TW202231409A - Inspection device, resin molding device, cutting device, method for manufacturing resin molded article, and method for manufacturing cut article - Google Patents
Inspection device, resin molding device, cutting device, method for manufacturing resin molded article, and method for manufacturing cut article Download PDFInfo
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- G01N2201/00—Features of devices classified in G01N21/00
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Abstract
Description
本發明關於一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法。The present invention relates to an inspection device, a resin molding device, a cutting device, a method for manufacturing a resin molded product, and a method for manufacturing a cut product.
日本特開2017-187296號公報(專利文獻1),揭露一種同軸照明裝置。此同軸照明裝置,具備半反射鏡、及將光照射到半反射鏡之光源部。半反射鏡,配置在連結觀察對象也就是工件與相機等觀察部的觀察軸上,且相對於該觀察軸傾斜。自光源部射出的光,在半反射鏡反射並照射到工件(參照專利文獻1)。Japanese Patent Laid-Open No. 2017-187296 (Patent Document 1) discloses a coaxial lighting device. This coaxial lighting device includes a half mirror and a light source portion that irradiates light to the half mirror. The half mirror is arranged on an observation axis that connects the observation object, that is, the workpiece, and an observation unit such as a camera, and is inclined with respect to the observation axis. The light emitted from the light source unit is reflected by the half mirror and irradiated to the workpiece (refer to Patent Document 1).
[先前技術文獻] (專利文獻) 專利文獻1:日本特開2017-187296號公報 [Prior Art Literature] (patent literature) Patent Document 1: Japanese Patent Laid-Open No. 2017-187296
[發明所欲解決的問題] 如上述專利文獻1揭露的同軸照明裝置中,為了使照射到觀察對象上的光盡量均勻,所以希望入射到半反射鏡的光的角度是規定角度。為了調整光對於半反射鏡的入射角度,考慮在光源部與半反射鏡之間配置板狀構件的方法,在該板狀構件中形成有複數個狹縫,該些狹縫互相平行。然而,即便採用這種方法,根據在該板狀構件中形成的狹縫的精度,也可能造成多數的光對於半反射鏡的入射角度不能夠成為規定角度。其結果,照射到觀察對象(檢查對象)的光的偏移變大。 [Problems to be Solved by Invention] In the coaxial illuminating device disclosed in the above-mentioned Patent Document 1, in order to make the light irradiated on the observation object as uniform as possible, the angle of the light incident on the half mirror is desirably a predetermined angle. In order to adjust the incident angle of light to the half mirror, a method of arranging a plate-like member in which a plurality of slits are formed between the light source unit and the half mirror, and the slits are parallel to each other, is considered. However, even if this method is adopted, depending on the precision of the slit formed in the plate-like member, there is a possibility that the incident angle of most of the light on the half mirror cannot be a predetermined angle. As a result, the deviation of the light irradiated to the observation object (inspection object) becomes large.
本發明為了解決這種問題而完成,其目的是提供一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法,可抑制照射到檢查對象的光的偏移。The present invention has been made in order to solve such a problem, and an object of the present invention is to provide an inspection apparatus, a resin molding apparatus, a cutting apparatus, a method for manufacturing a resin molded article, and a method for manufacturing a cut article, which can suppress the occurrence of light irradiated to an inspection object. offset.
[解決問題的技術手段] 依照本發明的一局面的檢查裝置,具備相機、及同軸照明。相機,構成為對於檢查對象物進行攝像。同軸照明,構成為將光照射到檢查對象物。同軸照明,包含半反射鏡、光源部、板狀構件、及調整部。半反射鏡,配置在連結檢查對象物與相機的觀察軸上,且相對於觀察軸傾斜。光源部,構成為自與觀察軸不同的方向朝向半反射鏡發光。由光源部發出的光在半反射鏡反射並照射到檢查對象物。板狀構件,配置在光源部與半反射鏡之間。在板狀構件中形成有複數個狹縫,該些狹縫互相大致平行。調整部,構成為調整板狀構件的配置。 [Technical means to solve the problem] An inspection apparatus according to an aspect of the present invention includes a camera and a coaxial illumination. The camera is configured to capture an image of the inspection object. The coaxial illumination is configured to irradiate the inspection object with light. The coaxial illumination includes a half mirror, a light source part, a plate-shaped member, and an adjustment part. The half mirror is arranged on the observation axis connecting the inspection object and the camera, and is inclined with respect to the observation axis. The light source unit is configured to emit light toward the half mirror from a direction different from the observation axis. The light emitted by the light source unit is reflected by the half mirror and irradiated to the inspection object. The plate-shaped member is arranged between the light source unit and the half mirror. A plurality of slits are formed in the plate-like member, and the slits are substantially parallel to each other. The adjustment portion is configured to adjust the arrangement of the plate-like members.
依照本發明的其他局面的樹脂成形裝置,具備:樹脂成形機構,構成為製造樹脂成形品;及,上述檢查裝置。A resin molding apparatus according to another aspect of the present invention includes: a resin molding mechanism configured to manufacture a resin molded product; and the above-mentioned inspection apparatus.
依照本發明的其他局面的切斷裝置,具備:切斷機構,構成為藉由將切斷對象物加以切斷來製造切斷品;及,檢查裝置。A cutting device according to another aspect of the present invention includes: a cutting mechanism configured to produce a cut product by cutting an object to be cut; and an inspection device.
依照本發明的其他局面的樹脂成形品的製造方法,具備下述步驟:製造樹脂成形品;及,使用上述檢查裝置來對檢查對象物進行檢查。檢查對象物,包含樹脂成形品。A method for producing a resin molded product according to another aspect of the present invention includes the steps of: producing a resin molded product; and inspecting an inspection object using the above-described inspection apparatus. Objects to be inspected include resin molded products.
依照本發明的其他局面的切斷品的製造方法,具備下述步驟:藉由將切斷對象物加以切斷來製造切斷品;及,使用上述檢查裝置來對檢查對象物進行檢查。檢查對象物,包含切斷對象物或前述切斷品。A method for manufacturing a cut product according to another aspect of the present invention includes the steps of: manufacturing a cut product by cutting an object to be cut; and inspecting the object to be inspected using the above-mentioned inspection apparatus. The object to be inspected includes the object to be cut or the aforementioned cut product.
[發明的效果] 依據本發明,能夠提供一種檢查裝置、樹脂成形裝置、切斷裝置、樹脂成形品的製造方法、及切斷品的製造方法,可抑制照射到檢查對象的光的偏移。 [Effect of invention] According to the present invention, it is possible to provide an inspection apparatus, a resin molding apparatus, a cutting apparatus, a method for manufacturing a resin molded product, and a method for manufacturing a cut product, which can suppress deviation of light irradiated to an inspection object.
以下,參照圖式,並且詳細地說明本發明的實施形態。另外,對於圖中相同或相當部分賦予相同符號並且不重複其說明。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, the same code|symbol is attached|subjected to the same or corresponding part in a figure, and the description is not repeated.
[1.概要]
第1圖是示意地表示依照本實施形態的檢查裝置10的圖。關於檢查裝置10中包含的同軸照明100,在第1圖中表示其剖面。箭頭UDFBLR的各者表示的方向,在各圖示中是共通的。
[1. Outline]
FIG. 1 is a diagram schematically showing an
如第1圖所示,檢查裝置10,包含同軸照明100、及相機200。同軸照明100,是配置在相機200與檢查對象物300之間。同軸照明100,構成為自檢查對象物300的上方將光往檢查對象物300照射。相機200,構成為自檢查對象物300的上方對於照射到光的狀態的檢查對象物300進行攝像。在檢查裝置10中,基於相機200所攝像的畫像來檢查檢查對象物300的表面的狀態。As shown in FIG. 1 , the
檢查對象物300,例如是連接了電子元件之樹脂成形前的基板、或將連接了電子元件之基板加以樹脂成形後的封裝基板等。作為封裝基板的一例,舉例有BGA(Ball Grid Array,球柵陣列)封裝基板、LGA(Land Grid Array,接點柵格陣列)封裝基板、CSP(Chip Size Package,晶片尺寸封裝)封裝基板、LED(Light Emitting Diode,發光二極體)封裝基板、QFN(Quad Flat No-leaded,方形扁平無引腳)封裝基板。The
同軸照明100,包含光源部125、板狀構件140、半反射鏡150、及框體110。光源部125,包含基板121、LED120、及擴散板130。基板121的形狀大致是矩形狀,在基板121上構裝有複數個LED120。基板121,配置為與相機200的觀察軸C1大致平行。複數個LED120,構成為各自朝向半反射鏡150發光。The
擴散板130,是毛玻璃狀的薄板,且配置在LED120與板狀構件140之間。擴散板130的形狀大致是矩形狀。擴散板130,配置為與相機200的觀察軸C1大致平行。由LED120發出的光在擴散板130擴散。亦即,光源部125,使由LED120發出的光在擴散板130擴散,藉此進行面發光。The
板狀構件140,是配置在光源部125與半反射鏡150之間。板狀構件140的形狀大致是矩形狀。板狀構件140,配置為與相機200的觀察軸C1大致平行。在板狀構件140中形成有複數個狹縫(louver,遮光格柵)142,該些狹縫142互相大致平行。板狀構件140,構成為抑制由光源部125發出的光的擴散並提升光的平行度。作為板狀構件140,例如能夠適用光控制薄膜(Light Control Film)。The plate-
半反射鏡150是配置在相機200的觀察軸C1上。半反射鏡150的反射面,在框體110的內部,相對於觀察軸C1傾斜。半反射鏡150的反射面,例如相對於觀察軸C1大致是傾斜45度。半反射鏡150,例如是以表面塗覆有介電質多層膜或金屬薄膜等的玻璃板來構成。半反射鏡150,例如構成為對於入射角為45度的光,反射率大致成為50%且透過率大致成為50%。The
框體110,在內部收容有光源部125、板狀構件140及半反射鏡150等。框體110,例如是以鋁合金等來構成。框體110的形狀,例如是長方體狀。框體110的內壁面之中,例如在半反射鏡150與板狀構件140之間的區域構成為鏡面。在框體110中,為了以相機200來觀察檢查對象物300,所以例如在相機200側的一面上形成有以玻璃來構成的窗(未圖示)。又,在框體110中,在檢查對象物300側的一面上形成有用以供光射出的光射出口(未圖示)。The
通過了板狀構件140的光,大多朝向相對於板狀構件140大致垂直的方向,藉此將在半反射鏡150反射的光大致均勻地照射到檢查對象物300的整體上。亦即,當通過了板狀構件140的光,大多相對於板狀構件140成為大致垂直時,不易產生照射到檢查對象物300的每個區域中的光的強度差異大的事態。The light that has passed through the plate-shaped
[2.板狀構件導致的可能產生的問題點]
在箭頭FB方向中,當各狹縫142相對於板狀構件140的一面往大致垂直的方向延伸,且該面為板狀構件140的各面之中的與擴散板130對向的一面時,通過了板狀構件140的光,大多朝向相對於板狀構件140大致垂直的方向。然而,在板狀構件140的生產時,不易控制板狀構件140內的各狹縫142的延伸方向。
[2. Possible problems caused by plate-like members]
In the direction of arrow FB, when each slit 142 extends in a direction substantially perpendicular to one surface of the plate-shaped
第2圖是用以說明因為在板狀構件140內的各狹縫142比預想更傾斜而產生的問題點的圖。第2圖中,為了容易理解而誇張地表示狹縫142的傾斜。如第2圖所示,此板狀構件140中,各狹縫142相對於板狀構件140的一面沒有往大致垂直的方向延伸,且該面為板狀構件140的各面之中的與擴散板130對向的一面。因此,通過了板狀構件140的光,大多沒有相對於板狀構件140成為大致垂直。其結果,在半反射鏡150反射的光沒有大致均勻地照射到檢查對象物300的整體上。此例中,檢查對象物300的上面之中,相較於靠近箭頭B方向的區域,靠近箭頭F方向的區域的一方照射到更強的光。這樣一來,照射到檢查對象物300的光偏移,而造成在檢查裝置10中,檢查對象物300的表面狀態的檢查精度降低。FIG. 2 is a diagram for explaining a problem caused by each
為了抑制這種問題,在檢查裝置10中的構成上實施巧思。以下,詳細說明檢查裝置10的構成。In order to suppress such a problem, the structure in the
[3.檢查裝置的構成]
第3圖是示意地表示同軸照明100的上面的圖。第4圖是示意地表示同軸照明100的正面的圖。第5圖是示意地表示沿第3圖的V-V線的剖面圖。另外,為了容易說明,在各圖中,以透過了內部的狀態來表示同軸照明100的一部分。
[3. Configuration of inspection device]
FIG. 3 is a diagram schematically showing the upper surface of the
參照第3圖、第4圖及第5圖,在同軸照明100中,在箭頭LR方向的各個端部設置有調整部160。調整部160,構成為調整板狀構件140的配置。具體來說,調整部160,可調整板狀構件140在箭頭FB方向上的位置,並且以在箭頭LR方向上延伸的軸(後述的軸構件166)作為旋轉中心而可調整板狀構件140的旋轉角度。亦即,調整部160,包含「位置調整部」來調整板狀構件140的位置、及「角度調整機構」來調整板狀構件140的旋轉角度。Referring to FIGS. 3 , 4 and 5 , in the
調整部160,包含夾持器163、支持構件170(第5圖)、移動構件161、操作構件162、軸構件166、止動件169(第5圖)、及遮光蓋167。在調整部160中包含的各構件,是金屬製或樹脂製。又,在調整部160中包含的各構件的顏色,較佳為黑色。這是為了減低進入了調整部160內的光進行漫射而對於照射到檢查對象物300的光帶來不良影響的可能性。The
上述位置調整部包含移動構件161,該移動構件構成為使板狀構件140在光源部125與半反射鏡150之間進行直線移動。又,上述角度調整機構,主要包含夾持器163、軸構件166、及止動件169,該夾持器構成為保持板狀構件140,該軸構件166成為夾持器163的旋轉軸,該止動件169構成為使軸構件166的旋轉停止。又,角度調整機構,包含支持構件170,其支持軸構件166並且一起安裝於在移動構件161上。支持構件170,包含支持構件本體部165和連結部164,該支持構件本體部165是安裝在移動構件161上,該連結部164連結支持構件本體部165中的移動構件161的附近與夾持器163。在支持構件本體部165和連結部164,分別地形成有貫穿孔,以供軸構件166貫穿。The above-described position adjusting portion includes a moving
夾持器163,構成為夾住板狀構件140,藉此保持板狀構件140。夾持器163是連接於支持構件170。支持構件170,包含大致是S字狀的連結部164、方塊狀的支持構件本體部165、及軸構件保持部168。連結部164、支持構件本體部165、及軸構件保持部168,可以是一體成形,也可以是形成為不同個體。當連結部164、支持構件本體部165、及軸構件保持部168是各別地形成為不同個體時,對於連結部164與支持構件本體部165之間進行固定,並且對於支持構件本體部165與軸構件保持部168之間進行固定。The
在支持構件本體部165的靠近上端的位置形成有孔,在該孔上實施,例如螺紋切削加工。移動構件161貫穿在該孔中。移動構件161,例如是以在箭頭FB方向延伸的滾珠螺桿來構成。在支持構件本體部165中形成有孔的位置,是在箭頭UD方向(高度方向)上的比軸構件166的位置更往上方偏離。換句話說,移動構件161與前述軸構件在高度方向上偏離。因此,即便假設移動構件161的顏色是黑色以外的顏色,自軸構件166與夾持器163的連接部附近進入了調整部160內的光,在移動構件161漫射的可能性也不高。連結部164,連結支持構件本體部165中的移動構件161的附近與夾持器163的端面。A hole is formed at a position close to the upper end of the support member
在移動構件161安裝有操作構件162。藉由對於操作構件162進行旋轉操作,以使移動構件161旋轉。伴隨著移動構件161的旋轉,使得支持構件170在箭頭FB方向上移動。其結果,使板狀構件140在箭頭FB方向上移動。亦即,伴隨著移動構件161的旋轉,使得板狀構件140在擴散板130與半反射鏡150之間直線移動。這樣一來,在檢查裝置10中,調整部160的位置調整部,能夠藉由操作構件162的旋轉操作,以調整板狀構件140在擴散板130與半反射鏡150之間的位置。An
在夾持器163的端面形成有孔部H1,以收容軸構件166的一部分。在孔部H1上實施螺紋切削加工。在軸構件166的一方的端部形成有螺絲部S1。螺絲部S1收容在孔部H1中。藉此,而固定軸構件166與夾持器163。A hole portion H1 is formed in the end surface of the
在支持構件170中,在連結部164、支持構件本體部165及軸構件保持部168中分別形成有孔,以供軸構件166貫穿。藉由使軸構件166貫穿在這些孔中,以使支持構件170支持軸構件166。在連結部164、支持構件本體部165及軸構件保持部168中分別形成的孔上沒有實施螺紋切削加工,使軸構件166可分別地相對於連結部164、支持構件本體部165及軸構件保持部168旋轉。In the
藉由使軸構件166旋轉,夾持器163以軸構件166為中心旋轉。伴隨著夾持器163的旋轉,使已保持在夾持器163上的板狀構件140也旋轉。這樣一來,在檢查裝置10中,調整部160的角度調整機構,能夠藉由軸構件166的旋轉操作,以調整板狀構件140相對於半反射鏡150的角度。By rotating the
在軸構件保持部168形成有孔,以收容止動件169。該孔,在與由軸構件166所貫穿的孔大致垂直的方向上延伸。例如,在該孔上實施螺紋切削加工,且止動件169是以螺絲來構成。此時,將止動件169螺旋固定在軸構件保持部168的孔中,藉此在止動件169與軸構件166之間產生摩擦。藉由此摩擦來限制軸構件166的旋轉。亦即,止動件169使軸構件166的旋轉停止。能夠藉由止動件169來固定軸構件166的旋轉角度,並且固定板狀構件140相對於半反射鏡150的角度。A hole is formed in the shaft
遮光蓋167,構成為覆蓋軸構件保持部168和止動件169。藉此,能夠抑制光自軸構件166與軸構件保持部168的連接部附近往調整部160內部的進入。The
這樣一來,在檢查裝置10中,可調整板狀構件140在擴散板130與半反射鏡150之間的位置。In this way, in the
第6圖是示意地表示擴散板130與板狀構件140之間的距離變短的狀態的檢查裝置10的圖。如第6圖所示,在此檢查裝置10中,例如與第2圖所示的例子比較,擴散板130與板狀構件140之間的距離變短。FIG. 6 is a diagram schematically showing the
即使當各狹縫142相對於板狀構件140的一面沒有往大致垂直的方向延伸,且該面為板狀構件140的各面之中的與擴散板130對向的一面時,若擴散板130與板狀構件140之間的距離變短,則相較於擴散板130與板狀構件140之間的距離長的情況,相對於板狀構件140大致垂直的光容易通過狹縫142。其結果,不易產生照射到檢查對象物300的每個區域中的光的強度差異大的事態。Even if each slit 142 does not extend in a substantially vertical direction with respect to one surface of the plate-shaped
第7圖是示意地表示板狀構件140相對於半反射鏡150的角度傾斜後的狀態的檢查裝置10的圖。另外,第7圖中,為了容易理解而誇張地表示狹縫142的傾斜。FIG. 7 is a diagram schematically showing the
如第7圖所示,在此檢查裝置10中,板狀構件140傾斜,以使各狹縫142相對於板狀構件140的一面的延伸方向趨近大致垂直,且該面為板狀構件140的各面之中的與擴散板130對向的一面。因為各狹縫142相對於板狀構件140的一面的延伸方向趨近大致垂直,且該面為板狀構件140的各面之中的與擴散板130對向的一面,所以通過了板狀構件140的光,大多相對於板狀構件140成為大致垂直。其結果,在半反射鏡150反射的光大致均勻地照射到檢查對象物300的整體上。As shown in FIG. 7 , in this
[4.特徵]
如以上,在依照本實施形態的檢查裝置10中,可調整板狀構件140的配置。因此,依據檢查裝置10,可藉由調整板狀構件140的配置,以調整通過了板狀構件140的光的行進方向,所以能夠抑制在半反射鏡150反射而照射到檢查對象物300的光的偏移。
[4. Features]
As described above, in the
[5.其他實施形態] 上述實施形態的思想,不受限於以上說明的實施形態。以下,說明能夠適用上述實施形態的思想之其他實施形態的一例。 [5. Other Embodiments] The idea of the above-described embodiment is not limited to the above-described embodiment. Hereinafter, an example of another embodiment to which the idea of the above-described embodiment can be applied will be described.
上述實施形態中,說明本發明適用於檢查裝置的例子,但是本發明除了檢查裝置以外,也能夠適用於例如樹脂成形裝置或切斷裝置。In the above-described embodiment, an example in which the present invention is applied to an inspection apparatus has been described, but the present invention can be applied to, for example, a resin molding apparatus or a cutting apparatus, in addition to an inspection apparatus.
第8圖是示意地表示樹脂成形裝置400的構成的方塊圖。如第8圖所示,樹脂成形裝置400,包含樹脂成形機構410和檢查裝置10。樹脂成形機構410,主要包含合模機構(未圖示),其對於將成形模具(未圖示)與成形模具加以合模。樹脂成形機構410,構成為將成形模具加以合模並進行成形對象物的樹脂成形,以製造樹脂成形品。檢查裝置10,例如檢查樹脂成形前的基板、或樹脂成形後的封裝基板也就是樹脂成形品。此時,樹脂成形前的基板、或樹脂成形後的封裝基板成為檢查對象物300。作為檢查的例子,列舉有已連接到樹脂成形前的基板之電子元件的位置偏移檢查和計數檢查、以及封裝基板的外觀檢查等。FIG. 8 is a block diagram schematically showing the configuration of the
第9圖是示意地表示切斷裝置500的構成的方塊圖。如第9圖所示,切斷裝置500,包含切斷機構510和檢查裝置10。切斷機構510,構成為主要包含具有刀刃之轉軸部(未圖示),並藉由高速旋轉的刀刃來將切斷對象物切斷,以製造切斷品。檢查裝置10,例如檢查切斷對象物、或切斷品。此時,切斷對象物、或切斷品成為檢查對象物300。作為檢查的例子,列舉有切斷對象物也就是封裝基板的樹脂成形了的一面的外觀檢查、以及切斷對象物也就是封裝基板的沒有進行樹脂成形的一面的檢查等。FIG. 9 is a block diagram schematically showing the configuration of the
又,上述實施形態中,檢查裝置10,構成為可調整板狀構件140在箭頭方向FB上的位置、及可調整以軸構件166作為旋轉中心之板狀構件140的旋轉角度。然而,不必一定要可進行兩方的調整。亦即,也可以是僅可進行板狀構件140在箭頭方向FB上的位置的調整、及以軸構件166作為旋轉中心之板狀構件140的旋轉角度的調整的任一方。In addition, in the above-described embodiment, the
以上,對於本發明的實施形態進行例示的說明。亦即,為了進行例示的說明而揭露了詳細的說明和附圖。因此,詳細的說明和附圖中記載的構成要素之中,會包含當為了解決問題時的不是必要的構成要素。因此,即便這些不是必要的構成要素是記載於詳細的說明和附圖中,也不應該立刻將這些不是必要的構成要素認定為是必要的。In the above, the embodiment of the present invention has been described as an example. That is, the detailed description and the drawings are disclosed for the purpose of illustrating the description. Therefore, among the components described in the detailed description and the drawings, components that are not necessary to solve the problem may be included. Therefore, even if these unnecessary components are described in the detailed description and drawings, these unnecessary components should not be considered as essential immediately.
又,上述實施形態,在本發明的範圍中可進行各種改良和變化。亦即,對於本發明的實施,能夠對應於實施形態來採用適當的具體構成。In addition, the above-mentioned embodiment can be variously improved and changed within the scope of the present invention. That is, for the implementation of the present invention, an appropriate specific configuration can be adopted in accordance with the embodiment.
10:檢查裝置 100:同軸照明 110:框體 120:LED 121:基板 125:光源部 130:擴散板 140:板狀構件 142:狹縫 150:半反射鏡 160:調整部 161:移動構件 162:操作構件 163:夾持器 164:連結部 165:支持構件本體部 166:軸構件 167:遮光蓋 168:軸構件保持部 169:止動件 170:支持構件 200:相機 300:檢查對象物 400:樹脂成形裝置 410:樹脂成形機構 500:切斷裝置 510:切斷機構 C1:觀察軸 H1:孔部 S1:螺絲部 10: Check the device 100: Coaxial lighting 110: Frame 120: LED 121: Substrate 125: Light source part 130: Diffuser plate 140: Plate member 142: Slit 150: Half mirror 160: Adjustment Department 161: Moving widgets 162: Operating Components 163: Gripper 164: Links 165: Support component body part 166: Shaft member 167: Blackout cover 168: Shaft member holding part 169: Stopper 170: Support Components 200: Camera 300: Check the object 400: Resin molding device 410: Resin molding mechanism 500: Cut off device 510: Cut off mechanism C1: Observation axis H1: Hole S1: Screw part
第1圖是示意地表示檢查裝置的圖。 第2圖是用以說明因為在板狀構件內的各狹縫比預想更傾斜而產生的問題點的圖。 第3圖是示意地表示同軸照明的上面的圖。 第4圖是示意地表示同軸照明的正面的圖。 第5圖是示意地表示沿第3圖的V-V線的剖面圖。 第6圖是示意地表示擴散板與板狀構件之間的距離變短的狀態的檢查裝置的圖。 第7圖是示意地表示板狀構件相對於半反射鏡的角度傾斜後的狀態的檢查裝置的圖。 第8圖是示意地表示樹脂成形裝置的構成的方塊圖。 第9圖是示意地表示切斷裝置的構成的方塊圖。 Fig. 1 is a diagram schematically showing an inspection apparatus. FIG. 2 is a diagram for explaining a problem caused by each slit in the plate-shaped member being inclined more than expected. Fig. 3 is a diagram schematically showing the upper surface of the coaxial illumination. FIG. 4 is a diagram schematically showing the front side of the coaxial illumination. FIG. 5 is a schematic cross-sectional view taken along the line V-V in FIG. 3 . FIG. 6 is a diagram schematically showing an inspection apparatus in a state where the distance between the diffuser plate and the plate-shaped member is shortened. FIG. 7 is a diagram schematically showing an inspection apparatus in a state in which the plate-shaped member is inclined at an angle with respect to the half mirror. Fig. 8 is a block diagram schematically showing the configuration of a resin molding apparatus. Fig. 9 is a block diagram schematically showing the configuration of the cutting device.
國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無 Domestic storage information (please note in the order of storage institution, date and number) none
國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無 Foreign deposit information (please mark in the order of deposit country, institution, date and number) none
10:檢查裝置 10: Check the device
100:同軸照明 100: Coaxial lighting
110:框體 110: Frame
120:LED 120: LED
121:基板 121: Substrate
125:光源部 125: Light source part
130:擴散板 130: Diffuser plate
140:板狀構件 140: Plate member
142:狹縫 142: Slit
150:半反射鏡 150: Half mirror
200:相機 200: Camera
300:檢查對象物 300: Check the object
C1:觀察軸 C1: Observation axis
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