TW201144788A - Refractory material internal defect inspection method - Google Patents
Refractory material internal defect inspection methodInfo
- Publication number
- TW201144788A TW201144788A TW99118540A TW99118540A TW201144788A TW 201144788 A TW201144788 A TW 201144788A TW 99118540 A TW99118540 A TW 99118540A TW 99118540 A TW99118540 A TW 99118540A TW 201144788 A TW201144788 A TW 201144788A
- Authority
- TW
- Taiwan
- Prior art keywords
- refractory material
- frequency
- internal defect
- under analysis
- inspection method
- Prior art date
Links
- 239000011819 refractory material Substances 0.000 title abstract 6
- 230000007547 defect Effects 0.000 title abstract 3
- 238000007689 inspection Methods 0.000 title abstract 2
- 238000000034 method Methods 0.000 title abstract 2
- 238000001228 spectrum Methods 0.000 abstract 3
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
A refractory material internal defect inspection method involves the following steps: (A) to obtain a dominant frequency of bottom face reflected wave of an internal defect-free refractory material, (B) hitting a refractory material under test, a reflected wave of the refractory material under test is converted into a spectrum signal under analysis, (C) in the spectrum signal under analysis, to identify the frequency under analysis as the one that a frequency higher than the dominant frequency and the largest amplitude, and a reference amplitude at the dominant frequency of the spectrum signal under analysis, if amplitude of the frequency under analysis is higher than the reference amplitude, then it indicates that the refractory material has internal defects.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99118540A TW201144788A (en) | 2010-06-08 | 2010-06-08 | Refractory material internal defect inspection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99118540A TW201144788A (en) | 2010-06-08 | 2010-06-08 | Refractory material internal defect inspection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW201144788A true TW201144788A (en) | 2011-12-16 |
Family
ID=46765719
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW99118540A TW201144788A (en) | 2010-06-08 | 2010-06-08 | Refractory material internal defect inspection method |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201144788A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112313510A (en) * | 2018-07-04 | 2021-02-02 | 株式会社岛津制作所 | Defect detecting device |
| TWI805501B (en) * | 2022-09-30 | 2023-06-11 | 中國鋼鐵股份有限公司 | Method for predicting refractory availability based on machine learning model |
-
2010
- 2010-06-08 TW TW99118540A patent/TW201144788A/en unknown
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112313510A (en) * | 2018-07-04 | 2021-02-02 | 株式会社岛津制作所 | Defect detecting device |
| TWI805501B (en) * | 2022-09-30 | 2023-06-11 | 中國鋼鐵股份有限公司 | Method for predicting refractory availability based on machine learning model |
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