TW201033251A - Positive type photosensitive polyimide resin composition - Google Patents
Positive type photosensitive polyimide resin composition Download PDFInfo
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- TW201033251A TW201033251A TW98142658A TW98142658A TW201033251A TW 201033251 A TW201033251 A TW 201033251A TW 98142658 A TW98142658 A TW 98142658A TW 98142658 A TW98142658 A TW 98142658A TW 201033251 A TW201033251 A TW 201033251A
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- Prior art keywords
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- chemical
- formula
- resin composition
- polyimide resin
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- 229920001721 polyimide Polymers 0.000 title claims abstract description 50
- 239000000203 mixture Substances 0.000 title claims abstract description 37
- 239000009719 polyimide resin Substances 0.000 title claims abstract description 36
- 239000002253 acid Substances 0.000 claims abstract description 16
- 150000001875 compounds Chemical class 0.000 claims abstract description 8
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 6
- 239000000126 substance Substances 0.000 claims description 49
- 239000011347 resin Substances 0.000 claims description 33
- 229920005989 resin Polymers 0.000 claims description 33
- -1 carboxylic acid dianhydride Chemical class 0.000 claims description 32
- 238000011161 development Methods 0.000 claims description 22
- 150000004985 diamines Chemical class 0.000 claims description 19
- 125000000217 alkyl group Chemical group 0.000 claims description 17
- 125000005843 halogen group Chemical group 0.000 claims description 14
- 125000003545 alkoxy group Chemical group 0.000 claims description 13
- 239000007864 aqueous solution Substances 0.000 claims description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 12
- 238000010438 heat treatment Methods 0.000 claims description 11
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 claims description 10
- 150000004984 aromatic diamines Chemical class 0.000 claims description 8
- 125000002843 carboxylic acid group Chemical group 0.000 claims description 6
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims description 5
- 230000003213 activating effect Effects 0.000 claims description 4
- 150000001335 aliphatic alkanes Chemical class 0.000 claims description 3
- 239000001257 hydrogen Substances 0.000 claims description 3
- 229910052739 hydrogen Inorganic materials 0.000 claims description 3
- 125000005647 linker group Chemical group 0.000 claims 1
- 238000006467 substitution reaction Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 17
- 239000003960 organic solvent Substances 0.000 abstract description 13
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 abstract description 5
- 238000012545 processing Methods 0.000 abstract description 2
- 230000003381 solubilizing effect Effects 0.000 abstract 1
- 239000010408 film Substances 0.000 description 61
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 45
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 26
- 238000000034 method Methods 0.000 description 24
- 239000000243 solution Substances 0.000 description 24
- 230000015572 biosynthetic process Effects 0.000 description 17
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 16
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 15
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 15
- 238000003786 synthesis reaction Methods 0.000 description 15
- 239000004065 semiconductor Substances 0.000 description 14
- 239000002904 solvent Substances 0.000 description 14
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 13
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 11
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 10
- 239000011342 resin composition Substances 0.000 description 10
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 9
- 238000006116 polymerization reaction Methods 0.000 description 9
- 230000001681 protective effect Effects 0.000 description 9
- 239000004642 Polyimide Substances 0.000 description 8
- 125000003118 aryl group Chemical group 0.000 description 8
- 238000006243 chemical reaction Methods 0.000 description 8
- 229920000642 polymer Polymers 0.000 description 8
- 239000001294 propane Substances 0.000 description 8
- 239000000654 additive Substances 0.000 description 7
- 239000002243 precursor Substances 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 7
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 239000011229 interlayer Substances 0.000 description 6
- 239000010410 layer Substances 0.000 description 6
- 238000002156 mixing Methods 0.000 description 6
- QWVGKYWNOKOFNN-UHFFFAOYSA-N o-cresol Chemical compound CC1=CC=CC=C1O QWVGKYWNOKOFNN-UHFFFAOYSA-N 0.000 description 6
- IWDCLRJOBJJRNH-UHFFFAOYSA-N p-cresol Chemical compound CC1=CC=C(O)C=C1 IWDCLRJOBJJRNH-UHFFFAOYSA-N 0.000 description 6
- 150000004060 quinone imines Chemical class 0.000 description 6
- 238000003756 stirring Methods 0.000 description 6
- ARCGXLSVLAOJQL-UHFFFAOYSA-N trimellitic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1 ARCGXLSVLAOJQL-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 5
- 150000008064 anhydrides Chemical class 0.000 description 5
- RLSSMJSEOOYNOY-UHFFFAOYSA-N m-cresol Chemical compound CC1=CC=CC(O)=C1 RLSSMJSEOOYNOY-UHFFFAOYSA-N 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 239000000047 product Substances 0.000 description 5
- AZQWKYJCGOJGHM-UHFFFAOYSA-N 1,4-benzoquinone Chemical compound O=C1C=CC(=O)C=C1 AZQWKYJCGOJGHM-UHFFFAOYSA-N 0.000 description 4
- 239000003513 alkali Substances 0.000 description 4
- 239000002585 base Substances 0.000 description 4
- 238000009835 boiling Methods 0.000 description 4
- 239000003054 catalyst Substances 0.000 description 4
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 239000000178 monomer Substances 0.000 description 4
- 238000001226 reprecipitation Methods 0.000 description 4
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 4
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
- 239000005711 Benzoic acid Substances 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical group [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 230000000996 additive effect Effects 0.000 description 3
- JFDZBHWFFUWGJE-UHFFFAOYSA-N benzonitrile Chemical compound N#CC1=CC=CC=C1 JFDZBHWFFUWGJE-UHFFFAOYSA-N 0.000 description 3
- 125000000649 benzylidene group Chemical group [H]C(=[*])C1=C([H])C([H])=C([H])C([H])=C1[H] 0.000 description 3
- 239000012024 dehydrating agents Substances 0.000 description 3
- 230000001066 destructive effect Effects 0.000 description 3
- URQUNWYOBNUYJQ-UHFFFAOYSA-N diazonaphthoquinone Chemical compound C1=CC=C2C(=O)C(=[N]=[N])C=CC2=C1 URQUNWYOBNUYJQ-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 150000002466 imines Chemical class 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 125000000951 phenoxy group Chemical group [H]C1=C([H])C([H])=C(O*)C([H])=C1[H] 0.000 description 3
- 229920006254 polymer film Polymers 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 238000007363 ring formation reaction Methods 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- PXQLVRUNWNTZOS-UHFFFAOYSA-N sulfanyl Chemical compound [SH] PXQLVRUNWNTZOS-UHFFFAOYSA-N 0.000 description 3
- XQGFDQLLBUGTDN-UHFFFAOYSA-N (4-aminophenyl) 4-amino-2-hydroxybenzoate Chemical compound C1=CC(N)=CC=C1OC(=O)C1=CC=C(N)C=C1O XQGFDQLLBUGTDN-UHFFFAOYSA-N 0.000 description 2
- VZXTWGWHSMCWGA-UHFFFAOYSA-N 1,3,5-triazine-2,4-diamine Chemical compound NC1=NC=NC(N)=N1 VZXTWGWHSMCWGA-UHFFFAOYSA-N 0.000 description 2
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 description 2
- 125000001622 2-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C(*)C([H])=C([H])C2=C1[H] 0.000 description 2
- NMFFUUFPJJOWHK-UHFFFAOYSA-N 2-phenoxyaniline Chemical compound NC1=CC=CC=C1OC1=CC=CC=C1 NMFFUUFPJJOWHK-UHFFFAOYSA-N 0.000 description 2
- SNHKMHUMILUWSJ-UHFFFAOYSA-N 5-(1,3-dioxo-3a,4,5,6,7,7a-hexahydro-2-benzofuran-5-yl)-3a,4,5,6,7,7a-hexahydro-2-benzofuran-1,3-dione Chemical compound C1CC2C(=O)OC(=O)C2CC1C1CC2C(=O)OC(=O)C2CC1 SNHKMHUMILUWSJ-UHFFFAOYSA-N 0.000 description 2
- 241000208140 Acer Species 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- RGSFGYAAUTVSQA-UHFFFAOYSA-N Cyclopentane Chemical compound C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 2
- 150000008065 acid anhydrides Chemical class 0.000 description 2
- ORILYTVJVMAKLC-UHFFFAOYSA-N adamantane Chemical compound C1C(C2)CC3CC1CC2C3 ORILYTVJVMAKLC-UHFFFAOYSA-N 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 2
- 150000007514 bases Chemical class 0.000 description 2
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical group C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- CJYIPJMCGHGFNN-UHFFFAOYSA-N bicyclo[2.2.1]heptane-2,3,5,6-tetracarboxylic acid Chemical compound C1C2C(C(O)=O)C(C(=O)O)C1C(C(O)=O)C2C(O)=O CJYIPJMCGHGFNN-UHFFFAOYSA-N 0.000 description 2
- 125000006268 biphenyl-3-yl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C1=C([H])C(*)=C([H])C([H])=C1[H] 0.000 description 2
- 125000000319 biphenyl-4-yl group Chemical group [H]C1=C([H])C([H])=C([H])C([H])=C1C1=C([H])C([H])=C([*])C([H])=C1[H] 0.000 description 2
- 239000002981 blocking agent Substances 0.000 description 2
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- PAFZNILMFXTMIY-UHFFFAOYSA-N cyclohexylamine Chemical compound NC1CCCCC1 PAFZNILMFXTMIY-UHFFFAOYSA-N 0.000 description 2
- 230000018044 dehydration Effects 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 125000003983 fluorenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3CC12)* 0.000 description 2
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 2
- JBFHTYHTHYHCDJ-UHFFFAOYSA-N gamma-caprolactone Chemical compound CCC1CCC(=O)O1 JBFHTYHTHYHCDJ-UHFFFAOYSA-N 0.000 description 2
- GAEKPEKOJKCEMS-UHFFFAOYSA-N gamma-valerolactone Chemical compound CC1CCC(=O)O1 GAEKPEKOJKCEMS-UHFFFAOYSA-N 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 229920006015 heat resistant resin Polymers 0.000 description 2
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 2
- AWJUIBRHMBBTKR-UHFFFAOYSA-N isoquinoline Chemical compound C1=NC=CC2=CC=CC=C21 AWJUIBRHMBBTKR-UHFFFAOYSA-N 0.000 description 2
- 239000004922 lacquer Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- QVEIBLDXZNGPHR-UHFFFAOYSA-N naphthalene-1,4-dione;diazide Chemical compound [N-]=[N+]=[N-].[N-]=[N+]=[N-].C1=CC=C2C(=O)C=CC(=O)C2=C1 QVEIBLDXZNGPHR-UHFFFAOYSA-N 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 229960003742 phenol Drugs 0.000 description 2
- 150000002989 phenols Chemical class 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920002098 polyfluorene Polymers 0.000 description 2
- 108010026466 polyproline Proteins 0.000 description 2
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical compound CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 125000001424 substituent group Chemical group 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- XFNJVJPLKCPIBV-UHFFFAOYSA-N trimethylenediamine Chemical compound NCCCN XFNJVJPLKCPIBV-UHFFFAOYSA-N 0.000 description 2
- FHBXQJDYHHJCIF-UHFFFAOYSA-N (2,3-diaminophenyl)-phenylmethanone Chemical compound NC1=CC=CC(C(=O)C=2C=CC=CC=2)=C1N FHBXQJDYHHJCIF-UHFFFAOYSA-N 0.000 description 1
- LERREUOVCXYKGR-UHFFFAOYSA-N (2-phenoxyphenyl)-phenylmethanone Chemical compound C=1C=CC=C(OC=2C=CC=CC=2)C=1C(=O)C1=CC=CC=C1 LERREUOVCXYKGR-UHFFFAOYSA-N 0.000 description 1
- RXCOGDYOZQGGMK-UHFFFAOYSA-N (3,4-diaminophenyl)-phenylmethanone Chemical compound C1=C(N)C(N)=CC=C1C(=O)C1=CC=CC=C1 RXCOGDYOZQGGMK-UHFFFAOYSA-N 0.000 description 1
- STIUJDCDGZSXGO-UHFFFAOYSA-N (3-amino-4-phenoxyphenyl)-(3-aminophenyl)methanone Chemical compound NC1=CC=CC(C(=O)C=2C=C(N)C(OC=3C=CC=CC=3)=CC=2)=C1 STIUJDCDGZSXGO-UHFFFAOYSA-N 0.000 description 1
- PHPTWVBSQRENOR-UHFFFAOYSA-N (3-amino-4-phenoxyphenyl)-(4-aminophenyl)methanone Chemical compound C1=CC(N)=CC=C1C(=O)C(C=C1N)=CC=C1OC1=CC=CC=C1 PHPTWVBSQRENOR-UHFFFAOYSA-N 0.000 description 1
- HFAMSBMTCKNPRG-UHFFFAOYSA-N (4-amino-3-phenoxyphenyl)-(3-aminophenyl)methanone Chemical compound NC1=CC=CC(C(=O)C=2C=C(OC=3C=CC=CC=3)C(N)=CC=2)=C1 HFAMSBMTCKNPRG-UHFFFAOYSA-N 0.000 description 1
- NILYJZJYFZUPPO-UHFFFAOYSA-N (4-amino-3-phenoxyphenyl)-(4-aminophenyl)methanone Chemical compound C1=CC(N)=CC=C1C(=O)C1=CC=C(N)C(OC=2C=CC=CC=2)=C1 NILYJZJYFZUPPO-UHFFFAOYSA-N 0.000 description 1
- YBQZXXMEJHZYMB-UHFFFAOYSA-N 1,2-diphenylhydrazine Chemical compound C=1C=CC=CC=1NNC1=CC=CC=C1 YBQZXXMEJHZYMB-UHFFFAOYSA-N 0.000 description 1
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- PWGJDPKCLMLPJW-UHFFFAOYSA-N 1,8-diaminooctane Chemical compound NCCCCCCCCN PWGJDPKCLMLPJW-UHFFFAOYSA-N 0.000 description 1
- JRHNUZCXXOTJCA-UHFFFAOYSA-N 1-fluoropropane Chemical compound CCCF JRHNUZCXXOTJCA-UHFFFAOYSA-N 0.000 description 1
- BRSRUYVJULRMRQ-UHFFFAOYSA-N 1-phenylanthracene Chemical compound C1=CC=CC=C1C1=CC=CC2=CC3=CC=CC=C3C=C12 BRSRUYVJULRMRQ-UHFFFAOYSA-N 0.000 description 1
- NOGFHTGYPKWWRX-UHFFFAOYSA-N 2,2,6,6-tetramethyloxan-4-one Chemical compound CC1(C)CC(=O)CC(C)(C)O1 NOGFHTGYPKWWRX-UHFFFAOYSA-N 0.000 description 1
- TUXAJHDLJHMOQB-UHFFFAOYSA-N 2-diazonio-4-sulfonaphthalen-1-olate Chemical compound C1=CC=C2C(S(=O)(=O)O)=CC([N+]#N)=C([O-])C2=C1 TUXAJHDLJHMOQB-UHFFFAOYSA-N 0.000 description 1
- VJKZIQFVKMUTID-UHFFFAOYSA-N 2-diazonio-5-sulfonaphthalen-1-olate Chemical compound N#[N+]C1=CC=C2C(S(=O)(=O)O)=CC=CC2=C1[O-] VJKZIQFVKMUTID-UHFFFAOYSA-N 0.000 description 1
- TWBPWBPGNQWFSJ-UHFFFAOYSA-N 2-phenylaniline Chemical group NC1=CC=CC=C1C1=CC=CC=C1 TWBPWBPGNQWFSJ-UHFFFAOYSA-N 0.000 description 1
- HUWXDEQWWKGHRV-UHFFFAOYSA-N 3,3'-Dichlorobenzidine Chemical compound C1=C(Cl)C(N)=CC=C1C1=CC=C(N)C(Cl)=C1 HUWXDEQWWKGHRV-UHFFFAOYSA-N 0.000 description 1
- SMDGQEQWSSYZKX-UHFFFAOYSA-N 3-(2,3-dicarboxyphenoxy)phthalic acid Chemical compound OC(=O)C1=CC=CC(OC=2C(=C(C(O)=O)C=CC=2)C(O)=O)=C1C(O)=O SMDGQEQWSSYZKX-UHFFFAOYSA-N 0.000 description 1
- OLQWMCSSZKNOLQ-UHFFFAOYSA-N 3-(2,5-dioxooxolan-3-yl)oxolane-2,5-dione Chemical compound O=C1OC(=O)CC1C1C(=O)OC(=O)C1 OLQWMCSSZKNOLQ-UHFFFAOYSA-N 0.000 description 1
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- RTWNYYOXLSILQN-UHFFFAOYSA-N methanediamine Chemical compound NCN RTWNYYOXLSILQN-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- YZOISHTVEWVNHA-UHFFFAOYSA-N n,n'-dicyclohexylmethanediamine Chemical compound C1CCCCC1NCNC1CCCCC1 YZOISHTVEWVNHA-UHFFFAOYSA-N 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- DIOQZVSQGTUSAI-UHFFFAOYSA-N n-butylhexane Natural products CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 1
- VMXAIJCDNKFKPO-UHFFFAOYSA-N n-ethynylaniline Chemical compound C#CNC1=CC=CC=C1 VMXAIJCDNKFKPO-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- DXGLGDHPHMLXJC-UHFFFAOYSA-N oxybenzone Chemical compound OC1=CC(OC)=CC=C1C(=O)C1=CC=CC=C1 DXGLGDHPHMLXJC-UHFFFAOYSA-N 0.000 description 1
- 229960001173 oxybenzone Drugs 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 1
- 235000021317 phosphate Nutrition 0.000 description 1
- 150000003013 phosphoric acid derivatives Chemical class 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
- XKJCHHZQLQNZHY-UHFFFAOYSA-N phthalimide Chemical compound C1=CC=C2C(=O)NC(=O)C2=C1 XKJCHHZQLQNZHY-UHFFFAOYSA-N 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 239000003495 polar organic solvent Substances 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 108010094020 polyglycine Proteins 0.000 description 1
- 229920000232 polyglycine polymer Polymers 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- WYVAMUWZEOHJOQ-UHFFFAOYSA-N propionic anhydride Chemical compound CCC(=O)OC(=O)CC WYVAMUWZEOHJOQ-UHFFFAOYSA-N 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- KIDHWZJUCRJVML-UHFFFAOYSA-N putrescine Chemical compound NCCCCN KIDHWZJUCRJVML-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000006798 ring closing metathesis reaction Methods 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000001235 sensitizing effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 239000001509 sodium citrate Substances 0.000 description 1
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 150000000000 tetracarboxylic acids Chemical class 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 125000005409 triarylsulfonium group Chemical group 0.000 description 1
- QORWJWZARLRLPR-UHFFFAOYSA-H tricalcium bis(phosphate) Chemical compound [Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O QORWJWZARLRLPR-UHFFFAOYSA-H 0.000 description 1
- AAAQKTZKLRYKHR-UHFFFAOYSA-N triphenylmethane Chemical compound C1=CC=CC=C1C(C=1C=CC=CC=1)C1=CC=CC=C1 AAAQKTZKLRYKHR-UHFFFAOYSA-N 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- PAPBSGBWRJIAAV-UHFFFAOYSA-N ε-Caprolactone Chemical compound O=C1CCCCCO1 PAPBSGBWRJIAAV-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
Abstract
Description
201033251 六、發明說明: 【發明所屬之技術領域】 本發明有關一種正型感光性聚醯亞胺樹脂組成 用以提高半導體元件之信賴性的半導體裝置等之 作爲電性、電子絕緣材料,尤其是半導體表面保 間絕緣膜使用者。 【先前技術】 以往,在半導體元件之表面保護膜、層間絕緣 Ο 層中,係使用兼具有優異之耐熱性、電特性、以 性等的聚醯亞胺樹脂。然而,近年來在半導體元 成化、大型化的進展中對密封樹脂包裝有薄型化 的要求,且採用經引腳跨接在晶片上(LOC: lead 〇 無鉛回流焊接之表面黏著等之方式,變成須有比 一步之機械特性、耐熱性等優異之聚醯亞胺樹脂 更且,近年來在電子機器使用之電路基板或半 零件中,爲了兼顧輕量化與高積成·高密度化而使 ® 之超精細化急速地進展。在該流程中,以往不受 板及構件材料間的線膨脹係數之差變成對製品品 性影響極大。而解決該問題之尺寸安定性則強烈 異之聚醯亞胺膜。 一方面,聚醯亞胺樹脂本身係使用賦予感光性 光性聚醯亞胺,如使用此樹脂時,具有可簡化圖 步驟並可縮短繁雜的製造步驟之特徵。負型中係 法:聚醯亞胺前驅物(醯胺酸)介由酯鍵、離子鍵 物,係在 製造中, 護膜或層 膜、保護 及機械特 件之高集 、小型化 n chip)或 以往更進 〇 導體封裝 配線間距 重視的基 質、信賴 地需求優 特性之感 案之製作 有下述方 、醯胺鍵 201033251 或IPN型等而導入甲基丙烯醯基之方法(例如參照專利文 獻1至5);具有光聚合烯烴之可溶性聚醯亞胺(例如參照專 利文獻6);具有二苯甲酮骨架,且在氮原子鍵結之芳香環之 鄰位具有烷基之利用脫氫反應之自體增敏型聚醯亞胺(例 如參照專利文獻7、8);利用光氧化激發聚合反應之具有呋 喃構造之可溶性聚醯亞胺(例如參照專利文獻9)等。 然而,該等負型中,由於在顯影步驟中使用不利於環境 之N-甲基吡咯啶酮等之有機溶劑,因而在顯影步驟中有安 ^ 全性上的問題,近年來開發一種取代以往的負型之能以鹼 水溶液顯影的正型感光性聚醯亞胺樹脂。曝光部分經顯影 而溶解的正型之耐熱性樹脂組成物係有:聚醯胺酸中添加 有萘醌二疊氮者(例如參照專利文獻10);在具有羥基之聚 醯胺酸中添加有萘醌二疊氮者(例如參照專利文獻11);在 具有酸·鹼分解基之聚醯亞胺前驅物中添加有光酸產生劑 (PAG)/光鹼產生劑(PBG)者(例如參照專利文獻12、13);將 〇-硝基苄基導入聚醯亞胺前驅物中者(例如參照專利文獻 ❹ 14)等。 在使用聚醯亞胺前驅物時,無論上述之任一種方法,在 光加工後,必須進行經加熱處理之醯亞胺閉環,此時,隨 著醯亞胺閉環之脫水與交聯基成分的揮發使體積收縮,而 無法避免引起膜厚之損失以及尺寸安定性降低之缺點。此 外,經閉環反應之高溫中的加熱處理步驟會導致其他的電子 零件或有機材料劣化的情形。雖提案一種本身無須環化過程 之有機溶劑可溶性的聚醯亞胺本身之感光化者(正型係例如參 201033251 照專利文獻15至18),然而該等係有感光特性、耐熱性、 機械特性以及尺寸安定性之任一項低劣的缺點。 因此’事實上任一項均未達到實用化之程度。 [專利文獻1]日本特開昭54-145794號公報 [專利文獻2]日本特開昭55-030207號公報 [專利文獻3]日本特開昭6卜118424號公報 [專利文獻4]日本特開昭57-168942號公報 [專利文獻5]日本特開平03-170547號公報 [專利文獻6]日本特開昭59-108031號公報 [專利文獻7]日本特開昭61-145794號公報 [專利文獻8]日本特開2003-076017號公報 [專利文獻9]曰本特開2000-338668號公報 [專利文獻10]日本特開昭52-0 1 3 3 1 5號公報 [專利文獻11]日本特開平04-204945號公報 [專利文獻丨2]日本特開平〇4·120171號公報 [專利文獻13]日本特開平ι〇_186664號公報 [專利文獻14]日本特開昭60-037550號公報 [專利文獻15]日本特開昭63-013032號公報 [專利文獻16]日本特開平04-046345號公報 [專利文獻17]日本特開2000-199957號公報 [專利文獻18]曰本特開2001-249454號公報 【發明內容】 [發明所欲解決之課題] 本發明之目的係提供一種正型感光性聚醯亞胺樹脂組成 201033251 物,該樹脂組成物可減輕以往正型感光性樹脂之大的熱膨 脹係數所引起之與基材的密著性降低或基材之翹曲等以往 技術所包含的課題,及同時解決經由隨著醯亞胺化中之加 熱的高溫與從醯亞胺化反應所產生之水,而在表面保護膜 或層間絕緣膜之形成時帶給半導體裝置等之製品極大影響 之課題;而減小熱膨脹係數因而使得與基材的密著性降低 或基材的翹曲等減輕;而無因爲隨著醯亞胺化中之加熱的 高溫與從醯亞胺化反應所產生之水,而使在表面保護膜或 ® 層間絕緣膜之形成時帶給半導體裝置等之製品極大影響; 可賦予不使電特性、解像度等劣化之耐熱性樹脂膜者。 並且,本發明提供一種經由上述組成物的使用而可得到 鹼顯影以及經低溫熱處理之耐熱性、機械特性以及熱尺寸 安定性優異之良好形狀之圖案的圖案製造法。並且,本發 明經由具有良好形狀與特性之圖案而提供一種信賴性高的 電子零件。 [用以解決課題之手段] 本發明者等因鑒於上述情況而專心致志持續硏究之結 果,達成以下之發明。 本發明之特徵係以包含:在主鏈上具有酯鍵,且主鏈以 及側鏈之至少一者具有含酚性羥基之聚醯亞胺、與光酸產 生劑爲必要成分,藉此而達成上述目的。亦即,本發明係 成爲以下之構成者。 •一種正型感光性聚醯亞胺樹脂組成物,其特徵係包含:使 (a)下述通式(化1)所示之分子內含酯鍵的四羧酸二酐、與 201033251 通式(化2)所示之芳香族二胺及/或通式(化3)所示之芳香族 二胺(且亦包含該等之鹽)反應而得之聚醯亞胺樹脂,以及 經活化光線照射而產生酸之化合物者; [化 1] '[Technical Field] The present invention relates to a positive-type photosensitive polyimide resin composition, which is used as an electrical or electronic insulating material for improving the reliability of a semiconductor device, and the like. Semiconductor surface insulation film user. [Prior Art] Conventionally, a polyimide resin having excellent heat resistance, electrical properties, properties, and the like is used for the surface protective film and the interlayer insulating layer of a semiconductor element. However, in recent years, in the progress of semiconductor element formation and large-scale development, there has been a demand for a thinner sealing resin package, and a pin is connected across a wafer (LOC: lead 〇 lead-free reflow soldering surface adhesion, etc. In order to achieve weight reduction, high integration, and high density, the circuit board or the half part used in an electronic device has been used in recent years in addition to a polyimide resin having excellent mechanical properties and heat resistance. Ultra-fine refinement has progressed rapidly. In this process, the difference in linear expansion coefficient between the board and the member material has not been greatly affected by the product quality. The dimensional stability that solves the problem is strongly different. On the one hand, the polyimide resin itself is used to impart photosensitive photopolymerization, and when used, it has the characteristics of simplifying the drawing step and shortening complicated manufacturing steps. Negative medium method: Polyimine precursor (proline) is based on ester bonds, ionic bonds, in the manufacture, high or small layers of protective or mechanical films, protective and mechanical components, or In addition, it is a method of introducing a methacrylic fluorenyl group by the following, a guanamine bond 201033251 or an IPN type, etc. 5) a soluble polyimine having a photopolymerizable olefin (for example, refer to Patent Document 6); a debenzoate having a benzophenone skeleton and having an alkyl group in the ortho position of the nitrogen ring-bonded aromatic ring The sensitizing type polyimine (see, for example, Patent Documents 7 and 8); a soluble polyimine having a furan structure (for example, see Patent Document 9) by photo-oxidation-excitation polymerization. However, in these negative types, since an organic solvent such as N-methylpyrrolidone which is unfavorable to the environment is used in the development step, there is a problem in safety in the development step, and in recent years, a development has been replaced. The negative type is a positive photosensitive polyimide resin which is developed with an aqueous alkali solution. The positive-type heat-resistant resin composition in which the exposed portion is developed and dissolved is one in which polyheptamic acid is added with naphthoquinone diazide (for example, refer to Patent Document 10); and a poly-proline which has a hydroxyl group is added Naphthoquinone diazide (for example, refer to Patent Document 11); a photoacid generator (PAG)/photobase generator (PBG) is added to a polyamidene precursor having an acid/base decomposition group (for example, reference) Patent Documents 12 and 13); a fluorene-nitrobenzyl group is introduced into a polyimide precursor (for example, see Patent Document ❹ 14). In the case of using a polyimine precursor, either of the above methods, after photoprocessing, it is necessary to carry out a heat-treated ruthenium ring closure, in which case, with the dehydration of the ruthenium ring and the cross-linking component Volatilization shrinks the volume, and the disadvantage of causing loss of film thickness and reduction in dimensional stability cannot be avoided. In addition, the heat treatment step in the high temperature of the ring closure reaction may cause deterioration of other electronic parts or organic materials. Although a sensitizer of a polyimine which is inherently soluble in an organic solvent which does not require a cyclization process is proposed (positive type, for example, Ref. 201033251, Patent Documents 15 to 18), these are photosensitive, heat-resistant, and mechanical. And the disadvantage of any inferiority in dimensional stability. Therefore, in fact, none of them has reached the level of practical use. [Patent Document 1] Japanese Laid-Open Patent Publication No. JP-A No. Hei. No. Hei. No. Hei. Japanese Laid-Open Patent Publication No. JP-A No. Hei 59-108031 [Patent Document 7] JP-A-61-145794 (Patent Document No. JP-A-61-145794) [Patent Document 10] JP-A-2000-338668 (Patent Document 10) JP-A-52-0 1 3 3 1 5 [Patent Document 11] Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. No. 60-037550 (Patent Document No.). Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. 249454 SUMMARY OF INVENTION [Problem to be Solved by the Invention] An object of the present invention is to provide a positive photosensitive property. The quinone imine resin composition 201033251, which can reduce the problem of the prior art such as a decrease in the adhesion to the substrate or the warpage of the substrate due to the large thermal expansion coefficient of the conventional positive photosensitive resin. At the same time, it solves the problem that the surface of the semiconductor device or the like is greatly affected by the formation of the surface protective film or the interlayer insulating film by the high temperature heated by the hydrazine imidization and the water generated by the hydrazine imidization reaction. And reducing the coefficient of thermal expansion, thereby reducing the adhesion to the substrate or reducing the warpage of the substrate; and not because of the high temperature of the heating in the imidization of the hydrazine and the water produced by the imidization reaction. In the case of forming a surface protective film or an interlayer insulating film, it is greatly affected by a product such as a semiconductor device, and a heat resistant resin film which does not deteriorate electrical properties, resolution, or the like can be imparted. Further, the present invention provides a pattern production method which is capable of obtaining a pattern of a good shape which is excellent in heat resistance, mechanical properties, and thermal dimensional stability after alkali development and low-temperature heat treatment by use of the above composition. Further, the present invention provides a highly reliable electronic component via a pattern having a good shape and characteristics. [Means for Solving the Problem] The present inventors have reached the following invention by focusing on the results of continuous research in view of the above circumstances. The present invention is characterized in that it has an ester bond in a main chain, and at least one of a main chain and a side chain has a phenolic hydroxyl group-containing polyimine and a photoacid generator as an essential component, thereby achieving The above purpose. That is, the present invention is a constituent of the following. A positive photosensitive polyimide resin composition characterized by comprising (a) a tetracarboxylic dianhydride having an ester bond in a molecule represented by the following formula (Chemical Formula 1), and a formula of 201033251 a polydiimide resin obtained by reacting an aromatic diamine represented by (Chemical Formula 2) and/or an aromatic diamine represented by the formula (Chemical Formula 3) (and also including the salt thereof), and activated light a compound that produces acid when irradiated; [Chemical 1]
(式中,X表示含芳香環之二價基) [化2](wherein X represents a divalent group containing an aromatic ring) [Chemical 2]
(式中表示氫、羧酸基、烷基、經氟取代之烷基、烷氧 基或鹵素基團;η表示〇至4之整數’其中’ 11個R!爲相同 或相異之取代基;m表示1以上之整數) [化3](wherein represents hydrogen, a carboxylic acid group, an alkyl group, a fluorine-substituted alkyl group, an alkoxy group or a halogen group; η represents an integer from 〇 to 4' wherein '11 R! are the same or different substituents ;m represents an integer greater than 1) [Chemical 3]
201033251 (式中,A係選自於由-C( = 0)0-、-NHCO-表示之基所構成的 組群中之任意的鍵結基;R2、R3以及R4之至少一者爲羥 基,其它表示羧酸基、烷基、經氟取代之烷基、烷氧基或 鹵素基團’爲相同或相異之基;p、q、r以及s表示0至4 之整數,P + q + r^l,(s+l)個A可相同或相異)。 •如卜記載之正型感光性聚醯亞胺樹脂組成物,其中,聚醯 亞胺樹脂含有(化4)所示之重覆單元, [化4]201033251 (wherein A is selected from any of a group consisting of a group represented by -C(=0)0-, -NHCO-; at least one of R2, R3 and R4 is a hydroxyl group; Other means that the carboxylic acid group, the alkyl group, the fluorine-substituted alkyl group, the alkoxy group or the halogen group 'is the same or different groups; p, q, r and s represent an integer of 0 to 4, P + q + r^l, (s+l) A can be the same or different). • A positive photosensitive polyimide resin composition as described in the above, wherein the polyimine resin contains a repeating unit represented by (Chemical Formula 4), [Chemical 4]
(式中,X表示含芳香環之二價基;W係源自通式(化2)或通 式(化3)所示之二胺的構造單元)。 •如1 至2 ·中任一項記載之正型感光性聚醯亞胺樹脂組成 物,其中通式(化3)之構造係下述通式(化5)所示之二胺, [化5](wherein, X represents a divalent group containing an aromatic ring; and W is derived from a structural unit of a diamine represented by the formula (Chemical Formula 2) or the general formula (Chemical Formula 3)). The positive-type photosensitive polyimide resin composition according to any one of the above-mentioned items, wherein the structure of the formula (Chemical Formula 3) is a diamine represented by the following formula (Chemical Formula 5). 5]
(式中,A係選自於由-C( = 0)0-、-NHCO-表示之基所構成的 組群中之任意的鍵結基;Rs、R6表示烷基、經氟取代之烷 基、烷氧基或鹵素基團,爲相同或相異之基;X、y表示0 201033251 至4之整數,x + ygl)。 •如1 ·至2 ·中任一項記載之正型感光性聚醯亞胺樹脂組成 物’其中,通式(化3)之構造係下述通式(化6)所示之二胺, [化6](wherein A is selected from any of a group consisting of a group represented by -C(=0)0-, -NHCO-; Rs, R6 represents an alkyl group, a fluorine-substituted alkane a group, an alkoxy group or a halogen group, which are the same or different groups; X, y represents an integer of 0 201033251 to 4, x + ygl). The positive-type photosensitive polyimide resin composition as described in any one of the above-mentioned, wherein the structure of the formula (Chemical Formula 3) is a diamine represented by the following formula (Chemical Formula 6), [Chemical 6]
(式中,A係選自於由- C( = 0)0-、-NHCO-表示之基所構成的 組群中之任意的鍵結基;R5、R6表示烷基、經氟取代之烷 基、烷氧基或鹵素基團,爲相同或相異之基;x、y表示0 至4之整數,x + ygl)。 •如1_至4·中任一項記載之正型感光性聚醯亞胺樹脂組成 物,其中,經活化光線照射而產生酸之化合物係經酯化之 醌二疊氮化合物。 Ο •一種聚醯亞胺凸版圖案,其特徵係:使如1.至5·中任一項 記載之正型感光性聚醯亞胺樹脂組成物以活化光線使圖案 曝光後,以氫氧化四甲銨水溶液等之鹼性水顯影後,在 25〇t以下之溫度中進行熱處理者。 [發明之效果] 如依本發明,由於使用具有特定構造之聚醯亞胺,因此 可良好地實現高彈性率、優異之熱尺寸安定性以及溶媒可 溶性之平衡。源自本發明之正型感光性聚醯亞胺樹脂組成 物的聚醯亞胺之熱膨脹係數小,而僅在矽晶圓等之低熱膨 201033251 脹係數的基材上塗布·乾燥下即可形成絕緣膜等之樹脂膜 而無需醯亞胺化製程’使熱膨脹係數之差小,並與基材之 密著性良好且可減輕翹曲等。而且,由於可良好地維持顯 影性、感光性等,因此由該等結果可得到良好的圖案,在 作爲半導體裝置等之製造中的電性.電子絕緣材料上極爲 有效。 【實施方式】 以下,對於本發明之實施型態進行說明,該等僅爲本發 明之實施型態的一例,並不受該等內容所限制。 本發明中之可溶性聚醯亞胺爲有機溶劑(溶媒)可溶性’ 如不溶於有機溶劑時,則有使用聚醯亞胺之前驅物並經脫 水閉環反應而形成聚醯亞胺層之必要,此時,由於需要 3 5 0°C以上之高溫製程,因而唯恐導致半導體裝置的熱劣 化。另外,此處之(有機溶劑)可溶性係指至少在選自下述 有機溶媒之至少一種以上的有機溶劑中溶解(3〇 °C)1質量% 以上的聚醯亞胺者。 該等有機溶媒之例可列舉如沸點在3 5 0 °C以下者’較佳之 例可列舉如沸點在3 00 r以下者,更佳之例可列舉如沸點在 2 5 0°C以下者。具體之例可列舉如:對氯酚或間甲酚等之酣 系溶媒;N-甲基-2-吡咯啶酮、N,N-二甲基甲醯胺、N,N-二甲 基甲醯胺等之醯胺系溶媒;或γ-丁內酯、γ-戊內酯、δ-戊內醋、 γ-己內酯、ε-己內酯、α-甲基-γ 丁內酯等之環狀酯溶媒等。 <本實施型態之槪要> 如依本實施型態即可提供一種聚醯亞胺聚合物’該聚醯亞 -10- 201033251 2)所示 胺聚合物係由通式(化1)所示之酸二酐、與通式(化 之二胺或通式(化3)所示之二胺聚合而成者; [化1](wherein A is selected from any of a group consisting of a group represented by -C(=0)0-, -NHCO-; and R5, R6 represents an alkyl group, a fluorine-substituted alkane. a group, an alkoxy group or a halogen group, which are the same or different groups; x, y represents an integer from 0 to 4, x + ygl). The positive photosensitive polyimide resin composition according to any one of the preceding claims, wherein the compound which generates an acid upon irradiation with an activating light is an esterified quinonediazide compound.醯 醯 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种 一种After development of alkaline water such as an aqueous solution of ammonium methoxide, heat treatment is carried out at a temperature of 25 Torr or less. [Effect of the Invention] According to the present invention, since a polyimide having a specific structure is used, a high elastic modulus, an excellent thermal dimensional stability, and a solvent solubility balance can be satisfactorily achieved. The polyimine which is derived from the positive photosensitive polyimide resin composition of the present invention has a small thermal expansion coefficient and can be formed only by coating and drying on a substrate having a low thermal expansion of 201033251, such as a tantalum wafer. A resin film such as an insulating film does not require a ruthenium imidization process to make the difference in thermal expansion coefficient small, and the adhesion to the substrate is good, and warpage can be reduced. Further, since the development property and the photosensitivity can be favorably maintained, a good pattern can be obtained from these results, and it is extremely effective as an electrical and electronic insulating material in the production of a semiconductor device or the like. [Embodiment] Hereinafter, embodiments of the present invention will be described, and these are merely examples of the embodiments of the present invention, and are not limited by the contents. The soluble polyimine in the present invention is soluble in an organic solvent (solvent). If it is insoluble in an organic solvent, it is necessary to form a polyimine layer by using a polyimine precursor and undergoing a dehydration ring closure reaction. At the time, since a high-temperature process of 350 ° C or higher is required, it is feared that thermal deterioration of the semiconductor device is caused. In addition, the term "organic solvent" is used herein to mean that at least 1% by mass or more of the polyimine is dissolved in at least one organic solvent selected from the group consisting of the following organic solvents. Examples of the organic solvent include those having a boiling point of not more than 550 °C. The preferred example is a boiling point of 300 rpm or less. More preferably, the boiling point is 260 ° C or less. Specific examples thereof include an anthraquinone solvent such as p-chlorophenol or m-cresol; N-methyl-2-pyrrolidone, N,N-dimethylformamide, and N,N-dimethyl group. A guanamine-based solvent such as guanamine; or γ-butyrolactone, γ-valerolactone, δ-valerol, γ-caprolactone, ε-caprolactone, α-methyl-γ-butyrolactone, etc. A cyclic ester solvent or the like. <Maintenance of this embodiment> As described in the present embodiment, a polyimine polymer can be provided, which is represented by the general formula (Chemical Formula 1). ) an acid dianhydride as shown, which is obtained by polymerizing a diamine represented by the formula (diamine or the formula (Chemical Formula 3); [Chemical Formula 1]
(式中’ X表7Π含芳香環之二價基)。 [化2](wherein X represents a divalent group of an aromatic ring). [Chemical 2]
(式中’R!表示氫、羧酸基、烷基、經氟取代之烷基 基或鹵素基團;η表示0至4之整數,其中,η個Ri 或相異之取代基;m袠示1以上之整數)所示之芳 胺,及/或通式(化3)。 、院氧 爲相同 香族二 [化3]Wherein 'R! represents hydrogen, a carboxylic acid group, an alkyl group, a fluorine-substituted alkyl group or a halogen group; η represents an integer of 0 to 4, wherein η Ri or a different substituent; m袠An aromatic amine represented by an integer of 1 or more, and/or a general formula (Chemical Formula 3). , the courtyard oxygen is the same, the fragrance two [Chemical 3]
-11- 201033251 (式中,A係選自於由_C( = 0)0_、-NHC.O-表示之基所構成的 組群中之任意的鍵結基;R2、R3以及R4之至少一者爲羥 基,其它表示羧酸基、烷基、經氟取代之烷基、烷氧基或 鹵素基團,爲相同或相異之基;p、q、r以及s表示0至4 之整數,P + q + r21,(s+l)個A可相同或相異)。 · 上述之聚醯亞胺中,通式(3)所示之二胺以通式(5)所示之 二胺爲佳。 [化5]-11- 201033251 (wherein A is selected from any of a group consisting of a group represented by _C(=0)0_, -NHC.O-; at least R2, R3, and R4 One is a hydroxyl group, the other represents a carboxylic acid group, an alkyl group, a fluorine-substituted alkyl group, an alkoxy group or a halogen group, which are the same or different groups; p, q, r and s represent an integer of 0 to 4 , P + q + r21, (s + l) A can be the same or different). In the above polyimine, the diamine represented by the formula (3) is preferably a diamine represented by the formula (5). [Chemical 5]
❹ (式中,A係選自於由-C( = 0)0-、-NHCO-表示之基所構成的 組群中之任意的鍵結基;Rs、Re表示烷基、經氟取代之烷 基、烷氧基或鹵素基團,爲相同或相異之基;X、y表示〇 至4之整數,χ + y 2 1)。 更且,上述之可溶聚醯亞胺聚合物中,通式(3)所示之二 胺以通式(6)所示之二胺爲佳。 [化6]❹ (wherein A is selected from any of a group consisting of a group represented by -C(=0)0-, -NHCO-; Rs, Re represents an alkyl group, and is substituted by fluorine. An alkyl, alkoxy or halogen group, which is the same or a different base; X, y represents an integer from 〇 to 4, χ + y 2 1). Further, in the above-mentioned soluble polyimine polymer, the diamine represented by the formula (3) is preferably a diamine represented by the formula (6). [Chemical 6]
-12- 201033251 (式中,A係選自於由- C( = 〇)〇-、-NHCO-表示之基所構成的 組群中之任意的鍵結基;R5、116表示烷基、經氟取代之烷 基、烷氧基或鹵素基團,爲相同或相異之基;X、y表示0 至4之整數,x + y g 1 )。 或者,如依本實施型態即可提供一種含有通式(化4)所示 之重複單元的聚醯亞胺聚合物。 [化4]-12- 201033251 (wherein A is selected from any of a group consisting of a group represented by -C(= 〇)〇-, -NHCO-; R5, 116 represents an alkyl group, A fluorine-substituted alkyl, alkoxy or halogen group is the same or a different group; X, y represents an integer from 0 to 4, x + yg 1 ). Alternatively, a polyimine polymer containing a repeating unit represented by the formula (Chemical Formula 4) can be provided as in the present embodiment. [Chemical 4]
(式中,X表示含芳香環之二價基;W係源自通式(2)或通式 (3)所示之二胺的構造單元)。 並且,在由含有上述聚醯亞胺之有機溶液所成.的漆中, 將經活化光線照射而產生酸之化合物溶解並以澆注製膜而 Q 得的感光性樹脂組成物呈現優異之感光特性。 然後,含有聚醯亞胺聚合物之膜的精細圖案可依下述製 造方法而適當地獲得,下述製造方法係包含:塗布上述之 正型感光性樹脂組成物而形成正型感光性樹脂組成物膜之 步驟、與將正型感光性樹脂組成物膜進行圖案曝光之步 驟、經圖案曝光之正型感光性樹脂組成物膜進行鹼顯影之 步驟以及將經鹼顯影之正型感光性樹脂組成物進行加熱處 理而形成聚醯亞胺膜之步驟。 亦即,如依本實施型態,如上所述,即可實現具有高透 -13- 201033251 明性之聚(酯)醯亞胺聚合物膜、使聚(酯)醯亞胺聚合物膜中 含有感光劑而成之正型感光性樹脂組成物、以及將此曝光 後經鹼顯影·清洗·硬化步驟而得之作爲電子製品(零件)之 最適當的聚酯醯亞胺聚合物膜與其之精細圖案的製造方 法。 <本實施型態之聚醯亞胺聚合物的製造方法> 上述聚醯亞胺聚合物之製造方法並無特別限制,可使用 適當的習知方法。更具體言之,可依下述方法而得。首先, 將上述通式(化2)或通式(化3)所示之一種以上的二胺(包含 其鹽)溶解於經脫水之聚合溶媒中,在此添加通式(化1)所 示之酸二酐並在氮氣環境下進行攪拌。 聚合使用之所有四羧酸二酐中,通式(化1)所示剛直的四 羧酸二酐之含量以在 50mol%以上之範圍爲佳,以在 75 mol %以上更佳,未達50 mol%時,唯恐導致熱膨脹係數、 彈性率等要求特性明顯降低而不佳。 本實施型態之聚(酯)醯亞胺在無損及聚合反應性、聚醯 亞胺之要求特性的範圍內,該聚(酯)醯亞胺在聚合時,通 式(化1)所示之四羧酸二酐以外之部分,可使用的四羧酸二 酐雖無特別限制,然爲了使聚醯亞胺具有耐熱性而以具有 碳數6至30之芳香族環基或芳香族雜環基之基者爲佳。較 佳之芳香族四羧酸酐之例可列舉如:偏苯四酸酐、聯苯基 -3,4,3·,4·-四羧酸二酐、二苯甲酮-3,4,3、4·-四羧酸二酐、 氧二酞酸二酐、二苯颯-3,4,3’,4'-四羧酸二酐、4,4·-(2,2 -六 氟異亞丙基)二酞酸二酐、丁烷-1,2,3,4-四羧酸二酐、戊烷 -14- 201033251(wherein, X represents a divalent group containing an aromatic ring; and W is derived from a structural unit of a diamine represented by the formula (2) or the formula (3)). Further, in the lacquer formed of the organic solution containing the above polyimine, the photosensitive resin composition obtained by dissolving a compound which generates an acid by irradiation with an active light and forming a film by casting has excellent photosensitive characteristics. . Then, the fine pattern of the film containing the polyimide pigment polymer can be suitably obtained according to the following production method, and the following production method includes: coating the above-mentioned positive type photosensitive resin composition to form a positive photosensitive resin composition a step of forming a film, a step of patternwise exposing the film of the positive photosensitive resin composition, a step of performing alkali development on the film of the positive photosensitive resin composition subjected to pattern exposure, and a step of forming an alkali-developed positive photosensitive resin The step of heat-treating to form a polyimide film. That is, as in the present embodiment, as described above, a poly(ester) quinone imine polymer film having a high permeability of 13-201033251 can be realized, and a poly(ester) quinone imine polymer film can be realized. A positive-type photosensitive resin composition containing a sensitizer, and an optimum polyester phthalimide polymer film obtained as an electronic product (part) obtained by an alkali development, cleaning, and hardening step after exposure thereto A method of manufacturing a fine pattern. <Method for Producing Polyimine Polymer of the Present Embodiment> The method for producing the polyimine polymer is not particularly limited, and a suitable conventional method can be used. More specifically, it can be obtained by the following method. First, one or more kinds of diamines (including salts thereof) represented by the above formula (Chemical Formula 2) or Formula (Chemical Formula 3) are dissolved in a dehydrated polymerization solvent, and the formula (Chemical Formula 1) is added thereto. The acid dianhydride was stirred under a nitrogen atmosphere. In all of the tetracarboxylic dianhydrides used for the polymerization, the content of the rigid tetracarboxylic dianhydride represented by the formula (Chemical Formula 1) is preferably in the range of 50 mol% or more, more preferably 75 mol% or more, and less than 50%. In the case of mol%, it is feared that the required characteristics such as the coefficient of thermal expansion and the modulus of elasticity are significantly lowered. In the range of the non-destructive and polymerizable reactivity and the desired properties of the polyimine, the poly(ester) quinone imine is represented by the formula (Chemical Formula 1) in the polymerization. The tetracarboxylic dianhydride which can be used, other than the tetracarboxylic dianhydride, is not particularly limited, but has an aromatic ring group or aromatic hetero group having a carbon number of 6 to 30 in order to impart heat resistance to the polyiminimide. The base of the ring base is preferred. Examples of preferred aromatic tetracarboxylic anhydrides include, for example, pyromellitic anhydride, biphenyl-3,4,3,4·-tetracarboxylic dianhydride, benzophenone-3, 4, 3, 4 ·-tetracarboxylic dianhydride, oxydiphthalic acid dianhydride, diphenyl hydrazine-3,4,3',4'-tetracarboxylic dianhydride, 4,4·-(2,2-hexafluoroisopropylene Dialkyl phthalic anhydride, butane-1,2,3,4-tetracarboxylic dianhydride, pentane-14- 201033251
-1,2,4,5-四羧酸二酐、環丁烷四羧酸二酐、環戊烷-1,2,3,4-四羧酸二酐、環己烷-1,2,4,5-四羧酸二酐、環己-1-烯 -2,3,5,6-四羧酸二酐、3-乙基環己-1-烯- 3-(1,2),5,6-四羧酸 二酐、1-甲基-3-乙基環己烷-3·(1,2),5,6-四羧酸二酐、1-甲基-3-乙基環己-1-烯-3-(1,2),5,6-四羧酸二酐、1-乙基環 己烷-1-(1,2),3,4-四羧酸二酐、1-丙基環己烷-1-(2,3),3,4-四羧酸二酐、1,3-二丙基環己烷-1-(2,3),3-(2,3)-四羧酸二 酐、二環己基-3,4,3’,4’-四羧酸二酐、雙環[2.2.1]庚烷 -2,3,5,6-四羧酸二酐、1-丙基環己烷-l-(2,3),3,4-四羧酸二 酐、1,3-二丙基環己烷-1-(2,3),3-(2,3)-四羧酸二酐、二環 己基-3,4,3',4’-四羧酸二酐、雙環[2.2.1]庚烷-2,3,5,6-四羧 酸二酐、雙環[2.2.2]辛烷-2,3,5,6-四羧酸二酐、雙環[2.2.2] 辛-7-烯-2,3,5,6-四羧酸二酐等,惟爲了維持低線膨脹係數 而以使用偏苯四酸酐構造或下述式(化7)至(化8)所示之聯 苯基-3,4,3’,4'-四羧酸二酐構造之酸酐爲佳。該等之四羧酸 二酐可單獨使用亦可倂用二種以上。 [化7]-1,2,4,5-tetracarboxylic dianhydride, cyclobutane tetracarboxylic dianhydride, cyclopentane-1,2,3,4-tetracarboxylic dianhydride, cyclohexane-1,2, 4,5-tetracarboxylic dianhydride, cyclohex-1-ene-2,3,5,6-tetracarboxylic dianhydride, 3-ethylcyclohex-1-ene-3-(1,2), 5,6-tetracarboxylic dianhydride, 1-methyl-3-ethylcyclohexane-3·(1,2),5,6-tetracarboxylic dianhydride, 1-methyl-3-ethyl Cyclohex-1-ene-3-(1,2),5,6-tetracarboxylic dianhydride, 1-ethylcyclohexane-1-(1,2), 3,4-tetracarboxylic dianhydride , 1-propylcyclohexane-1-(2,3), 3,4-tetracarboxylic dianhydride, 1,3-dipropylcyclohexane-1-(2,3), 3-(2 , 3)-tetracarboxylic dianhydride, dicyclohexyl-3,4,3',4'-tetracarboxylic dianhydride, bicyclo[2.2.1]heptane-2,3,5,6-tetracarboxylic acid Dihydride, 1-propylcyclohexane-l-(2,3), 3,4-tetracarboxylic dianhydride, 1,3-dipropylcyclohexane-1-(2,3),3- (2,3)-tetracarboxylic dianhydride, dicyclohexyl-3,4,3',4'-tetracarboxylic dianhydride, bicyclo[2.2.1]heptane-2,3,5,6-tetra Carboxylic dianhydride, bicyclo[2.2.2]octane-2,3,5,6-tetracarboxylic dianhydride, bicyclo[2.2.2]oct-7-ene-2,3,5,6-tetracarboxylate Acid dianhydride, etc., in order to maintain the low coefficient of linear expansion, use the pyromellitic anhydride structure or the following formula (Chemical 7) to An acid anhydride of a biphenyl-3,4,3',4'-tetracarboxylic dianhydride structure represented by (Chemical Formula 8) is preferred. These tetracarboxylic dianhydrides may be used singly or in combination of two or more. [Chemistry 7]
(式中,R7表示苯基、3-聯苯基、4-聯苯基、1-萘基、2-萘 基之任一種基) 15- 201033251 [化8](wherein R7 represents a phenyl group, a 3-biphenyl group, a 4-biphenyl group, a 1-naphthyl group or a 2-naphthyl group) 15-201033251 [Chem. 8]
(式中,R8表示苯基、3-聯苯基、4-聯苯基、1-萘基、2-萘 基之任一種基)。 本實施型態之聚(酯)醯亞胺在無損及聚合反應性、聚醯 亞胺之要求特性的範圍內,該聚醯亞胺在聚合時’通式(化 2)或通式(化3)所示之二胺以外之部分可使用的芳香族二 胺雖無特別限制,其例可列舉如:4,4’-雙(3-胺基苯氧基) 聯苯、雙[4-(3-胺基苯氧基)苯基]酮、雙[4-(3-胺基苯氧基) 苯基]硫醚、雙[4-(3-胺基苯氧基)苯基]颯、2,2-雙[4-(3-胺基 苯氧基)苯基]丙烷、2,2-雙[4-(3-胺基苯氧基)苯 基]-1,1,1,3,3,3-六氟丙烷、間苯二胺、鄰苯二胺、對苯二 胺、間胺基苯甲胺、對胺基苯甲胺、3,3'-二胺基二苯基醚、 3,4’-二胺基二苯基醚、4,4'-二胺基二苯基醚、3,3、二胺基 二苯基硫醚、3,3'-二胺基二苯基亞颯、3,4'-二胺基二苯基亞 楓、4,4'-二胺基二苯基亞颯、3,3、二胺基二苯基楓、3,4、二 胺基二苯基颯、4,4’-二胺基二苯基楓、3,3’-二胺基二苯甲 酮、3,4·-二胺基二苯甲酮、4,4、二胺基二苯甲酮、3,3'-二 胺基二苯基甲烷。 -16- 201033251 3,4·-二胺基二苯基甲烷、4,4i-二胺基二苯基甲烷、雙 [4-(4-胺基苯氧基)苯基]甲烷、〖,丨-雙[4-(4-胺基苯氧基)苯 基]乙烷、1,2-雙[4-(4-胺基苯氧基)苯基]乙烷、丨,丨-雙μ-(4-胺基苯氧基)苯基]丙烷、1,2-雙[4-(4-胺基苯氧基)苯基]丙 烷、1,3-雙[4-(4-胺基苯氧基)苯基]丙烷、2,2-雙[4-(4-胺基 苯氧基)苯基]丙院、1,1-雙[4-(4 -胺基苯氧基)苯基]丁院、 1,3-雙[4-(4-胺基苯氧基)苯基]丁烷、1,4-雙[4-(4-胺基苯氧 基)苯基]丁烷、2,2-雙[4-(4-胺基苯氧基)苯基]丁烷、2,3-O 雙[4-(4-胺基苯氧基)苯基]丁烷。 2-[4-(4-胺基苯氧基)苯基]-2-[4-(4-胺基苯氧基)-3_甲基 苯基]丙烷、2,2-雙[4-(4•胺基苯氧基)-3-甲基苯基]丙烷、 2-[4-(4-胺基苯氧基)苯基]-2-[4-(4-胺基苯氧基)_3,5-二甲 基苯基]丙烷、2,2-雙[4-(4-胺基苯氧基)-3,5-二甲基苯基] 丙烷、2,2-雙[4-(4-胺基苯氧基)苯基]-1,1,1,3,3,3-六氟丙 烷、1,4-雙(3-胺基苯氧基)苯、1,3-雙(3-胺基苯氧基)苯、 1,4-雙(4-胺基苯氧基)苯、4,4'-雙(4-胺基苯氧基)聯苯、雙 ® [4-(4-胺基苯氧基)苯基]酮、雙[4-(4-胺基苯氧基)苯基]硫 醚、雙[4·(4·胺基苯氧基)苯基]亞颯、雙[4-(4-胺基苯氧基) 苯基]颯、雙[4-(3-胺基苯氧基)苯基]醚、雙[4-(4-胺基苯氧 基)苯基]醚、1,3-雙[4-(4-胺基苯氧基)苯甲醯基]苯、1,3-雙[4-(3-胺基苯氧基)苯甲醯基]苯、1,4-雙[4-(3-胺基苯氧基) 苯甲醯基]苯、4,4·-雙[(3-胺基苯氧基)苯甲醯基]苯、丨,1· 雙[4-(3-胺基苯氧基)苯基]丙烷、1,3-雙[4-(3-胺基苯氧基) 苯基]丙烷、3,4,-二胺基二苯基硫醚、2,2 -雙[3-(3-胺基苯 -17- 201033251 氧基)苯基]-1,1,1,3,3,3-六氟丙烷、雙[4-(3-胺基苯氧基) 苯基]甲烷、1,1-雙[4-(3-胺基苯氧基)苯基]乙烷、1,2-雙 [4-(3-胺基苯氧基)苯基]乙烷、雙[4-(3-胺基苯氧基)苯基] 亞楓、4,^-雙[3-(4-胺基苯氧基)苯甲醯基]二苯基醚、4,4'-雙[3-(3-胺基苯氧基)苯甲醯基]二苯基醚、4,4’-雙[4-(4-胺 基-α,α-二甲基苯甲基)苯氧基]二苯甲酮、4,4’-雙[4-(4-胺基- α,α-二甲基苯甲基)苯氧基]二苯砸、雙[4-{4-(4-胺基 苯氧基)苯氧基}苯基]砸。 1,4-雙[4-(4-胺基苯氧基)苯氧基-α, α-二甲基苯甲基] 苯、1,3-雙[4_(4_胺基苯氧基)苯氧基-α,α-二甲基苯甲基] 苯、1,3-雙[4-(4-胺基-6-三氟甲基苯氧基)-α, α-二甲基苯 甲基]苯、1,3-雙[4-(4-胺基-6-氟苯氧基)-α, α-二甲基苯甲 基]苯、1,3-雙[4-(4-胺基-6-甲基氧基)-α,α-二甲基苯甲基] 苯、1,3-雙[4-(4-胺基-6-氰基苯氧基)-α,α-二甲基苯甲基] 苯、3,3·-二胺基-4,4·-二苯氧基二苯甲酮、4,4'-二胺基-5,5’-_ 二苯氧基二苯甲酮、3,4’-二胺基-4,51-二苯氧基二苯甲酮、(wherein R8 represents a phenyl group, a 3-biphenyl group, a 4-biphenyl group, a 1-naphthyl group or a 2-naphthyl group). In the range of the non-destructive and polymerization reactivity and the desired properties of the polyimine, the poly(imine) in the polymerization is 'general (chemical) 2 or generalized) 3) The aromatic diamine which can be used other than the diamine shown is not particularly limited, and examples thereof include 4,4'-bis(3-aminophenoxy)biphenyl and bis[4- (3-Aminophenoxy)phenyl]one, bis[4-(3-aminophenoxy)phenyl] sulfide, bis[4-(3-aminophenoxy)phenyl]anthracene , 2,2-bis[4-(3-aminophenoxy)phenyl]propane, 2,2-bis[4-(3-aminophenoxy)phenyl]-1,1,1, 3,3,3-hexafluoropropane, m-phenylenediamine, o-phenylenediamine, p-phenylenediamine, m-aminobenzylamine, p-aminobenzylamine, 3,3'-diaminodiphenyl Ether, 3,4'-diaminodiphenyl ether, 4,4'-diaminodiphenyl ether, 3,3, diaminodiphenyl sulfide, 3,3'-diaminodi Phenyl anthracene, 3,4'-diaminodiphenylarsin, 4,4'-diaminodiphenylarylene, 3,3, diaminodiphenyl maple, 3,4, 2 Aminodiphenyl hydrazine, 4,4'-diaminodiphenyl maple, 3,3'-diaminobenzophenone, 3,4 --Diaminobenzophenone, 4,4, diaminobenzophenone, 3,3'-diaminodiphenylmethane. -16- 201033251 3,4·-Diaminodiphenylmethane, 4,4i-diaminodiphenylmethane, bis[4-(4-aminophenoxy)phenyl]methane, 丨, 丨- bis[4-(4-aminophenoxy)phenyl]ethane, 1,2-bis[4-(4-aminophenoxy)phenyl]ethane, hydrazine, hydrazine-double μ- (4-Aminophenoxy)phenyl]propane, 1,2-bis[4-(4-aminophenoxy)phenyl]propane, 1,3-bis[4-(4-aminobenzene) Oxy)phenyl]propane, 2,2-bis[4-(4-aminophenoxy)phenyl]propyl, 1,1-bis[4-(4-aminophenoxy)phenyl Dingyuan, 1,3-bis[4-(4-aminophenoxy)phenyl]butane, 1,4-bis[4-(4-aminophenoxy)phenyl]butane, 2,2-bis[4-(4-aminophenoxy)phenyl]butane, 2,3-Obis[4-(4-aminophenoxy)phenyl]butane. 2-[4-(4-Aminophenoxy)phenyl]-2-[4-(4-aminophenoxy)-3-methylphenyl]propane, 2,2-bis[4- (4•Aminophenoxy)-3-methylphenyl]propane, 2-[4-(4-aminophenoxy)phenyl]-2-[4-(4-aminophenoxy) ) 3,5-dimethylphenyl]propane, 2,2-bis[4-(4-aminophenoxy)-3,5-dimethylphenyl]propane, 2,2-bis[4] -(4-Aminophenoxy)phenyl]-1,1,1,3,3,3-hexafluoropropane, 1,4-bis(3-aminophenoxy)benzene, 1,3- Bis(3-aminophenoxy)benzene, 1,4-bis(4-aminophenoxy)benzene, 4,4'-bis(4-aminophenoxy)biphenyl, double® [4 -(4-Aminophenoxy)phenyl]one, bis[4-(4-aminophenoxy)phenyl] sulfide, bis[4·(4.aminophenoxy)phenyl] Athene, bis[4-(4-aminophenoxy)phenyl]anthracene, bis[4-(3-aminophenoxy)phenyl]ether, bis[4-(4-aminophenoxy) Phenyl]ether, 1,3-bis[4-(4-aminophenoxy)benzylidene]benzene, 1,3-bis[4-(3-aminophenoxy)benzene Mercapto] benzene, 1,4-bis[4-(3-aminophenoxy)benzylidene]benzene, 4,4·-bis[(3-aminophenoxy)benzylidene] Benzene, hydrazine, 1·double [4-(3- Phenoxy)phenyl]propane, 1,3-bis[4-(3-aminophenoxy)phenyl]propane, 3,4,-diaminodiphenyl sulfide, 2,2- Bis[3-(3-aminophenyl-17-201033251 oxy)phenyl]-1,1,1,3,3,3-hexafluoropropane, bis[4-(3-aminophenoxy) Phenyl]methane, 1,1-bis[4-(3-aminophenoxy)phenyl]ethane, 1,2-bis[4-(3-aminophenoxy)phenyl]ethane , bis[4-(3-aminophenoxy)phenyl] yafeng, 4,^-bis[3-(4-aminophenoxy)benzylidene]diphenyl ether, 4,4 '-Bis[3-(3-Aminophenoxy)benzylidene]diphenyl ether, 4,4'-bis[4-(4-amino-α,α-dimethylbenzyl) Phenoxy]benzophenone, 4,4'-bis[4-(4-amino-α,α-dimethylbenzyl)phenoxy]diphenylhydrazine, bis[4-{4 -(4-Aminophenoxy)phenoxy}phenyl]indole. 1,4-bis[4-(4-aminophenoxy)phenoxy-α,α-dimethylbenzyl]benzene, 1,3-bis[4_(4-aminophenoxy) Phenoxy-α,α-dimethylbenzyl]benzene, 1,3-bis[4-(4-amino-6-trifluoromethylphenoxy)-α, α-dimethylbenzene Methyl]benzene, 1,3-bis[4-(4-amino-6-fluorophenoxy)-α, α-dimethylbenzyl]benzene, 1,3-bis[4-(4 -amino-6-methyloxy)-α,α-dimethylbenzyl]benzene, 1,3-bis[4-(4-amino-6-cyanophenoxy)-α, α-Dimethylbenzyl]benzene, 3,3·-diamino-4,4·-diphenoxybenzophenone, 4,4′-diamino-5,5′-_ Phenoxybenzophenone, 3,4'-diamino-4,51-diphenoxybenzophenone,
Q 3,3'-二胺基-4-苯氧基二苯甲酮、4,4'-二胺基-5-苯氧基二苯 甲酮、3,4'-二胺基-4-苯氧基二苯甲酮、3,4’-二胺基-5’-苯 氧基二苯甲酮、3,3’-二胺基_4,4'_二-聯苯氧基二苯甲酮、 4,4'-二胺基-5,5'-二-聯苯氧基二苯甲酮、3,4|-二胺基-4,5'-二-聯苯氧基二苯甲酮、3,3l-二胺基-4-聯苯氧基二苯甲酮、 4,4’-二胺基-5-聯苯氧基二苯甲酮、3,4’-二胺基-4-聯苯氧基 二苯甲酮、3,4'-二胺基-5'-聯苯氧基二苯甲酮、1,3-雙(3-胺基-4-苯氧基苯甲醯基)苯、1,4-雙(3-胺基-4-苯氧基苯甲 -18- 201033251 醯基)苯、1,3-雙(4-胺基-5-苯氧基苯甲醯基)苯、i,4_雙(4-胺基-5-苯氧基苯甲醯基)苯、1,3·雙(3-胺基_4_聯苯氧基苯 甲醯基)苯、1,4-雙(3-胺基-4-聯苯氧基苯甲醯基)苯、1>3_ 雙(4-胺基-5-聯苯氧基苯甲醯基)苯、1,4-雙(4-胺基-5-聯苯 氧基苯甲醯基)苯、2,6-雙[4-(4-胺基-α, α-二甲基苯甲基) 苯氧基]苯甲腈以及上述芳香族二胺中之芳香環上的部分 或全部之氫原子經鹵原子、碳數1至3之烷基或烷氧基、 ^ 氰基、或者烷基或烷氧基之部分或全部之氫原子經鹵原子 取代之碳數1至3的鹵化烷基或烷氧基取代之芳香族二胺 等,惟爲了維持低的線膨脹係數而宜使用對苯二胺。該等 二胺可單獨使用亦可倂用二種以上。 本實施型態之聚(酯)醯亞胺在無損及聚合反應性、聚醯 亞胺之要求特性的範圍內,該聚醯亞胺在聚合時,通式(化 2)或通式(化3)所示之二胺以外之部分可使用的脂肪族二 胺雖無特別限制,其例可列舉如:4,4'·亞甲基雙(環己胺)、 @ 異佛爾酮二胺、反-1,4·二胺基環己烷、順-1,4-二胺基環己 烷、1,4-環己烷雙甲胺、2,5-雙(胺基甲基)二環[2,2,1]庚烷、 2,6-雙(胺基甲基)二環[2,2,1]庚烷、3,8-雙(胺基甲基)三環 [5,2,1,〇]癸烷、1,3-二胺基金剛烷、2,2-雙(4-胺基環己烷) 丙烷、2,2-雙(4-胺基環己烷)六氟丙烷、1,3-丙烷二胺、ι,4_ 四亞甲二胺、1,5-五亞甲二胺、1,6-六亞甲二胺、丨,7_七亞 甲二胺、1,8-八亞甲二胺、1,9-九亞甲二胺等。該等亦可倂 用二種以上。 在合成本發明之聚醯亞胺樹脂時的單體混合比(莫耳 -19- 201033251 比)’以四羧酸(酸酐)/二胺之標示方法,係以0.800至 1.20 0/1.200 至 0.800 爲佳’以 0.900 至 1.100/1.100 至 0.900 更佳,又以0.950至1.15 0/1.150至0.950尤佳。 爲封閉本發明之分子末端,可使用二羧酸酐、三羧酸酐、 苯胺衍生物等之末端封閉劑。本發明之適用者爲酞酸酐、 馬來酸酐、乙炔基苯胺,而以馬來酸酐更佳。末端封閉劑 之使用量係相對於單體成分1莫耳爲0.001至1.0莫耳比。 在合成本發明之聚醯亞胺樹脂時所使用之有機溶劑,只 要是可將作爲原料單體以及中間產物之聚醯胺酸、或作爲 產物之聚醯亞胺樹脂的任一種溶解者,則無特別限制,其 例可列舉如:鄰甲酚、間甲酚、對甲酚' N-甲基-2-吡咯啶酮、 N-乙醯基-2-吡略啶酮、N,N-二甲基甲醯胺、N,N-二甲基甲 醯胺、N,N-二甲基乙醯胺、二甲基亞楓、γ-丁內酯、環丁楓、 鹵化酚類等,該等溶媒可單獨或混合使用。極性有機溶媒 之使用量如爲可充分地溶解所饋入單體之量即可,一般含 有1至50質量%之固形分即可,而以5至30質量%爲佳。 聚合反應係在有機溶媒中一邊攪拌及/或混合,同時在0 至80°C之溫度範圍下連續進行1〇分鐘至30小時之後,再 於100至300 °C之溫度範圍下連續進行1〇分鐘至30小時, 如有需要可分割聚合反應或升降溫度而無妨。此時,兩反 應體之添加順序雖無特別限制,然以在芳香族二胺類之溶 液中添加芳香族四羧酸酐類者爲佳。 在本發明中亦可使用閉環觸媒。本發明中所使用之閉環 觸媒的具體例可列舉如:苯甲酸、鄰苯甲酸、間苯甲酸、對苯 -20- 201033251 甲酸等之芳香族羧酸;三甲胺、三乙胺等之脂肪族三級胺; 異喹啉、吡啶、β-皮考啉等之雜環式三級胺等,惟以使用 選自雜環式三級胺之至少一種胺爲佳。閉環觸媒之含量係 以閉環觸媒之含量(莫耳)/作爲前驅物之聚醯胺酸中之含量 (莫耳)成爲0.01至10·00之範圍爲佳。 本發明中亦可使用脫水劑。其例可列舉如:乙酸酐、丙 酸酐、丁酸酐等之脂肪族羧酸酐以及苯甲酸酐等之芳香族 羧酸酐等,如爲可有效地脫水者,則無特別限制。脫水劑 之含量係脫水劑之含量(莫耳)/聚醯胺酸之含量(莫耳)成爲 〇_〇1至10.00之範圍爲佳。 本發明中,爲了與水共沸而可使用共溶媒。其例可列舉 如:甲苯、二甲苯等,如爲有效地與水共沸者即可而無特別 限制。 本發明中,以更提高聚醯亞胺樹脂之性能爲目的而可加 入添加物。該等添加物爲依其目的而定之各式各樣之添加 物,並不限於特定者。 並且,添加方法在添加時期中亦不限於特定者。添加物 之例可列舉如:氧化矽、氧化鈦、氧化鋁等之金屬氧化物; 磷酸鈣、磷酸氫鈣、焦磷酸鈣等之磷酸鹽等的有機、無機 之習知塡充物。 本發明中,可將經反應而得之聚醯亞胺樹脂以適當的弱 溶媒從反應溶液使之再沉澱。弱溶媒之例可列舉如:丙酮、 甲醇、乙醇、水等,如爲可有效地使再沉澱者則不限於該 等。而且,對於將再沉澱後殘留的反應溶媒去除之溶媒亦 -21- 201033251 無特別限定,以使用使再沉澱時所用之溶媒爲佳。 本發明中,可將反應溶液直接使用作爲聚醯亞胺樹脂溶 液,亦可由反應溶液以上述手法使再沉澱之聚醯亞胺樹脂 再溶解於溶媒中而得到聚醯亞胺樹脂溶液。後者之情形, 如爲可使聚醯亞胺樹脂有效地溶解者即可而無特別限定, 可列舉例如:鄰甲酚、間甲酚、對甲酚、N-甲基-2-吡咯啶酮、 N·乙醯基-2-吡咯啶酮、N,N-二甲基甲醯胺、N,N-二甲基甲 醯胺、N,N-二甲基乙醯胺、二甲基亞碾、γ-丁內酯、環丁颯、 鹵化酚類等有機溶劑。 本發明中,作爲使聚醯亞胺樹脂與有機溶媒混合之手 段,並無特別限定,可列舉例如:使用一般的攪拌翼、高黏度 用之攪拌翼進行混合攪拌之方法;使用多軸擠出機或靜態攪拌 器等之方法;進一步使用滾輪硏磨機等之高黏度用混合分 散機的方法進行混合攪拌。 本發明所得聚醯亞胺樹脂溶液中之聚醯亞胺樹脂的組 成,可列舉如:宜含有1至50質量%者,以5至30質量%者更 佳。此時,該黏度係以經BrookField黏度計測定爲0.1至 2000Pa.S者爲佳,以1至1〇〇〇 Pa’S者更佳,由於可穩定 地送液而佳。 本發明使用之經活化光線照射而產生酸之化合物爲感光 劑,係具有使酸產生且增大對光照射部之顯影液的可溶性 之機能者。其種類可列舉例如:二偶氮萘醌、芳基二偶氮 鑰鹽、二芳基碘鑰鹽、三芳基毓鹽等,並無特別限制’惟 以二偶氮萘醌系化合物因感度高而爲較佳者。 -22- 201033251 二偶氮萘醌系感光劑之具體例可列舉如:1,2·萘醌-2-二 叠氮-5-磺酸、1,2-萘醌-2-二疊氮-4-磺酸之低分子羥基苯、 2-以及4-甲基-酚、4,4'-羥基-丙烷之酯等。 二偶氮萘醌系感光劑之其他具體例亦可列舉如:酚化合 物與1,2-萘醌-2-二疊氮-5-磺酸或1,2-萘醌-2-二疊氮-4-磺 酸之酯。該等可單獨使用亦可組合二種以上使用。 經活化光線照射而產生酸之化合物的添加量,由感度與 顯影時間之容許範圍之點,係相對於100質量份之(a)成分 〇 而宜爲1至5 0質量份。如未達1質量份時,則難以得到良 好圖案,而超出50質量份時,感度易於大幅降低。 本發明之正型感光性聚醯亞胺樹脂組成物,亦可含有其 他添加劑,例如:交聯劑、塑化劑、表面活性劑、增敏劑、 接著促進劑等之添加劑。 使用本發明之正型感光性聚醯亞胺樹脂組成物之圖案形 成方法,係使用本發明之正型感光性聚醯亞胺樹脂組成物 並依光微影技術而形成由該組成物之聚醯亞胺所成的聚醯 W 亞胺膜者。本發明之圖案形成方法中,首先在支撐基板等 之表面形成使用本發明之正型感光性聚醯亞胺樹脂組成物 的覆膜。 另外,在使用本發明之正型感光性聚醯亞胺樹脂組成物 之圖案形成方法中,爲了提高聚醯亞胺覆膜與支撐基板的 接著性,可預先將支撐基板表面以接著助劑處理。由聚醯 亞胺所成的覆膜係例如在形成正型感光性聚醯亞胺樹脂組 成物(以下稱爲漆)之膜後,將此經由乾燥而形成。本發明 -23- 201033251 之聚醯亞胺覆膜之厚度並無特別限制’以形成 左右之覆膜爲宜,以3μιη以上更佳’特別以25μιη之膜厚 更爲適用。 在該正型感光性樹脂組成物中,二偶氮萘醌系感光劑之調 配比例過少時,曝光部與非曝光部之溶解度差過小而無法 經顯影而形成圖案,過多時,唯恐對聚酯醯亞胺聚合物之 膜物性(韌性、線熱膨脹係數、玻璃轉移溫度、耐熱性等) 有不良影響之外,硬化後會有減膜之重大問題產生’因此’ 該調配比例,相對於聚合物以5至40重量%爲佳,以20 至40重量%更佳。 上述製膜步驟宜在120 °C以下進行。如在該溫度以上,恐 致使二偶氮萘醌系感光劑開始進行熱分解。例如於60°C下 製膜時,塗膜中會殘留多量的溶媒。此時在曝光操作之前 可先在80至120 °C下進行1至30分鐘之預烘。 使用正型感光性聚醯亞胺樹脂組成物之聚醯亞胺覆膜之 _ 形成係因應正型感光性聚醯亞胺樹脂組成物之黏度等,從 使用旋轉之旋轉塗布、浸漬、噴霧印刷、網版印刷等之手 段適當選擇而進行。另外,覆膜之膜厚可依塗布條件、本 組成物之固形分濃度等而調節。並且,亦可預先將形成於 支撐基板之覆膜由支撐體上剝離,並將由聚醯亞胺所成之 片黏貼在上述支撐基板之表面,藉此而形成上述覆膜。 其次,在該形成之覆膜上隔著規定圖案之光罩在室溫下 照光(紫外光等之活化光線)1秒鐘至1小時之後,經鹼性水 溶液溶解曝光部而去除,得到所要之凸版圖案(relief -24- 201033251 pattern)»此時,顯影後之殘膜率以80%以上爲佳,以85% 以上更佳,尤以90%以上爲最佳。並且,感度係以600mJT/Cm2 以下爲佳,以500mJ/cm2以下更佳,又以4 50mJ/cm2以下 爲最佳。此處之感度係爲了得到以1 0 μηι以下高解析度之 圖案的最低必要之曝光量。 上述鹼性水溶液通常爲將鹼性化合物溶解於水之溶液。 鹼性化合物可列舉如:鹼金屬、鹼土金屬或銨離子之氫氧 化物或碳酸鹽,以及胺化合物等。可適當地使用例如:氫氧 化鈉、氫氧化鉀、碳酸鈉、矽酸鈉、偏矽酸鈉、氨水等之無 機鹼類;乙基胺、正丙基胺類;三乙基胺、甲基二乙基胺等 之三級胺類;二乙醇胺、三乙醇胺等之醇胺類;氫氧化四甲 銨、氫氧化四乙錶等之四級銨鹽鹼類之水溶液以及在此添 加適量之如甲醇、乙醇之醇類等的水溶液有機溶液或界面 活性劑之水溶液。顯影方法可有噴霧、覆液(paddle)、浸漬、 超音波等之方式。在多數的電子機器中,唯恐殘留金屬會 有對電特性不良影響之情形,因此有機鹸較爲適用,半導 體製程中所常用之氫氧化四甲銨水溶液爲適用。 此時,氫氧化四甲銨水溶液之濃度可使用〇.〇5至10重 量%,以0.1至5重量%爲佳,以2.38重量%更佳之水溶液, 在室溫下顯影1 〇秒鐘至1 〇分鐘,再以純水清洗即可得到 鮮明之正型圖案。 在上述顯影之後,可依需要以水或弱溶劑清洗,再於 l〇〇°C前後進行乾燥,期待使圖案穩定化。將形成圖案之膜 進行加熱即可得到具有優異耐熱性、機械特性以及零特性 -25- 201033251 之膜。 在使用以往之聚醯亞胺前驅物時,該圖案 3 00至500°C,該加熱溫度未達300°C時,聚 械特性以及熱特性會有降低之傾向,如超出 亞胺膜之機械特性以及熱特性會有變差之傾 明中並無需該高溫加熱,至多在2 00°C左右之 燥或低沸點物等之去除,即可形成耐熱性之 的聚醯亞胺圖案等之聚醯亞胺覆膜。 ® 如此之本發明的正型感光性聚醯亞胺樹脂 在半導體裝置等之電子零件用的表面保護膜 之層間絕緣膜等。使用本發明之正型感光性 成物的表面保護膜(保護層膜),由於接著 的線膨脹係數,因而並無基材的翹曲或由基 用本發明之正型感光性聚醯亞胺樹脂組成物 緣膜或表面保護膜之半導體元件成爲信賴性 用以得到如此信賴性高之半導體元件的膜之 數(50至200°C之溫度範圍的平均線膨脹係 40ppmTC爲佳,以 〇·1 至 30 ppm/°C更佳。 本發明之正型感光性聚醯亞胺樹脂組成物 絕緣層或表面保護膜層,由於其之優異特性 護層膜、核心、彩色、底膠塡充等之材料使 [實施例] 以下係呈示實施例而更具體地說明本發明 不僅限於該等實施例。同時,實施例中之各 之加熱溫度爲 醯亞胺膜之機 4 0 0 °C時,聚醯 向,然於本發 溫度下進行乾 低線膨脹係數 組成物可使用 、多層配線板 聚醯亞胺樹脂 性優異且爲低 材的剝離,使 而得的層間絕 極爲優異者。 具體線膨脹係 數),以 〇至 並非僅爲層間 ,而可作爲保 用。 ,惟本發明並 特性除了上述 -26- 201033251 方法之外,係以下述方法測定。 1 ·聚醯亞胺之線熱膨脹係數(CTE) 對於測定對象之聚醯亞胺,係將晶圓破壞剝離,在下述 條件中測定伸縮率,測定5 0 °C至6 5 °C、6 5 °C运8 (j t 之每 隔15°C的伸縮率/溫度,進行此測定至200°C,算出卩斤有測 定値之平均値作爲CTE。 機械名稱:MAC科學公司製造之TMA4000S 試樣長度:20mm ❹ 試樣寬度:2mm 開始負重:34.5g/mm2 開始昇溫之溫度:25°C 結束昇溫之溫度:250°C 昇溫速度:5°C/min 氣體環境:氬氣 2. 殘膜率之求算 Λ 測定預烘處理後之膜厚與顯影後之膜厚,依下述之計算 〇 方法求算殘膜率。 殘膜率(%)={(顯影後之膜厚)/(預烘處理後之膜厚)}χ1 〇〇 3. 感度評估 將用以鮮明地形成解析度1 〇 μιη之圖案所需的最低限度 之曝光量作爲感度。是否鮮明地形成解析度ίο μπι之圖案 係經由以顯微鏡觀察曝光·顯影後之凸版圖案而判斷。曝光 量係使用紫外光計量測試卡·光量計(UV-M03 : OAK股份有 限公司製造)而測定。 -27- 201033251 4.膜之外觀評估 將顯影後以及熱處理後之外觀以目視以及顯微鏡觀察。 對於顯影後之外觀評估,如未曝光部無顯影殘留且圖案邊 緣平滑者評估爲「良好」。而且,對於熱處理後之外觀評估’ 如膜無龜裂、空隙、剝落、晶圓之龜裂或翹曲等評估爲「良 好」。 (合成例1) 將具備氮氣導入管、溫度計、攪拌棒之反應容器內以氮 氣取代後,裝入4,6-二胺基二間苯二酚鹽酸鹽2.13g、無水 雙(偏苯三酸)苯酯4.58g、三乙基胺2.08g »接著,添加N-甲基-2-吡咯啶酮50g使完全溶解後,如在25°C之反應溫度 中攪拌20小時,可得到淡黃色的聚醯胺酸溶液。然後,在 裝置中設置迪安*斯塔克接收器(Dean-stark trap),在N2氣 流下,於200 °C之溫度中攪拌6小時。空冷後,開始以丙酮 2 0 00ml進行再沉澱。將所得固形物以混合機粉碎,在丙酮 & 1000ml中於25 °C攪拌清洗2次,在丙酮1000 ml中於回流 下攪拌清洗6小時。減壓下於70 °C進行乾燥1 2小時,得到 產量36.9g淡黃色之聚醯亞胺樹脂。其次,將所得聚醯亞 胺樹脂l〇g與N-甲基-2-吡咯啶酮80g混合並在80t之溫度 下攪拌1小時,藉此得到聚醯亞胺樹脂溶液。將此聚醯亞 胺樹脂溶液作爲漆-1。 (合成例2) 除了二胺係使用4-胺基水楊酸對胺基苯酯之外,其餘與 合成例1相同操作,藉此而得到所對應之聚醯亞胺樹脂溶 -28- 201033251 液。將此聚醯亞胺樹脂溶液作爲漆-2。 (合成例3) 除了酸酐係使用無水雙(偏苯三酸)莽酯之外,其餘與合 成例2相同操作,藉此而得到所對應之聚醯亞胺樹脂溶 液。將此聚醯亞胺樹脂溶液作爲漆-3。 (合成例4) 除了酸酐係使用無水雙(偏苯三酸)苯醯胺之外,其餘與 合成例1相同操作,藉此而得到所對應之聚醯亞胺樹脂溶 〇 液。將此聚醯亞胺樹脂溶液作爲漆-4。 (合成例5) 除了二胺係使用4-胺基苯基-41-胺基、3’-羥基苯甲酸酯 之外,其餘與合成例2相同操作,藉此而得到所對應之聚 醯亞胺樹脂溶液。將此聚醯亞胺樹脂溶液作爲漆-5。 (合成例6) 除了二胺係以對苯二胺取代4-胺基水楊酸對胺基苯酯之 外,其餘與合成例1相同操作,藉此反應中聚醯亞胺樹脂 y 由溶液析出。無法得到可溶之聚醯亞胺》 (合成例7) 除了酸酐係使用4,4i-(2,2-六氟異亞丙基)二酞酸二酐之 外,其餘與合成例2相同操作,藉此而得到所對應之聚醯 亞胺樹脂溶液。將此聚醯亞胺樹脂溶液作爲漆-7。 (實施例1) 在90°C之漆-1中添加由經酯化之醌二叠氮化合物所成的感光 劑NT-200(東洋合成工業股份有限公司)2.00g,過濾後,製成正 -29- 201033251 型感光性聚醯亞胺樹脂組成物。將該正型感光性聚醯亞胺 樹脂組成物以旋塗機在矽晶圓上旋轉塗布,並使用熱盤在 100°C下進行10分鐘之乾燥,得到ΙΟμιη之塗膜。將該塗膜 通過遮罩(1至50μ之殘留圖案以及脫落圖案),使用超高壓 水銀燈通過圖案遮罩照射紫外光。然後進行顯影。顯影係 使用2.38%氫氧化四甲銨水溶液進行。接著,以蒸餾水清 洗倂進行乾燥。其結果,以曝光量3 00 m J/cm2照射而形成 良好圖案,殘膜率爲90%。而且,曝光後之外觀亦佳。更 V 且,在氮氣環境下,進行120 °C/15分鐘、250 °c/ 60分鐘之 熱處理,得到附有毫無翹曲、龜裂以及剝落之聚醯亞胺覆 膜的矽晶圓。並且,依前述方法測定聚醯亞胺皮膜之線膨 脹係數時,爲l〇ppm/°C。 (實施例2至5) 除了以漆-2至5取代實施例1中所使用之漆-1以外,進 行與實施例1之相同操作而調整正型感光性聚醯亞胺樹脂 ©組成物’進行與實施例1之相同評估,將其結果示於表卜 (比較例1至2) 除了以合成例6之聚醯亞胺與漆-7取代實施例1中所使 用之漆-1以外,進行與實施例1之相同操作而調整正型感 光性聚醯亞胺樹脂組成物,並進行與實施例1之相同評 估,將其結果示於表1。 -30- 201033251 [表i] 線熱膨脹係 數(ppm广C) 感度 (mJ/cm2) 殘膜率 (%) 顯影後 之外觀 熱處理後 之外觀 實施例 1 10 300 90 良好 良好 2 13 300 91 良好 良好 3 15 360 89 良好 良好 4 17 320 90 良好 良好 5 13 300 89 良好 良好 比較例 1 由於聚醯亞胺的不溶而無法測定 2 60 500 90 良好 良好 [產業上之可利用性] 本發明之正型感光性聚醯亞胺樹脂組成物,在半導體裝 置之製造中作爲電性、電子絕緣材料,詳而言之,係使用 在1C或LSI等之半導體元件的表面保護膜、層間絕緣膜 等,可利用爲精細圖案加工所需要者等,並無伴隨著醯亞 胺化而有水的產生’且無暴露於高溫中,而且線膨脹係數 低而與基材之半導體晶圓等的線膨脹係數接近,而無因其 © 分離使基材翹曲或與基材間之該等覆膜的剝落,在該等用 途上即有意義❶ 【圖式簡單說明】 無。 【主要元件符號說明】 -31-Q 3,3'-diamino-4-phenoxybenzophenone, 4,4'-diamino-5-phenoxybenzophenone, 3,4'-diamino-4- Phenoxybenzophenone, 3,4'-diamino-5'-phenoxybenzophenone, 3,3'-diamino-4,4'-di-biphenyloxydiphenyl Methyl ketone, 4,4'-diamino-5,5'-di-biphenoxybenzophenone, 3,4|-diamino-4,5'-di-biphenyloxydiphenyl Methyl ketone, 3,3l-diamino-4-biphenoxybenzophenone, 4,4'-diamino-5-biphenoxybenzophenone, 3,4'-diamine -4-biphenoxybenzophenone, 3,4'-diamino-5'-biphenoxybenzophenone, 1,3-bis(3-amino-4-phenoxybenzene) Mercapto) benzene, 1,4-bis(3-amino-4-phenoxybenzene-18-201033251 fluorenyl)benzene, 1,3-bis(4-amino-5-phenoxybenzene) Mercapto) benzene, i, 4_bis(4-amino-5-phenoxybenzylidene)benzene, 1,3·bis(3-amino-4_biphenoxy benzhydryl Benzene, 1,4-bis(3-amino-4-biphenoxybenzhydryl)benzene, 1>3_bis(4-amino-5-biphenoxybenzylidene)benzene, 1,4-bis(4-amino-5-biphenoxybenzhydryl)benzene, 2,6-bis[4-(4-amino-α, α- Methylbenzyl)phenoxy]benzonitrile and some or all of the hydrogen atoms of the aromatic ring in the above aromatic diamine via a halogen atom, an alkyl group having 1 to 3 carbon atoms or an alkoxy group, cyanide a halogenated alkyl group or alkoxy-substituted aromatic diamine having a hydrogen atom of a part or all of an alkyl group or an alkoxy group substituted by a halogen atom, in order to maintain a low coefficient of linear expansion It is preferred to use p-phenylenediamine. These diamines may be used alone or in combination of two or more. In the range of the non-destructive and polymerization reactivity and the desired properties of the polyimine, the poly(imine) of the present embodiment has a general formula (Chemical Formula 2) or a general formula. The aliphatic diamine which can be used in parts other than the diamine shown is not particularly limited, and examples thereof include 4,4'·methylenebis(cyclohexylamine), @isophoronediamine. , trans-1,4·diaminocyclohexane, cis-1,4-diaminocyclohexane, 1,4-cyclohexanedimethylamine, 2,5-bis(aminomethyl)di Ring [2,2,1]heptane, 2,6-bis(aminomethyl)bicyclo[2,2,1]heptane, 3,8-bis(aminomethyl)tricyclo[5, 2,1,〇]decane, 1,3-diamine adamantane, 2,2-bis(4-aminocyclohexane)propane, 2,2-bis(4-aminocyclohexane)6 Fluoropropane, 1,3-propanediamine, iota, 4_tetramethylenediamine, 1,5-pentamethylenediamine, 1,6-hexamethylenediamine, anthracene, 7-heptylenediamine, 1,8-octa Methylenediamine, 1,9-non-methylenediamine, and the like. These may also be used in more than two types. The monomer mixing ratio (mole-19-201033251 ratio) when synthesizing the polyimine resin of the present invention is expressed by the method of tetracarboxylic acid (anhydride)/diamine, which is 0.800 to 1.20 0/1.200 to 0.800. It is better to use 0.900 to 1.100/1.100 to 0.900, and preferably 0.950 to 1.15 0/1.150 to 0.950. In order to block the molecular terminal of the present invention, a terminal blocking agent such as a dicarboxylic anhydride, a tricarboxylic anhydride or an aniline derivative can be used. Suitable for use in the present invention are phthalic anhydride, maleic anhydride, ethynyl aniline, and maleic anhydride is more preferred. The terminal blocking agent is used in an amount of from 0.001 to 1.0 mol per mol of the monomer component. The organic solvent to be used in the synthesis of the polyimine resin of the present invention is as long as it can dissolve any of the polyaminic acid as a raw material monomer and an intermediate product, or a polyamidene resin as a product. There is no particular limitation, and examples thereof include o-cresol, m-cresol, p-cresol ' N-methyl-2-pyrrolidone, N-ethin-2-pyrrolidone, N, N- Dimethylformamide, N,N-dimethylformamide, N,N-dimethylacetamide, dimethyl sulfoxide, γ-butyrolactone, cyclopentane, halogenated phenols, etc. These solvents may be used singly or in combination. The polar organic solvent may be used in an amount sufficient to dissolve the monomer to be fed, and generally contains 1 to 50% by mass of the solid component, and preferably 5 to 30% by mass. The polymerization reaction is carried out in an organic solvent while stirring and/or mixing, and is continuously carried out at a temperature ranging from 0 to 80 ° C for 1 to 30 hours, and then continuously at a temperature of from 100 to 300 ° C for 1 Torr. Minutes to 30 hours, if necessary, can divide the polymerization reaction or raise the temperature. In this case, the order of addition of the two reaction bodies is not particularly limited, but it is preferred to add an aromatic tetracarboxylic acid anhydride to the solution of the aromatic diamine. A closed loop catalyst can also be used in the present invention. Specific examples of the ring-closing catalyst used in the present invention include aromatic acids such as benzoic acid, o-benzoic acid, m-benzoic acid, p-benzene-20-201033251 formic acid, and fats such as trimethylamine and triethylamine. A trivalent amine; a heterocyclic tertiary amine such as isoquinoline, pyridine or β-picoline, etc., preferably using at least one amine selected from the group consisting of heterocyclic tertiary amines. The content of the closed-loop catalyst is preferably in the range of 0.01 to 10·00 in terms of the content of the closed-loop catalyst (mole) / the content of the poly-proline in the precursor (mol). A dehydrating agent can also be used in the present invention. For example, an aliphatic carboxylic anhydride such as acetic anhydride, propionic anhydride or butyric anhydride, or an aromatic carboxylic anhydride such as benzoic anhydride may be used, and it is not particularly limited as long as it can be effectively dehydrated. The content of the dehydrating agent is preferably in the range of 〇_〇1 to 10.00 in terms of the content of the dehydrating agent (mole) / the content of polyglycine (mol). In the present invention, a co-solvent can be used in order to azeotrope with water. Examples thereof include toluene, xylene, and the like, and are not particularly limited as long as they are effectively azeotroped with water. In the present invention, an additive may be added for the purpose of further improving the properties of the polyimide resin. These additives are various additives depending on the purpose, and are not limited to specific ones. Further, the addition method is not limited to a specific one in the addition period. Examples of the additive include metal oxides such as cerium oxide, titanium oxide, and aluminum oxide; and organic or inorganic additives such as phosphates such as calcium phosphate, calcium hydrogen phosphate, and calcium pyrophosphate. In the present invention, the reacted polyimine resin can be reprecipitated from the reaction solution with a suitable weak solvent. Examples of the weak solvent include acetone, methanol, ethanol, water, etc., and those which are effective for reprecipitation are not limited thereto. Further, the solvent for removing the reaction solvent remaining after reprecipitation is also not particularly limited, and it is preferred to use a solvent used for reprecipitation. In the present invention, the reaction solution may be used as a solution of a polyimide resin, or the re-precipitated polyimine resin may be redissolved in a solvent from the reaction solution to obtain a polyimide resin solution. In the case of the latter, it is not particularly limited as long as the polyimine resin can be effectively dissolved, and examples thereof include o-cresol, m-cresol, p-cresol, and N-methyl-2-pyrrolidone. , N·Ethyl-2-pyrrolidone, N,N-dimethylformamide, N,N-dimethylformamide, N,N-dimethylacetamide, dimethyl Organic solvents such as milled, γ-butyrolactone, cyclobutyl hydrazine, and halogenated phenols. In the present invention, the means for mixing the polyimine resin with the organic solvent is not particularly limited, and examples thereof include a method of mixing and stirring using a general stirring blade or a stirring blade for high viscosity; and using multiaxial extrusion. A method such as a machine or a static agitator; and further mixing and agitating using a high-viscosity mixer such as a roller honing machine. The composition of the polyimine resin in the polyimine resin solution obtained by the present invention is preferably, for example, preferably from 1 to 50% by mass, more preferably from 5 to 30% by mass. In this case, the viscosity is preferably 0.1 to 2000 Pa.s by the Brookfield viscometer, more preferably 1 to 1 Pa's, and it is preferable because the liquid can be stably supplied. The compound which generates an acid by irradiation with activating light which is used in the present invention is a sensitizer, and has a function of generating an acid and increasing solubility in a developing solution of a light-irradiating portion. The type thereof may, for example, be diazonaphthoquinone, an aryldiazolium salt, a diaryl iodine salt or a triarylsulfonium salt, and is not particularly limited to the case where the diazonaphthylquinone compound is highly sensitive. And better. -22- 201033251 Specific examples of the diazonaphthoquinone-based sensitizer include, for example, 1,2, naphthoquinone-2-diazide-5-sulfonic acid, 1,2-naphthoquinone-2-diazide- 4-sulfonic acid low molecular hydroxybenzene, 2- and 4-methyl-phenol, 4,4'-hydroxy-propane ester, and the like. Other specific examples of the diazonaphthoquinone-based sensitizer may also be exemplified by a phenol compound and 1,2-naphthoquinone-2-diazide-5-sulfonic acid or 1,2-naphthoquinone-2-diazide. An ester of 4-sulfonic acid. These may be used alone or in combination of two or more. The amount of the compound which generates an acid upon irradiation with the activating light is, in terms of the allowable range of the sensitivity and the development time, is preferably from 1 to 50 parts by mass based on 100 parts by mass of the component (a). If it is less than 1 part by mass, it is difficult to obtain a good pattern, and when it exceeds 50 parts by mass, the sensitivity is liable to be greatly lowered. The positive photosensitive polyimide resin composition of the present invention may contain other additives such as a crosslinking agent, a plasticizer, a surfactant, a sensitizer, and an additive such as a promoter. The pattern forming method using the positive photosensitive polyimide resin composition of the present invention is formed by using the positive photosensitive polyimide resin composition of the present invention and forming a composition by the photolithography technique. A polyfluorene W imine film formed by quinone. In the pattern forming method of the present invention, first, a film using the positive photosensitive polyimide resin composition of the present invention is formed on the surface of a support substrate or the like. Further, in the pattern forming method using the positive photosensitive polyimide resin composition of the present invention, in order to improve the adhesion of the polyimide film to the support substrate, the surface of the support substrate may be treated with an auxiliary agent in advance. . The film formed of the polyimine is formed, for example, by forming a film of a positive photosensitive polyimide resin composition (hereinafter referred to as lacquer). The thickness of the polyimide film of the present invention -23-201033251 is not particularly limited, and it is preferable to form a film on the left and right sides, more preferably 3 μm or more, and particularly preferably a film thickness of 25 μm. In the positive photosensitive resin composition, when the blending ratio of the disazonaphthoquinone-based sensitizer is too small, the difference in solubility between the exposed portion and the non-exposed portion is too small to develop a pattern, and when it is too large, it is fearful of polyester. The membrane properties (toughness, linear thermal expansion coefficient, glass transition temperature, heat resistance, etc.) of the quinone imine polymer have adverse effects, and there is a major problem of film reduction after hardening. Therefore, the ratio is adjusted relative to the polymer. It is preferably from 5 to 40% by weight, more preferably from 20 to 40% by weight. The film forming step described above is preferably carried out at 120 ° C or lower. If it is at or above this temperature, the disazonaphthoquinone-based sensitizer may be thermally decomposed. For example, when a film is formed at 60 ° C, a large amount of a solvent remains in the coating film. At this time, pre-baking may be performed at 80 to 120 ° C for 1 to 30 minutes before the exposure operation. The polyimide film of the positive photosensitive polyimide composition is formed by the spin coating, dipping, and spray printing using the rotation of the positive photosensitive polyimide resin composition. The means such as screen printing are appropriately selected. Further, the film thickness of the film can be adjusted depending on the coating conditions, the solid content concentration of the composition, and the like. Further, the film formed on the support substrate may be peeled off from the support in advance, and a sheet made of polyimide may be adhered to the surface of the support substrate to form the film. Next, the formed film is irradiated with a mask of a predetermined pattern at room temperature (activated light such as ultraviolet light) for 1 second to 1 hour, and then the exposed portion is dissolved in an alkaline aqueous solution to remove the desired portion. Relief pattern (relief -24-201033251 pattern)» At this time, the residual film ratio after development is preferably 80% or more, more preferably 85% or more, and particularly preferably 90% or more. Further, the sensitivity is preferably 600 mJT/cm 2 or less, more preferably 500 mJ/cm 2 or less, and most preferably 4 50 mJ/cm 2 or less. The sensitivity here is the minimum necessary exposure amount in order to obtain a pattern having a high resolution of 10 μηη or less. The above alkaline aqueous solution is usually a solution in which a basic compound is dissolved in water. The basic compound may, for example, be a hydroxide or a carbonate of an alkali metal, an alkaline earth metal or an ammonium ion, an amine compound or the like. For example, inorganic bases such as sodium hydroxide, potassium hydroxide, sodium carbonate, sodium citrate, sodium metasilicate, aqueous ammonia, etc.; ethylamine, n-propylamine; triethylamine, methyl a tertiary amine such as diethylamine; an alcohol amine such as diethanolamine or triethanolamine; an aqueous solution of a quaternary ammonium salt such as tetramethylammonium hydroxide or tetraethyl hydroxide; and an appropriate amount added thereto. An aqueous solution of an aqueous solution of an alcohol such as methanol or ethanol or an aqueous solution of a surfactant. The development method may be in the form of a spray, a paddle, a dipping, an ultrasonic wave or the like. In most electronic devices, it is feared that residual metals may have adverse effects on electrical characteristics. Therefore, organic hydrazine is suitable, and an aqueous solution of tetramethylammonium hydroxide commonly used in the semi-conductive process is suitable. At this time, the concentration of the aqueous solution of tetramethylammonium hydroxide can be 5 to 10% by weight, preferably 0.1 to 5% by weight, and more preferably 2.38% by weight of the aqueous solution at room temperature for 1 〇 to 1 After a few minutes, clean with pure water to get a clear positive pattern. After the above development, it may be washed with water or a weak solvent as needed, and then dried at about 100 ° C, and it is expected that the pattern is stabilized. The film having the pattern is heated to obtain a film having excellent heat resistance, mechanical properties, and zero characteristics -25-201033251. When the conventional polyimide precursor is used, the pattern is 300 to 500 ° C. When the heating temperature is less than 300 ° C, the mechanical properties and thermal properties tend to decrease, such as a machine that exceeds the imine film. When the characteristics and the thermal characteristics are deteriorated, it is not necessary to heat the high temperature, and at most 200 ° C or so dry or low-boiling substances can be removed to form a heat-resistant polyimine pattern or the like. Bismuth imide film. The positive-type photosensitive polyimide resin of the present invention is an interlayer insulating film or the like of a surface protective film for electronic parts such as a semiconductor device. The surface protective film (protective layer film) using the positive photosensitive material of the present invention has no warpage of the substrate due to the subsequent coefficient of linear expansion or a positive photosensitive polyimide of the present invention. The semiconductor element of the resin composition edge film or the surface protection film is used to obtain the number of films of the semiconductor element having such high reliability (the average linear expansion coefficient of 40 ppm TC in the temperature range of 50 to 200 ° C is preferable) More preferably, it is 1 to 30 ppm/° C. The positive-type photosensitive polyimide resin composition of the present invention has an insulating layer or a surface protective film layer, and has excellent properties such as a cover film, a core, a color, a primer, and the like. [Examples] Hereinafter, the present invention is more specifically described by way of examples, and the present invention is not limited to the examples. Meanwhile, when the heating temperature in each of the examples is 40 ° C of the quinone film, In the case of the polypyrene, the composition of the dry low-linear expansion coefficient can be used at the temperature of the present invention, and the multilayer wiring board is excellent in polyetherimide resin property and is low-peeling, so that the interlayer obtained is extremely excellent. Coefficient of expansion) , to 层 to not only the layer, but as a guarantee. However, the present invention is characterized by the following method in addition to the above-mentioned method -26-201033251. 1 - Linear thermal expansion coefficient (CTE) of polyimine. For the polyimide of the measurement target, the wafer was broken and peeled off, and the expansion ratio was measured under the following conditions, and the measurement was carried out at 50 ° C to 65 ° C, 6 5 °C Yun 8 (jt's expansion rate per 15 °C / temperature, the measurement is carried out to 200 ° C, and the average enthalpy of measurement is calculated as CTE. Machine name: TMA4000S sample length manufactured by MAC Science :20mm ❹ Sample width: 2mm Starting load: 34.5g/mm2 Temperature at which temperature starts: 25°C Temperature at the end of temperature: 250°C Temperature increase rate: 5°C/min Gas environment: Argon 2. Residual film rate Calculate Λ Measure the film thickness after pre-baking treatment and the film thickness after development, and calculate the residual film ratio according to the following calculation method. Residual film rate (%) = {(film thickness after development) / (pre-bake Film thickness after treatment)}χ1 〇〇3. Sensitivity evaluation will be used to vividly form the minimum exposure amount required for the pattern of resolution 1 〇μιη as the sensitivity. Whether the resolution is clearly formed ίο μπι It is judged by microscopic observation of the relief pattern after exposure and development. The exposure amount is UV. Measurement test card and light meter (UV-M03: manufactured by OAK Co., Ltd.) -27- 201033251 4. Evaluation of the appearance of the film The appearance after development and after heat treatment was visually observed and observed under a microscope. If the unexposed part has no development residue and the pattern edge is smooth, it is evaluated as “good.” Moreover, the evaluation of the appearance after heat treatment “if the film is free of cracks, voids, peeling, cracking or warping of the wafer, etc.” is evaluated as “ (Synthesis Example 1) After replacing the inside of a reaction vessel equipped with a nitrogen gas introduction tube, a thermometer, and a stir bar with nitrogen gas, 2.13 g of 4,6-diaminodisorcinol hydrochloride was added, and anhydrous bis ( 4.58 g of trimellitic acid) phenyl ester and 2.08 g of triethylamine. Next, 50 g of N-methyl-2-pyrrolidone was added to completely dissolve the mixture, and the mixture was stirred at a reaction temperature of 25 ° C for 20 hours. A pale yellow polyaminic acid solution was obtained. Then, a Dean-stark trap was placed in the apparatus, and the mixture was stirred at a temperature of 200 ° C for 6 hours under a flow of N 2 gas. Start reprecipitation with acetone 200 ml. The product was pulverized in a mixer, and washed twice in acetone & 1000 ml at 25 ° C, and washed with stirring in 1000 ml of acetone for 6 hours under reflux, and dried at 70 ° C for 12 hours under reduced pressure to obtain a yield. 36.9 g of a pale yellow polyimine resin. Next, the obtained polyimine resin 100 g was mixed with 80 g of N-methyl-2-pyrrolidone and stirred at a temperature of 80 t for 1 hour, thereby obtaining a poly A solution of a quinone imine resin. This polyimine resin solution was used as lacquer-1. (Synthesis Example 2) The same procedure as in Synthesis Example 1 was carried out except that the diamine-based 4-aminosalicylic acid-p-aminophenyl ester was used, whereby the corresponding polyimine resin was dissolved. -28-201033251 liquid. This polyimine resin solution was used as Paint-2. (Synthesis Example 3) A corresponding polyimine resin solution was obtained in the same manner as in Synthesis Example 2, except that the anhydride was an anhydrous bis(trimellitic acid) decyl ester. This polyimine resin solution was used as paint-3. (Synthesis Example 4) The same procedure as in Synthesis Example 1 was carried out except that the anhydride was an anhydrous bis(trimellitic acid) benzoguanamine, whereby a corresponding polyimine resin solvent solution was obtained. This polyimine resin solution was used as lacquer-4. (Synthesis Example 5) The same operation as in Synthesis Example 2 was carried out except that the diamine was a 4-aminophenyl-41-amino group or a 3'-hydroxybenzoic acid ester, whereby the corresponding polyfluorene was obtained. Imine resin solution. This polyimine resin solution was used as lacquer-5. (Synthesis Example 6) The same operation as in Synthesis Example 1 except that the diamine was substituted with p-phenylenediamine for 4-aminosalicylic acid p-aminophenyl ester, whereby the polyimine resin y was reacted from the solution. Precipitate. Incapable of obtaining soluble polyimine (Synthesis Example 7) The same operation as in Synthesis Example 2 except that 4,4i-(2,2-hexafluoroisopropylidene)dicarboxylic acid dianhydride was used as the acid anhydride system. Thereby, the corresponding polyimine resin solution is obtained. This polyimine resin solution was used as paint-7. (Example 1) 2.00 g of a sensitizer NT-200 (Toyo Seiki Co., Ltd.) formed from an esterified quinone diazide compound was added to lacquer-1 at 90 ° C, and filtered to obtain a positive -29- 201033251 Type photosensitive polyimide resin composition. The positive photosensitive polyimide resin composition was spin-coated on a crucible wafer by a spin coater, and dried at 100 ° C for 10 minutes using a hot plate to obtain a coating film of ΙΟμηη. The coating film was passed through a mask (a residual pattern of 1 to 50 μ and a peeling pattern), and ultraviolet light was irradiated through the pattern mask using an ultrahigh pressure mercury lamp. Then development is carried out. The development system was carried out using a 2.38% aqueous solution of tetramethylammonium hydroxide. Then, it was washed with distilled water and dried. As a result, a good pattern was formed by irradiation with an exposure amount of 300 m J/cm 2 , and the residual film ratio was 90%. Moreover, the appearance after exposure is also good. Further, in a nitrogen atmosphere, heat treatment at 120 ° C / 15 minutes and 250 ° C / 60 minutes was carried out to obtain a tantalum wafer with a polyimide film which was free from warpage, cracking and peeling. Further, when the linear expansion coefficient of the polyimide film was measured by the above method, it was 10 〇 ppm / °C. (Examples 2 to 5) The same procedure as in Example 1 was carried out except that the paint 1 to 5 was used instead of the paint-1 used in Example 1, and the positive photosensitive polyimide resin © composition was adjusted. The same evaluation as in Example 1 was carried out, and the results thereof are shown in Tables (Comparative Examples 1 to 2) except that the lacquer-1 used in Example 1 was replaced by the polyimine and the varnish-7 of Synthesis Example 6, The positive photosensitive polyimide resin composition was adjusted in the same manner as in Example 1 and evaluated in the same manner as in Example 1. The results are shown in Table 1. -30- 201033251 [Table i] Linear thermal expansion coefficient (ppm wide C) Sensitivity (mJ/cm2) Residual film rate (%) Appearance after development Appearance after heat treatment Example 1 10 300 90 Good good 2 13 300 91 Good and good 3 15 360 89 Good good 4 17 320 90 Good good 5 13 300 89 Good good Comparative example 1 Unable to measure due to insolubility of polyimine 2 60 500 90 Good and good [Industrial Applicability] Positive type of the present invention The photosensitive polyimide resin composition is used as an electrical or electronic insulating material in the manufacture of a semiconductor device, and a surface protective film or an interlayer insulating film of a semiconductor device such as 1C or LSI is used. When it is used for the processing of fine patterns, there is no occurrence of water accompanying imidization, and there is no exposure to high temperature, and the coefficient of linear expansion is low, and the coefficient of linear expansion of the semiconductor wafer or the like of the substrate is close. There is no such thing as the warpage of the substrate by the separation of the substrate or the peeling of the film between the substrates, and it is meaningful for such applications. [Simplified illustration] None. [Main component symbol description] -31-
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