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TWI488272B - 線路板及晶片封裝結構 - Google Patents

線路板及晶片封裝結構 Download PDF

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TWI488272B
TWI488272B TW098105656A TW98105656A TWI488272B TW I488272 B TWI488272 B TW I488272B TW 098105656 A TW098105656 A TW 098105656A TW 98105656 A TW98105656 A TW 98105656A TW I488272 B TWI488272 B TW I488272B
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pad
trace
fixed
adjacent
circuit board
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TW098105656A
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TW201032305A (en
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Ko Wei Lin
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Advanced Semiconductor Eng
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Priority to US12/554,340 priority patent/US8389869B2/en
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/111Pads for surface mounting, e.g. lay-out
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/563Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • H01L23/3128Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49838Geometry or layout
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09209Shape and layout details of conductors
    • H05K2201/09654Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
    • H05K2201/09781Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09818Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/0989Coating free areas, e.g. areas other than pads or lands free of solder resist
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10734Ball grid array [BGA]; Bump grid array
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3452Solder masks
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Geometry (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Wire Bonding (AREA)

Description

線路板及晶片封裝結構
本發明是有關於一種線路板及晶片封裝結構,且特別是有關於一種具有非焊罩定義型之接墊的線路板及晶片封裝結構。
覆晶接合技術(Flip Chip Bonding Technology)主要是以面陣列(area array)的排列方式,將多個晶片墊(die pad)配置於晶片(die)之主動表面(active surface),並在這些晶片墊上分別形成多個凸塊(bump),接著,將晶片翻面(flip),然後,使晶片上的凸塊分別電性(electrically)及機械性(mechanically)連接至一晶片載板上的多個接墊(bonding pad)。
晶片載板上的接墊型態可依照焊罩層(Solder Mask)是否覆蓋接墊而大致區分為「焊罩定義(Solder Mask Defined,SMD)」及「非焊罩定義(Non-Solder Mask Defined,NSMD)」兩種類型,其中NSMD又可稱為接墊定義(Pad Defined)。就非焊罩定義型的接墊而言,由於焊罩層的開口會完全暴露出接墊,所以無法藉由焊罩層將接墊固定在晶片載板的基板上,以致於接墊容易剝離。
本發明提供一種線路板,其非焊罩定義型之接墊不易剝離。
本發明提供一種晶片封裝結構,其晶片與線路板的接點密度較高。
本發明提出一種線路板包括一基板、一導電圖案與一焊罩層。導電圖案配置於基板上,導電圖案包括一第一接墊、一第一固定跡線與一第一訊號跡線。第一固定跡線與第一接墊的邊緣相連。第一訊號跡線與第一接墊的邊緣相連,且第一訊號跡線之鄰近第一接墊的部分與第一固定跡線之間形成一夾角,夾角大於0度並小於180度。焊罩層配置於基板上並覆蓋部分導電圖案,焊罩層具有一第一開口,第一開口完全暴露出第一接墊。
在本發明之一實施例中,夾角大於等於135度並小於180度。
在本發明之一實施例中,第一開口暴露出第一訊號跡線之鄰近第一接墊的部分以及第一固定跡線之鄰近第一接墊的部分。
在本發明之一實施例中,導電圖案更包括一第二接墊、一第二固定跡線與一第二訊號跡線,其中第二固定跡線與第二接墊的邊緣相連,第二訊號跡線與第二接墊的邊緣相連,且第二訊號跡線之鄰近第二接墊的部分與第二固定跡線之間的夾角為180度。焊罩層更具有一第二開口,第二開口完全暴露出第二接墊。
在本發明之一實施例中,第二開口暴露出第二訊號跡線之鄰近第二接墊的部分以及第二固定跡線之鄰近第二接墊的部分。
本發明提出一種晶片封裝結構包括一線路板、一晶片、一第一導電凸塊與一封裝膠體。線路板包括一基板、一導電圖案與一焊罩層。導電圖案配置於基板上,導電圖案包括一第一接墊、一第一固定跡線與一第一訊號跡線。第一固定跡線與第一接墊的邊緣相連。第一訊號跡線與第一接墊的邊緣相連,且第一訊號跡線之鄰近第一接墊的部分與第一固定跡線之間形成一夾角,夾角大於0度並小於180度。焊罩層配置於基板上並覆蓋部分導電圖案,焊罩層具有一第一開口,第一開口完全暴露出第一接墊。第一導電凸塊配置於晶片與第一接墊之間。封裝膠體包覆晶片與第一導電凸塊。
在本發明之一實施例中,夾角大於等於135度並小於180度。
在本發明之一實施例中,第一開口暴露出第一訊號跡線之鄰近第一接墊的部分以及第一固定跡線之鄰近第一接墊的部分。
在本發明之一實施例中,晶片封裝結構更包括一第二導電凸塊,其中導電圖案更包括一第二接墊、一第二固定跡線與一第二訊號跡線,其中第二固定跡線與第二接墊的邊緣相連,第二訊號跡線與第二接墊的邊緣相連,且第二訊號跡線之鄰近第二接墊的部分與第二固定跡線之間的夾角為180度。焊罩層更具有一第二開口,第二開口完全暴露出第二接墊。第二導電凸塊配置於第二接墊與晶片之間,且封裝膠體更包覆第二導電凸塊。
在本發明之一實施例中,第二開口暴露出第二訊號跡線之鄰近第二接墊的部分以及第二固定跡線之鄰近第二接墊的部分。
在本發明之一實施例中,封裝膠體的側壁與線路板的側壁實質上切齊。
在本發明之一實施例中,晶片封裝結構更包括一底膠,其填滿於晶片與線路板之間,並包覆第一導電凸塊。
在本發明之一實施例中,第一導電凸塊包括一銅凸塊或一焊料凸塊。
基於上述,本發明與接墊相連且焊罩層所部分覆蓋的固定跡線有助於使接墊固定在基板上。再者,由於訊號跡線之鄰近接墊的部分與固定跡線之間可形成一大於0度並小於180度的夾角,所以固定跡線可任意地配置於相鄰的接墊與訊號跡線之間,進而可提升線路板之線路佈局的自由度及接墊的密度。
為讓本發明之上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。
圖1A繪示本發明一實施例之線路板的局部俯視圖,圖1B繪示圖1A之線路板沿I-I線的剖面圖。請參照圖1A及圖1B,本實施例之線路板包括一基板110、一導電圖案120與一焊罩層130。導電圖案120配置於基板110上,導電圖案120包括多個接墊122a、多個固定跡線122b與多個訊號跡線122c。固定跡線122b連接至接墊122a的邊緣。訊號跡線122c連接至接墊122a的邊緣,且訊號跡線122c之鄰近接墊122a的部分與固定跡線122b之間形成一夾角θ 1,夾角θ 1大於0度並小於180度。夾角θ 1例如是大於等於135度並小於180度。
此外,在本實施例中,導電圖案120還可選擇性地包括多個接墊124a、多個固定跡線124b與多個訊號跡線124c。固定跡線124b連接至接墊124a的邊緣,訊號跡線124c連接至接墊124a的邊緣。訊號跡線124c之鄰近接墊124a的部分與固定跡線124b之間的夾角θ 2為180度,換言之,訊號跡線124c之鄰近接墊124a的部分與固定跡線124b可位於同一直線上。
本實施例的固定跡線122b、124b可分別具有彼此相對的一第一端123,127與一第二端125,129,其中該第一端123,127分別與該接墊122a,124a的邊緣相連。
焊罩層130配置於基板110上並覆蓋部分導電圖案120。具體而言,焊罩層130具有多個開口132與多個開口134,其中開口132完全暴露出接墊122a,而開口134完全暴露出接墊124a。詳細而言,在本實施例中,開口132還暴露出訊號跡線122c之鄰近接墊122a的部分、固定跡線122b之鄰近接墊122a的部分以及基板110之位於接墊122a周邊的部分。此外,開口134還暴露出訊號跡線124c之鄰近接墊124a的部分、固定跡線124b之鄰近接墊124a的部分以及基板110之位於接墊124a周邊的部分。
值得注意的是,由於本實施例的固定跡線122b、124b 與接墊122a、124a相連且焊罩層130部分覆蓋固定跡線122b、124b,亦即,該焊罩層130可包覆該固定跡線122b、124b的第二端125,129,所以固定跡線122b、124b有助於使接墊122a、124a固定在基板110上。再者,由於訊號跡線122c之鄰近接墊122a的部分與固定跡線122b之間可形成一大於0度並小於180度的夾角θ 1,因此固定跡線122b可任意地配置於相鄰的接墊122a與訊號跡線122c之間,而不會妨礙接墊122a與訊號跡線122c的配置,進而可提升線路佈局的自由度以及接墊122a的密度。
圖2繪示本發明一實施例之晶片封裝結構的剖面圖。請參照圖2,本實施例之晶片封裝結構200包括一線路板100、一晶片210、多個導電凸塊220與一封裝膠體230。值得注意的是,本實施例之線路板100相同於圖1A之線路板100,故於此不再贅述。
導電凸塊220配置於晶片210與接墊122a之間,以電性連接晶片210與線路板100。此外,在本實施例中,還可在接墊124a與晶片210之間配置一導電凸塊240。導電凸塊220、240例如為銅凸塊或焊料凸塊。在本實施例中,為保護導電凸塊220、240,可在晶片210與線路板100之間填入一底膠250,以包覆導電凸塊220、240。
封裝膠體230包覆晶片210與導電凸塊220、240,以保護晶片210與導電凸塊220、240免於受到外界環境的污染或者是濕氣的影響。在本實施例中,封裝膠體230的側壁332與線路板100的側壁140實質上切齊。
值得注意的是,由於線路板100具有較高的接墊密度,所以晶片210的接墊密度亦可隨之增加,以縮小晶片 210的尺寸,進而降低製作成本。
綜上所述,本發明與接墊相連且焊罩層所部分覆蓋的固定跡線有助於使接墊固定在基板上。再者,由於訊號跡線之鄰近接墊的部分與固定跡線之間可形成一大於0度並小於180度的夾角,所以固定跡線可任意地配置於相鄰的接墊與訊號跡線之間,進而可提升線路板之線路佈局的自由度及接墊的密度。此外,由於本發明之線路板具有較高的接墊密度,所以覆晶接合至線路板上的晶片的接墊密度亦可隨之增加,以縮小晶片的尺寸,進而降低製作成本。
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,故本發明之保護範圍當視後附之申請專利範圍所界定者為準。
100‧‧‧線路板
110‧‧‧基板
120‧‧‧導電圖案
122a‧‧‧接墊
122b‧‧‧固定跡線
122c‧‧‧訊號跡線
123‧‧‧固定跡線122b之第一端
124a‧‧‧接墊
124b‧‧‧固定跡線
124c‧‧‧訊號跡線
125‧‧‧固定跡線122b之第二端
127‧‧‧固定跡線124b之第二端
129‧‧‧固定跡線124b之第二端
130‧‧‧焊罩層
132‧‧‧開口
134‧‧‧開口
140‧‧‧側壁
200‧‧‧晶片封裝結構
210‧‧‧晶片
220‧‧‧導電凸塊
230‧‧‧封裝膠體
240‧‧‧導電凸塊
250‧‧‧底膠
θ 1‧‧‧夾角
θ 2‧‧‧夾角
圖1A繪示本發明一實施例之線路板的局部俯視圖。
圖1B繪示圖1A之線路板沿I-I線的剖面圖。
圖2繪示本發明一實施例之晶片封裝結構的剖面圖。
100...線路板
110...基板
120...導電圖案
122a...接墊
122b...固定跡線
122c...訊號跡線
124a...接墊
124b...固定跡線
124c...訊號跡線
130...焊罩層
132...開口
134...開口
θ1...夾角
θ2...夾角

Claims (13)

  1. 一種線路板,包括:一基板;一導電圖案,配置於該基板上,該導電圖案包括:一第一接墊,為實心圓形接墊;一第一固定跡線,具有彼此相對的一第一端與一第二端,其中該第一端與該第一接墊的邊緣相連;一第一訊號跡線,與該第一接墊的邊緣相連,且該第一訊號跡線之鄰近該第一接墊的部分與該第一固定跡線之間形成一夾角,該夾角大於0度並小於180度;以及一焊罩層,配置於該基板上並覆蓋部分該導電圖案,該焊罩層具有一第一開口,該第一開口完全暴露出該第一接墊,且該焊罩層包覆該第一固定跡線的該第二端。
  2. 如申請專利範圍第1項所述之線路板,其中該夾角大於等於135度並小於180度。
  3. 如申請專利範圍第1項所述之線路板,其中該第一開口暴露出該第一訊號跡線之鄰近該第一接墊的部分以及該第一固定跡線之鄰近該第一接墊的部分。
  4. 如申請專利範圍第1項所述之線路板,其中該導電圖案更包括:一第二接墊;一第二固定跡線,與該第二接墊的邊緣相連;以及一第二訊號跡線,與該第二接墊的邊緣相連,且該第 二訊號跡線之鄰近該第二接墊的部分與該第二固定跡線之間的夾角為180度,其中,該焊罩層更具有一第二開口,該第二開口完全暴露出該第二接墊。
  5. 如申請專利範圍第4項所述之線路板,其中該第二開口暴露出該第二訊號跡線之鄰近該第二接墊的部分以及該第二固定跡線之鄰近該第二接墊的部分。
  6. 一種晶片封裝結構,包括:一線路板,該線路板包括:一基板;一導電圖案,配置於該基板上,該導電圖案包括:一第一接墊,為實心圓形接墊;一第一固定跡線,具有彼此相對的一第一端與一第二端,其中該第一端與該第一接墊的邊緣相連;一第一訊號跡線,與該第一接墊的邊緣相連,且該第一訊號跡線之鄰近該第一接墊的部分與該第一固定跡線之間形成一夾角,該夾角大於0度並小於180度;一焊罩層,配置於該基板上並覆蓋部分該導電圖案,該焊罩層具有一第一開口,該第一開口完全暴露出該第一接墊,且該焊罩層包覆該第一固定跡線的該第二端;一晶片; 一第一導電凸塊,配置於該晶片與該第一接墊之間;以及一封裝膠體,包覆該晶片與該第一導電凸塊。
  7. 如申請專利範圍第6項所述之晶片封裝結構,其中該夾角大於等於135度並小於180度。
  8. 如申請專利範圍第6項所述之晶片封裝結構,其中該第一開口暴露出該第一訊號跡線之鄰近該第一接墊的部分以及該第一固定跡線之鄰近該第一接墊的部分。
  9. 如申請專利範圍第6項所述之晶片封裝結構,更包括:一第二導電凸塊,其中該導電圖案更包括:一第二接墊;一第二固定跡線,與該第二接墊的邊緣相連;以及一第二訊號跡線,與該第二接墊的邊緣相連,且該第二訊號跡線之鄰近該第二接墊的部分與該第二固定跡線之間的夾角為180度,其中,該焊罩層更具有一第二開口,該第二開口完全暴露出該第二接墊,該第二導電凸塊配置於該第二接墊與該晶片之間,且該封裝膠體更包覆該第二導電凸塊。
  10. 如申請專利範圍第9項所述之晶片封裝結構,其中該第二開口暴露出該第二訊號跡線之鄰近該第二接墊的部分以及該第二固定跡線之鄰近該第二接墊的部分。
  11. 如申請專利範圍第6項所述之晶片封裝結構,其 中該封裝膠體的側壁與該線路板的側壁實質上切齊。
  12. 如申請專利範圍第6項所述之晶片封裝結構,更包括:一底膠,填滿於該晶片與該線路板之間,並包覆該第一導電凸塊。
  13. 如申請專利範圍第6項所述之晶片封裝結構,其中該第一導電凸塊包括一銅凸塊或一焊料凸塊。
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