TWI413786B - High pressure test method and equipment for rapid detection of contact loop - Google Patents

Abstract

This invention relates to a high voltage test method and equipment for rapid detection of contact circuit. It is characterized in that before the high voltage test, an open-circuit test with lower voltage is conducted on the two ends of a test element to confirm that all the contacts are normal, and then high voltage test is performed to ensure the effectiveness of high voltage test in order to improve the requirement for test reliability. This invention uses conduction response element such as optical coupler to effectively improve test speed and stability, and can provide multiple fast switching to significantly reduce the time needed for contact circuit detection and improve production efficiency. In addition, this invention only needs some modification to the existing high-voltage test equipment. It is no need to buy a brand new set of equipment, thereby significantly reducing the equipment cost.

Description

High-voltage test method and device for rapid detection of contact loop

The invention relates to a high-voltage test method and a device thereof for rapid detection of a contact loop, in particular to a test device and a test method for detecting contact state of all contact contacts before performing high-voltage test.

Before the general electrical parts, or their finished products (such as electric heaters, hair dryers, optical couplers, capacitors, etc.), they must be pressure-tested for high-voltage measurement, that is, the quality inspection of the parts to confirm compliance. Withstand voltage conditions for safety specifications.

However, when the high voltage test is actually performed, if the device under test is in poor contact with the test equipment, arc light will occur between the contact contacts. Accordingly, long-term testing will destroy the contact points of the test equipment and affect its life. Moreover, because of the poor contact state, the high voltage may not be reliably transmitted to the device under test, and the defective voltage withstand voltage may be erroneously determined as good. In addition, for high-voltage generating equipment, the arc caused by poor contact will cause interference to the equipment itself or other attached testing equipment, which will affect the reliability and stability of the equipment, and even affect the reliability of the test results. .

Although, there are similar high-voltage measuring devices with open-circuit detection technology. However, in the prior art, if the high-voltage measurement is performed in a direct current manner, the instantaneous charging current characteristics of the device to be tested are mostly utilized, and for the low-capacity component to be tested, it is impossible to confirm whether the high voltage is normally connected. In addition, in the prior art, when the test is conducted in an alternating manner, there is also a problem that the low-capacity component to be tested cannot be detected.

For example, please refer to FIG. 1 , which is a multi-point high voltage scanning device known in the art of impedance testing. As shown in the figure, the conventional device uses the voltmeter V and the ammeter I to perform the contact point connection test. After the test is performed, the voltage and/or current must be measured for each contact point, and then the control unit (Fig. It is not shown in the figure) to judge whether the measured value is normal. If it is judged that it is not within the range of the normal value, it is reported as poor contact. Accordingly, the above-mentioned conventional test equipment is measured by the voltmeter V or the ammeter I, and the measurement and the judgment speed are too slow. Each contact often requires a response time of 100 ms (microseconds), and the actual measurement is 10 For example, a coil is often required to take about 1 second to 1.2 seconds to know the result. Therefore, the conventional equipment is tested at multiple joints, and the time taken is amazing, which affects production efficiency and increases costs.

The main object of the present invention is to provide a high-voltage test device with rapid detection of a contact loop, which can perform open-circuit inspection on both ends of the device to be tested with low-energy micro-current before performing high-voltage test, and then execute after confirming normal operation. High-voltage testing to ensure the effectiveness of high-voltage testing, thereby meeting the requirements for improved test reliability. Moreover, the invention utilizes the conduction reaction element, can effectively improve the test speed, and can provide multi-point fast switching, and greatly reduce the time required for the contact loop detection to improve the production efficiency.

To achieve the above object, the present invention provides a high voltage testing device for rapid detection of a contact loop, comprising: a high voltage test module, a contact loop detection module, a switching module, and a controller. The contact loop detection module includes a conduction reaction component, and the high voltage test module and the contact loop detection module are electrically connected to the switching module, and the switching module is electrically coupled to the standby module. Measuring component. In addition, the controller is electrically connected to the high voltage test module, the contact loop detection module, and the switching module, and the controller mainly controls the high voltage test module and the contact loop detection module to be turned on or off, and controls the switching module. The switch electrically connects the high voltage test module or the contact loop detection module to the component to be tested. However, when a contact loop is quickly detected, the controller controls the switching module to switch, and the contact loop detection module is electrically connected to the component to be tested, and simultaneously controls the contact loop detection module to start detection. Therefore, when the detection result is turned on, the conduction reaction element outputs a communication number to the controller.

The contact loop detection module of the present invention may include a DC power supply. Of course, the present invention is not limited to the DC power supply, and may be any form of power source such as AC power. In addition, the switching module of the present invention may include a plurality of output terminals for electrically connecting to the device to be tested, wherein each output terminal is electrically connected to a positive contact switch and one end of a negative contact switch. In addition, the other end of the positive contact switch is electrically coupled to the positive electrode of the DC power supply, and the other end of the negative contact switch is electrically coupled to the negative electrode of the DC power supply. As a result, the conductive response element is electrically connected between the negative contact switch and the negative electrode of the direct current power source.

Furthermore, the positive contact switches of the present invention and the negative contact switches may be formed by at least one relay. Accordingly, the present invention can quickly switch the conduction of each contact and perform detection by using the relay. Of course, the positive contact switch and the negative contact switch of the present invention are not limited to relays, and other equivalent switching devices are also applicable to the present invention. In addition, the high voltage test module of the present invention may include a high voltage transformer, and the two output ends of the high voltage transformer are electrically connected to the positive contact switch and the second switch, respectively. Accordingly, the high voltage transformer of the present invention is used to provide the high voltage required for high voltage testing, which may be an alternating voltage or a rectified filtered direct voltage.

In addition, the conduction reaction element of the present invention may be an optical coupler, a magnetic coupler, a relay, or other equivalent element, and the conduction reaction element of the present invention is mainly used to quickly turn on or off the reaction line. Among them, when the line is turned on, the conduction reaction element can quickly transmit the signal to the controller and perform the next contact point test. In addition, the contact loop detection module of the present invention may include a current limiting circuit electrically connected between the DC power source and the complex output terminal, and the current limiting circuit is mainly used to limit or adjust the test current of the contact loop detection. . However, the current limiting circuit of the present invention can be a resistive element, a current regulating element, or other equivalent element, device, or circuit.

Furthermore, the switching module of the present invention may include a first switch and a second switch; wherein the first switch-on relationship is electrically connected between the positive electrode of the DC power source and the positive contact switch; The second switching switch is electrically connected between the negative contact switch and the negative electrode of the DC power supply, and the second switching switch is connected in parallel to the conduction reaction element. Accordingly, the first switch and the second switch of the present invention are mainly used for switching the contact loop fast detection or high voltage test. The first switch is in an on state when performing the fast detection of the contact loop, and is open at other times; the second switch is in an open state when performing the fast detection of the contact loop, and is short-circuited at other times.

Another aspect of the present invention is a high voltage test method for rapid detection of a contact loop, which mainly comprises the following steps: First, a joint loop is quickly detected. Then, the micro current is supplied to each contact of the device to be tested, and the contacts are electrically connected to a conduction reaction element in sequence; wherein, when the contact is turned on, the conduction reaction element outputs a conduction number to a control Device. Moreover, when all the contacts of the device to be tested have been confirmed to be turned on, the contact circuit is quickly detected. Also, start the high voltage test. Therefore, the method of the present invention performs contact confirmation for all the contacts to be tested by high-speed scanning before performing the high-voltage test, and then performs high-voltage test after confirming that all the contacts are connected normally.

In the method provided by the present invention, the micro current is supplied to each contact of the device to be tested, and the contacts are connected to the contacts of the device to be tested to supply the micro current. In addition, in the high voltage test, the present invention sequentially switches the contacts connected to the device to be tested and supplies a high voltage, and finally confirms that all the contacts are connected normally, and then ends the high voltage test.

2 and FIG. 3, FIG. 2 is a system architecture diagram of a device according to a preferred embodiment of the present invention, and FIG. 3 is a circuit diagram of a device according to a preferred embodiment of the present invention. In FIG. 2, a high voltage test module 2, a contact loop detection module 3, a switch module 4, a device under test 5, and a controller 6 are mainly shown. In the present embodiment, the high voltage test module 2 includes a high voltage transformer 21 for providing a high voltage required for high voltage testing, and may be an alternating voltage or a rectified and filtered direct current voltage. In addition, the device under test 5 is a device under test when performing the test, and may be a transformer to be tested or other forms of parts or devices to be tested.

In addition, the contact loop detection module 3 includes a conduction reaction element 31, a DC power source 32, and a current limiting circuit 33. The conductive response element 31 used in this embodiment is an optical coupler 311. Of course, the present invention is not limited to the optical coupler 311, and may be a magnetic coupler, a relay, or other equivalent components. In addition, the DC power source 32 supplies a micro current mainly when the contact loop is quickly detected. Of course, the present invention is not limited to the DC power source 32, and may be any form of power source such as an AC power source. The current limiting circuit 33 used in this embodiment is a resistive element 331, and the current limiting circuit 33 is mainly used to limit or adjust the test current supplied by the DC power source 32.

However, the optical coupler 311 of the present embodiment is mainly composed of the light emitting unit 312 and the light detecting unit 313, and is integrated into the same package, and there is no electrical or physical connection between them except the light beam. The light emitting unit 312 is a light emitting diode (LED), and the light detecting unit 313 is a photodiode or a photoelectric crystal. However, the main principle of the optical coupler 311 is to use light as a medium to transmit electrical signals, which can maintain good isolation between the input and output of the electrical signal, and can operate the electrical signal through the isolation layer during operation. Transmission.

Accordingly, the optical coupler 311 used in this embodiment mainly has the following advantages: full electrical isolation, in the process of signal conversion, noise interference can be avoided; and since the input end of the optical coupler 311 belongs to the current type operation The low-resistance component has a strong common-mode rejection capability, so the signal-to-noise ratio can be greatly improved as a terminal isolation component in long-line transmission information; in addition, the response rate is fast and the response speed is fast, and the time constant of the optical coupler 311 is usually In microseconds or even nanoseconds; and, no contact does not produce sparks, long life, small size, and impact resistance; in addition, is not affected by transients, does not generate magnetic fields and exchange sharp waves; The unidirectionality of the "light" transmission, so that when the signal is unidirectionally transmitted from the light emitting unit 312 to the light detecting unit 313, no feedback phenomenon occurs, and the output signal does not affect the input end.

In addition, a switch module 4 is further shown in the figure, and the high voltage test module 2 and the contact loop detection module 3 are electrically connected to the switch module 4, and the switch module 4 is electrically coupled to a test unit. Element 5. The switching module 4 of the embodiment includes a plurality of output terminals CH1, CH2, CH3, and CH4 electrically connected to the device under test 5, and each of the output terminals CH1, CH2, CH3, and CH4 is electrically connected to a positive contact switch S1+. , S2+, S3+, S4+, and one of the negative contact switches S1-, S2-, S3-, S4-.

In this embodiment, the positive contact switches S1+, S2+, S3+, S4+, and the negative contact switches S1-, S2-, S3-, S4- are formed by the relay 7, so that they have stable characteristics, And provide the ability to quickly switch the conduction of each contact. In addition, the other ends of the positive contact switches S1+, S2+, S3+, and S4+ are electrically coupled to the positive electrode of the DC power source 32, and a current limiting circuit 33 and a first switching switch SW1 are interposed. The other ends of the negative contact switches S1-, S2-, S3-, and S4- are electrically coupled to the negative electrode of the DC power source 32, and the light-emitting units 312 of the optical coupler 311 are electrically connected to the same. The negative contact switches S1-, S2-, S3-, S4- are connected to the negative electrode of the DC power source 32.

Furthermore, the switching module 4 also includes a first switching switch SW1 and a second switching switch SW2, which are mainly used for switching the test type, that is, switching the contact loop fast detection or high voltage test. The first switch SW1 is electrically connected between the positive electrode of the DC power source 32 and the positive contact switches S1+, S2+, S3+, and S4+; and the second switch SW2 is electrically connected to the negative terminals. The point switches S1-, S2-, S3-, S4- are connected to the negative electrode of the DC power source 32, and the second switching switch SW2 is connected in parallel to the optical coupler 311. In addition, the output ends of the high voltage transformer 21 are electrically connected to the positive contact switches S1+, S2+, S3+, S4+ and the second switch SW2, respectively. Accordingly, when the contact loop is quickly detected, the first changeover switch SW1 is in a short-circuit state, and the second change-over switch SW2 is in an open state. On the contrary, when the high voltage test is performed, the first changeover switch SW1 is in an open state, and the second changeover switch SW2 is in a short circuit state.

As for the controller 6, the controller 6 is electrically connected to the high voltage test module 2, the contact loop detection module 3, and the switching module 4. The controller 6 mainly controls the high voltage test module 2 and the contact loop detection module 3 to be turned on or off, and controls the switching module 4 to switch the high voltage test module 2 or the contact loop detection module 3 to be electrically connected. Measuring element 5. When the contact loop is quickly detected, the controller 6 controls the switching module 4 to switch the contact loop detection module 3 to be electrically connected to the device under test 5, and controls the contact loop detection module 3 to start detection. When the detection result is turned on, the light detecting unit 313 of the optical coupler 311 outputs a conduction number Ci to the controller 6.

In the present embodiment, the optical coupler 311 provides a contact check judgment result of the fast contact loop. Therefore, when the switching operations S1 to S4 are completed, the contact check result of the contact loop is also fully presented. According to this, when it is confirmed that all the contacts are turned on, the rapid detection of the contact loop is ended, and then the high voltage test is performed, which can greatly improve the contact detection rate. However, when the high voltage test is performed, the controller 6 controls the switching module 4 to switch, electrically connects the high voltage test module 2 to the device under test 5, and controls the high voltage test module 2 to be started for testing.

Please refer to FIG. 4, which is a flow chart of a method in accordance with a preferred embodiment of the present invention. A high voltage testing method for rapid detection of a contact loop of the present invention comprises the following steps: First, a quick detection of a contact loop is initiated, as shown in step S1 in the figure. Then, the micro current is supplied to each contact of the device under test 5, that is, the contacts of the device under test 5 are sequentially switched to supply a micro current, and the contacts are sequentially switched to be electrically connected to a conductive response element. 31. This embodiment employs an optical coupler 311, as shown in step S2. Wherein, when a contact is turned on, the optical coupler 311 outputs a pilot number Ci to a controller 6, as shown in step S3. Subsequently, all the contacts are sequentially detected, and it is confirmed whether all the contacts are turned on, as shown in step S4. If the controller 6 notifies that the contact failure is not conducting, the operator checks and adjusts the non-conducting contact, as shown in step S5.

Then, after checking and adjusting the contacts, steps S2, S3, and S4 are repeated in sequence, and when all the contacts of the device under test 5 have been confirmed to be turned on, the contact loop is quickly detected and the high voltage test is started, such as Step S6 shown in the figure. When the high voltage test is performed, the contacts connected to the device under test 5 are sequentially switched and supplied with a high voltage. Finally, the high voltage test is ended. In short, the method of the present invention uses the high-speed scanning method to make contact confirmation for all the contacts to be tested before the test, and then performs the high-voltage test after confirming that the connection is normal. When the contact loop is quickly detected, if the connection of the component to be tested 5 is found to be abnormal, the controller 6 is notified that the connection has failed. At this point, the operator can intervene to check or adjust and do a second contact loop quick test. When it is confirmed that the connection cannot be made normally, the test of the next element to be tested 5 is performed.

Therefore, the embodiment uses the conduction principle of the optical coupler 311 to perform contact confirmation, and switches the different pins with the relay 7. When it is confirmed that all the pins to be tested are in contact, the high voltage test is performed to improve the AC/DC voltage test device. Reliability of use. Therefore, the present invention has the following advantages:

1. Provide open circuit detection before high voltage test.

2. With relay 7, you can quickly switch between multiple contacts.

3. Ultra-high-speed contact loop fast scan detection, in which the average response time of the optical coupler 311 is only 50μs (milliseconds), the completion of 10 coil loops only takes 0.2 seconds, and the conventional resistance test of the same test conditions requires about 1~ 1.2 seconds.

4. It can reduce the occurrence of arc light during high voltage test to improve the service life of test joints and improve the reliability of test equipment itself and other equipment.

5. With simple contact test circuit to ensure the effectiveness of high voltage test, the cost is relatively low, stable and easy to repair.

6. Can effectively reduce the test errors caused by misjudgment.

7. It can be applied to low-capacity components to be tested, such as inductors.

8. Partial modification of existing high-voltage test equipment, without the need to re-purchase a whole new set of equipment, significantly reducing equipment costs.

The above-mentioned embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.

2. . . High voltage test module

twenty one. . . High voltage transformer

3. . . Contact loop detection module

31. . . Conduction response element

311. . . Optocoupler

312. . . Light emitting unit

313. . . Light detection unit

32. . . DC power supply

33. . . Current limiting circuit

331. . . Resistance element

4. . . Switching module

5. . . Component to be tested

6. . . Controller

7. . . Relay

CH1, CH2, CH3, CH4. . . Output

Ci. . . Communication number

I. . . Ammeter

SW1. . . First switch

SW2. . . Second switch

SW3. . . Toggle switch

S1+, S2+, S3+, S4+. . . Positive contact switch

S1-, S2-, S3-, S4-. . . Negative contact switch

V. . . Voltmeter

Figure 1 is a multi-point high pressure scanning device known in the art of impedance testing.

2 is a system architecture diagram of a device in accordance with a preferred embodiment of the present invention.

3 is a circuit diagram of a device in accordance with a preferred embodiment of the present invention.

4 is a flow chart of a method in accordance with a preferred embodiment of the present invention.

2. . . High voltage test module

3. . . Contact loop detection module

4. . . Switching module

5. . . Component to be tested

6. . . Controller

7. . . Relay

Claims (10)

A high voltage testing device with rapid detection of a contact loop, comprising: a high voltage test module; a contact loop detection module comprising a conduction reaction component; a switching module, the high voltage test module, and the contact The circuit detection module is electrically connected to the switching module, the switching module is electrically coupled to a device to be tested; and a controller is electrically connected to the high voltage test module, and the contact loop is detected a module, and the switching module, the controller controls the high voltage test module, and the contact loop detection module to be activated or deactivated, and controls the switching module to switch the high voltage test module or the contact loop detection The module is electrically connected to the device to be tested; wherein, when performing a fast detection of a contact loop, the controller controls the switching module to switch the connection circuit detection module to be electrically connected to the device to be tested, and controls the The contact loop detection module initiates detection, and when the detection result is turned on, the conduction reaction component outputs a conduction communication number to the controller. The high-voltage test device with the rapid detection of the contact loop, as described in claim 1, wherein the contact loop detection module includes a DC power supply, and the switching module includes a plurality of output terminals for electrically connecting Each of the output terminals is electrically connected to one of the positive contact switch and one of the negative contact switches, and the other end of the positive contact switch is electrically coupled to the positive electrode of the DC power supply. The other end of the negative contact switch is electrically coupled to the negative electrode of the DC power source, and the conductive response element is electrically connected between the negative contact switch and the negative electrode of the DC power supply. The high-voltage testing device with the rapid detection of the contact loop described in the second paragraph of the patent application, wherein the positive contact switch and the negative contact opening relationship are formed by at least one relay. The high-voltage test device with the rapid detection of the contact loop, as described in claim 2, wherein the contact loop detection module includes a current limiting circuit electrically connected to the DC power source and the complex output terminal between. A high voltage testing device with a fast detection of a contact loop according to claim 4, wherein the current limiting circuit comprises a resistive element, and the conducting reactive element comprises an optical coupler. The high-voltage test device with the fast detection of the contact loop, as described in claim 2, wherein the switching module includes a first switch and a second switch; the first switch-on relationship is electrically connected to Between the positive electrode of the DC power source and the positive contact switch; the second switch-on relationship is electrically connected between the negative contact switch and the negative electrode of the DC power source, and the second switch is connected in parallel The reaction element is turned on. The high-voltage test device with the rapid detection of the contact loop, as described in claim 5, wherein the high-voltage test module includes a high-voltage transformer, and the output ends of the high-voltage transformer are electrically connected to the positive contact switches respectively. The second switch. A high voltage test method for rapid detection of a contact loop includes the following steps: (A) initiating a contact loop for rapid detection; (B) supplying microcurrent to each contact of a component to be tested, and sequentially switching its connections Pointly electrically connected to a conduction reaction element; (C) when the contact is turned on, the conduction reaction element outputs a conduction communication number to a controller; (D) when all contacts of the device to be tested have confirmed conduction, ending The contact loop is quickly detected; and (E) the high voltage test is initiated. For example, in the high-voltage test method for fast detection of the contact loop, the step (B) sequentially switches the contacts connected to the device to be tested to supply a microcurrent. For example, in the high-voltage test method for the rapid detection of the contact loop, the step (E) includes the following steps: (F) sequentially switching the contacts of the device to be tested and supplying a high voltage; (G) End the high voltage test.