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TW319916B - - Google Patents

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Publication number
TW319916B
TW319916B TW084109373A TW84109373A TW319916B TW 319916 B TW319916 B TW 319916B TW 084109373 A TW084109373 A TW 084109373A TW 84109373 A TW84109373 A TW 84109373A TW 319916 B TW319916 B TW 319916B
Authority
TW
Taiwan
Prior art keywords
boundary layer
light
region
layer
emitting diode
Prior art date
Application number
TW084109373A
Other languages
English (en)
Chinese (zh)
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Application granted granted Critical
Publication of TW319916B publication Critical patent/TW319916B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/822Materials of the light-emitting regions
    • H10H20/824Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H10H20/8242Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP characterised by the dopants
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/8215Bodies characterised by crystalline imperfections, e.g. dislocations; characterised by the distribution of dopants, e.g. delta-doping
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/305Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure

Landscapes

  • Led Devices (AREA)
TW084109373A 1995-06-05 1995-09-07 TW319916B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US46337195A 1995-06-05 1995-06-05

Publications (1)

Publication Number Publication Date
TW319916B true TW319916B (de) 1997-11-11

Family

ID=23839854

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084109373A TW319916B (de) 1995-06-05 1995-09-07

Country Status (5)

Country Link
US (1) US5909051A (de)
JP (1) JP3682938B2 (de)
DE (1) DE19615179B4 (de)
GB (1) GB2301934B (de)
TW (1) TW319916B (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6794731B2 (en) * 1997-02-18 2004-09-21 Lumileds Lighting U.S., Llc Minority carrier semiconductor devices with improved reliability
JP3461112B2 (ja) * 1997-12-19 2003-10-27 昭和電工株式会社 Iii族窒化物半導体発光素子
US20010020703A1 (en) 1998-07-24 2001-09-13 Nathan F. Gardner Algainp light emitting devices with thin active layers
US6469314B1 (en) 1999-12-21 2002-10-22 Lumileds Lighting U.S., Llc Thin multi-well active layer LED with controlled oxygen doping
US6486499B1 (en) 1999-12-22 2002-11-26 Lumileds Lighting U.S., Llc III-nitride light-emitting device with increased light generating capability
US6885035B2 (en) 1999-12-22 2005-04-26 Lumileds Lighting U.S., Llc Multi-chip semiconductor LED assembly
US6903376B2 (en) 1999-12-22 2005-06-07 Lumileds Lighting U.S., Llc Selective placement of quantum wells in flipchip light emitting diodes for improved light extraction
US6573537B1 (en) 1999-12-22 2003-06-03 Lumileds Lighting, U.S., Llc Highly reflective ohmic contacts to III-nitride flip-chip LEDs
US6514782B1 (en) 1999-12-22 2003-02-04 Lumileds Lighting, U.S., Llc Method of making a III-nitride light-emitting device with increased light generating capability
US6555457B1 (en) * 2000-04-07 2003-04-29 Triquint Technology Holding Co. Method of forming a laser circuit having low penetration ohmic contact providing impurity gettering and the resultant laser circuit
US6429460B1 (en) * 2000-09-28 2002-08-06 United Epitaxy Company, Ltd. Highly luminous light emitting device
JP4619621B2 (ja) * 2000-10-09 2011-01-26 クアルコム,インコーポレイテッド 無線リソースの管理
US6608328B2 (en) * 2001-02-05 2003-08-19 Uni Light Technology Inc. Semiconductor light emitting diode on a misoriented substrate
US6563142B2 (en) * 2001-07-11 2003-05-13 Lumileds Lighting, U.S., Llc Reducing the variation of far-field radiation patterns of flipchip light emitting diodes
US6891202B2 (en) 2001-12-14 2005-05-10 Infinera Corporation Oxygen-doped Al-containing current blocking layers in active semiconductor devices
KR100916489B1 (ko) * 2007-07-27 2009-09-08 엘지이노텍 주식회사 반도체 발광소자 및 그 제조방법
US8237049B2 (en) * 2007-08-29 2012-08-07 The Boeing Company Photovoltaic cells with selectively patterned transparent conductive coatings, and associated methods
DE102010035489A1 (de) * 2010-08-26 2012-03-01 Osram Opto Semiconductors Gmbh Halbleiterbauelement und Verfahren zur Herstellung eines Halbleiterbauelement
JP6744521B1 (ja) 2018-12-11 2020-08-19 パナソニックセミコンダクターソリューションズ株式会社 窒化物系半導体発光素子及びその製造方法、並びに、窒化物系半導体結晶の製造方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3812516A (en) * 1970-05-01 1974-05-21 Bell Telephone Labor Inc Spontaneously emitting hetero-structure junction diodes
US3806774A (en) * 1972-07-10 1974-04-23 Bell Telephone Labor Inc Bistable light emitting devices
US3869281A (en) * 1974-02-14 1975-03-04 Nl Industries Inc Removal of nickel from molten magnesium metal
US3936322A (en) * 1974-07-29 1976-02-03 International Business Machines Corporation Method of making a double heterojunction diode laser
US4160261A (en) * 1978-01-13 1979-07-03 Bell Telephone Laboratories, Incorporated Mis heterojunction structures
JPS54152485A (en) * 1978-05-23 1979-11-30 Toshiba Corp Electrode forming method for gallium phosphide light- emitting diode
US4231050A (en) * 1979-01-30 1980-10-28 Bell Telephone Laboratories, Incorporated Reduction of surface recombination current in GaAs devices
US4297783A (en) * 1979-01-30 1981-11-03 Bell Telephone Laboratories, Incorporated Method of fabricating GaAs devices utilizing a semi-insulating layer of AlGaAs in combination with an overlying masking layer
US4548654A (en) * 1983-06-03 1985-10-22 Motorola, Inc. Surface denuding of silicon wafer
US4719497A (en) * 1984-06-15 1988-01-12 Hewlett-Packard Company High efficiency light-emitting diode
US4888624A (en) * 1984-06-15 1989-12-19 American Telephone And Telegraph Company, At&T Bell Laboratories Semiconductor devices employing high resistivity in-based compound group III-IV epitaxial layer for current confinement
JPS61178497A (ja) * 1985-02-04 1986-08-11 Mitsubishi Monsanto Chem Co 低転位密度ひ化ガリウム単結晶の成長方法
US4610731A (en) * 1985-04-03 1986-09-09 At&T Bell Laboratories Shallow impurity neutralization
JPS6286785A (ja) * 1985-10-11 1987-04-21 Matsushita Electric Ind Co Ltd 半導体レ−ザ装置
US5068204A (en) * 1987-03-27 1991-11-26 Misawa Co. Ltd. Method of manufacturing a light emitting element
US4861976A (en) * 1988-06-06 1989-08-29 American Telephone And Telegraph Company, At&T Bell Laboratories Optical or opto-electronic device having a trapping layer in contact with a semiconductive layer
US5153889A (en) * 1989-05-31 1992-10-06 Kabushiki Kaisha Toshiba Semiconductor light emitting device
JP2588280B2 (ja) * 1989-07-10 1997-03-05 シャープ株式会社 化合物半導体発光素子
JPH0797780A (ja) * 1993-05-17 1995-04-11 Tokai Senko Kk 捺染布帛の蒸熱処理における含水率調整装置
JP2795195B2 (ja) * 1994-09-28 1998-09-10 信越半導体株式会社 発光素子

Also Published As

Publication number Publication date
DE19615179A1 (de) 1996-12-12
US5909051A (en) 1999-06-01
GB2301934B (en) 2000-01-19
GB9611093D0 (en) 1996-07-31
JPH08330626A (ja) 1996-12-13
JP3682938B2 (ja) 2005-08-17
GB2301934A (en) 1996-12-18
DE19615179B4 (de) 2004-04-08

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees