TW349132B - Surface cleaning method of II-VI Group compound semiconductor crystal - Google Patents
Surface cleaning method of II-VI Group compound semiconductor crystalInfo
- Publication number
- TW349132B TW349132B TW086109603A TW86109603A TW349132B TW 349132 B TW349132 B TW 349132B TW 086109603 A TW086109603 A TW 086109603A TW 86109603 A TW86109603 A TW 86109603A TW 349132 B TW349132 B TW 349132B
- Authority
- TW
- Taiwan
- Prior art keywords
- compound semiconductor
- semiconductor crystal
- group compound
- cleaning method
- surface cleaning
- Prior art date
Links
- 150000001875 compounds Chemical class 0.000 title abstract 3
- 239000013078 crystal Substances 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 238000004140 cleaning Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 title abstract 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 abstract 2
- 238000005530 etching Methods 0.000 abstract 2
- KMUONIBRACKNSN-UHFFFAOYSA-N potassium dichromate Chemical compound [K+].[K+].[O-][Cr](=O)(=O)O[Cr]([O-])(=O)=O KMUONIBRACKNSN-UHFFFAOYSA-N 0.000 abstract 2
- 239000007864 aqueous solution Substances 0.000 abstract 1
- 239000003795 chemical substances by application Substances 0.000 abstract 1
- 238000009738 saturating Methods 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/18, H10D48/04 and H10D48/07, with or without impurities, e.g. doping materials
- H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
- H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/465—Chemical or electrical treatment, e.g. electrolytic etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Weting (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
A surface cleaning method of II-VI Group compound semiconductor crystal, which is characterized in using an etching agent prepared by saturating an aqueous solution consisting of sulfuric acid and water at a volume ratio of 1~10 to 1 with potassium dichromate, and etching a II-VI Group compound semiconductor crystal in a temperature range of 10~80 DEG C.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23030496 | 1996-08-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW349132B true TW349132B (en) | 1999-01-01 |
Family
ID=49516050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086109603A TW349132B (en) | 1996-08-30 | 1997-07-08 | Surface cleaning method of II-VI Group compound semiconductor crystal |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR100415366B1 (en) |
TW (1) | TW349132B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1727189A2 (en) | 1999-12-27 | 2006-11-29 | Matsushita Electric Industrial Co., Ltd. | Method for producing a semiconductor device |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5948799B2 (en) * | 1982-07-17 | 1984-11-28 | 財団法人 半導体研究振興会 | ZnSe crystal treatment method |
JPH02137800A (en) * | 1988-11-15 | 1990-05-28 | Nippon Sheet Glass Co Ltd | Etching solution of znse single crystal |
JP3080721B2 (en) * | 1991-10-14 | 2000-08-28 | 株式会社東芝 | Semiconductor crystal processing method |
US5818072A (en) * | 1992-05-12 | 1998-10-06 | North Carolina State University | Integrated heterostructure of group II-VI semiconductor materials including epitaxial ohmic contact and method of fabricating same |
JPH07307528A (en) * | 1994-05-12 | 1995-11-21 | Sumitomo Electric Ind Ltd | Method for manufacturing blue semiconductor light emitting device |
-
1997
- 1997-07-08 TW TW086109603A patent/TW349132B/en active
- 1997-08-29 KR KR1019970042554A patent/KR100415366B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR19980019152A (en) | 1998-06-05 |
KR100415366B1 (en) | 2004-04-21 |
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