TW201703174A - Semiconductor wafer carrier assembly, door assembly, substrate container in combination with getter modules, and method of reducing concentration of contaminants with-in a front opening container - Google Patents
Semiconductor wafer carrier assembly, door assembly, substrate container in combination with getter modules, and method of reducing concentration of contaminants with-in a front opening container Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67389—Closed carriers characterised by atmosphere control
- H01L21/67393—Closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrierl
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Abstract
Description
本申請案主張於2015年3月11日提出申請之美國臨時申請案第62/131,478號之優先權。 The present application claims priority to US Provisional Application No. 62/131,478, filed on March 11, 2015.
用於半導體處理中之基板(例如晶圓及光罩(reticle))極易受污染物(包含水份、揮發性有機組分(volatile organic component;VOC)及顆粒)損害。水份之存在例如可導致霾於光罩及晶圓上之生長。一種用於控制包含水份之污染物之方式係為連續地或週期性地吹洗其中儲存有或固定有基板之一容器內之空間。於運輸期間,已認為使用吹洗並不實際,且於運輸期間於容器內已使用例如吸氣劑等裝置將水份及揮發性有機組分保持於可接受之水準。基板容器中之乾燥劑及吸氣劑通常需要於洗滌容器之前進行移除或拆離,乃因所使用之流體可對該等乾燥劑或吸氣劑造成破壞。 Substrates (eg, wafers and reticles) used in semiconductor processing are highly susceptible to contamination (including moisture, volatile organic components (VOC), and particulates). The presence of moisture, for example, can result in growth on the reticle and wafer. One method for controlling contaminants comprising moisture is to continuously or periodically purge a space within a container in which one of the substrates is stored or fixed. During transport, it has been considered impractical to use purging, and the moisture and volatile organic components have been maintained at acceptable levels in the container during transport using, for example, a getter. The desiccant and getter in the substrate container typically need to be removed or detached prior to washing the container, as the fluid used can cause damage to the desiccant or getter.
被稱為前開式統一標準盒(front opening unified pod;FOUP)、前開式運輸箱(front opening shipping box;FOSB)、或標準機械介面(standard mechanical interface;SMIF)盒之密封容器用作晶圓容器或光罩盒。該等容器提供一微環境,以對環繞製造積體電路時使用之晶圓及基板之體積進行隔離及控制。此等容器可得自本申請案之擁有者之英特格 公司(Entegris,Inc.)。 A sealed container called a front opening unified pod (FOUP), a front opening shipping box (FOSB), or a standard mechanical interface (SMIF) box is used as a wafer container. Or a reticle box. The containers provide a microenvironment to isolate and control the volume of wafers and substrates used in the fabrication of the integrated circuit. These containers are available from the owner of this application. Company (Entegris, Inc.).
由於水份、揮發性有機組分及顆粒對半導體生產之不利影響,因此提高對此等污染物之控制可為所期望的。 Increasing control of such contaminants may be desirable due to the adverse effects of moisture, volatile organic components, and particulates on semiconductor production.
一種半導體晶圓載具總成包含一載具,該載具界定適以支撐一或多個半導體晶圓之一晶圓儲存區域。該載具具有一前開式門,該前開式門包含一門殼體及一閂鎖機構,該閂鎖機構可操作地耦合該門殼體以使該門關牢,該門係為可開啟的以供存取該晶圓儲存區域,該門界定面朝該晶圓儲存區域之一內側。該總成亦包含一吸氣劑模組,該吸氣劑模組包含:一剛性聚合物殼體,具有一存取開口;吸氣材料,設置於該吸氣劑模組殼體內,該吸氣材料適以經由該存取開口而降低該載具之該晶圓儲存區域內之污染物之濃度;以及至少一個剛性聚合物連接特徵,作為該吸氣劑模組殼體之一部分或自該吸氣劑模組殼體延伸出,該連接特徵適以將該吸氣劑模組輕易地、可移除地固定至該門之該內側。 A semiconductor wafer carrier assembly includes a carrier defining a wafer storage area adapted to support one or more semiconductor wafers. The carrier has a front open door including a door housing and a latch mechanism operatively coupled to the door housing to secure the door, the door being openable For accessing the wafer storage area, the gate is defined to face one of the wafer storage areas. The getter module also includes a getter module comprising: a rigid polymer housing having an access opening; a getter material disposed in the getter module housing, the suction The gas material is adapted to reduce the concentration of contaminants in the wafer storage region of the carrier via the access opening; and at least one rigid polymer connection feature as part of or as part of the getter module housing The getter module housing extends out, the attachment feature being adapted to easily and removably secure the getter module to the inner side of the door.
根據一個實施例,該吸氣材料係為一單一吸氣劑包(getter pack)之形式,該吸氣劑包設置於一基座與一單一封蓋之間。根據其他實施例,該吸氣材料係為支撐於一基座框架上之複數個吸氣劑包之形式,其中一封蓋設置於每一吸氣劑包上方。為易於進行移除及替換起見,單一吸氣劑式模組或總成及多吸氣劑式模組或總成二者皆於該容器之該門中之容置器或附裝點內相對地、可移除地附裝至該載具之該門。 According to one embodiment, the getter material is in the form of a single getter pack disposed between a base and a single cover. According to other embodiments, the getter material is in the form of a plurality of getter packs supported on a base frame, wherein a cover is disposed over each getter pack. For ease of removal and replacement, a single getter module or assembly and a multi-aspirator module or assembly are both within the receptacle or attachment point of the door of the container. The door is removably attached to the vehicle.
本發明之實施例可與用於容納不同晶圓大小(例如150毫米矽晶圓、200毫米矽晶圓、300毫米矽晶圓、及450毫米矽晶圓,此處僅列舉幾個實例)之各種運輸器或其他載具或容器一起使用。藉由閱讀本發明,本發明之其他態樣對於通常知識者而言將顯而易見,且本發明內容不應被 視為限制性的。 Embodiments of the present invention can be used to accommodate different wafer sizes (eg, 150 mm germanium wafers, 200 mm germanium wafers, 300 mm germanium wafers, and 450 mm germanium wafers, to name a few examples) Use with a variety of transporters or other vehicles or containers. Other aspects of the invention will be apparent to those of ordinary skill in the <RTIgt; It is considered restrictive.
10‧‧‧半導體晶圓載具總成/總成/載具總成 10‧‧‧Semiconductor Wafer Carrier Assembly/Assembly/Carriage Assembly
15‧‧‧載具/容器 15‧‧‧ Vehicles/containers
20‧‧‧半導體晶圓/晶圓 20‧‧‧Semiconductor Wafer/Wafer
25‧‧‧堆疊 25‧‧‧Stacking
30‧‧‧晶圓儲存區域 30‧‧‧ Wafer storage area
35‧‧‧門 35‧‧‧
37‧‧‧內壁 37‧‧‧ inner wall
40‧‧‧內側 40‧‧‧ inside
42‧‧‧面朝內的表面 42‧‧‧ face-facing surface
43‧‧‧外壁 43‧‧‧ outer wall
45‧‧‧外側 45‧‧‧ outside
46‧‧‧外表面 46‧‧‧ outer surface
50‧‧‧門殼體 50‧‧‧ door housing
52‧‧‧閂鎖機構 52‧‧‧Latch mechanism
55‧‧‧突片 55‧‧‧1
60‧‧‧孔隙 60‧‧‧ pores
65‧‧‧凹槽 65‧‧‧ Groove
100‧‧‧吸氣劑模組/模組/第一吸氣劑模組/單一吸氣劑式模組/吸氣劑總成/所附裝模組/被動式吸氣劑模組 100‧‧‧Absorber module/module/first getter module/single getter module/ getter assembly/attached module/passive getter module
100’‧‧‧第二吸氣劑模組 100'‧‧‧second getter module
105‧‧‧殼體 105‧‧‧Shell
110‧‧‧基座 110‧‧‧Base
112‧‧‧凹槽 112‧‧‧ Groove
115‧‧‧封蓋 115‧‧‧ Cover
120‧‧‧吸氣材料/單一吸氣劑包 120‧‧‧Sucking material/single getter bag
125‧‧‧密封件/接合面 125‧‧‧Sealings/joints
130‧‧‧過濾器/滑入式或卡扣式過濾器 130‧‧‧Filter/slide-in or snap-on filter
135‧‧‧過濾器封蓋 135‧‧‧Filter cover
140‧‧‧孔隙/中央孔隙 140‧‧‧Pore/Central Pore
145‧‧‧周向設置之孔隙/孔隙 145‧‧‧ circumferentially set pores/pores
150‧‧‧孔隙 150‧‧‧ pores
155‧‧‧孔隙 155‧‧‧ pores
160、162‧‧‧連接特徵 160, 162‧‧‧ Connection characteristics
165‧‧‧突出部 165‧‧‧ highlights
170‧‧‧中央鰭片/鰭片/第一模組 170‧‧‧Central Fin/Fin/First Module
172‧‧‧第二模組 172‧‧‧ second module
174‧‧‧第三模組 174‧‧‧ third module
175‧‧‧末端鰭片/鰭片 175‧‧‧End fins/fins
176‧‧‧第四模組 176‧‧‧ fourth module
180‧‧‧被偏置之實質V形構件/構件/被偏置構件 180‧‧‧Substantially V-shaped members/members/biased members
182‧‧‧腿 182‧‧‧ legs
184‧‧‧腿 184‧‧‧ legs
185‧‧‧內部面板或表面 185‧‧‧Interior panels or surfaces
186‧‧‧外部面板或表面 186‧‧‧External panels or surfaces
190‧‧‧容置器 190‧‧‧ Container
192‧‧‧凹槽 192‧‧‧ Groove
194‧‧‧側壁 194‧‧‧ side wall
196‧‧‧止擋件構件 196‧‧‧stop member
198‧‧‧凸緣 198‧‧‧Flange
200‧‧‧晶圓保持器/結構/保持器 200‧‧‧ Wafer Holder / Structure / Holder
205‧‧‧晶圓平台 205‧‧‧ Wafer Platform
210‧‧‧卡扣式連接器 210‧‧‧Snap connector
300‧‧‧吸氣劑模組/模組/多吸氣劑式模組/吸氣劑總成/被動式吸氣劑模組 300‧‧‧Absorber module/module/multi-aspirator module/ getter assembly/passive getter module
305‧‧‧殼體 305‧‧‧Shell
310‧‧‧基座 310‧‧‧Base
312、314‧‧‧凹槽/末端凹槽 312, 314‧‧‧ Groove/end groove
313‧‧‧凹槽/中間凹槽 313‧‧‧ Groove/intermediate groove
315、317、319‧‧‧封蓋 315, 317, 319‧‧ ‧ cover
320、322、324‧‧‧吸氣材料 320, 322, 324‧‧‧ suction materials
325、327、329‧‧‧密封件/結合面 325, 327, 329‧ ‧ seals / joints
330‧‧‧過濾器 330‧‧‧Filter
335‧‧‧過濾器封蓋 335‧‧‧Filter cover
340‧‧‧孔隙 340‧‧‧ pores
360、362‧‧‧連接特徵 360, 362‧‧‧ connection features
375‧‧‧孔隙 375‧‧‧ pores
410、415、420、425‧‧‧步驟 410, 415, 420, 425‧ ‧ steps
第1圖係為根據本發明一實施例之具有門之一基板容器之前視立體圖。 1 is a front perspective view of a substrate container having a door in accordance with an embodiment of the present invention.
第2圖係為根據本發明一實施例之一吸氣劑模組之分解圖。 2 is an exploded view of a getter module in accordance with an embodiment of the present invention.
第3圖係為根據本發明一實施例之第2圖所示吸氣劑模組之前視立體圖。 Fig. 3 is a front perspective view of the getter module shown in Fig. 2 according to an embodiment of the present invention.
第4圖係為根據本發明一實施例之第2圖所示吸氣劑模組之後視立體圖。 Fig. 4 is a rear perspective view of the getter module shown in Fig. 2 according to an embodiment of the present invention.
第5圖係為根據本發明一實施例之具有第2圖所示複數個吸氣劑模組之一容器門之立體圖,其中一個吸氣劑模組固定至該門,且一個吸氣劑模組相對於該門處於一安裝前之定位或移除後之定位。 Figure 5 is a perspective view of a container door having a plurality of getter modules shown in Figure 2, wherein a getter module is fixed to the door and a getter mold is used according to an embodiment of the present invention. The set is positioned relative to the door prior to or prior to installation.
第6圖係為根據本發明一實施例之安裝於第5圖所示門中之第2圖所示吸氣劑之特寫立體圖。 Fig. 6 is a close-up perspective view of the getter shown in Fig. 2 attached to the door shown in Fig. 5 according to an embodiment of the present invention.
第7圖係為根據本發明另一實施例之一吸氣劑模組之分解圖。 Figure 7 is an exploded view of a getter module in accordance with another embodiment of the present invention.
第8圖係為根據本發明一實施例之第7圖所示吸氣劑模組之立體圖。 Figure 8 is a perspective view of a getter module shown in Figure 7 in accordance with an embodiment of the present invention.
第9圖係為根據本發明一實施例之安裝有第8圖所示吸氣劑模組及第3圖所示吸氣劑模組之第5圖所示門之立體圖。 Figure 9 is a perspective view of the door shown in Figure 5, in which the getter module of Figure 8 and the getter module of Figure 3 are mounted, in accordance with an embodiment of the present invention.
第10圖係為根據本發明一實施例之安裝於第5圖所示門中之第8圖所示吸氣劑模組之特寫立體圖。 Figure 10 is a close-up perspective view of the getter module shown in Figure 8 attached to the door shown in Figure 5, in accordance with an embodiment of the present invention.
第11圖係為顯示一種根據本發明一實施例之方法之流程圖。 Figure 11 is a flow chart showing a method in accordance with an embodiment of the present invention.
晶圓容器微環境內部中之水份、氧氣、氣載分子污染物(airborne molecular contaminant;AMC)、揮發性有機化合物(volatile organic compound;VOC)、或其他異物之不受控制之濃度可導致電路缺陷及降低良率。使用吸氣劑來控制及降低此等濃度。然而,於某些晶圓載具(例如450毫米或更大之晶圓載具)中,於載具之後面可不存在足夠空間來放置一吸氣劑,且於載具內亦可不存在足夠空間供一第26或其他額外晶圓狹槽來容納配備有一吸氣劑之碟片。本發明之某些實施例藉由使用亦可用於附裝例如晶圓襯墊或保持器等配件之附裝點而於一載具之門中提供可插入及可替換式吸氣劑來解決該等問題。 Water, oxygen, airborne molecular contaminant (AMC), volatile organic compounds in the interior of the wafer container microenvironment Uncontrolled concentrations of compounds; VOCs, or other foreign matter can cause circuit defects and reduce yield. Use a getter to control and reduce these concentrations. However, in some wafer carriers (for example, wafer carriers of 450 mm or larger), there may not be enough space behind the carrier to place a getter, and there is not enough space in the carrier for one. A 26th or other additional wafer slot to accommodate a disc equipped with a getter. Certain embodiments of the present invention address these by providing an insertable and replaceable getter in a door of a carrier by using attachment points that can also be used to attach accessories such as wafer pads or holders. problem.
更具體而言,一吸氣劑總成或模組包含一殼體或封閉體,該殼體或封閉體設置有一吸氣劑並安裝於一微環境門之一內面上。該吸氣劑總成用於清除各種化學品或以其他方式降低載具內之污染物或其他異物之濃度。一或多個吸氣劑總成可附裝至門之多個位置中。於一個構型中,一框架附裝至門上之多個位置並支撐多種吸氣劑。扣件、壓配合、卡扣配合、及摩擦配合係為用於將框架或吸氣劑總成附裝至門或載具中之其他位置之方法之實例。吸氣劑總成可為可消耗性或單次使用性商品類型之物品;吸氣劑總成亦可於一具體微環境容器之多次使用之間重複使用或再補充。 More specifically, a getter assembly or module includes a housing or enclosure that is provided with a getter and is mounted to an inner surface of a microenvironment door. The getter assembly is used to remove various chemicals or otherwise reduce the concentration of contaminants or other foreign matter in the carrier. One or more getter assemblies can be attached to multiple locations of the door. In one configuration, a frame is attached to a plurality of locations on the door and supports a plurality of getters. Fasteners, press fits, snap fits, and friction fits are examples of methods for attaching a frame or getter assembly to other locations in a door or carrier. The getter assembly can be a consumable or single-use product type item; the getter assembly can also be reused or replenished between multiple uses of a particular micro-environment container.
本發明之實施例可提供以下優點:例如提高晶圓良率以及持久地保護微環境不受水分、氧氣、酸、鹼、及其他污染物之損害。於某些情況下,於一容器門中安裝吸氣劑模組會消除或減少對容器中至外部環境之額外孔之需要。多個不同之吸氣劑模組可被配置及佈置成視需要清除各種化學品,且可藉由遞交門而非操縱整個載具總成或以其他方式侵入更接近晶圓操縱體積之載具之內部來替換吸氣劑模組。 Embodiments of the present invention can provide advantages such as improved wafer yield and long-lasting protection of the microenvironment from moisture, oxygen, acids, alkalis, and other contaminants. In some cases, installing a getter module in a container door eliminates or reduces the need for additional holes in the container to the external environment. A plurality of different getter modules can be configured and arranged to remove various chemicals as needed, and can be moved through the door instead of manipulating the entire carrier assembly or otherwise invading the carrier closer to the wafer handling volume The inside is used to replace the getter module.
轉向參照各圖,第1圖例示根據本發明一實施例之半導體晶圓載具總成10。總成10包含載具15,載具15適以支撐晶圓儲存區域30內之一或多個半導體晶圓20或堆疊25中之其他基板。載具15具有用於密封地閉 合載具15並用於打開載具15以容許存取晶圓儲存區域30之門35。亦參照第5圖,門35具有一內壁37及一外壁43,內壁37具有內側40並位於面朝內的表面42中,該側面朝晶圓儲存區域30,外壁43具有一外側45及一外表面46並背對晶圓儲存區域30。門35包含一閂鎖機構52之門殼體50,閂鎖機構52包含自孔隙60延伸至載具15中之對應凹槽65中之突片55以使門35關牢。 Turning to the figures, FIG. 1 illustrates a semiconductor wafer carrier assembly 10 in accordance with an embodiment of the present invention. Assembly 10 includes a carrier 15 adapted to support one or more of semiconductor wafers 20 or other substrates in stack 25 within wafer storage area 30. The carrier 15 has a closed seal for sealing The carrier 15 is coupled and used to open the carrier 15 to permit access to the door 35 of the wafer storage area 30. Referring also to FIG. 5, the door 35 has an inner wall 37 having an inner side 40 and an inwardly facing surface 42 facing the wafer storage area 30, the outer wall 43 having an outer side 45 and An outer surface 46 faces away from the wafer storage area 30. The door 35 includes a door housing 50 of a latch mechanism 52 that includes tabs 55 extending from the apertures 60 into corresponding recesses 65 in the carrier 15 to secure the door 35.
於所示實施例中,載具總成10係被稱為一前開式統一標準盒(FOUP)之一前開式晶圓容器。根據本發明實施例之其他類型之載具總成包含前開式運輸箱(FOSB)、標準機械介面盒(SMIF pod)、水平晶圓運輸器、單一晶圓運輸器、通用晶圓運輸器、或用於半導體磁碟或晶圓、用於基板、或用於其他物品之任何其他類型之載具。此等載具之實例闡述於美國專利第4,815,912號、第4,995,430號、第5,788,082號、第6,010,008號、及第6,354,601號中,上述美國專利皆由本申請案之擁有者擁有且皆以引用方式全文併入本文中以用於所有目的。 In the illustrated embodiment, the carrier assembly 10 is referred to as a front opening wafer container of a front open unified standard box (FOUP). Other types of carrier assemblies in accordance with embodiments of the present invention include a front open transport case (FOSB), a standard mechanical interface box (SMIF pod), a horizontal wafer transporter, a single wafer transporter, a universal wafer transporter, or Any other type of carrier used for semiconductor disks or wafers, for substrates, or for other articles. Examples of such vehicles are described in U.S. Patent Nos. 4,815,912, 4,995,430, 5, 788, 082, 6, 010, 008, and 6, 354, 601, each of which is owned by the assignee of In this article for all purposes.
第2圖至第4圖例示亦被稱為一吸氣劑總成之吸氣劑模組100。吸氣劑模組100包含具有基座110及封蓋115之殼體105。吸氣材料120設置於殼體105內,且具體而言於基座110上支撐於基座110之凹槽112內。封蓋115設置於基座110及吸氣材料120上方。根據一個實施例,封蓋115藉由黏著劑、超音波焊接或其他焊接或者其他模式而沿密封件或接合面125被密封或以其他方式實質上永久性地連接至基座110,其中吸氣劑模組100於使用之後可全部處理掉。作為另一選擇,封蓋115例如以一卡扣配合連接可移除地附裝至基座110,使得殼體105內之吸氣材料120或其他組件於多次使用之間可替換或可再補充。 Figures 2 through 4 illustrate a getter module 100, also referred to as a getter assembly. The getter module 100 includes a housing 105 having a base 110 and a cover 115. The getter material 120 is disposed within the housing 105 and, in particular, is supported on the base 110 in the recess 112 of the base 110. The cover 115 is disposed above the base 110 and the getter material 120. According to one embodiment, the cover 115 is sealed or otherwise substantially permanently attached to the base 110 along the seal or joint surface 125 by an adhesive, ultrasonic welding or other weld or other pattern, wherein the cover is inhaled The agent module 100 can be disposed of completely after use. Alternatively, the cover 115 can be removably attached to the base 110, for example, in a snap-fit connection such that the getter material 120 or other components within the housing 105 can be replaced or reused between multiple uses. supplement.
一或多個可選過濾器130設置於封蓋115與吸氣材料120之間,並由一或多個可選對應過濾器封蓋135定位及支撐。根據本發明之實施 例,過濾器封蓋135永久性地(例如藉由超音波焊接)或可移除地固定至封蓋115,以例如相對於封蓋115及吸氣材料120將過濾器130固持於適當地點。過濾器封蓋135亦可為用以容納一滑入式或卡扣式過濾器130之固持器之形式。過濾器130提供由內而外之保護及由外而內之保護二種保護,以用於過濾掉微粒物並實質上降低外部顆粒對吸氣材料120之污染,且亦用於將任何顆粒保持於殼體105內以防止對載具15內之微環境造成對應污染。 One or more optional filters 130 are disposed between the cover 115 and the getter material 120 and are positioned and supported by one or more optional corresponding filter covers 135. Implementation in accordance with the present invention For example, the filter cover 135 is permanently (e.g., by ultrasonic welding) or removably secured to the cover 115 to hold the filter 130 in place relative to, for example, the cover 115 and the getter material 120. The filter cover 135 can also be in the form of a holder for receiving a slide-in or snap-on filter 130. The filter 130 provides both internal and external protection and protection from the outside to protect the particulate matter and substantially reduce the contamination of the getter material 120 by the external particles, and is also used to retain any particles. Within the housing 105 to prevent corresponding contamination of the microenvironment within the carrier 15.
吸氣劑模組100亦界定穿過封蓋115之一或多個孔隙140,孔隙140用以將吸氣材料120在化學上暴露於載具15及晶圓儲存區域30之內部,或以其他方式促進或容許吸氣材料120與吸氣劑模組100外面之環境間之相互作用。於所示實施例中,孔隙140係為由六個周向設置之孔隙145環繞之一中央孔隙,但藉由閱讀此揭露內容,孔隙140、145之其他數目及構型對於通常知識者而言將顯而易見。中央孔隙140及周向設置之孔隙145與每一過濾器封蓋135中之對應孔隙150、155對應並大致對齊。 The getter module 100 also defines one or more apertures 140 through the cover 115 for chemically exposing the getter material 120 to the interior of the carrier 15 and the wafer storage area 30, or other The manner promotes or permits interaction between the getter material 120 and the environment outside of the getter module 100. In the illustrated embodiment, the apertures 140 are surrounded by six circumferentially disposed apertures 145, but by reading this disclosure, other numbers and configurations of the apertures 140, 145 are common to those of ordinary skill in the art. Will be obvious. The central aperture 140 and the circumferentially disposed apertures 145 correspond to and are generally aligned with corresponding apertures 150, 155 in each filter cover 135.
根據一個實例,吸氣材料120視需要為一吸氣劑包之形式,即被按壓或以其他方式被形成為一整體可移除單元之一或多種吸氣材料之一自包含(self-contained)部分。藉由閱讀此揭露內容,吸氣劑包之其他形式對於通常知識者而言將顯而易見。吸氣材料120適以降低載具15內(具體而言晶圓儲存區域30中)之污染物之濃度。於一個實施例中,吸氣材料120清除可能對載具總成10內之物品或處理具有不利影響之氣體、水份、氣載分子污染物(AMC)、揮發性有機化合物(VOC)或其他不需要之污染物或物質。可根據本發明而進行控制之氣載分子污染物包含酸及鹼(例如,NH3及SO4)、生物毒素、可壓縮污染物或腐蝕性污染物、揮發性有機化合物、摻雜劑、及其他種類之此等污染物或物質。 According to one example, the getter material 120 is in the form of a getter pack, ie, is pressed or otherwise formed as one of a unitary removable unit or one of a plurality of getter materials self-contained (self-contained )section. By reading this disclosure, other forms of getter packages will be apparent to those of ordinary skill. The getter material 120 is adapted to reduce the concentration of contaminants within the carrier 15 (specifically, in the wafer storage area 30). In one embodiment, getter material 120 removes gases, moisture, airborne molecular contaminants (AMCs), volatile organic compounds (VOCs), or other gases that may adversely affect articles or processes within carrier assembly 10. Unwanted contaminants or substances. Airborne molecular contaminants that can be controlled in accordance with the present invention include acids and bases (eg, NH 3 and SO 4 ), biotoxins, compressible or corrosive contaminants, volatile organic compounds, dopants, and Other types of such pollutants or substances.
可選擇不同類型之吸氣劑包或吸氣材料120來清除或降低特 定類型之污染物或物質之濃度,如特定應用中可能所需要。載具總成10之一使用者可依據待控制之污染物之類型及/或依據載具總成10內出現之特定物品或處理而挑選並選擇不同之吸氣材料120或吸氣劑模組100。 Different types of getter packs or getter materials 120 can be selected to remove or reduce The concentration of a contaminant or substance of a given type, as may be required in a particular application. A user of the vehicle assembly 10 may select and select different getter materials 120 or getter modules depending on the type of contaminants to be controlled and/or depending on the particular item or process occurring within the carrier assembly 10. 100.
根據本發明實施例適合使用之吸氣材料之實例包含用於可得自英特格公司之CLARILITE晶圓中之吸氣材料,該吸氣材料配合於前開式統一標準盒及前開式運輸箱內之晶圓狹槽中以吸收污染物及水份。CLARILITE係為英特格公司之一注冊商標。適合使用之吸氣材料之實例亦揭露於2014年9月5日提出申請之共同授予之美國專利第8,776,841號、美國專利第8,783,463號、及專利合作條約申請案第PCT/US2014/054399號中,以上所述專利皆以引用方式全文併入本文中以用於所有目的。 Examples of getter materials suitable for use in accordance with embodiments of the present invention include getter materials for use in Integral CLARILITE wafers, which are mated to a front open unified standard box and front open transport case The wafer slot is used to absorb contaminants and moisture. CLARILITE is a registered trademark of Intertek. Examples of suitable getter materials are also disclosed in co-pending U.S. Patent No. 8,776,841, U.S. Patent No. 8,783,463, and the Patent Cooperation Treaty Application No. PCT/US2014/054399, filed on Sep. 5, 2014. The above patents are hereby incorporated by reference in their entirety for all purposes.
根據本發明實施例之吸氣材料可為粒狀乾燥劑、剛性板、吸收劑碟片、分子篩、及/或固持乾燥劑或分子篩材料之聚合物基體(polymer matrix)(此處僅列舉幾個實例)之形式。吸氣材料視需要亦包含一聚合物基質(polymer base)、一溝流劑(channeling agent)、及/或一乾燥劑。於某些實施例中,該聚合物係為一熱塑性聚合物。熱塑性聚合物包括:丙烯酸,例如聚(甲基丙烯酸甲酯)(poly(methyl methacrylate);PMMA);聚醯胺,例如耐綸;聚苯並咪唑(polybenzimidazole;PBI);聚乙烯,包括超高分子量聚乙烯(ultra-high molecular weight polyethylene,UHMWPE)、高密度聚乙烯(high-density polyethylene;HDPE)、及低密度聚乙烯;聚丙烯(polypropylene,PP);聚苯乙烯;聚氯乙烯(polyvinyl chloride;PVC);以及聚四氟乙烯(polytetrafluoroethylene;PTFE)。溝流劑係為不可溶於聚合物中但用於形成穿過聚合物之可與乾燥劑連通之通道之一化合物。此等溝流劑之實例包括但不限於乙烯-乙烯醇(ethylene-vinyl alcohol;EVOH)及聚乙烯醇(polyvinyl alcohol,PVOH)。乾燥劑之實例包括:無水鹽,形 成含有水之晶體;反應性化合物,與水進行化學反應以形成新的化合物;以及物理吸收體,其中具有複數個微細管且因此倚靠毛細作用吸收來自環境之水份。此等吸收體之實例包括分子篩、矽凝膠、黏土、及澱粉。於實施例中,活性炭可為吸收材料,尤其對於揮發性有機化合物而言。本發明之實施例可實質上減少相關聯運輸器或其他容器內之氧氣、濕氣、水份、揮發性有機化合物及其他污染物之量。 The getter material according to an embodiment of the present invention may be a granular desiccant, a rigid plate, an absorbent disc, a molecular sieve, and/or a polymer matrix holding a desiccant or molecular sieve material (only a few are listed here) The form of the example). The getter material also includes a polymer base, a channeling agent, and/or a desiccant as needed. In certain embodiments, the polymer is a thermoplastic polymer. Thermoplastic polymers include: acrylic acid, such as poly(methyl methacrylate; PMMA); polyamines such as nylon; polybenzimidazole (PBI); polyethylene, including ultra high Ultra-high molecular weight polyethylene (UHMWPE), high-density polyethylene (HDPE), and low-density polyethylene; polypropylene (PP); polystyrene; polyvinyl chloride (polyvinyl chloride) Chloride; PVC); and polytetrafluoroethylene (PTFE). The channeling agent is a compound that is insoluble in the polymer but is used to form a passage through the polymer that is in communication with the desiccant. Examples of such channeling agents include, but are not limited to, ethylene-vinyl alcohol (EVOH) and polyvinyl alcohol (PVOH). Examples of the desiccant include: an anhydrous salt, a shape Forming a crystal containing water; a reactive compound, chemically reacting with water to form a new compound; and a physical absorber having a plurality of microtubes and thus absorbing moisture from the environment by capillary action. Examples of such absorbers include molecular sieves, enamel gels, clays, and starches. In embodiments, the activated carbon can be an absorbent material, especially for volatile organic compounds. Embodiments of the present invention can substantially reduce the amount of oxygen, moisture, moisture, volatile organic compounds, and other contaminants in associated transporters or other containers.
吸氣劑模組100包含適以將吸氣劑模組100輕易地、可移除地固定至門35之內側40之一或多個連接特徵160、162。連接特徵160包含突出部165,突出部165實質上平行於基座110之平面且實質上垂直於連接特徵162延伸。中央鰭片170及末端鰭片175將突出部165連接至基座110之一其餘部分並提供突出部165之相對於基座110之增強之剛性及結構強度。鰭片170、175亦提供連接特徵160及模組100相對於門35之恰當對齊。第4圖所示連接特徵162係為具有二個腿182、184之一被偏置之實質V形構件180。腿184相對於腿182折曲,以將吸氣劑模組100偏置至門35之內側40上之定位。構件180因此用作一彈簧或偏置構件,並用於幫助將吸氣劑模組100卡扣配合至門35中之地點中。突出部165設置於吸氣劑模組100之與構件180相對之一側,並在實質上垂直於構件180之一方向上延伸。 The getter module 100 includes one or more attachment features 160, 162 adapted to securely and removably secure the getter module 100 to the inner side 40 of the door 35. The attachment feature 160 includes a protrusion 165 that extends substantially parallel to the plane of the base 110 and that extends substantially perpendicular to the attachment feature 162. Central fin 170 and end fin 175 connect protrusion 165 to the remainder of one of pedestals 110 and provide enhanced rigidity and structural strength of protrusion 165 relative to pedestal 110. The fins 170, 175 also provide the proper alignment of the attachment features 160 and the module 100 relative to the door 35. The attachment feature 162 shown in FIG. 4 is a substantially V-shaped member 180 having one of the two legs 182, 184 biased. The leg 184 is flexed relative to the leg 182 to bias the getter module 100 to the position on the inner side 40 of the door 35. The member 180 thus acts as a spring or biasing member and serves to assist in snap fitting the getter module 100 into place in the door 35. The protrusion 165 is disposed on one side of the getter module 100 opposite to the member 180 and extends in a direction substantially perpendicular to one of the members 180.
第5圖至第6圖顯示吸氣劑模組100至門35之內側40之連接。門35包含內部面板或表面185以及外部面板或表面186,於內部面板或表面185與外部面板或表面186之間界定門35之一內部體積。門35包含用於模組100之複數個容置器190或附裝點。每一容置器190包含凹槽192,凹槽192延伸至體積189中並具有足夠之大小及深度以至少部分地容納吸氣劑模組100。側壁194設置於凹槽192之一側。呈二個側向延伸之止擋件形式之止擋件構件196鄰近或靠近側壁194設置。側壁194及止擋件構件196用於容置及 固持被偏置構件180。構件180之腿184接觸側壁194,且腿184之一上端鄰接或幾乎鄰接止擋件構件196之一下側。 Figures 5 through 6 show the connection of the getter module 100 to the inner side 40 of the door 35. The door 35 includes an interior panel or surface 185 and an exterior panel or surface 186 defining an interior volume of the door 35 between the interior panel or surface 185 and the exterior panel or surface 186. Door 35 includes a plurality of receptacles 190 or attachment points for module 100. Each of the receptacles 190 includes a recess 192 that extends into the volume 189 and is of sufficient size and depth to at least partially receive the getter module 100. The side wall 194 is disposed on one side of the recess 192. A stop member 196 in the form of two laterally extending stops is disposed adjacent or adjacent to the side wall 194. Side wall 194 and stop member 196 are for receiving and The biased member 180 is held. The leg 184 of the member 180 contacts the sidewall 194 and one of the upper ends of the leg 184 abuts or nearly abuts the underside of one of the stop members 196.
於吸氣劑模組100之相對側上,門35之內側40上之凸緣198界定位於凸緣198之下之一凹坑,所述凹坑用於容置連接特徵160之突出部165。為將吸氣劑模組100插入或附裝至門35中,首先將突出部165放置於位於凸緣198之下之凹坑中。然後將模組100進一步旋轉或按壓至凹槽192中,使得被偏置構件180接觸側壁194。被偏置構件180將吸氣劑模組100推動至如於第6圖中所觀察之右側,以將突出部165鎖定或卡扣配合至位於凸緣198之下之凹坑中並朝凸緣198推動鰭片170、175或將鰭片170、175推動成對齊接觸凸緣198。止擋件構件196實質上防止構件180沿側壁194向上滑動及滑出適當位置。吸氣劑模組100因此至少部分地設置於凹槽192內並延伸至內部面板或表面185與外部面板或表面186間之門35之內部體積。根據替代實施例,吸氣劑模組100於凹槽192內完全延伸,使得吸氣劑模組100之一頂面與門35之內部面板186實質上齊平或實質上共面。為進行移除,根據一個實施例,將模組100推動至如於第6圖中所觀察之左側,自位於凸緣198之下之凹坑移除突出部165,且然後自凹槽192及門35完全移除模組100。 On the opposite side of the getter module 100, the flange 198 on the inner side 40 of the door 35 defines a recess below the flange 198 for receiving the projection 165 of the attachment feature 160. To insert or attach the getter module 100 into the door 35, the tab 165 is first placed in a recess below the flange 198. The module 100 is then further rotated or pressed into the recess 192 such that the biased member 180 contacts the sidewall 194. The getter module 100 is pushed by the biasing member 180 to the right as viewed in FIG. 6 to lock or snap fit the tab 165 into the recess below the flange 198 and toward the flange 198 pushes the fins 170, 175 or pushes the fins 170, 175 into alignment contact flanges 198. The stop member 196 substantially prevents the member 180 from sliding up and out of position along the sidewall 194. The getter module 100 is thus at least partially disposed within the recess 192 and extends to the interior volume of the door 35 between the inner panel or surface 185 and the outer panel or surface 186. According to an alternative embodiment, the getter module 100 extends completely within the recess 192 such that one of the top surfaces of the getter module 100 is substantially flush or substantially coplanar with the inner panel 186 of the door 35. For removal, according to one embodiment, the module 100 is pushed to the left as viewed in FIG. 6, the protrusion 165 is removed from the recess below the flange 198, and then from the recess 192 and The door 35 completely removes the module 100.
於第5圖中,一第一吸氣劑模組100已被附裝至門35之內側40。根據本發明之一個實施例,所附裝模組100內之吸氣材料120係為由一使用者所選擇之用以自載具15內清除一或多種特定類型之污染物之一種類型的吸氣材料。一第二吸氣劑模組100’如圖所示即將插入至門35之內側40。根據一個實施例,第二吸氣劑模組100內之吸氣材料係為用以自載具15內清除與由所附裝模組100控制的污染物不同之一或多種不同類型的污染物之一種類型的吸氣材料。作為另一選擇,此種吸氣材料可相同於所附裝吸氣劑模組100之吸氣材料120。藉由為門15內之所需容置器190挑選及選擇不同 之吸氣劑模組,一使用者可根據欲載置於載具15內之特定物品、欲執行之處理、或以其他方式與可能存在於載具15內且可需要進行移除之污染物之類型及濃度一致地定製載具15內之吸氣劑之分佈、數量、及佈置。 In FIG. 5, a first getter module 100 has been attached to the inner side 40 of the door 35. According to one embodiment of the present invention, the getter material 120 in the attached module 100 is a type of suction selected by a user to remove one or more specific types of contaminants from the carrier 15. Gas material. A second getter module 100' is inserted into the inner side 40 of the door 35 as shown. According to one embodiment, the getter material in the second getter module 100 is used to remove one or more different types of contaminants from the carrier 15 than the contaminants controlled by the attached module 100. One type of getter material. Alternatively, such getter material may be the same as getter material 120 attached to getter module 100. By selecting and selecting different ones for the desired container 190 in the door 15 a getter module, a user may be placed according to a particular item to be placed in the carrier 15, the process to be performed, or otherwise with a contaminant that may be present in the carrier 15 and may need to be removed The type, concentration, and consistency of the getter distribution, quantity, and arrangement within the carrier 15 are consistently tailored.
第5圖亦例示用於引導或支撐固持於載具15內之晶圓之晶圓保持器200。根據一個實施例,保持器200包含複數個堆疊之晶圓平台205以幫助於載具15內引導或支撐堆疊之晶圓20。結構200包含卡扣式連接器210以連接至門35之內側40上之容置器,在形狀、大小、及/或功能方面類似於用於容置吸氣劑模組100之容置器190之容置器。因此,根據一個實例,若需要將保持器200替換為一較大保持器以容納較大之晶圓20,則該較大之保持器可以與吸氣劑模組100被配備有用於容置於容置器190中之連接結構相同的方式配備有適以配合於容置器190內之連接器。因此,每一容置器190適以容置一配件(例如保持器200或用於晶圓20之其他引導或支撐結構),且每一容置器190亦適以容置吸氣劑模組100之連接特徵160及/或162,以將吸氣劑模組100輕易地、可移除地固定至門35之內側40。根據本發明之實施例,每一容置器190無論位於門35上之何處或載具15內之其他位置,皆具有多種用途。 FIG. 5 also illustrates a wafer holder 200 for guiding or supporting a wafer held in the carrier 15. According to one embodiment, the holder 200 includes a plurality of stacked wafer platforms 205 to assist in guiding or supporting the stacked wafers 20 within the carrier 15. The structure 200 includes a snap-on connector 210 for attachment to a receptacle on the inner side 40 of the door 35, similar in shape, size, and/or function to the receptacle 190 for receiving the getter module 100 The receiver. Thus, according to one example, if the holder 200 needs to be replaced with a larger holder to accommodate the larger wafer 20, the larger holder can be equipped with the getter module 100 for housing. The connection structure in the receiver 190 is provided with a connector suitable for fitting in the receiver 190 in the same manner. Therefore, each of the accommodators 190 is adapted to receive an accessory (such as the holder 200 or other guiding or supporting structure for the wafer 20), and each of the accommodators 190 is also adapted to receive the getter module. The connection features 160 and/or 162 of 100 are used to easily and removably secure the getter module 100 to the inner side 40 of the door 35. In accordance with an embodiment of the present invention, each of the receptacles 190 has a variety of uses regardless of where on the door 35 or other locations within the carrier 15.
吸氣劑模組100係為單一吸氣劑式模組,該等單一吸氣劑式模組包含用於清除或以其他方式降低載具15內之一種類型之污染物或一組污染物之濃度之一單一吸氣劑包120。本發明之實施例亦設想多吸氣劑式模組,以用於容納多個吸氣劑包,用於處置載具15內之多種類型之污染物或較高濃度之污染物,現在將參照第7圖至第8圖來對此進行具體闡述。 The getter module 100 is a single getter module that includes a type of contaminant or a group of contaminants that are used to remove or otherwise reduce one type of carrier 15 One of the concentrations is a single getter pack 120. Embodiments of the present invention also contemplate a multi-suction module for accommodating a plurality of getter packages for handling various types of contaminants or higher concentrations of contaminants within the carrier 15, as will now be referred to This is illustrated in detail in Figures 7 through 8.
第7圖至第8圖例示亦被稱為一吸氣劑總成之吸氣劑模組300。吸氣劑模組300包含殼體305,殼體305具有呈一基座框架形式之基座310及多個封蓋315、317、319。吸氣材料320、322、324設置於殼體305內, 且具體而言於基座310上支撐於基座310之凹槽312、313、314內。吸氣材料320、322、324係呈複數個吸氣劑包之形式,該等吸氣劑包分別類似於參照第2圖至第4圖所述之吸氣劑包。 Figures 7 through 8 illustrate a getter module 300, also referred to as a getter assembly. The getter module 300 includes a housing 305 having a base 310 in the form of a base frame and a plurality of covers 315, 317, 319. The getter materials 320, 322, 324 are disposed in the housing 305. Specifically, it is supported on the pedestal 310 in the grooves 312, 313, 314 of the susceptor 310. The getter materials 320, 322, and 324 are in the form of a plurality of getter packs similar to the getter packs described with reference to Figures 2 through 4, respectively.
封蓋315、317、319設置於基座310上方並分別設置於基座310之凹槽312、313、314及對應吸氣材料320、322、324上方。根據一個實施例,封蓋315、317、319藉由黏著劑、超音波焊接或其他焊接、或其他模式沿密封件或結合面325、327、329被密封或以其他方式連接至基座310,其中吸氣劑模組300可於使用之後全部處理掉。作為另一選擇,封蓋315、317、319例如以一卡扣配合連接而可移除地附裝至基座310,使得殼體305內之吸氣材料320、322、324或其他組件於多次使用之間可替換或可再補充。一或多個可選過濾器330設置於封蓋315、317、319與相應吸氣材料320、322、324之間,以視需要由一或多個對應過濾器封蓋335定位及支撐。根據本發明之實施例,過濾器封蓋335永久性地或可移除地固定至封蓋315,以例如相對於封蓋315及吸氣材料320、322、324將過濾器330固持於適當地點。吸氣劑模組300亦界定穿過封蓋315、317、319之一或多個孔隙340,孔隙340用以將吸氣材料在化學上暴露於載具15及晶圓儲存區域30之內部,或以其他方式促進或容許吸氣材料與吸氣劑模組300外面之環境間之相互作用。該一或多個孔隙340及過濾器封蓋335中之對應孔隙之其他態樣相同於關於第2圖至第4圖中之孔隙140、145、150、155所述之該等態樣,且此處將不再重複贅述。此外,除非另外指出,否則與吸氣劑模組300相關之所有其他細節(例如,將其插入至凹槽192及門35之內部體積中以及自凹槽192及門35之內部體積移除)相同於關於吸氣劑模組100所述之該等細節。 The covers 315, 317, 319 are disposed above the base 310 and are respectively disposed above the grooves 312, 313, 314 of the base 310 and the corresponding getter materials 320, 322, 324. According to one embodiment, the closures 315, 317, 319 are sealed or otherwise attached to the base 310 along the seal or joint faces 325, 327, 329 by adhesive, ultrasonic welding or other welding, or other means, The getter module 300 can be disposed of completely after use. Alternatively, the closures 315, 317, 319 are removably attached to the base 310, for example, in a snap-fit connection such that the getter material 320, 322, 324 or other components within the housing 305 are Sub-use can be replaced or replenished. One or more optional filters 330 are disposed between the closures 315, 317, 319 and the respective getter materials 320, 322, 324 to be positioned and supported by one or more corresponding filter covers 335 as desired. In accordance with an embodiment of the present invention, the filter cover 335 is permanently or removably secured to the cover 315 to hold the filter 330 in place, for example, relative to the cover 315 and the getter material 320, 322, 324. . The getter module 300 also defines one or more apertures 340 through the covers 315, 317, 319 for chemically exposing the getter material to the interior of the carrier 15 and the wafer storage area 30, Or otherwise promote or allow interaction between the getter material and the environment outside of the getter module 300. Other aspects of the one or more apertures 340 and corresponding apertures in the filter cover 335 are the same as described for the apertures 140, 145, 150, 155 of Figures 2 through 4, and The details will not be repeated here. Moreover, unless otherwise indicated, all other details associated with the getter module 300 (eg, being inserted into the interior volume of the recess 192 and the door 35 and removed from the interior volume of the recess 192 and the door 35) This is the same as described with respect to the getter module 100.
儘管模組300之所示實施例包含三個吸氣劑包及三個封蓋,但模組300之替代實施例包含二個吸氣劑包及二個封蓋、四個吸氣劑包及四 個封蓋、或任何其他所需數目。 Although the illustrated embodiment of the module 300 includes three getter packs and three closures, an alternative embodiment of the module 300 includes two getter packs and two flaps, four getter packs and four a cover, or any other required number.
吸氣劑模組300包含適以將吸氣劑模組300輕易地、可移除地固定至門35之內側40之一或多個連接特徵360、362。連接特徵360、362視需要在結構及操作方面相同於參照第2圖至第4圖所述之連接特徵160、162,且此處將不再重複贅述。門35之每一容置器190適以如上所述輕易地、可移除地容置一單一吸氣劑式模組100,且複數個容置器190適以輕易地、可移除地容置該等連接特徵360以將多吸氣劑式模組300固定至門35。 The getter module 300 includes one or more attachment features 360, 362 adapted to securely and removably secure the getter module 300 to the inner side 40 of the door 35. The connection features 360, 362 are identical in construction and operation to the connection features 160, 162 described with reference to Figures 2 through 4, and will not be repeated here. Each of the receptacles 190 of the door 35 is adapted to easily and removably receive a single getter module 100 as described above, and the plurality of receptacles 190 are adapted to be easily and removably The connection features 360 are placed to secure the multi-suction module 300 to the door 35.
孔隙375鄰近基座框架或基座310中之凹槽312、313、314之相對側設置或設置於凹槽312、313、314之相對側上。中間凹槽313包含二個此等孔隙375,一個位於中間凹槽313之二個縱向側之任一縱向側上,且末端凹槽312、314包含一個此種孔隙375於其內部末端上。凹槽375例如容納用於協助將基座310插入門35中或自門35移除基座310之一工具。 The apertures 375 are disposed adjacent or disposed on opposite sides of the recesses 312, 313, 314 in the base frame or base 310. The intermediate recess 313 includes two such apertures 375, one on either longitudinal side of the two longitudinal sides of the intermediate recess 313, and the end recesses 312, 314 include one such aperture 375 on its inner end. The recess 375, for example, houses a tool for assisting in inserting the base 310 into the door 35 or removing the base 310 from the door 35.
第9圖至第10圖顯示吸氣劑模組300相對於門35之內側40之連接。如先前本文參照第5圖至第6圖所述,門35包含用於模組100之複數個容置器190或附裝點。此等容置器190(包含凹槽192、側壁194、止擋件構件196、及其其他特徵)以與其容納單一吸氣劑式模組100之連接特徵160、162相同的方式容納多吸氣劑式模組300之連接特徵360、362。第9圖顯示附裝至門35之內側40之一多吸氣劑式模組300及一單一吸氣劑式模組100二者,此可由一使用者選擇。該等模組包含一第一模組170、一第二模組172、一第三模組174、及一第四模組176。 9 through 10 show the connection of the getter module 300 with respect to the inner side 40 of the door 35. As previously described herein with reference to Figures 5 through 6, the door 35 includes a plurality of receptacles 190 or attachment points for the module 100. These receptacles 190 (including recesses 192, sidewalls 194, stop members 196, and other features) accommodate multiple suctions in the same manner as their attachment features 160, 162 that house a single getter module 100. Connection features 360, 362 of the dosage module 300. Figure 9 shows both the multi-aspirator module 300 attached to the inner side 40 of the door 35 and a single getter module 100, which can be selected by a user. The modules include a first module 170, a second module 172, a third module 174, and a fourth module 176.
如應理解,單一吸氣劑式模組100及/或多吸氣劑式模組300可以任何所需方式及組合附裝至門35之內側40,以便以一所定製方式降低載具15內污染物之濃度。每一多吸氣劑式模組300包含一特定應用所需要之吸氣劑包,例如二或三個不同之吸氣劑包、二個相同類型之吸氣劑包及一 個不同類型之吸氣劑包、或吸氣劑包之任何其他所需組合。多吸氣劑式模組300可視需要與單一吸氣劑式模組100一起用於同一門上。吸氣劑模組100、300可針對特定應用而定製或購買,抑或亦可提供及使用同時具有不同類型之吸氣劑模組100及/或300之套件。 As should be appreciated, the single getter module 100 and/or the multi-aspirator module 300 can be attached to the inner side 40 of the door 35 in any desired manner and combination to reduce the carrier 15 in a customized manner. Concentration of contaminants. Each getter module 300 includes a getter package for a particular application, such as two or three different getter packages, two getter packages of the same type, and one A different type of getter package, or any other desired combination of getter packages. The multi-aspirator module 300 can be used on the same door as the single getter module 100 as needed. The getter modules 100, 300 can be customized or purchased for a particular application, or can be provided and used with a kit of different types of getter modules 100 and/or 300.
第11圖顯示根據本發明一實施例之方法步驟。一種降低一容器微環境內之氣體、水份、及/或其他氣載分子污染物之濃度之方法包含:在410處,將一或多個吸氣劑總成100或300附加至容器15之門35。每一吸氣劑總成視需要適以自容器微環境清除一不同類型之污染物,及/或一個吸氣劑總成視需要適以清除多種不同污染物。該方法另外包含:在415處,將容器15之門35閉合以將吸氣劑總成暴露至容器微環境。在420處,最終將門35打開,且在425處,替換該等吸氣劑總成其中之一或多者。 Figure 11 shows the method steps in accordance with an embodiment of the present invention. A method of reducing the concentration of gas, moisture, and/or other airborne molecular contaminants in a container microenvironment includes: at 410, attaching one or more getter assemblies 100 or 300 to the container 15 Door 35. Each getter assembly is adapted to remove a different type of contaminant from the container microenvironment, and/or a getter assembly as needed to remove a plurality of different contaminants. The method additionally includes, at 415, closing the door 35 of the container 15 to expose the getter assembly to the container microenvironment. At 420, door 35 is finally opened, and at 425, one or more of the getter assemblies are replaced.
本發明之實施例尤其可用於非吹洗、被動式環境中。根據此等實施例,吸氣劑模組100、300不包含至吹洗埠或其他吹洗組件之連接且因此處於一吹洗流之外。然而,與此等被動式吸氣劑模組100、300一起使用之容器本身可包含其中使用吹洗氣體及系統來積極地降低污染物濃度之微環境。在其他實施例中,可將吹洗氣體或其他氣體直接按照規劃路線穿過模組100、300,使得該等模組直接處於吹洗流中。 Embodiments of the invention are particularly useful in non-purge, passive environments. According to these embodiments, the getter modules 100, 300 do not contain connections to the purge or other purge components and are therefore outside of a purge stream. However, the containers used with such passive getter modules 100, 300 may themselves include a microenvironment in which purge gas and systems are used to actively reduce the concentration of contaminants. In other embodiments, purge gas or other gases may be routed directly through the modules 100, 300 in a planned manner such that the modules are directly in the purge stream.
應注意,本發明之實施例並非僅限於與半導體材料、晶圓或其他基板或者載具一起使用。本發明之實施例可用於保護應以一清潔、無污染或以其他方式受保護之狀態輸送之任何物品,且此等實施例除半導體工業外亦可應用於各種工業及其他環境中。本文所用之用語基板包含被處理成積體電路、太陽面板、平板、或其他半導體裝置之晶圓;基板亦包含用於微影術中之光罩及用於記憶體磁碟(例如硬碟機)中之磁碟;以及欲 保護之任何其他物品。本發明之實施例可應用於各種工業及各種污染敏感型物品,而非僅應用於半導體工業及半導體晶圓。舉例而言,本發明之實施例亦應用於生命科學及生物/製藥工業。此外,除非另外指出,否則用語容器、載具、運輸器、卡匣、輸送/儲存倉等在本文中亦可互換使用。此外,用語吸氣劑模組與吸氣劑總成在本文中可互換使用。處於本申請案之範圍內之所示及所述實施例之各種潤飾及變化對熟習此項技術者而言將顯而易見。在不背離本發明之精神及範圍之條件下可作出形式及內容上之變化。 It should be noted that embodiments of the invention are not limited to use with semiconductor materials, wafers or other substrates or carriers. Embodiments of the present invention can be used to protect any item that should be transported in a clean, non-contaminated or otherwise protected state, and such embodiments can be used in a variety of industrial and other environments in addition to the semiconductor industry. The term substrate used herein includes a wafer that is processed into an integrated circuit, a solar panel, a flat panel, or other semiconductor device; the substrate also includes a photomask for use in lithography and a memory disk (eg, a hard disk drive). Medium disk; and desire Any other items protected. Embodiments of the present invention are applicable to a variety of industrial and various pollution sensitive articles, and not only to the semiconductor industry and semiconductor wafers. For example, embodiments of the invention are also applicable to the life sciences and bio/pharmaceutical industries. Moreover, unless otherwise indicated, the terms container, carrier, transporter, cassette, transport/storage bin, etc. are also used interchangeably herein. In addition, the term getter module and getter assembly are used interchangeably herein. Various modifications and variations of the illustrated and described embodiments within the scope of the present application will be apparent to those skilled in the art. Variations in form and content may be made without departing from the spirit and scope of the invention.
35‧‧‧門 35‧‧‧
37‧‧‧內壁 37‧‧‧ inner wall
40‧‧‧內側 40‧‧‧ inside
42‧‧‧表面 42‧‧‧ surface
100‧‧‧吸氣劑模組/模組/第一吸氣劑模組/單一吸氣劑式模組/吸氣劑總 成/所附裝模組 100‧‧‧Absorber module/module/first getter module/single getter module/ getter total Formed/attached module
100’‧‧‧第二吸氣劑模組 100'‧‧‧second getter module
185‧‧‧內部面板或表面 185‧‧‧Interior panels or surfaces
186‧‧‧外部面板或表面 186‧‧‧External panels or surfaces
190‧‧‧容置器 190‧‧‧ Container
192‧‧‧凹槽 192‧‧‧ Groove
194‧‧‧側壁 194‧‧‧ side wall
200‧‧‧晶圓保持器/結構/保持器 200‧‧‧ Wafer Holder / Structure / Holder
205‧‧‧晶圓平台 205‧‧‧ Wafer Platform
210‧‧‧卡扣式連接器 210‧‧‧Snap connector
Claims (35)
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US201562131478P | 2015-03-11 | 2015-03-11 | |
US62/131,478 | 2015-03-11 |
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TWI781476B (en) * | 2019-11-08 | 2022-10-21 | 美商恩特葛瑞斯股份有限公司 | Environmental control material holder |
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WO2024182383A1 (en) | 2023-02-28 | 2024-09-06 | Avient Corporation | Wafer carrier with moisture scavenging |
WO2024182429A1 (en) * | 2023-02-28 | 2024-09-06 | Avient Corporation | Wafer carrier with scavenging device |
WO2024182377A1 (en) | 2023-02-28 | 2024-09-06 | Avient Corporation | Wafer carrier with active oxygen scavenging |
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CN1223820C (en) * | 2002-08-19 | 2005-10-19 | 乐金电子(天津)电器有限公司 | Pickled vegetable refrigerator storage container |
JP4473670B2 (en) * | 2004-07-30 | 2010-06-02 | 近藤工業株式会社 | Breath filter for semiconductor wafer storage container |
JP5674314B2 (en) * | 2007-02-28 | 2015-02-25 | インテグリス・インコーポレーテッド | Reticle SMIF pod or substrate container and purge method thereof |
EP2272088B1 (en) * | 2008-03-13 | 2016-12-07 | Entegris, Inc. | Wafer container with tubular environmental control components |
WO2012088172A2 (en) * | 2010-12-20 | 2012-06-28 | Entegris, Inc. | Front opening large substrate container |
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TWI781476B (en) * | 2019-11-08 | 2022-10-21 | 美商恩特葛瑞斯股份有限公司 | Environmental control material holder |
US11581209B2 (en) | 2019-11-08 | 2023-02-14 | Entegris, Inc. | Environmental control material holder |
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WO2016145338A1 (en) | 2016-09-15 |
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