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TW331599B - Array substrate for LCD and method of making same - Google Patents

Array substrate for LCD and method of making same

Info

Publication number
TW331599B
TW331599B TW085111579A TW85111579A TW331599B TW 331599 B TW331599 B TW 331599B TW 085111579 A TW085111579 A TW 085111579A TW 85111579 A TW85111579 A TW 85111579A TW 331599 B TW331599 B TW 331599B
Authority
TW
Taiwan
Prior art keywords
wires
pixel electrodes
lcd
array substrate
substrate
Prior art date
Application number
TW085111579A
Other languages
English (en)
Inventor
Yoshirou Aoki
Yoichi Masuda
Original Assignee
Toshiba Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Co Ltd filed Critical Toshiba Co Ltd
Application granted granted Critical
Publication of TW331599B publication Critical patent/TW331599B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3685—Details of drivers for data electrodes
    • G09G3/3688—Details of drivers for data electrodes suitable for active matrices only
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/10—Dealing with defective pixels
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S345/00—Computer graphics processing and selective visual display systems
    • Y10S345/904—Display with fail/safe testing feature

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Liquid Crystal (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
TW085111579A 1995-09-26 1996-09-21 Array substrate for LCD and method of making same TW331599B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24806995 1995-09-26

Publications (1)

Publication Number Publication Date
TW331599B true TW331599B (en) 1998-05-11

Family

ID=17172753

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085111579A TW331599B (en) 1995-09-26 1996-09-21 Array substrate for LCD and method of making same

Country Status (3)

Country Link
US (2) US5774100A (zh)
KR (1) KR100222311B1 (zh)
TW (1) TW331599B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7515121B2 (en) 2002-06-20 2009-04-07 Casio Computer Co., Ltd. Light emitting element display apparatus and driving method thereof
US7518393B2 (en) 2004-03-30 2009-04-14 Casio Computer Co., Ltd. Pixel circuit board, pixel circuit board test method, pixel circuit, pixel circuit test method, and test apparatus
TWI411832B (zh) * 2004-10-25 2013-10-11 Samsung Display Co Ltd 陣列基板與具有此基板之顯示器裝置

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TW374852B (en) * 1996-06-10 1999-11-21 Toshiba Corp Display device
JPH09329806A (ja) * 1996-06-11 1997-12-22 Toshiba Corp 液晶表示装置
JP2937130B2 (ja) * 1996-08-30 1999-08-23 日本電気株式会社 アクティブマトリクス型液晶表示装置
US5958026A (en) * 1997-04-11 1999-09-28 Xilinx, Inc. Input/output buffer supporting multiple I/O standards
KR100239749B1 (ko) * 1997-04-11 2000-01-15 윤종용 그로스 테스트용 tft 소자 제조 방법 및 이를 형성한 액정 표시 장치 구조와 그로스 테스트 장치 및 방법
US5877632A (en) 1997-04-11 1999-03-02 Xilinx, Inc. FPGA with a plurality of I/O voltage levels
FR2764424B1 (fr) * 1997-06-05 1999-07-09 Thomson Lcd Procede de compensation d'un circuit capacitif perturbe et application aux ecrans de visualisation matriciels
JP2001504953A (ja) * 1997-08-26 2001-04-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 表示装置
US6265889B1 (en) 1997-09-30 2001-07-24 Kabushiki Kaisha Toshiba Semiconductor test circuit and a method for testing a semiconductor liquid crystal display circuit
JP2001520422A (ja) * 1997-10-09 2001-10-30 ヴィレラ，ジョセフ，エル 電子組立品ビデオ検査システム
US6191770B1 (en) * 1997-12-11 2001-02-20 Lg. Philips Lcd Co., Ltd. Apparatus and method for testing driving circuit in liquid crystal display
TW491959B (en) * 1998-05-07 2002-06-21 Fron Tec Kk Active matrix type liquid crystal display devices, and substrate for the same
JP4057716B2 (ja) * 1998-09-25 2008-03-05 東芝松下ディスプレイテクノロジー株式会社 保護回路を具えた絶縁ゲート型トランジスタ回路装置
US6115305A (en) * 1999-06-15 2000-09-05 Atmel Corporation Method and apparatus for testing a video display chip
JP5408829B2 (ja) 1999-12-28 2014-02-05 ゲットナー・ファンデーション・エルエルシー アクティブマトリックス基板の製造方法
JP2001265248A (ja) * 2000-03-14 2001-09-28 Internatl Business Mach Corp <Ibm> アクティブ・マトリックス表示装置、及び、その検査方法
JP4659180B2 (ja) * 2000-07-12 2011-03-30 シャープ株式会社 表示装置
US7385579B2 (en) * 2000-09-29 2008-06-10 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and method of driving the same
KR100494685B1 (ko) * 2000-12-30 2005-06-13 비오이 하이디스 테크놀로지 주식회사 액정표시장치의 패널내 배선의 결함 테스트 방법
JP4562938B2 (ja) * 2001-03-30 2010-10-13 シャープ株式会社 液晶表示装置
SG109457A1 (en) * 2001-07-17 2005-03-30 Toshiba Kk Array substrate, method of inspecting array substrate, and liquid crystal display
DE10227332A1 (de) * 2002-06-19 2004-01-15 Akt Electron Beam Technology Gmbh Ansteuervorrichtung mit verbesserten Testeneigenschaften
KR100895311B1 (ko) * 2002-11-19 2009-05-07 삼성전자주식회사 액정 표시 장치 및 그 검사 방법
US7265572B2 (en) * 2002-12-06 2007-09-04 Semicondcutor Energy Laboratory Co., Ltd. Image display device and method of testing the same
US6862489B2 (en) * 2003-01-31 2005-03-01 Yieldboost Tech, Inc. System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process
CN1802593A (zh) * 2003-06-04 2006-07-12 东芝松下显示技术有限公司 阵列基板检查方法及阵列基板检查设备
GB2403581A (en) * 2003-07-01 2005-01-05 Sharp Kk A substrate and a display device incorporating the same
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US7355418B2 (en) * 2004-02-12 2008-04-08 Applied Materials, Inc. Configurable prober for TFT LCD array test
US6833717B1 (en) * 2004-02-12 2004-12-21 Applied Materials, Inc. Electron beam test system with integrated substrate transfer module
US20060038554A1 (en) * 2004-02-12 2006-02-23 Applied Materials, Inc. Electron beam test system stage
US7319335B2 (en) * 2004-02-12 2008-01-15 Applied Materials, Inc. Configurable prober for TFT LCD array testing
JP4281622B2 (ja) * 2004-05-31 2009-06-17 ソニー株式会社 表示装置及び検査方法
US7868856B2 (en) * 2004-08-20 2011-01-11 Koninklijke Philips Electronics N.V. Data signal driver for light emitting display
KR101073041B1 (ko) 2004-10-25 2011-10-12 삼성전자주식회사 어레이 기판
US20090146933A1 (en) * 2004-11-24 2009-06-11 Koninklijke Philips Electronics, N.V. High contrast liquid crystal display device
KR101093229B1 (ko) * 2005-01-06 2011-12-13 삼성전자주식회사 어레이 기판 및 이를 갖는 표시장치
US7429970B2 (en) * 2005-01-11 2008-09-30 Tpo Displays Corp. Method for testing drive circuit, testing device and display device
US7429984B2 (en) * 2005-02-04 2008-09-30 Philip Morris Usa Inc. Display management system
TWI333094B (en) * 2005-02-25 2010-11-11 Au Optronics Corp System and method for display testing
US7535238B2 (en) * 2005-04-29 2009-05-19 Applied Materials, Inc. In-line electron beam test system
US20060273815A1 (en) * 2005-06-06 2006-12-07 Applied Materials, Inc. Substrate support with integrated prober drive
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KR20070040505A (ko) * 2005-10-12 2007-04-17 삼성전자주식회사 표시 장치 및 이의 검사 방법
TW200732808A (en) 2006-02-24 2007-09-01 Prime View Int Co Ltd Thin film transistor array substrate and electronic ink display device
KR20070093540A (ko) * 2006-03-14 2007-09-19 삼성전자주식회사 표시 장치
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CN104090436B (zh) * 2014-06-26 2017-03-22 京东方科技集团股份有限公司 一种阵列基板的栅极行驱动电路及显示装置
KR102312291B1 (ko) * 2015-02-24 2021-10-15 삼성디스플레이 주식회사 표시장치 및 그의 검사방법
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CN112289243A (zh) * 2020-11-30 2021-01-29 上海天马有机发光显示技术有限公司 显示面板及其制备方法、显示装置

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7515121B2 (en) 2002-06-20 2009-04-07 Casio Computer Co., Ltd. Light emitting element display apparatus and driving method thereof
US7518393B2 (en) 2004-03-30 2009-04-14 Casio Computer Co., Ltd. Pixel circuit board, pixel circuit board test method, pixel circuit, pixel circuit test method, and test apparatus
TWI411832B (zh) * 2004-10-25 2013-10-11 Samsung Display Co Ltd 陣列基板與具有此基板之顯示器裝置

Also Published As

Publication number Publication date
KR970017107A (ko) 1997-04-28
US20020047838A1 (en) 2002-04-25
KR100222311B1 (ko) 1999-10-01
US5774100A (en) 1998-06-30

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