TW201510179A - An etching additive for silicon wafer - Google Patents
An etching additive for silicon wafer Download PDFInfo
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- TW201510179A TW201510179A TW102131774A TW102131774A TW201510179A TW 201510179 A TW201510179 A TW 201510179A TW 102131774 A TW102131774 A TW 102131774A TW 102131774 A TW102131774 A TW 102131774A TW 201510179 A TW201510179 A TW 201510179A
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本發明係有關太陽能用矽晶片蝕刻所添加的鹼性蝕刻添加劑之組成及其簡易的製備方法。 The present invention relates to a composition of an alkaline etching additive added by etching a tantalum wafer for solar energy and a simple preparation method thereof.
太陽能電池的作用機制乃是利用材料的光電效應,將太陽光的能量直接轉換成電能。在太陽能電池材料製程中,通常會使用半導體矽晶片作為基板,來源可能為單晶矽晶片、多晶矽晶片,以及非晶矽晶片;然而非晶矽晶片的效率太低、壽命較短,所以較少使用。多晶矽晶片節理易破碎、轉換效率較低,但因成本較低廉,多用在較低功率的電力系統上。而目前則是以單晶矽晶片較為普遍,其轉換效率較高。 The mechanism of action of solar cells is to use the photoelectric effect of the material to directly convert the energy of sunlight into electrical energy. In the process of solar cell materials, semiconductor germanium wafers are generally used as substrates, and the sources may be single crystal germanium wafers, polycrystalline germanium wafers, and amorphous germanium wafers; however, amorphous germanium wafers are less efficient and have a shorter lifetime, so less use. Polycrystalline germanium wafers are easy to break and have low conversion efficiency, but they are used in lower power systems because of their lower cost. At present, single crystal germanium wafers are more common, and their conversion efficiency is higher.
太陽光能輻射出不同頻率的電磁波,照射在半導體矽晶片上,光子與半導體中的自由電子會相互作用而產生電流。但光電效應取決於光的頻率而非光的強度,只有頻率超過可產生光電效應的臨界值時,電流才會產生。所以為了提高太陽能電池光電轉換的效率,通常會利用蝕刻劑來處理矽晶片,目的在於增加其表面的粗糙度以及低反射率,使太 陽光照射在矽晶片上時能減少反射,進而降低能量的散失。 Solar energy can radiate electromagnetic waves of different frequencies and illuminate the semiconductor germanium wafer. Photons interact with free electrons in the semiconductor to generate current. However, the photoelectric effect depends on the frequency of the light rather than the intensity of the light, and the current is generated only when the frequency exceeds a critical value that produces a photoelectric effect. Therefore, in order to improve the efficiency of photoelectric conversion of solar cells, an etchant is usually used to process the germanium wafer, in order to increase the roughness of the surface and the low reflectance, so that When the sun shines on the germanium wafer, it reduces reflections and reduces energy loss.
而此專利針對單晶矽晶片蝕刻,其蝕刻劑通常為鹼性,以往的例子為異丙醇加上氫氧化鉀水溶液,其會破壞矽晶片表面結構並作異向性蝕刻,另外再加上一種添加劑,進一步地使矽晶片表面形成金字塔狀的凹凸結構。而此添加劑的組成則是造成形狀大小及表面均勻度的關鍵。 While this patent is directed to the etching of single crystal germanium wafers, the etchant is usually alkaline. The previous example is isopropyl alcohol plus an aqueous solution of potassium hydroxide, which destroys the surface structure of the germanium wafer and is anisotropically etched, plus An additive further forms a pyramid-like relief structure on the surface of the tantalum wafer. The composition of this additive is the key to shape and surface uniformity.
WO 2007/129555號提出一種半導體矽基板的製造方法及蝕刻劑,其組成含有選自一分子至少具有一個羧基,碳數1以上、12以下之羧酸或其鹽類的鹼性蝕刻劑,能將半導體基板蝕刻,在表面形成凹凸結構,達到降低矽基板表面反射率的效果。 WO 2007/129555 proposes a method for producing a semiconductor tantalum substrate and an etchant comprising a basic etchant selected from the group consisting of a carboxylic acid having at least one carboxyl group, a carbon number of 1 or more and 12 or less, or a salt thereof. The semiconductor substrate is etched to form an uneven structure on the surface, and the effect of reducing the reflectance of the surface of the ruthenium substrate is achieved.
TW 2013/22326號提出一種處理矽晶圓的方法,用一含有纖維素醚類物質的處理液來潤濕矽晶圓的表面,並將表面織構化,增加表面粗糙度,同樣達到耦合太陽光的目的。 TW 2013/22326 proposes a method for treating tantalum wafers by using a treatment liquid containing a cellulose ether to wet the surface of the tantalum wafer, texturing the surface, increasing the surface roughness, and also coupling the sun. The purpose of light.
WO 2010/052545號描述一種太陽能矽晶片的制絨蝕刻技術,其中所採用到的蝕刻添加劑是利用聚乙二醇類並加入鹼類,利用加熱或靜置等待溶液分成兩相,取其較低濃度的一相來當作添加劑,處理過後的矽晶片表面呈現金字塔狀的凹凸結構。其缺失在於製備過程較為繁複,也必須多耗費等待分相的時間,且可能會因為藥液放置過久造成蝕刻品質的不穩定。 WO 2010/052545 describes a texturing etching technique for a solar tantalum wafer in which an etching additive is used by using a polyethylene glycol and adding a base, and the solution is divided into two phases by heating or standing, and the lower is taken. One phase of the concentration is used as an additive, and the surface of the treated tantalum wafer exhibits a pyramid-like uneven structure. The lack of it is that the preparation process is complicated, and it is necessary to spend more time waiting for phase separation, and the etching quality may be unstable due to the long-term placement of the liquid.
此專利係發明了一種應用在半導體矽晶片蝕刻上之鹼性蝕刻添加劑的組成,其可使在製備的過程中不需花費靜置等待其分相的時間、或加熱所造成能源的消耗,只需要將原物料加入純水均勻混合即可製備完成。 This patent discloses a composition of an alkaline etching additive applied to semiconductor germanium wafer etching, which can eliminate the need to wait for the phase separation time or the energy consumption caused by heating during the preparation process. The raw material needs to be uniformly mixed with pure water to be prepared.
在本發明之添加劑中,包含至少一組成選自於乙二醇醚類,另一組成選自於鹼類,其中該乙二醇醚類為選自乙二醇單甲醚、乙二醇單乙醚、乙二醇單丙醚、乙二醇單丁醚、乙二醇二甲醚、乙二醇二乙醚、乙二醇二丙醚、乙二醇二丁醚、二乙二醇單甲醚、二乙二醇單乙醚、二乙二醇單丙醚、二乙二醇單丁醚、二乙二醇二甲醚、二乙二醇二乙醚、二乙二醇二丙醚、二乙二醇二丁醚所成群之一種或兩種以上。該鹼類最佳為氫氧化鈉或氫氧化鉀。 In the additive of the present invention, at least one component is selected from the group consisting of glycol ethers, and the other component is selected from the group consisting of alkalis, wherein the glycol ethers are selected from the group consisting of ethylene glycol monomethyl ether and ethylene glycol. Ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, ethylene glycol dimethyl ether, ethylene glycol diethyl ether, ethylene glycol dipropyl ether, ethylene glycol dibutyl ether, diethylene glycol monomethyl ether , diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol monobutyl ether, diethylene glycol dimethyl ether, diethylene glycol diethyl ether, diethylene glycol dipropyl ether, diethylene One or more of a group of dibutyl ethers. The base is preferably sodium hydroxide or potassium hydroxide.
而此添加劑中,乙二醇醚類的重量組成比例為10~70%,最佳比例為15~50%;鹼類的重量組成比例為1~40%,最佳比例為3~20%,其餘為純水。 In this additive, the weight composition ratio of the glycol ethers is 10 to 70%, and the optimum ratio is 15 to 50%; the weight composition ratio of the alkalis is 1 to 40%, and the optimum ratio is 3 to 20%. The rest is pure water.
然而,雖然本專利能簡易地製取此鹼性蝕刻添加劑,但其蝕刻的效果品質並不會因此而降低,將半導體矽基板浸泡於含有上述添加劑的蝕刻液中,特徵在於經過處理後的矽晶片,其表面會形成均勻排列的金字塔狀凸起,是理想的蝕刻圖形。 However, although this patent can easily prepare the alkaline etching additive, the quality of the etching effect is not lowered, and the semiconductor germanium substrate is immersed in the etching liquid containing the above additive, characterized by the treated germanium. The wafer, which has a uniformly arranged pyramid-like projection on its surface, is an ideal etched pattern.
在本專利的蝕刻液中加入至少包含一種或兩種 以上的乙二醇醚類,目的在於其與鹼類混合後,當作添加劑加入於蝕刻液中,能夠使得矽晶片表面形成適當大小的金字塔狀凸起,如第一圖、第二圖所示。若要使凸起的結構較為完整、均勻,則可以加入少許低泡性的界面活性劑作為調配。 Adding at least one or two in the etching solution of this patent The above glycol ethers are intended to be added to the etching solution as an additive after being mixed with a base, so that a pyramid-shaped projection of an appropriate size can be formed on the surface of the crucible wafer, as shown in the first and second figures. . In order to make the structure of the protrusion more complete and uniform, a little low foaming surfactant can be added as a blending.
第一圖係實施例一利用OLYMPUS-BXFM光學顯微鏡以倍率為100倍拍攝之結果。 The first figure is the result of taking a magnification of 100 times using an OLYMPUS-BXFM optical microscope.
第二圖係實施例二利用OLYMPUS-BXFM光學顯微鏡以倍率為100倍拍攝之結果。 The second figure is the result of the second embodiment using an OLYMPUS-BXFM optical microscope at a magnification of 100 times.
下列選出兩個實施例對此專利的操作方法作介紹:實施例一之蝕刻液組成為重量百分比30%異丙醇,25% KOH,44%水,1%添加劑;其中添加劑成分為30%二乙二醇單甲醚,10% KOH,60%水。將矽晶片剪取適當大小,浸泡在蝕刻液中加熱至75~85℃約20分鐘,再用純水洗淨矽晶片並擦乾,接著利用光學顯微鏡照相觀察處理後之晶片表面,顯微鏡拍攝結果如圖一所示,其放大倍率為100倍。 The following two examples are selected to describe the operation method of this patent: the etching solution of the first embodiment is 30% by weight of isopropyl alcohol, 25% KOH, 44% water, 1% additive; wherein the additive component is 30% Ethylene glycol monomethyl ether, 10% KOH, 60% water. The silicon wafer is cut to an appropriate size, immersed in an etching solution and heated to 75-85 ° C for about 20 minutes, and then the silicon wafer is washed with pure water and dried, and then the surface of the processed wafer is observed by an optical microscope, and the result of the microscope is taken. As shown in Figure 1, the magnification is 100 times.
實施例二蝕刻液組成為重量百分比30%異丙醇,25% KOH,43.5%水,1.5%添加劑;其中添加劑成分 為25%乙二醇二乙醚,15% KOH,60%水。將矽晶片剪取適當大小,浸泡在蝕刻液中加熱至75~85℃約20分鐘,再用純水洗淨矽晶片並擦乾,接著利用光學顯微鏡照相觀察處理後之晶片表面,顯微鏡拍攝結果如圖二所示,其放大倍率為100倍。 The etchant composition of the second embodiment is 30% by weight of isopropyl alcohol, 25% KOH, 43.5% water, 1.5% additive; wherein the additive component It is 25% ethylene glycol diethyl ether, 15% KOH, 60% water. The silicon wafer is cut to an appropriate size, immersed in an etching solution and heated to 75-85 ° C for about 20 minutes, and then the silicon wafer is washed with pure water and dried, and then the surface of the processed wafer is observed by an optical microscope, and the result of the microscope is taken. As shown in Figure 2, the magnification is 100 times.
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