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TW202012915A - Grain quality distinguishing device - Google Patents

Grain quality distinguishing device Download PDF

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TW202012915A
TW202012915A TW108127818A TW108127818A TW202012915A TW 202012915 A TW202012915 A TW 202012915A TW 108127818 A TW108127818 A TW 108127818A TW 108127818 A TW108127818 A TW 108127818A TW 202012915 A TW202012915 A TW 202012915A
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light
light source
grain
sample tray
grains
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TW108127818A
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TWI802732B (en
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松島秀昭
池田學
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日商佐竹股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids

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Abstract

An object of the present invention is to provide a grain quality distinguishing device capable of accurately distinguishing the quality of the external appearance of a grain placed on a transparent sample tray by preventing the appearance of light source glare on a bottom section of the sample tray. The grain quality distinguishing device of the present invention irradiates light onto a grain placed on a sample tray with a transparent bottom such that light passes through the grain, and distinguishes the quality of the external appearance of the grain based on the light transmitted through the grain, wherein an illumination mechanism having a light source is disposed beneath the sample tray, and the illumination mechanism irradiates indirect light onto the grain placed on the sample tray. In the present invention, it is preferable that the illumination mechanism has light source blocks disposed at an oblique angle below the sample tray, light sources are disposed inside the light source blocks, and the illumination mechanism reflects the light from the light sources inside the light source blocks, thereby illuminating the grain placed on the sample tray from below at an oblique angle with indirect light.

Description

穀粒品級判別裝置Grain grade discrimination device

本發明關於將米、麥、豆、玉米等穀粒的外觀品級加以判別之穀粒品級判別裝置。尤其,本發明關於下述穀粒品級判別裝置:具備可避免光源顯映在樣品盤的底部之照明機構,且以良好精度判別前述樣品盤所載置之穀粒的外觀品級。The present invention relates to a grain grade discrimination device for discriminating the appearance grade of grains such as rice, wheat, beans, and corn. In particular, the present invention relates to a grain grade discrimination device that includes an illumination mechanism that prevents the light source from being displayed at the bottom of the sample tray, and distinguishes the appearance grade of the grain placed on the sample tray with good accuracy.

往昔,普知有以下裝置:將光照射至穀粒,使前述光穿透前述穀粒及/或在前述穀粒反射,而基於來自前述穀粒之穿透光及/或反射光來判別前述穀粒的外觀品級(參照專利文獻1、2)。In the past, it is generally known to irradiate light to the grains, make the light penetrate the grains and/or reflect on the grains, and judge the aforesaid based on the penetrating light and/or reflected light from the grains Grain appearance grade (refer to Patent Documents 1 and 2).

專利文獻1記載一種包含拍攝機構的裝置,具備上部拍攝照明單元、下部照明單元、將配置在此等之間之判別對象即任意數的穀粒加以載置之托盤,且從上部拍攝照明單元的上部發光部將光照射至前述托盤所載置之穀粒並利用上部拍攝照明單元拍攝其反射光、或從下部照明單元的下部發光部將光照射至前述穀粒並利用上部拍攝照明單元拍攝其穿透光,取得來自前述穀粒之反射光或穿透光所成之影像資料。Patent Document 1 describes an apparatus including an imaging mechanism, including an upper imaging lighting unit, a lower lighting unit, a tray on which an arbitrary number of grains, which are discrimination objects arranged between them, and an imaging unit of the lighting unit are photographed from above The upper light emitting part irradiates light onto the grains placed on the tray and shoots the reflected light with the upper shooting lighting unit, or irradiates light to the grains from the lower light emitting part of the lower lighting unit and shoots the light with the upper shooting lighting unit Penetrating light to obtain image data formed by the reflected light or penetrating light from the aforementioned grains.

又,專利文獻2記載有一種裝置,具備:基底構件;旋轉構件,在前述基底構件內配設成可旋轉,且在一側方具有光源;以及罩蓋構件,安裝在前述基底構件上而與該基底構件一起構成外框,並位在前述旋轉構件的上方,具有將載置穀粒之樣品盤加以承接之開口部;且將載置有複數穀粒之樣品盤設置在前述罩蓋構件的開口部,並藉由前述光源自斜下方將光照射至前述樣品盤的透明底面,自斜下方使光穿透前述樣品盤所載置之複數穀粒。In addition, Patent Document 2 describes a device including: a base member; a rotating member arranged rotatably in the base member and having a light source on one side; and a cover member attached to the base member and The base member forms an outer frame together, and is located above the rotating member, and has an opening for receiving the sample pan on which the grain is placed; and the sample pan on which the plural grains are placed is provided on the cover member The opening part irradiates the transparent bottom surface of the sample tray with obliquely downward light from the light source, and allows the light to penetrate through the plural grains placed on the sample tray from obliquely downward.

依據上述專利文獻1所記載之裝置,則可利用將藉由拍攝機構取得之來自穀粒之反射光或穿透光所成之影像資料、及穀粒檢查用的基準影像資料加以比較,來判別前述穀粒的外觀品級。According to the device described in Patent Document 1, the image data formed by the reflected light or transmitted light from the grain obtained by the shooting mechanism can be compared with the reference image data for grain inspection The appearance grade of the aforementioned grains.

又,依據上述專利文獻2所記載之裝置,則可從樣品盤的上方利用操作者的目視等來觀察穀粒內有無陰影而偵測胴裂米等。In addition, according to the device described in the above-mentioned Patent Document 2, it is possible to observe the presence or absence of shadows in the grain from the top of the sample tray by the operator's visual observation, etc., and to detect the carcass and the like.

然而,專利文獻1所記載之裝置,係在下部發光部上將托盤加以載置之裝置,會有以下問題:前述下部發光部顯映在前述托盤的底部,對於由前述拍攝機構所取得之穀粒的影像資料造成影響,因此無法以良好精度判別穀粒的外觀品級。However, the device described in Patent Document 1 is a device that mounts a tray on a lower light-emitting portion, and there is a problem that the lower light-emitting portion is displayed on the bottom of the tray, and the valley obtained by the shooting mechanism The image data of the grain affects it, so it is impossible to judge the appearance grade of the grain with good accuracy.

另一方面,專利文獻2所記載之裝置,將光源配設在樣品盤的下部側方,且從斜下方將光照射至前述樣品盤的底面,但於未將前述光源往前述樣品盤的側方拉遠配設之情形下,會有以下問題:前述光源顯映在前述樣品盤的底部,對於來自樣品盤的上方之操作者的目視等所行之穀粒觀察造成影響,因此無法正確偵測胴裂米等。 〔先前技術文獻〕 〔專利文獻〕On the other hand, the device described in Patent Document 2 arranges the light source on the lower side of the sample tray and irradiates light to the bottom surface of the sample tray from diagonally below, but the light source is not directed to the side of the sample tray In the case of Fang Layuan, there will be the following problems: the aforementioned light source is displayed at the bottom of the aforementioned sample tray, which affects the grain observation by the operator from above the sample tray, and therefore cannot be detected correctly Measure the cracked rice and so on. [Previous Technical Literature] [Patent Literature]

專利文獻1:日本特開2015-7606號公報 專利文獻2:日本特開2014-173884號公報Patent Literature 1: Japanese Patent Laid-Open No. 2015-7606 Patent Document 2: Japanese Patent Laid-Open No. 2014-173884

〔發明所欲解決之問題〕[Problems to be solved by the invention]

於是,本發明之目的係提供一種穀粒品級判別裝置,可利用避免光源顯映在透明樣品盤的底部,而以良好精度判別前述樣品盤所載置之穀粒的外觀品級。 〔解決問題之方式〕Therefore, the object of the present invention is to provide a grain grade discriminating device, which can judge the appearance grade of the grain placed on the sample disc with good accuracy by avoiding the light source being displayed on the bottom of the transparent sample disc. [Method of solving the problem]

為了達成上述目的,本發明的一實施形態係一種穀粒品級判別裝置, 將光照射至具有透明底面之樣品盤所載置之穀粒,使光穿透前述穀粒,並基於來自前述穀粒的穿透光來判別前述穀粒的外觀品級,其特徵為, 在前述樣品盤的下方配設具有光源之照明機構, 前述照明機構將間接光照射至前述樣品盤所載置之穀粒。In order to achieve the above object, an embodiment of the present invention is a grain grade discrimination device, Irradiating light to the grains placed on the sample tray with a transparent bottom surface, allowing the light to penetrate the grains, and judging the appearance grade of the grains based on the penetrating light from the grains, characterized by, A lighting mechanism with a light source is arranged below the aforementioned sample tray, The illumination mechanism irradiates the grain placed on the sample tray with indirect light.

本發明的一實施形態宜如下。 前述照明機構具有配設在前述樣品盤的斜下方之光源區塊,且前述光源配設在前述光源區塊的內側, 前述照明機構使來自前述光源的光在前述光源區塊的內側反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒。An embodiment of the present invention is preferably as follows. The lighting mechanism has a light source block disposed obliquely below the sample tray, and the light source is disposed inside the light source block, The illumination mechanism reflects the light from the light source inside the light source block, and irradiates the grain placed on the sample tray from below obliquely as indirect light.

本發明的一實施形態宜如下。 前述光源區塊具備:固定部,固定前述光源;導光部,位在前述固定部的上部,且往前述樣品盤的中心側延伸,而將自前述光源朝往前述樣品盤的底部之直接光(直射光)加以遮擋並使其反射;以及反射部,位在前述固定部的下部,使來自前述光源之直接光、或來自前述導光部之反射光反射; 且前述照明機構使來自前述光源的光在前述光源區塊的前述各部的內側面反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒。An embodiment of the present invention is preferably as follows. The light source block includes: a fixing portion that fixes the light source; a light guide portion that is located above the fixing portion and extends toward the center side of the sample tray to direct light from the light source toward the bottom of the sample tray (Direct light) to block and reflect it; and the reflection part, located at the lower part of the fixed part, reflects the direct light from the light source or the reflected light from the light guide part; The illumination mechanism reflects light from the light source on the inner surface of each part of the light source block, and irradiates the grain placed on the sample tray from below obliquely as indirect light.

本發明的一實施形態宜如下。 在前述樣品盤的下方將成為背景之黑色反射板加以配設,且另一方面,將前述照明機構配設成鄰接於前述黑色反射板的外方,並將前述光源區塊的前述各部的內側面設成白色。An embodiment of the present invention is preferably as follows. A black reflection plate serving as a background is arranged below the sample tray, and on the other hand, the lighting mechanism is arranged adjacent to the outside of the black reflection plate, and the inside of the respective parts of the light source block The side is set to white.

本發明的一實施形態宜如下。 前述照明機構係在前述樣品盤的斜下方配設複數個,將來自前述光源的光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒。An embodiment of the present invention is preferably as follows. The illumination mechanism is provided with a plurality of obliquely below the sample tray, and irradiates light from the light source as indirect light from a plurality of directions to grains placed on the sample tray.

本發明的一實施形態宜如下。 前述穀粒品級判別裝置,將光照射至具有透明底面之樣品盤所載置之穀粒,使光穿透前述穀粒及/或在前述穀粒反射,並基於來自前述穀粒之穿透光及/或反射光來判別前述穀粒的外觀品級,其中, 在前述樣品盤的斜上方配設具有上部光源之上部照明機構, 前述上部照明機構具備:固定部,固定前述上部光源;下側遮光部,位在前述上部光源的下方,將自前述上部光源朝往前述樣品盤之直接光加以遮擋並使其往上方反射;上側遮光部,位在前述上部光源的上方,且將自前述上部光源朝往上方之直接光、及在前述下側遮光部反射之反射光加以遮擋並使其往下方反射; 且前述上部照明機構使來自前述上部光源的光在前述各遮光部反射,並作為間接光而從斜上方照射至前述樣品盤所載置之穀粒。An embodiment of the present invention is preferably as follows. The aforementioned grain grade discrimination device irradiates light to the grains mounted on the sample tray with a transparent bottom surface, causes light to pass through the grains and/or reflects on the grains, and is based on the penetration from the grains Light and/or reflected light to determine the appearance grade of the aforementioned grain, wherein, The upper light source and the upper illumination mechanism are arranged diagonally above the sample tray, The upper lighting mechanism includes: a fixing portion that fixes the upper light source; a lower light-shielding portion, which is located below the upper light source, blocks direct light from the upper light source toward the sample tray and reflects it upward; upper side The light shielding portion is located above the upper light source, and blocks direct light from the upper light source upward and reflected light reflected by the lower light shielding portion to reflect downward; In addition, the upper illumination mechanism reflects light from the upper light source at the light-shielding portions, and irradiates the grains placed on the sample tray from above diagonally as indirect light.

本發明的一實施形態宜如下。 前述上部照明機構係在一筒體的內面設置複數個,將來自前述上部光源之光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒。An embodiment of the present invention is preferably as follows. The upper illumination mechanism is provided with a plurality of inner surfaces of a cylindrical body, and irradiates light from the upper light source as indirect light to grains placed on the sample tray from a plurality of directions.

本發明的一實施形態宜如下。 將前述各遮光部設成黑色,且另一方面,前述筒體的內面之中,將比前述上側遮光部更下方設成白色、比前述上側遮光部更上方設成黑色。An embodiment of the present invention is preferably as follows. Each of the light-shielding portions is set to black, and on the other hand, the inner surface of the cylinder is set to be white below the upper light-shielding portion and black above the upper light-shielding portion.

本發明的一實施形態宜如下。 在係前述上側遮光部的上方、且係前述筒體的內部配設:黑色遮光板,具有圓形之開口,且具有將來自前述穀粒之穿透光及/或反射光的光量加以調整之光圈功能。An embodiment of the present invention is preferably as follows. Arranged above the upper light-shielding portion and inside the cylindrical body: a black light-shielding plate having a circular opening and having an adjustment to the amount of transmitted light and/or reflected light from the grain Aperture function.

本發明的一實施形態之穀粒品級判別裝置,因為照明機構將來自光源的光作為間接光而從下方照射至樣品盤所載置之穀粒,所以可以避免光源顯映在前述樣品盤的底部。 因此,依據本發明的一實施形態之穀粒品級判別裝置,則可基於來自穀粒之穿透光而以良好精度判別樣品盤所載置之穀粒的外觀品級。In the grain grade discrimination device of an embodiment of the present invention, since the illumination mechanism irradiates light from the light source as indirect light to the grains placed on the sample tray from below, the light source can be prevented from being displayed on the sample tray. bottom. Therefore, according to an embodiment of the present invention, the grain grade discrimination device can discriminate the appearance grade of the grain placed on the sample tray with good accuracy based on the penetrating light from the grain.

又,本發明的一實施形態的穀粒品級判別裝置,因為照明機構將來自光源的光作為間接光而從下方照射至樣品盤所載置之穀粒,所以不須為了避免光源顯映在前述樣品盤的底部而將前述照明機構從前述樣品盤的中心往側方拉遠配設。 因此,依據本發明的一實施形態的穀粒品級判別裝置,則可防止為了避免光源顯映在樣品盤的底部而使裝置大型化。In addition, in the grain grade discrimination device of an embodiment of the present invention, since the illumination mechanism irradiates light from the light source as indirect light from below to the grain placed on the sample tray, there is no need to prevent the light source from appearing in The bottom part of the sample tray is provided with the illumination mechanism pulled away from the center of the sample tray to the side. Therefore, according to the grain grade discrimination device of one embodiment of the present invention, it is possible to prevent the device from being enlarged in size in order to prevent the light source from being displayed on the bottom of the sample tray.

本發明的一實施形態之穀粒品級判別裝置只要定為前述照明機構具有配設在前述樣品盤的斜下方之光源區塊,且前述光源配設在前述光源區塊的內側,前述照明機構將來自前述光源的光在前述光源區塊的內側反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒,則前述照明機構可藉由簡單的構成將來自前述光源的光定為間接光。According to an embodiment of the present invention, the grain grade discrimination device is provided that the lighting mechanism has a light source block disposed obliquely below the sample tray, and the light source is disposed inside the light source block, and the lighting mechanism The light from the light source is reflected inside the light source block, and is irradiated obliquely from below to the grains placed on the sample tray, then the illumination mechanism can simply Light is defined as indirect light.

此外,本發明的一實施形態之穀粒品級判別裝置只要定為將來自光源的光從斜下方照射至樣品盤所載置之穀粒,則適宜偵測胴裂粒等。In addition, the grain grade discrimination device of one embodiment of the present invention is suitable for detecting carcass cracks and the like as long as the light from the light source is irradiated from diagonally below to the grains placed on the sample tray.

本發明的一實施形態之穀粒品級判別裝置只要定為前述光源區塊具備:固定部,固定前述光源;導光部,位在前述固定部的上部,且往前述樣品盤的中心側延伸,而將自前述光源朝往前述樣品盤的底部之直接光(直射光)加以遮擋並使其反射;以及反射部,位在前述固定部的下部,使來自前述光源之直接光或來自前述導光部之反射光反射;且前述照明機構將來自前述光源的光在前述光源區塊的前述各部的內側面反射,並作為間接光而從斜下方照射至前述樣品盤所載置之穀粒,則可藉由前述導光部來縮小前述光源顯映在前述樣品盤的底部之範圍,所以可使裝置小型化。 又,本發明的一實施形態之穀粒品級判別裝置,因為前述照明機構可將來自前述光源的光的大部份導光至前述光源區塊的前述反射部,所以可達成有效利用光。According to an embodiment of the present invention, the grain grade determining device is provided that the light source block is provided with: a fixing portion that fixes the light source; and a light guide portion that is located above the fixing portion and extends toward the center of the sample tray , And the direct light (direct light) from the light source toward the bottom of the sample tray is blocked and reflected; and the reflecting part is located at the lower part of the fixing part, so that the direct light from the light source or the light guide The reflected light of the light part is reflected; and the illumination mechanism reflects the light from the light source on the inner side surfaces of the parts of the light source block, and irradiates the grains placed on the sample tray from below obliquely as indirect light. The range of the light source displayed on the bottom of the sample tray can be reduced by the light guide, so the device can be miniaturized. In addition, in the grain grade discrimination device according to an embodiment of the present invention, since the illumination mechanism can guide most of the light from the light source to the reflection portion of the light source block, effective use of light can be achieved.

本發明的一實施形態之穀粒品級判別裝置只要定為在前述樣品盤的下方將成為背景之黑色反射板加以配設,且另一方面,將前述照明機構配設成鄰接於前述黑色反射板的外方,並將前述光源區塊的前述各部的內側面設成白色,則可藉由前述光源區塊的前述各部的白色的內側面而有效使前述光源的光反射,進行有效應用。又,自前述照明機構入射至成為背景之前述黑色反射板之光的大半部分係成為間接光,因此可避免來自前述黑色反射板之反射導致前述光源顯映在前述樣品盤的底部。The grain grade discrimination device of one embodiment of the present invention is provided as long as the black reflecting plate serving as the background is arranged below the sample tray, and on the other hand, the illumination mechanism is arranged adjacent to the black reflection Outside the board, and the inner side surfaces of the parts of the light source block are set to white, the white inner side surfaces of the parts of the light source block can effectively reflect the light of the light source for effective application. In addition, most of the light incident on the black reflection plate as the background from the illumination mechanism becomes indirect light. Therefore, the reflection from the black reflection plate can prevent the light source from being displayed on the bottom of the sample tray.

本發明的一實施形態之穀粒品級判別裝置只要定為前述照明機構係在前述樣品盤的斜下方配設複數個,將來自前述光源的光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒,則可無論穀粒的朝向如何而以良好精度偵測胴裂粒等。According to an embodiment of the present invention, as long as the grain level discrimination device is set, the illumination mechanism is provided at a plurality of obliquely below the sample tray, and the light from the light source is irradiated to the sample tray from the plural directions as indirect light The placed grains can detect carcass splits with good accuracy regardless of the orientation of the grains.

本發明的一實施形態之穀粒品級判別裝置只要定為上部照明機構使來自上部光源之光在下側遮光部及上側遮光部反射,並作為間接光而從斜上方照射至樣品盤所載置之穀粒,則可避免前述上部光源顯映在前述樣品盤。 因此,依據本發明的一實施形態之穀粒品級判別裝置,則可基於來自穀粒之穿透光及/或反射光而以良好精度判別樣品盤所載置之穀粒的外觀品級。The grain grade discrimination device according to an embodiment of the present invention may be set as an upper illumination mechanism to reflect light from an upper light source on a lower light-shielding portion and an upper light-shielding portion, and irradiate the sample tray from diagonally upward as indirect light. The grains can prevent the upper light source from being displayed on the sample tray. Therefore, the grain grade discrimination device according to an embodiment of the present invention can discriminate the appearance grade of the grain placed on the sample tray with good accuracy based on the transmitted light and/or reflected light from the grain.

又,本發明的一實施形態之穀粒品級判別裝置只要定為上部照明機構將來自上部光源之光在各遮光部反射,並作為間接光而從斜上方照射至樣品盤所載置之穀粒,則不須為了避免上部光源顯映在樣品盤的底部而將前述上部照明機構從前述樣品盤的中心往側方拉遠配設。 因此,依據本發明的一實施形態之穀粒品級判別裝置,則可防止為了避免光源顯映在樣品盤的底部而使裝置大型化。In addition, the grain grade discrimination device of an embodiment of the present invention may be set as an upper illumination mechanism that reflects light from the upper light source in each light-shielding portion, and irradiates the valley mounted on the sample tray diagonally as indirect light. In order to prevent the upper light source from being displayed on the bottom of the sample tray, it is not necessary to dispose the upper lighting mechanism from the center of the sample tray to the side. Therefore, according to the grain grade discrimination device of one embodiment of the present invention, it is possible to prevent the device from being enlarged in size in order to prevent the light source from being displayed on the bottom of the sample tray.

本發明的一實施形態之穀粒品級判別裝置只要定為前述上部照明機構係在筒體的內面設置複數個,將來自前述上部光源之光作為間接光而從複數方向照射至前述樣品盤所載置之穀粒,則可無論穀粒的朝向如何而以良好精度判別外觀品級。According to an embodiment of the present invention, as long as the upper-level illumination mechanism is provided on the inner surface of the cylinder, the upper-level illumination mechanism is determined to irradiate light from the upper-level light source to the sample tray from the multiple directions as indirect light. The grains placed can be judged with good accuracy regardless of the orientation of the grains.

本發明的一實施形態之穀粒品級判別裝置只要定為前述各遮光部係設成黑色,且另一方面,前述筒體的內面之中,將比前述上側遮光部更下方設成白色、比前述上側遮光部更上方設成黑色,則可藉由前述筒體之比前述上側遮光部更下方之白色的內面而有效應用前述各上部光源的光。又,本發明係從前述筒體的上方來將前述樣品盤所載置之穀粒的影像加以取得等,但因為藉由比前述上側遮光部更上方之黑色的內面來避免前述各上部光源的光繞進前述筒體的上方,所以可取得前述穀粒的鮮明影像。 本發明的一實施形態之穀粒品級判別裝置只要在係前述上側遮光部的上方、且係前述筒體的內部配設:黑色遮光板,具有圓形的開口,且具有將來自前述穀粒之穿透光及/或反射光的光量加以調整之光圈功能;則可於從前述筒體的上方將前述樣品盤所載置之穀粒的影像加以取得等之際,取得前述穀粒的鮮明影像。又,可利用變更前述黑色遮光板的前述開口的大小,而調整能取得前述樣品盤所載置之穀粒的影像之範圍,因此有效避免前述光源或前述上部光源顯映在前述樣品盤的底部。 〔發明之效果〕According to an embodiment of the present invention, the grain grade discrimination device is provided that each of the light-shielding portions is set to black, and on the other hand, the inner surface of the cylinder body is set to be white below the upper light-shielding portion 1. The upper part of the upper light-shielding portion is set to black, and the light from the upper light sources can be effectively applied by the white inner surface of the cylindrical body lower than the upper light-shielding portion. In addition, the present invention acquires images of grains placed on the sample tray from above the cylinder, but the black inner surface above the upper light-shielding portion avoids the The light circulates above the barrel, so a clear image of the grain can be obtained. The grain grade discrimination device of an embodiment of the present invention is provided above the upper light-shielding portion and inside the barrel: a black light-shielding plate, having a circular opening, and having The aperture function that adjusts the amount of transmitted light and/or reflected light; when the image of the grain placed on the sample tray is obtained from above the barrel, the vividness of the grain can be obtained image. In addition, the size of the opening of the black shading plate can be changed to adjust the range of the image of the grains placed on the sample tray, thus effectively preventing the light source or the upper light source from being displayed on the bottom of the sample tray . [Effect of Invention]

藉由本發明,提供一種穀粒品級判別裝置,可利用避免光源顯映在透明樣品盤的底部,而以良好精度判別前述樣品盤所載置之穀粒的外觀品級。By the present invention, a grain grade discrimination device is provided, which can distinguish the appearance grade of the grain placed on the sample tray with good accuracy by avoiding the light source being displayed on the bottom of the transparent sample tray.

〔實施發明之較佳形態〕[Preferable embodiment of the invention]

基於圖式說明本發明的實施形態。 圖1顯示本發明的實施形態中之穀粒品級判別裝置的概略說明圖。 圖1所示之穀粒品級判別裝置1具備下部照明用收納部2與上部照明用筒體3。 前述下部照明用收納部2具有俯視下矩形狀之空間,且沿著側面而收納下部照明機構20。在此,顯示將二組下部照明機構20加以收納之例。 前述下部照明用收納部2的上部中央設有圓形的開口部24,且在前述開口部24上載置以透明材料形成之圓形的透明盆4。又,在係前述下部照明用收納部2的底部、且係前述透明盆4的下方將成為背景之黑色反射板23加以配設。 前述下部照明機構20配設在前述透明盆(具有透明底面之樣品盤)4的斜下方,且從斜下方將光照射至前述透明盆4所載置之穀粒。 前述下部照明機構20,如同後述圖8所示,亦可配設在前述透明盆4的正下。此情形下,將前述下部照明機構20定為利用與前述黑色反射板23成為同色之構件來構成,並發揮作為背景之功能之構成。The embodiment of the present invention will be described based on the drawings. FIG. 1 shows a schematic explanatory diagram of a grain grade discrimination device in an embodiment of the present invention. The grain grade determination device 1 shown in FIG. 1 includes a lower lighting storage unit 2 and an upper lighting cylinder 3. The lower lighting storage portion 2 has a rectangular space in plan view, and houses the lower lighting mechanism 20 along the side surface. Here, an example in which two sets of lower lighting mechanisms 20 are stored is shown. A circular opening 24 is provided in the upper center of the lower lighting storage portion 2, and a circular transparent basin 4 formed of a transparent material is placed on the opening 24. In addition, a black reflection plate 23 serving as a background is arranged at the bottom of the storage unit 2 for lower lighting and below the transparent basin 4. The lower illumination mechanism 20 is disposed obliquely below the transparent bowl (sample tray with a transparent bottom surface) 4, and irradiates light to the grains placed on the transparent bowl 4 from obliquely below. As shown in FIG. 8 described later, the lower lighting mechanism 20 may be disposed directly under the transparent basin 4. In this case, the lower lighting mechanism 20 is configured to be a member having the same color as the black reflective plate 23, and functions as a background.

前述上部照明用筒體3,係圓筒形狀,且在前述下部照明用收納部2的上部配設成係與前述開口部24呈同心狀。 前述上部照明用筒體3的內面設有上部照明機構30。在此,顯示圓周方向上設有四組(省略一組圖示)的上部照明機構30。 前述上部照明用筒體3之中,上部係由蓋體34所封閉,經由前述蓋體34的中央所設之開口35,而藉由照相機等影像取得機構(感測器)5來取得前述透明盆4上所載置之穀粒的影像資料。 前述上部照明機構30,配設在前述透明盆4的斜上方,從斜上方將光照射至前述透明盆4所載置之穀粒。The cylindrical body 3 for upper lighting has a cylindrical shape, and is disposed on the upper portion of the storage portion 2 for lower lighting so as to be concentric with the opening 24. An upper lighting mechanism 30 is provided on the inner surface of the cylindrical body 3 for upper lighting. Here, four sets (one set of illustrations are omitted) of the upper lighting mechanism 30 are provided in the circumferential direction of the display. In the upper lighting cylinder 3, the upper part is closed by a lid 34, and the transparency is acquired by an image acquisition mechanism (sensor) 5 such as a camera through an opening 35 provided in the center of the lid 34 Image data of the grains placed on basin 4. The upper lighting mechanism 30 is disposed obliquely above the transparent bowl 4 and irradiates light to the grains placed on the transparent bowl 4 from obliquely above.

圖2係下部照明機構的說明圖,且顯示光源區塊。圖3顯示圖2的A-A剖視圖。 前述下部照明機構20具有下部光源21與長條狀的光源區塊22。 前述光源區塊22具有:固定部221,固定前述下部光源21;以及導光部222,位在前述固定部221的上部前端,且往前述透明盆4的中心側延伸,而將自前述下部光源21朝往前述透明盆4的底部之直接光(直射光)加以遮擋並使其朝往下方反射。 又,前述光源區塊22具有:反射部223,位在前述固定部221的下部,且上表面朝往前述透明盆4的中心側而向下方傾斜,使來自前述下部光源21之直接光或來自前述導光部222之反射光反射。FIG. 2 is an explanatory diagram of a lower lighting mechanism, and shows a light source block. Fig. 3 shows a cross-sectional view taken along line A-A of Fig. 2. The aforementioned lower lighting mechanism 20 has a lower light source 21 and an elongated light source block 22. The light source block 22 includes: a fixing portion 221, which fixes the lower light source 21; and a light guide portion 222, which is located at the upper front end of the fixing portion 221 and extends toward the center side of the transparent basin 4 to be from the lower light source 21 Direct light (direct light) toward the bottom of the aforementioned transparent basin 4 is blocked and reflected downward. In addition, the light source block 22 includes a reflecting portion 223 located at the lower portion of the fixing portion 221, and the upper surface is inclined downward toward the center side of the transparent basin 4, so that direct light from the lower light source 21 or The reflected light of the light guide 222 is reflected.

前述下部照明機構20,使來自前述下部光源21之光在前述光源區塊22的前述各部反射,並自前述反射部223或經由前述黑色反射板23而作為間接光從斜下方照射至前述透明盆4所載置之穀粒。 前述下部照明機構20,可藉由前述導光部222而縮小前述下部光源21顯映在透明盆4的底部之範圍,因此有助於使裝置小型化。 又,前述下部照明機構20,可將來自前述下部光源21之光的大部分導光至前述光源區塊22的前述反射部223,因此可達成有效利用光。The lower illumination mechanism 20 reflects the light from the lower light source 21 at the respective parts of the light source block 22, and radiates the oblique light from the reflective part 223 or through the black reflective plate 23 from below to the transparent basin 4 The grain placed. The lower lighting mechanism 20 can reduce the range of the lower light source 21 displayed on the bottom of the transparent basin 4 by the light guide portion 222, which contributes to miniaturization of the device. In addition, the lower illumination mechanism 20 can guide most of the light from the lower light source 21 to the reflection portion 223 of the light source block 22, so that light can be effectively used.

在此,前述光源區塊22之中,將前述固定部221、前述導光部222、及前述反射部223各部的內側面設成白色。 又,前述下部照明機構20,配設成鄰接於係前述下部照明用收納部2的底部、且係前述黑色反射板23的外方。Here, in the light source block 22, the inner side surfaces of the fixed portion 221, the light guide portion 222, and the reflection portion 223 are set to white. In addition, the lower lighting mechanism 20 is disposed adjacent to the bottom of the storage portion 2 for lower lighting and outside of the black reflector 23.

前述下部照明機構20,可藉由前述光源區塊22的前述各部之白色的內側面,而有效使前述下部光源21的光反射,進行有效應用。 又,因為自前述下部照明機構20入射至前述黑色反射板23之光的大部分成為間接光,所以可避免來自前述黑色反射板23之反射導致前述下部光源21顯映在前述透明盆4的底部。The lower illumination mechanism 20 can effectively reflect the light of the lower light source 21 through the white inner surfaces of the parts of the light source block 22 for effective application. In addition, since most of the light incident on the black reflection plate 23 from the lower illumination mechanism 20 becomes indirect light, it is possible to prevent reflection from the black reflection plate 23 from causing the lower light source 21 to be reflected on the bottom of the transparent basin 4 .

前述下部照明機構20,只要具有一個以上的下部光源21即可,於具有複數下部光源21之情形下,則呈直線狀固定在前述光源區塊22的長邊方向即可。 又,前述下部光源21使用LED(發光二極體)光源,但亦可使用LED光源以外的光源。 此外,前述下部照明機構20,將來自前述下部光源21之光從斜下方照射至透明盆4所載置之穀粒,因此適宜偵測胴裂粒等。The lower lighting mechanism 20 only needs to have one or more lower light sources 21, and in the case of having a plurality of lower light sources 21, it may be fixed in a straight line in the longitudinal direction of the light source block 22. In addition, the lower light source 21 uses an LED (Light Emitting Diode) light source, but a light source other than an LED light source may be used. In addition, the lower illumination mechanism 20 irradiates the light from the lower light source 21 obliquely below to the grains placed in the transparent bowl 4, so it is suitable to detect carcass cracks and the like.

圖4顯示上部照明機構的說明圖。圖5顯示圖4之B-B剖視圖。 前述上部照明機構30具備:上部光源31;下側遮光區塊32,固定在前述上部照明用筒體3的內面;以及上側遮光區塊33。 前述下側遮光區塊32具備:固定部321,固定前述上部光源31;以及下側遮光部322,呈L字狀設在前述固定部321的下部,且將自前述上部光源31朝往前述透明盆4之直接光加以遮擋並使其往上方反射。 前述下側遮光區塊32,在前述固定部321固定在前述上部照明用筒體3的內面。FIG. 4 shows an explanatory diagram of the upper lighting mechanism. FIG. 5 shows a B-B cross-sectional view of FIG. 4. The upper lighting mechanism 30 includes: an upper light source 31; a lower light shielding block 32 fixed to the inner surface of the upper lighting cylinder 3; and an upper light shielding block 33. The lower light shielding block 32 includes: a fixing portion 321 that fixes the upper light source 31; and a lower light shielding portion 322 that is provided in an L-shape below the fixing portion 321 and that is transparent from the upper light source 31 toward the transparent The direct light of the basin 4 is blocked and reflected upward. The lower light shielding block 32 is fixed to the inner surface of the upper lighting cylinder 3 at the fixing portion 321.

前述上側遮光區塊33具備:上側遮光部331,設置成載置或固定在係前述上部光源31的上方、且係前述下側遮光區塊32的前述固定部321上,將自前述上部光源31朝往上方之直接光(直射光)、及在前述下側遮光部322反射之反射光加以遮擋並使其朝下方反射。 在此,前述上側遮光區塊33係使用定為在中央具有圓形的開口之一個環狀構件並係對於四個上部照明機構30而言共通者,但亦可使用係對於各上部照明機構30而言個別獨立者。The upper light-shielding block 33 includes an upper light-shielding portion 331 that is placed or fixed on the fixing portion 321 above the upper light source 31 and on the lower light-shielding block 32 from the upper light source 31 The upward direct light (direct light) and the reflected light reflected by the lower light blocking portion 322 are blocked and reflected downward. Here, the upper light-shielding block 33 uses a ring member defined as having a circular opening in the center and is common to the four upper lighting mechanisms 30, but it may also be used for each upper lighting mechanism 30. In terms of individual independence.

前述上部照明機構30,使來自前述上部光源31的光在前述下側遮光區塊32及前述上側遮光區塊33的各遮光部322、331反射,並作為間接光而從斜上方照射至前述透明盆4所載置之穀粒,因此可避免前述上部光源31顯映在前述透明盆4的底部。The upper lighting mechanism 30 reflects the light from the upper light source 31 at the light shielding portions 322 and 331 of the lower light shielding block 32 and the upper light shielding block 33, and irradiates the transparent light obliquely from above to the transparent The grains placed in the pot 4 can prevent the upper light source 31 from being displayed on the bottom of the transparent pot 4.

在此,將前述下側遮光區塊32及前述上側遮光區塊33設成黑色。 又,前述上部照明用筒體3的內面之中,將比前述上側遮光區塊33(上側遮光部331)的下表面更下方設成白色,比前述上側遮光區塊33(上側遮光部331)的下表面更上方設成黑色。Here, the lower light blocking block 32 and the upper light blocking block 33 are set to black. In addition, among the inner surfaces of the upper lighting cylinder 3, the lower surface of the upper light shielding block 33 (upper light shielding portion 331) is set to be white below the upper surface of the upper light shielding block 33 (upper light shielding portion 331) ) Is set to black above the lower surface.

前述上部照明機構30,可藉由前述上部照明用筒體3之比前述上側遮光區塊33的下表面更下方的白色的內面而有效應用前述各上部光源31的光。 又,雖然從前述上部照明用筒體3的上方經由前述蓋體34的中央所設之開口35而藉由照相機等影像取得機構5來取得前述透明盆4上所載置之穀粒的影像資料,但因為藉由比前述上側遮光區塊33的下表面更上方的黑色的內面來避免前述各上部光源31的光繞進前述上部照明用筒體3的上方,所以可取得前述穀粒的鮮明的影像資料。The upper lighting mechanism 30 can effectively apply the light of the upper light sources 31 through the white inner surface of the upper lighting cylinder 3 below the lower surface of the upper light blocking block 33. Furthermore, the image data of the grain placed on the transparent bowl 4 is acquired by the image acquisition mechanism 5 such as a camera from above the upper illumination cylinder 3 through the opening 35 provided in the center of the cover 34 However, because the black inner surface above the lower surface of the upper light-shielding block 33 prevents the light of the upper light sources 31 from bypassing the upper lighting cylinder 3, the sharpness of the grain can be obtained Image data.

此外,前述上部照明用筒體3使用圓筒形狀者,但亦可使用例如四角筒形狀等角筒形狀者。 又,前述上部光源31使用LED(發光二極體)光源,但亦可使用LED光源以外的光源。In addition, the cylindrical body 3 for upper lighting uses a cylindrical shape, but, for example, a rectangular tube shape such as a rectangular tube shape may be used. In addition, the upper light source 31 uses an LED (Light Emitting Diode) light source, but a light source other than an LED light source may be used.

說明本發明的實施形態中之穀粒品級判別裝置的作用。 首先,將載置穀粒之透明盆4定為位在下部照明用收納部2的上部中央所設之開口部24上。 其次,在下部照明機構20及/或上部照明機構30,分別點亮下部光源21及/或上部光源31的LED,並將光照射至前述透明盆4所載置之前述穀粒,使光穿透前述穀粒及/或在前述穀粒反射。 而且,經由前述上部照明用筒體3之設在蓋體34的開口35,藉由影像取得機構5來取得前述透明盆4所載置之前述穀粒的穿透影像及/或反射影像。The function of the grain grade discrimination device in the embodiment of the present invention will be described. First, the transparent bowl 4 on which the grains are placed is positioned at the opening 24 provided in the upper center of the lower lighting storage portion 2. Next, the LEDs of the lower light source 21 and/or the upper light source 31 are respectively lit in the lower lighting mechanism 20 and/or the upper lighting mechanism 30, and the light is irradiated to the grains placed on the transparent bowl 4 to pass the light Through the grain and/or reflect on the grain. Then, through the opening 35 of the upper illumination cylinder 3 provided in the lid 34, the image acquisition mechanism 5 acquires the penetration image and/or reflection image of the grain placed on the transparent bowl 4.

前述穀粒品級判別裝置1,藉由未圖示之微電腦,而基於前述取得之穿透影像而抽取外形形狀、面積、長度、寬度等形狀資訊、色彩(顏色資訊(R、G、B)、乳白色等)、胴裂等光學資訊,又基於前述取得之反射影像而抽取外形形狀、面積、長度、寬度等形狀資訊,然後基於前述抽取之形狀資訊、光學資訊來判別前述穀粒的外觀品級。The aforementioned grain grade discrimination device 1 extracts shape information, color, color (color information (R, G, B)) such as shape, area, length, width, etc. based on the penetration image obtained through a microcomputer (not shown) , Milky white, etc.), carcass and other optical information, and extract shape information such as shape, area, length, width based on the aforementioned reflected image, and then determine the appearance of the grain based on the extracted shape information and optical information level.

前述下部照明機構20,因為將來自前述下部光源21的光作為間接光而從斜下方照射至前述透明盆4所載置之穀粒,所以可避免前述下部光源21顯映在前述透明盆4的底部。 又,前述上部照明機構30,因為將來自前述上部光源31的光作為間接光而從斜上方照射至前述透明盆4所載置之穀粒,所以可避免前述上部光源31顯映在前述透明盆4的底部。 因此,依據前述穀粒品級判別裝置1,則可基於來自穀粒的穿透光及/或反射光而以良好精度判別前述透明盆4所載置之穀粒的外觀品級。Since the lower illumination mechanism 20 irradiates light from the lower light source 21 as indirect light from obliquely below to the grains placed on the transparent bowl 4, it is possible to prevent the lower light source 21 from being reflected on the transparent bowl 4 bottom. In addition, since the upper lighting mechanism 30 irradiates light from the upper light source 31 as indirect light from above diagonally to the grains placed on the transparent bowl 4, the upper light source 31 can be prevented from being displayed on the transparent bowl 4 bottom. Therefore, according to the grain grade determining device 1 described above, the appearance grade of the grain placed on the transparent bowl 4 can be determined with good accuracy based on the penetrating light and/or reflected light from the grain.

前述穀粒品級判別裝置1之中,因為前述下部照明機構20將來自前述下部光源21的光作為間接光而從斜下方照射至前述透明盆4所載置之穀粒,所以無須為了避免前述下部光源21顯映在前述透明盆4的底部而將前述下部照明機構20從前述透明盆4的中心往側方拉遠配設。 又,前述穀粒品級判別裝置1之中,因為前述上部照明機構30將來自前述上部光源31的光作為間接光而從斜上方照射至前述透明盆4所載置之穀粒,所以無須為了避免前述上部光源31顯映在前述透明盆4的底部而將前述上部照明機構30從前述透明盆4的中心往側方拉遠配置。 因此,依據前述穀粒品級判別裝置1,則可防止為了避免下部光源21及上部光源31顯映在透明盆4的底部而使裝置大型化。In the grain quality determination device 1, the lower illumination mechanism 20 irradiates the grain placed on the transparent bowl 4 obliquely from the lower light source 21 as indirect light, so there is no need to avoid the foregoing The lower light source 21 is displayed on the bottom of the transparent basin 4 and the lower lighting mechanism 20 is arranged to be pulled away from the center of the transparent basin 4 to the side. In addition, in the grain grade determination device 1, the upper illumination mechanism 30 irradiates the grain placed on the transparent bowl 4 from above diagonally with light from the upper light source 31 as indirect light, so there is no need to The upper light source 31 is prevented from being displayed on the bottom of the transparent basin 4 and the upper lighting mechanism 30 is pulled away from the center of the transparent basin 4 to the side. Therefore, according to the above-mentioned grain grade discrimination device 1, it is possible to prevent the device from being enlarged in size in order to prevent the lower light source 21 and the upper light source 31 from being displayed on the bottom of the transparent bowl 4.

此外,前述穀粒品級判別裝置1,可在係前述上側遮光區塊33的上方、且係前述上部照明用筒體3的內部配設:黑色遮光板,具有圓形的開口,且具有將來自前述穀粒的穿透光及/或反射光的光量加以調整之未圖示之光圈功能。 前述穀粒品級判別裝置1只要在前述上部照明用筒體3的內部配設具有光圈功能之前述黑色遮光板,則於經由前述上部照明用筒體3之設在蓋體34的開口35而藉由影像取得機構5來取得前述透明盆4所載置之前述穀粒的穿透影像及/或反射影像之際,可取得前述穀粒的鮮明的影像。又,可利用變更具有光圈功能之前述黑色遮光板的前述開口的大小,而調整能將前述透明盆4所載置之穀粒的影像加以取得之範圍,因此有效於避免前述下部光源21或前述上部光源31顯映在前述透明盆4的底部。In addition, the grain grade determining device 1 may be disposed above the upper light-shielding block 33 and inside the upper lighting cylinder 3: a black light-shielding plate having a circular opening and having a An aperture function (not shown) in which the amount of transmitted light and/or reflected light from the aforementioned grains is adjusted. As long as the black shading plate having an aperture function is arranged inside the upper lighting cylinder 3, the above-mentioned grain grade discrimination device 1 passes through the opening 35 of the upper lighting cylinder 3 provided in the lid 34 When the image obtaining mechanism 5 obtains the penetration image and/or the reflection image of the grain placed on the transparent bowl 4, a vivid image of the grain can be obtained. In addition, the size of the opening of the black shading plate with the aperture function can be changed to adjust the range in which the image of the grain placed on the transparent bowl 4 can be obtained, so it is effective to avoid the lower light source 21 or the aforementioned The upper light source 31 is displayed at the bottom of the aforementioned transparent basin 4.

上述本發明的實施形態之中,以前述穀粒品級判別裝置1在前述下部照明用收納部2收納二組下部照明機構20之情形為例,但只要至少收納一組下部照明機構20即可。又,於前述下部照明用收納部2以90度等間隔收納四組下部照明機構20之情形下,若依序點亮四組前述下部照明機構20的光源而取得各穿透影像、或同時點亮四組前述下部照明機構20的光源而取得穿透影像,則可無論穀粒的朝向如何而以良好精度偵測胴裂粒等。In the embodiment of the present invention described above, the case where the grain grade determining device 1 accommodates two sets of lower lighting mechanisms 20 in the lower lighting storage portion 2 is taken as an example, but it is sufficient if at least one set of lower lighting mechanisms 20 is accommodated . In addition, in the case where the lower lighting storage unit 2 houses four sets of lower lighting mechanisms 20 at equal intervals of 90 degrees, if the light sources of the four groups of lower lighting mechanisms 20 are sequentially turned on to obtain respective penetration images, or simultaneous points By illuminating four groups of light sources of the lower illumination mechanism 20 to obtain a penetration image, it is possible to detect carcass splits with good accuracy regardless of the orientation of the grains.

圖6係下部照明機構的其它例的說明圖、且顯示光源區塊的剖視圖。 圖6所示之下部照明機構20之中,光源區塊22的反射部223的上表面係與下部照明用收納部2的底部約略平行,此點係與圖2及圖3所示之下部照明機構20不同。 圖6所示之下部照明機構20亦與圖2及圖3所示之下部照明機構20同樣,將來自下部光源21的光在前述光源區塊22的內側反射,並經由前述反射部223或黑色反射板23而作為間接光而從斜下方照射至透明盆4所載置之穀粒。6 is an explanatory diagram of another example of the lower lighting mechanism, and a cross-sectional view showing the light source block. In the lower lighting mechanism 20 shown in FIG. 6, the upper surface of the reflecting portion 223 of the light source block 22 is approximately parallel to the bottom of the lower lighting storage portion 2, which is the same as the lower lighting shown in FIGS. 2 and 3. Institution 20 is different. The lower illumination mechanism 20 shown in FIG. 6 is similar to the lower illumination mechanism 20 shown in FIGS. 2 and 3, and reflects light from the lower light source 21 inside the light source block 22 and passes through the reflection section 223 or black The reflecting plate 23 irradiates the grain placed on the transparent bowl 4 from below diagonally as indirect light.

圖7顯示本發明其它實施形態中之穀粒品級判別裝置的概略說明圖。 圖7所示之穀粒品級判別裝置101具備下部照明用收納部2,且僅具備下部照明機構20,並不具備上部照明用筒體,此點係與圖1所示之穀粒品級判別裝置1不同。 圖7所示之穀粒品級判別裝置101係與日本特開2014-173884號公報所記載之裝置同樣合宜使用於目視所行之胴裂米等的檢查。FIG. 7 is a schematic explanatory diagram of a grain grade discrimination device in another embodiment of the present invention. The grain grade discrimination device 101 shown in FIG. 7 includes the lower lighting storage unit 2 and only includes the lower lighting mechanism 20, and does not include the upper lighting cylinder. This point is the same as the grain grade shown in FIG. The discrimination device 1 is different. The grain grade discrimination device 101 shown in FIG. 7 is suitable for inspection of carcass and the like visually, similar to the device described in Japanese Patent Laid-Open No. 2014-173884.

圖7所示之穀粒品級判別裝置101,亦將來自下部光源21的光作為間接光而從斜下方照射至透明盆4所載置之穀粒,因此可避免前述下部光源21顯映在前述透明盆4的底部,且可基於來自穀粒的穿透光而以良好精度判別前述穀粒的外觀品級。The grain grade discrimination device 101 shown in FIG. 7 also irradiates the light from the lower light source 21 as indirect light from diagonally below to the grains placed in the transparent bowl 4, so that the aforementioned lower light source 21 can be prevented from being displayed on The bottom of the transparent bowl 4 can judge the appearance grade of the grain with good accuracy based on the penetrating light from the grain.

圖8顯示圖1所示之穀粒品級判別裝置的變形例的概略說明圖。 圖8所示之穀粒品級判別裝置1之中,下部照明機構20係配設在透明盆4的正下,此點係與圖1所示之穀粒品級判別裝置不同。此情形下,前述下部照明機構20構成為:在內側將下部光源21加以固定之例如圓形的杯型的光源區塊22係呈顛倒狀收納在下部照明用收納部2,並將前述光源區塊22的外側面設成黑色而發揮作為背景之功能。前述下部照明用收納部2亦可定為具有俯視下圓形的空間。FIG. 8 is a schematic explanatory diagram of a modification of the grain grade discrimination device shown in FIG. 1. In the grain grade discrimination device 1 shown in FIG. 8, the lower illumination mechanism 20 is arranged directly under the transparent bowl 4, which is different from the grain grade discrimination device shown in FIG. 1. In this case, the lower lighting mechanism 20 is configured such that, for example, a circular cup-shaped light source block 22 that fixes the lower light source 21 on the inside is stored in the lower lighting storage portion 2 in an inverted shape, and the light source area The outer side of the block 22 is set to black to function as a background. The lower lighting storage portion 2 may be defined as having a circular space in plan view.

圖8所示之穀粒品級判別裝置1之中,前述下部照明機構20使來自前述下部光源21的光在前述光源區塊22及前述下部照明用收納部2的內側面反射,並作為間接光而從下方照射至前述透明盆4所載置之穀粒。 圖8所示之穀粒品級判別裝置1亦可避免前述下部光源21顯映在前述透明盆4的底部,因此可基於來自穀粒的穿透光而以良好精度判別前述穀粒的外觀品級。In the grain grade determination device 1 shown in FIG. 8, the lower illumination mechanism 20 reflects light from the lower light source 21 on the inner side surfaces of the light source block 22 and the lower illumination storage portion 2 as an indirect The light is irradiated from below to the grain placed on the transparent bowl 4. The grain grade discrimination device 1 shown in FIG. 8 can also prevent the lower light source 21 from being displayed on the bottom of the transparent bowl 4, so that the appearance of the grain can be judged with good accuracy based on the penetrating light from the grain. level.

此外,圖8所示之例之中,省略上部照明機構30,但亦可定為與圖1所示之穀粒品級判別裝置同樣在上部照明用筒體3的內面具備上部照明機構30。 又,圖8所示之穀粒品級判別裝置1亦可定為與圖7所示之穀粒品級判別裝置101同樣不具備上部照明用筒體3之構成。In addition, in the example shown in FIG. 8, the upper lighting mechanism 30 is omitted, but it may be determined that the upper lighting mechanism 30 is provided on the inner surface of the upper lighting cylinder 3 in the same way as the grain grade determining device shown in FIG. 1. . In addition, the grain grade discrimination device 1 shown in FIG. 8 may also be configured to have a configuration that does not include the upper lighting cylinder 3 as in the grain grade discrimination device 101 shown in FIG. 7.

本發明的實施形態中之穀粒品級判別裝置,不限於判別米粒的外觀品級,可使用於判別各式各樣穀粒的外觀品級。The grain grade determining device in the embodiment of the present invention is not limited to determining the appearance grade of rice grains, and can be used to determine the appearance grade of various grains.

本發明不限於上述實施形態,當可於不脫離發明範圍下合宜變更其構成。 〔產業利用性〕The present invention is not limited to the above-mentioned embodiments, and its configuration can be appropriately changed without departing from the scope of the invention. [Industrial Utilization]

本發明之穀粒品級判別裝置,可利用避免光源顯映在透明樣品盤的底部,而以良好精度判別前述樣品盤所載置之穀粒的外觀品級,實用性優異。The grain grade discrimination device of the present invention can prevent the light source from being displayed on the bottom of the transparent sample tray, and can judge the appearance grade of the grain placed on the sample tray with good accuracy, and has excellent practicality.

1:穀粒品級判別裝置 2:下部照明用收納部 20:下部照明機構 21:下部光源(LED) 22:光源區塊 221:固定部 222:導光部 223:反射部 23:黑色反射板(背景) 24:開口部 3:上部照明用筒體 30:上部照明機構 31:上部光源(LED) 32:下側遮光區塊 321:固定部 322:下側遮光部 33:上側遮光區塊 331:上側遮光部 34:蓋體 35:開口 4:透明盆 5:影像取得機構(感測器) 101:穀粒品級判別裝置1: Grain grade discrimination device 2: Storage section for lower lighting 20: Lower lighting mechanism 21: Lower light source (LED) 22: Light source block 221: Fixed part 222: Light guide 223: Reflection Department 23: Black reflector (background) 24: opening 3: cylinder for upper lighting 30: Upper lighting mechanism 31: Upper light source (LED) 32: Lower shading block 321: fixed part 322: Lower light shield 33: Upper shading block 331: Upper light shield 34: Cover 35: opening 4: Transparent basin 5: Image acquisition mechanism (sensor) 101: Grain grade discrimination device

圖1係穀粒品級判別裝置的概略說明圖。 圖2係下部照明機構的說明圖。 圖3係圖2的A-A剖視圖。 圖4係上部照明機構的說明圖。 圖5係圖4的B-B剖視圖。 圖6係下部照明機構的其它例的說明圖。 圖7係其它穀粒品級判別裝置的概略說明圖。 圖8係圖1之穀粒品級判別裝置的變形例的概略說明圖。Fig. 1 is a schematic explanatory diagram of a grain grade discrimination device. Fig. 2 is an explanatory diagram of a lower lighting mechanism. Fig. 3 is a cross-sectional view taken along line A-A of Fig. 2. Fig. 4 is an explanatory diagram of an upper lighting mechanism. Fig. 5 is a sectional view taken along line B-B in Fig. 4. 6 is an explanatory diagram of another example of the lower lighting mechanism. Fig. 7 is a schematic explanatory diagram of another grain grade discrimination device. 8 is a schematic explanatory diagram of a modification of the grain grade discrimination device of FIG. 1.

1:穀粒品級判別裝置 1: Grain grade discrimination device

2:下部照明用收納部 2: Storage section for lower lighting

20:下部照明機構 20: Lower lighting mechanism

23:黑色反射板(背景) 23: Black reflector (background)

24:開口部 24: opening

3:上部照明用筒體 3: cylinder for upper lighting

30:上部照明機構 30: Upper lighting mechanism

34:蓋體 34: Cover

35:開口 35: opening

4:透明盆 4: Transparent basin

5:影像取得機構(感測器) 5: Image acquisition mechanism (sensor)

Claims (9)

一種穀粒品級判別裝置,將光照射至具有透明底面之樣品盤所載置之穀粒,使光穿透該穀粒,並基於來自該穀粒的穿透光來判別該穀粒的外觀品級,其中, 在該樣品盤的下方配設具有光源之照明機構, 該照明機構將間接光照射至該樣品盤所載置之穀粒。A grain grade discriminating device that irradiates light to grains placed on a sample tray with a transparent bottom surface, allows light to penetrate the grains, and judges the appearance of the grains based on the penetrating light from the grains Grade, where, An illumination mechanism with a light source is arranged below the sample tray, The illumination mechanism irradiates indirect light to the grains placed on the sample tray. 如申請專利範圍第1項之穀粒品級判別裝置,其中, 該照明機構具有配設在該樣品盤的斜下方之光源區塊,且該光源配設在該光源區塊的內側, 該照明機構使來自該光源的光在該光源區塊的內側反射,並作為間接光而從斜下方照射至該樣品盤所載置之穀粒。For example, the device for judging the grain grade of item 1 of the patent scope, in which The lighting mechanism has a light source block arranged obliquely below the sample tray, and the light source is arranged inside the light source block, The illumination mechanism reflects the light from the light source inside the light source block, and irradiates the grain placed on the sample tray diagonally from below as indirect light. 如申請專利範圍第2項之穀粒品級判別裝置,其中, 該光源區塊具備:固定部,固定該光源;導光部,位在該固定部的上部,且往該樣品盤的中心側延伸,而將自該光源朝往該樣品盤的底部之直接光加以遮擋並使其反射;以及反射部,位在該固定部的下部,且使來自該光源的直接光、或來自該導光部的反射光反射; 且該照明機構使來自該光源的光在該光源區塊的前述各部的內側面反射,並作為間接光而從斜下方照射至該樣品盤所載置之穀粒。For example, the device for judging the grain quality of item 2 of the patent scope, in which The light source block is provided with: a fixing part to fix the light source; a light guide part located at the upper part of the fixing part and extending toward the center side of the sample tray to direct light from the light source toward the bottom of the sample tray Shield and reflect it; and the reflection part, which is located at the lower part of the fixed part, and reflects the direct light from the light source or the reflected light from the light guide part; And the illumination mechanism reflects the light from the light source on the inner surface of each part of the light source block, and irradiates the grain placed on the sample tray diagonally as indirect light. 如申請專利範圍第3項之穀粒品級判別裝置,其中, 在該樣品盤的下方配設成為背景之黑色反射板,且另一方面,將該照明機構配設成鄰接於該黑色反射板的外方,並將該光源區塊的前述各部的內側面設成白色。For example, the device for judging the grain grade of item 3 of the patent scope, in which A black reflecting plate serving as a background is arranged below the sample tray, and on the other hand, the lighting mechanism is arranged adjacent to the outer side of the black reflecting plate, and the inner side surfaces of the aforementioned portions of the light source block are arranged Into white. 如申請專利範圍第1至4項中任一項之穀粒品級判別裝置,其中, 該照明機構係在該樣品盤的斜下方配置複數個,將來自該光源的光作為間接光而從複數方向照射至該樣品盤所載置之穀粒。For example, the grain grade discrimination device according to any one of the items 1 to 4 of the patent application scope, wherein, The illumination mechanism arranges a plurality of obliquely below the sample tray, and irradiates light from the light source as indirect light to grains placed on the sample tray from a plurality of directions. 如申請專利範圍第1至4項中任一項之穀粒品級判別裝置,其中, 該穀粒品級判別裝置,將光照射至具有透明底面之樣品盤所載置之穀粒,且使光穿透該穀粒及/或在該穀粒反射,並基於來自該穀粒的穿透光及/或反射光來判別該穀粒的外觀品級, 在該樣品盤的斜上方配設具有上部光源之上部照明機構, 該上部照明機構具備:固定部,固定該上部光源;下側遮光部,位在該上部光源的下方,且將自該上部光源朝往該樣品盤之直接光加以遮擋並使其往上方反射;以及上側遮光部,位在該上部光源的上方,且將自該上部光源朝往上方之直接光、與在該下側遮光部反射之反射光加以遮擋並使其往下方反射; 且該上部照明機構使來自該上部光源之光在該各遮光部反射,並作為間接光而從斜上方照射至該樣品盤所載置之穀粒。For example, the grain grade discrimination device according to any one of the items 1 to 4 of the patent application scope, wherein, The grain grade discrimination device irradiates light to the grains mounted on the sample tray with a transparent bottom surface, and causes light to penetrate the grains and/or reflect on the grains, based on the penetration from the grains Transmit and/or reflect light to determine the appearance grade of the grain, The upper light source and the upper lighting mechanism are arranged diagonally above the sample tray. The upper lighting mechanism includes: a fixing portion that fixes the upper light source; a lower light-shielding portion, which is located below the upper light source, and blocks direct light from the upper light source toward the sample tray and reflects it upward; And the upper light-shielding part is located above the upper light source, and blocks direct light from the upper light source upward and reflected light reflected from the lower light-shielding part to reflect downward; And the upper illumination mechanism reflects the light from the upper light source at the light shielding portions, and irradiates the grains placed on the sample tray diagonally as indirect light. 如申請專利範圍第6項之穀粒品級判別裝置,其中, 該上部照明機構係在筒體的內面設置複數個,將來自該上部光源之光作為間接光而從複數方向照射至該樣品盤所載置之穀粒。For example, the device for judging the grain grade of item 6 of the patent scope, in which The upper illumination mechanism is provided on the inner surface of the cylinder, and the light from the upper light source is used as indirect light to irradiate the grains placed on the sample tray from the plural directions. 如申請專利範圍第7項之穀粒品級判別裝置,其中, 將該各遮光部設成黑色,且另一方面,該筒體的內面之中,將比該上側遮光部更下方設成白色、比該上側遮光部更上方設成黑色。For example, the grain quality judgment device of the seventh item of the patent scope, in which Each of the light-shielding portions is set to black, and on the other hand, the inner surface of the cylinder is set to be white below the upper light-shielding portion and black above the upper light-shielding portion. 如申請專利範圍第7項之穀粒品級判別裝置,其中, 在該上側遮光部的上方、且位於該筒體的內部配設:黑色遮光板,具有圓形之開口,用以調整來自該穀粒的穿透光及/或反射光的光量。For example, the grain quality judgment device of the seventh item of the patent scope, in which Above the upper light-shielding portion and inside the cylinder, a black light-shielding plate with a circular opening is provided to adjust the amount of light transmitted and/or reflected from the grain.
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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7404895B2 (en) * 2020-01-29 2023-12-26 株式会社サタケ grain discriminator
JP7512733B2 (en) * 2020-07-21 2024-07-09 株式会社サタケ Grain Inspection Machine
JP7044150B1 (en) * 2020-12-18 2022-03-30 株式会社サタケ Reference member and grain discriminator
WO2022137817A1 (en) * 2020-12-23 2022-06-30 株式会社サタケ Grain discerning device

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10300679A (en) * 1997-04-22 1998-11-13 Satake Eng Co Ltd Optical detection device in granular material color sorter
JP2003057611A (en) * 2001-08-13 2003-02-26 San Contact Lens:Kk Contact lens inspection device
TW539853B (en) * 2001-09-10 2003-07-01 Yamagataken Grain quality judging sample container, grain quality judger, grain quality judging system, grain image reading device, sample arraying jig for the grain image reading device, sample arraying method, and sample arrayer for the grain image reading device
JP2007078581A (en) * 2005-09-15 2007-03-29 Shinko Seiki Co Ltd Illumination device for visual inspection
JP2008203093A (en) * 2007-02-20 2008-09-04 Mitsutoyo Corp Illumination device and image measurement apparatus
JP2009217222A (en) * 2008-03-06 2009-09-24 Takashi Goto Observation base with reflection type transmissive illumination auxiliary device
EP2587562A4 (en) * 2011-01-14 2013-06-12 Panasonic Corp LIGHT SOURCE LIGHTING
JP6094186B2 (en) * 2012-12-04 2017-03-15 株式会社サタケ Grain appearance inspection kit and grain appearance inspection method
JP6229278B2 (en) * 2013-03-06 2017-11-15 株式会社サタケ Grain fluoroscope
JP6203611B2 (en) * 2013-05-27 2017-09-27 株式会社ケット科学研究所 Application program for causing operation panel type information terminal to function as means for grain appearance inspection, and grain discrimination system combining imaging means and operation panel type information terminal
JP2015094644A (en) * 2013-11-12 2015-05-18 株式会社クボタ Egg appearance inspection apparatus and method
KR101474191B1 (en) * 2014-02-03 2014-12-18 삼성전기주식회사 Luminous module and visual inspection system using the same
JP6036778B2 (en) * 2014-09-26 2016-11-30 ウシオ電機株式会社 Light irradiation apparatus and photocuring material processing apparatus
JP5973521B2 (en) * 2014-10-15 2016-08-23 株式会社クボタ Optical grain evaluation system
WO2016098882A1 (en) * 2014-12-19 2016-06-23 株式会社サタケ Grain quality discrimination device
CN107003507A (en) * 2015-03-31 2017-08-01 奥林巴斯株式会社 Observe device and observational technique
JP6687826B2 (en) * 2015-04-06 2020-04-28 株式会社サタケ Grain quality determination device and method of receiving light from grain in the device
JP6862155B2 (en) * 2016-11-24 2021-04-21 第一実業ビスウィル株式会社 Visual inspection equipment

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