TW201308630A - Thick film paste containing bismuth-tellurium-oxide and its use in the manufacture of semiconductor devices - Google Patents
Thick film paste containing bismuth-tellurium-oxide and its use in the manufacture of semiconductor devices Download PDFInfo
- Publication number
- TW201308630A TW201308630A TW101117589A TW101117589A TW201308630A TW 201308630 A TW201308630 A TW 201308630A TW 101117589 A TW101117589 A TW 101117589A TW 101117589 A TW101117589 A TW 101117589A TW 201308630 A TW201308630 A TW 201308630A
- Authority
- TW
- Taiwan
- Prior art keywords
- thick film
- paste composition
- weight percent
- weight
- film paste
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract description 8
- 238000004519 manufacturing process Methods 0.000 title description 6
- 239000000203 mixture Substances 0.000 claims abstract description 126
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 43
- 229910052751 metal Inorganic materials 0.000 claims abstract description 21
- 239000002184 metal Substances 0.000 claims abstract description 21
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 18
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 63
- 229910052709 silver Inorganic materials 0.000 claims description 57
- 239000004332 silver Substances 0.000 claims description 57
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 42
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 34
- 239000000843 powder Substances 0.000 claims description 32
- 238000010304 firing Methods 0.000 claims description 19
- 229910015902 Bi 2 O 3 Inorganic materials 0.000 claims description 16
- 239000000654 additive Substances 0.000 claims description 11
- -1 B 2 O 3 Inorganic materials 0.000 claims description 10
- 230000000996 additive effect Effects 0.000 claims description 9
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 8
- 229910018068 Li 2 O Inorganic materials 0.000 claims description 4
- ONLCZUHLGCEKRZ-UHFFFAOYSA-N cerium(3+) lanthanum(3+) oxygen(2-) Chemical compound [O--].[O--].[O--].[La+3].[Ce+3] ONLCZUHLGCEKRZ-UHFFFAOYSA-N 0.000 claims description 4
- 229910044991 metal oxide Inorganic materials 0.000 claims description 4
- 150000004706 metal oxides Chemical class 0.000 claims description 4
- 239000003550 marker Substances 0.000 claims description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
- 229910006404 SnO 2 Inorganic materials 0.000 claims description 2
- 150000002736 metal compounds Chemical class 0.000 claims description 2
- 229910016336 Bi—Te—O Inorganic materials 0.000 claims 1
- 239000000758 substrate Substances 0.000 description 18
- 239000011521 glass Substances 0.000 description 17
- 238000000034 method Methods 0.000 description 15
- 238000009792 diffusion process Methods 0.000 description 13
- 239000002245 particle Substances 0.000 description 12
- 239000000463 material Substances 0.000 description 10
- 239000010949 copper Substances 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 7
- 239000004615 ingredient Substances 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000000523 sample Substances 0.000 description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 6
- 238000001035 drying Methods 0.000 description 6
- 238000002156 mixing Methods 0.000 description 6
- 229910000679 solder Inorganic materials 0.000 description 6
- 229910052715 tantalum Inorganic materials 0.000 description 6
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 6
- 239000003795 chemical substances by application Substances 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 5
- 238000007650 screen-printing Methods 0.000 description 5
- 239000004094 surface-active agent Substances 0.000 description 5
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 5
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 4
- 239000002318 adhesion promoter Substances 0.000 description 4
- POULHZVOKOAJMA-UHFFFAOYSA-N dodecanoic acid Chemical compound CCCCCCCCCCCC(O)=O POULHZVOKOAJMA-UHFFFAOYSA-N 0.000 description 4
- 229910000449 hafnium oxide Inorganic materials 0.000 description 4
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 4
- IPCSVZSSVZVIGE-UHFFFAOYSA-N hexadecanoic acid Chemical compound CCCCCCCCCCCCCCCC(O)=O IPCSVZSSVZVIGE-UHFFFAOYSA-N 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 229910010272 inorganic material Inorganic materials 0.000 description 4
- 239000011147 inorganic material Substances 0.000 description 4
- 239000011574 phosphorus Substances 0.000 description 4
- 229910052698 phosphorus Inorganic materials 0.000 description 4
- 229920001223 polyethylene glycol Polymers 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- 239000000155 melt Substances 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 238000007639 printing Methods 0.000 description 3
- 239000011734 sodium Substances 0.000 description 3
- OYHQOLUKZRVURQ-NTGFUMLPSA-N (9Z,12Z)-9,10,12,13-tetratritiooctadeca-9,12-dienoic acid Chemical compound C(CCCCCCC\C(=C(/C\C(=C(/CCCCC)\[3H])\[3H])\[3H])\[3H])(=O)O OYHQOLUKZRVURQ-NTGFUMLPSA-N 0.000 description 2
- WRIDQFICGBMAFQ-UHFFFAOYSA-N (E)-8-Octadecenoic acid Natural products CCCCCCCCCC=CCCCCCCC(O)=O WRIDQFICGBMAFQ-UHFFFAOYSA-N 0.000 description 2
- PAAZPARNPHGIKF-UHFFFAOYSA-N 1,2-dibromoethane Chemical compound BrCCBr PAAZPARNPHGIKF-UHFFFAOYSA-N 0.000 description 2
- LQJBNNIYVWPHFW-UHFFFAOYSA-N 20:1omega9c fatty acid Natural products CCCCCCCCCCC=CCCCCCCCC(O)=O LQJBNNIYVWPHFW-UHFFFAOYSA-N 0.000 description 2
- QSBYPNXLFMSGKH-UHFFFAOYSA-N 9-Heptadecensaeure Natural products CCCCCCCC=CCCCCCCCC(O)=O QSBYPNXLFMSGKH-UHFFFAOYSA-N 0.000 description 2
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 2
- 239000001856 Ethyl cellulose Substances 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- 239000005639 Lauric acid Substances 0.000 description 2
- 238000005481 NMR spectroscopy Methods 0.000 description 2
- 239000005642 Oleic acid Substances 0.000 description 2
- ZQPPMHVWECSIRJ-UHFFFAOYSA-N Oleic acid Natural products CCCCCCCCC=CCCCCCCCC(O)=O ZQPPMHVWECSIRJ-UHFFFAOYSA-N 0.000 description 2
- 235000021314 Palmitic acid Nutrition 0.000 description 2
- 229920003171 Poly (ethylene oxide) Polymers 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 2
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 239000006117 anti-reflective coating Substances 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 2
- 239000012964 benzotriazole Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
- 238000005136 cathodoluminescence Methods 0.000 description 2
- 235000015165 citric acid Nutrition 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- DOIRQSBPFJWKBE-UHFFFAOYSA-N dibutyl phthalate Chemical compound CCCCOC(=O)C1=CC=CC=C1C(=O)OCCCC DOIRQSBPFJWKBE-UHFFFAOYSA-N 0.000 description 2
- 235000014113 dietary fatty acids Nutrition 0.000 description 2
- FSCIDASGDAWVED-UHFFFAOYSA-N dimethyl hexanedioate;dimethyl pentanedioate Chemical compound COC(=O)CCCC(=O)OC.COC(=O)CCCCC(=O)OC FSCIDASGDAWVED-UHFFFAOYSA-N 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000000804 electron spin resonance spectroscopy Methods 0.000 description 2
- 229920001249 ethyl cellulose Polymers 0.000 description 2
- 235000019325 ethyl cellulose Nutrition 0.000 description 2
- 239000000194 fatty acid Substances 0.000 description 2
- 229930195729 fatty acid Natural products 0.000 description 2
- 150000004665 fatty acids Chemical class 0.000 description 2
- IPCSVZSSVZVIGE-UHFFFAOYSA-M hexadecanoate Chemical compound CCCCCCCCCCCCCCCC([O-])=O IPCSVZSSVZVIGE-UHFFFAOYSA-M 0.000 description 2
- 238000009616 inductively coupled plasma Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- QXJSBBXBKPUZAA-UHFFFAOYSA-N isooleic acid Natural products CCCCCCCC=CCCCCCCCCC(O)=O QXJSBBXBKPUZAA-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052744 lithium Inorganic materials 0.000 description 2
- WQEPLUUGTLDZJY-UHFFFAOYSA-N n-Pentadecanoic acid Natural products CCCCCCCCCCCCCCC(O)=O WQEPLUUGTLDZJY-UHFFFAOYSA-N 0.000 description 2
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 2
- ZQPPMHVWECSIRJ-KTKRTIGZSA-N oleic acid Chemical compound CCCCCCCC\C=C/CCCCCCCC(O)=O ZQPPMHVWECSIRJ-KTKRTIGZSA-N 0.000 description 2
- 235000021313 oleic acid Nutrition 0.000 description 2
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000011591 potassium Substances 0.000 description 2
- 229910052700 potassium Inorganic materials 0.000 description 2
- 238000010791 quenching Methods 0.000 description 2
- 230000000171 quenching effect Effects 0.000 description 2
- 229910052707 ruthenium Inorganic materials 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- TUNFSRHWOTWDNC-HKGQFRNVSA-N tetradecanoic acid Chemical compound CCCCCCCCCCCCC[14C](O)=O TUNFSRHWOTWDNC-HKGQFRNVSA-N 0.000 description 2
- 239000002562 thickening agent Substances 0.000 description 2
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000004846 x-ray emission Methods 0.000 description 2
- ZXUOFCUEFQCKKH-UHFFFAOYSA-N 12-methyltridecan-1-ol Chemical compound CC(C)CCCCCCCCCCCO ZXUOFCUEFQCKKH-UHFFFAOYSA-N 0.000 description 1
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 1
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 1
- HXDLWJWIAHWIKI-UHFFFAOYSA-N 2-hydroxyethyl acetate Chemical compound CC(=O)OCCO HXDLWJWIAHWIKI-UHFFFAOYSA-N 0.000 description 1
- MGANBONTQZDYTG-UHFFFAOYSA-N 5-(2-butoxyethoxy)-6-ethoxy-6-oxohexanoic acid Chemical compound CCCCOCCOC(C(=O)OCC)CCCC(O)=O MGANBONTQZDYTG-UHFFFAOYSA-N 0.000 description 1
- 229910001316 Ag alloy Inorganic materials 0.000 description 1
- 101710134784 Agnoprotein Proteins 0.000 description 1
- UDSFAEKRVUSQDD-UHFFFAOYSA-N Dimethyl adipate Chemical compound COC(=O)CCCCC(=O)OC UDSFAEKRVUSQDD-UHFFFAOYSA-N 0.000 description 1
- MUXOBHXGJLMRAB-UHFFFAOYSA-N Dimethyl succinate Chemical compound COC(=O)CCC(=O)OC MUXOBHXGJLMRAB-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229920000896 Ethulose Polymers 0.000 description 1
- 239000001859 Ethyl hydroxyethyl cellulose Substances 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910012258 LiPO Inorganic materials 0.000 description 1
- 238000004813 Moessbauer spectroscopy Methods 0.000 description 1
- 229910001260 Pt alloy Inorganic materials 0.000 description 1
- 229910021607 Silver chloride Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910003077 Ti−O Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 239000006071 cream Substances 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- BNMYXGKEMMVHOX-UHFFFAOYSA-N dimethyl butanedioate;dimethyl pentanedioate Chemical compound COC(=O)CCC(=O)OC.COC(=O)CCCC(=O)OC BNMYXGKEMMVHOX-UHFFFAOYSA-N 0.000 description 1
- XTDYIOOONNVFMA-UHFFFAOYSA-N dimethyl pentanedioate Chemical compound COC(=O)CCCC(=O)OC XTDYIOOONNVFMA-UHFFFAOYSA-N 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 235000019326 ethyl hydroxyethyl cellulose Nutrition 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 238000005816 glass manufacturing process Methods 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- ACCCMOQWYVYDOT-UHFFFAOYSA-N hexane-1,1-diol Chemical compound CCCCCC(O)O ACCCMOQWYVYDOT-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000012092 media component Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 150000002902 organometallic compounds Chemical class 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229920000193 polymethacrylate Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000000518 rheometry Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- CQLFBEKRDQMJLZ-UHFFFAOYSA-M silver acetate Chemical compound [Ag+].CC([O-])=O CQLFBEKRDQMJLZ-UHFFFAOYSA-M 0.000 description 1
- 229940071536 silver acetate Drugs 0.000 description 1
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 description 1
- FJOLTQXXWSRAIX-UHFFFAOYSA-K silver phosphate Chemical compound [Ag+].[Ag+].[Ag+].[O-]P([O-])([O-])=O FJOLTQXXWSRAIX-UHFFFAOYSA-K 0.000 description 1
- KZJPVUDYAMEDRM-UHFFFAOYSA-M silver;2,2,2-trifluoroacetate Chemical compound [Ag+].[O-]C(=O)C(F)(F)F KZJPVUDYAMEDRM-UHFFFAOYSA-M 0.000 description 1
- VFWRGKJLLYDFBY-UHFFFAOYSA-N silver;hydrate Chemical compound O.[Ag].[Ag] VFWRGKJLLYDFBY-UHFFFAOYSA-N 0.000 description 1
- GGCZERPQGJTIQP-UHFFFAOYSA-N sodium;9,10-dioxoanthracene-2-sulfonic acid Chemical compound [Na+].C1=CC=C2C(=O)C3=CC(S(=O)(=O)O)=CC=C3C(=O)C2=C1 GGCZERPQGJTIQP-UHFFFAOYSA-N 0.000 description 1
- 239000007962 solid dispersion Substances 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 238000005118 spray pyrolysis Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- 150000003505 terpenes Chemical class 0.000 description 1
- 235000007586 terpenes Nutrition 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000011345 viscous material Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/02—Frit compositions, i.e. in a powdered or comminuted form
- C03C8/08—Frit compositions, i.e. in a powdered or comminuted form containing phosphorus
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/18—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/14—Conductive material dispersed in non-conductive inorganic material
- H01B1/16—Conductive material dispersed in non-conductive inorganic material the conductive material comprising metals or alloys
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Dispersion Chemistry (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photovoltaic Devices (AREA)
- Conductive Materials (AREA)
Abstract
Description
本發明主要係關於一厚膜膏組成物及由該組成物形成的厚膜電極。其進一步係關於一矽半導體裝置,特別是關於用來形成太陽能電池之厚膜電極的導電組成物。 The present invention is primarily directed to a thick film paste composition and a thick film electrode formed from the composition. It is further related to a semiconductor device, and more particularly to a conductive composition for forming a thick film electrode of a solar cell.
雖然本發明對於像是光二極體及太陽能電池之受光元件特別有效,但是本發明可應用至廣域的半導體裝置。下面描述有關於做為習知技藝之一特定實例的太陽能電池之發明背景。 Although the present invention is particularly effective for light-receiving elements such as photodiodes and solar cells, the present invention is applicable to a wide-area semiconductor device. The background of the invention relating to a solar cell as a specific example of the prior art is described below.
具有p型基極之習知的太陽電池結構具有典型位於電池前側或太陽側的負電極及位於背側的正電極。落在半導體主體的p-n接面上且具有適當波長的輻射係作為一外部能量來源,以便在該主體中產生電洞-電子對。由於存在p-n接面上的電位差之緣故,電洞和電子以相反方向橫跨該接面移動,從而引發能夠輸送電力至一外部電路的電流流動。大多數的太陽能電池為經過金屬化,亦即,設有導電的金屬電極之矽晶圓的形式。典型的厚膜膏係網版印刷至基材上並燒製,以形成電極。 A conventional solar cell structure having a p-type base has a negative electrode typically located on the front side or the sun side of the cell and a positive electrode on the back side. A radiation system that falls on the p-n junction of the semiconductor body and has a suitable wavelength serves as an external source of energy to create a hole-electron pair in the body. Due to the potential difference on the p-n junction, the holes and electrons move across the junction in opposite directions, thereby causing a current flow that can deliver power to an external circuit. Most solar cells are in the form of metallized, that is, tantalum wafers with conductive metal electrodes. A typical thick film paste is screen printed onto a substrate and fired to form an electrode.
此製造方法之一實例在下文伴隨圖1A至1F敘述。 An example of such a manufacturing method is described below with reference to Figures 1A through 1F.
圖1A顯示單晶或多晶p型矽基材10。 FIG. 1A shows a single crystal or polycrystalline p-type tantalum substrate 10.
在圖1B中,相反導電型的n型擴散層20係使用氧氯化磷作為磷來源並藉由磷的熱擴散形成。在不作任何特定修改之下,在矽p型基材10的整個表面上方形成 擴散層20。擴散層的深度可藉由控制擴散溫度及時間來使之變化,且通常形成約0.3至0.5微米的厚度範圍。n型擴散層可具有每平方數十歐姆上至每平方約120歐姆的薄片電阻率。 In FIG. 1B, the opposite conductivity type n-type diffusion layer 20 is formed using phosphorus oxychloride as a phosphorus source and thermally diffused by phosphorus. Formed over the entire surface of the p-type substrate 10 without any specific modification Diffusion layer 20. The depth of the diffusion layer can be varied by controlling the diffusion temperature and time, and typically forms a thickness range of about 0.3 to 0.5 microns. The n-type diffusion layer may have a sheet resistivity of from about 10 ohms per square to about 120 ohms per square.
如圖1C所示,在以一光阻劑或類似物保護此擴散層之正面後,藉由蝕刻從剩餘表面移除擴散層20,以致擴散層20僅殘留在正面上。接著,使用一有機溶劑或類似物移除該光阻劑。 As shown in FIG. 1C, after the front side of the diffusion layer is protected by a photoresist or the like, the diffusion layer 20 is removed from the remaining surface by etching so that the diffusion layer 20 remains only on the front surface. Next, the photoresist is removed using an organic solvent or the like.
之後,如圖1D所示,在n型擴散層20上形成亦作用如一抗反射塗層的絕緣層30。絕緣層通常為氮化矽,但亦可為SiNx:H薄膜(亦即,絕緣薄膜包含用於在後續燒製處理期間鈍化的氫)、氧化鈦薄膜、氧化矽薄膜或氧化矽/氧化鈦薄膜。厚度約為700至900 Å的氮化矽薄膜適用於約1.9至2.0的折射率。絕緣層30的沈積可藉由濺射、化學氣相沈積或其他方法。 Thereafter, as shown in FIG. 1D, an insulating layer 30 which also acts as an anti-reflection coating is formed on the n-type diffusion layer 20. The insulating layer is usually tantalum nitride, but may also be a SiN x :H film (that is, the insulating film contains hydrogen for passivation during the subsequent firing process), a titanium oxide film, a hafnium oxide film or a hafnium oxide/titanium oxide. film. A tantalum nitride film having a thickness of about 700 to 900 Å is suitable for a refractive index of about 1.9 to 2.0. The deposition of the insulating layer 30 can be by sputtering, chemical vapor deposition, or other methods.
接下來,形成電極。如圖1E所示,將用於前電極的銀膏500網版印刷在氮化矽薄膜30上,接著乾燥。此外,接著將背側銀或銀/鋁膏70及鋁膏60網版印刷至基材背側,隨後進行乾燥。在紅外線爐中以接近750至850℃的溫度範圍持續實行從數秒至數十分鐘週期的燒製。 Next, an electrode is formed. As shown in FIG. 1E, the silver paste 500 for the front electrode is screen printed on the tantalum nitride film 30, followed by drying. Further, the back side silver or silver/aluminum paste 70 and the aluminum paste 60 are then screen-printed to the back side of the substrate, followed by drying. The firing from a few seconds to several tens of minutes is continuously carried out in an infrared oven at a temperature range of approximately 750 to 850 °C.
結果,如圖1F所示,在燒製期間,鋁在背側上從鋁膏60擴散進入矽基材10,從而形成含有高濃度鋁摻質的p+層40。此層通常被稱為背面電場(back surface field,BSF)層,且它有助於改善該太陽能電池之能量轉換效率。 As a result, as shown in FIG. 1F, during firing, aluminum diffuses from the aluminum paste 60 onto the tantalum substrate 10 on the back side, thereby forming a p+ layer 40 containing a high concentration of aluminum dopant. This layer is often referred to as a back surface field (BSF) layer and it helps to improve the energy conversion efficiency of the solar cell.
燒製將乾燥的鋁膏60轉換為鋁背電極61。同時燒製背側銀或銀/鋁膏70,使其變為銀或銀/鋁背電極71。在燒製期間,背側鋁和背側銀或銀/鋁之間的界線呈現合金狀態,從而達成電連接。背電極的大部分面積係由鋁電極61佔據,部分是因為要形成p+層40的緣故。因為不可能焊接至一鋁電極,銀或銀/鋁背電極71遂形成在部分的背側上方,以作為用於經由銅條或其類似物互連太陽能電池的電極。此外,前側銀膏500在燒製期間燒結並穿透氮化矽薄膜30,從而達成與n型層20的電接觸。此類型的程序通常稱為「燒穿」。圖1F之經燒製的電極501明顯呈現出燒穿的結果。 The dry aluminum paste 60 is converted into an aluminum back electrode 61 by firing. The back side silver or silver/aluminum paste 70 is simultaneously fired to become a silver or silver/aluminum back electrode 71. During firing, the boundary between the backside aluminum and the backside silver or silver/aluminum exhibits an alloyed state, thereby achieving electrical connection. Most of the area of the back electrode is occupied by the aluminum electrode 61, in part because of the formation of the p+ layer 40. Since it is impossible to solder to an aluminum electrode, silver or silver/aluminum back electrode 71 is formed over the back side of the portion as an electrode for interconnecting solar cells via a copper strip or the like. In addition, the front side silver paste 500 is sintered and penetrates the tantalum nitride film 30 during firing to achieve electrical contact with the n-type layer 20. This type of program is often referred to as "burn through." The fired electrode 501 of Figure 1F clearly shows the result of burn through.
持續努力於提供具有減量銀及無鉛的厚膜膏組成物,在此同時,其仍保有所得電極及裝置之電性能與其他相關性質。本發明提供一銀膏組成物,同時提供一具有較少量銀的無鉛系統,同時仍保有電及機械性能。 Efforts continue to provide thick film paste compositions with reduced silver and lead-free, while still retaining the electrical properties and other related properties of the resulting electrodes and devices. The present invention provides a silver paste composition while providing a lead-free system with a relatively small amount of silver while still retaining electrical and mechanical properties.
本發明提供一厚膜膏組成物,其包含:(a)25至55重量百分比的導電銀;(b)5至35重量百分比之一第二導電金屬,其係選自由鎳、鋁及其混合物所構成的群組;(c)0.5至5重量百分比的無鉛鉍-碲-氧化物;以及(d)一有機介質;其中該導電銀、該第二導電金屬及該鉍-碲-氧化物係分散在該有機介質中,且其中該重量百分比係以該膏組成物的總重量為基礎;以該鉍-碲-氧化物的總重量為基 礎,該鉍-碲-氧化物包含22至42重量百分比的Bi2O3及58至78重量百分比的TeO2。 The present invention provides a thick film paste composition comprising: (a) 25 to 55 weight percent of conductive silver; (b) 5 to 35 weight percent of a second conductive metal selected from the group consisting of nickel, aluminum, and mixtures thereof a group formed; (c) 0.5 to 5 weight percent of lead-free bismuth-tellurium-oxide; and (d) an organic medium; wherein the conductive silver, the second conductive metal, and the bismuth-tellurium-oxide system Dispersed in the organic medium, and wherein the weight percentage is based on the total weight of the paste composition; the bismuth-tellurium-oxide comprises 22 to 42 weights based on the total weight of the bismuth-tellurium-oxide Percentage of Bi 2 O 3 and 58 to 78 weight percent of TeO 2 .
本發明亦提供一半導體裝置,特別是一太陽能電池,其包含一由本膏組成物形成之電極,其中該膏組成物已經過燒製,以移除該有機介質並形成該電極。 The present invention also provides a semiconductor device, particularly a solar cell, comprising an electrode formed from the composition of the paste, wherein the paste composition has been fired to remove the organic medium and form the electrode.
本發明的導電厚膜膏組成物含有減量的導電銀,但同時提供從該膏形成一電極的能力,其中該電極具有良好的電及黏合性質。 The conductive thick film paste composition of the present invention contains a reduced amount of conductive silver, but at the same time provides the ability to form an electrode from the paste, wherein the electrode has good electrical and bonding properties.
該導電厚膜膏組成物包含導電銀;一第二導電金屬,其係選自由鎳、鋁及其混合物所構成的群組;一無鉛鉍-碲-氧化物;及一有機媒劑。其係用於形成網版印刷電極。在各種實施例中,其係用於在半導體裝置,特別是在太陽能電池上形成電極。在這一類的實施例中,其係用於在太陽能電池之矽基材的背側上形成標誌電極。該膏組成物包含25至55重量百分比的導電銀;5至35重量百分比之一第二導電金屬,其係選自由鎳、鋁及其混合物所構成的群組;0.5至5重量百分比的鉍-碲-氧化物;及一有機介質,其中該銀、該第二導電金屬及該鉍-碲-氧化物全都分散在該有機介質中,且其中該重量百分比係以該膏組成物的總重量為基礎。 The conductive thick film paste composition comprises conductive silver; a second conductive metal selected from the group consisting of nickel, aluminum and mixtures thereof; a lead-free bismuth-tellurium-oxide; and an organic vehicle. It is used to form a screen printing electrode. In various embodiments, it is used to form electrodes on semiconductor devices, particularly on solar cells. In this type of embodiment, it is used to form the marker electrode on the back side of the tantalum substrate of the solar cell. The paste composition comprises 25 to 55 weight percent of conductive silver; 5 to 35 weight percent of a second conductive metal selected from the group consisting of nickel, aluminum, and mixtures thereof; 0.5 to 5 weight percent of bismuth - a cerium-oxide; and an organic medium, wherein the silver, the second conductive metal, and the cerium-lanthanum-oxide are all dispersed in the organic medium, and wherein the weight percentage is based on the total weight of the paste composition basis.
在下文詳細解釋本發明之厚膜膏組成物的每一成分。 Each component of the thick film paste composition of the present invention is explained in detail below.
銀 silver
在本發明中,該膏之一導電相為銀(Ag)。該銀可為銀金屬、銀合金或其混合物之形式。典型地,在銀粉末中,銀粒子為片狀形態、球狀形態、粒狀形態、結晶形態、其他不規則形態及其混合物。可在一膠態懸浮液中提供銀。該銀亦可為下列形式:氧化銀(Ag2O)、銀鹽如AgCl、AgNO3、AgOOCCH3(乙酸銀)、AgOOCF3(三氟乙酸銀)、正磷酸銀(Ag3PO4)或其混合物。亦可使用可與其他厚膜膏成分相容之其他形態的銀。 In the present invention, one of the conductive phases of the paste is silver (Ag). The silver may be in the form of a silver metal, a silver alloy or a mixture thereof. Typically, in silver powder, the silver particles are in the form of flakes, spheres, granules, crystals, other irregularities, and mixtures thereof. Silver can be provided in a colloidal suspension. The silver may also be in the form of silver oxide (Ag 2 O), a silver salt such as AgCl, AgNO 3 , AgOOCCH 3 (silver acetate), AgOOCF 3 (silver trifluoroacetate), silver orthophosphate (Ag 3 PO 4 ) or Its mixture. Other forms of silver that are compatible with other thick film paste ingredients can also be used.
在一實施例中,該厚膜膏組成物包含經塗佈的導電銀粒子。合適之塗層包括磷與表面活性劑。合適之表面活性劑包括聚乙烯氧化物(polyethyleneoxide)、聚乙二醇、苯并三唑、聚(乙二醇)乙酸、月桂酸、油酸、癸酸、肉豆蔻酸、亞麻油酸、硬脂酸、棕櫚酸、硬脂酸鹽、棕櫚酸鹽與其混合物。鹽類相對離子可為銨、鈉、鉀及其混合物。 In one embodiment, the thick film paste composition comprises coated conductive silver particles. Suitable coatings include phosphorus and surfactants. Suitable surfactants include polyethylene oxide, polyethylene glycol, benzotriazole, poly(ethylene glycol) acetic acid, lauric acid, oleic acid, citric acid, myristic acid, linoleic acid, hard Fatty acid, palmitic acid, stearate, palmitate and mixtures thereof. The salt relative ions can be ammonium, sodium, potassium, and mixtures thereof.
銀的粒度並未受到任何特別限制。在一實施例中,一平均粒度為小於10微米;在另一實施例中,平均粒度小於5微米。 The particle size of silver is not subject to any particular restrictions. In one embodiment, an average particle size is less than 10 microns; in another embodiment, the average particle size is less than 5 microns.
由於成本之故,有利的是減少該膏中的銀量,同時保有該膏及從該膏形成之電極所需的性質。此外,本厚膜膏致能形成具有縮減厚度的電極,並導致進一步的節省。 Because of the cost, it is advantageous to reduce the amount of silver in the paste while retaining the properties required for the paste and the electrodes formed from the paste. In addition, the present thick film paste enables the formation of electrodes having reduced thickness and leads to further savings.
第二導電金屬 Second conductive metal
該膏之一第二導電相為一金屬,其係選自由鎳(Ni)、鋁(Al)及其混合物所構成的群組。該混合物可為合金形式。 One of the second conductive phases of the paste is a metal selected from the group consisting of nickel (Ni), aluminum (Al), and mixtures thereof. The mixture can be in the form of an alloy.
鎳和鋁粉末包含各種形狀的粒子,例如,片狀形態、球狀形態、粒狀形態、結晶形態、其他不規則形態及其混合物。鎳和鋁的粒度並未受到任何特殊限制。在一實施例中,一平均粒度為小於10微米;在另一實施例中,平均粒度小於5微米。 Nickel and aluminum powders contain particles of various shapes, for example, sheet form, spherical form, granular form, crystalline form, other irregular forms, and mixtures thereof. The particle sizes of nickel and aluminum are not subject to any particular limitation. In one embodiment, an average particle size is less than 10 microns; in another embodiment, the average particle size is less than 5 microns.
在一實施例中,該厚膜膏組成物包含經塗佈的導電鎳及/或鋁粒子。合適之塗層包括磷與表面活性劑。合適之表面活性劑包括聚乙烯氧化物(polyethyleneoxide)、聚乙二醇、苯并三唑、聚(乙二醇)乙酸、月桂酸、油酸、癸酸、肉豆蔻酸、亞麻油酸、硬脂酸、棕櫚酸、硬脂酸鹽、棕櫚酸鹽與其混合物。鹽類相對離子可為銨、鈉、鉀及其混合物。 In one embodiment, the thick film paste composition comprises coated conductive nickel and/or aluminum particles. Suitable coatings include phosphorus and surfactants. Suitable surfactants include polyethylene oxide, polyethylene glycol, benzotriazole, poly(ethylene glycol) acetic acid, lauric acid, oleic acid, citric acid, myristic acid, linoleic acid, hard Fatty acid, palmitic acid, stearate, palmitate and mixtures thereof. The salt relative ions can be ammonium, sodium, potassium, and mixtures thereof.
鉍-碲-氧化物 铋-碲-oxide
該膏組成物之一成分為無鉛鉍-碲-氧化物(Bi-Te-O)。在一實施例中,此氧化物可為一玻璃組成物,例如,玻料。在另一實施例中,此氧化物可為結晶、部分結晶、非晶、部分非晶或其組合。在一實施例中,Bi-Te-O可包括超過一種玻璃組成物。在一實施例中,Bi-Te-O組成物可包括一玻璃組成物及一額外的組成物(例如,一結晶組成物)。 One component of the paste composition is lead-free bismuth-tellurium-oxide (Bi-Te-O). In one embodiment, the oxide can be a glass composition, such as a glass. In another embodiment, the oxide can be crystalline, partially crystalline, amorphous, partially amorphous, or a combination thereof. In an embodiment, Bi-Te-O may comprise more than one glass composition. In one embodiment, the Bi-Te-O composition can include a glass composition and an additional composition (eg, a crystalline composition).
鉍-碲-氧化物(Bi-Te-O)可藉由使用在此技術中具有一般技藝者所了解的技術將Bi2O3、TeO2與其他欲混 入其中的氧化物(或在加熱時會分解為所需氧化物的其他材料)混合來製備。這類製備技術可包括在空氣或含氧大氣中加熱該混合物,以形成一熔體;將該熔體淬火;及磨碎、輾磨及/或篩選該經淬火的材料,以提供一具有所需粒度的粉末。熔化鉍、碲及其他欲混入其中之氧化物的混合物典型實施達800至1200℃的峰值溫度。熔化的混合物可在例如不銹鋼壓板上或在反方向旋轉的不銹鋼輥間進行淬火,以形成一薄板。可碾磨所產生的薄板,以形成粉末。典型地,經碾磨的粉末所具有的d50為0.1至3.0微米。一熟悉製造玻料之技術者可利用替代的合成技術(例如,但不受限於,水淬火、溶膠-凝膠、噴霧熱解或其他適於製造粉末形式之玻璃的技術)。 Bi-Te-O may be Bi 2 O 3 , TeO 2 and other oxides to be incorporated therein by using techniques known to those skilled in the art (or when heated) Prepared by mixing with other materials that will decompose into the desired oxide. Such preparation techniques can include heating the mixture in air or an oxygen-containing atmosphere to form a melt; quenching the melt; and grinding, honing, and/or screening the quenched material to provide a A powder of required particle size. The mixture of ruthenium, osmium and other oxides to be incorporated therein is typically subjected to a peak temperature of from 800 to 1200 °C. The molten mixture can be quenched, for example, on a stainless steel platen or a stainless steel roll rotating in the opposite direction to form a thin plate. The resulting sheet can be milled to form a powder. Typically, the milled powder having a d 50 of 0.1 to 3.0 microns. One skilled in the art of making glass can utilize alternative synthetic techniques (such as, but not limited to, water quenching, sol-gel, spray pyrolysis, or other techniques suitable for making glass in powder form).
上述程序的氧化物產物實質上典型為一非晶(無結晶)固態材料,亦即,玻璃。不過,在一些實施例中,所得的氧化物可為非晶、部分非晶、部分結晶、結晶或其組合。如本文所用,「玻料」包括所有這類產物。 The oxide product of the above procedure is typically substantially an amorphous (no crystalline) solid material, i.e., glass. However, in some embodiments, the resulting oxide can be amorphous, partially amorphous, partially crystalline, crystalline, or a combination thereof. As used herein, "glass" includes all such products.
以Bi-Te-O之起始混合物的總重量為基礎,用來製造Bi-Te-O的起始混合物包括22至42重量百分比的Bi2O3及58至78重量百分比的TeO2。 The starting mixture used to make Bi-Te-O comprises 22 to 42 weight percent Bi 2 O 3 and 58 to 78 weight percent TeO 2 based on the total weight of the starting mixture of Bi-Te-O.
在另一實施例中,除了Bi2O3及TeO2之外,以Bi-Te-O之起始混合物的總重量為基礎,用來製造Bi-Te-O的起始混合物包括0.1至7重量百分比的Li2O及0.1至4重量百分比的TiO2。在一更進一步的實施例中,再次以Bi-Te-O之起始混合物的總重量為基礎,起 始混合物包括0.1至8重量百分比的B2O3、0.1至3重量百分比的ZnO及0.3至2重量百分比的P2O5。 In another embodiment, in addition to Bi 2 O 3 and TeO 2 , the starting mixture used to make Bi-Te-O comprises 0.1 to 7 based on the total weight of the starting mixture of Bi-Te-O. Percent by weight of Li 2 O and 0.1 to 4 weight percent of TiO 2 . In a still further embodiment, the starting mixture comprises from 0.1 to 8 weight percent B 2 O 3 , from 0.1 to 3 weight percent ZnO and 0.3 based on the total weight of the initial mixture of Bi-Te-O. Up to 2% by weight of P 2 O 5 .
在另一實施例中,除了Bi2O3及TeO2之外,以Bi-Te-O之起始混合物的總重量為基礎,用來製造Bi-Te-O的起始混合物包括0.9至5重量百分比的Li2O及0.3至2重量百分比的TiO2。在尚有另一實施例中,再次以Bi-Te-O之起始混合物的總重量為基礎,起始混合物包括0.9至6重量百分比的B2O3、0.1至2重量百分比的ZnO及0.3至1重量百分比的P2O5。 In another embodiment, the starting mixture used to make the Bi-Te-O comprises 0.9 to 5, based on the total weight of the starting mixture of Bi-Te-O, in addition to Bi 2 O 3 and TeO 2 . Li 2 O by weight and 0.3 to 2 weight percent of TiO 2 . In yet another embodiment, the starting mixture comprises 0.9 to 6 weight percent B 2 O 3 , 0.1 to 2 weight percent ZnO, and 0.3, based on the total weight of the starting mixture of Bi-Te-O. Up to 1% by weight of P 2 O 5 .
在一實施例中,Bi-Te-O可為一均質粉末。在另一實施例中,Bi-Te-O可為多於一種粉末之一組合,其中每一粉末分別可為均質族群。2種粉末之總體組合的組成物係位於上述範圍內。例如,Bi-Te-O可包括二或多個不同粉末之一組合;這些粉末分別可具有不同組成物,且可或可不位於上述範圍內;不過,這些粉末的組合可位於上述範圍內。 In one embodiment, Bi-Te-O can be a homogeneous powder. In another embodiment, Bi-Te-O can be a combination of more than one powder, wherein each powder can be a homogeneous population, respectively. The composition of the overall combination of the two powders is within the above range. For example, Bi-Te-O may comprise a combination of two or more different powders; these powders may each have different compositions and may or may not be within the above ranges; however, combinations of these powders may be within the above ranges.
在一實施例中,Bi-Te-O組成物可包括一包括有一均質粉末的粉末,其包括Bi-Te-O組成物所需元素的一些而非全部;及一第二粉末,其包括其他所需元素的一或多個。例如,進一步包含Li及Ti之Bi-Te-O組成物可包括一第一粉末,其包括Bi、Te、Li及O;及一第二粉末,其包括TiO2。在此實施例之一實施態樣中,可將該些粉末共同熔化,以形成均勻的組成物。在此實施例之一進一步的實施態樣中,可分別將該些粉末添加至一厚膜組成物。 In one embodiment, the Bi-Te-O composition can include a powder comprising a homogeneous powder comprising some but not all of the desired elements of the Bi-Te-O composition; and a second powder comprising the other One or more of the required elements. For example, the Bi-Te-O composition further comprising Li and Ti may include a first powder including Bi, Te, Li, and O; and a second powder including TiO 2 . In one embodiment of this embodiment, the powders may be co-melted to form a uniform composition. In a further embodiment of this embodiment, the powders can be separately added to a thick film composition.
在一實施例中,一些或全部的任何Li2O可以Na2O、K2O、Cs2O或Rb2O來取代,導致玻璃組成物具有類似於上文所列出之組成物的性質。 In one embodiment, some or all of any Li 2 O may be substituted with Na 2 O, K 2 O, Cs 2 O, or Rb 2 O, resulting in a glass composition having properties similar to those listed above. .
在本文中所敘述的玻璃組成物(亦稱為玻料)係包括特定的成分百分比。具體而言,該百分比為用在如本文所述的後續處理以形成一玻璃組合物之起始材料中的成分百分比。這類命名法對於熟悉此項技術者來說早為已知。換言之,該組合物含有一些成分,且那些成分的百分比是表示為對應的氧化物形式之百分比。如玻璃化學這項技術中具有普通技能者所了解的,在玻璃的製造程序期間可能會釋放某一部分的揮發性物種。揮發性物種的一實例為氧。亦須了解雖然玻璃表現得像是非晶材料,其可能會含有微量的結晶材料。 The glass composition (also known as glass) described herein includes a specific percentage of ingredients. In particular, the percentage is the percentage of the ingredients used in the starting materials used to form a glass composition as described herein. Such nomenclature has long been known to those skilled in the art. In other words, the composition contains some ingredients, and the percentage of those ingredients is expressed as a percentage of the corresponding oxide form. As is known to those of ordinary skill in the art of glass chemistry, a certain portion of the volatile species may be released during the glass manufacturing process. An example of a volatile species is oxygen. It is also important to understand that although glass behaves like an amorphous material, it may contain traces of crystalline material.
若以經燒製的玻璃開始,在此項技術中具有普通技能者可使用熟悉此項技術者已知的一方法計算本文所述之起始成分的百分比,該些方法包括,但不限於:感應耦合電漿放射光譜儀(ICPES)、感應耦合電漿原子放射光譜儀(ICP-AES)及類似者。此外,可使用下列的例示性技術:X射線螢光光譜學(XRF);核磁共振光譜學(NMR);電子順磁共振光譜學(EPR);穆斯堡爾(Mössbauer)光譜學;電子微探針能量散佈光譜學(EDS);電子微探針波長散佈光譜學(WDS);陰極發光(CL)。 If starting with fired glass, one of ordinary skill in the art can calculate the percentage of the starting ingredients described herein using a method known to those skilled in the art, including, but not limited to: Inductively Coupled Plasma Emission Spectrometer (ICPES), Inductively Coupled Plasma Atomic Emission Spectrometer (ICP-AES) and the like. In addition, the following exemplary techniques can be used: X-ray fluorescence spectroscopy (XRF); nuclear magnetic resonance spectroscopy (NMR); electron paramagnetic resonance spectroscopy (EPR); Mössbauer spectroscopy; Probe Energy Dispersion Spectroscopy (EDS); Electron Microprobe Wavelength Dispersion Spectroscopy (WDS); Cathodoluminescence (CL).
在此項技術中具有普通技能者將了解原料的選擇可在非故意的情況下包括可在處理期間併入玻璃中的雜質。例如:雜質可以數百至數千ppm的範圍存在。 Those of ordinary skill in the art will appreciate that the choice of materials can unintentionally include impurities that can be incorporated into the glass during processing. For example, impurities may exist in the range of hundreds to thousands of ppm.
雜質的存在將不會改變玻璃、厚膜組合物或燒製裝置的性質。例如,即使該厚膜組成物包括雜質,含有該厚膜組成物的一太陽能電池仍可具有本文所述的效率。 The presence of impurities will not alter the properties of the glass, thick film composition or firing device. For example, even if the thick film composition includes impurities, a solar cell containing the thick film composition can still have the efficiencies described herein.
以該厚膜膏組成物的總重量為基礎,Bi-Te-O在本厚膜膏組成物中的含量典型為0.5至5重量百分比。在一實施例中,含量為1至3.5重量百分比。Bi-Te-O為本膏組成物之一必要成分,但亦可扮演一重要角色,以作為其他厚膜膏配方中之一成分。 The content of Bi-Te-O in the present thick film paste composition is typically from 0.5 to 5 weight percent based on the total weight of the thick film paste composition. In one embodiment, the amount is from 1 to 3.5 weight percent. Bi-Te-O is an essential component of the cream composition, but can also play an important role as one of the other thick film formulations.
有機介質 Organic medium
將厚膜膏組成物之無機成分與一有機介質混合,以形成對印刷具適當稠度及流變性的黏稠膏。多種惰性粘稠材料可當做有機介質使用。有機介質可為無機成分在膏之製造、運送及儲存期間以及在網版印刷程序期間於印刷篩網上可以適當穩定度分散在其中者。 The inorganic component of the thick film paste composition is mixed with an organic medium to form a viscous paste having a suitable consistency and rheology for printing. A variety of inert viscous materials can be used as organic media. The organic medium can be one in which the inorganic component can be suitably stabilized during manufacture, transport and storage of the paste and during the screen printing process on the printing screen.
適合的有機介質具備可提供穩定之固體分散性、適合網印之黏度及搖變性、適當之基材及膏固體可濕性、一優良之乾燥速率以及優良之燒製性質的流變特性。該有機介質可包括增稠劑、安定劑、表面活性劑及/或其他常見的添加劑。這一類的搖變性增稠劑為有機搖變助劑(thixatrol)。該有機介質可為一種聚合物溶於溶劑中的溶液。適合的聚合物包括乙基纖維素、乙基羥乙基纖維素、木松香、乙基纖維素及苯酚樹脂之混合物、低級醇之聚甲基丙烯酸酯以及乙二醇單乙酸酯之單丁醚。適用的溶劑包括萜烯,例如,α-或β-松脂醇或其與其他溶劑(例如,煤油、鄰苯二甲酸二丁酯、丁基卡必醇、丁基 卡必醇醋酸鹽、己二醇及沸點高於150℃的醇)的混合物以及醇酯。其他合適之有機介質組分包括:雙(2-(2-丁氧乙氧基)己二酸乙酯、二元酯(如DBE、DBE-2、DBE-3、DBE-4、DBE-5、DBE-6、DBE-9與DBE 1B)、環氧妥爾酸辛酯(octyl epoxy tallate)、異十四醇與氫化松香之新戊四醇酯。有機介質亦可包含揮發性液體,以在基材上塗敷該厚膜膏組成物後促進快速硬化。 Suitable organic media are provided with rheological properties which provide stable solid dispersion, viscosity and texturization suitable for screen printing, proper substrate and paste solid wettability, an excellent drying rate, and excellent firing properties. The organic medium can include thickeners, stabilizers, surfactants, and/or other common additives. This type of shake densifying thickener is an organic shake aid (thixatrol). The organic medium can be a solution in which a polymer is dissolved in a solvent. Suitable polymers include ethyl cellulose, ethyl hydroxyethyl cellulose, wood rosin, mixtures of ethyl cellulose and phenolic resins, polymethacrylates of lower alcohols, and mono-glycols of ethylene glycol monoacetate. ether. Suitable solvents include terpenes, for example, alpha- or beta-rosinol or other solvents (eg, kerosene, dibutyl phthalate, butyl carbitol, butyl) A mixture of carbitol acetate, hexanediol and an alcohol having a boiling point above 150 ° C and an alcohol ester. Other suitable organic media components include: bis(2-(2-butoxyethoxy)adipate ethyl ester, dibasic esters (eg DBE, DBE-2, DBE-3, DBE-4, DBE-5) , DBE-6, DBE-9 and DBE 1B), octyl epoxy tallate, isotetradecanol and hydrogenated rosin pentaerythritol ester. The organic medium may also contain volatile liquids to The thick film paste composition is applied to the substrate to promote rapid hardening.
有機介質在該厚膜膏組成物中之最佳量係與施用該膏之方法以及所用之特定有機介質有關。以該膏組成物的總重量為基礎,本厚膜膏組成物含有多於30且少於60重量百分比的有機介質。 The optimum amount of organic medium in the thick film paste composition is related to the method of applying the paste and the particular organic medium used. The thick film paste composition contains more than 30 and less than 60 weight percent of the organic medium based on the total weight of the paste composition.
若有機介質包含一聚合物,則該聚合物典型包含8至15重量百分比的有機組成物。 If the organic medium comprises a polymer, the polymer typically comprises from 8 to 15 weight percent of the organic composition.
無機添加劑 Inorganic additive
用在本發明之組成物中的Bi-Ti-O提供黏合性。不過,可添加一無機黏合性促進劑來增加黏合特性。此無機添加劑可選自由下列所構成的群組:Bi2O3、TiO2、Al2O3、B2O3、SnO2、Sb2O5、Cr2O3、Fe2O3、ZnO、CuO、Cu2O、MnO2、Co2O3、NiO、RuO2、一在燒製期間可產生所列出之金屬氧化物的金屬、一在燒製期間可產生所列出之金屬氧化物的金屬化合物及其混合物。添加劑可在不影響電性能及曲折的情況下幫助增加黏合特性。 The Bi-Ti-O used in the composition of the present invention provides adhesion. However, an inorganic adhesion promoter can be added to increase the adhesion characteristics. The inorganic additive may be selected from the group consisting of Bi 2 O 3 , TiO 2 , Al 2 O 3 , B 2 O 3 , SnO 2 , Sb 2 O 5 , Cr 2 O 3 , Fe 2 O 3 , ZnO. , CuO, Cu 2 O, MnO 2 , Co 2 O 3 , NiO, RuO 2 , a metal which produces the listed metal oxide during firing, and which produces the listed metal oxide during firing Metal compounds and mixtures thereof. Additives help increase adhesion without affecting electrical properties and tortuosity.
無機添加劑的平均直徑位於0.5至10.0 μm的範圍內,或者,當添加劑為有機金屬化合物的形式時,其平均直徑係分散至分子程度。以該膏組成物的總重量為基 礎,欲添加至膏組成物之添加劑的量為0.5至5重量百分比。 The inorganic additive has an average diameter in the range of 0.5 to 10.0 μm, or, when the additive is in the form of an organometallic compound, the average diameter thereof is dispersed to the molecular level. Based on the total weight of the paste composition The amount of the additive to be added to the paste composition is 0.5 to 5 weight percent.
厚膜膏組成物的製備 Preparation of thick film paste composition
在一實施例中,厚膜膏組成物可藉由以任何順序混合導電銀粉末、第二導電金屬粉末、Bi-Te-O粉末及有機介質與任何無機添加劑來製備。在某些實施例中,係先混合該無機材料,而後將它們加入該有機介質中。在其他實施例中,為無機物之主要部分的銀粉末及第二導電金屬粉末係緩慢添加至有機介質。需要時可藉由加入溶劑而調整其黏度。可使用提供高切力的混合方法。 In one embodiment, the thick film paste composition can be prepared by mixing conductive silver powder, second conductive metal powder, Bi-Te-O powder, and an organic medium with any inorganic additive in any order. In certain embodiments, the inorganic materials are first mixed and then added to the organic medium. In other embodiments, the silver powder and the second conductive metal powder, which are a major portion of the inorganic material, are slowly added to the organic medium. The viscosity can be adjusted by adding a solvent as needed. A mixing method that provides high shear force can be used.
以該膏組成物的總重量為基礎,本厚膜膏組成物包含25至55重量百分比的導電銀及5至35重量百分比的第二導電金屬。在一實施例中,該厚膜膏組成物包含36至48重量百分比的導電銀及12至24重量百分比的第二導電金屬。在仍有另一實施例中,該厚膜膏組成物包含36至42重量百分比的導電銀及18至24重量百分比的第二導電金屬。以該膏組成物的總重量為基礎,該厚膜膏含有少於70重量百分比的無機成分,亦即,導電銀粉末、第二導電金屬粉末、Bi-Te-O粉末及任何無機添加劑。 The thick film paste composition comprises 25 to 55 weight percent of conductive silver and 5 to 35 weight percent of the second conductive metal based on the total weight of the paste composition. In one embodiment, the thick film paste composition comprises 36 to 48 weight percent conductive silver and 12 to 24 weight percent second conductive metal. In still another embodiment, the thick film paste composition comprises 36 to 42 weight percent conductive silver and 18 to 24 weight percent second conductive metal. The thick film paste contains less than 70% by weight of inorganic components, that is, conductive silver powder, second conductive metal powder, Bi-Te-O powder, and any inorganic additive, based on the total weight of the paste composition.
可藉由網版印刷、電鍍、擠出成形、噴墨、塑形或多重印刷或色帶來沈積厚膜膏組成物。 The thick film paste composition can be deposited by screen printing, electroplating, extrusion molding, ink jet, shaping or multiple printing or color ribbons.
在此電極形成程序中,首先乾燥該厚膜膏組成物。經乾燥之膏的厚度典型約為10至14 μm。接著加熱經乾燥的膏,以移除有機介質及燒結無機材料。該加熱過 程可在空氣或一含氧氣氛中進行。此步驟通常稱為「燒製」。燒製溫度曲線典型地經過設定,以便致能從經乾燥的厚膜膏組成物燃毀有機黏合劑材料及所含有的任何其他有機材料。在一實施例中,燒製溫度為750至950℃。該燒製過程可在一利用高輸送速率(例如100-500 cm/min)之帶式爐中進行,而所得之滯留時間為0.05至5分鐘。可使用多個溫度區(例如,3至11個區)來控制所需的熱曲線。 In this electrode forming process, the thick film paste composition is first dried. The dried paste typically has a thickness of about 10 to 14 μm. The dried paste is then heated to remove the organic medium and the sintered inorganic material. This heated The process can be carried out in air or an oxygen-containing atmosphere. This step is often referred to as "burning." The firing temperature profile is typically set to enable the organic binder material to be destroyed from the dried thick film paste composition and any other organic materials contained therein. In one embodiment, the firing temperature is 750 to 950 °C. The firing process can be carried out in a belt furnace using a high delivery rate (e.g., 100-500 cm/min), and the resulting residence time is 0.05 to 5 minutes. Multiple temperature zones (eg, 3 to 11 zones) can be used to control the desired thermal profile.
參照圖2A至2D解釋一使用本發明之膏組成物製備太陽能電池的實例。 An example of preparing a solar cell using the paste composition of the present invention is explained with reference to Figs. 2A to 2D.
首先,製備具有一擴散層及一抗反射塗層的矽基材102。如圖2A所示,在矽基材的受光前側面(表面)上,安裝典型主要由銀組成的電極104。如圖2B所示,在基材背面上,藉由網版印刷塗敷鋁膏(例如,PV333、PV322(商業上可購自DuPont co.,Wilmington,DE))接著乾燥106。如圖2C所示,本發明的膏組成物接著以部分重疊的狀態與經乾燥的鋁膏塗敷在一起,之後進行乾燥108。每種膏的乾燥溫度較佳的是150℃或更低。同樣地,鋁膏及本發明之膏的重疊部分較佳的是約為0.5至2.5 mm。 First, a tantalum substrate 102 having a diffusion layer and an anti-reflective coating is prepared. As shown in Fig. 2A, an electrode 104 mainly composed of silver is mounted on the light-receiving front side (surface) of the ruthenium substrate. As shown in Figure 2B, an aluminum paste (e.g., PV333, PV322 (commercially available from DuPont Co., Wilmington, DE)) is applied by screen printing on the back side of the substrate followed by drying 106. As shown in Fig. 2C, the paste composition of the present invention is then coated with the dried aluminum paste in a partially overlapping state, followed by drying 108. The drying temperature of each paste is preferably 150 ° C or lower. Likewise, the overlap of the aluminum paste and the paste of the present invention is preferably from about 0.5 to 2.5 mm.
接下來,如圖2D所示,以700至950℃的溫度持續燒製基材1至15分鐘,以便得到所需的太陽能電池。電極112係由本發明的膏組成物形成,其中該組成物已經過燒製,以移除有機介質及燒結無機物。所得到的太陽能電池在基材102之受光前側上具有電極104,且在背面上具有主要由鋁組成的鋁電極110和由經燒製之本 發明之膏組成物組成的電極112。電極112作用如太陽能電池之背側上的標誌電極。 Next, as shown in Fig. 2D, the substrate is continuously fired at a temperature of 700 to 950 ° C for 1 to 15 minutes to obtain a desired solar cell. The electrode 112 is formed from the paste composition of the present invention, wherein the composition has been fired to remove the organic medium and the sintered inorganic material. The resulting solar cell has an electrode 104 on the light-receiving front side of the substrate 102, and has an aluminum electrode 110 mainly composed of aluminum on the back surface and a fired one. An electrode 112 composed of the inventive paste composition. The electrode 112 acts as a marker electrode on the back side of the solar cell.
鉍-碲-氧化物的製備 Preparation of bismuth-tellurium-oxide
一鉍-碲-氧化物(Bi-Te-O)組成物的製備係藉由混合及摻合Bi2O3、TeO2、Li2CO3、TiO2、B2O3、BPO4(或LiPO3)及ZnO粉末來得到Bi-Te-O組成物,其包含26.64重量百分比的Bi2O3、67.22重量百分比的TeO2、2.16重量百分比的LiO2、0.48重量百分比的TiO2、2.09重量百分比的B2O3、0.98重量百分比的ZnO及0.43重量百分比的P2O5。將經摻合的粉末批料裝載至鉑合金坩堝,接著插入爐中並以900℃在空氣或O2中持續加熱一小時,以使混合物熔化。藉由從爐中移除鉑坩鍋並透過反方向旋轉間隙為0.010至0.020"之不銹鋼輥來澆注熔體而使液態熔體從900℃淬火。在不銹鋼容器中粗壓碎所得的材料。壓碎的材料接著在氧化鋁-矽酸鹽陶瓷球磨機中以氧化鋯介質及水進行球磨,直到d50為0.5至0.7微米。接著從碾磨球分離經球磨的材料、進行濕篩並藉由熱風烘爐使之乾燥。讓經乾燥的粉末通過200篩目的篩網,以提供用於下文所述之厚膜膏製備中的Bi-Te-O粉末。對粉末進行X射線分析顯示非晶材料的特徵。藉由熱機械分析(TMA)來特徵化該材料,並顯示在320℃開始粒子燒結,且在353℃轉變為完全的黏性流。用於該組成物的液相線呈現出接近511℃(介於320 ℃和511℃之間,一些結晶相可短暫地形成,並在燒結開始及液相線溫度間的區域中重新溶解)。 A bismuth-tellurium-oxide (Bi-Te-O) composition is prepared by mixing and blending Bi 2 O 3 , TeO 2 , Li 2 CO 3 , TiO 2 , B 2 O 3 , BPO 4 (or LiPO 3 ) and ZnO powder to obtain a Bi-Te-O composition comprising 26.64% by weight of Bi 2 O 3 , 67.22% by weight of TeO 2 , 2.16% by weight of LiO 2 , 0.48% by weight of TiO 2 , and 2.09 by weight Percentage of B 2 O 3 , 0.98 weight percent ZnO, and 0.43 weight percent P 2 O 5 . The blended powder batch was loaded into a platinum alloy crucible, then inserted into a furnace and continuously heated at 900 ° C in air or O 2 for one hour to melt the mixture. The liquid melt was quenched from 900 ° C by removing the platinum crucible from the furnace and rotating the melt through a stainless steel roll having a gap of 0.010 to 0.020" in the opposite direction. The resulting material was coarsely crushed in a stainless steel vessel. The ground material is then ball milled in a zirconia medium and water in an alumina-silicate ceramic ball mill until the d 50 is 0.5 to 0.7 microns. The ball milled material is then separated from the mill balls, wet sieved and hot air The oven was allowed to dry. The dried powder was passed through a 200 mesh screen to provide a Bi-Te-O powder for use in the preparation of the thick film paste described below. X-ray analysis of the powder revealed amorphous material Characterization. The material was characterized by thermomechanical analysis (TMA) and showed particle sintering started at 320 ° C and converted to a complete viscous flow at 353 ° C. The liquidus used for the composition appeared close to 511 °C (between 320 °C and 511 °C, some of the crystalline phase can be formed briefly and re-dissolved in the region between the start of sintering and the liquidus temperature).
厚膜膏組成物的製備 Preparation of thick film paste composition
該厚膜膏係藉由混合銀、鎳、上文在實例1中製備的Bi-Te-O粉末、有機介質、有機搖變助劑及黏合性促進劑來製備。將Ag、Ni、Bi-Te-O及黏合性促進劑添加至有機介質及Thixatrol®(Elementis Specialities,Inc.,Hightstown,NJ),同時伴隨連續的攪拌。由於銀及鎳為固體的主要部分,須緩慢添加以確保較佳的潤濕。接著以1 mil的間隙讓膏通過三輥磨機數次。藉由磨料細度(FOG)來測量分散度,以確保FOG小於或等於20/10。 The thick film paste was prepared by mixing silver, nickel, Bi-Te-O powder prepared in Example 1 above, an organic medium, an organic shaking aid, and an adhesion promoter. Adding Ag, Ni, Bi-Te- O , and adhesion promoting agent to the organic medium and Thixatrol ® (Elementis Specialities, Inc., Hightstown, NJ), accompanied by continuous stirring. Since silver and nickel are the major components of the solid, they must be added slowly to ensure better wetting. The paste was then passed through a three-roll mill several times with a 1 mil gap. The dispersion is measured by abrasive fineness (FOG) to ensure that the FOG is less than or equal to 20/10.
用在此實例中之成分的比例為54重量百分比的銀、6重量百分比的鎳、2重量百分比的Bi-Te-O、35.25重量百分比的有機介質、0.75重量百分比的有機搖變助劑及2.0重量百分比的無機黏合性促進劑,其係由1.0重量百分比的ZnO、0.6重量百分比的Bi2O3及0.4重量百分比的銅組成。 The proportion of the ingredients used in this example was 54 weight percent silver, 6 weight percent nickel, 2 weight percent Bi-Te-O, 35.25 weight percent organic media, 0.75 weight percent organic rocking aid, and 2.0. A weight percent inorganic adhesion promoter consisting of 1.0 weight percent ZnO, 0.6 weight percent Bi 2 O 3 , and 0.4 weight percent copper.
測試電極 Test electrode
為了決定由本膏組成物形成之電極的黏合性質,將膏組成物以電極形式網版印刷至矽晶圓表面上。接著讓膏乾燥並在爐中燒製。 In order to determine the adhesive properties of the electrode formed from the paste composition, the paste composition is screen printed onto the surface of the tantalum wafer in the form of an electrode. The paste is then dried and fired in an oven.
測試程序-黏合性 Test procedure - adhesion
在燒製之後,將焊接帶焊接至經燒製的膏。由於本發明僅包含無鉛Bi-Te-O,遂使用無鉛焊錫。所用的無鉛焊錫為96.5錫/3.5銀。用於無鉛焊錫的焊接溫度位於345至375℃的範圍內,焊接時間為5至7秒。所用的助焊劑為MF200。 After firing, the solder strip is soldered to the fired paste. Since the present invention contains only lead-free Bi-Te-O, 无 uses lead-free solder. The lead-free solder used was 96.5 tin/3.5 silver. The soldering temperature for lead-free solder is in the range of 345 to 375 ° C and the soldering time is 5 to 7 seconds. The flux used was MF200.
焊接面積接近2 mm×2 mm。黏合強度係藉由以90°角將焊接帶拉至電池表面而獲得。黏合強度的評定係以2.5 N或更高之黏合強度為良好的假設為基礎來加以指定。 The welding area is close to 2 mm × 2 mm. The bond strength is obtained by pulling the solder ribbon to the surface of the battery at an angle of 90°. The evaluation of the bond strength is specified on the assumption that the bond strength of 2.5 N or higher is good.
黏合性係針對實例1的試樣進行測定,且18個測量值的平均值為5.35 N。 The adhesion was measured for the sample of Example 1, and the average of the 18 measurements was 5.35 N.
除了使用48重量百分比的銀、12重量百分比的鎳、2重量百分比的Bi-Te-O、35.25重量百分比的有機介質、0.75重量百分比的Thixatrol®及2.0重量百分比的無機黏合性促進劑來製備該膏之外,實例2係如實例1所述般實行,該無機黏合性促進劑係由1.0重量百分比的ZnO、0.6重量百分比的Bi2O3及0.4重量百分比的銅組成。 Except that 48 weight percent silver, 12 weight percent nickel, 2 percent by weight of the Bi-Te-O, 35.25 weight percent organic medium, 0.75 weight percent of Thixatrol ® and 2.0 weight percent of an inorganic adhesion-promoting agent is used for preparing the In addition to the paste, Example 2 was carried out as described in Example 1, which consisted of 1.0% by weight of ZnO, 0.6% by weight of Bi 2 O 3 and 0.4% by weight of copper.
黏合性係如實例1所述般針對實例2的試樣測定。平均黏合性為4.94 N。 The adhesion was determined for the sample of Example 2 as described in Example 1. The average adhesion is 4.94 N.
除了使用42重量百分比的銀、18重量百分比的鎳、2.0重量百分比的Bi-Te-O、35.25重量百分比的有 機介質、0.75重量百分比的Thixatrol®及2.0重量百分比的無機黏合性促進劑來製備該膏之外,實例3係如實例1所述般實行,該無機黏合性促進劑係由1.0重量百分比的ZnO、0.6重量百分比的Bi2O3及0.4重量百分比的銅組成。 This was prepared except that 42 weight percent silver, 18 weight percent nickel, 2.0 weight percent Bi-Te-O, 35.25 weight percent organic media, 0.75 weight percent Thixatrol ® , and 2.0 weight percent inorganic adhesion promoter were used. In addition to the paste, Example 3 was carried out as described in Example 1, which consisted of 1.0% by weight of ZnO, 0.6% by weight of Bi 2 O 3 and 0.4% by weight of copper.
黏合性係如實例1所述般針對實例3的試樣測定。平均黏合性為4.14 N。 The adhesion was determined for the sample of Example 3 as described in Example 1. The average adhesion is 4.14 N.
除了使用36重量百分比的銀、24重量百分比的鎳、2.0重量百分比的Bi-Te-O、35.25重量百分比的有機介質、0.75重量百分比的Thixatrol®及2.0重量百分比的無機黏合性促進劑來製備該膏之外,實例4係如實例1所述般實行,該無機黏合性促進劑係由1.0重量百分比的ZnO、0.6重量百分比的Bi2O3及0.4重量百分比的銅組成。 Except that 36 weight percent silver, 24 weight percent nickel, 2.0 weight percent Bi-Te-O, 35.25 weight percent organic medium, 0.75 weight percent of Thixatrol ® and 2.0 weight percent of an inorganic adhesion-promoting agent is used for preparing the In addition to the paste, Example 4 was carried out as described in Example 1, which consisted of 1.0 weight percent ZnO, 0.6 weight percent Bi 2 O 3 and 0.4 weight percent copper.
黏合性係如實例1所述般針對實例4的試樣測定。平均黏合性為5.15 N。 The adhesion was determined for the sample of Example 4 as described in Example 1. The average adhesion is 5.15 N.
除了使用54重量百分比的銀、6重量百分比的鎳、4.5重量百分比的Bi-Te-O、32.75重量百分比的有機介質、0.75重量百分比的Thixatrol®及2.0重量百分比的無機黏合性促進劑來製備該膏之外,實例5係如實例1所述般實行,該無機黏合性促進劑係由1.0重量百分比 的ZnO、0.6重量百分比的Bi2O3及0.4重量百分比的銅組成。 Except that 54 weight percent silver, 6 weight percent nickel, 4.5 weight percent of Bi-Te-O, 32.75 weight percent organic medium, 0.75 weight percent of Thixatrol ® and 2.0 weight percent of an inorganic adhesion-promoting agent is used for preparing the In addition to the paste, Example 5 was carried out as described in Example 1, which consisted of 1.0% by weight of ZnO, 0.6% by weight of Bi 2 O 3 and 0.4% by weight of copper.
黏合性係如實例1所述般針對實例5的試樣測定。平均黏合性為3.00 N。 The adhesion was determined for the sample of Example 5 as described in Example 1. The average adhesion is 3.00 N.
除了使用48重量百分比的銀、12重量百分比的鎳、4.5重量百分比的Bi-Te-O、32.75重量百分比的有機介質、0.75重量百分比的Thixatrol®及2.0重量百分比的無機黏合性促進劑來製備該膏之外,實例6係如實例1所述般實行,該無機黏合性促進劑係由1.0重量百分比的ZnO、0.6重量百分比的Bi2O3及0.4重量百分比的銅組成。 Except that 48 weight percent silver, 12 weight percent nickel, 4.5 weight percent of Bi-Te-O, 32.75 weight percent organic medium, 0.75 weight percent of Thixatrol ® and 2.0 weight percent of an inorganic adhesion-promoting agent is used for preparing the In addition to the paste, Example 6 was carried out as described in Example 1, which consisted of 1.0 weight percent ZnO, 0.6 weight percent Bi 2 O 3 and 0.4 weight percent copper.
黏合性係如實例1所述般針對實例6的試樣測定。平均黏合性為4.43 N。 The adhesion was determined for the sample of Example 6 as described in Example 1. The average adhesion is 4.43 N.
10‧‧‧p型矽基材 10‧‧‧p-type substrate
20‧‧‧n型擴散層 20‧‧‧n type diffusion layer
30‧‧‧氮化矽薄膜、氧化鈦薄膜或氧化矽薄膜 30‧‧‧Nitride film, titanium oxide film or hafnium oxide film
40‧‧‧p+層(背面電場,BSF) 40‧‧‧p+ layer (back surface electric field, BSF)
60‧‧‧形成在背側上的鋁膏 60‧‧‧Aluminum paste formed on the back side
61‧‧‧鋁背側電極 61‧‧‧Aluminum backside electrode
70‧‧‧形成在背側上的銀/鋁膏 70‧‧‧Silver/aluminum paste formed on the back side
71‧‧‧銀/鋁背側電極 71‧‧‧Silver/aluminum backside electrode
500‧‧‧形成在前側上的銀膏 500‧‧‧ Silver paste formed on the front side
501‧‧‧銀前電極 501‧‧‧ Silver front electrode
102‧‧‧矽基材 102‧‧‧矽 substrate
104‧‧‧受光表面側電極 104‧‧‧Light-receiving surface side electrode
106‧‧‧用於鋁電極的膏組成物 106‧‧‧Paste composition for aluminum electrodes
108‧‧‧用於標誌電極之本發明的膏組成物 108‧‧‧The paste composition of the present invention for marking electrodes
110‧‧‧鋁電極 110‧‧‧Aluminum electrode
112‧‧‧標誌電極 112‧‧‧mark electrode
圖1A至1F繪示一半導體裝置之製造。示於圖1A至1F之參考數字解釋如下。 1A to 1F illustrate the fabrication of a semiconductor device. The reference numerals shown in Figs. 1A to 1F are explained below.
10:p型矽基材 10: p type germanium substrate
20:n型擴散層 20: n type diffusion layer
30:氮化矽薄膜、氧化鈦薄膜或氧化矽薄膜 30: tantalum nitride film, titanium oxide film or hafnium oxide film
40:p+層(背面電場,BSF) 40: p+ layer (back surface electric field, BSF)
60:形成在背側上的鋁膏 60: aluminum paste formed on the back side
61:鋁背側電極(由燒製背側鋁膏所得到的) 61: Aluminum back side electrode (obtained by firing the back side aluminum paste)
70:形成在背側上的銀/鋁膏 70: Silver/aluminum paste formed on the back side
71:銀/鋁背側電極(由燒製背側銀/鋁膏所得到的) 71: Silver/aluminum backside electrode (obtained by firing the backside silver/aluminum paste)
500:形成在前側上的銀膏 500: silver paste formed on the front side
501:銀前電極(由燒製前側銀膏所形成的) 501: silver front electrode (formed by firing the front side silver paste)
圖2A至2D解釋一用於使用本發明之導電膏製造太陽能電池之一實施例的製造程序。示於圖2A至2D之參考數字解釋如下。 2A to 2D explain a manufacturing procedure for an embodiment of manufacturing a solar cell using the conductive paste of the present invention. The reference numerals shown in Figs. 2A to 2D are explained below.
102 矽基材,其具有擴散層及一抗反射塗層 102 矽 substrate with a diffusion layer and an anti-reflective coating
104 受光表面側電極 104 light-receiving surface side electrode
106 用於鋁電極的膏組成物 106 Paste composition for aluminum electrodes
108 用於標誌電極之本發明的膏組成物 108 paste composition of the present invention for marking electrodes
110 鋁電極 110 aluminum electrode
112 標誌電極 112 mark electrode
102‧‧‧矽基材 102‧‧‧矽 substrate
104‧‧‧受光表面側電極 104‧‧‧Light-receiving surface side electrode
110‧‧‧鋁電極 110‧‧‧Aluminum electrode
112‧‧‧標誌電極 112‧‧‧mark electrode
Claims (9)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161486828P | 2011-05-17 | 2011-05-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201308630A true TW201308630A (en) | 2013-02-16 |
Family
ID=46172943
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101117589A TW201308630A (en) | 2011-05-17 | 2012-05-17 | Thick film paste containing bismuth-tellurium-oxide and its use in the manufacture of semiconductor devices |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP2710612A1 (en) |
TW (1) | TW201308630A (en) |
WO (1) | WO2012158905A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI657065B (en) * | 2015-11-13 | 2019-04-21 | 英商強生麥特公司 | Conductive paste and conductive track or coating |
CN111863309A (en) * | 2020-08-26 | 2020-10-30 | 南通天盛新能源股份有限公司 | A kind of high-strength busbar silver paste applied to N-type solar cells and preparation method thereof |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9023254B2 (en) * | 2011-10-20 | 2015-05-05 | E I Du Pont De Nemours And Company | Thick film silver paste and its use in the manufacture of semiconductor devices |
US9236161B2 (en) * | 2012-09-06 | 2016-01-12 | E I Du Pont De Nemours And Company | Conductive paste composition and semiconductor devices made therewith |
CN104813414B (en) * | 2012-09-18 | 2017-12-05 | 贺利氏贵金属北美康舍霍肯有限责任公司 | Conductive paste and solar cell |
JP6067726B2 (en) * | 2012-09-26 | 2017-01-25 | ヘレウス プレシャス メタルズ ノース アメリカ コンショホーケン エルエルシー | Conductive paste and solar cell |
CN103021514B (en) * | 2012-12-10 | 2016-02-17 | 合肥杰明新材料科技有限公司 | A kind of conductive silver aluminium paste containing adipate ester |
TWI521545B (en) * | 2014-12-08 | 2016-02-11 | 碩禾電子材料股份有限公司 | Conductive paste containing lead-free glass frit (2) |
TWI505294B (en) * | 2014-12-08 | 2015-10-21 | Giga Solar Materials Corp | Conductive paste containing lead-free glass frit (6) |
GB201520077D0 (en) | 2015-11-13 | 2015-12-30 | Johnson Matthey Plc | Conductive track or coating |
CN106007390B (en) * | 2016-05-13 | 2019-01-11 | 浙江光达电子科技有限公司 | Silicon solar cell front side silver paste Nonlead glass composition and preparation method thereof |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04270140A (en) * | 1990-06-21 | 1992-09-25 | Johnson Matthey Inc | Sealing glass composition and said composition containing electrically conductive component |
US7736546B2 (en) * | 2008-01-30 | 2010-06-15 | Basf Se | Glass frits |
-
2012
- 2012-05-17 EP EP12724039.8A patent/EP2710612A1/en not_active Withdrawn
- 2012-05-17 WO PCT/US2012/038331 patent/WO2012158905A1/en active Application Filing
- 2012-05-17 TW TW101117589A patent/TW201308630A/en unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI657065B (en) * | 2015-11-13 | 2019-04-21 | 英商強生麥特公司 | Conductive paste and conductive track or coating |
CN111863309A (en) * | 2020-08-26 | 2020-10-30 | 南通天盛新能源股份有限公司 | A kind of high-strength busbar silver paste applied to N-type solar cells and preparation method thereof |
CN111863309B (en) * | 2020-08-26 | 2021-10-08 | 南通天盛新能源股份有限公司 | A kind of high-strength busbar silver paste applied to N-type solar cells and preparation method thereof |
Also Published As
Publication number | Publication date |
---|---|
EP2710612A1 (en) | 2014-03-26 |
WO2012158905A1 (en) | 2012-11-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103443025B (en) | Thick film ink comprising bismuth-tellurium-oxide and its purposes in the manufacture of a semiconductor device | |
US8845932B2 (en) | Thick film paste containing bismuth-tellurium-oxide and its use in the manufacture of semiconductor devices | |
JP5782112B2 (en) | Thick film pastes containing lead and tellurium oxides and their use in the manufacture of semiconductor devices | |
US9023254B2 (en) | Thick film silver paste and its use in the manufacture of semiconductor devices | |
US9349883B2 (en) | Conductor for a solar cell | |
TW201308630A (en) | Thick film paste containing bismuth-tellurium-oxide and its use in the manufacture of semiconductor devices | |
TW201303892A (en) | Thick film paste containing bismuth-based oxide and its use in the manufacture of semiconductor devices | |
TW201308355A (en) | Thick film paste containing lead-tellurium-lithium-titanium-oxide and its use in the manufacture of semiconductor devices | |
US8691119B2 (en) | Thick film paste containing lead-tellurium-lithium-titanium-oxide and its use in the manufacture of semiconductor devices | |
CN104916348B (en) | Electrocondution slurry for electrode of solar battery | |
TW201303891A (en) | Thick film paste containing bismuth-based oxide and its use in the manufacture of semiconductor devices | |
TW201419309A (en) | Thick film silver paste and its use in the manufacture of semiconductor devices | |
US9245663B2 (en) | Thick film silver paste and its use in the manufacture of semiconductor devices | |
US20140083495A1 (en) | Conductive silver paste for a metal-wrap-through silicon solar cell | |
TW201409487A (en) | Conductive compositions containing Li2RuO3 and ion-exchanged Li2RuO3 and their use in the manufacture of semiconductor devices |