TW201541084A - Universal testing device - Google Patents

Abstract

A universal testing device is used for testing an object under test. The universal testing device comprises a carrier plate, a pressurizing head, and a plurality of elastic positioning members. The carrier plate is provided with a testing groove with a probe installed therein. The pressurizing head is movably provided on the carrier plate and has a pressing block capable of approaching the testing groove and pressurizing the object under test in correspondence to the movement of the pressurizing head. The elastic positioning member is provided on the carrier plate and surrounds close to the outer periphery of the testing groove. Accordingly, the elastic positioning member is not only to prevent a thinner object under test from being located out of the testing groove due to external force, but also is not to make impact on the pressing block to press the object under test in the testing process. Therefore, the pressing block can be used universally without the need to individually design, hence, it is easy for use.

Description

Universal test device

The invention relates to a testing device, in particular to a structural improvement of a testing device, which is provided with a plurality of elastic positioning members near the test slot for testing and fixing the object to be tested, to help locate the position of the object to be tested.

For the conventional measuring socket, please refer to FIG. 1 , wherein a test slot 72 is disposed in the center of the carrying tray 71 to accommodate a test object 73. The bottom of the test slot 72 is provided with a plurality of probes 74, and the test slot 72 is The depth is substantially equivalent to the thickness of the object to be tested 73. Therefore, when the test is performed, the pressing block 75 pushes the object 73 downward to push the pin (not shown) of the object to be tested 73 to the probe 74 of the test slot 72 to electrically connect the object to be tested. 73 for each test and test whether the test object 73 can operate normally. However, with the development of packaging technology, more and more objects to be tested, especially system in package (SiP) modules, are becoming thinner and thinner. Therefore, the depth of the test slot 72 corresponds to the test. The ground is designed to be thinner and thinner, making the object 73 difficult to position and easily escaping out of the test slot 72 due to external force.

In order to prevent the above problem from occurring, another method is to increase the depth of the test slot 72 to prevent the object to be tested 73 from running out of the test slot 72. Please refer to FIG. In this way, in order to enable the pressing block 75 to smoothly push the object to be tested 73 to electrically connect the object to be tested 73 to the probe 74, the size of the pressing block 75 must be smaller than the test slot 72. At the same time, in order to prevent the object 73 from being tested The problem of excessive pressure is that the size and weight of the pressing block 75 need to be specially designed and cannot be integrally applied, which is inconvenient.

In view of the above, the main object of the present invention is to provide a testing device capable of accurately positioning a thin object to be tested, and secondly, a pressing block for pressing the object to be tested can be integrally applied to different sizes of the object to be tested. Increase the convenience of use.

In order to achieve the above object, the present invention provides a universal package test apparatus for testing a test object, the test apparatus comprising a carrier disk, a pressurizing head and a plurality of elastic positioning members. The central recess of the carrying tray is provided with a test slot, and the test slot is provided with at least one probe. The pressing head is movably disposed above the carrier tray and movable between a pressing position and an exiting position to respectively approach or away from the test slot, and a surface of the pressing head is connected with a pressing block to pressurize the test head Things. A plurality of elastic positioning members are disposed on the carrier tray and surround and abut the outer circumference of the test slot.

Thereby, the elastic positioning member disposed near the outer periphery of the test slot can help locate the object to be tested, and even if the thickness of the object to be tested is thin, the object to be tested is not easily escaping from the test slot due to the influence of the external force or the movement of the carrier disk. outer.

1‧‧‧Testing device

10‧‧‧ Carrying tray

11‧‧‧Test slot

12‧‧‧floor

13‧‧‧ side wall

14‧‧‧ accommodating space

15‧‧‧ probe

16‧‧‧Installation holes

20‧‧‧ Pressing head

21‧‧‧Clamps

30‧‧‧Flexible positioning parts

31‧‧‧ head

32‧‧‧ Spring

40‧‧‧Connecting parts

71‧‧‧ Carrying tray

72‧‧‧ test slot

73‧‧‧Test object

74‧‧‧ probe

75‧‧‧ Pressurized block

Figure 1 is a schematic diagram of the use of a conventional package test device.

Figure 2 is a schematic view showing the use of another conventional package test device.

Figure 3 is a side elevational view of a package testing apparatus in accordance with a preferred embodiment of the present invention.

Figure 4 is a perspective view of a carrier disk in accordance with a preferred embodiment of the present invention.

Fig. 5 is a cross-sectional view taken along line 5-5 of Fig. 4;

In order to better understand the features of the present invention, the present invention provides a preferred embodiment and is described below in conjunction with the drawings. Please refer to Figures 3 through 5. The universal test device 1 of the present invention can be used to test a test object. In this embodiment, the test object is a SiP module (System in Package (SiP), which can also be a SoC module (System on Chip, SoC). Or other forms of the object to be tested are not limited to this embodiment. The main components of the universal testing device 1 of the present invention comprise a carrier 10, a pressing head 20 and a plurality of elastic positioning members 30 (six in the present embodiment). The structure of each element and the relationship between them are as follows: Referring to FIG. 4, a bottom plate 12 is defined in the central recess of the carrier plate 10. A peripheral wall of the top surface of the bottom plate 12 is provided with a side wall 13 to define an accommodating space 14 therein. A test slot 11 is further recessed in the center of the bottom plate 12. The bottom of the test slot 11 is provided with a plurality of probes 15 for testing various objects to be tested. In addition, the bottom plate 12 is further recessed with six mounting holes 16 and is closely arranged on the outer circumference of the test slot 11; in other embodiments, the test slot may also be recessed at other positions of the bottom plate 12 without limitation The center of the bottom plate 12.

The pressing head 20 is oppositely disposed above the carrying tray 10 and pivotally connected to the connecting member 40 at one end thereof, as shown in FIG. 3, and the connecting member 40 is connected to the carrying tray 10, so that the pressing head 20 can be pressurized. The position is moved between a position and an exit position to approach or move away from the test slot 11, respectively. Further, a pressing block 21 is attached to the surface of the pressing head 20. When the pressing head 20 is pivoted to the pressing position, the pressing block 21 enters the accommodating space 14 with the pressing head 20.

Referring to FIG. 5 , the six elastic positioning members 30 are respectively disposed in the six mounting holes 16 , and each of the elastic positioning members 30 includes a head 31 and a spring 32 , and the two ends of the spring 32 respectively abut the mounting holes. The bottom of the 16 and the bottom of the head 31. The head 31 is used to abut the pressing block 21 when pressed When the block 21 does not abut the head portion 31, at least a portion of the head portion 31 may protrude outside the mounting hole 16. Further, the area formed by the elastic positioning members 30 is smaller than the area of the surface of the pressing block 21 for pressurizing the object to be tested.

In use, when the test is to be performed, the object to be tested is first placed above the test slot 11, and then the pressurizing head 20 is pivoted from the exit position to the pressurized position. At this time, the pressing block 21 enters the accommodating space 14 and abuts against the elastic positioning members 30 and the object to be tested. The pressing block 21 compresses the elastic positioning member 30 to cause the head 31 to immerse into the mounting hole 16 and pushes the waiting portion 16 The test object has its pins in contact with the probes 15 for various tests of the test object. Since the elastic positioning members 30 are disposed adjacent to the outer periphery of the test slot 11, and the head portions 31 of the elastic positioning members 30 are at least partially protruded from the mounting holes 16 when they are not pressurized, The positioning effect is good, so even if the thickness of the object to be tested is thin, the object to be tested is not easily escaping from the outside of the test slot 11 due to the influence of the external force or the movement of the carrier disk 10. On the other hand, during the whole test process, when the pressing block 21 is pressed down, the object to be tested and the elastic positioning member 30 are pressed by the pressing block 21 while moving downward until the pressing block 21 abuts against the bottom plate 12 and stops. Therefore, there is no problem that the compact 21 excessively presses the object to be tested. At this time, since the elastic positioning member 30 is completely immersed in the mounting hole 16, it does not affect the pressing of the pressing block 21 against the object to be tested. Therefore, the pressing block 21 can be integrally applied without being individually designed for different thicknesses of the object to be tested. , can achieve the purpose of convenient use.

It should be noted that those skilled in the art can increase or decrease the number of the elastic positioning members 30 or change the arrangement position according to actual needs. The pressing head 20 can also be directly pivotally connected to the carrier 10 at one end thereof, or can be driven by other driving devices (not shown) to drive the pressing head 20 to the pressing position and the leaving position. Intercropping moves up and down.

Finally, it must be stated again that the present invention is disclosed in the foregoing embodiments. The constituent elements are merely illustrative and are not intended to limit the scope of the present invention. Other structural changes that are easily conceivable, or alternative changes with other equivalent elements, are also covered by the scope of the patent application.

10‧‧‧ Carrying tray

11‧‧‧Test slot

12‧‧‧floor

13‧‧‧ side wall

14‧‧‧ accommodating space

15‧‧‧ probe

16‧‧‧Installation holes

30‧‧‧Flexible positioning parts

Claims (7)

A universal testing device for testing an object to be tested, the testing device comprising: a carrier tray recessed with a test slot, the test slot is provided with a plurality of probes; and a pressing head is movably disposed on the Above the carrier plate, movable between a pressing position and an exiting position to respectively approach or away from the test slot, the pressing head surface is connected with a pressing block to pressurize the object to be tested; a plurality of elastic positioning members are arranged The carrier disk is disposed around the periphery of the test slot for positioning the object to be tested. The universal testing device of claim 1, wherein the carrier tray is further recessed with a plurality of mounting holes, each of the elastic positioning members being respectively received in each of the mounting holes. The universal testing device of claim 2, wherein each of the elastic positioning members has a head and a spring, and the two ends of the spring respectively abut the bottom of the mounting hole and the bottom of the head, and the elastic positioning At least a portion of the head of the piece protrudes out of the mounting hole when not pressurized. The universal testing device of claim 1, further comprising a connecting member pivotally connected to the connecting member at one end thereof, and the connecting member is connected to the carrying tray. The universal testing device of claim 1, wherein the pressing head is pivotally connected to the carrier tray at one end thereof. The universal testing device of claim 1, wherein the probes are disposed on a bottom surface of the test slot. The universal testing device of claim 1, wherein an area of the surface of the pressing block for pressing the object to be tested is larger than an area formed by the elastic positioning members.