TWI421498B - Improved press bar of a testing socket and a dynamic testing equipment using the same - Google Patents

Description

Test stand with improved press and dynamic test equipment using the test stand

The invention relates to a test stand with an improved press pliers and a dynamic test device using the test stand, in particular to a test stand and a dynamic test device suitable for testing a dynamic sensor.

In recent years, with the rapid development of MEMS, various miniaturized, high-performance and low-cost sensors have emerged, which has further enhanced the sensor from key components into the main components of innovative value, such as Apple's iPhone. Most of the three-axis acceleration sensors used in the new generation iPod and Nintendo's Wii are applied to the sensor using MEMS technology. The principle of the acceleration sensor is to induce the XYZ triaxial component of the acceleration direction. The motion vector of the object in the three-dimensional space.

In addition, in order to make the sensing elements or the sensors to be tested more miniaturized, and for the convenience of subsequent assembly, a plurality of connecting pins or circuit patterns are often arranged on the surface of the sensor to be tested, and when testing is performed, The fixed pressing sensing element or the sensor to be tested can easily damage the component if it is pressed on each connecting pin or circuit pattern.

In view of this, it is necessary to design a device that avoids damaging the circuit pattern of the surface of the sensor to be tested and can test the motion signal of the dynamic sensor on a large scale to improve the yield, productivity, and test cost of the test.

The test stand with the improved press pliers comprises: a base, a test cymbal, a guide seat, a long pressure tong, a short pressure tong, and two pressing members. The pedestal has a receiving slot, and the test cymbal is disposed in the receiving slot of the base; the guiding seat defines a test slot, is placed in the receiving slot of the base, and is located above the test raft, the guiding seat and the test 埠The first clamp is provided with a plurality of first elastic members; the long pressure clamp is disposed on one side of the base, one end has a pressing head, and the pressing head is provided with at least one groove and a section having a pattern; the short pressure clamp is disposed on The opposite side of the long pressure clamp on the base; the two pressing members are pivotally disposed on opposite sides of the base, and respectively cover one end of the long pressure clamp and the short pressure clamp, and can be sandwiched between the two pressing members and the base A plurality of second elastic members.

When the pressing member is pressed, the long pressure pliers and the short pressure pliers placed under the pressing member can be opened upwards, and the sensor to be tested can be placed, and then the pressing member is stopped, and the pressing member is second elastic due to the plural. The elastic force of the component rebounds to the initial position, so that the long pressure clamp can be pressed against the sensor to be tested, and a micro compressive stress is applied to the sensor to be tested, so that the sensor to be tested can be in contact with the test cymbal. To test.

The groove and the section with the pattern on the pressure head of the long pressure clamp are designed to provide the pressure required for the test, and also to avoid damage to the circuit surface pattern of the sensor to be tested, so as to improve the test. Rate, capacity and reduce test costs. Preferably, the cross-sectional portion of the indenter may have a polygonal shape, a cross shape, a bow shape, a circular shape, an elliptical shape, or the like, or a combination thereof, and the cross-sectional portion may be a symmetrical or asymmetrical geometric shape. The grooves of the indenter may be circular, elliptical, polygonal, etc. or a combination thereof, and may also be symmetrical or asymmetrical geometric shapes. The cross section and the groove form on the indenter can be Any combination and combination, mainly to adjust the surface circuit pattern of the sensor to be tested.

When the indenter is pressed against the sensor to be tested, the at least one groove may correspond to the circuit pattern of the sensor to be tested, and the cross-section of the indenter may correspond to the non-circuit pattern of the sensor to be tested. In order to avoid the circuit pattern of the surface of the sensor to be tested, the sensor to be tested can be clamped in the body to avoid the sensor to be tested falling during the turning process or the linear reciprocating process, and can also be applied. Give the sensor a sufficient pressure to test.

The cross-section of the indenter may be the same size as the sensor to be tested, so that the indenter can accurately press the sensor to be tested; or an elastic layer may be disposed on the cross-section of the indenter to resist Sensor to be tested.

The invention relates to a dynamic testing device using the above-mentioned improved pressure clamp test seat, comprising a material distributing device, a dynamic testing device, a machine table, a plurality of test sockets, and a main controller. Wherein, the dispensing device is selectively moved between at least one of the sensor carrying trays to be tested and the plurality of test sockets. That is, the dispensing device mainly takes the sensor to be tested from the sensor carrying tray to be tested and places it in a plurality of test sockets. After the detection is completed, the sensor to be tested is taken out from the plurality of test sockets and placed. The sensor to be tested is carried in the disk. The machine is placed under the dispensing device and carries a dynamic test device on the machine.

The plurality of test sockets are respectively disposed on the carrying platform. Each of the test sockets includes a base including a receiving slot, a test port, a test slot, and a length. The pressure clamp, the short pressure clamp, and the two pressing members, the test jaw and the guiding seat are sequentially disposed in the receiving groove, and the plurality of first elastic components, the long pressure clamp and the clamping jaw are interposed between the guiding seat and the test jaw. Short press pliers Separately disposed on opposite sides of the base, and respectively covered with two pressing members, one end of the long pressure pliers has a pressing head, and the pressing head is provided with at least one groove and a cross section having a pattern, and between the pressing member and the base A plurality of second elastic members are interposed. As for the main controller, the plurality of test sockets and the dispensing device are electrically coupled respectively. Therefore, the present invention can provide the dynamic test required for the sensor to be tested, and can provide the pressure required for the test while avoiding the damage by providing the groove formed on the indenter of the long pressure clamp and the section having the pattern. The surface pattern of the sensor to be tested is to improve the yield, throughput and test cost of the test.

As mentioned above, the groove and the section having the pattern on the pressure head of the long pressure clamp are designed to provide the pressure required for the test while avoiding damaging the circuit pattern of the surface of the sensor to be tested. Improve test yield, productivity and reduce test costs. Preferably, the cross-sectional portion of the indenter may have a polygonal shape, a cross shape, a bow shape, a circular shape, an elliptical shape, or the like, or a combination thereof, and the cross-sectional portion may be a symmetrical or asymmetrical geometric shape. The grooves of the indenter may be circular, elliptical, polygonal, etc. or a combination thereof, and may also be symmetrical or asymmetrical geometric shapes. The cross-section of the indenter and the form of the groove can be arbitrarily combined and matched, mainly to adjust the circuit pattern of the surface of the sensor to be tested.

When the indenter is pressed against the sensor to be tested, the at least one groove may correspond to the circuit pattern of the sensor to be tested, and the cross-section of the indenter may correspond to the non-circuit pattern of the sensor to be tested. In order to avoid the circuit pattern of the surface of the sensor to be tested, the sensor to be tested can be clamped in the body to avoid the sensor to be tested falling during the turning process or the linear reciprocating process, and can also be applied. Give the sensor a sufficient pressure to test.

The cross-section of the indenter may be the same size as the sensor to be tested, so that the indenter can accurately press the sensor to be tested; or an elastic layer may be disposed on the cross-section of the indenter to resist Sensor to be tested.

In addition, the dynamic testing device of the present invention may include: a linear reciprocating device having a reciprocating sliding table, a fixing base, a flipping frame, and a carrying platform, the fixing seat may be disposed on the reciprocating sliding table, and the flipping frame may be pivoted The first shaft and the second shaft are perpendicular to each other, and are rotated on a rotating frame and rotated along a second axis. The first shaft and the second shaft are perpendicular to each other. The main controller is configured to control the flip frame to rotate along the first axis relative to the mount, and to control the carriage to rotate along the second axis relative to the flip frame. That is, the steering test of the flip frame and the carrying platform can also be reversed by the control of the main controller to achieve complete automation.

Please refer to FIG. 1 and FIG. 2, FIG. 1 is a perspective view of a dynamic testing device according to a preferred embodiment of the present invention, and FIG. 2 is a schematic diagram of a dynamic testing device disposed on a machine platform according to a preferred embodiment of the present invention. A dynamic test apparatus using a modified press jaw test stand is shown in FIG. 1, which includes a dispensing device 7, a dynamic testing device 3, a machine table 6, a plurality of test sockets 4, and a main controller 5. The machine 6 is placed under the dispensing device 7, and the machine 6 carries a dynamic testing device 3, and the main controller 5 is electrically coupled to the plurality of testing blocks 4 and the dispensing device 7, respectively.

The dispensing device 7 is disposed above the machine table 6. The dispensing device 7 is mainly used for feeding and screening and sorting after the test is completed. Wherein, when the material is fed after the feeding or testing, the dynamic testing device 3 is raised for the dispensing device 7 to pick up and release. and When the test is to be performed, the dynamic test device 3 is lowered to avoid impact or affect the dispensing device 7 or other equipment during the dynamic test.

As can be seen from FIG. 2, the dynamic testing device 3 includes a linear reciprocating device 31 having a reciprocating slide 311, a fixing base 32, a flip frame 33, and a loading table 34. The linear reciprocating device 31 can be a pneumatic cylinder device. The hydraulic cylinder device or the lead screw device can generate a linear reciprocating device. In this embodiment, a driving motor (not shown) is used to drive the rotation of an eccentric wheel 312, and then the reciprocating sliding table is linked through a link 313. 311 produces a linear reciprocating motion.

Further, the fixing base 32 is provided on the reciprocating slide 311 as shown in the drawing. The flip frame 33 is pivoted on the fixing base 32 and rotatable along a first axis X. The loading platform 34 is pivoted on the flip frame 33 and rotates along a second axis Y. Moreover, the first axis X and the second axis Y are perpendicular to each other, that is, rotated by two orthogonal vertical axes to form a flip between the three dimensions. A rotating motor 35, 36 is respectively disposed on the inverting frame 33 and the carrying platform 34 of the embodiment, and is respectively connected to the inverting frame 33 and the carrying platform 34. The rotary motors 35, 36 may be servo motors, which are mainly used to assist the flip frame 33 and the loading table 34 to be turned over.

Referring to FIG. 3 and FIG. 4 together, FIG. 3 is an exploded view of a test stand with an improved press pliers disposed on a carrying platform according to a preferred embodiment of the present invention, and FIG. 4 is a test stand of a preferred embodiment of the present invention. Cutaway view. The plurality of test sockets 4 are respectively disposed on the carrying platform 34. Each of the test sockets 4 houses a sensor 8 to be tested. Each of the test sockets 4 includes a base 41 having a receiving slot 411, a test port 42, a guiding seat 43 for opening a test slot 431, a long pressure clamp 44, and a short pressure clamp 45. And the second pressing member 46, the test cymbal 42 is disposed in the accommodating groove 411, and the guiding seat 43 is disposed in the accommodating groove 411 of the base 41 and located on the test cymbal 42 The first elastic member 421 is disposed between the guiding seat 43 and the test cymbal 42. The long pressure tongs 44 and the short pressure tongs 45 are respectively disposed on opposite sides of the base 41, and are respectively covered with two pressing members 46. Two second elastic members 47 are disposed between each pressing member 46 and the base 41 to give the pressing member 46 a restoring force by the restoring elastic force of the second elastic member 47.

Further, the long pressure clamp 44 and the short pressure clamp 45 are used for pressing and fixing the sensor 8 to be tested in the test slot 431, and applying a pressure to make the sensor 8 to be tested contact with the test cartridge 42. When the sensor 8 to be tested is taken before or after the test, the two pressing members 46 are pressed, and the long pressure clamp 44 and the short pressure clamp 45 are opened upward. After the loading and closing, the second elastic is utilized. The element 47 provides an elastic force to return the pressing member 46 to the original position, and the long pressure clamp 44 and the short pressure clamp 45 also return to the initial position, and pressurizes the sensor 8 to be tested to prevent the loading table 33 from reversing or reciprocating. During the operation of the device 2, the sensor 8 to be tested is dropped.

In addition, the main controller 5 and the plurality of test sockets 4 are electrically coupled to each other. In addition to the wired connection, a first wireless transmission module 341 can be used as shown in FIG. And electrically coupled to the plurality of test sockets 4. The first wireless transmission module 341 is used to transmit the test information Ti of the plurality of test sockets 4. In addition, as shown in FIG. 1, the main controller 5 includes a second wireless transmission module 51 for transmitting test information Tj. That is to say, the present embodiment controls the progress of all the detections on the dynamic testing device 3 through the controller 5, including the inversion, the transmission of the test information Tj, and the like. In addition, the test information Ti, Tj is transmitted through the first wireless transmission module 341 and the second wireless transmission module 51, and the embodiment can be completely wireless, which is more advantageous for detecting. get on. The wireless transmission modules used in the first wireless transmission module 341 and the second wireless transmission module 51 of the present embodiment are respectively a Bluetooth transmission module, and of course, it may also be a radio frequency transmission module, or other equivalent. Wireless transmission module.

4 and FIG. 5, FIG. 5 is a bottom view of the long pressure clamp according to a preferred embodiment of the present invention. As can be seen in FIG. 4, one end of the long pressure clamp 44 has a pressure head 441 pressed against the sensing to be tested. On the device 8, the surface of the sensor 8 to be tested has a circuit pattern 81, because the size of the sensor 8 to be tested is reduced, and most of the circuit pattern 81 is disposed on the surface of the sensor 8 to be tested, in order to avoid testing. When the circuit pattern 81 is damaged by the pressure applied by the indenter 441, the sensor 8 to be tested is damaged. Therefore, a recess 442 and a cross-sectional portion 443 having a pattern are formed on the indenter 441. As shown in FIG. 5, the cross-sectional portion 443 in the figure is square, and the groove 442 formed in the middle is circular, mainly to avoid damaging the central circuit pattern, so as to apply the test pressure required for the sensor 8 to be tested. The sensor 8 to be tested can be brought into contact with the test crucible 42. Referring to FIG. 8 , FIG. 8 is a partial enlarged view of the test socket according to FIG. 5 . The recesses 442 of the indenter 441 can correspond to one circuit pattern 81 of the sensor 8 to be tested and pass through the recess 442 . The circuit pattern 81 of the sensor 8 to be tested is prevented from being pressed to reduce the possibility of damage to the circuit pattern 81 of the sensor 8 to be tested; on the other hand, the cross-section 443 of the indenter 441 and the sensor 8 to be tested One of the non-circuit patterns 82 corresponds to the contact, and effectively holds the sensor 8 to be tested in the test slot 431.

Referring to FIGS. 6a-6d, FIGS. 6a-6d are respectively schematic views of the shape of the groove on the indenter according to a preferred embodiment of the present invention. The recess 442 formed by the indenter 441 not only ends in a circular shape as shown in FIG. 6a, but also has a groove 444 as shown in FIG. 6b as a diamond, and the groove 445 shown in FIG. 6c is a sixth. Edge, or in Figure 6d The grooves 446 are shown as being two-circular. Therefore, the grooves may be polygonal, circular, and a combination thereof, thereby being designed and used according to the sensor to be tested to be tested.

Referring to Figures 7a-7g, Figures 7a-7g are schematic views of the cross-sectional shape of the indenter according to a preferred embodiment of the present invention. In Fig. 5, the indenter 441 has a cross-sectional portion 443 of a symmetrical pattern. However, the shape of the cross-sectional portion may not only terminate in the square shape shown in Fig. 5, but also in the form of a diagonal portion in Figs. 7a to 7g, that is, as shown in the figure. The cross-sectional portion 448 shown in 7a has a hexagonal shape, the cross-sectional portion 449 shown in Fig. 7b has a cross shape, and the cross-sectional portion 450 shown in Fig. 7c has a rhombus shape and the cross-sectional portion shown in Figs. 7d and 7e. The shape of the 451, 452 is a radial dart shape, or the shape of the cross-section portion 453 shown in FIG. 7f is a bow-shaped shape, and the like, and the cross-section portion that is pressed against the sensor 8 to be tested is minimized, and can also be designed. The cross-section 454 is diamond-shaped as in Figure 7g and the groove 447 is also diamond-shaped. Therefore, the cross-sectional portion may be a polygon, a cross, a bow, a circle, and a combination thereof, thereby being designed and used according to the circuit pattern of the sensor to be tested.

The shape of the groove of Figures 6a to 6d and the shape of the section of Figures 7a to 7f can be combined and arbitrarily combined as needed to form a symmetrical or asymmetrical geometry so as to provide the pressure required for the test while avoiding damage. Sensor 8 surface circuit pattern to improve test yield, productivity and reduce test costs.

In addition, in the first preferred embodiment, the cross-sectional portion 443 of the indenter 441 is the same size as the sensor 8 to be tested to prevent uneven force, and the feeling of the test can be avoided by the recess 442. The circuit pattern 81 of the detector 8 ensures that the indenter 441 does not damage the circuit pattern 81 due to the applied pressure.

Furthermore, please refer to FIG. 9. FIG. 9 is a partial enlarged view of a test socket according to a second preferred embodiment of the present invention. The present example differs from the first preferred embodiment only. An elastic layer 483 is disposed on the cross-section of the indenter 481 for resisting a sensor 9 to be tested, thereby preventing the indenter 481 from applying an average stress to the sensor 9 to be tested due to the hollow groove 482. The structure of the sensor 9 to be tested.

The above-mentioned embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.

3‧‧‧Dynamic test device

31‧‧‧ linear reciprocating device

311‧‧‧Reciprocating slide

312‧‧‧Eccentric wheel

313‧‧‧ Connecting rod

32‧‧‧ fixed seat

33‧‧‧ flip frame

34‧‧‧Loading station

341‧‧‧First wireless transmission module

35,36‧‧‧Rotary motor

4‧‧‧ test seat

41‧‧‧Base

411‧‧‧ accommodating slots

42‧‧‧Test埠

421‧‧‧First elastic element

43‧‧‧ Guide seat

431‧‧‧Test slot

44‧‧‧long pressure pliers

441,481‧‧‧Indenter

442,444,445,446,447,482‧‧‧ Groove

443,448,449,450,451,452,453,454‧‧‧ Section

45‧‧‧Short pressure pliers

46‧‧‧Pressing parts

47‧‧‧Second elastic element

483‧‧‧Elastic layer

5‧‧‧Master controller

51‧‧‧Second wireless transmission module

6‧‧‧ machine

7‧‧‧Distribution device

8,9‧‧‧Sensor to be tested

81‧‧‧ circuit pattern

82‧‧‧Non circuit pattern

Ti, Tj‧‧‧ test information

X‧‧‧ first axis

Y‧‧‧Second axis

1 is a perspective view of a dynamic test apparatus according to a first preferred embodiment of the present invention.

2 is a schematic view showing the dynamic testing device of the first preferred embodiment of the present invention disposed on a machine platform.

3 is an exploded view of the test stand with the improved press pliers of the first preferred embodiment of the present invention disposed on the carrier.

Figure 4 is a cross-sectional view showing a test stand of a first preferred embodiment of the present invention.

Figure 5 is a bottom plan view of a long press pliers in accordance with a first preferred embodiment of the present invention.

6a-6d are schematic views respectively showing the shape of the groove on the indenter according to the first preferred embodiment of the present invention.

7a-7g are schematic views respectively showing the shape of the cross-sectional portion of the indenter according to the first preferred embodiment of the present invention.

Figure 8 is a partial enlarged view of the test seat of the first preferred embodiment of the present invention.

Figure 9 is a partial enlarged view of a test stand of a second preferred embodiment of the present invention.

3‧‧‧Dynamic test device

4‧‧‧ test seat

5‧‧‧Master controller

51‧‧‧Second wireless transmission module

6‧‧‧ machine

7‧‧‧Distribution device

Tj‧‧‧ test information

Claims (17)

A test stand with an improved press tongs, comprising: a pedestal having a receiving groove; a test cymbal disposed in the accommodating groove of the base; and a guiding seat, a test slot is disposed, The accommodating groove of the pedestal is located above the test cymbal, and a plurality of first elastic elements are interposed between the guiding seat and the test cymbal; a long pressure tong is disposed on one side of the base, one end The utility model has a pressure head, and the pressure head is provided with at least one groove and a section having a pattern; a short pressure clamp, opposite sides of the long pressure clamp disposed on the base; and two pressing members, pivoting On the opposite sides of the base, and covering one end of the long pressure clamp and the short pressure clamp respectively, a plurality of second elastic elements are interposed between the two pressing members and the base. The test seat according to claim 1, wherein the cross section of the indenter is a polygon, a cross, a bow, a circle, and a combination thereof. The test seat of claim 1, wherein the at least one groove of the indenter is polygonal, circular, and a combination thereof. The test seat of claim 1, wherein the cross section of the indenter is a symmetrical or asymmetrical geometry. The test seat of claim 1, wherein the at least one groove of the indenter has a symmetrical or asymmetrical geometry. The test socket of claim 1, wherein the at least one groove of the indenter corresponds to a circuit pattern of the sensor to be tested. The test stand of claim 1, wherein the cross section of the indenter corresponds to a non-circuit pattern contacting a sensor to be tested. The test seat of claim 1, wherein the cross section of the indenter is the same size as a sensor to be tested. The test seat of claim 1, wherein the cross section is provided with an elastic layer for resisting a sensor to be tested. A dynamic testing device using an improved pressure clamp test seat, comprising: a dispensing device; a dynamic testing device; a machine platform disposed under the dispensing device, the dynamic testing device being carried on the machine platform; The plurality of test sockets are respectively disposed in the dynamic testing device. Each test socket includes a base having a receiving slot, a test port, a test slot for opening a test slot, and a long pressure clamp. a short pressure pliers and two pressing members, the test cymbal and the guiding seat are sequentially disposed in the accommodating groove, and a plurality of first elastic members are interposed between the guiding seat and the test cymbal And the short pressure clamps are respectively disposed on opposite sides of the base, and respectively covered with the two pressing members, one end of the long pressure clamp has a pressing head, and the pressing head is provided with at least one groove and has a pattern a cross-sectional portion, a plurality of second elastic members are interposed between the two pressing members and the base; A main controller is electrically coupled to the plurality of test sockets and the dispensing device. The test seat according to claim 10, wherein the cross section of the indenter is a polygon, a cross, a bow, a circle, and a combination thereof. The test seat of claim 10, wherein the at least one groove of the indenter is polygonal, circular, and a combination thereof. The test seat of claim 10, wherein the cross section of the indenter is a symmetrical or asymmetrical geometry. The test seat of claim 10, wherein at least one groove of the indenter is a symmetrical or asymmetrical geometry. The test socket of claim 10, wherein the at least one groove of the indenter corresponds to a circuit pattern of the sensor to be tested. The test stand of claim 10, wherein the cross-section of the indenter corresponds to a non-circuit pattern contacting a sensor to be tested. The dynamic testing device of claim 10, wherein the dynamic testing device comprises: a linear reciprocating device having a reciprocating sliding table, a fixing base, a flip frame, and a carrying platform, the fixing base system Provided on the reciprocating slide, the flip frame is pivotally mounted on the mount and rotates along a first axis, the carrier is pivotally mounted on the flip frame and rotates along a second axis, the first axis And the second axis is perpendicular to each other.