TW201211329A - Quartz glass crucible for pulling up silicon single crystal and production method therefor - Google Patents
Quartz glass crucible for pulling up silicon single crystal and production method therefor Download PDFInfo
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- TW201211329A TW201211329A TW100120357A TW100120357A TW201211329A TW 201211329 A TW201211329 A TW 201211329A TW 100120357 A TW100120357 A TW 100120357A TW 100120357 A TW100120357 A TW 100120357A TW 201211329 A TW201211329 A TW 201211329A
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
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Abstract
Description
201211329 六、發明說明: 【發明所屬之技術領域】 本發明有關一種使用於矽單結晶拉延之石英玻璃坩鍋 及其製造方法。 【先前技術】 以往,如單結晶半導體材料之單結晶物質之製造已廣 爲採用稱爲所謂喬赫拉斯基(Czochraski )法之方法。該 方法係於容器內使多結晶矽熔融,於該熔融浴內進入種晶 之端部邊旋轉邊拉延者,而於種晶上使具有同一結晶方位 之單結晶成長。該單結晶拉延容器一般使用石英玻璃坩鍋 〇 多晶矽於石英玻璃坩鍋中熔解,拉延矽單結晶之際, 於矽熔融物表面發生振動波面。無法使矽種晶接合於矽熔 融物,而使矽單結晶之結晶性混亂之問題爲經常發生之現 象。 作爲該原因之一,舉例有於石英玻璃坩鍋內表面形成 爲合成石英玻璃層。於石英玻璃坩鍋內表面形成爲合成石 英玻璃層時,由於合成石英玻璃層爲實質上無氣泡,故在 ' 係單結晶拉延之際容易引起液面振動。 尤其,近幾年來,隨著矽單結晶成爲8吋以上,石英 玻璃坩鍋亦變爲大口徑’液面振動問題變得益形重要。 爲解決如上述之液面振動問題,例如於專利文獻1 ~4 中揭示有藉由使坩鍋內表面粗面化而抑制 '液面振動之技術 -5- 201211329 然而,本發明人等經重覆積極硏究之結果,發現即使 於粗面化時,亦有發生液面振動抑制效果差之情況,因而 烷成本發明。 [先前技術文獻] [專利文獻1] 專利文獻1 :特開2000-72594 專利文獻2:特開2000-327478 專利文獻3 :特開2005-272178 專利文獻4:特開2005-320241 【發明內容】 [發明欲解決之課題] 本發明係鑒於上述情況而成者,目的係提供可有效率 地抑制矽單結晶拉延時之液面振動發生之矽單結晶拉延用 石英玻璃坩鍋及其製造方法。 [用以解決課題之手段] 爲解決上述課題,本發明之矽單結晶拉延用石英玻璃 坩鍋係使種晶與矽熔液接觸並拉延以育成矽單結晶之矽單 結晶拉延用石英玻璃坩鍋,其包含半透明石英玻璃層之坩 鍋基體及形成於前述坩鍋基體內壁面上之透明合成石英玻 璃層,並具有上端部開口而成之縱本體部及於該縱本體部201211329 VI. Description of the Invention: [Technical Field] The present invention relates to a quartz glass crucible for use in a single crystal drawing and a method for producing the same. [Prior Art] Conventionally, a method called a so-called Jozraski method has been widely used for the production of a single crystal material such as a single crystal semiconductor material. In this method, a polycrystalline ruthenium is melted in a container, and a single crystal having the same crystal orientation is grown on the seed crystal while the inside of the molten bath enters the end of the seed crystal while rotating. The single crystal drawing container is generally melted in a quartz glass crucible by using a quartz glass crucible, and a vibration wavefront is generated on the surface of the crucible melt when the single crystal is drawn. The problem that the bismuth crystal is not bonded to the ruthenium melt and the crystallinity of the ruthenium single crystal is disturbed is a frequent occurrence. One of the reasons for this is that the inner surface of the quartz glass crucible is formed as a synthetic quartz glass layer. When the inner surface of the quartz glass crucible is formed into a synthetic quartz glass layer, since the synthetic quartz glass layer is substantially free of bubbles, the liquid surface vibration is likely to occur when the single crystal is drawn. In particular, in recent years, as the single crystal of bismuth has become 8 吋 or more, the quartz glass crucible has also become a large-caliber liquid level vibration problem. In order to solve the problem of the liquid surface vibration as described above, for example, Patent Literatures 1 to 4 disclose a technique for suppressing 'liquid surface vibration by roughening the inner surface of the crucible.-5-201211329 However, the inventors of the present invention have As a result of the active investigation, it was found that even when the surface was roughened, there was a case where the liquid surface vibration suppression effect was poor, and thus the alkane cost was invented. [Prior Art Document] [Patent Document 1] Patent Document 1: JP-A-2000-72594 Patent Document 2: JP-A-2000-327478 Patent Document 3: JP-A-2005-272178 Patent Document 4: JP-A-2005-320241 [Problem to be Solved by the Invention] The present invention has been made in view of the above circumstances, and an object thereof is to provide a quartz glass crucible for single crystal drawing which can effectively suppress liquid level vibration of a single crystal pulling delay and a method for producing the same . [Means for Solving the Problem] In order to solve the above-mentioned problems, the quartz glass crucible for the single crystal drawing of the present invention is used for the single crystal drawing of the single crystal in which the seed crystal is brought into contact with the tantalum melt and drawn to form a single crystal. a quartz glass crucible comprising a crucible base of a translucent quartz glass layer and a transparent synthetic quartz glass layer formed on the inner wall surface of the crucible base body, and having a vertical body portion opened at an upper end portion and the vertical body portion
S -6- 201211329 形成爲圓弧狀之底部,前述透明合成石英玻璃層表面之縱 本體部表面之一部分設有帶狀粗面區域,於較前述帶狀粗 面區域更下方之前述透明合成石英玻璃層表面之下部區域 設爲平滑面,前述帶狀粗面區域之算術平均粗糙度(Ra) 爲2〜9 μιη,前述帶狀粗面區域係設置爲使前述矽熔液在初 期狀態之液面成爲前述帶狀粗面區域之範圍內。 本說明書中,所謂算術平均粗糙度(Ra )係指於 JISB060 1中記載之算術平均粗糙度。 所謂前述帶狀粗面區域意指於前述透明合成石英玻璃 層表面之一部分形成爲帶狀之粗面區域。 所謂前述矽熔液於初期狀態之液面意指矽單結晶拉延 前之矽熔液裝入前述石英玻璃坩鍋內之狀態之液面。 又,本發明中所謂矽單結晶拉延時之液面振動意指種 晶與矽熔液接合,經過種晶縮頸,到矽單結晶之肩部形成 開始前之間所見到之液面振動。 前述帶狀粗面區域之距離前述石英玻璃坩鍋端部之位 置雖依據前述石英玻璃坩鍋之直徑或製造條件適當設定即 可’但有必要將前述帶狀粗面區域設置爲使前述矽熔液於 初期狀態之液面位置在前述帶狀粗面區域之範圍內。至於 前述帶狀粗面區域,係前述矽熔液於初期狀態之液面於中 心至少爲± 1 0mm,較好使得自液面朝下方之最大寬度成爲 5 0mm以內。 又,前述帶狀粗面區域較好藉由使用石英粉之鼓風處 理而形成。至於前述石英粉,係使用合成石英粉或高純度 201211329 天然石英粉。 再者,前述作爲前述平滑面之下部區域之算術平均粗 糙度(Ra)較好爲Ra: 0.09#m以下,更好爲Ra: 〇.〇3;zm 以下。 前述鼓風處理可適當爲乾式或濕式。 前述鼓風處理,係藉由以壓縮空氣或離心力噴吹石英 粉而使前述石英玻璃坩鍋內表面粗面化。至於前述鼓風處 理,可爲噴吹石英粉之乾式鼓風,亦可爲與水等流體一起 噴吹石英粉之濕式鼓風。至於石英粉,較好爲粒徑106ym 〜355/im範圍之石英粉的重量累積爲80%以上。粒徑之測 定及篩選若使用篩網即可。 本發明之矽單結晶拉延用石英玻璃坩鍋之製造方法, 爲使種晶與矽熔液接觸並拉延以育成矽單結晶之矽單結晶 拉延用石英玻璃坩鍋之製造方法,其特徵爲在於包括:製 作石英玻璃坩鍋,該石英玻璃坩鍋包含半透明石英玻璃層 之坩鍋基體及形成於前述坩鍋基體內壁面上之透明合成石 英玻璃層,且具有上端部開口而成之縱本體部表面及於該 縱本體部形成爲圓弧狀之底部,前述透明合成石英玻璃層 表面之一部分設有帶狀粗面區域,且將較前述帶狀粗面區 域更下方之前述透明合成石英玻璃層表面之下部區域設爲 平滑面,前述帶狀粗面區域之算術平均粗糙度(Ra)爲 2〜9μιη,前述帶狀粗面區域係設置爲使前述矽熔液在初期 狀態之液面位置位於前述帶狀粗面區域之範圍內。 又,前述帶狀粗面區域較好藉由使用石英粉之鼓風處S -6- 201211329 is formed in an arc-shaped bottom portion, and a part of the surface of the vertical body portion on the surface of the transparent synthetic quartz glass layer is provided with a strip-shaped rough surface region, and the transparent synthetic quartz is located below the strip-shaped rough surface region. The lower portion of the surface of the glass layer is a smooth surface, and the arithmetic mean roughness (Ra) of the strip-shaped rough surface region is 2 to 9 μm, and the strip-shaped rough surface region is set to be a liquid for causing the ruthenium melt in an initial state. The surface is within the range of the strip-shaped rough surface region. In the present specification, the arithmetic mean roughness (Ra) means the arithmetic mean roughness described in JIS B060 1. The strip-shaped rough surface region means that a part of the surface of the transparent synthetic quartz glass layer is formed into a strip-shaped rough surface region. The liquid level in the initial state of the crucible melt means a liquid surface in a state in which the crucible melt before the single crystal drawing is filled in the quartz glass crucible. Further, in the present invention, the liquid surface vibration of the single crystal pulling delay means that the seed crystal is bonded to the tantalum melt, and the liquid surface vibration is seen between the formation of the shoulder portion of the single crystal by the seed crystal necking. The distance between the strip-shaped rough surface region and the end portion of the quartz glass crucible may be appropriately set according to the diameter of the quartz glass crucible or the manufacturing conditions, but it is necessary to set the strip-shaped rough surface region to melt the foregoing crucible. The liquid level position of the liquid in the initial state is in the range of the aforementioned strip-shaped rough surface area. In the strip-shaped rough surface region, the liquid level in the initial state of the crucible melt is at least ± 10 mm in the center, and it is preferable that the maximum width from the liquid surface toward the bottom is 50 mm or less. Further, the strip-shaped rough surface region is preferably formed by blast treatment using quartz powder. As for the aforementioned quartz powder, synthetic quartz powder or high-purity 201211329 natural quartz powder is used. Further, the arithmetic mean roughness (Ra) of the region below the smooth surface is preferably Ra: 0.09 #m or less, more preferably Ra: 〇.〇3; zm or less. The aforementioned blast treatment may be suitably dry or wet. In the blast treatment, the inner surface of the quartz glass crucible is roughened by blowing quartz powder by compressed air or centrifugal force. As for the aforementioned blast treatment, it may be a dry blast which blows quartz powder, or a wet blast which blows quartz powder together with a fluid such as water. As for the quartz powder, it is preferred that the weight of the quartz powder having a particle diameter of from 106 μm to 355/im is 80% or more. The particle size can be measured and screened using a sieve. The method for producing a quartz glass crucible for a single crystal drawing of the present invention, the method for producing a quartz glass crucible for single crystal drawing in which a seed crystal is contacted with a tantalum melt and drawn to form a single crystal, The utility model is characterized in that the quartz glass crucible comprises a crucible base of a translucent quartz glass layer and a transparent synthetic quartz glass layer formed on the inner wall surface of the crucible base body, and has an upper end opening. The surface of the vertical body portion and the bottom portion of the vertical body portion are formed in an arc shape, and one of the surfaces of the transparent synthetic quartz glass layer is provided with a strip-shaped rough surface region, and the transparent portion is lower than the strip-shaped rough surface region. The lower surface of the surface of the synthetic quartz glass layer is a smooth surface, and the arithmetic mean roughness (Ra) of the strip-shaped rough surface region is 2 to 9 μm, and the strip-shaped rough surface region is set such that the tantalum melt is in an initial state. The liquid level position is within the range of the aforementioned strip-shaped rough surface area. Further, the strip-shaped rough surface region is preferably made by using a blast furnace of quartz powder.
S -8 - 201211329 理而形成。 前述平滑面區域之算術平均粗糙度(Ra )較好爲Ra : 0.09μιη以下,更好爲Ra: 0 03μιη以下。 再者’前述鼓風處理宜爲乾式或濕式處理。 又’本發明中適用之坩鍋口徑並無特別限制,可使用 各種口徑之坩鍋。 [發明效果] 依據本發明,具有可提供可有效地抑制矽單結晶拉延 時之液面振動發生之矽單結晶拉延用石英玻璃坩鍋以及其 製造方法之顯著較大效果。 又’依據本發明,具有亦縮短操作時間及提高成品率 之顯著較大效果。 【實施方式】 以下,基於附圖對本發明之一的實施形態加以說明, 但該等說明僅爲例示性表示者,當然不應解釋爲限定》 圖1中,符號10表示本發明之矽單結晶拉延用石英玻 璃坩鍋。矽單結晶拉延用石英玻璃坩鍋10爲使種晶與矽熔 液接觸並拉延以育成矽單結晶之矽單結晶拉延用石英玻璃 坩鍋,其包含半透明石英玻璃層之坩鍋基體12及形成於前 述坦鍋基體12內壁面上之透明合成石英玻璃層14,且具有 上端部22開口而成之縱本體部24及於該縱本體部24形成爲 圓弧狀之底部26,前述透明合成石英玻璃層14之縱本體部 201211329 24之一部分設有帶狀粗面區域18,且將較前述帶狀粗面區 域18更下方之前述透明合成石英玻璃層表面之下部區域28 設爲平滑面。又,符號2 0爲帶狀粗面區域18之凹部。 前述帶狀粗面區域18之算術平均粗糙度(Ra)爲 2~9μιη,前述帶狀粗面區域18係設置爲使前述矽熔液在初 期狀態之液面16與前述帶狀粗面區域18接觸。圖1之例中 ,前述帶狀粗面區域18之寬度W之恰於中間部分能成爲矽 熔液於初期狀態之液面16。.且自上端部22至帶狀粗面區域 18爲止之距離d,由於可依據坩鍋口徑或矽熔液量等各種 製造條件而改變,故並未特別限定。以使矽熔液於初期狀 態之液面16接觸前述帶狀粗面區域18之方式,調節距離d 並設置前述帶狀粗面區域18即可。且,成爲前述平滑面之 下部區域之算術平均粗糙度(Ra)較好爲Ra: 0.09μπι以下 ,更好爲Ra : 0.03μιη以下。 且,關於比前述帶狀粗面區域18更上方之前述透明合 成石英玻璃層表面之上部區域30,可設爲粗面,亦可設爲 平滑面,但若考慮因與原料的多晶矽接觸導致之石英片剝 離,則更好爲平滑面。圖示例係表示上述區域30與下部區 域28同樣爲平滑面之例。 如此,以使矽熔液於初期狀態之液面1 6與前述帶狀粗 面區域18接觸之方式設置前述帶狀粗面區域18,故可抑制 矽單結晶拉延時之液面振動發生。 實施例S -8 - 201211329 was formed. The arithmetic mean roughness (Ra) of the smooth surface region is preferably Ra: 0.09 μm or less, more preferably Ra: 0 03 μmη or less. Further, the aforementioned blast treatment is preferably dry or wet. Further, the caliber of the crucible to be used in the present invention is not particularly limited, and crucibles of various calibers can be used. [Effect of the Invention] According to the present invention, it is possible to provide a quartz glass crucible for single crystal drawing which can effectively suppress the occurrence of liquid surface vibration during the drawing of a single crystal, and a method for producing the same. Further, according to the present invention, it has a significant effect of shortening the operation time and improving the yield. [Embodiment] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings, but these descriptions are merely illustrative and should not be construed as limiting. FIG. The drawing is made of quartz glass crucible. Quartz glass crucible 10 for single crystal drawing is a quartz glass crucible for single crystal drawing, which is made by contacting and growing a seed crystal with a crucible melt, and comprises a translucent quartz glass layer crucible The base body 12 and the transparent synthetic quartz glass layer 14 formed on the inner wall surface of the can body base 12 have a vertical body portion 24 in which the upper end portion 22 is opened, and a bottom portion 26 in which the vertical body portion 24 is formed in an arc shape. One of the vertical body portions 201211329 24 of the transparent synthetic quartz glass layer 14 is provided with a strip-shaped rough surface region 18, and the lower transparent synthetic quartz glass layer surface lower portion 28 is disposed below the strip-shaped rough surface region 18 Smooth surface. Further, the symbol 20 is a concave portion of the strip-shaped rough surface region 18. The arithmetic mean roughness (Ra) of the strip-shaped rough surface region 18 is 2 to 9 μm, and the strip-shaped rough surface region 18 is provided so that the liquid surface 16 of the first molten metal in the initial state and the strip-shaped rough surface region 18 are provided. contact. In the example of Fig. 1, the width W of the strip-shaped rough surface region 18 can be the liquid level 16 in the initial state of the melt in the middle portion. Further, the distance d from the upper end portion 22 to the strip-shaped rough surface region 18 is not particularly limited because it can be changed depending on various manufacturing conditions such as the crucible diameter or the amount of the crucible melt. The strip-shaped rough surface region 18 may be provided so that the liquid surface 16 in the initial state of the crucible melt contacts the strip-shaped rough surface region 18 so as to adjust the distance d. Further, the arithmetic mean roughness (Ra) of the lower region which is the smooth surface is preferably Ra: 0.09 μm or less, more preferably Ra: 0.03 μm or less. Further, the upper surface region 30 of the transparent synthetic quartz glass layer above the strip-shaped rough surface region 18 may be a rough surface or a smooth surface, but it is considered to be in contact with the polycrystalline germanium of the raw material. When the quartz piece is peeled off, it is better to smooth the surface. The example of the figure shows an example in which the above-described area 30 and the lower area 28 are smooth surfaces. In this manner, the strip-shaped rough surface region 18 is provided so that the liquid surface 16 in the initial state of the tantalum melt contacts the strip-shaped rough surface region 18, so that the occurrence of the liquid surface vibration of the single crystal pulling delay can be suppressed. Example
S •10- 201211329 以下’列舉本發明之實施例更具體加以說明,但本發 明並非限定於該等實施例者,只要不脫離本發明之技術思 想’當然可進行各種變形。 (實施例1 ) 將粒徑50〜500μιη之天然石英粉供給於旋轉之內徑 570nm之模具內,成型出由厚度25mm之粉體層所成之成型 體’利用電弧放電自該成型體內部加熱熔融且同時在其高 溫氛圍中以100g/min之比例供給OH濃度爲40ppm之合成石 英玻璃粉,使無泡之透明玻璃層遍及全部內表面區域,以 l~3mm之厚度形成。對於結束熔融並冷卻之直徑 5 5 5〜560mm之石英玻璃坩鍋,進行上端部切割以使高度成 爲3 70mm,製作20個石英玻璃坩鍋。對於前述石英玻璃坩 鍋,於縱本體部內面,僅於與上端部之距離d爲60mm、寬 度爲40mm (亦即距離上端部60mm~100mm之範圍)之帶狀 粗面區域,以抽氣式空氣噴出處理進行粗面化製作1 〇個石 英玻璃坩鍋。粗面化處理時,對於不進行粗面化處理之上 部區域及下部區域,使用遮蔽膠帶預先予以遮蔽。粗面化 處理係以上端部向下之方式使石英玻璃坩鍋倒轉之狀態對 內壁面進行。對於作爲噴出材使用之高純度天然石英粉測 定其粒度分佈’結果</>l〇6ym~355#m所佔之比例爲87重 量%。測定各坩鍋之帶狀粗面區域之面粗糙度,結果爲Ra :3.72〜3.88/z m’且上部區域、下部區域之Ra分別爲 0.0 0〜0.02vm、〇·〇〇〜〇.〇2#m。於該石英玻璃坩鍋充塡聚 -11 - 201211329 矽140kg,於操作條件A進行矽單結晶拉延後,所有坩鍋均 未見到以往所發生之使種晶與矽熔液接合、經過種晶縮頸 、直至矽單結晶之肩部開始形成之期間所見到之矽熔液面 之振動,而可自動地操作,確認到操作時間之縮短及矽單 結晶之成品率提高。結果示於表1。且,表1及表2中,所 謂噴砂處理條件之範圍,表示進行噴砂處理之帶狀粗面區 域之位置,亦即表示與上端部之距離d〜該聚離d +帶狀粗面 區域之寬度W者。 本說明書中,所謂操作時間,係指自矽單結晶之拉延 開始至拉延結束所需之時間。於表1中,所謂操作時間率 ,爲以往之例的比較例1之操作時間設爲1時之比率,例如 於實施例1之操作時間率時,係由實施例1之操作時間+比 較例1之操作時間=實施例1之操作時間率而算出。操作時 間率越低,表示不需要利用操作員手動調整等而可自動操 作等,而可縮短操作時間。又所謂成品率,爲以以往例的 比較例1之矽單結晶之成品數設爲1時之比率。例如實施例 1之成品率時,係由實施例1之成品數+比較例1成品數=實 施例1之成品率而算出。成品率越高,表示成品數提高。 (實施例2 ) 變更實施例1之噴出處理條件,進行距離上端部 50mm〜1 l〇mm之範圍的帶狀粗面區域之粗面化處理。粗面 化處理之際,對於不進行粗面化處理之上部區域及下部區 域使用遮蔽膠帶預先予以遮蔽。粗面化處理係以上端部向The following is a more detailed description of the embodiments of the present invention. However, the invention is not limited to the embodiments, and various modifications may be made without departing from the spirit of the invention. (Example 1) A natural quartz powder having a particle diameter of 50 to 500 μm was supplied into a mold having a rotating inner diameter of 570 nm, and a molded body formed of a powder layer having a thickness of 25 mm was molded and heated from the inside of the molded body by arc discharge. At the same time, a synthetic quartz glass powder having an OH concentration of 40 ppm was supplied at a rate of 100 g/min in a high-temperature atmosphere, and a bubble-free transparent glass layer was formed over the entire inner surface region at a thickness of 1 to 3 mm. For the quartz glass crucible having a diameter of 5 5 5 to 560 mm which was melted and cooled, the upper end was cut to have a height of 3 70 mm, and 20 quartz glass crucibles were produced. In the quartz glass crucible, the inner surface of the vertical body portion is only a strip-shaped rough surface region having a distance d from the upper end portion of 60 mm and a width of 40 mm (that is, a range from 60 mm to 100 mm from the upper end portion). The air is sprayed and roughened to make 1 quartz glass crucible. In the roughening treatment, the upper region and the lower region which are not subjected to the roughening treatment are masked in advance using a masking tape. The roughening treatment is performed such that the upper end portion of the quartz glass crucible is inverted to the inner wall surface. The ratio of the particle size distribution of the high-purity natural quartz powder used as the ejected material was </>l〇6ym~355#m, which was 87% by weight. The surface roughness of the strip-shaped rough surface region of each crucible was measured, and as a result, Ra: 3.72 to 3.88/z m' and the Ra of the upper region and the lower region were 0.0 0 to 0.02 vm, respectively, 〇·〇〇~〇.〇 2#m. After the quartz glass crucible was filled with poly-l-11 - 201211329 矽140kg, after the single crystal drawing was carried out under the operating condition A, all the crucibles did not show the conventional bonding of the seed crystal and the crucible melt, and the seed was passed through The crystal neck and the vibration of the molten metal surface which are seen during the formation of the shoulder of the single crystal are automatically operated, and it is confirmed that the operation time is shortened and the yield of the single crystal is improved. The results are shown in Table 1. Further, in Tables 1 and 2, the range of the blasting treatment conditions indicates the position of the strip-shaped rough surface region subjected to the blasting treatment, that is, the distance d from the upper end portion to the condensed d + strip-shaped rough surface region. Width W. In the present specification, the term "operation time" refers to the time required from the start of the drawing of the single crystal to the end of the drawing. In Table 1, the operation time rate is a ratio when the operation time of Comparative Example 1 of the prior art is set to 1, for example, the operation time rate of the first embodiment is the operation time of the first embodiment + comparative example. The operation time of 1 = the operation time rate of Example 1 was calculated. The lower the operating time ratio, the automatic operation is not required by the operator's manual adjustment, etc., and the operation time can be shortened. In addition, the yield is a ratio when the number of finished products of the single crystal of Comparative Example 1 of the prior art is set to 1. For example, the yield of the first embodiment is calculated from the number of finished products of the first embodiment + the number of finished products of the comparative example 1 = the yield of the first embodiment. The higher the yield, the higher the number of finished products. (Example 2) The discharge processing conditions of Example 1 were changed, and the roughening treatment of the strip-shaped rough surface region in the range of 50 mm to 1 l〇mm from the upper end portion was performed. In the roughening treatment, the upper region and the lower region are not masked by masking tape without roughening. Roughening treatment
S -12- 201211329 下之方式使石英玻璃坩鍋倒轉之狀態對內壁面進行。結果 示於表1。如表1所示並未發生液面振動。 (實施例3 ) 替代抽氣式空氣噴出而利用濕式噴出處理,進行距離 上端部6 Omm~ 11 0mm之範圍的帶狀粗面區域之粗面化處理 。粗面化處理之際,對於不進行粗面化處理之上部區域及 下部區域使用遮蔽膠帶預先予以遮蔽。粗面化處理係以上 端部向下之方式使石英玻璃坩鍋倒轉之狀態對內壁面進行 。又,噴出材係使用於實施例1之空氣噴出中使用者相同 之天然石英粉。結果示於表1。如表1所示,種晶與矽熔液 接合,經過種晶縮頸,直至矽單結晶之肩部開始形成之期 間並未發生液面振動。 (實施例4 ) 對於較帶狀粗面區域(距離上端部60mm~100mm之範 圍)更上方之上部區域液進行粗面化處理。僅於下部區域 利用遮蔽膠帶進行遮蔽,上部區域不進行遮蔽。結果示於 表1。如表1所示並未發生液面振動。且粗面化處理係不使 石英玻璃坩鍋倒轉而進行。進行遮蔽之下部區域之算術平 均粗糙度(Ra)成爲低値,未進行遮蔽之上述區域之算術 平均粗糙度(Ra )成爲比較高之値。 (實施例5 ) -13- 201211329 替代抽氣式空氣噴出而實施濕式噴出處理,不使石英 玻璃坩鍋倒轉,且不進行遮蔽,進行距離上端部60mm 〜1 10mm之範圍的帶狀粗面區域之粗面化處理。又,噴出 材係使用於實施例1之空氣噴出中使用者相同之天然石英 粉。結果示於表1。如表1所示,種晶與矽熔液接合,經過 種晶縮頸,直至矽單結晶之肩部開始形成之期間並未發生 液面振動。儘管並未進行遮蔽,於上述區域及下部區域之 算術平均粗糙度(Ra )均成爲低値。 (實施例6 ) 距離上端部60mm〜1 10mm之範圍的帶狀粗面區域之粗 面化處理係利用濕式噴出處理,以使石英玻璃坩鍋倒轉之 狀態對內壁面進行。又,噴出材係使用於實施例1之空氣 噴出中使用者相同之天然石英粉。但不進行遮蔽。結果示 於表1。如表1所示並未發生液面振動。粗面化處理,與實 施例1同樣,由於係以上端部朝下之方式使石英玻璃坩鍋 倒轉之狀態對內壁面進行,因此下部區域之算術平均粗糙 度(Ra )成爲低値,上述區域之算術平均粗糙度(Ra )成 爲高於下部區域之算術平均粗糙度(Ra)之値。 (比較例1 ) 將粒徑50~500μιη之天然石英粉供給於旋轉之內徑 570nm之模具內,成型出由厚度25mm之粉體層所成之成型 體,利用電弧放電自該成型體內部加熱熔融且同時在其高S -12- 201211329 The method of inverting the quartz glass crucible is performed on the inner wall surface. The results are shown in Table 1. As shown in Table 1, no liquid surface vibration occurred. (Example 3) The roughing treatment of the strip-shaped rough surface region in the range of 6 mm to 110 mm from the upper end portion was carried out by a wet discharge treatment instead of the suction air blowing. In the roughening treatment, the upper region and the lower region are not masked with a masking tape before the roughening treatment. The roughening treatment is performed such that the upper end portion of the quartz glass crucible is inverted to the inner wall surface. Further, the sprayed material was used for the same natural quartz powder as that of the user in the air discharge of Example 1. The results are shown in Table 1. As shown in Table 1, the seed crystal was bonded to the ruthenium melt, and the seed crystal was necked until the liquid surface vibration did not occur during the formation of the shoulder of the single crystal. (Example 4) The liquid was roughened in the upper portion of the belt-like rough surface region (range of 60 mm to 100 mm from the upper end portion). Only the lower area is shielded with masking tape, and the upper area is not shielded. The results are shown in Table 1. As shown in Table 1, no liquid surface vibration occurred. Further, the roughening treatment is carried out without inverting the quartz glass crucible. The arithmetic mean roughness (Ra) of the lower portion of the masking region becomes low, and the arithmetic mean roughness (Ra) of the region where the masking is not performed becomes relatively high. (Embodiment 5) -13-201211329 A wet discharge process is performed instead of the air-exhausted air discharge, and the quartz glass crucible is not inverted, and the mask-like rough surface in the range of 60 mm to 1 10 mm from the upper end portion is not performed. The roughening of the area. Further, the discharge material was used for the natural quartz powder of the same user as that of the air ejection of Example 1. The results are shown in Table 1. As shown in Table 1, the seed crystal was bonded to the tantalum melt, and the seed crystal was necked until the liquid surface vibration did not occur during the formation of the shoulder of the single crystal. Although the masking was not performed, the arithmetic mean roughness (Ra) in the above region and the lower region became low. (Example 6) The roughening treatment of the strip-shaped rough surface region in the range of 60 mm to 1 10 mm from the upper end portion was performed by a wet discharge treatment to invert the state of the quartz glass crucible to the inner wall surface. Further, the sprayed material was used for the natural quartz powder of the same user as that of the air discharge of Example 1. But no shading. The results are shown in Table 1. As shown in Table 1, no liquid surface vibration occurred. In the same manner as in the first embodiment, the state in which the quartz glass crucible is inverted is performed on the inner wall surface in such a manner that the end portion is turned downward, and the arithmetic mean roughness (Ra) of the lower portion becomes low. The arithmetic mean roughness (Ra) becomes higher than the arithmetic mean roughness (Ra) of the lower region. (Comparative Example 1) A natural quartz powder having a particle diameter of 50 to 500 μm was supplied into a mold having a rotating inner diameter of 570 nm, and a molded body of a powder layer having a thickness of 25 mm was molded, and heated from the inside of the molded body by arc discharge. Melting and at the same time at its height
S -14- 201211329 溫氛圍中以100g/min之比例供給〇H濃度爲40ppm之合成石 英玻璃粉,使無泡之透明玻璃層遍及全部內表面區域,以 1〜3mm之厚度形成。對於結束熔融並冷卻之直徑5 5 5〜 560mm之石英玻璃坩鍋,進行上端部切割以使高度成爲 3 70mm,製作20個石英玻璃坩鍋。對於該等之10個,以操 作條件A (塡充140kg之多晶矽),進行矽單結晶拉延後, 任何情況下,於使種晶與矽熔液接合、經過種晶縮頸、直 至矽單結晶之肩部開始形成之期間(種入種晶〜肩部形成 )於矽熔液面發生振動,故無法自動地操作,只因爲必須 由操作者進行手動調整,因初期之困擾而使操作時間變長 ,其結果矽單結晶之成品率亦低。又,上述坩鍋使用前之 內表面粗糙度如之前進行測定,於全區域爲表1所示之値 ,自使用後之坩鍋測定操作開始時之初期液面位置後,平 均爲距離上端部74mm (最大78mm,最小72mm),如表1 所示發生液面振動。 (比較例2 ) 除變更帶狀粗面區域之Ra以外,與實施例1同樣進行 。粗面化處理之際,對於未進行粗面化處理之上述區域及 下部區域,使用遮蔽膠帶預先予以遮蔽。粗面化處理係以 上端部朝下之方式使石英玻璃坩鍋倒轉之狀態對內壁面進 行。結果示於表1。如表1所示發生液面振動。 (比較例3 ) -15- 201211329 帶狀粗面區域(距離上端部60mm〜100mm之範圍)、 比該帶狀粗面區域更上方之上部區域及比該帶狀粗面區域 更下方之下部區域如表1所示全部進行粗面化處理。亦即 ,除了前述透明合成石英玻璃層之內表面全部粗面化以外 ’與實施例1同樣進行。結果示於表1。如表1所示雖未發 生液面振動,但尤其是自坩鍋之縱本體部遍及底部之R部 (彎曲部)或底部之面狀態惡化,而使成品數大幅降低。 (比較例4 ) 改變帶狀粗面區域之Ra,進行距離上端部50mm~ 110mm之範圍的帶狀粗面區域之粗面化處理。粗面化處理 之際’對於不進行粗面化處理之上部區域及下部區域使用 遮蔽.膠帶預先予以遮蔽。粗面化處理係以上端部朝下之方 式使石英玻璃坩鍋倒轉之狀態對內壁面進行。結果示於表 1°如表1所示雖未發生液面振動,但由於石英片自粗面處 理之處理面剝離,故產生結晶容易混亂之問題,操作時間 變長。S -14- 201211329 A synthetic quartz glass powder having a 〇H concentration of 40 ppm was supplied in a temperature of 100 g/min in a warm atmosphere, and a bubble-free transparent glass layer was formed over the entire inner surface region in a thickness of 1 to 3 mm. For the quartz glass crucible having a diameter of 5 5 5 to 560 mm which was melted and cooled, the upper end was cut to have a height of 3 70 mm, and 20 quartz glass crucibles were produced. For the above 10, after operating the condition A (filling 140 kg of polycrystalline germanium), after the single crystal drawing, in any case, the seed crystal is bonded to the germanium melt, and the seed crystal is necked until the sheet is pressed. During the period in which the shoulder of the crystal begins to form (the seed crystal is formed into the shoulder portion), it vibrates on the molten metal surface, so it cannot be operated automatically, because the operator must perform manual adjustment, and the operation time is caused by the initial trouble. The length is increased, and as a result, the yield of single crystals is also low. Moreover, the inner surface roughness of the crucible before use is measured as before, and the whole area is the crucible shown in Table 1. After the initial liquid level position at the start of the crucible measurement operation after use, the average is the upper end portion. 74mm (maximum 78mm, minimum 72mm), as shown in Table 1, liquid level vibration occurs. (Comparative Example 2) The same procedure as in Example 1 was carried out except that Ra of the strip-shaped rough surface region was changed. In the roughening treatment, the region and the lower region which have not been subjected to the roughening treatment are masked in advance using a masking tape. The roughening treatment is performed on the inner wall surface in a state where the quartz glass crucible is inverted with the upper end portion facing downward. The results are shown in Table 1. The liquid level vibration occurred as shown in Table 1. (Comparative Example 3) -15-201211329 Band-shaped rough surface region (range of 60 mm to 100 mm from the upper end portion), upper portion above the strip-shaped rough surface region, and lower region than the strip-shaped rough surface region All of the roughening treatments were carried out as shown in Table 1. That is, the same as in the first embodiment except that the inner surface of the transparent synthetic quartz glass layer was completely roughened. The results are shown in Table 1. As shown in Table 1, although the liquid surface vibration did not occur, in particular, the vertical body portion of the crucible was deteriorated over the R portion (bending portion) or the bottom portion of the bottom portion, and the number of finished products was greatly lowered. (Comparative Example 4) The Ra of the strip-shaped rough surface region was changed, and the roughening treatment of the strip-shaped rough surface region in the range of 50 mm to 110 mm from the upper end portion was performed. At the time of the roughening treatment, the upper and lower regions are not subjected to the roughening treatment, and the tape is masked in advance. In the roughening treatment, the state in which the quartz glass crucible is inverted is performed on the inner wall surface in such a manner that the upper end portion faces downward. The results are shown in Table 1. As shown in Table 1, although the liquid surface vibration did not occur, since the quartz sheet was peeled off from the treated surface of the rough surface treatment, the crystal was easily confused, and the operation time became long.
S -16- 201211329S -16- 201211329
-17- 201211329 (實施例7 ) 進行距離上端部1 l〇mm〜140mm之範圍的帶狀粗面區域 之粗面化處理。改變帶狀粗面區域之Ra,改變液面位置, 以矽單結晶拉延條件操作條件B (塡充1 〇〇kg多晶矽)進行 矽單結晶拉延。粗面化處理之際,對於不進行粗面化處理 之上部區域及下部區域使用遮蔽膠帶預先予以遮蔽。粗面 化處理係以上端部朝下之方式使石英玻璃坩鍋倒轉之狀態 對內壁面進行。結果示於表2。如表2所示並未發生液面振 動。 表2中,所謂操作時間率爲以以往例的比較例5之操作 時間設爲1時之比率,例如於實施例7之操作時間率時,係 由實施例7之操作時間+比較例5之操作時間=實施例7之操 作時間率而算出》操作時間率越低,表示不需要利用操作 員手動調整等而可自動操作等,而可縮短操作時間。又所 謂成品率,爲以以往例的比較例5之矽單結晶之成品數設 爲1時之比率。例如實施例7之成品率時,係由實施例7之 成品數+比較例5成品數=實施例7之成品率而算出。成品率 越高,表示成品數提高。 (實施例8 ) 對帶狀粗面區域之寬度W以比實施例7更廣(距離上 端部爲1 l〇mm〜2 50mm之範圍)地進行粗面化處理。粗面化 處理之際,對於不進行粗面化處理之上部區域及下部區域 使用遮蔽膠帶預先予以遮蔽。粗面化處理係以上端部朝下-17-201211329 (Example 7) The roughening treatment of the strip-shaped rough surface region in the range from the upper end portion 1 l 〇 mm to 140 mm was performed. Change the Ra of the strip-shaped rough surface area, change the liquid level position, and carry out the single crystal drawing with the single crystal drawing condition operating condition B (filling 1 〇〇kg polycrystalline germanium). In the roughening treatment, the upper region and the lower region which are not subjected to the roughening treatment are masked in advance using a masking tape. The roughening treatment is performed by inverting the quartz glass crucible in such a manner that the upper end portion faces downward to the inner wall surface. The results are shown in Table 2. As shown in Table 2, no liquid level vibration occurred. In Table 2, the operation time ratio is a ratio when the operation time of Comparative Example 5 of the conventional example is set to 1, for example, the operation time rate of the embodiment 7 is the operation time of the embodiment 7 + the comparative example 5 The operation time = the operation time rate of the seventh embodiment is calculated. The lower the operation time rate is, the automatic operation or the like is not required by manual adjustment by the operator, and the operation time can be shortened. The yield is also a ratio when the number of finished products of the single crystal of Comparative Example 5 of the prior art is set to 1. For example, in the case of the yield of Example 7, the number of finished products of Example 7 + the number of finished products of Comparative Example 5 = the yield of Example 7 was calculated. The higher the yield, the higher the number of finished products. (Example 8) The width W of the strip-shaped rough surface region was roughened in a wider range than in the seventh embodiment (the range from the upper end portion to the range of 1 l〇mm to 2 50 mm). In the roughening treatment, the upper region and the lower region are not masked with a masking tape. Roughening treatment with the upper end facing down
S -18- 201211329 之方式使石英玻璃坩鍋倒轉之狀態對內壁面進行。結果示 於表2。如表2所示並未發生液面振動。 (實施例9 ) 如表2所示,除了帶狀粗面區域之Ra以外,比該帶狀 粗面區域更上方之上部區域及比該帶狀粗面區域更下方之 下.部區域處理至Ra分別爲0.03〜0_09仁m而成爲平滑面之處 理以外,與實施例7同樣進行。粗面化處理之際,對於不 進行粗面化處理之上部區域及下部區域使用遮蔽膠帶預先 予以遮蔽。粗面化處理係以上端部朝下之方式使石英玻璃 坩鍋倒轉之狀態對內壁面進行。結果示於表2。如表2所示 並未發生液面振動。 (比較例5 ) 使用於比較例1製作之石英玻璃坩鍋中剩餘的1 0個, 以操作條件B (同樣塡充1 〇〇kg )進行矽單結晶拉延,於使 種晶與矽熔液接合、經過種晶縮頸、直至矽單結晶之肩部 開始形成之期間(種入種晶〜肩部形成)於矽熔液面發生 振動’故無法自動地操作,只因爲必須由操作者進行手動 調整’因初期之困擾而使操作時間變長,其結果矽單結晶 之成品率亦低。又’上述坩鍋使用前之內表面粗糙度如之 前進行測定,於全區域爲表2所示之値,自使用後之坩鍋 測定操作開始時之初期液面位置後,平均爲距離上端部 124mm (最大127mm,最小122mm),如表2所示發生液面 -19- 201211329 振動》 (比較例6 ) 除改變帶狀粗面區域之Ra以外,與實施例7同樣進行 。結果示於表2»如表2所示發生液面振動。 (比較例7 ) 進行距離上端部60mm~ 100mm之範圍的帶狀粗面區域 之粗面化處理,使用與實施例1同樣之坩鍋,以矽熔液之 液面位置落於帶狀粗面區域以外之狀態,進行矽單結晶拉 延。粗面化處理之際,對於不進行粗面化處理之上部區域 及下部區域使用遮蔽膠帶預先予以遮蔽》粗面化處理係以 上端部朝下之方式使石英玻璃坩鍋倒轉.之狀態對內壁面進 行。結果示於表2。如表2所示發生液面振動。In the manner of S -18- 201211329, the state in which the quartz glass crucible is inverted is performed on the inner wall surface. The results are shown in Table 2. As shown in Table 2, no liquid level vibration occurred. (Example 9) As shown in Table 2, in addition to Ra of the strip-shaped rough surface region, the upper portion is higher than the strip-shaped rough surface region and lower than the strip-shaped rough surface region. The same procedure as in Example 7 was carried out except that the Ra was 0.03 to 0_09, respectively, and the smooth surface was processed. In the roughening treatment, the upper region and the lower region are not masked by masking tape without roughening. In the roughening treatment, the state in which the quartz glass crucible is inverted is performed on the inner wall surface in such a manner that the upper end portion faces downward. The results are shown in Table 2. As shown in Table 2, no liquid level vibration occurred. (Comparative Example 5) The remaining 10 in the quartz glass crucible prepared in Comparative Example 1 was subjected to a single crystal pulling operation under operating condition B (same filling of 1 〇〇kg) to melt the seed crystal and the crucible. The liquid is bonded, the seed is necked, and the period from the start of the formation of the shoulder of the single crystal (the seed crystal to the shoulder is formed) vibrates on the molten metal surface, so it cannot be operated automatically, only because it must be operated by the operator. Manual adjustment "The operation time is prolonged due to the initial troubles, and as a result, the yield of single crystal is also low. In addition, the inner surface roughness of the crucible before use is measured as before, and the whole area is the crucible shown in Table 2. After the initial liquid level position at the start of the crucible measurement operation after use, the average is the upper end portion. 124 mm (maximum 127 mm, minimum 122 mm), liquid level -19-201211329 vibration occurred as shown in Table 2 (Comparative Example 6) The same procedure as in Example 7 was carried out except that Ra of the strip-shaped rough surface region was changed. The results are shown in Table 2»The liquid level vibration occurred as shown in Table 2. (Comparative Example 7) The roughening treatment of the strip-shaped rough surface region in the range of 60 mm to 100 mm from the upper end portion was carried out, and the same crucible as in Example 1 was used, and the liquid surface position of the crucible melted on the strip-shaped rough surface. In the state outside the area, single crystal pulling is performed. In the case of the roughening treatment, the upper surface and the lower portion are not subjected to the roughening treatment, and the masking tape is masked in advance. The roughening treatment system is used to reverse the quartz glass crucible. The wall is carried out. The results are shown in Table 2. The liquid level vibration occurs as shown in Table 2.
S -20- 201211329S -20- 201211329
褂 ng OI ΙΟ ο 卜 σ> (Ο σ> 堪 讲 PQ s? csi 00 σ> 00 CO 00 ο 00 〇> S 〇 ο ο ο m g m Μ 聒 m 摧 m 擗 mg 璨 Μ 锻麒 E c Ε c Ε c .Ε C Ε c Ε c u C C g c C3 c Ε5 C· s C ΙΟ CVJ Μ© •Γ» T·· mm 盟·Ν ) 1〇 eg ? CO CM i IP CSI ) CSJ CM l CM CM i CM OJ 塡充量 I 1------ 100kg 100kg 100kg 100kg 100kg 100kg 下部區域 I 0.00-0.02 0.00~0.02 0.03 〜0.09 0.00-0.02 0.00~0.02 0.00-0.02 yx (2 η m 豳 m csi i <〇 l (D (〇 csi i s 0 1 S 0 1 s to l m S m s csi α> c6 CM CO oi o o 5 d s <〇 m Μ g S _g 3 S s m ΐ5ϋ 插 -Μ c> i o o ο l ο ο ο 0 1 s o 0 1 o d c> l O o 〇· l 〇 d E c Ε C E c E c E 醒 o C S CSI c o m s o 键 \ ι l T mil w m o r— ο o r— T· ~~s 壊 m<1 W u m 卜 習 00 〇> m CO 卜 闺 鎰 Ttttf* 鎰 鎰 IK in Ιϋ J-3 JA -21 - 201211329 【圖式簡單說明】 圖1爲本發明之矽單結晶拉延用石英玻璃坩鍋之一部 分剖面圖》 【主要元件符號說明】 10:本發明之矽單結晶拉延用石英玻璃坩鍋 1 2 :坩鍋基體 14:透明合成石英玻璃層 1 6 :矽熔液於初期狀態之液面位置 1 8 :帶狀粗面區域 20 :凹部 22 :上端部 24 :縱本體部 26 :底部 2 8 :下部區域 3 0 :上部區域 d:自上端部至帶狀粗面區域之距離 W:帶狀粗面區域之寬度褂ng OI ΙΟ ο 卜σ> (Ο σ> can speak PQ s? csi 00 σ> 00 CO 00 ο 00 〇> S 〇ο ο ο mgm Μ 聒m mm 擗mg 璨Μ Forged 麒 E c Ε c Ε c .Ε C Ε c Ε cu CC gc C3 c Ε5 C· s C ΙΟ CVJ Μ© •Γ»T··mm 盟·Ν ) 1〇eg ? CO CM i IP CSI ) CSJ CM l CM CM i CM OJ Charge I 1------ 100kg 100kg 100kg 100kg 100kg 100kg Lower Zone I 0.00-0.02 0.00~0.02 0.03 ~0.09 0.00-0.02 0.00~0.02 0.00-0.02 yx (2 η m 豳m csi i < 〇l (D (〇csi is 0 1 S 0 1 s to lm S ms csi α> c6 CM CO oi oo 5 ds < 〇m Μ g S _g 3 S sm ΐ5ϋ 插-Μ c> ioo ο l ο ο ο 0 1 so 0 1 od c> l O o 〇· l 〇d E c Ε CE c E c E awake o CS CSI comso key \ ι l T mil wmor — ο or — T· ~~s 壊m<1 W um 卜 00 〇> m CO 闺镒 闺镒 Ttttf* 镒镒IK in Ιϋ J-3 JA -21 - 201211329 [Simplified illustration] Figure 1 In the invention, a partial cross-sectional view of a quartz glass crucible for single crystal drawing is carried out. [Explanation of main component symbols] 10: Quartz glass crucible for single crystal drawing of the present invention 1 2: crucible base 14: transparent synthetic quartz glass Layer 1 6 : liquid level position of the bismuth melt in the initial state 1 8 : strip-shaped rough surface area 20 : recess 22 : upper end portion 24 : vertical body portion 26 : bottom portion 2 8 : lower portion 3 0 : upper region d: self The distance from the upper end to the strip-shaped rough surface W: the width of the strip-shaped rough surface area
S -22-S -22-
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