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TW523092U - Improved testing plate structure of chip testing machine - Google Patents

Improved testing plate structure of chip testing machine

Info

Publication number
TW523092U
TW523092U TW90217703U TW90217703U TW523092U TW 523092 U TW523092 U TW 523092U TW 90217703 U TW90217703 U TW 90217703U TW 90217703 U TW90217703 U TW 90217703U TW 523092 U TW523092 U TW 523092U
Authority
TW
Taiwan
Prior art keywords
plate structure
improved
testing
chip
testing machine
Prior art date
Application number
TW90217703U
Other languages
Chinese (zh)
Inventor
Jing-Lai Lu
Original Assignee
All Ring Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by All Ring Tech Co Ltd filed Critical All Ring Tech Co Ltd
Priority to TW90217703U priority Critical patent/TW523092U/en
Publication of TW523092U publication Critical patent/TW523092U/en

Links

TW90217703U 2001-10-17 2001-10-17 Improved testing plate structure of chip testing machine TW523092U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW90217703U TW523092U (en) 2001-10-17 2001-10-17 Improved testing plate structure of chip testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW90217703U TW523092U (en) 2001-10-17 2001-10-17 Improved testing plate structure of chip testing machine

Publications (1)

Publication Number Publication Date
TW523092U true TW523092U (en) 2003-03-01

Family

ID=28037561

Family Applications (1)

Application Number Title Priority Date Filing Date
TW90217703U TW523092U (en) 2001-10-17 2001-10-17 Improved testing plate structure of chip testing machine

Country Status (1)

Country Link
TW (1) TW523092U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI736454B (en) * 2020-10-23 2021-08-11 美商第一檢測有限公司 Chip test system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI736454B (en) * 2020-10-23 2021-08-11 美商第一檢測有限公司 Chip test system

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MK4K Expiration of patent term of a granted utility model