TWI581462B - 發光元件及其製造方法 - Google Patents
發光元件及其製造方法 Download PDFInfo
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- TWI581462B TWI581462B TW102119720A TW102119720A TWI581462B TW I581462 B TWI581462 B TW I581462B TW 102119720 A TW102119720 A TW 102119720A TW 102119720 A TW102119720 A TW 102119720A TW I581462 B TWI581462 B TW I581462B
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- film layer
- light
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- emitting diode
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- 238000004519 manufacturing process Methods 0.000 title claims description 17
- 238000000034 method Methods 0.000 claims description 31
- 239000000463 material Substances 0.000 claims description 18
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- 239000011248 coating agent Substances 0.000 claims description 9
- 238000000576 coating method Methods 0.000 claims description 9
- 229910044991 metal oxide Inorganic materials 0.000 claims description 9
- 150000004706 metal oxides Chemical class 0.000 claims description 9
- 150000004767 nitrides Chemical class 0.000 claims description 9
- 239000011521 glass Substances 0.000 claims description 7
- 239000000843 powder Substances 0.000 claims description 7
- 239000011230 binding agent Substances 0.000 claims description 6
- 229910005540 GaP Inorganic materials 0.000 claims description 5
- 229910000420 cerium oxide Inorganic materials 0.000 claims description 5
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 claims description 5
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims description 5
- 238000002834 transmittance Methods 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 description 27
- 239000000758 substrate Substances 0.000 description 23
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 13
- 238000005229 chemical vapour deposition Methods 0.000 description 6
- 239000011787 zinc oxide Substances 0.000 description 6
- 239000011858 nanopowder Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 229910002601 GaN Inorganic materials 0.000 description 4
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 4
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 4
- JAONJTDQXUSBGG-UHFFFAOYSA-N dialuminum;dizinc;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Al+3].[Al+3].[Zn+2].[Zn+2] JAONJTDQXUSBGG-UHFFFAOYSA-N 0.000 description 4
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 4
- 229910001195 gallium oxide Inorganic materials 0.000 description 4
- 229910003437 indium oxide Inorganic materials 0.000 description 4
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 4
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 4
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 4
- 229910001887 tin oxide Inorganic materials 0.000 description 4
- 229910052725 zinc Inorganic materials 0.000 description 4
- 239000011701 zinc Substances 0.000 description 4
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 4
- NPNMHHNXCILFEF-UHFFFAOYSA-N [F].[Sn]=O Chemical compound [F].[Sn]=O NPNMHHNXCILFEF-UHFFFAOYSA-N 0.000 description 3
- 238000001312 dry etching Methods 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000001039 wet etching Methods 0.000 description 3
- RNQKDQAVIXDKAG-UHFFFAOYSA-N aluminum gallium Chemical compound [Al].[Ga] RNQKDQAVIXDKAG-UHFFFAOYSA-N 0.000 description 2
- 238000000498 ball milling Methods 0.000 description 2
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 2
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- 238000001027 hydrothermal synthesis Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000000593 microemulsion method Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000000053 physical method Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000001556 precipitation Methods 0.000 description 2
- 238000010298 pulverizing process Methods 0.000 description 2
- 238000003980 solgel method Methods 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000010345 tape casting Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- NWAIGJYBQQYSPW-UHFFFAOYSA-N azanylidyneindigane Chemical compound [In]#N NWAIGJYBQQYSPW-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
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- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0133—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
- H10H20/01335—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
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- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H01L2224/73265—Layer and wire connectors
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- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
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- H01L24/42—Wire connectors; Manufacturing methods related thereto
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- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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Description
本發明揭露一發光元件之製造方法,特別是關於一具有一厚膜層之發光元件製造方法。
發光二極體(light-emitting diode,LED)的發光原理是利用電子在n型半導體與p型半導體間移動的能量差,以光的形式將能量釋放,這樣的發光原理係有別於白熾燈發熱的發光原理,因此發光二極體被稱為冷光源。此外,發光二極體具有高耐久性、壽命長、輕巧、耗電量低等優點,因此現今的照明市場對於發光二極體寄予厚望,將其視為新一代的照明工具,已逐漸取代傳統光源,並且應用於各種領域,如交通號誌、背光模組、路燈照明、醫療設備等。
第1a圖係習知之發光元件結構示意圖。如第1a圖所示,習知之發光元件100,包含有一透明基板11、一位於透明基板11上之半導體疊層12,以及至少一電極14位於上述半導體疊層12上,其中上述之半導體疊層12由上而下至少包含一第一導電型半導體層120、一活性層122,以及一第二導電型半導體層124。
此外,上述之發光元件100更可以進一步地與其他
元件組合連接以形成一發光裝置(light-emitting apparatus)。第1b圖為習知之發光裝置結構示意圖,如第1b圖所示,一發光裝置200包含一具有至少一電路150之次載體(sub-mount)21;至少一焊料(solder)22位於上述次載體21上,藉由此焊料22將上述發光元件100黏結固定於次載體21上並使發光元件100之基板11與次載體21上之電路150形成電連接;以及,一電性連接結構24,以電性連接發光元件100之電極14與次載體21上之電路150;其中,上述之次載體21可以是導線架(lead frame)或大尺寸鑲嵌基底(mounting substrate),以方便發光裝置200之電路規劃並提高其散熱效果。
本發明提供一發光元件之製造方法,其步驟包含:提供一載體;施行一塗佈步驟,包含塗佈一膜層於載體上;施行一烘烤步驟,包含於一第一溫度下烘烤此膜層;及重複一預定次數之塗佈步驟及烘烤步驟以形成一厚膜層。
本發明提供一發光元件之製造方法,其步驟更包含:提供一第二基板;形成一發光二極體磊晶結構於第二基板上;形成一接合層於厚膜層上,且藉由此接合層將厚膜層與發光二極體磊晶結構接合;及移除第二基板。
11‧‧‧透明基板
12‧‧‧半導體疊層
14‧‧‧電極
20‧‧‧發光元件
21‧‧‧次載體
22‧‧‧焊料
24‧‧‧電性連接結構
30‧‧‧發光元件
40‧‧‧燈泡
41‧‧‧燈罩
42‧‧‧透鏡
43‧‧‧載板
44‧‧‧發光模組
45‧‧‧燈座
46‧‧‧散熱鰭片
47‧‧‧電連接器
100‧‧‧發光元件
102‧‧‧膜層
103‧‧‧厚膜層
120‧‧‧第一導電型半導體層
122‧‧‧活性層
124‧‧‧第二導電型半導體層
150‧‧‧電路
200‧‧‧發光裝置
201‧‧‧第一基板
202‧‧‧第一導電型半導體層
203‧‧‧活性層
204‧‧‧第二導電型半導體層
205‧‧‧發光二極體結構
206‧‧‧緻密層
207‧‧‧導電反射層
208‧‧‧電極
209‧‧‧切割道
210‧‧‧載體
301‧‧‧第一基板
302‧‧‧第一導電型半導體層
303‧‧‧活性層
304‧‧‧第二導電型半導體層
305‧‧‧發光二極體結構
306‧‧‧緻密層
307‧‧‧導電反射層
308‧‧‧電極
309‧‧‧切割道
310‧‧‧載體
311‧‧‧第二基板
315‧‧‧發光二極體磊晶結構
316‧‧‧接合層
402‧‧‧膜層
403‧‧‧厚膜層
第1a圖為習知之發光元件結構示意圖,第1b圖為習知之發光裝置結構示意圖。
第2a圖至第2g圖為本發明第一實施例製造流程結構示意圖。
第3a圖至第3j圖為本發明第二實施例製造流程結構示意圖。
第4圖為本發明第三實施例結構示意圖。
為了使本發明之敘述更加詳盡與完備,請參照下列描述並配合第2-4圖之圖式。
第2圖所示為本發明第一實施例製造流程結構示意圖,係包含:提供一第一基板201,如第2a圖所示;藉由有機金屬化學氣相沉積法(metal-organic chemical vapor deposition;MOCVD)於第一基板201上形成一發光二極體結構205,其中此發光二極體結構205由下而上包含一第一導電型半導體層202,一活性層203及一第二導電型半導體層204,如第2b圖所示。於本實施例中,一載體210包含第一基板201和發光二極體結構205。
隨後,於發光二極體結構205之上形成一緻密層206,如第2c圖所示。其中形成緻密層206的方法包含物理氣相沉積法或化學氣相沉積法。組成緻密層206的材料為金屬氧化物、
金屬氮化物、或磷化鎵;其中金屬氧化物可為氧化鋅、氧化銦、氧化錫、氧化銦錫、氧化銦鋅、氧化氟錫、氧化鋁鋅、或氧化鋅鎵;金屬氮化物可為氮化鎵或氮化鋁。接著,於緻密層206上形成一膜層102。膜層102包含導電奈米粉體,於此實施例中係利用ITO蒸鍍錠或ZnO靶材以物理方法或化學方法製成,例如物理方法可為機械球磨法,氣相冷凝法或物理粉碎法;化學方法可為氣相沉積法,沈澱法,水熱合成法,溶膠凝膠法或微乳液法。膜層102更包含一黏結劑(圖未示)用以黏結上述之粉體。膜層102可以塗佈方式形成於緻密層206之上,其中塗佈的方法例如為旋轉塗佈法或刮刀塗佈法。於此實施例中,此膜層102之厚度介於10μm至30μm。其中,緻密層206具有增加膜層102與發光二極體結構205之間的接合性之功效。
接著於第一溫度下施行烘烤此膜層102之步驟;並
重覆一預定次數之上述之塗佈步驟和烘烤步驟以形成一厚膜層103,其中此預定次數為至少十次或二十次,如第2d圖所示。並於一第二溫度下施加一壓力於此厚膜層103,其中第二溫度高於第一溫度。最後所形成之厚膜層103之厚度介於100μm至600μm,其穿透率介於60%至90%,電阻率介於10-2至10-4 Ω-cm。
組成導電奈米粉體的材料可和緻密層206組成材料
相同或不同,其中導電奈米粉體的材料包含金屬氧化物、金屬氮化物、或磷化鎵;金屬氧化物可為氧化鋅、氧化銦、氧化錫、氧化銦錫、氧化銦鋅、氧化氟錫、氧化鋁鋅、或氧化鋅鎵;金屬氮
化物可為氮化鎵或氮化鋁。其中黏結劑的材料包含低溫玻璃或奈米級二氧化矽;在此之低溫玻璃是指具有75℃至150℃之玻璃轉換溫度之玻璃材料,在此之奈米級二氧化矽是指尺寸小於100 nm的二氧化矽晶粒或顆粒。
接著,移除第一基板201以暴露出發光二極體結構
205之第一導電型半導體層202,如第2e圖所示;其中移除暫時基板201的方法包含濕式蝕刻法或乾式蝕刻法。於厚膜層103相對於緻密層206之另一面上形成一導電反射層207,如第2f圖所示;其中此導電反射層207由金屬所組成,同時具有反射層及電極之功用。再於第一導電型半導體層202之上形成一電極208,並沿著切割道209切割以形成一發光元件20,如第2g圖所示。
第3圖所示為本發明第二實施例製造流程結構示意
圖,係包含提供一第一基板301,如第3a圖所示;藉由有機金屬化學氣相沉積法(metal-organic chemical vapor deposition;MOCVD)於第一基板301上形成一發光二極體結構305,其中此發光二極體結構305由下而上包含一第一導電型半導體層302,一活性層303及一第二導電型半導體層304,如第3b圖所示。於本實施例中,一載體310包含第一基板301和發光二極體結構305。
隨後,於發光二極體結構305之上形成一緻密層
306,如第3c圖所示。其中形成緻密層306的方法包含物理氣相沉積法或化學氣相沉積法。組成緻密層306的材料為金屬氧化物、金屬氮化物、或磷化鎵;其中金屬氧化物可為氧化鋅、氧化銦、
氧化錫、氧化銦錫、氧化銦鋅、氧化氟錫、氧化鋁鋅、或氧化鋅鎵;金屬氮化物可為氮化鎵或氮化鋁。
接著,於緻密層306上形成一膜層402。膜層402包
含導電奈米粉體,於此施實例中係利用ITO蒸鍍錠或ZnO靶材以物理方法或化學方法製成,例如物理方法可為機械球磨法,氣相冷凝法或物理粉碎法;化學方法可為氣相沉積法,沈澱法,水熱合成法,溶膠凝膠法或微乳液法。膜層402更包含一黏結劑(圖未示)用以黏結上述之粉體。膜層402可以塗佈方式形成於緻密層306之上,其中塗佈的方法例如為旋轉塗佈法或刮刀塗佈法。於此實施例中,此膜層402之厚度介於10μm至30μm。其中,緻密層306具有增加膜層402與發光二極體結構305之間的接合性之功效。
接著於第一溫度下施行烘烤此膜層402之步驟;並
重覆一預定次數之塗佈步驟和烘烤步驟以形成一厚膜層403,其中此預定次數為至少十次或二十次。並於一第二溫度下施加一壓力於此厚膜層403,其中第二溫度高於第一溫度。最後所形成之厚膜層403之厚度介於100μm至600μm,其穿透率介於60%至90%,電阻率介於10-2至10-4 Ω-cm。組成導電奈米粉體的材料可和緻密層306組成材料相同或不同,其中導電奈米粉體的材料包含金屬氧化物、金屬氮化物、或磷化鎵;金屬氧化物可為氧化鋅、氧化銦、氧化錫、氧化銦錫、氧化銦鋅、氧化氟錫、氧化鋁鋅、或氧化鋅鎵;金屬氮化物可為氮化鎵或氮化鋁。其中黏結劑的材
料包含低溫玻璃或奈米級二氧化矽;在此之低溫玻璃是指具有75℃至150℃之玻璃轉換溫度之玻璃材料,在此之奈米級二氧化矽是指尺寸小於100 nm的二氧化矽晶粒或顆粒。再於厚膜層403之上形成一接合層316,如第3d圖所示。
提供一第二基板311,並藉由有機金屬化學氣相沉積法(metal-organic chemical vapor deposition;MOCVD)於第二基板301上形成一發光二極體磊晶結構315,其中此發光二極體磊晶結構315由下而上包含一第一導電型半導體層,一活性層及一第二導電型半導體層(圖未示),如第3e圖所示。再藉由接合層316將厚膜層403與發光二極體磊晶結構315接合,如第3f圖所示。利用濕式蝕刻法或乾式蝕刻法移除第二基板311以暴露出發光二極體磊晶結構315,如第3g圖所示。再次利用濕式蝕刻法或乾式蝕刻法移除包含第一基板301和發光二極體結構305之載體310,如第3h圖所示。於緻密層306之上形成一導電反射層307;其中此導電反射層307由金屬所組成,同時具有反射層及電極之功用。再於發光二極體磊晶結構315之上形成一電極308,並沿著切割道309切割以形成一發光元件30,如第3i,3j圖所示。
第4圖為本發明第三實施例揭露一燈泡結構示意圖。燈泡40包含一燈罩41,一透鏡42,一發光模組44,一燈座45,一散熱鰭片46,一結合部47及一電連接器48。其中發光模組44係包含一載板43,並在載板43上包含至少一個上述實施例中的發光元件20,30。
上述第一導電型半導體層202,302與第二導電型半
導體層204,304係電性、極性或摻雜物相異,分別用以提供電子與電洞之半導體材料單層或多層結構(「多層」係指二層或二層以上,以下同)。其電性選擇可以為p型、n型、及i型中之任意二者之組合。活性層203,303係位於上述二個部分之電性、極性或摻雜物相異、或者係分別用以提供電子與電洞之半導體材料之間,為電能與光能可能發生轉換或被誘發轉換之區域。上述發光二極體結構205,305其材料包含一種或一種以上之元素選自鎵(Ga)、鋁(Al)、銦(In)、砷(As)、磷(P)、氮(N)以及矽(Si)所構成群組。常用之材料係如磷化鋁鎵銦(AlGaInP)系列、氮化鋁鎵銦(AlGaInN)系列等III族氮化物、氧化鋅(ZnO)系列等。活性層203之結構係如:單異質結構(single heterostructure;SH)、雙異質結構(double heterostructure;DH)、雙側雙異質結構(double-side double heterostructure;DDH)、或多層量子井(multi-quantum well;MQW)。再者,調整量子井之對數亦可改變發光波長。
以上各圖式與說明雖僅分別對應特定實施例,然而,各個實施例中所說明或揭露之元件、實施方式、設計準則、及技術原理除在彼此顯相衝突、矛盾、或難以共同實施之外,吾人當可依其所需任意參照、交換、搭配、協調、或合併。
雖然本發明已說明如上,然其並非用以限制本發明之範圍、實施順序、或使用之材料與製程方法。對於
本發明所作之各種修飾與變更,皆不脫本發明之精神與範圍。
20‧‧‧發光元件
102‧‧‧膜層
103‧‧‧厚膜層
202‧‧‧第一導電型半導體層
203‧‧‧活性層
204‧‧‧第二導電型半導體層
205‧‧‧發光二極體結構
206‧‧‧緻密層
207‧‧‧導電反射層
208‧‧‧電極
Claims (9)
- 一種發光元件之製造方法,其步驟包含:提供一載體包含一發光二極體結構;及形成複數個第一膜層於該發光二極體結構上以支撐該發光二極體結構,其中,該複數個第一膜層之間相互黏結以形成一第二膜層,該第二膜層的厚度介於100μm至600μm;以及形成一導電反射層於該第二膜層上。
- 如申請專利範圍第1項所述之製造方法,其中形成該第二膜層的方法包含:施行一塗佈步驟,包含塗佈該第一膜層於該發光二極體結構上,其中該第一膜層包含一導電粉體以及一黏結劑用以黏結該導電粉體;施行一烘烤步驟,包含於一第一溫度下烘烤該第一膜層;及重複一預定次數之該塗佈步驟和該烘烤步驟以形成該第二膜層。
- 如申請專利範圍第2項所述之製造方法,更包含於一第二溫度下施加一壓力於該第二膜層。
- 如申請專利範圍第3項所述之製造方法,其中該第二溫度高於該第一溫度。
- 如申請專利範圍第1項所述之製造方法,於形成該第二膜層之前更包含形成一緻密層於該載體上。
- 如申請專利範圍第2項所述之製造方法,其中該導電粉體材料包含金屬氧化物,金屬氮化物或磷化鎵。
- 如申請專利範圍第1項所述之製造方法,其中該第二膜層具有一穿透率介於60%至90%。
- 如申請專利範圍第1項所述之製造方法,其中該第二膜層具有一電阻率介於10-2至10-4Ω-cm。
- 如申請專利範圍第2項所述之製造方法,其中該黏結劑之材料包含低溫玻璃或奈米級二氧化矽。
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US20120220063A1 (en) * | 2009-11-25 | 2012-08-30 | Tae Yeon Seong | Vertical-structure semiconductor light emitting element and a production method therefor |
US20120286313A1 (en) * | 2009-12-21 | 2012-11-15 | Osram Opto Semiconductors Gmbh | Radiation-emitting semiconductor component |
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