200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 九、發明說明： 【發明所屬之技術領域】 本發明疋關於一種鍵盤測試系統及其方法，且特別是 有關於一種可以達到自動測試的鍵盤測試系統及其方法。 【先前技術】 鍵盤(key b 〇 ard)這個電子裝置在現今的電腦週邊設備 中有著不可或缺的地位存在。由於各家廠商在設計鍵盤 時，其因為依據電腦系統與使用者的使用需求，所以各家 廠商所設計出的鍵盤型式就不盡相同，以至於市面上就販 售著各種形式的鍵盤。 ’ 一般而言，各家廠商在產線測試鍵盤時，大部分還是 採用人工的方式逐個按下鍵盤内的每一個按鍵(大致需要 二十幾秒左右）’以確認每一個按鍵無瑕苑後才推其上市販 售。然而，因為採用人工的方式進行按鍵測試，所以报有 可能會導致鍵盤的損耗過大，以造成製作成本會增加且產 線產能會下降。 “ 另外，當電腦系統與使用者的使用需求增加時，各家 薇商所設計出的鍵盤按鍵數量就會越多，故而可推知的一 件事就是，在鍵盤測試的過程中，其測試時間必定會增加， 且因為是採用人工的方式來進行鍵盤的測試，所以測試效 率並不彰顯。 ' # > 除此之外，以現今筆記型電腦為例，其同時按下鍵盤 的Fn按鍵與Home/End按鍵時，即可以達到控制筆記型= 腦螢幕的明亮度。或者，同時按下鍵盤的Alt按鍵與料按 5 200837554 PWKS-KB-〇〇38.TWXX 226〇〇twfd〇c/〇〇6 鍵時，即可以達到關閉電腦系統視窗。甚至，同時按下ctrl ，鍵Alt按鍵及Ddete按鍵時，即可呼喚出系統管理視 此以複合鍵型式所代表的功能，也只能採用人工 —“進仃測試，如此鍵盤的測試時間就更須拉長，且 朴越盤時，其所需人力亦相當可觀，所以光光支 付在人力的測試成本上也就相當可觀。 【發明内容】 c υ 本發明的目的就是提供了一種鍵盤自動測 其方法’其藉由利用微處理器，以使得使用者透 ^輸入早兀(例如按下一個按鍵)與編碼單元後，即可達到 線'則式鍵盤單鍵/複合鍵之功能，如此不但可以降低產線 的測試效率其祕|，且更可以增加錄測試鍵盤 與微所3的鍵盤自動測試系統’其包括鍵盤單元 ,^ TO "、中，鍵盤單元具有多數個按鍵。微處理器 j鍵盤單元且内建—段鍵侧試程式，此微處理器依i 信號而於此段鍵盤測試程式中執行其相應的程式， 収鍵盤單元内全部按鍵之單鍵功能或全部按鍵之複合 鍵功能之狀態。 在^發明的~較佳實施例中，鍵盤自動測試系統更包 兀與編碼單元。其中，輸入單元係用以提供多個 號，而編碼單元則依據這些輸入信號而對應的產生 ^供;微處理器的編碼信號。 從另觀點來看，本發明所提供的鍵盤自動測試方法 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 包括下列步驟：首先，將一段鍵盤測試程式寫入至微處理 器中。接著，產生一編碼信號至微處理器，以致使微=理 器依據此編碼信號而於鍵盤測試程式中執行其相應^ 式。最後，依據上述執行的結果，以測試鍵盤單元^ 個按鍵之單鍵功能或其複合鍵功能之狀態。 夕支200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 IX. Description of the Invention: [Technical Field] The present invention relates to a keyboard testing system and method thereof, and in particular to a keyboard test capable of achieving automatic testing System and its methods. [Prior Art] The keyboard (key b 〇 ard) is an indispensable part of today's computer peripherals. Since various manufacturers are designing keyboards, they are designed according to the needs of computer systems and users, so the keyboard types designed by various manufacturers are not the same, so that various forms of keyboards are sold on the market. In general, most manufacturers use manual methods to press each button in the keyboard one by one (about 20 seconds or so). Push it to sell on the market. However, because the button test is performed manually, the report may cause excessive keyboard loss, resulting in increased production costs and reduced production capacity. “In addition, when the demand for computer systems and users increases, the number of keyboard buttons designed by each company will increase. Therefore, one thing that can be inferred is that during the keyboard test, the test time is It will definitely increase, and because the keyboard is tested manually, the test efficiency is not obvious. ' # > In addition, taking the current notebook computer as an example, it simultaneously presses the Fn button of the keyboard and When the Home/End button is pressed, the brightness of the control notebook type = brain screen can be reached. Alternatively, press the Alt button and the material button of the keyboard at the same time. 5 200837554 PWKS-KB-〇〇38.TWXX 226〇〇twfd〇c/〇 When the 〇6 key is pressed, the computer system window can be closed. Even when ctrl, the Alt key and the Ddete key are pressed at the same time, the system management can call the function represented by the composite key type, and can only use artificial - "Into the test, so the test time of the keyboard must be extended, and when the counter is on the disk, the manpower required is also considerable, so the cost of light payment is considerable. SUMMARY OF THE INVENTION c υ The object of the present invention is to provide a keyboard automatic method for detecting 'by using a microprocessor, so that the user can input early (for example, press a button) and the coding unit, that is, It can achieve the function of the line 'single keyboard single button/composite button, which can not only reduce the test efficiency of the production line, but also increase the keyboard automatic test system of the test keyboard and the micro-station 3, which includes the keyboard unit. ^ TO ", the keyboard unit has a number of buttons. The microprocessor j keyboard unit has a built-in segment key side trial program. The microprocessor executes its corresponding program in the keyboard test program according to the i signal, and receives all the single button functions or all buttons of the keyboard unit. The status of the composite key function. In the preferred embodiment of the invention, the keyboard automatic test system further includes a coding unit. The input unit is configured to provide a plurality of numbers, and the coding unit generates corresponding signals according to the input signals; the encoded signals of the microprocessor. From another point of view, the automatic keyboard test method provided by the present invention 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 includes the following steps: First, a keyboard test program is written into the microprocessor. Next, an encoded signal is generated to the microprocessor such that the micro-processor executes its corresponding mode in the keyboard test program in accordance with the encoded signal. Finally, based on the results of the above execution, the state of the single button function of the keyboard unit or its composite key function is tested. Eve
本發明所提供的鍵盤自動測試系統及其方法，因 過使用者將一段鍵盤測試程式寫入微處理器中，藉此二' 用者透過輸入單元提供一個輸入信號至編碼單元 ^元會據以產生一個編碼信號至微處理器，如此當微声^ 杰接收到此編碼信號時，其會執行其相應於鍵盤測試程式 ^的程式。藉此，使用者可預先設定此編碼信號 效(例如測試鍵盤單元的單鍵功能，或者測試鍵盤單元二卜 合鍵功能），如此本發明之賴自動賴彡統相 ^ 時間與其損耗量’以進而降低其製作成本 =為讓本發明之上述和其他目的、特徵和優點能更明 顯易懂’下文特舉本發明之較佳實施例，並配合所附圖 作詳細說明如下。 【實施方式】 、i f發明所欲達到的技術功效係為解決習知在產 線鍵盤 d Ί守丄其採用人工方式測試所衍生出的多項缺點，而以 下之内谷將針對本案之技術特徵與所欲達成之功效做一詳 加描，，=提供給該創作相關領域之技術人員參詳。 圖1緣示為依照本發明較佳實施例的鍵盤自動測試系 7 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 統10之方塊圖。請參照圖i，本實施例之鍵盤自動測試系 統10包括鍵盤單元100與微處理器1〇1。其中，鍵盤單元 100中具有多數個按鍵(未繪示），其係以矩陣的方式排列， 且此矩陣大小例如為行列8xl6或9xl6，然並不限制於此， 也就是說，使用者可依視實際需求而自行調整矩陣的排列 方式及其大小。 微處理器101耦接至編碼單元1〇3，並内建一段由使 Ο 巧所寫入的鍵盤測試程式，且此微處理器1G1係依據編 馬單元103戶斤輸出的編剔吕號ECS，❿於其内建的鍵盤測 試程式中執行相應的程式，以測試鍵盤單元100二的j 功能或是賊的複合鍵功能(複合鍵功能例如為按下 、’ i的Fn按鍵與H〇me/End按鍵、按下鍵盤的按鍵與 =按鍵J是同時按下ctrl按鍵、油按鍵及Deb按鍵… 之狀態。其中，微處理器系可以利用89S51之單晶 ^(smgle chip)來實行，但本實施例並不限制於此，也就是 1使用者可依實際需求*更替具有微處理功能的元件來 ^了 ’且此微處理H 1G1内之鍵制試程式可由使用者依 K際測試魏之需求而加以撰寫並燒錄至微處理哭10卜 ⑽施^’上述編碼單元1〇3祕至輸入單元 單元Η)2ΐϋΓ 1〇3所輸出的編碼信號ECS係依據輸入 的多個輸人信Μ而對應的產 就是說，=二對應!?輸入信號1s，然並不限制於此，也 s 者可依實際需求而增/刪治具的鍵量數。 8 200837554 P WKS-KB-003 8-TWXX 22600twf.doc/〇〇6 依據上述可知，假使輸入單元1Q2係利用A 實現時，可知的是，輸入單元102將會提供16個耠，具來 is至編碼單元103 ’而編碼單元1〇3接收到輪入丄_ 5號 所提供的輸入信號IS後會對應的產生編碼信號^ 102 $理器ΗΠ。。其中，因為輸入單元會提供^個輸3 =石1^闕單兀，，故編碼單元103可以利用16x4 I 柄益（⑽㈣來實現，而此16χ4之編碼器的b &會各別地減輸人單元1G2所提供的16 = is，並依據其16個輸入端之狀態而產生16組*位元= 進制碼(binary code)，亦即從0〇〇〇〜lln，而此会 兀的2進制碼會各別對應到上述16鍵治具的16鍵』4位 表1列為輸入單元102所輸出的16個輪入 編碼單元後所對應編碼成的‘ c 單元⑽此時會提供例如為 的輸入信號is至16x4民突、ΛΑ K , 之、、扁馬态的16個輸入端，而16x4 =碼益接收到此輸入信號IS後，會將其編碼成麵的 兀2進制碼輸出至微處理器1〇1。 接供二、假設使用者按下鍵2，故輸入單元102此時會 咖的輸入信號is至ΐ6χ4之編 輸入端’而16x4之編碼器接收到此輸入信號 理哭】〇Γ。字其編碼成0001的4位元2進制瑪輸出至微處 。而後績的鍵3至鍵亦會各別提供一輸入信號 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 IS至編碼單元1G3進行編碼，其與上述舉例類似，故在此 並不再加以贅述之。 請繼;續參照圖卜依據上述可知，本實施例之微處理 :101係 89S51之單晶片來實行之，故眾所皆知的 =，其具有4個輸出入埠(p〇rt)，亦即p〇〜p3，且每一埠包 含有8只輸出入腳位(1/〇)，亦即p〇 〇〜ρ〇 7、ρι7、 P口2.0〜P2.7、P3.〇〜Ρ3·7 ’所以哪51之單晶片本身具有32 ]X輸出=腳位’其中有4只輸出人腳位會接收上述】㈣ =編碼器所輸出的16組4位元2進制碼，而有24或Μ 只輸出入腳位會各別透過緩衝單元1〇4 鍵盤單元刚(其_按鍵矩陣大小為㈣8·：161=6) ^接。其中，緩衝單元1〇4用於增強由微處理器ι〇1輸出 k號之驅動能力，並避免輸出信號因鍵盤單元ι〇〇中負載 而衰減，且緩衝單元1〇4係可利用積體電路74LS125 來實行之，但於本實施例並不限制於此，也就是說，使用 者I依實際需求而更替具有緩衝功能的元件來實行，且鍵 盤單元100亦不限定為按鍵矩陣大小為行列8χΐ6或9χΐ6。 、在此，得一提的是，本實施例之微處理器101之啟動 方式分為高電位動作(high active)與低電位動作(1〇w active) 兩種，故上述微處理器1G1原本最多只能規咖測試i6 種按鍵測試功能，但因其啟動方式的區別，可使得其能規 劃到測試32種按鍵測試功能。更簡單的說就是，者 器101之啟動方式為高電位動作時，其可執行16^按鍵測 忒功能；而當微處理器101之啟動方式為低電位動作時， 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 其亦可執行另外16種按鍵測試功能，因此運用16鍵治具 即可實現32種按鍵測試功能。 另外’以該發明具有通常知識者當可知，上述實施例 之微處理器101所能規劃的按鍵測試功能種數，其必須視 上述治具的鍵數而決定，也就是說，當上述治具之鍵數為 8鍵時，微處理器1〇1所能規劃的按鍵測試功能種數就為 16種，而當上述治具之鍵數為4鍵時，微處理器1〇1所能 、 規劃的按鍵測試功能種數就為8種。 除此之外’本實施例之鍵盤自動測試系統10的系統電 壓係由電源單元111所供給，其係各別耦接至微處理器 1〇1、編碼單元103及緩衝單元1〇4，來用以各別提供給三 者内所有主動/被動元件運作時所須的工作電壓。 而為了要更清楚的說明本實施例之鍵盤自動測試系統 10的測試運作流程，以下將再舉一例來說明： 凊同時參照圖1及表1，在此假設當使用者按下上述 鍵1時為測試鍵盤單元100内的某一單鍵功能；當使用者 /按下上述鍵2時為測試鍵盤單元100内的某一複合雙鍵功 能；而當使用者按下上述鍵3時為測試鍵盤單元1〇〇内的 某複合二鍵功能，故此時使用者就必須將其相應的程式 (亦即鍵盤測試程式）寫入微處理器1〇1内，如此以達到使 用者所規劃的測試功效。然而，本實施例並不限制於此， 也就是說，使用者可依實際按鍵測試需求，而自行定義或 调整鍵1〜鍵16的按鍵測試功能，只要使用者將其相應的 鍵盤測試程式寫入微處理器101内，即可達到本發明^欲 11 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 達到之功效。 接者’ ^使用者此時按下鍵1時’此時輸入單元 會提供0000000000000001的輸入信號18至16χ4之編碼哭 的16個輸入端，而16x4之編碼器接收到此輸入信號^ 後’會將其編碼成〇〇〇〇的4位元的2進制碼輪出至微處理 器101。之後，微處理器iOi接收到編碼單元所輸出 之0000的4位元2進制碼後，會執行先前使用者所寫:的 鍵制試程式之減的程式，如此以測試鍵盤單元1〇 的某一 /每一單鍵功能。 另外，當使用者此時按下鍵2時，此時輸入單元1〇2 會提供0000000000000010的輸入信號Is至16χ4之編碼哭 ΐ ΪΓίΓ端’ *16x4之編碼器接收到此輸入信； 後’ *將〜扁碼成麵的4位元的2進制碼輸出至微處理 器10卜之後，微處理器101接收到編碼單元⑽ 之麵的4位元2進制碼後，會執行先前使用者所寫= 鍵盤測，程式之相應的程式，如此以測試鍵盤單元_内 的某一複合雙鍵功能，例如Alt+F4、Fn+End。 此外，當使用者此時按下鍵 會提供麵輸入錢駐^ 器2The keyboard automatic test system and method thereof are provided by the user to write a keyboard test program into the microprocessor, so that the user provides an input signal to the coding unit through the input unit. An encoded signal is generated to the microprocessor such that when the microsound receives the encoded signal, it executes its program corresponding to the keyboard test program. Thereby, the user can preset the coded signal effect (for example, testing the one-key function of the keyboard unit, or testing the keyboard unit two-fold key function), so that the present invention relies on the automatic control time and its loss amount to further The above and other objects, features and advantages of the present invention will become more <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; [Embodiment] The technical effect that the invention needs to achieve is to solve many shortcomings derived from the manual test of the production line keyboard, and the following valleys will be aimed at the technical characteristics of the case. The effect that you want to achieve is described in detail, and is provided to the technical personnel in the relevant fields of the creation. 1 is a block diagram of a keyboard automatic test system 7 200837554 PWKS-KB-0038-TWXX 22600 twf.doc/006 according to a preferred embodiment of the present invention. Referring to FIG. 1, the keyboard automatic test system 10 of the present embodiment includes a keyboard unit 100 and a microprocessor 101. The keyboard unit 100 has a plurality of buttons (not shown), which are arranged in a matrix manner, and the matrix size is, for example, a row or column 8xl6 or 9xl6, but is not limited thereto, that is, the user can Adjust the arrangement and size of the matrix according to actual needs. The microprocessor 101 is coupled to the encoding unit 1〇3, and has a built-in keyboard test program written by the user, and the microprocessor 1G1 is based on the singular number ECS output by the horoscope unit 103. The corresponding program is executed in the built-in keyboard test program to test the j function of the keyboard unit 100 or the compound key function of the thief (the composite key function is, for example, pressing the 'n' Fn button and H〇me The /End button, the button for pressing the keyboard, and the button for pressing J are the states of pressing the ctrl button, the oil button, and the Deb button at the same time. The microprocessor can be implemented by using the 89S51 single crystal (smgle chip), but The embodiment is not limited to this, that is, 1 user can replace the component with micro-processing function according to actual needs* and the key test program in the micro-processing H 1G1 can be tested by the user according to the K-test. The requirements are written and burned to the micro-processing cry 10 (10) application of the above coding unit 1 〇 3 secret to the input unit unit Η) 2 ΐϋΓ 1 〇 3 output coded signal ECS based on the input of multiple input letters The corresponding product is said to be, = two corresponding!? Input signal 1 s, of course, is not limited to this, and s can increase/delet the number of keys of the fixture according to actual needs. 8 200837554 P WKS-KB-003 8-TWXX 22600twf.doc/〇〇6 According to the above, if the input unit 1Q2 is implemented by A, it can be seen that the input unit 102 will provide 16 turns, with is to The encoding unit 103' and the encoding unit 1〇3 receive the input signal IS provided by the wheel 丄_5 to generate the encoded signal. . Wherein, since the input unit provides a single input 3 = stone 1 ^ 阙 single 兀, the coding unit 103 can be implemented by using 16x4 I handle ((10) (4), and the b & of the 16 χ 4 encoder will be separately reduced 16 = is provided by the input unit 1G2, and according to the state of its 16 inputs, 16 groups of *bits = binary code, that is, from 0〇〇〇~lln, and this will be The binary code will correspond to the 16 keys of the above 16-key fixture. The 4-bit table 1 is the 16-round input coding unit output by the input unit 102, and the corresponding c-unit (10) is provided. For example, the input signal is 16 input terminals of 16x4 民, ΛΑ K, and 扁, and 16x4 = SNR receives the input signal IS, which is encoded into the face 兀 binary The code is output to the microprocessor 1〇1. In addition, if the user presses the key 2, the input unit 102 will input the input signal is to the input end of the ΐ6χ4, and the 16x4 encoder receives the input. The signal is crying] 〇Γ. The word is encoded as 0001 4-bit binary numerator output to the micro-location. The key 3 to key of the subsequent performance will also be provided separately. The input signal 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 IS is coded to the coding unit 1G3, which is similar to the above example, and therefore will not be further described herein. Please continue to refer to FIG. The micro processing of this embodiment: 101 is a single chip of 89S51, so it is well known that it has four input and output ports (p〇rt), that is, p〇~p3, and each block contains There are 8 output pins (1/〇), that is, p〇〇~ρ〇7, ρι7, P port 2.0~P2.7, P3.〇~Ρ3·7 'So which 51 single chip itself has 32 ] X output = pin position 'There are 4 output pin positions will receive the above] (4) = 16 sets of 4-bit binary code output by the encoder, and 24 or Μ only output to the pin will pass through The buffer unit 1〇4 keyboard unit just (the size of the _ button matrix is (4) 8·:161=6) ^, wherein the buffer unit 1〇4 is used to enhance the driving ability of the output k by the microprocessor ι〇1, and The output signal is prevented from being attenuated by the load in the keyboard unit ι, and the buffer unit 1〇4 can be implemented by using the integrated circuit 74LS125, but it is not limited in this embodiment. In this case, the user I is replaced by an element having a buffer function according to actual needs, and the keyboard unit 100 is not limited to the size of the button matrix of the rank 8 χΐ 6 or 9 χΐ 6. Here, it is mentioned that The startup mode of the microprocessor 101 in this embodiment is divided into two types: high active operation and low potential operation (1〇w active), so the above microprocessor 1G1 can only test i6 kinds of button tests at most. Function, but because of the difference in its startup mode, it can be programmed to test 32 key test functions. More simply, when the startup mode of the device 101 is a high-potential action, it can perform a 16^ button test function; and when the start mode of the microprocessor 101 is a low-pot action, 200837554 PWKS-KB-0038- TWXX 22600twf.doc/006 It can also perform another 16 button test functions, so 32 button test functions can be realized with 16-key fixture. In addition, it is known from the ordinary knowledge of the invention that the number of key test functions that can be planned by the microprocessor 101 of the above embodiment must be determined according to the number of keys of the jig, that is, when the jig is When the number of keys is 8 keys, the number of key test functions that can be planned by the microprocessor 1〇1 is 16 kinds, and when the number of keys of the above-mentioned jig is 4 keys, the microprocessor 1〇1 can There are 8 types of button test functions planned. In addition, the system voltage of the keyboard automatic test system 10 of the present embodiment is supplied by the power supply unit 111, and is separately coupled to the microprocessor 1, the coding unit 103, and the buffer unit 1〇4. It is used to provide the working voltage required for all active/passive components in the three to operate. In order to more clearly explain the test operation flow of the keyboard automatic test system 10 of the present embodiment, an example will be described below: 凊 Simultaneously referring to FIG. 1 and Table 1, it is assumed here that when the user presses the above key 1 To test a single key function in the keyboard unit 100; when the user/presses the above key 2, it is a composite double key function in the test keyboard unit 100; and when the user presses the above key 3, it is a test keyboard. A composite two-key function in unit 1〇〇, so the user must write its corresponding program (that is, the keyboard test program) into the microprocessor 1〇1, so as to achieve the test efficiency of the user. . However, the embodiment is not limited thereto, that is, the user can define or adjust the button test function of the keys 1 to 16 according to the actual button test requirements, as long as the user writes the corresponding keyboard test program. Into the microprocessor 101, the effect achieved by the present invention is as follows: 2008. The receiver ' ^ user presses the button 1 at this time', the input unit will provide the input signals of the 0000000000000001 input signal 18 to 16 χ 4 encoding crying, and the 16x4 encoder receives the input signal ^ will The 4-digit binary code encoded as 〇〇〇〇 is output to the microprocessor 101. After the microprocessor iOi receives the 4-bit binary code of 0000 output by the encoding unit, it executes the program of the key test program written by the previous user, so as to test the keyboard unit 1 One/each single button function. In addition, when the user presses the button 2 at this time, the input unit 1〇2 will provide the input signal Is of the 000000000000010 to the code of 16χ4, and the encoder of the *16x4 receives the input signal; After outputting the 4-digit binary code of the flat code into the microprocessor 10, the microprocessor 101 receives the 4-bit binary code of the face of the coding unit (10), and executes the previous user. Write = keyboard test, the corresponding program of the program, so as to test a composite double-key function in the keyboard unit _, such as Alt+F4, Fn+End. In addition, when the user presses the button at this time, the face input money station 2 is provided.
的16個輸入端，而16x4之總石民哭拉士 z, , ± TO16 inputs, while 16x4 of the total stone people crying z, , ± TO
後’會將其編碼成〇_的4位的°° / IS 哭lm々^ , 位兀的2進制碼輸出至微處理 口口⑻。之後，微處理器、101接收到編碼單元1〇 之〇〇1〇的4位元2進制碼後，會執 」輸出 鍵盤測試程式之相應的程式，如此以賴鍵盤單元、10= 12 200837554 PWKS-KB-0038-TWXX 2260〇twfdoc/〇〇6 的某一複合三鍵功能，例如Ctrl+Alt+Delete。 处之舉例可知’只要使用者將相應的鍵盤測 ^式寫入微處理器101内後，再搭配輸入單元搬 碼單元103，即可遠至丨丨名於抑_ 、 键mn、去 在輸早兀02内以執行單鍵(鍵1〜 处甘”翻測試鍵盤單S 100内的所有按鍵的單鍵功 月b 至其内雙鍵複合鍵或三鍵複合鍵的功能狀態。 Γ 於本發明另一實施例中，鍵盤自動測試系統更 曰夏控制皁元105、鍵盤介面單元106、指向裝置107、指 置甘控士制單元曰108、方向鍵單元109,以及轉接介面單‘ 旦。/二中」音量控制單元105耦接至鍵盤單元，此音 里控制單元105具有多數個機構鍵來用以控制例如筆 電腦之喇叭的音量大小或靜音…等。 ° 6，盤，面單元1G6 _接至鍵盤單*⑽，此鍵盤介面 二=06是用以結合自動鍵盤測試系統iq與外部之鍵盤測 =電路板之橋梁。指向裝置1〇7包括—執跡點 广c pm— ’其例如為位於ibm冑記型電腦鍵盤上中間之 2 ’此紅點為滑良之游標裝置可依據所感應到的方向去 j方向，且此指向裝i1〇7係透過指向裝置控制單元ι〇8 所二★盤介面單兀ι〇6耦接在一起，以實現指向裝置1〇7 所治人達成的功能。 如八方向鍵單兀109係透過指向裝置控制單元1〇8而與鍵 =面單元1G6_，如此以實現方向鍵單元的功能。 ^ ^此方向鍵單元109例如可以為滑氣的左、中、右鍵， 曰^替代滑鼠的功能。轉接介面單元11〇耦接至鍵盤介 13 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 面單元106,來用以使鍵盤自動測試系統1〇可以適用於任 何型式的鍵盤以作其按鍵測試。 在此值得一提的是，於此實施例中，鍵盤自動測試系 統10所包括的音量控制單元105、鍵盤介面單元1〇6、指 向裝置107、指向裝置控制單元108、方向鍵單元1〇9，二 及轉接介面單元110的按鍵功能亦可由輸入單元1〇2提供 相應的輸入信號IS以對應的去做測試。因此，只要使用者 ^ 將相應的測試程式寫入微處理器101内，接著再搭配輸入 ? 單元102與編碼單元103後，即可達到在輸入單元102内 以執行單鍵(鍵1〜鍵16)就可達到測試上述音量控制單元 105、指向裝置1〇7、方向鍵單元1〇9，以及與鍵盤介面單 元106輕接的其他鍵盤的按鍵或軌跡點之功能狀態。 而為了要達到上述鍵盤自動測試系統1〇所能達到的 技術功效，以下再舉出一種鍵盤自動測試方法。圖2繪示 為依照本發明較佳實施例的鍵盤自動測試方法之流程圖。 凊參照圖2，本實施例之鍵盤自動測試方法包括下列步 G 驟：首先，如步驟S201所述，將一段鍵盤測試程式寫入 至微處理器中。於此步驟S201中，鍵盤測試程式可由使 用者依實際測試功能之需求而加以撰寫並燒錄至微處理器 中。 接著，如步驟S203所述，產生一編碼信號至微處理 器，以致使微處理器依據此編碼信號而於鍵盤測試程式中 執行其相應的程式。於此步驟S203中，編碼信號係藉由 利用一編碼單元將一輸入單元所供應的多個輸入信號進行 14 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 編碼後，以對應的產生此編碼信號。 最後，如步驟S205所述，依據上述步驟湖執 結果’以測試鍵盤單元内多數個按鍵之單鍵功能或入 ㈣能之^態。於此步驟S2G5如何測試鍵盤單元㈣^ 储鍵之早鍵魏或其複合鍵舰之狀態已在上述鍵盤自 動測試系統述明，故在此並不再加以贅述之。 读J =述，本發明所提供的鍵盤自動測試系統，因為 f) ^ 將一段鍵盤測試程式寫入微處理器中，萨此告 使用者透過輸入單元提供一個輸入信號至編碼單元日^，: 產生—個編碼信號至微處理器，如此當微處 編?信號時，其會執行其相應於鍵盤測試程 广使用者可預先設定此編碼信號的測試 =例广Μ鍵鮮元的單鍵魏，或者贱鍵盤單元的 技㈣能，又或者是顯上述音量㈣單元、 鍵丨面早几、指向裝置、指向裝置控制單元、方 二以及轉接介面單元...等的按鍵功能），如此本發明之鍵 (^^動職系統可以達册低產難的時間與1損 耗里，以進而降低其製作成本並增加產線產能。 除此之外，因為本發明之鍵盤自動測試系統並非以人 ^料來進行產_制試，因此，所f的測試時間可 由先刖技術所提及的大致二十幾秒左右（以人工的 咸少至七秒左右，故不但可以達到產線測;式鍵 盤的測试效率，且更可以降低支付在人力的測試成本。 雖然本發明已以較佳實施例揭露如上，然其並非用以 15 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 之精神 之保護 限定本發明，任何㈣此技藝者，在錢離本 :範圍内，當可作些許之更動與潤飾，因此本ς $色圍當視後附之申請專利範圍所界定者為準。X 【圖式簡單說明】After the latter, it will be encoded into 4 digits of 〇_ ° ° / IS cry lm 々 ^, the binary code of the position is output to the micro processing port (8). After that, the microprocessor 101 receives the 4-bit binary code of the coding unit 1 and then outputs the corresponding program of the keyboard test program, so that the keyboard unit, 10=12 200837554 PWKS-KB-0038-TWXX 2260〇twfdoc/〇〇6 A composite three-button function, such as Ctrl+Alt+Delete. As an example, as long as the user writes the corresponding keyboard measurement into the microprocessor 101, and then the input unit is moved to the code unit 103, it can be as far as the name is _, the key mn, and the input is lost. In the early 兀02, the single button (key 1~ 甘甘) is used to test the function state of the single key gong b of all the keys in the keyboard S 100 to the double key composite key or the triple key composite key. In another embodiment of the invention, the keyboard automatic test system further controls the soap element 105, the keyboard interface unit 106, the pointing device 107, the finger control unit 108, the direction key unit 109, and the transfer interface. The volume control unit 105 is coupled to the keyboard unit. The in-voice control unit 105 has a plurality of mechanism keys for controlling the volume of the speaker of the pen computer or the mute, etc.. 1G6 _ connected to the keyboard single * (10), this keyboard interface two = 06 is used to combine the automatic keyboard test system iq with the external keyboard test = circuit board bridge. Pointing device 1 〇 7 includes - the trace point wide c pm - ' It is for example located in the middle of the ibm 型 computer keyboard 2 'This red dot is a smooth cursor device that can go to the j direction according to the sensed direction, and this pointing device is coupled to the device control unit ι〇8 through the pointing device control unit ι〇8 Together, the function achieved by the pointing device 1〇7 is realized. For example, the eight-direction key unit 109 is transmitted through the pointing device control unit 1〇8 and the key=face unit 1G6_, thus realizing the function of the direction key unit. ^ The direction key unit 109 can be, for example, the left, middle, and right keys of the slippery air, and the function of the mouse is replaced by the keyboard. The switch interface unit 11 is coupled to the keyboard interface 13 200837554 PWKS-KB-0038-TWXX 22600twf.doc/ The surface unit 106 is used to enable the keyboard automatic test system 1 to be applied to any type of keyboard for its key test. It is worth mentioning that, in this embodiment, the keyboard automatic test system 10 includes The volume control unit 105, the keyboard interface unit 〇6, the pointing device 107, the pointing device control unit 108, the direction key unit 1〇9, and the button function of the switching interface unit 110 can also provide corresponding inputs by the input unit 1〇2. Signal IS to correspond To test, therefore, as long as the user ^ writes the corresponding test program into the microprocessor 101, and then with the input unit 102 and the encoding unit 103, it can be reached in the input unit 102 to execute a single key (key The function state of the above-mentioned volume control unit 105, pointing device 1〇7, direction key unit 1〇9, and other keyboard keys or track points that are lightly connected to the keyboard interface unit 106 can be achieved by 1~key 16). In order to achieve the technical effects that can be achieved by the above keyboard automatic test system, a keyboard automatic test method is exemplified below. 2 is a flow chart of a method for automatically testing a keyboard in accordance with a preferred embodiment of the present invention. Referring to Fig. 2, the keyboard automatic test method of this embodiment includes the following steps: First, a keyboard test program is written into the microprocessor as described in step S201. In this step S201, the keyboard test program can be written and burned into the microprocessor by the user according to the requirements of the actual test function. Next, as described in step S203, an encoded signal is generated to the microprocessor to cause the microprocessor to execute its corresponding program in the keyboard test program in accordance with the encoded signal. In this step S203, the encoded signal is encoded by a plurality of input signals supplied by an input unit by using a coding unit, and then the code is generated correspondingly by the encoding of the 200837554 PWKS-KB-0038-TWXX 22600 twf.doc/006. signal. Finally, as described in step S205, according to the above steps, the lake performs the result ' to test the single button function of the plurality of buttons in the keyboard unit or into the state of the (four) energy. In this step S2G5, how to test the keyboard unit (4) ^ The state of the key of the key switch Wei or its composite key ship has been described in the above keyboard automatic test system, so it will not be described here. Read J = the keyboard automatic test system provided by the present invention, because f) ^ writes a keyboard test program into the microprocessor, the user informs the user to provide an input signal to the coding unit through the input unit ^,: Generate a coded signal to the microprocessor, so that when the signal is programmed, it will perform a test corresponding to the keyboard test. The user can pre-set the coded signal = a single key of the broad key , or the skill of the keyboard unit (4), or the button function of the above-mentioned volume (four) unit, key face, pointing device, pointing device control unit, square two and switching interface unit, etc. The key of the invention (the ^^ dynamic system can reach the time of low production and 1 loss, thereby reducing the production cost and increasing the production capacity of the production line. In addition, because the keyboard automatic test system of the invention is not human The material is used for the production test. Therefore, the test time of f can be about twenty seconds or so, as mentioned by the prior art (small salt to as little as seven seconds, so not only can the line test be achieved; key Test efficiency, and more can reduce the cost of testing the labor. Although the invention has been disclosed above in the preferred embodiment, it is not used in the spirit of 15 200837554 PWKS-KB-0038-TWXX 22600twf.doc/006 The invention is limited to the invention, and any (4) person skilled in the art, in the context of the money: within the scope of the money, can make some changes and refinements, therefore, this is defined by the scope of the patent application attached to the scope of the application. X [ Simple description of the schema]
圖1繪示為依照本發明較佳實施例的鍵盤自動測試 統之方塊圖。 " 表1列為本發明之輸入單元所輸出的16個輪入信號 Ο t IS至編碼單元後所對應編碼成的16組4位元2進制碼示 思圖。 圖2 %示為依照本發明較佳實施例的鍵盤自動測試方 法之流程圖。 # 【主要元件符號說明】 10 :鍵盤自動測試系統 1〇〇:鍵盤單元 1〇1 :微處理器 102 ·輸入單元 1 〇 3 ·編碼單元 104 :緩衝單元 105 :音量控制單元 106 :鍵盤介面單元 107 :指向裝置 1〇8 ·指向裝置控制單元 109 :方向鍵單元 110 :轉接介面單元 16 200837554 P WKS-KB-003 8-TWXX 22600twf.doc/006 111 :電源單元 ECS :編碼信號 IS :輸入信號 S201〜S205 :本發明較佳實施例之鍵盤自動測試方法 流程圖的各步驟 171 is a block diagram of an automatic keyboard test system in accordance with a preferred embodiment of the present invention. " Table 1 shows the 16 sets of 4-bit binary code representations encoded by the 16 round-in signals Ο t IS outputted by the input unit of the present invention to the coding unit. Figure 2 is a flow chart showing an automatic keyboard test method in accordance with a preferred embodiment of the present invention. # [Main component symbol description] 10: Keyboard automatic test system 1〇〇: keyboard unit 1〇1: microprocessor 102 • input unit 1 〇3 • encoding unit 104: buffer unit 105: volume control unit 106: keyboard interface unit 107: pointing device 1 8 · pointing device control unit 109 : direction key unit 110 : switching interface unit 16 200837554 P WKS-KB-003 8-TWXX 22600twf.doc / 006 111 : power supply unit ECS : coded signal IS : input Signals S201 to S205: steps 17 of the flowchart of the automatic keyboard test method of the preferred embodiment of the present invention