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TW201617621A - Method and apparatus for detecting probe card - Google Patents

Method and apparatus for detecting probe card Download PDF

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Publication number
TW201617621A
TW201617621A TW103139127A TW103139127A TW201617621A TW 201617621 A TW201617621 A TW 201617621A TW 103139127 A TW103139127 A TW 103139127A TW 103139127 A TW103139127 A TW 103139127A TW 201617621 A TW201617621 A TW 201617621A
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TW
Taiwan
Prior art keywords
probe card
unit
pin
correction
working
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TW103139127A
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Chinese (zh)
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TWI525327B (en
Inventor
Jin-Yuan Wang
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Arcs Prec Technology Co Ltd
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Priority to TW103139127A priority Critical patent/TWI525327B/en
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Publication of TW201617621A publication Critical patent/TW201617621A/en

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Abstract

Disclosed is a probe card detection method, which includes: using a measurement device to identify position of each pin of the probe card; comparing each position of above-described pins with a standard position to determine the deviation between these two parties; if the above-described two parties have the deviation, then the pins that have deviation appeared are marked as erraneous pins; sending the probe card to a correction device for being corrected; wherein, the correction device having a working position whereby the erraneous pins of the probe card are directly delivered to; after one erraneous pin of the probe card being corrected, the next erraneous pin is directly sending to the working position of the correction device. In addition, the present invention also provides a probe card detection apparatus.

Description

探針卡檢測方法及裝置Probe card detection method and device


  本發明與探針卡之檢測有關,尤指一種快速檢測及校正探針卡之裝置及方法。

The invention relates to the detection of a probe card, in particular to a device and a method for quickly detecting and correcting a probe card.


  按,習用之探針卡檢測裝置具有一檢測平台,並設有治具以將待檢測之探針卡固定於平台上。而平台上設有一觀測器,用以觀測探針卡之腳位的位置是否符合標準。若發現某些腳位的位置偏離於標準位置,則須進一步將探針卡移至一校正裝置處,透過該校正裝置對此不良品進行校正,俾使偏離之腳位回復至標準位置上。
  然而,上述對於探針卡之檢測及校正過程必須由不同裝置分別進行,故須在不同裝置間拆裝探針卡,而有過於耗費時間的缺點產生。再者,在檢測階段時,必須記錄有問題之腳位的位置資訊,若有記錄疏漏或錯誤的情形發生,則影響檢測的正確性,進而影響探針卡的產品品質。
  有鑑於此,故如何改進上述問題,即為本發明所欲解決之首要課題。

According to the conventional probe card detecting device, there is a detecting platform, and a jig is provided to fix the probe card to be detected on the platform. An observer is provided on the platform to observe whether the position of the probe card is in compliance with the standard. If it is found that the position of some of the feet is deviated from the standard position, the probe card is further moved to a calibration device, and the defective device is corrected by the correcting device to return the offset position to the standard position.
However, the above-mentioned detection and correction process for the probe card must be performed separately by different devices, so that the probe card must be disassembled between different devices, and the disadvantage of being too time consuming is generated. Furthermore, in the detection phase, the position information of the problematic foot must be recorded. If there is a leak or an error in the recording, the correctness of the detection is affected, which in turn affects the product quality of the probe card.
In view of this, how to improve the above problems is the primary problem to be solved by the present invention.


  本發明之目的在於提供一種探針卡檢測方法及裝置,其利用量測裝置對探針卡進行檢測,進而標記出位置偏離之腳位,再將所標記之腳位直接輸送至校正裝置進行校正,藉以縮短檢測及校正的時間,提升工作效率。
  為達前述目的,本發明提供一種探針卡檢測方法,其包括有:
  以一量測裝置辨識探針卡之各腳位的位置;
  比對上述各腳位的位置與一標準位置,判斷二者之偏差情形;其中該標準位置由一於量測裝置中預先建置之教導檔提供;
  若前述二者具有偏差,則將出現偏差之腳位標記為一錯誤腳位;
  將探針卡輸送至一校正裝置以進行校正;其中校正裝置具有一工作位置,而探針卡之錯誤腳位被直接輸送至校正裝置之工作位置;
  探針卡之一個錯誤腳位校正完成後,下一個錯誤腳位被直接輸送至校正裝置之工作位置。
  其中更進一步地界定,若探針卡之腳位的位置與該標準位置出現偏差,且偏差超出公差值,則將此腳位標記為一錯誤腳位。
  上述方法更包括有:探針卡之錯誤腳位校正完成後,將探針卡送回量測裝置重行檢測,且僅對先前被標記之錯誤腳位進行檢測。
  而本發明更提供一種應用上述探針卡檢測方法之探針卡檢測裝置,其包括有:
  一工作平台;
  一量測部,其設於該工作平台上;該量測部包括有一影像擷取單元及一影像比對單元,其中該影像擷取單元用以擷取探針卡之影像,而該影像比對單元用以辨識探針卡之腳位的位置;該量測部更包括有一標示單元,用以標記探針卡之腳位的位置;
  一校正部,其設於該工作平台上;該校正部設有一工作位置,用以校正探針卡之腳位;
  一輸送部,其設於該工作平台上;該輸送部設有一載台,用以承載探針卡,且該輸送部可帶動該載台沿該工作平台進行二維方向之位移,藉此將探針卡被該標示單元標記之位置直接輸送至該校正部之工作位置。
  其中,該工作平台設有光學尺,用以產生該標示單元所標記之位置的座標,並利用此座標令該輸送部將探針卡被該標記之位置直接輸送至該校正部之工作位置。
  而本發明之上述目的與優點,不難從下述所選用實施例之詳細說明與附圖中獲得深入了解。

The object of the present invention is to provide a probe card detecting method and device, which uses a measuring device to detect a probe card, thereby marking a position deviation foot, and then directly feeding the marked foot to a calibration device for correction. In order to shorten the time of detection and correction, and improve work efficiency.
To achieve the foregoing objective, the present invention provides a probe card detecting method, which includes:
Identifying the position of each pin of the probe card by a measuring device;
Comparing the position of each of the above-mentioned feet with a standard position, judging the deviation between the two; wherein the standard position is provided by a pre-established teaching file in the measuring device;
If the foregoing two have deviations, the deviation of the foot is marked as an incorrect foot;
Delivering the probe card to a calibration device for correction; wherein the calibration device has a working position, and the wrong foot of the probe card is directly delivered to the working position of the calibration device;
After an error pin correction of the probe card is completed, the next error pin is directly delivered to the working position of the calibration device.
Further defined therein, if the position of the pin of the probe card deviates from the standard position and the deviation exceeds the tolerance value, the pin is marked as an incorrect pin.
The above method further includes: after the error pin correction of the probe card is completed, the probe card is sent back to the measuring device for re-detection, and only the previously marked wrong pin is detected.
The present invention further provides a probe card detecting device using the above probe card detecting method, which comprises:
a work platform;
a measuring unit is disposed on the working platform; the measuring unit includes an image capturing unit and an image comparing unit, wherein the image capturing unit is configured to capture an image of the probe card, and the image ratio is The unit is configured to identify the position of the pin of the probe card; the measuring portion further includes a marking unit for marking the position of the pin of the probe card;
a calibration unit disposed on the working platform; the correction portion is provided with a working position for correcting the position of the probe card;
a conveying portion is disposed on the working platform; the conveying portion is provided with a loading platform for carrying the probe card, and the conveying portion can drive the loading table to be displaced in the two-dimensional direction along the working platform, thereby The probe card is directly transported to the working position of the correction unit by the position marked by the marking unit.
Wherein, the working platform is provided with an optical scale for generating a coordinate of the position marked by the marking unit, and the coordinate is used to cause the conveying portion to directly convey the position of the probe card by the marking to the working position of the correcting portion.
The above objects and advantages of the present invention will be readily understood from the following detailed description of the embodiments of the invention.

1‧‧‧工作平台
11‧‧‧光學尺
2‧‧‧量測部
21‧‧‧影像擷取單元
22‧‧‧影像比對單元
23‧‧‧標示單元
24‧‧‧支撐柱
3‧‧‧輸送部
31‧‧‧載台
4‧‧‧校正部
41‧‧‧支撐柱
5‧‧‧針卡
1‧‧‧Working Platform 11‧‧‧Optical Ruler 2‧‧‧Measurement Unit 21‧‧‧Image Capture Unit 22‧‧‧Image Matching Unit 23‧‧‧Marking Unit 24‧‧‧Support Column 3‧‧ ‧Transportation Department 31‧‧‧Moving Station 4‧‧‧Alignment Department 41‧‧‧Support column 5‧‧‧ needle card


第1圖為本發明之方法的流程圖;
第2圖為本發明之裝置的立體示意圖;
第3圖為本發明之裝置的架構方塊示意圖;
第4圖為具有錯誤腳位之探針卡的示意圖。

Figure 1 is a flow chart of the method of the present invention;
Figure 2 is a perspective view of the apparatus of the present invention;
Figure 3 is a block diagram showing the architecture of the device of the present invention;
Figure 4 is a schematic illustration of a probe card with an incorrect foot.


  本發明提供一種探針卡檢測方法,本方法是以一探針卡檢測裝置實施,該裝置如第2、3圖所示,其包括有一工作平台1,且於工作平台1上設有一量測部2、一輸送部3及一校正部4。該量測部2包括有一影像擷取單元21及一影像比對單元22,其中該影像擷取單元21設於一支撐柱24上,並正對該工作平台1,用以擷取探針卡5之影像,而該影像比對單元22設於該量測部2中,其儲存有關於探針卡腳位之標準位置的教導檔,其包括有各腳位之位置及高度資訊,而該影像比對單元22乃將該影像擷取單元21所擷取之影像比對於該教導檔,進而辨識探針卡5之腳位的位置是否出現偏差。其中關於各腳位之位置可透過觀察影像中之各腳位是否偏離於教導檔中的位置而得,而關於各腳位之高度則可透過觀察影像中之各腳位是否位於影像對焦之焦點判定之。例如第4圖所示,於此探針卡5之A區塊中有一偏離於標準位置之腳位(以下稱為錯誤腳位51),此腳位51可透過該影像比對單元22經比較於教導檔而辨識出來,俾利於後續的校正作業。
  承上,該量測部2更包括有一標示單元23,用以標記探針卡5之腳位的位置。於本發明中,該標示單元23乃針對被該影像比對單元22辨識為錯誤之腳位進行標記。於本實施例中,該工作平台1設有光學尺11,用以產生該標示單元23所標記之位置的座標。其中該工作平台1上設有沿相互垂直且定義為X軸及Y軸延伸之兩個光學尺11,分別產生此二個軸向的座標資訊。而該錯誤腳位之座標被該標示單元23所記錄,以利於後續的校正作業。
  該校正部4設於該工作平台1上位於該量測部2附近之處。於本實施例中,該校正部4乃以一支撐柱41固定於該工作平台1上,其所在位置定義為一工作位置,而用以將探針卡5之錯誤腳位校正回標準位置。
  此外,該工作平台1上設有一輸送部3,該輸送部3設有一用以承載探針卡5之載台31,而該輸送部3可帶動該載台31於該工作平台1上進行沿X軸及Y軸之二維方向的位移,藉此帶動該載台31上之探針卡5於該量測部2與該校正部4之間移動。於本實施例中,標示單元23於探針卡5上標記出錯誤腳位並記錄其座標後,該輸送部3即利用此座標將探針卡5被標記之位置直接輸送至該校正部4之工作位置,令該校正部4可立即對該錯誤腳位進行校正。
  而本發明之探針卡檢測方法應用上述裝置,其步驟如第1圖所示,包括有:
  將探針卡置於載台上,並移動至量測部處;
  以影像擷取單元擷取探針卡之影像,且以影像比對單元加以辨識探針卡之腳位的位置;
  以標示單元針對各個位置偏離於標準位置的腳位進行標記;
  以輸送部將載台上之探針卡輸送至校正部;其中輸送部將探針卡被標示單元標記之位置直接輸送至該校正部之工作位置;
  以校正部對被標記之腳位進行校正;
  以輸送部將探針卡被標示單元標記之另一個位置直接輸送至該校正部之工作位置,並以校正部校正被標記之腳位。
  於本實施例中,上述檢測方法於開始進行之前,更包括先於量測部輸入關於探針卡腳位之標準位置的教導檔,以作為影像比對單元之比對基礎,藉此在後續擷取待檢測之探針卡的影像後,由該影像比對單元將其比對於該教導檔,進而辨識探針卡之腳位的位置是否出現偏差,若有如第4圖所示出現錯誤腳位51的情形,則該標示單元即加以標記。其中更進一步地界定,該標示單元乃針對各個位置偏離於標準位置且超出公差值的腳位進行標記,再透過輸送部輸送至校正部加以校正。而當該標示單元標記出錯誤腳位後,將記錄其位置,其中於本實施例中可藉由光學尺產生該位置之座標資訊,而該輸送部即利用此座標將探針卡被標記之位置直接輸送至該校正部之工作位置,令該校正部可立即對該錯誤腳位進行校正。
  接著,上述之檢測方法於校正部對探針卡之腳位進行校正後,更包括有以輸送部將探針卡輸送至量測部重行檢測之步驟,其中此步驟僅對探針卡先前被標示單元標記之腳位進行檢測。藉此可縮小檢測範圍以縮短檢測所需的時間,且同時兼顧檢測結果的正確性。而本方法將持續循環地進行,直至探針卡上已無錯誤腳位被標記出來,即可完成探針卡的檢測。
  惟,以上實施例之揭示乃用以說明本發明,並非用以限制本發明,故舉凡等效元件之置換仍應隸屬本發明之範疇。
  綜上所述,可使熟知本項技藝者明瞭本發明確可達成前述目的,實已符合專利法之規定,爰依法提出申請。

The present invention provides a probe card detecting method. The method is implemented by a probe card detecting device. As shown in FIGS. 2 and 3, the device includes a working platform 1 and a measuring device is disposed on the working platform 1. a portion 2, a transport portion 3, and a correction portion 4. The measuring unit 2 includes an image capturing unit 21 and an image comparing unit 22, wherein the image capturing unit 21 is disposed on a support column 24 and is facing the working platform 1 for capturing a probe card. An image matching unit 22 is disposed in the measuring unit 2, and stores a teaching file about a standard position of the probe card position, which includes position and height information of each foot position, and the information The image matching unit 22 compares the image captured by the image capturing unit 21 with respect to the teaching file, and thereby discriminates whether the position of the pin of the probe card 5 is deviated. The position of each foot can be obtained by observing whether the feet in the image deviate from the position in the teaching file, and the height of each foot can be observed whether the feet in the image are at the focus of the image focus. Judging it. For example, as shown in FIG. 4, in the A block of the probe card 5, there is a pin offset from the standard position (hereinafter referred to as the error pin 51), and the pin 51 can be compared through the image matching unit 22. It is recognized in the teaching file, which is beneficial to the subsequent correction work.
The measuring unit 2 further includes a marking unit 23 for marking the position of the pin of the probe card 5. In the present invention, the labeling unit 23 marks the foot recognized as an error by the image matching unit 22. In the embodiment, the working platform 1 is provided with an optical scale 11 for generating coordinates of the position marked by the marking unit 23. The working platform 1 is provided with two optical scales 11 extending perpendicularly to each other and defined as an X-axis and a Y-axis, respectively generating coordinate information of the two axial directions. The coordinates of the wrong foot are recorded by the marking unit 23 to facilitate subsequent calibration operations.
The correction unit 4 is disposed on the work platform 1 at a position near the measurement unit 2. In the embodiment, the correcting portion 4 is fixed on the working platform 1 by a supporting column 41, and its position is defined as a working position for correcting the wrong position of the probe card 5 back to the standard position.
In addition, the working platform 1 is provided with a transporting portion 3, which is provided with a loading platform 31 for carrying the probe card 5, and the transporting portion 3 can drive the loading platform 31 along the working platform 1 The displacement of the X-axis and the Y-axis in the two-dimensional direction drives the probe card 5 on the stage 31 to move between the measuring unit 2 and the correction unit 4. In this embodiment, after the marking unit 23 marks the wrong foot on the probe card 5 and records the coordinates thereof, the conveying portion 3 uses the coordinates to directly convey the position where the probe card 5 is marked to the correcting portion 4 The working position allows the correcting section 4 to immediately correct the wrong foot.
The probe card detecting method of the present invention is applied to the above apparatus, and the steps thereof are as shown in FIG. 1, and include:
Place the probe card on the stage and move it to the measuring section;
The image capturing unit captures the image of the probe card, and the image matching unit identifies the position of the probe card;
Marking the foot position of each position deviating from the standard position by the marking unit;
Sending the probe card on the stage to the correction part by the conveying part; wherein the conveying part directly conveys the position of the probe card marked by the marking unit to the working position of the correction part;
Correcting the marked foot with a correction unit;
The other position where the probe card is marked by the marking unit is directly conveyed to the working position of the correction portion by the conveying portion, and the marked position is corrected by the correcting portion.
In this embodiment, before the start of the detecting method, the teaching file corresponding to the standard position of the probe card position is input before the measuring unit is used as a comparison basis of the image comparing unit, thereby After capturing the image of the probe card to be detected, the image comparison unit compares it with respect to the teaching file, thereby identifying whether the position of the probe card is deviated, and if there is an error foot as shown in FIG. In the case of bit 51, the labeling unit is marked. Further, it is further defined that the marking unit marks the foot position whose position is deviated from the standard position and exceeds the tolerance value, and then is sent to the correction unit through the conveying unit for correction. When the marking unit marks the wrong foot, the position is recorded. In this embodiment, the coordinate information of the position can be generated by the optical ruler, and the conveying unit uses the coordinate to mark the probe card. The position is directly sent to the working position of the correction unit, so that the correction unit can immediately correct the wrong foot.
Then, after the correction unit corrects the position of the probe card, the detection method further includes the step of transporting the probe card to the measurement unit for re-detection by the transport unit, wherein the step is only for the probe card previously Mark the foot of the unit mark for detection. Thereby, the detection range can be narrowed to shorten the time required for the detection, and at the same time, the correctness of the detection result is taken into consideration. The method will continue to be performed cyclically until the probe card has been marked with no error pin, and the probe card can be detected.
The disclosure of the above embodiments is intended to be illustrative of the invention and is not intended to limit the invention.
In summary, it will be apparent to those skilled in the art that the present invention can achieve the foregoing objectives and is in accordance with the provisions of the Patent Law.

Claims (6)

【第1項】[Item 1] 一種探針卡檢測方法,其包括有:
  以一量測裝置辨識探針卡之各腳位的位置;
  比對上述各腳位的位置與一標準位置,判斷二者之偏差情形;
  若前述二者具有偏差,則將出現偏差之腳位標記為一錯誤腳位;
  將探針卡輸送至一校正裝置以進行校正;其中校正裝置具有一工作位置,而探針卡之錯誤腳位被直接輸送至校正裝置之工作位置;
  探針卡之一個錯誤腳位校正完成後,下一個錯誤腳位被直接輸送至校正裝置之工作位置。
A probe card detection method includes:
Identifying the position of each pin of the probe card by a measuring device;
Comparing the position of each of the above-mentioned feet with a standard position, judging the deviation between the two;
If the foregoing two have deviations, the deviation of the foot is marked as an incorrect foot;
Delivering the probe card to a calibration device for correction; wherein the calibration device has a working position, and the wrong foot of the probe card is directly delivered to the working position of the calibration device;
After an error pin correction of the probe card is completed, the next error pin is directly delivered to the working position of the calibration device.
【第2項】[Item 2] 如請求項1所述之探針卡檢測方法,其中,若探針卡之腳位的位置與該標準位置出現偏差,且偏差超出公差值,則將此腳位標記為一錯誤腳位。The probe card detecting method according to claim 1, wherein if the position of the pin of the probe card deviates from the standard position and the deviation exceeds the tolerance value, the pin is marked as an error pin. 【第3項】[Item 3] 如請求項1所述之探針卡檢測方法,其中,該標準位置由一於量測裝置中預先建置之教導檔提供,包括有各腳位之位置及高度資訊。The probe card detecting method according to claim 1, wherein the standard position is provided by a pre-established teaching file in the measuring device, and includes position and height information of each pin. 【第4項】[Item 4] 如請求項1所述之探針卡檢測方法,其中更包括有:探針卡之錯誤腳位校正完成後,將探針卡送回量測裝置重行檢測,且僅對先前被標記之錯誤腳位進行檢測。The probe card detecting method of claim 1, further comprising: after the error pin correction of the probe card is completed, returning the probe card to the measuring device for re-detection, and only for the previously marked error foot The bit is detected. 【第5項】[Item 5] 一種應用如請求項1所述之探針卡檢測方法之探針卡檢測裝置,其包括有:
  一工作平台;
  一量測部,其設於該工作平台上;該量測部包括有一影像擷取單元及一影像比對單元,其中該影像擷取單元用以擷取探針卡之影像,而該影像比對單元用以辨識探針卡之腳位的位置;該量測部更包括有一標示單元,用以標記探針卡之腳位的位置;
  一校正部,其設於該工作平台上;該校正部設有一工作位置,用以校正探針卡之腳位;
  一輸送部,其設於該工作平台上;該輸送部設有一載台,用以承載探針卡,且該輸送部可帶動該載台沿該工作平台進行二維方向之位移,藉此將探針卡被該標示單元標記之位置直接輸送至該校正部之工作位置。
A probe card detecting device using the probe card detecting method according to claim 1, which comprises:
a work platform;
a measuring unit is disposed on the working platform; the measuring unit includes an image capturing unit and an image comparing unit, wherein the image capturing unit is configured to capture an image of the probe card, and the image ratio is The unit is configured to identify the position of the pin of the probe card; the measuring portion further includes a marking unit for marking the position of the pin of the probe card;
a calibration unit disposed on the working platform; the correction portion is provided with a working position for correcting the position of the probe card;
a conveying portion is disposed on the working platform; the conveying portion is provided with a loading platform for carrying the probe card, and the conveying portion can drive the loading table to be displaced in the two-dimensional direction along the working platform, thereby The probe card is directly transported to the working position of the correction unit by the position marked by the marking unit.
【第6項】[Item 6] 如請求項5所述之探針卡檢測裝置,其中,該工作平台設有光學尺,用以產生該標示單元所標記之位置的座標,並利用此座標令該輸送部將探針卡被該標記之位置直接輸送至該校正部之工作位置。The probe card detecting device of claim 5, wherein the working platform is provided with an optical scale for generating a coordinate of the position marked by the marking unit, and using the coordinate to cause the conveying portion to clamp the probe The position of the mark is directly delivered to the working position of the correction unit.
TW103139127A 2014-11-11 2014-11-11 Probe card detection method and device TWI525327B (en)

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