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TW452718B - Method for integrating automated production capability information - Google Patents

Method for integrating automated production capability information Download PDF

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Publication number
TW452718B
TW452718B TW88120058A TW88120058A TW452718B TW 452718 B TW452718 B TW 452718B TW 88120058 A TW88120058 A TW 88120058A TW 88120058 A TW88120058 A TW 88120058A TW 452718 B TW452718 B TW 452718B
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Taiwan
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test
test time
data
patent application
scope
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TW88120058A
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Chinese (zh)
Inventor
Ming-Shiou Shie
Fu-Kang Lai
Wen-Feng Wu
Yi-Shin Jan
Yau-Dung Liou
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Taiwan Semiconductor Mfg
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Abstract

There is provided a method for integrating automated production capability information, which minimizes the total testing time in a testing plant and provides an integration of production capability information so as to have standardized and automated processing procedures to comprehensively program the testing jobs for various products. It is able to integrate the basic data and procedures of various production departments and also to calculate and monitor the estimated job load at any time, so as to provide a quick query about the testing time of any product thereby feeding message back to different department. After analyzing the statistic data of testing time for a long time, it is able to estimate the standard testing time of old products in a systematized manner, but also to estimate the standard testing time of a new product based on its feature and by analyzing the testing time data in a database.

Description

A7 B7 452718 五、發明說明( 發明領垅: 本發明係關於電腦化排程系統,以系統化分析與評估 一组織運作之方法,特別是關於使測試廠之總測試時間最 小化之方法。 發明背箦: 半導體元件之製造,可分為元件之生產製造與產品之 測試兩大部分/其中產品測試之測試時間,係影黎整體生 產效率之重要因素之一》晶圓廠(Fab)所生產之半導體元 件,需經過產品測試之程序,而影響測試時間之因素包括 不同產品之需求量在多種測試機台中之配置情況、各種測 試機台所負擔之產品需求量、測試機台操作控制程式之設 定、因應不同客戶需求所進行之產品測試、新產品測試方 法之不確定性’以及各部門間之協調工作等,皆會直接或 間接影響產品之總測試時間。 現今*以半導體測試廠而言,生產排程與派工前並沒 有任何一種方法將產能做最佳化配置。生產排程係與測試 機台之特性相關,用以將各種不同類別與特性之產品需求 董’做妥善地分配與規劃°由於有多種不同之待測產品, 例如不同吋別之晶圓、記愧體、積體電路等,其測試時.間 各有所不同,而某些產品僅能在特定之測試機台上測試, 2 本紙張尺度適用t國國家標準<CNS)A4規格(210 X 297公釐) -— — ---111----It --------- (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印數 452718 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明() 且各種測試機台之產能亦不同a同時,不同之測試機台有 不同的性能’且用以控制機台運作的程式也會影響測試時 間,如一種產品可在多種機台上測試,且有CP/FT兩邊同 時測試以及sort 1、sort2測試等,此將使得測試機台之 產能難以估計。再者,許多新產品經常無法知道在哪一種 測試機台上做測試’以及需要多少測試時間,從而增加生 產排程之困難。另一方面,不同測試廠之工業工程部、測 試部和總訂單管理系統(Total Order Management, TOM) 之運作方式皆不相同,且無一資訊整合之系統,用以互動 式地交流產品需求量與測試機台運作之即時資訊,使得產 品測試之整體控制益加困難。 訂定測試機台之標準測試時間,係準確估計產能之關 鍵。由於目前僅以以往之經驗,粗略估算各測試機台相對 於不同產品之產能,而沒有一個方法與程序,以訂定合理 之標準測試時間,且各測試廠產品標準測試時間之估算方 法不同,使得各測試機台之產能無法做正確地估算以致 影響使生產排程達到最佳化(即總測試時間最短)之目 的0 發叼目的及概述: 综上所述’為提高產品測試工作之效率始 F〜双平縮短總測試 時間,確有必要訂定一套標準化與自動化之處理程序,以 3 本紙張尺度適用中困國家標準(CNS)A4規格(210 X 297公笼) ----rid----裝-------r 訂-------- <請先閱讀背面之注意事項再填寫本頁) 45271 8A7 B7 452718 5. Description of the invention (Inventory: The invention relates to a computerized scheduling system to systematically analyze and evaluate the operation of an organization, especially to minimize the total test time of the test plant. Back to the invention: The manufacturing of semiconductor components can be divided into two parts: component manufacturing and product testing. The test time of product testing is one of the important factors of Yingli's overall production efficiency. The production of semiconductor components needs to go through the product test process. Factors affecting the test time include the configuration of the demand for different products in various test equipment, the demand for products burdened by various test equipment, and the operation control program of the test equipment. Settings, product testing in response to different customer needs, uncertainty in new product testing methods, and coordination between departments will all directly or indirectly affect the total test time of a product. Today * in terms of semiconductor test plants Before production scheduling and dispatch, there was no one way to optimize the production capacity. Production scheduling It is related to the characteristics of the test machine. It is used to properly allocate and plan the product requirements of various different types and characteristics. Because there are many different products to be tested, such as different wafers, shame bodies, The test time and time of integrated circuits are different, and some products can only be tested on specific test machines. 2 This paper size is applicable to the national standard of the country < CNS) A4 specification (210 X 297 public) -) --- --- 111 ---- It --------- (Please read the notes on the back before filling out this page) Intellectual Property Bureau, Ministry of Economic Affairs, Consumer Consumption Co., Ltd. Printed by A7 B7 of the Consumer Cooperative of the Property Bureau V. Invention description () And the production capacity of various test machines is also differenta At the same time, different test machines have different performances' and the programs used to control the operation of the machine will also affect the test Time, for example, a product can be tested on multiple machines, and there are simultaneous CP / FT tests and sort 1, sort2 tests, etc. This will make it difficult to estimate the capacity of the test machine. Furthermore, many new products often do not know which test machine to test and how much test time it takes, thereby increasing the difficulty of production scheduling. On the other hand, the industrial engineering department, testing department, and total order management system (TOM) of different test factories operate in different ways, and there is no information integration system to interactively communicate product demand. The real-time information related to the operation of the testing machine makes the overall control of product testing more difficult. Setting a standard test time for a test machine is critical to accurately estimating production capacity. Because only the past experience is currently used to roughly estimate the production capacity of each testing machine relative to different products, there is no method and procedure to set a reasonable standard test time, and the method of estimating the standard test time of products of different test plants is different. Makes the production capacity of each test machine unable to be correctly estimated, which affects the goal of optimizing the production schedule (that is, the shortest total test time). 0 Purpose and summary: In summary, 'To improve the efficiency of product testing work Since F ~ Shuangping shortened the total test time, it is indeed necessary to set a standardization and automation process to apply the National Standard for Difficulties (CNS) A4 specification (210 X 297 male cages) to 3 paper sizes ---- rid ---- install ------- r order -------- < Please read the notes on the back before filling this page) 45271 8

五、發明說明( 統籌規劃各種產品之測試工作。 (請先閱讀背面之注意事項再填舄本頁) 因此,本發明之目的之_ , 係為提高產品通丨就杜率, 訂定—套最佳化產㈣1 < n ⑨》。測以半 由於不同之測試廠,在各 方沐太π ^ ^ 糸统中之剛試時間的估算 方法不同,為達成標準化目的 根據之計算方式進行測試時 ;.^-1·具有學理 切於m 砰間的话算工作。再者’根據統 计理_ ’可得到合理化與系铋外★ 4 糸統化之解決方案:同時,藉由 應用軟雄之開發,可將解決方牵 茶之作業方式電腦化與自動 化’以減少人力以及時間上之 因此,本發明之另一目的, 係訂疋一套電腦化與自動 化之標準測轼時間設定法。 經濟部智慧財產局員工消费合作社印製 首先,於生產派工前,本發明所揭露之方法可依分析 影蜜產品測試時間所得長時期累積之統計資料,訂定出合 理之標準測試時間。此統計分析步驟先決定影響測試時間 之因素(如不同產品、不同测試機台與不同之測試程式 等)’而後針對各因素將資料分組並分析其分佈。得到資 料之分佈後,需考慮樣本數量是否足夠且具代表性,而後 利用Tukey法(Box Plot之應用)去除極端值(如因更換測 試程式所造成者),使計算結果不致因極端值的影樂而產 生偏差。最後,將處理完畢之資料的中位數求出,以作為 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 452718 A7 B7 五、發明説明( 經濟部智慧財產局員工消費合作社印製 標準測試時間之估計值。 料,不權Η 十值經由刀析長期之測試時間統計資 新產。L统化地估算舊產品之標準測試時間,並可依 新“之特性與相符之舊測試條件,經由分析資料庫内之 測試時間資料,預估其標準 W 间 力一方面,測試時 間統計資料係定期更新,以坦徂甚 〜沏尺新以紅供最新之統計資料庫。 而後,以依照上述方法所得之標準測試時間以及各 種產。。之冑求量,藉Φ數學方法中之線性代數運算(踏角 石法 Transportat ion Simplex Method),以得到最佳 化之產能配置’使總測試時間為最短。 上述統計資料之分析與數學運算,係藉由一功能強大 且具親和力之電腦系統與網路架構來違成,即一產能資訊 整合系統’其可整合不同廠區之製造企劃部及TOM間之基本 資料與程序’並可於任何時間計算並監視預估之工作量,提供快速 查詢任何產品之測試時間,而將訊息反饋給銷售、企劃,以及晶圓 廠等部門,以做為策略訂定之參考。 I8式簡果說明: 第1圖係以一供需表所建立之運輸矩陣; 第2圖係表示將各產品需求量分配完畢後,所得到之 運輸矩陣: 第3圖係利用本發明「最佳化之產能配置演算法j之 (請先閲讀背面之注意事項再填寫本頁) 裝. -訂 —ϊ . 本紙張尺度適用中國S家梯準(CNS >A4规格(2丨0X297公簸) ^^>71 8 A7 B7 五、發明說明( 經濟部智慧財產局員工消費合作杜印製 第一部第 輸矩陣第 陣;第 輪矩陣第 陣:第 輸矩陣第 陣:第 種分组第 種分組第 種分組 第第第第 架構; 分求出基本可行解之「新的相關運輸矩陣」; 4圖係表示以第一列第二行運輪格為入基變數之運 ,其中封閉線標示出鏈反應之路徑: 5圈係依照第4 ®所示之鏈反應所得到之新運輸矩 6圖係表示以第一列第三行運輪格為入基變數之運 ’其中封閉線標示出鍵反應之路徑; 7圖係依照第6圖所示之鏈反應所得到之新運輸矩 8圖係表示以第三列第二行運輸格為入基變數之運 ’其中封閉線標示出鏈反應之路徑; 9圖係依照第8圈所示之鏈反應所得到之斩運輸矩 1 Ο A圖係依照影饗測試時間之因素,所得到之第一 結果; 1 0B圖係依照影響測試時間之因素,所得到之第二 結果; 1 oc ®係依照影饗測試時間之因素,所得到之第三 結果; 11A圖係測試時間資料之對稱性分佈圖; Π B圖係測試時間資料之右偏性分佈圖; 11C圖係測試時間資料之左偏性分佈圖; 12圖係本發明所揭露之產能資訊整合系紙之系統 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁)V. Description of the invention (Planning the testing of various products as a whole. (Please read the precautions on the back before filling out this page). Therefore, the purpose of the present invention is to improve product throughput, and to order-sets Optimized production ㈣1 < n ⑨ ". It is estimated that due to different test plants, the method of estimating the test time in each party is different, and the test method is based on the calculation method to achieve standardization purposes; . ^-1 · It has a theoretical calculation that is close to m. It can also be rationalized and bismuth based on statistical theory. 4 The solution of unified system: At the same time, it can be developed by applying the soft hero. It is possible to computerize and automate the operation method of solving the problem of tea, to reduce manpower and time. Therefore, another object of the present invention is to set a standard computerized and automated measurement time setting method. Ministry of Economic Affairs Printed by the Intellectual Property Bureau employee consumer cooperative. First, before production is dispatched, the method disclosed in the present invention can be based on statistical data accumulated over a long period of time to analyze the test time of shadow honey products, and determine a reasonable Quasi-test time. This statistical analysis step first determines the factors that affect the test time (such as different products, different test equipment and different test programs, etc.), and then groups the data for each factor and analyzes its distribution. After obtaining the distribution of the data It is necessary to consider whether the sample size is sufficient and representative, and then use the Tukey method (the application of Box Plot) to remove extreme values (such as caused by changing the test program) so that the calculation results will not be biased by the extreme value of music. Finally, the median of the processed data is calculated and used as the paper size to apply Chinese National Standard (CNS) A4 (210 X 297 mm) 452718 A7 B7 V. Description of Invention Cooperatives print estimates of standard test times. It is expected that the ten values will be calculated by analyzing the long-term test time of new products. L will estimate the standard test time of the old product in a unified manner, and it can be consistent with the new characteristics. The old test conditions are based on the analysis of the test time data in the database to estimate its standard. The system is updated regularly, and the latest statistical data base is published in order to make it clear. Then, the standard test time and various productions obtained in accordance with the above methods are used. The amount is calculated by linear algebra in Φ mathematical method. Calculation (Transportation ion simplex method) to get the optimal capacity allocation to minimize the total test time. The analysis and mathematical calculation of the above statistical data are performed by a powerful and affinity computer system and network. This structure is inconsistent, that is, a capacity information integration system 'which can integrate basic data and procedures between manufacturing planning departments and TOMs in different factories', and can calculate and monitor the estimated workload at any time, providing quick query of any product Test time, and feedback the information to the sales, planning, and wafer fab departments as a reference for strategy formulation. Brief description of I8 formula: Figure 1 shows the transportation matrix established by a supply and demand table; Figure 2 shows the transportation matrix obtained after the demand for each product is allocated: Figure 3 uses the "optimal" Algorithm for capacity allocation (read the precautions on the back before filling this page). -Order—ϊ. This paper size is applicable to China's standard ladder (CNS > A4 specification (2 丨 0X297) ^^ &71; 71 8 A7 B7 V. Explanation of the invention (The employee property cooperation of Intellectual Property Bureau of the Ministry of Economic Affairs printed the first matrix of the first matrix; the matrix of the first matrix: the matrix of the first matrix: the first matrix of the first matrix: The first and second structure of the grouping; the "new related transportation matrix" of the basic feasible solution; and the figure 4 shows the transportation with the first row and the second row as the base variables, and the closed line indicates The path of the out-chain reaction: 5 circles are the new transportation moments obtained according to the chain reaction shown in Section 4®. The figure 6 shows the transportation with the first column and the third row as the base variables. Among them, the closed line is marked. The path of the bond reaction; Figure 7 is obtained according to the chain reaction shown in Figure 6. The new transportation moment 8 is shown in the third column and the second row is used as the base variable. The closed line indicates the path of the chain reaction. Figure 9 is the cut obtained according to the chain reaction shown in the eighth circle. The transport moment 1 〇 A is the first result obtained according to the factors that affect the test time; 1 0B is the second result obtained according to the factors that affect the test time; 1 oc ® is based on the influence of the test time Factors, the third result obtained; Figure 11A is the symmetrical distribution of test time data; Figure ΠB is the distribution of right skewness of test time data; Figure 11C is the distribution of left skewness of test time data; Figure 12 It is a system for integrating capacity information disclosed in the present invention. The paper size is applicable to China National Standard (CNS) A4 (210 X 297 public love) (Please read the precautions on the back before filling this page)

T I * I I I ϋ n l·* **5Ί' * n ϋ ϋ t· n f 452718 A7 B7 五、發明說明( 1 3圈係本發明所揭露之自動化標準測試時間資料 系統與網路架楫。 圃號對照說aq 120產能資訊整合系統 122用戶端之電腦系統 1 24產能資訊整合系統資訊網伺服器 1 26測試礙資料庠 1 28 TOM資訊網資料庫1210 TOM資料庫 13 0自動化標準測試時間資料系統與網路架構 132資料庫伺服器 134分時多工電腦系統 1 3 6廠區一之資料庫伺服器丨3 8 統計分析伺服器 1310廠區二之資料庫伺服器ι312終端機 1314 TCP/IP網路通訊協定1316 SQL網路1318 SQL網路 1 320 TCP/IP網路通訊協定 發明詳細説明: (請先閱讀背面之注意事項再填寫本買) i裝 —4 · 今° ;--------Λ 經濟部智慧財產局員工消费合作社印製 首先將針對本發明所揭露之最佳化產能配置法加以 說明,其次說明自動化標準測定時間設定法,最後說明產 能資訊整合系統之架構》 最佳化之產能配置演算法(Optimal Capacity A1 location Algori thm)可分為三部份:1)求出基本可行 7 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公《 )TI * III ϋ nl · * ** 5Ί '* n ϋ ϋ t · nf 452718 A7 B7 V. Description of the invention (1 3 circles are the automated standard test time data system and network framework disclosed by the present invention. Say aq 120 capacity information integration system 122 client computer system 1 24 capacity information integration system information network server 1 26 test failure data 1 28 TOM information network database 1210 TOM database 13 0 automated standard test time data system and network Road structure 132 database server 134 time-division multiplexing computer system 1 3 6 database server in factory area 丨 3 8 statistical analysis server 1310 database server in factory area 312 terminal 1314 TCP / IP network communication protocol 1316 SQL network 1318 SQL network 1 320 TCP / IP network protocol invention detailed description: (Please read the precautions on the back before filling in this purchase) i equipment—4 · today °; -------- Λ Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs will first explain the optimized capacity allocation method disclosed by the present invention, secondly describe the method for setting the automatic standard measurement time, and finally explain the framework of the capacity information integration system "Optimization of production capacity configuration algorithm (Optimal Capacity A1 location Algori thm) can be divided into three parts: 1) to obtain basic feasible seven paper scale applicable Chinese National Standard (CNS) A4 size (210 X 297 public")

經濟部智慧財產局員工消費合作社印敦 45271 8 五、發明說明() 解,2 )檢驗是否進行最佳化測試:以及3)進行最佳化測試 -尋找最佳解》 第一部分:求出基本可行解; 步驟一建立一供需表,以定義—「運輸矩陣」。 第1圖係一供需表之範例,在此供需表中,第一行 (column)為測試機台之代號,如S15、TRiLL等;第—列 (row)為產品代號’如TM 1〇〇〇、TM372 1等,而最後一行與 最後一列分別為產品需求量與測試機台可供產能,其中產 品需求量以「片」為單位,可供產能則以Γ分鐘」為單位。 每一格右上角皆有一數字,其代表以某一種機台測試某一 種產品之標準測試時問(分鐘/片),例如以TRIU機台測 試_ TM3506晶圓片,需耗時87分鐘。符號M(無窮大) 代表測試機台無法測試所對應之產品,而虛擬機台之標準 測試時間定義為9 9 9 9 9分/片,且可供產能無限制,其係 用以記錄其他測試機台無法容納之產品需求量。 步驟二:在運輸矩陣中,選出標準測試時間最小者。 如第2圖所示之運輸矩陣,標準測試時間最小者為 7. 8,即產品TJU 946與機台S15所對應之運輸格。 步驟三:分配最大可能之產品需求量給標準測試時間最小 8 本紙張尺度適用中國國家標準(CNS)A4規i"i2l〇 x 297公餐j----- (靖先閱讀背面之注意事項再填寫本頁) -裝— 1Γ 訂 l·----- -^ 4527Employees' Cooperatives, Indun 45271, Intellectual Property Bureau, Ministry of Economic Affairs 8 V. Explanation of the invention () Solution, 2) Check whether the optimization test is performed: and 3) Perform the optimization test-find the best solution. Part 1: Find the basics Feasible solution; Step 1 establish a supply and demand table to define-"transport matrix". Figure 1 is an example of a supply and demand table. In this supply and demand table, the first row (column) is the code of the test machine, such as S15, TRiLL, etc .; the first column (row) is the product code 'such as TM 1〇〇 〇, TM372 1 and so on, and the last row and the last column are the product demand and the available capacity of the test machine respectively, where the product demand is in units of "pieces" and the available capacity is in units of Γ minutes. There is a number in the upper right corner of each grid, which represents the standard test time (minutes / piece) for testing a certain product with a certain machine, for example, the TRIU machine test_ TM3506 wafer, which takes 87 minutes. The symbol M (infinity) indicates that the test machine cannot test the corresponding product, and the standard test time of the virtual machine is defined as 9 9 9 9 9 points / piece, and the available capacity is unlimited. It is used to record other test machines Demand for products that the table cannot accommodate. Step 2: In the transportation matrix, select the one with the smallest standard test time. As shown in Figure 2 for the transportation matrix, the minimum standard test time is 7.8, which is the transportation grid corresponding to the product TJU 946 and machine S15. Step 3: Allocate the largest possible product demand to the minimum standard test time 8 This paper size is applicable to the Chinese National Standard (CNS) A4 Regulation i " i2l〇x 297 Public Meal j ----- (Jing Xian read the notes on the back (Fill in this page again.)-装 — 1Γ Order l · ------^ 4527

五、發明說明() 經濟部智慧財產局員工消費合作社印製 之運輸格。 如第2围所示之運輸矩陣,由於產品TM1946之需求 量為1 64片,且其標準測試時間為7 8分鍾/片,因此共 需164*7.8 = 1279.2分鐘以完成測試,而機台S15之可供 產能為63, 694分鐘,此值比需求量大,因此可將產品 TM1 94 6之需求量(丨64片)全數分配給機台S15»此時,機 台S15之可供產能剩餘63694_1 279 2 = 6241 4 8分鐘。 步驟四’考慮所有標準測試時間之次小值,以步驟三之方 法進行計算’直到各產品需求量分配完畢為止^ 對標準測試時間次小值8. 7,即產品TM3506與機台 TRILL之交集位置進行分配。由於產品τΜ35〇6之需求量為 960片’且其標準測試時間為87分鐘/片,因此共需 960*8· 7 = 8352分鐘以完成測試,而機台TRILL之可供產能 為39, 782分鐘,此值比需求量大,因此可將產品TM3506 之需求量(960片)全數分配給機台TRILL»此時,機台 TRILL之可供產能剩餘39782-8352 = 3 1 430分鐘。其次,對 標準測試時間再次小值8. 8,即產品TM3546與機台TRILL 之交集位置進行分配》由於產品TM3546之需求量為 11,760片,且其標準測試時間為8,8分鐘/片,因此共需 11760*8.8 = 103488分鐘以完成測試,然而機台TRILL之可 供產能僅剩餘31,430分鐘,此值比需求量小,因此機台 9 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) ----裝-------t 訂L-------Λ (請先閱讀背面之注意事項再填寫本頁) 452718 經濟部智慧財產局員工消費合作社印製 Α7 Β7 五、發明說明() TRI LL只能測試剩餘可供產能3 1,43 0分鐘之數量,即 [ 31 430/8· 8] = 3571片》此時’機台TRILL之可供產能為〇, 且TM3546尚餘8, 189片未分配測試。餘依步驟三與步驟 四,將各產品需求量分配完畢後,其結果如第2圄所示之 運輸矩陣’其t運輸格之左下角標記各產品之分配量。如 前所述,虛擬機台之分配量’實際上為其他測試機台無法 容納之產品需求量。 第二部分:檢驗是否進行最佳化測試: 以上所定義之運輸矩陣中,列數即為產品種類數、行 數即為測試機台種類數、基變數即為有產品分配量之運輸 格内之標準測試時間,而基變數個數則定義為有產品分配 量之運輸格個數。若[列數+行數-1]之值不等於基變數個 數,則所得之分配結果即是最佳解;反之,若[列數+行數 -1]之值等於基變數個數,則所得之分配結果不是最佳 解。 此實施例中’列數為12、行數為9,而基變數個數為 15,由於虛擬機台上之運輸格有分配量,且分配至此虛擬 機台之產品有兩種以上可測試機台,其表示有機會分散負 荷,但[列數+行數-1]之值不等於基變數個數,因此所得 之分配結果已是最佳解(當然,此最佳解並非唯一 10 本紙張尺度適用中國國家標準(CNS)A4規格(210 * 297公釐) ----,----f ^-------------- (請先閱讀背面之注意事項再填寫本頁) 452718 Α7 -------------- 五、發明說明() 一部 進行最佳化測試·'尋找最佳解 ί請先閱讀背面之注意事項再填寫本頁) 假設吾人已透過r最佳化之產能配置演算法」之第一 部分求出基本可行解(即一初始解),如第3圖所示,其為 一 3X4之「新的相關運輸矩陣」,並依第二部分進行檢驗, 由於虛擬機台上之運輸格有分配量,且「新的相關運輸矩 陣」之[列數+行數_1]之值等於基變數個數(3 + 44 =6),因 此’此分配結果不是最佳解。 步驟一:決定「入基變數」 如第4圊之「新的相關運輸矩陣」。選取基變數個數 最多的列(或行)’並設定其第一參數值Ui (或第二參數值 Vj)為一基本參數值’基本參數值可任意選取_定值,本 實施列中以0作為基本參數值,而後再以Tij=ui+Vj之關 係,將所有之Ui與Vj--求出’其中Tij為基變數》此 例中’其計算過程如下:由於第二列之基變數個數最多, 因此將U2設為0’即U2 = 0’而各基變數Tij = Ui+Vj,所以 經濟部智慧財產局員工消费合作社印製 U 2 + V1 = 9、U 2 + V 2 = 1 2 而 U 2 + V 3 = 1 3,因此可得 v 1 = 9 ' V 2 = 1 2 且 V3 = 13,此外 U1+V1 = 8、U3 + V3M6 而 U3 + V4 = 5,所以 Ul =小 U3 = 3 且 V4 = 2。 接著計算非基變數之(Tίj-Ui-Vj)值,並選擇其值為 負數之絕對值中最大者(若有兩個以上,則任選其一),此 11 本紙張尺度適用中國S家標準(CNS)A4規格(210 X 297公Μ ) 4 5271 8 A7 B7 經濟部智慧財產局貝工消費合作社印製 以 五、發明說明( 運輸格即為「入基變數」。第一列第二行之[γι2-ΙΠ-V2 = 6-(-l)-12 = ~5]為負數之絕對值中最大者,所以此運輸 格為「入基變數」。 步驟二:決定「出基變數」 如第4圓所示之運輸矩陣。找出當入基變數增加時’ 為保持可行性所需之鏈反應。由於第一列第二行為「入基 變數」,並以Φ表示,此時開始出發尋找基變數以便形成 一迴圈鍊’並以㊉Θ交互表示。從迴圏鍊中可知,以Θ表 示之運輸格中,以第二列第二行之產品分配量2〇為最小, 所以第一列第二行之「入基變數」=〇 + 2〇 = 2〇,第二列第二 行為「出基變數」,其產品分配量= 20-20 = 0,第一列第一 行之產品分配量=35-20 = 15,而第二列第一行之產品分配 量=1 0 + 20 = 30,因此可得到如第5囷之新運輸矩陣。此時 再設定 U1 = 0,而 U1+V1 = 8 且 Ul+V2 = 6,所以 Vl=8,V2 = 6 : 因 U2 + V1=9,所以 U2 = l ;而 U2 + V3 = 13,所以 ν<ϊ_10 . ^ I 6 * 而 U3 + V3 = 16,所以 U3 = 4 ;而 U3 + V4 = 5,所以 V4-i . ^ Ί i 〇接著計算 非基變數之(14卜1^】)值,並選擇其值為.私4 π貝歎之絕對值V. Description of the Invention () Transport grid printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. As the transportation matrix shown in the second circle, because the demand of the product TM1946 is 1 64 pieces, and its standard test time is 78 minutes / piece, a total of 164 * 7.8 = 1279.2 minutes is required to complete the test, and the machine S15 The available capacity is 63,694 minutes, which is greater than the demand. Therefore, the total demand of the product TM1 94 6 (64 pieces) can be allocated to machine S15. At this time, the available capacity of machine S15 is left. 63694_1 279 2 = 6241 4 8 minutes. Step 4 'Considering all the minor values of the standard test time and calculate by the method of Step 3' until the demand of each product is allocated ^ To the minor value of the standard test time 8.7, which is the intersection of the product TM3506 and the machine TRILL Location. Because the demand for the product τΜ35〇6 is 960 pieces and its standard test time is 87 minutes / piece, a total of 960 * 8 · 7 = 8352 minutes is required to complete the test, and the available capacity of the machine TRILL is 39,782 Minutes, this value is greater than the demand, so you can fully allocate the demand (960 pieces) of the product TM3506 to the machine TRILL »At this time, the remaining capacity of the machine TRILL is 39782-8352 = 3 1 430 minutes. Secondly, the standard test time is again a small value of 8.8, that is, the intersection position of the product TM3546 and the machine TRILL is allocated. Since the demand for the product TM3546 is 11,760 pieces, and the standard test time is 8,8 minutes / piece, so It takes a total of 11760 * 8.8 = 103488 minutes to complete the test. However, the available capacity of the machine TRILL has only 31,430 minutes remaining. This value is smaller than the demand. Therefore, the paper size of machine 9 applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) ---- install ------- t order L ------- Λ (Please read the precautions on the back before filling out this page) 452718 Employee Consumer Cooperatives, Intellectual Property Bureau, Ministry of Economic Affairs Printed Α7 Β7 V. Description of the invention () TRI LL can only test the remaining available capacity of 3, 1,430 minutes, that is, [31 430/8 · 8] = 3571 pieces. Production capacity is 0, and TM3546 has 8,189 units left untested. According to step 3 and step 4, after allocating the demand for each product, the result is shown in the transportation matrix shown in Figure 2 圄. The lower left corner of the t transportation box marks the distribution amount of each product. As mentioned before, the virtual machine's allocation is actually the demand for products that cannot be accommodated by other test machines. Part II: Check whether the optimization test is performed: In the transport matrix defined above, the number of columns is the number of product types, the number of rows is the number of test equipment types, and the base variable is the number of the product in the transportation grid. The standard test time, and the number of base variables is defined as the number of transport cells with product distribution. If the value of [number of columns + number of rows -1] is not equal to the number of basis variables, the distribution result obtained is the best solution; otherwise, if the value of [number of columns + number of rows -1] is equal to the number of basis variables, The distribution result obtained is not the optimal solution. In this embodiment, 'the number of columns is 12, the number of rows is 9, and the number of base variables is 15, because the transportation grid on the virtual machine platform has an assigned amount, and the products assigned to this virtual machine platform have more than two testable machines Platform, which means that there is a chance to spread the load, but the value of [number of columns + number of rows -1] is not equal to the number of basis variables, so the distribution result obtained is already the best solution (of course, this optimal solution is not the only 10 papers Standards are applicable to China National Standard (CNS) A4 specifications (210 * 297 mm) ----, ---- f ^ -------------- (Please read the notes on the back first (Fill in this page again) 452718 Α7 -------------- V. Description of the invention (1) Optimizing test · 'Find the best solution, please read the notes on the back before filling in (This page) Assume that we have obtained the basic feasible solution (ie, an initial solution) through the first part of the "r-optimized capacity allocation algorithm", as shown in Figure 3, which is a 3X4 "new related transportation matrix" "And check according to the second part, because the transport grid on the virtual machine has an assigned amount, and the value of [number of rows + number of rows _1] of the" new related transport matrix "is equal to Variable number (44 + 3 = 6), and therefore 'the result is not the best solution for this assignment. Step 1: Determine the "basic variables", such as "New Related Transport Matrix" in Section 4 Select the column (or row) with the most number of base variables and set its first parameter value Ui (or second parameter value Vj) as a basic parameter value. The basic parameter value can be arbitrarily selected_ fixed value. 0 is used as the basic parameter value, and then the relationship between Tij = ui + Vj is used to calculate all Ui and Vj-'where Tij is the base variable> In this example, the calculation process is as follows: Because the base variable in the second column The largest number, so set U2 to 0 ', that is, U2 = 0' and each base variable Tij = Ui + Vj, so the consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs printed U 2 + V1 = 9, U 2 + V 2 = 1 2 and U 2 + V 3 = 1 3, so we can get v 1 = 9 'V 2 = 1 2 and V3 = 13 and in addition U1 + V1 = 8, U3 + V3M6 and U3 + V4 = 5, so Ul = Small U3 = 3 and V4 = 2. Then calculate the value of the non-base variable (Tίj-Ui-Vj), and choose the largest of the absolute values with negative values (if there are more than two, choose one of them). These 11 paper standards are applicable to Chinese S Standard (CNS) A4 specification (210 X 297 MM) 4 5271 8 A7 B7 Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperatives, with a description of the invention (the transport case is the "base variable". The first column is the second The line [γι2-ΙΠ-V2 = 6-(-l) -12 = ~ 5] is the largest of the absolute values of negative numbers, so this transportation grid is "into base variable". Step 2: Determine "out of base variable" The transportation matrix shown in circle 4. Find the chain reaction needed to maintain the feasibility when the base variable is increased. Since the second row in the first column is "base variable" and is represented by Φ, it starts at this time Start to find the base variables to form a loop chain 'and interactively express it with ㊉Θ. From the loop chain, we can see that in the transportation grid represented by Θ, the product allocation amount 20 in the second column and the second row is the smallest, so the first The second row of the "Into Base Variable" = 0 + 2〇 = 2〇, the second column in the second row is "Out of Base Variable", Product allocation = 20-20 = 0, product allocation in the first row of the first column = 35-20 = 15, and product allocation in the first row of the second column = 0 + 20 = 30, so we can get The new transportation matrix of the 5th. At this time, U1 = 0, and U1 + V1 = 8 and Ul + V2 = 6, so Vl = 8, V2 = 6: Because U2 + V1 = 9, U2 = l; U2 + V3 = 13, so ν < ϊ_10. ^ I 6 * and U3 + V3 = 16, so U3 = 4; and U3 + V4 = 5, so V4-i. ^ Ί i 〇 Then calculate the non-base variable (14 卜 1 ^]) value, and select its value. Absolute value of private 4 π

中最大者(若有兩個以上,則任選其一),此運认U 扣噢輸格即為「入 基變數J »第一列第三行之[T13-Ul-V3 = l〇4 1f> u-l2 = -2]為負 數之絕對值中最大者,所以此運輪格為「入就mi 八%變數」。如 第6圖所示,由於第一列第三行為「入基嫌奴 敌」,並以㊉ 表示,此時開始出發尋找基變數以便形成—袖 地幽鍊,並 12 表紙張尺度適用中國國家標準(CNS>A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁)The largest one (if there are more than two, choose one of them), this operation recognizes that the U deduction is "into the base variable J» [T13-Ul-V3 = l〇4 1f > u-l2 = -2] is the largest of the absolute values of the negative numbers, so this wheel grid is "into mi 8% variable". As shown in Figure 6, because the third behavior in the first column is "Slave into the base," and it is indicated by ㊉, at this time, we started to search for the base variables to form a sleeve-like chain, and the 12-sheet paper scale is applicable to the Chinese country. Standard (CNS > A4 specification (210 X 297 mm) (Please read the precautions on the back before filling this page)

* 4^4-------- . l·---I — I I 45271 8 A7 B7 五、發明說明() ㊉Θ交互表示。從迴圈鍊中可知,以Θ表示之運輸格中, (請先閱讀背面之沒意事項再填寫本頁) 以第一列第一行之產品分配量1 5為最小,所以第一列第 三行為「入基變數」=0 + 15=15,第一列第一行為「出基變 數」產品分配量=1 5-1 5 = 0,第二列第一行之產品分配量 = 30 + 15 = 45,而第二列第三行之產品分配量=20-15 = 5,因 此可得到如第7圊之新運輪矩陣。此時再設定V3 = 0,而* 4 ^ 4 --------. L · --- I — I I 45271 8 A7 B7 V. Description of the invention () ㊉Θ interactive representation. It can be known from the loop chain that in the transportation grid represented by Θ, (please read the unintentional matter on the back before filling this page) The product distribution amount of 15 in the first column and the first row is the smallest, so the first column Three lines "into the base variable" = 0 + 15 = 15, the first line in the first line "out of the base variable" product allocation amount = 1 5-1 5 = 0, the second line in the first row product allocation amount = 30 + 15 = 45, and the product allocation of the second column and the third row = 20-15 = 5, so we can get the new shipping matrix as shown in 7th. Then set V3 = 0 again, and

Ul+V3 = 10、U2 + V3M3 且 U3 + V3 = 16,所以 Ul = 10、U2 = 13、 U3 = 16; Ul+V2 = 6,所以 V2 = -4;而 U2 + V1 = 9,所以 VI 二-4; 經濟部智慧財產局員工消費合作社印製 而U3 + V4 = 5,所以U4 = -l 1。接著計算非基變數之(Ti j-Ui-Vj) 值,並選擇其值為負數之絕對值中最大者(若有兩個以 上,則任選其一),此運輸格即為「入基變數」。第三列 第二行之[T32-U3-V2 = 9-16-(-4)=-3]為負數之絕對值中 最大者,所以此運輸格為「入基變數」。如第8圖所示, 由於第三列第二行為「入基變數」,並以㊉表示,此時開 始出發尋找基變數以便形成一迴圈鍊,並以㊉Θ交互表 示。從迴圈鍊中可知,在以Θ表示之運輸格中,以第三列 第三行之產品分配量1 0為最小,所以第三列第二行之「入 基變數」=0 + 10 = 10,第三列第三行為「出基變數」產品分 配量=10-10 = 0,第一列第二行之產品分配量=20-10 = 10, 而第一列第三行之產品分配量=1 5 + 1 0 = 2 5,因此可得到如 第9圖之新運輸矩陣。此時再設定111 = 0,而Ul + V2 = 6、 Ul+V3 = 10,所以 V2 = 6、V3 = 10 ;而 U2 + V3 = 13,所以 U2 = 3 ; 而 U2 + V1 = 9,所以 Vl = 6 ;而 U3 + V2 = 9,所以 U3 = 3 ;而 U3 + V4 = 5,所以V4 = 2。接著計算非基變數之(Ti j-lH-V j) 13 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 452718 經 濟 部 智 慧 財 產 局 員 費 合 作 社 印 製 A7 B7 五、發明說明() 值’其結果皆大於等於〇,表示已得最佳解。 接著說明自動化標準測定時間設定法。首先決定影響 測試時間之因素,如廠區之不同、產品編號之不同測試 機台操作控制程式之設定、為因應不同客戶之需求所進行 之產品測試 '新產品測試方法之不確定性以及各部門間 之協調工作等β而後針對各影響因素將資料作組合運算, 並分析每一種可能組合之分佈,運算結果所得到之分組方 式如第10Α圖、第1〇Β圖及第10c圖所示。資料之分組結 果,代表多種測試情況,例如於甲測試廠,以產品編號ρΑβΤ 在第二測試機台上以某測試程式進行s〇RT2之邏輯電路測 試,而此產品係由客戶乙所提供,此即是_種測試情況。 而後,每一種測試情況皆有一與之對應之分佈圖,此分佈 围之資料分佈情形’主要有下列三種:如帛UA圖所示之 對稱分佈(即眾數=中位數=平均數)' 如第i 1B圖所示之右 偏分佈(即眾數〉中位數〉平均數)或如第uc圖所示之左偏 分佈(即眾數<中位數<平均數),其中每一分佈固之橫轴為 測試時間’縱轴為測試次數》為了得到一標準測試時間, 需由統計分佈中考慮樣本數大小與樣本代表性以選擇一 合理之代表值,作為描述資料集中趨勢之指標。由於平均 數易受極端值影響,以及眾數不適用於小樣本空間之情 況,且中位數具有受極端值影響小、大小樣本空間均適= 之侵點’常應用於無母數之統計分析,再者,無母數統計 方法不須假設資料為常態分佈,且可使用於樣本空間較小 _ 14 ί—國^^^2177297 公爱 l· — I Ί---^_ ----- !ί 訂'---ίίΆ (請先閱讀背面之注意事項再填寫本頁) 45271 A7 B7 經 濟 部 智 慧 財 產 局 負 工 消 费 合 作 社 印 製 五、發明說明( 的清況而不需嚴格的統計假設’故適用於自動化之分析 系統得ί丨測試情況資料之分佈後,需考慮樣本數量是否 足夠且具代表性’而後利用Tukey法(Box Pi〇t之應用) 以去除1.5倍内四分位距(Inter叫^叫e, I⑽)以 外之極端值’使計算結果不致因極端值的影響而產生較大 偏差。最後1處理完畢之資料的中位數求出,以作為標 準測試時間之估計值。經由分析-段時期(如-年)之測試 時間統計資料’不僅可系統化地估算舊產品之標準測試時 間’並可依新產品之特性與相符之舊測試條件,經由分析 資料庫内之測試時間資料,預估其標㈣試時間。另一方 面,測試時間統計資料係定期更新,以隨時提供最新之統 計分析資料庫β 本發月所揭露之最佳化產能配置法以及自動化標準 測定時間設定法,㈣電腦化與自動化料實施。以下將 說明用以實施本發明所揭露方法之電腦系統。$ 12圖係 本發明所揭露之產能資訊整合系統12〇,其中主要包含: 戶端之電腦系統1 2 2、產能資訊整合系統資訊網伺服器 124、測試廠資料庫126、T〇M資訊網資料庫Μ ,以及 tom資料庫mo。用戶端之電腦系統122係用於提供快速査 詢任何產品之測試時間與基本資料(如機台數量、欸率/卫程比率及 原始統計資料等),並可監視預估之工作量;產能資訊整合系統 資訊網伺服器124可經由全球資訊網(w〇rU Wide Web), 提供網路上用戶端4電滕系統取得所需資I;測試礙資料 --I -------J--「: ------— 1 訂--I-----Λ- (請先閱讀背面之注意事項再填寫本頁) 15 45271 8 A7Ul + V3 = 10, U2 + V3M3 and U3 + V3 = 16, so Ul = 10, U2 = 13, U3 = 16; Ul + V2 = 6, so V2 = -4; and U2 + V1 = 9, so VI 2-4; printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs and U3 + V4 = 5, so U4 = -l 1. Then calculate the (Ti j-Ui-Vj) value of the non-base variable, and choose the largest of the absolute values with negative values (if there are more than two, choose one of them). variable". In the third column, [T32-U3-V2 = 9-16-(-4) =-3] is the largest of the absolute values of negative numbers, so this transport cell is the "base variable". As shown in Fig. 8, since the second row in the third column is "into the base variable" and is represented by ㊉, at this time, it starts to search for the base variable so as to form a loop chain, and it is represented by ㊉Θ interactively. It can be known from the loop chain that in the transportation grid represented by Θ, the product allocation amount of 10 in the third column and the third row is the smallest, so the "base variable" in the second row of the third column = 0 + 10 = 10, the third column and the third line "out of base variables" product distribution amount = 10-10 = 0, the first column second row product distribution amount = 20-10 = 10, and the first column third row product distribution The quantity = 1 5 + 1 0 = 2 5 so a new transportation matrix as shown in Figure 9 can be obtained. At this time, set 111 = 0, and Ul + V2 = 6, Ul + V3 = 10, so V2 = 6, V3 = 10; and U2 + V3 = 13, so U2 = 3; and U2 + V1 = 9, so Vl = 6; and U3 + V2 = 9, so U3 = 3; and U3 + V4 = 5, so V4 = 2. Next, calculate the non-base variable (Ti j-lH-V j). 13 This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm). 452718 Printed by the Intellectual Property Bureau Staff Cooperative of the Ministry of Economic Affairs A7 B7 V. Invention Explanation () value 'The results are greater than or equal to 0, indicating that the best solution has been obtained. Next, an automatic standard measurement time setting method will be described. First determine the factors that affect the test time, such as different factory locations, different test numbers for the setting of the test machine operation control program, product testing to respond to the needs of different customers, the uncertainty of new product testing methods, and the various departments. The coordination work, such as β, then combined the data for each influencing factor, and analyzed the distribution of each possible combination. The grouping methods obtained by the calculation results are shown in Figures 10A, 10B, and 10c. The grouping results of the data represent a variety of test conditions. For example, in the A test factory, the logic circuit test of SORT2 was performed with a test program on the second test machine under the product number ρΑβΤ, and this product was provided by customer B. This is a test case. Then, each test situation has a corresponding distribution map. The data distribution of this distribution area 'mainly has the following three types: as shown in the 帛 UA diagram, the symmetrical distribution (that is, mode = median = mean)' A right-biased distribution (i.e. mode> median> mean) as shown in Figure i 1B or a left-biased distribution (i.e. mode & median & average) as shown in Figure uc, where The horizontal axis of each distribution is the test time and the vertical axis is the number of tests. "In order to obtain a standard test time, the size and representativeness of the samples need to be considered in the statistical distribution to select a reasonable representative value as a description of the data concentration trend. Indicators. Because the average is susceptible to extreme values, and the mode is not suitable for small sample spaces, and the median has a small sample space affected by extreme values, and the size of the sample space is appropriate = the invasion point 'is often used in statistics without mother numbers Analysis, furthermore, the statistical method without mothers does not need to assume that the data is normally distributed, and can be used for a small sample space _ 14 ί— 国 ^^ 2177297 Public love l · — I Ί --- ^ _ --- -! ί '' --- ίίΆ (Please read the notes on the back before filling out this page) 45271 A7 B7 Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Statistical hypothesis 'So it is suitable for automated analysis systems to obtain the distribution of test situation data, you need to consider whether the sample size is sufficient and representative', and then use the Tukey method (the application of Box Pi〇t) to remove the quarter within 1.5 times. Extreme values other than the bit distance (Inter is called ^ called e, I⑽), so that the calculation results will not cause large deviation due to the influence of extreme values. The median of the last processed data is obtained as the standard test time. Estimated value -Period (eg, -year) test time statistics 'not only can systematically estimate the standard test time of old products', but also can analyze the test time data in the analysis database based on the characteristics of the new product and the corresponding old test conditions. On the other hand, the test time statistics are regularly updated to provide the latest statistical analysis database at any time. Β The optimized capacity allocation method and the automatic standard measurement time setting method disclosed in this month Computerized and automated material implementation. The computer system used to implement the disclosed method of the present invention will be described below. The $ 12 figure is the capacity information integration system 12 disclosed by the present invention, which mainly includes: The client computer system 1 2 2. Capacity information integration system information network server 124, test plant database 126, TOM information network database M, and tom database mo. The computer system 122 on the client side is used to provide quick query of any product test Time and basic data (such as the number of machines, rate of flight / health rate and raw statistics, etc.), and can monitor the estimated workload; capacity The information integration system information network server 124 can provide the client-side 4 network system on the network to obtain the necessary information through the World Wide Web (W0UU Wide Web); test data --I ------- J -「: ------— 1 order --I ----- Λ- (Please read the notes on the back before filling this page) 15 45271 8 A7

五、發明說明() 庫1 2 6係儲存測試gi ρα * 5* j,j 時間之統汁資料;TOM資料庫1 21 〇储存 訂單之相關資料;Τ0Μ資訊網資料庫1 28則提供訂單之相 關資料給產能資訊整合系統資訊網词服器m。另—方 面’傳送自動化標準測試時間資料之系統與網路架構 U0 ’如第13圖所示。其t資料庫伺服器ι32與分時多工 電腦系統134係以TCP/iP網路通訊協定1314連結,並藉 由分時多工電腦系統i34控制資料庫伺服器1 32 ;廠區一V. Description of the invention () Library 1 2 6 is used to store test data of gi ρα * 5 * j, j time; TOM database 1 21 〇 stores relevant information of orders; TOM information network database 1 28 provides order information Relevant data is provided to the capacity information integration system information network server m. On the other hand, the system and network architecture U0 for transmitting automated standard test time data is shown in Figure 13. The database server ι32 and the time-sharing multiplexing computer system 134 are connected by the TCP / iP network communication protocol 1314, and the database server 1 32 is controlled by the time-sharing multiplexing computer system i34;

之資料庫伺服器1 3 6與分時多工電腦系統i 34係以SQL (Structured Query Language, SQL)網路 1316 連接,並 藉由分時多工電腦系統丨3 4控制廠區—之資料庫伺服器 136 ;廠區一之資料庫伺服器136以SQL網路1318與統計 分析飼服器138連接’以提供統計分析之資料:廠區二之 資料庫伺服器1310以TCP/IP網路通訊協定1 320與統計 分析飼服器1 38連結’以提供統計分析之資料:而後統計 分析词服器138與一終端機1312連接,以提供終端機1312 監控自動化標準測試時間資料之系統與網路架構13〇之介 面。終端機1312則經由網路與第12圖所示之產能資訊整 合系統120中之TOM資訊網資料庫128連接》以上即為產 能資訊整合系統與自動化標準測試時間資料傳送系統之 網路架構。由此,測試廠各個部門之資訊經網路連結而得 到交流,從而提供了產能資訊整合的途徑。 以上所述僅為本發明之較佳實施例而已,並非用以限 定本發明之申請專利範圍;凡其它未脫離本發明所揭示之精 神下所完成之等效改變或修飾,均應包含夺下述之申請專利 16 本紙張尺度適用中困0家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) -裝------— 訂 -------Λ 經濟部智慧財產局員工消费合作社印製 45271 8 A7 B7 五、發明說明() 範園内 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS〉A4規格(210 X 297公釐〉The database server 1 3 6 and the time-sharing and multiplexing computer system i 34 are connected by a SQL (Structured Query Language, SQL) network 1316, and the time-sharing and multiplexing computer system 丨 3 4 controls the plant area-the database Server 136; The database server 136 of the plant area 1 is connected to the statistical analysis feeder 138 through the SQL network 1318 to provide statistical analysis data: The database server 1310 of the plant area 2 uses the TCP / IP network communication protocol 1 320 is connected to the statistical analysis feeder 1 38 'to provide statistical analysis data: Then the statistical analysis server 138 is connected to a terminal 1312 to provide the terminal 1312 to monitor the system and network architecture of the automated standard test time data 13 〇 的 surface. The terminal 1312 is connected to the TOM information network database 128 in the capacity information integration system 120 shown in FIG. 12 via the network. The above is the network structure of the capacity information integration system and the automated standard test time data transmission system. As a result, the information of each department of the test plant was exchanged via the Internet, which provided a way to integrate capacity information. The above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the patent application of the present invention; all other equivalent changes or modifications made without departing from the spirit disclosed by the present invention shall include deprivation The application patent mentioned in this paper is applicable to 0 standard (CNS) A4 specifications (210 X 297 mm) (please read the precautions on the back before filling this page) -Installation ------- Order- ------ Λ Printed by the Consumer Property Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 45271 8 A7 B7 V. Description of the invention () in Fan Yuan (Please read the precautions on the back before filling this page) The printed paper size is applicable to Chinese national standards (CNS> A4 size (210 X 297 mm>

Claims (1)

452718 六、申請專利範圍 ™ w 贫尔統,至少包含, 第一資料庫裝置,用㈣㈣訂單| 第二資料庫裝置,用以储存廠房:統資料; 資訊網接收儲存於該第一資料庫裝置 貧讯,並經由 統資料: 讀總訂單管理系 -資訊網資料庫裝置,用以儲存總 訊網資料,並經由該資訊網’ 系統之資 遞該總訂單管理系統資料;、" 料庫裝置相互傳 一資訊網_服器裝置,作為該資訊^飼 接收儲存於該資訊網資料庠裝 ,用以 庫裝置相互傳遞該產能資訊與該總訂單管:::第二資料 及 ”理系統資料、 一電膝終端機’具有標準輸入/輸出裝置,用、 指令以及接收儲存於該資訊網伺服器裝置之、發送 與該總訂單管理系統資料。 〆產能資m 經 濟 部 智 慧 財 產 局 消 费 合 2‘如申請專利範圍冑!項之自動化產能資訊整合系統 上述之第一資料庫裝置與上述之第二資料庠裝置, 由第一網路連接。 ’其令 係藉 3.如申請專利範圍第丨項之自動化產能資訊整、· 0乐統,其中 上述之第一資料庫裝置與上述之資訊網資料 衣置,係 藉由第二網路連接。 J 53?1 8452718 VI. Scope of Patent Application ™ w Poor system, at least, the first database device, used for ordering | the second database device, used to store the plant: unified data; the information network receives and stores in the first database device Poor information, and through the unified data: read the total order management system-information network database device, used to store the general information network data, and the total order management system data through the information network's system; and "quote" The devices communicate with each other an information network_server device, which serves as the information, receives and stores the data outfit in the information network, and is used by the library devices to communicate the capacity information and the total order management :: the second data and the management system. Data, an electric knee terminal 'has standard input / output devices, uses, commands, and receives data stored in the information network server device, sends and the total order management system. 2'If the scope of patent application is 胄!, The above-mentioned first database device and the above-mentioned second data of the automated production capacity information integration system The device is connected by the first network. 'Its order is borrowed 3. If the automatic production capacity information of item 丨 of the patent application scope is integrated, the above-mentioned first database device and the above-mentioned information network data are placed. Is connected via a second network. J 53? 1 8 申請專利範圍 A8B8C8D8 蛵 濟 部 智 慧 財 產 局 員 X 消 費 合 η 社 印 製 •如申清專利範圍第1項之自動化產能資訊整合系統,其中 上述之第二資料庠裝置與上述之資訊網伺服器裝置,係 藉由第三網路連接。 5·如申請專利範園第丨項之自動化產能資訊整合系統,其中 上述之資訊網資料庫裝置與上述之資訊網何服器裝 置’係藉由第四網路連接a 6 ·如申請專利範圍第1項之自動化產能資訊整合系統,其中 上述之資訊網伺服器裝置與上述之電腦終端機,係藉由 第五網路連接a 7·如申請專利範圍第丨項之自動化產能資訊整合系統,其中 上述之資訊網資料庫裝置更與一傳送自動化標準測試 時間資料之系統連結’該傳送自動化標準測試時間資料 之系統至少包含: 一資料庫伺服器裝置’用以储存資料; 一分時多工電腦系統裝置,與該資料庫伺服器裝置連 結,用以控制該資料庫伺服器裝置; 第一廠區資料庫伺服器裝置’用以儲存第一廠區之測 試時間資料,並與該分時多工電腦系統裝置連結; 一統計資料分析伺服器裝置’用以分析測試時間資 料,並與第一廠區資料庫伺服器裝置連結; 本紙張尺度適用令國國家標準(CNS)A4規格(210 X 297公釐 ---^----^----- Μ-------;—訂-:--- - { (請先間讀背面之注意事項再填寫本頁) A8 、___ η -------- _ \ _ 、、申請專利範圍 ' ' ▲第二礙區資料庫词服器裝置,用以錄存第二礙區之測 ▲時1資_並與該統計資料分析词服器裝置連結·,以及 、 電腦系統,具有標準輸入/輸出裝置,與該統計資 料分析伺服器裝置連結,用以控制該統計資料分析伺服器 裝置,並與該資訊網資料庫裝置連結。 如申請專利範固帛7項之自動化產能資訊堅合系統,其中 上述之資料庠伺服器裝置係以TCP/IP網路通訊協定與 上述之分時多工電腦系統裝置連結。 9. 如申請專利範圍第7項之自動化產能資訊整合系統其中 上述之第一廠區資料庫伺服器裝置係以SQL網路與上述 之分時多工電腦系統裝置連結。 10. 如申請專利範圍第7項之自動化產能資訊整合系統,其 中上述之第一廠區資料庫伺服器裝置係以SQL網路與上 述之統計資料分析伺服器裝置連結。 11.如申請專利範圍第7項之自動化產能資訊整合系統,其 中上述之第二廠區資料庫伺服器裝置係以TCP/IP網路 通訊協定與上述之統計資料分析伺服器裝置連結。 1 2 · —種將產品配置量最佳化,使總測試時間最小化之方法, 該產品配置方法至少包含下列步騍: 20 本紙張尺度適用中國a家標準(CNS)A4規格(2】〇x297公釐〉 <請先閱讀背面之注意事現再填寫本頁) -t * n n al ϋ kδ,, * n n n -4 經濟部智慧財產局員工消费合作社印繁 ^^271 8 A8 B8 C8The scope of patent application is A8B8C8D8, printed by the Consumers ’Intellectual Property Bureau of the Ministry of Economic Affairs, X Consumption Company. It is connected via a third network. 5 · If the patent application park's first automated capacity information integration system, where the above information network database device and the above information network server device 'are connected via a fourth network a 6 · If the scope of the patent application The automatic capacity information integration system of item 1, wherein the above-mentioned information network server device and the above computer terminal are connected through a fifth network. The above-mentioned information network database device is further connected with a system for transmitting automatic standard test time data. The system for transmitting automatic standard test time data includes at least: a database server device for storing data; The computer system device is connected to the database server device to control the database server device; the first plant database server device is used to store the test time data of the first plant area and work with the time-sharing and multi-tasking Computer system device connection; a statistical data analysis server device 'for analyzing test time data, and Factory database server device connection; This paper size applies the national standard (CNS) A4 specification (210 X 297 mm --- ^ ---- ^ ----- Μ -------; —Order-: ---- {(Please read the precautions on the back before filling in this page) A8, ___ η -------- _ \ _, the scope of patent application '' ▲ Second obstacle The database server device is used to record the measurement of the second obstructed area. ▲ Hour 1 asset _ and connected with the statistical data analysis server device, and, the computer system has a standard input / output device, and the statistics The data analysis server device link is used to control the statistical data analysis server device and link to the information network database device. For example, the patented application Fangu 帛 7 automated capacity information consolidation system, where the above data is servo The device is connected to the above-mentioned time-sharing and multiplexing computer system device by using TCP / IP network communication protocol. 9. For example, the automatic capacity information integration system of the scope of patent application No. 7 in which the above-mentioned first plant database server device is Connect to the above time-division multiplexing computer system device through SQL network. 10. For example, the automatic capacity information integration system for item 7 in the scope of patent application, in which the above-mentioned first plant database server device is connected to the above-mentioned statistical data analysis server device through SQL network. Automated production capacity information integration system, in which the above-mentioned second plant database server device is connected with the above-mentioned statistical data analysis server device through TCP / IP network communication protocol. 1 2 · —A kind of optimization of product allocation The method of minimizing the total test time, the product configuration method includes at least the following steps: 20 This paper size is applicable to China A standard (CNS) A4 specifications (2) 0x297 mm> < Please read the note on the back first Please fill in this page again now) -t * nn al ϋ kδ ,, * nnn -4 Employee Consumer Cooperatives, Intellectual Property Bureau, Ministry of Economic Affairs, India ^^ 271 8 A8 B8 C8 請 先 閱 讀 背 & 之* 注1 意! 事-I 項一j 再'1 填 | ί裝 頁1 w t 訂 45271 8 A8B8C8D8 六、申請專利範圍 {it先閱讀背面之注意事項再填寫本頁) 計算所有該非基變數之該第二判別值’若該第二判別值皆 大於該基本參數值,則重新得到之分配結果即是最佳分配結 果’否則繼續尋找新的入基變數與新的出基變數,以形成一新 的鏈反應,並將該產品配置量重新分配,直到該非基變數之該 第二判別值皆大於該基本參數值為止。 13_如申請專利範圍第12項之產品配置方法,其中上述之 第一判别值係藉由計算[列數+行數]而得。 14.如申請專利範圍第12項之產品配置方法,其中上述之 第二判別值係藉由計算[基變數-第一判別值-第二判別值] 而得Q 15‘如申請專利範圍第12項之產品配置方法,其中上述之 基本參數值為一定值* 經濟部智慧財產局具工消費合作社印製 1 6 _如申請專利範圍第1 2項之產品配置方法,其中上述尋 找該基變數個數最多的列’並設定該列之第一參數值為該 基本參數值之步驟,可以尋拽該基變數個數最多的行,並 設定該行之第二參數值為該基本參數值之步驟取代。 17.如申請專利範圍第12項之產品配置方法,其中上述建 立一供需表之步驟,更包含下列步驟: 設定一集合,使該集合包含複數個影響測試時間之 22 本紙張尺度適用中國國家標準(CNS)A4规格(210x297公;S > 經 員 費 申清旱利範圍 因素; 將該集合内複數個影準測試時間之 算,以得到複數個測試情況; 素,作組合運 以符合各別該複數個测試情況所 形成-包含複數個測試時間之集合; 試時間, 將該包含複數個測試時間之集合 計算統計資料之中付軲 為蛛計母群’並 玎貢料之中位數’以作為該測 時間。 S V兄之標準測試 18.如申請專利範圍第17項之產品配 將該包含複數個測試時間之集合作為^ *、中上述之 算統計資料之中位數’以作為該測試情:之:準= 時間之步驟,更包含去除U倍内四之標準測试 之步驟。 +位距以外資料 19.如申請專利範圍第i7項之產品配置 、 J在,其中上述之 複數個影響測試時間之因素之一為礙别。 20.如夺諝專利範囡第】7項之產品配 I万法’其中上述之 複數個影響測試時間之因素之一為產品編號。 21.如t請專利範面第17項之產品配置方法,其_上述之 複數個影響測試時間之因素之一為測試機台之型 號》 I_ 23 本紙張尺度適用中覊固家標準(CNS>A4規格(210 X 297公釐》 訂 A8 B8 C8 D8Please read the back & of * Note 1 Note! Matter-I item one j then '1 fill in | tiling page 1 wt order 45271 8 A8B8C8D8 VI. Patent application scope (it read the precautions on the back before filling this page) Calculate the second discriminant value of all the non-base variables 'If the second discriminant value is greater than the basic parameter value, the distribution result obtained is the best distribution result' Otherwise, continue to find new input variables and new output variables Base variable to form a new chain reaction and redistribute the product configuration amount until the second discrimination value of the non-base variable is greater than the basic parameter value. 13_ The product allocation method according to item 12 of the scope of patent application, wherein the first discrimination value is obtained by calculating [number of columns + number of rows]. 14. The product allocation method according to item 12 of the scope of patent application, wherein the above-mentioned second discriminant value is obtained by calculating [basic variable-first discriminant value-second discriminant value] to obtain Q 15 '. Item configuration method, where the above basic parameter value is a certain value * Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Industrial and Industrial Cooperatives. The step with the most number of columns' and setting the first parameter value of the column to the basic parameter value can be found by dragging the row with the largest number of basic variables and setting the second parameter value of the row to the basic parameter value. To replace. 17. The product configuration method according to item 12 of the scope of patent application, wherein the above-mentioned step of establishing a supply and demand table further includes the following steps: Set up a set so that the set contains a plurality of 22 that affect the test time. This paper size applies to Chinese national standards. (CNS) A4 specification (210x297 male; S > staff member Shen Shen clears the range of drought benefits; calculates the number of probabilistic test times in the set to get multiple test conditions; prime, combined to meet each Do not be formed by the plurality of test cases-a set including a plurality of test times; test time, the calculation data including the set of a plurality of test times is calculated as the "spider mother group" and the median The number is taken as the test time. SV Brother ’s standard test 18. If the product in the scope of patent application No. 17 is equipped with the set containing multiple test times as ^ *, the median of the statistical data above is As the test situation: of: the step of quasi = time, and also includes the step of removing the standard test within four times U. + data other than the distance 19. such as the scope of the patent application for item i7 Product configuration, J is among them, one of the above-mentioned multiple factors affecting the test time is a hindrance. 20. Such as winning the patent scope of item 7 of the product is equipped with 10,000 methods, of which the above-mentioned multiple of the impact of the test time One of the factors is the product number. 21. If the product configuration method of item 17 of the patent scope is requested, one of the above-mentioned factors affecting the test time is the model of the test machine. I_ 23 This paper is applicable Detainer Standard (CNS > A4 Specification (210 X 297 mm) Order A8 B8 C8 D8 申請專利範圍 22.如申請專利範圍第17項之產品犯置方法,其十上述之 複數個影響測試時間之因素之一為測試機台之控制 程式。 2 3 ‘ -種標準測試時間段定方法,至少包含下列步驟: 設定一集合’使該集合包含複數個影響測試時間之 因素; 將該集合内複數個影響測試時間之因素,作組合運 算,以得到複數個測試情況; 以符合各別該複數個測試情況所對應之測試時間’ 形成一包含複數個測試時間之集合; 將該包含複數個測試時間之集合作為統計母群,並 計算統計資料之中位數,以作為該測試情況之標準測試 時間。 24_如申請專利範圍第23項之標準測試時間設定方法,其 中上述之將該包含複數個測試時間之集合作為統計 母群’並計算統計資料之中位數,以作為該測試情 況之標準測試時間之步驟,更包含去除1 · 5倍内四 分位距以外資料之步驟。 25.如申請專利範圍第23項之標準測試時間設定方法,其 中上述之複數個影響測試時間之因素之一為廠別。 24 本紙張尺度適用中國國家標準(CNS)A4规格(210 X 297公« > (請先閱讀背面之注意事項再填寫本頁) -裝 經濟部智慧財產局員Η消費合作枉印製 8888 ABCD 及52 7ί 8 、申請專利範圍 26. 如申請專利範圍第23項之標準測試時間設定方法,其 中上述之複數個影響測試時間之因素之一為產品編 號。 27. 如申請專利範圍第23項之標準測試時間設定方法,其 中上述之複數個影響測試時間之因素之一為測試機 台之型號。 28. 如申請專利範圍第23項之標準測試時間設定方法,其 中上述之複數個影響測試時間之因素之一為測試機 台之控制程式。 (請先閲讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 25 本紙張尺度適用中國國家標準(CNS)A4規格(210 * 297公釐)Scope of patent application 22. If the product infringement method of item 17 of the scope of patent application, one of the above ten factors affecting the test time is the control program of the test machine. 2 3 '-A standard test time period setting method, which includes at least the following steps: Set a set so that the set contains a plurality of factors that affect the test time; The combination of the plurality of factors that affect the test time in the set is combined to calculate Obtain a plurality of test cases; form a set including a plurality of test times in accordance with the test time corresponding to each of the plurality of test cases; use the set including the plurality of test times as a statistical mother group, and calculate the statistical data The median is used as the standard test time for this test situation. 24_ The standard test time setting method of item 23 of the scope of patent application, wherein the above set of the plurality of test times is used as the statistical parent group and the median of the statistical data is calculated as the standard test for the test situation The step of time also includes the step of removing data outside the interquartile range of 1.5 times. 25. If the standard test time setting method of item 23 of the scope of patent application, one of the above-mentioned factors affecting the test time is the factory type. 24 This paper size applies Chinese National Standard (CNS) A4 specifications (210 X 297 male «> (Please read the notes on the back before filling out this page)-Installed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperation, printed 8888 ABCD and 52 7ί 8. The scope of patent application 26. For the standard test time setting method of item 23 of the scope of patent application, one of the above factors affecting the test time is the product number. 27. The standard of scope 23 of the patent application The test time setting method, in which one of the above-mentioned factors affecting the test time is the model of the test machine. 28. For the standard test time setting method in the scope of the patent application No. 23, among the above-mentioned multiple factors that affect the test time One is the control program of the test machine. (Please read the precautions on the back before filling out this page) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economy 25 This paper size is applicable to China National Standard (CNS) A4 (210 * 297) Mm)
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7483761B2 (en) 2003-08-14 2009-01-27 Taiwan Semiconductor Manufacturing Co., Ltd. System and method of demand and capacity management
US9870547B2 (en) 2003-08-14 2018-01-16 Chung-Wen Wang System and method of demand and capacity management
US20220405769A1 (en) * 2021-06-18 2022-12-22 Inventec (Pudong) Technology Corporation Test Time Estimation Suggestion Providing System Based On Product Configuration Information And Method Thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7483761B2 (en) 2003-08-14 2009-01-27 Taiwan Semiconductor Manufacturing Co., Ltd. System and method of demand and capacity management
US9870547B2 (en) 2003-08-14 2018-01-16 Chung-Wen Wang System and method of demand and capacity management
US20220405769A1 (en) * 2021-06-18 2022-12-22 Inventec (Pudong) Technology Corporation Test Time Estimation Suggestion Providing System Based On Product Configuration Information And Method Thereof

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