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TWI367338B - Test device and program - Google Patents

Test device and program

Info

Publication number
TWI367338B
TWI367338B TW097104246A TW97104246A TWI367338B TW I367338 B TWI367338 B TW I367338B TW 097104246 A TW097104246 A TW 097104246A TW 97104246 A TW97104246 A TW 97104246A TW I367338 B TWI367338 B TW I367338B
Authority
TW
Taiwan
Prior art keywords
program
test device
test
Prior art date
Application number
TW097104246A
Other languages
Chinese (zh)
Other versions
TW200839271A (en
Inventor
Toshiyuki Miura
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200839271A publication Critical patent/TW200839271A/en
Application granted granted Critical
Publication of TWI367338B publication Critical patent/TWI367338B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
TW097104246A 2007-02-15 2008-02-04 Test device and program TWI367338B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007034669A JP4951365B2 (en) 2007-02-15 2007-02-15 Test apparatus and program

Publications (2)

Publication Number Publication Date
TW200839271A TW200839271A (en) 2008-10-01
TWI367338B true TWI367338B (en) 2012-07-01

Family

ID=39689931

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097104246A TWI367338B (en) 2007-02-15 2008-02-04 Test device and program

Country Status (3)

Country Link
JP (1) JP4951365B2 (en)
TW (1) TWI367338B (en)
WO (1) WO2008099686A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101997536B1 (en) * 2018-05-08 2019-10-01 한국전력공사 Apparatus for testing circuit integrity, Method thereof, and Computer readable storage medium storing the method
TWI837998B (en) * 2022-12-08 2024-04-01 欣銓科技股份有限公司 Signal switching and verification device and signal verification system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2598663Y2 (en) * 1992-11-16 1999-08-16 横河電機株式会社 Diagnostic device for LSI test equipment
JPH06324115A (en) * 1993-05-14 1994-11-25 Yokogawa Electric Corp Diagnostic device for lsi tesster
JPH1073627A (en) * 1996-08-30 1998-03-17 Ando Electric Co Ltd Self-diagnostic device for ic testing apparatus

Also Published As

Publication number Publication date
TW200839271A (en) 2008-10-01
JP4951365B2 (en) 2012-06-13
JP2008197045A (en) 2008-08-28
WO2008099686A1 (en) 2008-08-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees