TW365700B - Method of manufacture of plugs - Google Patents
Method of manufacture of plugsInfo
- Publication number
- TW365700B TW365700B TW086115290A TW86115290A TW365700B TW 365700 B TW365700 B TW 365700B TW 086115290 A TW086115290 A TW 086115290A TW 86115290 A TW86115290 A TW 86115290A TW 365700 B TW365700 B TW 365700B
- Authority
- TW
- Taiwan
- Prior art keywords
- dielectric layer
- layer
- plugs
- plug
- height
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76819—Smoothing of the dielectric
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/7684—Smoothing; Planarisation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW086115290A TW365700B (en) | 1997-10-17 | 1997-10-17 | Method of manufacture of plugs |
US08/985,698 US6146995A (en) | 1997-10-17 | 1997-12-05 | Method for manufacturing interconnecting plug |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW086115290A TW365700B (en) | 1997-10-17 | 1997-10-17 | Method of manufacture of plugs |
Publications (1)
Publication Number | Publication Date |
---|---|
TW365700B true TW365700B (en) | 1999-08-01 |
Family
ID=21627112
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086115290A TW365700B (en) | 1997-10-17 | 1997-10-17 | Method of manufacture of plugs |
Country Status (2)
Country | Link |
---|---|
US (1) | US6146995A (zh) |
TW (1) | TW365700B (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100335120B1 (ko) * | 1999-08-25 | 2002-05-04 | 박종섭 | 반도체 소자의 금속 배선 형성 방법 |
US6426289B1 (en) | 2000-03-24 | 2002-07-30 | Micron Technology, Inc. | Method of fabricating a barrier layer associated with a conductor layer in damascene structures |
US6489573B2 (en) * | 2000-06-16 | 2002-12-03 | Acer Display Technology | Electrode bonding structure for reducing the thermal expansion of the flexible printed circuit board during the bonding process |
US8053361B2 (en) | 2008-09-04 | 2011-11-08 | Globalfoundries Singapore Pte. Ltd | Interconnects with improved TDDB |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4180432A (en) * | 1977-12-19 | 1979-12-25 | International Business Machines Corporation | Process for etching SiO2 layers to silicon in a moderate vacuum gas plasma |
JPH04293233A (ja) * | 1991-03-22 | 1992-10-16 | Sony Corp | メタルプラグの形成方法 |
EP0720227B1 (en) * | 1994-12-29 | 2004-12-01 | STMicroelectronics, Inc. | Electrical connection structure on an integrated circuit device comprising a plug with an enlarged head |
US5591673A (en) * | 1995-07-05 | 1997-01-07 | Taiwan Semiconductor Manufacturing Company Ltd. | Tungsten stud process for stacked via applications |
-
1997
- 1997-10-17 TW TW086115290A patent/TW365700B/zh not_active IP Right Cessation
- 1997-12-05 US US08/985,698 patent/US6146995A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6146995A (en) | 2000-11-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK4A | Expiration of patent term of an invention patent |