TW420725B - Improved process for purification of organometallic compounds - Google Patents
Improved process for purification of organometallic compounds Download PDFInfo
- Publication number
- TW420725B TW420725B TW87121035A TW87121035A TW420725B TW 420725 B TW420725 B TW 420725B TW 87121035 A TW87121035 A TW 87121035A TW 87121035 A TW87121035 A TW 87121035A TW 420725 B TW420725 B TW 420725B
- Authority
- TW
- Taiwan
- Prior art keywords
- item
- precursor
- purification
- compound
- organic
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/301—AIII BV compounds, where A is Al, Ga, In or Tl and B is N, P, As, Sb or Bi
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4402—Reduction of impurities in the source gas
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Description
420725 Α7 Β7 經濟部中央標隼局員工消費合作社印製 五、發明説明(丨) 本發明乃有關於化學氣相蒸著法技術中所使用有機金 屬化合物之純化方法,尤其是三甲基絪的純化。 有機金鼷化合物,如三甲基絪,在Μ化學氣相蒸著法 技術,如金鼷有機氣相嘉晶(MOVPE )—被用當前驅物以 便附著一金臑薄膜於固體被覆物上,此金靨薄膜對於使用 於電子及光電產業中的半導體之製造是很重要的。 近來,高飽含量的合金組成*如AlGalnP,特別被發 展用來製造高亮度的發光二極體*它比傳統發光二極體較 省電,又可製成數種不同顔色,及衛星所使用的絪糸太陽 電池,然而,此種薄膜對於在蒸著過程可能引入的微量含 氧物種是特別敏感,存在於前驅物的典型不純物包括二乙 / .V . /V 基醚,三甲基絪-二乙基醚互屬錯合物,二甲基-甲氧基絪 I ,甲基-二甲氧基絪,及三甲氧基絪。 可能被引人前驅物的含氧物種之來源有,如用以製造 前驅物的原料或其製程中所使用之溶劑,如醚類,亦可能 自空氣中進入這些來源的容器或鼓泡器與有機金屬化合物 反應產生烧氧化物,而協助傳送已氣化前驅物至被覆物的 載送氣體也可能含有氧,與有機金鼷合物反應產生焼氧 化物。 存在於有機金屬前驅物之含氧物會随著載送氣釋之輸 送進入反應器,此反應器在裂解金靥化合物使成一金屬薄 膜之同時亦很容易將氧帶入,用此遭污染的薄膜製成的半 導體,其晶級是非常的低劣。 本發明的目標即是要克服這種有機金屬前I區物受到氧 (請先閱讀背面之注意事項再'填寫本頁) 本紙張尺度適用中國國家標準(CNS ) Α4規格(210Χ297公釐)il 42^725 A7 B7 五、發明説明(1 化物污染之問題,進而改善金屬薄膜之品質,特別是高亮 度的發光二極體及太陽電池之甩途。 因此•本發明提供一種純化有機金屬前驅物的方法, 藉由化學氣相蒸著法技術製造金麋薄膜,其中之步驟乃令 前驅物置於一容器内,導入一鎮基物,令前驅物氣化之前 驅物減少氧化物的污染。 本發明即是含有更進一步的步驟將前驅物的金屬蒸著 於被覆物上。 一般來說,前驅物是在鼓泡器中氣化,然後Μ載送氣 體,如氦氣,傳送至被塗物上。氣基溶劑較常被放入鼓泡 器,它較易與含氧物反應而自蒸氣中脫雛,因此可使前驅 物減少氧化物的污染,而此含氧物蒸氣壓的降低,可防止 其在載有前驅物的載送氣體中之傳輸,進而防止導入蒸著 薄膜内。 使用低揮發性的氨基溶劑較不易自鼓泡器被載送氣體 送出*同時,較未氣化前驅物的密度為低的鎮基溶劑亦較 易為所用,此氣基溶劑亦常置於輸送載送氣體及氣化前軀 物之管子底部上方,期使前驅物能與摄基溶劑混合接觸之 經濟部中央標準爲貝工消費合作社印製 (請先閲讀背面之注意事項再填寫本頁) 較受本發明垂愛的氨類是三烧基氨,尤其是Ν-Ν二甲 基十二基氣。 本發明特別適合Μ三甲基銦當前驅物製造姻薄膜的方 法,但其他絪化合物,例如1至4個碳的R In,亦可使用於 類似的方法;本方法也Μ用來蒸著其他金屬薄膜或混合金 本紙張尺度適用中國國家標準(CNS ) Α4規格(210Χ 297公釐) 420725 經濟部中央標隼局負工消費合作社印製 A7 B7__五、發明説明(θ ) 屬薄膜,特gfj是鼷Μ及屬v金廳薄膜,女口AlInAs與AlGalnP Ο 讁來自鼓泡器含微量氧污染物的前驅物通過鎮溶液, 這種在鎮基物裡的有機金屬前驅物溶液可用來當做捉拿者 K驅除氧不純物。 本發明提供化學氣相蒸著法技術製造低氧污染物金屬 , 薄膜,這種高品質薄膜特別適合做為太陽電池及高密度發 光二極體之裝置,瑄種薄膜可由各種化學氣相蒸善技術製 得,特sa是金屬有機氣相晶晶(MOVPE)。 本發明將以下面諸例更進一步敘述。 r }. 例一 [ΙΪ 取50克三甲基銦樣品,先MFTNMR分析其酸不純度,, 置於一玻璃鼓泡器内,再加入10克N-N二甲基十二基氧, 徐徐攬拌後,靜置12小時,再用高純度氮氣以每分鐘1公 升的速率通過下傾腳,將帶出的三甲基銦集於一玻璃接收 器,並冷卻至-2〇r: ; MFTNMR分析所收集的三甲基絪,並 與先前的比較,分析發琨先前的樣本含56PPM二甲基醚, 經處理的樣品在此儀器的精確度下無法測出醚的含量,其 精確度為7PPM。 例二 取200克三甲基銦樣品,先MFTNMR分析其含氧物種, 然後分成二份:第一份100克置於一含有17克N-H二甲基 十二基氣且經完全標準清洗過之S/S鼓泡器*第二份1〇〇克 則置於一相同完全標準清洗過之回流鼓泡器;然後,將此 (請先閲讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐)厶 42Q725 A7 B7 五、發明説明(斗) 二樣品置於一*CVT MOCVD反應器’各自做為生長A1 InAs露 晶薄_的姻來源原料,所有其他前驅物及蒸著條件均保持 一定。所得二種薄膜分析其載送氣體濃度*接著msims( Secondary Ion Mass Spectrometry )測誠嵌於薄膜的氧 Ο 初始固體三甲基因,从FTNMR分析含酸量為40PPM。 (請先閲讀背面之注意事項再填寫本頁) 經濟部中央櫺準局員工消費合作社印製 此結果很清楚表示,用Μ氣化三甲基絪的鼓泡器,若 有:基物導入,可以使氣化的前驅物降低其含氧物,進而 夜蒸著中製得較純的金靥薄膜,此乃因氨基物易與含氧物 作用,降低其蒸氣麼,進而胆礙載送氣體將其送至反應器 Ο 氧量分析 載送氣體濃度 (cm ) SIMS (cm ) 第一樣品 7X el5 <1x1077 (detection limit) 第二樣品 4 X el6 4x 1017 本紙浪尺度適用中國國家標準(CNS ) Α4規格(210X 297公釐)y
Claims (1)
- AS 公告本ρπ25 I__ P申請專利範園 1. 一種有機金靨化合物之純化改菩方法•藉由化學氣 相蒸著法技術製造金屬薄膜*其中之步驟乃令前驅物置於 一容器内,導入一截基物,令前驅物氣化並輸送雛開此容 器·此截基物可以鑲氣化之前驅物減少氧污染〇 2. 如申請専利範圍第1項所述有機金臛化合物之純化 改菩方法*包含蒸著此前驅物金靨薄膜於被播物上之步驟 〇 3. 如申誚専利範画第1項或第2項所述有機金靥化合 之純化改菩方法•歧氣基物具低揮發性。 4. 如申謫專利範圍第3項所述有機金靨化合物之純化 改巷方法,此氛基物比未氣化之前驅物密度低。 5. 如申辅專利範園第4項所述有機金靨化合物之純化 改菩方法•此截基物是三综基® 〇 6. 如申請專利範圍第5項所述有機金鼷化合物之純化 改善方法,肋截基物是N-N二甲基十二基氣。 7. 如申請専利範圍第2項或第4項或第5項或第6項 所述有機金匾化合物之純化改菩方法,此氣化之前驅物是 藉一戟送氣艘被送至被授物上。 8. 如申請專利範園第7項所述有機金围化合物之純化 改善方法· 氛基物是以溶液狀態置於容器内•使琴與含 氣物反應•逍而自蒸氣中將其驅除。 9. 如申辅専利範圃第8項所述有機金膈化合物之純化 改普方法,此氣基物是置於輸送載进氣雅及氣化前驅物之 管子底部上方。 本紙張U4用中家#準(CNS ) Λ4規格(210X297公釐)f • *~ • .·>^ (請先E讀背面之注意事項再填寫本頁) 經濟部中央慄準曷員工消费合作.ti印装 ^20725 Α% Β8 C8 D8 經濟部中央標隼局貝工消费合作社印製 六、申請專利範園 10. 如申請専利範圍第1項所述有機金屬化合物之純化 改畚方法*此前驅物是絪的有機金觴化合物。 11. 如申請専利範醣第10項所述有機金靨化合物之純化 改善方法,此前驅物是RIn,R為1至4個碳。 12·如申請專利範画第1〇項所述有機金靨化合物之純化 改畚方法,此前驅物是三甲基姻。 13♦如申誧専利範圃第1項所述有機金觸化合物之純化 改菩方法,製造屬m及雇V的金靨薄膜。 14·如申請專利範圍第1項所述有機金屬化合物之純化 改普方法•此化學氣相蒸著法技術乃金屬有機氣相磊晶( M0VPE ) 〇 15. 如申誚專利範園第1項所述有機金匾化合物之純化 改窖方法•鑲來自鼓泡器含微量氣污染物的前驅物通過氨 溶液,埴種在截基物裡的有機金觸前驅物溶液可用來當做 捉韋者,Μ驅除氧不純物〇 16. 如申請専利範晒第1項所述有機金鼷化合物之純化 改普方法,蒸著之金臁薄膜所製得的高密度發光二極雅〇 17. 如申請專利範圃第1項所述有機金圈化合物之純化 改善方法•蒸著之金雇薄膜所製得的太陽霣池。 (請先閲讀背面之注意事項再填寫本頁) 訂 ^. 本紙張尺度逋用中國國家榣率{ CNS ) Α4规格(210X 297公釐)f
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP98309286A EP1001049A1 (en) | 1998-11-13 | 1998-11-13 | Process for purification of organometallic compounds |
Publications (1)
Publication Number | Publication Date |
---|---|
TW420725B true TW420725B (en) | 2001-02-01 |
Family
ID=8235161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW87121035A TW420725B (en) | 1998-11-13 | 1998-12-17 | Improved process for purification of organometallic compounds |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1001049A1 (zh) |
DE (1) | DE1001049T1 (zh) |
TW (1) | TW420725B (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7281527B1 (en) | 1996-07-17 | 2007-10-16 | Bryant Clyde C | Internal combustion engine and working cycle |
US7222614B2 (en) | 1996-07-17 | 2007-05-29 | Bryant Clyde C | Internal combustion engine and working cycle |
US8215292B2 (en) | 1996-07-17 | 2012-07-10 | Bryant Clyde C | Internal combustion engine and working cycle |
US6956127B2 (en) | 2002-01-17 | 2005-10-18 | Shipley Company, L.L.C. | Alkyl group VA metal compounds |
US7178492B2 (en) | 2002-05-14 | 2007-02-20 | Caterpillar Inc | Air and fuel supply system for combustion engine |
US6688280B2 (en) | 2002-05-14 | 2004-02-10 | Caterpillar Inc | Air and fuel supply system for combustion engine |
US7201121B2 (en) | 2002-02-04 | 2007-04-10 | Caterpillar Inc | Combustion engine including fluidically-driven engine valve actuator |
US7191743B2 (en) | 2002-05-14 | 2007-03-20 | Caterpillar Inc | Air and fuel supply system for a combustion engine |
US7252054B2 (en) | 2002-05-14 | 2007-08-07 | Caterpillar Inc | Combustion engine including cam phase-shifting |
JP2006290889A (ja) * | 2005-04-12 | 2006-10-26 | Rohm & Haas Electronic Materials Llc | 金属含有化合物精製 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0523525B1 (en) * | 1991-07-17 | 1995-04-12 | Japan Pionics Co., Ltd. | Process for purification of gaseous organometallic compounds |
GB9116381D0 (en) * | 1991-07-30 | 1991-09-11 | Shell Int Research | Method for deposition of a metal |
US5322573A (en) * | 1992-10-02 | 1994-06-21 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | InP solar cell with window layer |
-
1998
- 1998-11-13 EP EP98309286A patent/EP1001049A1/en not_active Withdrawn
- 1998-11-13 DE DE1998309286 patent/DE1001049T1/de active Pending
- 1998-12-17 TW TW87121035A patent/TW420725B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1001049A1 (en) | 2000-05-17 |
DE1001049T1 (de) | 2000-11-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW420725B (en) | Improved process for purification of organometallic compounds | |
US5232869A (en) | Metal deposition | |
Jones | Developments in metalorganic precursors for semiconductor growth from the vapour phase | |
Miehr et al. | The first monomeric, volatile bis‐azide single‐source precursor to Gallium nitride thin films | |
EP0134947A1 (en) | Method and apparatus for improved gettering for reactant gases | |
Lum et al. | Comparison of alternate As-sources to arsine in the MOCVD growth of GaAs | |
Masuda | Mist CVD growth of ZnO-based thin films and nanostructures | |
Stauf et al. | Low‐temperature organometallic vapor phase epitaxy of InSb using the novel Sb precursor triisopropylantimony | |
Swaminathan et al. | Characterization of GaAs films grown by metalorganic chemical vapor deposition | |
Cheng et al. | Effects of Precursor‐Substrate Distances on the Growth of GaN Nanowires | |
JPH04318920A (ja) | 気相結晶成長装置 | |
Hahn et al. | Photoassisted growth and nitrogen doping of ZnSe | |
Park et al. | First Approach to an AlSb Layer from the Single‐Source Precursors [Et2AlSb (SiMe3) 2] 2 and [iBu2AlSb (SiMe3) 2] 2 | |
WO2002040752A2 (en) | Process for producing iii-v compound films by chemical deposition | |
Hirose et al. | Atomic layer epitaxy of AlAs and (AlAs) n (GaAs) n superlattices with a new aluminum source ethyldimethylamine alane | |
Park et al. | Growth of GaAs by Chemical Beam Epitaxy Using Unprecracked Arsine and Trimethylgallium | |
US4999223A (en) | Chemical vapor deposition and chemicals with diarsines and polyarsines | |
JPS63500757A (ja) | 有機金属源及び元素状プニクチド源を利用する3−5型半導体の化学気相成長方法及び装置 | |
Zhou et al. | Gas-phase parasitic reactions and Al incorporation efficiency in light radiation heating, low-pressure metal–organic chemical vapor deposition of AlGaN | |
JPH07300398A (ja) | IIIb−Vb族化合物の合成法 | |
Topf et al. | Low Pressure CVD of GaN from GaCl3 and NH3 | |
JP2717623B2 (ja) | 膜形成材料及び膜形成方法 | |
JP2506046B2 (ja) | Ga系膜形成材料及びGa系膜形成方法並びにGa系膜 | |
Hasegawa et al. | Vapor phase epitaxial growth of AlAs by chloride transport method | |
Vértes et al. | Emission Mössbauer study of the interface between a cobalt substrate and a polyimide coating |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent | ||
MM4A | Annulment or lapse of patent due to non-payment of fees |