TW202501171A - Bearing - Google Patents
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- TW202501171A TW202501171A TW113119774A TW113119774A TW202501171A TW 202501171 A TW202501171 A TW 202501171A TW 113119774 A TW113119774 A TW 113119774A TW 113119774 A TW113119774 A TW 113119774A TW 202501171 A TW202501171 A TW 202501171A
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- bearing surface
- piston
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70816—Bearings
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C29/00—Bearings for parts moving only linearly
- F16C29/02—Sliding-contact bearings
- F16C29/025—Hydrostatic or aerostatic
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16C—SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OR CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS
- F16C32/00—Bearings not otherwise provided for
- F16C32/06—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings
- F16C32/0603—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings supported by a gas cushion, e.g. an air cushion
- F16C32/0614—Bearings not otherwise provided for with moving member supported by a fluid cushion formed, at least to a large extent, otherwise than by movement of the shaft, e.g. hydrostatic air-cushion bearings supported by a gas cushion, e.g. an air cushion the gas being supplied under pressure, e.g. aerostatic bearings
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
本發明係關於一種軸承,其可適合用於微影設備內。微影設備可為極紫外線(EUV)微影設備。The present invention relates to a bearing which can be suitable for use in a lithography apparatus. The lithography apparatus can be an extreme ultraviolet (EUV) lithography apparatus.
微影設備為經建構以將所要圖案施加至基板上之機器。微影設備可用於例如積體電路(IC)之製造中。舉例而言,微影設備可將來自圖案化裝置(例如遮罩)之圖案投射至設置於基板上之輻射敏感材料(抗蝕劑)層上。A lithography apparatus is a machine constructed to apply a desired pattern onto a substrate. A lithography apparatus may be used, for example, in the manufacture of integrated circuits (ICs). For example, a lithography apparatus may project a pattern from a patterning device (such as a mask) onto a layer of radiation-sensitive material (resist) disposed on a substrate.
微影設備用以將圖案投射至基板上之輻射的波長決定了可形成於彼基板上之特徵的最小大小。相比於習知微影設備(其可例如使用具有為193 nm之波長之電磁輻射),使用為具有在4至20 nm之範圍內的波長之電磁輻射之EUV輻射的微影設備可用於在基板上形成較小特徵。The wavelength of radiation used by a lithography apparatus to project a pattern onto a substrate determines the minimum size of features that can be formed on that substrate. Lithography apparatus using EUV radiation, which is electromagnetic radiation having a wavelength in the range of 4 to 20 nm, can be used to form smaller features on a substrate than conventional lithography apparatus (which may, for example, use electromagnetic radiation having a wavelength of 193 nm).
用於將圖案賦予至微影設備中之輻射射束的圖案化裝置(例如遮罩)可形成遮罩總成之部分。A patterning device (eg, a mask) for imparting a pattern to a radiation beam in a lithography apparatus may form part of a mask assembly.
倍縮光罩遮蔽葉片可用以界定圖案化裝置之可接收輻射的大體上矩形區。在使用中,倍縮光罩遮蔽葉片可經歷線性運動。此線性運動可經由一或多個軸桿傳輸至倍縮光罩遮蔽葉片。一或多個軸桿可由軸承支撐。在使用中,各軸桿可在大體上平行於其軸線之方向上相對於軸承移動,同時由軸承支撐。各軸桿及由此支撐之倍縮光罩遮蔽葉片可在使用中經受高加速度。需要準確地定位倍縮光罩遮蔽葉片以便確保其適當地操作。The zoom mask shield blade can be used to define a generally rectangular area of the patterned device that can receive radiation. In use, the zoom mask shield blade can undergo linear motion. This linear motion can be transmitted to the zoom mask shield blade via one or more shafts. One or more shafts can be supported by bearings. In use, each shaft can move relative to the bearing in a direction generally parallel to its axis while being supported by the bearing. Each shaft and the zoom mask shield blade supported thereby can withstand high accelerations in use. Accurate positioning of the zoom mask shield blade is required to ensure its proper operation.
可需要提供一種預防或減輕與先前技術相關聯之一或多個問題的設備。It may be desirable to provide a device that prevents or mitigates one or more of the problems associated with the prior art.
根據本揭露之第一態樣,提供一種軸承,其包含:支撐件;及複數個軸承表面,其由該支撐件支撐且經組態以至少部分地界定用於收納軸桿之孔隙,該孔隙具有圍繞孔隙之質心的有限旋轉對稱階數;其中軸承表面中之至少一些經組態以便可相對於支撐件獨立地移位,以便允許在孔隙中收納之軸桿圍繞正交於軸桿之標稱軸線的一或多個旋轉軸線旋轉,同時實質上防止軸桿圍繞其標稱軸線旋轉。According to a first aspect of the present disclosure, a bearing is provided, comprising: a support member; and a plurality of bearing surfaces supported by the support member and configured to at least partially define a void for receiving a shaft, the void having a finite rotational symmetry order about a center of mass of the void; wherein at least some of the bearing surfaces are configured so as to be independently displaceable relative to the support member so as to allow a shaft received in the void to rotate about one or more rotational axes orthogonal to a nominal axis of the shaft while substantially preventing the shaft from rotating about its nominal axis.
應採用術語可移位來指示以平移方式及/或以旋轉方式移動之能力。The term displaceable should be used to indicate the ability to move in translation and/or rotation.
在一些實施例中,軸承表面可經組態以便可相對於支撐件獨立地旋轉。在其他替代性實施例中,軸承表面可經組態以便可相對於支撐件獨佔地旋轉。In some embodiments, the bearing surface may be configured so as to be independently rotatable relative to the support. In other alternative embodiments, the bearing surface may be configured so as to be exclusively rotatable relative to the support.
軸桿可為往復軸桿,該往復軸桿在使用中可在大體平行於其軸線之方向上相對於軸承移動,同時由軸承支撐。在高加速度下,此類往復軸桿可在正交於軸桿之標稱軸線的方向上經受偏轉。往復軸桿之偏轉可在軸承處引起軸桿之局部旋轉或局部傾斜。舉例而言,軸桿可支撐微影設備之倍縮光罩遮蔽葉片。倍縮光罩遮蔽葉片圍繞軸桿之標稱軸線的旋轉係不合需要的。The shaft may be a reciprocating shaft which, in use, may move relative to the bearing in a direction generally parallel to its axis while being supported by the bearing. Under high accelerations, such a reciprocating shaft may experience deflections in a direction orthogonal to the nominal axis of the shaft. Deflections of the reciprocating shaft may cause local rotation or local tilting of the shaft at the bearing. For example, the shaft may support a multiplying reticle shielding blade of a lithography apparatus. Rotation of the multiplying reticle shielding blade about the nominal axis of the shaft is undesirable.
有利地,提供至根據第一態樣之軸承之軸承表面的旋轉自由度允許軸承表面藉由旋轉而符合往復軸桿之局部傾斜。軸承表面之旋轉減少了負載跨越軸承表面的不均勻性(亦即,局部濃度)。在流體膜存在於軸承表面與軸桿之間的情況下,軸承表面之旋轉輔助在軸承表面與往復軸桿之間維持足夠的膜。此允許膜能夠支撐往復軸桿,而在往復軸桿與軸承表面之間無過度接觸。Advantageously, the rotational freedom provided to the bearing surface of the bearing according to the first aspect allows the bearing surface to conform to the local tilt of the reciprocating shaft by rotating. The rotation of the bearing surface reduces the non-uniformity (i.e., local concentration) of the load across the bearing surface. In the event that a fluid film exists between the bearing surface and the shaft, the rotation of the bearing surface assists in maintaining sufficient film between the bearing surface and the reciprocating shaft. This allows the film to support the reciprocating shaft without excessive contact between the reciprocating shaft and the bearing surface.
軸桿之標稱軸線可為在複數個軸承表面安置於標稱位置或定向中時由複數個軸承表面界定的孔隙之軸線。The nominal axis of the shaft may be the axis of the aperture defined by the plurality of bearing surfaces when the plurality of bearing surfaces are disposed in a nominal position or orientation.
使用右側笛卡爾座標集合,若軸桿之標稱軸線平行於z軸,則軸承表面中之至少一些可為可旋轉的以便允許軸桿圍繞x軸及/或y軸旋轉。應瞭解,在此旋轉之後,一般而言,軸桿之軸線將相對於軸桿之標稱軸線成非零角度(亦即,軸桿將不再極佳地平行於z軸)。Using a right-hand Cartesian set of coordinates, if the nominal axis of the shaft is parallel to the z-axis, at least some of the bearing surfaces may be rotatable to allow the shaft to rotate about the x-axis and/or the y-axis. It will be appreciated that after such rotation, in general, the axis of the shaft will be at a non-zero angle relative to the nominal axis of the shaft (i.e., the shaft will no longer be perfectly parallel to the z-axis).
根據第一態樣之軸承耐受往復軸桿之偏轉,此允許往復軸桿經受更高加速度及速度。The bearing according to the first aspect tolerates deflections of the reciprocating shaft, which allows the reciprocating shaft to withstand higher accelerations and speeds.
根據第一態樣之軸承需要較不嚴格的製造公差,從而使得軸承之製造具更低成本。Bearings according to the first aspect require less stringent manufacturing tolerances, thereby making the bearings less expensive to manufacture.
複數個軸承表面可以一或多對大體相對之軸承表面配置,且各對軸承表面之軸承表面可在第一方向上分隔開且可各自圍繞旋轉軸線旋轉。給定對之軸承表面之兩個軸承表面的旋轉軸線可平行於大體上垂直於第一方向及軸桿之標稱軸線的第二方向。The plurality of bearing surfaces may be arranged in one or more pairs of substantially opposed bearing surfaces, and the bearing surfaces of each pair of bearing surfaces may be spaced apart in a first direction and may each rotate about an axis of rotation. The axes of rotation of both bearing surfaces of a given pair of bearing surfaces may be parallel to a second direction substantially perpendicular to the first direction and the nominal axis of the shaft.
可圍繞軸桿在第二方向上(亦即,平行旋轉軸線)旋轉之相對軸承表面能夠在共同旋轉時(例如,回應於往復軸桿之局部傾斜)保持互相平行。孔隙之稜柱形幾何形狀係在軸承表面對共同旋轉時被保留,從而允許維持均一的膜厚度,有助於軸承之操作。特定而言,若此各對大體上相對之軸承表面圍繞其各別旋轉軸線旋轉相同角度,則由於此等兩個旋轉軸線皆平行於第二方向,至少部分地由軸承表面界定之孔隙之形狀將相同,儘管在第一方向上按角度之餘弦因數按比例調整。Opposing bearing surfaces rotatable about the shaft in a second direction (i.e., parallel to the axis of rotation) are able to remain parallel to each other when rotated together (e.g., in response to local tilt of the reciprocating shaft). The prismatic geometry of the pores is preserved when the pair of bearing surfaces rotate together, thereby allowing uniform film thickness to be maintained, facilitating operation of the bearings. In particular, if each pair of substantially opposing bearing surfaces is rotated about their respective axes of rotation by the same angle, then because both axes of rotation are parallel to the second direction, the shape of the pores at least partially defined by the bearing surfaces will be the same, although scaled by a factor of the cosine of the angle in the first direction.
複數個軸承表面可包含至少一個軸承表面,該至少一個軸承表面經約束以便實質上防止至少一個軸承表面相對於支撐件圍繞軸桿之標稱軸線旋轉。The plurality of bearing surfaces may include at least one bearing surface that is constrained so as to substantially prevent the at least one bearing surface from rotating relative to the support member about a nominal axis of the shaft.
複數個軸承表面可僅包含一個軸承表面,該軸承表面經約束以便實質上防止至少一個軸承表面相對於支撐件圍繞軸桿之標稱軸線旋轉。The plurality of bearing surfaces may include only one bearing surface that is constrained so as to substantially prevent at least one bearing surface from rotating relative to the support member about a nominal axis of the shaft.
僅一個軸承之約束防止軸桿圍繞其標稱軸線之非所要旋轉,且避免軸承之過度約束。Constraint of only one bearing prevents unwanted rotation of the shaft about its nominal axis and avoids overconstraint of the bearing.
複數個軸承表面可以一或多對大體相對之軸承表面配置,且各對軸承表面之軸承表面在第一方向上分隔開。The plurality of bearing surfaces may be arranged in one or more pairs of substantially opposing bearing surfaces, and the bearing surfaces of each pair of bearing surfaces are spaced apart in a first direction.
各對軸承表面之軸承表面各自可圍繞旋轉軸線旋轉,給定對之軸承表面之兩個軸承表面的旋轉軸線平行於大體上垂直於第一方向及軸桿之標稱軸線的第二方向。The bearing surfaces of each pair of bearing surfaces are each rotatable about an axis of rotation, and the axes of rotation of the two bearing surfaces of a given pair of bearing surfaces are parallel to a second direction that is substantially perpendicular to the first direction and the nominal axis of the shaft.
軸承表面之旋轉軸線係使得其實質上不能圍繞平行於軸桿之標稱軸線的軸線旋轉。The axis of rotation of the bearing surface is such that it is substantially unable to rotate about an axis parallel to the nominal axis of the shaft.
各對軸承表面可包含可旋轉軸承表面及經偏置軸承表面。Each pair of bearing surfaces may include a rotatable bearing surface and an offset bearing surface.
可旋轉軸承表面與經偏置軸承表面之組合允許軸承有效地約束軸桿,而在軸承表面與軸桿之間無需小公差。The combination of a rotatable bearing surface and an offset bearing surface allows the bearing to effectively constrain the rod without requiring close tolerances between the bearing surface and the rod.
該等對中之至少一者的可旋轉軸承表面可僅圍繞平行於第二方向之軸線旋轉,該第二方向大體上垂直於第一方向及軸桿之標稱軸線。The rotatable bearing surface of at least one of the pairs can rotate only about an axis parallel to a second direction that is substantially perpendicular to the first direction and the nominal axis of the shaft.
該等對中之至少一者的可旋轉軸承表面可圍繞垂直於該對軸承表面之第一方向的兩個軸線中之任一者旋轉。The rotatable bearing surface of at least one of the pairs can rotate about either of two axes perpendicular to the first direction of the pair of bearing surfaces.
該等軸承表面對中之至少一者的可旋轉軸承表面可經由萬向鉸鏈連接至支撐件。萬向鉸鏈可包含一或多個撓曲件。The rotatable bearing surface of at least one of the bearing surface pairs may be connected to the support member via a universal hinge. The universal hinge may include one or more flexures.
有利地,軸承表面在不添加額外旋轉約束的情況下將軸桿支撐於適當位置。額外旋轉約束可能需要軸承及軸桿之更精細的公差。Advantageously, the bearing surfaces hold the shaft in place without adding additional rotational restraint, which might require finer tolerances on the bearing and shaft.
可藉由一或多個偏置構件將各經偏置軸承表面朝向孔隙之質心推動。Each offset bearing surface may be urged toward the centroid of the aperture by one or more offset members.
在使用中,將經偏置軸承表面朝向軸桿推動,從而允許軸承表面適應軸桿及軸承尺寸之變化。In use, the offset bearing surface is pushed toward the shaft, thereby allowing the bearing surface to adapt to changes in shaft and bearing size.
一或多個經偏置軸承表面中之各者可包含用於防止經偏置軸承表面在第一方向上沿旋轉軸線之旋轉的構件。用於防止經偏置軸承表面之旋轉的構件可包含互補反旋轉特徵。Each of the one or more offset bearing surfaces may include means for preventing rotation of the offset bearing surface along the axis of rotation in a first direction. The means for preventing rotation of the offset bearing surface may include complementary anti-rotation features.
一或多個經偏置軸承表面之一或多個偏置構件可包含氣動偏置構件及/或機械偏置構件。One or more biasing members of one or more biased bearing surfaces may include pneumatic biasing members and/or mechanical biasing members.
一或多個偏置構件可包含氣動活塞。The one or more biasing members may include a pneumatic piston.
可藉由第一組態中之機械構件及藉由第二組態中之氣動構件將一或多個經偏置軸承表面朝向孔隙之質心推動。One or more offset bearing surfaces may be urged toward the center of mass of the aperture by a mechanical component in a first configuration and by a pneumatic component in a second configuration.
在第一組態中,軸承可諸如在運輸期間與外部氣動壓力源斷開連接。在第二組態中,軸承可諸如在軸承之操作期間自外部氣動壓力源連接。In a first configuration, the bearing may be disconnected from the external pneumatic pressure source, such as during transportation. In a second configuration, the bearing may be connected from the external pneumatic pressure source, such as during operation of the bearing.
有利地,在軸承之運輸期間,由機械構件提供之張力允許軸桿被動地由軸承緊固地固持而無需外部動力。Advantageously, during transportation of the bearing, the tension provided by the mechanical member allows the shaft to be passively and securely held by the bearing without the need for external power.
機械偏置構件可包含螺旋彈簧、波形墊圈或彈性元件。The mechanical biasing member may include a coil spring, a wave washer or a resilient element.
軸承可包含兩對軸承表面,其旋轉軸線互相正交。The bearing may comprise two pairs of bearing surfaces whose axes of rotation are orthogonal to each other.
兩對軸承表面允許軸承回應於往復軸桿在垂直於標稱軸桿軸線之任何方向上的偏轉而維持足夠的膜。應瞭解,具有更多對軸承表面之其他配置係可能的(例如3、4、5、6、7或更多),但此等配置在機械上可能更複雜。Two pairs of bearing surfaces allow the bearings to maintain adequate film in response to deflection of the reciprocating shaft in any direction perpendicular to the nominal shaft axis. It should be understood that other configurations with more pairs of bearing surfaces are possible (e.g., 3, 4, 5, 6, 7 or more), but such configurations may be more mechanically complex.
軸承可係空氣軸承。The bearing may be an air bearing.
特定而言,軸承可為靜氣軸承。空氣軸承以低摩擦、振動及高精度操作。藉由符合往復軸桿之局部傾斜,本揭露之空氣軸承可跨越軸承表面維持足夠的氣膜。足夠的氣膜可在往復軸桿與軸承表面之間無任何接觸的情況下支撐往復軸桿,從而使磨損及摩擦最小化。In particular, the bearing may be a hydrostatic bearing. Air bearings operate with low friction, vibration and high precision. By conforming to the local tilt of the reciprocating shaft, the air bearing of the present disclosure can maintain a sufficient air film across the bearing surface. The sufficient air film can support the reciprocating shaft without any contact between the reciprocating shaft and the bearing surface, thereby minimizing wear and friction.
軸承可進一步包含用於連接至氣體供應器之氣體入口及經組態以將氣體入口以流體方式連接至複數個軸承表面中之各者的一或多個通道。The bearing may further include a gas inlet for connecting to a gas supply and one or more channels configured to fluidly connect the gas inlet to each of the plurality of bearing surfaces.
在使用中,氣體入口可連接至氣體供應系統。在使用中,氣體入口可供應有加壓氣體(例如,經由一或多個可撓性管)。應瞭解,氣體入口可包含複數個氣體入口。舉例而言,在一些實施例中,可針對複數個軸承表面中之各者提供一個氣體入口。對於此等實施例,一或多個通道可經組態以將各氣體入口以流體方式連接至複數個軸承表面中之對應軸承表面。In use, the gas inlet may be connected to a gas supply system. In use, the gas inlet may be supplied with pressurized gas (e.g., via one or more flexible tubes). It will be appreciated that the gas inlet may include a plurality of gas inlets. For example, in some embodiments, a gas inlet may be provided for each of a plurality of bearing surfaces. For such embodiments, one or more channels may be configured to fluidically connect each gas inlet to a corresponding bearing surface of the plurality of bearing surfaces.
軸承可進一步包含複數個軸承部件,各軸承部件包含本體且界定複數個軸承表面中之一者。各軸承部件之本體可界定氣體歧管,該氣體歧管包含入口且經組態以使在入口處接收之氣體均勻地分配於由本體界定之軸承表面上方。The bearing may further include a plurality of bearing components, each bearing component including a body and defining one of a plurality of bearing surfaces. The body of each bearing component may define a gas manifold including an inlet and configured so that gas received at the inlet is evenly distributed over the bearing surface defined by the body.
各軸承部件可被視為在軸承表面中之一者之下的支撐件。支撐件可進一步包含歧管,該歧管透過可撓性管供應有氣體。在使用中,各軸承部件之各歧管的入口可連接至氣體供應系統。在使用中,各軸承部件之各歧管之入口可供應有加壓氣體(例如經由可撓性管)。氣體可為空氣。Each bearing component may be considered as a support member below one of the bearing surfaces. The support member may further comprise a manifold, which is supplied with gas via a flexible tube. In use, the inlet of each manifold of each bearing component may be connected to a gas supply system. In use, the inlet of each manifold of each bearing component may be supplied with pressurized gas (e.g. via a flexible tube). The gas may be air.
軸承部件可為包含界定軸承表面之第一部分及支撐該第一部分之第二部分的複合部件。界定軸承表面之第一部分可實質上由多孔石墨構成。一般而言,第一部分及第二部分可由不同材料形成。The bearing component may be a composite component including a first portion defining a bearing surface and a second portion supporting the first portion. The first portion defining the bearing surface may be substantially composed of porous graphite. In general, the first portion and the second portion may be formed of different materials.
軸承表面中之各者可經由偏置機構連接至支撐件,該偏置機構經配置以使軸承表面朝向標稱位置或定向偏置。Each of the bearing surfaces may be connected to the support via a biasing mechanism configured to bias the bearing surface toward a nominal position or orientation.
應瞭解,偏置機構可包含彈性偏置部件之任何組合,諸如彈簧、片彈簧、撓曲件或其類似者。It will be appreciated that the biasing mechanism may comprise any combination of resilient biasing components, such as springs, leaf springs, flexures or the like.
軸承表面中之至少一者可經由一或多個撓曲件連接至支撐件。At least one of the bearing surfaces may be connected to the support member via one or more flexure members.
有利地,撓曲件為單組件且因此不展現出明顯摩擦或背隙。撓曲件可屬於片彈簧形式或任何其他類型之撓曲件。撓曲件可為「凹口」撓曲件。撓曲件可安裝至支撐件。Advantageously, the flex member is a single component and therefore does not exhibit significant friction or backlash. The flex member may be in the form of a leaf spring or any other type of flex member. The flex member may be a "notch" flex member. The flex member may be mounted to a support member.
在一些實施例中,軸承表面中之各者可經由一或多個撓曲件連接至支撐件。In some embodiments, each of the bearing surfaces may be connected to the support member via one or more flexures.
軸承表面中之至少一者可具有一個自由度。At least one of the bearing surfaces may have one degree of freedom.
在一些實施例中,軸承表面中之各者可具有一個自由度。In some embodiments, each of the bearing surfaces may have one degree of freedom.
具有一個自由度之軸承表面固有地限制旋轉至正交於軸桿往復方向的旋轉軸線,而無需另外機構或結構。在一實例中,經由凹口撓曲件連接至支撐件之軸承表面具有一個自由度。A bearing surface with one degree of freedom inherently constrains rotation to an axis of rotation orthogonal to the reciprocating direction of the shaft without requiring additional mechanisms or structures. In one example, a bearing surface connected to a support member via a notched flexure has one degree of freedom.
軸承表面可具有高達3毫弧度之旋轉範圍。在一實例中,軸承表面中之至少一者可具有±1.5毫弧度之旋轉範圍。空氣軸承可進一步包含經組態以將軸承表面之旋轉限制在所要範圍內的結構(例如保險桿或實體止擋件)。另外或替代地,空氣軸承可包含用以進一步支撐軸承表面同時仍允許所要旋轉之結構。The bearing surfaces may have a range of rotation of up to 3 milliradians. In one example, at least one of the bearing surfaces may have a range of rotation of ±1.5 milliradians. The air bearing may further include structure (e.g., a safety lever or a physical stop) configured to limit rotation of the bearing surface to a desired range. Additionally or alternatively, the air bearing may include structure to further support the bearing surface while still allowing the desired rotation.
軸承表面中之至少一者的偏置機構可實質上由鈦或鐵合金構成。The biasing mechanism of at least one of the bearing surfaces may consist essentially of titanium or an iron alloy.
在一些實施例中,軸承表面中之各者可實質上由鈦或鐵合金構成。In some embodiments, each of the bearing surfaces may consist essentially of titanium or an iron alloy.
鐵合金可包括不鏽鋼或碳鋼。有利地,歸因於鈦合金及鐵合金之高疲乏限制,鈦合金及鐵合金偏置機構(例如撓曲件)具有長久壽命。一般而言,偏置機構可由具有高疲乏強度及/或疲乏限制的任何材料製造。The iron alloy may include stainless steel or carbon steel. Advantageously, titanium alloy and iron alloy biasing mechanisms (e.g., bends) have a long life due to their high fatigue limits. Generally speaking, biasing mechanisms may be made of any material with high fatigue strength and/or fatigue limits.
軸承表面可為實質上平面的。The bearing surface may be substantially planar.
平面軸承表面允許往復軸桿以正交於其平面之軸線自由傾斜。A flat bearing surface allows the reciprocating rod to tilt freely about an axis normal to its plane.
軸承表面可替代地在橫向於軸桿往復方向(亦即,軸桿之標稱軸線)的方向上彎曲(亦即,凸起、凹入或其組合)。The bearing surface may alternatively be curved (ie, convex, concave, or a combination thereof) in a direction transverse to the reciprocating direction of the shaft (ie, the nominal axis of the shaft).
根據第二態樣,提供一種微影設備之倍縮光罩遮蔽系統,該倍縮光罩遮蔽系統包含:軸桿;倍縮光罩遮蔽葉片,其經組態以部分地界定光學孔隙;及第一態樣之軸承;其中軸桿收納於由軸承之軸承表面界定且由此支撐之孔隙中。軸承可包含上文所描述之視情況選用的特徵中之任一者。According to a second aspect, a multiplying mask shielding system for a lithography apparatus is provided, the multiplying mask shielding system comprising: a shaft; a multiplying mask shielding blade configured to partially define an optical aperture; and the bearing of the first aspect; wherein the shaft is received in the aperture defined by and supported by a bearing surface of the bearing. The bearing may include any of the optional features described above.
軸桿經組態以在軸承孔隙內往復。根據第二態樣之倍縮光罩遮蔽系統可在倍縮光罩遮蔽葉片之高速度及加速度下操作。根據第二態樣之倍縮光罩遮蔽系統亦避免對經組態以限制倍縮光罩遮蔽葉片圍繞軸桿往復方向之旋轉的額外機構之需求,從而減少倍縮光罩遮蔽系統之佔據面積。The shaft is configured to reciprocate within the bearing aperture. The doubling mask shielding system according to the second aspect can operate at high speeds and accelerations of the doubling mask shielding blades. The doubling mask shielding system according to the second aspect also avoids the need for an additional mechanism configured to limit the rotation of the doubling mask shielding blades around the reciprocating direction of the shaft, thereby reducing the footprint of the doubling mask shielding system.
軸桿在橫截面上可至少部分地為非環狀。The shaft may be at least partially non-annular in cross-section.
非環狀孔隙及/或軸桿會防止在軸桿往復方向上旋轉。Non-annular apertures and/or shafts will prevent rotation in the shaft reciprocating direction.
偏置構件可包含:彈簧;可膨脹氣動腔室;另外其中該偏置構件可在以下兩者之間組態:第一組態,其中彈簧經組態以透過氣動腔室將經偏置軸承表面朝向孔隙質心推動;及第二組態,其中氣動腔室經加壓,從而縮回彈簧,且氣動腔室之氣動壓力將經偏置軸承表面朝向孔隙質心推動。The biasing member may include: a spring; an expandable pneumatic chamber; and wherein the biasing member may be configured between: a first configuration, wherein the spring is configured to push the biased bearing surface toward the center of mass of the pore through the pneumatic chamber; and a second configuration, wherein the pneumatic chamber is pressurized, thereby retracting the spring, and the pneumatic pressure of the pneumatic chamber pushes the biased bearing surface toward the center of mass of the pore.
對於給定氣體壓力,軸桿與經偏置軸承表面之相對位置(亦即,其分隔)大致恆定。有利地,分隔實質上獨立於組件在限度內之絕對位置。在分隔之任何干擾下,軸承表面將自身重新定位在正確分隔處以便達到力均衡。經偏置軸承表面自動地補償軸承及/或軸桿尺寸之不準確性。For a given gas pressure, the relative position of the shaft and the offset bearing surfaces (i.e., their separation) is approximately constant. Advantageously, the separation is substantially independent of the absolute position of the components within limits. With any disturbance in the separation, the bearing surfaces will reposition themselves at the correct separation to achieve force balance. The offset bearing surfaces automatically compensate for inaccuracies in the bearing and/or shaft dimensions.
偏置構件可進一步包含:子活塞,其藉由彈簧推動;主活塞,其連接至經偏置軸承表面;其中彈簧、子活塞及主活塞被限制在設置於支撐件中之孔內,且主活塞及子活塞與孔一起界定可膨脹氣動腔室;且另外其中在第一組態中,子活塞及主活塞接觸;且在第二組態中,子活塞及主活塞藉由氣動壓力分隔開。The biasing member may further include: a sub-piston, which is pushed by a spring; a main piston, which is connected to the biased bearing surface; wherein the spring, the sub-piston and the main piston are confined in a hole set in the support member, and the main piston and the sub-piston together with the hole define an expandable pneumatic chamber; and further wherein in a first configuration, the sub-piston and the main piston are in contact; and in a second configuration, the sub-piston and the main piston are separated by pneumatic pressure.
主活塞及/或子活塞可進一步包含活塞密封環,該活塞密封環經組態以密封孔。The main piston and/or the sub-piston may further include a piston sealing ring configured to seal the hole.
活塞密封環耐受主活塞及/或子活塞之往復移動且允許主活塞傾斜。活塞密封環確保主活塞/子活塞與孔之間的有效氣動密封。The piston seal ring tolerates the reciprocating movement of the main piston and/or sub-piston and allows the main piston to tilt. The piston seal ring ensures an effective pneumatic seal between the main piston/sub-piston and the bore.
氣動腔室可以流體方式連接至氣體入口及經偏置軸承表面。The pneumatic chamber can be fluidly connected to the gas inlet and the offset bearing surface.
軸桿可進一步由第二軸承支撐。The shaft may be further supported by a secondary bearing.
在兩個點處支撐往復軸桿將往復軸桿的平移約束在垂直於軸桿之標稱軸線的方向上。Supporting the reciprocating shaft at two points constrains the translation of the reciprocating shaft in a direction perpendicular to the nominal axis of the shaft.
軸桿可包含藉由軸承收納之具有非環狀橫截面的第一部分及藉由第二軸承之孔隙收納之具有環狀橫截面的第二部分。The shaft may include a first portion having a non-annular cross-section received by the bearing and a second portion having an annular cross-section received by the aperture of the second bearing.
在一些實施例中,軸桿之第二部分亦可為非環狀,藉由第二軸承之對應孔隙收納。在此等實施例中,前軸承圍繞標稱軸線之任何(輕微)旋轉將造成與第二軸承對準之衝突(例如造成空氣軸承中之氣隙減小)。因此,具有非環狀第一及第二軸桿部分之此等實施例可能需要倍縮光罩遮蔽系統及其組件具有增加之準確度、精度、穩定性及剛性以最佳地起作用。因此,第二部分之環狀橫截面簡化了倍縮光罩遮蔽系統之製造。In some embodiments, the second portion of the shaft may also be non-annular, being received by a corresponding aperture of the second bearing. In such embodiments, any (slight) rotation of the front bearing about the nominal axis will cause a conflict with the alignment of the second bearing (e.g. causing a reduction in the air gap in the air bearing). Therefore, such embodiments with non-annular first and second shaft portions may require the zoom mask shielding system and its components to have increased accuracy, precision, stability and rigidity to function optimally. Therefore, the annular cross-section of the second portion simplifies the manufacture of the zoom mask shielding system.
第二軸承可由材料之薄環形腹板支撐。The secondary bearing may be supported by a thin annular web of material.
材料之薄環形腹板允許第二軸承之軸承表面藉由旋轉而符合往復軸桿之局部傾斜。軸承表面之旋轉輔助在軸承表面與往復軸桿之間維持足夠的膜。The thin annular web of material allows the bearing surface of the secondary bearing to conform to the local tilt of the reciprocating shaft by rotating. The rotation of the bearing surface assists in maintaining an adequate film between the bearing surface and the reciprocating shaft.
第二軸承可藉由自第二軸承突出之相較於支撐框架具有更大靈活性的複數個懸置臂自支撐框架懸置。The secondary bearing may be suspended from the support frame by a plurality of suspension arms protruding from the secondary bearing and having greater flexibility than the support frame.
上述第二軸承懸置件提供所需程度之順應性,同時製造相對簡單。The second bearing suspension described above provides the required degree of compliance while being relatively simple to manufacture.
第二軸承可由至少三個撓曲件支撐。The secondary bearing may be supported by at least three flexures.
複數個懸置臂可以大體上相切之方式自第二軸承突出。A plurality of suspension arms may project from the second bearing in a generally tangential manner.
第二軸承可由三個撓曲件支撐。The secondary bearing may be supported by three flexures.
倍縮光罩遮蔽系統可進一步包含氣體供應系統,其經組態以將氣體供應至軸承之複數個軸承表面中之各者。氣體供應系統亦可經組態以將氣體供應至第二軸承之一或多個軸承表面。The zoom mask shielding system may further include a gas supply system configured to supply gas to each of the plurality of bearing surfaces of the bearing. The gas supply system may also be configured to supply gas to one or more bearing surfaces of the second bearing.
提供氣體供應系統允許在軸承表面與往復軸桿之間維持足夠的氣膜。Providing a gas supply system allows an adequate air film to be maintained between the bearing surface and the reciprocating shaft.
根據第三態樣,提供一種微影設備,其包含第二態樣之倍縮光罩遮蔽系統。倍縮光罩遮蔽系統可包含上文所描述之視情況選用的特徵中之任一者。According to a third aspect, a lithography apparatus is provided, which includes the multiplication mask shielding system of the second aspect. The multiplication mask shielding system may include any one of the optional features described above.
應瞭解,上文所描述或以下描述中所提及之一或多個態樣或特徵可與一或多個其他態樣或特徵組合。It should be understood that one or more aspects or features described above or mentioned in the following description may be combined with one or more other aspects or features.
圖1展示微影系統。微影系統包含輻射源SO及微影設備LA。輻射源SO經組態以產生極紫外線(EUV)輻射射束B。微影設備LA包含照明系統IL、經組態以支撐包括圖案化裝置MA之倍縮光罩總成15 (例如倍縮光罩或遮罩)的支撐結構MT、投影系統PS,及經組態以支撐基板W之基板台WT。照明系統IL經組態以在輻射射束B入射於圖案化裝置MA上之前該調節輻射射束。投影系統經組態以將輻射射束B (現由圖案化裝置MA圖案化)投射至基板W上。基板W可包括先前形成的圖案。在此種狀況下,微影設備將經圖案化輻射射束B與先前形成於基板W上之圖案對準。FIG1 shows a lithography system. The lithography system comprises a radiation source SO and a lithography apparatus LA. The radiation source SO is configured to generate an extreme ultraviolet (EUV) radiation beam B. The lithography apparatus LA comprises an illumination system IL, a support structure MT configured to support a multiplying mask assembly 15 (e.g., a multiplying mask or a shadow mask) including a patterning device MA, a projection system PS, and a substrate table WT configured to support a substrate W. The illumination system IL is configured to condition the radiation beam B before the radiation beam B is incident on the patterning device MA. The projection system is configured to project the radiation beam B (now patterned by the patterning device MA) onto a substrate W. The substrate W may include a previously formed pattern. In this case, the lithography equipment aligns the patterned radiation beam B with the pattern previously formed on the substrate W.
輻射源SO、照明系統IL及投影系統PS可皆經建構且經配置以使得其可與外部環境隔離。處於低於大氣壓力之壓力下之氣體(例如氫)可提供於輻射源SO中。真空可提供於照明系統IL及/或投影系統PS中。在充分低於大氣壓力之壓力下之少量氣體(例如氫)可提供於照明系統IL及/或投影系統PS中。The radiation source SO, the illumination system IL and the projection system PS may all be constructed and arranged so that they can be isolated from the external environment. A gas (e.g. hydrogen) at a pressure lower than atmospheric pressure may be provided in the radiation source SO. A vacuum may be provided in the illumination system IL and/or the projection system PS. A small amount of gas (e.g. hydrogen) at a pressure sufficiently lower than atmospheric pressure may be provided in the illumination system IL and/or the projection system PS.
圖1中所展示之輻射源SO屬於可被稱作雷射產生電漿(LPP)源之類型。可例如為CO2雷射之雷射1經配置以經由雷射射束2而將能量沉積至自燃料發射器3提供之諸如錫(Sn)之燃料中。儘管在以下描述中提及錫,但可使用任何合適燃料。燃料可例如呈液體形式,且可例如係金屬或合金。燃料發射器3可包含經組態以沿著軌道朝著電漿形成區4導引例如呈小滴形式之錫的噴嘴。雷射射束2在電漿形成區4處入射於錫上。雷射能量沉積至錫中在電漿形成區4處產生電漿7。包括EUV輻射之輻射在電漿之離子之去激發及再結合期間自電漿7發射。The radiation source SO shown in FIG. 1 is of a type that may be referred to as a laser produced plasma (LPP) source. The laser 1, which may be, for example, a CO2 laser, is configured to deposit energy via a laser beam 2 into a fuel, such as tin (Sn), provided from a fuel emitter 3. Although tin is mentioned in the following description, any suitable fuel may be used. The fuel may, for example, be in liquid form and may, for example, be a metal or an alloy. The fuel emitter 3 may include a nozzle configured to guide tin, for example in the form of droplets, along a trajectory toward a plasma formation region 4. The laser beam 2 is incident on the tin at the plasma formation region 4. The laser energy is deposited into the tin to generate a plasma 7 at the plasma formation region 4. Radiation, including EUV radiation, is emitted from the plasma 7 during deexcitation and recombination of ions in the plasma.
EUV輻射由近正入射輻射收集器5 (有時更通常被稱作正入射輻射收集器)收集及聚焦。收集器5可具有經配置以反射EUV輻射(例如具有諸如13.5 nm之所要波長之EUV輻射)的多層結構。收集器5可具有橢圓形組態,其具有兩個橢圓焦點。第一焦點可處於電漿形成區4處,且第二焦點可處於中間焦點6處,如下文所論述。EUV radiation is collected and focused by a near normal incidence radiation collector 5 (sometimes more generally referred to as a normal incidence radiation collector). Collector 5 may have a multi-layer structure configured to reflect EUV radiation (e.g., EUV radiation having a desired wavelength, such as 13.5 nm). Collector 5 may have an elliptical configuration with two elliptical foci. The first focus may be at the plasma formation region 4, and the second focus may be at the middle focus 6, as discussed below.
在雷射產生電漿(LPP)源之其他實施例中,收集器5可為所謂的掠入射收集器,其經組態以在掠入射角處接收EUV輻射且將EUV輻射聚焦在中間焦點處。掠入射收集器可例如為巢套式收集器,其包含複數個掠入射反射器。掠入射反射器可經安置成圍繞光軸軸向地對稱。In other embodiments of a laser produced plasma (LPP) source, the collector 5 may be a so-called grazing incidence collector, which is configured to receive EUV radiation at a grazing incidence angle and focus the EUV radiation at an intermediate focus. The grazing incidence collector may, for example, be a nested collector comprising a plurality of grazing incidence reflectors. The grazing incidence reflectors may be arranged axially symmetrically around the optical axis.
輻射源SO可包括一或多個污染截留器(圖中未示)。舉例而言,污染截留器可位於電漿形成區4與輻射收集器5之間。污染截留器可例如為旋轉箔片截留器,或可為任何其他合適形式之污染截留器。The radiation source SO may include one or more contamination traps (not shown). For example, the contamination trap may be located between the plasma formation region 4 and the radiation collector 5. The contamination trap may be, for example, a rotating foil trap, or may be any other suitable form of contamination trap.
雷射1可與輻射源SO分隔開。在此情況下,可藉助於包含例如合適的導向鏡面及/或射束擴展器及/或其他光學件之射束遞送系統(圖中未示)而將雷射射束2自雷射1傳遞至輻射源SO。雷射1及輻射源SO可一起被視為輻射系統。The laser 1 may be separated from the radiation source SO. In this case, the laser beam 2 may be transferred from the laser 1 to the radiation source SO by means of a beam delivery system (not shown) comprising, for example, suitable steering mirrors and/or beam expanders and/or other optical components. The laser 1 and the radiation source SO may be considered together as a radiation system.
由收集器5反射之輻射形成輻射射束B。輻射射束B聚焦於點6處以形成電漿形成區4之影像,該影像充當用於照明系統IL之虛擬輻射源。輻射射束B聚焦於之點6可被稱作中間焦點。輻射源SO經配置成使得中間焦點6位於輻射源SO之圍封結構9中的開口8處或附近。The radiation reflected by the collector 5 forms a radiation beam B. The radiation beam B is focused at a point 6 to form an image of the plasma forming zone 4, which image serves as a virtual radiation source for the illumination system IL. The point 6 at which the radiation beam B is focused may be referred to as an intermediate focus. The radiation source SO is configured such that the intermediate focus 6 is located at or near an opening 8 in an enclosure 9 of the radiation source SO.
輻射射束B自輻射源SO傳遞至照明系統IL中,該照明系統經組態以調節輻射射束。照明系統IL可包括琢面化場鏡面裝置10及琢面化光瞳鏡面裝置11。琢面化場鏡面裝置10及琢面化光瞳鏡面裝置11一起向輻射射束B提供所要橫截面形狀及所要角分佈。輻射射束B自照明系統IL傳遞且入射於由支撐結構MT固持之倍縮光罩總成15上。倍縮光罩總成15包括圖案化裝置MA及表膜19。表膜經由表膜框架17安裝至圖案化裝置MA。倍縮光罩總成15可被稱作倍縮光罩及表膜總成15。圖案化裝置MA反射且圖案化輻射射束B。除了琢面化場鏡面裝置10及琢面化光瞳鏡面裝置11以外或替代該等裝置,照明系統IL可包括其他鏡面或裝置。A radiation beam B is transmitted from a radiation source SO to an illumination system IL which is configured to condition the radiation beam. The illumination system IL may include a faceted field mirror device 10 and a faceted pupil mirror device 11. The faceted field mirror device 10 and the faceted pupil mirror device 11 together provide the radiation beam B with a desired cross-sectional shape and a desired angular distribution. The radiation beam B is transmitted from the illumination system IL and is incident on a zoom mask assembly 15 held by a support structure MT. The zoom mask assembly 15 includes a patterning device MA and a pellicle 19. The pellicle is mounted to the patterning device MA via a pellicle frame 17. The zoom mask assembly 15 may be referred to as a zoom mask and pellicle assembly 15. The patterning device MA reflects and patterns the radiation beam B. In addition to or instead of the faceted field mirror device 10 and the faceted pupil mirror device 11, the illumination system IL may comprise other mirrors or devices.
在自圖案化裝置MA反射之後,經圖案化輻射射束B進入投影系統PS。投影系統包含複數個鏡面13、14,該複數個鏡面經組態以將輻射射束B投射至由基板台WT固持之基板W上。投影系統PS可將減小因數應用於輻射射束,從而形成具有小於圖案化裝置MA上之對應構件之構件的影像。舉例而言,可應用減小因數4。儘管在圖1中投影系統PS具有兩個鏡面13、14,但投影系統PS可包括任何數目個鏡面(例如六個鏡面)。After reflection from the patterning device MA, the patterned radiation beam B enters the projection system PS. The projection system comprises a plurality of mirrors 13, 14 which are configured to project the radiation beam B onto a substrate W held by a substrate table WT. The projection system PS may apply a reduction factor to the radiation beam, thereby forming an image having components that are smaller than corresponding components on the patterning device MA. For example, a reduction factor of 4 may be applied. Although in FIG1 the projection system PS has two mirrors 13, 14, the projection system PS may comprise any number of mirrors (e.g. six mirrors).
微影設備可例如用於掃描模式中,其中在將被賦予至輻射射束之圖案投射至基板W上時,同步地掃描支撐結構(例如遮罩台) MT及基板台WT (亦即,動態曝光)。可藉由投影系統PS之縮小率及影像反轉特性來判定基板台WT相對於支撐結構(例如遮罩台) MT之速度及方向。入射於基板W上之經圖案化輻射射束可包含輻射帶。輻射帶可被稱作曝光隙縫。在掃描曝光期間,基板台WT及支撐結構MT之移動可使得曝光隙縫遍及基板W之曝光場而行進。The lithography apparatus may, for example, be used in a scanning mode, wherein the support structure (e.g. mask table) MT and the substrate table WT are scanned synchronously while a pattern imparted to the radiation beam is projected onto the substrate W (i.e. dynamic exposure). The speed and direction of the substrate table WT relative to the support structure (e.g. mask table) MT may be determined by the magnification and image inversion characteristics of the projection system PS. The patterned radiation beam incident on the substrate W may comprise a swath of radiation. The swath of radiation may be referred to as an exposure slit. During a scanning exposure, movement of the substrate table WT and the support structure MT may cause the exposure slit to travel across the exposure field of the substrate W.
圖1中所展示之輻射源SO及/或微影設備可包括未經繪示之組件。舉例而言,光譜濾光器可提供於輻射源SO中。光譜濾光器可實質上透射EUV輻射,但實質上阻擋其他波長之輻射,諸如紅外輻射。The radiation source SO and/or the lithography apparatus shown in Fig. 1 may include components not shown. For example, a spectral filter may be provided in the radiation source SO. The spectral filter may substantially transmit EUV radiation but substantially block radiation of other wavelengths, such as infrared radiation.
在微影系統之其他實施例中,輻射源SO可採用其他形式。舉例而言,在替代性實施例中,輻射源SO可包含一或多個自由電子雷射。該一或多個自由電子雷射可經組態以發射可提供至一或多個微影設備的EUV輻射。In other embodiments of the lithography system, the radiation source SO may take other forms. For example, in an alternative embodiment, the radiation source SO may include one or more free electron lasers. The one or more free electron lasers may be configured to emit EUV radiation that can be provided to one or more lithography devices.
如上文簡要地描述,倍縮光罩總成15包括鄰近於圖案化裝置MA而提供之表膜19。表膜19提供於輻射射束B之路徑中,使得輻射射束B在其自照明系統IL接近圖案化裝置MA時及在其由圖案化裝置MA朝向投影系統PS反射時兩種情況下穿過表膜19。表膜19包含薄膜或隔膜,其對於EUV輻射實質上為透明的(儘管其將吸收少量EUV輻射)。在本文中EUV透明表膜或用於EUV輻射之實質上透明的膜意謂表膜19透射EUV輻射之至少65%,較佳地至少80%且更佳地EUV輻射之至少90%。表膜19用以保護圖案化裝置MA免於粒子污染。As briefly described above, the reticle assembly 15 includes a pellicle 19 provided adjacent to the patterning device MA. The pellicle 19 is provided in the path of the radiation beam B so that the radiation beam B passes through the pellicle 19 both when it approaches the patterning device MA from the illumination system IL and when it is reflected by the patterning device MA towards the projection system PS. The pellicle 19 comprises a film or membrane that is substantially transparent to EUV radiation (although it will absorb a small amount of EUV radiation). In this context, EUV transparent pellicle or substantially transparent film for EUV radiation means that the pellicle 19 transmits at least 65% of the EUV radiation, preferably at least 80% and more preferably at least 90% of the EUV radiation. The pellicle 19 serves to protect the patterning device MA from particle contamination.
儘管努力維持微影設備LA內部之清潔環境,但粒子仍可存在於微影設備LA內部。在不存在表膜19之情況下,粒子可沉積至圖案化裝置MA上。圖案化裝置MA上之粒子可不利地影響向輻射射束B賦予之圖案且因此影響轉印至基板W之圖案。表膜19有利地在圖案化裝置MA與微影設備LA中之環境之間提供障壁以便防止粒子沉積在圖案化裝置MA上。Despite efforts to maintain a clean environment inside the lithography apparatus LA, particles may still be present inside the lithography apparatus LA. In the absence of the pellicle 19, particles may be deposited on the patterning device MA. Particles on the patterning device MA may adversely affect the pattern imparted to the radiation beam B and therefore the pattern transferred to the substrate W. The pellicle 19 advantageously provides a barrier between the patterning device MA and the environment in the lithography apparatus LA so as to prevent particles from being deposited on the patterning device MA.
表膜19經定位成與圖案化裝置MA相距一距離,該距離足以使得入射於表膜19之表面上的任何粒子不在微影設備LA之場平面中。表膜19與圖案化裝置MA之間的此間隔用以減小表膜19之表面上之任何粒子將圖案賦予至成像至基板W上之輻射射束B的範圍。應瞭解,在粒子存在於輻射射束B中但不在輻射射束B之場平面中之位置處(例如,不在圖案化裝置MA之表面處)的情況下,則粒子之任何影像將不聚焦於基板W之表面處。在不存在其他考慮因素之情況下,可能需要將表膜19定位成與圖案化裝置MA相距相當大的距離。然而,實務上,微影設備LA中可用以容納表膜之空間歸因於其他組件之存在而受限。在一些實施例中,表膜19與圖案化裝置MA之間的間隔可例如在大致1 mm與10 mm之間,例如1 mm與5 mm之間,例如2 mm與2.5 mm之間。The pellicle 19 is positioned a distance from the patterning device MA that is sufficient so that any particles incident on the surface of the pellicle 19 are not in the field plane of the lithography apparatus LA. This spacing between the pellicle 19 and the patterning device MA serves to reduce the extent to which any particles on the surface of the pellicle 19 impart a pattern to the radiation beam B imaged onto the substrate W. It will be appreciated that in the event that a particle is present at a location in the radiation beam B but not in the field plane of the radiation beam B (e.g., not at the surface of the patterning device MA), then any image of the particle will not be focused at the surface of the substrate W. In the absence of other considerations, it may be desirable to position the pellicle 19 a considerable distance from the patterning device MA. However, in practice, the space available in the lithography apparatus LA to accommodate the pellicle is limited due to the presence of other components. In some embodiments, the spacing between the pellicle 19 and the patterning device MA may be, for example, approximately between 1 mm and 10 mm, such as between 1 mm and 5 mm, such as between 2 mm and 2.5 mm.
現參看圖2A至圖4提供對實例類型之微影設備LA之一些額外特徵,尤其靠近支撐結構MT之一些特徵及組件的描述。A description of some additional features of an example type of lithography apparatus LA, particularly some features and components proximate to the support structure MT, is now provided with reference to FIGS. 2A to 4 .
支撐結構MT可在掃描方向上移動,以便在單次動態掃描曝光中曝光倍縮光罩及表膜總成15之圖案化裝置MA之較大區,如現參看圖2A及圖2B所論述。圖2A及圖2B展示兩個不同位置中之支撐結構MT及倍縮光罩及表膜總成15的示意性平面圖。The support structure MT can be moved in the scanning direction to expose a larger area of the patterning device MA of the multiplying mask and pellicle assembly 15 in a single dynamic scanning exposure, as now discussed with reference to Figures 2A and 2B. Figures 2A and 2B show schematic plan views of the support structure MT and the multiplying mask and pellicle assembly 15 in two different positions.
支撐結構MT以可移動方式安裝於區24內。特定而言,支撐結構MT可在由箭頭26所指示之掃描方向上在第一末端位置(在圖2A中展示)與第二末端位置(在圖2B中展示)之間移動。The support structure MT is movably mounted in the region 24. In particular, the support structure MT is movable in the scanning direction indicated by the arrow 26 between a first end position (shown in FIG. 2A ) and a second end position (shown in FIG. 2B ).
除非另外陳述,否則貫穿本說明書,將使用以下笛卡爾座標集合。掃描方向被標註為y方向。亦在支撐結構MT之平面中且垂直於掃描方向的方向被稱作非掃描方向且被標註為x方向。垂直於支撐結構MT之平面的方向被標註為z方向。Unless otherwise stated, throughout this specification, the following set of Cartesian coordinates will be used. The scanning direction is denoted as the y-direction. The direction that is also in the plane of the support structure MT and perpendicular to the scanning direction is called the non-scanning direction and is denoted as the x-direction. The direction perpendicular to the plane of the support structure MT is denoted as the z-direction.
微影設備LA可被認為包含可操作以使支撐結構MT在掃描方向上在至少第一末端位置與第二末端位置之間移動的掃描模組。舉例而言,掃描模組可以可操作以在掃描方向上相對於支撐框架(由區24示意性地指示)移動支撐結構MT,該支撐結構MT可被認為以可移動方式安裝至該支撐框架。The lithography apparatus LA may be considered to include a scanning module operable to move the support structure MT in a scanning direction between at least a first end position and a second end position. For example, the scanning module may be operable to move the support structure MT in the scanning direction relative to a support frame (schematically indicated by area 24), to which the support structure MT may be considered to be movably mounted.
倍縮光罩及表膜總成15可被認為包含中心部分15a及包圍中心部分15a之周邊部分15b。中心部分15a可被稱作影像形成部分,且可與倍縮光罩MA之圖案化輻射射束B之一部分及表膜19之隔膜重合。周邊部分15b可與表膜19之邊界部分及表膜19之框架重合。The zoom mask and pellicle assembly 15 can be considered to include a central portion 15a and a peripheral portion 15b surrounding the central portion 15a. The central portion 15a can be referred to as an image forming portion and can overlap with a portion of the patterned radiation beam B of the zoom mask MA and the diaphragm 19. The peripheral portion 15b can overlap with a border portion of the pellicle 19 and the frame of the pellicle 19.
支撐結構MT在第一位置與第二位置之間的移動界定支撐結構MT之經延伸第一部分區28,其由可安置有倍縮光罩及表膜總成15之中心部分15a的所有區界定。亦即,支撐結構MT之經延伸第一部分區28為藉由將倍縮光罩及表膜總成15之中心部分15a自第一末端位置(在圖2A中展示)移動至第二末端位置(在圖2B中展示)而界定的區。The movement of the support structure MT between the first position and the second position defines an extended first partial area 28 of the support structure MT, which is defined by all areas where the central portion 15a of the zoom mask and pellicle assembly 15 can be placed. That is, the extended first partial area 28 of the support structure MT is the area defined by moving the central portion 15a of the zoom mask and pellicle assembly 15 from the first end position (shown in FIG. 2A ) to the second end position (shown in FIG. 2B ).
微影設備LA具備四個倍縮光罩遮蔽葉片,其界定基板W上被照明之場的範圍,如現在參看圖3A、圖3B及圖4所描述。照明系統IL可操作以在圖案化裝置MA安置於支撐結構MT上時照明該圖案化裝置之區。此區可被稱作照明系統IL之隙縫且由四個倍縮光罩遮蔽葉片至少部分地界定,該四個倍縮光罩遮蔽葉片界定可接收輻射之圖案化裝置之大體上矩形區。該大體上矩形區在第一方向(其可被稱作x方向)上之範圍係由一對x遮蔽葉片32、34界定。該大體上矩形區在第二方向(其可被稱作y方向)上之範圍係由一對y遮蔽葉片36、38界定。The lithography apparatus LA is provided with four reticle shielding blades that define the extent of the field to be illuminated on the substrate W, as now described with reference to FIGS. 3A , 3B and 4 . The illumination system IL is operable to illuminate a region of the patterned device MA when the patterned device MA is disposed on the support structure MT. This region may be referred to as the aperture of the illumination system IL and is at least partially defined by the four reticle shielding blades that define a generally rectangular region of the patterned device that may receive radiation. The extent of the generally rectangular region in a first direction, which may be referred to as the x-direction, is defined by a pair of x shielding blades 32, 34. The extent of the generally rectangular region in a second direction, which may be referred to as the y-direction, is defined by a pair of y shielding blades 36, 38.
遮蔽葉片32、34、36、38中之各者經安置成靠近支撐結構MT上之圖案化裝置,但稍微在該圖案化裝置之平面之外。x遮蔽葉片32、34安置於第一平面40中,且y遮蔽葉片36、38安置於第二平面42中。Each of the shielding leaves 32, 34, 36, 38 is arranged close to the patterned device on the support structure MT, but slightly out of the plane of the patterned device. The x shielding leaves 32, 34 are arranged in a first plane 40 and the y shielding leaves 36, 38 are arranged in a second plane 42.
遮蔽葉片32、34、36、38中之各者在可接收輻射之圖案化裝置MA之平面中界定矩形場區44之一個邊緣。實務上,照明系統IL可僅照明矩形場區44之部分。在圖4中展示,照明系統IL可經配置以照明彎曲隙縫區46,該彎曲隙縫區可與矩形場區44之一部分重合(取決於y遮蔽葉片36、38之位置)。Each of the shielding leaves 32, 34, 36, 38 defines an edge of a rectangular field 44 in the plane of the patterned device MA that can receive radiation. In practice, the illumination system IL can illuminate only part of the rectangular field 44. In FIG. 4 , it is shown that the illumination system IL can be configured to illuminate a curved gap area 46, which can coincide with a part of the rectangular field 44 (depending on the position of the y shielding leaves 36, 38).
彎曲隙縫區46可部分地由照明系統IL及/或投影系統PS內之光學件界定。另外,彎曲隙縫區46可部分地由沿著彎曲隙縫區46之彎曲邊緣中之一者或兩者提供的複數個可獨立移動物件界定。複數個可獨立移動物件可被稱作聯通手指(unicom fingers)。複數個可獨立移動物件可提供於不同x位置處,且可在y方向上移動以控制可移動物件中之各者與由照明系統IL產生之輻射射束B之間的重疊。控制可移動部件之y位置可控制彎曲隙縫區46之彎曲邊緣中之一者或兩者的形狀(或至少強度分佈)。可移動部件可用於最小化由輻射射束B在非掃描方向(亦即,x方向)上之不同位置處提供的輻射劑量的變化。另外,彎曲隙縫區46可部分地由實體孔隙(例如,投影系統PS之入口孔隙)界定。The bend gap region 46 may be defined in part by optics within the illumination system IL and/or the projection system PS. Additionally, the bend gap region 46 may be defined in part by a plurality of independently movable objects provided along one or both of the curved edges of the bend gap region 46. The plurality of independently movable objects may be referred to as unicom fingers. The plurality of independently movable objects may be provided at different x positions and may be moved in the y direction to control the overlap between each of the movable objects and the radiation beam B generated by the illumination system IL. Controlling the y position of the movable component may control the shape (or at least the intensity distribution) of one or both of the curved edges of the bend gap region 46. The movable components may be used to minimize variations in the radiation dose provided by the radiation beam B at different locations in the non-scanning direction (ie, the x-direction). Additionally, the bend gap region 46 may be defined in part by a solid aperture (eg, an entrance aperture of the projection system PS).
遮蔽葉片32、34、36、38中之各者可在遮蔽葉片未安置於輻射射束之路徑中的縮回位置與遮蔽葉片至少部分地阻擋由照明系統IL投射至圖案化裝置MA上之輻射射束的插入位置之間獨立地移動。藉由將遮蔽葉片32、34、36、38移動至輻射射束之路徑中,可截斷輻射射束B (在x及/或y方向上),因此限制接收輻射射束B之場區44之範圍。Each of the shielding leaves 32, 34, 36, 38 can be independently moved between a retracted position in which the shielding leaf is not disposed in the path of the radiation beam and an inserted position in which the shielding leaf at least partially blocks the radiation beam projected by the illumination system IL onto the patterning device MA. By moving the shielding leaf 32, 34, 36, 38 into the path of the radiation beam, the radiation beam B can be intercepted (in the x and/or y direction), thereby limiting the range of the field 44 that receives the radiation beam B.
x方向對應於微影設備LA之非掃描方向,且y方向對應於微影設備LA之掃描方向。圖案化裝置MA可在y方向上移動通過場區44 (如再次由箭頭26所指示)以便在單次動態掃描曝光中曝光圖案化裝置MA之較大區。The x-direction corresponds to the non-scanning direction of lithography apparatus LA, and the y-direction corresponds to the scanning direction of lithography apparatus LA. Patterning device MA may be moved in the y-direction through field 44 (as again indicated by arrow 26) in order to expose a larger area of patterning device MA in a single dynamic scanning exposure.
在基板W之目標區之動態曝光期間,目標區移動通過基板W之平面中的曝光區,該曝光區為基板W之由投影系統PS將圖案化裝置MA之曝光區44成像至其上的一部分。當基板W之目標區移動至曝光區中時,第一遮蔽葉片36、38移動以使得僅該目標區接收輻射(亦即,基板之在目標區外部的部分未被曝光)。在掃描曝光開始時,y遮蔽葉片36、38中之一者安置於輻射射束B之路徑中,充當遮光片,使得基板W之任何部分皆不接收輻射。在掃描曝光結束時,y遮蔽葉片36、38中之另一者安置於輻射射束B之路徑中,充當遮光片,使得基板W之任何部分皆不接收輻射。在掃描曝光之中間部分期間,當在曝光區44 (其接收輻射B)與基板W之鄰近目標區中之任一者之間不存在重疊時,y遮蔽葉片36、38中之兩者安置於縮回位置中。During dynamic exposure of a target area of substrate W, the target area moves through an exposure zone in the plane of substrate W, which is a portion of substrate W onto which the exposure area 44 of patterning device MA is imaged by projection system PS. When the target area of substrate W moves into the exposure zone, the first shielding blades 36, 38 move so that only the target area receives radiation (i.e., portions of the substrate outside the target area are not exposed). At the beginning of the scanning exposure, one of the y shielding blades 36, 38 is placed in the path of radiation beam B, acting as a light shield, so that no part of substrate W receives radiation. At the end of the scanning exposure, the other of the y shielding blades 36, 38 is placed in the path of radiation beam B, acting as a light shield, so that no part of substrate W receives radiation. During the middle portion of the scanning exposure, when there is no overlap between the exposure area 44 (which receives radiation B) and any of the adjacent target areas of the substrate W, both of the y-shielding blades 36, 38 are disposed in the retracted position.
輻射射束B之射線被展示為鄰近於遮蔽葉片32、34、36、38中之各者。應瞭解,隙縫區46中之各點係由來自一角度範圍之輻射照明。舉例而言,隙縫區46中之各點可接收輻射錐。被展示為鄰近於遮蔽葉片32、34、36、38中之各者的輻射射束B之射線指示了由圖案化裝置MA接收之輻射之平均方向。被展示為鄰近於遮蔽葉片32、34、36、38中之各者的輻射射束B之射線可被稱作主射線。自圖3A及圖3B可見,在此實施例中,當投射至x-z平面上時,輻射之主射線大體上正入射於圖案化裝置MA上,而當投射至y-z平面上時,輻射之主射線大體上以角度48入射於圖案化裝置MA上。The rays of the radiation beam B are shown adjacent to each of the shielding leaves 32, 34, 36, 38. It should be understood that each point in the gap area 46 is illuminated by radiation from a range of angles. For example, each point in the gap area 46 can receive a radiation cone. The rays of the radiation beam B shown adjacent to each of the shielding leaves 32, 34, 36, 38 indicate the average direction of the radiation received by the patterning device MA. The rays of the radiation beam B shown adjacent to each of the shielding leaves 32, 34, 36, 38 can be referred to as primary rays. As can be seen from Figures 3A and 3B, in this embodiment, when projected onto the x-z plane, the main ray of radiation is substantially incident on the patterning device MA, and when projected onto the y-z plane, the main ray of radiation is substantially incident on the patterning device MA at an angle of 48.
微影設備LA可進一步包含氣體噴嘴50,該氣體噴嘴可經配置以鄰近於支撐結構MT導引氣流52。特定而言,由氣體噴嘴50鄰近於支撐結構MT提供之氣流52可大體上平行於圖案化裝置MA之表面,且可被稱作交叉流。氣體噴嘴50可大體上安置於與x遮蔽葉片32、34相同之平面(第一平面40)中。氣體噴嘴可指向掃描方向,使得氣流52大體上平行於掃描方向且在x遮蔽葉片32、34之間流動。氣體噴嘴50可被認為形成可操作以鄰近於支撐結構MT提供氣流的氣體供應模組之部分。The lithography apparatus LA may further comprise a gas nozzle 50 which may be configured to direct a gas flow 52 adjacent to the support structure MT. In particular, the gas flow 52 provided by the gas nozzle 50 adjacent to the support structure MT may be substantially parallel to the surface of the patterning device MA and may be referred to as a cross flow. The gas nozzle 50 may be disposed substantially in the same plane (the first plane 40) as the x-shielding blades 32, 34. The gas nozzle may be pointed in the scanning direction such that the gas flow 52 is substantially parallel to the scanning direction and flows between the x-shielding blades 32, 34. The gas nozzle 50 may be considered to form part of a gas supply module operable to provide a gas flow adjacent to the support structure MT.
氣體噴嘴50可形成氫供應件之部分,該氫供應件可操作以在表膜及倍縮光罩總成15由支撐結構MT支撐時在表膜及倍縮光罩總成15之表膜19附近供應氫。The gas nozzle 50 may form part of a hydrogen supply operable to supply hydrogen in the vicinity of the pellicle 19 of the pellicle and multiplication reticle assembly 15 when the pellicle and multiplication reticle assembly 15 is supported by the support structure MT.
圖4展示在正z方向(亦即,在圖3B中向上)上檢視之第二平面42中之y遮蔽葉片36、38的平面圖。x遮蔽葉片32、34及氣體噴嘴(其安置於第一平面40中)之位置以點線展示。在圖4中,四個遮蔽葉片32、34、36、38經安置以便界定大體上矩形場區44,隙縫區46安置於此大體上矩形場區44內。在目標區(例如基板W上之晶粒)之中心部分之曝光期間,此可為四個遮蔽葉片32、34、36、38之典型組態。如上文所解釋,x遮蔽葉片32、34中之各者可操作以在x方向上移動且y遮蔽葉片36、38中之各者可操作以在y方向上移動,以控制場區44之大小。y遮蔽葉片36、38經組態以使得其可自場區44之同一側致動。為了達成此情形,y遮蔽葉片36、38經成形以使得(儘管其位於實質上同一平面42中)遮蔽葉片36、38中之各者具備在同一方向(在圖4中為負y方向)上延伸的一或多個支撐部分。FIG. 4 shows a plan view of the y shielding leaves 36, 38 in a second plane 42 viewed in the positive z-direction (i.e., upward in FIG. 3B ). The positions of the x shielding leaves 32, 34 and the gas nozzles (which are disposed in the first plane 40) are shown with dotted lines. In FIG. 4 , the four shielding leaves 32, 34, 36, 38 are disposed so as to define a generally rectangular field 44 within which a gap region 46 is disposed. This may be a typical configuration of the four shielding leaves 32, 34, 36, 38 during exposure of a central portion of a target area (e.g., a die on a substrate W). As explained above, each of the x shielding leaves 32, 34 is operable to move in the x-direction and each of the y shielding leaves 36, 38 is operable to move in the y-direction to control the size of the field 44. The y shielding leaves 36, 38 are configured so that they can be actuated from the same side of the field 44. To achieve this, the y shielding leaves 36, 38 are shaped so that (although they are located in substantially the same plane 42) each of the shielding leaves 36, 38 has one or more support portions extending in the same direction (negative y direction in FIG. 4).
遮蔽葉片32、34、36、38及氣體噴嘴50可安裝於共同遮蔽葉片總成支撐件(圖中未示)上。應瞭解,遮蔽葉片32、34、36、38可以可移動方式安裝於此類支撐件上使得其可相對於該類支撐件移動。氣體噴嘴可靜態地安裝於此類支撐件上。The shielding blades 32, 34, 36, 38 and the gas nozzle 50 may be mounted on a common shielding blade assembly support (not shown). It should be understood that the shielding blades 32, 34, 36, 38 may be movably mounted on such a support so that they can move relative to such a support. The gas nozzle may be statically mounted on such a support.
為了以低摩擦及精確度界定之移動包封移動,遮蔽葉片32、34、36、38中之一或多者具備軸桿及軸承系統。現參看圖5A及圖5B描述軸承,該等圖分別示意性地繪示橫向橫截面及軸向橫截面中之軸承100。In order to enclose the movement with low friction and precisely defined movement, one or more of the shielding blades 32, 34, 36, 38 is provided with a shaft and bearing system. The bearing is now described with reference to Figures 5A and 5B, which schematically show the bearing 100 in a transverse cross section and in an axial cross section, respectively.
在以下描述中,在圖中存在實質上相同之組件之多個實例的情況下,為簡潔及清楚起見,可標記僅單個實例。In the following description, where there are multiple instances of substantially the same component in the figures, only a single instance may be labeled for the sake of brevity and clarity.
另外,應注意,在以下描述中參考之軸線不同於圖2A至圖4中參考之軸線。自圖2A至圖4應瞭解,遮蔽葉片32、34中之一些的移動方向(與支撐軸桿平行)為微影設備LA之非掃描方向,而遮蔽葉片36、38中之一些的移動方向(與支撐軸桿平行)為微影設備LA之掃描方向。在下文中,此移動方向(與支撐軸桿平行)被稱作z方向。In addition, it should be noted that the axes referenced in the following description are different from the axes referenced in FIGS. 2A to 4. It should be understood from FIGS. 2A to 4 that the movement direction (parallel to the support shaft) of some of the shielding leaves 32 and 34 is the non-scanning direction of the lithography apparatus LA, while the movement direction (parallel to the support shaft) of some of the shielding leaves 36 and 38 is the scanning direction of the lithography apparatus LA. Hereinafter, this movement direction (parallel to the support shaft) is referred to as the z direction.
軸承100包含支撐件101及由支撐件101支撐之四個軸承表面102。軸承表面102經組態以至少部分地界定用於收納軸桿108之孔隙104。孔隙104具有圍繞孔隙104之質心106之有限旋轉對稱階數(亦即,4階)。The bearing 100 includes a support 101 and four bearing surfaces 102 supported by the support 101. The bearing surfaces 102 are configured to at least partially define a cavity 104 for receiving a shaft 108. The cavity 104 has a finite rotational symmetry order (ie, 4th order) about a center of mass 106 of the cavity 104.
軸承表面102經組態以便可相對於支撐件101獨立地移位,以便允許在孔隙中收納之軸桿108圍繞正交於軸桿之標稱軸線110的一或多個旋轉軸線112旋轉,同時實質上防止軸桿108圍繞其標稱軸線110旋轉。The bearing surface 102 is configured to be independently displaceable relative to the support 101 so as to allow a shaft 108 received in the aperture to rotate about one or more rotation axes 112 orthogonal to the shaft's nominal axis 110 while substantially preventing the shaft 108 from rotating about its nominal axis 110 .
可由軸承100及其標稱軸線110收納之軸桿108的位置及範圍在圖5B中最佳地指示。The location and range of shaft 108 that can be received by bearing 100 and its nominal axis 110 is best indicated in Figure 5B.
藉由將軸承表面102耦接至支撐件101之連接部件114來促進軸承表面102之移位。The displacement of the bearing surface 102 is facilitated by a connecting member 114 coupling the bearing surface 102 to the support 101 .
軸桿之標稱軸線110可為在複數個軸承表面安置於標稱位置或定向中時由複數個軸承表面102界定的孔隙之軸線。The nominal axis 110 of the shaft may be the axis of the aperture defined by the plurality of bearing surfaces 102 when the plurality of bearing surfaces are disposed in a nominal position or orientation.
應採用術語可移位以指示以平移方式及/或以旋轉方式移動之能力—移位可包含旋轉及平移兩者。The term displaceable should be used to indicate the ability to move in translation and/or in rotation - displacement may include both rotation and translation.
儘管關於圖5A及圖5B所描述之實施例包含四個軸承表面102,但在其他實施例中,軸承可包含3、5、6、7、8、9或更多個軸承表面。一般而言,軸承可包含複數個軸承表面。Although the embodiment described with respect to Figures 5A and 5B includes four bearing surfaces 102, in other embodiments, the bearing may include 3, 5, 6, 7, 8, 9 or more bearing surfaces. In general, the bearing may include a plurality of bearing surfaces.
在一些實施例中,並非所有軸承表面102可經組態以可相對於支撐件101獨立地移位。各軸承表面102可相對於另一軸承表面102呈固定關係,例如,軸承表面對可以串聯方式移動。In some embodiments, not all bearing surfaces 102 may be configured to be independently displaceable relative to the support member 101. Each bearing surface 102 may be in a fixed relationship relative to another bearing surface 102, for example, a pair of bearing surfaces may be movable in series.
在一些實施例中,軸承表面102可經組態以便可相對於支撐件101獨立地旋轉。在其他替代性實施例中,軸承表面102可經組態以便可相對於支撐件101獨佔地(獨立地)旋轉。In some embodiments, the bearing surface 102 may be configured so as to be independently rotatable relative to the support member 101. In other alternative embodiments, the bearing surface 102 may be configured so as to be exclusively (independently) rotatable relative to the support member 101.
軸桿108可例如支撐微影設備之倍縮光罩遮蔽葉片(例如,軸桿108可支撐上文參看圖2A至圖4所描述之類型的遮蔽葉片32、34、36、38)。鑒於倍縮光罩遮蔽葉片之上述線性移動,軸桿108可為往復軸桿,其在使用時可在大體上平行於其軸線同時由軸承支撐之方向上相對於軸承100移動。在高加速度下,此類往復軸桿可在正交於軸桿之標稱軸線的方向上經受偏轉。往復軸桿之偏轉可在軸承處引起軸桿之局部旋轉或局部傾斜。倍縮光罩遮蔽葉片圍繞軸桿之標稱軸線的旋轉係不合需要的。Shaft 108 may, for example, support a reticle shield blade of a lithography apparatus (e.g., shaft 108 may support shield blades 32, 34, 36, 38 of the type described above with reference to FIGS. 2A-4). In view of the above-described linear movement of the reticle shield blade, shaft 108 may be a reciprocating shaft that, when in use, may move relative to bearing 100 in a direction substantially parallel to its axis while being supported by the bearing. Under high accelerations, such a reciprocating shaft may experience deflection in a direction orthogonal to the nominal axis of the shaft. Deflection of the reciprocating shaft may cause local rotation or local tilt of the shaft at the bearing. It is undesirable for the zoom mask to obscure the rotation of the blades about the nominal axis of the shaft.
提供至軸承之軸承表面102的旋轉自由度允許軸承表面藉由旋轉而符合往復軸桿108之局部傾斜。軸承表面102之旋轉減少了負載跨越軸承表面的不均勻性(亦即,局部濃度)。在流體膜存在於軸承表面102與軸桿108之間的情況下,軸承表面之旋轉輔助在軸承表面與往復軸桿之間維持足夠的膜。此允許膜能夠支撐往復軸桿108,而在往復軸桿與軸承表面102之間無過度接觸。The rotational freedom provided to the bearing surface 102 of the bearing allows the bearing surface to conform to the local tilt of the reciprocating shaft 108 by rotating. The rotation of the bearing surface 102 reduces the non-uniformity (i.e., local concentration) of the load across the bearing surface. In the event that a fluid film exists between the bearing surface 102 and the shaft 108, the rotation of the bearing surface assists in maintaining sufficient film between the bearing surface and the reciprocating shaft. This allows the film to support the reciprocating shaft 108 without excessive contact between the reciprocating shaft and the bearing surface 102.
軸承100耐受往復軸桿108之偏轉,此允許往復軸桿經受更高加速度及速度。軸承100亦需要較不嚴格的製造公差,從而使得軸承之製造具更低成本。The bearing 100 tolerates deflection of the reciprocating shaft 108, which allows the reciprocating shaft to withstand higher accelerations and speeds. The bearing 100 also requires less stringent manufacturing tolerances, making the bearing less expensive to manufacture.
使用右側笛卡爾座標集合,若軸桿之標稱軸線平行於z軸,則軸承表面中之至少一些可經旋轉以便允許軸桿圍繞x軸及/或y軸旋轉。應瞭解,在此旋轉之後,一般而言,軸桿之軸線將相對於軸桿之標稱軸線成非零角度(亦即,軸桿將不再極佳地平行於z軸)。應注意,此等軸線與關於圖2A至圖4所界定之軸線並不重合。Using a right-hand Cartesian set of coordinates, if the nominal axis of the shaft is parallel to the z-axis, at least some of the bearing surfaces may be rotated to allow the shaft to rotate about the x-axis and/or the y-axis. It will be appreciated that, following such rotation, the axis of the shaft will, in general, be at a non-zero angle relative to the nominal axis of the shaft (i.e., the shaft will no longer be perfectly parallel to the z-axis). It should be noted that these axes do not coincide with the axes defined with respect to FIGS. 2A-4.
圖6展示本揭露之軸承200之另一實施例。為了清楚及易於理解,省略支撐件。軸承200通常類似於軸承100,參看圖5A及圖5B所描述,且相同部分將由相同符號指代。FIG. 6 shows another embodiment of a bearing 200 of the present disclosure. For clarity and ease of understanding, the support members are omitted. The bearing 200 is generally similar to the bearing 100, described with reference to FIGS. 5A and 5B, and the same parts will be referred to by the same symbols.
軸承200包含支撐件(圖6中未展示)、八個撓曲件206及四個軸承表面102。軸承表面102中之各者經由一對撓曲件206連接至支撐件。The bearing 200 includes a support member (not shown in FIG. 6 ), eight flexure members 206 and four bearing surfaces 102 . Each of the bearing surfaces 102 is connected to the support member via a pair of flexure members 206 .
軸承200之軸承表面102成對地配置成大體上相對之軸承表面202。軸承200包含兩對軸承表面202。一對202之各軸承表面具有旋轉軸線204。一對之旋轉軸線204係平行的。不同對軸承表面202之旋轉軸線204互相正交。各對軸承表面202之軸承表面102在第一方向205上分隔開且各自可圍繞旋轉軸線204旋轉。給定對之軸承表面202之兩個軸承表面102之旋轉軸線204平行於大體上垂直於第一方向及軸桿之標稱軸線110的第二方向。The bearing surfaces 102 of the bearing 200 are arranged in pairs as substantially opposed bearing surfaces 202. The bearing 200 includes two pairs of bearing surfaces 202. Each bearing surface of a pair 202 has an axis of rotation 204. The axes of rotation 204 of a pair are parallel. The axes of rotation 204 of different pairs of bearing surfaces 202 are orthogonal to each other. The bearing surfaces 102 of each pair of bearing surfaces 202 are separated in a first direction 205 and each can rotate around the axis of rotation 204. The axes of rotation 204 of the two bearing surfaces 102 of a given pair of bearing surfaces 202 are parallel to a second direction substantially perpendicular to the first direction and the nominal axis 110 of the shaft.
兩個互相正交之軸承表面對202部分地界定孔隙104,其具有正方形(或更大體上矩形)橫截面。Two mutually orthogonal bearing surface pairs 202 partially define a void 104 having a square (or more generally rectangular) cross-section.
兩對軸承表面202允許軸承回應於往復軸桿在正交於軸桿之標稱軸線110的任何方向上之偏轉(亦即,圖6之x-y平面中之偏轉)而維持足夠的膜。The two pairs of bearing surfaces 202 allow the bearings to maintain adequate film in response to deflection of the reciprocating shaft in any direction orthogonal to the nominal axis 110 of the shaft (i.e., deflection in the x-y plane of FIG. 6 ).
應瞭解,軸承表面對202無需互相正交。兩對軸承表面可以彼此大於或小於90°之角度安置。在一實例中,兩對軸承表面202可至少部分地界定孔隙,其具有平行四邊形橫截面。It should be understood that the bearing surface pairs 202 need not be orthogonal to each other. The two pairs of bearing surfaces can be disposed at an angle greater than or less than 90° to each other. In one example, the two pairs of bearing surfaces 202 can at least partially define a void having a parallelogram cross-section.
儘管軸承200具有兩對軸承表面202,但其他配置係可能的。在一些實施例中,軸承可包含更多對軸承表面(例如,3、4、5、6、7或更多),但此等配置在機械上可能更複雜。Although the bearing 200 has two pairs of bearing surfaces 202, other configurations are possible. In some embodiments, the bearing may include more pairs of bearing surfaces (e.g., 3, 4, 5, 6, 7 or more), but such configurations may be more complex mechanically.
軸承200之相對軸承表面102可在第二方向(亦即,平行旋轉軸線)上圍繞軸線204旋轉。相對軸承表面102能夠在共同旋轉時(例如,回應於往復軸桿之局部傾斜)保持互相平行。孔隙104之稜柱形幾何形狀係在軸承表面對202共同旋轉時被保留,從而允許維持均一的膜厚度,有助於軸承200之操作。特定而言,若此各對大體上相對之軸承表面圍繞其各別旋轉軸線204旋轉相同角度,則由於此等兩個旋轉軸線皆平行於第二方向,至少部分地由軸承表面102界定之孔隙之形狀將相同,儘管在第一方向上按角度之餘弦因數按比例調整。The opposing bearing surfaces 102 of the bearing 200 can rotate about the axis 204 in a second direction (i.e., parallel to the axis of rotation). The opposing bearing surfaces 102 can remain parallel to each other when they rotate together (e.g., in response to local tilt of the reciprocating shaft). The prismatic geometry of the pores 104 is preserved when the bearing surface pair 202 rotates together, thereby allowing a uniform film thickness to be maintained, facilitating operation of the bearing 200. In particular, if each pair of substantially opposing bearing surfaces is rotated about their respective axes of rotation 204 by the same angle, then because both axes of rotation are parallel to the second direction, the shape of the aperture at least partially defined by the bearing surfaces 102 will be the same, albeit scaled by a cosine factor of the angle in the first direction.
撓曲件206為凹口撓曲件。撓曲件206允許軸承表面之上述旋轉。The flexure 206 is a notched flexure. The flexure 206 allows the above-mentioned rotation of the bearing surface.
軸承表面102中之各者具有一個自由度。凹口撓曲件將軸承表面102限制在單個自由度上。具有一個自由度之一或多個軸承表面固有地限制旋轉至正交於軸桿往復方向的旋轉軸線,而無需另外機構或結構。Each of the bearing surfaces 102 has one degree of freedom. The notched flexure constrains the bearing surface 102 to a single degree of freedom. One or more bearing surfaces having one degree of freedom inherently constrains rotation to an axis of rotation orthogonal to the reciprocating direction of the shaft without the need for additional mechanisms or structures.
撓曲件為單組件且因此不展現出明顯摩擦或背隙。儘管撓曲件206為凹口撓曲件,但撓曲件亦可具有片彈簧形式或為任何其他類型之撓曲件。The flexure is a single component and therefore does not exhibit significant friction or backlash. Although the flexure 206 is a notched flexure, the flexure may also be in the form of a leaf spring or any other type of flexure.
在一些實施例中,每軸承表面之撓曲件之數目可變化。舉例而言,軸承表面經由1、3、4、5、6或更多個撓曲件連接至支撐件。In some embodiments, the number of flexures per bearing surface can vary. For example, the bearing surface is connected to the support member via 1, 3, 4, 5, 6 or more flexures.
撓曲件將旋轉機構及偏置機構組合於一個結構中。在一些其他實施例中,旋轉機構可包含球型接頭、鉸鏈或軸。The flexure combines the rotation mechanism and the biasing mechanism into one structure. In some other embodiments, the rotation mechanism may include a ball joint, a hinge or a shaft.
應瞭解,在其他實施例中,軸承表面102中之一或多者可經由偏置機構連接至支撐件,該偏置機構經配置以使軸承表面朝向標稱位置或定向偏置。偏置機構可包含撓曲件、線圈彈簧或片彈簧或其組合。特定而言,旋轉機構包含球型接頭、鉸鏈或軸之軸承實施例可具備獨立的偏置機構。在其他實施例中,可能不存在偏置機構。It should be appreciated that in other embodiments, one or more of the bearing surfaces 102 may be connected to the support via a biasing mechanism configured to bias the bearing surface toward a nominal position or orientation. The biasing mechanism may include a flexure, a coil spring, or a leaf spring, or a combination thereof. In particular, bearing embodiments where the rotational mechanism includes a ball joint, hinge, or shaft may have a separate biasing mechanism. In other embodiments, there may be no biasing mechanism.
大體而言,軸承表面中之至少一者的偏置機構可實質上由鈦或鐵合金構成。Generally speaking, the biasing mechanism of at least one of the bearing surfaces may consist essentially of titanium or an iron alloy.
鐵合金可包括不鏽鋼或碳鋼。有利地,歸因於鈦合金及鐵合金之高疲乏限制,鈦合金及鐵合金偏置機構(例如撓曲件)具有長久壽命。一般而言,偏置機構可由具有高疲乏強度及/或疲乏限制的任何材料製造。The iron alloy may include stainless steel or carbon steel. Advantageously, titanium alloy and iron alloy biasing mechanisms (e.g., bends) have a long life due to their high fatigue limits. Generally speaking, biasing mechanisms may be made of any material with high fatigue strength and/or fatigue limits.
軸承表面102可具有高達±3毫弧度之旋轉範圍。在一實例中,軸承表面102中之至少一者可具有±1.5毫弧度之旋轉範圍。一般而言,旋轉範圍之選擇可取決於軸承自身、軸桿或任何其他已連接部分之公差、所要柔度及硬度之間的平衡。空氣軸承可進一步包含經組態以將軸承表面之旋轉限制在所要範圍內的結構(例如保險桿或實體止擋件)。另外或替代地,空氣軸承可包含用以進一步支撐軸承表面同時仍允許所要旋轉之結構。The bearing surfaces 102 may have a range of rotation of up to ±3 milliradians. In one example, at least one of the bearing surfaces 102 may have a range of rotation of ±1.5 milliradians. In general, the selection of the range of rotation may depend on a balance between tolerances, desired compliance, and stiffness of the bearing itself, the shaft, or any other connected parts. The air bearing may further include structure (e.g., a safety rod or a physical stop) configured to limit rotation of the bearing surface to a desired range. Additionally or alternatively, the air bearing may include structure to further support the bearing surface while still allowing the desired rotation.
軸承表面102為實質上平面的。平面軸承表面允許往復軸桿以正交於其平面之軸線自由傾斜。The bearing surface 102 is substantially planar. A planar bearing surface allows the reciprocating rod to freely tilt about an axis normal to its plane.
在其他實施例中,軸承表面可替代地在橫向於軸桿往復方向(亦即,軸桿之標稱軸線)的方向上彎曲(亦即,凸起、凹入或其組合)。In other embodiments, the bearing surface may alternatively be curved (ie, convex, concave, or a combination thereof) in a direction transverse to the reciprocating direction of the shaft (ie, the nominal axis of the shaft).
軸承200之軸承表面102中之各者經由一對撓曲件206連接至支撐件。替代地,各對軸承表面中之一個軸承表面可經由另一旋轉機構(例如球型接頭)連接至支撐件。應瞭解,僅需要將軸承表面中之一或多者限制至一個自由度以便防止旋轉。在一實例中,各對軸承表面可包含具有一個自由度之第一軸承表面及具有兩個或更多個自由度之第二相對軸承表面。第一軸承表面可經由凹口撓曲件連接至支撐件,且第二相對軸承表面可經由球型接頭連接至支撐件。Each of the bearing surfaces 102 of the bearing 200 is connected to the support member via a pair of deflections 206. Alternatively, one of the bearing surfaces in each pair of bearing surfaces may be connected to the support member via another rotational mechanism, such as a ball joint. It should be understood that it is only necessary to restrict one or more of the bearing surfaces to one degree of freedom in order to prevent rotation. In one example, each pair of bearing surfaces may include a first bearing surface having one degree of freedom and a second opposing bearing surface having two or more degrees of freedom. The first bearing surface may be connected to the support member via a notched deflection member, and the second opposing bearing surface may be connected to the support member via a ball joint.
在一些實施例中,軸承200可為空氣軸承。特定而言,軸承可為靜氣軸承。空氣軸承以低摩擦、振動及高精度操作。藉由符合往復軸桿之局部傾斜,本揭露之空氣軸承可跨越軸承表面維持足夠的氣膜。足夠的氣膜可在往復軸桿與軸承表面之間無任何接觸的情況下支撐往復軸桿,從而使磨損及摩擦最小化。In some embodiments, the bearing 200 may be an air bearing. Specifically, the bearing may be a hydrostatic bearing. Air bearings operate with low friction, vibration, and high precision. By conforming to the local tilt of the reciprocating shaft, the air bearing of the present disclosure can maintain a sufficient air film across the bearing surface. The sufficient air film can support the reciprocating shaft without any contact between the reciprocating shaft and the bearing surface, thereby minimizing wear and friction.
圖7A及圖7B示意性地繪示空氣軸承300之軸向及橫向橫截面。應瞭解,空氣軸承機械地類似於軸承200;空氣軸承進一步包含經組態以產生及維持氣膜之組件及結構。為簡潔起見,將因此省略對其機械操作之描述。7A and 7B schematically illustrate axial and transverse cross-sections of air bearing 300. It should be understood that the air bearing is mechanically similar to bearing 200; the air bearing further includes components and structures configured to generate and maintain an air film. For the sake of brevity, a description of its mechanical operation will therefore be omitted.
空氣軸承300包含用於連接至氣體供應器之氣體入口302及經組態以將氣體入口302流體地連接至複數個軸承表面312中之各者的複數個通道304。The air bearing 300 includes a gas inlet 302 for connecting to a gas supply and a plurality of channels 304 configured to fluidly connect the gas inlet 302 to each of a plurality of bearing surfaces 312 .
氣體入口302及通道304可設置於支撐件301內。The gas inlet 302 and the channel 304 may be disposed in the support member 301 .
在使用中,氣體入口302可連接至氣體供應系統。在使用中,氣體入口302供應有加壓氣體(例如,經由一或多個可撓性管)。In use, the gas inlet 302 can be connected to a gas supply system. In use, the gas inlet 302 is supplied with pressurized gas (e.g., via one or more flexible tubes).
空氣軸承300進一步包含複數個軸承部件310,各軸承部件310包含本體311且界定複數個軸承表面312中之一者,且其中各軸承部件310之本體311界定氣體歧管308,該氣體歧管包含入口307且經組態以使在入口307處接收之氣體遍及由本體界定之軸承表面312均勻地分佈。The air bearing 300 further includes a plurality of bearing components 310, each bearing component 310 including a body 311 and defining one of a plurality of bearing surfaces 312, and wherein the body 311 of each bearing component 310 defines a gas manifold 308, the gas manifold including an inlet 307 and configured so that gas received at the inlet 307 is evenly distributed throughout the bearing surface 312 defined by the body.
各軸承部件310可被視為在軸承表面312中之一者之下的支撐件。在使用中,各軸承部件之各歧管308的入口307可連接至氣體供應系統。在使用中,各軸承部件310之各歧管308之入口307透過可撓性管306供應有加壓氣體。氣體可為空氣。Each bearing component 310 can be considered as a support under one of the bearing surfaces 312. In use, the inlet 307 of each manifold 308 of each bearing component can be connected to a gas supply system. In use, the inlet 307 of each manifold 308 of each bearing component 310 is supplied with pressurized gas through the flexible tube 306. The gas can be air.
各軸承部件經由撓曲件206連接至支撐件。撓曲件206為凹口撓曲件。撓曲件206允許軸承表面312以類似於參看圖6所描述之方式的方式旋轉。Each bearing member is connected to the support member via a flex member 206. The flex member 206 is a notched flex member. The flex member 206 allows the bearing surface 312 to rotate in a manner similar to that described with reference to FIG. 6 .
儘管圖6之軸承部件310藉助於歧管308產生氣膜,但在替代方案中,軸承部件可為包含界定軸承表面之第一部分及支撐第一部分之第二部分的複合部件。界定軸承表面之第一部分可實質上由多孔石墨或另一多孔材料構成。一般而言,第一部分及第二部分可由不同材料形成。Although the bearing component 310 of FIG. 6 generates an air film by means of the manifold 308, in an alternative embodiment, the bearing component may be a composite component including a first portion defining a bearing surface and a second portion supporting the first portion. The first portion defining the bearing surface may be substantially composed of porous graphite or another porous material. In general, the first portion and the second portion may be formed of different materials.
應瞭解,氣體入口可包含複數個氣體入口。舉例而言,在一些實施例中,可針對複數個軸承表面中之各者提供一個氣體入口。對於此等實施例,一或多個通道可經組態以將各氣體入口以流體方式連接至複數個軸承表面中之對應軸承表面。It should be understood that the gas inlet may include a plurality of gas inlets. For example, in some embodiments, a gas inlet may be provided for each of a plurality of bearing surfaces. For these embodiments, one or more channels may be configured to fluidically connect each gas inlet to a corresponding bearing surface in the plurality of bearing surfaces.
為了促進空氣軸承之適當操作,軸承表面必須相對於軸桿而準確地定位。在一實例中,軸承表面可與軸桿分隔開10 μm與12 μm之間。To facilitate proper operation of the air bearing, the bearing surface must be accurately positioned relative to the shaft. In one example, the bearing surface may be separated from the shaft by between 10 μm and 12 μm.
在使用中,可能需要相對於軸承表面之支撐件來調整該等軸承表面。在一些實施例中,可能需要調整至±1 μm內。存在多個替代性調整方法。在一些實施例中,軸承表面調整可藉由以下來實現:拆卸軸承、漸進地將軸承之組件朝向其最終組態加工以及檢測經組裝之軸承。在檢測時,進一步的拆卸、機械加工及檢測可為必要的。因此,可反覆地到達所要的軸承尺寸組態。In use, it may be necessary to adjust the bearing surfaces relative to their supports. In some embodiments, adjustment may be required to within ±1 μm. There are a number of alternative adjustment methods. In some embodiments, bearing surface adjustment may be achieved by disassembling the bearings, progressively machining the components of the bearings toward their final configuration, and testing the assembled bearings. During testing, further disassembly, machining, and testing may be necessary. Thus, the desired bearing size configuration may be achieved iteratively.
替代地,軸承表面可藉助於墊片及/或軸承調整機構來調整。在一實例中,軸承表面中之兩者或更多者可經由可軸向移動之軸桿支撐,從而允許調整軸承表面位置。應注意,此等軸桿在垂直於支撐倍縮光罩遮蔽葉片之軸桿之軸線的方向上延伸且可軸向移動。恰當軸承表面位置可藉助於來自螺釘之摩擦而固定。Alternatively, the bearing surfaces may be adjusted by means of gaskets and/or bearing adjustment mechanisms. In one example, two or more of the bearing surfaces may be supported by axially movable rods, thereby allowing the bearing surface positions to be adjusted. It should be noted that these rods extend in a direction perpendicular to the axis of the rods supporting the zoom mask shielding blades and are axially movable. The proper bearing surface position may be secured by means of friction from screws.
在其他實施例中,氣隙尺寸可藉助於包含軸承表面之獨立總成而調整。總成可膠合至支撐件中。在一實例中,經膠合總成可定位於所要位置中且接著供應有經加壓液體膠。同時,軸承表面可在使用中經加壓至標稱氣體壓力。所得軸承組態將模仿標稱軸承預張力且具有所要軸承表面位置。此軸承表面位置接著藉由使膠固化而固定。In other embodiments, the air gap size may be adjusted by means of a separate assembly including the bearing surface. The assembly may be glued into the support. In one example, the glued assembly may be positioned in the desired position and then supplied with pressurized liquid glue. At the same time, the bearing surface may be pressurized to the nominal gas pressure in use. The resulting bearing configuration will mimic the nominal bearing pretension and have the desired bearing surface position. This bearing surface position is then fixed by curing the glue.
圖8A及圖8B示意性地描繪倍縮光罩遮蔽系統400之實施例的軸向橫截面。8A and 8B schematically depict axial cross-sections of an embodiment of a zoom mask system 400.
在圖1中所展示且在上文所描述之微影設備LA可包含倍縮光罩遮蔽系統400。The lithography apparatus LA shown in FIG. 1 and described above may include a reticle shielding system 400.
圖8A繪示處於靜止及/或處於未偏轉狀態之倍縮光罩遮蔽系統400。倍縮光罩遮蔽系統400包含軸桿402、倍縮光罩遮蔽葉片404 (其可為上文參考圖2A至圖4所描述之類型的遮蔽葉片32、34、36、38)及根據上述實施例之軸承406 (例如軸承100、軸承200或空氣軸承300)。軸桿402收納於由軸承406及軸承408之軸承表面410界定且由此支撐之孔隙中。倍縮光罩遮蔽葉片404耦接至軸桿402之末端。FIG8A shows a zoom mask shielding system 400 in a stationary and/or undeflected state. Zoom mask shielding system 400 includes a shaft 402, a zoom mask shielding blade 404 (which may be a shielding blade 32, 34, 36, 38 of the type described above with reference to FIGS. 2A to 4), and a bearing 406 (e.g., bearing 100, bearing 200, or air bearing 300) according to the above embodiments. Shaft 402 is received in an aperture defined by and supported by bearing surfaces 410 of bearings 406 and 408. Zoom mask shielding blade 404 is coupled to the end of shaft 402.
倍縮光罩遮蔽系統400進一步包含第二軸承408。軸桿402進一步由第二軸承408支撐。視需要,在兩個點處支撐往復軸桿402將往復軸桿的平移約束在正交於軸桿402之標稱軸線的方向上。The zoom reticle shielding system 400 further includes a second bearing 408. The shaft 402 is further supported by the second bearing 408. Optionally, supporting the reciprocating shaft 402 at two points constrains the translation of the reciprocating shaft in a direction orthogonal to the nominal axis of the shaft 402.
軸桿402經組態以在由軸承406及軸承408之軸承表面410界定的孔隙內往復。擴展地,倍縮光罩遮蔽葉片404經組態以與軸桿以串聯方式往復。倍縮光罩遮蔽系統400可在倍縮光罩遮蔽葉片404之高速度及加速度下操作。The shaft 402 is configured to reciprocate within an aperture defined by the bearing 406 and the bearing surface 410 of the bearing 408. By extension, the reticle shielding blade 404 is configured to reciprocate in series with the shaft. The reticle shielding system 400 can operate at high speeds and accelerations of the reticle shielding blade 404.
倍縮光罩遮蔽系統400之高速度及/或高加速度的影響繪示於圖8B中。在高速度及/或高加速度下,軸桿402可正交於軸桿標稱軸線110而偏轉(參見圖8A)。軸承表面410旋轉一角度θ以符合軸桿402之偏轉引發之局部旋轉。應注意,出於繪示之目的而放大圖8B中所展示之角度θ。軸承表面之旋轉輔助在軸承表面與往復軸桿之間維持足夠的氣膜。在無軸承表面410之旋轉的情況下,軸桿402可撞擊軸承表面410。The effects of high speed and/or high acceleration of the zoom mask system 400 are illustrated in FIG8B . Under high speed and/or high acceleration, the shaft 402 may deflect orthogonally to the shaft nominal axis 110 (see FIG8A ). The bearing surface 410 rotates an angle θ to account for the local rotation induced by the deflection of the shaft 402. It should be noted that the angle θ shown in FIG8B is exaggerated for illustration purposes. The rotation of the bearing surface assists in maintaining an adequate air film between the bearing surface and the reciprocating shaft. Without the rotation of the bearing surface 410, the shaft 402 may impact the bearing surface 410.
倍縮光罩遮蔽系統400亦避免對經組態以限制倍縮光罩遮蔽葉片圍繞軸桿402之標稱軸線旋轉的額外機構之需求,從而減少倍縮光罩遮蔽系統之佔據面積。The reticle shielding system 400 also avoids the need for an additional mechanism configured to limit the rotation of the reticle shielding blades about the nominal axis of the shaft 402, thereby reducing the footprint of the reticle shielding system.
在倍縮光罩遮蔽系統之一些實施例中,軸承可屬於不同類型。通常,軸承中之至少一者應根據上述實施例—亦即,限制軸桿圍繞標稱軸線旋轉的軸承。In some embodiments of the zoom mask shielding system, the bearings may be of different types. Typically, at least one of the bearings should be according to the above-described embodiments, that is, a bearing that limits the rotation of the shaft around a nominal axis.
圖9描繪包含軸桿502、第一軸承506、第二軸承508及線性馬達520的倍縮光罩遮蔽系統500之部分的橫截面圖。軸桿502自身包含具有正方形橫截面之第一部分503及具有圓形橫截面之第二部分504。第一部分503係由第一軸承506之正方形孔隙收納。第二部分504係由第二軸承508之圓柱形孔隙收納。FIG9 depicts a cross-sectional view of a portion of a zoom mask system 500 including a shaft 502, a first bearing 506, a second bearing 508, and a linear motor 520. The shaft 502 itself includes a first portion 503 having a square cross-section and a second portion 504 having a circular cross-section. The first portion 503 is received by the square aperture of the first bearing 506. The second portion 504 is received by the cylindrical aperture of the second bearing 508.
儘管自圖9省略,但軸桿502經組態以與倍縮光罩遮蔽葉片耦接。Although omitted from FIG. 9 , shaft 502 is configured to couple with a zoom reticle shielding blade.
第一軸承506包含至少部分地界定正方形孔隙之四個可旋轉軸承表面510。第一軸承506可類似於軸承100、軸承200或空氣軸承300。The first bearing 506 includes four rotatable bearing surfaces 510 that at least partially define a square aperture. The first bearing 506 can be similar to the bearing 100, the bearing 200, or the air bearing 300.
第二軸承508包含界定圓柱形孔隙之單一軸承表面512。第二軸承508經由材料514之薄環形腹板由支撐件513支撐。The second bearing 508 includes a single bearing surface 512 defining a cylindrical aperture. The second bearing 508 is supported by a support member 513 via a thin annular web of material 514.
材料514之薄環形腹板可容易變形。材料514之薄環形腹板的變形允許第二軸承508之軸承表面512藉由相對於支撐件513旋轉而符合往復軸桿502之第二部分504的局部傾斜。軸承表面之旋轉輔助在軸承表面與往復軸桿之間維持足夠的氣膜。The thin annular web of material 514 can be easily deformed. The deformation of the thin annular web of material 514 allows the bearing surface 512 of the second bearing 508 to conform to the local tilt of the second portion 504 of the reciprocating shaft 502 by rotating relative to the support member 513. The rotation of the bearing surface assists in maintaining an adequate air film between the bearing surface and the reciprocating shaft.
在一實例中,材料514之薄環形腹板可為至少約0.2 mm厚。在另一實例中,材料514之薄環形腹板可為至少約0.3 mm厚。在一些實施例中,材料之薄環形腹板可具有約38 mm之內徑及約48 mm之外徑。材料514之薄環形腹板可實質上由鋼合金(例如不鏽鋼合金)或鈦合金構成。一般而言,材料514之薄環形腹板可經組態以(藉由材料或尺寸選擇)在旋轉上相對於軸承表面512硬度小約20倍與100倍之間。In one example, the thin annular web of material 514 may be at least about 0.2 mm thick. In another example, the thin annular web of material 514 may be at least about 0.3 mm thick. In some embodiments, the thin annular web of material may have an inner diameter of about 38 mm and an outer diameter of about 48 mm. The thin annular web of material 514 may be substantially composed of a steel alloy (e.g., a stainless steel alloy) or a titanium alloy. In general, the thin annular web of material 514 may be configured (by material or size selection) to be between about 20 and 100 times less rotationally stiff than the bearing surface 512.
線性馬達剛性地耦接至往復軸桿502。在使用中,線性馬達經組態以引發軸桿502及擴展地倍縮光罩遮蔽葉片的線性往復運動。The linear motor is rigidly coupled to the reciprocating shaft 502. In use, the linear motor is configured to induce linear reciprocating motion of the shaft 502 and, by extension, the shroud shield blades.
第二軸承508可被支撐於分別在圖14A及圖14B中之正視圖及側視圖中示意性地繪示的替代性配置550中。如圖14A中所展示,第二軸承508藉由三個懸置臂554a、554b、554c自支撐框架552懸置。三個懸置臂554a、554b、554c比支撐框架552具有更大靈活性且自第二軸承508突出。懸置臂554a、554b、554c以大體上相切之方式自第二軸承突出。The second bearing 508 may be supported in an alternative configuration 550 schematically depicted in the front and side views in FIGS. 14A and 14B , respectively. As shown in FIG. 14A , the second bearing 508 is suspended from a support frame 552 by three suspension arms 554a, 554b, 554c. The three suspension arms 554a, 554b, 554c are more flexible than the support frame 552 and protrude from the second bearing 508. The suspension arms 554a, 554b, 554c protrude from the second bearing in a generally tangential manner.
在使用中,可撓性懸置臂准許第二軸承508之軸承表面558藉由相對於支撐件552旋轉而符合往復軸桿502之第二部分504的局部傾斜。In use, the flexible suspension arm allows the bearing surface 558 of the second bearing 508 to conform to the local tilt of the second portion 504 of the reciprocating shaft 502 by rotating relative to the support member 552.
在一些實施例中,懸置臂可為撓曲件。在一實例中,撓曲件可為片彈簧類金屬元件。In some embodiments, the suspension arm can be a flexure. In one example, the flexure can be a leaf spring type metal element.
製造第二軸承508及其支撐配置550之方法可包含自單件材料研磨至少一部分第二508及支撐配置550,從而簡化製造。A method of manufacturing the second bearing 508 and its support arrangement 550 may include grinding at least a portion of the second bearing 508 and the support arrangement 550 from a single piece of material, thereby simplifying manufacturing.
軸承表面558可為與氣體供應器(圖中未示)流體連通之多孔石墨組件。The bearing surface 558 may be a porous graphite component that is in fluid communication with a gas supply (not shown).
在一些實施例中,軸桿之第二部分亦可為非環狀,藉由第二軸承之對應孔隙收納。在此等實施例中,前軸承圍繞標稱軸線之任何(輕微)旋轉將造成與第二軸承對準之衝突(例如造成空氣軸承中之氣隙減小)。因此,具有非環狀第一及第二軸桿部分之此等實施例可能需要倍縮光罩遮蔽系統及其組件具有增加之準確度、精度、穩定性及剛性以最佳地起作用。因此,第二部分之環狀橫截面簡化了倍縮光罩遮蔽系統之製造。In some embodiments, the second portion of the shaft may also be non-annular, being received by a corresponding aperture of the second bearing. In such embodiments, any (slight) rotation of the front bearing about the nominal axis will cause a conflict with the alignment of the second bearing (e.g. causing a reduction in the air gap in the air bearing). Therefore, such embodiments with non-annular first and second shaft portions may require the zoom mask shielding system and its components to have increased accuracy, precision, stability and rigidity to function optimally. Therefore, the annular cross-section of the second portion simplifies the manufacture of the zoom mask shielding system.
儘管倍縮光罩遮蔽系統500包含係空氣軸承之軸承,但應瞭解,在一些實施例中,一或多個軸承(例如第二軸承508)無需為空氣軸承且可為例如油潤滑式軸承(但此等軸承在微影應用中可造成更大污染風險)或滾筒軸承。Although the zoom reticle shielding system 500 includes bearings that are air bearings, it should be understood that in some embodiments, one or more bearings (e.g., the second bearing 508) need not be air bearings and may be, for example, oil-lubricated bearings (although such bearings may pose a greater risk of contamination in lithography applications) or drum bearings.
儘管參看圖5A至圖8B所描述之空氣軸承包含四個可獨立移位之軸承表面,其中各軸承可僅以垂直於軸桿之標稱軸線的軸線(例如軸承200之軸承表面102)旋轉。應瞭解,可藉由替代配置來達成有效防止軸桿圍繞其標稱軸線之旋轉。Although the air bearings described with reference to Figures 5A-8B include four independently displaceable bearing surfaces, each of which can rotate only about an axis perpendicular to the nominal axis of the shaft (e.g., bearing surface 102 of bearing 200), it will be appreciated that effective prevention of rotation of the shaft about its nominal axis may be achieved by alternative arrangements.
圖10示意性地繪示根據本揭露之實施例之橫向橫截面中的軸承1000。在較佳實施例中,軸承1000為空氣軸承。Figure 10 schematically illustrates a bearing 1000 in a transverse cross section according to an embodiment of the present disclosure. In a preferred embodiment, the bearing 1000 is an air bearing.
軸承1000包含支撐件1101及由支撐件1101支撐之四個軸承表面1002、1202a、1202b、1402。軸承表面經組態以至少部分地界定用於收納軸桿1008之正方形孔隙1004。孔隙1004具有圍繞孔隙1004之質心1006之有限旋轉對稱階數(亦即,4階)。The bearing 1000 includes a support 1101 and four bearing surfaces 1002, 1202a, 1202b, 1402 supported by the support 1101. The bearing surfaces are configured to at least partially define a square aperture 1004 for receiving a shaft 1008. The aperture 1004 has a finite rotational symmetry order (i.e., order 4) about a center of mass 1006 of the aperture 1004.
軸承表面以(兩)對大體相對之軸承表面配置。軸承1000包含第一對軸承表面及第二對軸承表面。第一對軸承表面包含軸承表面1002及軸承表面1202a。第二對軸承表面包含軸承表面1402及軸承表面1202b。各對軸承表面之軸承表面在第一方向上分隔開。第一對軸承表面中之軸承表面1002及軸承表面1202a在第一方向1005上分隔開。第二對軸承表面中之軸承表面1402及軸承表面1202b在第一方向1405上分隔開。The bearing surfaces are arranged in (two) pairs of substantially opposite bearing surfaces. Bearing 1000 includes a first pair of bearing surfaces and a second pair of bearing surfaces. The first pair of bearing surfaces includes bearing surface 1002 and bearing surface 1202a. The second pair of bearing surfaces includes bearing surface 1402 and bearing surface 1202b. The bearing surfaces of each pair of bearing surfaces are separated in a first direction. Bearing surface 1002 and bearing surface 1202a in the first pair of bearing surfaces are separated in a first direction 1005. Bearing surface 1402 and bearing surface 1202b in the second pair of bearing surfaces are separated in a first direction 1405.
當複數個軸承表面安置於標稱位置或定向中時,由複數個軸承表面界定的孔隙1004之中心軸線界定了軸桿之標稱軸線。When the plurality of bearing surfaces are disposed in a nominal position or orientation, the center axis of the aperture 1004 defined by the plurality of bearing surfaces defines the nominal axis of the shaft.
複數個軸承表面中之一者(軸承表面1002)僅可圍繞平行於大體上垂直於第一方向1005及軸桿之標稱軸線的第二方向的旋轉軸線1012旋轉。替代地,軸承表面1002具有一個(旋轉)自由度。軸承表面1002係藉由連接構件1014連接至支撐件1101。應瞭解,軸承表面1002類似於上文參看圖5A至圖8B所描述之軸承表面(例如圖6之軸承表面102)。因而,其可併入結合彼等軸承表面描述之構造的細節中之任一者—例如,連接構件114可包含一或多個(凹口)撓曲件。One of the plurality of bearing surfaces (bearing surface 1002) can only rotate about a rotation axis 1012 that is parallel to a second direction that is substantially perpendicular to the first direction 1005 and the nominal axis of the shaft. Alternatively, the bearing surface 1002 has one (rotational) degree of freedom. The bearing surface 1002 is connected to the support member 1101 by a connecting member 1014. It should be understood that the bearing surface 1002 is similar to the bearing surfaces described above with reference to Figures 5A to 8B (e.g., the bearing surface 102 of Figure 6). As such, it may incorporate any of the details of the construction described in conjunction with those bearing surfaces—for example, the connecting member 114 may include one or more (notch) deflection members.
在替代性實施例中,複數個軸承表面之兩個或更多個軸承表面可僅具有一個旋轉自由度。In alternative embodiments, two or more of the plurality of bearing surfaces may have only one rotational degree of freedom.
軸承表面1402具有兩個旋轉自由度—軸承表面1402能夠圍繞y軸及z軸傾斜。替代地,軸承表面1402可圍繞垂直於第一對軸承表面之第一方向1405的兩個軸線中之任一者旋轉。在一些實施例中,軸承表面1402經由連接構件1414連接至支撐件1101。連接構件可為萬向鉸鏈。萬向鉸鏈可包含一或多個撓曲件。在其他實施例中,軸承表面1402可藉由允許兩個(旋轉)自由度之其他構件(諸如球型接頭)連接至支撐件。The bearing surface 1402 has two rotational degrees of freedom - the bearing surface 1402 can tilt about the y-axis and the z-axis. Alternatively, the bearing surface 1402 can rotate about either of two axes that are perpendicular to the first direction 1405 of the first pair of bearing surfaces. In some embodiments, the bearing surface 1402 is connected to the support 1101 via a connecting member 1414. The connecting member can be a universal hinge. The universal hinge can include one or more flexures. In other embodiments, the bearing surface 1402 can be connected to the support by other members that allow two (rotational) degrees of freedom, such as a ball joint.
軸承表面1202a及1202b為經偏置軸承表面。各對軸承表面對包含可旋轉軸承表面及經偏置軸承表面。Bearing surfaces 1202a and 1202b are offset bearing surfaces. Each pair of bearing surfaces includes a rotatable bearing surface and an offset bearing surface.
軸承1000包含兩個經偏置軸承表面1202a、1202b,其各自藉由偏置構件1214朝向孔隙1006之質心推動。在使用中,經偏置軸承表面1202a、1202b將軸桿1008分別朝向相對軸承表面1002及1402推擠。應注意,複數個軸承表面1002、1202a、1202b、1402不經組態以直接接觸軸桿1008—任何力皆經由軸承表面與軸桿1008之間的氣膜傳輸。The bearing 1000 includes two offset bearing surfaces 1202a, 1202b, each of which is urged toward the center of mass of the aperture 1006 by an offset member 1214. In use, the offset bearing surfaces 1202a, 1202b urge the shaft 1008 toward the opposing bearing surfaces 1002 and 1402, respectively. It should be noted that the plurality of bearing surfaces 1002, 1202a, 1202b, 1402 are not configured to directly contact the shaft 1008 - any forces are transmitted through the air film between the bearing surfaces and the shaft 1008.
兩個經偏置軸承表面1202a、1202b之偏置構件1214可包含氣動及/或機械偏置構件。氣動偏置構件可包含氣動活塞。機械偏置構件可包含螺旋彈簧、波形墊圈或彈性元件。替代地或另外,偏置構件1214可包含電磁偏置構件。The biasing member 1214 of the two biased bearing surfaces 1202a, 1202b may include pneumatic and/or mechanical biasing members. The pneumatic biasing member may include a pneumatic piston. The mechanical biasing member may include a coil spring, a wave washer, or an elastic element. Alternatively or in addition, the biasing member 1214 may include an electromagnetic biasing member.
應進一步瞭解,經偏置軸承表面1202a、1202b至少部分地藉由偏置構件1214安裝至支撐件1101。經偏置軸承表面1202a、1202b可朝向質心1006前進或自該質心縮回。It should be further understood that the offset bearing surfaces 1202a, 1202b are mounted to the support 1101 at least in part by the offset member 1214. The offset bearing surfaces 1202a, 1202b can advance toward or retract from the center of mass 1006.
在使用中,軸承1000可符合往復軸桿1008之偏轉,從而維持均勻流體(氣)膜。軸承表面1002可回應於軸桿圍繞x方向之偏轉或局部旋轉而傾斜。由經偏置軸承表面1202a提供之壓力將軸桿1008約束在軸承表面1002上。軸承表面1002僅具有單一旋轉軸線1012,且因此實質上防止軸桿1008圍繞y軸旋轉。軸承表面1402亦可回應於軸桿圍繞z方向之偏轉或局部旋轉而傾斜。另外,軸承表面1402可在y方向上傾斜。軸承表面1402之兩個自由度防止軸桿1008過度約束,從而允許軸承表面1402符合軸桿之尺寸的變化。因為經偏置軸承表面1202a、1202b可前進及縮回,所以孔隙1004可在第一方向1405及1005上改變其範圍,從而允許使用具有較鬆弛尺寸公差之軸桿的軸承1000。In use, bearing 1000 can conform to deflections of reciprocating shaft 1008, thereby maintaining a uniform fluid (air) film. Bearing surface 1002 can tilt in response to deflection or partial rotation of the shaft about the x-direction. The pressure provided by offset bearing surface 1202a constrains shaft 1008 to bearing surface 1002. Bearing surface 1002 has only a single axis of rotation 1012, and thus substantially prevents shaft 1008 from rotating about the y-axis. Bearing surface 1402 can also tilt in response to deflection or partial rotation of the shaft about the z-direction. In addition, bearing surface 1402 can tilt in the y-direction. The two degrees of freedom of the bearing surface 1402 prevents the shaft 1008 from being over-constrained, thereby allowing the bearing surface 1402 to conform to changes in the size of the shaft. Because the offset bearing surfaces 1202a, 1202b can advance and retract, the aperture 1004 can change its range in the first direction 1405 and 1005, thereby allowing the use of the bearing 1000 with a shaft having a looser dimensional tolerance.
經偏置軸承表面1202a、1202b之位置係藉由由氣膜在軸桿1008與軸承表面之間施加的力來控制。對於給定氣體壓力,軸桿與經偏置軸承表面之相對位置(亦即,其分隔)大致恆定。該分隔在主活塞之移動包封內實質上不變/與組件之絕對位置無關。在分隔之任何干擾下,軸承表面將在正確分隔時重新定位自身。經偏置軸承表面1202a、1202b自動地補償軸承及/或軸桿尺寸之不準確性。The position of the offset bearing surfaces 1202a, 1202b is controlled by the force exerted by the gas film between the shaft 1008 and the bearing surfaces. For a given gas pressure, the relative position of the shaft and the offset bearing surfaces (i.e., their separation) is approximately constant. The separation is substantially constant within the movement envelope of the main piston/independent of the absolute position of the assembly. With any perturbation of the separation, the bearing surfaces will reposition themselves at the correct separation. The offset bearing surfaces 1202a, 1202b automatically compensate for inaccuracies in the bearing and/or shaft dimensions.
在圖11中示意性地繪示軸承表面1402及其連接構件1414之實施例。連接構件1414包含經組態以允許圍繞z軸旋轉之第一撓曲件1416及經組態以允許圍繞y軸旋轉之第二撓曲件1418。組合地,第一及第二撓曲件1416、1418形成連接至軸承表面1402之萬向鉸鏈。軸承表面1402包含複數個孔1420以在使用中在軸承表面1402與軸桿1008之間提供氣膜。另外,軸承表面1402及其連接構件1414在x方向上極堅固。結合經偏置軸承表面1202b,軸桿1008準確地經約束或位於其x位置中。An embodiment of a bearing surface 1402 and its connecting member 1414 is schematically illustrated in FIG11 . The connecting member 1414 includes a first flexure 1416 configured to allow rotation about the z-axis and a second flexure 1418 configured to allow rotation about the y-axis. In combination, the first and second flexures 1416, 1418 form a universal hinge connected to the bearing surface 1402. The bearing surface 1402 includes a plurality of holes 1420 to provide an air film between the bearing surface 1402 and the shaft 1008 in use. In addition, the bearing surface 1402 and its connecting member 1414 are extremely strong in the x-direction. In conjunction with the offset bearing surface 1202b, the shaft 1008 is accurately constrained or located in its x position.
參看圖12A及圖12B描述偏置構件之實施例。偏置構件1214包含彈簧1222、子活塞1224及主活塞1226。子活塞1224由彈簧1222推動(朝向孔隙之質心)。主活塞連接至經偏置軸承表面1202a。彈簧122、子活塞1224及主活塞1226被限制在設置於支撐件1101中之孔1228內。主活塞1226及子活塞1224與孔1228一起界定可膨脹氣動腔室1230。偏置構件1214經組態以可在第一(或運輸)與第二(或操作)組態之間操作。An embodiment of a biasing member is described with reference to FIGS. 12A and 12B. The biasing member 1214 includes a spring 1222, a sub-piston 1224, and a main piston 1226. The sub-piston 1224 is pushed (toward the center of mass of the aperture) by the spring 1222. The main piston is connected to the offset bearing surface 1202a. The spring 122, the sub-piston 1224, and the main piston 1226 are confined within a hole 1228 disposed in the support member 1101. The main piston 1226 and the sub-piston 1224 together with the hole 1228 define an expandable pneumatic chamber 1230. The biasing member 1214 is configured to be operable between a first (or transport) and a second (or operating) configuration.
彈簧1222可取代其他偏置構件—例如螺旋彈簧、波形墊圈、錐形墊圈、彈性元件及/或其他機械偏置構件。在其他實施例中,彈簧1222可取代任何被動偏置構件。Spring 1222 can replace other biasing members—such as coil springs, wave washers, conical washers, elastic elements and/or other mechanical biasing members. In other embodiments, spring 1222 can replace any passive biasing member.
圖12A展示在第一組態中之偏置構件1214,其中彈簧1222經由子活塞1224將主活塞1226朝向孔隙質心推動。在第一組態中,主活塞1226及已連接經偏置軸承表面經推動而無需任何外部能量源。有利地,在倍縮遮罩遮蔽系統之運輸期間,由彈簧提供之張力允許軸桿被動地由軸承牢固地固持。FIG. 12A shows the biasing member 1214 in a first configuration, wherein the spring 1222 pushes the main piston 1226 toward the aperture centroid via the sub-piston 1224. In the first configuration, the main piston 1226 and the connected biased bearing surface are pushed without any external energy source. Advantageously, during transportation of the telescopic shielding system, the tension provided by the spring allows the shaft to be passively held firmly by the bearing.
圖12B展示在第二組態中之偏置構件1214,其中氣動腔室1230經加壓,從而縮回子活塞1224,且壓力藉由氣動壓力將主活塞1226朝向孔隙質心推動。氣動腔室1230可藉由加壓空氣加壓及膨脹,該加壓空氣藉助於空氣管道或入口1232供應。腔室1230之膨脹使子活塞1224與主活塞1226分隔開。藉由活塞施加之力係藉由孔1228之橫截面積及腔室1230中之壓力來控制。在一些實施例中,第二組態中之氣動腔室1230中之壓力可為大約6巴(a)。FIG. 12B shows the biasing member 1214 in a second configuration, wherein the pneumatic chamber 1230 is pressurized, thereby retracting the sub-piston 1224, and the pressure pushes the main piston 1226 toward the center of mass of the aperture by the pneumatic pressure. The pneumatic chamber 1230 can be pressurized and expanded by pressurized air, which is supplied by means of an air line or inlet 1232. The expansion of the chamber 1230 separates the sub-piston 1224 from the main piston 1226. The force applied by the piston is controlled by the cross-sectional area of the bore 1228 and the pressure in the chamber 1230. In some embodiments, the pressure in the pneumatic chamber 1230 in the second configuration can be about 6 bar(a).
圖13展示主活塞1226之更詳細的示意性橫截面圖。活塞1226包含保持被限制在活塞1226之環形凹槽1238中的活塞密封環1234。活塞密封環1234密封孔1228,從而在使用中提供可靠的氣動密封。另外,活塞密封環允許使用尺寸稍微過小之主活塞1226,使得在主活塞1226與孔1228之間存在間隙(在圖13中藉由Δ指示)。間隙Δ可為經偏置軸承表面1202提供一定程度的順應性。替代地,經偏置軸承表面1202a可傾斜。有利地,活塞密封環1234在任何定向(例如圍繞x軸及/或y軸傾斜)下密封主活塞1226—經偏置軸承表面1202a亦可符合軸桿1008之偏轉,同時維持對軸桿之壓縮力。FIG. 13 shows a more detailed schematic cross-sectional view of the main piston 1226. The piston 1226 includes a piston sealing ring 1234 that is retained and confined in an annular groove 1238 of the piston 1226. The piston sealing ring 1234 seals the bore 1228, thereby providing a reliable pneumatic seal in use. In addition, the piston sealing ring allows the use of a slightly undersized main piston 1226, so that there is a gap (indicated by Δ in FIG. 13) between the main piston 1226 and the bore 1228. The gap Δ can provide a certain degree of compliance for the offset bearing surface 1202. Alternatively, the offset bearing surface 1202a can be tilted. Advantageously, the piston seal ring 1234 seals the main piston 1226 in any orientation (e.g., tilted about the x-axis and/or y-axis) - the offset bearing surface 1202a can also accommodate deflection of the shaft 1008 while maintaining a compressive force on the shaft.
氣動腔室1230以流體方式連接至入口1232及經偏置軸承表面1202a。氣動腔室充當加壓空氣之儲集器,以在經偏置軸承表面1202a與軸桿1008之間供應氣膜(經由氣體歧管1203)。The pneumatic chamber 1230 is fluidly connected to the inlet 1232 and the offset bearing surface 1202a. The pneumatic chamber acts as a reservoir for pressurized air to supply an air film between the offset bearing surface 1202a and the shaft 1008 (via the gas manifold 1203).
主活塞1226進一步包含經組態以防止主活塞之過度插入的凸緣1236。The main piston 1226 further includes a flange 1236 configured to prevent over-insertion of the main piston.
儘管主活塞1226及擴展地經偏置軸承表面1202a可圍繞x軸及y軸傾斜,但不期望經偏置軸承表面1226軸向地旋轉—亦即,圍繞z軸旋轉。主活塞1226進一步包含反旋轉凸耳1238中之一或多者(例如兩者),該等反旋轉凸耳與界定於支撐件1101中之互補凹槽1239介接。反旋轉凸耳1238定位至互補凹槽1239中且阻止主活塞1226圍繞z軸旋轉。反旋轉凸耳及互補凹槽為互補反旋轉特徵之實例。Although the master piston 1226 and, by extension, the offset bearing surface 1202a can tilt about the x-axis and the y-axis, it is not desirable for the offset bearing surface 1226 to rotate axially—that is, about the z-axis. The master piston 1226 further includes one or more (e.g., two) anti-rotation lugs 1238 that interface with complementary grooves 1239 defined in the support 1101. The anti-rotation lugs 1238 are positioned into the complementary grooves 1239 and prevent the master piston 1226 from rotating about the z-axis. The anti-rotation lugs and complementary grooves are examples of complementary anti-rotation features.
在一些實施例中,子活塞1224亦可包含活塞密封環以便對孔1228提供氣動密封。In some embodiments, the sub-piston 1224 may also include a piston sealing ring to provide a pneumatic seal to the hole 1228.
參看圖12A、圖12B及圖13所描述之偏置構件之實施例係關於第一對軸承表面之經偏置軸承表面1202a加以描述。應瞭解,實質上類似偏置構件亦可將第二對軸承表面之經偏置軸承表面1202b連接至支撐件1101。The embodiment of the offset member described with reference to Figures 12A, 12B and 13 is described with respect to the offset bearing surface 1202a of the first pair of bearing surfaces. It should be understood that substantially similar offset members can also connect the offset bearing surface 1202b of the second pair of bearing surfaces to the support member 1101.
微影設備LA可包含倍縮光罩遮蔽系統500。在本文件中對遮罩或倍縮光罩之提及可解釋為對圖案化裝置(遮罩或倍縮光罩為圖案化裝置之實例)之提及且可互換地使用術語。特定而言,術語遮罩總成與倍縮光罩總成及圖案化裝置總成同義。The lithography apparatus LA may include a reticle masking system 500. References to a mask or reticle in this document may be interpreted as references to a patterning device (a mask or reticle is an example of a patterning device) and the terms may be used interchangeably. In particular, the term mask assembly is synonymous with a reticle assembly and a patterning device assembly.
儘管在本文中可特定地參考本發明在微影設備之內容背景中之實施例,但本發明之實施例可用於其他設備中。本發明之實施例可形成遮罩檢測設備、度量衡設備或量測或處理諸如晶圓(或其他基板)或遮罩(或其他圖案化裝置)之物件的任何設備之部分。此等設備通常可被稱作微影工具。此類微影工具可使用真空條件或環境(非真空)條件。Although specific reference may be made herein to embodiments of the invention in the context of lithography apparatus, embodiments of the invention may be used in other apparatus. Embodiments of the invention may form part of a mask inspection apparatus, a metrology apparatus, or any apparatus that measures or processes an object such as a wafer (or other substrate) or a mask (or other patterned device). Such apparatus may generally be referred to as a lithography tool. Such lithography tools may use vacuum conditions or ambient (non-vacuum) conditions.
術語「EUV輻射」可被認為涵蓋具有介於4 nm至20 nm之範圍內,例如介於13 nm至14 nm之範圍內之波長的電磁輻射。EUV輻射可具有小於10 nm,例如在4 nm至10 nm之範圍內,諸如6.7 nm或6.8 nm之波長。The term "EUV radiation" may be considered to cover electromagnetic radiation having a wavelength in the range of 4 nm to 20 nm, for example in the range of 13 nm to 14 nm. EUV radiation may have a wavelength less than 10 nm, for example in the range of 4 nm to 10 nm, such as 6.7 nm or 6.8 nm.
儘管可在本文中特定地參考微影設備在IC製造中之使用,但應理解,本文中所描述之微影設備可具有其他應用。可能的其他應用包括製造整合式光學系統、導引及偵測用於磁疇記憶體之圖案、平板顯示器、液晶顯示器(LCD)、薄膜磁頭等。Although specific reference may be made herein to the use of lithography equipment in IC manufacturing, it should be understood that the lithography equipment described herein may have other applications. Possible other applications include manufacturing integrated optical systems, guiding and detecting patterns for magnetic resonance memory, flat panel displays, liquid crystal displays (LCDs), thin film magnetic heads, etc.
雖然上文已描述本發明之特定實施例,但應瞭解,可以與所描述之方式不同的其他方式來實踐該等本發明。以上描述意欲為繪示性而非限制性的。因此,對於熟習此項技術者將顯而易見,可在不脫離下文所闡述之申請專利範圍之範疇的情況下對所描述之本發明進行修改。Although specific embodiments of the present invention have been described above, it should be understood that the present invention may be practiced in other ways than those described. The above description is intended to be illustrative and not restrictive. Therefore, it will be apparent to those skilled in the art that modifications may be made to the present invention as described without departing from the scope of the claims set forth below.
1:雷射 2:雷射射束 3:燃料發射器 4:電漿形成區 5:收集器 6:中間焦點 7:電漿 8:開口 9:圍封結構 10:琢面化場鏡面裝置 11:琢面化光瞳鏡面裝置 13:鏡面 14:鏡面 15:倍縮光罩總成/表膜總成 15a:中心部分 15b:周邊部分 17:表膜框架 19:表膜 24:區 26:箭頭 28:經延伸第一部分區 32:x遮蔽葉片 34:x遮蔽葉片 36:y遮蔽葉片 38:y遮蔽葉片 40:第一平面 42:第二平面 44:大體上矩形場區 46:彎曲隙縫區 48:角度 50:氣體噴嘴 52:氣流 100:軸承 101:支撐件 102:軸承表面 104:孔隙 106:質心 108:軸桿 110:標稱軸線 114:連接部件 200:軸承 202:軸承表面 204:旋轉軸線 205:第一方向 206:撓曲件 300:空氣軸承 301:支撐件 302:氣體入口 304:通道 306:可撓性管 307:入口 308:歧管 310:軸承部件 311:本體 312:軸承表面 400:倍縮光罩遮蔽系統 402:往復軸桿 404:倍縮光罩遮蔽葉片 406:軸承 408:第二軸承 410:軸承表面 500:倍縮光罩遮蔽系統 502:往復軸桿 503:第一部分 504:第二部分 506:第一軸承 508:第二軸承 510:可旋轉軸承表面 512:軸承表面 513:支撐件 514:材料 520:線性馬達 550:替代性配置 552:支撐框架 554a:懸置臂 554b:懸置臂 554c:懸置臂 558:軸承表面 1000:軸承 1002:軸承表面 1004:孔隙 1005:第一方向 1006:質心 1008:軸桿 1012:旋轉軸線 1014:連接構件 1101:支撐件 1202a:經偏置軸承表面 1202b:經偏置軸承表面 1203:氣體歧管 1214:偏置構件 1222:彈簧 1224:子活塞 1226:主活塞 1228:孔 1230:可膨脹氣動腔室 1232:空氣管道或入口 1234:活塞密封環 1236:凸緣 1238:環形凹槽 1239:互補凹槽 1402:軸承表面 1405:第一方向 1414:連接構件 1416:第一撓曲件 1418:第二撓曲件 1420:孔 B:輻射射束 IL:照明系統 LA:微影設備 MA:圖案化裝置 MT:支撐結構 PS:投影系統 SO:輻射源 W:基板 WT:基板台 1: Laser 2: Laser beam 3: Fuel emitter 4: Plasma formation zone 5: Collector 6: Intermediate focus 7: Plasma 8: Opening 9: Enclosure 10: Faceted field mirror device 11: Faceted pupil mirror device 13: Mirror 14: Mirror 15: Zoom mask assembly/film assembly 15a: Central portion 15b: Peripheral portion 17: Film frame 19: Film 24: Zone 26: Arrow 28: Extended first section zone 32: x shielding blade 34: x shielding blade 36: y shielding blade 38: y shielding blade 40: First plane 42: Second plane 44: generally rectangular field area 46: bend gap area 48: angle 50: gas nozzle 52: gas flow 100: bearing 101: support member 102: bearing surface 104: aperture 106: center of mass 108: shaft 110: nominal axis 114: connecting member 200: bearing 202: bearing surface 204: rotation axis 205: first direction 206: deflection member 300: air bearing 301: support member 302: gas inlet 304: passageway 306: flexible tube 307: inlet 308: Manifold 310: Bearing Component 311: Body 312: Bearing Surface 400: Zoom Mask Shielding System 402: Reciprocating Shaft 404: Zoom Mask Shielding Blade 406: Bearing 408: Secondary Bearing 410: Bearing Surface 500: Zoom Mask Shielding System 502: Reciprocating Shaft 503: First Section 504: Second Section 506: First Bearing 508: Secondary Bearing 510: Rotatable Bearing Surface 512: Bearing Surface 513: Support 514: Material 520: Linear Motor 550: Alternative Configurations 552: support frame 554a: suspension arm 554b: suspension arm 554c: suspension arm 558: bearing surface 1000: bearing 1002: bearing surface 1004: aperture 1005: first direction 1006: center of mass 1008: shaft 1012: axis of rotation 1014: connecting member 1101: support member 1202a: offset bearing surface 1202b: offset bearing surface 1203: gas manifold 1214: offset member 1222: spring 1224: sub-piston 1226: main piston 1228: hole 1230: expandable pneumatic chamber 1232: air duct or inlet 1234: piston seal ring 1236: flange 1238: annular groove 1239: complementary groove 1402: bearing surface 1405: first direction 1414: connecting member 1416: first deflection member 1418: second deflection member 1420: hole B: radiation beam IL: illumination system LA: lithography equipment MA: patterning device MT: support structure PS: projection system SO: radiation source W: substrate WT: substrate stage
現將參看隨附示意性圖式僅作為實例來描述本發明之實施例,在隨附示意性圖式中: - 圖1為包含微影設備及輻射源之微影系統的示意性說明; - 圖2A為安置於第一末端位置中的圖1中所展示之支撐結構及圖案化裝置的示意性平面圖; - 圖2B為安置於第二末端位置中的圖1中所展示之支撐結構及圖案化裝置的示意性平面圖; - 圖3A為通過圖1之微影設備之支撐結構上之圖案化裝置及倍縮光罩遮蔽葉片的第一橫截面的示意性說明; - 圖3B為通過圖1之微影設備之支撐結構上之圖案化裝置及倍縮光罩遮蔽葉片的第二橫截面的示意性說明; - 圖4為展示呈第一組態的圖1之微影設備之y遮蔽葉片及x遮蔽葉片(點線)的平面圖; - 圖5A為通過根據本揭露之實施例之軸承之橫向橫截面的示意性說明; - 圖5B為通過根據圖5A中所展示之實施例之軸承之軸向橫截面的示意性說明; - 圖6為根據本揭露之另一實施例之軸承的透視說明; - 圖7A為通過根據本揭露之實施例的空氣軸承之軸向橫截面的示意性說明; - 圖7B為通過根據圖7A中所展示之實施例的軸承之橫向橫截面的示意性說明; - 圖8A為通過根據本揭露之實施例之倍縮光罩遮蔽系統之軸向橫截面的示意性說明; - 圖8B為在偏轉下通過根據圖8A中所展示之實施例之倍縮光罩遮蔽系統之軸向橫截面的示意性說明; - 圖9為根據本揭露之實施例之倍縮光罩遮蔽系統的透視說明。 - 圖10示意性地繪示根據本揭露之實施例之橫向橫截面中的軸承。 - 圖11示意性地繪示根據本揭露之實施例的軸承表面及其連接構件。 - 圖12A及圖12B示意性地繪示根據本揭露之實施例之偏置構件。 - 圖13示意性繪示根據本揭露之實施例的主活塞。 - 圖14A及圖14B示意性地繪示根據本揭露之替代性實施例之軸承。 An embodiment of the present invention will now be described as an example only with reference to the accompanying schematic drawings, in which: - FIG. 1 is a schematic illustration of a lithography system including a lithography apparatus and a radiation source; - FIG. 2A is a schematic plan view of the support structure and patterning device shown in FIG. 1 disposed in a first end position; - FIG. 2B is a schematic plan view of the support structure and patterning device shown in FIG. 1 disposed in a second end position; - FIG. 3A is a schematic illustration of a first cross-section of the patterning device and the doubling mask shielding blade on the support structure of the lithography apparatus of FIG. 1; - FIG. 3B is a schematic illustration of a second cross-section through the patterning device and the doubling mask shielding blade on the support structure of the lithography apparatus of FIG. 1; - FIG. 4 is a plan view showing the y shielding blade and the x shielding blade (dotted line) of the lithography apparatus of FIG. 1 in a first configuration; - FIG. 5A is a schematic illustration of a transverse cross-section through a bearing according to an embodiment of the present disclosure; - FIG. 5B is a schematic illustration of an axial cross-section through a bearing according to the embodiment shown in FIG. 5A; - FIG. 6 is a perspective illustration of a bearing according to another embodiment of the present disclosure; - FIG. 7A is a schematic illustration of an axial cross-section through an air bearing according to an embodiment of the present disclosure; - FIG. 7B is a schematic illustration of a transverse cross section through a bearing according to the embodiment shown in FIG. 7A; - FIG. 8A is a schematic illustration of an axial cross section through a doubling mask shielding system according to an embodiment of the present disclosure; - FIG. 8B is a schematic illustration of an axial cross section through a doubling mask shielding system according to an embodiment of the present disclosure under deflection; - FIG. 9 is a perspective illustration of a doubling mask shielding system according to an embodiment of the present disclosure. - FIG. 10 schematically illustrates a bearing in a transverse cross section according to an embodiment of the present disclosure. - FIG. 11 schematically illustrates a bearing surface and its connecting components according to an embodiment of the present disclosure. - Figures 12A and 12B schematically illustrate a biasing member according to an embodiment of the present disclosure. - Figure 13 schematically illustrates a main piston according to an embodiment of the present disclosure. - Figures 14A and 14B schematically illustrate a bearing according to an alternative embodiment of the present disclosure.
100:軸承 100: Bearings
101:支撐件 101: Support parts
102:軸承表面 102: Bearing surface
104:孔隙 104: Porosity
106:質心 106: Center of mass
108:軸桿 108: Shaft
114:連接部件 114: Connecting parts
Claims (35)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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EP23181410.4 | 2023-06-26 | ||
EP23181410 | 2023-06-26 |
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TW202501171A true TW202501171A (en) | 2025-01-01 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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TW113119774A TW202501171A (en) | 2023-06-26 | 2024-05-29 | Bearing |
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TW (1) | TW202501171A (en) |
WO (1) | WO2025002640A1 (en) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US20080029682A1 (en) * | 2005-11-04 | 2008-02-07 | Nikon Corporation | Fine stage "Z" support apparatus |
US8467034B2 (en) * | 2008-07-02 | 2013-06-18 | Nikon Corporation | Light shielding unit, variable slit apparatus, and exposure apparatus |
US9347494B2 (en) * | 2014-07-15 | 2016-05-24 | Boss Tool Corporation | Guiding element for actuator |
WO2019096644A1 (en) * | 2017-11-14 | 2019-05-23 | Asml Netherlands B.V. | Object stage bearing for lithographic apparatus |
US12255514B2 (en) * | 2021-07-30 | 2025-03-18 | Mainspring Energy, Inc. | Systems and methods for flexure-based bearing mounting |
-
2024
- 2024-05-07 WO PCT/EP2024/062545 patent/WO2025002640A1/en unknown
- 2024-05-29 TW TW113119774A patent/TW202501171A/en unknown
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