TW531878B - Bar circuit for an integrated circuit - Google Patents
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- TW531878B TW531878B TW91100284A TW91100284A TW531878B TW 531878 B TW531878 B TW 531878B TW 91100284 A TW91100284 A TW 91100284A TW 91100284 A TW91100284 A TW 91100284A TW 531878 B TW531878 B TW 531878B
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Abstract
Description
531878531878
5 -1發明領域·· .本發明係有關於積體電路之阻斷電路(ba]: CU 11 ),特別疋有關於晶片i電感器電路的阻斷電路 5-2發明背景: =體電路元件朝縮小尺寸方面設計肖,將不同各種 二:二體電路晶圓的要求也隨之增力”舉例來 。,若=尸已經成為高佔有率的消費性產品 紝果產生〇口敕人思—赫玆(1~2 GHz)頻率的範圍間操作; 、:要求,::1頁前端電路至高產能之矽積體電路製程 電路晶圓。缺而,以頻4功此組合至同一積體 之f 有5品質係數(high_my fact〇rs, 、1 仍有右干窒礙難行的問題需克服。 人們在矽積 行許多的努力, 製程技術產生如 電感器的流失。 frequency)時, 所皆知的事。在 藉助於連接至石夕5 -1 Field of Invention ... The present invention relates to a blocking circuit (ba): CU 11 of an integrated circuit, and particularly to a blocking circuit of a chip i inductor circuit. 5-2 Background of the Invention: = Body Circuit The components are designed to reduce the size, and the requirements of different types of two- and two-body circuit wafers are also increased. "For example, if the corpse has become a high-occupancy consumer product, the result is 0. —Hertz (1 ~ 2 GHz) frequency range operation; : Requirement: : 1 page front-end circuit to high-capacity silicon integrated circuit process circuit wafer. In the absence, the frequency is combined to the same integrated circuit with 4 power f has 5 quality factors (high_my fact0rs, 1, there are still problems with right stems that are difficult to be overcome. People have made a lot of efforts in silicon, and process technology produces losses such as inductors. Frequency), everyone knows Thing. In the connection to Shi Xi
體電路技術中整合高品質係數電感器上進 但至多只有3 - 8不等的品質係數;利用矽 此的問題,部分是因為矽底材的電導造成 田頻率接近自諧振頻率(sel f _res〇nant 電感(inductance)值會隨之降低,這是眾 導電性矽底材中所流失的電感器,是可以 底材的雜散電容具有相對較大值與導體而In the bulk circuit technology, high quality coefficient inductors are integrated but have a quality coefficient ranging from 3 to 8 at most; the problem of using silicon is partly because the field frequency of the silicon substrate causes the field frequency to approach the self-resonant frequency (sel f _res. The nant inductance value will decrease accordingly. This is the inductor lost in the conductive silicon substrate. The stray capacitance of the substrate can have a relatively large value and the conductor.
531878531878
增加。 因此,努力的方向有,提供在矽製程枯化+ 3出-凹槽,將由氧化物包圍、螺旋形式Π感;” 的j:電感器。上述做法的優點是,這些被氧化 電感器被大量的絕緣結構與金屬層隔開,: 。但無論如何,對於CM0S製 遢離夕底 構而言,實在是過剩了。 叉仃中/、而2至4層級的結 如第一圖所示,為整體模式9m〇n〇l 電感? (。n —CMP indUCt〇r)的-般電路模 本徵電感器(intrinsic inductor)…為寄生;“不 parasitic capacitance);以為晶片上 =合( 容;Cox為晶片上電感器與底材之間的·"益ρ —寄生電 擬渦流電流部分的電阻;Cc)x與Rb皆 =_表示模 晶片上之電感器在操作模式時’“tQ二材;y:失。曰當 改變,進而感應底材中的渦流電流產二產生磁通罝的 身亦視為-能量容器,在底材中愈多“ $ ’點感器本 著愈多的能量流失,相當於品質係數電流產生意味 底材的電感器之串音(cross talk) p牛低。此外,經由 l會發生。 1示 m 環uuard 應 ;然而,電流仍然存在’並且;= ; = =increase. Therefore, the direction of efforts is to provide a silicon substrate withered + 3 out-grooves, which will be surrounded by oxide, in the form of a spiral π; "j: inductors. The advantage of the above approach is that these oxidized inductors are The insulation structure is separated from the metal layer, but: In any case, it is too much for the CM0S system, which is a new year's eve basement structure. Fork and middle, and the 2 to 4 level junctions are shown in the first figure, The overall mode 9m0n0l inductor? (.N —CMP indUCtr)-general circuit mode intrinsic inductor (parasitic inductor) ... is parasitic; "not parasitic capacitance"; thought on the chip = on (capacity; Cox is the resistance between the inductor on the wafer and the substrate. Quot. Yi ρ-the resistance of the parasitic electric pseudo-eddy current part; Material; y: lost. When the change is made, and then the eddy current generated in the substrate is induced, the magnetic flux is generated. The body is also regarded as an energy container. Energy loss, equivalent to the coefficient of quality current producing cross talk of the inductor meaning substrate p cattle low. Also, via l will happen. 1 shows that the m-ring uuard should; however, the current still exists ’and =; = =
第6頁 531878Page 6 531878
^ 方面’金屬遮蔽(metal shield)也可用來減少渴 流電流,但是會犧牲電感器的效能。 5 - 3發明目的及概述: _,上述之發明背景中,本發明主要提供一積體電路 中白:L:電路’此阻斷電路利用增加-半導體底材之阻抗 減y 9效應及減少由積體電路之電感器所感應之渦流電 本發明的另一目的 路。在一半導體底材中 少半導體底材所導致的^ "Metal shield" can also be used to reduce thirst current, but it will sacrifice inductor performance. 5-3 Purpose and summary of the invention: _, In the above background of the invention, the present invention mainly provides an integrated circuit: L: circuit 'This blocking circuit utilizes the increase-the resistance of the semiconductor substrate reduces the y 9 effect and reduces the Eddy currents induced by inductors of integrated circuits are another object of the present invention. Caused by less semiconductor substrate in a semiconductor substrate
在於提供一晶片上電路中的阻斷電 一般長條井下方的長條深井可以減 電磁干擾效應(EMI)。 根據以上所述之目#,本發明提供一種減少積體電路 =日fross talk)與渦流電流(eddy current)之一阻斷電 之一二且其阻斷電路包括:具有-第-導電性 導體一第二導電性之-第-長條井於半 麻好中—,八有第一導電性之一第二長條井於半導體 二:鄰弟;長條井下,,並與第-長條井 糟开y成—連接阻障以阻斷串音與渦流電流。 W1878 五、發明說明(4) 菖本發明 的人士應有所 中,是允許若 法並不僅侷限 來加以說明較 本發明之 。某些尺度與 楚的描述和本 是以具有寬度 楚地瞭解到所 ’其中可能包 在製造實際的 與高度。 :t貫施例詳細描述之時,•悉此領域 發明在不脫離所提出的專利範圍請求 所運用來揭露的結構或方 诖每浐/丨 电砍。。電路而圖示亦是用 只施例,而非加以限縮本發明範圍。 ::體,列的不同部分並沒有依照尺寸緣圖 ς相關尺度相比已經被誇張,以提 电明的理解…卜,雖然 :;月 與深度在不同階段的二維中顯示:;;;; :示的區域只是晶片上電感器電路二部: ::多士在三維空間中排列的元件。相對地: 凡件%,圖示的區域具有三維的長度,寬度 本發明主要的目的在於提供一種減少積體電路 taU)=電流(eddy —"之; ^ ClrCUlt) ’其阻斷電路包括:具有一第一導電性之 :t導體底材;一電感器元件於半導體底材上;具有一第 二=電性之稷數,第=長條井於半導體底材中及電感器元 底鉍:;A具有第二導電性之複數個第二長條井於I ^體 長條井於第-長條井下方,並與第 。目一冑以形成-連接阻障以阻斷串音與渦流電流The purpose is to provide a block of electricity in a circuit on a chip. A long deep well below a generally long well can reduce electromagnetic interference (EMI) effects. According to the above-mentioned purpose #, the present invention provides a reduction of integrated circuits = one day of fross talk and one of eddy current to block electricity, and the blocking circuit includes:-the-conductive conductor One of the second conductivity-the first-long well in a half-nano good-eight have one of the first conductivity. The second long well is in semiconductor two: the neighbor; the long well, and the first long Wells open-Connect barriers to block crosstalk and eddy currents. W1878 V. Description of the invention (4) The person of the present invention should have some understanding. It is permissible if the law is not limited to explain the invention. Some scales and descriptions of Chu are based on having a clear understanding of what ’which may be included in manufacturing actual and height. : t While implementing the detailed description of the examples, understand that the invention in this field does not depart from the scope of the proposed patent to request the structure or method to be disclosed. . Circuits and illustrations are only examples, not limiting the scope of the invention. :: body, the different parts of the column have not been exaggerated according to the size of the edge map, and related scales, to improve the understanding of the light ... buh, though: ;; the month and depth are displayed in two dimensions at different stages: ;;;; ;: The area shown is just the two inductor circuits on the chip: :: Toast is an element arranged in a three-dimensional space. Relatively: For the%, the illustrated area has a three-dimensional length and width. The main purpose of the present invention is to provide a reduced integrated circuit taU) = current (eddy — "of; ^ ClrCUlt) 'The blocking circuit includes: Has a first conductivity: t-conductor substrate; an inductor element on the semiconductor substrate; has a second = the number of electrical properties, the third = long well in the semiconductor substrate and the inductor element base bismuth :; A has a plurality of second strip wells having a second conductivity at I ^ body strip wells below the -strip strip wells, and the same. At a glance to form-connect barriers to block crosstalk and eddy currents
第8頁 五、發明說明(5) =明實施例將參照下列圖示加以 :=1部分正視示意圖,用以說明根據本發明 上電感器之積體電路的社一 a :月f具有晶片 、 有摻雜或非摻雜石夕、或是鍺箄耸·士上 導體底材12中有若千具技尺疋歸寺4,在半 Λ . t 干長條井14。特別要強調的是,铲此具 條井的排列不限於第二 u長 形式。在半導體底材12 ς τ ^疋任何的安排 形成一平面蟬型電$。。iβ成電層,其經圖案移轉以 听认ΐ 感益16;當然,電感器的幾何形妝亦不 限於圖上所示的形狀。 」咴υ巾狀亦不 H —圖為第二圖以2 _2為切線之部份剖面示音 圖。為間化說明起見,邱八展* 5 丁… 。在半導俨底材”!V 牛亚沒有顯示於圖上 ,车莫雕二/ 上為螺型電感器1 6,在第一個實施例中 ,+導體底材12為P型矽底姑。名主道鰣广^ 〇山、也W Y 414 PH AM ^ , 底材在丰钕體底材K中的長條 、:、,。♦明的關鍵是,在長條井1 4下方、盥長 :井14相鄰處有若干長條深井15 ;長 較、 (juncti〇^^^ I )、/ .長條深井1 5的深度約在半導體底材1 2的表面下 a、 ^米’再者’長條井14可連接至外部高電壓(Vdd)或 疋序接狀態(floating)。 田螺型電感Is 1 6在操作模式下,會產生磁通量的變化 口而在半導體底材1 2中產生渦流電流,由長條深井1 5、 531878 、發明說明(6) ^條井1 4與半導體底材1 2互 IV則可以阻斷此操作中螺型 再者’長條深井1 5的形成可 進而消除經由半導體底材12 發生的可能性。 相配合所形成的P-N-P連接阻 電感器1 6所感應的渦流電流。 以增加半導體底材1 2的阻抗, /罙層區域的串音(cr〇ss taik) 材12 參/ 以 f ^離圖早為本發明結構的第二個實施例。半導體底 一長條p井",長ΪΡ井广在長條井14形成另 或是浮接狀態。” 、了以連接至外部低電壓(Vss) 弟二c圖為本發明的第三 12摻以N型離子,長條 '苑例不思圖。半導體底材 度的P型離子。而在第三:每":長條井14則是摻以不同濃 ,其亦可以阻斷螺型電感"哭,,例中是形成N —p —N連接阻障 串音效應;長條井丨4可^ 7感應的渦流電流,並減少 狀態。 至外部低電壓(Vss)或是浮接Page 8 V. Invention description (5) = The embodiment will be added with reference to the following diagrams: = 1 A schematic diagram of the front view, which is used to explain the integrated circuit of the inductor integrated circuit according to the present invention a: month f has a chip, Doped or non-doped Shi Xi, or germanium on the conductor substrate 12, there are Ruoqianji ruler Guigui Temple 4, in the half Λ. T dry strip well 14. It is particularly emphasized that the arrangement of this stripped well is not limited to the second u-length form. Any arrangement on the semiconductor substrate 12 τ τ ^ forms a flat cicada-type electricity $. . iβ forms an electrical layer, which is transferred to recognize the ΐ benefit 16; of course, the geometric makeup of the inductor is not limited to the shape shown in the figure. "咴 υ is not shaped like a towel. H — The picture is the second section with 2 _2 as a tangent to the cross-sectional audio chart. For the sake of explanation, Qiu Bazhan * 5 Ding ... In the semiconducting substrate "! V Niuya is not shown in the figure, and the Carmo Carving II / is a spiral inductor 16. In the first embodiment, the + conductor substrate 12 is a P-type silicon substrate. 。The name is Dao Guang ^ 〇 mountain, but also WY 414 PH AM ^, the substrate in the neodymium body substrate K strips,: ,,. The key is that under the strip wells 14 Length: There are several long deep wells 15 adjacent to the well 14; long, (juncti〇 ^^ I), /. The depth of the long deep well 15 is about a, ^ m below the surface of the semiconductor substrate 12 Furthermore, the 'long strip well 14' can be connected to an external high voltage (Vdd) or a floating state. The field spiral inductor Is 1 6 will generate a change in magnetic flux in the operation mode, and the semiconductor substrate 1 2 An eddy current is generated. The long deep wells 15 and 531878 and the description of the invention (6) ^ The wells 4 and the semiconductor substrate 12 and the IV can block the formation of the spiral type and the long deep wells 15 in this operation. It can further eliminate the possibility of occurrence through the semiconductor substrate 12. The eddy currents induced by the matched PNP connection resistance inductor 16 are increased to increase the impedance of the semiconductor substrate 12, / Cross-talk (cr0ss taik) in the base layer area 12 reference / f ^ from the figure as early as the second embodiment of the structure of the present invention. The semiconductor bottom of a long p well " Well 14 is in a floating or floating state. "The second picture of the second low-voltage (Vss) connected to the outside is doped with N-type ions in the third twelfth embodiment of the present invention. P-type ion of semiconductor substrate. And in the third: each ": the long well 14 is mixed with different concentrations, which can also block the spiral inductor " cry, in the example is to form the N-p-N connection barrier crosstalk effect; long The wells can reduce the induced eddy current and reduce the state. To external low voltage (Vss) or floating
第二D圖為本發明的第四 材1 2摻以N型離子,長條严 汽施例示意圖。半導體底 濃度的P型離子。長條井^ / 1 5與長條井1 4則是摻以不同 18則可以連接至外部^電1另一長條N井18,長條N井 中的P-N-P連接阻障 與":二d)或是浮 接狀悲。本發明 連接阻障,皆可以阻斷螺型電The second diagram D is a schematic diagram of an embodiment of the fourth material 12 doped with N-type ions and long steam. P-type ions at semiconductor bottom concentration. Long well ^ / 1 5 and long well 1 4 are mixed with 18 and can be connected to the external ^ electricity 1 another long N well 18, PNP connection barriers in long N wells ": d ) Or floating sadness. According to the present invention, the connection barrier can block the spiral type electrical
第10頁 531878 五、發明說明(7). 感器1 6所感應的渴流電流,並減少串音效應。如此,電感 器的能量不會在半導體底材中被消耗掉;再者,本發明結 構可以改善品質係數與降低半導體底材中的雜訊。特別要 強調的是,在沒有增加製程複雜性的優點下,對於射頻與 混合模式的產品也可以利用本發明的長條深井。 本發明提供具有晶片上電感器之積體電路中深井的結 構。長條深井藉由阻斷感應渦流電流與減少經由半導體底 材深層區域的串音效應’來達到改善積體電路之品質係數 的目的,如此,積體電路的整體效能也能隨之增加。 以上所述僅為本發明之較佳實施例而已,並非用以限 定本發明之申請專利範圍;凡其它未脫離本發明所揭示之 精神下所完成之等效改變或修飾,均應包含在下述之申請 專利範圍内。Page 10 531878 V. Description of the invention (7). The thirst current induced by the sensor 16 and reduce the crosstalk effect. In this way, the energy of the inductor will not be consumed in the semiconductor substrate; further, the structure of the present invention can improve the coefficient of quality and reduce the noise in the semiconductor substrate. In particular, it is emphasized that the long deep well of the present invention can also be used for RF and mixed mode products without the advantage of increasing the complexity of the process. The present invention provides a deep well structure in an integrated circuit having an inductor on a chip. The long deep well improves the quality coefficient of the integrated circuit by blocking the induced eddy current and reducing the crosstalk effect through the deep region of the semiconductor substrate. In this way, the overall performance of the integrated circuit can be increased accordingly. The above are merely preferred embodiments of the present invention, and are not intended to limit the scope of patent application for the present invention; all other equivalent changes or modifications made without departing from the spirit disclosed by the present invention shall be included in the following Within the scope of patent application.
第11頁 531878 圖式簡單說明 第一圖為部份等效電路示意圖用以說明先前技術之一 實施例。 第二圖係根據本發明所揭露,為具有晶片上電感器之 積體電路實施例的部分正面結構示意圖。 第三A至三D圖係根據第二圖2 - 2切線之多種結構之剖 面示意圖。 主要部分之代表符號: 12 半導體底材 14 長條井 1 5 長條深井 16 螺型電感器 17 長條P井 18 長條N井Page 531 878 Brief description of diagrams The first diagram is a schematic diagram of some equivalent circuits for explaining one embodiment of the prior art. The second figure is a schematic diagram of a part of the front structure of an embodiment of an integrated circuit having an inductor on a chip according to the present invention. The third A to D diagrams are schematic cross-sectional views of various structures according to the second figure 2-2 tangent line. Main symbols: 12 Semiconductor substrates 14 Long wells 1 5 Long deep wells 16 Spiral inductors 17 Long P wells 18 Long N wells
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TW91100284A TW531878B (en) | 2002-01-11 | 2002-01-11 | Bar circuit for an integrated circuit |
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TW91100284A TW531878B (en) | 2002-01-11 | 2002-01-11 | Bar circuit for an integrated circuit |
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