TWI428971B - Method and apparatus for breaking workpiece, scribing and breaking method, and scribing apparatus with breaking function - Google Patents
Method and apparatus for breaking workpiece, scribing and breaking method, and scribing apparatus with breaking function Download PDFInfo
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- TWI428971B TWI428971B TW095100127A TW95100127A TWI428971B TW I428971 B TWI428971 B TW I428971B TW 095100127 A TW095100127 A TW 095100127A TW 95100127 A TW95100127 A TW 95100127A TW I428971 B TWI428971 B TW I428971B
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- 238000000034 method Methods 0.000 title claims description 47
- 238000005452 bending Methods 0.000 claims description 46
- 238000001179 sorption measurement Methods 0.000 claims description 39
- 235000012431 wafers Nutrition 0.000 claims description 29
- 239000000463 material Substances 0.000 claims description 9
- 238000003776 cleavage reaction Methods 0.000 claims description 8
- 230000007017 scission Effects 0.000 claims description 8
- 239000011521 glass Substances 0.000 description 17
- 239000000758 substrate Substances 0.000 description 14
- 238000003825 pressing Methods 0.000 description 9
- 239000004065 semiconductor Substances 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000007935 neutral effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 239000004840 adhesive resin Substances 0.000 description 1
- 229920006223 adhesive resin Polymers 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 210000003298 dental enamel Anatomy 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000013001 point bending Methods 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/023—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
- C03B33/033—Apparatus for opening score lines in glass sheets
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2249/00—Aspects relating to conveying systems for the manufacture of fragile sheets
- B65G2249/04—Arrangements of vacuum systems or suction cups
- B65G2249/045—Details of suction cups suction cups
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Dicing (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
Description
本發明係關於對由半導體晶圓、玻璃等脆性材料所構成工件施行裂片(Break)的工件之裂片方法及裝置、刻劃(Scribe)及裂片方法暨附裂片功能之刻劃裝置。The present invention relates to a sharding method and apparatus for a workpiece which is subjected to a rupture of a workpiece composed of a brittle material such as a semiconductor wafer or glass, a scribing method, a slashing method, and a scribing method.
將由半導體晶圓、玻璃等脆性材料所構成的工件,裂斷(切斷)成既定形狀的方法,有採用將工件送入於旋轉刀中,而斷裂成細小方塊狀(small cubes)的切割(dicing)方法。該切割方法中,工件被送入旋轉刀中部分的體積式被去除。A method of cutting (cutting) a workpiece made of a brittle material such as a semiconductor wafer or glass into a predetermined shape, and cutting the workpiece into a rotating blade to break into small cubes. (dicing) method. In the cutting method, the volumetric form in which the workpiece is fed into the rotary blade is removed.
近年,已有取代切割方法,改採在工件表面經利用刻劃裝置刻劃出刻劃線之後,再利用裂片裝置沿刻劃線使裂痕成長而將工件裂片的方法(例如參照專利文獻1、段落[0001]~[0004])。In recent years, there has been a method of replacing the cutting method, which has been used to sculpt a workpiece by slashing the surface of the workpiece with a scribing device, and then using a dicing device to grow the crack along the scribe line (for example, refer to Patent Document 1 Paragraphs [0001]~[0004]).
圖29所示係習知裂片方法的原理圖。該裂片方法中,在2個支撐點1a、1b間載置著工件2,並利用裂片頭3(breaking head)從上方向對支撐點1a、1b間施以加壓力。加壓力係從刻劃線所刻劃側的背後側施加。藉由對支撐點1a、1b間施以加壓力,使工件2發生彎曲力矩(bending moment),俾藉由該彎曲力矩使刻劃線所刻劃的部分處發生拉伸應力。藉由該拉伸應力,刻劃線的裂痕從表面朝項背面(在圖29中係從下朝上)進展。若裂痕到達工件背面,工件便被斷裂。Figure 29 is a schematic diagram of a conventional splitting method. In the splitting method, the workpiece 2 is placed between the two support points 1a and 1b, and a pressing force is applied between the support points 1a and 1b from the upper side by the breaking head 3 (breaking head). The applied pressure is applied from the back side of the scored side of the score line. By applying a pressing force between the support points 1a and 1b, the workpiece 2 is subjected to a bending moment, and a tensile stress is generated at a portion where the score line is scored by the bending moment. With this tensile stress, the crack of the score line progresses from the surface toward the back side of the item (from bottom to top in Fig. 29). If the crack reaches the back of the workpiece, the workpiece is broken.
但是,在圖29所示習知裂片方法中,當施行裂片之際,在工件背面經斷裂的工件間將相互摩擦,導致在圖中A部所示工件背面發生碎裂(chipping)(細片缺損現象)狀況。此外,若來自裂片頭的加壓力增加,亦將導致工件出現變形的肇因。However, in the conventional splitting method shown in Fig. 29, when the split is applied, the workpieces which are broken on the back surface of the workpiece are rubbed against each other, causing chipping on the back surface of the workpiece shown in Part A of the figure (slices) Defective condition). In addition, if the pressing force from the split head increases, it will also cause the deformation of the workpiece.
解決此項問題的技術有如圖30所示,在專利文獻2中揭示:「將由一對玻璃基板S1、S2接合而成的玻璃基板接合體W,以沿每個晶胞(cell)的斷裂線形成缺口溝的玻璃基板S1表面朝上,並載置於球面支撐頭71上,在對其覆蓋安裝具充分可撓性的按押片材73,並透過排氣管71b,將收容著由按押片材73與支撐頭表面71a等,所包圍的玻璃基板接合體W之空間內的空氣排放出,俾使玻璃基板接合體W密接於形成球面的支撐頭表面71a,而將玻璃基板S1沿缺口溝進行斷裂的方法」(參照專利文獻2、申請專利範圍1)。A technique for solving this problem is as shown in FIG. 30. Patent Document 2 discloses that "the glass substrate assembly W joined by a pair of glass substrates S1 and S2 has a fracture line along each cell. The glass substrate S1 forming the notch groove faces upward and is placed on the spherical support head 71, and is covered with a sufficiently flexible push-pull sheet 73, and is passed through the exhaust pipe 71b. The sheet material 73 and the support head surface 71a and the like, the air in the space of the glass substrate assembly W enclosed therein is discharged, so that the glass substrate assembly W is adhered to the spherical support surface 71a, and the glass substrate S1 is placed along the surface. A method of breaking a notch groove" (see Patent Document 2, Patent Application No. 1).
專利文獻1:日本專利特開平9-202635號公報專利文獻2:日本專利特開2004-354836號公報Patent Document 1: Japanese Patent Laid-Open No. Hei 9-202635, Patent Document 2: Japanese Patent Laid-Open No. 2004-354836
但是,專利文獻2所記載的裂片方法,因為在玻璃基板接合體W上覆蓋著按押片材73,因此該按押片材73的彈力將對玻璃基板S1的缺口溝d裂開造成阻礙。所以,仍恐因玻璃基板S1斷裂面的摩擦而發生碎裂狀況。況且,若將按押片材73卸除,最終經斷裂的玻璃基板接合體W將呈散落狀,對玻璃基板接合體W的處置亦較為困難。However, in the splitting method described in Patent Document 2, since the pressing sheet 73 is covered on the glass substrate assembly W, the elastic force of the pressing sheet 73 is prevented from being cracked in the notch d of the glass substrate S1. Therefore, it is still feared that the chipping state occurs due to the friction of the fracture surface of the glass substrate S1. On the other hand, when the pressed sheet material 73 is removed, the finally broken glass substrate joined body W is scattered, and handling of the glass substrate joined body W is also difficult.
緣是,本發明之目的在於提供一種當將刻劃有刻劃線的工件施行斷裂之際,可防止工件斷裂面因摩擦而發生碎裂狀況的工件之裂片方法及裝置。Accordingly, it is an object of the present invention to provide a method and apparatus for splitting a workpiece which can prevent a fracture of a workpiece from being broken by friction when a workpiece having a score line is fractured.
為解決上述問題,申請專利範圍第1項之發明,係將表面刻劃有刻劃線之工件(5)沿刻劃線(5c)進行斷裂的工件之裂片方法,包含有:將上述工件(5)背面貼附於可伸縮性片材(9)上的工件黏貼步驟;對已貼附上述工件(5)的上述片材(9)施行拉伸的片材拉伸步驟;以及在將上述片材(9)拉伸的狀態下,使上述刻劃線(5c)到達上述工件背面的工件斷裂步驟;其中,經斷裂的上述工件(5)係利用上述片材(9)的拉伸力而隔開。In order to solve the above problems, the invention of claim 1 is a lobing method for a workpiece having a surface scribed with a scored workpiece (5) broken along a scribe line (5c), comprising: the above workpiece ( 5) a step of attaching a workpiece attached to the stretchable sheet (9) on the back side; a sheet stretching step of stretching the sheet (9) to which the workpiece (5) has been attached; and a workpiece breaking step in which the scribe line (5c) reaches the back surface of the workpiece in a state where the sheet (9) is stretched; wherein the workpiece (5) which is broken is a tensile force using the sheet (9) And separated.
根據本發明,因為在斷裂之同時,工件便被拉離開,因此減少經斷裂的工件間的摩擦情況,可防止背面發生碎裂狀況。此外,因為藉由對工件施加拉伸力,而使拉伸力成為工件斷裂的輔助,因此可藉更小力道施行裂片。另外,因為將工件貼附於片材上,因而在將工件裂片之後,所斷裂的工件將不致散落,且亦無摩擦狀況發生。故,工件的處理將較為容易。According to the present invention, since the workpiece is pulled away at the same time as the fracture, the friction between the fractured workpieces is reduced, and the chipping of the back surface can be prevented. In addition, since the tensile force is assisted by the fracture of the workpiece by applying a tensile force to the workpiece, the split can be performed with a smaller force. In addition, since the workpiece is attached to the sheet, after the workpiece is split, the broken workpiece will not be scattered, and no frictional condition will occur. Therefore, the processing of the workpiece will be easier.
申請專利範圍第2項之發明,係在申請專利範圍第1項之工件之裂片方法中,其中,上述工件斷裂步驟係在將上述片材(9)拉伸的狀態下,依上述工件(5)表面側成為彎曲外側之方式將上述工件(5)彎曲,藉此使上述刻劃線(5c)到達上述工件(5)背面。The invention of claim 2, wherein the workpiece breaking step is performed by stretching the sheet (9) in accordance with the workpiece (5) The workpiece (5) is bent such that the surface side becomes curved outward, whereby the scribe line (5c) reaches the back surface of the workpiece (5).
根據本發明,藉由彎曲力矩與拉伸力的併用,即便具厚度的工件亦可在不致發生碎裂的情況下進行斷裂。According to the present invention, by the combination of the bending moment and the tensile force, even a workpiece having a thickness can be fractured without causing chipping.
申請專利範圍第3項之發明,係在申請專利範圍第1或2項之工件之裂片方法中,其中,上述片材拉伸步驟係在將上述片材(9)拉伸之後,於上述工件(5)周圍空出間隙並將框構件(12)貼附於上述片材(9)上,而將上述片材(9)的張力封閉於上述框構件(12)內。The invention of claim 3, wherein the sheet stretching step is performed after the sheet (9) is stretched, and the workpiece is subjected to the sharding method of the workpiece of claim 1 or 2 (5) A gap is left around and the frame member (12) is attached to the sheet (9), and the tension of the sheet (9) is enclosed in the frame member (12).
根據本發明,在將工件拉伸後,即使將拉伸力去除,仍可持續對工件賦予拉伸力。According to the present invention, after the workpiece is stretched, even if the tensile force is removed, the tensile force can be continuously imparted to the workpiece.
申請專利範圍第4項之發明,係將表面刻劃有刻劃線之工件(5)沿刻劃線(5c)施行斷裂的工件之裂片裝置,具備有:將上述工件(5)背面所貼附的可伸縮性片材(9)進行拉伸的片材拉伸手段(10,11,14a、14b),以及在將上述片材(9)拉伸的狀態下,以使上述工件(5)表面朝向彎曲外側之方式將上述工件(5)彎曲,藉此使上述刻劃線(5c)到達上述工件(5)背面的工件斷裂手段(16);其中,經斷裂的上述工件(5)利用上述片材(9)的拉伸力而隔開。The invention of claim 4 is a lobing device for scrimming a workpiece (5) having a scribed line (5) along a scribe line (5c), and is provided with: affixing the back surface of the workpiece (5) a sheet stretching means (10, 11, 14a, 14b) for stretching the attached stretchable sheet (9), and a state in which the sheet (9) is stretched to make the workpiece (5) The surface of the workpiece (5) is bent toward the outside of the curved surface, whereby the scribe line (5c) is brought to the workpiece breaking means (16) on the back surface of the workpiece (5); wherein the workpiece (5) is broken They are separated by the tensile force of the above sheet (9).
根據本發明,因為在斷裂之同時亦將工件拉離開,因而減少經斷裂的工件間的摩擦情況,可防止背面發生碎裂狀況。此外,藉由彎曲力矩與拉伸力的併用,即便具厚度的工件亦可在不致發生碎裂的情況下進行斷裂。且,因為將工件貼附於片材上,因此在將工件裂片之後,所斷裂的工件不致散落,且亦無摩擦狀況。故,工件的處理較為容易。According to the present invention, since the workpiece is pulled away at the same time as the fracture, the friction between the fractured workpieces is reduced, and the chipping of the back surface can be prevented. In addition, by the combination of the bending moment and the tensile force, even a workpiece having a thickness can be fractured without causing chipping. Moreover, since the workpiece is attached to the sheet, the broken workpiece does not scatter after the workpiece is split, and there is no friction condition. Therefore, the processing of the workpiece is relatively easy.
申請專利範圍第5項之發明,係一邊在工件(5)表面刻劃出刻劃線(5c),一邊將工件(5)沿刻劃線(5c)施行斷裂的工件之刻劃及裂片方法,包含有:在可伸縮性片材(9)上貼附工件(5)的工件黏貼步驟;將上述工件(5)所貼附的上述片材(9)施行拉伸的片材拉伸步驟;以及在將上述片材(9)拉伸的狀態下,於上述工件(5)表面刻劃出刻劃線(5c),同時使上述工件(5)表面的上述刻劃線(5c)到達上述工件(5)背面的工件斷裂步驟;其中,經斷裂的上述工件(5)係利用上述片材(9)的拉伸力而隔開。The invention of claim 5 is a scribing and splitting method of a workpiece in which a workpiece (5) is fractured along a scribe line (5c) while scribing a scribe line (5c) on the surface of the workpiece (5). a step of attaching a workpiece to which a workpiece (5) is attached to a stretchable sheet (9); and a sheet stretching step of stretching the sheet (9) to which the workpiece (5) is attached And in the state in which the sheet (9) is stretched, the scribe line (5c) is scribed on the surface of the workpiece (5) while the scribe line (5c) on the surface of the workpiece (5) is reached. The workpiece breaking step on the back surface of the workpiece (5); wherein the fractured workpiece (5) is separated by the tensile force of the sheet (9).
根據本發明,因為在斷裂之同時亦將工件拉離開,因而減少經斷裂的工件間之摩擦情況,可防止背面發生碎裂狀況。此外,因為藉由對工件施加拉伸力而使拉伸力成為工件斷裂的輔助,因此在將工件刻劃之同時便可施行裂片。且,因為將工件貼附於片材上,因此在將工件裂片之後,所斷裂的工件不致散落且亦無摩擦狀況。故,工件的處理較為容易。According to the present invention, since the workpiece is pulled away at the same time as the fracture, the friction between the fractured workpieces is reduced, and the chipping of the back surface can be prevented. Further, since the tensile force is assisted by the fracture of the workpiece by applying a tensile force to the workpiece, the split can be performed while the workpiece is being scored. Moreover, since the workpiece is attached to the sheet, the broken workpiece does not scatter and has no frictional condition after the workpiece is split. Therefore, the processing of the workpiece is relatively easy.
申請專利範圍第6項之發明,係一邊在工件(5)表面刻劃出刻劃線(5c),一邊將工件(5)沿刻劃線施行斷裂的附裂片功能之刻劃裝置,具備有:將上述工件(5)所貼附的可伸縮性片材(9)施行拉伸的片材拉伸手段(22);以及在將上述片材(9)拉伸的狀態下,在上述工件(5)表面刻劃出刻劃線(5c),同時使上述工件(5)表面的上述刻劃線(5c)到達上述工件(5)背面,而將上述工件(5)斷裂的工件斷裂手段(20);其中,經斷裂的上述工件(5)係利用上述片材(9)的拉伸力而隔開。The invention of claim 6 is a scribing device having a function of a splitting piece for cutting a workpiece (5) along a scribe line while scribing a scribe line (5c) on the surface of the workpiece (5). a sheet stretching means (22) for stretching the stretchable sheet (9) to which the workpiece (5) is attached; and in the state where the sheet (9) is stretched, the workpiece (5) The surface is scribed with a score line (5c) while the above-mentioned scribe line (5c) on the surface of the workpiece (5) reaches the back surface of the workpiece (5), and the workpiece is broken by the workpiece (5) (20); wherein the fractured workpiece (5) is separated by the tensile force of the sheet (9).
根據本發明,因為在斷裂之同時亦將工件拉離開,因而減少經斷裂的工件間的摩擦情況,可防止背面發生碎裂狀況。此外,藉由對工件施加拉伸力而使拉伸力成為工件斷裂的輔助,因此在將工件刻劃之同時便可施行裂片。且,因為將工件貼附於片材上,因而在將工件裂片之後,斷裂的工件不致散落且亦無摩擦狀況。故,工件的處理將較為容易。According to the present invention, since the workpiece is pulled away at the same time as the fracture, the friction between the fractured workpieces is reduced, and the chipping of the back surface can be prevented. Further, by applying a tensile force to the workpiece, the tensile force is assisted by the fracture of the workpiece, so that the split can be performed while the workpiece is being scored. Moreover, since the workpiece is attached to the sheet, the broken workpiece does not scatter and has no frictional condition after the workpiece is split. Therefore, the processing of the workpiece will be easier.
申請專利範圍第7項之發明,係將表面刻劃有刻劃線(52)的工件(51),沿刻劃線(52)施行斷裂的工件(51)之裂片方法,包含有:將上述工件(51)背面貼附於片材(53)上的工件黏貼步驟;使上述片材(53)密接於裂片台(55,65),並依使上述工件(51)表面朝向彎曲外側之方式將上述工件(51)彎曲,藉此使上述工件(51)表面的上述刻劃線(52)到達上述工件(51)背面,而將上述工件(51)斷裂的工件斷裂步驟。The invention of claim 7 is a sharding method in which a workpiece (51) having a scribed line (52) is scribed on the surface, and a workpiece (51) which is ruptured along the scribe line (52) is included, including: a step of attaching the workpiece (51) to the workpiece on the back side of the sheet (53); attaching the sheet (53) to the splitting table (55, 65), and aligning the surface of the workpiece (51) toward the outside of the curved surface The workpiece (51) is bent, whereby the scribe line (52) on the surface of the workpiece (51) reaches the back surface of the workpiece (51), and the workpiece (51) is broken.
根據本發明,因為片材位於工件背面側,因而片材不致阻礙及工件表面側的刻劃線張開而使工件斷裂的動作。所以,可防止工件斷裂面發生摩擦而碎裂的狀況。且,藉由將工件貼附於片材上,經斷裂後的工件亦不致散落。According to the present invention, since the sheet is located on the back side of the workpiece, the sheet does not hinder the action of breaking the workpiece by the scribe line on the surface side of the workpiece. Therefore, it is possible to prevent the fracture surface of the workpiece from being rubbed and broken. Moreover, by attaching the workpiece to the sheet, the fractured workpiece is not scattered.
申請專利範圍第8項之發明,係在申請專利範圍第7項之工件之裂片方法中,其中,上述工件斷裂步驟包含有:使縱橫刻劃有複數刻劃線(52)的上述工件(51),沿半圓柱形狀裂片台(55)彎曲,而將上述工件(51)斷裂成複數細長條的細長條斷裂步驟;然後,將從上述裂片台(55)上退縮的上述片材(53),相對於上述裂片台(55),在包含上述片材(53)在內的平面內進行相對90度旋轉的相對旋轉步驟;以及將經斷裂為細長條的上述工件(51),延上述裂片台(55)再度彎曲,而將上述工件(51)斷裂成複數晶片(chip)的晶片斷裂步驟。The invention of claim 8 is the lobing method of the workpiece of claim 7, wherein the step of splicing the workpiece comprises: arranging the workpiece (51) with a plurality of scribe lines (52). a step of breaking the above-mentioned workpiece (51) into a plurality of elongated strips by bending along a semi-cylindrical shape splitting table (55); then, said sheet (53) being retracted from said splitting table (55) a relative rotation step of rotating relative to 90 degrees in a plane including the above-mentioned sheet (53) with respect to the above-mentioned split sheet stage (55); and extending the above-mentioned workpiece (51) which is broken into elongated strips The stage (55) is again bent, and the above-mentioned workpiece (51) is broken into a wafer breaking step of a plurality of chips.
根據本發明,可將縱橫刻劃有刻劃線的工件,在不致發生碎裂的情況下分割為晶片。然後,因為使用半圓柱形狀裂片台以二步驟使工件斷裂,因此相較於使用球面形狀裂片台以單一步驟使工件斷裂的情況下,在使沿裂片台彎曲時,沿刻劃線的力較難發生作用,因而工件的斷裂面亦不致發生摩擦狀況。According to the present invention, a workpiece which is scored in the longitudinal and transverse directions can be divided into wafers without being broken. Then, since the workpiece is broken in two steps by using the semi-cylindrical shape splitting table, the force along the score line is compared when the workpiece is broken along the split table, as compared with the case where the workpiece is broken in a single step using the spherical shape splitter table. Difficult to occur, so the fracture surface of the workpiece does not cause friction.
申請專利範圍第9項之發明,係申請專利範圍第7或8項之工件之裂片方法中,其中,上述工件斷裂步驟利用抽吸空氣的吸附孔(56,66),將上述工件(51)所貼附的上述片材(53)吸附於上述裂片台(55,65)上,而使上述工件(51)沿上述裂片台(55,65)彎曲。The invention of claim 9 is the splitting method of the workpiece of claim 7 or 8, wherein the workpiece breaking step uses the suction hole (56, 66) for sucking air to apply the workpiece (51) The attached sheet (53) is attached to the splitting table (55, 65) to bend the workpiece (51) along the splitting table (55, 65).
根據本發明,藉由從吸附孔抽吸空氣,可使工件沿裂片台彎曲。According to the present invention, the workpiece can be bent along the splitting table by sucking air from the adsorption holes.
申請專利範圍第10項之發明,係申請專利範圍第7或8項之工件之裂片方法中,其中,上述工件斷裂步驟係使在包含上述片材(53)在內的平面上,朝垂直方向使上述裂片台(55,65)相對於上述片材(53)進行相對移動,而將上述裂片台(55,65)推抵於上述工件(51)所貼附的上述片材(53)上,而使上述工件(51)沿上述裂片台(55,65)彎曲。The invention of claim 10, wherein the workpiece breaking step is performed on a plane including the sheet (53), in a vertical direction, in the method of splitting a workpiece according to claim 7 or 8. The splitting table (55, 65) is relatively moved relative to the sheet (53), and the splitting table (55, 65) is pushed against the sheet (53) to which the workpiece (51) is attached. The workpiece (51) is bent along the splitting table (55, 65).
根據本發明,藉由將工件所貼附的片材推抵於裂片台,便可使工件沿裂片台彎曲。且,因為在將工件斷裂之前便對工件施加拉伸力,因而當工件被斷裂時,經斷裂的工件間便呈相離開狀態。所以,便不致發生工件斷裂面相互摩擦的狀況。According to the present invention, the workpiece can be bent along the splitting table by pushing the sheet to which the workpiece is attached against the splitting table. Moreover, since the tensile force is applied to the workpiece before the workpiece is broken, when the workpiece is broken, the fractured workpieces are separated from each other. Therefore, the situation in which the fracture surfaces of the workpieces rub against each other does not occur.
申請專利範圍第11項之發明,係將表面刻劃有刻劃線(52)的工件(51),沿刻劃線(52)進行斷裂的工件之裂片裝置,具備有:使上述工件(51)彎曲的裂片台(55,65);以及使上述工件(51)背面所貼附的片材(53)密接於上述裂片台(55,65),並依上述工件(51)表面朝向彎曲外側之方式將上述工件(51)彎曲的片材密接手段(56,66,64);其中,使上述工件(51)表面的上述刻劃線(52)到達上述工件(51)背面,而將上述工件(51)斷裂。The invention of claim 11 is a splitting device for scribing a workpiece (51) having a score line (52) and a workpiece broken along the score line (52), comprising: causing the workpiece (51) a curved splitting table (55, 65); and a sheet (53) attached to the back surface of the workpiece (51) is in close contact with the splitting table (55, 65), and faces the curved outer side according to the surface of the workpiece (51) a sheet adhesion means (56, 66, 64) for bending the workpiece (51); wherein the scribe line (52) on the surface of the workpiece (51) is brought to the back surface of the workpiece (51), and the above The workpiece (51) is broken.
根據本發明,因為片材位於工件背面側,因而片材便不致阻礙及工件表面側的刻劃線張開而使工件斷裂的動作。所以,可防止因工件斷裂面相互摩擦而碎裂的狀況發生。且,藉由將工件貼附於片材上,亦可使斷裂後的工件不致發生散落狀況。According to the present invention, since the sheet is located on the back side of the workpiece, the sheet does not hinder the action of breaking the workpiece by the scribe line on the surface side of the workpiece. Therefore, it is possible to prevent a situation in which the fracture surface of the workpiece rubs against each other and breaks. Moreover, by attaching the workpiece to the sheet, the workpiece after the fracture can be prevented from being scattered.
申請專利範圍第12項之發明,係申請專利範圍第11項之工件之裂片裝置中,上述密接手段(56,66)係從上述裂片台(55,65)的較高位置起,朝向較低位置具高低差的排列,且具有抽吸空氣的複數吸附孔(56,66),並利用上述吸附孔(56,66)將上述片材(53)吸附,而使上述工件(51)密接於上述裂片台(55,65)。The invention of claim 12, wherein in the splitting device of the workpiece of claim 11, the close-contact means (56, 66) is oriented from a higher position of the splitting table (55, 65) The position has a height difference arrangement and has a plurality of adsorption holes (56, 66) for sucking air, and the sheet (53) is adsorbed by the adsorption holes (56, 66), so that the workpiece (51) is in close contact with The above split table (55, 65).
根據本發明,可從裂片台的較高位置起朝較低位置依序使工件密接於裂片台。因為工件從較高位置起朝較低位置依序斷裂,因而可防止工件斷裂面相互摩擦而發生碎裂的狀況。According to the present invention, the workpiece can be closely attached to the splitting stage in order from the upper position of the splitting table to the lower position. Since the workpiece is sequentially broken from a higher position toward a lower position, it is possible to prevent the fracture surface of the workpiece from rubbing against each other and causing chipping.
申請專利範圍第13項之發明,係申請專利範圍第12項之工件之裂片裝置中,上述密接手段更進一步具備有複數電磁閥(63),其從較高位置起朝較低位置依序使上述吸附孔(56,66)抽吸空氣。The invention of claim 13 is the split device of the workpiece of claim 12, wherein the close-contact means further comprises a plurality of solenoid valves (63) which are sequentially arranged from a higher position toward a lower position The above adsorption holes (56, 66) draw air.
根據本發明,可從工件的較高位置起朝較低位置,確實地使工件密接於裂片台上。According to the present invention, the workpiece can be securely attached to the splitting table from a higher position of the workpiece to a lower position.
申請專利範圍第14項之發明,係申請專利範圍第11項之工件之裂片裝置中,上述密接手段具備有:配置成包夾上述裂片台(55,65)的狀態,並保持著上述片材(53)端部的片材固定台(64);以及在包含上述片材(53)在內的平面上,朝垂直方向相對於上述片材固定台(64)使上述裂片台(55,65)相對移動的推抵機構;其中,藉由將上述工件(51)所貼附的上述片材(53)推抵於上述裂片台(55,65),而使上述工件(51)沿上述裂片台(55,65)彎曲。The invention of claim 14 is the split device of the workpiece of claim 11, wherein the close-contact means includes: a state in which the split table (55, 65) is placed, and the sheet is held (53) an end sheet fixing table (64); and on the plane including the sheet (53), the split table (55, 65) is vertically opposed to the sheet fixing table (64) a relatively moving pushing mechanism; wherein the workpiece (51) is along the split by pushing the sheet (53) attached to the workpiece (51) against the splitting table (55, 65) The table (55, 65) is bent.
根據本發明,藉由將工件所貼附的片材推抵於裂片台,可使工件沿裂片台彎曲。且,因為在使工件斷裂之前便對工件施加拉伸力,因而當工件被斷裂時,經斷裂的工件間相離開。所以,不致有工件斷裂面相互摩擦的狀況發生。According to the present invention, the workpiece can be bent along the splitting table by pushing the sheet to which the workpiece is attached against the splitting table. Moreover, since the tensile force is applied to the workpiece before the workpiece is broken, when the workpiece is broken, the inter-worked phase exits. Therefore, there is no situation in which the fracture surfaces of the workpieces rub against each other.
申請專利範圍第15項之發明,係申請專利範圍第11至14項中任一項之工件之裂片裝置中,其中,上述裂片裝置係使縱橫刻劃有複數刻劃線的上述工件(51),沿半圓柱形狀裂片台(55)彎曲,而將上述工件(51)斷裂成複數細長條之後,使從上述裂片台(55)退縮的上述片材(53),相對於上述裂片台(55)在包含上述片材(53)在內的平面內,進行相對90度旋轉,然後使經斷裂為細長條的上述工件(51)沿上述裂片台(55)再度彎曲,而將上述工件(51)斷裂成複數晶片。The invention of claim 15 is the apparatus for splitting a workpiece according to any one of claims 11 to 14, wherein the splitting device is configured to scribe the workpiece (51) with a plurality of score lines in the longitudinal and transverse directions. And bending the semi-cylindrical splitting table (55) to break the workpiece (51) into a plurality of elongated strips, and then retracting the sheet (53) from the splitting table (55) relative to the splitting table (55) Rotating at a relative angle of 90 degrees in a plane including the above-mentioned sheet (53), and then re-bending the above-mentioned workpiece (51) which has been broken into elongated strips along the splitting table (55), and the above-mentioned workpiece (51) Breaking into a plurality of wafers.
根據本發明,可使縱橫刻劃有刻劃線的工件在不致發生碎裂狀況下,分割成晶片。且,因為使用半圓柱形狀裂片台以二步驟將工件斷裂,因而相較於使用球面形狀裂片台依單一步驟將工件斷裂的情況下,當沿裂片台彎曲時,沿刻劃線的力較難發生作用,且亦無工件斷裂面相互摩擦的狀況發生。According to the present invention, it is possible to divide a workpiece which is scribed in the longitudinal and transverse directions into a wafer without causing chipping. Moreover, since the workpiece is broken in two steps using a semi-cylindrical splitting table, the force along the scribe line is difficult when bending along the splitting table as compared with the case where the workpiece is broken in a single step using the spherical shaped splitting table. The action occurs, and there is no situation in which the fracture surfaces of the workpiece rub against each other.
根據以上申請專利範圍第1至15項之發明,當將刻劃有刻劃線之工件施行斷裂之際,將可防止因工件斷裂面相互摩擦而發生碎裂的狀況。According to the invention of the first to fifteenth aspects of the above patent application, when the workpiece having the scored line is fractured, it is possible to prevent the workpiece from being broken by the frictional surface of the workpiece.
圖1所示係本發明第1實施形態的工件之裂片方法原理圖。在半導體晶圓或玻璃等板狀工件表面上,預先利用刻劃裝置刻劃出刻劃線。刻劃裝置以前端尖銳的刀尖、或自由旋轉的薄板圓盤(輪)為刻劃刀,並推抵於工件表面,且使刻劃刀沿工件表面移動,而在工件表面鑿刻出刻劃線。Fig. 1 is a schematic view showing a method of splitting a workpiece according to a first embodiment of the present invention. On the surface of a plate-like workpiece such as a semiconductor wafer or glass, a scribe line is scribed in advance using a scribing device. The scoring device adopts a pointed tip or a freely rotating thin plate disc (wheel) as a scribing knife, and pushes against the surface of the workpiece, and moves the scoring blade along the surface of the workpiece to be chiseled on the surface of the workpiece. Dash.
經在工件表面上刻劃出刻劃線之後,將工件5安裝於裂片裝置上。裂片裝置以使刻劃有刻劃線之一側5a成為彎曲外側之方式,對工件5施加彎曲力矩。具體而言,在2個支撐點6a、6b(機台)間載置工件5,並利用裂片頭7從上方向對支撐點6a、6b間的工件5施以加壓力。加壓力從刻劃有刻劃線之一側5a的背後側施加。藉由對支撐點6a、6b間施加加壓力,使工件5發生彎曲力矩,藉由該彎曲力矩在刻劃有刻劃線的部分處發生彎曲應力中的拉伸應力。藉由拉伸應力,裂痕從表面朝背面(圖1中為從下朝上的方向)進展。After the score line is scored on the surface of the workpiece, the workpiece 5 is mounted on the split device. The lobing device applies a bending moment to the workpiece 5 such that one side 5a of the scribe line is curved outward. Specifically, the workpiece 5 is placed between the two support points 6a and 6b (machine table), and the workpiece 5 between the support points 6a and 6b is applied with pressure from the upper side by the split head 7. The pressing force is applied from the back side of the side 5a on which the score line is scored. By applying a pressing force between the support points 6a, 6b, the workpiece 5 is subjected to a bending moment by which the tensile stress in the bending stress occurs at the portion where the score line is scored. By the tensile stress, the crack progresses from the surface toward the back (in the direction from bottom to top in Fig. 1).
在對工件5賦予彎曲力矩之同時,亦對工件5施加刻劃線正交方向的拉伸力P。藉由對工件5施加拉伸力P,因為在被斷裂之同時,工件5亦被拉離開,因而減少所斷裂工件5間的摩擦狀況,可抑制背面(刻劃側的背後側)發生碎裂狀況。此外,藉由對工件5施加拉伸力P,因為拉伸力P成為工件斷裂的輔助,因而以更小的裂片頭7加壓力便可將工件5裂片。While the bending moment is applied to the workpiece 5, the workpiece 5 is also subjected to a tensile force P in the orthogonal direction of the scribe line. By applying the tensile force P to the workpiece 5, since the workpiece 5 is also pulled away while being broken, the friction between the fractured workpieces 5 is reduced, and the back surface (the back side of the scribing side) is suppressed from being broken. situation. Further, by applying the tensile force P to the workpiece 5, since the tensile force P serves as an aid to the fracture of the workpiece, the workpiece 5 can be split by applying pressure with the smaller split head 7.
另外,當僅對工件5施加拉伸力,便可將工件5裂片的情況時,亦可不用對工件5施加彎曲力矩。而當對工件5施加彎曲力矩的情況時,亦可取代裂片頭7而改用裂片輥,亦可在機台上形成直線狀延伸的突起,並在突起二側的機台上設置將工件抽吸的抽吸裝置,且以突起部分為頂點的使工件彎曲。Further, when the tensile force is applied only to the workpiece 5, the workpiece 5 can be lobed, and the bending moment can not be applied to the workpiece 5. When a bending moment is applied to the workpiece 5, the splitting head 7 may be replaced by a splitting roller, or a linearly extending projection may be formed on the machine table, and the workpiece may be drawn on the machine on the two sides of the projection. The suction device is sucked, and the workpiece is bent with the protruding portion as a vertex.
圖2所示係由彎曲力矩所發生的彎曲應力。若對工件5作用彎曲力矩M,便將利用彎曲力矩M而使工件發生彎曲應力σ。彎曲應力σ的分佈如圖所示,在中立軸5e下側處發生拉伸應力,而在上側發生壓縮應力。在工件5上側所發生的壓縮應力σ為導致工件5相互摩擦的肇因。即使對工件所施加的拉伸力P較小於壓縮應力σ,但是在斷裂之同時便可將工件5拉離開,因而將可減少工件5相互摩擦的狀況。而若工件5的拉伸力P,大於由彎曲力矩M使工件5上側所發生壓縮應力σ以上,因為可避免工件5產生壓縮應力,因而可消除造成工件5相互摩擦的肇因。Figure 2 shows the bending stress caused by the bending moment. When the bending moment M is applied to the workpiece 5, the bending stress M is used to cause the workpiece to have a bending stress σ. The distribution of the bending stress σ is as shown in the drawing, and tensile stress occurs at the lower side of the neutral shaft 5e, and compressive stress occurs at the upper side. The compressive stress σ occurring on the upper side of the workpiece 5 is a cause of friction between the workpieces 5. Even if the tensile force P applied to the workpiece is smaller than the compressive stress σ, the workpiece 5 can be pulled away while being broken, so that the situation in which the workpieces 5 rub against each other can be reduced. On the other hand, if the tensile force P of the workpiece 5 is larger than the compressive stress σ generated by the bending moment M on the upper side of the workpiece 5, since the compressive stress of the workpiece 5 can be prevented, the cause of the friction between the workpieces 5 can be eliminated.
圖3所示係本發明第2實施形態的工件之裂片方法原理圖。本實施形態中,一邊在工件5表面上刻劃著刻劃線,一邊朝刻劃線的正交方向對工件5施加拉伸力P,而將工件5裂片。換言之,本實施形態中,同時進行對工件5刻劃著刻劃線的刻劃步驟、與將工件斷裂的裂片步驟。Fig. 3 is a schematic view showing a method of splitting a workpiece according to a second embodiment of the present invention. In the present embodiment, the workpiece 5 is split by applying a tensile force P to the workpiece 5 in the orthogonal direction of the score line while scribing the surface of the workpiece 5. In other words, in the present embodiment, the scribing step of scribing the workpiece 5 and the splitting step of breaking the workpiece are simultaneously performed.
藉由一邊對工件5刻劃著刻劃線一邊對工件5施加拉伸力P,使裂痕5d朝工件厚度方向(圖3中為從上朝下的方向)進展。裂痕5d到達背面5b時,工件5便裂片。此外,藉由對工件5施加拉伸力,因為在斷裂之同時,工件5將被拉離開,因而將減少所斷裂工件5間發生相互摩擦狀況,便可抑制工件5背面5b發生碎裂情況。The tensile force P is applied to the workpiece 5 while scribing the workpiece 5, and the crack 5d is advanced in the thickness direction of the workpiece (the direction from the top to the bottom in Fig. 3). When the crack 5d reaches the back surface 5b, the workpiece 5 is split. Further, by applying a tensile force to the workpiece 5, since the workpiece 5 is pulled away while being broken, the mutual friction between the fractured workpieces 5 is reduced, and the occurrence of chipping on the back surface 5b of the workpiece 5 can be suppressed.
當工件5厚度屬較厚的情況時,可能有對工件5僅施加拉伸力,但無法使裂痕到達背面5b的情況。此情況下,在施加拉伸力之同時,以經刻劃有刻劃線之一側5a成為彎曲外側之方式,對工件5施加彎曲力矩。When the thickness of the workpiece 5 is thick, there may be a case where only the tensile force is applied to the workpiece 5, but the crack cannot be reached to the back surface 5b. In this case, a bending moment is applied to the workpiece 5 such that the one side of the score line 5a is curved outside while the tensile force is applied.
圖4所示係使用片材9對工件5施加拉伸力的方法原理圖。首先,如圖4(A)所示,在可伸縮性片材9上貼附工件5。對片材9預先賦予黏著性。將片材9二端夾緊於片材拉伸手段(例如由固定側10、與對固定側10呈可動狀態的可動側11所構成之延伸治具)中。在將工件5貼附於片材9上的狀態下,使延伸治具的可動側11移動,而將片材9朝既定方向拉伸,對片材9施加拉伸力(張力)。此例子中,雖例示將工件5僅朝X方向拉伸的例子,惟並不僅侷限於X方向,亦可朝X方向、及X方向正交的Y方向等2方向拉伸。Figure 4 is a schematic diagram showing the method of applying a tensile force to the workpiece 5 using the sheet 9. First, as shown in FIG. 4(A), the workpiece 5 is attached to the stretchable sheet 9. Adhesion is imparted to the sheet 9 in advance. The two ends of the sheet 9 are clamped in a sheet stretching means (for example, an extension jig formed by the fixed side 10 and the movable side 11 which is movable to the fixed side 10). In a state where the workpiece 5 is attached to the sheet 9, the movable side 11 of the extension jig is moved, and the sheet 9 is stretched in a predetermined direction, and a tensile force (tension) is applied to the sheet 9. In this example, the example in which the workpiece 5 is stretched only in the X direction is exemplified, but it is not limited to the X direction, and may be stretched in two directions such as the X direction and the Y direction orthogonal to the X direction.
其次,如圖4(B)所示,在保持著張力之狀態下,在工件5周圍貼附上作為框構件的環12,並將環12外側的片材切斷。將環12外側的片材切斷之狀態,如圖4(C)所示。在工件5周圍與環12之間隔開間隙,俾對工件5與環12之間的片材9賦予張力。另一方面,因為工件5在施加張力之前便貼附片材9,因而不致對工件5所貼附部分的片材9施加張力。Next, as shown in FIG. 4(B), the ring 12 as a frame member is attached around the workpiece 5 while the tension is maintained, and the sheet outside the ring 12 is cut. The state in which the sheet outside the ring 12 is cut is as shown in Fig. 4(C). A gap is provided between the workpiece 5 and the ring 12 around the workpiece 5, and tension is applied to the sheet 9 between the workpiece 5 and the ring 12. On the other hand, since the workpiece 5 is attached to the sheet 9 before the tension is applied, tension is not applied to the sheet 9 to which the workpiece 5 is attached.
其次,將經施加張力的工件5搬送至裂片裝置或附裂片功能之刻劃裝置中,如圖4(D)所示,利用裂片裝置或附裂片功能之刻劃裝置將工件5裂片。因為對工件5施加張力,因而在斷裂之同時,工件5間被拉離開,因而工件5間空出間隙。最後在利用UV照射等,將片材9的黏著性去除,俾將工件5從片材9上剝離。Next, the workpiece 5 to which the tension is applied is conveyed to the slitting device or the scoring device having the function of the splitting piece, and as shown in Fig. 4(D), the workpiece 5 is split by the slitting device or the scoring device with the splitting function. Since the tension is applied to the workpiece 5, the workpieces 5 are pulled apart while being broken, and a gap is left between the workpieces 5. Finally, the adhesion of the sheet 9 is removed by UV irradiation or the like, and the workpiece 5 is peeled off from the sheet 9.
利用如上述片材9對工件5施行的拉緊方法,頗適用於工件5尺寸較小的半導體晶圓。The tensioning method applied to the workpiece 5 by the sheet 9 as described above is quite suitable for a semiconductor wafer having a small workpiece size 5.
針對實現上述裂片原理的工件5之裂片方法及裂片裝置說明。圖5所示係本發明第1實施形態的裂片裝置。在裂片裝置的機台23上,將已刻劃有刻劃線5c的工件5表面朝下而安裝工件5。在刻劃線5c的正上方,配置有作為工件斷裂手段之朝刻劃線5c方向延伸的棒狀裂片頭16。裂片裝置從工件5上面按壓裂片頭16,俾以經刻劃有刻劃線之一側成為外側之方式使工件5彎曲。Description of the splitting method and the splitting device of the workpiece 5 for realizing the above-described splitting principle. Fig. 5 shows a splitting device according to a first embodiment of the present invention. On the machine table 23 of the splitting device, the workpiece 5 is mounted with the surface of the workpiece 5 having the score line 5c drawn downward. Immediately above the score line 5c, a rod-shaped split head 16 extending in the direction of the score line 5c as a workpiece breaking means is disposed. The splitting device presses the split head 16 from above the workpiece 5, and the workpiece 5 is bent in such a manner that one side of the score line is scored to the outside.
表面刻劃有刻劃線5c的工件5,將其背面貼附於可伸縮性片材9上。然後,依對工件5施加拉伸力P之方式,將工件5所貼附的片材9拉伸。圖6所示係供對工件5賦予拉伸力之片材拉伸手段的拉緊機構。將工件5貼附於片材9上,再將片材9利用真空等方法固定於一對平台14a、14b上。然後,使平台14a、14b朝相反方向移動而拉伸片材9拉伸。另外,亦可使二平台14a、14b均各朝相反向移動,亦可將其中一平台14a固定,僅使另一平台14b移動。此外,亦可如圖9所示,將工件5貼附於片材9上,然後利用將片材9二端夾緊的夾緊夾具22將片材9拉伸。另外,雖僅對工件賦予X方向的拉伸力,但是亦可設置2組拉緊機構,朝相互正交的X方向與Y方向賦予拉伸力。當然,亦可使用圖4所示的環12。The workpiece 5 having the score line 5c is scribed on the surface, and the back surface thereof is attached to the stretchable sheet 9. Then, the sheet 9 to which the workpiece 5 is attached is stretched in such a manner that the tensile force P is applied to the workpiece 5. Fig. 6 shows a tensioning mechanism for a sheet stretching means for imparting a tensile force to the workpiece 5. The workpiece 5 is attached to the sheet 9, and the sheet 9 is fixed to the pair of stages 14a, 14b by a vacuum or the like. Then, the platforms 14a, 14b are moved in opposite directions and the stretched sheet 9 is stretched. In addition, the two platforms 14a, 14b can also be moved in opposite directions, and one of the platforms 14a can be fixed, and only the other platform 14b can be moved. Further, as shown in Fig. 9, the workpiece 5 may be attached to the sheet 9, and then the sheet 9 may be stretched by a clamp jig 22 that clamps both ends of the sheet 9. Further, although only the tensile force in the X direction is given to the workpiece, two sets of the tensioning mechanism may be provided, and the tensile force may be applied to the X direction and the Y direction orthogonal to each other. Of course, the ring 12 shown in Fig. 4 can also be used.
如圖5所示,在將片材9拉伸的狀態下,利用工件斷裂手段的裂片頭16,以使工件5表面側成為彎曲外側之方式將工件5彎曲。然後,藉由使工件5彎曲,使工件5表面的刻劃線5c到達工件5背面。圖7(A)所示係工件5所發生的裂痕5d。因為藉由對工件5施加拉伸力P可使裂痕5d進展,因而利用裂片頭16較小的加壓力便可將工件5裂片。此外,經斷裂後,因為工件5間相互離開,因而可抑制工件邊緣發生碎裂狀況,可在不致對斷裂面施加多餘負荷(損壞)的情況下進行裂片。圖7(B)所示係未對工件5施加拉伸力之情況時的比較例。當未對工件5施加拉伸力的情況時,因為水平方向並無竄逃處,因而若將裂片頭16按壓工件5,背面的A部處便發生碎裂情況,且工件5的斷裂面亦將相互摩擦而遭受損壞。另外,當工件屬於較薄的情況時,即便未施加彎曲力矩M,僅依靠拉伸力P亦仍可進行斷裂。此情況下,便不需要賦予彎曲力矩M的裂片頭16。As shown in Fig. 5, in a state where the sheet 9 is stretched, the workpiece 5 is bent by the split head 16 of the workpiece breaking means so that the surface side of the workpiece 5 becomes curved outside. Then, by bending the workpiece 5, the score line 5c on the surface of the workpiece 5 reaches the back surface of the workpiece 5. Fig. 7(A) shows the crack 5d which occurs in the workpiece 5. Since the crack 5d is made to progress by applying the tensile force P to the workpiece 5, the workpiece 5 can be split by the small pressing force of the split head 16. Further, after the fracture, since the workpieces 5 are separated from each other, it is possible to suppress the occurrence of chipping at the edge of the workpiece, and the split can be performed without applying unnecessary load (damage) to the fracture surface. Fig. 7(B) shows a comparative example in the case where no tensile force is applied to the workpiece 5. When the tensile force is not applied to the workpiece 5, since there is no escape in the horizontal direction, if the split head 16 is pressed against the workpiece 5, the A portion of the back surface is broken, and the fracture surface of the workpiece 5 is also Rubbed against each other and suffered damage. Further, when the workpiece is in a thin condition, even if the bending moment M is not applied, the fracture can be performed only by the tensile force P. In this case, the split head 16 that imparts the bending moment M is not required.
圖8與圖9所示係本發明第2實施形態的附裂片功能之刻劃裝置。圖8所示係附裂片功能之刻劃裝置的立體示意圖,圖9(A)所示係附裂片功能之刻劃裝置的俯視圖,圖9(B)所示係附裂片功能之刻劃裝置的側視圖。該附裂片功能之刻劃裝置同時執行刻劃步驟與裂片步驟,具備有:支撐著工件5的機台18;具有抵接於工件5上之刻劃刀19的刻劃頭20(工件斷裂手段);以及使刻劃頭20直線移動的移動機構21。在刻劃頭20中設有例如磁致伸縮振動元件或壓電元件等振動元件。利用從發送器所送出的電流使磁致伸縮振動元件產生振動,再藉由該振動元件使刻劃刀19振動。若使刻劃刀19振動,因為從刻劃刀19對工件5賦予衝撞力,因而裂痕將朝工件5的厚度方向進展。使刻劃頭20移動的移動機構21,係屬於滾珠螺桿機構等周知的移動機構。若使抵接於工件上的刻劃刀19移動,便在工件5表面上刻劃出刻劃線5c。Fig. 8 and Fig. 9 show a scribing device functioning device according to a second embodiment of the present invention. Fig. 8 is a perspective view showing a scribing device with a splitting function, Fig. 9(A) is a plan view of a scoring device with a splitting function, and Fig. 9(B) is a scoring device for attaching a splitting function. Side view. The scoring device with the splitting function simultaneously performs the scribing step and the splitting step, and includes: a machine table 18 supporting the workpiece 5; and a scribing head 20 having a scoring blade 19 abutting on the workpiece 5 (workpiece breaking means) And a moving mechanism 21 that moves the scribing head 20 linearly. A vibrating element such as a magnetostrictive vibrating element or a piezoelectric element is provided in the scribing head 20. The magnetostrictive vibrating element is vibrated by the current sent from the transmitter, and the scribing blade 19 is vibrated by the vibrating element. When the scribe blade 19 is vibrated, since the collision force is applied to the workpiece 5 from the scribe blade 19, the crack progresses toward the thickness direction of the workpiece 5. The moving mechanism 21 that moves the scribing head 20 is a well-known moving mechanism such as a ball screw mechanism. When the scribing blade 19 abutting on the workpiece is moved, the score line 5c is scored on the surface of the workpiece 5.
已在表面上刻劃有刻劃線5c的工件5,將其背面貼附於可伸縮性片材9上。然後,以對工件5賦予拉伸力P之方式,將工件5所貼附的片材9進行拉伸。換言之,如圖9所示,將工件5貼附於片材9上,然後,利用將片材9二端夾緊的夾緊夾具22將片材9拉伸。當然,亦可取代夾緊夾具22,改用圖6所示的拉緊機構將片材拉伸。The workpiece 5 having the score line 5c is scored on the surface, and the back surface thereof is attached to the stretchable sheet 9. Then, the sheet 9 to which the workpiece 5 is attached is stretched so as to impart a tensile force P to the workpiece 5. In other words, as shown in Fig. 9, the workpiece 5 is attached to the sheet 9, and then the sheet 9 is stretched by the clamp jig 22 which clamps the both ends of the sheet 9. Of course, instead of the clamp jig 22, the tensioning mechanism shown in Fig. 6 can be used to stretch the sheet.
如圖8所示,在將片材9拉伸的狀態下,利用工件斷裂手段的刻劃頭20在工件5表面上刻劃出刻劃線5c,同時使工件5表面的刻劃線5c到達工件5背面。圖10(A)所示係所發生的裂痕5d。藉由對工件5施加拉伸力P,可使利用刻劃頭20之刻劃刀19所發生的垂直裂痕5d更進一步成長,最後可達全切割狀態。藉由對工件5施加拉伸力P,即便刻劃刀19的荷重為低荷重,但是仍可形成較大的垂直裂痕5d。此外,因為形成有垂直裂痕5d的竄逃處,因而亦不致對斷裂面施加多餘的負荷(損壞)。圖10(B)所示係未對工件5施加拉伸力P之情況時的比較例。當未對工件5施加拉伸力P的情況時,因為垂直裂痕5d較不易成長,且垂直裂痕5d並無竄逃處,因而將對工件5斷裂面施加多餘的負荷(損壞)。若為形成較長垂直裂痕5d而增加刻劃刀19荷重,便可能對斷裂面施加過大的負荷,導致所斷裂產品的品質、破壞強度降低。As shown in Fig. 8, in a state where the sheet 9 is stretched, the scribing head 20 using the workpiece breaking means scores the score line 5c on the surface of the workpiece 5 while the score line 5c on the surface of the workpiece 5 is reached. The back of the workpiece 5. Fig. 10(A) shows the crack 5d which occurred. By applying the tensile force P to the workpiece 5, the vertical crack 5d generated by the scribe blade 19 by the scribe head 20 can be further grown, and finally reaches the full-cut state. By applying the tensile force P to the workpiece 5, even if the load of the scoring blade 19 is a low load, a large vertical crack 5d can be formed. Further, since the escape of the vertical crack 5d is formed, no excessive load (damage) is applied to the fracture surface. Fig. 10(B) shows a comparative example in the case where the tensile force P is not applied to the workpiece 5. When the tensile force P is not applied to the workpiece 5, since the vertical crack 5d is less likely to grow, and the vertical crack 5d does not escape, an excessive load (damage) is applied to the fracture surface of the workpiece 5. If the load of the scoring blade 19 is increased to form the long vertical crack 5d, an excessive load may be applied to the fracture surface, resulting in a decrease in the quality and the fracture strength of the fractured product.
圖11所示係本發明第3實施形態的附裂片功能之刻劃裝置。本實施形態的特徴在於:於上述第2實施形態的附裂片功能之刻劃裝置中,對工件施加彎曲力矩M。彎曲力矩M係以使刻劃有刻劃線5c之一側成為彎曲外側之方式施加。若工件5厚度較厚,僅依靠拉伸力P的施加並無法將工件斷裂。所以,對工件5亦施加彎曲力矩M,便可輕易地將工件斷裂。對工件施加彎曲力矩的方式,可採取諸如:利用3點彎曲而施加彎曲力矩的方式,或使以刻劃線為界線而保持著工件的一對機台中,使其中一者對另一者進行既定角度傾斜的方式;或使以刻劃線為界線而保持著工件的一雙夾緊裝置中,使其中一者對另一者進行既定角度傾斜的方式。因為刻劃頭20、移動機構21係如同上述第2實施形態的刻劃裝置,便賦予相同的元件符號並省略說明。Fig. 11 shows a scribing device having a splitting function according to a third embodiment of the present invention. The present embodiment is characterized in that the bending moment M is applied to the workpiece in the scribing device having the split blade function according to the second embodiment. The bending moment M is applied so that one side of the scored score line 5c is curved outward. If the thickness of the workpiece 5 is thick, the application of the tensile force P alone cannot break the workpiece. Therefore, by applying a bending moment M to the workpiece 5, the workpiece can be easily broken. The manner in which the bending moment is applied to the workpiece may be, for example, a method of applying a bending moment by using a 3-point bending, or a pair of machines holding the workpiece with the scribe line as a boundary, and one of them is performed on the other. A manner in which a predetermined angle is inclined; or a manner in which a pair of clamping devices that hold a workpiece with a scribe line as a boundary, such that one of them is tilted at a predetermined angle to the other. Since the scribing head 20 and the moving mechanism 21 are the same as the scribing device of the second embodiment, the same reference numerals are given to the same components, and the description thereof is omitted.
圖12(A)所示係使用第3實施形態的附裂片功能之刻劃裝置時所發生的裂痕。藉由對工件5施加拉伸力P與彎曲力矩M,可使利用刻劃裝置所發生的垂直裂痕5d更加成長,最後可達全切割狀態。圖12(B)所示係未對工件5施加拉伸力P.彎曲力矩M之情況時的比較例。當未對工件5施加拉伸力、彎曲力矩的情況時,因為垂直裂痕5d較不易成長,且垂直裂痕5d亦無竄逃處,因而將對工件5的斷裂面施加多餘的負荷(損壞)。若為形成較長的垂直裂痕而增加刻劃刀19荷重,便可能對斷裂面施加過大的負荷,導致所斷裂產品的品質、破壞強度降低。Fig. 12(A) shows a crack which occurs when the scribing device having the splitting function of the third embodiment is used. By applying the tensile force P and the bending moment M to the workpiece 5, the vertical crack 5d generated by the scoring device can be further grown, and finally the full-cut state can be achieved. Figure 12 (B) shows that the tensile force is not applied to the workpiece 5. A comparative example in the case of the bending moment M. When the tensile force and the bending moment are not applied to the workpiece 5, since the vertical crack 5d is less likely to grow, and the vertical crack 5d does not escape, an excessive load (damage) is applied to the fracture surface of the workpiece 5. If the load of the scoring blade 19 is increased to form a long vertical crack, an excessive load may be applied to the fracture surface, resulting in a decrease in the quality and fracture strength of the fractured product.
(1)裝置概要為調查延伸的效果,試製僅具延伸機構的試驗用治具(圖13)。外觀尺寸係410mm×450mm。該試驗用治具可對片材施加僅朝X方向、及X-Y方向之複合方向的張力。片材的夾緊係組合具溝槽的板並利用螺絲固定。利用該具溝槽的板可將片材的總寬度夾緊。張力的調整係一邊觀看刻度一邊利用圖中「拉伸部」的螺絲實施。(1) Device outline In order to investigate the effect of extension, a test fixture having only an extension mechanism was produced (Fig. 13). The external dimensions are 410mm x 450mm. The test jig can apply a tension to the sheet in a composite direction only in the X direction and the X-Y direction. The clamping of the sheet is combined with a grooved plate and secured with screws. The grooved plate can be used to clamp the overall width of the sheet. The adjustment of the tension is performed by using the screw of the "stretching portion" in the drawing while viewing the scale.
(2)延伸所使用片材之概要所使用的刻劃膠帶係當將矽晶圓刻劃時一般所使用的D-650及延伸用膠帶D-675[Lintec(Adwill)公司製,寬度300mm,厚度80 μ m]。經刻劃為適當長度供使用。(2) The outline of the sheet to be used for stretching is a D-650 and an extension tape D-675 (Lintec (Adwill), which is generally used for the enamel wafer, and has a width of 300 mm. Thickness 80 μ m]. It is scribed as an appropriate length for use.
(3)晶圓裂片時的延伸效果將矽晶圓貼附於刻劃膠帶(D-675)上,分別朝X、Y方向各拉伸15mm。當將工件僅朝片材拉伸方向(X方向)拉伸的情況時,在片材拉伸方向(X方向)的正交方向(Y方向)上將出現起皺情況[圖14(a)],但是若正交方向亦施行相同距離延伸,起皺現象便將消失[圖14(b)]。(3) Extension effect at the time of wafer splicing The 矽 wafer was attached to the scribe tape (D-675) and stretched by 15 mm in the X and Y directions, respectively. When the workpiece is stretched only in the sheet stretching direction (X direction), wrinkles will occur in the orthogonal direction (Y direction) of the sheet stretching direction (X direction) [Fig. 14 (a) ], but if the same direction is extended in the orthogonal direction, the wrinkling phenomenon will disappear [Fig. 14(b)].
當將工件斷裂(用手折斷)時,在斷裂的地方出現間隙(圖15)。間隙係約340 μ m。經斷裂且已開啟的間隙隨時間的經過而有逐漸擴大的傾向,經數小時之後,在其他處所發現新的斷裂地方,且確認到間隙較之前所開始的寬度狹窄。When the workpiece is broken (broken by hand), a gap occurs at the break (Figure 15). The gap is approximately 340 μm. The fractured and opened gap tends to gradually expand over time, and after a few hours, new fractures are found in other locations, and the gap is confirmed to be narrower than the width previously started.
(4)工件施行十字刻劃的情況利用經施行十字刻劃的工件調查延伸效果。延伸距離均設定為15mm。將X方向斷裂(用手折斷)的結果(圖16)雖偏離刻劃線,但是在斷裂地方發生間隙。此外,在十字方向上亦同樣出現間隙,且寬度較第1斷裂地方更寬。可判斷係受延伸順序的影響。若將片材從環中取下,經放置數小時放置之後,間隙雖將收縮但是不致變為零。(4) The case where the workpiece is subjected to cross scoring is used to investigate the extension effect by the workpiece subjected to cross scribing. The extension distance is set to 15 mm. The result of breaking the X direction (breaking by hand) (Fig. 16) deviates from the scribe line, but a gap occurs at the break. In addition, a gap also appears in the cross direction, and the width is wider than the first break. It can be judged that it is affected by the order of extension. If the sheet is removed from the loop and placed for a few hours, the gap will shrink but will not become zero.
(5)切割膠帶D-675的情況將切割膠帶素材改變使用延伸用D-675,並施行延伸斷裂試驗。延伸距離在X、Y方向均設定為20mm。經斷裂的結果,在二方向均斷裂的地方釋放張力並出現間隙。在拉伸方向上所發生間隙的寬度如同之前D-650膠帶般朝X方向擴大,並朝Y方向略變狹窄。因為刻劃所產生的垂直裂痕較淺,用手折斷進行斷裂的影響較大,因而偏離刻劃線位置的情況較少。當可將刻劃線位置斷裂的情況時,便可呈一直線斷裂,在邊緣部並未發現較大的碎裂現象,且在經斷裂後的工件表面並無發現微粒附著現象(圖17)。分割面狀態因採取用手折斷方式之故雖難謂良好,但是可謂直角度大致呈良好狀態。(5) In the case of the dicing tape D-675, the dicing tape material was changed to use the extension D-675, and an elongation fracture test was performed. The extension distance is set to 20 mm in both the X and Y directions. As a result of the fracture, the tension is released and a gap occurs in the place where both directions are broken. The width of the gap occurring in the stretching direction is expanded toward the X direction like the previous D-650 tape, and is slightly narrowed toward the Y direction. Because the vertical cracks generated by the scoring are shallow, the effect of breaking by hand is greater, and thus the deviation from the position of the score line is less. When the position of the score line can be broken, it can be broken in a straight line, no large fragmentation phenomenon is found at the edge portion, and no particle adhesion phenomenon is observed on the surface of the fractured workpiece (Fig. 17). Although it is difficult to say that the state of the split surface is broken by hand, it can be said that the straight angle is substantially good.
(6)結論本試驗內所獲得的結果,整理如下:確認到即使習知所使用的切割膠帶仍可進行充分的延伸。(6) Conclusion The results obtained in this test were organized as follows: It was confirmed that even the conventionally used dicing tape can be sufficiently extended.
在將工件斷裂之同時於斷裂地方出現間隙。A gap occurs at the break where the workpiece is broken.
當以十字施行延伸的情況時,雖隨拉伸順序(X、Y)改變張力大小,但是不管哪一方向均可發現延伸的效果。When extending in a cross, although the tension is changed in the stretching order (X, Y), the effect of stretching can be found regardless of which direction.
在剛裂片後與搬送中,因為工件間並未相互摩擦,因而不致發生碎裂現象,且亦無發現對矽表面的微粒附著現象。After the cleavage and the transfer, since the workpieces did not rub against each other, no chipping occurred, and no adhesion of particles to the surface of the crucible was observed.
因為認為在刻劃試驗中可獲得充分的延伸效果,因而判斷可施行品質良好的裂片。Since it is considered that a sufficient extension effect can be obtained in the scratch test, it is judged that a good quality split can be performed.
以下,針對本發明第4實施形態的裂片裝置進行說明。圖18至圖21所示係本發明第4實施形態的裂片裝置。如圖18所示,對作為工件51的薄板狀半導體晶圓預先利用刻劃機,朝縱橫刻劃出格子狀刻劃線52。例如將前端尖銳的角錐工具(刀尖)、或自由旋轉的薄板圓盤(輪)推抵於工件表面上,並沿工件51表面使該等工具移動,在工件51表面上鑿刻出刻劃線52。亦可在使工具延工件51移動之際,使工具產生振動。Hereinafter, a splitting device according to a fourth embodiment of the present invention will be described. Fig. 18 to Fig. 21 show a splitting device according to a fourth embodiment of the present invention. As shown in FIG. 18, a grid-shaped scribe line 52 is drawn in the vertical and horizontal directions by using a scriber in advance on the thin-plate-shaped semiconductor wafer as the workpiece 51. For example, a sharp-pointed corner tool (knife tip) or a freely rotating thin plate disk (wheel) is pushed against the surface of the workpiece, and the tools are moved along the surface of the workpiece 51, and the surface of the workpiece 51 is chiseled and scored. Line 52. It is also possible to cause the tool to vibrate while the tool is being extended by the workpiece 51.
經在工件51表面上刻劃出刻劃線52之後,如圖19(A)所示,在工件51已刻劃有刻劃線52之一側設定為表面側,並將工件51背面貼附於片材53上。片材53使用具黏著性的樹脂製品。例如可使用如同在搬送時,晶片狀半導體晶圓所貼附的搬送用片材為相同者。本第4實施形態的裂片裝置不同於第1實施形態的裂片裝置之處在於:片材53有施加拉伸力的情況,亦有未施加的情況。After the scribe line 52 is scored on the surface of the workpiece 51, as shown in Fig. 19(A), one side of the workpiece 51 on which the scribe line 52 has been scribed is set as the surface side, and the back surface of the workpiece 51 is attached. On the sheet 53. The sheet 53 is made of an adhesive resin product. For example, it is possible to use the same sheet for transporting the wafer-shaped semiconductor wafer as it is during transportation. The splitting device of the fourth embodiment is different from the splitting device of the first embodiment in that the sheet 53 has a tensile force applied thereto, and may not be applied.
如圖18所示,片材53上所貼附的工件51以片材53為背側載置於中高裂片台55上。裂片台55形成半圓柱狀,且在表面上開設複數個作為片材密接手段的吸附孔56。吸附孔56連接於抽吸路徑57,而抽吸路徑57連通於最後的一個抽吸口58。該圖18中雖省略圖示裂片台55中央部分的吸附孔56,但是實際上沿裂片台55圓周方向設置複數個。抽吸口58連接於未圖示的真空泵,並從抽吸口58抽吸著空氣。As shown in Fig. 18, the workpiece 51 attached to the sheet 53 is placed on the middle-high splitting stage 55 with the sheet 53 as the back side. The splitting table 55 is formed in a semi-cylindrical shape, and a plurality of adsorption holes 56 as a means for adhering the sheets are formed on the surface. The suction hole 56 is connected to the suction path 57, and the suction path 57 is connected to the last suction port 58. Although the adsorption holes 56 in the central portion of the splitting table 55 are not shown in Fig. 18, a plurality of them are actually provided in the circumferential direction of the splitting table 55. The suction port 58 is connected to a vacuum pump (not shown), and sucks air from the suction port 58.
圖20所示係半圓柱形裂片台55的俯視圖,圖21係背面圖。複數吸附孔56排列於裂片台55的最高部(線h1上),並在其上面不僅裂片台55的最高部,尚從最高部朝較低位置(線h2)具高低差的複數列排列。圖20所示係橫向一列相同高度的吸附孔56。圖中W1、W2所示係尺寸不同的圓形工件平面形狀。吸附孔56以抽吸工件51周圍、或避開工件51下面僅抽吸片材53之方式排列。然後,較低位置列的吸附孔56比較高位置列排列更多。該等吸附孔56連接於在裂片台55背面所形成抽吸溝59。如圖21所示,抽吸溝59朝縱向與橫向延伸,並連接於最後的抽吸口58。裂片台55載置於未圖示之具平坦表面的基台上,而基台表面與裂片台抽吸溝59之間成為抽吸空氣的通路。Fig. 20 is a plan view showing a semi-cylindrical split piece stage 55, and Fig. 21 is a rear view. The plurality of adsorption holes 56 are arranged at the highest portion of the splitter table 55 (on the line h1), and are arranged on the uppermost portion of not only the highest portion of the splitter stage 55 but also from the highest portion to the lower position (line h2) with a height difference. Figure 20 shows a row of adsorption holes 56 of the same height in the lateral direction. In the figure, W1 and W2 are plane shapes of circular workpieces having different sizes. The suction holes 56 are arranged around the suction workpiece 51 or away from the workpiece 51 only by sucking the sheet 53. Then, the adsorption holes 56 of the lower position column are arranged more than the higher position column. The adsorption holes 56 are connected to the suction grooves 59 formed on the back surface of the splitting table 55. As shown in Fig. 21, the suction groove 59 extends in the longitudinal direction and the lateral direction, and is connected to the last suction port 58. The splitting table 55 is placed on a base having a flat surface (not shown), and the surface between the abutment and the splitting table suction groove 59 serves as a path for sucking air.
將已貼附工件51的片材53載置於裂片台55上之後,從抽吸口58將空氣抽吸,連接於抽吸口58的吸附孔56便抽吸空氣,使片材53密接於裂片台55。因為若片材53與裂片台55間的距離越狹窄,壓力越容易下降,因而自然從裂片台55較高位置朝較低位置依序進行,換言之,從工件51中央部起朝二端側依序地使片材53密接於裂片台55。片材53密接於裂片台55上時,片材53上所貼附的工件51如圖19(B)所示,以刻劃線52成為彎曲外側之方式沿裂片台55彎曲。依此,工件51發生彎曲力矩,並在工件51有鑿刻刻劃線52之一側發生拉伸應力。藉由該拉伸應力,裂痕54從工件51表面朝背面進展而使工件51斷裂。在此,於工件51沿裂片台55彎曲的階段中工件51便斷裂。所以,工件51從中央部起朝向二端側逐漸斷裂(若就圖18而言,從半圓柱裂片台55的最高部起,沿左右的刻劃線52發生/推進斷裂)。After the sheet 53 to which the workpiece 51 has been attached is placed on the splitting table 55, air is sucked from the suction port 58, and the suction hole 56 connected to the suction port 58 sucks air to make the sheet 53 adhere to each other. Splitting table 55. Because the narrower the distance between the sheet 53 and the splitting table 55, the pressure is more likely to decrease, so that it naturally proceeds from the higher position of the splitting table 55 toward the lower position, in other words, from the central portion of the workpiece 51 toward the two ends. The sheet 53 is sequentially adhered to the splitting stage 55. When the sheet 53 is in close contact with the splitting table 55, the workpiece 51 attached to the sheet 53 is bent along the splitting table 55 so that the score line 52 becomes curved outward as shown in Fig. 19(B). Accordingly, the workpiece 51 is subjected to a bending moment, and tensile stress is generated on one side of the workpiece 51 having the chiseled score line 52. By the tensile stress, the crack 54 progresses from the surface of the workpiece 51 toward the back surface to break the workpiece 51. Here, the workpiece 51 is broken during the stage in which the workpiece 51 is bent along the splitting table 55. Therefore, the workpiece 51 gradually breaks from the center portion toward the both end sides (if, in Fig. 18, from the highest portion of the semi-cylindrical split table 55, the right and left scribe lines 52 occur/propel fracture).
將片材53設為工件51背側的理由如圖19所示,因為裂痕54對工件51的進展較為容易。假設若將片材53貼附於工件51表面側,片材53將因其彈力而妨礙到刻劃線52溝渠的開啟,因而導致裂片趨於困難。此外,藉由將裂片台55設為半圓柱形,並將工件51的刻劃線52平行於裂片台中心線55a配置,藉此對已彎曲之工件51的法線方向產生應力作用。故,可防止因工件51斷裂面相互摩擦而發生碎裂情況。The reason why the sheet 53 is set to the back side of the workpiece 51 is as shown in Fig. 19, because the crack 54 is easier to advance the workpiece 51. It is assumed that if the sheet 53 is attached to the surface side of the workpiece 51, the sheet 53 will hinder the opening of the scribe line 52 due to its elastic force, thus causing the sipe to become difficult. Further, by setting the splitting table 55 to a semi-cylindrical shape and arranging the score line 52 of the workpiece 51 parallel to the splitting table center line 55a, stress acts on the normal direction of the bent workpiece 51. Therefore, it is possible to prevent the chipping of the fracture surface of the workpiece 51 from colliding with each other.
在上述斷裂步驟中,對縱向與橫向的刻劃線52中,僅就縱向(換言之,平行於裂片台55中心線55a的刻劃線52),將工件51斷裂。在縱橫中之其中一方向的斷裂之最終階段,工件51在片材53上被斷裂成細長條(細長條斷裂步驟)。接著,解除吸附孔56的吸附,使片材53從裂片台55上退縮。然後,將片材53或裂片台55任一者於包含片材53在內的平面(例如水平面內)進行90度旋轉(相對旋轉步驟)。依此,縱橫中另一者的刻劃線52平行於裂片台55中心線55a。然後,再度從吸附孔56抽吸空氣,並使已斷裂成細長條的工件51沿裂片台55再度彎曲,將工件51斷裂成複數個晶片(晶片斷裂步驟)。藉由將工件斷裂步驟分開成細長條斷裂步驟與晶片斷裂步驟,可在將經刻劃出縱橫刻劃線的工件51不致發生碎裂情況下斷裂成晶片。In the above-described breaking step, in the longitudinal and lateral scribe lines 52, the workpiece 51 is broken only in the longitudinal direction (in other words, the scribe line 52 parallel to the center line 55a of the lobing table 55). At the final stage of the fracture in one of the longitudinal and transverse directions, the workpiece 51 is broken into an elongated strip on the sheet 53 (strip strip breaking step). Next, the adsorption of the adsorption holes 56 is released, and the sheet 53 is retracted from the split table 55. Then, either the sheet 53 or the splitting table 55 is rotated 90 degrees (relatively rotating step) on a plane (for example, in a horizontal plane) including the sheet 53. Accordingly, the score line 52 of the other of the vertical and horizontal directions is parallel to the center line 55a of the split stage 55. Then, air is again sucked from the adsorption holes 56, and the workpiece 51 which has been broken into the elongated strips is again bent along the splitting table 55, and the workpiece 51 is broken into a plurality of wafers (wafer breaking step). By separating the workpiece breaking step into the elongated strip breaking step and the wafer breaking step, the workpiece 51 which has been scored with the longitudinal and transverse score lines can be broken into wafers without causing chipping.
圖22所示係在工件51貼附於片材53上的狀態下,將可伸縮性片材53拉伸的例子。當將工件51斷裂時,若對工件51施加拉伸力,在工件51斷裂之同時,工件51間將被拉離開,因為工件51間空出間隙,因而可更進一步防止工件51斷裂面間發生相接觸情況。所以,如圖22所示,亦可在將工件51斷裂之前,於將工件51貼附於片材53上的狀態下,對可伸縮性片材53施加拉伸力。具體而言,對片材53周圍朝X方向與Y方向拉伸,對片材53朝X方向與Y方向施加拉伸力(張力t)。在保持著該張力t的狀態下,將框構件60貼附於工件51周圍。在工件51周圍與框構件60之間空出間隔,而對工件51周圍所露出的片材53賦予張力。另外,在對工件51施加拉伸力時,吸附孔56最好避開工件51下面,配置於僅吸附片材53的位置處。理由係若在工件51下面配置吸附孔56,則原本特地利用片材53的拉伸力要將已斷裂工件間拉離開,卻因吸附孔56的吸附,反而導致工件51間較難分離。FIG. 22 shows an example in which the stretchable sheet 53 is stretched in a state where the workpiece 51 is attached to the sheet 53. When the workpiece 51 is broken, if a tensile force is applied to the workpiece 51, the workpiece 51 will be pulled away while the workpiece 51 is broken, because gaps are left between the workpieces 51, so that the occurrence of fracture between the workpieces 51 can be further prevented. Contact situation. Therefore, as shown in FIG. 22, a tensile force may be applied to the stretchable sheet 53 in a state where the workpiece 51 is attached to the sheet 53 before the workpiece 51 is broken. Specifically, the periphery of the sheet 53 is stretched in the X direction and the Y direction, and a tensile force (tension t) is applied to the sheet 53 in the X direction and the Y direction. The frame member 60 is attached around the workpiece 51 while the tension t is maintained. A space is formed between the periphery of the workpiece 51 and the frame member 60, and tension is applied to the sheet 53 exposed around the workpiece 51. Further, when a tensile force is applied to the workpiece 51, the adsorption hole 56 is preferably disposed at a position where only the sheet 53 is adsorbed while avoiding the lower surface of the workpiece 51. The reason is that if the adsorption hole 56 is disposed under the workpiece 51, the tensile force of the sheet 53 is originally used to pull the fractured workpiece apart, but the adsorption of the adsorption hole 56 causes the workpiece 51 to be difficult to separate.
但是,習知並未存在有可將刻劃有縱橫刻劃線52的半導體晶圓斷裂成晶片的裂片裝置。理由係在將工件51加工成細長條的階段,剩餘的刻劃線52並非呈一直線排列。在利用刀片切割時非對準不可,對刻劃線52與刀片及其刀片座間的位置關係必須要求高精度,當將工件51進行90度旋轉時,刀片無法確切落於刻劃線上,導致成為晶片。但是,本實施形態中,對可輕易將工件51斷裂成細長條狀的細長條斷裂步驟,以及進行90度旋轉並裂片為晶片的晶片斷裂步驟,均未要求刻劃線52必需位於一直線上。故裂片成為晶片。However, it is not known that there is a splitting device that can break a semiconductor wafer having a longitudinal and vertical score line 52 into a wafer. The reason is that at the stage of processing the workpiece 51 into a sliver, the remaining score lines 52 are not arranged in a straight line. When the cutting is performed by the blade, the misalignment is not possible. The positional relationship between the score line 52 and the blade and the blade holder must require high precision. When the workpiece 51 is rotated by 90 degrees, the blade cannot fall on the score line, resulting in Wafer. However, in the present embodiment, the step of breaking the elongated strip which can easily break the workpiece 51 into a slender strip, and the step of breaking the wafer by 90 degrees and the split is a wafer do not require the score line 52 to be in a straight line. Therefore, the lobes become wafers.
圖23所示係裂片台55上所形成吸附孔56的另一例。在該例子中,於裂片台55表面上形成朝裂片台55中心線55a的平行方向延伸之溝槽61。吸附孔56連接於溝槽61,一列的吸附孔56利用溝槽61而組群化。若將吸附孔56利用溝槽61組群化,在裂片台55中心線方向上,便可均等吸附著工件51。此外,如圖24所示,為使片材53對裂片台55的吸附更牢固,將裂片台55周圍利用箱體62包圍亦屬有效方法。Another example of the adsorption hole 56 formed in the cleavage table 55 is shown in FIG. In this example, a groove 61 extending in the parallel direction of the center line 55a of the splitting table 55 is formed on the surface of the splitting table 55. The adsorption holes 56 are connected to the grooves 61, and the adsorption holes 56 in one row are grouped by the grooves 61. When the adsorption holes 56 are grouped by the grooves 61, the workpiece 51 can be uniformly adsorbed in the center line direction of the splitting table 55. Further, as shown in Fig. 24, in order to make the suction of the sheet 53 to the splitting table 55 stronger, it is also an effective method to surround the splitting table 55 with the casing 62.
圖25所示係為從較高位置起朝較低位置的吸附孔56依序抽吸空氣,在抽吸路徑57上設置複數電磁閥63的例子。複數吸附孔56從中央最高位置起排列至左右較低位置處。所以,抽吸路徑57便配合吸附孔56的高度設置複數個,且各抽吸路徑57中相同高度的複數吸附孔56相連接。各抽吸路徑57中分別設有電磁閥63。電磁閥63從較高位置的吸附孔56所連接之抽吸路徑57起,朝向較低位置的吸附孔56所連接抽吸路徑依序開啟。例如圖25所示,電磁閥63將依1、2、3、…、7等順序開啟。若設有電磁閥63,便可從工件51中央部朝外側,確實以目視亦能辨識的程度,依序將工件51密接於裂片台55上。Fig. 25 shows an example in which the suction holes 56 are sucked toward the lower position from the upper position, and the plurality of solenoid valves 63 are provided on the suction path 57. The plurality of adsorption holes 56 are arranged from the highest position in the center to the lower left and right positions. Therefore, the suction path 57 is provided in plurality with the height of the adsorption hole 56, and the plurality of adsorption holes 56 of the same height in the respective suction paths 57 are connected. A solenoid valve 63 is provided in each of the suction paths 57. The solenoid valve 63 is opened from the suction path 57 to which the adsorption hole 56 of the higher position is connected, and the suction path connected to the adsorption hole 56 at the lower position is sequentially opened. For example, as shown in Fig. 25, the solenoid valve 63 will be opened in the order of 1, 2, 3, ..., 7, and the like. When the electromagnetic valve 63 is provided, the workpiece 51 can be closely adhered to the splitting table 55 in order from the center portion of the workpiece 51 to the outside, and surely visually recognized.
圖26所示係本發明第5實施形態的裂片裝置。本實施形態中,將片材53密接於裂片台55的片材密接手段,由片材固定台14與片材推抵機構所構成。換言之,如圖26(A)所示,包夾裂片台55而配置一對片材固定台14,將片材53二端部利用片材固定台14夾緊。然後,如圖26(B)所示,利用推抵機構將裂片台55從下方朝片材53向上推,使片材53密接於裂片台55。推抵機構使用如滾珠螺桿等周知的單軸移動機構。另外,因為裂片台55對片材53的移動係相對的,因而亦可取代將裂片台55往上推,改為將片材固定台14往下推。Fig. 26 shows a splitting device according to a fifth embodiment of the present invention. In the present embodiment, the sheet material adhering means for adhering the sheet member 53 to the split sheet stage 55 is constituted by the sheet fixing table 14 and the sheet pushing mechanism. In other words, as shown in Fig. 26(A), the pair of sheet fixing stages 14 are placed to sandwich the splitting table 55, and the both ends of the sheet 53 are clamped by the sheet fixing table 14. Then, as shown in FIG. 26(B), the splitting table 55 is pushed up from the lower side toward the sheet 53 by the pushing mechanism, and the sheet 53 is brought into close contact with the splitting table 55. The pushing mechanism uses a well-known single-axis moving mechanism such as a ball screw. Further, since the movement of the sheet 53 against the sheet 53 is opposed, instead of pushing the splitting table 55 upward, the sheet fixing table 14 can be pushed down.
片材53利用裂片台55的上昇而推抵於裂片台55,並沿裂片台55表面彎曲。若片材53密接於裂片台55,片材53上所貼附的工件51亦將沿裂片台55彎曲。在工件51沿裂片台55彎曲的階段,工件51便斷裂,因此工件51一邊從中央部起朝二端側逐漸斷裂,一邊使斷裂的工件51依序密接於裂片台55。依上述,工件51被分割成細長條。在將工件51分割成細長條之後,使裂片台55從片材53上朝下方退縮,再將片材53二端部從片材固定台14上取下。接著。使片材53在水平面內90度旋轉後,再度將片材53保持於片材固定台14上。當然,亦可取代將片材53安置於片材固定台14上,改為設置使裂片台55在水平面內90度旋轉的旋轉機構。最後,再度將裂片台55往上推而將已分割成細長條的工件51分割為晶片。The sheet 53 is pushed against the splitting table 55 by the rise of the splitting table 55, and is bent along the surface of the splitting table 55. If the sheet 53 is in close contact with the splitting table 55, the workpiece 51 attached to the sheet 53 will also be bent along the splitting table 55. When the workpiece 51 is bent along the cleavage table 55, the workpiece 51 is broken. Therefore, the workpiece 51 gradually breaks from the center portion toward the both end sides, and the fractured workpiece 51 is in close contact with the cleavage table 55 in order. According to the above, the workpiece 51 is divided into elongated strips. After the workpiece 51 is divided into elongated strips, the splitting table 55 is retracted downward from the sheet 53, and the both ends of the sheet 53 are removed from the sheet fixing table 14. then. After the sheet 53 is rotated 90 degrees in the horizontal plane, the sheet 53 is again held on the sheet fixing table 14. Of course, instead of placing the sheet 53 on the sheet fixing table 14, a rotating mechanism for rotating the splitting table 55 at 90 degrees in the horizontal plane may be provided instead. Finally, the splitting table 55 is again pushed up to divide the workpiece 51 that has been divided into elongated strips into wafers.
根據本第5實施形態的裂片裝置,即便未在裂片台55上設置吸附孔56,仍可使片材53密接於裂片台55。且,當將片材53利用裂片台55上推之際,因為對片材53自然發生拉伸力作用,因而可防止已斷裂的工件51間的斷裂面發生相互摩擦情況。According to the splitting device of the fifth embodiment, even if the adsorption hole 56 is not provided in the splitting table 55, the sheet 53 can be adhered to the splitting table 55. Further, when the sheet 53 is pushed up by the splitting table 55, since the tensile force acts on the sheet 53 naturally, it is possible to prevent the fracture surfaces between the broken workpieces 51 from rubbing against each other.
圖27與圖28所示係裂片台65之另一例。圖27所示係裂片台65的側視圖,圖28所示係裂片台65的側視圖。將工件51一次統括地分割成晶片時,亦可將裂片台65如本例子般的形成球面其中一部分。此情況下,在圖28所示裂片台的俯視圖中,吸附孔66以裂片台65的最高部C為中心排列呈同心圓狀態。然後,吸附孔66連接於抽吸路徑67,抽吸路徑67則連通於其中一個抽吸口68。若從吸附孔66抽吸空氣,便可從工件51的中央部起朝向外周側,依序使工件51密接於裂片台65。Another example of the splitting stage 65 shown in Figs. 27 and 28 is shown. Fig. 27 is a side view of the cleavage table 65, and Fig. 28 is a side view of the cleavage table 65. When the workpiece 51 is collectively divided into wafers at a time, the splitting table 65 may be formed as a part of the spherical surface as in the present example. In this case, in the plan view of the splitting stage shown in Fig. 28, the adsorption holes 66 are arranged concentrically around the highest portion C of the splitting stage 65. Then, the adsorption hole 66 is connected to the suction path 67, and the suction path 67 is communicated to one of the suction ports 68. When air is sucked from the suction hole 66, the workpiece 51 can be closely adhered to the splitting stage 65 from the center portion of the workpiece 51 toward the outer peripheral side.
另外,本發明並不僅侷限於上述實施形態,舉凡在未變更本發明主旨的範疇內均可進行各種變更。例如工件亦可取代半導體晶圓,改用薄玻璃基板。此外,在工件黏貼步驟中,亦可在工件中刻劃出刻劃線之後,才將工件貼附於片材上,亦可在將工件貼附於片材上之後,才於工件上刻劃出刻劃線。另外,半圓柱形裂片台亦可為半圓筒形。The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit and scope of the invention. For example, a workpiece can also replace a semiconductor wafer and use a thin glass substrate instead. In addition, in the step of attaching the workpiece, the workpiece may be attached to the sheet after the scribe line is scored in the workpiece, or the workpiece may be scribed on the workpiece after being attached to the sheet. Lined out. In addition, the semi-cylindrical split table can also be semi-cylindrical.
本說明書係以2005年1月5日申請的日本專利特願2005-000554、2005年5月19日申請的日本專利特願2005-146551及2005年12月26日申請的日本專利特願2005-373460為基礎。該等的內容均涵蓋於本發明中。The present specification is Japanese Patent Application No. 2005-000554 filed on Jan. 5, 2005, Japanese Patent Application No. 2005-146551, filed on May 19, 2005, and Japanese Patent Application No. 2005-. Based on 373460. The content of these are all covered by the present invention.
1a、1b...支撐點1a, 1b. . . Support point
2、5...工件2, 5. . . Workpiece
3...斷片頭3. . . Fragment head
5a...有刻劃線之一側5a. . . One side with a score line
5b...背面5b. . . back
5c...刻劃線5c. . . Scribing
5d...裂痕5d. . . crack
5e...中立軸5e. . . Neutral axis
6a、6b...支撐點6a, 6b. . . Support point
9...片材9. . . Sheet
10、11...由固定側及移動側所構成的延伸夾具(片材拉伸手段)10, 11. . . Extension jig composed of fixed side and moving side (sheet stretching method)
14a、14b...由平台所構成的拉緊機構(片材拉伸手段)14a, 14b. . . Tensioning mechanism composed of a platform (sheet stretching means)
12...環(框構件)12. . . Ring (frame member)
16...裂片頭(工件斷裂手段)16. . . Split head (workpiece breaking means)
18...機台18. . . Machine
19...刻劃刀19. . . Knife
20...刻劃頭(工件斷裂手段)20. . . Scribing head (workpiece breaking means)
21...移動機構twenty one. . . Mobile agency
22...夾緊夾具(片材拉伸手段)twenty two. . . Clamping clamp (sheet stretching method)
51...工件51. . . Workpiece
52...刻劃線52. . . Scribing
53...片材53. . . Sheet
55、65...裂片台55, 65. . . Splitting table
55a...裂片台中心線55a. . . Splitting table centerline
56、66...吸附孔(片材密接手段)56, 66. . . Adsorption hole (sheet adhesion means)
57、67...抽吸路徑57, 67. . . Suction path
58、68...抽吸口58, 68. . . Suction port
61...溝槽61. . . Trench
62...箱體62. . . Box
63...電磁閥63. . . The electromagnetic valve
64...片材固定台(片材密接手段)64. . . Sheet fixing table (sheet bonding means)
71...球面支撐頭71. . . Spherical support head
71a...支撐頭表面71a. . . Support head surface
71b...排氣管71b. . . exhaust pipe
73...按押片材73. . . Press sheet
d...缺口溝d. . . Notch groove
P...拉伸力P. . . Tensile force
M...彎曲力矩M. . . Bending moment
S1、S2...玻璃基板S1, S2. . . glass substrate
W...玻璃基板接合體W. . . Glass substrate assembly
W1、W2...圓形工件W1, W2. . . Circular workpiece
圖1為本發明第1實施形態的工件之裂片方法原理圖。Fig. 1 is a schematic view showing a method of splitting a workpiece according to a first embodiment of the present invention.
圖2為由彎曲力矩所發生的彎曲應力圖。Figure 2 is a graph of the bending stress occurring by the bending moment.
圖3為本發明第2實施形態的工件之裂片方法原理圖。Fig. 3 is a schematic view showing a method of splitting a workpiece according to a second embodiment of the present invention.
圖4(A)~(D)為使用片材對工件施加拉伸力的方法示意圖。4(A) to (D) are schematic views showing a method of applying a tensile force to a workpiece using a sheet.
圖5為本發明第1實施形態的裂片裝置立體示意圖。Fig. 5 is a perspective view showing a splitting device according to a first embodiment of the present invention.
圖6為供對工件施加拉伸力的拉緊機構立體示意圖。Figure 6 is a perspective view of a tensioning mechanism for applying a tensile force to a workpiece.
圖7為利用裂片裝置所產生的裂痕圖(圖(A)係使用本實施形態的裂片裝置之情況,圖(B)係比較例中使用習知裂片裝置之情況)。Fig. 7 is a view showing a crack generated by a splitting device (Fig. (A) shows a case where the splitting device of the present embodiment is used, and Fig. (B) shows a case where a conventional splitting device is used in a comparative example).
圖8為本發明第2實施形態的附裂片功能之刻劃裝置立體示意圖。Fig. 8 is a perspective view showing a scribing device having a splitting function according to a second embodiment of the present invention.
圖9為上述圖8的附裂片功能之刻劃裝置圖(圖(A)係俯視圖,圖(B)係側視圖)。Fig. 9 is a view showing the scribing device of the above-mentioned Fig. 8 (Fig. (A) is a plan view, and Fig. (B) is a side view).
圖10為利用上述圖8所示附裂片功能之刻劃裝置產生的裂痕圖(圖(A)係使用本實施形態的刻劃裝置之情況,圖(B)係比較例中使用習知刻劃裝置之情況)。Fig. 10 is a view showing a crack generated by the scribing device having the splitting function shown in Fig. 8 (Fig. (A) shows the use of the scribing device of the present embodiment, and Fig. (B) shows the conventional scribing for the comparative example. The situation of the device).
圖11為本發明第3實施形態的附裂片功能之刻劃裝置立體示意圖。Fig. 11 is a perspective view showing a scribing device having a splitting function according to a third embodiment of the present invention.
圖12為利用上述圖11所示附裂片功能之刻劃裝置產生的裂痕圖(圖(A)係使用本實施形態之附裂片功能之刻劃裝置的情況,圖(B)係比較例中使用習知刻劃裝置之情況)。Fig. 12 is a view showing a crack generated by the scribing device having the splitting function shown in Fig. 11 (Fig. (A) shows the use of the scribing device of the present embodiment, and Fig. (B) is used in the comparative example. The case of a conventional scoring device).
圖13為延伸夾具的外觀圖。Figure 13 is an external view of the extension jig.
圖14(a)、(b)為利用試製夾具所進行的片材拉伸狀況照片。Fig. 14 (a) and (b) are photographs showing the state of sheet stretching by a trial jig.
圖15(a)、(b)為延伸狀態下的矽晶圓斷裂照片。Fig. 15 (a) and (b) are photographs of the ruthenium wafer fracture in an extended state.
圖16為十字刻劃物的斷裂(D-650)圖。Figure 16 is a broken (D-650) diagram of a cross score.
圖17(a)~(c)為斷裂後的工件之面狀態(D-675)照片。Fig. 17 (a) to (c) are photographs of the surface state (D-675) of the workpiece after the fracture.
圖18為本發明第4實施形態的裂片裝置立體示意圖。Figure 18 is a perspective view showing a splitting device according to a fourth embodiment of the present invention.
圖19為將工件貼附於片材上的狀態剖視圖(圖(A)係使工件彎曲前的狀態,圖(B)係使工件彎曲的狀態)。Fig. 19 is a cross-sectional view showing a state in which a workpiece is attached to a sheet (Fig. (A) shows a state before the workpiece is bent, and Fig. (B) shows a state where the workpiece is bent).
圖20為半圓柱形裂片台的俯視圖。Figure 20 is a top plan view of a semi-cylindrical split table.
圖21為圖20所示裂片台的仰視圖。Figure 21 is a bottom plan view of the splitting stage shown in Figure 20.
圖22為在將工件貼附於片材上的狀態下,將可伸縮性片材進行拉伸之例的立體示意圖。Fig. 22 is a schematic perspective view showing an example in which a stretchable sheet is stretched in a state in which a workpiece is attached to a sheet.
圖23為裂片台上所形成吸附孔另一例的俯視圖。Fig. 23 is a plan view showing another example of the adsorption holes formed in the split stage.
圖24為將裂片台利用箱體包圍之例子的立體示意圖。Fig. 24 is a schematic perspective view showing an example in which a splitting table is surrounded by a casing.
圖25為在抽吸路徑上設置電磁閥之例子的立體示意圖。Fig. 25 is a schematic perspective view showing an example in which a solenoid valve is provided on a suction path.
圖26為本發明第5實施形態的裂片裝置立體示意圖(圖(A)係將片材上推前,圖(B)係正將片材上推的階段)。Fig. 26 is a perspective view showing a splitting device according to a fifth embodiment of the present invention (Fig. (A) is a stage in which the sheet is pushed up, and Fig. (B) is a step in which the sheet is pushed up).
圖27為球面形狀裂片台的側視圖。Figure 27 is a side elevational view of a spherical shaped splitter table.
圖28為球面形狀裂片台的俯視圖。Figure 28 is a plan view of a spherical shaped splitting table.
圖29為習知裂片方法的原理圖。Figure 29 is a schematic diagram of a conventional splitting method.
圖30為習知裂片裝置的剖視圖(圖(A)係將工件吸附前,圖(B)係將工件吸附後)。Figure 30 is a cross-sectional view of a conventional splitting device (Fig. (A) is before the workpiece is adsorbed, and Figure (B) is after the workpiece is adsorbed).
5...工件5. . . Workpiece
5c...刻劃線5c. . . Scribing
16...裂片頭16. . . Split head
23...機台twenty three. . . Machine
M...彎曲力矩M. . . Bending moment
P...拉伸力P. . . Tensile force
Claims (10)
Applications Claiming Priority (3)
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JP2005000554 | 2005-01-05 | ||
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JP2005373460 | 2005-12-26 |
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JP (1) | JP5037138B2 (en) |
KR (1) | KR101170587B1 (en) |
TW (1) | TWI428971B (en) |
WO (1) | WO2006073098A1 (en) |
Families Citing this family (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090050610A1 (en) * | 2004-10-13 | 2009-02-26 | Mitsuboshi Diamond Industrial Co., Ltd. | Method and apparatus for scribing brittle material board and system for breaking brittle material board |
JP5177992B2 (en) * | 2006-10-27 | 2013-04-10 | 浜松ホトニクス株式会社 | Processing object cutting method |
WO2008126501A1 (en) * | 2007-03-30 | 2008-10-23 | Thk Co., Ltd. | Scribing device and scribing method |
TWI466749B (en) * | 2007-11-02 | 2015-01-01 | Mitsuboshi Diamond Ind Co Ltd | Method for Segmentation of Fragile Material Substrate |
JP5286938B2 (en) * | 2008-05-27 | 2013-09-11 | 東京エレクトロン株式会社 | Needle mark inspection device, probe device, needle mark inspection method, and storage medium |
JP5203827B2 (en) * | 2008-07-14 | 2013-06-05 | リンテック株式会社 | Holding device |
JP5310278B2 (en) * | 2009-06-05 | 2013-10-09 | 三星ダイヤモンド工業株式会社 | Break bar |
JP5421699B2 (en) * | 2009-09-07 | 2014-02-19 | 三菱電機株式会社 | Semiconductor element separation method and semiconductor element separation apparatus |
TWI494284B (en) * | 2010-03-19 | 2015-08-01 | Corning Inc | Mechanical scoring and separation of strengthened glass |
JP5182339B2 (en) * | 2010-08-31 | 2013-04-17 | 三星ダイヤモンド工業株式会社 | Substrate break device |
CN103650304B (en) * | 2011-07-27 | 2016-01-20 | 日产自动车株式会社 | The manufacturing installation of excitation pole magnet and manufacture method thereof |
JP5831119B2 (en) * | 2011-10-17 | 2015-12-09 | 日本電気硝子株式会社 | Glass substrate cleaving apparatus, glass substrate cleaving method, and glass substrate manufacturing method |
KR101987039B1 (en) * | 2011-12-12 | 2019-06-10 | 니폰 덴키 가라스 가부시키가이샤 | Method for cutting and separating plate glass |
JP5994280B2 (en) * | 2012-02-21 | 2016-09-21 | 日産自動車株式会社 | Manufacturing method and manufacturing apparatus of magnet piece constituting magnet body for field pole |
KR101895606B1 (en) * | 2012-04-18 | 2018-10-18 | 주식회사 탑 엔지니어링 | Breaking unit and scribe apparatus having the same |
KR101365049B1 (en) * | 2012-08-02 | 2014-02-20 | 한국미쯔보시다이아몬드공업(주) | Rolling break apparatus for brittle material substrate |
JP6039363B2 (en) * | 2012-10-26 | 2016-12-07 | 三星ダイヤモンド工業株式会社 | Method and apparatus for dividing brittle material substrate |
WO2014079478A1 (en) | 2012-11-20 | 2014-05-30 | Light In Light Srl | High speed laser processing of transparent materials |
EP2754524B1 (en) | 2013-01-15 | 2015-11-25 | Corning Laser Technologies GmbH | Method of and apparatus for laser based processing of flat substrates being wafer or glass element using a laser beam line |
EP2781296B1 (en) | 2013-03-21 | 2020-10-21 | Corning Laser Technologies GmbH | Device and method for cutting out contours from flat substrates using a laser |
JP6115438B2 (en) * | 2013-10-16 | 2017-04-19 | 三星ダイヤモンド工業株式会社 | Breaking device and cutting method |
US20150165560A1 (en) | 2013-12-17 | 2015-06-18 | Corning Incorporated | Laser processing of slots and holes |
US10293436B2 (en) | 2013-12-17 | 2019-05-21 | Corning Incorporated | Method for rapid laser drilling of holes in glass and products made therefrom |
US11556039B2 (en) | 2013-12-17 | 2023-01-17 | Corning Incorporated | Electrochromic coated glass articles and methods for laser processing the same |
US10442719B2 (en) | 2013-12-17 | 2019-10-15 | Corning Incorporated | Edge chamfering methods |
US9676167B2 (en) | 2013-12-17 | 2017-06-13 | Corning Incorporated | Laser processing of sapphire substrate and related applications |
US9701563B2 (en) | 2013-12-17 | 2017-07-11 | Corning Incorporated | Laser cut composite glass article and method of cutting |
US9850160B2 (en) | 2013-12-17 | 2017-12-26 | Corning Incorporated | Laser cutting of display glass compositions |
US9815730B2 (en) | 2013-12-17 | 2017-11-14 | Corning Incorporated | Processing 3D shaped transparent brittle substrate |
EP3166895B1 (en) | 2014-07-08 | 2021-11-24 | Corning Incorporated | Methods and apparatuses for laser processing materials |
WO2016010943A2 (en) | 2014-07-14 | 2016-01-21 | Corning Incorporated | Method and system for arresting crack propagation |
EP3169635B1 (en) | 2014-07-14 | 2022-11-23 | Corning Incorporated | Method and system for forming perforations |
JP6788571B2 (en) | 2014-07-14 | 2020-11-25 | コーニング インコーポレイテッド | Interface blocks, systems and methods for cutting transparent substrates within a wavelength range using such interface blocks. |
WO2016010954A2 (en) | 2014-07-14 | 2016-01-21 | Corning Incorporated | Systems and methods for processing transparent materials using adjustable laser beam focal lines |
JP6689023B2 (en) * | 2014-08-28 | 2020-04-28 | 三星ダイヤモンド工業株式会社 | Break device |
US10047001B2 (en) | 2014-12-04 | 2018-08-14 | Corning Incorporated | Glass cutting systems and methods using non-diffracting laser beams |
JP2018507154A (en) | 2015-01-12 | 2018-03-15 | コーニング インコーポレイテッド | Laser cutting of thermally enhanced substrates using multi-photon absorption method |
EP3274306B1 (en) | 2015-03-24 | 2021-04-14 | Corning Incorporated | Laser cutting and processing of display glass compositions |
CN107666983B (en) | 2015-03-27 | 2020-10-02 | 康宁股份有限公司 | Venetian window and method for manufacturing the same |
WO2017011296A1 (en) | 2015-07-10 | 2017-01-19 | Corning Incorporated | Methods of continuous fabrication of holes in flexible substrate sheets and products relating to the same |
JP6509156B2 (en) * | 2016-04-05 | 2019-05-08 | 太陽誘電株式会社 | Expansion device and method of manufacturing electronic component |
KR102405144B1 (en) | 2016-05-06 | 2022-06-07 | 코닝 인코포레이티드 | Laser cutting and removal of contour shapes from transparent substrates |
US10410883B2 (en) | 2016-06-01 | 2019-09-10 | Corning Incorporated | Articles and methods of forming vias in substrates |
US10794679B2 (en) | 2016-06-29 | 2020-10-06 | Corning Incorporated | Method and system for measuring geometric parameters of through holes |
CN109803934A (en) | 2016-07-29 | 2019-05-24 | 康宁股份有限公司 | Device and method for laser treatment |
WO2018044843A1 (en) | 2016-08-30 | 2018-03-08 | Corning Incorporated | Laser processing of transparent materials |
JP6923284B2 (en) | 2016-09-30 | 2021-08-18 | コーニング インコーポレイテッド | Equipment and methods for laser machining transparent workpieces using non-axisymmetric beam spots |
EP3529214B1 (en) | 2016-10-24 | 2020-12-23 | Corning Incorporated | Substrate processing station for laser-based machining of sheet-like glass substrates |
US10752534B2 (en) | 2016-11-01 | 2020-08-25 | Corning Incorporated | Apparatuses and methods for laser processing laminate workpiece stacks |
JP6776859B2 (en) | 2016-12-09 | 2020-10-28 | 日本電気硝子株式会社 | Manufacturing method of wavelength conversion member, wavelength conversion member and light emitting device |
US10688599B2 (en) | 2017-02-09 | 2020-06-23 | Corning Incorporated | Apparatus and methods for laser processing transparent workpieces using phase shifted focal lines |
US11078112B2 (en) | 2017-05-25 | 2021-08-03 | Corning Incorporated | Silica-containing substrates with vias having an axially variable sidewall taper and methods for forming the same |
US10580725B2 (en) | 2017-05-25 | 2020-03-03 | Corning Incorporated | Articles having vias with geometry attributes and methods for fabricating the same |
US10626040B2 (en) | 2017-06-15 | 2020-04-21 | Corning Incorporated | Articles capable of individual singulation |
JP2019038238A (en) * | 2017-08-29 | 2019-03-14 | 三星ダイヤモンド工業株式会社 | Break device |
CN107673596B (en) * | 2017-11-13 | 2023-07-14 | 武汉先河激光技术有限公司 | Splitting device and splitting method for mobile phone comprehensive screen |
US12180108B2 (en) | 2017-12-19 | 2024-12-31 | Corning Incorporated | Methods for etching vias in glass-based articles employing positive charge organic molecules |
US11554984B2 (en) | 2018-02-22 | 2023-01-17 | Corning Incorporated | Alkali-free borosilicate glasses with low post-HF etch roughness |
JP7037424B2 (en) | 2018-04-20 | 2022-03-16 | 株式会社ディスコ | Wafer processing method |
JP7366490B2 (en) | 2019-04-19 | 2023-10-23 | 株式会社ディスコ | Chip manufacturing method |
CN114093979A (en) * | 2020-08-25 | 2022-02-25 | 苏州阿特斯阳光电力科技有限公司 | Photovoltaic cell splitting method and splitting equipment |
JP2023089634A (en) * | 2021-12-16 | 2023-06-28 | 日東電工株式会社 | Dividing method of sheet material |
JP2024004015A (en) * | 2022-06-28 | 2024-01-16 | 日東電工株式会社 | Sheet material cutting method and sheet material cutting device |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56148842A (en) * | 1980-04-18 | 1981-11-18 | Mitsubishi Electric Corp | Dividing method for semiconductor wafer |
JPS5811250U (en) * | 1981-07-14 | 1983-01-25 | 日本電気株式会社 | Laser diode pelletizing jig |
JPH01276740A (en) * | 1988-04-28 | 1989-11-07 | Nec Kansai Ltd | Pelletizing method |
JPH08213348A (en) * | 1995-02-03 | 1996-08-20 | Yamaha Corp | Dividing method of crystal wafer |
JPH1071483A (en) * | 1996-08-29 | 1998-03-17 | Hitachi Constr Mach Co Ltd | Method for shearing brittle material |
JPH1179770A (en) * | 1997-07-10 | 1999-03-23 | Yamaha Corp | Scribing device and cleavage method |
JP2002050589A (en) * | 2000-08-03 | 2002-02-15 | Sony Corp | Method and device for stretching and separating semiconductor wafer |
-
2005
- 2005-12-27 KR KR1020077017975A patent/KR101170587B1/en active IP Right Grant
- 2005-12-27 WO PCT/JP2005/023953 patent/WO2006073098A1/en not_active Application Discontinuation
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KR20070121640A (en) | 2007-12-27 |
KR101170587B1 (en) | 2012-08-01 |
TW200636846A (en) | 2006-10-16 |
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JPWO2006073098A1 (en) | 2008-06-12 |
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