TW202314256A - Socket for inspection of IC package and method for producing same - Google Patents
Socket for inspection of IC package and method for producing same Download PDFInfo
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- TW202314256A TW202314256A TW111118222A TW111118222A TW202314256A TW 202314256 A TW202314256 A TW 202314256A TW 111118222 A TW111118222 A TW 111118222A TW 111118222 A TW111118222 A TW 111118222A TW 202314256 A TW202314256 A TW 202314256A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1007—Plug-in assemblages of components, e.g. IC sockets with means for increasing contact pressure at the end of engagement of coupling parts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/7076—Coupling devices for connection between PCB and component, e.g. display
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/91—Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Manufacturing Of Electrical Connectors (AREA)
Abstract
Description
本發明係關於一種IC(Integrated Circuit)封裝體之檢查用插座及其製造方法。The invention relates to a socket for inspection of an IC (Integrated Circuit) package and a manufacturing method thereof.
於SOP(Small Outline Package:小型封裝)或QFP(Quad Flat Package:四方扁平封裝)等IC封裝體中,有時除引線端子以外,於IC封裝體之背面還設有散熱用及/或接地用焊墊。於檢查此種IC封裝體時,有時期望設置熱連接或電性連接於IC封裝體之背面(例如焊墊)之連接器插腳(例如參照專利文獻1及2)。 [現有技術文獻] [專利文獻] In IC packages such as SOP (Small Outline Package) or QFP (Quad Flat Package: Quad Flat Package), there are sometimes heat dissipation and/or grounding on the back of the IC package in addition to the lead terminals. solder pads. When inspecting such IC packages, it is sometimes desirable to provide connector pins that are thermally or electrically connected to the backside of the IC package (eg, solder pads) (for example, refer to Patent Documents 1 and 2). [Prior art literature] [Patent Document]
[專利文獻1]日本特開2005-5130號公報 [專利文獻2]日本特開2005-166270號公報 [Patent Document 1] Japanese Unexamined Patent Publication No. 2005-5130 [Patent Document 2] Japanese Patent Laid-Open No. 2005-166270
[發明所欲解決之問題][Problem to be solved by the invention]
於連接於引線端子之訊號連接器插腳設於插座本體外周部之情形時,將IC封裝體之背面接觸用連接器插腳設於插座本體之態樣受到限制。於此種限制中,由於在插座本體設置IC封裝體之背面接觸用連接器插腳,因此可將該連接器插腳沿垂直方向插入並固定於插座本體。然而,若在相同垂直方向上對連接器插腳賦予負載,則連接器插腳容易位移,有導致安裝姿勢變化之虞。When the signal connector pins connected to the lead terminals are provided on the outer peripheral portion of the socket body, there are restrictions on providing the connector pins for contacting the back surface of the IC package on the socket body. In such a limitation, since the connector pins for contacting the back surface of the IC package are provided on the socket body, the connector pins can be inserted in the vertical direction and fixed to the socket body. However, when a load is applied to the connector pins in the same vertical direction, the connector pins are likely to be displaced, which may cause a change in the mounting posture.
進而,連接器插腳之上部接觸部於每次檢查IC封裝體時,存在與IC封裝體之底面接觸而受到向下之負載之情形。又,連接器插腳之下部接觸部存在以插座被構裝於構裝基板上之狀態自構裝基板受到向上之負載之情形。進而,於插座之製造過程或搬運過程中,亦可能會對連接器插腳賦予使其產生位移或姿勢變化之外力。插座本體中之連接器插腳之位移或姿勢變化有影響與IC封裝體或構裝基板之電性或熱連接狀態之虞,從而不受期待。Furthermore, the upper contact portion of the connector pin may come into contact with the bottom surface of the IC package and receive a downward load every time the IC package is inspected. Also, the lower contact portion of the connector pin may receive an upward load from the mounting substrate in a state where the socket is mounted on the mounting substrate. Furthermore, during the manufacturing process or transportation process of the socket, an external force may be applied to the connector pins to cause displacement or a change in posture. The displacement or posture change of the connector pins in the socket body may affect the electrical or thermal connection state with the IC package or the assembly substrate, so it is not expected.
基於上述例示性課題,本案發明人新發現如下課題,即,抑制IC封裝體之背面接觸用連接器插腳自上方或下方或上下兩方接受負載而導致容易相對於插座本體位移。再者,該課題可於插座之連接器插腳藉由焊接而電性或熱連接於構裝基板之方式、插座之連接器插腳以自構裝基板受到向上負載之狀態電性或熱連接於構裝基板之方式、其他方式之任一者中產生。於插座之連接器插腳以自構裝基板受到向上負載之狀態電性或熱連接於構裝基板之方式中,由於連接器插腳始終自構裝基板受到向上負載,因此更容易受到垂直方向之負載。 [解決問題之手段] Based on the above-mentioned exemplary problems, the inventors of the present invention have newly discovered the problem that the back contact connector pins of the IC package are prevented from being easily displaced relative to the socket body due to load from above, below, or both. Furthermore, this problem can be solved by soldering the connector pins of the receptacle to be electrically or thermally connected to the structure substrate, and the connector pins of the receptacle being electrically or thermally connected to the structure substrate in a state of being loaded upwards from the structure substrate. Either of the method of mounting the substrate or other methods. In the way that the connector pins of the receptacle are electrically or thermally connected to the build substrate in the state of being loaded upward from the build substrate, since the connector pins are always loaded upward from the build substrate, they are more likely to be loaded in the vertical direction . [means to solve the problem]
本發明之一態樣之IC封裝體之檢查用插座包含:絕緣性插座本體,其載置IC封裝體;一組第1連接器插腳,其等以可與IC封裝體之端子(例如引線端子)電性連接之方式安裝於插座本體之外周部;以及1個以上之第2連接器插腳,其以可與在IC封裝體之底面露出之散熱用及/或接地用焊墊接觸之方式安裝於插座本體,位於較第1連接器插腳靠插座本體之內側。於插座本體設有容許第2連接器插腳向插座本體之外周部橫向移動之空間,藉由空間中之第2連接器插腳之橫向移動而將第2連接器插腳安裝於插座本體,由插座本體阻止第2連接器插腳之上下方向之位移。The IC package inspection socket of one aspect of the present invention includes: an insulating socket body, which carries the IC package; a set of first connector pins, which can be connected to the terminals of the IC package (such as lead terminals) ) are installed on the outer periphery of the socket body in the form of electrical connection; and one or more second connector pins are installed in such a way that they can be in contact with the heat dissipation and/or grounding pads exposed on the bottom surface of the IC package In the socket body, it is located on the inner side of the socket body than the pins of the first connector. The socket body is provided with a space that allows the second connector pins to move laterally to the outer periphery of the socket body, and the second connector pins are installed on the socket body by the lateral movement of the second connector pins in the space, and the socket body Prevent the vertical displacement of the pins of the second connector.
於一些實施形態中,第1連接器插腳為訊號連接器插腳,第2連接器插腳為接地或散熱連接器插腳。第1連接器插腳可構成為夾住IC封裝體之引線端子。In some embodiments, the first connector pin is a signal connector pin, and the second connector pin is a ground or heat dissipation connector pin. The first connector pins may be configured to sandwich lead terminals of the IC package.
於一些實施形態中,空間包含為了保持第2連接器插腳而設於插座本體之保持槽。空間可進而包含為了促進將第2連接器插腳導入至保持槽而與保持槽空間上連通之導入孔。保持槽可自插座本體之內側位置向插座本體之角部延伸。於俯視插座本體時,保持槽可於插座本體之角部(例如柱部)與角部之間細長地延伸。於在插座本體設有導入孔之情形時,於俯視插座本體時,保持槽可於插座本體之角部(例如柱部)與導入孔之間細長地延伸。導入孔之形狀或大小可為各式各樣。於導入孔可配置有用於為了與第2連接器插腳相同或不同而設置之第3連接器插腳(例如散熱連接器插腳)。In some embodiments, the space includes holding grooves provided in the socket body for holding the pins of the second connector. The space may further include an introduction hole spatially communicating with the holding groove for facilitating the introduction of the second connector pin into the holding groove. The retaining groove can extend from the inner side of the socket body to the corner of the socket body. When looking down on the socket body, the retaining groove can extend elongatedly between a corner (such as a post) and a corner of the socket body. When the socket body is provided with an introduction hole, when viewing the socket body from above, the retaining groove can extend elongatedly between a corner (such as a post) of the socket body and the introduction hole. The shape or size of the introduction hole can vary. A third connector pin (for example, a heat radiation connector pin) provided to be the same as or different from the second connector pin may be arranged in the introduction hole.
於一些實施形態中,設有複數個保持槽以分開保持複數個第2連接器插腳,導入孔共同設於複數個保持槽。In some embodiments, a plurality of holding grooves are provided to separately hold the plurality of second connector pins, and the guide holes are jointly provided in the plurality of holding grooves.
於一些實施形態中,空間包含為了保持第2連接器插腳而設於插座本體之保持槽,插座本體具有為了劃定保持槽而對向配置之一對壁面、及與一對壁面之至少一者連結之複數個連結部,複數個連結部以形成供第2連接器插腳之插入部插入之插入路之方式設置。In some embodiments, the space includes a holding groove provided in the socket body for holding the pins of the second connector, and the socket body has a pair of wall surfaces facing to define the holding groove, and at least one of the pair of wall surfaces A plurality of connecting parts are connected, and the plurality of connecting parts are provided in such a way as to form an insertion path for inserting the insertion part of the pin of the second connector.
於一些實施形態中,複數個連結部沿著插入路之長度方向交替配置於插入路之上下兩側。In some embodiments, a plurality of connecting parts are arranged alternately on the upper and lower sides of the insertion path along the length direction of the insertion path.
於一些實施形態中,複數個連結部以第2連接器插腳之插入部壓入至插入路之方式設置,及/或第2連接器插腳以第2連接器插腳之插入部壓入至插入路之方式構成。In some embodiments, the plurality of connection parts are provided in such a way that the insertion part of the second connector pin is pressed into the insertion path, and/or the second connector pin is pressed into the insertion path by the insertion part of the second connector pin constituted in a manner.
於一些實施形態中,複數個第2連接器插腳分別設於插座本體,導入孔共同設於以分開保持複數個第2連接器插腳之方式設置之複數個保持槽。In some embodiments, a plurality of second connector pins are respectively provided on the socket body, and the introduction holes are jointly provided in a plurality of holding grooves provided to separately hold the plurality of second connector pins.
於一些實施形態中,第2連接器插腳具有可與散熱用及/或接地用焊墊接觸之上部接觸部、可與供構裝插座之構裝基板接觸之下部接觸部、及設於上部接觸部與下部接觸部之間之中間部,上部接觸部可根據自上方賦予之負載而向下方彈性位移,下部接觸部可根據自下方賦予之負載而向上方彈性位移,第2連接器插腳之插入部自中間部沿橫向延伸。In some embodiments, the second connector pin has an upper contact portion that can be in contact with the heat dissipation and/or grounding pad, a lower contact portion that can be in contact with the construction substrate for the construction of the socket, and an upper contact portion. In the middle part between the contact part and the lower contact part, the upper contact part can elastically displace downward according to the load applied from above, and the lower contact part can elastically displace upward according to the load applied from below, the insertion of the second connector pin The portion extends laterally from the middle portion.
於一些實施形態中,為了阻止第2連接器插腳自插座本體脫落,於插座本體及第2連接器插腳設有互補之防脫構造。In some embodiments, in order to prevent the pins of the second connector from falling off from the socket body, complementary anti-loosening structures are provided on the socket body and the pins of the second connector.
於一些實施形態中,第2連接器插腳具有可與散熱用及/或接地用焊墊接觸之上部接觸部、及可與供構裝插座之構裝基板接觸之下部接觸部,上部接觸部可根據自上方賦予之負載而向下方彈性位移,下部接觸部可根據自下方賦予之負載而向上方彈性位移。In some embodiments, the pins of the second connector have an upper contact portion that can be in contact with a heat dissipation and/or grounding pad, and a lower contact portion that can be in contact with a construction substrate for constructing a socket, and the upper contact portion can be The lower contact part can elastically displace downward according to the load applied from above, and the lower contact part can elastically displace upward according to the load applied from below.
於一些實施形態中,檢查用插座進而包含:罩部,其係為了切換第1連接器插腳之狀態而相對於插座本體可上下移動地設置;及浮動構件,其係為了切換第2連接器插腳之狀態而與罩部之上下移動連動而相對於插座本體可上下移動地設置。In some embodiments, the socket for inspection further includes: a cover part, which is provided to be movable up and down relative to the socket body for switching the state of the pins of the first connector; and a floating member, which is used for switching the pins of the second connector In this state, it is arranged to be movable up and down relative to the socket body in conjunction with the up and down movement of the cover portion.
本發明之另一態樣之IC封裝體之檢查用插座之製造方法包括如下步驟:於絕緣性插座本體之外周部安裝一組第1連接器插腳;以及於較第1連接器插腳靠插座本體內側之位置將1個以上之第2連接器插腳安裝於插座本體,於設於插座本體之空間使第2連接器插腳向插座本體之外周部橫向移動而將第2連接器插腳安裝於插座本體,由插座本體阻止第2連接器插腳之上下方向之位移。 [發明之效果] Another aspect of the present invention is a method for manufacturing a socket for inspection of an IC package, including the following steps: installing a group of first connector pins on the outer periphery of the insulating socket body; Install one or more second connector pins on the socket body at the inner side of the body, and move the second connector pins laterally to the outer periphery of the socket body in the space provided on the socket body to install the second connector pins on the socket The main body prevents the vertical displacement of the pins of the second connector by the socket main body. [Effect of Invention]
根據本發明之一態樣,可抑制IC封裝體之背面接觸用連接器插腳自上方或下方或上下兩方受到負載而導致容易相對於插座本體位移,提高與IC封裝體之電性連接或熱連接之可靠性。According to one aspect of the present invention, it is possible to prevent the pins of the connector pins for the back contact of the IC package from being loaded from above or below or from both sides to cause easy displacement relative to the socket body, thereby improving the electrical connection or thermal connection with the IC package. connection reliability.
以下,參照圖式對本發明之多種實施形態及特徵進行說明。本領域具有通常知識者可組合各實施形態及/或各特徵而無需過度說明,亦可理解該組合之協同效應。原則上省略實施形態間之重複說明。所參照的圖式,主要是為了記述發明,且為了便於作圖而簡化。應理解,各特徵係不僅僅對本說明書中揭示之插座及其製造方法有效,亦為於本說明書未揭示之其他各種插座及其製造方法中通用的普遍特徵。Hereinafter, various embodiments and features of the present invention will be described with reference to the drawings. Those skilled in the art can combine various embodiments and/or various features without excessive explanation, and can also understand the synergistic effect of the combination. In principle, overlapping descriptions between the embodiments are omitted. The drawings referred to are mainly for describing the invention and are simplified for the convenience of drawing. It should be understood that each feature is not only valid for the socket and its manufacturing method disclosed in this specification, but also is a general feature commonly used in various other sockets and its manufacturing method not disclosed in this specification.
圖1係IC封裝體之檢查用插座91(以下簡稱為插座91)之概略性立體圖。圖2係插座91之概略性分解立體圖。圖3係插座91之概略性俯視圖。再者,於插座本體10未安裝訊號連接器插腳20。圖4係沿著圖3之一點鏈線A-A之概略性剖視圖,插座處於第1狀態。圖5係沿著圖3之一點鏈線A-A之概略性剖視圖,插座處於第2狀態。FIG. 1 is a schematic perspective view of a
如圖1所示,插座91為開頂式插座,構裝於稱為測試板之構裝基板92上。將插座91固定於構裝基板92之態樣有各式各樣,例如藉由螺固而牢固地固定。收容於插座91之IC封裝體經由插座91電性連接及熱連接於構裝基板92。當然,亦可採用除開頂式以外之種類之插座。As shown in FIG. 1 , the
典型地,IC封裝體為SOP(Small Outline Package)或QFP(Quad Flat Package)等。IC封裝體係將1個以上之IC晶片構裝於引線框架,將其用樹脂密封而製造。數個引線端子(例如鷗翼形引線端子)自IC封裝體之樹脂密封部延伸出。於IC封裝體之底面,露出設有散熱用及/或接地用焊墊(露出金屬區域)。換言之,為了露出該焊墊而部分去除或不形成IC封裝體之絕緣材料。經由該焊墊可將於IC封裝體內之半導體晶片產生之熱量散至IC封裝體外,及/或可自IC封裝體外設定IC封裝體內之半導體晶片之接地電位。於QFP中,引線端子以一定間距高密度地排列於其矩形的樹脂密封部之4邊。Typically, the IC package is SOP (Small Outline Package) or QFP (Quad Flat Package). The IC package system is manufactured by mounting one or more IC chips on a lead frame and sealing it with resin. Several lead terminals (eg, gull-wing lead terminals) extend from the resin sealing portion of the IC package. On the bottom surface of the IC package, there are exposed heat dissipation and/or grounding pads (exposed metal areas). In other words, the insulating material of the IC package is partially removed or not formed in order to expose the pad. The heat generated by the semiconductor chip in the IC package can be dissipated to the outside of the IC package through the pad, and/or the ground potential of the semiconductor chip in the IC package can be set from outside the IC package. In QFP, lead terminals are arranged at high density at a certain pitch on the four sides of its rectangular resin sealing part.
如圖1及圖2所示,插座91具有:絕緣性插座本體10,其載置IC封裝體;訊號連接器插腳20(第1連接器插腳),其以可與IC封裝體之引線端子電性連接之方式安裝固定於插座本體10之外周部;以及接地連接器插腳40(第2連接器插腳),其於較訊號連接器插腳20靠插座本體10內側之位置以可與IC封裝體之底面接觸之方式安裝固定於插座本體10。進而,插座91具有:散熱連接器插腳30(第3連接器插腳),其於較訊號連接器插腳20靠插座本體10內側之位置以可與IC封裝體之底面接觸之方式設於插座本體10;罩部50,其係為了切換訊號連接器插腳20之狀態而相對於插座本體10可上下移動地設置;以及浮動構件60,其係為了切換散熱連接器插腳30與接地連接器插腳40之狀態而與罩部50之上下移動連動而相對於插座本體10可上下移動地設置。As shown in Figures 1 and 2, the
插座本體10係固定於構裝基板92上之絕緣性固定構件,藉由基底構件10A與底蓋10B之組合而構成,但不一定限定於此。基底構件10A具有安裝固定訊號連接器插腳20之外周部6、及設置散熱連接器插腳30與接地連接器插腳40之內側部分7。內側部分7自外周部6之上表面向下方偏移設置以形成IC封裝體之容納空間。底蓋10B以夾住浮動構件60之方式安裝固定於基底構件10A之內側部分7,其結果,內側部分7與浮動構件60被底蓋10B自上方覆蓋。The
於基底構件10A之外周部6之角部設置柱11。於柱11設有容納下述浮動構件60之圓筒部63之空間,又,於柱11之內側壁設有用以容許浮動構件60之上下位移之上下較長之切口。於相鄰之柱11之間設有保持槽配置部12。於各保持槽配置部12設有供訊號連接器插腳20插入而保持之數個保持槽。於相鄰之間隔壁之間形成有各保持槽,確保保持於相鄰之保持槽的訊號連接器插腳20彼此之絕緣。
底蓋10B具有載置IC封裝體之上表面14,且安裝固定於基底構件10A之內側部分7上。尤其於底蓋10B之上表面14之周緣設有向上突出之肋15,促進上表面14上之IC封裝體(尤其是其樹脂密封部)之定位。底蓋10B具有引導浮動構件60之上下位移之X字狀之引導孔G1,其於底蓋10B之上表面14形成開口。於引導孔G1容納下述浮動構件60之一部分(例如中央部61之整體及延伸部62之一部分)。於底蓋10B設有4個腳96,腳96分別插入至基底構件10A之內側部分7之保持槽。於腳96向保持槽插入之過程中,腳96下端之突起越過設於保持槽之壁面之突起,藉此,底蓋10B卡止於基底構件10A。The
散熱連接器插腳30係具有可沿上下方向伸縮之彈性之棒狀金屬製構件。例如,散熱連接器插腳30為複數個配件之組裝品,如圖2所示,於可相對位移之上下配件31、32、與上下配件31、32之凸緣33、34之間保持,具有於上下方向將上下配件31、32向相反側彈壓之彈簧35。上配件31於其上表面與IC封裝體底面之散熱焊墊接觸。下配件32於其下表面與構裝基板92之散熱配線接觸。上配件31與下配件32以散熱連接器插腳30可伸縮之態樣機械連結以使其等相互不分離。The heat
接地連接器插腳40係具有可沿上下方向伸縮之彈性之插腳型金屬製構件,例如由表面形成有鍍覆層之銅或銅合金構成。如圖2所示,接地連接器插腳40具有中間部41、為了與構裝基板92之配線焊墊彈性接觸而經由彈簧部43與中間部41連結之下部接觸部42、為了與IC封裝體之底面彈性接觸而經由彈簧部45與中間部41連結之上部接觸部44、及為了由浮動構件60之按壓部66向下方按壓而經由上部接觸部44及彈簧部45與中間部41連結之被按壓部46。於接地連接器插腳40之中間部41設有插入部49,插入並保持於設於下述基底構件10A之保持槽17之插入路81。The
散熱連接器插腳30之數量與接地連接器插腳40之數量可適當變更。例如,藉由增加散熱連接器插腳30提高插座91之散熱性能。藉由增加接地連接器插腳40之數量降低接地電阻。The number of heat dissipation connector pins 30 and the number of ground connector pins 40 can be changed appropriately. For example, the heat dissipation performance of the
訊號連接器插腳20係具有可沿上下方向伸縮之彈性之插腳型金屬製構件,例如由表面形成有鍍覆層之銅或銅合金構成。如圖4及圖5所示,訊號連接器插腳20具有中間部21、為了與構裝基板92之配線焊墊彈性接觸而經由彈簧部23與中間部21連結之下部接觸部22、及為了夾持IC封裝體之引線端子之端部而構成之夾持部24。The
夾持部24具有供IC封裝體之引線端子之端部放置並接觸之接觸部25、為了向接觸部25彈壓而經由彈簧部27與中間部21連結之壓固部26、及為了使壓固部26離開接觸部25而藉由罩部50操作之桿28。The clamping
於中間部21設有插入部29,壓入至設於基底構件10A之外周部6之保持槽配置部12的插槽13。藉由將插入部29向插槽13壓入而將訊號連接器插腳20安裝固定於基底構件10A之保持槽配置部12。再者,訊號連接器插腳20係用於資料傳輸、控制訊號傳輸、測試訊號傳輸、時脈訊號傳輸等各種目的之傳輸線路。An
罩部50具有形成有可供IC封裝體通過之窗之樹脂製矩形框51。於矩形框51之內表面形成有朝向下方縮窄窗寬之傾斜引導面,促進IC封裝體向插座本體10順利移動。於矩形框51之四角設有向下方延伸之4根中空之圓筒部52。圓筒部52之孔到達矩形框51之上表面,於矩形框51之上表面開口。The
於矩形框51設有供訊號連接器插腳20之桿28自下方插入之槽53。罩部50下降時,桿28更深地進入槽53,接觸槽53之底面53B。藉由罩部50之進一步下降,桿28被槽53之底面53B向外側推壓,壓固部26從接觸部25向上拉開。The
浮動構件60係具有中央部61、及自中央部61呈放射狀延伸之4根延伸部62之X字狀構件。於中央部61設有配置並卡合散熱連接器插腳30之上部之卡合孔64。浮動構件60之卡合孔64區分為上部孔64A及下部孔64B,於兩者之間形成有與中心軸CL交叉或正交之階差面即被按壓面。散熱連接器插腳30(例如凸緣33)與該被按壓面接觸,浮動構件60向上方彈壓。再者,上部孔64A,與下部孔64B相比直徑縮小。再者,散熱連接器插腳30於浮動構件60下降時,自浮動構件60受到向下之負載而收縮。當對罩部50之向下負載解除時,散熱連接器插腳30伸長,浮動構件60被散熱連接器插腳30向上推壓。The floating
於延伸部62設有容許接地連接器插腳40之上部(簡言之,為上部接觸部44、彈簧部45、被按壓部46)插入之插入槽65。於插入槽65設有按壓部66,其於浮動構件60下降時,將接地連接器插腳40之被按壓部46向下按壓。於按壓部66之正下方設有被按壓部46,於浮動構件60下降時,按壓部66將被按壓部46向下方按壓。與按壓部66相比,上部接觸部44之插入空間與插座91之中心軸CL側相鄰設置,於該相反側設有彈簧部45之插入空間。若按壓部66將被按壓部46向下按壓,則接地連接器插腳40之上部接觸部44靠近插座91之中心軸CL及/或向下方位移。當對罩部50之向下負載解除時,浮動構件60上升,接地連接器插腳40恢復為初始姿勢。The
於各延伸部62之外端,設有應與罩部50之圓筒部52配置於同軸上之中空之圓筒部63。罩部50之圓筒部52插入至浮動構件60之圓筒部63之貫通孔。以於浮動構件60之圓筒部63與罩部50之圓筒部52之間設有彈簧71之狀態,浮動構件60與罩部50藉由插腳72機械連結。彈簧71為壓縮螺旋彈簧,罩部50與浮動構件60被彈簧71於上下方向朝相互分離之方向彈壓。於基底構件10A與罩部50之間設有彈簧71',其等被彈簧71'向相互分離之方向彈壓。At the outer end of each
罩部50與浮動構件60可按以下方式組裝。首先,圓筒部52穿過彈簧71,繼而穿過浮動構件60之圓筒部63。成為於圓筒部52與圓筒部63之間配置有彈簧71之狀態。將插腳72插入至圓筒部52內,緊固插腳72之插入端。以此方式組裝罩部50與浮動構件60。The
底蓋10B安裝於基底構件10A時,由基底構件10A與底蓋10B夾住浮動構件60。因此,阻止浮動構件60與罩部50之組裝品自插座本體10脫落。當然,浮動構件60與罩部50之組裝品相對於插座本體10可上下移動地設置。When the
圖6係沿著圖3之一點鏈線B-B之概略性剖視圖,插座處於第1狀態。圖7係沿著圖3之一點鏈線B-B之概略性剖視圖,插座處於第2狀態。由圖6及圖7可知,於插座本體10設有保持接地連接器插腳40之保持槽l7、及為了促進將接地連接器插腳40向保持槽17導入而與保持槽17空間上連通之導入孔16。導入孔16設於插座91之中心軸CL上,貫通插座本體10之內側部分(例如內側部分7)。保持槽17包含自插座本體10之內側位置向外周部6延伸之部分。詳細而言,劃定保持槽17之各壁面18自劃定導入孔16之壁面向插座本體10之外周部6(例如其角部(例如柱11))延伸。Fig. 6 is a schematic sectional view along the chain line B-B in Fig. 3, the socket is in the first state. Fig. 7 is a schematic sectional view along the chain line B-B in Fig. 3, the socket is in the second state. As can be seen from Figures 6 and 7, the
於本實施形態中,於插座本體10設有容許接地連接器插腳40朝向插座本體10之外周部6橫向移動之空間8,藉由空間8中之接地連接器插腳40之橫向移動將接地連接器插腳40安裝於插座本體10,由插座本體10阻止接地連接器插腳40之上下方向之位移。例如,接地連接器插腳40之下側部分自上方導入並收容於導入孔16。其次,接地連接器插腳40之下側部分自導入孔16向保持槽17移動,插入並保持於保持槽17。如此,經由接地連接器插腳40之橫向移動將接地連接器插腳40安裝於插座本體10,由插座本體10阻止接地連接器插腳40之上下方向之位移。插座本體10中之接地連接器插腳40之位移或姿勢變化得到抑制,提高與IC封裝體或構裝基板之電性連接或熱連接之可靠性。In this embodiment, the
再者,上述空間8包含保持槽17之保持空間。於在插座本體10設有導入孔16之情形時,上述空間8亦包含導入孔16之內部空間。於完成狀態之插座91中,於導入孔16配置有散熱連接器插腳30,於保持槽17配置有接地連接器插腳40,但並不限定於此。因此,於本說明書中,請注意,空間並不表示此處未放置任何物體之狀態。Furthermore, the above-mentioned
接地連接器插腳40之橫向移動方向典型地與相對於插座91之中心軸CL正交之方向一致,但並不限定於此,亦可以相對於與插座91之中心軸CL正交之方向構成某一角度(例如35°以下)之方式傾斜。導入孔16係為了可使接地連接器插腳40向保持槽17插入而設置。不一定需要於導入孔16配置散熱連接器插腳30。The lateral movement direction of the
於一些情形,(例如呈放射狀)設有複數個保持槽17以分開保持複數個接地連接器插腳40。導入孔16共同設於複數個保持槽17,促進插座本體10之小型化。In some cases, a plurality of holding
於一些情形,插座本體10具有為了劃定保持槽17而對向配置之一對壁面18、及與一對壁面18之至少一者(圖示例中為兩者)連結之複數個連結部19,複數個連結部19以形成供接地連接器插腳40之插入部49插入之插入路81之方式配置。接地連接器插腳40之插入部49插入(例如壓入)並保持於插入路81。In some cases, the
2個以上(較佳為3個以上)之連結部19可沿著插入路81之長度方向交替配置於插入路81之上下兩側。於該情形時,可藉由通用之射出成型技術形成連結部19。插入路81之長度方向典型而言係與插座91之中心軸CL正交之方向,亦可以某一角度傾斜。為了向插入路81壓入,亦可適當將接地連接器插腳40之插入部49賦形。為了保持接地連接器插腳40或其他目的,亦可於壁面18設置凸部或凹部。Two or more (preferably three or more) connecting
以下,參照圖8至圖12對將IC封裝體200載置於插座本體10上之過程進行說明。圖8係表示插座91為第2狀態時,IC封裝體200載置於插座本體上之過程之示意圖。圖9係表示插座91自第2狀態成為第1狀態,IC封裝體200之引線端子202由訊號連接器插腳夾持之示意圖。圖10係表示插座91為第2狀態時,第2連接器插腳處於不與IC封裝體(未圖示)接觸之狀態之示意圖。圖11係表示插座91自第2狀態成為第1狀態,第2連接器插腳處於可與IC封裝體(未圖示)之背面接觸之狀態之示意圖。圖12係表示第2連接器插腳與IC封裝體之背面接觸之狀態之示意圖。Hereinafter, the process of mounting the
如圖8及圖10所示時,插座91處於第2狀態,可將IC封裝體200設置於插座91。罩部50向下按壓,插座91自第1狀態向第2狀態推移。詳細而言,浮動構件60亦與罩部50之下降同步下降。於罩部50及浮動構件60下降之過程中,罩部50操作訊號連接器插腳20,成為可收容IC封裝體之引線端子之狀態。例如,罩部50使桿28向外側傾斜,壓固部26自接觸部25向上方拉開。又,浮動構件60將散熱連接器插腳30向下按壓,繼而將接地連接器插腳40之被按壓部46向下按壓使上部接觸部44之位置變低。藉此,避免散熱連接器插腳30及接地連接器插腳40接觸IC封裝體之底面。As shown in FIGS. 8 and 10 , the
如圖9及圖11所示時,插座91恢復為第1狀態,IC封裝體200牢固地設置於插座91上。當罩部50朝向下方之按壓解除時,插座91自動從第2狀態恢復為第1狀態。詳細而言,浮動構件60亦與罩部50之上升同步上升。於罩部50及浮動構件60上升之過程中,訊號連接器插腳20恢復為初始姿勢,桿28向內側移動,壓固部26接近接觸部25,於兩者之間夾著IC封裝體200之引線端子202之前端。散熱連接器插腳30向上方伸長,浮動構件60向上方推壓,接地連接器插腳40之上部接觸部44移動至原本高度。藉此,確保散熱連接器插腳30及接地連接器插腳40對IC封裝體200之本體部201之底面之接觸(參照圖12)。As shown in FIG. 9 and FIG. 11 , the
關於自插座91拆下IC封裝體之方法,可根據上述說明理解,從而省略。The method of detaching the IC package from the
其次,對插座91之製造方法之概要進行說明。該製造方法包括如下步驟:於絕緣性插座本體10之外周部6安裝一組訊號連接器插腳20;以及於較訊號連接器插腳20靠插座本體10內側之位置將1個以上之接地連接器插腳40安裝於插座本體10。此處,於設於插座本體10之空間8,接地連接器插腳40向插座本體10之外周部6橫向移動而將接地連接器插腳40安裝於插座本體10,由插座本體10阻止接地連接器插腳40之上下方向之位移。設置接地連接器插腳40後,將散熱連接器插腳30配置於導入孔16。接地連接器插腳40之移動係由人或機器人進行。由於連接器插腳為易變形之金屬零件,因此期望用鑷子等慎重處理。關於基底構件10A與底蓋10B之連結、或浮動構件60與罩部50之組裝品之安裝已經進行了說明,從而省略其等之重複說明。Next, the outline of the manufacturing method of the
如圖13所示,藉由使接地連接器插腳40下降而將接地連接器插腳40配置於導入孔16內。繼而,將接地連接器插腳40朝向插座本體10之外周部6橫向移動。藉此,接地連接器插腳40之插入部49插入並保持於保持槽17。具體而言,接地連接器插腳40之插入部49插入並保持於藉由複數個連結部19而形成之插入路81。As shown in FIG. 13 , the
可理解於在插座本體10除設有接地連接器插腳40以外亦設有散熱連接器插腳30之情形時,將插座本體10中之散熱連接器插腳30之配置空間(簡言之,為導入孔16)兼用於接地連接器插腳40向保持槽17之橫向移動。It can be understood that when the
再者,亦可藉由在導入孔16配置散熱連接器插腳30而阻止接地連接器插腳40自保持槽17脫落。可以設置阻止接地連接器插腳40自保持槽17脫落之防脫構件250作為散熱連接器插腳30之替代(參照圖14)。Moreover, it is also possible to prevent the
為了阻止接地連接器插腳40自插座本體10脫落,亦可於插座本體10及接地連接器插腳40設置互補之防脫構造(參照圖15)。於插座本體10之保持槽17之壁面18設有卡止部181,於接地連接器插腳40設有被卡止部47。若將接地連接器插腳40插入至保持槽17,則藉由卡止部181將被卡止部47卡住。亦可獲得表示接地連接器插腳40完成插入之扣合感覺,抑制接地連接器插腳40之不充分插入。被卡止部47為凹部,卡止部181為可進入凹部之矛狀物(lance)(斜向傾斜之金屬片)。可將卡止部181與被卡止部47之凸凹關係反轉。In order to prevent the grounding connector pins 40 from falling off from the
基於上述教示,本領域具有通常知識者可對各實施形態及各特徵施加各種變更。可選擇以不與置於插座本體10上的IC封裝體之底面接觸之方式操作散熱連接器插腳30與接地連接器插腳40,可視實施形態而省略。導入孔並不限於圓柱狀空間,與保持槽同樣地,可沿既定方向形成為細長之狹縫狀。導入孔之位置、個數可進行變更。Based on the above teaching, those skilled in the art can add various modifications to the respective embodiments and respective features. The heat
6:外周部 7:內側部分 8:空間 10:插座本體 10A:基底構件 10B:底蓋 11:柱 12:保持槽配置部 13:插槽 14:上表面 15:肋 16:導入孔 17:保持槽 18:壁面 19:連結部 20:訊號連接器插腳(第1連接器插腳) 21:中間部 22:下部接觸部 23:彈簧部 24:夾持部 25:接觸部 26:壓固部 27:彈簧部 28:桿 29:插入部 30:散熱連接器插腳 31:上配件 32:下配件 33:凸緣 34:凸緣 35:彈簧 40:接地連接器插腳(第2連接器插腳) 41:中間部 42:下部接觸部 43:彈簧部 44:上部接觸部 45:彈簧部 46:被按壓部 47:被卡止部 49:插入部 50:罩部 51:矩形框 52:圓筒部 53:槽 53B:底面 60:浮動構件 61:中央部 62:延伸部 63:圓筒部 64:卡合孔 64A:上部孔 64B:下部孔 65:槽 66:按壓部 71:彈簧 71’:彈簧 72:插腳 81:插入路 90:插座 91:插座 92:構裝基板 96:腳 181:卡止部 200:IC封裝體 201:本體部 202:引線端子 250:防脫構件 G1:引導孔 6: Peripheral 7: inner part 8: space 10: Socket body 10A: Base member 10B: Bottom cover 11: column 12:Holding groove configuration part 13: slot 14: Upper surface 15: Rib 16: Import hole 17: Holding groove 18: wall 19: Connection Department 20: Signal connector pin (1st connector pin) 21: middle part 22: Lower contact part 23: spring part 24: clamping part 25: contact part 26: Consolidation Department 27: spring part 28: Rod 29: Insertion part 30: Heat dissipation connector pin 31: Upper accessories 32: Bottom accessories 33: Flange 34: Flange 35: spring 40: Ground connector pin (2nd connector pin) 41: middle part 42: Lower contact part 43: spring part 44: Upper contact part 45: spring part 46: Pressed part 47: locked part 49: Insertion part 50: cover part 51: rectangular frame 52: Cylindrical part 53: Slot 53B: bottom surface 60: Floating components 61: central part 62: Extension 63: Cylindrical part 64: snap hole 64A: Upper hole 64B: Bottom hole 65: slot 66: Pressing part 71: Spring 71': spring 72: pin 81: insert road 90: socket 91: socket 92: Construct the substrate 96: feet 181: locking part 200: IC package 201: Body Department 202: Lead terminal 250: anti-detachment member G1: guide hole
[圖1]係本發明之一態樣之IC封裝體之檢查用插座之概略性立體圖。 [圖2]係本發明之一態樣之檢查用插座之概略性分解立體圖。再者,於插座本體未安裝訊號連接器插腳。 [圖3]係本發明之一態樣之檢查用插座之概略性俯視圖。 [圖4]係沿著圖3之一點鏈線A-A之概略性剖視圖,插座處於第1狀態。 [圖5]係沿著圖3之一點鏈線A-A之概略性剖視圖,插座處於第2狀態。 [圖6]係沿著圖3之一點鏈線B-B之概略性剖視圖,插座處於第1狀態。 [圖7]係沿著圖3之一點鏈線B-B之概略性剖視圖,插座處於第2狀態。 [圖8]係表示插座於第2狀態時,IC封裝體載置於插座本體上之過程之示意圖。 [圖9]係表示插座自第2狀態成為第1狀態,IC封裝體之引線端子由訊號連接器插腳夾持之示意圖。 [圖10]係表示插座於第2狀態時,接地連接器插腳處於不與IC封裝體(未圖示)接觸之狀態之示意圖。 [圖11]係表示插座自第2狀態成為第1狀態,接地連接器插腳處於可與IC封裝體(未圖示)之背面接觸之狀態之示意圖。 [圖12]係表示接地連接器插腳與IC封裝體之背面接觸之狀態之示意圖。 [圖13]係表示將接地連接器插腳橫向移動而安裝於插座本體之示意圖。 [圖14]係表示使用阻止接地連接器插腳之位移或脫落之插塞之變化之示意圖。 [圖15]係表示於插座本體及接地連接器插腳設有互補之防脫構造之變化之示意圖。 [ Fig. 1 ] is a schematic perspective view of a socket for inspection of an IC package according to an aspect of the present invention. [ Fig. 2 ] is a schematic exploded perspective view of an inspection socket according to an aspect of the present invention. Furthermore, no signal connector pins are installed on the socket body. [ Fig. 3 ] is a schematic plan view of an inspection socket according to an aspect of the present invention. [Fig. 4] is a schematic cross-sectional view along the dotted line A-A in Fig. 3, and the socket is in the first state. [Fig. 5] is a schematic cross-sectional view along the dotted line A-A in Fig. 3, and the socket is in the second state. [FIG. 6] It is a schematic cross-sectional view along the dotted line B-B in FIG. 3, and the socket is in the first state. [FIG. 7] It is a schematic sectional view along the dotted line B-B in FIG. 3, and the socket is in the second state. [ Fig. 8 ] is a schematic diagram showing the process of placing the IC package on the socket body when the socket is in the second state. [FIG. 9] It is a schematic diagram showing that the socket changes from the second state to the first state, and the lead terminals of the IC package are clamped by the pins of the signal connector. [ Fig. 10 ] is a schematic diagram showing a state where the pin of the ground connector is not in contact with the IC package (not shown) when the socket is in the second state. [FIG. 11] It is a schematic diagram which shows the socket from the 2nd state to the 1st state, and the ground connector pin is in the state which can contact the back surface of an IC package (not shown). [ Fig. 12 ] is a schematic diagram showing a state where the ground connector pins are in contact with the back surface of the IC package. [FIG. 13] It is a schematic diagram showing that the pin of the grounding connector is moved laterally and installed on the socket body. [ Fig. 14 ] is a schematic view showing a variation using a plug that prevents displacement or falling off of the pin of the ground connector. [FIG. 15] It is a schematic diagram showing the variation of the socket body and the grounding connector pins being provided with complementary anti-off structures.
6:外周部 6: Peripheral
7:內側部分 7: inner part
8:空間 8: space
16:導入孔 16: Import hole
17:保持槽 17: Holding groove
18:壁面 18: wall
19:連結部 19: Connection Department
40:接地連接器插腳(第2連接器插腳) 40: Ground connector pin (2nd connector pin)
41:中間部 41: middle part
42:下部接觸部 42: Lower contact part
43:彈簧部 43: spring part
44:上部接觸部 44: Upper contact part
45:彈簧部 45: spring part
46:被按壓部 46: Pressed part
49:插入部 49: Insertion part
81:插入路 81: insert road
Claims (13)
Applications Claiming Priority (2)
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JP2021-096202 | 2021-06-08 | ||
JP2021096202A JP7189460B1 (en) | 2021-06-08 | 2021-06-08 | IC package inspection socket |
Publications (1)
Publication Number | Publication Date |
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TW202314256A true TW202314256A (en) | 2023-04-01 |
Family
ID=84424856
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TW111118222A TW202314256A (en) | 2021-06-08 | 2022-05-16 | Socket for inspection of IC package and method for producing same |
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JP (1) | JP7189460B1 (en) |
DE (1) | DE112022002955T5 (en) |
TW (1) | TW202314256A (en) |
WO (1) | WO2022259818A1 (en) |
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JP4311829B2 (en) * | 1999-10-06 | 2009-08-12 | 株式会社センサータ・テクノロジーズジャパン | socket |
JP4155833B2 (en) * | 2003-01-27 | 2008-09-24 | 株式会社エンプラス | Socket for electrical parts |
JP4347027B2 (en) | 2003-11-28 | 2009-10-21 | 株式会社エンプラス | Socket for electrical parts |
JP4420720B2 (en) * | 2004-04-07 | 2010-02-24 | 株式会社ルネサステクノロジ | Socket for electrical parts |
JP2020055130A (en) | 2018-09-28 | 2020-04-09 | 富士フイルム株式会社 | Optical laminate film |
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2021
- 2021-06-08 JP JP2021096202A patent/JP7189460B1/en active Active
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2022
- 2022-05-13 DE DE112022002955.2T patent/DE112022002955T5/en active Pending
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DE112022002955T5 (en) | 2024-03-21 |
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