TWI631352B - Measuring system - Google Patents

Abstract

A measuring system comprises: a measuring platform having a bearing surface, the bearing surface for placing the object to be tested; a cantilever comprising a plurality of pivoting arms, the arms comprising a first arm and a a second arm, the first arm is connected to the measuring platform at one end and movable relative to the measuring platform; a probe module is disposed on the second arm, the probe module has a probe; and a holding member Attached to the second arm, the grip member is for the user to hold to move the cantilever relative to the bearing surface; a horizontal limiting mechanism and a controller, the horizontal limiting mechanism is disposed on the cantilever, and is controlled by The controller is connected to the horizontal limit mechanism, and the controller includes a horizontal limit switch. When the horizontal limit switch is triggered, the limit cantilever cannot move in the horizontal direction relative to the measuring platform.

Description

Measuring system

The present invention relates to a measurement system; in particular, to a measurement system for measuring an electronic component or a circuit substrate.

With the development of electronic products, in order to ensure the quality of electronic products at the factory, before the manufacture, assembly and delivery, the electrical connection between the precise electronic components of the electronic products is usually detected through the measurement system or on the circuit substrate. Is there any error in the electrical properties of the surface line and the buried line?

The size of the electronic component or the circuit board is not singular, and the probe module for electrically detecting the object to be tested is also changed according to various requirements. Therefore, the detector module is directly held by the detecting personnel. Electrical detection of extremely fine objects to be tested, inevitably, due to physiological factors such as breathing, heartbeat, or physiological factors such as stress and fatigue, it is impossible to accurately move the probe module to an appropriate position. Test the object to be tested. In addition, since the object to be tested and the probe module are both high-priced and precise parts, any errors may cause delays in the test period and increase in the test cost.

In view of the above, an object of the present invention is to provide a measurement system that can improve the efficiency and accuracy of an electrical detection of a test object by a tester.

In order to achieve the above object, the present invention provides a measuring system for measuring an object to be tested, comprising: a measuring platform having a bearing surface for placing the object to be tested; The cantilever includes a plurality of arms pivotally connected to each other, the arms including a first arm and a second arm, the first arm being connected to the measuring platform at one end and movable relative to the measuring platform a probe module is disposed on the second arm, the probe module has at least one probe, and a grip member is coupled to the second arm, the grip member is for holding by the user a controller for moving the cantilever relative to the bearing surface; a horizontal limiting mechanism and a controller, the horizontal limiting mechanism is disposed on the cantilever and controlled by the controller; the controller is electrically connected to the horizontal limit The position mechanism includes a horizontal limit switch that limits the movement of the cantilever in a horizontal direction relative to the measuring platform when the horizontal limit switch is triggered.

The effect of the invention is that, through the above design, the detecting person can easily move the probe module by holding the grip member, and then electrically detect the object to be tested, and the support through the cantilever is more effective. The auxiliary probe module is kept in a stable state and is not easy to shake, thereby improving the detection efficiency and accuracy of the inspector.

In order to explain the present invention more clearly, a preferred embodiment will be described in detail with reference to the drawings. Referring to FIG. 1 to FIG. 3 , a measurement system 100 according to a preferred embodiment of the present invention includes a measurement platform 10 , a cantilever 20 , a probe module 30 , a handle 40 , and a The horizontal limiting mechanism 50, a vertical limiting mechanism 60 and a controller 70.

In the embodiment, the measuring platform 10 includes a base 12 and a column 14 . The base 12 includes a body 122 and a carrier 124. The carrier 124 is movably disposed on the seat. Preferably, the carrier 122 is disposed on the base 122 so as to be movable in a horizontal direction relative to the base 122, and/or may be perpendicular to the base 122. The upper moving mode is disposed on the seat body 122, in other words, the carrier plate 124 can also be designed to be lifted and lowered. The carrier plate 124 has a bearing surface 125, and the bearing surface 125 can be placed for testing. (not shown), the object to be tested may be an electronic component or a circuit substrate. The column 14 is disposed on the base 122.

The cantilever 20 is connected to the measuring platform 10 at one end, and is movable relative to the measuring platform 10. The cantilever 20 includes a plurality of arms pivotally connected to each other. In this embodiment, the arms include a first An arm 22 and a second arm 24, one end of which is connected to the column 14 of the measuring platform 10, and is swingable in the horizontal direction with respect to the bearing surface 125 on the measuring platform 10. As shown in FIG. 2, the first arm 22 is swingable in the horizontal direction, and the first arm 22 is swung in the arrow direction A1 with the upright 14 as a rotation axis; one end of the second arm 24 and the first arm The other end of the arm 22 is connected, and the second arm 24 is horizontally and vertically rotatable relative to the first arm 22, wherein the second arm 24 is horizontal as shown in FIG. The oscillating direction means that the second arm 24 swings in the direction of the arrow A2 with the one end connected to the first arm 22 as a rotation axis. In the embodiment, the second arm 24 includes a parallel link group 242 and a a bracket 244, one end of the parallel link set 242 is pivotally connected to the first arm 22, and the other end is opposite to the bearing 244 is pivoted, whereby the design of the parallel link set 242 allows the frame 244 to be pivoted with the end of the parallel link set 242 and the first arm as a fulcrum in a vertical direction relative to the bearing surface 125. The movement of the second arm 24 can be moved up and down in the direction of the arrow A3 as shown in FIG.

The probe module 30 is disposed on the carrier 244 and has at least one probe 32 for contacting the object to be tested for electrical measurement of the object to be tested.

The holding member 40 is disposed on the receiving frame 244 and located above the probe module 30. The holding member 40 is for holding by the user, so as to drive the cantilever 20 and the probe disposed on the cantilever 20 The needle module 30 is moved relative to the bearing surface 125 to move the probe module 30 above the object to be tested or other suitable test position.

The horizontal limiting mechanism 50 is disposed on the cantilever 20, electrically connected to the controller 70, and controlled by the controller 70. The horizontal limiting mechanism 50 is controlled to limit the arms. Pivoting in a horizontal direction, for example, when the horizontal limiting mechanism 50 is triggered, can limit the first arm 22 and the second arm 24 from moving in a horizontal direction relative to the measuring platform. As shown in FIG. 1 , in the embodiment, the horizontal limiting mechanism 50 includes a first horizontal limiting member 50a and a second horizontal limiting member 50b. The first horizontal limiting member 50a is disposed on the first horizontal limiting member 50a. Between the first arm 22 and the column 14 for restricting the swing of the first arm 22 in the horizontal direction, the second horizontal limiting member 50b is disposed between the second arm 24 and the first arm 22 for limiting the second arm The swing in the horizontal direction with respect to the first arm 22. In this embodiment, the first horizontal limiting member 50a and the second horizontal limiting member 50b are electromagnetically braked or energized by a motor to achieve the effect of electromagnetic braking.

As shown in FIG. 4 , the vertical limiting mechanism 60 is disposed on the second arm 24 and electrically connected to the controller 70 , and is controlled by the controller 70 , the vertical limiting mechanism 60 . The control can be used to limit the distance between the cantilever 20 and the bearing surface 125 by a predetermined distance, or to limit the distance between the probe module 30 disposed on the cantilever 20 and the object to be tested by a predetermined distance. In this embodiment, the vertical limiting mechanism 60 mainly includes three parts, which are respectively a sliding rail assembly 60a, a stopping member 60b and a power driving member 60c. The sliding rail assembly 60a is connected to the stopping member 60b. For adjusting the height (or vertical position) of the blocking member 60b in the vertical direction; one end of the stopping member 60b has a stopping portion for abutting against a reference surface R, so that the cantilever 20 In the present embodiment, the blocking member 60b is disposed on the cantilever 20, so that the blocking portion is disposed on the cantilever 20; The power driving member 60c is connected to the second arm 24. In the embodiment, the power driving member 60c is a nitrogen cylinder for driving the parallel link group 242 to drive the carrier 244 to move in the vertical direction. In other practical implementations, the power driving member 60c is not limited to a nitrogen cylinder, and other power driving members such as a hydraulic cylinder, an electric cylinder, a pneumatic cylinder or a screw may be used.

In this embodiment, the controller 70 is disposed on the holding component 40 and electrically connected to the probe module 30, the horizontal limiting mechanism 50, and the vertical limiting mechanism 60. The controller 70 includes a controller 70. a probe switch (not shown), a horizontal limit switch (not shown), and a vertical limit switch (not shown), wherein each of the above open relationships is for a user to click or tap to trigger a corresponding action ,E.g:

When the probe switch is triggered, the probe module 30 is driven to drive the probe 32 to move a distance away from the object to be tested, and contacts the object to be tested, thereby electrically charging the object to be tested. Sex measurement; on the other hand, when the probe switch is not triggered, the probe 32 does not actively move in the direction of the object to be tested.

When the horizontal limit switch is triggered, the horizontal limiting mechanism 50 limits the cantilever 20 from moving in the horizontal direction relative to the measuring platform 10, as in the embodiment, limiting the first arm 22 and the second The arm 24 cannot be moved horizontally relative to the metrology platform 10, or is referred to as a particular X, Y-axis coordinate that secures the cantilever 20 to the load bearing surface. On the other hand, when the horizontal limit switch is not triggered, the cantilever 20 can be arbitrarily moved and swung by the user.

When the vertical limit switch is triggered, the vertical limiting mechanism 60 limits the distance between the cantilever 20 and the carrying surface 125 at a predetermined distance, that is, the probe module disposed on the cantilever 20 can be restricted. 30 is held at a predetermined distance above the object to be tested, so that the probe module 30 can be positioned at a predetermined height relative to the bearing surface 125, or a specific one fixed on the bearing surface 125. For example, in the present embodiment, the parallel link set 242 is fixed by controlling the nitrogen cylinder so that the frame 244 cannot move in the vertical direction, thereby achieving the restriction between the cantilever 20 and the bearing surface 125. The effect at this predetermined distance. On the other hand, when the vertical limit switch is not triggered, the second arm 24 is vertically movable relative to the bearing surface 125, or is movable in the Z-axis direction.

Preferably, each of the above-mentioned open relationships is disposed on the surface of the grip member 40, thereby being more ergonomic and easy to be used when the user holds the grip member 40 to manipulate the switch. User control, and its operational feel can be significantly improved.

The measurement method applicable to the above measurement system is exemplified. Firstly, the object to be tested is first placed on the bearing surface 125, and the user can adjust the horizontal position and vertical position of the carrier plate 124 relative to the base 122 according to the needs. Position, and then, after the adjustment is completed, the user can hold the grip member 40 and drive the cantilever 20 and the probe module 30 to move relative to the bearing surface 125 to approach or away from the object to be tested or to be tested. Test point of the object.

Wherein, in order to avoid accidental occurrence of collision between the probe module 30 and the test object or the carrier 124 due to the erroneous operation or the unfamiliar operation of the measurement system, the probe module 30 may be accidentally generated. The predetermined height of the cantilever 20 relative to the bearing surface 125 or the object to be tested (also referred to as a predetermined distance). Referring to FIG. 4, first, the user first adjusts the rail assembly 60a to set the vertical position of the stopper 60b for setting the height of the stopper of the stopper 60b from the bracket 244. At this time, the vertical limiting mechanism 60 is in a setting mode, and then the user triggers the blocking member 60b on the sliding rail assembly 60a to extend, and the holding member 40 is manipulated to move the cantilever 20 and the probe module 30, And the stopping portion of the stopping member 60b is abutted against the reference surface R, so that the cantilever 20 and the probe module 30 are spaced apart from the bearing surface 125 of the measuring platform 10 by a predetermined distance, and are defined by the above setting mode. The required predetermined distance and the measured height are output, and then the action of the stopper against the reference surface R is performed. Wherein, the stopper 60b protrudes in such a manner that the stopping portion thereof exceeds the tip of the probe 32, so that the tip of the probe 32 does not directly contact the reference surface R when the height is set. Damaged.

Then, after the reference surface R is completed, the stopper 60b on the slide rail assembly 60a is triggered to be retracted, that is, the vertical position of the stopper 60b is increased and the ratio is higher than the probe module. 30 the needle tip is still in a high position, and the vertical limiting mechanism 60 can be in an operating mode. At this time, the power driving member 60c will be triggered to fix the parallel link group 242 such that the carrier 244 is in the vertical direction. It cannot move, in other words, the carrier 244 is fixed to a specific Z-axis coordinate. Thereafter, when the cantilever 20 is operated by the user, the cantilever 20 can be subjected to the height limiting step performed by the previous vertical limiting mechanism 60, so that the shortest vertical distance between the cantilever 20 and the measuring platform 10 or the object to be tested when the cantilever 20 moves is Restricted, thereby effectively avoiding the risk that the cantilever 20 will be too close to the bearing surface 125 during operation, causing the probe 32 to strike the bearing surface 125 or the object to be tested.

In addition, the action of extending and retracting the stop member 60b and the action of triggering the power drive member 60c to vertically limit the cantilever 20 can be performed simultaneously, for example, when a vertical limit switch is used. When the triggering stopper 60b is extended, the power driving member 60c releases the vertical position of the cantilever 20, and the cantilever 20 can move up and down with the user's control; in addition, when the stopping portion abuts against the reference surface R When the action is completed, and the vertical limit switch is used to trigger the stop 60b to be retracted, the power driving member 60c is simultaneously triggered, thereby restricting the movement of the cantilever 20 in the vertical direction, that is, limiting the cantilever 20 to a specific Z-axis coordinate. on. In addition, in an embodiment, the extending and retracting action of the stopping member 60b may be performed at the same time as the triggering of the power driving member 60c to perform the vertical restraining action of the cantilever 20. At this time, the extension of the stopping member 60b is performed. The trip and retraction need to be additionally set with the stopper switch for triggering, and the power driving member 60c uses the vertical limit switch to trigger the limit or opening in the vertical height, and is not limited to the foregoing description.

Then, the user can control the grip member 40 to move the cantilever 20 and the probe module 30 relative to the measuring platform 10 to move the probe module 30 to the position of the object to be tested, for example, to Directly above one of the test points of the object to be tested, at this time, the user can trigger the vertical limit switch and/or the horizontal limit switch to activate the vertical limit mechanism 60 and/or the horizontal limit mechanism 50 to limit the cantilever. The movement, for example, when the user has moved the probe module 30 directly above the measurement point to be measured, that is, the horizontal direction of the probe module 30 relative to the object to be tested (XY The position on the plane has been determined, then the horizontal limit mechanism 50 can be activated to fix the horizontal position of the cantilever 20 relative to the measurement platform 10; then, when the user has moved the probe module 30 above the object to be tested When the height is measured, the vertical limiting mechanism 60 can be activated to fix the vertical position of the cantilever 20 relative to the measuring platform, thereby fixing the distance between the probe 32 and the object to be tested in the vertical direction.

Afterwards, the user can trigger the probe switch to drive the probe 32 of the probe module 30 to move a distance away from the object to be tested and contact the object to be tested, thereby breaking the object to be tested. Sex measurement. Preferably, the distance traveled by the probe 32 is greater than the distance between the probe 32 and the object to be tested in the vertical direction, so that the probe 32 can be slightly penetrated into the test. The test point of the object to make effective contact with the object to be tested, and to complete the collection of the correct measurement data. In this embodiment, the user triggers the probe switch to drive other power driving members such as an electric cylinder, a hydraulic cylinder, a pneumatic cylinder, and the like to drive the probe 32 of the probe module 30 to move.

Therefore, through the above measurement system and measurement method, the user can easily move the cantilever 20 and the probe module 30 to the ideal test position, and pass through the horizontal limit mechanism 50 and the vertical limit mechanism 60. The auxiliary and the support of the cantilever 20 can effectively reduce the problem of the user's misoperation due to physiological factors such as breathing or psychological factors such as stress, and at the same time can effectively assist the probe module during the test and during the needle down. Keeping it in a stable state and not swaying, can improve the efficiency and accuracy of detection.

Wherein, the predetermined distance may be a distance interval, for example, between 3 cm and 6 cm, and between 5 mm and 10 mm. In addition, the predetermined distance may also be a specific value, for example, the predetermined distance may be 3 mm. A specific value of 5 mm or 5 cm, etc., is intended to limit the movement of the second arm 24 of the cantilever 20 to a specific vertical height range, or to be movable within a specific vertical height range.

In addition, the order of the movement of the locking cantilever relative to the measuring platform in the horizontal direction or the vertical direction is not limited to the above exemplary description. In other practical applications, it is of course possible to first lock the cantilever to the vertical. The direction then locks the movement of the cantilever in the horizontal direction, or simultaneously locks the movement of the cantilever in the vertical and horizontal directions.

In addition, in an embodiment, the cantilever may further include a third arm pivotally connected between the first arm and the second arm, thereby increasing the range of movement of the cantilever, the moving angle, and the like, and having more The possibility of measuring the range.

In addition, in an embodiment, as shown in FIG. 5, a bearing portion 246 may be disposed on the rack, and the carrying portion 246 may be disposed as a light spot indicating device for facing the probe module. The needle position emits a light spot prompt, for example, by projecting a laser spot to assist or guide the user to accurately find the position of the lower needle; in addition, the carrying portion 246 can also be provided with a magnifying glass, so that the user can see through the magnifying glass The lower needle position of the object and the probe; in addition, a camera can be disposed on the carrying portion 246, for example, a CCD camera is provided to take a picture of the probe and the object to be tested, and the user can make a reference for measuring the position point. .

The above is only a preferred embodiment of the present invention, and equivalent changes to the scope of the present invention and the scope of the patent application are intended to be included in the scope of the present invention.

[this invention]

100‧‧‧Measurement system

10 ‧‧‧Measuring platform

12 ‧‧‧Base

122 ‧‧‧

124 ‧‧‧ Carrier Board

125 ‧‧‧ bearing surface

14 ‧‧‧ Column

20 ‧‧‧cantilever

22 ‧‧‧First arm

24 ‧‧‧second arm

242 ‧‧‧Parallel link set

244 ‧‧‧ Shelf

30 ‧‧‧ Probe Module

32 ‧‧‧Probe

40 ‧‧‧ Holding parts

50 ‧‧‧Horizontal Limiting Mechanism

50a ‧‧‧First level limiter

50b ‧‧‧second level limiter

60‧‧‧Vertical limit mechanism

60a ‧‧‧Slide assembly

60b‧‧‧stops

60c ‧‧‧Power Drives

70 ‧ ‧ controller

A1~A3 ‧‧‧ arrow direction

R‧‧‧ reference surface

1 is a perspective view of a measurement system in accordance with a preferred embodiment of the present invention. Figure 2 is a top plan view of the measurement system of the preferred embodiment described above. Figure 3 is a side elevational view of the measurement system of the preferred embodiment described above. 4 is a side elevational view of the measurement system of the preferred embodiment, showing the stop portion abutting against a reference surface to set a predetermined distance. Figure 5 is a side elevational view of the measurement system of the above preferred embodiment, revealing that the predetermined distance is set and the stop is retracted.

Claims (2)

A measuring system for measuring an object to be tested, comprising: a measuring platform having a bearing surface for placing the object to be tested; a cantilever comprising a plurality of mutually pivoting The arm includes a first arm and a second arm, the first arm is connected to the measuring platform at one end and movable relative to the measuring platform; a probe module is disposed on the arm The probe module has at least one probe on the second arm; a grip member is coupled to the second arm, the grip member is for holding by the user to drive the cantilever relative to the carrier a horizontal limit mechanism and a controller, the horizontal limit mechanism is disposed on the cantilever and controlled by the controller; the controller is electrically connected to the horizontal limit mechanism, and the controller includes a level A limit switch that limits the movement of the cantilever in a horizontal direction relative to the measurement platform when the horizontal limit switch is triggered. The measuring system of claim 1, further comprising a vertical limiting mechanism for controlling to limit the suspension arm to the bearing surface at a predetermined distance to fix the probe and the object to be tested The distance between the vertical direction; the controller includes a vertical limit switch that limits the suspension arm to the bearing surface by the predetermined distance when the vertical limit switch is triggered.