TW395126B - Semiconductor device of detecting the physical quantity distribution driving method and manufacturing method thereof - Google Patents
Semiconductor device of detecting the physical quantity distribution driving method and manufacturing method thereof Download PDFInfo
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- H—ELECTRICITY
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- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
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- H10F39/15—Charge-coupled device [CCD] image sensors
- H10F39/153—Two-dimensional or three-dimensional array CCD image sensors
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- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/766—Addressed sensors, e.g. MOS or CMOS sensors comprising control or output lines used for a plurality of functions, e.g. for pixel output, driving, reset or power
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
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Abstract
Description
經濟部中央標準局員工消费合作社印製 B7______ 五、發明説明() 本發明的另一物理量分布之半導體裝置,備有由Jiii 之行與Μ個之列配列成立領域(N及Μ爲2以 ------ —· —— 上之自然數),該複數之單位領域中的每一個包含有··偵測 儲荐部,具有用以偵測物理量的偵測元件,與用以儲 該偵測元件麻廣齒得έ物理量資訊的儲存元件;及重定元 件,用以將儲存元件予以重定。該裝置又備有·:行選擇功能 部,用以由該Ν個之行選擇至少一行;及Μ列之緩衝器部, 可偵測出屬於該被選擇之行的偵測儲存部內”乏簠差茜件年 一 . ; ·.一-"S7T7 ' 儲存的_,而予吳1@琴^個之選擇輸出傳達線_丄用 以蔣該行選擇功能部P輸出信號傳達至該N個之行;該Μ 列之緩衝器部之電源輸λ部係被連接於該Ν個之選擇輸出 傳達線,可介由該被選擇之行的該選擇輸出傳達線而接受 電源電壓。 本發明的又另一偵測理量_分布_名$導釁®置,備有: 偵測儲存部置於齒則_內之複數的單位領^中 的各單位領域,'真ΪΜΙϊΜϋΜΐ妾受乏W理—量的禎測元 件,及用以儲存所偵測得之物理量資訊的儲存元件;複數 之緩衝器部,分配於該偵測儲存部,用以偵測出儲存於該 對應之偵測儲存部的儲存元件中的資訊,而.无以_出;鸟 選擇功能部,用以選擇該偵測儲存部。_麗之糧11 器部 包含用以控制流過該緩衝器部內之電流的電流控制元件、; 該雷流桦葡丨Heggfjp[入部係連接於該選擇功能部的輸 出部,僅只予由該選擇功能部存部 的緩衝罨部才發生動作。 (請先閱讀背面之注意事項再填寫本頁) οPrinted by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs B7______ 5. Description of the Invention () Another semiconductor device with a physical quantity distribution according to the present invention is provided with a field established by Jiii's line and M lines (N and M are 2 to- ----- — · —— natural numbers above), each of the plurality of unit fields includes a detection and recommendation section, which has a detection element for detecting a physical quantity, and a detection element for storing the detection A storage element for the physical quantity information of the element Ma Guangtou; and a reset element for resetting the storage element. The device is also provided with: a row selection function section for selecting at least one row from the N rows; and a buffer section of the M row, which can detect the lack of the detection storage section belonging to the selected row. The difference is one year .; · .One-" S7T7 'Stored _, and the Wu 1 @ 琴 ^ 个 的 choose output transmission line _ 丄 is used to convey the output signal of the selection function P of the bank to the N The power supply lambda section of the buffer section of the M column is connected to the N selection output transmission lines, and can receive the power supply voltage through the selection output transmission line of the selected line. Yet another detection quantity_distribution_ 名 $ 引 衅 ® is equipped with: Detects each unit field in the plural unit collars ^ placed in the teeth_ —Quantity measuring element and storage element for storing the detected physical quantity information; a plurality of buffer sections are allocated to the detection storage section for detecting and storing in the corresponding detection storage section The information in the storage component of the device is not available. The bird selection function is used to select the detection storage section. The grain 11 device section includes a current control element for controlling the current flowing in the buffer section; the thunder current 丨 Heggfjp [The input section is connected to the output section of the selection function section, and only the selection function section The buffering crotch of the storage department only moves. (Please read the precautions on the back before filling this page) ο
,1T -β 本紙張尺度適州中囡H3家標準(CNS )八心見格(2!〇x 297公f ) 經濟部中央標準扃員工消費合作社印製 A7 ____B7____ 五、發明説明() 本發明的又另一偵測物理量分布之半導體裝置 由N個之行與Μ個之列配列成的複數之單位領域 以上之自然數,而Μ爲2以上之自然數),該複數之單位 領域中的每一個包含有:偵測儲存部,具有用以偵測物理 量的偵測元件,與用以儲存由該偵測元件所偵測得之物理 量資訊的儲存元件;及重定元件,用以將儲存元件予以重 定。該裝置備有冽選擇功能部,用以由該Μ個之列選擇至 少一列;及Μ列之緩衝器部,可偵測电屬H變键養夢之烈 的偵測儲存部內之儲存元件中儲存的薈而予以騎1出~; --,,|| - - - —一-------- 各該緩gj器部:¾有電jg控制選擇功能部之輸 出部係被連接於該緩衝器部的該電流控制元ϋ輸入部。 · . , - - ...........—、 本發明的又另一偵測^理量分布之半導體裝置,備有 由Ν個之行與Μ個之列配列成的複數之單位領域(Ν爲1 以上之自然數,而Μ爲2以上之自然數),該複數之單位 領域中的每一個包含有:偵測儲存部,具有用以偵測物理 量的偵測元件,與用以儲存由該偵測元件所偵測得之物理 量資訊的儲存元件;及重定元件,用以將儲存元件予以重 定;該裝置備有:列選擇功能部,用以由該Μ個之列選擇至 少一列;Μ列之緩衝器部,可偵測出屬於該被選擇之列的 偵測儲存部內之儲存元件中儲存的資訊,而予以輸电;元 件輸出部,用以將由該緩衝器部的輸出部輸出之信號予以 -- — · ~ 輸出,至孟件外部猶患信^傳達線.,直接或介由阻抗變搡 部連接於該元.及切換元性JL使電流流過虫該列 選擇功能部所笔列的gfpg部內-〇 V· 6 ^^7^^中阀國家標準(CNS ) Λ4说格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) Λν 訂 經濟部中央標準局員工消費合作社印製 A7 B7 ---—---- - 五、發明説明() 依本發明的偵測物理量分布之半導體裝置的驅動方 法,該偵測物理量分布之半導體裝置包含:偵測儲存部, 具有配置於複數個單位領域內之每一個用以偵測物理量的 偵測元件,與用以儲存由該偵測元件所偵測得之物理量資 訊的儲存元件;及緩衝器部,用以偵測儲存於該偵測儲存 部的儲存元件的資訊並予輸出;用以選擇該複數個之單g 領域的一部分之選擇功能部的選擇輸3¾達 器部的電源輸入部作電性連接;於此驅動方法中」讀出行 選擇係藉由將電源電壓供給至應琴擇之行的該緩& 器部而 施行之。 本發明的又另一偵測物理量分布之半導體裝置的驅動 方法,該偵測物理量分布之半導體裝置包含:偵測儲存 部,具有配置於複數個單位領域內之每一個用以偵測物理 量的偵測元件,與用以儲存由該偵測元件所偵測得之物理 量資訊的儲存元件;及緩衝器部,用以偵測儲存於該偵測 儲存部的儲存元件的資訊並予輸出;用以選擇該複數個之 單位領域的一部分之第1選擇功能部的選擇輸出傳達線係 與該緩衝器部的電源輸入gg俺電性建接了於_匙噩動方法 中,第η行的讀出行選擇係與第(η-1)行的蓽定選搔园時進 行。 '本發明的又另一偵測物理量分布之半導體裝置的驅動 方法,該偵測物理量分布之半導體裝置包含:偵測儲存 部,具有配置於複數個單位領域內之每一個用以偵測物理 量的偵測元件,與用以儲存由該偵測元件所偵測得之物理 7 本紙張尺度適州中國Η家標準(CNsYa4規格(2^297公漦) 一 ' — (請先閲讀背面之注意事項再填寫本頁} i, 1T -β This paper is in the state of Shizhou. H3 Standards (CNS) Eight Hearts (2! 0x 297gf) Central Standards of the Ministry of Economy 扃 Printed by the Consumer Consumer Cooperative A7 ____B7____ 5. Description of the Invention And another semiconductor device that detects the distribution of physical quantities is composed of N rows and M columns in a complex unit field above a natural number and M is a natural number above 2). Each includes: a detection storage unit, which has a detection element for detecting a physical quantity, and a storage element for storing physical quantity information detected by the detection element; and a resetting element, which stores the storage element Be redefined. The device is provided with a 冽 selection function section for selecting at least one row from the M rows; and a buffer section of the M row, which can detect the storage element in the detection storage unit of the electric H-key key to raise the dream Stored to ride 1 out ~; ,, ||------------- Each slow gj part: ¾ The output part of the electric jg control selection function part is connected The current control element input section of the buffer section. ·,--...........-, yet another semiconductor device for detecting the ^ quantity distribution of the present invention, which is provided with a complex number composed of N rows and M rows Unit fields (N is a natural number of 1 or more, and M is a natural number of 2 or more), each of the plurality of unit fields includes: a detection storage section having a detection element for detecting a physical quantity, And a storage element for storing physical quantity information detected by the detection element; and a resetting element for resetting the storage element; the device is provided with: a row selection function section for selecting from the M rows Select at least one row; the buffer section of row M can detect the information stored in the storage elements in the detection storage section belonging to the selected row and transmit power; the element output section is used to transfer the information from the buffer section The output signal of the output part is given to the output signal to the outside of the Meng piece. It is connected to the element directly or through the impedance changing part. And the switching of the elementary JL causes the current to flow through the insect. Gfpg within the column selection function department-0V · 6 ^^ 7 ^^ National Valve National Standard (CNS) Λ4 Grid (210X297mm) (Please read the notes on the back before filling this page) Λν Order printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 ------------5. Description of the invention () An invented driving method of a semiconductor device for detecting a physical quantity distribution. The semiconductor device for detecting a physical quantity distribution includes: a detecting storage section, each of which has a detecting element arranged in a plurality of unit fields for detecting a physical quantity, and A storage element for storing physical quantity information detected by the detection element; and a buffer section for detecting and outputting information of the storage element stored in the detection storage section; for selecting the plurality of The selection of a part of the selection function part of the field g is electrically connected to the power input part of the sensor part; in this driving method, the "read line selection" is performed by supplying the power supply voltage to the line that should be selected by Ying Qin. Relief & organ and implement it. According to still another driving method of a semiconductor device for detecting a physical quantity distribution according to the present invention, the semiconductor device for detecting a physical quantity distribution includes a detection storage unit having a detection unit for detecting a physical quantity disposed in each of a plurality of unit fields. A measuring element, and a storage element for storing physical quantity information detected by the detection element; and a buffer section for detecting and outputting information of the storage element stored in the detection storage portion; The selection output transmission line of the first selection function section, which selects a part of the plurality of unit fields, is electrically connected to the power input gg of the buffer section. The readout line of the n-th line is electrically connected to the key operation method. The selection system is performed when the selected garden is selected in line (η-1). 'Another method for driving a semiconductor device for detecting a physical quantity distribution according to the present invention, the semiconductor device for detecting a physical quantity distribution includes: a detecting storage section having each of a plurality of unit fields configured to detect a physical quantity; Detecting element, and used to store the physical detected by the detecting element. 7 paper sizes. Applicable to China Standards (CNsYa4 specification (2 ^ 297 cm)). 1 '-(Please read the precautions on the back first. Refill this page} i
'1T - . .- .11 ,-:-:-.-- -- —I— I . A7 A7 經濟部中央標準局員工消費合作社印製 五、發明説明() 量資訊的儲存元件;及緩衝器部,用以偵測儲存於該偵測 儲存部的儲存元件的資訊並予輸出;用以選擇列之第2選 擇功能部的輸出部係與該緩衝器部的電源控制元件之輸入 部相連接;於此驅動方法中,別選擇及被選擇之列的該緩 衝器部之電流之控制係在同1定释施行之π' 本發明的又另一偵測物理量分布之半導體裝置的驅動 方法,該偵測物理量分布之半導體裝置包含:偵測儲存 部,具有配置於複數個單位領域內之每一個用以偵測物理 量的偵測元件,與用以儲存由該偵測元件所偵測得之物理 量資訊的儲存元件;及緩衝器部,用以偵測儲存於該偵測 儲存部的儲存元件的資訊並予輸出;於第m列之該緩衝器 _ -T- 部的電流控制電路之第一輸入部連第(m-a)列(但泛1) 之列選擇功能部之輸出部,而於第二連接著第(m-b) 列(但b 21)之歹[J選擇功能部之塗g部;於此驅動方法中,. 第m列該緩衝器部的電流在第(m-a)列選擇時升高,而在第 (m-b冽選擇時降低。 一一 '一上_ — 依本發明的偵測物理量分布之半導體裝置的製造方 法,該偵測物理量分布之半導體裝置備有由N個之行與Μ 個之列配列成的複數之單位領域(Ν及Μ爲2以上之自然 數),該複數之單位領域中的每一個包含有:偵測儲存部,具 有用以偵測物理量的偵測元件,與用以儲存由該偵測元件 所偵測得之物理量資訊的儲存元件;及重定元件,用以將 儲存元件予以重定。該裝置又備有:行選擇功能部,用以由 該Ν個之行選擇至少一行;'Μ列之緩衝器部偵Μ出屬 (請先間讀背面之注意事項再填寫本頁) --訂 --Φ, 本紙張尺度適用中辑國家標卑(「NS ) Μ坭格(21()Χ297公漦) 經濟部中央標準局員工消費合作社印製 A7 B7 _ 五、發明説明() 於該被選擇之行的偵測儲存部內之儲存元件中儲存的資 訊,而予以輸出;及N個之選擇輸出傳達線,用以將該行 選擇功能部的輸出信號傳達至該N個之行;該Μ列之緩衝 器部之電源輸入部係被連接於該Ν個之選擇輸出傳達線, 可介由該被選擇之行的該選擇輸出傳達線而接受電源電 壓;該Μ列之緩衝器部的每一個均具有源極輸出電路,該 源極輸出電路包含:複數之驅動元件,分配予對應之列內之 單位領域;及連接於該複數之驅動元件中的至少一個之負 載元件。於此製造方法中,每貪:¾成該選擇輸出傳達線的 步驟;及形成連接复數之驅動元-侔與該負載元性之配線 的步驟;該兩步驟形成位準互異之配線。 圖式之簡單說明 圖1爲顯示依本發明的偵測物理量分布之单導體裝屢. 之_ 1實施形態的檸成之圖式-。 .圖2爲顯岙圖1的裝置之驅動方法的定時匱。 f圖3爲顯示依本發明的裝置之第2寘施形態跑_成之、 圖式。 圖4爲顯示依本發明的裝置之第3.實施形態的搆成之 圖式。 圖5顯示圖4的裝置之驅動友法的定時圖-。 圖ό爲顯示依本發明的裝置之第I賓施形態的.構成之 圖式。'1T-. .- .11,-:-: -.-- --- I- A. A7 A7 Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5.Inventory () Storage elements for quantity information; and buffers An output unit for detecting a storage element stored in the detection storage unit and outputting it; an output unit for selecting a second selection function unit is similar to an input unit of a power control element of the buffer unit; Connection; in this driving method, the current control of the buffer portion of the selected and selected columns is controlled at the same π ', and is another driving method of the semiconductor device for detecting the physical quantity distribution of the present invention The semiconductor device for detecting the physical quantity distribution includes: a detecting storage section, each of which has a detecting element for detecting a physical quantity arranged in a plurality of unit fields, and is used for storing the detected by the detecting element Storage element of physical quantity information; and a buffer unit for detecting and outputting information of the storage element stored in the detection storage unit; and the current control circuit of the buffer _ -T- unit in the m column. The first input part is in column (ma) (but pan 1) The output section of the function selection section is connected to the second section (mb) of the (mb) column (but b 21). [J section of the selected function section; in this driving method, the buffer section of the mth column. The current increases when column (ma) is selected, and decreases when column (mb 冽) is selected. One by one, one by one — The method of manufacturing a semiconductor device for detecting a physical quantity distribution according to the present invention, the detected physical quantity distribution The semiconductor device is provided with a plurality of unit fields (N and M are natural numbers of 2 or more) arranged by N rows and M rows. Each of the plurality of unit fields includes: a detection storage unit , Having a detecting element for detecting a physical quantity, and a storage element for storing physical quantity information detected by the detecting element; and a resetting element for resetting the storage element. The device is further provided with: The row selection function section is used to select at least one row from the N rows; the buffer section of column M detects the belonging (please read the precautions on the back before filling this page) --order--Φ, this Paper scale applies to the National Series of Standards ("NS") (21 () × 297 cm) Central of the Ministry of Economic Affairs Printed by the Consumer Bureau of Standards Bureau A7 B7 _ V. Description of the invention () The information stored in the storage element in the selected store's detection storage department is outputted; and N selection output transmission lines are used for The output signals of the row selection function section are transmitted to the N rows; the power input section of the buffer section of the M column is connected to the N selection output transmission lines, and can be transmitted through the selected row. The selected output transmission line receives a power supply voltage; each of the buffer sections of the M column has a source output circuit, the source output circuit includes: a plurality of driving elements allocated to the unit fields in the corresponding column; and A load element connected to at least one of the plurality of drive elements. In this manufacturing method, each step: forming a step of selecting the output transmission line; and forming a step of connecting a plurality of driving elements- 侔 and the load element wiring; the two steps form wirings of mutually different levels. Brief Description of the Drawings Figure 1 is a diagram of a single conductor assembly showing the detection of physical quantity distribution according to the present invention. Figure 2 shows the timing of the driving method of the device of Figure 1. f FIG. 3 is a diagram showing a second arrangement form of the device according to the present invention. Fig. 4 is a diagram showing the structure of a third embodiment of the apparatus according to the present invention. FIG. 5 shows a timing diagram of the driving friend method of the device of FIG. 4. Figure 6 is a diagram showing the structure of the first Binsch form of the device according to the present invention.
圖7爲顯示依本發明的裝置之第·5-窶施形態的構成SL 9 本紙張尺度適川中囤闽家標準((:邓)八4現格(2丨0>< 297公產) (.請先閲讀背面之注意事項再填寫本頁) > A7 B7 五、發明説明() ..圖式。 圖8爲顯示依本發明的裝置之第6實施形態的構成之. 圖式。 圖9爲顯示依本發明的裝置之第7實施形態的構成之 圖式。 圖10爲顯示依本發明的裝置之第8實施形態的構成之 圖式。 .圖11顯示圖9及圖10所示裝置之驅動方法的定時 圖'。 ( 圖12爲顯示習用的偵測物理量分布之半導體裝置之 圖式。 符號之說明 31〜攝影區域 32〜像素 經濟部中央標隼局員工消費合作社印製 (請先閱讀背面之注意事項再填寫本頁) 33〜光電變換儲存部 34〜閘極部 35〜驅動電晶體 36〜行選擇移位暫存器 37〜輸出部 38〜選擇行驅動部 39〜選擇行驅動電壓輸入部 40〜選擇行驅動電晶體 41〜選擇行電源供給線 10 本紙張尺度適州中國國家標準(CNS ) Λ4規格(210X 297公釐) A7 B7 經濟部中央標準局員工消費合作社印製 五、發明説明() 1 i 42〜電晶體 1 Ί 43〜垂直信號線 -1 -I 44~負載電晶體 1 請- 45〜第二電源電壓(Vss)端子 先丨 閱 丨 讀 1 71 46〜,極輸入部 1 1 J 1 49〜像素重定電壓供給線 泛1 5 1 50〜列選擇移位暫存器 ' 事1 項 1 再 51〜輸出部 J k. 52〜列選擇驅動部 ί 1 一 1 53〜信號列選擇電晶體 1 I 54〜水平信號線 ? 1 1 55〜阻抗變換部 .丨 訂 56〜輸出部 1 一 1 58〜重定電壓輸入部 1 I 59〜選擇行重定驅動電晶體 、 1 1 i 60〜像素重定電晶體 丄 〇 63〜行選擇驅動電壓· . 1 | 64〜電壓基準點 丨 ; 1 I 65〜行選擇電壓 - ' . 1 1 66〜行選擇電壓 丨 * 1 67〜列選擇電壓 -1 -| 68〜列選擇電壓 1 - ί 69〜列選擇電壓 ^ 1 1 70〜輸出電壓 ,1 ! 1 11 . 1 本紙張尺度適问中阀1¾苳標準(rNS ) Λ4規格(21 ox 297公f ) 經濟部中央標準局員工消费合作社印製 A7 B7 五、發明説明() 71~重定電壓 72〜列選擇脈衝 73〜列選擇脈衝 74〜列選擇脈衝 75〜輸出 76〜重定脈衝 79〜選擇行電源供給線 80〜像素重定電晶體 81〜行重定時鐘信號 82〜重定時鐘信號 91〜列選擇驅動部 92〜列選擇電晶體 93〜水平信號線 95〜電流控制列選擇電晶體 97〜電流控制選擇電壓產生電路部 98〜第一輸入部 99〜第二輸入部 1 〇〇〜電流控制選擇電壓輸出部 1 〇 1〜電流控制選擇電壓產生電路部 102〜第一電源輸入部〇^幻- 103〜第二電源輸入部(Vss) 104〜第一輸入部 105〜第二輸入部 106〜輸出部 (請先閱讀背面之注意事項再填寫本頁)FIG. 7 shows the composition of the device according to the present invention in the form of the 5th-fifth application SL 9 paper size suitable for the Sichuan family standard ((: Deng) 8 4 present grid (2 丨 0 > < 297 public product) ( (Please read the notes on the back before filling out this page) > A7 B7 V. Description of the invention () .. Figure. Figure 8 shows the structure of the sixth embodiment of the device according to the present invention. 9 is a diagram showing the structure of the seventh embodiment of the apparatus according to the present invention. FIG. 10 is a diagram showing the structure of the eighth embodiment of the apparatus according to the present invention. FIG. 11 shows FIGS. 9 and 10 Timing chart of the driving method of the device '. (Figure 12 is a diagram showing a conventional semiconductor device for detecting the distribution of physical quantities. Explanation of symbols 31 ~ Photographing area 32 ~ Printed by the Consumers' Cooperative of the Central Bureau of the Ministry of Economic Affairs (Please Read the precautions on the back before filling in this page) 33 ~ Photoelectric conversion storage section 34 ~ Gate electrode section 35 ~ Drive transistor 36 ~ Row select shift register 37 ~ Output section 38 ~ Select row drive section 39 ~ Select row Drive voltage input section 40 to select a row drive transistor 41 to select Line power supply line 10 This paper is in accordance with China's National Standard (CNS) Λ4 size (210X 297 mm) A7 B7 Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of the invention () 1 i 42 ~ Transistor 1 Ί 43 ~ vertical signal line-1 -I 44 ~ load transistor 1 please-45 ~ second power voltage (Vss) terminal first read 丨 read 1 71 46 ~, pole input section 1 1 J 1 49 ~ pixel reset voltage supply Line pan 1 5 1 50 ~ column selection shift register 'thing 1 item 1 then 51 ~ output section J k. 52 ~ column selection driving section ί 1 1 53 ~ signal column selection transistor 1 I 54 ~ horizontal signal Line 1 1 55 ~ impedance conversion unit. 丨 Order 56 ~ output unit 1 1 1 58 ~ reset voltage input unit 1 I 59 ~ select line reset drive transistor, 1 1 i 60 ~ pixel reset reset transistor 丄 63 ~ row Select drive voltage ·. 1 | 64 to voltage reference point 丨; 1 I 65 to row selection voltage-'. 1 1 66 to row selection voltage 丨 * 1 67 to column selection voltage -1-| 68 to column selection voltage 1- ί 69 ~ column selection voltage ^ 1 1 70 ~ output voltage, 1! 1 11. 1 paper size Questionnaire valve 1¾ 苳 standard (rNS) Λ4 specification (21 ox 297 male f) Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention 71) Resetting voltage 72 ~ Column selection pulse 73 ~ Column selection pulse 74 to column selection pulse 75 to output 76 to reset pulse 79 to select row power supply line 80 to pixel reset transistor 81 to row reset clock signal 82 to reset clock signal 91 to column selection drive unit 92 to column selection transistor 93 to Horizontal signal line 95 to current control column selection transistor 97 to current control selection voltage generation circuit section 98 to first input section 99 to second input section 1 〇〜 current control selection voltage output section 1 〇1 to current control selection voltage Generation circuit section 102 ~ first power input section 〇 ^ -103 ~ second power input section (Vss) 104 ~ first input section 105 ~ second input section 106 ~ output section (please read the precautions on the back before filling (This page)
本紙張尺度適用中國囡家標卒(CNS ) Λ4規格(210X 297公釐) 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明() 110〜列選擇電壓 111〜列選擇電壓 112〜列選擇電壓 113〜列選擇脈衝 114〜列選擇脈衝 115〜列選擇脈衝 116〜電流控制列選擇電壓 117〜電流控制列選擇電壓 118〜電流控制列選擇電壓 119〜電流控制列選擇脈衝 120〜電流控制列選擇脈衝 121〜電流控制列選擇脈衝 較佳實施例之說明 以下,參照附圖說明依本發明的偵測物理量分布之半 導體裝置及其驅動方法的實施形態。 (第1實施形態) 圖1爲顯示依本發明的偵測物理量分布之半導體裝置 之第1實施形態的構成之圖式。此一裝置爲單位領域係作 二次元方式配列的固體攝影裝置。 _ 在攝影區域(物理量偵測儲存領域內,有複數之像 素(單位領域)32作行及列狀配置。於圖1中,顯至像素的 第(η:1}ί〒二襄n行、第行二丨_)列、.第卫列丄第 (m+1)列(但是η、m爲正整數)。各像素32包含_備有光 - - _ ......I . _______________- ----—~ ' 一 13 (請先閱讀背面之注意事項再填寫本頁)This paper size is applicable to the Chinese Standard Soldier Standard (CNS) Λ4 specification (210X 297 mm) Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention () 110 ~ Column selection voltage 111 ~ Column selection voltage 112 ~ Column selection voltage 113 ~ Column selection pulse 114 ~ Column selection pulse 115 ~ Column selection pulse 116 ~ Current control column selection voltage 117 ~ Current control column selection voltage 118 ~ Current control column selection voltage 119 ~ Current control column selection pulse 120 ~ Current control Column Selection Pulse 121 ~ Current Control Column Selection Pulse Description of Preferred Embodiments Hereinafter, embodiments of a semiconductor device for detecting a physical quantity distribution and a driving method thereof according to the present invention will be described with reference to the drawings. (First Embodiment) Fig. 1 is a diagram showing the structure of a first embodiment of a semiconductor device for detecting a physical quantity distribution according to the present invention. This device is a solid-state imaging device arranged in a two-dimensional manner in the unit field. _ In the photographing area (physical quantity detection storage area, there are a plurality of pixels (unit area) 32 arranged in rows and columns. In Figure 1, the (η: 1) ί〒 二 xiangn row, Row 2 丨 _),. Guardian 丄 Column (m + 1) (but η and m are positive integers). Each pixel 32 contains _with light--_ ...... I. _______________ -----— ~ '13 (Please read the notes on the back before filling this page)
、1T 本紙張尺度適川中囤闫家標卑(CNS ) Λ4規格(210乂29?公釐) 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明() 電變換元件與電荷儲存冗_光電變換儲存部33 ;備有閘 __ — 一 _ . —— _ .,ιι· "—“ - · 極部34的驅動電晶體35 J及像素重定璽晶體60。 行選擇移位暫存詻36 j複數之行順g選擇一行。在行 選擇移位暫存器% Φ,分配給應選擇之€的輸出部T7之 電位,使對應之選擇行驅動部38內所設之選擇行驅動霉晶 體40導通。依此方式,行選擇栘位暫存#制設於選 擇行驅動部38內之選擇行驅動電晶體40的蔓通/¾導通, 由於自選擇行驅動電壓輸入部39施加有第一電源電壓 (Vdd)J令選擇行驅動電晶體40,一旦選擇行驅動電晶體40 導通,選擇行驅動電晶體40之輸出即與電源重爾(Vd办 實質上相等之値。選擇行驅動電晶體_4〇之輸出經選擇行電 源供給線41被供給至各像素32之驅動電晶體$二換胃 之,依本實施形態,電源電壓僅供Ιί至成^讀出^像的被 選擇之行。對於未被選擇之行,則不撰語^;涵_ 各像素內之驅動電晶體35的電源輸;令:¾ 配給該像素所屬之「行」的選擇行電源供給線41。又,各 像素內之驅動電晶體35的輸出部,係介由分配給該像素所 屬之「列」垂直信號^ 43而連接於負載電晶體44。負 載電晶體44被連接於第Elfef^jtCVss)端子45及_亟輸 入部46。隨著儲存於光電變換儲€部3Γ的信gi荷而變 III . , 一一 一 - · _1 — - * 化之光電變換儲存部傳 之閘極部34 〇驅動電晶體載電晶體44形成f爲緩 衝器的源極輸出電路,取決於信號於 垂直信號線43上。 14 本紙張尺度適用中阀國家標绛(CNS ) Λ4規格(?」〇κ 297公麓) (請先閲讀背面之注意事項再填寫本頁)、 1T This paper is suitable for Yanjiabiaobei (CNS) in the middle of Sichuan. Specification Λ4 (210 乂 29? Mm) Printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs. A7 B7 5. Description of the invention () Electrical conversion element and charge storage redundant The conversion storage section 33 is provided with a gate __ — — _. —— _., Ι · " — “-· The driving transistor 35 J of the pole portion 34 and the pixel resetting crystal 60. Row selection shift temporary storage 詻36 j selects a row in the order of g. Selects a shift register% Φ in the row, and assigns the potential of the output section T7 to be selected, so that the corresponding selected row driving section 38 in the selected row driving section 38 drives the mold. The crystal 40 is turned on. In this way, the row selection bit temporary storage # is made of the selected row driving transistor 40 in the selected row driving section 38, and since the self-selected row driving voltage input section 39 applies the first A power supply voltage (Vdd) J causes the selection of the row driving transistor 40. Once the selection of the row driving transistor 40 is turned on, the output of the selection of the row driving transistor 40 is substantially equal to the power source (Vd Office. Selecting the row driving transistor) The output of crystal_4〇 is selected by the power supply line 41 of the selected row. The driving transistor $ 2 supplied to each pixel 32 is replaced by the stomach. According to this embodiment, the power supply voltage is only selected for reading the image. For the unselected line, no wording is given. ; _ _ The power supply of the driving transistor 35 in each pixel; let: ¾ The power supply line 41 for the selected row allocated to the "row" to which the pixel belongs. In addition, the output part of the driving transistor 35 in each pixel is a medium The "transistor" vertical signal ^ 43 assigned to the pixel is connected to the load transistor 44. The load transistor 44 is connected to the Elfef (jtCVss) terminal 45 and the input unit 46. It changes with the letter gi stored in the photoelectric conversion storage section 3Γ. III,, one by one-· _1 —-* The gate section 34 passed by the photoelectric conversion storage section drives the transistor carrier crystal 44 to form f The source output circuit of the buffer depends on the signal on the vertical signal line 43. 14 This paper size applies to the national valve national standard (CNS) Λ4 specification (? "〇κ297297) (Please read the precautions on the back before filling this page)
五、發明説明 Λ7 B7 經濟部中央標隼局—工消費合作社印紫 列選擇移位暫存器50藉由其輸出部51之電壓,使分 配給應選擇之列的列選擇驅動W 52竹之信號列選擇電晶 體53導通。其結果,屬於被選擇之列的垂直信號線4_3:1 之電位,亦即源極輸出電路的輸出乃被連接於水平信號線 54 °此一輸出經由阻抗變換部(輸出緩衝器)55 至輸 出部 56。 · 一_ 在將來自各像素的信號輸出後,依遐由重定電壓輸人 部58所施加之重定信號,選擇行重定驅動電發生 動作,在像素重定電壓供給線49裏象害重定電晶 體60隨著供給至像素重定亀壓供給線, 將儲存5^3^__換儲存部33之信號電荷无以熏定。再度開 始信號電荷之儲存。 依lEt—fftS ’電源電力經由選擇行電源供給線41,而 被供給至由驅動電晶體35及負載電晶體44所構成之源極 輸出電路。因此,乃不須如習用例\之電癒屏給線17(圖12), 裝置之電路構成遵以簡化。 依本實施形態,由於施加於通遅行驅動重麗輸入部i9 的電,電壓Vdd,不令其雙小β卩用作爲p亟輸忠電路的電 源' 1文宜使用所謂嵌入型董晶^乍爲i擇行驅動電晶體 40 °又’使用自舉電路亦可獲得相同效果。 以下’除了圖1之外更參照圖2以說明本胃碑形態之 裝置®Bff。 一 一’一’一… 圖2顯示在第n行被選擇期間61與第(n+l)行被選擇期 間62的各信號波形。 15 本紙張尺度適用中0陶( ( NS ) Λ4現格(2丨〇 X 297公费) (請先閲讀背面之注意事項再填寫本頁) ο. .n 、1τ __ A7 B7 五、發明説明() 行選擇驅動電壓63爲施加於圖1之選擇行驅動電壓輸 入部39的電源電壓Vdd。數字符號64„表示行選擇驅動電 壓63的電壓基準點(0V)。在選擇第η行之期間61,献入 至第η行之選擇行電源供給線41的行選擇電壓65成爲 「high」,在選擇第(η+l)行之期間62,饋入至第(η+1)行 之選擇行電源供給線41的行選擇電壓66成爲^ high」。 以下,就第η行被選擇之情形,詳述裝置的||重力。 經濟部中央標準局員工消費合作杜印製 (請先閱讀背面之注意事項再填寫本頁) 首先,從由行選擇移位暫存器36分έ予第行之輸出 部37輸出「行選擇信號」。藉此,而使分配予第η行之選 擇行驅動部38內之選擇行驅動電晶體40導通,使選擇行 驅動電壓輸入部39與第η行之選擇行電源供給線41電性 連接。其結果,在選擇第η行之期間61,饋入至第η行之 選擇行電源供給線41的行選擇電壓65成爲^ high」。因 此,分配予各列的緩衝器之電源輸入部乃一律被供給以電 源電壓Vdd。其結果,由第η行之驅動元件35及和其對 應之負載電晶體44所構成之源極輸出電路(緩衝器)乃作 動,儲存於第η行之各光電變換儲存部33的資訊被讀出。 依被讀出之資訊,連接驅動電晶體35與負載電晶體44的 垂直信號線43之電位發生變化。垂直信號線43之電位變 化係就全部的列近乎同時發生。此時,分配予各列的負載 電晶體44係作用爲決定各列之源極輸出電路之電流的定 電流源。 列選擇移位暫存器之輸出部電麗 歹丨J,依次由「low」由於第 一—‘一 - . .h 16 本紙張尺度適用中國國家標隼(CNS ),\4%格(210X 297公1 ) 經濟部中央標準局員工消费合作社印製 A7 __ B7 ___ 五、發明説明() fm-1)歹fjg列選擇電夕列潠標電壓68、第(m+1) 列之列選擇電壓69 jjl如場分別具有列選擇脈 衝72、73^ f4,故對應列之源極輸出電路(緩衝器)的輸 出乃被傳達至輸出緩衝器55。此一傳達係藉由依次導通各 列之信號列選擇電晶體53而實行之。其結果,分配予第 (m-1)列、第m列、第(m+1)列之源極輸出電路(緩衝器)的 輸出乃介由阻抗變換部55而被輸出作爲輸出電壓70。數 字符號75係表示來自第η行第(m-Ι)列之像素的輸出。 在來自第η行之全部之列的輸出終了後,即) 行之選擇。一旦選擇了第(η+1)行,第(n+l)_g^3釋行電源 供給線79即兼作爲第η行之Ϊ寨董定電壓供給源’故第η 行之像素重定電晶體80乃導通。藉此方式,而於第(η+1) 行之選擇期間62中,進行第η行之重定動作。 饋入至第η行之選擇行電源供給線79的行選擇電壓 65,係與饋入至第(η-I)行之像素重定電晶體80之輸入部 的第(η-I)行重定時鐘信號81同一之時鐘信號。而饋入至 第(η+1)行之選擇行電源供給線79的行選擇電壓66係與饋 入至第η行之像素重定電晶體80之輸入部的第η行重定時 鐘信號82同一之時鐘信號。 施加於重定電壓輸ifl淡J5重定電壓 「low」轉「high」成脈衝狀而升高,形成重定脈衝76。 藉此,屬於第η行之全部之像素重定電晶If 60乃導通^由 於第η行之像素重定電晶體60的電源部券係SSSfl擇行 電源供給線41 ’故藉由像素重定電晶體60之導通’光電 (,,'沪 —訂 ^y (請先閱讀背面之注意事項再填寫本頁) 本紙张尺度適州中國i家樣率(CNS ) A4Am ( 210 乂2>;7公矩) 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明() 變換儲存部33之電位位準乃被重定爲電源電壓之電位位 準。其後,選擇第(n+1)行,進行同樣之動作。 於上述實施形態中,關於光電變換儲存部33雖就兼具 有光電變換元件及用以儲存其輸出的儲存元件之例加以說 明,但亦可以光電變換元件及對應之用以儲存光電變換元 件之輸出的儲存元件構成光電變換儲存部33,此自不待 言。後述之實施形態亦相同。 (第2實施形態). ' MT爲顯示依本發明的偵測物理量分布之半導體裝置 之第2實施形態之電路。於本實施形態之構成中,有關和 第1實施形態之構成相同的部分,.§_明從略。 本實施形態之裝置和第1實施形態之裝置的相異點係 在各像素中配置有用以控制驅動電晶體35與垂甚信號線 43之導蓮7菲導通的選擇行電晶疆^3&選擇行電晶體 42的閘極輸入部連接於選擇行電源供給線41,故僅只屬 於被選擇之行的電晶體42導通。 依本實施形態,和一列垂直信號線43栢連接的驅動電 晶體35,雖僅限S令歸屬於被選擇之行的像素者丄但在寬廣 --^ ; -ΤΓ ·,— 之電壓範圍內受到ϋ「乃ir確保寬廣之動作電V. Description of the invention Λ7 B7 The Central Standards Bureau of the Ministry of Economic Affairs-Industrial and Consumer Cooperative Co., Ltd. Yinzi column selection shift register 50 uses the voltage of its output section 51 to make the column selection drive W 52 Takeshi The signal column selection transistor 53 is turned on. As a result, the potential of the vertical signal line 4_3: 1 belonging to the selected column, that is, the output of the source output circuit is connected to the horizontal signal line 54 °. This output passes the impedance conversion section (output buffer) 55 to the output.部 56. · _ After outputting the signal from each pixel, according to the reset signal input by the reset voltage input unit 58, select the reset reset driving power to operate, and damage the reset transistor 60 in the pixel reset voltage supply line 49. With the supply to the pixel resetting pressure supply line, the signal charge stored in 5 ^ 3 ^ __ for the storage portion 33 cannot be determined. Storage of the signal charge begins again. According to 1Et_fftS ', the power is supplied to the source output circuit composed of the driving transistor 35 and the load transistor 44 via the selection line power supply line 41. Therefore, it is not necessary to follow the use case \ electrical screen supply line 17 (Figure 12), and the circuit configuration of the device is simplified. According to this embodiment, since the electricity and voltage Vdd applied to the driving input unit i9 of the driving circuit are not allowed to use the double small β 卩 as a power source of the p-transistor circuit, it is appropriate to use a so-called embedded Dong Jing ^ Drive the transistor for 40 ° for i and use the bootstrap circuit to achieve the same effect. In the following ', in addition to FIG. 1, refer to FIG. 2 to explain the device of this stomach stele® Bff. One One One One One One ... Fig. 2 shows signal waveforms during the n-th row selected period 61 and the (n + 1) -th row selected period 62. 15 The standard of this paper is applicable to 0 ceramics ((NS) Λ4 now (2 丨 〇X 297 public expense) (please read the notes on the back before filling in this page) ο. .N, 1τ __ A7 B7 V. Description of the invention ( ) The row selection driving voltage 63 is the power supply voltage Vdd applied to the row selection driving voltage input section 39 of FIG. 1. The numeral 64 indicates the voltage reference point (0V) of the row selection driving voltage 63. During the selection of the nth row, 61 The row selection voltage 65 of the power supply line 41 which is dedicated to the selected row of the nth row becomes "high", and during the period of selecting the (η + 1) th row 62, the selected row of the (η + 1) th row is fed. The row selection voltage 66 of the power supply line 41 becomes ^ high ". In the following, the case where the n-th row is selected will be described in detail || gravity of the device. Please fill in this page again.) First, the "row selection signal" is output from the row selection shift register 36 to the output unit 37 of the row. As a result, the selection row driving unit allocated to the n-th row is output. The selected row driving transistor 40 in 38 is turned on, so that the selected row driving voltage input section 39 and the n-th row The selected row power supply line 41 is electrically connected. As a result, during the period 61 in which the nth row is selected, the row selection voltage 65 fed to the nth selected row power supply line 41 becomes ^ high ". Therefore, the The power supply input sections of the buffers in each column are always supplied with the power supply voltage Vdd. As a result, the source output circuit (buffer) composed of the driving element 35 in the nth row and the corresponding load transistor 44 is Acting, the information stored in each photoelectric conversion storage section 33 in the nth row is read out. Based on the read out information, the potential of the vertical signal line 43 connecting the driving transistor 35 and the load transistor 44 changes. The vertical signal line The potential change of 43 occurs almost simultaneously for all columns. At this time, the load transistor 44 assigned to each column functions as a constant current source that determines the current of the source output circuit of each column. Column selection shift register The output department of Dian Li Jiu J, followed by "low" due to the first —'a-. .H 16 This paper size applies to China National Standards (CNS), \ 4% grid (210X 297 male 1) Central Ministry of Economic Affairs Printed by Standards Bureau Consumer Consumer Cooperative A 7 __ B7 ___ V. Description of the invention () fm-1) 歹 fjg column selection electrical standard voltage 68, column (m + 1) column selection voltage 69 jjl If the field has column selection pulses 72, 73 ^ f4, the output of the corresponding source output circuit (buffer) is transmitted to the output buffer 55. This communication is performed by sequentially turning on the signal column selection transistors 53 of the respective columns. As a result, the outputs assigned to the source output circuits (buffers) in the (m-1) th, mth, and (m + 1) th columns are output as the output voltage 70 via the impedance conversion section 55. The number character number 75 indicates the output from the pixel in the n-th row (m-1). After the output from all the columns of the nth row is finished, that is, the row is selected. Once the (η + 1) th row is selected, the (n + l) _g ^ 3 release power supply line 79 is also used as the fixed voltage supply source for the ninth row, so the pixel reset transistor in the ηth row 80 is on. In this way, in the selection period 62 of the (η + 1) th line, the reset operation of the nth line is performed. The row selection voltage 65 fed to the selected row power supply line 79 of the n-th row is the (η-I) -th row reset clock which is fed to the input portion of the pixel resetting transistor 80 of the (η-I) row The signal 81 is the same clock signal. The row selection voltage 66 fed to the (η + 1) -th row selection power supply line 79 is the same as the n-th row reset clock signal 82 fed to the input portion of the pixel reset transistor 80 of the n-th row. Clock signal. The reset voltage applied to the reset voltage input is light J5 and the reset voltage "low" turns to "high" in a pulse shape and rises to form a reset pulse 76. As a result, all the pixel resetting transistors If 60 that belong to the nth row are turned on ^ Because the power supply unit of the pixel resetting transistor 60 in the nth row is the SSSfl select line power supply line 41 ', the pixel resetting transistor 60 Zhitong 'Optoelectronics (,,' 沪 —— ^ y (Please read the notes on the back before filling out this page) This paper size is suitable for China iSample Rate (CNS) A4Am (210 乂 2 >; 7mm) Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 V. Description of the invention () The potential level of the storage unit 33 is reset to the potential level of the power supply voltage. Then, select line (n + 1) and proceed In the above-mentioned embodiment, although the photoelectric conversion storage unit 33 is described as an example having both a photoelectric conversion element and a storage element for storing its output, the photoelectric conversion element and a corresponding storage element may be used. It is needless to say that the storage element output from the photoelectric conversion element constitutes the photoelectric conversion storage portion 33. The embodiment described later is also the same. (Second Embodiment). MT is a semiconductor device that displays the distribution of the detected physical quantity according to the present invention. The circuit of the second embodiment. In the configuration of this embodiment, the same parts as those of the first embodiment are described. §_ The description is omitted. The differences between the device of this embodiment and the device of the first embodiment are different. A selection transistor for controlling the conduction of the driving transistor 35 and the vertical signal line 43 in each pixel is arranged in each pixel. The gate input section of the selection transistor 42 is connected to the selection line power supply. Line 41, so that only the transistor 42 belonging to the selected row is turned on. According to this embodiment, the drive transistor 35 connected to a column of vertical signal lines 43 is not limited to the pixels belonging to the selected row. But within a wide range of voltages-^; -ΤΓ ,,-are affected by "ϋir to ensure a wide range of operating power
- 〆--· V 壓範圍。 '顯示本實施形態之驅動方法的定時圖係與第1實施形 態之情形相同。 (第3實施形態) 圖4爲顯示依本發明的偵測物理量分布之半導體裝置 18 本紙張尺度適丨中國國家標準(CNS ) Λ4規格(210'〆297公犛) | (請先閲讀背面之注意事項再填寫本¥0-〆-- · V pressure range. 'The timing chart showing the driving method of this embodiment is the same as that of the first embodiment. (Third Embodiment) Fig. 4 is a semiconductor device showing the detection of physical quantity distribution according to the present invention. 18 paper sizes are appropriate 丨 China National Standard (CNS) Λ4 specification (210'〆297mm 牦) | (Please read the back Matters needing attention fill in this ¥ 0
經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明() 之第3實施形態的電路。於本實施形態之:構成中,有關和 第2實施形態之構成相同的部分,其說明從略。^ 4 本實施形態之裝置與第1實施形態之裝置的相異點如 首先,於本實施形態並無選擇行亀m靂日曰日蓐59與 像素重定電壓供給線49。其次,η行(η = 2、3、一-Ν) 的選擇行電源供給線79係連接於第(η-1)行之像素重定電 晶體80的輸入控制部。換言之,第η行(n = 2、3、一-Ν) 的選擇行電源供給線79係兼作爲第(η-1)行的像素重定電 壓供給源。依本實施形態,電路構成更加簡化。 茲參照圖5以說明此一偵測物理量分布之半導體裝置 的動作。 行選擇驅動電壓:J3爲選擇行驅動電壓輸入部 39之電源電壓Vdd。參考號碼64係表示行選擇驅動電壓 63之電壓基準點(0V)。在選擇第η行之期間61,饋入至第 η行之選擇行電源供給線79的行選擇電壓65成爲 「high」,在選擇第(η+1)行之期間62,饋入至第(η+1)行 之選擇行電源供給線41的行選擇電壓66成爲^igh」。 由行選擇移位暫存器36盆配乏筆輸 _ __——"------ 出「行選擇 行驅 動部內之選擇行驅動重晶,使選擇行驅動電 壓輸入部39與第η行之選擇行供_@線79電性連接。 其結果,在第rT行ί皮ίί單之期間61入至第η行之選擇 _____.一--------------'Γ'· 行電源供給線79的行選ftl;M 65成爲ligh」。因此, 19 本紙悵尺度適丨國ϋ準(CNS ) Λ4規格(2!0> 2W公漦) (請先閲讀背面之注意事項再填寫本頁) _____ 訂 經濟部中央標準局員工消費合作社印¾ A7 B7 五、發明説明() 分配予各列的緩衝器之電源輸入部乃一律被供給以電源電 壓Vdd。又,設在屬於所選擇之行之各驅動電晶體35和 與其對應之垂直信號線43間的行選擇電晶體42變成導 通。其結果,由第η行之驅動元件35及和其對應之負載電 晶體44所構成之源極輸出電路(緩衝器)乃作動,儲存於第 η行之各光電變換儲存部33的資訊被讀出。依被讀出之資 訊,連接驅動電晶體35與負載電晶體44的垂直信號線43 之電位發生變化。垂直信號,線43之電位變化係就全部的列 近乎同時發生。此時,分配予各列的負載電晶體44係作用 爲決定各列之源極輸出電路之電流的定電流源。 列選擇移位暫存器之輸出部_51的雷懕,係對於纖擇之 歹U,依次由「jl「high上成脈衝狀而升高。由於第 (m-1)列之列選養竃壓67、第111雨5^[^擇_1_6¥^(111+1) 歹丨J之列選擇電S 69'錄如圖般厂分另5¾有列選擇脈 衝72、73及74,故對應列之源極輸出電路(緩衝器)的輸 出乃被傳達至輸出緩衝器55。此一傳達係藉由依次導通各 列之信號列選擇電晶體53而實行之。其結果,分配予第 (m-1)列、第m列、第(m+i冽之源極輸出電路(緩衝器)的 輸出乃介由阻抗變換部55而被輸出作爲輸出電壓70。數 字符號75係表示來自第n行第(m—丨)列之像素的輸出。 在來自^ η行@全部之列的輸出終了後,施行第(η+1) 行之選擇。一旦選i^(n+l)行,第(11+1)~呑乏_擇行電源供 給線79良P兼作爲第~!1否乏摄素董定電壓供給源,故第n行 之像素重定電晶體如乃導通。藉此方式,乃於第(n+1)行 20 適川中_家料(^ — (請先閱讀背面之注意事項再填寫本頁) -A,Printed by the Consumers' Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs A7 B7 5. The circuit of the third embodiment of the invention description (). In the configuration of this embodiment, the description of the same parts as those of the second embodiment will be omitted. ^ 4 The differences between the device of this embodiment and the device of the first embodiment are as follows. Firstly, in this embodiment, there is no choice between the line 59 and the pixel reset voltage supply line 49. Next, the selection line power supply line 79 of the η row (η = 2, 3, --N) is connected to the input control section of the pixel resetting transistor 80 at the (η-1) th row. In other words, the power supply line 79 of the selected row of the n-th row (n = 2, 3, and -N) also serves as the pixel reset voltage supply source of the (η-1) -th row. According to this embodiment, the circuit configuration is further simplified. The operation of this semiconductor device for detecting a physical quantity distribution will be described with reference to FIG. 5. Row selection driving voltage: J3 is the power supply voltage Vdd for selecting the row driving voltage input section 39. The reference number 64 indicates a voltage reference point (0V) of the row selection driving voltage 63. During the period 61 in which the n-th row is selected, the row selection voltage 65 fed to the selected-row power supply line 79 in the n-th row becomes "high", and in the period 62 in which the (η + 1) -th row is selected, it is fed to the (n + 1) η + 1) The row selection voltage 66 of the row selection power supply line 41 becomes ^ igh ". The row selection shift register 36 is equipped with a lack of pen input _ __—— " -------- The "selection row in the row selection row driving section drives the recrystallized, so that the selection row driving voltage input section 39 and the first The selection of the η line is provided for _ @ 线 79 to be electrically connected. As a result, during the period of the rT line, the 61 line to the η line selection _____. a ------------- --- 'Γ' Row selection ftl of line power supply line 79; M 65 becomes ligh ". Therefore, the size of 19 papers is in compliance with the National Standards (CNS) Λ4 specification (2! 0 > 2W). (Please read the precautions on the back before filling this page.) A7 B7 V. Description of the Invention () The power input section of the buffers allocated to each column is always supplied with the power supply voltage Vdd. In addition, the row selection transistor 42 provided between each of the driving transistors 35 belonging to the selected row and the corresponding vertical signal line 43 is turned on. As a result, the source output circuit (buffer) composed of the driving element 35 in the n-th row and the corresponding load transistor 44 operates, and the information stored in each photoelectric conversion storage section 33 in the n-th row is read. Out. According to the read information, the potential of the vertical signal line 43 connecting the driving transistor 35 and the load transistor 44 changes. In the vertical signal, the change in the potential of the line 43 occurs almost simultaneously in all the columns. At this time, the load transistors 44 assigned to the columns are constant current sources that determine the current of the source output circuits of the columns. The thunder of the output section _51 of the column selection shift register is for the fiber U of the selection, which in turn rises from "jl" high in a pulse-like manner. Because the column (m-1) is selected and raised竃 Press 67, 111th rain 5 ^ [^ Select_1_6 ¥ ^ (111 + 1) 歹 丨 Selection of the electric line S 69 'recorded as shown in the figure, and another 5¾ has a selection pulse 72, 73, and 74, so The output of the source output circuit (buffer) of the corresponding column is transmitted to the output buffer 55. This transmission is performed by sequentially turning on the signal column selection transistor 53 of each column. As a result, it is allocated to the ( The output of the m-1) column, the m-th column, and the (m + i 冽) source output circuit (buffer) is output as the output voltage 70 through the impedance conversion section 55. The numeral 75 indicates that it is from the n-th row The output of the pixel in the (m- 丨) column. After the output from the ^ η row @ all column is finished, the selection of the (η + 1) row is performed. Once the i ^ (n + l) row is selected, the ( 11 + 1) ~ 呑 __ select line power supply line 79 good P also serves as the first ~! 1 no pixel prime voltage supply, so the pixel resetting transistor in the nth row is turned on. In this way, On line (n + 1) 20 Shichuanzhong_ 家 料 (^ — ( Matters to read the back of the note and then fill in this page) -A,
*tT B7 B7 經濟部中央標準局員工消費合作社印裝 五.、發明説明() 之期間62中,進行第η行的重定動作。 饋入至第η行之選擇行電源供給線79的行選擇電壓 65,係與饋入至第(η-1)行之像素重定電晶體80 2輸夂·部 的第(η-1)行重定時鐘信號81爲同一之時鐘信號。而饋入 至第(η+1)行之選擇行電源供給線79的行選擇電壓66,係 與饋入至第η行之像素重定電晶體80之輸入部的第η行重 定時鐘信號81爲同一之時鐘信號。 (第4實施形態) ' 圖ό爲顯示依本發g的偵測物理半導體裝置 之第一4 形薇§勺雷¥^於^^11之耩成中,有關和 索3¾施形態之構成相同的部分,其說明從略。 呆實施形態之裝置與第.3實施形態之裝置的相異點爲: 設於列選擇i_力部91之列選擇電晶體92,兼具有作爲被 .· · ..... .. ... * —"―—" 選擇之列的源極輸出電路之「電流開關」的功能。 不替在本發明之第1至3之實施形態或習用例中,其 構成方式均爲一.旦選擇了某一^行 1於其期間中,在全部之 列之源極輸出電_衝器)均有電流流過。但是,若以固體 ""~~—- 、 攝影裝置爲例,通常列數均達數百或數千,其消耗電流頗 _ —. _ — 大。 依本實施形態,爲達輸出之目的,僅只被選擇之列的 · - -· —.. 源極輸出電路直電電流1¾¾]¾的 數百分之一至數分之一的程度。又,特別是在第1及第3 實施形態中’由於同一行之全部的源極輸出電路之電流經 由選擇行電源供給線41或79被供給,故若選擇行電源供 _ 21 本紙張尺度適;ί]中网因冢標卒(CNS )、丨地格(210><2(^公漦) (請先閲讀背面之注意事項再填寫本頁)* tT B7 B7 Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs. 5. During the description of the invention (), the reset operation of the nth line is performed. The row selection voltage 65 that is fed to the n-th row of the selected row power supply line 79 is the (n-1) th row of the pixel resetting transistor 80 2 that is fed to the (n-1) th row The reset clock signal 81 is the same clock signal. The row selection voltage 66 fed to the selection row power supply line 79 of the (η + 1) th row is the same as the nth row reset clock signal 81 fed to the input portion of the pixel resetting transistor 80 of the nth row. The same clock signal. (Fourth embodiment) 'Figure 6 shows the first four shapes of a physical semiconductor device detected according to the present invention. [勺] In the formation of ^^ 11, the structure of the Hezuo method is the same. The description of the part is omitted. The difference between the device in the embodiment and the device in the third embodiment is as follows: it is provided in the column selection i_force portion 91 and the column selection transistor 92, and also serves as a quilt ... ... * — " ―— " The function of the "current switch" of the selected source output circuit. It is not for the first to third embodiments of the present invention or the use cases that the constitutions are all the same. Once a certain line 1 is selected during the period, all the source output voltage generators ) All current flows. However, taking solid " " ~~ —- and photographic devices as examples, the number of columns usually reaches hundreds or thousands, and the current consumption is quite large. According to this embodiment, for the purpose of output, only the selected range of the direct current of the source output circuit 1¾¾] ¾ is in the range of a few hundredth to a fewth of a degree. In particular, in the first and third embodiments, 'all the currents of the source output circuits in the same row are supplied via the select row power supply line 41 or 79. ; ί] China Net due to mound mark (CNS), 丨 ge (210 > < 2 (^ 公 漦) (Please read the precautions on the back before filling this page)
經濟部中央標準局員工消費合作社印製 A7 B7 __ 五、發明説明() 給線41或79的電流容量較低,則有因電壓降低造成不能 正常動作之虞。依本實施形態,由於電流僅選擇性地流過 分配予被選擇之列的源極輸出電路,故可解決上述問題。 (第5實施形態) 圖7爲顯示依本發明的偵測物理量分布之半導體裝置 之第5實施形態的電路。於本實施形態之構成中,有關和 第4實施形態之構成相同的部分,其說明從略。 本實施形態之裝置與第4實施形態之裝置的相異點爲 係在於各源極輸出電路之輸出介由列選擇電晶體92而連 接於水平信號線93 〇於第4實施形態中,全部之垂直信號 線43均經常處於相互連接之狀態。因此,在被選擇之列切 換之際,被選擇之列的源極輸出電路必須對其他全部之列 的垂直信號線予以充電。因此,爲求儘早達於穩定狀態, 有必要使源極輸出電路的時間常數減小。但是,由裝置小 型化的觀點’加大驅動電晶體有其限度。 相對於此,於本實施形態,被選擇之列的源極輸出電 路的輸出並未與其他列的垂直信號線相連接。因此,須游 藉由〜個源極輸出電路施行充電的容量較諸前述實施形態 之場合可減小爲數百分之一至數千分之一。因此,不易發 生充電時間變長的問題。且依本實施形態,亦可將分配予 各列的負載電晶體44置換成共通的單一個負載電晶體。 (第6實施形態) 圖8爲顯示依本發明的偵測物理量分布之半導體裝置 之第6實施形態的電路。於本實施形態之構成中,有關和 ___ 22 本紙張尺度通用中國㈤㈣(7ks) “格(孖(.)X 297公菀—] '~ (請先閱讀背面之注意事項再填寫本頁) •ο. -5 ,¾. 經濟部中央標隼局員工消費合作社印製 A7 B7Printed by the Consumers' Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs A7 B7 __ V. Description of the invention () If the current capacity of line 41 or 79 is low, there is a risk that it will not operate normally due to voltage reduction. According to this embodiment, the above problem can be solved because the current selectively flows only through the source output circuits allocated to the selected row. (Fifth Embodiment) Fig. 7 is a circuit showing a fifth embodiment of a semiconductor device for detecting a physical quantity distribution according to the present invention. In the configuration of this embodiment, the description of the same parts as those of the fourth embodiment will be omitted. The difference between the device of this embodiment and the device of the fourth embodiment is that the output of each source output circuit is connected to a horizontal signal line 93 via a column selection transistor 92. In the fourth embodiment, all The vertical signal lines 43 are always connected to each other. Therefore, when the selected column is switched, the source output circuits of the selected column must charge all the other vertical signal lines. Therefore, in order to reach the stable state as soon as possible, it is necessary to reduce the time constant of the source output circuit. However, from the viewpoint of miniaturization of the device, there is a limit to increasing the driving transistor. In contrast, in this embodiment, the outputs of the source output circuits of the selected column are not connected to the vertical signal lines of the other columns. Therefore, the capacity to be charged by the ~ source output circuits can be reduced to several hundredths to several thousandths compared to the case of the foregoing embodiments. Therefore, a problem that the charging time becomes long does not easily occur. In addition, according to this embodiment, the load transistors 44 assigned to the respective columns may be replaced with a common single load transistor. (Sixth Embodiment) Fig. 8 is a circuit showing a sixth embodiment of a semiconductor device for detecting a physical quantity distribution according to the present invention. In the composition of this embodiment, ___ 22 paper sizes are commonly used in China㈤㈣ (7ks) “格 (孖 (.) X 297 公 菀 —] '~ (Please read the precautions on the back before filling this page) • ο. -5, ¾. Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs A7 B7
撵 、發明說明() 第4 形熊夕^成相同的部分,茸說明從赂〇 本贊施形態之裝置與第4及又實施形態之裝置的相異 口下。 - - .一一 亦®,(a)與列選擇電晶體92獨竺地|曼置電流控制列選 p八馕95<可1流控制列的聞極共通連 ^方^列壤擇移位暫存器50之輸出部51 ;及(c)介由列選擇 %曰曰壞92將水平信號線93與垂直信號線予以連接。 ,此,電流乃僅只流過被選擇之列的源極輸出電路。 43 平信號線93僅有分配予被選擇之列的垂直信號線 和其相連接」_故僅^^$5^列的負載電晶體44作用 二〕原極輸 ° ’施臟) ® 9爲顯示依裡日綱個腫狸難斑2:0¾體裝置 :第7實施形態的重U全本實施形態之搆成中,有關和 第6實施雙的部分3其說明從略。 於第4至ό的實施形熊中,用以讀出信號的列潠擇期 間和電流流過源極輸出電路所須之列選擇期間係爲相同。 與輸出被選擇之列的信號之期間相較,在由電流流過源極 輸出電路後至達於穩定狀態爲止之時間常數充分小之場 合,此點並無任何节妥'。然而,在由於尺寸之麗β造成驅 動電晶體35的電_驅動容ΐϋ充兮加大之場含,或_ 垂直方向的像素較多理由眞垂直信號線43的容量較大之 場合,必須使電流流過源極輸出電路之期間較信號輸出期 間爲長。 23 (請先閱讀背面之注意事項再填寫本頁)发明. Description of the invention (4) The Xiong Xi of the 4th shape is the same, and the explanation will be based on the differences between the device of this Zanshi form and the device of the fourth and other forms. --. One by one, (a) and the column selection transistor 92 alone | man-made current control column selection p lt95 < can be connected in common with the sense pole of a 1-flow control column The output section 51 of the register 50; and (c) the horizontal signal line 93 and the vertical signal line are connected through the column selection% or 9292. Therefore, the current only flows through the selected source output circuit. 43 Flat signal line 93 Only the vertical signal line assigned to the selected column is connected to it "_ Therefore only ^^ $ 5 ^ column of load transistor 44 role 2] The original pole input ° 'do dirty" ® 9 is displayed Iri Ritsuna swollen raccoon spot 2: 0¾ body device: In the structure of the seventh embodiment, the description of the third part of the sixth embodiment is omitted. In the fourth to sixth embodiments, the column selection period used to read the signal and the column selection period required for the current to flow through the source output circuit are the same. Compared with the period in which the selected signal is output, there is no limitation on the point where the time constant after the current flows through the source output circuit until the steady state is sufficiently small '. However, if the electric capacity of the driving transistor 35 is increased due to the size of the beautiful β, or there are more pixels in the vertical direction, and the capacity of the vertical signal line 43 is large, it is necessary to make The period during which the current flows through the source output circuit is longer than the signal output period. 23 (Please read the notes on the back before filling this page)
本紙浪尺度適ffl中阀國家標準(CNS ) A4規格(210X 297公簸) 經濟部中央標準局*:工消費合作社印製 A7 B7 五、發明説明() 因此’於本實施形態中,係令電流流過源極輸出電路 之期間與信號輸出期間可獨立地選擇。詳言之,爲備有第 一輸入部98、第二輸入部99、及電流控制選擇電壓輸出 部100的電路部。在各列各自分配予電流控制選擇電壓產 生電路部97 ’用以將由第一輸入音g 98接收到既定之信號, 到第二輸入部99挎收到既定之信號爲止的期間、及既定之 電位輸出至電流控制選擇電壓輸出部100。 兹就對於第.m列之源極輸出電路的輸出部51之電流 控|[f選擇電壓產生電路部97加以說明。此一電流控制選擇 電壓產生電路部97之第一輸入部.98被.¾接於第(m-1)列之 列選擇移位暫存器的輸出部·51-a 〇電流控制選擇電壓產生 電路部97之笔^盤么部巧..被連接於第(eq±1)列之列選擇移 位暫存器的輸出部51-b。電流控制選擇電壓輸出部100連 接於第m列之電流控制列選擇移位暫存器之聞極。 一旦藉由列塁移ί立暫器選擇X第電流控 制選擇電壓產生電路部97即介由第一輸入部98接受來自 第(m-l)fJ之列選擇移位暫_器之輸组,使輸出部1〇〇之電 位由「1倾i上ft至丄high士孱始維持該二璽位之動作。 藉此方式,在第m歹_際被選擇之前,電流開始流過第m 列之源極輸出電路中而開始讀出動作。其後,一旦藉由 -— 列選擇移位暫存器選擇了第(m+Ι)列,電流控制選擇電壓產 生電路部97即介由第二輸入部99接受來自第(m+1)列之列 選擇移位暫存器之輸出,而停止動作。亦即,輸出部100 之電位由「Wgh」降低至「low」,由第m列之源極輸出 本纸張尺度適州中國《家標準(CNS)Λ4规格(210〆297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明说明() 電路所進行之|賣串動讎冬:χ 〇 (第8實施形態) 圖10爲顯示依本發明的偵測物理量分布之半導體裝 置之第8實施形態之要部之構成。本實施开^1基^»^ 7 實施形態頁有相同之構成,但電备控制選擇電壓產生電路 部之構成ί目異。於本實施形態之彳學成中,有關和第7實施 形態之構成相同的部分,其說明從略。 圖示之電流控制選擇雷壓產生電路ILlOl:係與圖9 之電流控制選擇電壓產生電路部97相對應者4皮稱:i#態 RS正反器電路或雙態穩定元件,此爲吾人熟知"之構歳之電 此一電路部1〇1備有第一電源輸入部(_坤处102及第二 電源輸入部(Vss)103丄且備有第一輸入部_.1Q4、第二輸入 部105與輸出部100。在電路部1〇1 g内部有ό個電晶體 如圖示般相互連接。第一輸入部104、第二輸入部105與 輸出部106分別栢當於圖9之第一輸入部98、第二輸入部 99及電流控制選擇電壓輸出部100 〇 此一電路部1〇1係被稱爲雙態i定竃路\其動作方式 爲:藉由饋入至第一輸入部104之正脈衝使輸出部106成爲 第1電源電壓狀態;藉由饋入至第二輸入部105之正脈衝 便輸出部106成爲第2電源電壓狀態。 其次’參照圖η以說明本實施形態之驅動方法。 於圖11中,參考號碼「110」、「111」及「112」 分別顯示第(m-l)列、第m列及第(m+i)列之列選擇電壓, (請先閲讀背面之注意事項再填寫本頁) 、-° 本纸張尺度適用中國囚萃標準(CNS ) Λ4現格(2!0'χ 29?公犛) 經濟部中央標準局員工消費合作社印製 A7 B7 五、發明説明() . 此爲各列選擇移位暫存器之輸出部51的電壓。又,參考號 碼「113」、「114」及「115」分別爲顯示第(fcL)列、 第m列及第(m+i)列之選-狀態的列選擇脈衝.。參考號碼 「」、「117」及「118」分別顯示第(m—1)列、第m 歹扱第(m+1)列之電流控制列選擇電壓,此爲各電流控制選 擇電壓產生電路部97之輸出部100之電壓。參考號碼 「119」、「120」及「121」分別爲顯示第(m-1)列、第 m列及第(m+Ι)列之電流控制選擇狀態的電流控制列選擇 脈衝。 以第m列之電流控制烈選擇脈衝120爲例1 在第(m-1)列之列選擇脈衝113上升時成爲第1電源電壓狀態;而 在第(m+1)列之列選擇脈衝115上升時成爲第2電源電壓狀 態。亦即、,g第m列被選擇#霉輸出之列以前,電流開始 流過第m列£源極輸出電路,而在第m列之輸出終了後, 電流即不再流過第m列之源極輸出電路。 於本f施形態中,5隹搜取在箄(111-1)列之迴選擇脈衝 113上迁丄而在第(m+1)列之列選擇脈衝115上升時下降的 配線連接方式,但若欲在更以前之列選擇脈衝上升當然可 設定成讓電流更早開始流過源極輸出電路。又,關於下降, 若有必要當然同樣可設定爲較遲下降。 胃關霉流控制選擇電壓產生電路部的具體之電路,圖 10中雖就所謂雙態穩定元件加以例示,但並未限定於此一 電路搆成,例如亦可爲其CMOS電路或其他邏輯電路。另 外,雖就施加於輸入部的時鐘信號上升時輸出上升或下降 (請先閱讀背vg之注意事項再填寫本頁)The size of the paper is suitable for the national valve standard (CNS) A4 specification (210X 297). The Central Standards Bureau of the Ministry of Economic Affairs *: Printed by the Industrial and Consumer Cooperative A7 B7. 5. Description of the invention () Therefore, in this embodiment, the order The period during which the current flows through the source output circuit and the period during which the signal is output can be selected independently. Specifically, it is a circuit section provided with a first input section 98, a second input section 99, and a current control selection voltage output section 100. In each column, a current control selection voltage generating circuit section 97 'is allocated for receiving a predetermined signal from the first input sound g 98 and receiving a predetermined signal from the second input section 99, and a predetermined potential. Output to the current control selection voltage output section 100. The current control | [f selection voltage generating circuit section 97] of the output section 51 of the source output circuit in the .m column will be described. The first input section of this current control selection voltage generating circuit section 97 is 98. ¾ is connected to the output section of the column selection shift register of column (m-1). 51-a 〇 Current control selection voltage generation The circuit section 97 pen ^ disk module is connected to the output section 51-b of the select shift register in the column (eq ± 1). The current control selection voltage output section 100 is connected to the current control column selection shift register of the m-th column. Once the column selection Xth current control selection voltage generating circuit section 97 is selected by the column shifter, the input group from the (ml) fJth column selection shift register is received via the first input section 98 to make the output The potential of the part 100 is maintained from "1 to ft to 丄 high 孱" to maintain the second sign position. In this way, the current starts to flow through the source of the m column before the m_th interval is selected. The read operation is started in the pole output circuit. After that, once the (m + 1) column is selected by the column selection shift register, the current control selection voltage generating circuit section 97 is passed through the second input section. 99 accepts the output from the shift register selected by the (m + 1) th column and stops the operation. That is, the potential of the output section 100 is reduced from "Wgh" to "low", and the source of the mth column Output this paper size Shizhou China "Home Standard (CNS) Λ4 Specification (210〆297 mm) (Please read the precautions on the back before filling out this page) Order printed by the Consumer Standards Cooperative of the Central Standards Bureau of the Ministry of Economic Affairs 5 、 Explanation of the invention () The circuit is carried out | Selling string moving winter: χ 〇 (8th embodiment) Figure 10 shows The constitution of the main part of the eighth embodiment of the semiconductor device for detecting the physical quantity distribution of the invention. This implementation is based on ^ 1 ^^^ 7 The implementation page has the same configuration, but the configuration of the power backup control selection voltage generation circuit section is different. The description of the same components as those of the seventh embodiment in the learning achievement of this embodiment will be omitted. The current-control selection lightning-voltage generating circuit IL101 shown in the figure is the counterpart of the current-control selection voltage-generating circuit section 97 shown in FIG. 9: i # state RS flip-flop circuit or dual-state stabilization element, which is well known to me. " The structure of the electric circuit is equipped with a first power input section (_Kun at 102 and second power input section (Vss) 103) and a first input section _.1Q4, second The input section 105 and the output section 100. In the circuit section 101 g, there are transistors connected to each other as shown in the figure. The first input section 104, the second input section 105, and the output section 106 are respectively shown in FIG. 9 The first input section 98, the second input section 99, and the current control selection voltage output section 100. This circuit section 101 is called a two-state i fixed circuit, and its operation mode is: by feeding to the first A positive pulse from the input section 104 causes the output section 106 to enter the first power supply voltage state; a positive pulse fed to the second input section 105 causes the output section 106 to enter the second power supply voltage state. Next, the implementation will be described with reference to FIG. How to drive the form. In Figure 11, the reference numbers "110", "111", and "112" show the (m- l) Select voltages in column, column m and column (m + i), (please read the precautions on the back before filling this page),-° This paper standard is applicable to Chinese prison extraction standard (CNS) Grid (2! 0'χ 29? Public money) A7 B7 printed by the Consumer Cooperatives of the Central Standards Bureau of the Ministry of Economic Affairs 5. Description of the invention (). This is the voltage of the output section 51 of the shift register selected for each column. Reference numbers "113", "114", and "115" are column selection pulses that display the selection-status of column (fcL), column m, and (m + i), respectively. Reference numbers "" and "117 "" And "118" respectively display the current control column selection voltages in the (m-1) th column and the mth (m + 1) th column. This is the voltage of the output section 100 of each current control selection voltage generating circuit section 97. The reference numbers "119", "120", and "121" are current control column selection pulses that display the current control selection states of column (m-1), column m, and column (m + 1), respectively. The current control strong selection pulse 120 in the m column is taken as an example 1. When the selection pulse 113 in the (m-1) column rises, it becomes the first power supply voltage state; and the selection pulse 115 in the (m + 1) column When it rises, it becomes the second power supply voltage state. That is, before the mth column of g is selected, the current begins to flow through the mth column of the source output circuit, and after the output of the mth column ends, the current That is, the source output circuit in the m-th column no longer flows. In this embodiment, 5 隹 is searched for the selection pulse 113 in the 箄 (111-1) column and moved to the (m + 1) -th column. The wiring connection method in which the column selection pulse 115 rises when it rises, but if you want to select the pulse rise in the previous column, of course, it can be set to allow the current to start flowing through the source output circuit earlier. Regarding the descent, of course, if necessary, it may be set to a later descent. The specific circuit of the control voltage generation circuit unit of the gastric mold flow control, although the so-called two-state stabilization element is exemplified in FIG. 10, it is not limited to this circuit configuration. For example, it can also be a CMOS circuit or other logic circuit. . In addition, although the output signal rises or falls when the clock signal applied to the input part rises (please read the precautions for the back of vg before filling in this page)
本紙張尺度適州中國國家標準(ms ) Λ4規格(2!OX297公漦) 五The size of this paper is in accordance with China's national standard (ms) Λ4 specification (2! OX297) 漦
經濟部中央標隼局員工消费合作社印製 A7 B7 發明説明() 的電路爲例予以顯示,但亦可採用於輸入下降時輸出上升 或下降的電路。 關於第4至8實施形態中之像素部及行選擇部分的構 成,雖已就和第3實施形態具有相同構成的形態加以說 明,但第4至δ實施形態之像素部及行選擇部分的構成, 亦可採用第1至3實施形態之任一構成,或習知技術之構 成。 圖12所示之習知例的元件構成中,靈要低電阻性(大 電流容量)的ft成要素僅有垂直信號線13與電源供給線 Π。由於此等構成要素在設計上限制嚴格的像素2中可彼 此平行地配置,故可由相同低電阻性之配線膜(例如金屬系 層)形成之。但是,在圖1及其後面所示本發明之實施形態 中,須要低電阻性(大電流容量)之構成要素爲選擇行電源供 給線41及垂直信號線43。如圖1所示,此等構成要素並 非彼此平行,而是成直交關係。因此,爲實現本發明之實 施形態,不採以同一配線膜形成之方式,而採以處於彼此 互異位準的配線膜形成之方式遠更爲容易。 又,於此說明之實施形態中’爲簡單計而就設有兼作 爲光電變換部及信號電荷儲存部的光電變換儲存部之情形 加以說明,但對於光電變換部及信號電荷儲存部分別獨立 形成的場合當然亦有效。 又,於前述說明中’雖爲了說竺方便而實質上以固體、 廣影裝置爲例,但若設置例如雨页偵画X羅泉、紅夕f線、 溫度二磁^了電"場"、壓力等其迆之物理#的偵測部,將隨 27 (請先閱讀背面之注意事項再填踌本頁)The circuit printed by A7 B7 Invention Note () printed by the staff consumer cooperative of the Central Bureau of Standards of the Ministry of Economics is shown as an example, but it is also possible to use a circuit where the output rises or falls when the input falls. The configuration of the pixel portion and the row selection portion in the fourth to eighth embodiments has been described with respect to the configuration having the same configuration as the third embodiment, but the configuration of the pixel portion and the row selection portion in the fourth to δ embodiments is described. It is also possible to adopt any of the structures of the first to third embodiments or the structure of conventional techniques. In the element configuration of the conventional example shown in FIG. 12, only the vertical signal line 13 and the power supply line Π are required as the ft components having low resistance (large current capacity). Since these constituent elements can be arranged in parallel with each other in the pixels 2 with strict design restrictions, they can be formed from wiring films (such as metal-based layers) having the same low resistance. However, in the embodiment of the present invention shown in Fig. 1 and the following, it is necessary to select a row power supply line 41 and a vertical signal line 43 as components having low resistance (large current capacity). As shown in Fig. 1, these constituent elements are not parallel to each other, but in a orthogonal relationship. Therefore, in order to realize the embodiment of the present invention, it is far easier to adopt a method of forming wiring films at mutually different levels instead of using the same wiring film. In addition, in the embodiment described here, a case where a photoelectric conversion storage section serving as both a photoelectric conversion section and a signal charge storage section is provided for simplicity is described, but the photoelectric conversion section and the signal charge storage section are formed separately. The occasion is certainly valid. Also, in the foregoing description, "Although for the sake of convenience, a solid and wide-screen device is used as an example, if a rain sheet survey X Luoquan, Hongxi F-line, and temperature two magnets are provided, for example, the electric field" "、 压力 等 其 迤 的 物理 # 's detection department will follow 27 (Please read the precautions on the back before filling this page)
本纸張尺度適用中國gj家操净(CNS ) Λ4規格(210 ’〆公漦 A7 B7 五、發明説明() 所接受之物理量而變化之電位傳達至驅動電晶體的閘極 部,則對於偵測光以外之物理量的分布之半導體裝置亦屬 一般地有效,此自不待言。 一 又,於前述說明屮^雖以單位領域係形成爲二次元狀 的場合爲例加以說明,但基本槪念對於單位領域係形成爲 一次元狀的場合亦有效,此自不待言。 又,關於行選擇或列選擇功能部雖採用所謂移位暫存 器,但此等行選擇或列選擇功能部若採用所謂解碼器顯然 亦可獲得同樣之效果。 如上述,依本發明,藉由令分配予各行的一根配線兼 具有行選擇功能與電源電壓供給功能,甚至重定功能,而 能實現構成簡單之偵測物理量分布之半導體裝置。 (請先閱讀背面之注意事項再填寫本頁) -丄---This paper standard is applicable to Chinese gj housekeeping net (CNS) Λ4 specification (210 '〆 公 漦 A7 B7 V. Description of the invention () The potential of the changed physical quantity is transmitted to the gate part of the driving transistor. It is self-evident that a semiconductor device having a physical quantity distribution other than photometry is generally effective. Also, in the foregoing description, although the unit field system is formed into a quadratic element as an example, the basic idea is It is also effective for the case where the unit field system is formed in a one-dimensional shape, and it goes without saying. Although the row selection or column selection function section employs a so-called shift register, if such a row selection or column selection function section adopts The so-called decoder can obviously also obtain the same effect. As described above, according to the present invention, by making a wiring allocated to each row have both a row selection function and a power supply voltage supply function, and even a reset function, a simple configuration can be achieved. Semiconductor device for detecting physical quantity distribution. (Please read the precautions on the back before filling this page)-丄 ---
1T 經濟部中央標隼局員工消費合作社印製 28 本紙張尺度適用中國阀家標準(CNS ) Λ4规格(210X 297公f )1T Printed by the Consumer Cooperatives of the Central Bureau of Standards of the Ministry of Economic Affairs 28 This paper size is applicable to the China Valve Standard (CNS) Λ4 specification (210X 297 male f)
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Applications Claiming Priority (1)
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JP9060332A JPH10257392A (en) | 1997-03-14 | 1997-03-14 | Physical quantity distribution detecting semiconductor device, method of driving the same, and method of manufacturing the same |
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TW395126B true TW395126B (en) | 2000-06-21 |
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TW087103796A TW395126B (en) | 1997-03-14 | 1998-03-12 | Semiconductor device of detecting the physical quantity distribution driving method and manufacturing method thereof |
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US (3) | US6512543B1 (en) |
EP (1) | EP0865197A3 (en) |
JP (1) | JPH10257392A (en) |
KR (1) | KR100551389B1 (en) |
TW (1) | TW395126B (en) |
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1998
- 1998-03-12 TW TW087103796A patent/TW395126B/en not_active IP Right Cessation
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JPH10257392A (en) | 1998-09-25 |
KR19980080259A (en) | 1998-11-25 |
EP0865197A3 (en) | 2001-05-02 |
US20030103154A1 (en) | 2003-06-05 |
US6512543B1 (en) | 2003-01-28 |
US7397508B2 (en) | 2008-07-08 |
US20030179304A1 (en) | 2003-09-25 |
EP0865197A2 (en) | 1998-09-16 |
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