TW202209424A - Mask and preparation method thereof - Google Patents
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- TW202209424A TW202209424A TW109131954A TW109131954A TW202209424A TW 202209424 A TW202209424 A TW 202209424A TW 109131954 A TW109131954 A TW 109131954A TW 109131954 A TW109131954 A TW 109131954A TW 202209424 A TW202209424 A TW 202209424A
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- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
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Abstract
Description
本發明係關於鏡頭製備技術領域,尤其關於一種遮罩版及其製備方法。The present invention relates to the technical field of lens preparation, in particular to a mask plate and a preparation method thereof.
曝光技術可以可分為接近式曝光、接觸式曝光和非接近式曝光,三種曝光方式的區別在於:曝光時遮罩版與基片間相對關係是接近、貼緊還是分開。接近式曝光及接觸式曝光具有分辨率高、複印面積大、複印精度好、曝光設備簡單、操作方便和生產效率高等特點,但由於塗覆光刻膠的基片與遮罩版的接觸或接近會產生靜電吸附灰塵及其它顆粒,每一次接觸或接近過程,會在基片和遮罩版上都造成一定的缺陷,影響成品率和遮罩版版壽命,對準精度的提高也受到較多的限制。因此,接近式曝光及接觸式曝光一般用於精密度要求不高的器件的製備,例如鏡頭的分立元件的製備或中、小規模集成電路的製備。Exposure technology can be divided into proximity exposure, contact exposure and non-proximity exposure. The difference between the three exposure methods lies in whether the relative relationship between the mask plate and the substrate is close, close or separate during exposure. Proximity exposure and contact exposure have the characteristics of high resolution, large copy area, good copy accuracy, simple exposure equipment, convenient operation and high production efficiency. It will generate electrostatic adsorption of dust and other particles. Each contact or approach process will cause certain defects on the substrate and the mask version, which will affect the yield and the life of the mask version, and the improvement of alignment accuracy will also be greatly affected. limits. Therefore, proximity exposure and contact exposure are generally used for the preparation of devices that do not require high precision, such as the preparation of discrete components of lenses or the preparation of medium and small scale integrated circuits.
接近式曝光及接觸式曝光用的遮罩版可以通用,遮罩版包括透光基板及形成於透光基板上的不透光層,目前,接近式曝光及接觸式曝光用的遮罩版均為平整遮罩版,也即,透光基板的頂表面與不透光層的頂表面的高度近似相等,使得整個遮罩版的頂表面近似是平整的。利用這種平整的遮罩版對具有坑穴的基底進行接觸曝光時,由於不透光層與坑穴底部的距離較遠,曝光後形成的圖案的邊緣比較模糊,圖案的分辨率和精度下降,器件的精度和穩定性也隨之降低。The mask plate for proximity exposure and contact exposure can be used in general. The mask plate includes a light-transmitting substrate and an opaque layer formed on the light-transmitting substrate. At present, the mask plate for proximity exposure and contact exposure is both In order to flatten the mask plate, that is, the heights of the top surface of the light-transmitting substrate and the top surface of the opaque layer are approximately equal, so that the top surface of the entire mask plate is approximately flat. When using this flat mask plate for contact exposure of a substrate with pits, due to the long distance between the opaque layer and the bottom of the pits, the edge of the pattern formed after exposure is relatively blurred, and the resolution and accuracy of the pattern are reduced. , the accuracy and stability of the device are also reduced.
本發明的目的在於提供一種遮罩版及其製備方法,能夠提高對具有坑穴的基底進行接近式曝光後形成的圖案的分辨率和精度。The purpose of the present invention is to provide a mask plate and a preparation method thereof, which can improve the resolution and precision of a pattern formed after proximity exposure of a substrate with pits.
為了達到上述目的,本發明提供了一種遮罩版的製備方法,包括:In order to achieve the above object, the present invention provides a method for preparing a mask plate, comprising:
提供底模,所述底模內具有若干凹槽,所述凹槽從所述底模的頂表面延伸至所述底模內;providing a bottom mold having a plurality of grooves therein, the grooves extending from a top surface of the bottom mold into the bottom mold;
形成不透光層於所述凹槽中,所述不透光層至少覆蓋所述凹槽的底部;forming an opaque layer in the groove, the opaque layer covering at least the bottom of the groove;
形成透光過渡層於所述底模上,並在所述透光過渡層上蓋上透光基板;以及,forming a light-transmitting transition layer on the bottom mold, and covering the light-transmitting transition layer with a light-transmitting substrate; and,
將所述底模離模以形成所述遮罩版。The bottom mold is released from the mold to form the mask plate.
可選的,所述不透光層完全填充所述凹槽;或者,所述不透光層填充所述凹槽的部分深度,所述透光過渡層填充所述凹槽的剩餘深度。Optionally, the opaque layer completely fills the groove; or, the opaque layer fills a part of the depth of the groove, and the light-transmitting transition layer fills the remaining depth of the groove.
塗布第一膠材於所述底模上並固化以形成所述透光過渡層;或者,滴入第一膠材於所述底模上並壓合、固化以形成所述透光過渡層。The first glue material is coated on the bottom mold and cured to form the light-transmitting transition layer; or, the first glue material is dropped onto the bottom mold and pressed and cured to form the light-transmitting transition layer.
可選的,當所述第一膠材為熱固膠時,加熱所述第一膠材以進行固化;當所述第一膠材為感光膠時,採用預定波長的光照射所述第一膠材以進行固化。Optionally, when the first glue material is a thermosetting glue, the first glue material is heated for curing; when the first glue material is a photosensitive glue, light of a predetermined wavelength is used to irradiate the first glue material. glue for curing.
可選的,塗布第一膠材於所述底模上並靜置固化以形成所述透光過渡層,其中,所述第一膠材為硬化膠,且所述底模的邊緣具有遮擋環。Optionally, coating a first adhesive material on the bottom mold and standing to solidify to form the light-transmitting transition layer, wherein the first adhesive material is a hardened adhesive, and the edge of the bottom mold has a blocking ring .
可選的,塗布第一膠材於所述底模上之後以及固化所述第一膠材之前蓋上所述透光基板。Optionally, after coating the first adhesive material on the bottom mold and before curing the first adhesive material, the light-transmitting substrate is covered.
可選的,形成不透光層於所述凹槽中的步驟包括:Optionally, the step of forming the opaque layer in the groove includes:
滴入第二膠材至所述凹槽中並固化以形成所述不透光層,所述第二膠材不透光。A second glue material is dropped into the groove and cured to form the opaque layer, and the second glue material is opaque to light.
可選的,當所述第二膠材為熱固膠時,加熱所述第二膠材以進行固化;當所述第二膠材為感光膠時,採用預定波長的光照射所述第二膠材以進行固化;當所述第二膠材為硬化膠時,靜置所述第二膠材以進行固化。Optionally, when the second glue material is a thermosetting glue, the second glue material is heated for curing; when the second glue material is a photosensitive glue, light of a predetermined wavelength is used to irradiate the second glue material. The glue material is cured; when the second glue material is a hardened glue, the second glue material is allowed to stand for curing.
本發明還提供了一種遮罩版,包括:The present invention also provides a mask plate, comprising:
透光基板;light-transmitting substrate;
透光過渡層,位於所述透光基板上;以及,a light-transmitting transition layer on the light-transmitting substrate; and,
若干不透光層,分布於所述透光過渡層上,且凸出於所述透光過渡層。A plurality of opaque layers are distributed on the light-transmitting transition layer and protrude from the light-transmitting transition layer.
可選的,所述不透光層的頂表面與所述透光基板的頂表面之間的距離大於或等於100微米。Optionally, the distance between the top surface of the opaque layer and the top surface of the light-transmitting substrate is greater than or equal to 100 microns.
在本發明提供的遮罩版及其製備方法中,首先提供具有凹槽的底模,然後在凹槽中形成不透光層,接著在底模上形成透光過渡層並蓋上透光基板,透光過渡層可作為透光基板與不透光層之間的粘合層,以利於底模離模,離模之後,形成所述遮罩版。本發明中不透光層凸出於透光基板,利用所述遮罩版對具有坑穴的基底進行曝光時,不透光層可伸進基底的坑穴中,從而減小與坑穴底部之間的距離,增大曝光後形成的圖案的邊緣的銳利度和清晰度,進而提高器件的精度和可靠性。In the mask plate and its preparation method provided by the present invention, a bottom mold with grooves is provided first, then a light-tight layer is formed in the grooves, and then a light-transmitting transition layer is formed on the bottom mold and covered with a light-transmitting substrate , the light-transmitting transition layer can be used as an adhesive layer between the light-transmitting substrate and the opaque layer, so as to facilitate the release of the bottom mold, and after the mold is released, the mask plate is formed. In the present invention, the opaque layer protrudes from the light-transmitting substrate, and when the mask plate is used to expose the substrate with pits, the opaque layer can extend into the pits of the substrate, thereby reducing the distance between the bottom of the pit and the bottom of the pit. The distance between them increases the sharpness and definition of the edge of the pattern formed after exposure, thereby improving the precision and reliability of the device.
進一步,通過控制凹槽的深度可以控制不透光層相對所述透光基板向外凸出的距離,從而能夠適應更多的器件的製備。Further, by controlling the depth of the groove, the outwardly protruding distance of the opaque layer relative to the light-transmitting substrate can be controlled, thereby being able to accommodate the preparation of more devices.
進一步,第一膠材和第二膠材通過加熱或曝光的方式固化,可以減少固化時間,提高製備效率。Further, the first glue material and the second glue material are cured by heating or exposure, which can reduce the curing time and improve the preparation efficiency.
進一步,第一膠材在固化時還可以進行壓合處理,進一步減少了固化時間,並且可以減小透光過渡層的厚度,增大遮罩版在製備時的工藝窗口。Further, the first adhesive material can also be subjected to a lamination treatment during curing, which further reduces the curing time, and can reduce the thickness of the light-transmitting transition layer, thereby increasing the process window during the preparation of the mask plate.
下面將結合示意圖對本發明的具體實施方式進行更詳細的描述。根據下列描述,本發明的優點和特徵將更清楚。需說明的是,附圖均採用非常簡化的形式且均使用非精準的比例,僅用以方便、明晰地輔助說明本發明實施例的目的。The specific embodiments of the present invention will be described in more detail below with reference to the schematic diagrams. The advantages and features of the present invention will become more apparent from the following description. It should be noted that, the accompanying drawings are all in a very simplified form and in inaccurate scales, and are only used to facilitate and clearly assist the purpose of explaining the embodiments of the present invention.
實施例一Example 1
圖1為本實施例提供的遮罩版的製備方法的流程圖。如圖1所示,所述遮罩版包括:FIG. 1 is a flowchart of a method for preparing a mask plate provided in this embodiment. As shown in Figure 1, the mask plate includes:
步驟S1:提供底模,所述底模內具有若干凹槽,所述凹槽從所述底模的表面延伸至所述底模內;Step S1: providing a bottom mold with a plurality of grooves in the bottom mold, and the grooves extend from the surface of the bottom mold into the bottom mold;
步驟S2:形成不透光層於所述凹槽中,所述不透光層至少覆蓋所述凹槽的底部;Step S2: forming an opaque layer in the groove, the opaque layer covering at least the bottom of the groove;
步驟S3:形成透光過渡層於所述底模上,並在所述透光過渡層上蓋上透光基板;以及,Step S3: forming a light-transmitting transition layer on the bottom mold, and covering the light-transmitting transition layer with a light-transmitting substrate; and,
步驟S4:將所述底模離模以形成所述遮罩版。Step S4: releasing the bottom mold from the mold to form the mask plate.
具體的,請參閱圖2~圖6,其為所述遮罩版的製備方法的相應步驟對應的結構示意圖,接下來,將結合圖2~圖6對本實施例提供的遮罩版的製備方法作進一步說明,並且,為了便於描述,本實施例將以製備攝像頭的光圈用的遮罩版為例進行說明。應理解,本發明提供的遮罩版的製備方法也可以用於製備其他遮罩版。可以理解的是,本實施例中的遮罩版可以用於接觸式曝光,也可以用於接近式曝光,本實施例將以遮罩版用於接近式曝光為例進行說明。Specifically, please refer to FIGS. 2 to 6 , which are schematic structural diagrams corresponding to the corresponding steps of the method for preparing the mask plate. Next, the method for preparing the mask plate provided by the present embodiment will be described with reference to FIGS. 2 to 6 . For further description, and for the convenience of description, this embodiment will be described by taking the preparation of a mask plate for an aperture of a camera as an example. It should be understood that the method for preparing a mask plate provided by the present invention can also be used to prepare other mask plates. It can be understood that the mask plate in this embodiment can be used for contact exposure or proximity exposure, and this embodiment will be described by taking the mask plate used for proximity exposure as an example.
請參閱圖2,首先執行步驟S1,提供底模100,所述底模100中具有若干凹槽101,所述凹槽101從所述底模100的頂表面延伸至所述底模100內的一定深度。所述凹槽101將對應於所述遮罩版上的不透光圖案,通過設計所述凹槽101的形狀及分布方式可以製備出不同的不透光圖案。本實施例中,由於所述遮罩版是用於製備攝像頭的光圈,所述凹槽101的形狀為圓形,且在所述底模100呈陣列式分布。Referring to FIG. 2 , step S1 is first performed to provide a
請繼續參閱圖2,所述底模100的邊緣具有遮擋環102,所述遮擋環102是沿著所述底模100的邊緣圍繞成一圈的擋板。所述遮擋環102具有一定的高度,以防止後續工藝中產生溢膠的問題,並能更好的控制後續工藝中塗布的膠材的厚度均勻性。Please continue to refer to FIG. 2 , the edge of the
本實施例中,所述底模100為金屬模具,利用數控機床在金屬模具上加工出所述凹槽101。作為可選實施例,所述底模100也可以是塑料模具,本發明不作限制。進一步,所述遮擋環102與所述底模100是一體成型的,以簡化所述底模100的製備工藝,但不以此為限。In this embodiment, the
請參閱圖3,執行步驟S2,在所述凹槽101中滴入第二膠材,直至所述第二膠材完全填滿所述凹槽101,然後將所述第二膠材固化形成所述不透光層201。可選的,所述第二膠材可以是熱固膠、感光膠或硬化膠,當所述第二膠材為熱固膠時,加熱所述第二膠材以進行固化;當所述第二膠材為感光膠時,採用預定波長的光照射所述第二膠材以進行固化;當所述第二膠材為硬化膠時,靜置所述第二膠材以進行固化。進一步,所述感光膠例如是UV膠,利用UV光照射進行固化;所述硬化膠例如是AB膠或矽膠等靜置即可固化的膠材。Please refer to FIG. 3 , step S2 is performed, and a second glue material is dropped into the
應理解,由於膠材通常是透光的,在所述凹槽101中滴入所述第二膠材之前,所以需要在所述第二膠材內滴入黑色的染料,使得所述第二膠材呈黑色(根據需要,也可以是其他顏色染料,只要能在曝光過程中擋住光線即可),固化後形成的所述不透光層201即可不透光。當然,所述第二膠材也可以直接選取黑色的膠材省略滴入黑色的染料的步驟。It should be understood that since the glue material is usually light-transmitting, before the second glue material is dropped into the
由於所述第二膠材完全填滿所述凹槽101,所述不透光層201也會完全填充所述凹槽101。從圖3中可見,每個所述凹槽101中均具有一所述不透光層201,且所述不透光層201的厚度等於所述凹槽101的深度,如此一來,通過控制所述凹槽101的深度即可控制所述不透光層201的厚度。Since the second adhesive material completely fills the
請參閱圖4,執行步驟S3,在所述底模100的頂表面上塗布第一膠材並立即蓋上透光基板203,使得所述第一膠材同時粘附在所述透光基板203及所述不透光層201上。本實施例中,所述第一膠材為硬化膠,通過靜置即可固化,固化後的所述第一膠材形成透光過渡層202。由於所述底模100邊緣具有所述遮擋環102的遮擋,所述第一膠材不會在靜置時溢出所述底模100。Referring to FIG. 4 , step S3 is executed, coating a first adhesive material on the top surface of the
應理解,所述透光過渡層202可以作為粘結層將所述透光基板203與所述不透光層201粘結在一起,即使所述第二膠材被固化後體積微縮導致所述不透光層201的頂表面略低於所述凹槽101的槽口,第一膠材也能夠流到所述凹槽101中與所述不透光層201形成良好的接觸,便於脫模。並且,由於所述透光過渡層202是可以透光的,也不會改變所述遮罩版的不透光圖案。It should be understood that the light-transmitting
請參閱圖5,執行步驟S4,將所述底模100離模,形成如圖6所示的遮罩版。由於所述透光過渡層202將所述不透光層201粘附住,所述底模100能夠比較容易的脫模,不會損壞所述不透光層201。Referring to FIG. 5 , step S4 is performed, and the
請繼續參閱圖6,本實施例還提供了一種遮罩版,包括:Please continue to refer to FIG. 6, this embodiment also provides a mask version, including:
透光基板203,所述透光基板203是玻璃或石英玻璃(quartz)基板,但不以此為限;The light-transmitting
透光過渡層202,位於所述透光基板203上;The light-transmitting
若干不透光層201,分布於所述透光過渡層202上,且凸出於所述透光過渡層202,所述透光過渡層202將所述透光基板203與所述不透光層201粘結在一起。A plurality of
本實施例中,所述不透光層201的頂表面與所述透光基板203的頂表面之間的距離大於或等於100微米,使得所述不透光層201向外凸出,所述遮罩版不再是平面結構,而是立體結構。In this embodiment, the distance between the top surface of the
圖7a及圖7b是採用所述遮罩版對一基底300進行曝光時的示意圖。如圖7a及圖7b所示,所述基底300是用於形成攝像頭(具體是攝像頭的鏡頭)的基底300,所述基底300中具有若干坑穴301(圖7a及圖7b中僅示意性的展示出一個坑穴301),所述坑穴301從所述基底300的頂表面延伸至所述基底300內一定深度。所述基底300的頂表面覆蓋一層待曝光層302,所述坑穴301的底部的至少部分向上隆起形成凸出部303,所述凸出部303上的待曝光層302需要通過曝光去除,從而形成攝像頭的光圈。7a and 7b are schematic diagrams of exposing a
利用所述遮罩版對所述基底300進行曝光時,所述不透光層201可以伸入所述坑穴301中,使得所述不透光層201與所述凸出部303的頂表面之間的曝光距離d減小,從而使得曝光後的圖案的邊緣的銳利度和清晰度,進而提高了形成的攝像頭的攝像清晰度。When the
圖8a及圖8b是本實施例提供的兩種不同的曝光距離d下形成的光圈的部分示意圖。其中,圖8a中的曝光距離d=500微米,圖8b中的曝光距離d=100微米,也就是說,圖8a及圖8b採用的遮罩版的不透光層201的圖案相同,區域在於,圖8b採用的遮罩版的不透光層201的厚度更大,能夠更接近於坑穴301中的凸出部303。從圖8a及圖8b中可見,曝光距離d越小,則曝光後形成的圖案的邊緣的銳利度和清晰度更好,因此,本實施例中提供的遮罩版相對於現有技術中平整的遮罩版來說,能夠提高曝光後形成的圖案的邊緣的銳利度和清晰度。8a and 8b are partial schematic diagrams of apertures formed under two different exposure distances d provided in this embodiment. Among them, the exposure distance d=500 microns in FIG. 8a, and the exposure distance d=100 microns in FIG. 8b, that is to say, the pattern of the
實施例二Embodiment 2
圖9~圖12為本實施例提供的遮罩版的製備方法的相應步驟對應的結構示意圖。請參閱圖9,與實施例一不同的是,本實施例中,在執行步驟S2時,只在所述凹槽101中滴入相對少量的第二膠材,使得所述第二膠材填充部分所述凹槽101,然後將所述第二膠材固化形成所述不透光層201。9 to 12 are schematic structural diagrams corresponding to corresponding steps of the method for preparing a mask plate provided in this embodiment. Referring to FIG. 9 , the difference from the first embodiment is that in this embodiment, when step S2 is performed, only a relatively small amount of the second glue material is dropped into the
由於所述第二膠材僅填充了部分所述凹槽101,所述不透光層201也會填充所述凹槽101的部分深度。從圖9中可見,每個所述凹槽101中均具有一所述不透光層201,且所述不透光層201的頂表面低於所述凹槽101的槽口。Since the second adhesive material only fills part of the
請參閱圖10,執行步驟S3,在所述底模100的頂表面上塗布第一膠材並立即蓋上透光基板203,所述第一膠材會流到所述凹槽101中填滿所述凹槽101的剩餘深度,將所述第一膠材靜置固化後形成所述透光過渡層202,所述透光過渡層202填充所述凹槽101的未被所述不透光層201填充的部分。Please refer to FIG. 10 , step S3 is executed, and a first adhesive material is coated on the top surface of the
在本實施例中,由於所述不透光層201僅填充所述凹槽101的部分深度,與所述底模100的接觸面較少,更有利於脫模。In this embodiment, since the
請參閱圖11及圖12,執行步驟S4,將所述底模100離模後形成所述遮罩版,與實施例一不同的是,本實施例中的遮罩版中的透光過渡層202的頂表面不是平整的表面,而是具有若干凸起,所述不透光層201位於所述透光過渡層202的凸起上。在採用所述遮罩版進行曝光時,所述透光過渡層202的凸起及所述不透光層201可以一起伸進基底的坑穴內。Please refer to FIG. 11 and FIG. 12 , step S4 is executed, and the mask plate is formed after the
實施例三Embodiment 3
圖13~圖14為本實施例提供的遮罩版的製備方法的相應步驟對應的結構示意圖。請參閱圖13及圖14,與實施例二不同的是,本實施例中,所述底模100的邊緣沒有遮擋環,在執行步驟S3時,塗布第一膠材於所述底模100上並固化以形成所述透光過渡層202,所述第一膠材為熱固膠會感光膠,加熱所述第一膠材以進行固化或採用預定波長的光照射所述第一膠材以進行固化。相對於靜置固化來說,加熱固化或光照射固化的方式固化的速度較快,所述第一膠材通常會很快固化而不會溢出所述底模100,所以無需在底模100的邊緣設置遮擋環。並且,增加固化速度還可以提高製備的效率。13 to 14 are schematic structural diagrams corresponding to corresponding steps of the method for preparing a mask plate provided in this embodiment. Please refer to FIG. 13 and FIG. 14 . The difference from the second embodiment is that in this embodiment, the edge of the
實施例四Embodiment 4
圖15~圖17為本實施例提供的遮罩版的製備方法的相應步驟對應的結構示意圖。請參閱圖15,與實施例三不同的是,本實施例中,在執行步驟S3時,在所述底模100上滴入所述第一膠材,並對所述第一進行加熱固化或光照固化,同時還對所述第一膠材進行壓合。舉例而言,當所述第一膠材為熱固膠時,在所述底模100上滴入所述第一膠材之後,採用一高溫的壓合頭壓合所述第一膠材,使得所述第一膠材延展至整個所述底模100的頂表面,並且同時也固化了所述第一膠材;當所述第一膠材為感光膠時,在所述底模100上滴入所述第一膠材之後,在採用預定波長的光照射所述第一膠材的同時,採用一透光的壓合頭壓合所述第一膠材,使得所述第一膠材延展至整個所述底模100的頂表面,並且同時也固化了所述第一膠材。15 to 17 are schematic structural diagrams corresponding to corresponding steps of the method for preparing a mask plate provided in this embodiment. Referring to FIG. 15 , the difference from the third embodiment is that in this embodiment, when step S3 is performed, the first adhesive material is dropped on the
所述第一膠材優選滴在所述底模100的中心,且滴入的量較少以防止溢膠,通過一次性壓合、固化的方式形成所述透光過渡層202的速率更快,進一步提高了製備的效率。The first glue material is preferably dropped in the center of the
請參閱圖16及圖17,執行步驟S4,將所述底模100離模後形成所述遮罩版,與實施例三不同的是,採用壓合的方式形成的所述透光過渡層202的厚度更薄,且在所述透光基板203上的分布也比較均勻。Please refer to FIG. 16 and FIG. 17 , step S4 is executed, and the mask plate is formed after the
實施例五Embodiment 5
圖18~圖20為本實施例提供的遮罩版的底模的結構示意圖。請參閱圖18~圖20,與實施例一不同的是,本實施例中,所述底模100的遮擋環102上具有若干溢膠口102a,所述溢膠口102a從所述遮擋環102的頂表面延伸至所述遮擋環102內的一定深度,當在執行步驟S3時,在所述底模100上塗布所述第一膠材,當所述第一膠材過量時,可通過所述溢膠口102a將過量的所述第一膠材排出。18 to 20 are schematic structural diagrams of the bottom mold of the mask plate provided in this embodiment. Please refer to FIGS. 18 to 20 . The difference from the first embodiment is that in this embodiment, the
本實施例中,所述溢膠口102a的數量為4個,4個所述溢膠口102a對稱分布,但不以此為限;進一步地,所述溢膠口102a的形狀可以為半圓形、方形或梯形等,此處不再一一舉例說明。In this embodiment, the number of the
應理解,本文所指的“透光”也可以稱之為“完全透光”,其透光率例如是大於或等於98%,可以近似看成能夠透過所有的光線;“不透光”也可以稱之為“完全不透光”,其透光率例如是小於或等於2%,可以近似看成能夠遮擋所有的光線。應理解,“透光”和“不透光”透光率不限於以上描述的範圍,所謂“透光”只是相對於“不透光”的透光率較高,並不意味著完全透光,所謂“不透光”只是相對於“透光”的透光率較低,並不意味著完全不透光,可以根據實際的工藝需要相應的“透光”和“不透光”的透光率範圍。It should be understood that the "light transmission" referred to herein can also be referred to as "completely light transmission", and its light transmittance is, for example, greater than or equal to 98%, which can be approximately regarded as being able to transmit all light; It can be called "completely opaque", and its light transmittance is, for example, less than or equal to 2%, which can be approximately regarded as being able to block all light. It should be understood that the light transmittances of "transmitting" and "opaque" are not limited to the ranges described above, and the so-called "transmitting" is only a higher transmittance relative to "opaque", and does not mean complete transmittance , the so-called "opaque" only has a lower light transmittance relative to "transparent", it does not mean that it is completely opaque, and the corresponding "transparent" and "opaque" can be based on the actual process needs. Light rate range.
綜上,在本發明提供的遮罩版及其製備方法中,首先提供具有凹槽的底模,然後在凹槽中形成不透光層,接著在底模上形成透光過渡層並蓋上透光基板,透光過渡層可作為透光基板與不透光層之間的粘合層,以利於底模離模,離模之後,形成所述遮罩版。本發明中不透光層凸出於透光基板,利用所述遮罩版對具有坑穴的基底進行曝光時,不透光層可伸進基底的坑穴中,從而減小與坑穴底部之間的距離,增大曝光後形成的圖案的邊緣的銳利度和清晰度,進而提高器件的精度和可靠性。進一步,通過控制凹槽的深度可以控制不透光層相對所述透光基板向外凸出的距離,從而能夠適應更多的器件的製備。進一步,第一膠材和第二膠材通過加熱或曝光的方式固化,可以減少固化時間,提高製備效率。進一步,第一膠材在固化時還可以進行壓合處理,進一步減少了固化時間,並且可以減小透光過渡層的厚度,增大遮罩版在製備時的工藝窗口。To sum up, in the mask plate and its preparation method provided by the present invention, a bottom mold with grooves is first provided, then a light-tight layer is formed in the grooves, and then a light-transmitting transition layer is formed on the bottom mold and covered The light-transmitting substrate and the light-transmitting transition layer can be used as an adhesive layer between the light-transmitting substrate and the opaque layer, so as to facilitate the release of the bottom mold, and after the mold is released, the mask plate is formed. In the present invention, the opaque layer protrudes from the light-transmitting substrate, and when the mask plate is used to expose the substrate with pits, the opaque layer can extend into the pits of the substrate, thereby reducing the distance between the bottom of the pit and the bottom of the pit. The distance between them increases the sharpness and definition of the edge of the pattern formed after exposure, thereby improving the precision and reliability of the device. Further, by controlling the depth of the groove, the outwardly protruding distance of the opaque layer relative to the light-transmitting substrate can be controlled, thereby being able to accommodate the preparation of more devices. Further, the first glue material and the second glue material are cured by heating or exposure, which can reduce the curing time and improve the preparation efficiency. Further, the first adhesive material can also be subjected to a lamination treatment during curing, which further reduces the curing time, and can reduce the thickness of the light-transmitting transition layer, thereby increasing the process window during the preparation of the mask plate.
上述僅為本發明的優選實施例而已,並不對本發明起到任何限制作用。任何所屬技術領域的技術人員,在不脫離本發明的技術方案的範圍內,對本發明揭露的技術方案和技術內容做任何形式的等同替換或修改等變動,均屬未脫離本發明的技術方案的內容,仍屬於本發明的保護範圍之內。The above are only preferred embodiments of the present invention, and do not have any limiting effect on the present invention. Any person skilled in the art, within the scope of not departing from the technical solution of the present invention, makes any form of equivalent replacement or modification to the technical solution and technical content disclosed in the present invention, all belong to the technical solution of the present invention. content still falls within the protection scope of the present invention.
100:底模
101:凹槽
102:遮擋環
102a:溢膠口
201:不透光層
202:透光過渡層
203:透光基板
300:基底
301:坑穴
302:待曝光層
303:凸出部
d:曝光距離
S1~S4:步驟100: Bottom mold
101: Grooves
102:
圖1為本發明實施例一提供的遮罩版的製備方法的流程圖; 圖2~圖6為本發明實施例一提供的遮罩版的製備方法的相應步驟對應的結構示意圖,其中,圖6為遮罩版的結構示意圖; 圖7a~圖7b為本發明實施例一提供的採用遮罩版對一基底進行曝光的示意圖; 圖8a~圖8b是本發明實施例一提供的兩種不同的曝光距離下形成的光圈的部分示意圖; 圖9~圖12為本發明實施例二提供的遮罩版的製備方法的相應步驟對應的結構示意圖,其中,圖12為遮罩版的結構示意圖; 圖13~圖14為本發明實施例三提供的遮罩版的製備方法的相應步驟對應的結構示意圖; 圖15~圖17為本發明實施例四提供的遮罩版的製備方法的相應步驟對應的結構示意圖,其中,圖17為遮罩版的結構示意圖; 圖18~圖20為本發明實施例五提供的遮罩版的底模的結構示意圖。Fig. 1 is the flow chart of the preparation method of the mask plate provided by Embodiment 1 of the present invention; 2 to 6 are schematic structural diagrams corresponding to the corresponding steps of the method for preparing a mask plate according to Embodiment 1 of the present invention, wherein, FIG. 6 is a schematic structural diagram of the mask plate; 7a-7b are schematic diagrams of exposing a substrate by using a mask plate according to Embodiment 1 of the present invention; 8a-8b are partial schematic diagrams of apertures formed under two different exposure distances provided by Embodiment 1 of the present invention; 9 to 12 are schematic structural diagrams corresponding to corresponding steps of the method for preparing a mask plate according to Embodiment 2 of the present invention, wherein FIG. 12 is a schematic structural diagram of the mask plate; 13 to 14 are schematic structural diagrams corresponding to corresponding steps of the method for preparing a mask plate according to Embodiment 3 of the present invention; 15 to 17 are schematic structural diagrams corresponding to corresponding steps of the method for preparing a mask plate provided in Embodiment 4 of the present invention, wherein FIG. 17 is a schematic structural diagram of the mask plate; 18 to 20 are schematic structural diagrams of the bottom mold of the mask plate according to the fifth embodiment of the present invention.
S1~S4:步驟S1~S4: Steps
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