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TW202334367A - Conductive paste and multilayer substrate - Google Patents

Conductive paste and multilayer substrate Download PDF

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Publication number
TW202334367A
TW202334367A TW111144137A TW111144137A TW202334367A TW 202334367 A TW202334367 A TW 202334367A TW 111144137 A TW111144137 A TW 111144137A TW 111144137 A TW111144137 A TW 111144137A TW 202334367 A TW202334367 A TW 202334367A
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metal particles
mass
melting point
conductive paste
parts
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TW111144137A
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Chinese (zh)
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中園元
津田剛志
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日商拓自達電線股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20Conductive material dispersed in non-conductive organic material
    • H01B1/22Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern

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  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
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  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Conductive Materials (AREA)

Abstract

The present invention provides a conductive paste which is capable of forming a cured product that achieves high conductivity and long-term reliability at the same time. The present invention provides a conductive paste which contains, per 100 parts by mass of a liquid epoxy compound, 1,700 parts by mass to 3,300 parts by mass of metal particles that include high melting point metal particles (B1) which contain silver and/or copper and have a melting point of 800 DEG C or higher, low melting point metal particles (B2) which are formed of an alloy having a melting point of 130 DEG C to 150 DEG C, and low melting point metal particles (B3) which are formed of an alloy of two or more metals selected from the group consisting of tin, silver, copper, bismuth and indium, and have a melting point of 200 DEG C to 240 DEG C, 1 part by mass to 30 parts by mass of a curing agent, and 20 parts by mass to 200 parts by mass of a flux.

Description

導電性糊及多層基板Conductive paste and multilayer substrate

發明領域 本發明是有關於導電性糊及使用該導電性糊之多層基板。 Field of invention The present invention relates to a conductive paste and a multilayer substrate using the conductive paste.

背景技術 用於基板之孔填充等的導電性糊是使用金屬熔融糊,其係添加助熔劑、硬化劑、熱硬化性樹脂及導電性填料,且於一定條件下加熱會使樹脂硬化,同時使金屬粒子熔解而金屬化(即,形成金屬粒子彼此的金屬間化合物)。 Background technology The conductive paste used for hole filling in substrates uses metal molten paste, which is added with flux, hardener, thermosetting resin and conductive filler. When heated under certain conditions, the resin will harden and the metal particles will Melt and metallize (that is, form an intermetallic compound between metal particles).

於此種導電性糊中,為了發揮長期連接穩定性,已知的方法是在導電性填料中組合使用高熔點金屬粒子與低熔點金屬粒子(專利文獻1、2)。In order to achieve long-term connection stability in such a conductive paste, a known method is to use a combination of high-melting-point metal particles and low-melting-point metal particles as a conductive filler (Patent Documents 1 and 2).

然而,以今日要求高機能化、小型化之半導體裝置而言,若使用該等方法所製得之導電性糊,其作成硬化物時之比電阻高,導電性不足。However, in today's semiconductor devices that require high functionality and miniaturization, if the conductive paste prepared by these methods is used, the specific resistance when made into a cured product is high and the conductivity is insufficient.

又,為了改善導電性,亦有一發明報導使用氟系界面活性劑來改善導電性糊之潤濕性並提升連接性(專利文獻3)。In addition, in order to improve the conductivity, there is also an invention reported using a fluorine-based surfactant to improve the wettability of the conductive paste and enhance the connectivity (Patent Document 3).

先前技術文獻 專利文獻 專利文獻1:日本特開2008-108629號公報 專利文獻2:國際公開第2016/136204號 專利文獻3:日本特開2020-152778號公報 Prior technical literature patent documents Patent Document 1: Japanese Patent Application Publication No. 2008-108629 Patent Document 2: International Publication No. 2016/136204 Patent Document 3: Japanese Patent Application Publication No. 2020-152778

發明概要 發明欲解決之課題 然而,雖然可藉由使用氟系界面活性劑來提升導電性糊之接著性,但是在作成硬化物時比電阻並未減低,導電性不足,而且長期可靠性未經評價,效果不明。 Summary of the invention The problem to be solved by the invention However, although the adhesion of the conductive paste can be improved by using a fluorine-based surfactant, the specific resistance is not reduced when the hardened product is made, the conductivity is insufficient, and the long-term reliability has not been evaluated, and the effect is unknown.

因此,如今仍未獲得在作成硬化物時能高水平地兼顧高導電性與長期可靠性之導電性糊。Therefore, a conductive paste that can achieve both high conductivity and long-term reliability at a high level when forming a cured product has not yet been obtained.

本發明是用以解決此種課題者,目的在於提供一種導電性糊,該導電性糊能形成一種兼顧高導電性與長期可靠性之硬化物。The present invention is made to solve such problems, and its object is to provide a conductive paste that can form a cured product that has both high conductivity and long-term reliability.

用以解決課題之手段 本案發明人等為了達成上述目標一心一意地努力,結果發現若利用以下導電性糊,在作成硬化物時便具有高導電性與長期可靠性,即:一種導電性糊,其含有液狀環氧樹脂、金屬粒子、硬化劑及助熔劑,並且,相對於液狀環氧樹脂100質量份,金屬粒子為1700質量份~3300質量份,硬化劑為1質量份~30質量份,助熔劑為20質量份~200質量份;前述金屬粒子包含:高熔點金屬粒子(B1),其含有銀及/或銅且熔點800℃以上;低熔點金屬粒子(B2),其為熔點130℃~150℃之合金;以及,低熔點金屬粒子(B3),其為選自於由錫、銀、銅、鉍及銦所構成群組中之2種以上之合金,且熔點200℃~240℃。本發明是根據該等見解而完成。 means to solve problems The inventors of this case worked wholeheartedly to achieve the above goal, and found that cured products can have high conductivity and long-term reliability if the following conductive paste is used: a conductive paste containing a liquid epoxy resin , metal particles, hardener and flux, and, relative to 100 parts by mass of liquid epoxy resin, the metal particles are 1700 to 3300 parts by mass, the hardener is 1 to 30 parts by mass, and the flux is 20 parts by mass ~200 parts by mass; the aforementioned metal particles include: high-melting-point metal particles (B1), which contain silver and/or copper and have a melting point of 800°C or above; low-melting-point metal particles (B2), which are alloys with a melting point of 130°C~150°C. ; And, low melting point metal particles (B3), which are two or more alloys selected from the group consisting of tin, silver, copper, bismuth and indium, and have a melting point of 200°C to 240°C. The present invention was completed based on these findings.

即,本發明提供一種導電性糊,其含有液狀環氧化合物、金屬粒子、硬化劑及助熔劑,並且,相對於液狀環氧化合物100質量份,金屬粒子為1700質量份~3300質量份,硬化劑為1質量份~30質量份,助熔劑為20質量份~200質量份;前述金屬粒子包含3種以上金屬粒子:高熔點金屬粒子(B1),其含有銀及/或銅且熔點800℃以上;低熔點金屬粒子(B2),其為熔點130℃~150℃之合金;以及,低熔點金屬粒子(B3),其為選自於由錫、銀、銅、鉍及銦所構成群組中之2種以上之合金,且熔點200℃~240℃。That is, the present invention provides a conductive paste containing a liquid epoxy compound, metal particles, a hardener, and a flux, and the metal particles are 1,700 to 3,300 parts by mass relative to 100 parts by mass of the liquid epoxy compound. , the hardener is 1 to 30 parts by mass, and the flux is 20 to 200 parts by mass; the aforementioned metal particles include more than 3 types of metal particles: high melting point metal particles (B1), which contain silver and/or copper and have a melting point 800℃ or above; low-melting-point metal particles (B2), which are alloys with a melting point of 130℃~150℃; and, low-melting-point metal particles (B3), which are selected from the group consisting of tin, silver, copper, bismuth and indium Two or more alloys in the group, with a melting point of 200℃~240℃.

上述導電性糊可藉由使用上述液狀環氧化合物而大量摻合金屬粒子,其結果可提升導電性。藉由組合含有上述高熔點金屬粒子(B1)與上述低熔點金屬粒子(B2),作成硬化物時之導電性優異。藉由含有上述低熔點金屬粒子(B3),可提升作成硬化物時之長期可靠性。又,相對於上述液狀環氧化合物100質量份,包含上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)之金屬粒子含有1700重量份~3300重量份,藉此,可減低上述導電性糊之硬化物之比電阻,提升導電性,並且可抑制裂痕產生,因此可提升長期連接可靠性。藉由含有1質量份~30質量份之硬化劑,可抑制作成硬化物時裂痕產生,提升長期可靠性。藉由含有20質量份~200質量份之助熔劑,可於上述導電性糊之硬化物中減低比電阻,提升導電性。The above-mentioned conductive paste can be mixed with a large amount of metal particles by using the above-mentioned liquid epoxy compound, and as a result, the conductivity can be improved. By containing the high-melting-point metal particles (B1) and the low-melting-point metal particles (B2) in combination, a cured product has excellent electrical conductivity. By containing the above-mentioned low melting point metal particles (B3), the long-term reliability of the hardened product can be improved. Moreover, the metal particles including the above-mentioned high-melting-point metal particles (B1), the above-mentioned low-melting-point metal particles (B2), and the above-mentioned low-melting-point metal particles (B3) contain 1,700 to 3,300 parts by weight relative to 100 parts by mass of the above-mentioned liquid epoxy compound. parts by weight, thereby reducing the specific resistance of the hardened material of the conductive paste, improving the conductivity, and suppressing the occurrence of cracks, thereby improving long-term connection reliability. By containing 1 to 30 parts by mass of the hardener, cracks can be suppressed when making the hardened product and long-term reliability can be improved. By containing 20 parts by mass to 200 parts by mass of flux, the specific resistance can be reduced and the conductivity can be improved in the hardened material of the conductive paste.

本發明之導電性糊宜為:上述低熔點金屬粒子(B2)與上述低熔點金屬粒子(B3)之質量比率為(B2)/(B3)=0.9~40。藉由上述低熔點金屬粒子(B2)與上述低熔點金屬粒子(B3)之質量比率為0.9以上,比電阻會減低而導電性更趨優異。又,藉由上述低熔點金屬粒子(B2)與上述低熔點金屬粒子(B3)之質量比率為40以下,便容易抑制裂痕產生而兼顧長期連接可靠性。The conductive paste of the present invention is preferably such that the mass ratio of the low-melting-point metal particles (B2) to the low-melting-point metal particles (B3) is (B2)/(B3)=0.9~40. When the mass ratio of the low-melting-point metal particles (B2) and the low-melting-point metal particles (B3) is 0.9 or more, the specific resistance is reduced and the electrical conductivity becomes more excellent. In addition, when the mass ratio of the low-melting-point metal particles (B2) to the low-melting-point metal particles (B3) is 40 or less, the generation of cracks can be easily suppressed and long-term connection reliability can be achieved.

又,上述硬化劑宜為含羥基之芳香族化合物。In addition, the above-mentioned hardener is preferably a hydroxyl-containing aromatic compound.

又,上述硬化劑宜為苯酚系硬化劑及/或萘酚系硬化劑。In addition, the above-mentioned hardener is preferably a phenol-based hardener and/or a naphthol-based hardener.

又,本發明提供一種多層基板,其係由複數層導電層與介於上述複數層導電層間之絕緣層所構成,且貫通上述絕緣層的孔被本發明之導電性糊之硬化物填充,透過上述導電性糊之硬化物,接在上述絕緣層兩面的導電層彼此相互導通。Furthermore, the present invention provides a multilayer substrate, which is composed of a plurality of conductive layers and an insulating layer interposed between the plurality of conductive layers, and the holes penetrating the insulating layer are filled with the hardened material of the conductive paste of the present invention, and penetrated therethrough. In the cured product of the conductive paste, the conductive layers connected to both sides of the insulating layer are electrically connected to each other.

又,於上述導電性糊硬化物中,宜為上述高熔點金屬粒子(B1)、低熔點金屬粒子(B2)及低熔點金屬粒子(B3)熔解而相互一體化並合金化。Furthermore, in the above-mentioned conductive paste cured material, it is preferable that the above-mentioned high-melting-point metal particles (B1), low-melting-point metal particles (B2) and low-melting-point metal particles (B3) are melted and integrated with each other and alloyed.

發明效果 本發明之導電性糊能形成一種兼顧高導電性與長期可靠性之硬化物。 Invention effect The conductive paste of the present invention can form a hardened product that has both high conductivity and long-term reliability.

用以實施發明之形態 [導電性糊] 本發明之導電性糊至少包含液狀環氧化合物、金屬粒子、硬化劑及助熔劑。上述導電性糊亦可包含上述各成分以外的其他成分。 Form used to implement the invention [Conductive paste] The conductive paste of the present invention contains at least a liquid epoxy compound, metal particles, a hardener and a flux. The above-mentioned conductive paste may contain components other than the above-mentioned components.

(液狀環氧化合物) 上述液狀環氧化合物為分子內(一分子中)至少具有1個以上環氧基(環氧乙烷基)之化合物。上述液狀環氧化合物意指於常溫下為液體的環氧化合物。另,所謂「於常溫下為液體」,意指於25℃下且在無溶劑狀態下顯現流動性之狀態。本發明之導電性糊可藉由含有高流動性之上述液狀環氧化合物而大量摻合金屬粒子,其結果可提升導電性。上述液狀環氧化合物可以僅使用一種,亦可使用二種以上。 (liquid epoxy compound) The above-mentioned liquid epoxy compound is a compound having at least one epoxy group (oxirane group) in the molecule (in one molecule). The above-mentioned liquid epoxy compound means an epoxy compound that is liquid at normal temperature. In addition, "liquid at normal temperature" means a state that exhibits fluidity at 25° C. in a solvent-free state. The conductive paste of the present invention can contain a large amount of metal particles by containing the above-mentioned liquid epoxy compound with high fluidity, and as a result, the conductivity can be improved. Only one type of the above-mentioned liquid epoxy compound may be used, or two or more types may be used.

上述液狀環氧化合物並無特殊限制,可舉例如:雙酚型環氧化合物、螺環型環氧化合物、萘型環氧化合物、聯苯型環氧化合物、萜烯型環氧化合物、酚醛清漆型環氧化合物、二聚物酸改質環氧化合物、環氧丙基胺型環氧化合物、環氧丙基醚型環氧化合物、橡膠改質環氧樹脂或螯合物改質環氧樹脂等。其中,從可降低電阻值且保存穩定性優異之觀點來看,又以二聚物酸改質環氧化合物為佳。The liquid epoxy compound is not particularly limited, and examples thereof include bisphenol-type epoxy compounds, spirocyclic epoxy compounds, naphthalene-type epoxy compounds, biphenyl-type epoxy compounds, terpene-type epoxy compounds, and phenolic compounds. Varnish type epoxy compound, dimer acid modified epoxy compound, glycidylamine type epoxy compound, glycidyl ether type epoxy compound, rubber modified epoxy resin or chelate modified epoxy compound Resin etc. Among these, dimer acid-modified epoxy compounds are preferred because they can reduce the resistance value and have excellent storage stability.

上述雙酚型環氧化合物可舉例如:雙酚A型環氧化合物、雙酚F型環氧化合物、雙酚S型環氧化合物或四溴雙酚A型環氧化合物等。Examples of the bisphenol type epoxy compound include a bisphenol A type epoxy compound, a bisphenol F type epoxy compound, a bisphenol S type epoxy compound, a tetrabromobisphenol A type epoxy compound, and the like.

上述酚醛清漆型環氧化合物可舉例如:甲酚酚醛清漆型環氧化合物、苯酚酚醛清漆型環氧化合物、α-萘酚酚醛清漆型環氧化合物或溴化苯酚酚醛清漆型環氧化合物等。Examples of the novolak-type epoxy compound include a cresol novolak-type epoxy compound, a phenol novolak-type epoxy compound, an α-naphthol novolak-type epoxy compound, or a brominated phenol novolac-type epoxy compound.

所謂上述二聚物酸改質環氧化合物,係經二聚物酸改質之環氧化合物,即,二聚物酸結構中至少一個羧基已與多官能環氧化合物反應之物。在此,所謂二聚物酸,係不飽和脂肪酸之二聚物。原料之不飽和脂肪酸並無特殊限制,例如可使用以油酸或亞麻油酸等碳數18之不飽和脂肪酸作為主成分之源自植物之油脂。二聚物酸之結構可為環狀、非環狀中任一者。The above-mentioned dimer acid-modified epoxy compound refers to an epoxy compound modified by a dimer acid, that is, at least one carboxyl group in the dimer acid structure has reacted with a multifunctional epoxy compound. Here, the so-called dimer acid refers to a dimer of unsaturated fatty acid. The unsaturated fatty acid of the raw material is not particularly limited. For example, plant-derived oils and fats containing unsaturated fatty acids with 18 carbon atoms such as oleic acid or linoleic acid as the main component can be used. The structure of the dimer acid may be either cyclic or acyclic.

進行二聚物酸改質之環氧化合物並無特殊限制,可舉例如就上述環氧化合物所例示的環氧化合物等。上述二聚物酸改質環氧化合物中所含環氧化合物可以僅使用一種,亦可使用二種以上。例如,可使用將雙酚型、醚酯型、酚醛清漆環氧型、酯型、脂肪族型、芳香族型等各種環氧化合物以二聚物酸改質之公知二聚物酸改質環氧化合物。The epoxy compound used for acid-modifying the dimer is not particularly limited, and examples thereof include the epoxy compounds exemplified for the above-mentioned epoxy compounds. Only one type of epoxy compound contained in the above-mentioned dimer acid-modified epoxy compound may be used, or two or more types of epoxy compounds may be used. For example, a known dimer acid-modified ring modified with a dimer acid can be used to modify various epoxy compounds such as bisphenol type, ether ester type, novolak epoxy type, ester type, aliphatic type, aromatic type, etc. oxygen compounds.

上述環氧丙基胺型環氧化合物可舉例如:四環氧丙基二胺基二苯甲烷、N,N-雙(2,3-環氧基丙基)-4-(2,3-環氧基丙氧基)苯胺等胺基酚型環氧化合物等。Examples of the above-mentioned epoxypropylamine type epoxy compound include: tetraepoxypropyldiaminodiphenylmethane, N,N-bis(2,3-epoxypropyl)-4-(2,3- Aminophenol type epoxy compounds such as epoxypropoxy)aniline and so on.

上述環氧丙基醚型環氧化合物可舉例如:參(環氧丙氧基苯基)甲烷、肆(環氧丙氧基苯基)乙烷、環氧丙基烷基醚等。Examples of the above-mentioned glycidyl ether type epoxy compound include: (glycidoxyphenyl)methane, glycidoxyphenyl)ethane, glycidyl alkyl ether, and the like.

上述橡膠改質環氧樹脂係於環氧樹脂中包含橡膠成分。上述橡膠成分可舉例如:丁二烯橡膠、丙烯酸橡膠、聚矽氧橡膠、丁基橡膠、異戊二烯橡膠、苯乙烯橡膠、氯丁二烯橡膠、NBR、SBR、IR、EPR等。上述橡膠成分可以僅使用一種,亦可使用二種以上。The above-mentioned rubber-modified epoxy resin contains a rubber component in the epoxy resin. Examples of the rubber component include butadiene rubber, acrylic rubber, silicone rubber, butyl rubber, isoprene rubber, styrene rubber, chloroprene rubber, NBR, SBR, IR, EPR, and the like. Only one type of the above-mentioned rubber component may be used, or two or more types may be used.

(金屬粒子) 本發明之導電性糊在金屬粒子方面包含:高熔點金屬粒子(B1),其含有銀及/或銅且熔點800℃以上;低熔點金屬粒子(B2),其為熔點130℃~150℃之合金;以及,低熔點金屬粒子(B3),其為選自於由錫、銀、銅、鉍及銦所構成群組中之2種以上之合金,且熔點200℃~240℃。 (metal particles) The conductive paste of the present invention contains metal particles: high-melting-point metal particles (B1), which contain silver and/or copper and have a melting point of 800°C or above; low-melting-point metal particles (B2), which have a melting point of 130°C to 150°C. Alloy; and low melting point metal particles (B3), which are two or more alloys selected from the group consisting of tin, silver, copper, bismuth and indium, and have a melting point of 200°C to 240°C.

<高熔點金屬粒子(B1)> 上述高熔點金屬粒子(B1)為包含銅(熔點:1083℃)及/或銀(熔點:961℃)之金屬粒子。本發明之導電性糊可藉由組合上述高熔點金屬粒子(B1)與上述低熔點金屬粒子(B2)而發揮充分之導電性。又,上述高熔點金屬粒子(B1)亦可含有銅及銀以外的金屬,例如可列舉以下諸等:金(熔點:1064℃)、鎳(熔點:1455℃)、鋅(熔點:420℃)、或包含該等中之一種以上之合金且為熔點800℃以上者。又,上述高熔點金屬粒子(B1)可以僅使用一種,亦可使用二種以上。 <High melting point metal particles (B1)> The high melting point metal particles (B1) are metal particles containing copper (melting point: 1083°C) and/or silver (melting point: 961°C). The conductive paste of the present invention can exhibit sufficient conductivity by combining the high-melting-point metal particles (B1) and the low-melting-point metal particles (B2). In addition, the above-mentioned high-melting-point metal particles (B1) may contain metals other than copper and silver. Examples include the following: gold (melting point: 1064°C), nickel (melting point: 1455°C), zinc (melting point: 420°C) , or those containing one or more of these alloys and having a melting point of 800°C or above. In addition, only one type of the above-mentioned high melting point metal particles (B1) may be used, or two or more types may be used.

又,上述高熔點金屬粒子(B1)亦可為金屬包金屬粒子,例如可列舉:銀包銅粒子、金包銅粒子、銀包鎳粒子或銀包合金粒子等。上述銀包合金粒子可舉例如:含銅之合金(例如由銅、鎳及鋅之合金構成的銅合金)被銀包覆之銀包銅合金粒子等。Furthermore, the high melting point metal particles (B1) may be metal-coated metal particles, and examples include silver-coated copper particles, gold-coated copper particles, silver-coated nickel particles, or silver-coated alloy particles. Examples of the silver-coated alloy particles include silver-coated copper alloy particles in which a copper-containing alloy (for example, a copper alloy composed of an alloy of copper, nickel, and zinc) is coated with silver.

上述高熔點金屬粒子(B1)之熔點為800℃以上,且宜為900℃以上,較佳為1000℃以上。藉由上述高熔點金屬粒子(B1)之熔點為800℃以上,於金屬粒子中可大量含有高導電性之金屬,作成硬化物時之導電性更趨優異。又,上述高熔點金屬粒子(B1)之熔點宜為1300℃以下,較佳為1200℃以下。藉由上述高熔點金屬粒子(B1)之熔點為1300℃以下,將上述導電性糊作成硬化物時則更趨容易合金化。The melting point of the high-melting-point metal particles (B1) is 800°C or higher, preferably 900°C or higher, and preferably 1000°C or higher. Since the melting point of the high-melting-point metal particles (B1) is 800° C. or higher, a large amount of highly conductive metal can be contained in the metal particles, and the conductivity of the cured product becomes even more excellent. Furthermore, the melting point of the high-melting-point metal particles (B1) is preferably 1300°C or lower, more preferably 1200°C or lower. Since the melting point of the high-melting-point metal particles (B1) is 1300° C. or lower, alloying becomes easier when the conductive paste is made into a hardened product.

上述高熔點金屬粒子(B1)之含量宜相對於上述液狀環氧化合物100質量份為400質量份~1800質量份,較佳為500質量份~1500質量份,更佳為600質量份~1400質量份,尤宜為700質量份~1300質量份。藉由相對於上述液狀環氧化合物100質量份而含有400質量份以上之上述高熔點金屬粒子(B1),在作成硬化物時容易降低比電阻,並發揮充分之導電性。又,藉由上述高熔點金屬粒子(B1)之含量為1800質量份以下,可使埋孔性優異,並抑制作成硬化物時裂痕產生而提升長期可靠性。The content of the above-mentioned high melting point metal particles (B1) is preferably 400 to 1800 parts by mass, preferably 500 to 1500 parts by mass, and more preferably 600 to 1400 parts by mass relative to 100 parts by mass of the liquid epoxy compound. Parts by mass, especially 700 parts by mass to 1300 parts by mass. By containing 400 parts by mass or more of the high-melting-point metal particles (B1) with respect to 100 parts by mass of the liquid epoxy compound, the specific resistance can be easily reduced and sufficient electrical conductivity can be exerted when forming a hardened product. In addition, when the content of the high-melting-point metal particles (B1) is 1800 parts by mass or less, it is possible to achieve excellent hole burial properties, suppress the occurrence of cracks when forming a hardened product, and improve long-term reliability.

<低熔點金屬粒子(B2)> 上述低熔點金屬粒子(B2)為熔點130℃~150℃之合金之金屬粒子。本發明之導電性糊可藉由組合上述高熔點金屬粒子(B1)與上述低熔點金屬粒子(B2)而發揮充分之導電性。上述低熔點金屬粒子(B2)可以僅使用一種,亦可使用二種以上。 <Low melting point metal particles (B2)> The above-mentioned low melting point metal particles (B2) are metal particles of an alloy with a melting point of 130°C to 150°C. The conductive paste of the present invention can exhibit sufficient conductivity by combining the high-melting-point metal particles (B1) and the low-melting-point metal particles (B2). Only one type of low melting point metal particles (B2) may be used, or two or more types may be used.

上述低熔點金屬粒子(B2)宜為含有錫(熔點:232℃)及鉍(熔點:271℃)之合金,除了錫及鉍外,其他金屬只要是熔點能成為130℃~150℃則亦可含有。又,上述低熔點金屬粒子(B2)中錫:鉍之質量比率宜為80:20~40:60。藉由錫:鉍為上述質量比率,便容易使上述熔點金屬粒子(B2)之熔點在130℃~150℃之範圍內。The above-mentioned low melting point metal particles (B2) are preferably an alloy containing tin (melting point: 232°C) and bismuth (melting point: 271°C). In addition to tin and bismuth, other metals are also acceptable as long as their melting points can be 130°C to 150°C. contain. Furthermore, the mass ratio of tin:bismuth in the low-melting-point metal particles (B2) is preferably 80:20 to 40:60. By having the above mass ratio of tin:bismuth, it is easy to make the melting point of the above melting point metal particles (B2) within the range of 130°C to 150°C.

上述低熔點金屬粒子(B2)之熔點為130℃~150℃,且宜為135℃~145℃。藉由熔點在上述範圍內,便容易在上述導電性糊之硬化反應時進行金屬化。The melting point of the low-melting-point metal particles (B2) is 130°C to 150°C, and preferably 135°C to 145°C. When the melting point is within the above range, metallization can be easily performed during the hardening reaction of the conductive paste.

上述低熔點金屬粒子(B2)之含量宜相對於上述液狀環氧化合物100質量份為300質量份~2400質量份,較佳為400質量份~2300質量份,更佳為500質量份~2200質量份,尤宜為600質量份~2000質量份。藉由上述低熔點金屬粒子(B2)之含量相對於上述液狀環氧化合物100質量份為300質量份以上,在作成硬化物時可發揮充分之導電性。又,藉由上述低熔點金屬粒子(B2)之含量為2400質量份以下,可使埋孔性優異,並抑制作成硬化物時裂痕產生而提升長期可靠性。The content of the above-mentioned low melting point metal particles (B2) is preferably 300 to 2400 parts by mass, preferably 400 to 2300 parts by mass, and more preferably 500 to 2200 parts by mass relative to 100 parts by mass of the liquid epoxy compound. Parts by mass, especially 600 parts by mass to 2000 parts by mass. When the content of the low-melting-point metal particles (B2) is 300 parts by mass or more relative to 100 parts by mass of the liquid epoxy compound, sufficient electrical conductivity can be exerted when the cured product is formed. In addition, when the content of the low-melting-point metal particles (B2) is 2,400 parts by mass or less, it is possible to achieve excellent hole-burying properties, suppress the occurrence of cracks when forming a hardened product, and improve long-term reliability.

<低熔點金屬粒子(B3)> 上述低熔點金屬粒子(B3)為選自於由錫、銀、銅、鉍及銦所構成群組中之2種以上之合金,且熔點為200℃~240℃。本發明之導電性糊可藉由含有上述低熔點金屬粒子(B3)而提升導電性糊之長期可靠性。上述低熔點金屬粒子(B3)可以僅使用一種,亦可使用二種以上。 <Low melting point metal particles (B3)> The above-mentioned low melting point metal particles (B3) are two or more alloys selected from the group consisting of tin, silver, copper, bismuth and indium, and have a melting point of 200°C to 240°C. The conductive paste of the present invention can improve the long-term reliability of the conductive paste by containing the above-mentioned low melting point metal particles (B3). Only one type of low melting point metal particles (B3) may be used, or two or more types may be used.

上述低熔點金屬粒子(B3)宜為以錫作為主成分之合金。又,只要熔點在200℃~240℃之範圍內,便可含有上述金屬以外的金屬。上述合金之總量(100質量%)中,錫之含有比例宜為80質量%以上,較佳為85質量%以上,尤宜為90質量%以上。上述低熔點金屬粒子(B3)藉由含有錫作為主成分而容易使熔點為200℃~240℃。The low melting point metal particles (B3) are preferably an alloy containing tin as a main component. In addition, as long as the melting point is within the range of 200°C to 240°C, metals other than the above-mentioned metals may be included. In the total amount of the above-mentioned alloy (100% by mass), the content ratio of tin is preferably 80% by mass or more, preferably 85% by mass or more, and particularly preferably 90% by mass or more. Since the low-melting-point metal particles (B3) contain tin as a main component, the melting point can be easily adjusted to 200°C to 240°C.

上述低熔點金屬粒子(B3)之熔點為200℃~240℃,且宜為205℃~235℃。藉由上述低熔點金屬粒子(B3)之熔點在上述範圍內,就容易提升長期可靠性。The melting point of the above-mentioned low-melting-point metal particles (B3) is 200°C to 240°C, and preferably 205°C to 235°C. When the melting point of the low-melting-point metal particles (B3) is within the above range, long-term reliability can be easily improved.

上述低熔點金屬粒子(B3)之含量宜相對於液狀環氧化合物100質量份為40質量份~700質量份,較佳為50質量份~600質量份,尤宜為60質量份~500質量份。藉由上述低熔點金屬粒子(B3)之含量相對於上述液狀環氧化合物100質量份為40質量份以上,作成硬化物時可提升長期連接可靠性。又,藉由上述低熔點金屬粒子(B3)之含量為700質量份以下,可發揮適度之填充性。The content of the above-mentioned low melting point metal particles (B3) is preferably 40 to 700 parts by mass, preferably 50 to 600 parts by mass, and especially 60 to 500 parts by mass relative to 100 parts by mass of the liquid epoxy compound. share. When the content of the low-melting-point metal particles (B3) is 40 parts by mass or more relative to 100 parts by mass of the liquid epoxy compound, long-term connection reliability can be improved when a hardened product is formed. In addition, when the content of the low-melting-point metal particles (B3) is 700 parts by mass or less, appropriate filling properties can be exerted.

又,本發明之導電性糊亦可含有上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)以外的金屬粒子。Furthermore, the conductive paste of the present invention may contain metal particles other than the above-described high-melting-point metal particles (B1), the above-described low-melting-point metal particles (B2), and the above-described low-melting point metal particles (B3).

從令本發明之導電性糊發揮導電性與長期可靠性之觀點來看,上述導電性糊中所含上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)之合計量宜為金屬粒子總量(100質量%)中之90質量%以上,較佳為95質量%以上,尤宜為99質量%以上。From the viewpoint of making the conductive paste of the present invention exhibit conductivity and long-term reliability, the above-mentioned high melting point metal particles (B1), the above-mentioned low melting point metal particles (B2), and the above-mentioned low melting point metal particles contained in the above-mentioned conductive paste The total amount of (B3) is preferably 90 mass% or more of the total amount of metal particles (100 mass%), preferably 95 mass% or more, especially 99 mass% or more.

上述金屬粒子之形狀可列舉:球狀、小片狀(鱗片狀)、樹枝狀、纖維狀、無定形(多面體)等。上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)之粒子形狀可各自不同亦可相同。其中,從導電性糊之埋孔性、填充性、塗佈穩定性更高且導電性更優異之觀點來看,又以球狀為佳。又,關於上述金屬粒子之平均粒徑(D50),上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)各自宜為0.5μm~30μm,較佳為1μm~10μm。The shapes of the above-mentioned metal particles include: spherical, flake-like (scale-like), dendritic, fibrous, amorphous (polyhedral), etc. The particle shapes of the high melting point metal particles (B1), the low melting point metal particles (B2), and the low melting point metal particles (B3) may be different or the same. Among them, the spherical shape is more preferable from the viewpoint of higher hole-burying properties, filling properties, higher coating stability, and better conductivity of the conductive paste. Moreover, regarding the average particle diameter (D50) of the above-mentioned metal particles, the above-mentioned high-melting-point metal particles (B1), the above-mentioned low-melting-point metal particles (B2), and the above-mentioned low-melting point metal particles (B3) are each preferably 0.5 μm to 30 μm, preferably It is 1μm~10μm.

使用於本發明之導電性糊的金屬粒子之合計量相對於上述液狀環氧化合物100質量份為1700質量份~3300質量份,且宜為1800質量份~3200質量份,較佳為1900質量份~3000質量份。藉由上述金屬粒子之含量相對於上述液狀環氧化合物100質量份為1700質量份以上,作成硬化物時可減低比電阻而提升導電性。又,藉由上述金屬粒子之含量為3300質量份以下,可提升填充性並提升長期可靠性。The total amount of metal particles used in the conductive paste of the present invention is 1700 to 3300 parts by mass, preferably 1800 to 3200 parts by mass, and preferably 1900 parts by mass based on 100 parts by mass of the liquid epoxy compound. parts ~3000 parts by mass. When the content of the metal particles is 1700 parts by mass or more relative to 100 parts by mass of the liquid epoxy compound, the specific resistance can be reduced and the conductivity can be improved when the cured product is formed. In addition, when the content of the above-mentioned metal particles is 3300 parts by mass or less, filling properties and long-term reliability can be improved.

又,上述低熔點金屬粒子(B2)與上述低熔點金屬粒子(B3)之質量比率宜為(B2)/(B3)=0.9~40,較佳為1.3~35。藉由上述低熔點金屬粒子(B2)與上述低熔點金屬粒子(B3)之質量比率為0.9以上,上述導電性糊在作成硬化物時比電阻會減低而導電性優異,並且愈加可兼顧長期可靠性。又,藉由上述低熔點金屬粒子(B2)與上述低熔點金屬粒子(B3)之質量比率為40以下,作成硬化物時將具有充分之回流耐性及熱循環耐性,長期可靠性更趨優異。In addition, the mass ratio of the above-mentioned low-melting-point metal particles (B2) and the above-mentioned low-melting-point metal particles (B3) is preferably (B2)/(B3)=0.9~40, preferably 1.3~35. When the mass ratio of the low-melting-point metal particles (B2) to the low-melting-point metal particles (B3) is 0.9 or more, the specific resistance of the conductive paste when it is made into a hardened product is reduced, the conductivity is excellent, and the long-term reliability is improved. sex. In addition, when the mass ratio of the low-melting-point metal particles (B2) to the low-melting-point metal particles (B3) is 40 or less, the cured product will have sufficient reflow resistance and thermal cycle resistance, and will have excellent long-term reliability.

(硬化劑) 上述硬化劑宜為令本發明之導電性糊中所含液狀環氧化合物硬化之物。因此,上述硬化劑宜具有與環氧基具反應性之官能基。上述硬化劑可以僅使用一種,亦可使用二種以上。 (hardener) The above-mentioned hardening agent is preferably one that hardens the liquid epoxy compound contained in the conductive paste of the present invention. Therefore, the above-mentioned hardener preferably has a functional group reactive with the epoxy group. Only one type of the above-mentioned hardener may be used, or two or more types may be used.

上述硬化劑可舉例如:異氰酸酯系硬化劑、苯酚系硬化劑、萘酚系硬化劑、咪唑系硬化劑及胺系硬化劑等。又,從與環氧化合物之反應性之觀點來看,上述硬化劑宜為含羥基之芳香族化合物。上述含羥基之芳香族化合物例如宜為苯酚系硬化劑及萘酚系硬化劑等。Examples of the curing agent include isocyanate curing agents, phenol curing agents, naphthol curing agents, imidazole curing agents, and amine curing agents. Furthermore, from the viewpoint of reactivity with an epoxy compound, the hardener is preferably a hydroxyl-containing aromatic compound. The above-mentioned hydroxyl-containing aromatic compound is preferably a phenol-based hardener, a naphthol-based hardener, or the like.

上述苯酚系硬化劑可舉例如:具有酚醛清漆結構之苯酚系硬化劑、含氮苯酚系硬化劑及含三𠯤骨架之苯酚系硬化劑等。Examples of the above-mentioned phenol-based hardener include phenol-based hardeners having a novolak structure, nitrogen-containing phenol-based hardeners, and phenol-based hardeners containing a trisulfide skeleton.

上述萘酚系硬化劑可舉例如:具有酚醛清漆結構之萘酚系硬化劑、含氮萘酚系硬化劑及含三𠯤骨架之萘酚系硬化劑等。Examples of the naphthol-based hardener include naphthol-based hardeners having a novolak structure, nitrogen-containing naphthol-based hardeners, and naphthol-based hardeners containing a triskeleton skeleton.

上述硬化劑之含量相對於上述液狀環氧化合物100質量份為1質量份~30質量份,且宜為2質量份~27質量份,較佳為3~25質量份。若上述含量為1質量份以上,上述導電性糊中之硬化性化合物將會充分硬化而長期可靠性更趨優異。若上述含量為30質量份以下,作成硬化物時硬化劑不會阻礙導通而導電性更趨良好。The content of the above-mentioned hardener is 1-30 parts by mass relative to 100 parts by mass of the above-mentioned liquid epoxy compound, and is preferably 2-27 parts by mass, preferably 3-25 parts by mass. If the content is 1 part by mass or more, the curable compound in the conductive paste will be sufficiently hardened to achieve better long-term reliability. If the content is 30 parts by mass or less, the curing agent will not hinder conduction when forming a cured product, and the conductivity will be better.

(助熔劑) 上述助熔劑具有促進上述金屬粒子金屬化之作用。上述助熔劑可舉例如多元羧酸化合物或其以外的化合物。上述助熔劑可以僅使用一種,亦可使用二種以上。 (flux) The above-mentioned flux has the effect of promoting the metallization of the above-mentioned metal particles. Examples of the flux include polycarboxylic acid compounds and compounds other than these. Only one type of flux may be used, or two or more types may be used.

作為上述多元羧酸化合物,以二羧酸為例,可列舉:草酸、戊二酸、己二酸、琥珀酸、癸二酸、丙二酸、馬來酸、延胡索酸、酞酸、庚二酸、辛二酸、壬二酸、對酞酸、檸康酸、α-酮戊二酸、縮二羥乙酸(diglycolic acid)、硫基二乙酸(thiodiglycolic acid)、二硫二乙酸(dithiodiglycolic acid)、4-環己烯-1,2-二羧酸、十二烷二酸、二苯基醚-4,4’-二羧酸、吡啶-2,6-二羧酸、四氫羧酸、六氫羧酸、四氫酞酸、六氫酞酸等;三羧酸可舉例如:偏苯三甲酸、檸檬酸、異檸檬酸、丁烷-1,2,4-三羧酸、環己烷-1,2,4-三羧酸、苯-1,2,4-三羧酸、1,2,3-丙烷三羧酸等;四羧酸可舉例如:乙烯四甲酸(ethylenetetracarboxylic acid)、1,2,3,4-丁烷四羧酸、環丁烷-1,2,3,4-四羧酸、苯-1,2,4,5-四羧酸等。As the above-mentioned polycarboxylic acid compound, taking dicarboxylic acid as an example, examples include: oxalic acid, glutaric acid, adipic acid, succinic acid, sebacic acid, malonic acid, maleic acid, fumaric acid, phthalic acid, and pimelic acid. , suberic acid, azelaic acid, terephthalic acid, citraconic acid, α-ketoglutaric acid, diglycolic acid, thiodiglycolic acid, dithiodiglycolic acid , 4-cyclohexene-1,2-dicarboxylic acid, dodecanedioic acid, diphenyl ether-4,4'-dicarboxylic acid, pyridine-2,6-dicarboxylic acid, tetrahydrocarboxylic acid, Hexahydrocarboxylic acid, tetrahydrophthalic acid, hexahydrophthalic acid, etc.; examples of tricarboxylic acids include: trimellitic acid, citric acid, isocitric acid, butane-1,2,4-tricarboxylic acid, cyclohexane Alkane-1,2,4-tricarboxylic acid, benzene-1,2,4-tricarboxylic acid, 1,2,3-propanetricarboxylic acid, etc.; examples of tetracarboxylic acids include: ethylenetetracarboxylic acid , 1,2,3,4-butanetetracarboxylic acid, cyclobutane-1,2,3,4-tetracarboxylic acid, benzene-1,2,4,5-tetracarboxylic acid, etc.

上述其等以外的化合物可列舉:氯化鋅、乳酸、油酸、硬脂酸、麩胺酸、苯甲酸、麩胺酸鹽酸鹽、苯胺鹽酸鹽、溴化鯨蠟基吡啶、脲、三乙醇胺、丙三醇、肼及松香等。Examples of compounds other than the above include zinc chloride, lactic acid, oleic acid, stearic acid, glutamic acid, benzoic acid, glutamine hydrochloride, aniline hydrochloride, cetylpyridine bromide, urea, Triethanolamine, glycerol, hydrazine and rosin, etc.

上述助熔劑之含量相對於上述液狀環氧化合物100質量份為20質量份~200質量份,且宜為30質量份~180質量份,較佳為40質量份~160質量份。若上述助熔劑之含量為20質量份以上,作成硬化物時可充分促進上述金屬粒子金屬化。若上述含量為200質量份以下,作成硬化物時助熔劑不會妨礙導通而導電性更趨良好。The content of the above-mentioned flux is 20-200 parts by mass relative to 100 parts by mass of the above-mentioned liquid epoxy compound, and is preferably 30-180 parts by mass, preferably 40-160 parts by mass. If the content of the above-mentioned flux is 20 parts by mass or more, the metallization of the above-mentioned metal particles can be sufficiently promoted when forming a hardened product. If the content is 200 parts by mass or less, the flux will not interfere with electrical conduction when the cured product is formed, and the electrical conductivity will be better.

(其他成分) 本發明之導電性糊亦可在無損本發明效果之範圍內含有上述各成分以外的其他成分。上述其他成分可舉如公知或慣用之組成物中可含有之成分。上述其他成分可舉例如:上述液狀環氧化合物以外的其他黏結劑成分、溶劑、消泡劑、調平劑、增稠劑、黏著劑、填充劑、阻燃劑、著色劑等。上述其他成分可以僅使用一種,亦可使用二種以上。 (other ingredients) The conductive paste of the present invention may also contain other components than the above components within a range that does not impair the effects of the present invention. Examples of the above-mentioned other components include components that may be contained in known or customary compositions. Examples of the above-mentioned other components include other adhesive components other than the above-mentioned liquid epoxy compound, solvents, defoaming agents, leveling agents, thickeners, adhesives, fillers, flame retardants, colorants, and the like. Only one type of the above-mentioned other components may be used, or two or more types may be used.

上述其他黏結劑成分可舉如上述液狀環氧化合物以外的其他熱硬化性化合物。上述熱硬化性化合物可舉例如:於常溫下為固體的環氧化合物、丙烯酸酯化合物、酚系樹脂、胺甲酸乙酯系樹脂、三聚氰胺系樹脂、醇酸系樹脂等。另,所謂「於常溫下為固體」,意指於25℃下且在無溶劑狀態下未顯現流動性之狀態。上述其他黏結劑成分可以僅使用一種,亦可使用二種以上。Examples of the other adhesive components include thermosetting compounds other than the above-mentioned liquid epoxy compounds. Examples of the thermosetting compound include epoxy compounds, acrylate compounds, phenol resins, urethane resins, melamine resins, and alkyd resins that are solid at room temperature. In addition, the term "solid at normal temperature" means a state that does not exhibit fluidity at 25° C. in a solvent-free state. Only one type of the above-mentioned other binder components may be used, or two or more types may be used.

本發明之導電性糊可含有上述其他黏結劑成分,亦可不含有。又,當含有上述其他黏結劑成分時,從降低導電性糊之黏度並提升處理性之觀點來看,其含量宜相對於上述液狀環氧化合物100質量份為50質量份以下,較佳為30質量份以下,尤宜為10質量份以下。The conductive paste of the present invention may or may not contain the other binder components mentioned above. In addition, when the above-mentioned other adhesive components are contained, from the viewpoint of reducing the viscosity of the conductive paste and improving the handleability, the content is preferably 50 parts by mass or less based on 100 parts by mass of the above-mentioned liquid epoxy compound, preferably 30 parts by mass or less, preferably 10 parts by mass or less.

上述溶劑可舉以下公知或慣用之有機溶劑為例:甲基乙基酮、丙酮、苯乙酮等酮;甲賽璐蘇、甲卡必醇、二乙二醇二甲基醚、四氫呋喃等醚;乙酸甲賽璐蘇、乙酸丁酯、乙酸甲酯等酯等。Examples of the above-mentioned solvents include the following well-known or commonly used organic solvents: ketones such as methyl ethyl ketone, acetone, and acetophenone; ethers such as methylcellulose, methylcarbitol, diethylene glycol dimethyl ether, and tetrahydrofuran. ; Methylcellulose acetate, butyl acetate, methyl acetate and other esters.

本發明之導電性糊中溶劑之含有比例並無特殊限制,宜相對於本發明之導電性糊之總量100質量%為10質量%以下,較佳為5質量%以下。The content ratio of the solvent in the conductive paste of the present invention is not particularly limited, but it is preferably 10 mass % or less, preferably 5 mass % or less, based on 100 mass % of the total amount of the conductive paste of the present invention.

本發明之導電性糊利用BH型黏度計轉子No.7(旋轉速度:10rpm)測定之25℃下的黏度宜為300dPa.s~2500dPa.s,較佳為500dPa.s~2000dPa.s。若上述黏度在上述範圍內,則填充性更趨優異。The viscosity of the conductive paste of the present invention measured at 25°C using BH type viscometer spindle No. 7 (rotation speed: 10 rpm) is preferably 300 dPa. s~2500dPa. s, preferably 500dPa. s~2000dPa. s. If the viscosity is within the above range, the filling property will be more excellent.

本發明之導電性糊可作為半導體封裝體之通孔或貫穿孔等的孔填充用途。尤其是從導電性及長期可靠性優異之觀點來看,可作為多層基板之孔填充用途。The conductive paste of the present invention can be used for filling holes such as through-holes or through-holes in semiconductor packages. Especially from the viewpoint of excellent electrical conductivity and long-term reliability, it can be used as hole filling in multilayer substrates.

將本發明之導電性糊用於多層基板之貫穿孔填充時,藉由熱硬化,液狀環氧化合物等熱硬化性化合物會硬化,同時,包含上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)之金屬粒子會熔解而金屬化,且上述金屬粒子會與設置於貫穿孔上端部與下端部之導電層之接觸部一體化。在此情形下,相較於上述金屬粒子與上述導電層只是單純接觸之情形,可獲得更高之導電性,而且導電性糊與導電層之接合可靠性明顯提升。又,上述導電性糊與多層基板之絕緣層之接著性亦優異,因此可製得具有高長期可靠性之多層基板。When the conductive paste of the present invention is used to fill through-holes in a multilayer substrate, thermosetting compounds such as liquid epoxy compounds are cured by thermal hardening, and at the same time, the above-mentioned high-melting-point metal particles (B1) and the above-mentioned low-melting point metal particles are hardened. The metal particles (B2) and the low-melting-point metal particles (B3) are melted and metallized, and the metal particles are integrated with the contact portions of the conductive layers provided at the upper and lower ends of the through holes. In this case, compared with the case where the metal particles and the conductive layer are simply in contact, higher conductivity can be obtained, and the bonding reliability between the conductive paste and the conductive layer is significantly improved. In addition, the above-mentioned conductive paste also has excellent adhesion to the insulating layer of the multilayer substrate, so that a multilayer substrate with high long-term reliability can be produced.

[導電性糊之製造方法] 本發明之導電性糊並無特殊限制,可利用公知或慣用之方法來製造。例如,可將上述各成分混合,並利用三輥研磨機、行星式攪拌裝置、行星式混合機、均質機、槳式混合機等進行攪拌來製造。 [Method for manufacturing conductive paste] The conductive paste of the present invention is not particularly limited and can be produced by known or customary methods. For example, the above-mentioned components can be mixed and stirred using a three-roller mill, a planetary stirring device, a planetary mixer, a homogenizer, a paddle mixer, or the like, and can be produced.

[多層基板] 本發明之多層基板宜為以下多層基板:由複數層導電層與介於上述複數層導電層間之絕緣層所構成,且貫通上述絕緣層的孔被導電性糊硬化物填充,透過上述導電性糊硬化物,接在上述絕緣層兩面的導電層彼此相互導通。 [Multilayer substrate] The multilayer substrate of the present invention is preferably a multilayer substrate composed of a plurality of conductive layers and an insulating layer between the plurality of conductive layers, and the holes penetrating the insulating layer are filled with a conductive paste cured material, and the conductive paste passes through the conductive paste. In the hardened material, the conductive layers connected to both sides of the above-mentioned insulating layer are electrically connected to each other.

上述導電層只要是能發揮導電性之物即無特殊限制,可舉例如:金、銀、銅、鈀、鎳、鋁或包含該等中之一種以上金屬之合金等。又,上述導電層可為單層,亦可為同種或不同種之積層體。The conductive layer is not particularly limited as long as it can exhibit conductivity. Examples include gold, silver, copper, palladium, nickel, aluminum, or alloys containing one or more of these metals. In addition, the conductive layer may be a single layer or a laminate of the same type or different types.

上述導電層之厚度宜為5nm~10μm。另,當導電層為複層構造時,上述導電層之厚度為所有層厚度之合計。The thickness of the above-mentioned conductive layer is preferably 5nm~10μm. In addition, when the conductive layer has a multi-layer structure, the thickness of the conductive layer is the total thickness of all layers.

上述絕緣層只要是能發揮絕緣性之物即無特殊限制,可舉例如:塑膠基材(尤其是塑膠膜)、玻璃板等。上述絕緣層可為單層,亦可為同種或不同種之積層體。The above-mentioned insulating layer is not particularly limited as long as it can exert insulating properties. Examples include: plastic substrate (especially plastic film), glass plate, etc. The above-mentioned insulating layer may be a single layer or a laminate of the same type or different types.

上述絕緣層之厚度宜為1μm~1000μm。另,當絕緣層為複層構造時,上述絕緣層之厚度為所有層厚度之合計。The thickness of the above-mentioned insulating layer is preferably 1 μm ~ 1000 μm. In addition, when the insulating layer has a multi-layer structure, the thickness of the above-mentioned insulating layer is the total thickness of all layers.

上述多層基板宜為上述絕緣層之兩面形成有上述導電層之結構積層有2層以上者,較佳為積層有2層~10層者。The above-mentioned multi-layer substrate is preferably a structure in which the above-mentioned conductive layer is formed on both sides of the above-mentioned insulating layer, and has a structure of laminated with more than 2 layers, and preferably has a laminated structure with 2 to 10 layers.

又,使用於上述多層基板的上述導電性糊硬化物中,上述高熔點金屬粒子(B1)、上述低熔點金屬粒子(B2)及上述低熔點金屬粒子(B3)宜熔解而相互一體化並合金化。另,上述合金化意指當用於多層基板之孔填充時,進行鄰接的金屬粒子彼此相連而一體化的金屬化,同時金屬粒子還與在孔上端部及下端部接觸之導電層相連而一體化。Furthermore, in the above-mentioned conductive paste cured material used in the above-mentioned multilayer substrate, it is preferable that the above-mentioned high-melting-point metal particles (B1), the above-mentioned low-melting-point metal particles (B2), and the above-mentioned low-melting point metal particles (B3) are melted and integrated with each other and alloyed. change. In addition, the above-mentioned alloying means that when used for filling holes in a multilayer substrate, adjacent metal particles are connected and integrated with each other, and at the same time, the metal particles are also connected and integrated with the conductive layer in contact with the upper end and lower end of the hole. change.

[多層基板之製造方法] 圖1為顯示多層基板製造例之示意截面圖,該多層基板使用了本發明之導電性糊。於圖1中,符號1表示絕緣層,符號2表示填充於絕緣層1之貫穿孔中的導電性糊,符號3表示導電層,符號2’表示導電性糊2之硬化物,符號3’表示經圖案化之導電層。另,本圖是顯示在未對基板之貫穿孔施以貫穿孔鍍敷之情形下,填充物直接接觸貫穿孔內壁的例子。 [Manufacturing method of multilayer substrate] FIG. 1 is a schematic cross-sectional view showing an example of manufacturing a multilayer substrate using the conductive paste of the present invention. In FIG. 1, symbol 1 represents an insulating layer, symbol 2 represents a conductive paste filled in the through holes of the insulating layer 1, symbol 3 represents a conductive layer, symbol 2' represents a hardened product of the conductive paste 2, and symbol 3' represents Patterned conductive layer. In addition, this figure shows an example in which the filler directly contacts the inner wall of the through hole when the through hole of the substrate is not plated.

為了製得本發明之多層基板,例如,如圖1(a)所示,利用鑽機或雷射在已預先加熱之絕緣層1形成貫穿孔後,將導電性糊2填充於貫穿孔內,且如(b)所示,於該絕緣層1之上下兩面配置導電層3進行壓製而一體化,並於預定條件下加熱。藉由該加熱使液狀環氧化合物硬化並且使金屬粒子熔解,藉此,會進行鄰接的金屬粒子彼此相連的金屬化,同時導電層之端面與金屬粒子牢固接合。硬化後,例如如(c)所示,可以視需要於導電層進行圖案化。In order to prepare the multilayer substrate of the present invention, for example, as shown in FIG. 1(a) , a drill or a laser is used to form a through hole in the preheated insulating layer 1 , and then the conductive paste 2 is filled into the through hole, and As shown in (b), conductive layers 3 are arranged on the upper and lower sides of the insulating layer 1, pressed and integrated, and heated under predetermined conditions. This heating hardens the liquid epoxy compound and melts the metal particles, thereby metallizing the adjacent metal particles to connect each other, and at the same time, the end surfaces of the conductive layer and the metal particles are firmly bonded. After hardening, for example, as shown in (c), the conductive layer can be patterned if necessary.

導電性糊之加熱條件係選擇適合液狀環氧化合物硬化與金屬粒子金屬化兩者之條件,因此,具體條件會依照糊組成而不同,但大致標準是在約150℃~180℃之溫度範圍內加熱約30分~120分鐘左右即可。另,本圖中顯示導電層為2層、絕緣層為1層之情形,但若為3層以上導電層與2層以上絕緣層交互積層的多層基板也能依循上述來製造。The heating conditions for the conductive paste are those suitable for both the hardening of the liquid epoxy compound and the metallization of the metal particles. Therefore, the specific conditions will vary depending on the composition of the paste, but the general standard is a temperature range of about 150°C to 180°C. Reheat for about 30 to 120 minutes. In addition, this figure shows a case where there are two conductive layers and one insulating layer. However, a multilayer substrate in which three or more conductive layers and two or more insulating layers are alternately laminated can also be manufactured as described above.

實施例 以下,根據實施例,更詳細說明本發明一實施形態。 Example Hereinafter, one embodiment of the present invention will be described in more detail based on examples.

<製作導電性糊> 摻合表1、表2所記載之各成分進行混合,調製出實施例及比較例之各導電性糊(表中的數值表示質量份)。所用各成分之詳情如下。 <Preparation of conductive paste> Each component described in Table 1 and Table 2 was blended and mixed to prepare each conductive paste of an Example and a Comparative Example (the numerical values in the table represent parts by mass). Details of each ingredient used are as follows.

液狀環氧化合物:商品名「jER871」,三菱化學公司製 高熔點金屬粒子(B1)1:銀包銅粉(熔點990℃、平均粒徑3μm),同和電子(DOWA ELECTRONICS)公司製 高熔點金屬粒子(B1)2:銀粉(熔點961℃、平均粒徑3μm),同和電子(DOWA ELECTRONICS)公司製 高熔點金屬粒子(B1)3:銅粉(熔點1083℃、平均粒徑3μm),福田金屬粒子箔粉工業公司製 低熔點金屬粒子(B2):Sn-Bi合金金屬粒子(Sn:Bi=42:58、熔點138℃、平均粒徑6μm) 低熔點金屬粒子(B3):Sn96.5-Ag3.0-Cu0.5金屬粒子(Sn:Ag:Cu=96.5:3.0:0.5、熔點217℃、平均粒徑6μm) 硬化劑:苯酚系硬化劑,商品名「TAMANOL758」,荒川化學工業公司製 助熔劑:8-乙基十八烷二酸,岡村製油公司製 Liquid epoxy compound: Trade name "jER871", manufactured by Mitsubishi Chemical Corporation High melting point metal particles (B1) 1: Silver-coated copper powder (melting point 990°C, average particle diameter 3 μm), manufactured by DOWA ELECTRONICS High melting point metal particles (B1) 2: Silver powder (melting point 961°C, average particle diameter 3 μm), manufactured by DOWA ELECTRONICS High melting point metal particles (B1) 3: copper powder (melting point 1083°C, average particle diameter 3 μm), manufactured by Fukuda Metal Particle Foil Powder Industry Co., Ltd. Low melting point metal particles (B2): Sn-Bi alloy metal particles (Sn: Bi=42:58, melting point 138°C, average particle size 6 μm) Low melting point metal particles (B3): Sn96.5-Ag3.0-Cu0.5 metal particles (Sn:Ag:Cu=96.5:3.0:0.5, melting point 217°C, average particle size 6μm) Hardener: Phenol-based hardener, trade name "TAMANOL758", manufactured by Arakawa Chemical Industry Co., Ltd. Fluxing agent: 8-Ethyloctadecanedioic acid, manufactured by Okamura Oil Co., Ltd.

<製作評價用基板> 使用CO 2雷射,於厚度約100μm之絕緣層(松下電器(Panasonic)公司製,商品名「R-1551」)形成φ100μm之169孔連結圖案,並利用印刷法,將上述導電性糊填充於孔內後,使用真空壓製機,於以下壓力條件及溫度條件下進行壓製,藉此製作出評價用基板。 壓力:用17分鐘從0kg/cm 2升壓至表面壓力10.2kg/cm 2,並且於該狀態下保持10分鐘。接著,用24分鐘升壓至表面壓力30.6kg/cm 2,並且於該狀態下保持46分鐘後,用23分鐘減壓至0kg/cm 2。 溫度:用17分鐘從30℃升溫至130℃,並且於該狀態下保持10分鐘。接著,用24分鐘升溫至180℃,並且於該狀態下保持46分鐘後,用23分鐘冷卻至30℃。 <Preparation of evaluation substrate> Using a CO 2 laser, a 169-hole connection pattern of φ100 μm was formed on an insulating layer with a thickness of about 100 μm (manufactured by Panasonic, trade name "R-1551"), and printed using a printing method. After the above-mentioned conductive paste is filled in the holes, it is pressed using a vacuum press under the following pressure conditions and temperature conditions, thereby producing an evaluation substrate. Pressure: It takes 17 minutes to increase the pressure from 0kg/ cm2 to a surface pressure of 10.2kg/ cm2 , and maintain it in this state for 10 minutes. Next, the pressure was raised to a surface pressure of 30.6 kg/cm 2 over 24 minutes, and after maintaining this state for 46 minutes, the pressure was reduced to 0 kg/cm 2 over 23 minutes. Temperature: Raise the temperature from 30°C to 130°C in 17 minutes and maintain it in this state for 10 minutes. Next, the temperature was raised to 180°C over 24 minutes, maintained in this state for 46 minutes, and then cooled to 30°C over 23 minutes.

[評價] 使用上述導電性糊或上述評價用基板,實施各種物性值之評價。 [evaluation] Using the above-mentioned conductive paste or the above-mentioned evaluation substrate, various physical property values were evaluated.

(1)比電阻 使用金屬印版,將實施例及比較例所製得之上述導電性糊線性印刷(長度60mm、寬度1mm、厚度約100μm)於玻璃環氧基板上,於180℃下加熱60分鐘,藉此使其正式硬化,製作出已形成導電性圖案的評價用基板。接著,使用測試器,測定導電性圖案兩端間的電阻值,並利用下述式(1),從截面積(S,cm 2)與長度(L,cm)計算出比電阻。另,對3片玻璃環氧基板施以各5條線性印刷,形成合計15條導電性圖案,並求出該等之比電阻之平均值,按下述進行評價。 比電阻=(S/L)×R      (1) ○:比電阻小於5×10 -5Ω.cm ×:比電阻為5×10 -5Ω.cm以上 (1) Specific resistance Use a metal printing plate to linearly print the above-mentioned conductive paste prepared in the Examples and Comparative Examples (length 60 mm, width 1 mm, thickness approximately 100 μm) on a glass epoxy substrate, and heat it at 180°C for 60 minutes, thereby allowing it to be formally cured, and an evaluation substrate on which a conductive pattern was formed was produced. Next, a tester was used to measure the resistance value between both ends of the conductive pattern, and the specific resistance was calculated from the cross-sectional area (S, cm 2 ) and length (L, cm) using the following formula (1). In addition, five lines of linear printing were applied to three glass epoxy substrates each to form a total of 15 conductive patterns, and the average value of the specific resistances was calculated and evaluated as follows. Specific resistance = (S/L)×R (1) ○: Specific resistance is less than 5×10 -5 Ω. cm ×: Specific resistance is 5×10 -5 Ω. cm or more

(2)填充性 使用X射線穿透裝置(商品名「Y.Cheetah μHD」,依科視朗國際(Yxlon International)公司製),於以下測定條件下對上述評價用基板觀察通孔(Via)部分,評價出填充性。 <測定條件>電壓:50kV、電流:80μA、電力:4W ○:印刷性良好 ×:硬化時發生糊未填充、裂痕 (2) Filling property Using an X-ray penetrating device (trade name "Y.Cheetah μHD", manufactured by Yxlon International), the via portion of the above evaluation substrate was observed under the following measurement conditions, and the filling was evaluated. sex. <Measurement conditions> Voltage: 50kV, current: 80μA, power: 4W ○: Good printability ×: Unfilled paste or cracks occurred during hardening

(3)初始通孔(Via)電阻值 上述評價用基板之初始通孔電阻值之測定是測定上述連結圖案兩端間的電阻值,且將該電阻值除以各孔數,求出每一孔之電阻值並算出平均值,按下述進行評價。 ○:小於4.0mΩ/Via ×:4.0mΩ/Via以上 (3) Initial via (Via) resistance value The initial through-hole resistance value of the above-mentioned evaluation substrate is measured by measuring the resistance value between both ends of the above-mentioned connection pattern, and dividing the resistance value by the number of each hole, obtaining the resistance value of each hole and calculating the average value, press Evaluate as described. ○: Less than 4.0mΩ/Via ×: 4.0mΩ/Via or more

(4)長期可靠性1(回流耐性) 對上述評價用基板反覆進行5次260℃、10秒鐘之回流爐處理後測定其通孔電阻值,評價出以試驗前評價用基板為基準的通孔電阻值變化率。另,通孔電阻值之測定方法與上述初始通孔電阻值之測定方法相同。又,關於以下長期可靠性2~4方面,亦進行相同之評價。 ○:電阻值變化率為±10%以內之情形 ×:電阻值變化率大於±10%之情形 (4) Long-term reliability 1 (reflow resistance) The above-mentioned evaluation substrate was repeatedly subjected to a reflow oven treatment at 260°C for 10 seconds five times, and then the through-hole resistance value was measured, and the change rate of the through-hole resistance value was evaluated based on the evaluation substrate before the test. In addition, the measurement method of the through hole resistance value is the same as the measurement method of the initial through hole resistance value mentioned above. In addition, the following long-term reliability aspects 2 to 4 are also evaluated in the same way. ○: When the resistance value change rate is within ±10% ×: When the resistance value change rate is greater than ±10%

(5)長期可靠性2(熱循環耐性) 對上述評價用基板進行以-60℃處理30分鐘及以125℃處理30分鐘的熱循環試驗1000循環後,測定導電性糊之電阻值,並算出以試驗前評價用基板為基準的通孔電阻值變化率,按上述進行評價。 (5) Long-term reliability 2 (thermal cycle resistance) After the above-mentioned evaluation substrate was subjected to a thermal cycle test of -60°C for 30 minutes and 125°C for 30 minutes for 1,000 cycles, the resistance value of the conductive paste was measured, and the through-hole resistance was calculated based on the evaluation substrate before the test. The value change rate is evaluated as above.

(6)長期可靠性3(耐熱試驗) 測定上述評價用基板於100℃下靜置1000小時後的導電性糊之電阻值,並算出以試驗前評價用基板為基準的通孔電阻值變化率,按上述進行評價。 (6) Long-term reliability 3 (heat resistance test) The resistance value of the conductive paste was measured after the evaluation substrate was left standing at 100° C. for 1000 hours, and the change rate of the through-hole resistance value was calculated based on the evaluation substrate before the test, and the evaluation was performed as described above.

(7)長期可靠性4(耐濕試驗) 測定上述評價用基板於溫度85℃、濕度85%之環境下靜置1000小時後的導電性糊之電阻值,並算出以試驗前評價用基板為基準的通孔電阻值之變化率之變化率,按上述進行評價。 (7) Long-term reliability 4 (humidity resistance test) Measure the resistance value of the conductive paste after the above-mentioned evaluation substrate is left standing for 1000 hours in an environment with a temperature of 85°C and a humidity of 85%, and calculate the change rate of the through-hole resistance value based on the evaluation substrate before the test. , evaluate as above.

[表1] [Table 1]

[表2] [Table 2]

實施例1~7可確認導電性及長期可靠性優異。不含低熔點金屬粒子(B3)之比較例1,其長期可靠性不足。金屬粒子含量未達1700質量份之比較例3,則導電性、長期可靠性不足。金屬粒子含量大於3300質量份之比較例2及4則缺乏填充性與回流耐性,長期可靠性不足。又,硬化劑小於1質量份之比較例5有缺乏長期可靠性之結果,硬化劑大於30質量份之比較例6則是導電性不足。再者,助熔劑小於20質量份之比較例7為缺乏長期可靠性之結果,助熔劑大於200質量份之比較例8則是導電性不足。Examples 1 to 7 confirmed excellent conductivity and long-term reliability. Comparative Example 1, which does not contain low-melting-point metal particles (B3), has insufficient long-term reliability. Comparative Example 3 in which the metal particle content is less than 1,700 parts by mass has insufficient conductivity and long-term reliability. Comparative Examples 2 and 4 in which the metal particle content exceeds 3300 parts by mass lack filling properties and reflow resistance, resulting in insufficient long-term reliability. In addition, Comparative Example 5 in which the hardener is less than 1 part by mass has poor long-term reliability, and Comparative Example 6 in which the hardener is more than 30 parts by mass has insufficient electrical conductivity. Furthermore, Comparative Example 7 with a flux of less than 20 parts by mass is a result of lack of long-term reliability, and Comparative Example 8 with a flux of more than 200 parts by mass is a result of insufficient electrical conductivity.

1:絕緣層 2:導電性糊 2’:導電性糊之硬化物 3:導電層 3’:經圖案化之導電層 1: Insulation layer 2: Conductive paste 2’: Hardened material of conductive paste 3: Conductive layer 3’: Patterned conductive layer

圖1為顯示多層基板製造例之示意截面圖,該多層基板使用了本發明之導電性糊。FIG. 1 is a schematic cross-sectional view showing an example of manufacturing a multilayer substrate using the conductive paste of the present invention.

(無)(without)

Claims (6)

一種導電性糊,含有液狀環氧化合物、金屬粒子、硬化劑及助熔劑,並且,相對於液狀環氧化合物100質量份,金屬粒子為1700質量份~3300質量份,硬化劑為1質量份~30質量份,助熔劑為20質量份~200質量份; 前述金屬粒子包含: 高熔點金屬粒子(B1),其含有銀及/或銅且熔點800℃以上; 低熔點金屬粒子(B2),其為熔點130℃~150℃之合金;以及 低熔點金屬粒子(B3),其為選自於由錫、銀、銅、鉍及銦所構成群組中之2種以上之合金,且熔點200℃~240℃。 A conductive paste containing a liquid epoxy compound, metal particles, a hardener and a flux, and, relative to 100 parts by mass of the liquid epoxy compound, the metal particles are 1,700 to 3,300 parts by mass, and the hardener is 1 mass part ~30 parts by mass, flux is 20 parts by mass ~200 parts by mass; The aforementioned metal particles include: High melting point metal particles (B1), which contain silver and/or copper and have a melting point of 800°C or above; Low melting point metal particles (B2), which are alloys with a melting point of 130°C~150°C; and Low melting point metal particles (B3) are two or more alloys selected from the group consisting of tin, silver, copper, bismuth and indium, and have a melting point of 200°C to 240°C. 如請求項1之導電性糊,其中前述低熔點金屬粒子(B2)與前述低熔點金屬粒子(B3)之質量比率為(B2)/(B3)=0.9~40。Such as the conductive paste of claim 1, wherein the mass ratio of the aforementioned low melting point metal particles (B2) and the aforementioned low melting point metal particles (B3) is (B2)/(B3)=0.9~40. 如請求項1或2之導電性糊,其中前述硬化劑為含羥基之芳香族化合物。The conductive paste of claim 1 or 2, wherein the hardener is a hydroxyl-containing aromatic compound. 如請求項1至3中任一項之導電性糊,其中前述硬化劑為苯酚系硬化劑及/或萘酚系硬化劑。The conductive paste according to any one of claims 1 to 3, wherein the hardener is a phenol-based hardener and/or a naphthol-based hardener. 一種多層基板,係由複數層導電層與介於前述複數層導電層間之絕緣層所構成,且貫通前述絕緣層的孔被導電性糊硬化物填充,透過前述導電性糊硬化物,接在前述絕緣層兩面的導電層彼此相互導通;前述導電性糊硬化物為如請求項1至4中任一項之導電性糊之硬化物。A multilayer substrate is composed of a plurality of conductive layers and an insulating layer between the plurality of conductive layers, and the holes penetrating the insulating layer are filled with a conductive paste, and the conductive paste is connected through the conductive paste. The conductive layers on both sides of the insulating layer are electrically connected to each other; the aforementioned cured conductive paste is a cured product of the conductive paste according to any one of claims 1 to 4. 如請求項5之多層基板,其中於前述導電性糊硬化物中,前述高熔點金屬粒子(B1)、前述低熔點金屬粒子(B2)及前述低熔點金屬粒子(B3)已熔解而相互一體化並合金化。The multilayer substrate of claim 5, wherein in the conductive paste cured material, the high melting point metal particles (B1), the low melting point metal particles (B2) and the low melting point metal particles (B3) are melted and integrated with each other. and alloyed.
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