201243359 六、發明說明： 【發明所屬之技術領域】 本發明是有關於一種探針測試定位系統，特別是指一 種堆疊式測試定位系統。 【先前技術】 探針測試系統被廣泛地運用於各種工業，以測試或量 測各種裝置，例如印刷電路板或半導體晶圓…等等。傳統 的探針測試系統-般均是客製化，以適用於具尺寸與配置 等限制條件之特定型式的應用場合，因此，其適用性並不 佳，舉例來m，若傳統的探針測言式系統是被設計用來測試 小尺寸的印刷電路板，則當一大尺寸的印刷電路板超過它 原來設計的尺寸限制時，此種探針測試系統即會變得毫無 用處。 為了改善上述的缺失，便有人推出一種模組化的探針 測試系統（例如美國專利US7764079號），此種探針測試系 統大體上包含了一安裝基板、多種可供選用的配置元件， 及數可將被選用的配置元件固定於該安裝機板的快拆連接 器，然而，此種探針測試系統至少需使用6〇分鐘的時間， ，才忐從原來的配置型式轉換為另一種配置型式，而且， 其在不同的配置型式均需搭配不同的配置元件，無法利用 既有的配置7〇件加以擴充延伸，此外，此種探針測試系統 並無法支援電腦背板或主機板的垂直模式測試作業。 【發明内容】 因此本發明之目的，即在提供一種可擴充的堆疊式 201243359 測試定位系統。 、-宇橋ΓΓ測試定位系統，包含數堆疊腳塊 ，1㈣疊腳塊可互相磁吸 該等堆疊腳塊可形成二間Λ 置於Μ吉““ 直立結構。該架橋設 ;口乂荨直立…構的頂端，並盘該尊 ^ ΑΛ. ^ 。及直立，、告構互相磁吸。 該探針疋位機構設置於該牟 媒 *橋的頂側，並與該架橋互相磁 V/SL 0 【實施方式】 有關本發明之前述及其他技術内容、特點與功效’在 以下配合參考圆式之—較佳實施例的詳細說明中，將可清 楚的明白。 參閲圖1、2 ’為本發明堆疊式測試定位系統的較佳實 施例，該堆疊式測試定位系統包含：數堆_塊.1()、一架 橋20、二磁性板21，及一探針定位機構3〇。 如圖1、3所示，該等堆疊腳塊1〇可互相磁吸，該等 堆疊腳塊H)分別具有一塊體U，及至少一設置於該塊體η 底側的磁性元件12，該等塊體u具有導磁性。在本實施例 中，該塊體11的材質是金屬，該磁性元件12是磁鐵。 該等堆疊腳塊1〇可堆疊形成二間隔設置的直立結構13 如圖1、3所示，該架橋2〇設置於該等直立結構u的 頂端’並與該等直立結構13互相磁吸。 在本實施例中，該架橋20具有導磁性，該架橋20的 材質是金屬。 201243359 如圖1、3所示，該等磁性板2ι八 ^ 結構13頂端與該架橋 刀/於6玄等直立 立結構u互相磁吸。_之間’讓該架㈣與該等直 的頂Γ二2所示，該探針定位機構3〇設置於該架橋 =置;與該架橋2°互相磁吸。該探針定位機構3" 有二於該架橋2。頂側並與該架橋2。互相磁吸的基座 a置於《座40的三㈣整裝置5()、 整裝置％連接的第-連桿6Q、—第二連桿I—:= :第…連桿6〇、70之間的第-球离接頭⑼、-第三連 Ϊ Γο。'置於忒第二、三連桿70、9〇之間的旋轉接頭裝 置_ '-夾頭裝置2〇〇 ’及一設置於該第三連桿％與該 夾頭裝置200之間的第二球窩接頭300。 如圖1所示’該基座40具有一座體41，及至少一設置 於該座體41底側的磁性元件42,該座體41具有導磁性。 在本實施例中，該座體41的材質是金屬，該磁性元件芯 是磁鐵。 如圖4、5所不’該三軸調整裝置5〇包括一設置於該 基座4〇並具有一沿—Χ軸向延伸的第-滑轨511的基台51 、一可移ίΜ也設置於該第一㈣511並具有一沿—Υ轴向 延伸的第—滑執521的第_滑座52、__樞設於該基台51並 沿該χ軸向延伸且與該第一滑座52螺接的第一螺桿53、— 可移動地設置於該第二滑軌521並具有一沿一 ζ軸向延伸 的第三滑軌541的第二滑座54、一樞設於該第一滑座52並 沿该Υ軸向延伸且與該第二滑座54螺接的第二螺桿55、 201243359 -可移動地設置於該第三滑& 5 設於嗲笛-冰庙〇从 们弟月座56’及一樞 又於该第一座54並沿該z軸向延伸且 螺接的第三螺桿57。如此， 一第二滑座56 桿53可驅使啰第… 實施例中’旋動該第-螺 二1驗«-餘52相對於該基台 動’旋動該第二螺桿55可 。亥X軸向移 -滑座52沿該Y軸向移動，=滑座54相對於該第 軸。移動，旋動該第三螺桿57可驅使該 第三滑座56相對於該第二滑座5"該Z轴向移動。 。如圖Η所示，該第一連桿⑼與該第三滑座56連接 如圖6、7所示，該第_抹、诠 Μ υ 第球窩接頭80具有一設置於該 W…向該第二連桿7〇的一端的第一球頭Μ，及 :轉動地β又置於第二連桿7〇朝向該第一連桿⑼的一端 的第—球离82,該第一球窩82具有一第一球寫槽821，及 :可供該第-連桿60避入的缺口 822，該第一球頭81與該 第一球窩槽821可轉動地銜接。 如圖ό 7所不’该第二連桿7〇具有一沿長度延伸並 與該第一球窩槽821連通的第二軸孔71〇 如圖6 7所不，該第二球寫接頭3〇〇具有一設置於該 夾：裝置200的第二球頭31〇,及—可轉動地設置於該第三 連才干90朝向4夾頭裝置的—端的第二球窩32〇，該第 球离320具有-第二球窩槽321，及一可供該夾頭裝置 200與該第二球頭31〇連接的桿段避入的缺口 μ〕，該第二 球頭310與該第二球窩槽321可轉動地銜接。 如圖6、7所示，該第三連桿9〇具有一沿長度延伸並 201243359 與該第二球窩槽321連通的第三轴孔91。 如圖6、7 i - ’所不，該旋轉接頭裝置100包括一設置於該 第一連桿70相向於該第三連桿90的一端並具有一與該第 二轴孔71連通的第一套接孔m的第一套接環u〇、一設 置於°亥一連才干90相向於該第二連桿70的一端並具有一與 X第軸孔91連通的第二套接孔121的第二套接環12〇、 一分別沿該X軸向可移動地設置於該第二、三軸孔71、91 的頂桿130、一沿該γ軸向可移動地設置於該第一套接孔 111的第一边緊件14〇、一沿該γ軸向可移動地設置於該第 二套接孔121的第二迫緊件15()、—調整旋鈕⑽及一介 於該第一、一套接環110、120之間的墊圈17〇。 該第一迫緊件140具有-穿孔141，及一朝向其中一頂 桿130的第一凸輪面142。 D亥第一迫緊件150具有一套接於該二套接孔121的套 接段151，及一從該套接段151延伸出並穿出該穿孔⑷的 累接奴152。5亥套接段151具有一朝向另一頂桿13〇的第二 凸輪面153。 该調整旋鈕160與該螺接段152螺接，並位於該第— 迫緊件140的外側。 如圖8所示，當該調整旋&⑽旋緊並抵緊該第一迫 緊件刚，使該第-迫緊件14〇與該套接段i5i互相靠近時 ’該第一、二凸輪面142、153分別抵緊該等軸桿130,迫 使該等軸桿no分別抵緊該-、二球頭81、31〇，限制該第 -、二套接環110、120之間的相對運動 '該第一球頭與 201243359 球寫二二相對運動收 球8接頭Γ 運動，在此狀態下，由於該第-、二 :該二與該旋轉接頭裝£丨。。均被鎖緊，因此 、三連;^ 不能相對於該第—連桿60樞擺，該二 残相㈣置細也 16。即可同時將:第樞擺’簡言之，旋緊該調整旋紐 裝置二、三連桿6g、7g、9g與該夾頭 00之間的相對位置固定在一特定位置。 抿緊，第也h圖7所不’當該調整旋鈕160旋鬆並不再 第一迫緊件140時’該第-、二凸輪面H2'153分 別鬆釋該等車由桿130,使該等轴桿13〇不再抵緊該一、二球 :=、31°’因此，該第一、二套接環11〇、12°之間的相 及二：第一球頭81與該第一球寫82之間的相對運動 ^丨、頭310與該第二球窩32〇之間的相對運動均不 再受到限制，在此狀態下，由於該第一、二球寫接頭8〇、 3〇〇與該旋轉接頭裝置⑽不再被鎖緊，該第二連桿7〇即 可相對於該第-連桿6〇自由地插擺，該二、三連桿7〇、％ 之間也可自由地相對轉動，該夾頭裝i 2⑽也可相對於該 第三連桿90自由地樞擺，簡言之，旋鬆該調整旋紐16〇即 可讓該第-、二、三連桿6〇、7〇、9〇與該夾頭裝置_之 間的相對位置任意地調整。 如圖9、10、11所示，該央頭裝置2〇〇具有一與該第二 球頭31G連接的端桿件21G、—拖設於該端桿件2ι〇的夹持 桿件220、一設置於該端桿件210與該夾持桿件22〇之間的 201243359 壓縮彈簧23〇、一马罟认分+姑均从 叹置於该夾持柃件220的偏轉調整螺栓 240、-設置於該夹持桿件22〇的夾持調整螺检㈣，及一 設置於該夾持桿件22〇而可供夾持一探針4〇〇(見圖⑺ 的夾頭260。 該端桿件210具有一與該第二球頭31〇 如圖10所示 延伸出的第一樞接段 連接的基段211 ’及一從該基段211 212。 如圖1〇、11、12所示，該夾持桿件220具有一與該第 一樞接段柩212接並與該基段211互相間隔的第二樞接段 221及從該第二樞接段221延伸出的夾持段222。 該第二樞接段221具有二平行壁223，及一連接於該等 平行壁223之間的側壁224，該等平行壁223與該側壁— 配合界定出一樞接空間226，該側壁224具有一與該樞接空 間226連通並朝向該第一樞接段212的側螺孔225，該第一 樞接段212樞接於該等平行壁223之間。 β亥夾持段222具二互相平行的夾持壁227，位於上方的 其中一夾持壁227具有一穿孔228，位於下方的另一夾持壁 227具有一螺孔229。 如圖10、11所示，該壓縮彈簧23〇抵接於該基段211 朝向該夾持桿件220的一端與該側壁224朝向該端桿件21〇 的一端之間.，並被預壓。 如圖11所示’該偏轉調整螺栓24〇與該側螺孔225螺 接並朝向該第一樞接段212，當調整該偏轉調整螺栓24〇延 伸入該樞接空間226的深度時，可改變該夾持桿件22〇相 201243359 對於該端桿件210枢擺的角度；如圖13所示，當該偏轉調 整螺拴240延伸入該樞接空間226的深度變小或完全退出 該樞接空間226時，該壓縮彈簧230將推動該夾持桿件22〇 ，使該夾持桿件220帶動該夾頭260相對於該端桿件21〇 繞該z軸向順時針擺動；相反地，如圖14所示，當該偏轉 調整螺栓240延伸入該枢接空間226的深度變大時，該偏 轉調整螺栓240會推抵該第一插接段212，而使該夾持桿件 220帶動該夾頭260相對於該端桿件21〇繞該z軸向逆時針 擺動’並擠壓該壓縮彈簧230’由此可知，旋動該偏轉調整 螺检240即可使該夾持桿件22Q帶動該夾頭細繞該z轴 向做擺動，改變該夹頭260所夾持的探針4〇〇 (見圖17) 的指向。 如圖10、15所示，該夾持調整螺栓25〇具有一位於上 方的夾持壁227之外的紐頭251，及_從該钮頭25 i延伸出 並穿過該穿孔228至與該螺孔229螺接的螺桿段252。 如圖ίο、15所示，該夾頭260具有一第一夾具26ι、 一=置於該第一夾具261並延伸至該等夹持壁227之間的 軸才干262、-可移動地設置於該第一夾具26ι並相對於該第 夾具261疋位的第二夾具263、—抵靠於該第—夾具加 的導滑塊264、二穿過該導滑塊264與該第二夾具263至與 5第夾八261連接的導栓265，及一與該第二夹具⑹螺 接的調整螺栓266。 夾具261具有—第一水平壁267，及—從該第 該第 水平壁267端緣朝下延伸出的第一垂直壁268201243359 VI. Description of the Invention: [Technical Field] The present invention relates to a probe test positioning system, and more particularly to a stacked test positioning system. [Prior Art] Probe test systems are widely used in various industries to test or measure various devices such as printed circuit boards or semiconductor wafers, and the like. Traditional probe test systems are generally custom-made for specific types of applications with constraints on size and configuration. Therefore, their applicability is not good. For example, if traditional probes are used. The speech system is designed to test small-sized printed circuit boards, and when a large-sized printed circuit board exceeds its original design size limit, such a probe test system becomes useless. In order to improve the above-mentioned deficiency, a modular probe test system (for example, US Pat. No. 7,746,079) has been proposed. The probe test system generally comprises a mounting substrate, a plurality of optional configuration components, and a plurality of The selected configuration component can be fixed to the quick release connector of the mounting board. However, the probe test system needs at least 6 minutes to convert from the original configuration type to another configuration type. Moreover, it needs to be matched with different configuration components in different configuration types, and cannot be extended and extended by using the existing configuration. In addition, the probe test system cannot support the vertical mode of the computer backboard or the motherboard. Test the job. SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide an expandable stacked 201243359 test positioning system. , - Yuqiao ΓΓ test positioning system, including several stacking feet, 1 (four) stacking blocks can be magnetically attracted to each other. These stacked foot blocks can form two Λ placed in the Μ "" upright structure. The bridge is set up; the mouth is erected... the top of the structure, and the disc is the one that stands for ^ ΑΛ. ^. And erect, telling each other magnetic. The probe clamping mechanism is disposed on the top side of the buffer* bridge and magnetically V/SL 0 with the bridge. [Embodiment] The foregoing and other technical contents, features and functions of the present invention are combined with reference circles below. The detailed description of the preferred embodiments will be apparent. 1 and 2′ are preferred embodiments of the stacked test positioning system of the present invention. The stacked test positioning system includes: a plurality of stacks. 1 (), a bridge 20, two magnetic plates 21, and a probe. Needle positioning mechanism 3〇. As shown in FIG. 1 and FIG. 3, the stacking blocks 1 磁 are magnetically attracted to each other, and the stacking blocks H) respectively have a body U and at least one magnetic element 12 disposed on the bottom side of the block η. The block u has magnetic permeability. In the present embodiment, the material of the block 11 is metal, and the magnetic element 12 is a magnet. The stacking blocks 1 〇 can be stacked to form two spaced apart upright structures 13 as shown in Figs. 1 and 3, which are disposed at the top end of the upright structures u and magnetically attracted to the upright structures 13. In this embodiment, the bridge 20 has magnetic permeability, and the material of the bridge 20 is metal. 201243359 As shown in Figs. 1 and 3, the tops of the magnetic plates 2 ι 8 ^ are magnetically attracted to the erecting knives/the erecting structures u and the like. Between the _ between the frame (four) and the straight top Γ 2 2, the probe positioning mechanism 3 〇 is set at the bridge = set; and the bridge 2 ° magnetic mutual. The probe positioning mechanism 3" has two of the bridges 2. The top side is with the bridge 2. The bases a magnetically attracted to each other are placed in the three (four) device 5 () of the seat 40, the first link 6Q connected to the entire device, the second link I -: =: the ... link 6 〇, 70 The first ball is separated from the joint (9), and the third is connected to the joint. a rotary joint device _ '- collet device 2 忒 ' placed between the second and third links 70, 9 及 and a portion disposed between the third link % and the collet device 200 Two ball joints 300. As shown in Fig. 1, the base 40 has a body 41 and at least one magnetic member 42 disposed on the bottom side of the base 41. The base 41 has magnetic permeability. In this embodiment, the material of the base 41 is metal, and the core of the magnetic element is a magnet. As shown in FIGS. 4 and 5, the triaxial adjustment device 5 includes a base 51 disposed on the base 4 and having a first slide rail 511 extending in the axial direction, and a movable platform is also provided. The first (four) 511 and the first slider 521 of the first sliding 521 extending in the axial direction are pivoted on the base 51 and extend along the axial direction of the first sliding seat. a first screw 53 that is screwed, a second sliding seat 54 that is movably disposed on the second sliding rail 521 and has a third sliding rail 541 extending in an axial direction, and is pivoted to the first a second screw 55, 201243359, which is axially extended along the yoke and is screwed to the second sliding seat 54, is movably disposed on the third sliding & The moon seat 56' and a third screw 57 which is pivotally connected to the first seat 54 and extends along the z-axis. Thus, a second slider 56 rod 53 can drive the second screw 55 to be rotated relative to the base by rotating the first screw in the embodiment. The X-axis shifts - the carriage 52 moves along the Y-axis, = the carriage 54 is opposite the first axis. Moving, rotating the third screw 57 can drive the third carriage 56 to move relative to the second carriage 5" . As shown in FIG. ,, the first connecting rod (9) is connected to the third sliding seat 56 as shown in FIGS. 6 and 7. The first ball joint and the first ball joint 80 have a setting on the W... a first ball end 一端 at one end of the second link 7〇, and a rotative ground β is placed on the second ball 7 〇 toward the end of the first link (9), the first ball socket 82, the first ball socket 82 has a first ball writing slot 821, and a notch 822 that can be avoided by the first link 60. The first ball head 81 is rotatably engaged with the first ball socket 821. As shown in FIG. 7 , the second link 7 has a second shaft hole 71 extending along the length and communicating with the first ball socket 821. The second ball joint 3 is not shown in FIG. The crucible has a second ball head 31〇 disposed on the clip: the device 200, and a second ball socket 32〇 rotatably disposed at the end of the third connector 90 toward the 4 collet device, the ball The distance from 320 has a second ball socket 321 and a notch μ for the rod segment to be connected to the second ball 31 〇, the second ball 310 and the second ball The socket 321 is rotatably engaged. As shown in FIGS. 6 and 7, the third link 9A has a third shaft hole 91 extending along the length and 201243359 communicating with the second ball socket 321 . As shown in FIG. 6, 7 i - ', the rotary joint device 100 includes a first end disposed at the first link 70 facing the third link 90 and having a first communication with the second shaft hole 71. a first socket ring u〇 of the socket hole m, and a second socket hole 121 disposed at one end of the second link 70 and having a second socket hole 121 communicating with the X-axis hole 91 a second socket 12〇, a ejector 130 movably disposed along the X-axis of the second and third shaft holes 71, 91, and a yoke movably disposed along the γ-axis in the first socket a first tensioning member 14〇 of the hole 111, a second pressing member 15() movably disposed along the γ axial direction of the second socket hole 121, an adjustment knob (10), and an intervening A set of washers 17 之间 between the rings 110, 120. The first pressing member 140 has a through hole 141 and a first cam surface 142 facing one of the top rods 130. The first pressing member 150 of the D-hai has a sleeve portion 151 connected to the two sockets 121, and a splicing slave 152. 5 sets of sleeves extending from the socket portion 151 and passing through the through hole (4) The joint 151 has a second cam surface 153 facing the other ram 13 。. The adjusting knob 160 is screwed to the screwing section 152 and is located outside the first pressing member 140. As shown in FIG. 8, when the adjusting knob & (10) is screwed and abuts against the first pressing member, the first pressing member 14 is brought close to the socket portion i5i. The cam faces 142, 153 respectively abut the shafts 130, forcing the shafts no to abut against the - and the two ball heads 81, 31, respectively, limiting the relative relationship between the first and second sets of rings 110, 120. The movement 'the first ball head with the 201243359 ball writes 22 two relative movements to receive the ball 8 joint Γ movement, in this state, due to the first -, second: the two with the rotary joint loaded. . Both are locked, so, three connected; ^ can not be pivoted relative to the first link 60, the two residual phases (four) are also thin 16 . At the same time, the first pivoting position can be simultaneously fixed. In a short, the relative position between the adjusting knob 2, the three links 6g, 7g, 9g and the collet 00 is fixed at a specific position. Tightening, the same as FIG. 7 does not 'when the adjusting knob 160 is loosened and no longer the first pressing member 140', the first and second cam faces H2' 153 release the car by the lever 130, respectively The shafts 13〇 no longer abut the one or two balls:=, 31°' Therefore, the first and second sockets 11〇, 12° phase and two: the first ball head 81 and the The relative motion between the first ball write 82, the relative movement between the head 310 and the second ball socket 32〇 is no longer limited, in this state, due to the first and second ball write joints 8〇 3, and the rotary joint device (10) is no longer locked, the second link 7〇 can be freely inserted relative to the first link 6〇, the second and third links 7〇, % The first clamping device i 2 (10) is also freely pivotable relative to the third connecting rod 90. In short, the adjusting knob 16 is loosened to allow the first, second, The relative position between the three links 6〇, 7〇, 9〇 and the chuck device _ is arbitrarily adjusted. As shown in FIG. 9, 10, and 11, the end cap device 2 has an end rod member 21G connected to the second ball head 31G, a clamping rod member 220 that is dragged to the end rod member 2ι, A 201243359 compression spring 23〇 disposed between the end rod member 210 and the clamping rod member 22〇, a horse 罟 分 + 姑 姑 姑 姑 从 从 从 偏转 偏转 偏转 偏转 偏转 偏转 偏转 偏转 偏转 偏转 偏转 偏转 240 240 240 240 240 240 a clamping adjustment screw (4) disposed on the clamping rod member 22A, and a clamp head 260 disposed on the clamping rod member 22 for clamping a probe 4 (see (7). The rod member 210 has a base portion 211 ' coupled to the first ball joint portion of the second ball head 31 延伸 as shown in FIG. 10 and a base portion 211 211 from the base portion 211 212. As shown in FIGS. 1 , 11 , 12 The clamping rod member 220 has a second pivoting portion 221 that is connected to the first pivoting portion 柩212 and spaced apart from the base portion 211, and a clamping portion that extends from the second pivoting portion 221 The second pivoting section 221 has two parallel walls 223 and a side wall 224 connected between the parallel walls 223. The parallel walls 223 cooperate with the side walls to define a pivoting space 226. 224 a side screw hole 225 communicating with the pivoting space 226 and facing the first pivoting section 212. The first pivoting section 212 is pivotally connected between the parallel walls 223. The β-clamping section 222 has two mutual Parallel clamping walls 227, one of the clamping walls 227 above has a perforation 228, and the other clamping wall 227 located below has a screw hole 229. As shown in Figures 10 and 11, the compression spring 23 is abutted. Connected to the end of the base member 211 toward the clamping rod member 220 and the side wall 224 facing the end of the end rod member 21, and is pre-stressed. As shown in Fig. 11, the deflection adjusting bolt 24 The side screw hole 225 is screwed and faces the first pivoting section 212. When the depth of the pivoting adjustment bolt 24 is extended into the pivoting space 226, the clamping rod 22 can be changed to the end of the current portion 201243359. The angle at which the lever member 210 pivots; as shown in FIG. 13, when the depth of the yaw adjustment screw 240 extending into the pivoting space 226 becomes smaller or completely exits the pivoting space 226, the compression spring 230 will push the clip Holding the rod 22 〇, the clamping rod member 220 drives the collet 260 to circumscribe the z-axis with respect to the end rod member 21 The needle swinging; conversely, as shown in FIG. 14, when the depth of the deflection adjusting bolt 240 extending into the pivoting space 226 becomes larger, the deflection adjusting bolt 240 pushes against the first plugging section 212, and the The clamping rod member 220 drives the collet 260 to swing counterclockwise about the z-axis with respect to the end rod member 21 and presses the compression spring 230'. It can be seen that the deflection adjustment screw 240 can be rotated. The clamping bar member 22Q drives the collet to swing around the z-axis to change the orientation of the probe 4〇〇 (see FIG. 17) held by the collet 260. As shown in FIGS. 10 and 15, the clamping adjustment bolt 25 has a button 251 located outside the upper clamping wall 227, and _ extends from the button head 25 i and passes through the through hole 228 to The screw hole 229 is screwed to the screw segment 252. As shown in FIG. 1, the chuck 260 has a first clamp 26, a shaft 262 disposed between the first clamp 261 and extending between the clamping walls 227, and is movably disposed on The first clamp 261 is opposite to the second clamp 263 which is clamped with respect to the first clamp 261, abuts against the guide clamp 264 of the first clamp, and passes through the guide slider 264 and the second clamp 263 to a guide bolt 265 connected to the fifth clamp 261, and an adjustment bolt 266 screwed to the second clamp (6). The clamp 261 has a first horizontal wall 267, and a first vertical wall 268 extending downward from an end edge of the first horizontal wall 267.
S 10 201243359 該軸桿262設置於該第—垂直壁268，當該夾持調整螺 栓250旋緊並使該鈕頭251抵緊上方的失持壁227時，可 使該等夾持壁227互相靠近，並夾緊該軸桿262，當該夾持 調整螺栓250旋鬆時，該等夾持壁227恢復平行，並鬆釋 該軸桿262,如此，當旋鬆該夾持調整螺栓25〇時，該軸桿 262即可相對於該夾持桿件22〇樞轉，讓該第一、二夹呈 26卜263可相對於該失持桿件22。繞該γ轴向擺動，而^ 變該第-、二夾具261、263所夾持的探針彻（見圖17) 相對於該夾持桿件220的上、下傾角。 該第二夾具263具有一第二垂直壁269，及二分別從該 第二垂直壁269兩端緣水平延伸出的第二水平壁27〇 ,該第 -水平壁267介於該等第二水平& 27〇之間，該第二垂'直 壁269具有一導溝271。 該導滑塊264位於該第二#直壁⑽外側，該等導检 265分別穿過該導滑塊264及該導溝271至與該第—水平壁 267連接，讓該導滑塊264抵靠於該第二垂直壁2的。 該調整螺栓266與位於下方的其中一第二水平壁27( 螺接並朝向該第-水平壁267，當旋人該調整螺栓加時， 該調整螺栓266可朝上推動該第—水平壁％ 具加相對於該第二爽具加朝上移動，縮小該第 =267與上方的第二水平壁27〇之間的距離，以爽緊該探 ，十_ (見® 17);相反地，當旋出該調整螺才全施時，該 ^一夹具261可相對於該第二夾具263朝下移動，放大該 第一水平壁267與上方的第二水平壁⑽之間的距離，以 201243359 鬆釋該探針400 (見圖17) β 藉此’ 16、17所示’當使用者要湘本發明對一 =板500進行水平模式的測試作業時，可先利用四失持 =⑽定位該電路板·;接著，再將該等堆叠塊腳ι〇 等度，而形成位於該電路板遍兩側之外的該 架構13’該等直立架構13頂端是高料電路板· 接Ϊ者具Γ該架橋20定位於該等直立結構13的頂端； :再將該探針定位機構30定位於該架橋20 ,並將該探 針400夾固定位於 I肘这侏 接著，使用者可將該旋轉接 頭裝置1〇0的調整独⑽旋鬆，待初步調整該第-、二 ::=。，、9。與該央頭裝置2。。之間的相對位置後 8。，與該旋轉接頭裝置二有1:球咖 也可旋動該偏_整螺栓_， ，使用者 , 以调整该夾頭260所夾持的 頭木 ^指向，或旋鬆該央持調整螺检250，以調整該央 爽持的探針400的傾角，以讓該探針 了初步心向所欲測試的區域叙 調整裝置50的第—、使用者可方疋動該三轴 , —、二累才干 53、55、57’ 以在該 χ、 路板50(^微調該央頭細所夹持的探針4〇0相對於該電 D 、區域，如此，該探針4〇〇 定區域進行水平模柄職作業。卩了對錢路板_的特 再者’使用者切在㈣料5⑽的另—側 "月的-組探針定位機構3〇，並將該探針定位機構％的 S： 12 201243359 夾頭裝置200的灸頭260拆卸下來，如此，即可將一筆型 的電子顯微鏡520直接夾持於該夾持桿件22〇的夾持段222 ’以利用該電子顯微鏡520來拍攝該探針400所測試區域 的影像。可以理解的是，該探針彻與該電子顯微鏡52〇 均可與-電腦設備（圖未示，例如筆記型電腦）電連接。 此外’圖17所示的水平模式的測試作業也可延伸應用 於直接測試-安裝於-電腦主機（圖未示）内的主機板（ 圖未示），即’使用者只需將該電腦主機的側蓋打蓋，並讓 該電腦主機以側蓋開口朝上的方式平躺，再將該等堆叠腳 塊1〇堆疊至該等直立架帛13的頂端高於該電腦主機，如 此，使用者即可利用上述的操作方式直接對該電腦主機内 的主機板進行測試，換句話說，使用者完全不需特地將該 主機板從該電腦主機内拆下，就可以對該主機板進行測試 ，省時又方便。 另外’如圖18所^當使料要洲本發明對該電路 板500進行垂直模式的測試作業時，可先利用二垂直堆疊 的定位裝置_搭配一介於該等定位裝置6〇〇之間的定: 塊㈣，來夾持該電路板的左、右兩側與底側；接著， 將本發明的'组探針定位機構％擺置於該電路板_ 地：類似上述的操作方式，讓該探針的針頭精確 地才曰向所欲測試的區域’如此，該探冑彻即可對 板500的特定區域進行垂直模式的測試 _ 用者也可在該電路5⑽之前擺置另 m地’使 位機構3。’並將該探針定位機構3〇的夹頭裝置 13 201243359 260拆卸下來，以利用夾持於該夾持桿件22()的該電子顯微 鏡520來拍攝該探針400所測試區域的影像。 經由以上的說明，可再將本發明的優點歸納如下： 一、 本發明只需更換不同長度的架橋2〇，並將該芊橋 20定位於堆#至駭高度的直立結構13上，即可將相同的 探針定位機構3G定位於該架橋2G上，並利用該探針定位 機構所爽㈣探針铜㈣不同尺寸的電路板進行進水 平模式的測試作業，相較於習知技術，本發明可適用於不 同尺寸的電路板，特別是大尺寸的電路板，因此，本發明 的擴充性佳。 二、 本發明在組立的過程中完不需使用到手工具，因 此，本發明在組立上相當方便與快速。 三、 本發明可利用該三軸調整裝置5〇在該X、γ、ζ軸 向上’微調該夾頭26G所夾持的探針相對於該電路板 5〇〇的位置’因此，本發明可增進該探針彻的測試精確度 〇 四、 本發明的探針定位機構30只需操作該調整旋紐 160即可同時鎖緊或鬆釋該第一、二球窩接頭80、300與 該旋轉接頭裝置1〇〇，便於使用者調整定位該第一、二、I 連桿6〇、7〇、90與該夹頭裝置之間的相對位置，讓: 夾頭260所夾持的探針400相對於該三軸調整裝置5〇產生 不同距離與不同指向的組合變化，因此，該探針定位機構 3〇在使用上相當具有彈性，至少可適用於對該電路板_ 進行水平模式或垂直模式的測試作業。S 10 201243359 The shaft 262 is disposed on the first vertical wall 268. When the clamping adjustment bolt 250 is screwed and the button head 251 is abutted against the upper detent wall 227, the clamping walls 227 can be mutually Closely, and clamping the shaft 262, when the clamping adjustment bolt 250 is unscrewed, the clamping walls 227 are restored in parallel, and the shaft 262 is released, so that when the clamping adjustment bolt 25 is loosened. The shaft 262 can be pivoted relative to the clamping bar 22 , such that the first and second clips are 26 263 relative to the missing lever 22 . The y-axis is swung around the γ, and the upper and lower inclination angles of the probes (see FIG. 17) held by the first and second clamps 261 and 263 with respect to the clamping rod 220 are changed. The second clamp 263 has a second vertical wall 269, and two second horizontal walls 27 respectively extending horizontally from opposite ends of the second vertical wall 269, and the first horizontal wall 267 is between the second level Between 27 〇, the second vertical straight wall 269 has a guide groove 271. The guide slider 264 is located outside the second straight wall (10), and the guides 265 are respectively passed through the guide slider 264 and the guide groove 271 to be connected to the first horizontal wall 267, so that the guide slider 264 is abutted. Relying on the second vertical wall 2. The adjusting bolt 266 and one of the second horizontal walls 27 located below are screwed and facing the first horizontal wall 267. When the adjusting bolt is applied, the adjusting bolt 266 can push the first horizontal wall upwards. Adding an upward movement relative to the second cooling device, reducing the distance between the first=267 and the upper second horizontal wall 27〇 to cool the probe, ten_ (see ® 17); conversely, When the adjustment screw is fully applied, the clamp 261 can move downward relative to the second clamp 263, and enlarge the distance between the first horizontal wall 267 and the upper second horizontal wall (10) to 201243359 Loosen the probe 400 (see Figure 17) β by '16, 17'. When the user wants to test the horizontal mode of a = plate 500, the user can first use the four-loss = (10) positioning. The board is then equated to form the structure 13's outside the two sides of the board. The tops of the upright structures 13 are high-level boards. The bridge 20 is positioned at the top end of the upright structures 13; the probe positioning mechanism 30 is positioned at the bridge 20 again. The probe 400 is fixed to the I elbow. Then, the user can loosen the adjustment of the rotary joint device 1〇0 (10), and the first, second, and the like are to be initially adjusted. The relative position between the head unit 2 is 8. After the rotary joint device 2 has a 1: the ball can also rotate the partial bolt _, the user adjusts the chuck 260 to hold The head wood ^ points, or loosens the central adjustment screw 250 to adjust the tilt angle of the centrally held probe 400, so that the probe has a preliminary orientation to the area of the adjustment device 50 - the user can shake the three axes, -, two tired talents 53, 55, 57' to the probe, the road plate 50 (^ fine-tuning the probe 4 〇 0 relative to the Electric D, area, and so on, the probe 4 is set to perform the horizontal mold-handling operation. The user of the money board _ is cut in the other side of the (4) material 5 (10) - month - The set of probe positioning mechanism 3〇, and the probe positioning mechanism% of the S: 12 201243359 chuck head device 200 of the moxibustion head 260 is removed, so that a type of electronic The micromirror 520 is directly clamped to the clamping section 222 ′ of the clamping lever 22 以 to capture an image of the test area of the probe 400 by using the electron microscope 520. It can be understood that the probe is completely related to the electron. The microscope 52〇 can be electrically connected to a computer device (not shown, such as a notebook computer). In addition, the horizontal mode test operation shown in Figure 17 can also be extended to direct test-installed on the computer host (Figure not The motherboard (not shown) in the display), that is, the user only needs to cover the side cover of the computer main body, and let the computer main body lie flat with the side cover opening upward, and then stack the legs. The top of the block 1 is stacked above the top of the upright frame 13 so that the user can directly test the motherboard in the host computer by using the above operation mode. In other words, the user does not at all It is necessary to specifically remove the motherboard from the host computer to test the motherboard, which is time-saving and convenient. In addition, as shown in FIG. 18, when the board is subjected to the vertical mode test operation of the circuit board 500, the two vertically stacked positioning devices can be used first with a setting between the positioning devices 6〇〇. : block (four) for clamping the left and right sides and the bottom side of the circuit board; then, placing the 'group probe positioning mechanism % of the present invention on the circuit board _ ground: similar to the above operation mode, let The needle of the probe is precisely pointed to the area to be tested. Thus, the probe can be tested in a vertical mode on a specific area of the board 500. The user can also place another m ground before the circuit 5 (10). Positioning mechanism 3. The collet device 13 201243359 260 of the probe positioning mechanism 3 is detached to take an image of the test area of the probe 400 by the electron microscope 520 clamped to the holder member 22 (). Through the above description, the advantages of the present invention can be further summarized as follows: 1. The present invention only needs to replace the bridge 2 of different lengths, and position the bridge 20 on the upright structure 13 of the stack # to the height of the stack. Positioning the same probe positioning mechanism 3G on the bridge 2G, and using the probe positioning mechanism to perform (four) probe copper (four) different size circuit boards for horizontal mode test operation, compared with the prior art, this The invention is applicable to circuit boards of different sizes, particularly large-sized circuit boards, and therefore, the present invention is excellent in expandability. 2. The present invention does not require the use of hand tools during the assembly process, and thus the present invention is relatively convenient and fast in assembly. 3. The present invention can utilize the triaxial adjustment device 5 to 'finely adjust the position of the probe clamped by the collet 26G relative to the circuit board 5' in the X, γ, and ζ axial directions. Therefore, the present invention can Improving the thorough test accuracy of the probe. Fourth, the probe positioning mechanism 30 of the present invention can simultaneously lock or release the first and second ball joints 80, 300 and the rotation only by operating the adjustment knob 160. The joint device 1〇〇 is convenient for the user to adjust the relative position between the first, second and I links 6〇, 7〇, 90 and the chuck device, so that: the probe 400 clamped by the chuck 260 The combination of different distances and different orientations is generated with respect to the three-axis adjustment device 5〇. Therefore, the probe positioning mechanism 3 is relatively flexible in use, and is at least suitable for horizontal or vertical mode of the board _ Test job.
S 14 201243359 五、 本發明探針定位機構30的夾頭裝置2〇〇只需操作 忒偏轉調整螺栓24〇,即可微調該夾頭26〇所夾持的 4〇〇的指向，在使用上相當方便。 六、 本發明探針定位機構3〇的夾頭裝置2〇〇只需操作 該夾持調整螺栓25〇，即可微調該夾頭26〇所夾持的探針 400的傾角’在使用上相當方便。 紅上所述，本發明之堆疊式測試定位系統，不僅擴充 性佳，且可適用於不同的應用場合，並且在組立上相當方 便與快速，故確實能達成本發明之目的。 惟以上所述者，僅為本發明之較佳實施例而已，當不 月b以此限疋本發明貫施之範圍，即大凡依本發明申請專利 範圍及發明說明内容所作之簡單的等效變化與修飾，皆仍 屬本發明專利涵蓋之範圍内。 15 201243359 【圖式簡單說明】 圖1是本發明的堆疊式測試定位系統一較佳實施例的 側視示意圖； 圖2是圖1的俯視示意圖； 圖3是該較佳實施例的數堆疊腳塊、一架橋與二磁性 板的分解立體示意圖； 圖4疋該較佳實施例的一探針定位機構的一三軸調整 裝置的分解立體示意圖； 圖5疋5玄二軸調整裝置的組合剖視示意圖； 圖6是該探針定位機構的一第一連桿、一第二連桿、 第球窩接頭、一第三連桿、一旋轉接頭裝置與一第 一球窩接頭的分解立體示意圖； 圖7是圖6的組合剖視示意圖，說明該第一、二球寫 接頭與該旋轉接頭裝置被鬆釋； 圖8是一類似於圖7的視圖，說明該第一、二球窩接 頭與該旋轉接頭裝置被鎖緊； 圖9是該探針定位機構的一夾頭裝置的組合立體示意 圖； 圖10是圖9的分解立體示意圖； 圖11是圆9的俯視示意圖； 圖12是圖丨丨中χ jj -χ n割面線的剖視示意圖； 圖13是一類似於圖11的視圖，說明該夾頭裝置的—夹 持桿件相對於一端桿件順時針擺動； 圖14是一類似於圖11的視圖，說明該夾持桿件相對於S 14 201243359 V. The chuck device 2 of the probe positioning mechanism 30 of the present invention only needs to operate the yaw deflection adjusting bolt 24 〇 to finely adjust the orientation of the 4 夹持 held by the chuck 26 , in use. Quite convenient. 6. The chuck device 2 of the probe positioning mechanism of the present invention only needs to operate the clamping adjustment bolt 25〇, and can finely adjust the inclination angle of the probe 400 held by the chuck 26〇. Convenience. As described above, the stacked test positioning system of the present invention is not only expandable, but also applicable to different applications, and is quite convenient and fast in assembly, so that the object of the present invention can be achieved. However, the above is only a preferred embodiment of the present invention, and is not limited to the scope of the present invention, that is, the simple equivalent of the scope of the patent application and the description of the invention. Variations and modifications are still within the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side elevational view of a preferred embodiment of a stacked test positioning system of the present invention; FIG. 2 is a top plan view of FIG. 1; FIG. 3 is a plurality of stacked legs of the preferred embodiment. 3D exploded perspective view of a block, a bridge and two magnetic plates; FIG. 4 is an exploded perspective view of a three-axis adjusting device of a probe positioning mechanism of the preferred embodiment; FIG. Figure 6 is an exploded perspective view of a first link, a second link, a ball joint, a third link, a rotary joint device and a first ball joint of the probe positioning mechanism. Figure 7 is a schematic cross-sectional view of the combination of Figure 1, illustrating the first and second ball joints and the rotary joint device being released; Figure 8 is a view similar to Figure 7, illustrating the first and second ball joints Figure 9 is an exploded perspective view of the collet device of the probe positioning mechanism; Figure 10 is an exploded perspective view of Figure 9; Figure 11 is a top plan view of the circle 9;丨丨中χ jj -χ n cut line Figure 13 is a view similar to Figure 11 illustrating the clamping member of the collet device swinging clockwise relative to the end member; Figure 14 is a view similar to Figure 11 illustrating the clamping Relative to the rod
S 16 201243359 該端桿件逆時針擺動； 圖15是圖11中X ν-X V割面線的剖視示意圖； 圖1<5是本發明與一電路板的分解立體示意圖； 圖17疋一側視示意圖，說明本發明對該電路板進行水 平模式的測試作業；及 圖18是一前視示意圖 直模式的測試作業。 說明本發明對該電路板進行垂 17 201243359 【主要元件符號說明】S 16 201243359 The end rod swings counterclockwise; Fig. 15 is a cross-sectional view of the X ν-XV cut line in Fig. 11; Fig. 1 <5 is an exploded perspective view of the present invention and a circuit board; Referring to the schematic diagram, the present invention performs a horizontal mode test operation on the circuit board; and FIG. 18 is a front view schematic straight mode test operation. DESCRIPTION OF THE INVENTION The present invention is carried out on the circuit board. 17 201243359 [Explanation of main component symbols]
S 10·.··. •…堆疊腳塊 71…… …·第二軸孔 11 ••… …·塊體 80…… …第一球窩接頭 12····. •…磁性元件 81…… …·第一球頭 13·...· •…直立結構 82…… …·第一球窩 20•.… 橋 821 ··· •…第一球窩槽 21 ••… •…磁性板 822 ··· .·.·缺口 30····· •…探針定位機構 90…… …·第三連桿 40·.··. …·基座 91…… —第—轴孔 41 ·.··· 座體 100… …·旋轉接頭裝置 42··... •…磁性元件 110 ... •…第一套接環 50 •…三軸調整裝置 111 ··· •…第一套接孔 51 ··.·· …·基台 120 ··· …·第二套接環 511… •…第一滑軌 121 .... •…第二套接孔 52···.. …·第 滑座 130… …·頂桿 521… •…第二滑執 140 ·· •…第一迫緊件 53••… …·第一螺桿 141 .... …·第一穿孔 54·.··. •…第二滑座 142 ··· —第 凸輪面 541… •…第三滑軌 150 ·… …·第二迫緊件 55···.. •…第二螺桿. 151 .··. …·套接段 56••… •…第三滑座 152 ···. •…螺接段 57····. •…第三螺桿 153 ··· …·第二凸輪面 60··..· •…第連杯 160… …·調整旋鈕 70 •…第二連桿 170 .··. …·墊圈 18 201243359 200 ··· •…夾頭裝置 265… …·導栓 210 .... •…端桿件 266… •…調整螺栓 211 ···· •…基段 267 ···. …·第一水平壁. 212 ··.. …·第一樞接段 268… …·第一垂直壁 220 ···. •…夾持桿件 269… •…第二垂直壁 221 ··· …第二枢接段 270 ···. …·第二水平壁 222 ···· …夾持段 271… …·導溝 223 ·.·. …平行壁 300… •…第二球窩接頭 224 ··· •…側壁 310… …·第二球頭 225 ··· •…側螺孔 320… …·第二球窩 226 ··.. …樞接空間 321… —第一球窩槽 227 ··· …·夾持壁 322… ..··缺口 228 ···. …穿孔 400… …·探針 229 ·.·. …螺孔 500·.· •…電路板 230 ··· …·壓縮彈簣 510… •…夾持裝置 240 ·.·. …·偏轉調整螺栓 520… —顯微鏡 250… •…夾持調整螺栓 600… •…定位裝置 251 ··· …·紐頭 610… •…定位塊 252 ···' •…螺桿段 X…… •…軸向 260… 失頭 …·軸向 261… •…第一夾具 Z…… ----轴向 262 .......軸桿 263……第二夾具 264 .......導滑塊 19S 10····. •...Stacking foot block 71............·Second shaft hole 11 ••...·Block 80... First ball joint 12····.... Magnetic element 81... ...·first ball head 13·...·•...upright structure 82.........first ball socket 20•.... bridge 821 ··· •...first ball socket 21 ••... •...magnetic plate 822 ··· . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ..················································································ Contact hole 51 ·······Base 120 ·····Second sleeve ring 511...•...first slide rail 121........second sleeve hole 52···.. ... · Slider 130 ... ... ejector 521 ... • ... second slipper 140 · · • ... first pressing member 53 • • ... ... first screw 141 .... ... ... first perforation 54 ·. ···•...Second slide 142 ··· —The first cam surface 541...•...The third slide rail 150... ·Second pressing member 55···.. •...Second screw. 151 .··....·Sleeve segment 56••... •...Slide 3 152 ···. •... screw segment 57· ····•...the third screw 153 ·····the second cam surface 60······...the first cup 160...the adjustment knob 70...the second link 170.··....· Washer 18 201243359 200 ··· •... Chuck device 265... .... Guide pin 210 .... • End member 266... • Adjusting bolt 211 ·····...Base section 267 ···. First horizontal wall. 212 ···.....the first pivoting section 268...the first vertical wall 220 ····....the clamping bar 269...the second vertical wall 221 ··· ... Two pivoting sections 270 ····....the second horizontal wall 222 ·····the clamping section 271...the guiding groove 223 ·.....the parallel wall 300...the second ball joint 224 ·· · •... Side wall 310...··Second ball head 225 ···•...Side screw hole 320...·Second ball socket 226 ···.....Pivot space 321...——First ball socket 227 ··· ...·Clamping wall 322.....·. Notch 228 ···....Perforation 400... ·Probe 229 ·..... Screw hole 500·.·•...Circuit board 230·····Compression magazine 510... •...Clamping device 240 ······ deflection adjustment bolt 520...——Microscope 250 ... •...Clamping adjustment bolts 600... •...Positioning device 251 ·····Nutou 610... •...Positioning block 252 ···' •...Screw segment X... •...Axis 260... Lost head...·Axis To 261... •...first clamp Z... ----axial 262.......shaft 263...second clamp 264.......guide slider 19