[go: up one dir, main page]

TWI368742B - Electroconductive contactor holder and electroconductive contactor unit - Google Patents

Electroconductive contactor holder and electroconductive contactor unit

Info

Publication number
TWI368742B
TWI368742B TW097122997A TW97122997A TWI368742B TW I368742 B TWI368742 B TW I368742B TW 097122997 A TW097122997 A TW 097122997A TW 97122997 A TW97122997 A TW 97122997A TW I368742 B TWI368742 B TW I368742B
Authority
TW
Taiwan
Prior art keywords
electroconductive contactor
holder
electroconductive
unit
contactor
Prior art date
Application number
TW097122997A
Other languages
Chinese (zh)
Other versions
TW200902985A (en
Inventor
Hiroshi Nakayama
Kohei Hironaka
Mitsuhiro Kondo
Osamu Ito
Takashi Sudo
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW200902985A publication Critical patent/TW200902985A/en
Application granted granted Critical
Publication of TWI368742B publication Critical patent/TWI368742B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Multi-Conductor Connections (AREA)
TW097122997A 2007-06-22 2008-06-20 Electroconductive contactor holder and electroconductive contactor unit TWI368742B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007165396 2007-06-22

Publications (2)

Publication Number Publication Date
TW200902985A TW200902985A (en) 2009-01-16
TWI368742B true TWI368742B (en) 2012-07-21

Family

ID=40185550

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097122997A TWI368742B (en) 2007-06-22 2008-06-20 Electroconductive contactor holder and electroconductive contactor unit

Country Status (3)

Country Link
JP (1) JP5193200B2 (en)
TW (1) TWI368742B (en)
WO (1) WO2009001731A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9645172B2 (en) 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
TWI596342B (en) * 2014-03-25 2017-08-21 Advantest Corp Device Holder, Internal Unit, External Unit and Tray
TWI646335B (en) * 2018-05-10 2019-01-01 中華精測科技股份有限公司 Guide board, manufacturing method thereof, and probe head having the same

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5742235B2 (en) * 2011-01-18 2015-07-01 富士通株式会社 Connecting parts
JP5725543B2 (en) * 2011-02-17 2015-05-27 上野精機株式会社 Electronic component measuring device
KR101762836B1 (en) * 2015-09-10 2017-07-28 리노공업주식회사 A probe socket
KR101882209B1 (en) * 2016-03-23 2018-07-27 리노공업주식회사 Coaxial Test Socket Assembly
KR101906575B1 (en) * 2016-11-29 2018-10-11 리노공업주식회사 Camera module test device
KR101975836B1 (en) * 2017-08-11 2019-08-28 리노공업주식회사 A Test Device
WO2019049482A1 (en) * 2017-09-08 2019-03-14 株式会社エンプラス Electric connection socket
JP2023174031A (en) * 2022-05-27 2023-12-07 株式会社ヨコオ Inspection device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002328149A (en) * 2001-04-27 2002-11-15 Sony Corp Ic socket
JP2005049163A (en) * 2003-07-31 2005-02-24 Yokowo Co Ltd Test jig and probe for test apparatus of device for high frequency and high speed
JP2005127794A (en) * 2003-10-22 2005-05-19 Murata Mfg Co Ltd Measurement jig for electronic components and measurement method for electronic components
JP4689196B2 (en) * 2003-11-05 2011-05-25 日本発條株式会社 Conductive contact holder, conductive contact unit
JP2005337904A (en) * 2004-05-27 2005-12-08 New Japan Radio Co Ltd Fixture and method for measuring semiconductor device characteristics

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI596342B (en) * 2014-03-25 2017-08-21 Advantest Corp Device Holder, Internal Unit, External Unit and Tray
US9645172B2 (en) 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
TWI646335B (en) * 2018-05-10 2019-01-01 中華精測科技股份有限公司 Guide board, manufacturing method thereof, and probe head having the same

Also Published As

Publication number Publication date
WO2009001731A1 (en) 2008-12-31
JPWO2009001731A1 (en) 2010-08-26
JP5193200B2 (en) 2013-05-08
TW200902985A (en) 2009-01-16

Similar Documents

Publication Publication Date Title
TWI368742B (en) Electroconductive contactor holder and electroconductive contactor unit
TWI372494B (en) Conductive contacts holder and conductive contacts unit
DK3275894T3 (en) Antagonistisk cxc-chemokin-receptor-4(cxcr4)-polypeptid
EP2045050A4 (en) Electric scissors
HK1138538A1 (en) Tip holder and holder unit
GB0806063D0 (en) Component holder
EP2001207A4 (en) Desktop charger holder
AU311450S (en) Charger/holder
GB0700677D0 (en) Probe
EP2048045A4 (en) Electric steering-lock device
ZA201100796B (en) Receptacle and support
EP2138852A4 (en) Conductive contact holder and conductive contact unit
EP2216655A4 (en) Probe card
EP2133951A4 (en) Electrochemical device
GB0802154D0 (en) Improvements in electrical means
EP2153450A4 (en) Electrical switch apparatus and methods
PL2164777T3 (en) Holder
GB0802481D0 (en) Receptacle
TWI372862B (en) Reference electrode
EP2285424A4 (en) Instrument holder and connector
IL185245A0 (en) Electric dissuader
GB0611409D0 (en) An earthing arrangement
HK1109832A2 (en) Non contact-making probes
EP2234754A4 (en) Holder
GB0709795D0 (en) Electrical apparatus

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees