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TW201604005A - Complex - Google Patents

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Publication number
TW201604005A
TW201604005A TW104119468A TW104119468A TW201604005A TW 201604005 A TW201604005 A TW 201604005A TW 104119468 A TW104119468 A TW 104119468A TW 104119468 A TW104119468 A TW 104119468A TW 201604005 A TW201604005 A TW 201604005A
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TW
Taiwan
Prior art keywords
glass substrate
resin
resin layer
composite
layer
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Application number
TW104119468A
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Chinese (zh)
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TWI659832B (en
Inventor
Junichi Kakuta
Masamichi Ide
Kenichi Ebata
Yasuji Fukasawa
Daisuke Kobayashi
Yuichi Suzuki
Original Assignee
Asahi Glass Co Ltd
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Publication of TW201604005A publication Critical patent/TW201604005A/en
Application granted granted Critical
Publication of TWI659832B publication Critical patent/TWI659832B/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • B32B17/10005Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing
    • B32B17/10165Functional features of the laminated safety glass or glazing
    • B32B17/10366Reinforcements of the laminated safety glass or glazing against impact or intrusion
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • B32B17/10Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin
    • B32B17/10005Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing
    • B32B17/1055Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material of synthetic resin laminated safety glass or glazing characterized by the resin layer, i.e. interlayer
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/28Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
    • B32B27/281Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polyimides
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/28Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
    • C03C17/32Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material with synthetic or natural resins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/54Yield strength; Tensile strength
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Laminated Bodies (AREA)
  • Surface Treatment Of Glass (AREA)
  • Compositions Of Macromolecular Compounds (AREA)

Abstract

本發明之目的在於提供一種於對表面存在微小裂縫之玻璃基板施加拉伸應力時不易產生破裂之複合體。本發明係關於一種複合體,其中樹脂層之樹脂深入至微小裂縫內部之至少一部分,且樹脂距離玻璃基板表面之深入深度df相對於上述微小裂縫之深度d的比、與上述樹脂層之斷裂伸長率TE(%)、及上述樹脂層之降伏應力σS(MPa)的乘積為400MPa‧%以上,並且上述樹脂層之拉伸彈性模數為1.0GPa以上。 An object of the present invention is to provide a composite which is less likely to be broken when a tensile stress is applied to a glass substrate having a micro crack on its surface. The present invention relates to a composite in which the resin of the resin layer penetrates into at least a part of the inside of the micro crack, and the ratio of the depth of the resin to the depth df of the surface of the glass substrate relative to the depth d of the micro crack, and the elongation at break of the resin layer The product of the rate TE (%) and the relief stress σS (MPa) of the above resin layer is 400 MPa‧% or more, and the tensile elastic modulus of the above resin layer is 1.0 GPa or more.

Description

複合體 Complex

本發明係關於一種複合體,尤其是關於一種樹脂深入至玻璃基板表面之微小裂縫內部特定深度之複合體。 The present invention relates to a composite, and more particularly to a composite in which a resin penetrates to a specific depth inside a microcrack on the surface of a glass substrate.

作為圖像顯示面板、太陽電池、薄膜二次電池等電子裝置之基板,提出有具有玻璃片材及與玻璃片材結合之樹脂層之複合片材(例如參照專利文獻1)。於複合片材所含之玻璃片材以特定之曲率半徑彎曲變形而於玻璃片材之與樹脂層結合之主面產生拉伸應力的情形時,該拉伸應力因樹脂層之存在而得以減小。藉此可抑制玻璃片材之破損。 A composite sheet having a glass sheet and a resin layer bonded to the glass sheet is proposed as a substrate of an electronic device such as an image display panel, a solar cell, or a thin film secondary battery (see, for example, Patent Document 1). When the glass sheet contained in the composite sheet is bent and deformed by a specific radius of curvature to cause tensile stress on the main surface of the glass sheet combined with the resin layer, the tensile stress is reduced by the presence of the resin layer. small. Thereby, the breakage of the glass sheet can be suppressed.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

專利文獻1:國際公開第2012/166343號 Patent Document 1: International Publication No. 2012/166343

另一方面,通常對玻璃基板實施洗淨處理、研磨處理、切斷處理等各種處理,此時於玻璃基板之表面形成微小裂縫。 On the other hand, the glass substrate is usually subjected to various treatments such as a cleaning treatment, a polishing treatment, and a cutting treatment, and at this time, minute cracks are formed on the surface of the glass substrate.

本發明者等人參照專利文獻1之記載,於經過特定處理而在表面形成有微小裂縫之玻璃基板上形成樹脂層,評估該複合體之特性,結果發現,若對玻璃基板施加拉伸應力,則存在容易破裂之情況。 The inventors of the present invention have found that a resin layer is formed on a glass substrate having micro cracks formed on the surface thereof by a specific treatment, and the characteristics of the composite are evaluated. As a result, it is found that when a tensile stress is applied to the glass substrate, There is a case where it is easy to break.

本發明係鑒於上述實際情況,目的在於提供一種於對表面存在 微小裂縫之玻璃基板施加拉伸應力時不易產生破裂之複合體。 The present invention is directed to the above-mentioned actual situation, and aims to provide a presence on the surface A composite in which a glass substrate of a microcrack is less likely to be broken when a tensile stress is applied.

本發明者等人為解決上述課題經過努力研究,結果完成本發明。 The inventors of the present invention have diligently studied to solve the above problems, and have completed the present invention.

即,本發明之第1形態係一種複合體,其係具備表面存在微小裂縫之玻璃基板、與配置於上述玻璃基板上之樹脂層者,且上述樹脂層之樹脂深入至上述微小裂縫內部之至少一部分,上述樹脂距離上述玻璃基板表面之深入深度df相對於上述微小裂縫之深度d的比(df/d)、與上述樹脂層之斷裂伸長率TE(%)、及上述樹脂層之降伏應力σS(MPa)的乘積(比(df/d)×斷裂伸長率TE×降伏應力σS)為400MPa‧%以上,並且上述樹脂層之拉伸彈性模數Eresin為1.0GPa以上。 That is, the first aspect of the present invention is a composite comprising a glass substrate having a micro crack on its surface and a resin layer disposed on the glass substrate, and the resin of the resin layer penetrates into at least the inside of the micro crack. a part of the ratio of the depth d f of the resin to the depth d of the surface of the glass substrate to the depth d of the microcrack (d f /d), the elongation at break TE (%) of the resin layer, and the fall of the resin layer the product of the stress [sigma] S (MPa) (the ratio of (d f / d) × elongation at break TE × yield stress σ S) or more 400MPa‧%, the resin layer and a tensile modulus of elasticity E resin is 1.0GPa or more.

第1形態中,較佳為玻璃基板之平均厚度為10~200μm。 In the first aspect, the glass substrate preferably has an average thickness of 10 to 200 μm.

第1形態中,較佳為樹脂層之平均厚度為10~100μm。 In the first embodiment, the resin layer preferably has an average thickness of 10 to 100 μm.

第1形態中,較佳為樹脂層包含聚醯亞胺。 In the first aspect, it is preferred that the resin layer contains polyimide.

本發明之第2形態係一種電子裝置,其包含作為第1形態之複合體、與形成於上述複合體之玻璃基板上之元件。 According to a second aspect of the invention, there is provided an electronic device comprising the composite of the first aspect and an element formed on the glass substrate of the composite.

根據本發明,可提供一種於對表面存在微小裂縫之玻璃基板施加拉伸應力時不易產生破裂之複合體。 According to the present invention, it is possible to provide a composite which is less likely to be broken when a tensile stress is applied to a glass substrate having a micro crack on its surface.

2‧‧‧複合體 2‧‧‧Compound

4‧‧‧玻璃基板 4‧‧‧ glass substrate

6‧‧‧樹脂層 6‧‧‧ resin layer

8‧‧‧微小裂縫 8‧‧‧Small cracks

8a‧‧‧線狀之微小裂縫 8a‧‧‧Linear cracks

8b‧‧‧點狀之微小裂縫 8b‧‧‧ point-like tiny crack

10‧‧‧彎曲試驗裝置 10‧‧‧Bending test device

14‧‧‧上側支持盤 14‧‧‧Upper support disk

14a‧‧‧上側支持盤之支持面 14a‧‧‧Support surface of the upper support disk

16‧‧‧下側支持盤 16‧‧‧Lower support disk

16a‧‧‧下側支持盤之支持面 16a‧‧‧Support surface of the lower support disk

17‧‧‧止動部 17‧‧‧Department

18‧‧‧試驗片材 18‧‧‧Test sheet

70‧‧‧有機EL面板(OLED) 70‧‧‧Organic EL Panel (OLED)

71‧‧‧有機EL元件 71‧‧‧Organic EL components

72‧‧‧像素電極 72‧‧‧pixel electrode

74‧‧‧有機層 74‧‧‧Organic layer

76‧‧‧對向電極 76‧‧‧ opposite electrode

78‧‧‧密封板 78‧‧‧ Sealing plate

80‧‧‧液晶面板 80‧‧‧LCD panel

82‧‧‧TFT基板 82‧‧‧TFT substrate

83‧‧‧TFT元件 83‧‧‧TFT components

84‧‧‧CF基板 84‧‧‧CF substrate

85‧‧‧彩色濾光片元件 85‧‧‧Color filter components

86‧‧‧液晶層 86‧‧‧Liquid layer

90‧‧‧太陽電池 90‧‧‧Solar battery

91‧‧‧太陽電池元件 91‧‧‧Solar battery components

92‧‧‧透明電極 92‧‧‧Transparent electrode

94‧‧‧矽層 94‧‧‧矽

96‧‧‧反射電極 96‧‧‧Reflective electrode

98‧‧‧密封板 98‧‧‧ Sealing plate

100‧‧‧薄膜二次電池 100‧‧‧Film secondary battery

101‧‧‧薄膜二次電池元件 101‧‧‧Film secondary battery components

102‧‧‧透明電極 102‧‧‧Transparent electrode

104‧‧‧電解質層 104‧‧‧ electrolyte layer

106‧‧‧集電層 106‧‧‧ collector layer

108‧‧‧密封層 108‧‧‧ Sealing layer

109‧‧‧密封板 109‧‧‧ Sealing plate

110‧‧‧電子紙 110‧‧‧electronic paper

111‧‧‧電子紙元件 111‧‧‧Electronic paper components

112‧‧‧TFT層 112‧‧‧TFT layer

114‧‧‧包含電工學介質之層 114‧‧‧ Layer containing electrical media

116‧‧‧透明電極 116‧‧‧Transparent electrode

118‧‧‧前面板 118‧‧‧ front panel

d‧‧‧微小裂縫之深度 d‧‧‧Deep crack depth

df‧‧‧樹脂距離玻璃基板表面之深入深度 d f ‧‧‧Deep depth of resin from the surface of the glass substrate

D‧‧‧上側支持盤之支持面與下側支持盤之支持面之間之間隔 D‧‧‧Interval between the support surface of the upper support disk and the support surface of the lower support disk

W‧‧‧微小裂縫之寬度 W‧‧‧The width of tiny cracks

圖1係表示本發明之複合體之一實施形態的剖視圖。 Fig. 1 is a cross-sectional view showing an embodiment of a composite of the present invention.

圖2係具有微小裂縫之玻璃基板的俯視圖。 2 is a plan view of a glass substrate having minute cracks.

圖3係表示本發明之一實施形態之有機EL面板之構造的剖視圖。 Fig. 3 is a cross-sectional view showing the structure of an organic EL panel according to an embodiment of the present invention.

圖4係表示本發明之一實施形態之液晶面板之構造的剖視圖。 Fig. 4 is a cross-sectional view showing the structure of a liquid crystal panel according to an embodiment of the present invention.

圖5係表示本發明之一實施形態之太陽電池之構造的剖視圖。 Fig. 5 is a cross-sectional view showing the structure of a solar cell according to an embodiment of the present invention.

圖6係表示本發明之一實施形態之薄膜二次電池之構造的剖視 圖。 Figure 6 is a cross-sectional view showing the structure of a thin film secondary battery according to an embodiment of the present invention. Figure.

圖7係表示本發明之一實施形態之電子紙之構造的剖視圖。 Fig. 7 is a cross-sectional view showing the structure of an electronic paper according to an embodiment of the present invention.

圖8係表示檢測本發明之一實施形態之玻璃基板及複合體之平均破壞強度的彎曲試驗裝置之概略圖。 Fig. 8 is a schematic view showing a bending test apparatus for detecting the average breaking strength of the glass substrate and the composite according to the embodiment of the present invention.

圖9(A)及圖9(B)係使螢光素吸附於具有微小裂縫之玻璃基板表面後破壞玻璃基板,對該破斷面利用光學顯微鏡進行觀察而得之圖(圖9(A))及利用螢光顯微鏡進行觀察而得的圖(圖9(B))。 Fig. 9(A) and Fig. 9(B) are diagrams in which luciferin is adsorbed on the surface of a glass substrate having minute cracks, and the glass substrate is broken, and the broken section is observed by an optical microscope (Fig. 9(A) ) and a view obtained by observation with a fluorescence microscope (Fig. 9(B)).

以下參照圖式說明用以實施本發明之形態。各圖式中,對相同或對應之構成標註相同或對應之符號而省略說明。再者,本發明中之圖為模式圖,各層之厚度之關係或位置關係等未必與實物一致。再者,於本說明書中,“重量%”與“質量%”含義相同。 The form for carrying out the invention will be described below with reference to the drawings. In the drawings, the same or corresponding components are designated by the same or corresponding reference numerals, and the description is omitted. Furthermore, the drawings in the present invention are schematic diagrams, and the relationship of the thicknesses of the layers, the positional relationship, and the like are not necessarily identical to the actual objects. Further, in the present specification, "% by weight" has the same meaning as "% by mass".

作為本發明之複合體之特徵之一,可列舉:對樹脂層之特性(斷裂伸長率、降伏應力、拉伸彈性模數)加以控制,並且樹脂層中之樹脂深入至玻璃基板之微小裂縫內之特定深度。認為玻璃基板容易破裂之原因在於玻璃表面存在之微小裂縫,推測於對玻璃施加應力時,該微小裂縫大幅延伸而導致破裂。因此,如上所述藉由表現出特定特性之樹脂深入至微小裂縫內部而獲得所期望效果。 One of the characteristics of the composite of the present invention is that the properties of the resin layer (elongation at break, the stress at break, the modulus of tensile modulus) are controlled, and the resin in the resin layer penetrates into the minute crack of the glass substrate. The specific depth. It is considered that the glass substrate is easily broken due to minute cracks existing on the surface of the glass, and it is presumed that when a stress is applied to the glass, the minute crack largely extends to cause cracking. Therefore, as described above, the desired effect is obtained by the resin which exhibits a specific characteristic penetrates into the inside of the minute crack.

圖1係本發明之複合體之一例之模式剖視圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing an example of a composite of the present invention.

複合體2具有玻璃基板4、與配置於玻璃基板4上之樹脂層6。於玻璃基板4之樹脂層6側之表面存在微小裂縫8,樹脂層6中之樹脂深入至微小裂縫8內部之至少一部分。 The composite 2 has a glass substrate 4 and a resin layer 6 disposed on the glass substrate 4. A micro crack 8 is present on the surface of the glass substrate 4 on the resin layer 6 side, and the resin in the resin layer 6 penetrates at least a part of the inside of the micro crack 8.

複合體2可為用作圖像顯示面板、太陽電池、薄膜二次電池等電子裝置之基板者,亦可為供形成各種元件者。複合體2可為捲取於捲芯上者,亦可為用於藉由捲對捲法進行之電子裝置之製造者。 The composite 2 may be used as a substrate for an electronic device such as an image display panel, a solar cell, or a thin film secondary battery, or may be used to form various components. The composite 2 may be wound on a core or may be a manufacturer of an electronic device for use in a roll-to-roll process.

再者,圖1中,僅於玻璃基板4之單側具有樹脂層6,亦可於隔著 玻璃基板4之兩側分別具有樹脂層6。隔著玻璃基板4所配置之2個樹脂層6可具有相同厚度亦可具有不同厚度,可具有相同物性(拉伸彈性模數、熱膨脹係數等)亦可具有不同物性。 In addition, in FIG. 1, the resin layer 6 is provided only on one side of the glass substrate 4, and it may be interposed. The resin substrate 6 is provided on both sides of the glass substrate 4, respectively. The two resin layers 6 disposed through the glass substrate 4 may have the same thickness or different thicknesses, and may have the same physical properties (tensile elastic modulus, thermal expansion coefficient, etc.) or different physical properties.

首先,以下對構成複合體2之玻璃基板4及樹脂層6進行詳細說明。 First, the glass substrate 4 and the resin layer 6 which comprise the composite 2 are demonstrated in detail below.

<玻璃基板> <glass substrate>

玻璃基板4之玻璃可為多種多樣,例如可列舉鈉鈣玻璃、無鹼玻璃等。 The glass of the glass substrate 4 can be various, and examples thereof include soda lime glass and alkali-free glass.

玻璃基板4之平均厚度並無特別限制,較佳為200μm以下。若玻璃基板4之平均厚度為200μm以下,則可將玻璃基板4捲繞成螺旋狀而製成玻璃輥。 The average thickness of the glass substrate 4 is not particularly limited, but is preferably 200 μm or less. When the average thickness of the glass substrate 4 is 200 μm or less, the glass substrate 4 can be wound into a spiral shape to form a glass roll.

玻璃基板4之平均厚度較佳為150μm以下,更佳為100μm以下,進而較佳為50μm以下。又,玻璃基板4之平均厚度較佳為0.1μm以上,更佳為1μm以上,進而較佳為5μm以上,尤佳為10μm以上。 The average thickness of the glass substrate 4 is preferably 150 μm or less, more preferably 100 μm or less, still more preferably 50 μm or less. Further, the average thickness of the glass substrate 4 is preferably 0.1 μm or more, more preferably 1 μm or more, still more preferably 5 μm or more, and still more preferably 10 μm or more.

再者,上述平均厚度係測定任意10點以上之玻璃基板4之厚度,將該等作算術平均而得之值。 Further, the average thickness is a value obtained by measuring the thickness of the glass substrate 4 of any ten or more points and arithmetically averaging them.

玻璃基板4之寬度方向上之厚度偏差較佳為5μm以下。所謂「厚度偏差」意指與平均厚度之偏差。若玻璃基板4之寬度方向上之厚度偏差為5μm以下,則複合體2於彎曲變形時等於玻璃基板4上產生之應力較均勻,可減小玻璃基板4之破損。再者,玻璃基板4之長度方向上之厚度偏差一般而言小於玻璃基板4之寬度方向上之厚度偏差。玻璃基板4之寬度方向上之厚度偏差更佳為3μm以下,進而較佳為1μm以下,尤佳為0.5μm以下。玻璃基板4之寬度方向上之厚度偏差係利用雷射位移計分別測定玻璃基板4之正反面之凹凸形狀而求出。 The thickness deviation in the width direction of the glass substrate 4 is preferably 5 μm or less. The term "thickness deviation" means the deviation from the average thickness. When the thickness deviation in the width direction of the glass substrate 4 is 5 μm or less, the composite 2 is equal to the stress generated on the glass substrate 4 when it is bent and deformed, and the damage of the glass substrate 4 can be reduced. Further, the thickness variation in the longitudinal direction of the glass substrate 4 is generally smaller than the thickness deviation in the width direction of the glass substrate 4. The thickness deviation in the width direction of the glass substrate 4 is more preferably 3 μm or less, further preferably 1 μm or less, and particularly preferably 0.5 μm or less. The thickness deviation in the width direction of the glass substrate 4 was determined by measuring the uneven shape of the front and back surfaces of the glass substrate 4 by a laser displacement meter.

玻璃基板4可為帶狀,玻璃基板4之寬度可為100mm以上。於玻璃基板4之寬度為100mm以上之情形時,藉由捲對捲法進行之電子裝 置之製造步驟中,存在對複合體2施加之拉力於寬度方向上變得不均勻之情況,存在拉伸應力集中於玻璃基板4之一部分之情況。於上述情形時,本實施形態之效果(降低玻璃基板4之破損之效果)顯著顯現。 The glass substrate 4 may have a strip shape, and the glass substrate 4 may have a width of 100 mm or more. When the width of the glass substrate 4 is 100 mm or more, the electronic loading by the roll-to-roll method In the manufacturing step, there is a case where the tensile force applied to the composite 2 becomes uneven in the width direction, and there is a case where the tensile stress concentrates on one portion of the glass substrate 4. In the above case, the effect of the present embodiment (the effect of reducing the damage of the glass substrate 4) is remarkably exhibited.

玻璃基板4之製造方法可為浮式法、熔融法、再曳引法中之任意方法。於浮式法之情形時,使熔融玻璃於浴槽內之熔融錫上流動而成形為帶板狀,待所成形之玻璃緩慢冷卻後,將已冷卻之玻璃切斷成所需尺寸。於熔融法之情形時,使自槽狀構件溢出之熔融玻璃於槽狀構件之下端合流而成形為帶板狀,待所成形之玻璃緩慢冷卻後,將已冷卻之玻璃切斷成所需尺寸。於再曳引法之情形時,利用熱使玻璃基板軟化後拉伸成所需厚度,並使經拉伸之玻璃基板固化。 The method for producing the glass substrate 4 may be any of a floating method, a melting method, and a re-drawing method. In the case of the floating method, the molten glass is flowed on the molten tin in the bath to form a strip shape, and after the formed glass is slowly cooled, the cooled glass is cut into a desired size. In the case of the melting method, the molten glass overflowing from the groove-like member is merged at the lower end of the groove-like member to be formed into a strip shape, and after the formed glass is slowly cooled, the cooled glass is cut into a desired size. . In the case of the re-drawing method, the glass substrate is softened by heat, stretched to a desired thickness, and the stretched glass substrate is cured.

於玻璃基板4之表面上存在微小裂縫8。微小裂縫8係於製造玻璃基板時之各種處理(洗淨處理、研磨處理、切斷處理等)時、或搬運玻璃基板等操作時產生。微小裂縫8之形狀並無特別限制,如具有微小裂縫之玻璃基板4之俯視圖即圖2所示,例如可列舉溝狀之凹部呈線狀延伸而成之形狀8a、或點狀之凹部形狀8b。 There are minute cracks 8 on the surface of the glass substrate 4. The microcracks 8 are generated when various processes (cleaning process, polishing process, cutting process, etc.) are performed when a glass substrate is manufactured, or when a glass substrate or the like is handled. The shape of the microcracks 8 is not particularly limited. For example, as shown in FIG. 2, which is a plan view of the glass substrate 4 having minute cracks, for example, a shape 8a in which the groove-like recesses extend in a line shape or a dot-shaped recess shape 8b is exemplified. .

所謂微小裂縫8,主要指微小尺寸等級以下之裂縫(損傷)。 The so-called micro cracks 8 mainly refer to cracks (damages) of a size below a minor size.

微小裂縫8之深度d之大小並無特別限制,就可由電子顯微鏡等檢測出之範圍而言多為0.1μm以上,更多情況下為1.0μm以上。又,上限並無特別限制,多為30μm以下,更多情況下為15μm以下。 The size of the depth d of the microcracks 8 is not particularly limited, and may be 0.1 μm or more, and more preferably 1.0 μm or more, as measured by an electron microscope or the like. Further, the upper limit is not particularly limited, and is usually 30 μm or less, and more often 15 μm or less.

微小裂縫8之寬度W之大小並無特別限制,就可由電子顯微鏡等檢測出之範圍而言多為1nm以上,更多情況下為10nm以上。又,上限並無特別限制,多為100μm以下,更多情況下為10μm以下。 The size of the width W of the microcracks 8 is not particularly limited, and may be 1 nm or more in the range detected by an electron microscope or the like, and more preferably 10 nm or more. Further, the upper limit is not particularly limited, and is usually 100 μm or less, and more often 10 μm or less.

作為上述微小裂縫8之深度d及寬度W之測定方法,可列舉將複合體2切斷而對該切斷面利用電子顯微鏡進行觀察之方法。 As a method of measuring the depth d and the width W of the microcrack 8, the method of cutting the composite 2 and observing the cut surface by an electron microscope is exemplified.

<樹脂層> <Resin layer>

樹脂層6係配置於上述玻璃基板4上之層,發揮針對玻璃基板4之易破裂性進行補強之補強層之作用。 The resin layer 6 is a layer disposed on the glass substrate 4, and functions as a reinforcing layer that reinforces the rupturability of the glass substrate 4.

樹脂層6與上述玻璃基板4之間滿足以下式(1)之關係。 The relationship between the resin layer 6 and the glass substrate 4 described below satisfies the following formula (1).

式(1):(比(df/d))×(樹脂層之斷裂伸長率TE)×(樹脂層之降伏應力σS)≧400MPa‧% Formula (1) :( ratio (d f / d)) × ( breaking elongation of the resin layer TE) × (yield stress of the resin layer σ S) ≧ 400MPa‧%

以下,首先對該式中之各項進行詳細說明。 Hereinafter, each item in the formula will be described in detail first.

如圖1所示,樹脂層6中之樹脂深入至(填充於)微小裂縫8內部之一部分區域。樹脂距離玻璃基板4表面之深入深度df(填充深度)相對於微小裂縫之深度d的比(df/d)之大小(微小裂縫之深度方向上之樹脂之嵌入比)只要滿足上述式(1)之關係則並無特別限制,就複合體更不易破裂之方面(以下亦簡稱為「本發明之效果更優異之方面」)而言,較佳為0.01以上,更佳為0.05以上,進而較佳為0.1以上。上限並無特別限制,由於深入深度df不會大於微小裂縫之深度d,故而為1以下。上述深入深度df表示以玻璃基板4表面為基準,深入至微小裂縫內部之樹脂之最深位置。 As shown in FIG. 1, the resin in the resin layer 6 penetrates (fills) a portion of the inside of the minute crack 8. The ratio of the depth d f (filling depth) of the resin to the depth d of the micro crack (d f /d) of the surface of the glass substrate 4 (the embedding ratio of the resin in the depth direction of the micro crack) is as long as the above formula is satisfied ( 1) The relationship is not particularly limited, and it is preferably 0.01 or more, and more preferably 0.05 or more, in terms of the fact that the composite is less likely to be broken (hereinafter also referred to as "the aspect of the present invention is more excellent"). It is preferably 0.1 or more. The upper limit is not particularly limited, and since the depth d f is not larger than the depth d of the minute crack, it is 1 or less. The depth d f described above indicates the deepest position of the resin deep inside the micro crack based on the surface of the glass substrate 4.

上述比(df/d)為平均值,即,觀察10個以上之微小裂縫,測定各微小裂縫之深度d與深入深度df,計算各微小裂縫之比(df/d),並將所算出之各微小裂縫之比(df/d)進行算術平均而得之值。 The above ratio (d f /d) is an average value, that is, 10 or more micro cracks are observed, the depth d of each micro crack and the depth d f are measured, and the ratio of each micro crack (d f /d) is calculated, and The ratio of the calculated micro cracks (d f /d) is arithmetically averaged.

上述深度d及深入深度df係藉由實施複合體之破壞試驗後利用光學顯微鏡直接觀察破壞起點而獲得。又,根據破壞力學之基礎式(「陶瓷之破壞學」P68),由破壞應力、應力強度因數亦可求出理論值,可確認上述值之正確性。進而,關於深入深度df,預先使色素分散於待塗佈之樹脂中,藉此可利用螢光顯微鏡觀察破壞試驗後之破壞起點,測定其大小,並與深度d進行比較。此處,色素並無特別限定,較佳為螢光素或其衍生物。 The depth d and the depth d f are obtained by directly observing the fracture origin by an optical microscope after performing a failure test of the composite. Further, according to the basic formula of the failure mechanics ("ceramic destruction" P68), the theoretical value can be obtained from the failure stress and the stress intensity factor, and the correctness of the above value can be confirmed. Further, regarding the depth df , the dye is dispersed in the resin to be coated in advance, whereby the origin of destruction after the breaking test can be observed by a fluorescence microscope, and the size thereof is measured and compared with the depth d. Here, the dye is not particularly limited, and is preferably luciferin or a derivative thereof.

又,於色素之分散性較差之樹脂液之情形時,可使用黏度一致 之水溶性樹脂作為觀察用樹脂。藉由使實際用於形成樹脂層之樹脂層形成用組合物之黏度與包含上述觀察用樹脂及色素之評估用組合物之黏度一致,而使評估用組合物侵入至深度d之微小裂縫內部之程度與使用樹脂層形成用組合物之情形時為同等程度。此處,所謂水溶性樹脂係指聚乙烯醇(PVA)或羥基纖維素(HEC)等。又,關於深度d,亦可藉由使色素吸附於微小裂縫內表面,利用螢光顯微鏡觀察破壞試驗後之破壞起點而求出。 Moreover, in the case of a resin liquid in which the dispersibility of the pigment is poor, the viscosity can be used uniformly. The water-soluble resin is used as an observation resin. By making the viscosity of the composition for forming a resin layer which is actually used for forming the resin layer coincide with the viscosity of the composition for evaluation including the observation resin and the dye, the composition for evaluation is invaded into the inside of the micro crack of the depth d. The degree is the same as that in the case of using the composition for forming a resin layer. Here, the water-soluble resin means polyvinyl alcohol (PVA), hydroxy cellulose (HEC), or the like. Further, the depth d can be obtained by adsorbing the dye on the inner surface of the microcrack and observing the origin of destruction after the breaking test by a fluorescence microscope.

再者,作為一例,圖9(A)及圖9(B)中揭示對使螢光素吸附於具有微小裂縫之玻璃基板表面而進行破壞試驗後之玻璃基板之破壞起點附近之破斷面利用光學顯微鏡及螢光顯微鏡進行觀察而得之照片。圖9(A)為光學顯微鏡下之觀察圖,圖9(B)為螢光顯微鏡下之觀察圖。圖中之箭頭意指玻璃基板之厚度方向。若比較兩者,則可於圖9(B)之一表面上(圖式中為玻璃基板之下側之表面)確認到源自吸附於微小裂縫內部之螢光素之螢光,由距離玻璃基板表面之該螢光區域之深度可算出上述深度d。又,如上所述,亦可使色素(例如螢光素)分散於待塗佈之樹脂中,與上述圖9(B)同樣地觀察破壞試驗後之玻璃基板之剖面,藉此觀察上述深入深度dfFurther, as an example, as shown in FIG. 9(A) and FIG. 9(B), the use of the fracture surface near the fracture starting point of the glass substrate after the luciferin is adsorbed on the surface of the glass substrate having the micro cracks is examined. Photographs were observed with an optical microscope and a fluorescent microscope. Fig. 9(A) is an observation view under an optical microscope, and Fig. 9(B) is an observation view under a fluorescence microscope. The arrow in the figure means the thickness direction of the glass substrate. If the two are compared, the fluorescein derived from the inside of the microcrack can be confirmed on the surface of one of FIG. 9(B) (the surface on the lower side of the glass substrate in the drawing), and the distance glass is The depth d can be calculated from the depth of the fluorescent region on the surface of the substrate. Further, as described above, a pigment (for example, luciferin) may be dispersed in the resin to be coated, and the cross section of the glass substrate after the breaking test may be observed in the same manner as in the above-described FIG. 9(B), thereby observing the above-mentioned depth. d f .

樹脂層6之斷裂伸長率TE(%)之大小只要滿足上述式(1)之關係則並無特別限制,就本發明之效果更優異之方面而言,較佳為20%以上,更佳為40%以上。 The breaking elongation TE (%) of the resin layer 6 is not particularly limited as long as it satisfies the relationship of the above formula (1), and is preferably 20% or more, and more preferably in terms of the effect of the present invention. 40% or more.

斷裂伸長率TE(%)之測定方法係依據ASTM D882-12。 The elongation at break TE (%) is determined in accordance with ASTM D882-12.

樹脂層6之降伏應力σS(MPa)之大小只要滿足上述式(1)之關係則並無特別限制,就本發明之效果更優異之方面而言,較佳為50MPa以上,更佳為100MPa以上。 The magnitude of the stress σ S (MPa) of the resin layer 6 is not particularly limited as long as it satisfies the relationship of the above formula (1), and is preferably 50 MPa or more, more preferably 100 MPa, in terms of the effect of the present invention being more excellent. the above.

降伏應力σS之測定方法係依據JIS-C-2151:2006。 The method for determining the stress σ S is based on JIS-C-2151:2006.

上述式(1)意指上述比(df/d)、與樹脂層6之斷裂伸長率TE、及樹 脂層6之降伏應力σS的乘積為400MPa‧%(N/mm2‧%)以上。其中,就本發明之效果更優異之方面而言,上述式(1)之左邊((比(df/d))×(樹脂層之斷裂伸長率TE)×(樹脂層之降伏應力σS))較佳為450MPa‧%以上,更佳為500MPa‧%以上。上限並無特別限制,通常多為8000MPa‧%以下,更多情況下為2000MPa‧%以下。 The above formula (1) means that the product of the above ratio (d f /d), the elongation at break TE of the resin layer 6, and the relief stress σ S of the resin layer 6 is 400 MPa‧% (N/mm 2 ‧%) or more . In the aspect of the present invention, the left side of the formula (1) ((r f / d)) × (elongation at break TE of the resin layer) × (the stress of the resin layer σ S) )) is preferably 450 MPa‧% or more, more preferably 500 MPa‧% or more. The upper limit is not particularly limited, and is usually 8,000 MPa ‧ % or less, and more often 2,000 MPa ‧ %

如上所述,玻璃基板4破裂之原因主要在於:應力集中於玻璃基板4表面所存在之微小裂縫8而導致玻璃基板4容易破裂。本發明者等人發現:藉由使可形成展現特定斷裂伸長率TE及降伏應力σS之樹脂層6之樹脂深入至微小裂縫8內部之特定深度,即,藉由滿足式(1)之關係,可抑制如圖1中之空心箭頭所示之朝向使微小裂縫8之破裂進一步延伸之方向上之應力。 As described above, the reason why the glass substrate 4 is broken is mainly because stress concentrates on the micro cracks 8 existing on the surface of the glass substrate 4, and the glass substrate 4 is easily broken. The present inventors have found that by making the resin which can form the resin layer 6 exhibiting the specific elongation at break TE and the stress σ S into a certain depth inside the minute crack 8, that is, by satisfying the relationship of the formula (1) The stress in the direction in which the rupture of the microcrack 8 is further extended as shown by the hollow arrow in Fig. 1 can be suppressed.

更具體而言,如上所述,玻璃基板破裂之原因在於應力集中於微小裂縫,但於樹脂深入至(嵌入至)微小裂縫內之情形時,施加於微小裂縫之能量根據所深入之深度被分配至樹脂。此時,由樹脂所作之作功量係由以下之式(X)表示。 More specifically, as described above, the reason why the glass substrate is broken is that stress concentrates on minute cracks, but when the resin penetrates into (inserted into) the micro cracks, the energy applied to the micro cracks is distributed according to the depth to which it is deepened. To the resin. At this time, the amount of work performed by the resin is represented by the following formula (X).

式(X)中,W'表示由微小裂縫內所嵌入之樹脂所作之作功量,α表示於微小裂縫之深度方向上之樹脂之嵌入率,d表示微小裂縫之深度,σ表示樹脂之降伏應力,ε表示樹脂之斷裂伸長率。 In the formula (X), W' represents the amount of work performed by the resin embedded in the microcrack, α represents the embedding rate of the resin in the depth direction of the microcrack, d represents the depth of the microcrack, and σ represents the lodging of the resin. The stress, ε, represents the elongation at break of the resin.

上述變數中,d(微小裂縫之深度)相當於經過某步驟之玻璃之最低強度所對應之最深之微小裂縫,若為同一批次之玻璃基板則不存在較大變化,因此可視為大致常數。如此,作功量W'之大小取決於α、 σ及ε。本發明者等人發現,若該3個參數之乘積為特定值,則玻璃基板不易產生破裂。 Among the above variables, d (the depth of the microcrack) corresponds to the deepest microcrack corresponding to the lowest strength of the glass passing through a certain step, and if it is the same batch of the glass substrate, there is no large change, and therefore it can be regarded as a substantially constant. Thus, the amount of work W' depends on α, σ and ε. The inventors of the present invention have found that if the product of the three parameters is a specific value, the glass substrate is less likely to be cracked.

尤其樹脂層6之斷裂伸長率TE越大,則微小裂縫內部之樹脂直至斷裂為止之容許應力之範圍較廣。又,樹脂層6之降伏應力σS越大,則微小裂縫內部之樹脂直至降伏為止之容許應力之範圍較廣。 In particular, the larger the elongation at break TE of the resin layer 6, the wider the allowable stress of the resin inside the microcrack until the fracture. Further, the larger the relief stress σ S of the resin layer 6 is, the wider the allowable stress of the resin inside the microcrack is up to the undulation.

樹脂層6之拉伸彈性模數Eresin為1.0GPa以上,就本發明之效果更優異之方面而言,較佳為1.5GPa以上,更佳為2.0GPa以上。上限並無特別限制,通常多為15GPa以下,更多情況下為10GPa以下。 The tensile elastic modulus E resin of the resin layer 6 is 1.0 GPa or more, and is preferably 1.5 GPa or more, and more preferably 2.0 GPa or more, in terms of the effect of the present invention being more excellent. The upper limit is not particularly limited, and is usually 15 GPa or less, and more often 10 GPa or less.

拉伸彈性模數Eresin之測定方法係依據JIS-C-2151(2006年)。 The method for measuring the tensile elastic modulus E resin is based on JIS-C-2151 (2006).

樹脂層6之平均厚度並無特別限制,較佳為100μm以下。若樹脂層6之平均厚度為100μm以下,則可充分確保複合體2之可撓性。又,若樹脂層6之平均厚度為100μm以下,則可抑制因樹脂與玻璃之熱膨脹係數差所引起之翹曲。樹脂層6之平均厚度較佳為90μm以下,更佳為75μm以下。又,樹脂層6之平均厚度就本發明之效果更優異之方面而言,較佳為0.5μm以上,更佳為1μm以上,進而較佳為10μm以上。 The average thickness of the resin layer 6 is not particularly limited, but is preferably 100 μm or less. When the average thickness of the resin layer 6 is 100 μm or less, the flexibility of the composite 2 can be sufficiently ensured. Moreover, when the average thickness of the resin layer 6 is 100 μm or less, warpage due to a difference in thermal expansion coefficient between the resin and the glass can be suppressed. The average thickness of the resin layer 6 is preferably 90 μm or less, more preferably 75 μm or less. Further, the average thickness of the resin layer 6 is preferably 0.5 μm or more, more preferably 1 μm or more, and still more preferably 10 μm or more from the viewpoint of the effect of the present invention being more excellent.

再者,上述平均厚度係測定任意10點以上之樹脂層6之厚度,並將該等進行算術平均而得之值。 Further, the average thickness is a value obtained by measuring the thickness of the resin layer 6 of any ten or more points and arithmetically averaging these.

樹脂層6例如可僅由樹脂形成。再者,樹脂層6只要由包含樹脂之材料形成即可,例如亦可由樹脂及填料形成。 The resin layer 6 can be formed, for example, only of a resin. Further, the resin layer 6 may be formed of a material containing a resin, and may be formed, for example, of a resin or a filler.

作為填料,可列舉纖維狀、或板狀、鱗片狀、粒狀、不定形狀、破碎品等非纖維狀之填充剖,具體而言,例如可列舉:玻璃纖維、PAN(Polyacrylonitrile,聚丙烯腈)系或瀝青系之碳纖維、不鏽鋼纖維、鋁纖維或黃銅纖維等金屬纖維、芳香族聚醯胺纖維等有機纖維、石膏纖維、陶瓷纖維、石棉纖維、氧化鋯纖維、氧化鋁纖維、二氧化矽纖維、氧化鈦纖維、碳化矽纖維、岩絨、鈦酸鉀晶鬚、鈦酸鋇 晶鬚、硼酸鋁晶鬚、氮化矽晶鬚、雲母、滑石、高嶺土、二氧化矽、碳酸鈣、玻璃珠、玻璃薄片、玻璃微球、黏土、二硫化鉬、矽灰石、氧化鈦、氧化鋅、聚磷酸鈣、金屬粉、金屬薄片、金屬帶、金屬氧化物、碳粉末、石墨、碳黑、鱗片狀碳、奈米碳管等。作為金屬粉、金屬薄片、金屬帶之金屬種之具體例,可例示:銀、鎳、銅、鋅、鋁、不鏽鋼、鐵、黃銅、鉻、錫等。玻璃纖維或碳纖維之種類只要為一般用於樹脂強化用者則並無特別限定,例如可自長纖維型或短纖維型之切股纖維、磨碎纖維等中加以選擇而使用。又,樹脂層6亦可由含浸有樹脂之織布、不織布等構成。 Examples of the filler include a fibrous form, a non-fibrous filler cross section such as a plate shape, a scaly shape, a granular shape, an indefinite shape, and a crushed product. Specific examples thereof include glass fiber and PAN (Polyacrylonitrile). Metal fiber such as carbon fiber, stainless steel fiber, aluminum fiber or brass fiber, organic fiber such as aromatic polyamide fiber, gypsum fiber, ceramic fiber, asbestos fiber, zirconia fiber, alumina fiber, cerium oxide Fiber, titanium oxide fiber, tantalum carbide fiber, rock wool, potassium titanate whisker, barium titanate Whiskers, aluminum borate whiskers, tantalum nitride whiskers, mica, talc, kaolin, ceria, calcium carbonate, glass beads, glass flakes, glass microspheres, clay, molybdenum disulfide, apatite, titanium oxide, Zinc oxide, calcium polyphosphate, metal powder, metal flakes, metal strips, metal oxides, carbon powder, graphite, carbon black, scaly carbon, carbon nanotubes, and the like. Specific examples of the metal powder of the metal powder, the metal foil, and the metal strip include silver, nickel, copper, zinc, aluminum, stainless steel, iron, brass, chromium, tin, and the like. The type of the glass fiber or the carbon fiber is not particularly limited as long as it is generally used for resin reinforcement. For example, it can be selected from a long fiber type or a short fiber type woven fiber or a ground fiber. Further, the resin layer 6 may be composed of a woven fabric impregnated with a resin, a nonwoven fabric or the like.

樹脂層6之樹脂可為多種多樣,例如可為熱塑性樹脂、熱硬化性樹脂之任意者。 The resin of the resin layer 6 can be various, and for example, it can be any of a thermoplastic resin and a thermosetting resin.

作為熱硬化性樹脂,例如可使用聚醯亞胺(PI)、環氧樹脂(EP)等。作為熱塑性樹脂,例如可使用聚醯胺(PA)、聚醯胺醯亞胺(PAI)、聚醚醚酮(PEEK)、聚苯并咪唑(PBI)、液晶聚合物(LCP)、聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)、聚醚碸(PES)、環狀聚烯烴(COP)、聚碳酸酯(PC)、聚氯乙烯(PVC)、聚乙烯(PE)、聚丙烯(PP)、丙烯酸系樹脂(PMMA(PolymethylMethacrylate,聚甲基丙烯酸甲酯))、胺基甲酸酯(PU)等。 As the thermosetting resin, for example, polyimide (PI), epoxy resin (EP), or the like can be used. As the thermoplastic resin, for example, polyamine (PA), polyamidoximine (PAI), polyetheretherketone (PEEK), polybenzimidazole (PBI), liquid crystal polymer (LCP), polyparaphenylene can be used. Ethylene dicarboxylate (PET), polyethylene naphthalate (PEN), polyether oxime (PES), cyclic polyolefin (COP), polycarbonate (PC), polyvinyl chloride (PVC), poly Ethylene (PE), polypropylene (PP), acrylic resin (PMMA (PolymethylMethacrylate)), urethane (PU), and the like.

再者,樹脂層6可由光硬化性樹脂形成,亦可為共聚物或混合物。藉由捲對捲法進行之電子裝置之製造步驟有時包含伴有加熱處理之步驟,樹脂之耐熱溫度(可連續使用之溫度)較佳為100℃以上。作為耐熱溫度為100℃以上之樹脂,例如可列舉:聚醯亞胺(PI)、環氧樹脂(EP)、聚醯胺(PA)、聚醯胺醯亞胺(PAI)、聚醚醚酮(PEEK)、聚苯并咪唑(PBI)、聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)、聚醚碸(PES)、環狀聚烯烴(COP)、聚碳酸酯(PC)、聚氯乙烯(PVC)、丙烯酸系樹脂(PMMA)、胺基甲酸酯(PU)等。 Further, the resin layer 6 may be formed of a photocurable resin, or may be a copolymer or a mixture. The manufacturing step of the electronic device by the roll-to-roll method sometimes includes a step accompanied by heat treatment, and the heat-resistant temperature (temperature at which continuous use) of the resin is preferably 100 ° C or higher. Examples of the resin having a heat resistance temperature of 100 ° C or higher include polyimine (PI), epoxy resin (EP), polyamine (PA), polyamidimide (PAI), and polyether ether ketone. (PEEK), polybenzimidazole (PBI), polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polyether oxime (PES), cyclic polyolefin (COP), Polycarbonate (PC), polyvinyl chloride (PVC), acrylic resin (PMMA), urethane (PU), and the like.

其中,就本發明之效果更優異之方面而言,作為樹脂層6中之樹脂,較佳為聚醯亞胺、環氧樹脂,更佳為聚醯亞胺。 Among them, the resin in the resin layer 6 is preferably a polyimide or an epoxy resin, and more preferably a polyimide.

聚醯亞胺之結構並無特別限制,較佳為包含下述式(I)所表示之具有四羧酸類之殘基(X)與二胺類之殘基(A)的重複單元。再者,聚醯亞胺較佳為含有式(I)所表示之重複單元作為主成分(較佳為相對於全部重複單元為95莫耳%以上),亦可包含其以外之其他重複單元(例如後述式(2-1)或(2-2)所表示之重複單元)。 The structure of the polyimine is not particularly limited, and is preferably a repeating unit containing a residue (X) having a tetracarboxylic acid represented by the following formula (I) and a residue (A) of a diamine. Further, the polyimine preferably contains a repeating unit represented by the formula (I) as a main component (preferably 95 mol% or more with respect to all repeating units), and may contain other repeating units other than For example, a repeating unit represented by the following formula (2-1) or (2-2).

再者,所謂四羧酸類之殘基(X)意指自四羧酸類去除羧基所得之四羧酸殘基,所謂二胺類之殘基(A)意指自二胺類去除胺基所得之二胺殘基。 Further, the residue (X) of the tetracarboxylic acid means a tetracarboxylic acid residue obtained by removing a carboxyl group from a tetracarboxylic acid, and the residue (A) of a so-called diamine means that the amine group is removed from the diamine. Diamine residue.

式(I)中,X表示自四羧酸類去除羧基所得之四羧酸殘基,A表示自二胺類去除胺基所得之二胺殘基。 In the formula (I), X represents a tetracarboxylic acid residue obtained by removing a carboxyl group from a tetracarboxylic acid, and A represents a diamine residue obtained by removing an amine group from a diamine.

式(I)中,X表示自四羧酸類去除羧基所得之四羧酸殘基,較佳為包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基。其中,就本發明之效果更優異之方面而言,更佳為X之總數之50莫耳%以上(較佳為80~100莫耳%)包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基。進而較佳為X之總數之實質上全數(100莫耳%)包含選自由以下之式(X1)~(X4)所表示之基所組成之 群中之至少1種基。 In the formula (I), X represents a tetracarboxylic acid residue obtained by removing a carboxyl group from a tetracarboxylic acid, and preferably contains at least one selected from the group consisting of groups represented by the following formulas (X1) to (X4). Kind of base. In particular, in terms of the effect of the present invention being more excellent, more preferably 50% by mole or more (preferably 80 to 100% by mole) of the total number of Xs is selected from the following formulas (X1) to (X4) At least one of the groups consisting of the indicated groups. Further preferably, substantially all of the total number of X (100 mol%) comprises a group selected from the group consisting of the following formulas (X1) to (X4). At least one base in the group.

又,A表示自二胺類去除胺基所得之二胺殘基,較佳為包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。其中,就本發明之效果更優異之方面而言,更佳為A之總數之50莫耳%以上(較佳為80~100莫耳%)包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。進而較佳為A之總數之實質上全數(100莫耳%)包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。 Further, A represents a diamine residue obtained by removing an amine group from a diamine, and preferably contains at least one group selected from the group consisting of groups represented by the following formulas (A1) to (A8). In particular, in terms of the effect of the present invention being more excellent, more preferably 50 mol% or more (preferably 80 to 100 mol%) of the total number of A is selected from the following formulas (A1) to (A8) At least one of the groups consisting of the indicated groups. Further, it is preferable that substantially all of the total number of A (100 mol%) includes at least one group selected from the group consisting of the groups represented by the following formulas (A1) to (A8).

再者,就本發明之效果更優異之方面而言,較佳為X之總數之80~100莫耳%包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基、且A之總數之80~100莫耳%包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基,更佳為X之總數之實質上全數(100莫耳%)包含選自由以下之式(X1)~(X4)所表示之基所組成之群中之至少1種基、且A之總數之實質上全數(100莫耳%)包含選自由以下之式(A1)~(A8)所表示之基所組成之群中之至少1種基。 Further, in terms of the effect of the present invention being more excellent, it is preferable that 80 to 100 mol% of the total number of Xs is selected from the group consisting of the groups represented by the following formulas (X1) to (X4). At least one of the groups, and 80 to 100 mol% of the total number of A includes at least one group selected from the group consisting of the groups represented by the following formulas (A1) to (A8), and more preferably X The substantial total number (100 mol%) of the total number includes at least one group selected from the group consisting of the groups represented by the following formulas (X1) to (X4), and the substantial total number of A (100 mo The ear %) contains at least one group selected from the group consisting of the groups represented by the following formulas (A1) to (A8).

其中,就本發明之效果更優異之方面而言,作為X,較佳為式(X1)所表示之基及式(X4)所表示之基,更佳為式(X1)所表示之基。 In particular, in view of the fact that the effect of the present invention is more excellent, X is preferably a group represented by the formula (X1) and a group represented by the formula (X4), and more preferably a group represented by the formula (X1).

又,就本發明之效果更優異之方面而言,作為A,較佳為式(A1)所表示之基及式(A6)所表示之基,更佳為式(A1)所表示之基。 Further, in view of the fact that the effect of the present invention is more excellent, A is preferably a group represented by the formula (A1) and a group represented by the formula (A6), and more preferably a group represented by the formula (A1).

作為包含式(X1)~(X4)所表示之基與式(A1)~(A8)所表示之基之較佳組合的聚醯亞胺,可較佳地列舉:X為式(X1)所表示之基且A為式(A1)所表示之基的聚醯亞胺1、及X為式(X4)所表示之基且A為式(A6)所表示之基的聚醯亞胺2。於聚醯亞胺1之情形時,耐熱性更優異。又,於聚醯亞胺2之情形時,無色透明性之方面較佳。 As the polyimine which comprises a preferred combination of the group represented by the formula (X1) to (X4) and the group represented by the formula (A1) to (A8), X is preferably a formula (X1). Polyimine 1 in which A is a group represented by the formula (A1), and X is a group represented by the formula (X4), and A is a polyimine 2 represented by the formula (A6). In the case of polyimine 1, heat resistance is more excellent. Further, in the case of polyimine 2, colorless transparency is preferred.

聚醯亞胺中之上述式(I)所表示之重複單元之重複數(n)並無特別限制,較佳為2以上之整數,就本發明之效果更優異之方面而言,較佳為10~10000,更佳為15~1000。 The number of repetitions (n) of the repeating unit represented by the above formula (I) in the polyimine is not particularly limited, and is preferably an integer of 2 or more. In terms of the effect of the present invention being more excellent, it is preferably 10~10000, more preferably 15~1000.

上述聚醯亞胺亦可於無損耐熱性之範圍內包含選自由下述所例示之基所組成之群中之1種以上作為四羧酸類之殘基(X)。又,亦可包含2種以上之下述所例示之基。 The polyimine may further contain, as a tetracarboxylic acid residue (X), one or more selected from the group consisting of the groups exemplified below in the range of non-destructive heat resistance. Further, two or more kinds of the groups exemplified below may be included.

[化3] [Chemical 3]

又,上述聚醯亞胺亦可於無損耐熱性之範圍內包含選自由下述所例示之基所組成之群中之1種以上作為二胺類之殘基(A)。又,亦可包含2種以上之下述所例示之基。 Further, the polyimine may further contain, as a diamine residue (A), one or more selected from the group consisting of the groups exemplified below in the range of non-deterioration heat resistance. Further, two or more kinds of the groups exemplified below may be included.

[化4] [Chemical 4]

樹脂層6只要覆蓋欲抑制玻璃基板4之破裂之部分即可,亦可為覆蓋樹脂層6之一主面之至少一部分之形態。樹脂層6較佳為覆蓋玻璃基板4之一整個主面。再者,樹脂層6亦可自玻璃基板4之一主面伸出。 The resin layer 6 may cover the portion where the glass substrate 4 is to be broken, and may cover at least a part of one of the main faces of the resin layer 6. The resin layer 6 preferably covers the entire main surface of one of the glass substrates 4. Further, the resin layer 6 may also protrude from one main surface of the glass substrate 4.

樹脂層6之製造方法並無特別限制,根據所使用之材料而適當選擇最佳條件,就本發明之效果更優異之方面而言,可列舉於玻璃基板4上塗佈液狀之樹脂組合物並使之固化而形成樹脂層6之方法。 The method for producing the resin layer 6 is not particularly limited, and the optimum conditions are appropriately selected depending on the materials to be used. In view of the fact that the effects of the present invention are more excellent, a liquid resin composition can be applied to the glass substrate 4. A method of forming the resin layer 6 by curing it.

再者,製造包含上述聚醯亞胺之樹脂層(聚醯亞胺樹脂層)時之製造方法並無特別限制,較佳為使用藉由熱硬化而成為上述式(I)所表示之聚醯亞胺樹脂的硬化性樹脂之形態。 In addition, the production method in the case of producing the resin layer (polyimine resin layer) containing the above polyimine is not particularly limited, and it is preferred to use the polycarbonate represented by the above formula (I) by thermal curing. The form of the curable resin of the imide resin.

以下,對聚醯亞胺樹脂層之製造方法之較佳形態進行詳細說 明。該製造方法較佳為具有以下之步驟(1)及步驟(2)。 Hereinafter, a preferred embodiment of the method for producing a polyimide resin layer will be described in detail. Bright. The manufacturing method preferably has the following steps (1) and (2).

步驟(1):將藉由熱硬化而成為上述式(I)所表示之聚醯亞胺樹脂的硬化性樹脂塗佈於玻璃基板4上而獲得塗膜之步驟 Step (1): a step of applying a curable resin which is a polyimine resin represented by the above formula (I) to a glass substrate 4 by thermal curing to obtain a coating film

步驟(2):對塗膜實施加熱處理而形成聚醯亞胺樹脂層之步驟 Step (2): a step of subjecting the coating film to heat treatment to form a polyimide layer

以下對各步驟之程序進行詳細說明。 The procedure of each step will be described in detail below.

(步驟(1):塗膜形成步驟) (Step (1): Coating film forming step)

步驟(1)係將藉由熱硬化而成為具有上述式(I)所表示之重複單元之聚醯亞胺樹脂的硬化性樹脂塗佈於玻璃基板4上而獲得塗膜之步驟。 The step (1) is a step of applying a curable resin which is a polyimine resin having a repeating unit represented by the above formula (I) to a glass substrate 4 by thermal curing to obtain a coating film.

再者,硬化性樹脂較佳為包含使四羧酸二酐與二胺類反應所獲得之聚醯胺酸,四羧酸二酐之至少一部分包含選自由下述式(Y1)~(Y4)所表示之化合物所組成之群中之至少1種四羧酸二酐,且二胺類之至少一部分包含選自由下述式(B1)~(B8)所表示之化合物所組成之群中之至少1種二胺類。 Further, the curable resin preferably contains a polyamic acid obtained by reacting a tetracarboxylic dianhydride with a diamine, and at least a part of the tetracarboxylic dianhydride is selected from the following formulas (Y1) to (Y4). At least one tetracarboxylic dianhydride in the group consisting of the compounds represented, and at least a part of the diamines is at least one selected from the group consisting of compounds represented by the following formulas (B1) to (B8) One type of diamine.

再者,聚醯胺酸通常係以包含以下之式(2-1)及/或式(2-2)所表示之重複單元之結構式表示。再者,式(2-1)及式(2-2)中,X、A之定義分別與式(I)中之X、A之定義含義相同。 Further, the polyamic acid is usually represented by a structural formula including a repeating unit represented by the following formula (2-1) and/or formula (2-2). Further, in the formulas (2-1) and (2-2), the definitions of X and A are the same as the definitions of X and A in the formula (I), respectively.

四羧酸二酐與二胺類之反應條件並無特別限制,就可高效率地合成聚醯胺酸之方面而言,較佳為於-30~70℃(較佳為-20~40℃)下進行反應。 The reaction conditions of the tetracarboxylic dianhydride and the diamine are not particularly limited, and in terms of efficiently synthesizing the polyamic acid, it is preferably from -30 to 70 ° C (preferably from -20 to 40 ° C). The reaction is carried out under .

四羧酸二酐與二胺類之混合比率並無特別限制,可列舉:使相對於二胺類1莫耳而較佳為0.66~1.5莫耳、更佳為0.9~1.1莫耳、進而較佳為0.97~1.03莫耳之四羧酸二酐與之反應。 The mixing ratio of the tetracarboxylic dianhydride to the diamine is not particularly limited, and is preferably from 0.66 to 1.5 mol, more preferably from 0.9 to 1.1 mol, based on 1 mol of the diamine. It is preferably reacted with 0.97~1.03 mole of tetracarboxylic dianhydride.

於四羧酸二酐與二胺類之反應時亦可視需要使用有機溶劑。所 使用之有機溶劑之種類並無特別限制,例如可使用N-甲基-2-吡咯啶酮、N,N-二甲基乙醯胺、N,N-二乙基乙醯胺、N,N-二甲基甲醯胺、N,N-二乙基甲醯胺、N-甲基己內醯胺、六甲基磷醯胺、四亞甲基碸、二甲基亞碸、間甲酚、苯酚、對氯酚、2-氯-4-羥基甲苯、二乙二醇二甲醚、三乙二醇二甲醚、四乙二醇二甲醚、二烷、γ-丁內酯、二氧雜環戊烷、環己酮、環戊酮等,亦可將2種以上併用。 An organic solvent may also be used as needed in the reaction of the tetracarboxylic dianhydride with the diamine. The type of the organic solvent to be used is not particularly limited, and for example, N-methyl-2-pyrrolidone, N,N-dimethylacetamide, N,N-diethylacetamide, N, can be used. N-dimethylformamide, N,N-diethylformamide, N-methylcaprolactam, hexamethylphosphoniumamine, tetramethylene hydrazine, dimethyl hydrazine, m. Phenol, phenol, p-chlorophenol, 2-chloro-4-hydroxytoluene, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, two Alkane, γ-butyrolactone, dioxolane, cyclohexanone, cyclopentanone or the like may be used in combination of two or more kinds.

上述反應時,亦可視需要併用除選自由上述式(Y1)~(Y4)所表示之化合物所組成之群中之四羧酸二酐以外之其他四羧酸二酐。 In the above reaction, other tetracarboxylic dianhydrides other than the tetracarboxylic dianhydride selected from the group consisting of the compounds represented by the above formulas (Y1) to (Y4) may be used in combination.

又,上述反應時,亦可視需要併用除選自由上述式(B1)~(B8)所表示之化合物所組成之群中之二胺類以外之其他二胺類。 Further, in the above reaction, other diamines other than the diamines selected from the group consisting of the compounds represented by the above formulas (B1) to (B8) may be used in combination.

又,本步驟中所使用之硬化性樹脂可使用除使上述四羧酸二酐與二胺類反應而獲得之聚醯胺酸以外亦添加有可與聚醯胺酸反應之四羧酸二酐或二胺類者。若除聚醯胺酸以外亦添加四羧酸二酐或二胺類,則可使2個以上之具有式(2-1)或式(2-2)所表示之重複單元之聚醯胺酸分子經由四羧酸二酐或二胺類鍵結。 Further, as the curable resin used in the present step, a tetracarboxylic dianhydride which can be reacted with polyglycine can be added in addition to the polyamic acid obtained by reacting the above tetracarboxylic dianhydride with a diamine. Or diamines. When tetracarboxylic dianhydride or diamine is added in addition to poly-proline, two or more poly-lysines having a repeating unit represented by formula (2-1) or formula (2-2) can be obtained. The molecule is bonded via a tetracarboxylic dianhydride or a diamine.

於聚醯胺酸於末端具有胺基之情形時,可添加四羧酸二酐,可以使羧基相對於聚醯胺酸1莫耳而成為0.9~1.1莫耳之方式添加。於聚醯胺酸於末端具有羧基之情形時,可添加二胺類,可以使胺基相對於聚醯胺酸1莫耳而成為0.9~1.1莫耳之方式添加。再者,於聚醯胺酸於末端具有羧基之情形時,酸末端亦可使用添加水或任意之醇而使末端之酸酐基開環所得者。 In the case where the polyamine has an amine group at the terminal, a tetracarboxylic dianhydride may be added, and the carboxyl group may be added in a manner of 0.9 to 1.1 moles per mole of the polyglycolic acid. In the case where the polyglycolic acid has a carboxyl group at the terminal, a diamine may be added, and the amine group may be added in an amount of 0.9 to 1.1 moles per mole of the polyglycolic acid. Further, in the case where the polyglycolic acid has a carboxyl group at the terminal, the acid terminal may be obtained by adding water or an arbitrary alcohol to ring-open the acid anhydride group at the terminal.

後續添加之四羧酸二酐更佳為式(Y1)~(Y4)所表示之化合物。後續添加之二胺類較佳為具有芳香環之二胺類,更佳為式(B1)~(B8)所表示之化合物。 The tetracarboxylic dianhydride to be added later is more preferably a compound represented by the formula (Y1) to (Y4). The diamine to be added later is preferably a diamine having an aromatic ring, more preferably a compound represented by the formula (B1) to (B8).

於後續添加四羧酸二酐類或二胺類之情形時,具有式(2-1)或式(2-2)所表示之重複單元之聚醯胺酸之聚合度(n)較佳為1~20。若聚合 度(n)為該範圍,則即便使硬化性樹脂溶液中之聚醯胺酸濃度成為30質量%以上,亦可使硬化性樹脂之溶液呈低黏度狀態。 In the case where a tetracarboxylic dianhydride or a diamine is added in the subsequent manner, the degree of polymerization (n) of the polyamic acid having a repeating unit represented by the formula (2-1) or the formula (2-2) is preferably 1~20. If aggregated When the degree (n) is in this range, the concentration of the polyamic acid in the curable resin solution is 30% by mass or more, and the solution of the curable resin can be made to have a low viscosity state.

本步驟中亦可使用硬化性樹脂以外之成分。 A component other than the curable resin can also be used in this step.

例如可使用溶劑。更具體而言,可使硬化性樹脂溶解於溶劑而以硬化性樹脂之溶液(硬化性樹脂溶液)之形態使用。作為溶劑,尤其就聚醯胺酸之溶解性之方面而言,較佳為有機溶劑。作為所使用之有機溶劑,可列舉上述反應時所使用之有機溶劑。 For example, a solvent can be used. More specifically, the curable resin can be dissolved in a solvent and used as a solution of a curable resin (curable resin solution). As the solvent, an organic solvent is preferred in terms of solubility of the polyamic acid. The organic solvent to be used in the above reaction can be mentioned as the organic solvent to be used.

再者,於硬化性樹脂溶液中包含有機溶劑之情形時,只要為可實現塗膜厚度之調整、塗佈性良好之量,則有機溶劑之含量並無特別限制,一般而言,相對於硬化性樹脂溶液總質量,較佳為5~95質量%,更佳為10~90質量%。 In the case where the organic solvent is contained in the curable resin solution, the content of the organic solvent is not particularly limited as long as the coating film thickness can be adjusted and the coating property is good, and generally, it is hardened. The total mass of the resin solution is preferably from 5 to 95% by mass, more preferably from 10 to 90% by mass.

又,亦可視需要併用旨在促進聚醯胺酸之脫水閉環之脫水劑或脫水閉環觸媒。例如作為脫水劑,例如可使用乙酸酐、丙酸酐、三氟乙酸酐等酸酐。又,作為脫水閉環觸媒,例如可使用吡啶、三甲基吡啶、二甲基吡啶、三乙基胺等三級胺。 Further, a dehydrating agent or a dehydration ring-closing catalyst which is intended to promote the dehydration ring closure of polyamic acid may be used in combination. For example, as the dehydrating agent, for example, an acid anhydride such as acetic anhydride, propionic anhydride or trifluoroacetic anhydride can be used. Further, as the dehydration ring-closing catalyst, for example, a tertiary amine such as pyridine, trimethylpyridine, lutidine or triethylamine can be used.

於玻璃基板表面上塗佈硬化性樹脂(或硬化性樹脂溶液)之方法並無特別限定,可使用公知之方法。例如可列舉:噴塗法、模嘴塗佈法、旋轉塗佈法、浸漬塗佈法、輥塗法、棒式塗佈法、網版印刷法、凹版塗佈法等。 A method of applying a curable resin (or a curable resin solution) to the surface of the glass substrate is not particularly limited, and a known method can be used. For example, a spray coating method, a die coating method, a spin coating method, a dip coating method, a roll coating method, a bar coating method, a screen printing method, a gravure coating method, and the like can be given.

藉由上述處理而獲得之塗膜之厚度並無特別限制,可以獲得上述所需厚度之聚醯亞胺樹脂層之方式適當進行調整。 The thickness of the coating film obtained by the above treatment is not particularly limited, and the polyimide layer of the desired thickness can be appropriately adjusted.

(步驟(2):加熱處理步驟) (Step (2): Heat treatment step)

步驟(2)係對塗膜實施加熱處理而形成聚醯亞胺樹脂層之步驟。藉由實施本步驟,例如使硬化性樹脂所含之聚醯胺酸進行閉環反應而形成所需之樹脂層。 The step (2) is a step of subjecting the coating film to heat treatment to form a polyimide film. By carrying out this step, for example, the polyamic acid contained in the curable resin is subjected to a ring closure reaction to form a desired resin layer.

加熱處理之方法並無特別限制,適當使用公知之方法(例如將附 塗膜之支持基材靜置於加熱烘箱中進行加熱之方法)。 The method of heat treatment is not particularly limited, and a known method is suitably used (for example, attached) The support substrate of the coating film is placed in a heating oven for heating).

加熱溫度並無特別限制,較佳為300~500℃,就殘留溶劑率變低並且醯亞胺化率進一步上升、本發明之效果更優異之方面而言,更佳為350~450℃。於上述加熱溫度下主要進行聚醯胺酸之閉環反應,因此以下亦將上述溫度稱為醯亞胺化溫度。再者,如後所述,就本發明之效果更優異之方面而言,較佳為使加熱溫度緩慢上升至醯亞胺化溫度。 The heating temperature is not particularly limited, and is preferably from 300 to 500 ° C, and more preferably from 350 to 450 ° C in terms of a lower residual solvent ratio and a further increase in the sulfhydrylation ratio and more excellent effects of the present invention. The ring closure reaction of polyglycolic acid is mainly carried out at the above heating temperature. Therefore, the above temperature is also referred to as the hydrazine imidization temperature. Further, as described later, in terms of the effect of the present invention being more excellent, it is preferred to gradually increase the heating temperature to the hydrazine imidization temperature.

加熱時間並無特別限制,根據所使用之硬化性樹脂之結構而適當選擇最佳時間,就殘留溶劑率變低並且醯亞胺化率進一步上升、本發明之效果更優異之方面而言,自室溫至醯亞胺化溫度之升溫時間較佳為30~180分鐘,更佳為60~120分鐘。又,於實施後述乾燥加熱處理之情形時,自乾燥加熱處理時之溫度至醯亞胺化溫度之升溫時間只要處於上述範圍即可。再者,升溫時之升溫速度並無特別限制,較佳為以大致恆定之速度(恆定之升溫速度)進行升溫,較佳為用加熱開始溫度(於實施過乾燥加熱處理之情形時為乾燥溫度)與特定之醯亞胺化溫度之差除以特定之升溫時間所得之值。具體而言,於加熱開始溫度為120℃、醯亞胺化溫度為350℃、升溫時間為120分鐘之情形時,升溫速度較佳為(350-120)/120≒1.9℃/min左右。 The heating time is not particularly limited, and the optimum time is appropriately selected depending on the structure of the curable resin to be used, and the residual solvent ratio is lowered, the ruthenium imidization ratio is further increased, and the effect of the present invention is further improved. The temperature rise time of the temperature to the imidization temperature is preferably from 30 to 180 minutes, more preferably from 60 to 120 minutes. Further, in the case of performing the drying and heat treatment described later, the temperature rise time from the temperature at the time of the heat treatment to the heat treatment temperature of the hydrazine imidization temperature may be within the above range. Further, the temperature increase rate at the time of temperature rise is not particularly limited, but it is preferred to increase the temperature at a substantially constant speed (constant temperature increase rate), and it is preferable to use a heating start temperature (dry temperature when subjected to dry heat treatment) The difference between the difference from the specific imidization temperature divided by the specific temperature rise time. Specifically, when the heating start temperature is 120 ° C, the hydrazine imidization temperature is 350 ° C, and the temperature rise time is 120 minutes, the temperature increase rate is preferably about (350-120) / 120 ≒ 1.9 ° C / min.

又,醯亞胺化溫度下之保持時間較佳為30~120分鐘。 Further, the holding time at the hydrazine imidization temperature is preferably from 30 to 120 minutes.

加熱之環境並無特別限制,例如於大氣中、真空下或惰性氣體下實施。 The heating environment is not particularly limited, and is, for example, carried out in the atmosphere, under vacuum or under an inert gas.

再者,加熱處理可於不同溫度下分階段實施。 Furthermore, the heat treatment can be carried out in stages at different temperatures.

再者,於上述加熱溫度下之處理前亦可視需要實施用以去除塗膜中之揮發成分(溶劑)之乾燥加熱處理。乾燥加熱處理之溫度條件並無特別限制,就本發明之效果更優異之方面而言,較佳為40~200℃下之加熱處理。又,乾燥時間並無特別限制,就本發明之效果更優異 之方面而言,較佳為15~120分鐘,更佳為30~60分鐘。再者,乾燥加熱處理可於不同溫度下分階段實施。 Further, a drying heat treatment for removing volatile components (solvents) in the coating film may be carried out as needed before the treatment at the above heating temperature. The temperature conditions for the drying and heat treatment are not particularly limited, and in terms of the effect of the present invention being more excellent, the heat treatment at 40 to 200 ° C is preferred. Further, the drying time is not particularly limited, and the effect of the present invention is more excellent. In terms of aspect, it is preferably 15 to 120 minutes, more preferably 30 to 60 minutes. Furthermore, the drying heat treatment can be carried out in stages at different temperatures.

因此,作為本步驟(2)之較佳形態之一,可列舉於上述溫度下實施乾燥加熱處理後進而實施上述於350~450℃下之加熱處理之形態。 Therefore, as one of the preferable aspects of the step (2), a drying treatment at the above temperature may be employed, and then the heat treatment at 350 to 450 ° C may be carried out.

藉由經過上述步驟(2)而形成包含聚醯亞胺樹脂之聚醯亞胺樹脂層。 The polyimine resin layer containing the polyimide resin is formed by the above step (2).

聚醯亞胺樹脂之醯亞胺化率並無特別限制,就本發明之效果更優異之方面而言,較佳為99.0%以上,更佳為99.5%以上。 The ruthenium imidation ratio of the polyimide resin is not particularly limited, and is preferably 99.0% or more, and more preferably 99.5% or more, in terms of the effect of the present invention being more excellent.

關於醯亞胺化率之測定方法,將於氮氣環境下對硬化性樹脂在350℃下進行2小時之加熱之情形設為醯亞胺化率100%,由硬化性樹脂之IR光譜中源自醯亞胺羰基之峰值:約1780cm-1之峰值強度相對於加熱處理前後不變之峰值強度(例如源自苯環之峰值:約1500cm-1)的強度比而求出。 The method for measuring the yield of hydrazine is carried out by heating the curable resin at 350 ° C for 2 hours in a nitrogen atmosphere, and the yttrium imidation ratio is 100%, which is derived from the IR spectrum of the curable resin. the carbonyl peak (PEI): a peak strength of about 1780cm -1 to the peak intensity of the phase change before and after heat treatment (e.g., benzene ring derived peak: about 1500cm -1) intensity ratio is obtained.

再者,上述步驟(1)中,將藉由熱硬化而成為具有上述式(I)所表示之重複單元之聚醯亞胺樹脂的硬化性樹脂塗佈於玻璃基板上而製造塗膜,但並不限定於該形態,例如亦可塗佈包含上述式(I)所表示之聚醯亞胺樹脂及溶劑之組合物而形成塗膜。 In the above step (1), a curable resin which is a polyimine resin having a repeating unit represented by the above formula (I) by thermal curing is applied onto a glass substrate to produce a coating film, but The composition is not limited to this embodiment. For example, a composition comprising a polyimine resin represented by the above formula (I) and a solvent may be applied to form a coating film.

<複合體及電子裝置> <Composite and electronic device>

上述複合體具備玻璃基板4與樹脂層6。 The composite body includes a glass substrate 4 and a resin layer 6.

複合體之光線透過率並無特別限制,於應用於無需使光透過至背面基板之頂部發光之OLED用途之情形時,可為90%以下,80%以下亦無妨。 The light transmittance of the composite is not particularly limited, and may be 90% or less and 80% or less in the case of application to an OLED which does not require light to be transmitted to the top of the rear substrate.

其次,對電子裝置進行說明。 Next, the electronic device will be described.

作為電子裝置,可列舉:圖像顯示面板、太陽電池、薄膜二次電池、攝像元件(CCD(Charge Coupled Device,電荷耦合元件)、CMOS(complementary metal oxide semiconductor,互補金氧半導體) 等)、壓力感測器、加速度感測器、生物感測器等。作為圖像顯示面板,可列舉:液晶面板(LCD)、電漿顯示面板(PDP)、有機EL面板(OLED)、電子紙等。電子裝置具有上述構成之複合體、及形成於複合體上之元件。 Examples of the electronic device include an image display panel, a solar cell, a thin film secondary battery, and an imaging element (CCD (Charge Coupled Device), CMOS (Complementary Metal Oxide Semiconductor)). Etc.), pressure sensors, acceleration sensors, biosensors, etc. Examples of the image display panel include a liquid crystal panel (LCD), a plasma display panel (PDP), an organic EL panel (OLED), and electronic paper. The electronic device has a composite body of the above configuration and an element formed on the composite body.

圖3係表示本發明之一實施形態之有機EL面板(OLED)之圖。有機EL面板70例如由複合體2、像素電極72、有機層74、對向電極76及密封板78等構成。有機層74至少包含發光層,視需要包含電洞注入層、電洞傳輸層、電子傳輸層、電子注入層。例如有機層74自陽極側起依序包含電洞注入層、電洞傳輸層、發光層、電子傳輸層及電子注入層。由像素電極72、有機層74及對向電極76等構成頂部發光型有機EL元件71。再者,有機EL元件亦可為底部發光型。 Fig. 3 is a view showing an organic EL panel (OLED) according to an embodiment of the present invention. The organic EL panel 70 is composed of, for example, a composite 2, a pixel electrode 72, an organic layer 74, a counter electrode 76, a sealing plate 78, and the like. The organic layer 74 includes at least a light-emitting layer, and optionally includes a hole injection layer, a hole transport layer, an electron transport layer, and an electron injection layer. For example, the organic layer 74 sequentially includes a hole injection layer, a hole transport layer, a light-emitting layer, an electron transport layer, and an electron injection layer from the anode side. The top emission type organic EL element 71 is constituted by the pixel electrode 72, the organic layer 74, the counter electrode 76, and the like. Further, the organic EL element may be of a bottom emission type.

圖4係表示本發明之一實施形態之液晶面板之圖。液晶面板80係由TFT基板82、CF基板84及液晶層86等構成。TFT基板82係於複合體2(構成複合體2之例如玻璃基板4)上圖案形成TFT元件(薄膜電晶體元件)83等而成。CF基板84係於另一複合體2(構成複合體2之例如玻璃基板4)上圖案形成彩色濾光片元件85而成。液晶層86係形成於TFT基板82與CF基板84之間。TFT基板82及CF基板84相當於申請專利範圍中記載之電子裝置。 Fig. 4 is a view showing a liquid crystal panel according to an embodiment of the present invention. The liquid crystal panel 80 is composed of a TFT substrate 82, a CF substrate 84, a liquid crystal layer 86, and the like. The TFT substrate 82 is formed by patterning a TFT element (thin film transistor element) 83 on the composite 2 (for example, the glass substrate 4 constituting the composite 2). The CF substrate 84 is formed by patterning the color filter element 85 on the other composite 2 (for example, the glass substrate 4 constituting the composite 2). The liquid crystal layer 86 is formed between the TFT substrate 82 and the CF substrate 84. The TFT substrate 82 and the CF substrate 84 correspond to the electronic device described in the patent application.

圖5係表示本發明之一實施形態之太陽電池之圖。太陽電池90例如由複合體2、透明電極92、矽層94、反射電極96及密封板98等構成。矽層例如自陽極側起由p層(摻雜成p型之層)、i層(光吸收層)、n層(摻雜成n型之層)等構成。由透明電極92、矽層94及反射電極96等構成矽型太陽電池元件91。再者,太陽電池元件亦可為化合物型、色素增感型、量子點型等。 Fig. 5 is a view showing a solar cell according to an embodiment of the present invention. The solar cell 90 is composed of, for example, a composite 2, a transparent electrode 92, a ruthenium layer 94, a reflective electrode 96, a sealing plate 98, and the like. The tantalum layer is composed of, for example, a p-layer (a layer doped into a p-type), an i-layer (a light-absorbing layer), an n-layer (a layer doped into an n-type), and the like from the anode side. The prismatic solar cell element 91 is constituted by the transparent electrode 92, the ruthenium layer 94, the reflective electrode 96, and the like. Further, the solar cell element may be a compound type, a dye-sensitized type, a quantum dot type or the like.

圖6係表示本發明之一實施形態之薄膜二次電池之圖。薄膜二次電池100例如由複合體2、透明電極102、電解質層104、集電層106、 密封層108及密封板109等構成。由透明電極102、電解質層104、集電層106及密封層108等構成薄膜二次電池元件101。再者,本實施形態之薄膜二次電池元件101為鋰離子型,亦可為鎳氫型、聚合物型、陶瓷電解質型等。 Fig. 6 is a view showing a thin film secondary battery according to an embodiment of the present invention. The thin film secondary battery 100 is composed of, for example, a composite 2, a transparent electrode 102, an electrolyte layer 104, a collector layer 106, The sealing layer 108, the sealing plate 109, and the like are configured. The thin film secondary battery element 101 is composed of the transparent electrode 102, the electrolyte layer 104, the collector layer 106, the sealing layer 108, and the like. Further, the thin film secondary battery element 101 of the present embodiment is of a lithium ion type, and may be a nickel hydrogen type, a polymer type, a ceramic electrolyte type or the like.

圖7係表示本發明之一實施形態之電子紙之圖。電子紙110例如由複合體2、TFT層112、包含電工學介質(例如微膠囊)之層114、透明電極116及前面板118構成。由TFT層112、包含電工學介質之層114及透明電極116等構成電子紙元件111。電子紙元件可為微膠囊型、橫向電場型、扭轉球型、粒子移動型、電子噴流型、聚合物網路型中之任意類型。 Fig. 7 is a view showing an electronic paper according to an embodiment of the present invention. The electronic paper 110 is composed of, for example, a composite 2, a TFT layer 112, a layer 114 containing an electrical medium (for example, a microcapsule), a transparent electrode 116, and a front panel 118. The electronic paper element 111 is composed of a TFT layer 112, a layer 114 containing an electrical medium, a transparent electrode 116, and the like. The electronic paper element may be any of a microcapsule type, a transverse electric field type, a torsion sphere type, a particle moving type, an electron jet type, and a polymer network type.

[實施例] [Examples]

以下藉由例等具體地說明本發明,但本發明並不限定於該等例。例1為實施例,例2及3為比較例。 Hereinafter, the present invention will be specifically described by way of examples, but the present invention is not limited to the examples. Example 1 is an example, and Examples 2 and 3 are comparative examples.

以下之例中,作為玻璃基板,使用玻璃基板X(平均厚度100μm,寬度方向厚度偏差1μm以下,無鹼玻璃,熱膨脹係數4×10-6/℃,拉伸彈性模數77GPa)。於玻璃基板X之表面上存在多處微小裂縫。微小裂縫之寬度W為10~100nm左右,深度d為10μm以下。 In the following examples, a glass substrate X (having an average thickness of 100 μm, a thickness deviation of 1 μm or less in the width direction, an alkali-free glass, a thermal expansion coefficient of 4 × 10 -6 /° C., and a tensile modulus of elasticity of 77 GPa) was used as the glass substrate. There are a plurality of minute cracks on the surface of the glass substrate X. The width W of the micro crack is about 10 to 100 nm, and the depth d is 10 μm or less.

再者,玻璃基板X係利用浮式法製作。具體而言,使熔融玻璃於熔融錫上流動而成形為帶板狀,待所成形之玻璃緩慢冷卻後,將已冷卻之玻璃切斷成所需尺寸。於緩冷步驟及切斷步驟中,利用壓縮空氣之空氣壓支持玻璃以使玻璃不與固體物接觸。切斷步驟中採用作為非接觸切斷法之雷射切斷法。 Further, the glass substrate X is produced by a floating method. Specifically, the molten glass is formed on a molten tin to be formed into a strip shape, and after the glass to be formed is slowly cooled, the cooled glass is cut into a desired size. In the slow cooling step and the cutting step, the glass is supported by the air pressure of the compressed air so that the glass does not come into contact with the solid matter. In the cutting step, a laser cutting method as a non-contact cutting method is employed.

<製造例1:聚醯胺酸溶液(P1)之製造> <Manufacturing Example 1: Production of Polyproline Solution (P1)>

使對苯二胺(10.8g,0.1mol)溶解於1-甲基-2-吡咯啶酮(226.0g),於室溫下攪拌。向其中歷時1分鐘添加BPDA(3,3',4,4'-bisphenyltetracarboxylic dianhydride,3,3',4,4'-聯苯四羧酸二酐)(29.4 g,0.1mol),於室溫下攪拌2小時,獲得包含具有上述式(2-1)及/或式(2-2)所表示之重複單元之聚醯胺酸且固形物成分濃度20質量%之聚醯胺酸溶液(P1)。測定該溶液之黏度,結果於20℃下為3000厘泊。 P-phenylenediamine (10.8 g, 0.1 mol) was dissolved in 1-methyl-2-pyrrolidone (226.0 g), and stirred at room temperature. Add BPDA (3,3',4,4'-bisphenyltetracarboxylic dianhydride,3,3',4,4'-biphenyltetracarboxylic dianhydride) to the mixture for 1 minute (29.4 g, 0.1 mol), stirred at room temperature for 2 hours to obtain a polyglycine containing a repeating unit represented by the above formula (2-1) and/or formula (2-2) and having a solid content concentration of 20 masses % polyglycine solution (P1). The viscosity of the solution was measured and found to be 3000 cps at 20 °C.

黏度係使用Tokimec公司(股份)製造之DVL-BII型數位黏度計(B型黏度計),測定20℃下之旋轉黏度所得者。 The viscosity was obtained by using a DVL-BII type digital viscometer (B type viscometer) manufactured by Tokimec Co., Ltd., and measuring the rotational viscosity at 20 °C.

再者,聚醯胺酸中所含之式(2-1)及/或式(2-2)所表示之重複單元中之X為式(X1)所表示之基,A為式(A1)所表示之基。 Further, X in the repeating unit represented by the formula (2-1) and/or the formula (2-2) contained in the polyamic acid is a group represented by the formula (X1), and A is a formula (A1). The basis of the representation.

<例1> <Example 1>

首先,對玻璃基板X進行純水清洗後,進而進行UV清洗而使之潔淨化。 First, the glass substrate X is washed with pure water, and then further cleaned by UV cleaning.

繼而,利用旋轉塗佈機(轉數:2000rpm,15秒)將聚醯胺酸溶液(P1)塗佈於玻璃基板X之第1主面上,從而於玻璃基板X上設置包含聚醯胺酸之塗膜(塗膜量100g/m2)。 Then, the polyaminic acid solution (P1) was applied onto the first main surface of the glass substrate X by a spin coater (revolution number: 2000 rpm, 15 seconds), thereby providing a polylysine on the glass substrate X. The coating film (coating amount: 100 g/m 2 ).

再者,上述聚醯胺酸係使上述式(Y1)所表示之化合物與式(B1)所表示之化合物反應而得之樹脂。 Further, the polyamic acid is a resin obtained by reacting a compound represented by the above formula (Y1) with a compound represented by the formula (B1).

其次,於大氣中、60℃下加熱30分鐘,其後於120℃下加熱30分鐘,進而歷時2小時升溫至350℃,於350℃下保持1小時,加熱塗膜而形成樹脂層(平均厚度:25μm)。所形成之樹脂層中包含具有下式所表示之重複單元之聚醯亞胺樹脂(式(I)中之X包含式(X1)所表示之基,A包含式(A1)所表示之基)。再者,醯亞胺化率為99.7%。 Next, it was heated in the air at 60 ° C for 30 minutes, then heated at 120 ° C for 30 minutes, and further heated to 350 ° C for 2 hours, and kept at 350 ° C for 1 hour, and the coating film was heated to form a resin layer (average thickness). : 25 μm). The formed resin layer contains a polyimine resin having a repeating unit represented by the following formula (X in the formula (I) contains a group represented by the formula (X1), and A contains a group represented by the formula (A1)) . Further, the oxime imidization ratio was 99.7%.

<例2> <Example 2>

將塗膜之加熱條件設為於60℃下加熱30分鐘,其後於120℃下加熱30分鐘,進而直接放入350℃之烘箱中加熱1小時,除此以外,利用與例1相同之方法獲得玻璃複合體。 The heating conditions of the coating film were set to 60 ° C for 30 minutes, then heated at 120 ° C for 30 minutes, and further heated in an oven at 350 ° C for 1 hour, except that the same method as in Example 1 was used. A glass composite is obtained.

<例3> <Example 3>

利用與例1相同之方法成膜樹脂層(聚醯亞胺膜)後,暫時將聚醯亞胺膜剝離,使之與另一玻璃基板X重疊,使用三共製造之「HAL-TEC」,將壓入量設為1mm,於大氣下進行輥壓積層。 After forming a resin layer (polyimine film) by the same method as in Example 1, the polyimide film was temporarily peeled off and overlapped with another glass substrate X, and "HAL-TEC" manufactured by Sankyo Co., Ltd. was used. The amount of press-in was set to 1 mm, and the laminate was rolled under the atmosphere.

<各種參數之測定> <Measurement of various parameters>

(「df/d」) ("d f /d")

微小裂縫之深度d係藉由對玻璃基板X實施後述破壞試驗後,利用光學顯微鏡直接觀察破壞起點而獲得。 The depth d of the microcrack is obtained by directly performing the destruction test described later on the glass substrate X, and directly observing the fracture origin by an optical microscope.

又,關於樹脂之深入深度df之測定,首先,藉由旋轉塗佈(2000rpm),於玻璃基板X之表面塗佈溶解有3-胺基丙基三乙氧基矽烷(KBM903)0.1質量%之異丙醇溶液。繼而,於80℃下乾燥10分鐘後,利用旋轉塗佈機(轉數:2000rpm,15秒)將包含螢光異硫氰酸鹽(濃度:0.01(mmol/l))與水溶性樹脂(聚乙烯醇)之水溶液塗佈於玻璃基板X之第1主面上。塗佈處理後,用純水對玻璃基板X進行3次沖洗,加以乾燥後,實施後述破壞試驗,其後使用螢光顯微鏡(Olympus)觀察破壞起點,觀察深入深度df。再者,上述水溶液中之聚乙烯醇之濃度係以使水溶液之黏度與上述聚醯胺酸溶液(P1)之黏度成為同等程度之方式進行調整。 Further, regarding the measurement of the depth d f of the resin, first, 0.1% by mass of 3-aminopropyltriethoxydecane (KBM903) was dissolved and coated on the surface of the glass substrate X by spin coating (2000 rpm). Isopropyl alcohol solution. Then, after drying at 80 ° C for 10 minutes, a fluorescent isothiocyanate (concentration: 0.01 (mmol/l)) and a water-soluble resin (concentration) were used by a spin coater (revolution number: 2000 rpm, 15 seconds). An aqueous solution of vinyl alcohol) is applied to the first main surface of the glass substrate X. After the coating treatment, the glass substrate X was rinsed three times with pure water, dried, and then subjected to a breaking test described later, and thereafter, a fracture origin was observed using a fluorescence microscope (Olympus), and the depth d f was observed. Further, the concentration of the polyvinyl alcohol in the aqueous solution is adjusted so that the viscosity of the aqueous solution is equal to the viscosity of the polyamic acid solution (P1).

又,上述揭示了利用螢光顯微鏡測定深入深度df之方法,對所獲得之複合體實施後述破壞試驗後,利用光學顯微鏡直接觀察破壞起點,結果觀測到與由上述螢光顯微鏡所獲得之深入深度df為同等程度 之值。 Further, as described above, a method of measuring the depth d f by a fluorescence microscope is disclosed. After the fracture test described later is performed on the obtained composite, the fracture origin is directly observed by an optical microscope, and as a result, the depth obtained by the above-mentioned fluorescence microscope is observed. The depth d f is the same value.

再者,於難以利用顯微鏡進行測定之情形時,根據破壞力學之基礎式d=(K/2σ)2(「陶瓷之破壞學」P68),由破壞應力、應力強度因數而求出理論值,並使用該值。 In addition, when it is difficult to perform measurement by a microscope, the theoretical value is obtained from the failure stress and the stress intensity factor according to the basic formula d=(K/2σ) 2 ("ceramic destruction" P68) of the failure mechanics. And use this value.

(樹脂層之斷裂伸長率TE) (The elongation at break of the resin layer TE)

樹脂層(聚醯亞胺樹脂層)之斷裂伸長率TE係依據ASTM D882-12進行測定。 The elongation at break TE of the resin layer (polyimine resin layer) was measured in accordance with ASTM D882-12.

(樹脂層之降伏應力σS及拉伸彈性模數Eresin) (The lodging stress σ S of the resin layer and the tensile elastic modulus E resin )

樹脂層(聚醯亞胺樹脂層)之降伏應力σS及拉伸彈性模數Eresin係依據JIS-C-2151:2006進行測定。 The lodging stress σ S and the tensile elastic modulus E resin of the resin layer (polyimine resin layer) were measured in accordance with JIS-C-2151:2006.

再者,關於樹脂層(聚醯亞胺樹脂層)之斷裂伸長率TE、樹脂層之降伏應力σS及樹脂層之拉伸彈性模數Eresin,自所獲得之複合體將樹脂層剝離後實施上述測定。於無法將樹脂層剝離之情形時,利用氫氟酸將玻璃基板溶解而獲得測定用樹脂層。 Further, regarding the elongation at break TE of the resin layer (polyimine resin layer), the stress σ S of the resin layer, and the tensile elastic modulus E resin of the resin layer, after the resin layer is peeled off from the obtained composite The above measurement was carried out. When the resin layer cannot be peeled off, the glass substrate is dissolved by hydrofluoric acid to obtain a resin layer for measurement.

<評估(破壞試驗)> <Evaluation (destruction test)>

藉由圖8之彎曲試驗裝置,對例1~3中準備之存在樹脂層之情形時之玻璃基板之平均破壞強度進行測定。 The average fracture strength of the glass substrate in the case where the resin layer was prepared in Examples 1 to 3 was measured by the bending test apparatus of Fig. 8.

以下,首先,參照圖8,對不存在樹脂層之情形時之玻璃基板之平均破壞強度之測定方法進行說明。 Hereinafter, first, a method of measuring the average fracture strength of the glass substrate in the case where the resin layer is not present will be described with reference to FIG.

圖8係表示檢測本發明之玻璃基板之平均破壞強度之彎曲試驗裝置之圖。圖8中,若於實線所示之狀態下,下側支持盤相對於上側支持盤而向圖中左方向移動,則成為單點鏈線所示之狀態。 Fig. 8 is a view showing a bending test apparatus for detecting the average breaking strength of the glass substrate of the present invention. In the state shown by the solid line, when the lower support disk moves to the left in the drawing with respect to the upper support disk, the state shown by the single-dot chain line is shown.

彎曲試驗裝置10如圖8所示,具備作為第1支持盤之上側支持盤14、作為第2支持盤之下側支持盤16,使試驗片材18於上側支持盤14與下側支持盤16之間彎曲。 As shown in FIG. 8, the bending test apparatus 10 includes a support disk 14 as the upper side of the first support disk and a support disk 16 as the lower support side of the second support disk, and the test sheet 18 is placed on the upper support disk 14 and the lower support disk 16 Bend between.

試驗片材18係對與欲知曉平均破壞強度之玻璃基板同一時間所 製作之玻璃基板進行加工而製成。同一時間製作之玻璃基板(例如同一批次之玻璃基板)可視為於表面具有同等程度之損傷。再者,試驗片材18亦可自欲知曉平均破壞強度之玻璃基板自身切割出。 The test sheet 18 is at the same time as the glass substrate for which the average breaking strength is to be known. The produced glass substrate is processed and produced. Glass substrates produced at the same time (eg, glass substrates of the same batch) can be considered to have the same degree of damage to the surface. Further, the test sheet 18 can also be cut out from the glass substrate itself which is known to have an average breaking strength.

試驗片材18於無外力之自然狀態下形成為矩形狀。試驗片材18之短邊長度為100mm,試驗片材18之長邊長度為150mm。 The test sheet 18 is formed in a rectangular shape in a natural state without external force. The length of the short side of the test sheet 18 was 100 mm, and the length of the long side of the test sheet 18 was 150 mm.

上側支持盤14支持試驗片材18。上側支持盤14之支持面14a為朝下之平坦面。於上側支持盤14之支持面14a例如利用膠帶等將試驗片材18之一短邊部加以固定。 The upper side support disk 14 supports the test sheet 18. The support surface 14a of the upper side support disk 14 is a flat surface facing downward. The support surface 14a of the upper support tray 14 is fixed to the short side portion of the test sheet 18 by, for example, an adhesive tape.

下側支持盤16與上側支持盤14同樣地支持試驗片材18。下側支持盤16之支持面16a為朝上之平坦面。於下側支持盤16之支持面16a載置矩形狀之試驗片材18之另一短邊部,利用靜止摩擦力加以固定。為了防止試驗片材18之位置偏移,而於下側支持盤16之支持面16a設置與試驗片材18之另一短邊部抵接之止動部17。 The lower support tray 16 supports the test sheet 18 in the same manner as the upper support tray 14. The support surface 16a of the lower side support tray 16 is a flat surface facing upward. The other short side portion of the rectangular test piece 18 is placed on the support surface 16a of the lower support tray 16 and fixed by static friction. In order to prevent the positional deviation of the test piece 18, the stopper portion 17 abutting against the other short side portion of the test piece 18 is provided on the support surface 16a of the lower side support disk 16.

該彎曲試驗裝置10中,首先,作業人員對相互平行之上側支持盤14之支持面14a與下側支持盤16之支持面16a之間之間隔D進行調整,而使於上側支持盤14與下側支持盤16之間彎曲之試驗片材18產生特定之拉伸應力。 In the bending test apparatus 10, first, the operator adjusts the interval D between the support surface 14a of the upper side support disk 14 and the support surface 16a of the lower support disk 16 so as to be on the upper support disk 14 and the lower side. The test sheet 18 bent between the side support disks 16 produces a specific tensile stress.

於試驗片材18之彎曲部之頂端(圖8中為試驗片材18之右端)產生之拉伸應力σ可基於下述式(2)算出。 The tensile stress σ generated at the tip end of the bent portion of the test sheet 18 (the right end of the test sheet 18 in Fig. 8) can be calculated based on the following formula (2).

σ=A×E×t/(D-t)‧‧‧(2) σ=A×E×t/(D-t)‧‧‧(2)

上述式(2)中,A為本試驗中固有之常數(1.198),E為試驗片材18之拉伸彈性模數,t為試驗片材18之厚度。由式(2)明瞭,間隔D(D>2×t)越窄,則拉伸應力σ越大。 In the above formula (2), A is a constant (1.198) inherent in the test, E is a tensile elastic modulus of the test sheet 18, and t is the thickness of the test sheet 18. It is clear from the formula (2) that the narrower the interval D (D>2×t), the larger the tensile stress σ.

繼而,作業人員於維持間隔D之狀態下,使相對於上側支持盤14之下側支持盤16之位置向特定方向移動1次。移動速度為10mm/s,移動距離為100mm,移動方向為與試驗片材18之短邊垂直之方向。 Then, the operator moves the position of the support tray 16 on the lower side of the upper support tray 14 in the specific direction one time while maintaining the interval D. The moving speed was 10 mm/s, the moving distance was 100 mm, and the moving direction was a direction perpendicular to the short side of the test sheet 18.

如此,由作業人員檢查於上側支持盤14與下側支持盤16之間彎曲之試驗片材18上是否形成裂縫。是否形成裂縫係利用檢測有無於形成裂縫時產生之AE(Acoustic Emission,聲波發射)波之AE感測器進行確認。 In this manner, whether or not a crack is formed on the test sheet 18 bent between the upper support tray 14 and the lower support tray 16 is checked by an operator. Whether or not the crack is formed is confirmed by an AE sensor that detects the presence or absence of an AE (Acoustic Emission) wave generated when the crack is formed.

於試驗片材18上未形成裂縫之情形時,作業人員將相互平行之上側支持盤14之支持面14a與下側支持盤16之支持面16a之間之間隔D縮窄。藉此,於上側支持盤14與下側支持盤16之間彎曲之試驗片材18產生高於前次之拉伸應力。 When the crack is not formed on the test sheet 18, the operator narrows the interval D between the support surface 14a of the upper side support disk 14 and the support surface 16a of the lower support disk 16 in parallel with each other. Thereby, the test sheet 18 bent between the upper side support tray 14 and the lower side support tray 16 generates higher tensile stress than the previous one.

繼而,作業人員於維持間隔D之狀態下,使相對於上側支持盤14之下側支持盤16之位置發生移動,檢查於上側支持盤14與下側支持盤16之間彎曲之試驗片材18上是否形成裂縫。分階段縮窄間隔D而分階段增強對試驗片材18施加之拉伸應力σ,直至試驗片材18上形成裂縫,藉此得知試驗片材18之破壞強度。試驗片材18破裂時之拉伸應力σ係作為破壞強度使用。 Then, the operator moves the position relative to the lower side support tray 16 of the upper support tray 14 while maintaining the interval D, and inspects the test sheet 18 bent between the upper support tray 14 and the lower support tray 16 Whether a crack is formed on it. The tensile stress σ applied to the test sheet 18 was stepwisely narrowed in stages, and cracks were formed on the test sheet 18, whereby the breaking strength of the test sheet 18 was known. The tensile stress σ when the test sheet 18 is broken is used as the breaking strength.

5片試驗片材18之破壞強度之平均值係作為5片試驗片材18之平均破壞強度使用。 The average value of the breaking strength of the five test sheets 18 was used as the average breaking strength of the five test sheets 18.

其次,對具有樹脂層之複合體之平均破壞強度之測定方法進行說明。於存在樹脂層之情形時亦與不存在樹脂層之情形同樣地使用圖8所示之彎曲試驗裝置,進行彎曲試驗以使於玻璃基板之與樹脂層結合之主面產生拉伸應力。於玻璃基板之主面之彎曲部之頂端產生之拉伸應力σ可根據下述式(3)算出。 Next, a method of measuring the average fracture strength of a composite having a resin layer will be described. In the case where the resin layer was present, the bending test apparatus shown in Fig. 8 was used in the same manner as in the absence of the resin layer, and a bending test was performed to cause tensile stress on the main surface of the glass substrate to which the resin layer was bonded. The tensile stress σ generated at the tip end of the curved portion of the main surface of the glass substrate can be calculated according to the following formula (3).

σ=A×E×t/(D'-t)‧‧‧(3) σ=A×E×t/(D'-t)‧‧‧(3)

上述式(3)中,A為本試驗中固有之常數(1.198),E為玻璃基板之拉伸彈性模數,t為玻璃基板之厚度,D'為由「D'=D-2×u」式所算出之值。u表示樹脂層之厚度。由於樹脂層之存在,玻璃基板之上端與下端之間隔較間隔D短2×u之量。再者,因樹脂層之存在而產生之 玻璃基板之中性面之位移量為玻璃基板厚度t之5%以下,幾乎不會對拉伸應力σ之計算結果造成影響,因此可忽視。所謂中性面係拉伸應力或壓縮應力均未產生之面,於不存在樹脂層之情形時為玻璃基板之板厚方向中心面。中性面之位移量可採用材料力學中通常之公式算出。玻璃基板破裂時之拉伸應力σb係作為破壞強度使用。 In the above formula (3), A is a constant (1.198) inherent in the test, E is a tensile elastic modulus of the glass substrate, t is the thickness of the glass substrate, and D' is "D'=D-2×u The value calculated by the formula. u represents the thickness of the resin layer. Due to the presence of the resin layer, the distance between the upper end and the lower end of the glass substrate is shorter than the interval D by 2 x u. Further, the amount of displacement of the neutral surface of the glass substrate due to the presence of the resin layer is 5% or less of the thickness t of the glass substrate, and the influence of the calculation result of the tensile stress σ is hardly affected, so that it can be ignored. The neutral surface is a surface where neither tensile stress nor compressive stress is generated, and in the case where the resin layer is not present, it is the center plane in the thickness direction of the glass substrate. The displacement of the neutral plane can be calculated by the usual formula in material mechanics. The tensile stress σ b when the glass substrate is broken is used as the breaking strength.

使用上述裝置,算出由補強層(樹脂層)之存在所實現之玻璃基板之平均破壞強度之提高率。該提高率係以不存在補強層之情形時之玻璃基板之平均破壞強度作為基準(100%)時之值。作為例1~3中之基準之平均破壞強度,使用玻璃基板X之平均破壞強度(154MPa)。 Using the above apparatus, the rate of improvement of the average fracture strength of the glass substrate achieved by the presence of the reinforcing layer (resin layer) was calculated. The increase rate is a value obtained by using the average fracture strength of the glass substrate in the absence of the reinforcing layer as a reference (100%). As the average breaking strength of the criteria in Examples 1 to 3, the average breaking strength (154 MPa) of the glass substrate X was used.

又,例1~3中所準備之複合體之可撓性係藉由複合體之撓曲剛度之上升率進行評估。此處,所謂「撓曲剛度之上升率」意指以不存在樹脂層之情形時之玻璃基板之撓曲剛度作為基準時之複合體之撓曲剛度之上升率。撓曲剛度可採用構造力學中通常之公式算出。撓曲剛度之上升率越低,則可撓性越佳。 Further, the flexibility of the composite prepared in Examples 1 to 3 was evaluated by the rate of increase in the flexural rigidity of the composite. Here, the "increased rate of flexural rigidity" means the rate of increase in the flexural rigidity of the composite when the flexural rigidity of the glass substrate in the absence of the resin layer is used as a reference. The flexural stiffness can be calculated using the usual formula in structural mechanics. The lower the rate of increase in flexural rigidity, the better the flexibility.

將評估結果示於表1。 The evaluation results are shown in Table 1.

如表1之例1所示,確認本發明之複合體展現出所期望之效果。又,撓曲剛度未太上升,因此可撓性未下降。 As shown in Example 1 of Table 1, it was confirmed that the composite of the present invention exhibited the desired effect. Also, the flexural rigidity does not rise too much, so the flexibility does not decrease.

另一方面,不滿足本發明之要件之例2及3未獲得所期望之效 果。 On the other hand, Examples 2 and 3 which do not satisfy the requirements of the present invention do not achieve the desired effect. fruit.

以上說明了複合體等之實施形態,但本發明並不限定於上述實施形態。本發明可於申請專利範圍中所記載之主旨之範圍內加以變化或改良。 Although the embodiment of the composite or the like has been described above, the present invention is not limited to the above embodiment. The present invention can be modified or improved within the scope of the gist of the invention as set forth in the appended claims.

詳細地且參照特定之實施態樣說明了本發明,但業者明瞭,可於不脫離本發明之精神與範圍之情況下施加各種變更或修正。本申請案係基於2014年6月16日提出申請之日本專利申請(日本專利特願2014-123308)者,將其內容以參照之形式組入本說明書中。 The present invention has been described in detail with reference to the specific embodiments thereof, and it is understood that various changes or modifications may be made without departing from the spirit and scope of the invention. The present application is based on Japanese Patent Application No. 2014-123308, filed on Jun.

2‧‧‧複合體 2‧‧‧Compound

4‧‧‧玻璃基板 4‧‧‧ glass substrate

6‧‧‧樹脂層 6‧‧‧ resin layer

8‧‧‧微小裂縫 8‧‧‧Small cracks

d‧‧‧微小裂縫之深度 d‧‧‧Deep crack depth

df‧‧‧樹脂距離玻璃基板表面之深入深度 d f ‧‧‧Deep depth of resin from the surface of the glass substrate

W‧‧‧微小裂縫之寬度 W‧‧‧The width of tiny cracks

Claims (5)

一種複合體,其係具備表面存在微小裂縫之玻璃基板、與配置於上述玻璃基板上之樹脂層者,且上述樹脂層之樹脂深入至上述微小裂縫內部之至少一部分,上述樹脂距離上述玻璃基板表面之深入深度df相對於上述微小裂縫之深度d的比(df/d)、與上述樹脂層之斷裂伸長率TE(%)、及上述樹脂層之降伏應力σS(MPa)的乘積(比(df/d)×斷裂伸長率TE×降伏應力σS)為400MPa‧%以上,並且上述樹脂層之拉伸彈性模數Eresin為1.0GPa以上。 A composite body comprising a glass substrate having a micro crack on its surface and a resin layer disposed on the glass substrate, wherein a resin of the resin layer penetrates at least a portion of the inside of the micro crack, and the resin is away from the surface of the glass substrate The ratio of the depth d f to the depth d of the minute crack (d f /d), the elongation at break TE (%) of the resin layer, and the relief stress σ S (MPa) of the resin layer ( ratio (d f / d) × elongation at break TE × yield stress σ S) or more 400MPa‧%, the resin layer and a tensile modulus of elasticity E resin is 1.0GPa or more. 如請求項1之複合體,其中上述玻璃基板之平均厚度為10~200μm。 The composite of claim 1, wherein the glass substrate has an average thickness of 10 to 200 μm. 如請求項1或2之複合體,其中上述樹脂層之平均厚度為10~100μm。 The composite of claim 1 or 2, wherein the resin layer has an average thickness of 10 to 100 μm. 如請求項1至3中任一項之複合體,其中上述樹脂層包含聚醯亞胺。 The composite according to any one of claims 1 to 3, wherein the above resin layer comprises polyimine. 一種電子裝置,其包含如請求項1至4中任一項之複合體、與形成於上述複合體之玻璃基板上之元件。 An electronic device comprising the composite according to any one of claims 1 to 4, and an element formed on the glass substrate of the composite.
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