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TWI332695B - - Google Patents

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Publication number
TWI332695B
TWI332695B TW095141109A TW95141109A TWI332695B TW I332695 B TWI332695 B TW I332695B TW 095141109 A TW095141109 A TW 095141109A TW 95141109 A TW95141109 A TW 95141109A TW I332695 B TWI332695 B TW I332695B
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TW
Taiwan
Prior art keywords
elastic
pad
low
layer
bump
Prior art date
Application number
TW095141109A
Other languages
Chinese (zh)
Other versions
TW200822328A (en
Inventor
Kun Yung Huang
Yukai Cheng
meng chi Chen
Original Assignee
Fortuna Technologies Inc
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Priority to TW095141109A priority Critical patent/TW200822328A/en
Publication of TW200822328A publication Critical patent/TW200822328A/en
Application granted granted Critical
Publication of TWI332695B publication Critical patent/TWI332695B/zh

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Wire Bonding (AREA)

Description

1332695 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種用於如晶粒與玻璃基板等基材上 構裝之彈性凸塊(Compliant Bump )及其製作方式,特別是 指一種於焊墊上方形成有一低階粗糙面之彈性凸塊及其製 作方法。 【先前技術】 凸魏疋一製作於積體電路晶片之焊塾上的金屬立方體 ’便於後續以捲帶式晶片封裝(Tape Carrier Package,Tcp ) 、晶片與玻璃基板封裝(Chip on Glass,c〇G)、晶片與薄膜 基板封裴(Chip on Film,C0F)等構裝方式,將晶片的線路 力月b、’’里焊墊、凸塊、構裝基板導線傳送至如平面顯示器等 其所搭配的設備。 就凸塊的種類而言,除了典型地以金(Au)為材質電 鑛成型之金凸塊外,另外還有—種如我國專利中請號第 仙5491號、第891助5號,以及第9(H3i469號所揭露 之彈性凸塊’參閱圖1,—般的彈性凸塊9多是以高分子材 料為核心91 ’外圍包覆—與料90電性連接之金屬薄膜 92而形成之導電立方體;由 Μ由於該彈性凸塊9之核心91能選 用工作性質及機械性質較佳之高分子材料,故在製作及使 用過程中,均較傳統金凸塊具有更佳之機械特性及可靠性 ,因此已逐漸廣泛地受到平而翁_ I> ^ 』十面顯不面板構裝業界注意,並 著手進行相關測試。 上述的彈性凸塊9 在製作完成後尚需進行積體電路( 5 13326951332695 IX. Description of the Invention: [Technical Field] The present invention relates to a flexible bump for mounting on a substrate such as a die and a glass substrate, and a manufacturing method thereof, and particularly to a method An elastic bump having a low-order rough surface is formed above the solder pad and a manufacturing method thereof. [Prior Art] The metal cube formed on the soldering pad of the integrated circuit chip is convenient for subsequent Tape Carrier Package (Tcp), wafer and glass substrate packaging (Chip on Glass, c〇 G), wafer and film substrate (Chip on Film, C0F) and other packaging methods, the wafer line force, b, '' inside the pad, bump, package substrate wire to a flat display, etc. Matching equipment. As far as the types of bumps are concerned, in addition to the gold bumps which are typically formed by gold (Au), there are also kinds of gold alloys such as No. 5491 and No. 5 of the Chinese patents, and 9 (Elastic bumps disclosed in H3i469) Referring to FIG. 1, the general elastic bumps 9 are formed by a polymer film as a core 91' peripherally coated with a metal film 92 electrically connected to the material 90. The conductive cube; because the core 91 of the elastic bump 9 can select a polymer material with better working properties and mechanical properties, it has better mechanical properties and reliability than the conventional gold bumps in the process of manufacture and use. Therefore, it has gradually been widely accepted by the flat _ I> ^ 』 十 显 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 面板 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。

Integrated Circuit,IC )電氣功能測試,測試時是以一探針 (probe card needle ) 8 觸壓(t〇uch d〇wn )上述彈性凸塊 9 之頂面921進行電性量測;然由於該核心91在製作過程中 通常具有良好的工作性及流動性,因此其成形後均具有極 為平滑之頂部,加上該金屬薄膜92多是採用濺鍍技術( sputtering)形成,因此該頂面921的粗糙度(r〇ughness) 極低,無法提供足夠之摩擦力;故當為確保該探針8良好 接觸該彈性凸塊9而過度下壓(〇ver drive)時,便會導致 該探針8之針尖81於該頂面921上相對滑動,而發生所謂 的滑針現象。 上述滑針現象使得同一探針8與同一彈性凸塊9間需 重複進行多次不必要之觸壓才得以進行電性量測,因而增 加測5式作業的時程;同時也由於未能確定該針尖81是否正 確觸壓該彈性凸塊9之頂端921,因此使得測試過程及結果 充滿更多的不確定性;此外更由於該針尖81於觸壓該頂面 921產生滑動,而將到起部分該金屬薄膜92並沾粘於該針 太81上,導致該探針8平均每5至1〇次觸壓後,均必須 進行探針清潔(needle cleaning),不僅在測試時程上產生延 誤’更會造成錯誤的測試結果。 為解決於先前技術中所提及的滑針問題,先前曾有中 華民國發明專利公告號帛1248145號及中華民國發明專利 公告號第1248133號之發明提出’其說明書内容全部列入 本案參考範圍。 由於現今電子產品的多樣化,除了彈性凸塊9有小型 6 1332695 化的趨勢外,在許多彈性凸& 9的構裝製程中,亦多運‘ 重配線路以彈性調整彈性凸& 9的位置。然而此種少量多 樣化的凸塊重配布局將迫使測試機台進行多次的探針測試 位置與程序設定,此種多次繁複的設定亦會造成凸㈣試 上額外的負擔與衫。加上彈性凸塊9之發展亦有小型化 之趨勢’因此如何能不破壞已完成之彈性凸塊9、減少測試 機台繁複設定之讀、时避免上述滑針現㈣提升測試 效率,成為業界急欲解決之問題。Integrated circuit, IC) electrical function test, the test is carried out by a probe (needle card needle) 8 touch pressure (t〇uch d〇wn) the top surface 921 of the elastic bump 9 for electrical measurement; The core 91 generally has good workability and fluidity during the manufacturing process, so that it has an extremely smooth top after forming, and the metal film 92 is mostly formed by sputtering, so the top surface 921 is The roughness (r〇ughness) is extremely low and does not provide sufficient friction; therefore, when the probe 8 is ensured to be in good contact with the elastic bump 9, excessively pressing (〇ver drive), the probe 8 is caused. The needle tip 81 slides relative to the top surface 921, and a so-called slip phenomenon occurs. The above-mentioned slip needle phenomenon enables repeated measurement of multiple unnecessary pressures between the same probe 8 and the same elastic bump 9 to perform electrical measurement, thereby increasing the time course of the 5 type operation; Whether the needle tip 81 correctly touches the top end 921 of the elastic bump 9, thereby making the test process and the result full of more uncertainty; moreover, since the needle tip 81 is sliding against the top surface 921, it will rise. A part of the metal film 92 is adhered to the needle 81, so that the probe 8 must perform needle cleaning every 5 to 1 times of contact pressure, which not only causes delay in the test time. 'More will result in wrong test results. In order to solve the problem of the slip needle mentioned in the prior art, the invention of the Republic of China Invention Patent No. 帛1248145 and the Republic of China Invention Patent No. 1248133 have been previously proposed, and the contents of the specification are all included in the reference range of the present case. Due to the diversification of today's electronic products, in addition to the tendency of the elastic bumps 9 to have a small size of 6 1332695, in many elastic convex & amp 9 manufacturing processes, the 're-matching line is also used to elastically adjust the elastic convex & 9 s position. However, such a small number of different bump reconfiguration layouts will force the test machine to perform multiple probe test positions and program settings. Such multiple complicated settings will also cause additional burdens on the bumps (4). In addition, the development of the elastic bumps 9 has also become a trend of miniaturization. Therefore, how to avoid the damage of the completed elastic bumps 9, reduce the complicated setting of the test machine, and avoid the above-mentioned slip needles (4) improve the test efficiency and become the industry. Anxious to solve the problem.

【發明内容】 本發明之主要目的是在提供一種具有低階粗輪面之彈 性凸塊及其製作方法。 本發明之另—目的是在提供一種具有A工粗縫度之彈 性凸塊及其製作方法。 本發明之又一目的是在提供一種能避免滑針現象發生 之彈性凸塊及其製作方法。SUMMARY OF THE INVENTION A primary object of the present invention is to provide an elastic bump having a low-order coarse wheel surface and a method of fabricating the same. Another object of the present invention is to provide an elastic bump having a rough seam of A and a method of fabricating the same. It is still another object of the present invention to provide an elastic bump which can prevent the occurrence of a slip phenomenon and a method of fabricating the same.

本發明之再一目的是在提供一種能於焊墊位置進行測 試之彈性凸塊及其製作方法。 本發明具有低階粗糙面之彈性凸塊是設置於一具有一 焊墊及一保護層的基板上;該彈性凸塊具有一位於該基板 上之彈性座體,以及一覆蓋於該彈性座體頂面並鄰接該焊 墊表面之表層金屬膜,該表層金屬膜具有一鄰接該焊墊表 面之接觸面以及一相反於該接觸面之低階表面。 本發明之彈性凸塊的主要特徵在於該表層金屬膜形成 有多數由該低階表面朝該接觸面方向延伸之凹槽。 7 1332695 本發明之彈性凸塊的特徵之一在於各該凹槽可以為一 延伸至該接觸面而為貫穿該表層金屬膜之穿孔、或一由該 低階表面朝該接觸面方向延伸之盲孔、或-沿平行該焊勢 表面之水平方向延伸的槽道。 本發明之彈性凸塊的特徵之一在於該彈性座體位於該 焊墊上且不完全遮蔽該焊墊。當然這包含了將該彈性座體 形成於該焊墊上,且該彈性座體鄰接於該焊墊之底部面積 小於該焊墊之表面積的狀況;以及僅將該彈性座體之部分 幵y成於該知塾上,或者將該彈性座體形成於該焊塾以外的 區域上。 本發明之彈性凸塊的另特徵之一在於該彈性座體位於 該保護層上,如此將不會遮蔽該焊墊。 本發明之彈性凸塊的特徵之一在於該彈性座體之材質 可以是一感光或一非感光的材料,例如聚亞醯胺( polyimide)、苯環丁烯(benez〇cyd〇butene)、聚丙烯酸酯( polyacrylates)、橡膠(rubber),以及矽膠(siiicone)等。 本發明之彈性凸塊的特徵之一在於該表層金屬膜之材 質非限疋地可以是金、銀、鉻、鈦、鎢、紹、銅,以尽其 等之組合。 本發明之彈性凸塊的特徵之一在於該表層金屬膜可以 疋一層或多層結構。在兩層以上的結構中,該表層金屬膜 可以具有一鄰接該焊墊之内膜層,以及一鄰接該内膜層之 外膜層。該内膜層之材質非限定地可以是路、鈦、鶴、鋁 、銅,以及其等之組合。而該外膜層之材質非限定地可以 8 1332695 是金、鋼、銀,以及其等之組合。 而本發明具有低階粗趟面之彈性凸塊的製作方法則包 含下列步驟: a) 於上述具有上述焊墊之基板上形成上述彈性座體; b) 於上述彈性座體及上述烊塾上形成上述表面金屬層; 及 c) 移除部份上述表面金屬層鄰接上述焊墊之區段以形成 上述多數凹槽。 本發明之製作方法的特徵之—在於該步驟a)是將該彈 性座體形成於該焊墊上且不完全遮蔽該焊墊。這包含了將 該彈性座體形成於該焊墊上’且該彈性座體鄰接於該焊塾 之底部面積小於該焊塾之表面積的狀況;以及僅將該彈性 座體之部分形成於該焊墊上;或者將該彈性座體形成於該 焊整以外的區域上。而討㈣的方法可以是以微影技術 或印刷技術製程完成;具體舉例地來說,該步驟幻包含下 列步驟: 、 a-Ι)製備一具有上述彈性座體二維投影圖形之光罩; a-2)於該基板上塗佈一感光材料層; a - 3)以曝光方式將該光罩上之該彈性座體二維投影圖形 傳遞至該感光材料層上;及 a-4)以顯影方式形成上述彈性座體。 本發明之製作方法的特徵之—在於該步驟b)是以物理 氣相沉積技術之製程完成;其非限定地包含賤鏡技術,或 採用蒸鍍技術。當上述表面金屬層為兩層以上之結構時, 9 1332695 該步驟b)可以包含下列步驟:It is still another object of the present invention to provide an elastic bump which can be tested at the position of the pad and a method of fabricating the same. The elastic bump having the low-order rough surface is disposed on a substrate having a pad and a protective layer; the elastic bump has an elastic seat on the substrate, and a cover is disposed on the elastic body The top surface and adjacent to the surface metal film of the surface of the pad, the surface metal film has a contact surface adjacent to the surface of the pad and a low-order surface opposite to the contact surface. The main feature of the elastic bump of the present invention is that the surface metal film is formed with a plurality of grooves extending from the lower-order surface toward the contact surface. 7 1332695 One of the features of the elastic bump of the present invention is that each of the grooves may be a perforation extending to the contact surface and extending through the surface metal film, or a blind extending from the lower-order surface toward the contact surface. A hole, or a channel extending in a horizontal direction parallel to the surface of the soldering surface. One of the features of the resilient bump of the present invention is that the resilient seat is located on the pad and does not completely shield the pad. Of course, this includes forming the elastic seat body on the soldering pad, and the elastic seat body is adjacent to the bottom surface of the soldering pad to be smaller than the surface area of the soldering pad; and only the part of the elastic seat body is formed In this knowledge, the elastic seat body is formed on a region other than the soldering iron. One of the other features of the resilient bump of the present invention is that the resilient seat is located on the protective layer such that the pad will not be shielded. One of the characteristics of the elastic bump of the present invention is that the material of the elastic seat can be a photosensitive or non-photosensitive material, such as polyimide, benez〇cyd〇butene, poly Polyacrylates, rubber, and siiicone. One of the features of the elastic bump of the present invention is that the material of the surface metal film may be gold, silver, chromium, titanium, tungsten, bismuth or copper in a non-limiting manner, in a combination thereof. One of the features of the elastic bump of the present invention is that the surface metal film can be laminated in one or more layers. In a structure of more than two layers, the surface metal film may have an inner film layer adjacent to the pad and an outer film layer adjacent to the inner film layer. The material of the inner film layer may be, without limitation, a combination of road, titanium, crane, aluminum, copper, and the like. The material of the outer film layer may be, without limitation, 8 1332695 being a combination of gold, steel, silver, and the like. The method for manufacturing the elastic bump having the low-order rough surface includes the following steps: a) forming the elastic seat on the substrate having the pad; b) on the elastic body and the top Forming the surface metal layer; and c) removing a portion of the surface metal layer adjacent to the pad to form the plurality of grooves. The method of the present invention is characterized in that the step a) is to form the elastic body on the pad and not completely shield the pad. The method includes: forming the elastic seat body on the soldering pad' and the elastic seat body is adjacent to a bottom surface of the soldering iron to be smaller than a surface area of the soldering iron; and forming only a portion of the elastic seat body on the soldering pad Or the elastic seat is formed on a region other than the weld. The method of (4) may be completed by a lithography technique or a printing technology process; specifically, the step includes the following steps: a-Ι) preparing a photomask having the two-dimensional projection pattern of the elastic seat; A-2) coating a photosensitive material layer on the substrate; a-3) transferring the two-dimensional projection pattern of the elastic seat on the photomask to the photosensitive material layer by exposure; and a-4) The developing method forms the above elastic seat. The method of fabrication of the present invention is characterized in that the step b) is carried out by a process of physical vapor deposition techniques; it includes, without limitation, 贱 mirror technology, or by evaporation techniques. When the surface metal layer is a structure of two or more layers, the step b) of the step 1) may include the following steps:

b-Ι)於該彈性座體及該焊塾上形成一内膜層;及 b-2)於該内膜層上形成一外膜層。 H 本發明之製作方法的特徵之一在於若僅就在移除部份 上述表面金屬層鄰接上述焊塾之區段形成上述多數凹槽的 具體方法而言,該步驟幻可以包含下列步驟: c-1)以微影技術於該表面金屬層定義出該等凹槽所 圍,及B-Ι) forming an inner film layer on the elastic body and the soldering iron; and b-2) forming an outer film layer on the inner film layer. H. One of the features of the manufacturing method of the present invention is that if only a specific method of removing a portion of the surface metal layer adjacent to the solder bump portion is formed, the step may include the following steps: -1) defining, by lithography, the grooves in the surface metal layer, and

C - 2)以㈣技術移除位於該等凹槽所在範圍之部分該表 面金屬層。 本發明之製作方法的特徵之—在於該步驟〇更可以同 步地移除部分上述表面金屬層以界^出自上述彈性座體延 伸至上述焊墊之上述表層金屬膜。就移除部分上述表面金 屬層以同時地界定出自上述彈性座體延伸至上述焊墊之上 述表層金屬膜,以及上述多數凹槽的具體方法而言,該步 驟c)可以包含下列步驟:C - 2) The metal layer of the surface located in the range of the grooves is removed by the technique of (4). The manufacturing method of the present invention is characterized in that the step 〇 further removes a portion of the surface metal layer to extend the surface metal film extending from the elastic body to the pad. In the specific method of removing a portion of the surface metal layer to simultaneously define the surface metal film extending from the elastic body to the pad, and the plurality of grooves, the step c) may include the following steps:

c-1)以微影技術於該表面金屬層定義出該彈性座體所在 範圍、該焊墊所在範圍、該彈性座體至該焊墊間之範圍, 以及該等凹槽所在範圍;及 c-2)以蝕刻技術移除非位於該彈性座體所在範圍非 位於該焊墊所在範圍、非位於該彈性座體至該焊墊間之部 分的該表面金屬層’以及位於該等凹槽所在範圍之部分該 表面金屬層。 本發明之製作方法的特徵之一在於並非以在同一製程 10 1332695 步驟同時完成界定自上述彈性座體延伸至上述焊塾之上述 表層金屬m,以及上述多個凹槽為限;界定上述表層金屬 膜之輪廓範圍與界定形成於該表層金屬膜上之多個凹槽也 可以於不同之製程步驟進行,如在該步驟b)及步驟c)間進 行下列步驟: d)移除部分該表面金屬層以界定出自該彈性座體延伸至 該焊墊之該表層金屬膜。 具體地,該步驟d)包含下列步驟: d-Ι)以微影技術於該表面金制定義出該彈性座體所在 範圍、該焊墊所在範圍,以及該彈性座體至該焊墊間之範 圍;及 d-2)以蝕刻技術移除非位於該彈性座體所在範圍、非位 於該焊墊所在範圍,以及非位於該彈性座體至該焊墊間之 部分的該表面金屬層。 本發明之功效是能於彈性凸塊之表層金屬膜於鄰接焊 墊之區段上形成之一人工的粗糙面,從而避免滑針現象發 生,又能於焊墊位置進行測試。 【實施方式】 、有關本發明之前述及其他技術内容、特點與功效,在 以下配合參考圖式之三較佳實施例的詳細說明中,將可清 楚的明白。在提出詳細說明之前,要注意的是,在以下的 敘述中,類似的元件是以相同的編號來表示。 如圖2及圖3所示’本發明具有低階粗糙面之彈性凸 塊2及其製作方法的第-較佳實施例,是以-晶圓(wafer 11 為基板1,將多數個本發明具有表面圖案凹陷之彈性凸塊 1作於該基板i。該基板i具有一電路層u、多數形成於 X電路層11上之焊墊12,以及一形成於該電路層Η上其 餘部分之保護層13。該電路層U包含多數金屬内連線(圖 未不)以及包圍該等内連線之介電材質(圖未示),由於該 電路層11之具體配置非本發明主要特徵,故在此不多加 述。 如圖3所示,該彈性凸塊2具有一設置於該基板i上 之彈I·生座體21,以及一覆蓋該彈性座體21和該焊墊12上 之表層金屬膜22。在本實施例中,該彈性座體21是相對於 "玄焊墊12偏移地跨設於部分該焊墊12與部份該保護層 上,且不完全遮蔽該焊墊12,並具有一遠離該基板丨之頂 面211,在本實施例中,該彈性座體21是以感光型聚亞醯 胺(ph〇t〇-sensitive polyimide)材料製成,但並不以此為限 ;除了現有適用於製作彈性凸塊2之核心(c〇re)的感光材 料(photo-sensitive material)外,其他如非感光型之聚亞 酿胺(polyimide)、苯環丁烯(benezocycl〇butene)、聚丙烯 酸醋(polyacrylates)、橡膠(rubber),以及矽膠(siHc〇ne )等,也都適用於本發明中。 該表層金屬膜22覆蓋於該彈性座體21之頂面211上並 包覆該彈性座體21,同時也延伸至該焊塾12處,覆蓋並鄰 接於未被該彈性座體21遮蔽之該焊墊12區域而與該焊墊 12電性連接》該表層金屬膜22具有一鄰接該焊墊12表面 121之接觸面221、一相反於該接觸面221之低階表面222 12 1332695 ,以及多數由該低階表面222朝該接觸面221方向延伸之 凹槽220 ;在本實施例中,各該凹槽22〇由該低階表面222 延伸至該接觸面221,而為一貫穿該表層金屬膜22之穿孔 〇 該表層金屬膜22是由一内臈層223與一外膜層224所 組成,该内膜層223鄰接且直接地覆蓋於該彈性座體21與 未被泫彈性座體21遮蔽之該烊墊12區域上;該外膜層224 則鍍設鄰接於該内膜層223之外。該内膜層223 一般亦稱 之為黏著與擴散阻障層,在本實施例中該内膜層223之材 質為鈦鎢混鑄金屬(TiW),但並非以此為限。而該内膜層 223的厚度為1500Λ;該外膜層224之材質則是金,厚度為 3000Α。當然,該内膜層223及該外膜層224之材質與厚度 並非以上述舉例為限。此外,該内膜層223也可以是由鉻 (CO、鈦(Ti)、鎢(w)、銘(Α1)、銅(Cu),或其等之 組合的材料製成’其在較佳的實施上,厚度範圍一般約在 500〜5000A 間。 該外膜層224則可以是由金(Au)、銅(Cu)、銀* )’以及其等之組合的材料製成。此外該表層金屬膜22也 非限定以上述兩金屬層為限,其也可以由單一金屬層,或 兩層以上之金屬層構成。 要特別說明的是,雖然在本實施例中,該表層金屬膜 22是完全包覆該彈性座體2卜但此非本發明之必要技術手 段,該表層金屬膜22只需於該彈性座體21頂面2ιι形成供 後續構裝作業之上階表面225,並且與該焊墊12完成電性 13 連接即可,因此該表層金屬膜22是否完全包㈣彈性座體 21可依設計需要進行選擇。 前面述及構裝作業之技術,一般是指運用凸塊之覆晶 晶片技術,其非限;U也包含有各向異性導電膜(ACF)技術、 各向異性導電t(Acp)技術、料電顆㈣(卿)技術和非 導電顆粒《 (NCP)技術等,由於此非本發明技術特徵,故不 多加贅述。C-1) defining, by the lithography technique, the range of the elastic seat, the range of the pad, the range between the elastic body and the pad, and the range of the grooves; and -2) removing, by etching technique, the surface metal layer not located in the range of the solder pad, not in the range of the solder pad, not located between the elastic body and the solder pad, and at the groove A portion of the surface of the surface metal layer. One of the features of the manufacturing method of the present invention is that the surface metal m defined by extending from the elastic body to the soldering iron is not simultaneously completed in the same process 10 1332695, and the plurality of grooves are limited; the surface metal is defined The contour range of the film and the plurality of grooves defined on the surface metal film may also be performed in different process steps, such as performing the following steps between the step b) and the step c): d) removing part of the surface metal The layer defines a surface metal film extending from the elastic body to the bonding pad. Specifically, the step d) comprises the following steps: d-Ι) defining, by the lithography technique, the range of the elastic seat, the range of the bonding pad, and the elastic seat to the bonding pad The range; and d-2) removing, by the etching technique, the surface metal layer not located in the range of the elastic body, not in the range of the pad, and not in the portion between the elastic body and the pad. The effect of the invention is that an artificial rough surface can be formed on the surface of the elastic bump on the section adjacent to the solder pad, thereby avoiding the occurrence of the slip phenomenon and testing at the position of the solder pad. The above and other technical contents, features and effects of the present invention will become apparent from the following detailed description of the preferred embodiments of the preferred embodiments. Before the detailed description is made, it is noted that in the following description, similar elements are denoted by the same reference numerals. As shown in FIG. 2 and FIG. 3, the first preferred embodiment of the present invention has a low-order rough surface elastic bump 2 and a method for fabricating the same, which is a wafer (wafer 11 is a substrate 1 and a plurality of the present invention will be used. An elastic bump 1 having a surface pattern recess is formed on the substrate i. The substrate i has a circuit layer u, a plurality of pads 12 formed on the X circuit layer 11, and a protection formed on the remaining portion of the circuit layer Layer 13. The circuit layer U includes a plurality of metal interconnects (not shown) and a dielectric material (not shown) surrounding the interconnects. Since the specific configuration of the circuit layer 11 is not the main feature of the present invention, As shown in FIG. 3, the elastic bump 2 has a spring I and a living body 21 disposed on the substrate i, and a surface layer covering the elastic body 21 and the bonding pad 12. The metal film 22. In the embodiment, the elastic body 21 is offset from the solder pad 12 and partially on the protective layer with respect to the solder pad 12, and the pad is not completely shielded. 12, and has a top surface 211 away from the substrate, in the embodiment, the elastic body 21 is photosensitive Made of ph〇t〇-sensitive polyimide material, but not limited thereto; except for the photo-sensitive material which is suitable for making the core of the elastic bump 2 Other non-photosensitive polyimide, benezocycline butene, polyacrylates, rubber, and silicone (siHc〇ne) are also suitable for use in In the present invention, the surface metal film 22 covers the top surface 211 of the elastic seat body 21 and covers the elastic seat body 21, and also extends to the soldering iron 12, covering and adjacent to the elastic seat body. The surface of the pad 12 is electrically connected to the pad 12. The surface metal film 22 has a contact surface 221 adjacent to the surface 121 of the pad 12 and a low-order surface 222 opposite to the contact surface 221. 1332695, and a plurality of grooves 220 extending from the lower-order surface 222 toward the contact surface 221; in the embodiment, each of the grooves 22 extends from the lower-order surface 222 to the contact surface 221, and is a Through the perforation of the surface metal film 22, the surface metal film 22 is An inner layer 223 is formed of an outer film layer 224 adjacent to and directly covering the elastic seat body 21 and the area of the mattress 12 which is not covered by the elastic body 21; the outer film The layer 224 is plated adjacent to the inner film layer 223. The inner film layer 223 is also generally referred to as an adhesion and diffusion barrier layer. In the embodiment, the inner film layer 223 is made of titanium-tungsten mixed metal. (TiW), but not limited thereto, and the inner film layer 223 has a thickness of 1500 Å; the outer film layer 224 is made of gold and has a thickness of 3000 Å. Of course, the material and thickness of the inner film layer 223 and the outer film layer 224 are not limited to the above examples. In addition, the inner film layer 223 may also be made of a material of chromium (CO, titanium (Ti), tungsten (w), ing (1), copper (Cu), or the like, which is preferred. In practice, the thickness is generally in the range of about 500 to 5000 A. The outer film layer 224 may be made of a material of gold (Au), copper (Cu), silver*)', and the like. Further, the surface metal film 22 is not limited to the above two metal layers, and may be composed of a single metal layer or a metal layer of two or more layers. It should be particularly noted that although in the present embodiment, the surface metal film 22 completely covers the elastic body 2, but this is not a necessary technical means of the present invention, the surface metal film 22 only needs to be in the elastic body. The top surface of the 21 surface is formed into a surface 225 for the subsequent assembly operation, and the electrical connection 13 is completed with the solder pad 12, so that the surface metal film 22 is completely covered. (4) The elastic base 21 can be selected according to design requirements. . The technique of the above-mentioned construction operation generally refers to the flip chip technology using bumps, which is not limited; U also includes anisotropic conductive film (ACF) technology, anisotropic conductive t (Acp) technology, and materials. Electron (4) (Qing) technology and non-conductive particles "(NCP) technology, etc., because this is not a technical feature of the present invention, it will not be repeated.

如圖3及圖4所示, 在本實施例中,各該凹槽220為 —貫穿該表層金相22之穿孔,但並非以此為限,該等凹 =20是用於增加該低階表面222之粗縫度因此其鐘空 ::尺寸大小冑目多寡’及排列方式等均能依實際需 :::又汁變化’如圖5所示,各該凹槽22〇 &可以是一沿平 仃及焊墊表面121之水平方向延伸的槽I此外,由隨後 所介紹的本發明製作過程可知,^形成各該凹肖22〇⑽ 刻步驟不完全(不足)’或僅㈣移除該外膜層224之部分As shown in FIG. 3 and FIG. 4, in the embodiment, each of the grooves 220 is a through hole penetrating through the surface metallization 22, but is not limited thereto. The concave=20 is used to increase the low order. The roughness of the surface 222 is thus the clock space: the size and the size of the product and the arrangement can be adjusted according to the actual needs::: juice change as shown in Fig. 5, each of the grooves 22〇& A groove I extending in the horizontal direction of the flat surface and the pad surface 121. Further, it is known from the manufacturing process of the present invention which will be described later that the step of forming the concave surface is incomplete (deficient) or only (four) In addition to the portion of the outer film layer 224

如圖6所示’均將使得各該凹槽22Q成為—盲孔,但仍能 達到本發明使職階表面奶產生減度的效果。 ” X下即詳細說明上述具有低階粗縫面之彈性凸塊2的 •乍方法配&圖7所示,該製作方法包括下列步驟: 步驟500’如圖8所示,製備該具有上述焊墊η及該 保護層13之基板1。 步驟502 ’如圖9所示,製備一具有上述彈性座體η 圖3)之二維投影圖形31〇的光罩31。 步驟5〇4,於該基1上塗佈-感光材料層20,在本 14 &例中是以旋塗(spin )方式將上述正感光型聚亞酿胺盡 佈於該等焊墊12及該保護層13之表面上。 步驟506,以曝光(exposure)方式將上述光罩31之二 維才又影圖形310傳遞(transfer)至該感光材料層2〇上,在 匕步驟中,該二維投影圖形31〇不完全涵蓋各該焊墊12顯 露於該保護層13外之表面。 步驟508,如圖1〇所示,以顯影(devel〇pment)方式 移除部分感光材料層20(見圖9)而形成上述彈性座體21 在本實施例中,是以有機溶劑移除未曝光部分之聚亞醯 胺;當然,其他如有機鹼水溶液等,也能運用於本發明步 ,中。由於在步驟506中該二維投影圖形31〇 (見圖9)不 元全涵蓋各該焊墊12所顯露之表面,因此明顯地,所形成 的該彈性座體21將不完全遮蔽該焊墊12。 ^上述步驟至步驟508是將上述彈性座體21形成於 。玄基板1上的諸多方式之一,特別是當所述的彈性座體21 之材質是感光材料時的一種製作方法,但並非以此為限, 特別當所述的彈性座體21選用之材質為非感光材料時,該 彈性座體21也可以採用其他如傳統微影(ph〇t〇Hth〇graphy )蝕刻(etching)技術或印刷技術(printing)等製程完成 〇 步驟510,如圖π所示,以濺鑛技術於上述彈性座體 21及未被該彈性座體21遮蔽之該焊墊12區域上形成該厚 度均勻之内膜層223 ;由於該内膜層223直接鄰接於該焊塾 12上,因此亦使該内膜層223與上述焊墊12電性連接。 15 1332695 步驟512,以濺鍍技術於該内膜層223上形成上述之外 膜層224。 前述步驟510和步驟512是於上述彈性座體21及上述 焊墊12上形成一包含上述兩種不同材料之内膜層223與外 • 膜層224,並與上述焊墊12電性連接之表面金屬層229的 - 方法,因此,若該表面金屬層229僅是由單一膜層(圖未 示)構成時,則此處僅需一單一步驟形成該表面金屬層229 即可,因此,熟習該項技術者當可推想,若構成該表面金 # 屬層229之膜層數較多時,其相對應之步驟也將隨之增加 〇 同樣地,雖然在本實施例中,該内膜層223及該外膜 層224都是以濺鍍技術形成,但並非以此為限;無論形成 的該表面金屬層229是單一膜層構造,或是多層膜層構造 ,其形成方法均可依據所選用的金屬材質之特性,採用如 蒸鍍技術(evaporation)等其他種類的物理氣相沉積技術( Physical vapor depositi〇n, pvD)之製程,也都能應用於本 籲 發明中以形成該表面金屬層229。 步驟514,如圖12所示,塗佈一光阻劑4於該表面金 屬層229上。 步驟516,如圖4及圖12所示,運用一涵蓋上述彈性 座體21及上述焊墊12,以及具有上述凹槽㈣之二維投影 圖形320的光罩32 ,以曝光方式將該二維投影圖#挪傳 遞至該光阻劑4_±^該光罩32有關上述凹槽22()之二維圖 形是投影於該光阻劑4上對應部分該表面金屬層229鄰接 16 1332695 該焊塾12之區段。 此處所稱之二維投影圖形320,其涵蓋上述彈性座體 21及上述焊墊12之二維投影是指欲保留該表面金屬層229 之範圍,意即至少包含上述彈性座體21之頂面211、上述 烊墊12未被該彈性座體21遮蔽之區域,以及該頂面211至 上述焊墊12未被該彈性座體21遮蔽之區域間的連線範圍 〇 步驟518,以顯影方式移除部分該光阻劑4而將上述彈 性座體21、上述焊墊12未被該彈性座體21遮蔽之區域、 該頂面211至上述焊墊12未被該彈性座體21遮蔽之區域間 的連線範圍,以及上述凹槽22〇之二維投影圖形32〇定義 於該表面金屬層229上,如圖13所示。 上述步驟514至步驟518是以微影技術於該表面金屬 層229定義出上述彈性座體21所在範圍、該焊墊12所在 範圍、該彈性座體21至該焊墊12間之範圍,以及上述凹 槽220所在範圍。 步驟520,如圖13所示,以蝕刻技術移除非位於該彈 性座體21所在範圍、非位於該焊墊12所在範圍非位於 忒彈性座體21至該焊墊12間之部分的該表面金屬層229, 以及該表面金屬層229鄰接該焊墊12之區段内位於上述凹 槽220 (見冑3)所在位置之部分;以界定出自上述彈性座 體21延伸至該焊墊12之該表層金屬膜22,並形成上述凹 槽220 (見圖3)。 由於在本實施例中,該表面金屬層229具有該鈦鎢混 17 1332695 鑄金屬製成之内膜層223及該金質之外膜層以,故在此步 驟中是先以該光阻劑4(見圖13)為银刻屏障,選用誠⑸ 與蛾化卸(KI)溶液為餘刻液钱刻該外膜層224 •隨後再以保 f下來之外膜層224為㈣屏障,選用雙氧水(Η2〇2)溶液為 钱刻液银刻該内膜層223。 ▲步驟522,清除殘存之上述光阻劑4(見圖⑴,完成 該具有低階粗糙面之彈性凸塊2。 由上述可知,步驟514至步驟522是同步地形成如圖3 所示之上述凹# 22〇與衫上述彈性凸塊2之表層金屬膜 22,因此相較於現有一般彈性凸塊之製程,本發明且有低 Ρ皆粗糙面·性Μ 2在製作時並不需要增加任何步驟, 僅在製作該具有上述彈性凸& 2之二維投影圖形32〇的光 罩32時,於該二維投影圖形32〇中同時形成上述凹槽22〇 之二維投影,便能於界定上述彈性座體21延伸至該焊墊Η 之表層金屬膜22時,同步地形成該等凹槽22〇。由於各該 凹槽220之深度等於上述表層金屬膜22之厚度,故相當於 疋在位於該焊墊12未被該彈性座體21遮蔽之區域上形成 一與其自身厚度相同之粗糙度的上述表層金屬膜22。從而 可在該知墊12未被該彈性座體21遮蔽之位置上進行測試 ’並能避免發生滑針現象。 如圖14所示,本發明具有低階粗糙面之彈性凸塊2及 其製作方法的第二較佳實施例與上述第一較佳實施例大致 相同,其差異在於,在本實施例中,該彈性座體21是完全 形成於該焊墊12顯露於該保護層13外的範圍内且各該 18 1332695 凹槽220之型態為一由該低階表面222往該接觸面22ι延 伸之盲孔。 此外,與上述第一較佳實施例之另一差異在於,在本 實施例中,上述彈性凸塊2之製作方法是先定義出該等表 層金屬膜22後,才於各該表層金屬膜22上形成該等凹槽 220。以下詳細說明本發明彈性凸塊2之另一製作方法,配 合圖15所示,其步驟包含: 步驟600,如圖16所示,製備該具有上述焊墊12及該 保護層13之基板1。 Λ 步驟602,將上述彈性座體21形成於上述焊墊12上; 在本實施例中,該彈性座體21完全地位於該焊墊12裸露 於該保護層13外之表面121範圍内,且該彈性座體21鄰 接於該焊墊12之底部面積小於該焊墊12表面121面積; 由於上述焊墊12未被該彈性座體21完全遮蔽,因此顯露 出部分上述焊墊12之表面121。 步驟604,如圖17所示,於上述彈性座體21上形成一 與上述焊墊12電性連接之表面金屬層229,在本實施例中 ,該表面金屬層229同樣地包含一内膜層223及一外膜層 224。 步驟606,如圖18所示,運用微影技術以一光阻劑4 於該表面金屬層229上定義出包含上述彈性座體21之上述 焊墊12所在範圍。 步驟608,以蝕刻技術移除非位於上述焊墊丨2所在範 圍之部分該表面金屬層229,如圖19所示,以界定出上述 19 1332695 表層金屬膜22。 此處界定之範圍相對上述第一較佳實施例較為單純, 乃是由於上述彈性座體21完全位於上述焊墊12範圍内, 因此界定出在該焊塾12範圍内之上述表層金屬膜22,便能 同時界定出包含上述彈性座體21之頂面211、上述焊墊12 未被上述彈性座體21遮蔽之區域,以及該頂面2ιι至上述 焊墊12未被上述彈性座體21遮蔽之區域間的連線範圍之 上述表層金屬膜22。 步驟610,如圖20所示,運用微影技術以一光阻劑4 於上述表層金屬膜22之外膜層224上定義出上述凹槽22〇 (見圖14)所在範圍2240;其中,上述凹槽22〇座落之範 圍2240是對應部分該表層金屬膜22鄰接該焊墊12之區段 〇 步驟612,如圖14所示,以蝕刻技術移除位於上述凹 槽220所在範圍之部分表層金屬膜22,以形成上述凹槽 220。 依上所述,本實施例所揭露之製作方式同樣地能於上 述表層金屬膜22鄰接於該焊墊12之區段上形成該等凹槽 220,且各該凹槽22〇之深度等於上述該外膜層224之厚度 ,因此便能使該彈性凸塊2之上述表層金屬膜22在位於該 焊墊12未被該彈性座體21遮蔽之區域上形成與上述外膜 層224厚度相同之粗糙度,從而可在該焊墊12未被該彈性 座體21遮蔽之位置上進行測試,並避免發生滑針現象。 如圖21所示’本發明的第三較佳實施例與上述兩較佳 20 實鈿例大致相同,其差異在於,在本實施例中,該彈性座 體21是完全形成於該保護層13上,而不在該焊墊12上, 且各該凹肖220之型態如同上述第-實施例相同,為一貫 穿該表層金屬膜22之穿孔。 在本實施例中’該基板1同樣具有一電路層11、多數 升/成於該電路層11上之焊塾12,以及—形成於該電路層11 上其餘部分之保護| 13。該彈性凸塊2具有一設置於該保 護層13之彈性座體21,以及_覆蓋該彈性座體2ι和該悍 墊12上之表層金屬膜22。該彈性座體η遠離該焊墊η, 且完全不遮蔽該焊墊12,並具有一遠離該基板(之頂面2ιι 〇 該表層金屬膜22覆蓋於該彈性座體21之頂面211上並 包覆該彈性座體21,同時也延伸至該焊墊12處覆蓋並鄰 ,於該顯露於該保護層13外之焊塾12上,並與該焊塾12 完成電性連接。該表層金屬膜22具有—鄰接該焊墊12表 面121之接觸面221、一相反於該接觸面22丨之低階表面 222以及多數由該低階表面222朝該接觸面221方向延伸 之凹槽220 ;在本實施例中,各該凹槽220由該低階表面 222延伸至該接觸面221,而為一貫穿該表層金屬膜u之 穿孔。而由上述實施例可知,各該凹槽22〇也可以形成盲 孔或槽道的型態。 該表層金屬膜22是由一内膜層223與一外膜層224所 組成,該内膜層223鄰接且直接地覆蓋於該彈性座體21與 該焊墊12上;該外膜層224則鍍設鄰接於該内膜層223之 21 1332695 外。同樣地,該表層金屬膜22也非限定以上述兩金屬層為 限,其也可以由單一金屬層,或兩層以上之金屬層構成。 雖然在本實施例中,該表層金屬膜22是完全包覆該彈 性座體21,但此非本發明之必要技術手段,該表層金屬膜 22只需於忒彈性座體21頂面211形成供後續構裝作業之上 階表面225,並且與該焊墊12完成電性連接即可,因此該 表層金屬膜22是否完全包覆該彈性座體21可依設計需要 進行選擇。 依上所述,本實施例所揭露之型態同樣地能藉由形成 各該於上述表層金屬膜22鄰接於該焊墊12之凹槽220,使 該彈性凸塊2之上述表層金屬膜22在位於該焊墊12上形 成與上述表層金屬膜22厚度相同之粗糙度,從而可在該焊 墊12位置上進行測試,並避免發生滑針現象。 惟以上所述者,僅為本發明之三較佳實施例而已,當 不旎以此限定本發明實施之範圍,即大凡依本發明申請專 利範圍及發明說明書内容所作之簡單的等效變化與修飾, 皆應仍屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1是一般彈性凸塊之一剖面示意圖,說明一探針觸 壓於一彈性凸塊上; 圖2疋本發明具有低階粗縫面之彈性凸塊及i製作方 法之第一較佳實施例的一平面俯視圖,說明多數彈性凸 設置於一基板上; 圖3是上述第一較佳實施例之一局部剖面圖,說明本 22 1332695 發明彈性凸塊之組成; 圖4是上述第一較佳實施例之一局部平面圖,說明上 述彈性凸塊之低階粗糙面的一態樣; *圖5是上述第一較佳實施例之一局部平面圖說明另 一態樣之彈性凸塊之低階粗糙面另一態樣; 圖6是上述第一較佳實施例之另一態樣的局部剖面圖 ,說明本發明彈性凸塊上所形成之另一型態之凹槽;As shown in Fig. 6, each of the grooves 22Q becomes a blind hole, but the effect of reducing the degree of surface milk generation of the present invention can still be attained. "X" is a detailed description of the above-described elastic bump 2 having a low-order rough surface. The method includes the following steps: Step 500' is as shown in FIG. The pad η and the substrate 1 of the protective layer 13. Step 502 ' As shown in FIG. 9, a photomask 31 having a two-dimensional projection pattern 31 of the above-mentioned elastic body n FIG. 3) is prepared. Step 5〇4, The base 1 is coated with a photosensitive material layer 20, and in the present embodiment, the positive photosensitive polyaracine is disposed in the pad 12 and the protective layer 13 in a spin coating manner. Step 506, the two-dimensional shadow pattern 310 of the reticle 31 is transferred to the photosensitive material layer 2 以 in an exposure manner, and in the 匕 step, the two-dimensional projection pattern 〇 The surface of each of the pads 12 exposed outside the protective layer 13 is not completely covered. Step 508, as shown in FIG. 1A, a part of the photosensitive material layer 20 (see FIG. 9) is removed by a developing method. In the present embodiment, the elastic seat 21 is an organic solvent to remove the unexposed portion of the polyamidamine; of course, For example, an aqueous solution of an organic alkali or the like can also be used in the step of the present invention. Since the two-dimensional projection pattern 31〇 (see FIG. 9) in step 506 does not entirely cover the surface exposed by each of the pads 12, it is apparent that The formed elastic seat 21 will not completely shield the pad 12. The above steps to step 508 are one of the many ways of forming the above-mentioned elastic seat 21 on the mysterious substrate 1, especially when The material of the elastic seat body 21 is a photosensitive material, but it is not limited thereto. Especially when the material of the elastic seat body 21 is non-photosensitive material, the elastic seat body 21 can also adopt other materials. Conventional lithography (etching) or printing (printing) process is completed, step 510, as shown in Figure π, with the splashing technique on the elastic body 21 and not The inner film layer 223 having a uniform thickness is formed on the region of the solder pad 12 covered by the elastic body 21; since the inner film layer 223 is directly adjacent to the solder bump 12, the inner film layer 223 and the solder pad 12 are also disposed. Electrical connection 15 1332695 Step 512, with sputtering The outer film layer 224 is formed on the inner film layer 223. The foregoing step 510 and step 512 are formed on the elastic seat body 21 and the solder pad 12 to form an inner film layer 223 and the outer layer comprising the above two different materials. a film 224, and a method of surface metal layer 229 electrically connected to the pad 12, therefore, if the surface metal layer 229 is composed of a single film layer (not shown), only one is needed here. The surface metal layer 229 can be formed in a single step. Therefore, it is conceivable for those skilled in the art that if the number of layers constituting the surface gold layer 229 is large, the corresponding steps will be increased. Similarly, although in the embodiment, the inner film layer 223 and the outer film layer 224 are formed by sputtering, it is not limited thereto; regardless of the surface metal layer 229 formed, the single film layer structure is Or a multi-layer film structure, which can be formed according to the characteristics of the selected metal material, and adopts other kinds of physical vapor deposition technology (pvD) processes such as evaporation. Can also be applied to this Invention to form the surface of the metal layer 229. Step 514, as shown in FIG. 12, a photoresist 4 is applied over the surface metal layer 229. Step 516, as shown in FIG. 4 and FIG. 12, using a mask 32 covering the elastic body 21 and the pad 12, and the two-dimensional projection pattern 320 having the groove (4), the two-dimensional image is exposed by exposure. The projection image is transferred to the photoresist 4_±^. The two-dimensional pattern of the mask 32 with respect to the groove 22 is projected onto the corresponding portion of the photoresist 4, and the surface metal layer 229 is adjacent to the 16 1332695. Section of 12. The two-dimensional projection pattern 320 referred to herein, which covers the two-dimensional projection of the elastic seat body 21 and the solder pad 12, refers to a range in which the surface metal layer 229 is to be retained, that is, at least the top surface of the elastic seat body 21 is included. 211, a region of the cymbal pad 12 not covered by the elastic seat body 21, and a connection range between the top surface 211 and the region of the pad 12 not covered by the elastic seat body 〇, step 518, moving in a developing manner Except for a portion of the photoresist 4, the elastic body 21, the region where the pad 12 is not shielded by the elastic body 21, and the region between the top surface 211 and the pad 12 not covered by the elastic body 21 The wiring range, and the two-dimensional projection pattern 32 of the above groove 22 is defined on the surface metal layer 229, as shown in FIG. The steps 514 to 518 are defined by the lithography technique on the surface metal layer 229, the range of the elastic seat 21, the range of the solder pad 12, the range between the elastic body 21 and the bonding pad 12, and the above. The range of the groove 220 is. Step 520, as shown in FIG. 13, removing the surface not located in the range of the elastic body 21, not in the range of the pad 12, not located between the elastic body 21 and the pad 12 by etching. a metal layer 229, and a portion of the surface metal layer 229 adjacent to the portion of the pad 12 at the location of the recess 220 (see 胄3); to define the extension from the elastic body 21 to the pad 12 The surface metal film 22 is formed and the above-described groove 220 is formed (see Fig. 3). In this embodiment, the surface metal layer 229 has the inner film layer 223 made of the titanium-tungsten blend 17 1332695 cast metal and the outer layer of the gold, so in this step, the photoresist is used first. 4 (See Figure 13) is the silver engraved barrier, using Cheng (5) and moth repellent (KI) solution for the engraved liquid to engrave the outer film layer 224 • Then to protect the outer layer 224 as a (four) barrier, select The hydrogen peroxide (Η2〇2) solution is engraved with the inscription layer 223. ▲Step 522, removing the remaining photoresist 4 (see FIG. (1), completing the elastic bump 2 having a low-order rough surface. From the above, steps 514 to 522 are synchronously formed as shown in FIG. The concave metal film 22 of the above-mentioned elastic bump 2 is formed by the concave surface of the above-mentioned elastic bump 2, so that the present invention has a low-lying rough surface and has no need to add any Steps: When the photomask 32 having the two-dimensional projection pattern 32 of the elastic convex & 2 is produced, the two-dimensional projection of the groove 22〇 is simultaneously formed in the two-dimensional projection pattern 32〇, When the elastic seat 21 is extended to the surface metal film 22 of the pad ,, the grooves 22 are formed in synchronization. Since the depth of each of the grooves 220 is equal to the thickness of the surface metal film 22, it is equivalent to 疋The surface metal film 22 having a roughness equal to its own thickness is formed on a region of the bonding pad 12 that is not shielded by the elastic body 21. Thus, the position of the spacer 12 is not blocked by the elastic body 21. Test on it' and avoid slipping As shown in FIG. 14, the second preferred embodiment of the elastic bump 2 having the low-order rough surface of the present invention and the manufacturing method thereof is substantially the same as the first preferred embodiment described above, and the difference lies in the present embodiment. The elastic seat body 21 is completely formed in a range in which the solder pad 12 is exposed outside the protective layer 13 and each of the 18 1332695 recesses 220 has a shape extending from the low-order surface 222 to the contact surface 22 In addition, another difference from the first preferred embodiment is that, in the embodiment, the elastic bump 2 is formed by defining the surface metal film 22 first. The groove 220 is formed on the surface metal film 22. Another method for fabricating the elastic bump 2 of the present invention is described in detail below. Referring to FIG. 15, the steps include: Step 600, as shown in FIG. The solder pad 12 and the substrate 1 of the protective layer 13. Λ Step 602, the elastic body 21 is formed on the solder pad 12; in the embodiment, the elastic body 21 is completely located on the solder pad 12 The surface of the protective layer 13 is outside the surface 121, and the elastic seat The area of the bottom portion adjacent to the pad 12 is smaller than the area of the surface 121 of the pad 12; since the pad 12 is not completely shielded by the elastic body 21, a portion of the surface 121 of the pad 12 is exposed. Step 604, such as As shown in FIG. 17, a surface metal layer 229 electrically connected to the pad 12 is formed on the elastic body 21. In the embodiment, the surface metal layer 229 similarly includes an inner film layer 223 and an outer layer. The film layer 224. Step 606, as shown in FIG. 18, defines a range of the solder pads 12 including the elastic body 21 on the surface metal layer 229 by using a photoresist 4 on the surface metal layer 229 by using a lithography technique. Step 608, removing the portion of the surface metal layer 229 that is not located in the range of the pad 2 as shown in FIG. 19 by an etching technique to define the surface layer 22 of the above-mentioned 19 1332695. The range defined herein is relatively simple with respect to the first preferred embodiment described above, because the elastic seat 21 is completely located within the range of the pad 12, thereby defining the surface metal film 22 in the range of the pad 12, The top surface 211 including the elastic seat body 21, the area where the solder pad 12 is not shielded by the elastic seat body 21, and the top surface 2 ι to the solder pad 12 can be defined by the elastic seat body 21. The surface metal film 22 described above is connected to the range. Step 610, as shown in FIG. 20, using a lithography technique to define a range 2240 of the recess 22 (see FIG. 14) on the outer film layer 224 of the surface metal film 22 by a photoresist 4; The range 2240 of the recess 22 is a corresponding portion of the surface metal film 22 adjoining the pad 12, and as shown in FIG. 14, the surface layer located in the range of the groove 220 is removed by etching. The metal film 22 is formed to form the above-described groove 220. According to the above description, the manufacturing method disclosed in the embodiment can form the grooves 220 on the section of the surface metal film 22 adjacent to the bonding pad 12, and the depth of each of the grooves 22 is equal to the above. The thickness of the outer film layer 224 is such that the surface metal film 22 of the elastic bump 2 is formed to have the same thickness as the outer film layer 224 in a region where the solder pad 12 is not shielded by the elastic body 21. The roughness can be tested at a position where the pad 12 is not shielded by the elastic seat 21, and the slip phenomenon is avoided. As shown in FIG. 21, the third preferred embodiment of the present invention is substantially the same as the above two preferred embodiments, except that in the present embodiment, the elastic body 21 is completely formed on the protective layer 13. The shape of each of the pads 220 is the same as that of the above-described first embodiment, and is a through hole penetrating the surface metal film 22. In the present embodiment, the substrate 1 also has a circuit layer 11, a plurality of solder pads 12 which are raised/formed on the circuit layer 11, and a protective layer 13 formed on the remaining portion of the circuit layer 11. The elastic projection 2 has an elastic seat body 21 disposed on the protective layer 13, and a surface metal film 22 covering the elastic seat body 2 and the mattress 12. The elastic seat η is away from the pad η and does not cover the pad 12 at all, and has a distance from the substrate (the top surface 2 ι the surface metal film 22 covers the top surface 211 of the elastic body 21 and The elastic seat body 21 is covered, and also extends to the solder pad 12 to cover and adjacent to the solder bump 12 exposed on the outer surface of the protective layer 13, and is electrically connected to the solder bump 12. The surface metal The film 22 has a contact surface 221 adjacent to the surface 121 of the solder pad 12, a low-order surface 222 opposite to the contact surface 22, and a plurality of grooves 220 extending from the low-order surface 222 toward the contact surface 221; In this embodiment, each of the grooves 220 extends from the lower-order surface 222 to the contact surface 221 and is a through hole penetrating the surface metal film u. As can be seen from the above embodiments, each of the grooves 22 can also be Forming a blind hole or a channel. The surface metal film 22 is composed of an inner film layer 223 and an outer film layer 224, and the inner film layer 223 is adjacent to and directly covers the elastic body 21 and the solder The outer film layer 224 is plated adjacent to the inner film layer 223 21 1332695. Similarly, The surface metal film 22 is not limited to the above two metal layers, and may be composed of a single metal layer or two or more metal layers. Although in the present embodiment, the surface metal film 22 is completely covered. The elastic seat body 21, but this is not a necessary technical means of the present invention, the surface layer metal film 22 only needs to be formed on the top surface 211 of the elastic body 21 for the subsequent assembly work, and is completed with the pad 12 Electrical connection is sufficient, so whether the surface metal film 22 completely covers the elastic seat 21 can be selected according to design requirements. According to the above, the form disclosed in this embodiment can also be formed by The surface metal film 22 is adjacent to the recess 220 of the solder pad 12, so that the surface metal film 22 of the elastic bump 2 has a roughness equal to the thickness of the surface metal film 22 on the solder pad 12, thereby The test is performed at the position of the pad 12, and the slippery phenomenon is avoided. However, the above description is only the third preferred embodiment of the present invention, and the scope of the present invention is not limited thereto. Patent application The simple equivalent changes and modifications made in the contents of the specification of the invention are still within the scope of the patent of the present invention. [Simplified illustration of the drawing] FIG. 1 is a schematic cross-sectional view of a general elastic bump, illustrating a probe touch Figure 2 is a top plan view of a first preferred embodiment of the present invention having a low-order rough surface and an elastic projection of the first embodiment, illustrating that a plurality of elastic projections are disposed on a substrate; 3 is a partial cross-sectional view of the first preferred embodiment of the present invention, illustrating the composition of the elastic bump of the present invention; FIG. 4 is a partial plan view of the first preferred embodiment, illustrating the low-order roughness of the elastic bump. FIG. 5 is a partial plan view of a first preferred embodiment of the present invention, showing another aspect of the lower-order rough surface of another embodiment of the elastic bump; FIG. 6 is the first preferred embodiment described above. Another partial cross-sectional view showing another type of groove formed on the elastic bump of the present invention;

圖7是上述第一較佳實施例之一流程圖,說明製作上 述彈性凸塊之步驟;Figure 7 is a flow chart of the first preferred embodiment, illustrating the steps of fabricating the above-mentioned elastic bumps;

圖8是上述第一較佳實施例 句部剖面圖,說明 基板之組成; 圖9是上述第一較佳實施例之一局部剖面圖 述基板上塗佈一感光材料層; 、圖10是上述第一較佳實施例之一局部剖面圖 述感光材料形成一彈性座體; 圖11是上述第一較佳實施例之一局部剖面圖 述彈性座體上形成一表面金屬層; 圖12是上述第一較佳實施例之一局部剖面圖 述表面金屬層上塗佈一光阻劑; 述』二是上述第一較佳實施例之一局部剖面圖,說明上 ,L 劑疋義出彈性凸塊及凹槽所在範圍; 法之二發明具有低階粗糙面之彈性凸塊及其製作方 一較佳A施例的一局部J 塊之組成; _說明本發明彈性凸 說明上 說明 說明上 說明上 23Figure 8 is a cross-sectional view of the first preferred embodiment of the example, illustrating the composition of the substrate; Figure 9 is a partial cross-sectional view of the first preferred embodiment of the substrate coated with a layer of photosensitive material; FIG. 11 is a partial cross-sectional view showing a surface metal layer formed on the elastic seat body in a partial cross-sectional view of the first preferred embodiment; FIG. A partial cross-sectional view of a preferred embodiment is coated with a photoresist on the surface metal layer; and the second is a partial cross-sectional view of the first preferred embodiment, illustrating that the L agent is a flexible bump. And the range of the groove; the second method of the invention comprises the elastic bump of the low-order rough surface and the composition of a partial J block of the preferred embodiment A; _ illustrating the elastic convex description of the present invention twenty three

圖15疋上述第二較佳實施例之一流 述彈性凸塊之步驟; 秩圖,說明製作上 -基上述第二較佳實施例之-局部剖面圖 |扳上形成—彈性座體; 圖^是上述第二較佳實施例之一局部 述彈性座體上形成-表面金制; 圖 光祖Π是上述第二較佳實施例之—局部剖面圖 先叙義出上述彈性凸塊所在範圍; 2 19是上述第二較佳實施例之—局部剖面圖 上述表面金屬層界定出一表層金屬膜; 圖20是上述第二較佳實施例之一局部剖面圖 光阻劑定義出多數凹槽所在範圍;及 圖21是本發明具有低階粗輕面之彈性凸塊之第三較佳 實施例的-局部剖面圖,說明本發明彈性凸塊之組成。 說明於 說明上 說明 s兒明於 說明 24 1332695 【主要元件符號說明】 1…… …·基板 223 ·· ••…内膜層 11 ·.··. …·電路層 224 ·· .....外膜層 12····. •…焊墊 2240· ••…範圍 121 ··· —表面 225 ·· ••…上階表面 13··..· …·保護層 229 ·· .....表面金屬層 2…… •…彈性凸塊 31…· •…光罩 20··.·· •…感光材料層 310 ·. ••…二維投影圖形 21 •…彈性座體 32…·. ••…光罩 211… •…頂面 320… …··二維投影圖形 22··..· —表層金屬膜 4…… ••…光阻劑 220… •…凹槽 500〜 522步驟 221 ··· •…接觸面 600〜 612步驟 222… •…低階表面Figure 15 is a step of describing the elastic bumps in one of the above second preferred embodiments; a rank diagram illustrating a partial cross-sectional view of the second preferred embodiment of the above-described second preferred embodiment; The surface of the elastic body of the second preferred embodiment is formed on the surface of the elastic body. The surface of the second embodiment is a partial cross-sectional view of the second preferred embodiment. 2 19 is a partial cross-sectional view of the second preferred embodiment, wherein the surface metal layer defines a surface metal film; FIG. 20 is a partial cross-sectional view of the second preferred embodiment of the photoresist defining a plurality of grooves. And FIG. 21 is a partial cross-sectional view showing a third preferred embodiment of the elastic bump of the present invention having a low-order rough light surface, illustrating the composition of the elastic bump of the present invention. Descriptions are explained in the description. Illustrated in the description 24 1332695 [Description of main component symbols] 1...... .... Substrate 223 ·· ••...Inner film layer 11 ····. ...·Circuit layer 224 ··. Outer film layer 12····.•...pad 2240· ••...range 121 ··· —surface 225 ·· ••...upper surface surface 13·······protective layer 229 ·· .. ...surface metal layer 2... •...elastic bump 31...·......mask 20······...photosensitive material layer 310 ·. ••...two-dimensional projection pattern 21 •...elastic body 32... ·••... reticle 211... •... top surface 320... 2D projection pattern 22·····-surface metal film 4... ••... photoresist 220... •...grooves 500~ 522 Step 221 ··· •... Contact surface 600~ 612 Step 222... •...Low order surface

2525

Claims (1)

十、申請專利範圍: h 一種具有低階粗糙面之彈性凸塊,是設置於一具有一焊 塾的基板上,該彈性凸塊具有一位於該基板上之彈性座 體,以及一覆蓋於該彈性座體頂面並鄰接該焊墊表面之 表層金屬膜,該表層金屬膜具有一鄰接該焊墊表面之接 觸面以及一相反於該接觸面之低階表面;其特徵在於: 該表層金屬膜形成有多數由該低階表面朝該接觸面 方向延伸之凹槽。 2.依據申請專利範圍第丨項所述的具有低階粗,面之彈性 凸塊,其中,各該凹槽為一盲孔。 、 3:依據申請專利範圍第丨項所述的具有低階粗糙面之彈性 凸塊,其中,各該凹槽延伸至該接觸面而為一貫穿該表 層金屬膜之穿孔。 4·依據申請專利範圍第i項所述的具有低階粗糙面之彈性 凸塊,其中,各該凹槽為一沿平行該焊墊表面之水平方 向延伸的槽道。 5. 依據申μ專利範圍第丨項所述的具有低階粗糖面之彈性 凸塊,其中,該彈性座體位於該焊塾上且不完全遮蔽該 焊墊。 6. 依據申請專利範圍第丨項所述的具有低階粗糙面之彈性 凸塊’其t ’該彈性座體形成於該焊塾上,且該彈性座 體鄰接於該焊墊之底#, 坪蝥之底°卩面積小於該焊墊之表面積。 7. 依據申請專利範圍第1項 斤述的具有低階粗糙面之彈性 凸塊’其十,該基板具 保濩層,該彈性座體形成於 26 1332695 該保護層上。 8. 依據申請專利範圍第1項所述的具有低階粗糙面之彈性 凸塊’其t,該彈性座體之材質是一感光材料。 9. 依據中請專利範圍第i項所述的具有低階㈣面之彈性 凸塊”中該彈性座體之材質是聚亞醯胺、苯環丁烯 、聚丙烯酸酯、橡膠,以及矽膠其中之一。 H).依射請專利範圍第1項所述的具有低階粗糙面之彈性 凸塊’其中,該表層金屬膜之材質是選自於由下列所構 成之-群組,該群組包含金、銀'鉻、欽、鶴、铭、銅 ’以及其等之組合。 11_依據巾請專利範@第丨項所述的具有低階祕面之彈性 凸塊,其中,該表層金屬膜具有一鄰接該焊墊之内膜層 ’以及一鄰接該内膜層之外膜層。 U.依射請專㈣圍第u項所述的具有低階⑽面之彈性 凸塊’其中,該内膜層之材質是選自於由下列所構成之 一群組,該群組包含鉻、鈦、鎢、鋁、銅,以及其等之 組合。 13. 依據申請專利範圍第u項所述的具有低階粗糙面之彈性 凸塊,其中,該外膜層之材質是選自於由下列所構成之 一群組,該群組包含金、銅、銀,以及其等之組合。 14. 一種具有低階粗糙面之彈性凸塊的製作方法,包含下列 步驟: a) 於一具有一焊墊之基板上形成一彈性座體; b) 於該彈性座體及該焊墊上形成一表面金屬層;及 27 1332695 c)移除部份該表面金屬層鄰接該焊墊之區段以形成 多數凹槽。 15’依據中明專利範圍第14所述的具有低階粗链面之彈性凸 塊的製作方法’其中,該步驟a)是將該彈性座體形成於 °亥焊墊上且不完全遮蔽該焊墊。 據申》«專利範圍第丨4所述的具有低階粗链面之彈性凸 塊的製作方法’其中’該步驟a)是將該彈性座體形成於 該焊墊上且該彈性座體鄰接於該焊塾之底部面積小於該 焊墊之表面積。 17.依據中請專利範圍第14項所述的具有低階祕面之彈性 凸塊的製作方法’其t ’該步驟是以微影技術及印刷 技術其中之一製程完成。 依據申明專利範圍第14項所述的具有低階粗縫面之彈性 鬼的製作方法,其中,該步驟a)包含下列步驟: a-l)製備-具有上述彈性座體二維投影圖形之光罩X. Patent application scope: h An elastic bump having a low-order rough surface is disposed on a substrate having a solder bump, the elastic bump having an elastic seat on the substrate, and a cover a top surface of the elastic body adjacent to the surface metal film of the surface of the pad, the surface metal film having a contact surface adjacent to the surface of the pad and a low-order surface opposite to the contact surface; wherein: the surface metal film A plurality of grooves extending from the lower-order surface toward the contact surface are formed. 2. The elastic bump having a low-order thick surface according to the scope of the patent application, wherein each of the grooves is a blind hole. 3: The elastic bump having a low-order rough surface according to the scope of the patent application, wherein each of the grooves extends to the contact surface and is a through hole penetrating the metal film of the surface layer. 4. The elastic bump having a low-order rough surface according to claim i, wherein each of the grooves is a channel extending in a horizontal direction parallel to the surface of the pad. 5. The elastic bump having a low-order coarse sugar surface according to the invention of claim 5, wherein the elastic seat is located on the soldering iron and does not completely shield the solder pad. 6. The elastic bump having a low-order rough surface as described in the scope of the patent application, wherein the elastic seat is formed on the welding pad, and the elastic seat is adjacent to the bottom # of the bonding pad, The bottom of the raft is less than the surface area of the pad. 7. According to the scope of claim 1, the elastic bump having a low-order rough surface is described. The substrate has a protective layer formed on the protective layer of 26 1332695. 8. The elastic bump having a low-order rough surface as described in claim 1 of the invention, wherein the material of the elastic seat is a photosensitive material. 9. The material of the elastic seat in the elastic bump having a low-order (four) face according to the item i of the patent application is poly-liminamide, benzocyclobutene, polyacrylate, rubber, and silicone. H). The elastic bump having a low-order rough surface according to the first aspect of the patent scope, wherein the material of the surface metal film is selected from the group consisting of: The group includes a combination of gold, silver 'chromium, chin, crane, Ming, copper' and the like. 11_According to the towel, the elastic bump having a low-order secret surface as described in the patent specification, the surface layer, wherein the surface layer The metal film has an inner film layer adjacent to the solder pad and a film layer adjacent to the inner film layer. U., according to the fourth item, the elastic bump having a low-order (10) surface, as described in item (i) The material of the inner film layer is selected from the group consisting of chromium, titanium, tungsten, aluminum, copper, and the like. 13. According to the scope of claim U The elastic bump having a low-order rough surface, wherein the material of the outer film layer is selected from the following a group comprising gold, copper, silver, and the like. 14. A method for fabricating a resilient bump having a low-order rough surface, comprising the steps of: a) having a pad Forming an elastic seat on the substrate; b) forming a surface metal layer on the elastic body and the pad; and 27 1332695 c) removing a portion of the surface metal layer adjacent to the pad to form a plurality of grooves 15' The method for fabricating an elastic bump having a low-order thick chain surface according to the fourth aspect of the invention, wherein the step a) is to form the elastic seat on the silicon pad and not completely shield the The manufacturing method of the elastic bump having the low-order thick chain surface described in the fourth paragraph of the patent, wherein the step a) is to form the elastic seat on the solder pad and the elastic seat The bottom surface of the body adjacent to the solder fillet is smaller than the surface area of the solder pad. 17. The method for fabricating an elastic bump having a low-order secret surface as described in claim 14 of the patent scope is 't' One of the film technology and printing technology is completed According to claim 14, the method for manufacturing an elastic ghost having a low-order rough surface according to claim 14, wherein the step a) comprises the following steps: a-l) preparing a reticle having the two-dimensional projection pattern of the elastic seat described above a_2)於該基板上塗佈—感光材料層; a 3)以曝光方式將該光罩上之該彈性座體二維投影 圖形傳遞至該感光材料層上;及 a_4)以顯影方式形成該彈性座體。 19·依據申請專利範圍第 凸塊的製作方法,其 術之製程完成。 2 0.依據申請專利範圍第 14項所述的具有低階粗縫面之彈性 中,該步驟· b)是以物理氣相沉積技 19項所述的具有低階粗趟面之彈性 28 1332695 凸塊的製作方法’其中,該步驟b)是以濺鍍技術及蒸鍍 技術其中之一製程完成。 21. 依據申請專利範圍第丨4項所述的具有低階粗糙面之彈性 凸塊的製作方法’其中,該步驟b)包含下列步驟: b-Ι)於該彈性座體及該焊墊上形成一内膜層;及 b-2)於該内膜層上形成一外膜層。 22. 依據申請專利範圍第j4項所述的具有低階粗趟面之彈性 凸塊的製作方法’其中,該步驟幻包含下列步驟: c-1)以微影技術於該表面金屬層定義出該等凹槽所 在範圍;及 c-2)以蝕刻技術移除位於該等凹槽所在範圍之部分 該表面金屬層。 23. 依據申清專利範圍第μ項所述的具有低階粗糖面之彈性 凸塊的製作方法’其中,該步驟c)更同步地移除部分該 表面金屬層以界定出自該彈性座體延伸至該焊墊之該表 層金屬膜。 24. 依據申請專利範圍第23項所述的具有低階粗糙面之彈性 凸塊的製作方法,其中,該步驟勹包含下列步驟: c-l)以微影技術於該表面金屬層定義出該彈性座體 所在範圍、該焊墊所在範圍、該彈性座體至該焊墊間之 範圍’以及該等凹槽所在範圍;及 c-2)以蝕刻技術移除非位於該彈性座體所在範圍、 非位於該焊墊所在範圍、非位於該彈性座體至該焊墊間 之部分的該表面金屬層,以及位於該等凹槽所在範圍之 29 1332695 部分該表面金屬層。 25.依據申睛專利範圍第14項所述的具有低階粗糙面之彈性 凸塊的製作方法,更包含於該步驟b)及步驟c)間之下列 步驟: d)移除部分該表面金屬層以界定出自該彈性座體延 伸至該焊墊之該表層金屬膜。 26.依據申請專利範圍帛25項所述的具有低階粗糙面之彈性 凸塊的製作方法中’該步驟d)包含下列步驟. d_l)以微影技術於該表面金屬層定義出該彈性座體 所在範圍、該焊墊所在範圍’以及該彈性座體至該焊墊 間之範圍;及 d-2)以姓刻㈣移除非位於該肖性座體所在範圍、 非位於該焊㈣在範圍’以及非位於該彈性座體至該焊 墊間之部分的該表面金屬層。 30A_2) coating a photosensitive material layer on the substrate; a3) transferring the two-dimensional projection pattern of the elastic seat on the photomask to the photosensitive material layer by exposure; and a_4) forming the elasticity by developing Seat. 19. The manufacturing process is completed according to the manufacturing method of the bumps in the patent application scope. 2 0. According to the elasticity of the low-order rough surface described in Item 14 of the patent application, the step b) is the elasticity 28 1332695 having the low-order rough surface described in the physical vapor deposition technique 19 item. The method of manufacturing the bumps, wherein the step b) is completed by one of a sputtering technique and an evaporation technique. 21. The method according to claim 4, wherein the step b) comprises the following steps: b-Ι) forming on the elastic body and the bonding pad. An inner film layer; and b-2) forming an outer film layer on the inner film layer. 22. The method for fabricating an elastic bump having a low-order rough surface according to the scope of claim j4, wherein the step comprises the following steps: c-1) defining the surface metal layer by lithography The range of the grooves; and c-2) removing the surface metal layer in a portion of the range of the grooves by etching. 23. The method of fabricating an elastic bump having a low-order coarse sugar surface according to the scope of the patent application, wherein the step c) removes a portion of the surface metal layer more synchronously to define an extension from the elastic body. To the surface metal film of the pad. 24. The method of fabricating an elastic bump having a low-order rough surface according to claim 23, wherein the step 勹 comprises the steps of: cl) defining the elastic seat on the surface metal layer by lithography; The range of the body, the range of the pad, the range between the elastic body and the pad, and the range of the grooves; and c-2) are removed by etching techniques not in the range of the elastic body, The surface metal layer is located in the range of the solder pad, not in the portion between the elastic body and the solder pad, and the surface metal layer is located in a portion of the range of the recesses 29 1332695. 25. The method for fabricating an elastic bump having a low-order rough surface according to claim 14 of the claim is further included in the following steps between the step b) and the step c): d) removing part of the surface metal The layer defines a surface metal film extending from the elastic body to the bonding pad. 26. In the method for fabricating an elastic bump having a low-order rough surface according to claim 25, the step d) comprises the following steps: d_l) defining the elastic seat on the surface metal layer by lithography The range of the body, the range of the pad and the range between the elastic body and the pad; and d-2) the removal of the surname (4) is not located in the range of the symmetrical body, not located in the welding (four) The range 'and the surface metal layer not located between the resilient body and the pad. 30
TW095141109A 2006-11-07 2006-11-07 Compliant bump having low-level rough surface and its manufacturing method TW200822328A (en)

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