TWI566331B - Package module and its substrate structure - Google Patents
Package module and its substrate structure Download PDFInfo
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- TWI566331B TWI566331B TW104126501A TW104126501A TWI566331B TW I566331 B TWI566331 B TW I566331B TW 104126501 A TW104126501 A TW 104126501A TW 104126501 A TW104126501 A TW 104126501A TW I566331 B TWI566331 B TW I566331B
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19105—Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate
Landscapes
- Production Of Multi-Layered Print Wiring Board (AREA)
Description
本發明係有關一種基板結構,尤指一種用以設置電子元件之基板結構。 The invention relates to a substrate structure, in particular to a substrate structure for arranging electronic components.
隨著電子產業的發達,現今的電子產品已趨向輕薄短小與功能多樣化的方向設計,半導體封裝技術亦隨之開發出不同的封裝型態。 With the development of the electronics industry, today's electronic products have been designed in a light, short, and versatile manner, and semiconductor packaging technologies have also developed different packaging types.
如第1圖所示,係為習知封裝模組1,其包括:一基板結構1’、一主動元件8a、一被動元件8b以及封裝材9。 As shown in Fig. 1, a conventional package module 1 includes a substrate structure 1', an active device 8a, a passive component 8b, and a package 9.
所述之基板結構1’係包括:一第一線路層11、形成於該第一線路層11上之複數第一導電柱體100、一包覆該第一線路層11與第一導電柱體100之第一絕緣層13、形成於該第一絕緣層13上之一第二線路層12、形成於該第二線路層12上之複數第二導電柱體15、包覆該第二線路層12與第二導電柱體15之一第二絕緣層14、形成於該第二絕緣層14上之一第三線路層16、形成於該第三線路層16上之複數導電凸塊160、以及形成於該第二絕緣層14與該第三線路層16上之一絕緣保護層17,且該些導電凸塊160外露於該絕緣保護層17,以供結合複數導電元件18。 The substrate structure 1 ′ includes a first circuit layer 11 , a plurality of first conductive pillars 100 formed on the first circuit layer 11 , and a first conductive layer and a first conductive pillar a first insulating layer 13 of 100, a second circuit layer 12 formed on the first insulating layer 13, a plurality of second conductive pillars 15 formed on the second wiring layer 12, and a second wiring layer And a second insulating layer 14 of the second conductive pillar 15 , a third wiring layer 16 formed on the second insulating layer 14 , a plurality of conductive bumps 160 formed on the third wiring layer 16 , and An insulating protective layer 17 is formed on the second insulating layer 14 and the third wiring layer 16 , and the conductive bumps 160 are exposed on the insulating protective layer 17 for bonding the plurality of conductive elements 18 .
所述之主動元件8a與被動元件8b係藉由複數導電元件19結合至該第一線路層11上。 The active component 8a and the passive component 8b are coupled to the first circuit layer 11 by a plurality of conductive components 19.
所述之封裝材9係形成於該基板結構1’上,以包覆該主動元件8a與被動元件8b。 The package material 9 is formed on the substrate structure 1' to cover the active element 8a and the passive element 8b.
於習知基板結構1’中,該第一線路層11、第一導電柱體100與第一絕緣層13係作為一線路部1a,且該第二線路層12、第二導電柱體15與第二絕緣層14亦作為一線路部1b,而該第三線路層16、導電凸塊160與絕緣保護層17係作為另一線路部1c。 In the conventional substrate structure 1', the first circuit layer 11, the first conductive pillar 100 and the first insulating layer 13 are used as a line portion 1a, and the second circuit layer 12 and the second conductive pillar 15 are The second insulating layer 14 also serves as a wiring portion 1b, and the third wiring layer 16, the conductive bump 160, and the insulating protective layer 17 serve as another wiring portion 1c.
再者,由於一般基板均會形成有用以連接基板上、下兩側線路層之導電通孔,故於習知基板結構1’中,上、下兩側之線路層分別為第一線路層11與第三線路層16,因而部分該第一導電柱體100與部分該第二導電柱體15可視為該基板結構1’之導電通孔10。 Moreover, since the common substrate is formed with conductive vias for connecting the upper and lower circuit layers on the substrate, in the conventional substrate structure 1', the circuit layers on the upper and lower sides are respectively the first circuit layer 11 And the third circuit layer 16, and thus the first conductive pillar 100 and a portion of the second conductive pillar 15 can be regarded as the conductive via 10 of the substrate structure 1'.
又,所述之基板結構1’係為高密度線路之基板,其主要應用於高階晶片之電子產品上,且產品往往輕薄短小,而當產品之功能愈強、愈快及儲存量愈高時,則會使用成本較高之高階材料(如絕緣層之材料之顆粒尺寸極小)製作多層之線路構造(如第1圖所示之三層線路部1a,1b,1c),以形成高密度線路之基板結構1’。具體地,電性連接該主動元件8a之基板結構1’中之線路係採用細線路製程製作,且於該基板結構1’中用以設置該主動元件8a之細線路區A需使用高階材料(即該第一與第二絕緣層13,14之材料顆粒的尺寸極小,約小於5um)。 Moreover, the substrate structure 1' is a substrate of a high-density circuit, which is mainly applied to electronic products of high-order chips, and the products are often light, thin, and short, and when the function of the product is stronger, faster, and the storage amount is higher. Then, a higher-order material (such as a material having a very small particle size of the insulating layer) is used to fabricate a multilayer wiring structure (such as the three-layer wiring portion 1a, 1b, 1c shown in Fig. 1) to form a high-density circuit. Substrate structure 1'. Specifically, the circuit in the substrate structure 1' electrically connected to the active device 8a is fabricated by a fine line process, and the fine circuit region A for setting the active device 8a in the substrate structure 1' needs to use a high-order material ( That is, the size of the material particles of the first and second insulating layers 13, 14 is extremely small, about less than 5 um).
然而,該基板結構1’中用以設置該被動元件8b之非細線路區B亦需配合該細線路區A使用高階材料,因而導致該基板結構1’整體製作之成本極高。 However, the non-fine line region B of the substrate structure 1' for arranging the passive element 8b also needs to be used with the fine line region A to use a high-order material, thereby resulting in an extremely high cost of the overall fabrication of the substrate structure 1'.
再者,該基板結構1’係需包含多層線路部1a,1b,1c以配合高階晶片,因而該基板結構1’之整體厚度較厚。 Further, the substrate structure 1' is required to include the plurality of wiring portions 1a, 1b, 1c to match the high-order wafer, so that the overall thickness of the substrate structure 1' is thick.
又,於製作該導電通孔10時,需於兩層線路部1a,1b間進行對位堆疊,因而極易發生該第一導電柱體100與該第二導電柱體15間的對位誤差,進而影響該導電通孔10之品質。 Moreover, when the conductive via 10 is formed, the alignment stacking between the two wiring portions 1a, 1b is required, so that the alignment error between the first conductive pillar 100 and the second conductive pillar 15 is highly likely to occur. In turn, the quality of the conductive via 10 is affected.
因此,如何避免習知技術中之種種缺失,實已成為目前亟欲解決的課題。 Therefore, how to avoid all kinds of defects in the prior art has become a problem that is currently being solved.
鑑於上述習知技術之種種缺失,本發明提供一種基板結構,係包括:一第一絕緣層,係具有相對之第一表面與第二表面;一第一線路層,係嵌埋於該第一絕緣層中並外露出該第一表面;複數個導電柱體,係設於該第一絕緣層中並電性連接該第一線路層;一線路板體,係埋設於該第一絕緣層中且連通該第一與第二表面,其中,該線路板體具有複數佈線層且部分該佈線層係外露於該第一與第二表面;以及一第二線路層,係設於該線路板體與該第一絕緣層之第二表面上且電性連接該佈線層,並藉由該些導電柱體電性連接該第一線路層。 In view of the above-mentioned various deficiencies of the prior art, the present invention provides a substrate structure comprising: a first insulating layer having opposite first and second surfaces; and a first circuit layer embedded in the first The first surface is exposed in the insulating layer; a plurality of conductive pillars are disposed in the first insulating layer and electrically connected to the first circuit layer; and a circuit board body is embedded in the first insulating layer And connecting the first and second surfaces, wherein the circuit board body has a plurality of wiring layers and a portion of the wiring layer is exposed on the first and second surfaces; and a second circuit layer is disposed on the circuit board body And electrically connecting the wiring layer to the second surface of the first insulating layer, and electrically connecting the first circuit layer by the conductive pillars.
本發明亦提供一種封裝模組,係包括:一前述之基板結構;以及至少一第一電子元件,係設於該線路板體上相 對該第一絕緣層之第一表面之側且電性連接該佈線層。 The present invention also provides a package module comprising: a substrate structure as described above; and at least one first electronic component disposed on the circuit board body The side of the first surface of the first insulating layer is electrically connected to the wiring layer.
前述之封裝模組中,復包括至少一第二電子元件,係設於該第一絕緣層之第一表面上並電性連接該第一線路層。例如,包括複數導電元件,係設於該第一絕緣層之第一表面上,以供結合該第二電子元件並電性連接該第一線路層。 The package module includes at least one second electronic component disposed on the first surface of the first insulating layer and electrically connected to the first circuit layer. For example, a plurality of conductive elements are disposed on the first surface of the first insulating layer for bonding the second electronic component and electrically connecting the first circuit layer.
前述之封裝模組中,復包括封裝材,形成於該第一絕緣層之第一表面上,以包覆該第一與第二電子元件。 In the above package module, a package material is formed on the first surface of the first insulating layer to cover the first and second electronic components.
前述之封裝模組及其基板結構中,該線路板體復具有用以埋設該佈線層之第二絕緣層。例如,該第二絕緣層之材質與該第一絕緣層之材質不同。 In the above package module and its substrate structure, the circuit board body has a second insulating layer for embedding the wiring layer. For example, the material of the second insulating layer is different from the material of the first insulating layer.
前述之封裝模組及其基板結構中,該佈線層係包含複數導電跡線與複數電性連接該導電跡線之導電盲孔。 In the above package module and its substrate structure, the wiring layer comprises a plurality of conductive traces and a plurality of conductive blind holes electrically connected to the conductive traces.
前述之封裝模組及其基板結構中,復包括複數導電凸塊,係設於該第二線路層上。例如,包括一絕緣保護層,係設於該線路板體與該第一絕緣層之第二表面上並包覆該第二線路層,且外露該些導電凸塊。又包括複數導電元件,係設於該些導電凸塊上。 In the foregoing package module and the substrate structure thereof, the plurality of conductive bumps are further disposed on the second circuit layer. For example, an insulating protective layer is disposed on the second surface of the circuit board body and the first insulating layer and covers the second circuit layer, and the conductive bumps are exposed. A plurality of conductive elements are further included on the conductive bumps.
另外,前述之封裝模組及其基板結構中,復包括複數導電元件,係設於該線路板體上,以供結合該第一電子元件並電性連接該佈線層。 In addition, the package module and the substrate structure thereof include a plurality of conductive elements disposed on the circuit board body for bonding the first electronic components and electrically connecting the wiring layers.
由上可知,本發明之封裝模組及其基板結構中,主要藉由先製作該線路板體,再將該線路板體導入一般基板製程中。因此,僅於該線路板體中使用成本較高之絕緣材, 而該第一絕緣層則可採用較便宜之材料製作,故相較於習知技術,本發明之基板結構之製作成本較低。 It can be seen from the above that in the package module and the substrate structure of the present invention, the circuit board body is mainly produced first, and then the circuit board body is introduced into the general substrate manufacturing process. Therefore, only the costly insulating material is used in the circuit board body, The first insulating layer can be made of a relatively inexpensive material, so that the substrate structure of the present invention is less expensive to manufacture than conventional techniques.
再者,該基板結構因已將細線路形成於該線路板體中,故於該第一絕緣層上可只形成該第二線路層即可。因此,相較於習知技術,該基板結構可減少線路部之層數,以降低整體結構之厚度。 Furthermore, since the substrate structure has formed a thin line in the circuit board body, only the second circuit layer may be formed on the first insulating layer. Therefore, the substrate structure can reduce the number of layers of the wiring portion to reduce the thickness of the overall structure as compared with the prior art.
又,該線路板體已具有兩層佈線層,故於該第一絕緣層中,該導電柱體可視為導電通孔。因此,相較於習知技術,該基板結構具有一體成型之導電通孔,因而無對位之問題。 Moreover, the circuit board body has two wiring layers, so in the first insulating layer, the conductive pillar can be regarded as a conductive through hole. Therefore, compared with the prior art, the substrate structure has integrally formed conductive vias, and thus there is no problem of alignment.
1,3‧‧‧封裝模組 1,3‧‧‧Package Module
1’,2‧‧‧基板結構 1', 2‧‧‧ substrate structure
1a,1b,1c‧‧‧線路部 1a, 1b, 1c‧‧‧ Line Department
10‧‧‧導電通孔 10‧‧‧ Conductive through hole
100‧‧‧第一導電柱體 100‧‧‧First conductive cylinder
11,21‧‧‧第一線路層 11, 21‧‧‧ first circuit layer
12,22‧‧‧第二線路層 12,22‧‧‧second circuit layer
13,23‧‧‧第一絕緣層 13,23‧‧‧First insulation
14,241,241’‧‧‧第二絕緣層 14,241,241'‧‧‧Second insulation
15‧‧‧第二導電柱體 15‧‧‧Second conductive cylinder
16‧‧‧第三線路層 16‧‧‧ third circuit layer
160,26‧‧‧導電凸塊 160,26‧‧‧Electrical bumps
17,27‧‧‧絕緣保護層 17,27‧‧‧Insulating protective layer
18,19,28,29,30‧‧‧導電元件 18,19,28,29,30‧‧‧Conductive components
20‧‧‧承載板 20‧‧‧Loading board
20a‧‧‧主要區 20a‧‧‧ main area
20b‧‧‧輔助區 20b‧‧Auxiliary area
200‧‧‧黏著層 200‧‧‧Adhesive layer
21a‧‧‧表面 21a‧‧‧Surface
210‧‧‧電性連接墊 210‧‧‧Electrical connection pads
23a‧‧‧第一表面 23a‧‧‧ first surface
23b‧‧‧第二表面 23b‧‧‧ second surface
24‧‧‧線路板體 24‧‧‧Circuit board
240,240’‧‧‧佈線層 240,240’‧‧‧ wiring layer
240a,240a’‧‧‧導電跡線 240a, 240a’‧‧‧ conductive traces
240b,240b’‧‧‧導電盲孔 240b, 240b’‧‧‧ conductive blind holes
25‧‧‧導電柱體 25‧‧‧Electrical cylinder
25a‧‧‧端面 25a‧‧‧ end face
31‧‧‧第一電子元件 31‧‧‧First electronic component
32‧‧‧第二電子元件 32‧‧‧Second electronic components
8a‧‧‧主動元件 8a‧‧‧Active components
8b‧‧‧被動元件 8b‧‧‧ Passive components
9‧‧‧封裝材 9‧‧‧Package
A‧‧‧細線路區 A‧‧‧fine line area
B‧‧‧非細線路區 B‧‧‧Non-fine line area
d,t‧‧‧顆粒 d, t‧‧‧ particles
第1圖係為習知封裝模組的剖面示意圖;以及第2A至2F圖係為本發明之封裝模組及其基板結構之製法之剖視示意圖;其中,第2C’圖係為第2C圖之局部放大圖。 1 is a schematic cross-sectional view of a conventional package module; and 2A to 2F are schematic cross-sectional views showing a method of fabricating the package module and the substrate structure thereof; wherein the 2C' is a 2C Partial enlarged view.
以下藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。 The other embodiments of the present invention will be readily understood by those skilled in the art from this disclosure.
須知,本說明書所附圖式所繪示之結構、比例、大小等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功 效及所能達成之目的下,均應仍落在本發明所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如“上”、“下”、“第一”、“第二”及“一”等之用語,亦僅為便於敘述之明瞭,而非用以限定本發明可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本發明可實施之範疇。 It is to be understood that the structure, the proportions, the size, and the like of the present invention are intended to be used in conjunction with the disclosure of the specification, and are not intended to limit the invention. The qualifications are not technically meaningful, and any modification of the structure, change of the proportional relationship or adjustment of the size does not affect the work that can be produced by the present invention. Both the effects and the achievable objectives should still fall within the scope of the technical contents disclosed in the present invention. In the meantime, the terms "upper", "lower", "first", "second" and "one" are used in the description for convenience of description, and are not intended to limit the invention. Changes in the scope of implementation, changes or adjustments in their relative relationship, are considered to be within the scope of the present invention.
第2A至2F圖係為本發明之封裝模組3及其基板結構2之製法之剖面示意圖。 2A to 2F are schematic cross-sectional views showing the manufacturing method of the package module 3 and the substrate structure 2 of the present invention.
如第2A圖所示,藉由圖案化製程於一承載板20上形成一第一線路層21。 As shown in FIG. 2A, a first wiring layer 21 is formed on a carrier 20 by a patterning process.
於本實施例中,該承載板20係為基材,例如銅箔基板或其它板體,並無特別限制。 In the present embodiment, the carrier 20 is a substrate, such as a copper foil substrate or other plate, and is not particularly limited.
再者,該承載板20之表面定義有相鄰接之主要區20a與輔助區20b。 Furthermore, the surface of the carrier plate 20 defines adjacent main regions 20a and auxiliary regions 20b.
又,該第一線路層21係形成於該輔助區20b上,且包含複數電性連接墊210。 Moreover, the first circuit layer 21 is formed on the auxiliary region 20b and includes a plurality of electrical connection pads 210.
另外,該圖案化製程係包含形成光阻、曝光與顯影、電鍍銅、移除光阻等流程。 In addition, the patterning process includes processes of forming photoresist, exposing and developing, electroplating copper, removing photoresist, and the like.
如第2B圖所示,於該承載板20之主要區20a上藉由黏著層200設置一線路板體24,其中,該線路板體24係為細線路板的半成品。 As shown in FIG. 2B, a circuit board body 24 is disposed on the main area 20a of the carrier board 20 by the adhesive layer 200, wherein the circuit board body 24 is a semi-finished product of the thin circuit board.
於本實施例中,該線路板體24具有兩層佈線層240,240’及用以埋設該佈線層240,240’之兩層材質相同的第二絕緣層241,241’,且各該佈線層240,240’係包含複數 導電跡線240a,240a’與複數電性連接該導電跡線240a,240a’之導電盲孔240b,240b’,其中,部分導電盲孔240b係用以作為兩層導電跡線240a,240a’之間的電性連接。 In the present embodiment, the circuit board body 24 has two wiring layers 240, 240' and two second insulating layers 241, 241' for burying the two wiring layers 240, 240', and each of the wiring layers 240, 240' includes plural The conductive traces 240a, 240a' are electrically connected to the conductive vias 240b, 240b' of the conductive traces 240a, 240a', wherein the conductive vias 240b are used as the two conductive traces 240a, 240a' Electrical connection between the two.
再者,其中一佈線層240之導電跡線240a(下層者)係外露於該第二絕緣層241之一側(下側),而部分導電盲孔240b’(上層者)係外露於該第二絕緣層241’之一側(上側)。或者,部分導電盲孔240b’(上層者)亦可不外露於該第二絕緣層241’之一側(上側)。 Furthermore, one of the conductive traces 240a (lower layer) of the wiring layer 240 is exposed on one side (lower side) of the second insulating layer 241, and a part of the conductive blind via 240b' (upper layer) is exposed to the first One side (upper side) of the second insulating layer 241'. Alternatively, the portion of the conductive via hole 240b' (upper layer) may not be exposed on one side (upper side) of the second insulating layer 241'.
又,該線路板體24之佈線層之層數可依需求製作,並不限於上述。 Further, the number of layers of the wiring layer of the wiring board body 24 can be produced as needed, and is not limited to the above.
本發明之製法係於一次製程(即製作該線路板體24)中完成細線路板的半成品,故可減少細線路材料之使用量,以降低製作成本。 The method of the invention is to complete the semi-finished product of the thin circuit board in one process (that is, to fabricate the circuit board body 24), so that the use amount of the fine circuit material can be reduced to reduce the manufacturing cost.
如第2C圖所示,藉由圖案化製程於該第一線路層21上形成複數導電柱體25,再於該承載板20上形成一具有相對之第一表面23a及第二表面23b的第一絕緣層23,以令該第一絕緣層23包覆該第一線路層21、該些導電柱體25與該線路板體24,且該第一絕緣層23係藉其第一表面23a結合至該承載板20上。 As shown in FIG. 2C, a plurality of conductive pillars 25 are formed on the first circuit layer 21 by a patterning process, and a first surface 23a and a second surface 23b are formed on the carrier board 20. An insulating layer 23, such that the first insulating layer 23 covers the first circuit layer 21, the conductive pillars 25 and the circuit board body 24, and the first insulating layer 23 is bonded by the first surface 23a thereof. To the carrier board 20.
於本實施例中,該圖案化製程係包含形成光阻、曝光與顯影、電鍍銅、移除光阻等流程,故該導電柱體25係為銅柱。 In this embodiment, the patterning process includes a process of forming photoresist, exposing and developing, electroplating copper, removing photoresist, etc., so the conductive pillar 25 is a copper pillar.
再者,該第一線路層21之表面21a係齊平該第一絕緣 層23之第一表面23a,且該些導電柱體25之一端面25a係外露於該第一絕緣層23之第二表面23b。 Furthermore, the surface 21a of the first circuit layer 21 is flush with the first insulation The first surface 23a of the layer 23 and the end surface 25a of the conductive pillars 25 are exposed on the second surface 23b of the first insulating layer 23.
又,該第一絕緣層23係以壓合或鑄模(molding)方式製作,再進行整平,使該些導電柱體25之一端面25a齊平該第一絕緣層23之第二表面23b。 Moreover, the first insulating layer 23 is formed by press-bonding or molding, and is then leveled so that one end surface 25a of the conductive pillars 25 is flush with the second surface 23b of the first insulating layer 23.
另外,該第一絕緣層23係為鑄模化合物(molding compound)、介電材、如環氧樹脂(Epoxy)、聚醯亞胺(Polyimide,簡稱PI)、其它感光或非感光性材料等之有機樹脂,且該第二絕緣層241,241’之材質與該第一絕緣層23之材質不同,例如,如第2C’圖所示,該第二絕緣層241之材料之顆粒d之體積遠小於該第一絕緣層23之材料之顆粒t之體積。 In addition, the first insulating layer 23 is a molding compound, a dielectric material, an epoxy resin (Epoxy), a polyimide (PI), and other photosensitive or non-photosensitive materials. Resin, and the material of the second insulating layer 241, 241' is different from the material of the first insulating layer 23. For example, as shown in FIG. 2C', the volume of the material d of the material of the second insulating layer 241 is much smaller than the first The volume of the particles t of the material of an insulating layer 23.
於一實施例中,若於第2B圖之製程中,部分導電盲孔240b’未外露於該第二絕緣層241’之一側,此時可利用整平該第一絕緣層23之製程,使部分導電盲孔240b’外露於該第二絕緣層241’之一側。 In an embodiment, in the process of FIG. 2B, a portion of the conductive via hole 240b' is not exposed on one side of the second insulating layer 241', and a process of leveling the first insulating layer 23 may be utilized. A portion of the conductive via hole 240b' is exposed on one side of the second insulating layer 241'.
如第2D圖所示,於該線路板體24與該第一絕緣層23之第二表面23b上藉由圖案化製程形成一第二線路層22,且該第二線路層22電性連接該佈線層240’之導電盲孔240b’,並使該第二線路層22藉由該些導電柱體25電性連接該第一線路層21。接著,於該第二線路層22上藉由圖案化製程形成複數導電凸塊26,再於該線路板體24與該第一絕緣層23之第二表面23b上形成一絕緣保護層27,以令該絕緣保護層27包覆該第二線路層22,且令該些導 電凸塊26外露於該絕緣保護層27。 As shown in FIG. 2D, a second circuit layer 22 is formed on the second surface 23b of the circuit board body 24 and the first insulating layer 23 by a patterning process, and the second circuit layer 22 is electrically connected to the second circuit layer 22. The conductive vias 240b' of the wiring layer 240' are electrically connected to the first wiring layer 21 by the conductive pillars 25. Then, a plurality of conductive bumps 26 are formed on the second circuit layer 22 by a patterning process, and an insulating protective layer 27 is formed on the circuit board body 24 and the second surface 23b of the first insulating layer 23 to The insulating protective layer 27 is wrapped around the second wiring layer 22, and the guiding The electrical bumps 26 are exposed to the insulating protective layer 27.
於本實施例中,該第二線路層22係直接連接該導電盲孔240b’、該些導電柱體25與導電凸塊26。 In this embodiment, the second circuit layer 22 is directly connected to the conductive vias 240b', the conductive pillars 25 and the conductive bumps 26.
再者,該絕緣保護層27係以壓合或鑄模(molding)方式製作,且該絕緣保護層27係為鑄模化合物(molding compound)、介電材、如環氧樹脂(Epoxy)、聚醯亞胺(Polyimide,簡稱PI)、其它感光或非感光性材料等之有機樹脂、或防焊層(solder mask)。 Furthermore, the insulating protective layer 27 is formed by pressing or molding, and the insulating protective layer 27 is a molding compound, a dielectric material, such as an epoxy resin (Epoxy), or a poly An organic resin such as Polyimide (PI), other photosensitive or non-photosensitive materials, or a solder mask.
又,該絕緣保護層27之製作方式可先覆蓋該第二線路層22與該些導電凸塊26,再整平該絕緣保護層27(之後可依需求蝕刻該些導電凸塊26之頂面),使該絕緣保護層27之表面可齊平或不齊平該些導電凸塊26之頂面,以外露該些導電凸塊26之頂面。或者,該絕緣保護層27之製作方式可先覆蓋該第二線路層22與該些導電凸塊26,再於該絕緣保護層27上形成複數開孔,使該些導電凸塊26外露於該些開孔。 Moreover, the insulating protective layer 27 can be formed by first covering the second circuit layer 22 and the conductive bumps 26, and then leveling the insulating protective layer 27 (the top surface of the conductive bumps 26 can be etched as needed). The surface of the insulating protective layer 27 may be flush or not flush with the top surface of the conductive bumps 26 to expose the top surfaces of the conductive bumps 26. Alternatively, the insulating protective layer 27 can be formed by covering the second circuit layer 22 and the conductive bumps 26, and forming a plurality of openings on the insulating protective layer 27 to expose the conductive bumps 26 to the conductive bumps 26. Some openings.
如第2E圖所示,移除該承載板20及該黏著層200,以外露該第一線路層21與該佈線層240之導電跡線240a。 As shown in FIG. 2E, the carrier board 20 and the adhesive layer 200 are removed, and the conductive traces 240a of the first circuit layer 21 and the wiring layer 240 are exposed.
於本實施例中,該線路板體24之表面低於該第一絕緣層23之第一表面23a;於其它實施例中,該線路板體24之表面可等於該第一絕緣層23之第一表面23a。 In this embodiment, the surface of the circuit board body 24 is lower than the first surface 23a of the first insulating layer 23. In other embodiments, the surface of the circuit board body 24 may be equal to the first insulating layer 23. A surface 23a.
本發明之基板結構2係於一標準基板製程中埋入一細線路半成品(如該線路板體24),之後再製作增層,以形成一不對稱結構,例如,該線路板體24具有兩層佈線層 240,240’,而於該第一絕緣層23中僅具有一線路構造(即該第一線路層21與導電柱體25),即多層佈線層240,240’對應一層線路構造。 The substrate structure 2 of the present invention is embedded in a standard substrate process to embed a fine line semi-finished product (such as the circuit board body 24), and then layered to form an asymmetric structure. For example, the circuit board body 24 has two Layer wiring layer 240, 240', and having only one line structure (i.e., the first circuit layer 21 and the conductive pillar 25) in the first insulating layer 23, that is, the multilayer wiring layers 240, 240' correspond to a layer structure.
再者,該基板結構2因已將細線路形成於該線路板體24中,故可依需求設計該線路板體24之佈線層240,240’(即細線路)之層數。因此,於該第一絕緣層23中,可減少該基板結構2之線路層之層數,故相較於習知技術,該基板結構2之線路部之層數較少,因而能降低整體結構之厚度。 Further, since the substrate structure 2 has been formed in the wiring board 24, the number of layers of the wiring layers 240, 240' (i.e., thin wiring) of the wiring board 24 can be designed as required. Therefore, in the first insulating layer 23, the number of layers of the circuit layer of the substrate structure 2 can be reduced, so that the number of layers of the circuit portion of the substrate structure 2 is smaller than that of the prior art, thereby reducing the overall structure. The thickness.
又,該線路板體24之多層佈線層240,240’已滿足細線路之層數需求,故於該第一絕緣層23之兩側,可僅形成兩層線路層(如第一線路層21與第二線路層22)即可。因此,於該基板結構2中,上、下兩側之線路層分別為第一線路層21與第二線路層22,因而部分該導電柱體25可視為導電通孔,故相較於習知技術,該基板結構2具有一體成型之導電通孔(即該導電柱體25),因而無對位之問題。 Moreover, the plurality of wiring layers 240, 240' of the circuit board body 24 have satisfied the number of layers of the thin circuit. Therefore, on both sides of the first insulating layer 23, only two circuit layers (such as the first circuit layer 21 and the first layer) can be formed. The second circuit layer 22) is sufficient. Therefore, in the substrate structure 2, the circuit layers on the upper and lower sides are the first circuit layer 21 and the second circuit layer 22, respectively, and thus some of the conductive pillars 25 can be regarded as conductive vias, so that compared with the conventional ones, In the technology, the substrate structure 2 has an integrally formed conductive via (ie, the conductive pillar 25), and thus there is no problem of alignment.
如第2F圖所示,於該第一絕緣層23之第一表面23a之側上植設複數導電元件28,29,以藉由該些導電元件28,29結合電子元件。 As shown in FIG. 2F, a plurality of conductive elements 28, 29 are implanted on the side of the first surface 23a of the first insulating layer 23 to bond the electronic components by the conductive elements 28, 29.
於本實施例中,部分導電元件28係設於該線路板體24上且電性連接該佈線層240之導電跡線240a,以藉由部分導電元件28結合第一電子元件31。 In this embodiment, a portion of the conductive component 28 is disposed on the circuit board body 24 and electrically connected to the conductive trace 240a of the wiring layer 240 to bond the first electronic component 31 by the partial conductive component 28.
再者,部分導電元件29係設於該第一線路層21之電性連接墊210上且電性連接該該第一線路層21,以藉由該 些導電元件29結合第二電子元件32。 In addition, a portion of the conductive element 29 is disposed on the electrical connection pad 210 of the first circuit layer 21 and electrically connected to the first circuit layer 21. The conductive elements 29 are combined with the second electronic component 32.
又,亦可形成複數導電元件30於該絕緣保護層27上,且該些導電元件30電性連接該些導電凸塊26,以藉由該些導電元件30結合如電路板之電子裝置(圖略)。 In addition, a plurality of conductive elements 30 may be formed on the insulating protective layer 27, and the conductive elements 30 are electrically connected to the conductive bumps 26 to bond electronic components such as circuit boards by the conductive elements 30 (Fig. slightly).
另外,該些導電元件28,29,30係如焊球、焊錫凸塊、銅凸塊等,且該第一電子元件31係為主動元件,如半導體晶片,而該第二電子元件32係為被動元件,如電容、電感、電阻等。 In addition, the conductive elements 28, 29, 30 are solder balls, solder bumps, copper bumps, etc., and the first electronic component 31 is an active component, such as a semiconductor wafer, and the second electronic component 32 is Passive components such as capacitors, inductors, resistors, etc.
於後續製程中,可形成封裝材(圖略,可考參第1圖所示之封裝材9)於該第一絕緣層23之第一表面23a上,以包覆該第一電子元件31與該第二電子元件32。 In the subsequent process, a package material (not shown, which can be referred to as the package material 9 shown in FIG. 1 ) is formed on the first surface 23 a of the first insulating layer 23 to cover the first electronic component 31 and The second electronic component 32.
綜上所述,本發明之基板結構2係利用先製作該線路板體24,再將該線路板體24導入一般基板製程中,即高階製程(如該線路板體24、或電性連接高階晶片之細線路)與低階製程(如電性連接被動元件之增層線路)分開製作,再結合成一成品(即該基板結構2)。 In summary, the substrate structure 2 of the present invention utilizes the circuit board body 24 first, and then the circuit board body 24 is introduced into a general substrate process, that is, a high-order process (such as the circuit board body 24, or a high-level electrical connection). The fine lines of the wafer are fabricated separately from the low-order processes (such as the build-up lines electrically connected to the passive components) and then combined into a finished product (ie, the substrate structure 2).
因此,本發明之基板結構2僅於該線路板體24中使用成本較高之第二絕緣層241,而該第一絕緣層23則採用較便宜之材料製作,亦即用以設置被動元件(第二電子元件32)之非細線路區無需配合細線路區(即該線路板體24)使用高階材料,故能降低本發明之基板結構2之製作成本。 Therefore, the substrate structure 2 of the present invention uses only the second insulating layer 241 which is relatively expensive in the circuit board body 24, and the first insulating layer 23 is made of a relatively inexpensive material, that is, for providing a passive component ( The non-fine line region of the second electronic component 32) does not need to be used with the fine wiring region (i.e., the wiring board body 24) to use a high-order material, so that the manufacturing cost of the substrate structure 2 of the present invention can be reduced.
上述實施例係用以例示性說明本發明之原理及其功效,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修 改。因此本發明之權利保護範圍,應如後述之申請專利範圍所列。 The above embodiments are intended to illustrate the principles of the invention and its effects, and are not intended to limit the invention. Anyone skilled in the art can modify the above embodiments without departing from the spirit and scope of the present invention. change. Therefore, the scope of protection of the present invention should be as set forth in the appended claims.
2‧‧‧基板結構 2‧‧‧Substrate structure
21‧‧‧第一線路層 21‧‧‧First line layer
22‧‧‧第二線路層 22‧‧‧Second circuit layer
23‧‧‧第一絕緣層 23‧‧‧First insulation
23a‧‧‧第一表面 23a‧‧‧ first surface
23b‧‧‧第二表面 23b‧‧‧ second surface
24‧‧‧線路板體 24‧‧‧Circuit board
240,240’‧‧‧佈線層 240,240’‧‧‧ wiring layer
240a,240a’‧‧‧導電跡線 240a, 240a’‧‧‧ conductive traces
240b,240b’‧‧‧導電盲孔 240b, 240b’‧‧‧ conductive blind holes
241,241’‧‧‧第二絕緣層 241,241'‧‧‧Second insulation
25‧‧‧導電柱體 25‧‧‧Electrical cylinder
26‧‧‧導電凸塊 26‧‧‧Electrical bumps
27‧‧‧絕緣保護層 27‧‧‧Insulation protective layer
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