TWI399559B - Automated test equipment - Google Patents

Description

Automated test device

The present invention relates to a test device which is referred to as an automated test device.

According to the rapid development of science and technology and the progress of the industry, the market led by the semiconductor industry and the information electronics industry continues to grow steadily, resulting in significant changes in the application level, bringing more than just scientific and technological achievements. It has enhanced the quality of human life and changed the way of life. The affected technology products, such as personal computers, mice, scanners, mobile phones, personal digital assistants, etc., are thousands of electronic consumer products, especially such products. From professional equipment to consumer products in the personal, family, and general life, in other words, people's dependence on these devices is increasing, and all manufacturers are committed to producing more related products, and therefore manufacturers, All are committed to increasing production capacity.

Furthermore, computer manufacturers develop and manufacture a computer platform product, such as a computer motherboard or a computer expansion card. Usually, a test program is required before the product is launched to test whether the computer platform product is fully operational. . If any component or circuit is found to be defective during the test and cannot be operated normally, the tester shall record the abnormal operation status as a defect point and submit the defect to the R&D department for correction. .

In the current IT industry's computer hardware, such as servers, notebook computers, etc., in order to ensure the quality of the factory products, it is necessary to test whether the peripheral hardware of the computer products is qualified. The test method of the factory on the general production line is to test the computer in the original test mode or Around the computer, that is, the factory requires the operator to perform the test manually, such as manually turning the switch, button, or requiring the operator to subjectively determine the test result with the eyes or ears, causing some problems, such as inconvenience in testing, Long manual operations and fatigue of the operator can affect the test results.

Please refer to the first A picture and the first B picture together, which is a schematic diagram of a cycle of testing a computer motherboard for a conventional technology and a cycle of testing two computer motherboards at the same time. As shown in the figure, a general tester includes a manual test cycle 10', a program automatic test cycle 12', and a manual automatic interleaving test cycle 14' during a test cycle of a computer motherboard. In order to increase the test efficiency, the average operator needs the tester to test several computer motherboards at the same time. This is only to test two computer motherboards at the same time, as shown in the first B, because when testing a computer motherboard. Manual test, program automatic test or manual automatic interleaving test will be required. Thus, when the program automatic test cycle is performed simultaneously on two computer motherboards, a manual idle cycle 20' will occur, when two computer motherboards are used. When the manual test is performed and another computer motherboard performs automatic hand test, the program idle period 22' will occur, thus increasing the total test time, thereby reducing the test efficiency, and when the tester tests several simultaneously. When the computer motherboard is used, its impact will be even greater.

Therefore, how to solve the above problems and propose a novel automatic testing device, which can avoid the test time by manually performing computer or computer peripheral testing, and is prone to test errors, and can avoid increasing personnel costs, and can solve the above problem. The problem.

One of the objects of the present invention is to provide an automated test apparatus that reduces the personnel cost by automating the test without requiring testers to perform the test.

It is an object of the present invention to provide an automated test apparatus that reduces test time by automated testing.

One of the objects of the present invention is to provide an automated test device that avoids human error by automatically testing a test module.

The automated test device of the present invention comprises a device to be tested and a test module. The device to be tested has a test program, and the device to be tested includes a plurality of function modules; the test module is coupled to the test device, and the test module sequentially tests the function modules of the device to be tested, wherein the device under test performs the test The program is coupled to the test module, and the test module tests the functional modules of the device to be tested. In this way, the present invention can reduce the personnel cost by automating the test without requiring the tester to perform the test, and the total test time can be shortened. Moreover, the present invention can automatically test the functional modules of the device under test by the test module to avoid Human error.

In order to provide a better understanding and understanding of the structural features and the achievable effects of the present invention, please refer to the preferred embodiments and the detailed descriptions as follows: please refer to the second figure, which is A block diagram of a preferred embodiment of the invention. As shown, the automated test apparatus of the present invention includes a device under test 10 and a test module 20. The device under test 10 has a test program, and the device under test 10 includes a plurality of function modules. The test module 20 is coupled to the test device 10, and the test module 20 tests the function modules of the device under test 10, wherein The device 10 executes a test program and is connected to the test module 20 The test module 20 tests the functional modules of the device 10 to be tested, that is, the test module 20 executes the test program according to the device under test 10, and sequentially tests the functional modules of the device under test 10 to achieve The purpose of automated testing, without the need for testers to test, thereby reducing personnel costs. In the present invention, a preferred embodiment of the device under test 10 is a motherboard of a computer system.

Please refer to FIG. 3A and FIG. 3B together, which are schematic diagrams showing the cycle of testing a computer motherboard and the period of testing four computer motherboards simultaneously according to a preferred embodiment of the present invention. As shown, the automated test apparatus of the present invention includes a test test fixture cycle 30, a program automatic test cycle 32 and a teardown test fixture cycle 34 during the testing of a computer motherboard cycle. As shown in Figure B, the tester can test different computer motherboards in sequence, and can test multiple computer motherboards. When testing multiple computer motherboards, there will be no program idle cycle or manual idle. Time to achieve automated testing and reduce total test time, which in turn increases test efficiency.

Please refer to the second figure. The test module 20 of the present invention tests the functional modules of the device under test 10 . In this embodiment, the test module 20 tests the peripheral circuits of the computer, that is, the test module 20 . The invention comprises an audio test circuit 21, a screen test circuit 22, a touch test circuit 23, a switch test circuit 24, a network route test circuit 25, a keyboard test circuit 26, a charge and discharge test circuit 27 and a multimedia test circuit. 28, respectively coupled to an audio circuit 11, an image output module 12, a touch module 13, a switch module 14, a network route 15, a keyboard 16, a charging switch 17 and a multimedia circuit 18 And test it.

In addition, the device under test 10 of the present invention is controlled by itself. As the indicator signal, the tester uses the red image signal, a green image signal and a blue image signal as the indicator lights, and the information of the indicator light is used to know that the current test module 20 is undergoing the test. A test. The device under test 10 executes the test program and displays the indicators of the current test module 20 by the indicators of the red image signal, the green image signal and the blue image signal, and the test module 10 tests the corresponding image signals. One of the functional modules of the measuring device 10. The following is a description of various test circuits.

Please refer to the fourth figure, which is a block diagram of an audio test according to a preferred embodiment of the present invention. As shown, the test module 20 of the present invention includes a control unit 29 and an audio test circuit 21. The control unit 29 receives the test signal generated by the device under test 10 to generate a control signal, and the audio test circuit 21 receives the control signal to generate an audio signal, that is, the buzzer 211 of the audio test circuit 21 generates a sound. A playback unit 110 of the audio circuit 11 of the function module plays an audio signal, and the audio test circuit 21 tests the audio signal played by the playback unit 110. That is, the device under test 10 receives the audio signal sent by the audio test circuit 21, and then the audio signal received by the device under test 10 is played by the playback unit 110 of the audio circuit 11, and the audio test circuit 21 receives the audio signal played by the playback unit 110. And the audio signal played by the test audio test circuit 21 is the same as the audio signal played by the playback unit 110, and an output signal is generated, and the audio test circuit 21 transmits the output signal to the device under test 10 for the device under test 10 to determine. Whether the playback unit 110 is normal. The playing unit 110 is a speaker.

In addition, the audio circuit 11 of the device under test 10 further includes a microphone 112, and the microphone 112 receives the audio signal played by the audio test circuit 21. The sound signal is transmitted to the playing unit 110, and the playing unit 110 plays the sound signal to the audio testing circuit 21 for audio testing.

Please refer to FIG. 5, which is a circuit diagram of an audio test circuit according to a preferred embodiment of the present invention. As shown, the audio test circuit 21 of the present invention includes a comparison module 210. The comparison module 210 compares a threshold value with an audio signal played by the playback unit 110 for audio testing. In addition, since the audio signal is a waveform superimposed on a DC signal by an AC signal, wherein the AC signal is a true audio signal and the DC signal is a reference signal, the audio test circuit 21 of the present invention is an audio signal. The AC signal is tested separately from the DC signal to increase the accuracy of the test.

Therefore, the comparison module 210 includes a first extraction circuit 212, a first comparison circuit 214, a second extraction circuit 216, and a second comparison circuit 218. The first capturing circuit 212 is configured to capture an alternating current signal of the audio signal. The first comparing circuit 214 receives the alternating current signal and compares one of the threshold values and the alternating current signal to generate a first comparison signal. The first capture circuit 212 includes a capacitor 2120 and a resistor 2122. One end of the capacitor 2120 receives the sound signal, one end of the resistor 2122 is coupled to the other end of the capacitor 2120, and the other end of the resistor 2122 is coupled to the ground. Thus, the first capture circuit 212 captures the sound by the capacitor 2120 and the resistor 2122. Signal exchange signal. The first comparison circuit 214 includes a capacitor 2140, 2142, a resistor 2144, 2146 and a comparison unit 2148. The capacitor 2140 is coupled between the first extraction circuit 212 and the ground terminal, and is coupled to the positive input terminal of the comparison unit 2148. The capacitor 2142 is coupled between the negative input terminal and the ground terminal of the comparison unit 2148. One end of 2144 is coupled to the supply power source, and the other end is connected to one end of the series resistor 2146, and the resistor 2146 is The other end is coupled to the ground. The first comparison circuit 214 forms an AC generating circuit 215 by the resistor 2144 and the resistor 2146, and generates an AC threshold value by dividing the resistor 2144 and the resistor 2146. The comparing unit 2148 compares the AC threshold value with The first comparison signal is generated by alternating the signal.

The second capture circuit 216 captures a DC signal of the audio signal, and the second comparison circuit 218 receives the DC signal and compares the DC threshold of the DC signal with the threshold value to generate a second comparison signal. The second extraction circuit 216 includes a resistor 2160 and a capacitor 2162. One end of the resistor 2160 receives the sound signal, and the other end is coupled to the capacitor 2162. The capacitor 2162 is coupled between the resistor 2160 and the ground. Thus, the second extraction circuit 216 extracts the DC signal from the sound signal by the resistor 2160 and the capacitor 2162. Signal. The second comparison circuit 218 includes a comparison unit 2180, a capacitor 2182 and a resistor 2184, 2186, 2188. The positive input terminal of the comparison unit 2180 receives the DC signal, and the capacitor 2182 is coupled to the negative input terminal of the comparison unit 2180. Between the ground terminals, one end of the resistor 2184 is coupled to the power supply, the other end is coupled to the negative input of the resistor 2186 and the comparison unit 2180, and the resistor 2186 is coupled between the negative input terminal of the comparison unit 2180 and the ground terminal, and the resistor 2188 is coupled. Connected to the output of the power supply and comparison unit 2180, the resistor 2184 and the resistor 2186 form a DC generation circuit 217, and the DC voltage threshold is generated by dividing the resistor 2184 and the resistor 2186, and the comparison unit 2180 generates a DC threshold according to the DC threshold value. Second comparison signal.

As described above, the comparison module 210 generates an output signal according to the first comparison signal and the second comparison signal to determine whether the playback unit 110 and the microphone 112 of the audio circuit 11 are normal. The output end of the first comparison circuit 214 is coupled to the output end of the second comparison unit 218, that is, the output end of the first and second gates is coupled to the output end of the first comparison circuit 214 and compared with the second. The output of circuit 218 is used to generate an output signal. In addition, the audio test circuit 21 further includes a rectification filter circuit 219. The rectifying and filtering circuit 219 is coupled to the output end of the first comparing circuit 214 and the output end of the second comparing circuit 218 to rectify and filter the output signal. The rectifier filter circuit 219 includes a rectifier 2190, a capacitor 2192 and a resistor 2194. The positive terminal of the rectifier 2190 receives the output signal of the comparison module 210. The capacitor 2192 is coupled between the negative terminal of the rectifier 2190 and the ground terminal, and the resistor 2194 is connected in parallel with the capacitor 2192.

In addition, the audio test circuit 21 of the present invention can receive the sound signal generated by the buzzer 211 of the microphone 112 of the audio circuit 11 of the device under test 10, and the comparison module 210 of the audio test circuit 21 can test the microphone 112. Sound signal to test if the microphone 112 is normal.

Please refer to a sixth diagram, a block diagram of a screen test in accordance with a preferred embodiment of the present invention. As shown in the figure, the embodiment is different from the embodiment of the fourth embodiment in that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the screen test of the test module 20. Circuit 22 tests the screen. The screen test circuit 22 receives the control signal and tests the image output module 12 of the device under test 10 . The image output module 12 generates an image signal for the screen test circuit 22 to perform image test on the image output module 12 . The image output module 12 is a digital video interface (DVI) or a high definition digital multimedia interface (HDMI). The screen test circuit 22 includes an image processing circuit 220 and a comparison module 222. The image processing circuit 220 receives the image signal and amplifies the image signal and outputs the image signal. The comparison module 222 receives the amplified image signal and compares a threshold value with the image signal to generate an output signal to determine whether the image output module 12 is normal. . Among them, the image signal Contains a red image signal, a green image signal and a blue image signal.

Please refer to the seventh figure, which is a circuit diagram of a screen test circuit according to a preferred embodiment of the present invention. As shown in the figure, the comparison module 222 of the screen test circuit 22 includes a comparison unit 2220, a resistor 2222, a capacitor 2224 and a resistor 2226, 2228, 2229. The positive input terminal of the comparison unit 2220 receives the red image of the image signal. The signal 2222 is coupled between the positive input terminal of the comparison unit 2220 and a ground terminal. The capacitor 2224 is coupled between the negative input terminal of the comparison unit 2220 and the ground terminal. One end of the resistor 2226 is coupled to a power supply. The other end is coupled to one end of the resistor 2228, and the other end of the resistor 2228 is coupled to the ground end to form a threshold generating circuit 224 through the resistor 2226 and the resistor 2228, and the voltage is divided to obtain a threshold value, and the resistor 2229 is coupled to the power supply and the Comparing the output of the unit 2220, the comparing unit 2220 compares the threshold value with the red image signal of the image signal to generate an output signal, and transmits the output signal to the device under test 10, so that the device under test 10 determines whether the image output module 12 is normal. In addition, the screen test circuit 22 further includes a rectification filter circuit 226. The rectification filter circuit 226 is used to rectify and filter the output signal. The rectifier filter circuit 226 includes a rectifier 2260, a capacitor 2262 and a resistor 2264. The positive terminal of the rectifier 2260 receives the output signal of the comparison unit 2220. The capacitor 2262 is coupled between the negative terminal of the rectifier 2260 and the ground terminal, and the resistor 2264 is connected in parallel with the capacitor 2262.

Since the green image signal is the same as the test circuit of the blue image signal and the test circuit of the red image signal, it is not mentioned here. In addition, in the present invention, the red image signal, the green image signal and the blue image signal are used as control indicators, so Whether the light signal on the broken indicator light is the same as the control test item, whether the image output module 12 is normal or not, without setting the screen test circuit 22, to reduce the circuit area, thereby saving costs.

Please refer to the eighth figure, which is a block diagram of a touch test of one of the more embodiments of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the touch test circuit 23 of the test module 20. The touch module 13 is tested. The touch test circuit 23 has a switch 230 coupled between the touch module 13 of the function module and a touch signal. The touch test circuit 23 turns on the switch according to the control signal generated by the control unit 29. 230, to output a touch signal to the touch module 13, and perform a touch test. That is, the touch test circuit 23 of the present invention outputs the touch signal to the touch module 13 by turning on the switch 230 to replace the manual test, thereby reducing the overhead of personnel costs and avoiding human error. The switch 230 is a relay or a transistor.

Please refer to the ninth figure, which is a block diagram of a test of a switch module according to a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the switch test circuit 24 of the test module 20. The switch module 14 is tested. The switch test circuit 24 has a switch 240 coupled between the switch module 14 of the function module and a lead communication number. The switch test circuit 24 turns on the switch 240 according to the control signal to perform the switch mode by outputting the communication number. Group 14 test. That is, the present invention transmits the communication number to the switch module 14 by turning on the switch 240, instead of manually testing, thereby reducing the overhead of personnel costs and avoiding human error. Wherein, the switch module 14 is An image output module switch, a network management switch or a wireless network switch. And the switch 240 is a relay or a transistor.

Please refer to the tenth figure, which is a block diagram of a network route test according to a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the network test circuit 25 of the test module 20. Switch the network route to test the network route separately. The network route test circuit 25 has a switch module 250, and the network route test circuit 25 turns on/off the switch module 250 according to the control signal to switch one of the function modules, the first network route 252 or the function modules. One of the second network routes 254, and the network route test. In this way, the present invention performs the test by switching the first network route 252 or the second network route 254 by switching the switch module 250, instead of manually switching the network route for testing, thereby reducing the overhead of personnel costs and avoiding artificial Misjudgment.

As described above, the network route test circuit 25 includes a first network port 255, a second network port 256, a third network port 257, and a switch module 250. The first network 255 is coupled to the network route test circuit 25 through the first network route 252, and the second network 256 is coupled to the network route test circuit 25 through the second network route 254. The third network route 258 is coupled to the receiving circuit 10, and the switch module 250 is coupled to the first network 255, the second network 256, and the third network 257. The switch module 250 is based on the control signal. The first network route 252 or the second network route 254 is switched for network route testing. The first network route 252 or the second network route 254 is a network route of the LAN 50M or the LAN LOOP. Wherein, the switch module 250 is a relay, a transistor or any combination thereof .

In addition, the switch module 250 includes a relay 2500 and a switch 2502. The relay 2500 is coupled to the first network 255, the second network 256, and the third network 257. The switch 2502 is coupled to the relay 2500. The switch 2502 turns on the first network 255 and the third network according to the control signal. 257, or the second network 256 and the third network 257 are turned on, so that the first network route 252 is connected to the device under test 10 or the second network route 254 is connected to the device under test 10 to achieve the first switch. Web route 252 and second mesh route 254 are tested. In this embodiment, although the first mesh route 252 and the second mesh route 254 are switched by one relay 2500, it is not limited to using one relay 2500, and a plurality of relays may be used to achieve the purpose of switching.

Please refer to FIG. 11 , which is a block diagram of a keyboard test according to a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the keyboard test circuit 26 of the test module 20 to be heavy. One of the keyboards 16 to be tested is placed. The keyboard test circuit 26 has a switch 260. The keyboard test circuit 26 turns on the switch 260 according to the control signal to reset the keyboard 16 of the device under test 10, instead of manually resetting the keyboard 16, thereby reducing the overhead of personnel costs. The switch 260 is a relay or a transistor.

Please refer to FIG. 12, which is a block diagram of a charging function test according to a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the charge and discharge test circuit 27 of the test module 20. And the charging switch 17 of the device 10 to be tested Perform a test of the charging function. The charge and discharge test circuit 27 has a switch 270. The charge and discharge test circuit 27 turns on the switch 270 according to the control signal to test the charging function of the function module, that is, the current mode is replaced by the on/off switch 270. Plugging a power converter to test the device to be tested, thus reducing the overhead of personnel costs and avoiding human error. The switch 270 is a relay or a transistor.

Please refer to a thirteenth diagram, which is a block diagram of a multimedia test in accordance with a preferred embodiment of the present invention. As shown in the figure, the difference between the embodiment and the embodiment is that the control unit 29 receives the test signal generated by the device under test 10 to execute the test program, and generates a control signal to drive the multimedia test circuit 28 of the test module 20. The multimedia circuit 18 of one of the functional modules of the device 1 to be tested is subjected to multimedia testing. The multimedia test circuit 28 has a detecting component 280. The detecting component 280 performs a multimedia test according to a light source of the multimedia circuit 28 of the control signal detecting function module, instead of manually detecting the finger by touching the sensing button. Reduce the cost of personnel costs and avoid human error. The detecting component 280 is a photoresistor.

In summary, the automatic test device of the present invention is coupled to the test device by the test module, and the test device is executed by a test program and is connected to the test module, so that the test module can be used for the test module. carry out testing. As such, the present invention eliminates the need for testing by automated testing, thereby reducing personnel costs and reducing overall test time.

The invention is a novelty, progressive and available for industrial use, and should meet the requirements of the patent application stipulated in the Patent Law of China, and the invention patent application is filed according to law, and the prayer bureau will grant the patent as soon as possible. prayer.

However, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and the shapes, structures, features, and spirits described in the claims are equivalently changed. Modifications are intended to be included in the scope of the patent application of the present invention.

Conventional technology:

10’‧‧‧Manual test cycle

12’‧‧‧Program automatic test cycle

14’‧‧‧Hand automatic staggering test cycle

20’‧‧‧Manual idle cycle

22’‧‧‧Program idle cycle

this invention:

10‧‧‧Device under test

11‧‧‧Optical circuit

110‧‧‧Play unit

112‧‧‧ microphone

12‧‧‧Image output module

13‧‧‧Touch Module

14‧‧‧Switch Module

15‧‧‧Network route

16‧‧‧ keyboard

17‧‧‧Charge switch

18‧‧‧Multimedia circuit

20‧‧‧Test module

21‧‧‧Audio test circuit

210‧‧‧Comparative Module

211‧‧‧ buzzer

212‧‧‧First capture circuit

2120‧‧‧ Capacitance

2122‧‧‧resistance

214‧‧‧First comparison circuit

2140‧‧‧ Capacitance

2142‧‧‧ Capacitance

2144‧‧‧resistance

2146‧‧‧resistance

2148‧‧‧Comparative unit

215‧‧‧AC threshold generation circuit

216‧‧‧Second capture circuit

2160‧‧‧resistance

2162‧‧‧ Capacitance

217‧‧‧DC threshold generation circuit

218‧‧‧Second comparison circuit

2180‧‧‧Comparative unit

2182‧‧‧ Capacitance

2184‧‧‧resistance

2186‧‧‧resistance

2188‧‧‧resistance

219‧‧‧Rectifier filter circuit

2190‧‧‧Rectifier

2192‧‧‧ Capacitance

2194‧‧‧resistance

22‧‧‧Screen test circuit

220‧‧‧Image Processing Circuit

222‧‧‧Comparative Module

2220‧‧‧Comparative unit

2222‧‧‧resistance

2224‧‧‧ Capacitance

2226‧‧‧resistance

2228‧‧‧resistance

2229‧‧‧resistance

224‧‧‧ threshold generation circuit

226‧‧‧Rectifier filter circuit

2260‧‧‧Rectifier

2262‧‧‧ Capacitance

2264‧‧‧resistance

23‧‧‧ touch test circuit

230‧‧‧ switch

24‧‧‧Switch Test Circuit

240‧‧‧ switch

25‧‧‧Network route test circuit

250‧‧‧Switch Module

2500‧‧‧ Relay

2502‧‧‧Switch

252‧‧‧First network route

254‧‧‧Second network route

255‧‧‧First Internet埠

256‧‧‧Second Internet Protocol

257‧‧‧ Third Network Network

26‧‧‧Keyboard test circuit

260‧‧‧ switch

27‧‧‧Charge and discharge test circuit

270‧‧‧Charge switch

28‧‧‧Multimedia test circuit

280‧‧‧Detection components

29‧‧‧Control unit

30‧‧‧Installation test fixture cycle

32‧‧‧Program automatic test cycle

34‧‧‧Disassembly test fixture cycle

The first A diagram is a schematic diagram of the cycle of testing a computer motherboard by the prior art; the first diagram B is a schematic diagram of testing the period of two computer motherboards at the same time as the prior art; the second diagram is the invention A block diagram of a preferred embodiment; FIG. 3A is a schematic diagram of a cycle for testing a computer motherboard according to a preferred embodiment of the present invention; and FIG. 3B is a preferred embodiment of the present invention A schematic diagram of a period of testing four computer motherboards; a fourth diagram is a block diagram of an audio test according to a preferred embodiment of the present invention; and a fifth diagram is a circuit diagram of an audio test circuit according to a preferred embodiment of the present invention. The sixth drawing is a block diagram of a screen test of a preferred embodiment of the present invention; the seventh figure is a circuit diagram of a screen test circuit of one of the more embodiments of the present invention; and the eighth figure is one of the inventions. A block diagram of a touch test of a preferred embodiment; a ninth figure is a block diagram of a test of a switch module in accordance with a preferred embodiment of the present invention; 10 is a block diagram of a network route test according to a preferred embodiment of the present invention; FIG. 11 is a block diagram of a keyboard test according to a preferred embodiment of the present invention; A block diagram of a charging function test of a preferred embodiment; and a thirteenth diagram is a block diagram of a multimedia test in accordance with a preferred embodiment of the present invention.

10‧‧‧Device under test

11‧‧‧Optical circuit

12‧‧‧Image output module

13‧‧‧Touch Module

14‧‧‧Switch Module

15‧‧‧Network route

16‧‧‧ keyboard

17‧‧‧Charge switch

18‧‧‧Multimedia circuit

20‧‧‧Test module

21‧‧‧Audio test circuit

22‧‧‧Screen test circuit

23‧‧‧ touch test circuit

24‧‧‧Switch Test Circuit

25‧‧‧Network route test circuit

26‧‧‧Keyboard test circuit

27‧‧‧Charge and discharge test circuit

28‧‧‧Multimedia test circuit

Claims (33)

An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module includes: a control unit that receives a test signal generated by the device under test to generate a control signal, and generates a control signal; and an audio test circuit that receives the control signal An audio signal, a playback unit of the function module plays the audio signal, and the audio test circuit tests the audio signal played by the playback unit, wherein the audio test circuit includes: a comparison module, comparing a threshold value with The audio signal is played by the playing unit for performing an audio test. The comparison module includes: a first capturing circuit for extracting an alternating current signal of the audio signal; and a first comparing circuit for receiving the alternating current signal, and Comparing the AC signal with an threshold value of the threshold value to generate a first comparison signal; and a second capture circuit for capturing the audio signal a DC signal; and a second comparison circuit, receiving the DC signal, and comparing the DC signal with a DC threshold of the threshold value to generate a second comparison signal; wherein the comparison module is based on the first comparison The signal and the second comparison signal generate an output signal to determine whether the playback unit is normal. The test device executes the test program and is connected to the test module, and the test module tests the function modules of the device to be tested. Such as the automatic test device described in claim 1, wherein the The microphone of the function module receives the sound signal and transmits the sound signal to the playing unit, and the playing unit plays the sound signal to the audio testing circuit for audio testing. The automatic test device of claim 1, wherein the output signal is transmitted to the device under test for the device to be tested to determine whether the playback unit is normal. The automatic testing device of claim 1, wherein the comparing module further comprises: a rectifying and filtering circuit that rectifies and filters the output signal. The automatic test device of claim 1, wherein the playback unit is a speaker. An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module includes: a control unit that receives a test signal generated by the device under test to generate a control signal, and generates a control signal; and a screen test circuit that receives the control signal And testing an image output module of the device to be tested, the image output module generates an image signal for the screen test circuit to perform image test on the image output module, wherein the screen test circuit comprises: a comparison module Receiving the image signal, comparing a threshold value with the image signal, generating an output signal and transmitting the signal to the device under test for the device to be tested to determine whether the image output module is normal. An automated test device as described in claim 6 wherein the firefly The curtain test module further comprises: a rectifying and filtering circuit for rectifying and filtering the output signal. The automatic test device of claim 6, wherein the image signal comprises a red image signal, a green image signal or a blue image signal. An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module includes: a control unit that receives a test signal generated by the device under test to generate a control signal, and generates a control signal; and a touch test circuit having a switch The switch is coupled between the touch module and the touch signal of the function module. The touch test circuit turns on the switch according to the control signal to output the touch signal to the touch module. And perform a touch test. The automatic test device of claim 9, wherein the switch is a relay or a transistor. An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module, wherein the test module comprises: a control unit, receiving a test signal generated by the device under test to generate a control signal, and generating a control signal; and a switch test circuit having a switch The switch is coupled to the functional modules Between one of the switch modules and a test signal, the switch test circuit turns on the switch according to the control signal to output the test signal for the switch test. The automatic test device of claim 11, wherein the switch is a relay or a transistor. The automatic test device of claim 11, wherein the switch module is a display screen switch, a network management switch or a wireless network switch. An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module, wherein the test module comprises: a control unit, receiving a test signal generated by the device under test to generate the control signal, and generating a control signal; and a network route test circuit having a switch a switch module, the network route test circuit turns on/off the switch switch module according to the control signal, to switch one of the first network route of the function module or the second network route of the function module, and perform a network route test. The automatic test device of claim 14, wherein the network route test circuit comprises: a first network port coupled to the test circuit; a second network port coupled to the test circuit; a network switch coupled to the device under test; and the switch module coupled to the first network port, the second network port, and the third network port, the switch module being controlled according to the control Signal while switching The first network port or the second network port is used for network route testing. The automatic test device of claim 14, wherein the switch is a relay, a transistor, or any combination thereof. An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module includes: a control unit that receives a test signal generated by the device under test to generate a control signal, and generates a control signal; and a keyboard test circuit having a switch The keyboard test circuit turns on the switch according to the control signal to reset a keyboard of the device to be tested. The automatic test device of claim 17, wherein the switch is a relay or a transistor. An automatic test device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the device to be tested The function module, wherein the test module comprises: a control unit, receiving a test signal generated by the device under test to generate a control signal, and generating a control signal; and a charge and discharge test circuit having a switch The charge and discharge test circuit turns on the switch according to the control signal to test a charging function of the function module. The automatic test device of claim 19, wherein the switch is a relay or a transistor. An automated test device. The device includes: a device to be tested, having a test program, the device to be tested includes a plurality of function modules; and a test module coupled to the device to be tested, the test module testing the function modules of the device to be tested The test module includes: a control unit that receives a test signal generated by the test device to execute the test program to generate a control signal; and a multimedia test circuit having a detection component, the detection The component detects a light source of the multimedia circuit of the functional module according to the control signal for multimedia testing. The automatic test device of claim 21, wherein the detecting component is a photoresistor. An automatic test device comprising: a device to be tested having a test program; a control unit receiving a test signal generated by the device under test to generate a control signal; and generating an control signal; and an audio test circuit Receiving the control signal generates an audio signal: a playback unit plays the audio signal, and the audio test circuit tests the audio signal played by the playback unit, wherein the audio test circuit includes: a comparison module, comparing a threshold value with the The audio signal is played by the playback unit for performing an audio test, wherein the comparison module includes: a first capture circuit for extracting an alternating current signal of the audio signal; and a first comparison circuit for receiving the alternating current signal, and Comparing the AC signal with an threshold value of the threshold value to generate a first comparison signal; a second extraction circuit for capturing a DC signal of the audio signal; and a second comparison circuit for receiving the DC signal, And compare the DC signal with The threshold value is a DC threshold value, and a second comparison signal is generated. The comparison module generates an output signal according to the first comparison signal and the second comparison signal to determine whether the playback unit is normal. The automatic testing device of claim 23, wherein one of the function modules receives the sound signal and transmits the sound signal to the playing unit, wherein the playing unit plays the sound signal to the audio testing circuit to Conduct an audio test. The automatic test device of claim 23, wherein the output signal is transmitted to the device under test for the device to be tested to determine whether the playback unit is normal. The automatic test device of claim 23, wherein the comparison module further comprises: a rectification filter circuit that rectifies and filters the output signal. The automated test apparatus of claim 23, wherein the playback unit is a speaker. An automatic test device comprising: a device to be tested having a test program; a control unit receiving a test signal generated by the device under test to generate a control signal; and generating an control signal; and an audio test circuit Receiving the control signal to generate an audio signal: a playback unit plays the audio signal, and the audio test circuit tests the audio signal played by the playback unit; wherein the control unit is further coupled to a screen test circuit, and the screen test circuit receives The image output module of the device to be tested is tested by the control signal, and the image output module generates an image signal for the screen test circuit to perform image test on the image output module, wherein the screen test circuit includes A comparison circuit receives the image signal and compares a threshold value with the image signal to generate an output signal and transmits the signal to the device under test for the device to be tested to determine whether the image output module is normal. The automatic test device of claim 28, wherein the screen test module further comprises: a rectifying and filtering circuit that rectifies and filters the output signal. The automatic test device of claim 28, wherein the image signal comprises a red image signal, a green image signal or a blue image signal. An automated test device. The method includes: a test device having a test program; a control unit receiving a test signal generated by the test device to execute the test program to generate a control signal; and an audio test circuit receiving the control signal An audio signal: a playback unit plays the audio signal, and the audio test circuit tests the audio signal played by the playback unit; wherein the control unit is further coupled to a network route test circuit, the network route test circuit has a switch a module, the network route test circuit turns on/off the switch module according to the control signal, to switch a first network route of the function module or a second network route of the function module, and perform a network route test . The automatic test device of claim 31, wherein the network route test circuit comprises: a first network port coupled to the test circuit; and a second network port coupled to the test circuit; a third network port coupled to the device to be tested; and the switch module coupled to the first network port, the second network path, and the third network port, and the switch module is controlled according to the control Signal, and switch the first network route or the second network route to perform the network route test. The automatic test device of claim 31, wherein the switch module is a relay, a transistor, or any combination thereof.