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TW269040B - - Google Patents

Info

Publication number
TW269040B
TW269040B TW083100001A TW83100001A TW269040B TW 269040 B TW269040 B TW 269040B TW 083100001 A TW083100001 A TW 083100001A TW 83100001 A TW83100001 A TW 83100001A TW 269040 B TW269040 B TW 269040B
Authority
TW
Taiwan
Application number
TW083100001A
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Application granted granted Critical
Publication of TW269040B publication Critical patent/TW269040B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
TW083100001A 1993-05-12 1994-01-04 TW269040B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/058,152 US5341678A (en) 1993-05-12 1993-05-12 Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods

Publications (1)

Publication Number Publication Date
TW269040B true TW269040B (zh) 1996-01-21

Family

ID=22015022

Family Applications (1)

Application Number Title Priority Date Filing Date
TW083100001A TW269040B (zh) 1993-05-12 1994-01-04

Country Status (4)

Country Link
US (1) US5341678A (zh)
EP (1) EP0627609A1 (zh)
JP (1) JPH0771905A (zh)
TW (1) TW269040B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113932700A (zh) * 2021-09-28 2022-01-14 中国矿业大学 一种基于阻抗坐标变换的热障涂层粘结层厚度测量方法

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69602841T2 (de) * 1995-06-29 1999-12-30 Bekaert N.V. S.A., Zwevegem Verfahren und einrichtung zur dickenmessung von leitenden nicht ferromagnetischen schichten auf einem leitenden ferromagnetischen substrat
US6366083B1 (en) * 1999-09-17 2002-04-02 Framatome Anp Inc. Method for measuring the thickness of oxide layer underlying crud layer containing ferromagnetic material on nuclear fuel rods
US6369566B1 (en) * 1999-09-27 2002-04-09 Framatone Anp Inc. Method for measuring crud thickness on nuclear fuel rods
US6288537B1 (en) 1999-12-22 2001-09-11 General Electric Company Eddy current probe with foil sensor mounted on flexible probe tip and method of use
TWI241398B (en) * 2000-03-28 2005-10-11 Toshiba Corp Eddy current loss measuring sensor, film thickness measuring device, film thickness measuring method and recording medium
US20030210041A1 (en) * 2000-04-07 2003-11-13 Le Cuong Duy Eddy current measuring system for monitoring and controlling a chemical vapor deposition (CVD) process
US6741076B2 (en) 2000-04-07 2004-05-25 Cuong Duy Le Eddy current measuring system for monitoring and controlling a CMP process
US6549006B2 (en) * 2000-04-07 2003-04-15 Cuong Duy Le Eddy current measurements of thin-film metal coatings using a selectable calibration standard
US6762604B2 (en) 2000-04-07 2004-07-13 Cuong Duy Le Standalone eddy current measuring system for thickness estimation of conductive films
US7215117B2 (en) * 2001-10-17 2007-05-08 Esr Technology Ltd. Measurement with a magnetic field
US7388369B2 (en) * 2004-11-30 2008-06-17 Electric Power Research Institute, Inc. Method and apparatus for measuring hydrogen concentration in zirconium alloy components in the fuel pool of a nuclear power plant
JP4895142B2 (ja) * 2008-12-18 2012-03-14 株式会社グローバル・ニュークリア・フュエル・ジャパン 酸化膜厚さ測定方法
US8903680B2 (en) * 2010-12-10 2014-12-02 The Boeing Company Apparatus and method for evaluating layers in a multi-layer structure
KR101200781B1 (ko) * 2011-07-08 2012-11-13 한전원자력연료 주식회사 프로브 및 이를 포함하는 연료봉 산화막 두께 측정장치
CN111487294A (zh) * 2019-12-19 2020-08-04 韦士肯(厦门)智能科技有限公司 一种金属探伤方法及系统
CN111929127B (zh) * 2020-07-23 2023-06-13 核工业西南物理研究院 一种原位实时定量诊断聚变装置面壁部件腐蚀沉积的方法
KR102589937B1 (ko) * 2021-04-01 2023-10-17 현대모비스 주식회사 레이더용 웨이브가이드

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1237335B (de) * 1963-12-03 1967-03-23 Dr Phil Friedrich Foerster Anordnung zur Messung von Schichtdicken nichtferromagnetischer Medien auf ferromagnetischem Material
US3737764A (en) * 1971-09-27 1973-06-05 Commissariat Energie Atomique Eddy-current test apparatus for detection of flaws in a metal seal placed within an electrically conductive tube
US4088946A (en) * 1975-07-28 1978-05-09 Westinghouse Electric Corp. Magnetic bridge transducer formed with permanent magnets and a hall effect sensor for identifying the presence and location of ferromagnetic discontinuities within or on a tubular specimen
US4292588A (en) * 1978-12-18 1981-09-29 Schlumberger Technology Corporation Electromagnetic inspection tool for ferromagnetic casings
US4303885A (en) * 1979-06-18 1981-12-01 Electric Power Research Institute, Inc. Digitally controlled multifrequency eddy current test apparatus and method
AU7802481A (en) * 1981-10-14 1983-05-05 Combustion Engineering Inc. Clad thickness measuring device
US4553095A (en) * 1982-06-10 1985-11-12 Westinghouse Electric Corp. Eddy current thickness gauge with constant magnetic bias
JPS5967405A (ja) * 1982-09-30 1984-04-17 Sumitomo Metal Ind Ltd ライナ厚測定方法
JPS6193901A (ja) * 1984-10-15 1986-05-12 Kobe Steel Ltd ライナ厚測定方法
US4700134A (en) * 1985-01-10 1987-10-13 Anco Engineers, Inc. Method and apparatus for determining the amount of magnetic debris adhering to the exterior of a tube
JPS6453146A (en) * 1987-01-09 1989-03-01 Hitachi Ltd Method and instrument for measuring electrical conductivity of solution and water quality control method
WO1988006716A1 (en) * 1987-02-27 1988-09-07 Radiodetection Limited Inductive displacement sensors
US4901017A (en) * 1987-08-28 1990-02-13 Zinke Otto H Gap-modified magnetic bridge device for fringing flux analysis
FR2656415B1 (fr) * 1989-12-27 1993-04-09 Framatome Sa Procede et dispositif de mesure simultanee de distance entre tubes metalliques et d'epaisseur d'oxyde sur les tubes.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113932700A (zh) * 2021-09-28 2022-01-14 中国矿业大学 一种基于阻抗坐标变换的热障涂层粘结层厚度测量方法

Also Published As

Publication number Publication date
US5341678A (en) 1994-08-30
JPH0771905A (ja) 1995-03-17
EP0627609A1 (en) 1994-12-07

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