TW202234092A - Optical film provided with antifouling layer - Google Patents
Optical film provided with antifouling layer Download PDFInfo
- Publication number
- TW202234092A TW202234092A TW110125719A TW110125719A TW202234092A TW 202234092 A TW202234092 A TW 202234092A TW 110125719 A TW110125719 A TW 110125719A TW 110125719 A TW110125719 A TW 110125719A TW 202234092 A TW202234092 A TW 202234092A
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- Prior art keywords
- layer
- optical film
- film
- refractive index
- antifouling
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- 230000003373 anti-fouling effect Effects 0.000 title claims abstract description 115
- 239000012788 optical film Substances 0.000 title claims abstract description 108
- 230000003287 optical effect Effects 0.000 claims abstract description 44
- 239000000758 substrate Substances 0.000 claims abstract description 29
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 19
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- 229910052814 silicon oxide Inorganic materials 0.000 claims description 11
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- 150000004706 metal oxides Chemical class 0.000 claims description 9
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- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
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- 238000001771 vacuum deposition Methods 0.000 description 1
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- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/02—Physical, chemical or physicochemical properties
- B32B7/023—Optical properties
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/18—Coatings for keeping optical surfaces clean, e.g. hydrophobic or photo-catalytic films
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- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Ophthalmology & Optometry (AREA)
- Laminated Bodies (AREA)
- Surface Treatment Of Optical Elements (AREA)
Abstract
Description
本發明係關於一種附防污層之光學膜。The present invention relates to an optical film with an antifouling layer.
於液晶顯示器等顯示器之圖像顯示側之外表面,例如設置有具備具有規定光學功能之層(光學功能層)的透明光學膜。作為光學膜,例如可例舉抗反射膜、透明導電性膜及電磁波屏蔽膜。光學膜例如具備:透明基材、配置於透明基材一面側之光學功能層、及配置於透明基材之另一面上之黏著劑層。例如下述專利文獻1中記載有與此種光學膜相關之技術。 [先前技術文獻] [專利文獻] On the outer surface on the image display side of a display such as a liquid crystal display, for example, a transparent optical film having a layer having a predetermined optical function (optical function layer) is provided. As an optical film, an antireflection film, a transparent conductive film, and an electromagnetic wave shielding film are mentioned, for example. The optical film includes, for example, a transparent base material, an optical functional layer disposed on one side of the transparent base material, and an adhesive layer disposed on the other side of the transparent base material. For example, the following patent document 1 describes the technique concerning such an optical film. [Prior Art Literature] [Patent Literature]
[專利文獻1]日本專利特開2017-227898號公報[Patent Document 1] Japanese Patent Laid-Open No. 2017-227898
[發明所欲解決之問題][Problems to be Solved by Invention]
於配置光學功能層作為最表層之光學膜,手部油脂等污染物質容易附著於光學功能層,又,附著之污染物質不易自光學功能層去除。就確保光學膜之透明性之觀點而言,不希望污染物質附著於光學膜。因此,於光學膜例如設置防污層作為最表層。對於此種附防污層之光學膜,要求防污層具有高防污性。When the optical functional layer is configured as the outermost optical film, contaminants such as hand grease are easily attached to the optical functional layer, and the attached contaminants are not easily removed from the optical functional layer. From the viewpoint of securing the transparency of the optical film, it is not desirable that contaminants adhere to the optical film. Therefore, for example, an antifouling layer is provided as the outermost layer in the optical film. For such an optical film with an antifouling layer, the antifouling layer is required to have high antifouling properties.
本發明提供一種適於實現防污層之高防污性的附防污層之光學膜。 [解決問題之技術手段] The present invention provides an optical film with an antifouling layer suitable for realizing high antifouling properties of the antifouling layer. [Technical means to solve problems]
本發明[1]包含一種附防污層之光學膜,其依序具備透明基材、光學功能層及防污層,防污層之與光學功能層為相反側之外表面具有110°以上之水接觸角。The present invention [1] includes an optical film with an antifouling layer, which comprises a transparent substrate, an optical function layer and an antifouling layer in sequence, and the antifouling layer and the optical function layer are opposite to the outer surface having an angle of 110° or more. water contact angle.
本發明[2]包含如上述[1]所記載之附防污層之光學膜,其中上述外表面具有超過2 nm之表面粗糙度Ra。The present invention [2] includes the antifouling layer-attached optical film according to the above [1], wherein the outer surface has a surface roughness Ra exceeding 2 nm.
本發明[3]包含如上述[1]或[2]所記載之附防污層之光學膜,其中光學功能層為抗反射層。The present invention [3] includes the optical film with an antifouling layer according to the above [1] or [2], wherein the optical functional layer is an antireflection layer.
本發明[4]包含如上述[3]所記載之附防污層之光學膜,其中抗反射層交替包含折射率相對較大之高折射率層、及折射率相對較小之低折射率層。The present invention [4] includes the optical film with an antifouling layer as described in the above [3], wherein the antireflection layer alternately includes a high refractive index layer with a relatively large refractive index and a low refractive index layer with a relatively small refractive index .
本發明[5]包含如上述[1]至[4]中任一項所記載之附防污層之光學膜,其中透明基材於光學功能層側具有硬塗層。The present invention [5] includes the antifouling layer-attached optical film according to any one of the above [1] to [4], wherein the transparent substrate has a hard coat layer on the optical functional layer side.
本發明[6]包含如上述[5]所記載之附防污層之光學膜,其中硬塗層含有金屬氧化物微粒子。The present invention [6] includes the antifouling layer-attached optical film according to the above [5], wherein the hard coat layer contains metal oxide fine particles.
本發明[7]包含如上述[6]所記載之附防污層之光學膜,其中金屬氧化物微粒子為奈米氧化矽粒子。The present invention [7] includes the optical film with an antifouling layer as described in the above [6], wherein the metal oxide fine particles are nano-silicon oxide particles.
本發明[8]包含如上述[5]至[7]中任一項所記載之附防污層之光學膜,其中硬塗層之光學功能層側之表面具有0.5 nm以上20 nm以下之表面粗糙度Ra。 [發明之效果] The present invention [8] includes the antifouling layer-attached optical film according to any one of the above [5] to [7], wherein the surface on the optical function layer side of the hard coat layer has a surface of 0.5 nm or more and 20 nm or less. Roughness Ra. [Effect of invention]
因本發明之附防污層之光學膜中,防污層之與光學功能層為相反側之外表面具有110°以上之水接觸角,故適於實現防污層之高防污性。In the optical film with antifouling layer of the present invention, the outer surface of the antifouling layer on the opposite side to the optical functional layer has a water contact angle of 110° or more, so it is suitable for realizing high antifouling property of the antifouling layer.
如圖1所示,光學膜F作為本發明之附防污層之光學膜之一實施方式,朝向厚度方向D之一側依序具備透明基材10、光學功能層20及防污層30。於本實施方式中,光學膜F朝向厚度方向D之一側依序具備透明基材10、密接層40、光學功能層20及防污層30,較佳為由透明基材10、密接層40、光學功能層20及防污層30構成。又,光學膜F具有於與厚度方向D正交之方向(面方向)上擴展之形狀。As shown in FIG. 1 , as an embodiment of the optical film with an antifouling layer of the present invention, the optical film F includes a
於本實施方式中,透明基材10朝向厚度方向D之一側依序具備樹脂膜11及硬塗層12。In this embodiment, the
樹脂膜11係具有可撓性之透明樹脂膜。作為樹脂膜11之材料,例如可例舉聚酯樹脂、聚烯烴樹脂、聚苯乙烯樹脂、丙烯酸樹脂、聚碳酸酯樹脂、聚醚碸樹脂、聚碸樹脂、聚醯胺樹脂、聚醯亞胺樹脂、纖維素樹脂、降莰烯樹脂、聚芳酯樹脂及聚乙烯醇樹脂。作為聚酯樹脂,例如可例舉聚對苯二甲酸乙二酯(PET)、聚對苯二甲酸丁二酯、及聚萘二甲酸乙二酯。作為聚烯烴樹脂,例如可例舉聚乙烯、聚丙烯及環烯烴聚合物。作為纖維素樹脂,例如可例舉三乙醯纖維素。該等材料可單獨使用,亦可併用兩種以上。就透明性及強度之觀點而言,作為樹脂膜11之材料,較佳為使用纖維素樹脂,更佳為使用三乙醯纖維素。The
亦可對樹脂膜11之硬塗層12側表面進行表面改質處理。作為表面改質處理,例如可例舉電暈處理、電漿處理、臭氧處理、底塗處理、輝光處理、及偶合劑處理。The surface of the
就強度之觀點而言,樹脂膜11之厚度較佳為5 μm以上,更佳為10 μm以上,進而較佳為20 μm以上。就操作性之觀點而言,樹脂膜11之厚度較佳為300 μm以下,更佳為200 μm以下。From the viewpoint of strength, the thickness of the
就透明性之觀點而言,樹脂膜11之可見光透過率較佳為80%以上,更佳為90%以上。樹脂膜11之可見光透過率例如為100%以下。From the viewpoint of transparency, the visible light transmittance of the
硬塗層12配置於樹脂膜11之厚度方向D之一面上。硬塗層12係用以使光學膜F之露出表面(圖1中為上表面)不易形成擦傷之層。The
硬塗層12係硬化性樹脂組合物之硬化物。作為硬化性樹脂組合物所含有之硬化性樹脂,例如可例舉聚酯樹脂、丙烯酸樹脂、胺基甲酸酯樹脂、胺基甲酸酯丙烯酸酯樹脂、醯胺樹脂、聚矽氧樹脂、環氧樹脂、及三聚氰胺樹脂。該等硬化性樹脂可單獨使用,亦可併用兩種以上。就確保硬塗層12之高硬度之觀點而言,作為硬化性樹脂,較佳為使用丙烯酸樹脂及/或胺基甲酸酯丙烯酸酯樹脂。The
又,作為硬化性樹脂組合物,例如可例舉紫外線硬化型樹脂組合物、及熱硬化型樹脂組合物。作為硬化性樹脂組合物,較佳為使用紫外線硬化型樹脂組合物,因其無須進行高溫加熱便可硬化,故而有助於提昇光學膜F之製造效率。紫外線硬化型樹脂組合物包括選自由紫外線硬化型單體、紫外線硬化型低聚物、及紫外線硬化型聚合物所組成之群中之至少一種。作為紫外線硬化型樹脂組合物,例如可例舉日本專利特開2016-179686號公報所記載之硬塗層形成用組合物。Moreover, as a curable resin composition, an ultraviolet curable resin composition and a thermosetting resin composition are mentioned, for example. As a curable resin composition, it is preferable to use an ultraviolet curable resin composition, and since it can harden|cure without high temperature heating, it contributes to the improvement of the manufacturing efficiency of the optical film F. The UV-curable resin composition includes at least one selected from the group consisting of UV-curable monomers, UV-curable oligomers, and UV-curable polymers. As an ultraviolet curable resin composition, the composition for hard-coat layer formation described in Unexamined-Japanese-Patent No. 2016-179686 is mentioned, for example.
硬塗層12亦可為具有防眩性之硬塗層(防眩性硬塗層)。作為防眩性硬塗層之硬塗層12係硬化性樹脂組合物之硬化物,硬化性樹脂組合物含有硬化性樹脂(基質樹脂)、及用以表現防眩性之微粒子(防眩性微粒子)。作為防眩性微粒子,例如可例舉金屬氧化物微粒子及有機系微粒子。作為金屬氧化物微粒子之材料,例如可例舉氧化矽、氧化鋁、氧化鈦、氧化鋯、氧化鈣、氧化錫、氧化銦、氧化鎘及氧化銻。作為有機系微粒子之材料,可例舉聚甲基丙烯酸甲酯、聚矽氧、聚苯乙烯、聚胺基甲酸酯、丙烯酸系樹脂-苯乙烯共聚物共聚物、苯并胍胺、三聚氰胺及聚碳酸酯。該等微粒子可單獨使用,亦可併用兩種以上。要使硬塗層12表現出良好之防眩性,作為防眩性微粒子,較佳為使用選自由奈米氧化矽粒子、聚甲基丙烯酸甲酯粒子、及聚矽氧粒子所組成之群中之至少一種。The
微粒子之平均粒徑例如為10 μm以下,較佳為8 μm以下,又,例如1 nm以上。於使用奈米粒子作為微粒子之情形時,該微粒子之平均粒徑例如為100 nm以下,較佳為70 nm以下,又,例如1 nm以上。例如藉由雷射散射法中之粒度分佈測定法求出粒度分佈,從而求出D50值(累積50%中值粒徑)作為微粒子之平均粒徑。The average particle diameter of the fine particles is, for example, 10 μm or less, preferably 8 μm or less, and, for example, 1 nm or more. When nanoparticles are used as fine particles, the average particle diameter of the fine particles is, for example, 100 nm or less, preferably 70 nm or less, and, for example, 1 nm or more. For example, the particle size distribution is obtained by the particle size distribution measurement method in the laser scattering method, and the D50 value (cumulative 50% median diameter) is obtained as the average particle diameter of the fine particles.
基質樹脂(硬化後)之折射率例如為1.46以上,較佳為1.49以上,更佳為1.50以上,進而較佳為1.51以上。該折射率例如為1.60以下,較佳為1.59以下,更佳為1.58以下,進而較佳為1.57以下。The refractive index of the matrix resin (after curing) is, for example, 1.46 or more, preferably 1.49 or more, more preferably 1.50 or more, and still more preferably 1.51 or more. The refractive index is, for example, 1.60 or less, preferably 1.59 or less, more preferably 1.58 or less, and still more preferably 1.57 or less.
微粒子之折射率可高於或低於基質樹脂之上述折射率。於微粒子之折射率高於基質樹脂之折射率之情形時,微粒子之折射率例如為1.62以下,較佳為1.60以下,更佳為1.59以下,進而較佳為1.50以下。於微粒子之折射率低於基質樹脂之折射率之情形時,微粒子之折射率例如為1.40以上,較佳為1.42以上,更佳為1.44以上。The refractive index of the microparticles may be higher or lower than the above-mentioned refractive index of the matrix resin. When the refractive index of the fine particles is higher than that of the matrix resin, the refractive index of the fine particles is, for example, 1.62 or less, preferably 1.60 or less, more preferably 1.59 or less, and still more preferably 1.50 or less. When the refractive index of the fine particles is lower than the refractive index of the matrix resin, the refractive index of the fine particles is, for example, 1.40 or more, preferably 1.42 or more, and more preferably 1.44 or more.
相對於基質樹脂100質量份,硬塗層12中微粒子之含量較佳為1質量份以上,更佳為3質量份以上。相對於基質樹脂100質量份,硬塗層12中微粒子之含量較佳為30質量份以下,更佳為20質量份以下。The content of the fine particles in the
就確保硬塗層12之硬度之觀點而言,硬塗層12之厚度較佳為0.5 μm以上,更佳為1 μm以上。硬塗層12之厚度例如為10 μm以下。From the viewpoint of securing the hardness of the
亦可對硬塗層12之密接層40側表面進行表面改質處理。作為表面改質處理,例如可例舉電漿處理、電暈處理、臭氧處理、底塗處理、輝光處理及偶合劑處理。要確保硬塗層12與密接層40之間之高密接力,較佳為對硬塗層12之密接層40側表面進行輝光處理。Surface modification treatment may also be performed on the side surface of the
就強度之觀點而言,透明基材10之厚度較佳為5 μm以上,更佳為10 μm以上,進而較佳為20 μm以上。就操作性之觀點而言,透明基材10之厚度較佳為300 μm以下,更佳為200 μm以下。From the viewpoint of strength, the thickness of the
就透明性之觀點而言,透明基材10之可見光透過率較佳為80%以上,更佳為90%以上。透明基材10之可見光透過率例如為100%以下。From the viewpoint of transparency, the visible light transmittance of the
透明基材10之光學功能層20側之表面(於本實施方式中為硬塗層12之光學功能層20側之表面)之表面粗糙度Ra(算術平均表面粗糙度)較佳為0.5 nm以上,更佳為0.8 nm以上。該表面粗糙度Ra較佳為20 nm以下,更佳為15 nm以下。例如根據藉由AFM(Atomic Force Microscopy,原子力顯微鏡)所得之1 μm見方之觀察圖像求出表面粗糙度Ra。The surface roughness Ra (arithmetic mean surface roughness) of the surface on the optical
密接層40係用以確保透明基材10與光學功能層20之密接力之層。密接層40配置於透明基材10(於本實施方式中具體為透明基材10之硬塗層12)之厚度方向D之一面上。作為密接層40之材料,例如可例舉矽、鎳、鉻、鋁、錫、金、銀、鉑、鋅、鈦、鎢、鋯、鈀等金屬、該等金屬之2種以上之合金、及該等金屬之氧化物。為了兼具對於有機層(具體而言為硬塗層12)及氧化物層(具體而言為後述第1高折射率層21)雙方之密接性、以及密接層40之透明性,作為密接層40之材料,較佳為使用銦錫氧化物(ITO)或氧化矽(SiOx)。於使用氧化矽作為密接層40之材料之情形時,較佳為使用氧量少於化學計量組成之SiOx,更佳為使用x為1.2以上1.9以下之SiOx。The
要確保透明基材10與光學功能層20之間之密接力,並同時實現密接層40之透明性,密接層40之厚度例如為1 nm以上,且例如為10 nm以下。In order to ensure the adhesion between the
光學功能層20配置於密接層40之厚度方向D之一面上。於本實施方式中,光學功能層20係用以抑制外界光之反射強度之抗反射層。即,光學膜F於本實施方式中為抗反射膜。The optical
光學功能層20(抗反射層)於厚度方向上交替具有折射率相對較大之高折射率層、及折射率相對較小之低折射率層。於抗反射層,藉由其所含之複數個薄層(高折射率層、低折射率層)之複數個界面產生之反射光間之干涉作用,使淨反射光強度衰減。又,於抗反射層,藉由調整各薄層之光學膜厚(折射率與厚度之積),可表現出使反射光強度衰減之干涉作用。於本實施方式中,具體而言,此種作為抗反射層之光學功能層20朝向厚度方向D之一側依序具有第1高折射率層21、第1低折射率層22、第2高折射率層23、第2低折射率層24。The optical function layer 20 (anti-reflection layer) alternately has a high refractive index layer with a relatively large refractive index and a low refractive index layer with a relatively small refractive index in the thickness direction. In the anti-reflection layer, the net reflected light intensity is attenuated by the interference between the reflected light generated by the multiple interfaces of the multiple thin layers (high refractive index layer, low refractive index layer) contained in the anti-reflection layer. In addition, in the antireflection layer, by adjusting the optical film thickness (the product of the refractive index and the thickness) of each thin layer, the interference effect of attenuating the reflected light intensity can be exhibited. In the present embodiment, specifically, the
第1高折射率層21及第2高折射率層23分別包含波長550 nm下之折射率較佳為1.9以上之高折射率材料。要兼具高折射率與可見光之低吸收性,作為高折射率材料,例如可例舉氧化鈮(Nb
2O
5)、氧化鈦、氧化鋯、摻錫氧化銦(ITO)、及摻銻氧化錫(ATO),較佳為使用氧化鈮。
The first high-
第1高折射率層21之光學膜厚(折射率與厚度之積)例如為20 nm以上,且例如為55 nm以下。第2高折射率層23之光學膜厚例如為60 nm以上,且例如為330 nm以下。The optical film thickness (the product of the refractive index and the thickness) of the first high
第1低折射率層22及第2低折射率層24分別包含波長550 nm下之折射率較佳為1.6以下之低折射率材料。要兼具低折射率與可見光之低吸收性,作為低折射率材料,例如可例舉二氧化矽(SiO
2)及氟化鎂,較佳為使用二氧化矽。要確保第2低折射率層24與防污層30之密接性,亦較佳為使用二氧化矽作為第2低折射率層24之材料。
The first low-
第1低折射率層22之光學膜厚例如為15 nm以上,且例如為70 nm以下。第2低折射率層24之光學膜厚例如為100 nm以上,且例如為160 nm以下。The optical film thickness of the first low
又,光學功能層20中,第1高折射率層21之厚度例如為1 nm以上,較佳為5 nm以上,且例如為30 nm以下,較佳為20 nm以下。第1低折射率層22之厚度例如為10 nm以上,較佳為20 nm以上,且例如為50 nm以下,較佳為30 nm以下。第2高折射率層23之厚度例如為50 nm以上,較佳為80 nm以上,且例如為200 nm以下,較佳為150 nm以下。第2低折射率層24之厚度例如為60 nm以上,較佳為80 nm以上,且例如為150 nm以下,較佳為100 nm以下。In the optical
防污層30係光學膜F中具有防污功能之層,配置於光學功能層20之厚度方向D之一面上。防污層30於厚度方向D一側具有外表面31。防污層30之防污功能包括抑制使用光學膜F時手部油脂等污染物質附著於膜露出面之功能、以及使附著之污染物質容易被去除之功能。The
作為防污層30之材料,例如可例舉含氟基之有機化合物。作為含氟基之有機化合物,較佳為使用具有全氟聚醚基之烷氧基矽烷化合物。作為具有全氟聚醚基之烷氧基矽烷化合物,例如可例舉下述通式(1)所示之化合物。As the material of the
R 1-R 2-X-(CH 2) m-Si(OR 3) 3(1) R 1 -R 2 -X-(CH 2 ) m -Si(OR 3 ) 3 (1)
通式(1)中,R 1表示烷基中之一個以上之氫原子被氟原子取代之直鏈狀或支鏈狀之氟化烷基(碳數為例如1以上20以下),較佳為表示烷基之所有氫原子被氟原子取代之全氟烷基。 In the general formula (1), R 1 represents a linear or branched fluorinated alkyl group in which one or more hydrogen atoms in the alkyl group are substituted with a fluorine atom (the number of carbon atoms is, for example, 1 to 20), preferably Represents a perfluoroalkyl group in which all hydrogen atoms of an alkyl group are replaced by fluorine atoms.
R 2表示至少包含一個全氟聚醚(PFPE)基之重複結構的結構,較佳為表示包含兩個PFPE基之重複結構的結構。作為PFPE基之重複結構,例如可例舉直鏈狀PFPE基之重複結構及支鏈狀PFPE基之重複結構。作為直鏈狀PFPE基之重複結構,例如可例舉-(OC nF 2n) p-所示之結構(n表示1以上20以下之整數,p表示1以上50以下之整數。下同)。作為支鏈狀PFPE基之重複結構,例如可例舉-(OC(CF 3) 2) p-所示之結構及-(OCF 2CF(CF 3)CF 2) p-所示之結構。作為PFPE基之重複結構,較佳為可例舉直鏈狀PFPE基之重複結構,更佳為可例舉-(OCF 2) p-及-(OC 2F 4) p-。 R 2 represents a structure containing at least one repeating structure of a perfluoropolyether (PFPE) group, preferably a structure containing a repeating structure containing two PFPE groups. As a repeating structure of a PFPE group, the repeating structure of a linear PFPE group and the repeating structure of a branched PFPE group are mentioned, for example. The repeating structure of the linear PFPE group may, for example, be the structure represented by -(OC n F 2n ) p - (n represents an integer of 1 or more and 20 or less, and p represents an integer of 1 or more and 50 or less. The same applies hereinafter). Examples of the repeating structure of the branched PFPE group include a structure represented by -(OC(CF 3 ) 2 ) p - and a structure represented by -(OCF 2 CF(CF 3 )CF 2 ) p -. As the repeating structure of the PFPE group, the repeating structure of the linear PFPE group is preferably exemplified, and -(OCF 2 ) p - and -(OC 2 F 4 ) p - are more preferred.
R 3表示碳數1以上4以下烷基,較佳為表示甲基。 R 3 represents an alkyl group having 1 to 4 carbon atoms, preferably a methyl group.
X表示醚基、羰基、胺基或醯胺基,較佳為表示醚基。X represents an ether group, a carbonyl group, an amino group or an amide group, preferably an ether group.
m表示1以上之整數。又,m表示較佳為20以下、更佳為10以下、進而較佳為5以下之整數。m represents an integer of 1 or more. Moreover, m represents an integer which is preferably 20 or less, more preferably 10 or less, and still more preferably 5 or less.
此種具有全氟聚醚基之烷氧基矽烷化合物中,較佳為使用下述通式(2)所示之化合物。Among the alkoxysilane compounds having such a perfluoropolyether group, those represented by the following general formula (2) are preferably used.
CF 3-(OCF 2) q-(OC 2F 4) r-O-(CH 2) 3-Si(OCH 3) 3(2) CF 3 -(OCF 2 ) q -(OC 2 F 4 ) r -O-(CH 2 ) 3 -Si(OCH 3 ) 3 (2)
通式(2)中,q表示1以上50以下之整數,r表示1以上50以下之整數。In the general formula (2), q represents an integer of 1 or more and 50 or less, and r represents an integer of 1 or more and 50 or less.
又,具有全氟聚醚基之烷氧基矽烷化合物可單獨使用,亦可併用兩種以上。Moreover, the alkoxysilane compound which has a perfluoropolyether group may be used individually, and may use 2 or more types together.
於本實施方式中,防污層30係藉由乾式塗佈法形成之膜(乾式塗佈膜)。作為乾式塗佈法,可例舉濺鍍法、真空蒸鍍法、及CVD(Chemical Vapor Deposition,化學氣相沈積)。防污層30較佳為乾式塗佈膜,更佳為真空蒸鍍膜。In this embodiment, the
防污層30之材料含有具有全氟聚醚基之烷氧基矽烷化合物,且防污層30為乾式塗佈膜(較佳為真空蒸鍍膜),此構成適於確保防污層30對光學功能層20具有高接合力,因此,適於確保防污層30之耐剝離性。防污層30之耐剝離性較高,有助於維持防污層30之防污性能。The material of the
防污層30之厚度較佳為1 nm以上,更佳為2 nm以上,進而較佳為3 nm以上。防污層30之厚度較佳為100 nm以下,更佳為50 nm以下,進而較佳為30 nm以下。The thickness of the
防污層30之外表面31之水接觸角(純水接觸角)為110°以上,較佳為111°以上,更佳為112°以上,進而較佳為113°以上,尤其較佳為114°以上。外表面31之水接觸角如此高之構成適於實現防污層30之高防污性。該水接觸角例如為130°以下。藉由於防污層30之外表面31(露出表面)形成直徑2 mm以下之水滴(純水之液滴),測定該水滴相對於防污層30表面之接觸角而求出水接觸角。例如藉由調整防污層30之組成、外表面31之粗糙度、硬塗層12之組成、及硬塗層12之光學功能層20側之表面之粗糙度可調整外表面31之水接觸角。The water contact angle (pure water contact angle) of the
防污層30之外表面31之表面粗糙度Ra(算術平均表面粗糙度)較佳為1 nm以上,更佳為1.3 nm以上,進而較佳為2 nm以上。此種構成適於避免防污層30之外表面31之光澤感變得過強。該表面粗糙度Ra較佳為20 nm以下,更佳為18 nm以下,進而較佳為17 nm以下。此種構成對於光學膜F之光學特性與霧度而言較佳,例如於光學膜F設置於顯示器表面之情形時,適於抑制介隔該光學膜F觀察到之圖像之白暈(white blurring)。The surface roughness Ra (arithmetic mean surface roughness) of the
防污層30之全反射Y值較佳為1以下,更佳為0.9以下。防污層30之正反射Y值較佳為0.9以下,更佳為0.8以下。於光學膜F設置於顯示器表面之情形時,該等構成適於抑制背景映入該顯示器表面。The total reflection Y value of the
全反射Y值(Y
1)與正反射Y值(Y
2)之差ΔY(Y
1-Y
2)較佳為超過0.13,更佳為0.15以上,進而較佳為0.17以上。此種構成適於確保防污層30乃至光學膜F之防眩性。差ΔY較佳為0.8以下,更佳為0.7以下。於光學膜F設置於顯示器表面之情形時,此種構成適於抑制介隔該光學膜F觀察到之圖像之白暈。
The difference ΔY(Y 1 −Y 2 ) between the total reflection Y value (Y 1 ) and the regular reflection Y value (Y 2 ) is preferably more than 0.13, more preferably 0.15 or more, and still more preferably 0.17 or more. Such a configuration is suitable for securing the anti-glare properties of the
正反射Y值(Y
2)相對於全反射Y值(Y
1)之比率(Y
2/Y
1)較佳為0.15以上,更佳為0.18以上。於光學膜F設置於顯示器表面之情形時,此種構成適於抑制介隔該光學膜F觀察到之圖像之白暈。該比率(Y
2/Y
1)較佳為0.6以下,更佳為0.58以下。此種構成適於確保防污層30乃至光學膜F之防眩性。
The ratio (Y 2 /Y 1 ) of the regular reflection Y value (Y 2 ) to the total reflection Y value (Y 1 ) is preferably 0.15 or more, more preferably 0.18 or more. When the optical film F is disposed on the display surface, this configuration is suitable for suppressing the white halo of the image observed through the optical film F. The ratio (Y 2 /Y 1 ) is preferably 0.6 or less, more preferably 0.58 or less. Such a configuration is suitable for securing the anti-glare properties of the
防污層30之表面霧度(外部霧度)較佳為20%以下,更佳為10%以下。此種構成適於確保光學膜F之透明性。防污層30之表面霧度例如為0.01%以上。The surface haze (external haze) of the
準備透明基材10後,例如以輥對輥方式於透明基材10上依序積層密接層40、光學功能層20及防污層30,藉此可製作光學膜F。藉由於密接層40上依序積層第1高折射率層21、第1低折射率層22、第2高折射率層23及第2低折射率層24,可形成光學功能層20。After the
藉由於樹脂膜11上形成硬塗層12,可製作透明基材10。例如於樹脂膜11上,塗佈含有硬化性樹脂、及視需要而定之防眩性微粒子的硬化性樹脂組合物而形成塗膜後,使該塗膜硬化,藉此可形成硬塗層12。於硬化性樹脂組合物含有紫外線化型樹脂之情形時,藉由照射紫外線使上述塗膜硬化。於硬化性樹脂組合物含有熱硬化型樹脂之情形時,藉由加熱使上述塗膜硬化。The
視需要對形成於透明基材10上之硬塗層12之露出表面進行表面改質處理。於進行電漿處理作為表面改質處理之情形時,例如使用氬氣作為惰性氣體。又,電漿處理時之放電功率例如為10 W以上,且例如為10000 W以下。The exposed surface of the
藉由分別以乾式塗佈法成膜材料而可形成密接層40,第1高折射率層21、第1低折射率層22、第2高折射率層23及第2低折射率層24。作為乾式塗佈法,可例舉濺鍍法、真空蒸鍍法及CVD,較佳為使用濺鍍法。The
濺鍍法係於濺鍍室內在真空條件下一面導入氣體,一面對配置於陰極上之靶施加負電壓。藉此,產生輝光放電,使氣體原子離子化,使該氣體離子高速碰撞靶表面,使靶材料自靶表面彈出,使彈出之靶材料沈積於規定面上。形成金屬氧化物層時,就成膜速度之觀點而言,較佳為使用反應性濺鍍。反應性濺鍍係使用金屬靶作為靶,使用氬氣等惰性氣體與氧氣(反應性氣體)之混合氣體作為上述氣體。藉由調整惰性氣體與氧氣之流量比(sccm),可調整成膜之金屬氧化物層所含之氧之比率。In the sputtering method, a gas is introduced into a sputtering chamber under vacuum conditions, and a negative voltage is applied to a target arranged on a cathode. Thereby, a glow discharge is generated, gas atoms are ionized, the gas ions collide with the target surface at a high speed, the target material is ejected from the target surface, and the ejected target material is deposited on a predetermined surface. When forming the metal oxide layer, reactive sputtering is preferably used from the viewpoint of the film formation rate. In reactive sputtering, a metal target is used as a target, and a mixed gas of an inert gas such as argon and oxygen (reactive gas) is used as the gas. By adjusting the flow ratio (sccm) of inert gas and oxygen, the ratio of oxygen contained in the metal oxide layer to be formed can be adjusted.
用以實施濺鍍法之電源,例如可例舉DC電源(Direct Current,直流)、AC(Alternating Current,交流)電源、RF(Radio Frequency,射頻)電源、及MFAC(Medium Frequency Alternating Current,中波交流)電源。濺鍍法之放電電壓例如為200 V以上,且例如為1000 V以下。又,實施濺鍍法之濺鍍室內之成膜氣壓例如為0.01 Pa以上,且例如為2 Pa以下。The power source used to implement the sputtering method can be, for example, a DC power source (Direct Current, direct current), an AC (Alternating Current, alternating current) power source, an RF (Radio Frequency, radio frequency) power source, and a MFAC (Medium Frequency Alternating Current, medium wave) power source. AC) power supply. The discharge voltage of the sputtering method is, for example, 200 V or more and, for example, 1000 V or less. Moreover, the film-forming gas pressure in the sputtering chamber in which the sputtering method is performed is, for example, 0.01 Pa or more, and, for example, 2 Pa or less.
可藉由於光學功能層20上成膜例如含氟基之有機化合物而形成防污層30。作為防污層30之形成方法,可例舉乾式塗佈法。作為乾式塗佈法,例如可例舉真空蒸鍍法、濺鍍法及CVD,較佳為使用真空蒸鍍法。The
例如可以如上方式製造光學膜F。例如經由黏著劑將透明基材10側貼合於被黏著體來使用光學膜F。For example, the optical film F can be manufactured as described above. For example, the optical film F is used by bonding the
光學膜F亦可為抗反射膜以外之其他光學膜。作為光學膜,例如可例舉透明導電性膜及電磁波屏蔽膜。The optical film F may also be other optical films other than the antireflection film. As an optical film, a transparent conductive film and an electromagnetic wave shielding film are mentioned, for example.
於光學膜F為透明導電性膜之情形時,該光學膜F之光學功能層20例如朝向厚度方向D之一側依序具備第1介電薄膜、ITO膜等透明電極膜及第2介電膜。具有此種積層構成之光學功能層20兼具可見光透過性與導電性。When the optical film F is a transparent conductive film, for example, the optical
於光學膜F為電磁波屏蔽膜之情形時,該光學膜F之光學功能層20例如於厚度方向D上交替具備具有電磁波反射能之金屬薄膜及金屬氧化物膜。具有此種積層構成之光學功能層20兼具對於特定波長電磁波之屏蔽性與可見光透過性。When the optical film F is an electromagnetic wave shielding film, the
如圖2所示,光學膜F亦可具備配置於透明基材10在厚度方向D上之另一面之黏著劑層50。As shown in FIG. 2 , the optical film F may also include the
黏著劑層50係由黏著性組合物形成之層,且具有光透過性。黏著性組合物至少含有使黏著劑層50表現出黏著性之基底聚合物。作為基底聚合物,例如可例舉丙烯酸聚合物、橡膠系聚合物、聚矽氧系聚合物、胺基甲酸酯系聚合物、聚酯系聚合物、及聚醯胺系聚合物。要同時實現對光學膜F之黏著劑層50所要求之黏著力與高透明性,較佳為使用丙烯酸聚合物作為基底聚合物。The
於光學膜F中,要實現對被黏著體之充分黏著力,黏著劑層50之厚度較佳為5 μm以上,更佳為10 μm以上,更佳為15 μm以上。又,就確保透明性之觀點而言,黏著劑層50之厚度較佳為300 μm以下,更佳為200 μm以下,進而較佳為100 μm以下。In the optical film F, in order to achieve sufficient adhesion to the adherend, the thickness of the
圖2所示之光學膜F例如可以如下方式製造。首先,於剝離襯墊上塗佈黏著性組合物,形成塗膜。其次,視需要使剝離襯墊上之塗膜乾燥。藉此,於剝離襯墊上形成黏著劑層50。其次,將黏著劑層50之露出面與圖1所示之光學膜F在透明基材10之厚度方向D上之另一面(圖1中為下表面)貼合。例如以此種方式可製造圖2所示之光學膜F。The optical film F shown in FIG. 2 can be manufactured as follows, for example. First, the adhesive composition is coated on the release liner to form a coating film. Next, the coating film on the release liner is dried as necessary. Thereby, the
於光學膜F具備黏著劑層50之情形時,貼合於被黏著體時無須另外使用接著劑。
[實施例]
When the optical film F is provided with the
以下示出實施例對本發明進行具體說明。本發明並不限定於實施例。又,以下記載之調配量(含量)、物性值、參數等具體數值可替換為上述「實施方式」中記載之與其對應之調配量(含量)、物性值、參數等相當記載之上限(定義為「以下」或「未達」之數值)或下限(定義為「以上」或「超過」之數值)。The present invention will be specifically described below with reference to Examples. The present invention is not limited to the Examples. In addition, the specific numerical values such as the compounding amount (content), physical property value, parameter, etc. described below can be replaced by the corresponding compounding amount (content), physical property value, parameter, etc. described in the above-mentioned "Embodiment". "under" or "under" value) or lower limit (defined as "above" or "over" value).
[實施例1] 首先,於作為透明樹脂膜之三乙醯纖維素(TAC)膜(厚度80 μm)之單面,形成防眩性之硬塗層(硬塗層形成步驟)。於本步驟中,首先,將以下成分混合,製備固形物成分濃度55質量%之組合物(清漆):紫外線硬化型胺基甲酸酯丙烯酸酯(商品名「UV1700TL」,日本合成化學工業公司製造)50質量份、紫外線硬化型多官能丙烯酸酯(商品名「Viscoat#300」,主成分為季戊四醇三丙烯酸酯,大阪有機化學工業公司製造)50質量份、作為防眩性微粒子之聚甲基丙烯酸甲酯粒子(商品名「Techpolymer」,平均粒徑3 μm,折射率1.525,積水化成品工業公司製造)3質量份、作為防眩性微粒子之聚矽氧粒子(商品名「Tospearl 130」,平均粒徑3 μm,折射率1.42,Momentive Performance Materials Japan公司製造)1.5質量份、觸變性賦予劑(商品名「Lucentite SAN」,作為有機黏土之合成膨潤石,CO-OP. CHEMICAL公司製造)1.5質量份、光聚合起始劑(商品名「OMNIRAD907」,BASF公司製造)3質量份、調平劑(商品名「LE303」,共榮社化學公司製造)0.15質量份、甲苯-乙酸乙酯-環戊酮混合溶劑(質量比35:41:24)。混合係使用超音波分散機。其次,於上述TAC膜之單面塗佈組合物,形成塗膜。其次,藉由照射紫外線使該塗膜硬化後,藉由加熱使其乾燥。照射紫外線時,使用高壓水銀燈作為光源,使用波長365 nm之紫外線,累計照射光量設為300 mJ/cm 2。又,加熱溫度設為80℃,加熱時間設為60秒。藉此,於TAC膜上形成厚度8 μm之防眩性硬塗層(第1HC層)。 [Example 1] First, an anti-glare hard coat layer (hard coat layer forming step) was formed on one side of a triacetate cellulose (TAC) film (thickness 80 μm) as a transparent resin film. In this step, first, the following components were mixed to prepare a composition (varnish) with a solid content concentration of 55% by mass: UV-curable urethane acrylate (trade name "UV1700TL", manufactured by Nippon Synthetic Chemical Industry Co., Ltd. ) 50 parts by mass, UV-curable polyfunctional acrylate (trade name "Viscoat #300", the main component is pentaerythritol triacrylate, manufactured by Osaka Organic Chemical Industry Co., Ltd.) 50 parts by mass, polymethacrylic acid as anti-glare fine particles 3 parts by mass of methyl ester particles (trade name "Techpolymer", average particle size 3 μm, refractive index 1.525, manufactured by Sekisui Chemical Industry Co., Ltd.), polysiloxane particles as anti-glare fine particles (trade name "Tospearl 130", average Particle size 3 μm, refractive index 1.42, manufactured by Momentive Performance Materials Japan) 1.5 parts by mass, thixotropy imparting agent (trade name “Lucentite SAN”, synthetic bentonite as organoclay, manufactured by CO-OP. CHEMICAL Co., Ltd.) 1.5 mass part, 3 parts by mass of a photopolymerization initiator (trade name "OMNIRAD907", manufactured by BASF Corporation), 0.15 mass part of a leveling agent (trade name "LE303", manufactured by Kyoeisha Chemical Co., Ltd.), toluene-ethyl acetate-cyclic Pentanone mixed solvent (mass ratio 35:41:24). The mixing system uses an ultrasonic disperser. Next, the composition is applied to one side of the above-mentioned TAC film to form a coating film. Next, after hardening this coating film by irradiating an ultraviolet-ray, it is made to dry by heating. When irradiating ultraviolet rays, a high-pressure mercury lamp was used as a light source, and ultraviolet rays with a wavelength of 365 nm were used, and the cumulative irradiation light amount was set to 300 mJ/cm 2 . In addition, the heating temperature was 80 degreeC, and the heating time was 60 second. Thereby, an anti-glare hard coat layer (1st HC layer) with a thickness of 8 μm was formed on the TAC film.
其次,藉由輥對輥方式之電漿處理裝置,於1.0 Pa之真空環境下對附HC層之TAC膜之HC層表面進行電漿處理。該電漿處理中,使用氬氣作為惰性氣體,將放電功率設為2400 W。Next, plasma treatment was performed on the surface of the HC layer of the TAC film with the HC layer in a vacuum environment of 1.0 Pa by means of a roll-to-roll plasma treatment device. In this plasma treatment, argon gas was used as an inert gas, and the discharge power was set to 2400 W.
其次,於電漿處理後之附HC層之TAC膜之HC層上依序形成密接層與抗反射層(濺鍍成膜步驟)。具體而言,藉由輥對輥方式之濺鍍成膜裝置,於電漿處理後之附HC層之TAC膜之HC層上,依序形成作為密接層之厚度3.5 nm之SiOx層(x<2)、作為第1高折射率層之厚度12 nm之Nb 2O 5層、作為第1低折射率層之厚度28 nm之SiO 2層、作為第2高折射率層之厚度100 nm之Nb 2O 5層、作為第2低折射率層之厚度85 nm之SiO 2層。形成密接層時,使用Si靶,使用氬氣作為作為惰性氣體,使用氧氣作為相對於氬氣100體積份為3體積份之反應性氣體,將放電電壓設為520 V,將成膜室內之氣壓(成膜氣壓)設為0.27 Pa,藉由MFAC濺鍍成膜SiOx層(x<2)。形成第1高折射率層時,使用Nb靶,使用100體積份之氬氣及5體積份之氧氣,將放電電壓設為415 V,將成膜氣壓設為0.42 Pa,藉由MFAC濺鍍成膜Nb 2O 5層。形成第1低折射率層時,使用Si靶,使用100體積份之氬氣及30體積份之氧氣,將放電電壓設為350 V,將成膜氣壓設為0.3 Pa,藉由MFAC濺鍍成膜SiO 2層。形成第2高折射率層時,使用Nb靶,使用100體積份之氬氣及13體積份之氧氣,將放電電壓設為460 V,將成膜氣壓設為0.5 Pa,藉由MFAC濺鍍成膜Nb 2O 5層。形成第2低折射率層時,使用Si靶,使用100體積份之氬氣及30體積份之氧氣,將放電電壓設為340 V,將成膜氣壓設為0.25 Pa,藉由MFAC濺鍍成膜SiO 2層。以如上方式,經由密接層於附HC層之TAC膜之HC層上積層形成抗反射層(第1高折射率層、第1低折射率層、第2高折射率層、第2低折射率層)。 Next, an adhesion layer and an anti-reflection layer are sequentially formed on the HC layer of the TAC film attached with the HC layer after the plasma treatment (sputtering film forming step). Specifically, a 3.5 nm-thick SiOx layer (x< 2) Nb 2 O 5 layer with a thickness of 12 nm as the first high refractive index layer, SiO 2 layer with a thickness of 28 nm as the first low refractive index layer, and Nb with a thickness of 100 nm as the second high refractive index layer 2 O 5 layer, SiO 2 layer with a thickness of 85 nm as the second low refractive index layer. When forming the adhesion layer, a Si target was used, argon was used as an inert gas, and oxygen was used as a reactive gas of 3 parts by volume relative to 100 parts by volume of argon, the discharge voltage was set to 520 V, and the gas pressure in the film-forming chamber was adjusted to The (film formation pressure) was set to 0.27 Pa, and a SiOx layer (x<2) was formed by MFAC sputtering. When forming the first high refractive index layer, a Nb target was used, 100 parts by volume of argon gas and 5 parts by volume of oxygen gas were used, the discharge voltage was set to 415 V, and the film-forming gas pressure was set to 0.42 Pa, and sputtered by MFAC. Membrane Nb2O5 layer. When forming the first low refractive index layer, a Si target was used, 100 parts by volume of argon gas and 30 parts by volume of oxygen gas were used, the discharge voltage was set to 350 V, and the film-forming pressure was set to 0.3 Pa, and sputtered by MFAC. film SiO 2 layer. When forming the second high refractive index layer, a Nb target was used, 100 parts by volume of argon gas and 13 parts by volume of oxygen gas were used, the discharge voltage was set to 460 V, and the film-forming gas pressure was set to 0.5 Pa, and sputtered by MFAC. Membrane Nb2O5 layer. When forming the second low-refractive index layer, a Si target was used, 100 parts by volume of argon gas and 30 parts by volume of oxygen gas were used, the discharge voltage was set to 340 V, and the film formation pressure was set to 0.25 Pa, and sputtered by MFAC. film SiO 2 layer. In the above manner, an anti-reflection layer (the first high refractive index layer, the first low refractive index layer, the second high refractive index layer, the second low refractive index layer) is formed by lamination on the HC layer of the TAC film with the HC layer via the adhesion layer. Floor).
其次,於形成之抗反射層上形成防污層(防污層形成步驟)。具體而言,藉由使用含全氟聚醚基之烷氧基矽烷化合物作為蒸鍍源之真空蒸鍍法,於抗反射層上形成厚度7 nm之防污層。蒸鍍源係將大金工業公司製造之「OPTOOL UD509」(上述通式(2)所示之含全氟聚醚基之烷氧基矽烷化合物,固形物成分濃度20質量%)乾燥所得之固形物成分。又,真空蒸鍍法之蒸鍍源之加熱溫度設為260℃。Next, an antifouling layer is formed on the formed antireflection layer (antifouling layer forming step). Specifically, an antifouling layer with a thickness of 7 nm was formed on the antireflection layer by a vacuum evaporation method using an alkoxysilane compound containing a perfluoropolyether group as an evaporation source. The vapor deposition source is a solid obtained by drying "OPTOOL UD509" (a perfluoropolyether group-containing alkoxysilane compound represented by the above general formula (2),
以如上方式製作實施例1之光學膜。實施例1之光學膜朝向厚度方向一側依序具備透明基材(樹脂膜、硬塗層)、密接層、抗反射層、防污層。The optical film of Example 1 was produced in the above manner. The optical film of Example 1 includes a transparent substrate (resin film, hard coat layer), an adhesive layer, an antireflection layer, and an antifouling layer in this order toward one side in the thickness direction.
[實施例2] 使用將大金工業公司製造之「OPTOOL UD120」(含全氟聚醚基之烷氧基矽烷化合物)乾燥所得之固形物成分作為防污層形成步驟中之蒸鍍源,除此以外,以與實施例1之光學膜同樣之方式製作實施例2之光學膜。 [Example 2] The solid content obtained by drying "OPTOOL UD120" (perfluoropolyether group-containing alkoxysilane compound) manufactured by Daikin Industries Co., Ltd. was used as a vapor deposition source in the antifouling layer formation step, and other than that The optical film of Example 1 was produced in the same manner as the optical film of Example 2.
[實施例3] 首先,於作為透明樹脂膜之三乙醯纖維素(TAC)膜(厚度80 μm)之單面,形成防眩性之硬塗層(硬塗層形成步驟)。於本步驟中,首先,將以下成分混合,製備固形物成分濃度55質量%之組合物(清漆):紫外線硬化型丙烯酸單體(商品名「GRANDIC PC-1070」,DIC公司製造)100質量份、含有奈米氧化矽粒子作為防眩性微粒子之有機氧化矽凝膠(商品名「MEK-ST-L」,奈米氧化矽粒子之平均一次粒徑為50 nm,固形物成分濃度30質量%,日產化學公司製造)25質量份(奈米氧化矽粒子換算量)、觸變性賦予劑(商品名「Lucentite SAN」,作為有機黏土之合成膨潤石,CO-OP. CHEMICAL公司製造)1.5質量份、光聚合起始劑(商品名「OMNIRAD907」,BASF公司製造)3質量份、調平劑(商品名「LE303」,共榮社化學公司製造)0.15質量份。混合時使用超音波分散機。其次,於上述TAC膜之單面塗佈組合物,形成塗膜。其次,藉由照射紫外線使該塗膜硬化後,藉由加熱使其乾燥。照射紫外線時,使用高壓水銀燈作為光源,使用波長365 nm之紫外線,累計照射光量設為200 mJ/cm 2。又,加熱時間設為80℃,加熱溫度設為3分鐘。藉此,於TAC膜上形成厚度6 μm之防眩性硬塗層(第2HC層)。 [Example 3] First, an anti-glare hard coat layer (hard coat layer forming step) was formed on one side of a triacetyl cellulose (TAC) film (thickness 80 μm) as a transparent resin film. In this step, first, the following components were mixed to prepare a composition (varnish) with a solid content concentration of 55% by mass: 100 parts by mass of an ultraviolet curable acrylic monomer (trade name "GRANDIC PC-1070", manufactured by DIC Corporation) , Organic silica gel containing nano-silica particles as anti-glare fine particles (trade name "MEK-ST-L", the average primary particle size of the nano-silica particles is 50 nm, and the solid content concentration is 30% by mass , Nissan Chemical Co., Ltd.) 25 parts by mass (in terms of nanosilica particles), thixotropy imparting agent (trade name "Lucentite SAN", synthetic bentonite as organoclay, manufactured by CO-OP. CHEMICAL Co., Ltd.) 1.5 parts by mass , 3 parts by mass of a photopolymerization initiator (trade name "OMNIRAD907", manufactured by BASF Corporation), and 0.15 parts by mass of a leveling agent (trade name "LE303", manufactured by Kyoeisha Chemical Co., Ltd.). Use an ultrasonic disperser when mixing. Next, the composition is applied to one side of the above-mentioned TAC film to form a coating film. Next, after hardening this coating film by irradiating an ultraviolet-ray, it is made to dry by heating. When irradiating ultraviolet rays, a high-pressure mercury lamp was used as a light source, and ultraviolet rays with a wavelength of 365 nm were used, and the cumulative irradiation light amount was set to 200 mJ/cm 2 . Moreover, the heating time was set to 80 degreeC, and the heating temperature was set to 3 minutes. Thereby, an anti-glare hard coat layer (2nd HC layer) with a thickness of 6 μm was formed on the TAC film.
其次,藉由輥對輥方式之電漿處理裝置,於1.0 Pa之真空環境下對附HC層之TAC膜之HC層表面進行電漿處理。該電漿處理中,使用氬氣作為惰性氣體,將放電功率設為150 W。Next, plasma treatment was performed on the surface of the HC layer of the TAC film with the HC layer in a vacuum environment of 1.0 Pa by means of a roll-to-roll plasma treatment device. In this plasma treatment, argon gas was used as an inert gas, and the discharge power was set to 150 W.
其次,於電漿處理後之附HC層之TAC膜之HC層上依序形成密接層與抗反射層(濺鍍成膜步驟)。具體而言,藉由輥對輥方式之濺鍍成膜裝置,於電漿處理後之附HC層之TAC膜之HC層上,依序形成作為密接層之厚度1.5 nm之銦錫氧化物(ITO)層、作為第1高折射率層之厚度12 nm之Nb 2O 5層、作為第1低折射率層之厚度28 nm之SiO 2層、作為第2高折射率層之厚度100 nm之Nb 2O 5層、作為第2低折射率層之厚度85 nm之SiO 2層。形成密接層時,使用ITO靶,使用氬氣作為惰性氣體,使用相對於氬氣100體積份為10體積份之氧氣作為反應性氣體,將放電電壓設為400 V,將成膜室內之氣壓(成膜氣壓)設為0.2 Pa,藉由MFAC濺鍍成膜ITO層。本實施例中之第1高折射率層、第1低折射率層、第2高折射率層及第2低折射率層之形成條件與實施例1中之第1高折射率層、第1低折射率層、第2高折射率層及第2低折射率層之上述形成條件相同。 Next, an adhesion layer and an anti-reflection layer are sequentially formed on the HC layer of the TAC film attached with the HC layer after the plasma treatment (sputtering film forming step). Specifically, on the HC layer of the TAC film with the HC layer attached after the plasma treatment, indium tin oxide ( ITO) layer, Nb 2 O 5 layer with a thickness of 12 nm as the first high refractive index layer, SiO 2 layer with a thickness of 28 nm as the first low refractive index layer, and a thickness of 100 nm as the second high refractive index layer Nb 2 O 5 layer, SiO 2 layer with a thickness of 85 nm as the second low refractive index layer. When forming the adhesion layer, an ITO target was used, argon was used as an inert gas, and 10 parts by volume of oxygen was used as a reactive gas relative to 100 parts by volume of argon, and the discharge voltage was set to 400 V, and the pressure in the film-forming chamber ( The film forming pressure) was set to 0.2 Pa, and the ITO layer was formed by MFAC sputtering. The formation conditions of the first high refractive index layer, the first low refractive index layer, the second high refractive index layer and the second low refractive index layer in this example are the same as those of the first high refractive index layer and the first high refractive index layer in Example 1. The above-mentioned formation conditions of the low-refractive index layer, the second high-refractive-index layer, and the second low-refractive index layer are the same.
其次,於形成之抗反射層上形成防污層(防污層形成步驟)。具體而言,與實施例1中之防污層形成步驟相同(使用將大金工業公司製造之「OPTOOL UD509」乾燥所得之固形物成分作為蒸鍍源)。Next, an antifouling layer is formed on the formed antireflection layer (antifouling layer forming step). Specifically, the steps of forming the antifouling layer were the same as those in Example 1 (the solid content obtained by drying "OPTOOL UD509" manufactured by Daikin Industries, Ltd. was used as a vapor deposition source).
以如上方式製作實施例3之光學膜。實施例3之光學膜朝向厚度方向一側依序具備透明基材(樹脂膜、硬塗層)、密接層、抗反射層、防污層。The optical film of Example 3 was produced in the above manner. The optical film of Example 3 includes a transparent substrate (resin film, hard coat layer), an adhesive layer, an antireflection layer, and an antifouling layer in this order toward one side in the thickness direction.
[實施例4] 使用將大金工業公司製造之「OPTOOLUD120」(含全氟聚醚基之烷氧基矽烷化合物)乾燥所得之固形物成分作為防污層形成步驟中之蒸鍍源,除此以外,以與實施例3之光學膜同樣之方式製作實施例4之光學膜。 [Example 4] In addition to using the solid content obtained by drying "OPTOOLUD120" (perfluoropolyether group-containing alkoxysilane compound) manufactured by Daikin Industries, Ltd. as a vapor deposition source in the antifouling layer formation step, The optical film of Example 3 was produced in the same manner as the optical film of Example 4.
[實施例5] 使用將信越化學工業公司製造之「KY-1901」(含全氟聚醚基之烷氧基矽烷化合物)乾燥所得之固形物成分作為防污層形成步驟中之蒸鍍源,除此以外,以與實施例3之光學膜同樣之方式製作實施例5之光學膜。 [Example 5] The solid content obtained by drying "KY-1901" (perfluoropolyether group-containing alkoxysilane compound) manufactured by Shin-Etsu Chemical Co., Ltd. was used as a vapor deposition source in the antifouling layer forming step. The optical film of Example 5 was produced in the same manner as the optical film of Example 3.
[實施例6] 除硬塗層形成步驟及防污層形成步驟以外,以實施例3之光學膜同樣之方式製作實施例6之光學膜。 [Example 6] The optical film of Example 6 was produced in the same manner as the optical film of Example 3 except for the step of forming a hard coat layer and the step of forming an antifouling layer.
實施例6之硬塗層形成步驟中,首先,將以下成分混合,製備固形物成分濃度45質量%之組合物(清漆):含奈米氧化矽粒子之丙烯酸單體組合物(商品名「NC035」,奈米氧化矽粒子之平均一次粒徑為40 nm,固形物成分濃度50質量%,固形物成分中奈米氧化矽粒子之比率為60質量%,荒川化學工業公司製造)67質量份、紫外線硬化型多官能丙烯酸酯(商品名「Binder A」,固形物成分濃度100質量%,荒川化學工業公司製造)33質量份、作為防眩性微粒子之聚甲基丙烯酸甲酯粒子(商品名「Techpolymer」,平均粒徑3 μm,折射率1.525,積水化成品工業公司製造)3質量份、作為防眩性微粒子之聚矽氧粒子(商品名「Tospearl 130」,平均粒徑3 μm,折射率1.42,Momentive Performance Materials Japan公司製造)1.5質量份、觸變性賦予劑(商品名「Lucentite SAN」,作為有機黏土之合成膨潤石,CO-OP. CHEMICAL公司製造)1.5質量份、光聚合起始劑(商品名「OMNIRAD907」,BASF公司製造)3質量份、調平劑(商品名「LE303」,共榮社化學公司製造)0.15質量份、甲苯。混合時使用超音波分散機。其次,於上述TAC膜之單面塗佈組合物,形成塗膜。其次,藉由照射紫外線使該塗膜硬化後,藉由加熱使其乾燥。照射紫外線時,使用高壓水銀燈作為光源,使用波長365 nm之紫外線,累計照射光量設為200 mJ/cm 2。又,加熱時間設為60℃,加熱溫度設為60秒。藉此,於TAC膜上形成厚度7 μm之防眩性硬塗層(第3HC層)。 In the hard coat layer forming step of Example 6, first, the following components were mixed to prepare a composition (varnish) with a solid content concentration of 45% by mass: an acrylic monomer composition containing nanosilica particles (trade name "NC035") ”, the average primary particle size of the nano-silica particles is 40 nm, the solid content concentration is 50 mass %, and the ratio of the nano-silica particles in the solid content is 60 mass %, manufactured by Arakawa Chemical Industry Co., Ltd.) 67 parts by mass, UV-curable polyfunctional acrylate (trade name "Binder A", solid content concentration 100% by mass, manufactured by Arakawa Chemical Industry Co., Ltd.) 33 parts by mass, polymethyl methacrylate particles as anti-glare fine particles (trade name " Techpolymer”, average particle size 3 μm, refractive index 1.525, manufactured by Sekisui Chemical Industry Co., Ltd.) 3 parts by mass, polysiloxane particles as anti-glare fine particles (trade name “Tospearl 130”, average particle size 3 μm, refractive index 1.42, manufactured by Momentive Performance Materials Japan Co., Ltd.) 1.5 parts by mass, thixotropy imparting agent (trade name "Lucentite SAN", synthetic bentonite as organoclay, manufactured by CO-OP. CHEMICAL Co., Ltd.) 1.5 parts by mass, photopolymerization initiator (trade name "OMNIRAD907", manufactured by BASF Corporation) 3 parts by mass, leveling agent (trade name "LE303", manufactured by Kyoeisha Chemical Co., Ltd.) 0.15 parts by mass, and toluene. Use an ultrasonic disperser when mixing. Next, the composition is applied to one side of the above-mentioned TAC film to form a coating film. Next, after hardening this coating film by irradiating an ultraviolet-ray, it is made to dry by heating. When irradiating ultraviolet rays, a high-pressure mercury lamp was used as a light source, and ultraviolet rays with a wavelength of 365 nm were used, and the cumulative irradiation light amount was set to 200 mJ/cm 2 . In addition, the heating time was made into 60 degreeC, and the heating temperature was made into 60 second. Thereby, an anti-glare hard coat layer (3rd HC layer) with a thickness of 7 μm was formed on the TAC film.
於實施例6之防污層形成步驟中,使用將大金工業公司製造之「OPTOOLUD120」(含全氟聚醚基之烷氧基矽烷化合物)乾燥所得之固形物成分作為蒸鍍源。In the antifouling layer forming step of Example 6, the solid content obtained by drying "OPTOOLUD120" (perfluoropolyether group-containing alkoxysilane compound) manufactured by Daikin Industries, Ltd. was used as a vapor deposition source.
[實施例7] 使用將信越化學工業公司製造之「KY-1901」(含全氟聚醚基之烷氧基矽烷化合物)乾燥所得之固形物成分作為防污層形成步驟中之蒸鍍源,除此以外,以與實施例6之光學膜同樣之方式製作實施例7之光學膜。 [Example 7] The solid content obtained by drying "KY-1901" (perfluoropolyether group-containing alkoxysilane compound) manufactured by Shin-Etsu Chemical Co., Ltd. was used as a vapor deposition source in the antifouling layer forming step. The optical film of Example 7 was produced in the same manner as the optical film of Example 6.
[實施例8] 除硬塗層形成步驟及防污層形成步驟以外,以與實施例3之光學膜同樣之方式製作實施例8之光學膜。 [Example 8] The optical film of Example 8 was produced in the same manner as the optical film of Example 3 except for the hard coat layer forming step and the antifouling layer forming step.
實施例8之硬塗層形成步驟中,首先,將以下成分混合,製備固形物成分濃度42質量%之組合物(清漆):含奈米氧化矽粒子之丙烯酸單體組合物(商品名「NC035HS」,奈米氧化矽粒子之平均一次粒徑為40 nm,固形物成分濃度50質量%,固形物成分中奈米氧化矽粒子之比率為60質量%,荒川化學工業公司製造)83質量份、紫外線硬化型多官能胺基甲酸酯丙烯酸酯(商品名「BEAMSET 580」,固形物成分濃度70質量%,荒川化學工業公司製造)17質量份、作為防眩性微粒子之聚甲基丙烯酸甲酯粒子(商品名「Techpolymer」,平均粒徑3 μm,折射率1.495,積水化成品工業公司製造)4質量份、作為防眩性微粒子之聚矽氧粒子(商品名「Tospearl 130」,平均粒徑3 μm,折射率1.42,Momentive Performance Materials Japan公司製造)0.1質量份、觸變性賦予劑(商品名「Lucentite SAN」,作為有機黏土之合成膨潤石,CO-OP. CHEMICAL公司製造)2.0質量份、光聚合起始劑(商品名「OMNIRAD907」,BASF公司製造)3質量份、調平劑(商品名「LE303」,共榮社化學公司製造)0.15質量份、乙酸丁酯。混合時使用超音波分散機。其次,於上述TAC膜之單面塗佈組合物,形成塗膜。其次,藉由照射紫外線使該塗膜硬化後,藉由加熱使其乾燥。照射紫外線時,使用高壓水銀燈作為光源,使用波長365 nm之紫外線,累計照射光量設為200 mJ/cm 2。又,加熱時間設為60℃,加熱溫度設為60秒。藉此,於TAC膜上形成厚度8 μm之防眩性硬塗層(第4HC層)。 In the hard coat layer forming step of Example 8, first, the following components were mixed to prepare a composition (varnish) with a solid content concentration of 42% by mass: an acrylic monomer composition containing nano-silica particles (trade name "NC035HS") ”, the average primary particle size of the nano-silica particles is 40 nm, the solid content concentration is 50 mass %, and the ratio of the nano-silica particles in the solid content is 60 mass %, manufactured by Arakawa Chemical Industry Co., Ltd.) 83 parts by mass, UV-curable polyfunctional urethane acrylate (trade name "BEAMSET 580", solid content concentration 70% by mass, manufactured by Arakawa Chemical Industry Co., Ltd.) 17 parts by mass, polymethyl methacrylate as anti-glare fine particles Particles (trade name "Techpolymer", average particle size 3 μm, refractive index 1.495, manufactured by Sekisui Chemical Industry Co., Ltd.) 4 parts by mass, polysiloxane particles as anti-glare fine particles (trade name "Tospearl 130", average particle size 3 μm, refractive index 1.42, manufactured by Momentive Performance Materials Japan) 0.1 part by mass, thixotropy imparting agent (trade name “Lucentite SAN”, synthetic bentonite as organoclay, manufactured by CO-OP. CHEMICAL Co., Ltd.) 2.0 parts by mass, 3 parts by mass of a photopolymerization initiator (trade name "OMNIRAD907", manufactured by BASF Corporation), 0.15 parts by mass of a leveling agent (trade name "LE303", manufactured by Kyōeisha Chemical Co., Ltd.), and butyl acetate. Use an ultrasonic disperser when mixing. Next, the composition is applied to one side of the above-mentioned TAC film to form a coating film. Next, after hardening this coating film by irradiating an ultraviolet-ray, it is made to dry by heating. When irradiating ultraviolet rays, a high-pressure mercury lamp was used as a light source, and ultraviolet rays with a wavelength of 365 nm were used, and the cumulative irradiation light amount was set to 200 mJ/cm 2 . In addition, the heating time was made into 60 degreeC, and the heating temperature was made into 60 second. Thereby, an anti-glare hard coat layer (4th HC layer) with a thickness of 8 μm was formed on the TAC film.
實施例8之防污層形成步驟中,使用信越化學工業公司製造之「KY-1903-1」(含全氟聚醚基之烷氧基矽烷化合物)乾燥所得之固形物成分作為蒸鍍源。In the antifouling layer forming step of Example 8, the solid content obtained by drying "KY-1903-1" (perfluoropolyether group-containing alkoxysilane compound) manufactured by Shin-Etsu Chemical Co., Ltd. was used as a vapor deposition source.
[比較例1] 除防污層形成步驟以外,以與實施例1之光學膜同樣之方式製作比較例1之光學膜。 [Comparative Example 1] Except for the antifouling layer forming step, the optical film of Comparative Example 1 was produced in the same manner as the optical film of Example 1.
比較例1之防污層形成步驟中,首先,用稀釋溶劑(商品名「Fluorinert」,3M公司製造)將作為塗佈劑之「OPTOOL UD509」(大金工業公司製造)稀釋,製備固形物成分濃度0.1質量%之塗佈液。其次,藉由凹版塗佈,將塗佈液塗佈於藉由濺鍍成膜步驟形成之抗反射層之上,形成塗膜。其次,藉由於60℃下對該塗膜進行2分鐘加熱而使其乾燥。藉此,於抗反射層上形成厚度7 nm之防污層。In the antifouling layer forming step of Comparative Example 1, first, "OPTOOL UD509" (manufactured by Daikin Industries, Ltd.) as a coating agent was diluted with a diluting solvent (trade name "Fluorinert", manufactured by 3M Corporation) to prepare a solid content Coating liquid with a concentration of 0.1% by mass. Next, by gravure coating, the coating liquid is coated on the antireflection layer formed by the sputtering film-forming step to form a coating film. Next, the coating film was dried by heating at 60°C for 2 minutes. Thereby, an antifouling layer with a thickness of 7 nm was formed on the antireflection layer.
<水接觸角> 對於實施例1~8及比較例1之各光學膜,調查防污層表面之水接觸角。首先,藉由對光學膜之防污層表面滴加約1 μL之純水而形成水滴。其次,測定防污層表面上之水滴之表面與防污層表面所成之角度。測定時使用接觸角計(商品名「DMo-501」,協和界面科學公司製造)。將其測定結果示於表1中。 <Water Contact Angle> For each of the optical films of Examples 1 to 8 and Comparative Example 1, the water contact angle on the surface of the antifouling layer was investigated. First, water droplets were formed by dropping about 1 μL of pure water on the surface of the antifouling layer of the optical film. Next, the angle formed by the surface of the water droplet on the surface of the antifouling layer and the surface of the antifouling layer was measured. A contact angle meter (trade name "DMo-501", manufactured by Kyowa Interface Science Co., Ltd.) was used for the measurement. The measurement results are shown in Table 1.
<表面粗糙度Ra> 對於實施例1~8及比較例1之各光學膜,調查防污層之表面粗糙度Ra。具體而言,藉由原子力顯微鏡(商品名「SPI3800」,Seiko Instruments公司製造)觀察各光學膜之防污層表面,於1 μm見方之觀察像中求出表面粗糙度Ra(算術平均粗糙度)。將其結果示於表1中。 <Surface Roughness Ra> For each of the optical films of Examples 1 to 8 and Comparative Example 1, the surface roughness Ra of the antifouling layer was investigated. Specifically, the surface of the antifouling layer of each optical film was observed with an atomic force microscope (trade name "SPI3800", manufactured by Seiko Instruments Co., Ltd.), and the surface roughness Ra (arithmetic mean roughness) was determined from the observed image of 1 μm square. . The results are shown in Table 1.
<全反射及正反射> 對於實施例1~8及比較例1之各光學膜,以如下方式測定全反射Y值及正反射Y值。 <Total reflection and regular reflection> About each optical film of Examples 1-8 and the comparative example 1, the total reflection Y value and the regular reflection Y value were measured as follows.
首先,藉由黏著劑將自光學膜切出之樣本膜(50 mm×50 mm)之透明基材側貼合於黑壓克力板。其次,對於貼合於黑壓克力板之樣本,使用分光光度計(商品名「U-4100」,日立高新技術公司製造)實施全反射測定。基於藉由該測定所得之波長380~780 nm下之分光反射率與CIE標準光源D65之相對分光分佈,計算JIS Z8701所規定之XYZ表色系統中由反射所得之物體顏色之三刺激值Y,從而求出全反射Y值。First, the transparent substrate side of the sample film (50 mm×50 mm) cut out from the optical film was attached to a black acrylic plate by an adhesive. Next, the total reflection measurement was carried out using a spectrophotometer (trade name "U-4100", manufactured by Hitachi High-Technology Co., Ltd.) about the sample attached to the black acrylic sheet. Based on the spectral reflectance at the wavelength of 380-780 nm obtained by this measurement and the relative spectral distribution of the CIE standard light source D65, calculate the tristimulus value Y of the object color obtained by reflection in the XYZ color system specified in JIS Z8701, Thereby, the total reflection Y value is obtained.
又,對於貼合於黑壓克力板之上述樣本,使用分光光度計(商品名「U-4100」),於使用U-4100附屬之治具去除散亂光之狀態下,實施光入射角5°之條件下之正反射測定。基於藉由該測定所得之波長380~780 nm下之分光反射率、及CIE標準光源D65之相對分光分佈,計算JIS Z8701所規定之XYZ表色系統中由反射所得之物體顏色之三刺激值Y,從而求出正反射Y值。In addition, for the above-mentioned sample attached to the black acrylic sheet, a spectrophotometer (trade name "U-4100") was used, and the jig attached to the U-4100 was used to remove the scattered light, and the light incident angle was measured. Specular reflection measurement at 5°. Based on the spectral reflectance at the wavelength of 380-780 nm obtained by this measurement and the relative spectral distribution of the CIE standard light source D65, the tristimulus value Y of the object color obtained by reflection in the XYZ color system specified in JIS Z8701 is calculated , so as to obtain the Y value of the specular reflection.
將全反射Y值(Y 1)、正反射Y值(Y 2)、全反射Y值與正反射Y值之差ΔY(Y 1-Y 2)、及正反射Y值相對於全反射Y值之比率(Y 2/Y 1)示於表1中。 The total reflection Y value (Y 1 ), the specular reflection Y value (Y 2 ), the difference between the total reflection Y value and the specular reflection Y value ΔY (Y 1 −Y 2 ), and the specular reflection Y value relative to the total reflection Y value The ratio (Y 2 /Y 1 ) is shown in Table 1.
<表面霧度> 對於實施例1~8及比較例1之各光學膜,調查表面霧度。具體而言,首先,對於自光學膜切出之樣本膜,使用村上色彩技術研究所公司製造之「霧度計HM150」,基於JIS K 7136(2000)實施霧度測定(藉此測定樣本膜之總霧度值)。其次,經由黏著劑於樣本膜之防污層側表面貼合環烯烴聚合物膜而消除樣本膜之表面霧度,於該狀態下,使用村上色彩技術研究所公司製造之「霧度計HM150」,基於JIS K 7136(2000)實施霧度測定(藉此,測定樣本膜之內部霧度值)。然後,自總霧度值減去內部霧度值,求出外部霧度(表面霧度)值。將該值示於表1中。 <Surface Haze> About each optical film of Examples 1-8 and Comparative Example 1, the surface haze was investigated. Specifically, first, with respect to the sample film cut out from the optical film, the haze measurement was carried out based on JIS K 7136 (2000) using "Haze Meter HM150" manufactured by Murakami Color Technology Laboratory Co., Ltd. total haze value). Next, the surface haze of the sample film was eliminated by attaching the cycloolefin polymer film to the antifouling layer side surface of the sample film with an adhesive. In this state, the "Haze Meter HM150" manufactured by Murakami Color Technology Research Institute was used. , based on JIS K 7136 (2000), haze measurement (thereby, the internal haze value of the sample film is measured). Then, the internal haze value was subtracted from the total haze value to obtain the external haze (surface haze) value. This value is shown in Table 1.
<防污性之評估> 對於實施例1~8及比較例1之各光學膜,調查防污層之防污性。具體而言,首先,用手指接觸光學膜之防污層表面,留下指紋。其次,用棉製廢棉紗頭對指紋實施3次擦拭作業(使廢棉紗頭接觸作業防污層表面包含指紋附著部位之區域並使該廢棉紗頭沿一個方向擦)。並且,對於防污層之防污性,於3次擦拭作業能拭去指紋之情形時,評估為“良”,於藉由3次擦拭作業未能拭去指紋之情形時(即,殘留一部分指紋之情形時),評估為“不良”。將其結果示於表1中。 <Evaluation of antifouling properties> About each optical film of Examples 1-8 and Comparative Example 1, the antifouling property of the antifouling layer was investigated. Specifically, first, the surface of the antifouling layer of the optical film is touched with a finger to leave a fingerprint. Next, the fingerprints were wiped three times with a cotton waste yarn end (the waste cotton yarn end was brought into contact with the area of the antifouling layer surface including the fingerprint attachment portion, and the waste cotton yarn end was wiped in one direction). In addition, the antifouling properties of the antifouling layer were evaluated as "good" when fingerprints could be wiped off by 3 wiping operations, and "good" when fingerprints could not be wiped off by 3 wiping operations (that is, a part of remaining fingerprints remained). In the case of fingerprints), it was evaluated as "bad". The results are shown in Table 1.
[表1]
10:透明基材 11:樹脂膜 12:硬塗層 20:光學功能層 21:第1高折射率層 22:第1低折射率層 23:第2高折射率層 24:第2低折射率層 30:防污層 31:外表面 40:密接層 50:黏著劑層 F:光學膜(附防污層之光學膜) 10: Transparent substrate 11: Resin film 12: Hard coating 20: Optical functional layer 21: 1st high refractive index layer 22: 1st low refractive index layer 23: Second high refractive index layer 24: Second low refractive index layer 30: Antifouling layer 31: outer surface 40: Adhesion layer 50: Adhesive layer F: Optical film (optical film with antifouling layer)
圖1係本發明之光學膜之一實施方式之剖視模式圖。 圖2係本發明之光學膜之變化例之剖視模式圖(本變化例中,光學膜具備黏著劑層)。 FIG. 1 is a schematic cross-sectional view of one embodiment of the optical film of the present invention. 2 is a schematic cross-sectional view of a modification of the optical film of the present invention (in this modification, the optical film is provided with an adhesive layer).
10:透明基材 10: Transparent substrate
11:樹脂膜 11: Resin film
12:硬塗層 12: Hard coating
20:光學功能層 20: Optical functional layer
21:第1高折射率層 21: 1st high refractive index layer
22:第1低折射率層 22: 1st low refractive index layer
23:第2高折射率層 23: Second high refractive index layer
24:第2低折射率層 24: Second low refractive index layer
30:防污層 30: Antifouling layer
31:外表面 31: outer surface
40:密接層 40: Adhesion layer
F:光學膜(附防污層之光學膜) F: Optical film (optical film with antifouling layer)
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WO2025013861A1 (en) * | 2023-07-11 | 2025-01-16 | 日東電工株式会社 | Antireflection film |
JP2025011543A (en) * | 2023-07-11 | 2025-01-24 | 日東電工株式会社 | Laminated Film |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3836214B2 (en) * | 1997-05-12 | 2006-10-25 | 凸版印刷株式会社 | Antireflection material and optical member |
JP2001188102A (en) | 1999-12-27 | 2001-07-10 | Toppan Printing Co Ltd | Antireflection film |
JP3732451B2 (en) * | 2002-03-26 | 2006-01-05 | 大日本印刷株式会社 | Method for producing transparent laminated film, transparent laminated film and antireflection film |
US7695781B2 (en) * | 2004-02-16 | 2010-04-13 | Fujifilm Corporation | Antireflective film, polarizing plate including the same, image display unit including the same and method for producing antireflective film |
JP4544952B2 (en) * | 2004-03-31 | 2010-09-15 | 大日本印刷株式会社 | Anti-reflection laminate |
JP2007194109A (en) * | 2006-01-20 | 2007-08-02 | Toppan Printing Co Ltd | Conductive laminate, optical functional filter, and optical display device |
EP2915833B1 (en) * | 2012-11-05 | 2018-06-06 | Daikin Industries, Ltd. | Silane compound containing perfluoro(poly)ether group |
CN112442205B (en) * | 2015-05-27 | 2023-08-22 | 迪睿合株式会社 | laminated film |
EP3766889A1 (en) * | 2015-07-31 | 2021-01-20 | Daikin Industries, Ltd. | Silane compound containing perfluoro(poly)ether group |
JP2017161893A (en) * | 2016-03-03 | 2017-09-14 | 日東電工株式会社 | Optical laminate |
JP6774383B2 (en) | 2016-06-17 | 2020-10-21 | 日東電工株式会社 | Antireflection film and its manufacturing method, and polarizing plate with antireflection layer |
JP6477934B1 (en) * | 2017-02-03 | 2019-03-06 | ダイキン工業株式会社 | Perfluoro (poly) ether group-containing compound, surface treatment agent containing the same, and article |
WO2018193742A1 (en) * | 2017-04-20 | 2018-10-25 | 信越化学工業株式会社 | Antireflective member and method of manufacture therefor |
WO2018207811A1 (en) * | 2017-05-12 | 2018-11-15 | Agc株式会社 | Antifouling article and method for producing antifouling article |
EP3670174A4 (en) * | 2017-08-16 | 2020-08-19 | Nissan Motor Co., Ltd. | Antifouling structure |
JP6999370B2 (en) * | 2017-11-06 | 2022-01-18 | 日東電工株式会社 | Polarizer with antireflection layer and its manufacturing method |
KR102635865B1 (en) * | 2018-04-27 | 2024-02-14 | 다이니폰 인사츠 가부시키가이샤 | Optical films, polarizers and image display devices |
JP7217118B2 (en) * | 2018-09-26 | 2023-02-02 | 日東電工株式会社 | Optical film with protective film |
JP2020060657A (en) * | 2018-10-09 | 2020-04-16 | 日東電工株式会社 | Antireflection glass |
JP7057864B2 (en) * | 2019-11-25 | 2022-04-20 | 日東電工株式会社 | Anti-reflection film and image display device |
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CN115803194A (en) | 2023-03-14 |
WO2022014567A1 (en) | 2022-01-20 |
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