TW200813406A - An underwater acoustic micro-sensor - Google Patents
An underwater acoustic micro-sensor Download PDFInfo
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- TW200813406A TW200813406A TW95132297A TW95132297A TW200813406A TW 200813406 A TW200813406 A TW 200813406A TW 95132297 A TW95132297 A TW 95132297A TW 95132297 A TW95132297 A TW 95132297A TW 200813406 A TW200813406 A TW 200813406A
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- 238000000034 method Methods 0.000 claims abstract description 20
- 238000005530 etching Methods 0.000 claims abstract description 12
- 239000000463 material Substances 0.000 claims abstract description 12
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 10
- 229920000052 poly(p-xylylene) Polymers 0.000 claims abstract description 6
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims abstract description 4
- 238000000151 deposition Methods 0.000 claims abstract 4
- 239000013078 crystal Substances 0.000 claims description 11
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- 239000010931 gold Substances 0.000 claims description 9
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 8
- 229910052737 gold Inorganic materials 0.000 claims description 8
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- 229910052732 germanium Inorganic materials 0.000 claims description 5
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- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 claims description 5
- -1 boron ions Chemical class 0.000 claims description 4
- 238000009616 inductively coupled plasma Methods 0.000 claims description 4
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- 229910052796 boron Inorganic materials 0.000 claims description 2
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- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 abstract 1
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- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 5
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- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
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- KAESVJOAVNADME-UHFFFAOYSA-N Pyrrole Chemical compound C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 2
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
Description
200813406 九、發明說明: w 【發明所屬之技術領域】 本發明係有關一種水下聲響微感測器之裝置,係使用 微機電製程之面型加工技術製作該感測器結構。該感測器 之感測薄膜結構於接受接近該結構自然振頻之特定頻^ 範圍的聲波時,該感測器輸出訊號具有高訊雜比的特性, 以此接收水下聲波所傳遞之訊號内容。 【先前技術】 微機電系統之研究係結合了傳統的電子、電機、機 械、生醫、控制等領域之知識與半導體製造技術所發展出 來的微型感麟與致動器系統。對於各領域之應用而言, 感測系統的微小化,具有減輕負载、縮小佔用面積^低 整體能量損耗等優點。因此,將微機電系統運用於感測哭 上,不但可錢感測器體積縮小且較為靈敏,其精準^ .對可隨之提* ’且所耗費的能量亦較低;此外,並可配合 半導體技術製造出一陣列式感測器。 '口 雖然目别業界以微機雷系絲 當的多元,其應用範圍亦相當廣上之::斋已經相 關之微感測器之研發卻相當缺乏。t疋,與水下技術相 有鑑於此,本案發明人累積 驗,精心研究,研私屮 P產業開發實務上之經 九研發出一種運用於 益,以習知之屋力感測器為基礎 每境之聲響感測 程技術與灯聲學技蚊訂 種結合微機電製 曰娬感測器。此水下量測200813406 IX. Description of the invention: w [Technical field to which the invention pertains] The present invention relates to an apparatus for an underwater acoustic micro-sensor, which is fabricated using a surface processing technique of a microelectromechanical process. The sensing film structure of the sensor receives a sound wave of a specific frequency range close to the natural frequency of the structure, and the sensor output signal has a high signal-to-noise ratio characteristic, thereby receiving the signal transmitted by the underwater sound wave. content. [Prior Art] The research department of MEMS is a combination of traditional knowledge in the fields of electronics, motors, mechanics, biomedicine, and control, and micro-sensory and actuator systems developed by semiconductor manufacturing technology. For applications in various fields, the miniaturization of the sensing system has the advantages of reducing the load, reducing the occupied area, and lowering the overall energy loss. Therefore, the application of MEMS to the sensing crying, not only the volume sensor is smaller and more sensitive, its accuracy ^ can be followed by * and the energy consumed is also lower; in addition, and can be coordinated Semiconductor technology produces an array of sensors. 'But Although it is different from the industry, the scope of its application is quite wide: the research and development of micro-sensors related to Zhai is quite lacking. t疋, in view of the underwater technology, in this case, the inventor of this case accumulated the test, carefully studied, research and development of the P industry development of the nine development of a use of benefits, based on the traditional house force sensor The sound of the sound of the range and the technology of the acoustics of the mosquitoes combined with the micro-electromechanical sensor. This underwater measurement
CKU-P060054-TW 200813406 技術之結合’相信將帶給水下量測技術突破 【發明内容】 之而發月之主要目的’旨在提供-種結合微機電製程 1加術與水下聲學技術之水下聲響微感測 聲響微感測ϋ。 _ ^度南、精確、耗能低之水下 為達上述之目的’本發明之感測器結構如圖一所示, Γί、—組導線電路、-絕緣材料、 苛眠以及一防水薄膜。其中, 該壓阻組,传以客曰 使壓阻特性㈣t 並離子佈制離子, 中句人: 阻组係以四個壓阻為一組,其 值固定的壓阻。 及_未設置在薄膜結構上阻 成畜路組,係以金為導線材料’連接四個壓阻組 測器電觀地端,另一對為感 屬導後=材料,係以氮化♦為材料,其位於麼阻以及金 2方’㈣阻絕可導電之單㈣基底,避免短路。 料^m膜’係直接使用作為基底之單晶石夕晶片為材 、面先將薄膜外型溝槽侧完成,接著再將該晶CKU-P060054-TW 200813406 The combination of technology 'believes that it will bring breakthroughs in underwater measurement technology 【Abstract】 The main purpose of the month is to provide a kind of water that combines MEMS and underwater acoustic technology. Under the sound, the micro-sensing sound is slightly sensitive. _ ^ South, accurate, low-energy underwater For the above purposes, the sensor structure of the present invention is shown in Figure 1, Γί, - group conductor circuit, - insulating material, harsh sleep and a waterproof film. Among them, the piezoresistive group is transmitted by the guest to make the piezoresistive characteristic (4) t and ion-distributed ions, and the middle sentence person: the resistance group is a group of four piezoresistors, and its value is fixed piezoresistive. And _ is not set on the film structure to block the livestock road group, the gold is the wire material 'connected to the four piezoresistive group detectors, and the other pair is the sense of the guide = material, is nitrided ♦ For the material, it is located in the resistance and the gold 2 square '(4) resists the conductive single (four) substrate to avoid short circuit. The material ^m film is directly used as a base single crystal stone wafer, and the surface is first completed on the side of the film outer groove, and then the crystal is further
CKU-P060054-TW 200813406 用精確控制_速率與深度之錄餘刻製 德、田予又之相結構。該薄膜之外型為細長型之姓 構,可使其振動捃能… 窄,m鬥且#扣4、二早且該薄膜之左右兩側寬度較 ^牙之薄臈外型溝槽,用以降低結構勁度盥自 然振頻。 '曰 乂該防水薄膜,係沉積於該制器外層,其中該防水薄 膜係為一聚對二甲苯基(Parylene) |,用以避免水氣侵 入該感測器,以符合水下操作環境。 於設計光罩時需考慮到晶片空間的限制以及感測器 的功忐性,因此在設計晶片上感測器的配置時,除了單一 感’則器放入單一個測試晶片之外,如圖二所示,另外設計 了同時配置兩個、四個感測器在單一測試晶片上。除了可 增加感測器數量以及降低單位成本之外,配置四個感測器 的測試晶片更將四個感測薄膜設計成不同長度,使其具有 不同共振頻率提升感測晶片的運用效能。 【實施方式】 兹為便於貴審查委員能更進一步對本發明之構 造、使用及其特徵有更深一層,明確、詳實的認識與瞭解, 發明人舉出數個較佳之實施例,並配合圖式詳細說明如 下: 圖三與圖四詳細地描述了本發明的主要製造方法及 結構。茲說明如下: 圖三為本發明之微感測器之製程流程圖,其中該感測CKU-P060054-TW 200813406 With the precise control of the rate and depth of the record, the structure of the German and the field. The outer shape of the film is a slender type of structure, which can make it vibrate... narrow, m bucket and #扣4, two early and the width of the left and right sides of the film is thinner than the outer groove of the tooth, with To reduce the structural stiffness and natural vibration frequency. The waterproof film is deposited on the outer layer of the device, wherein the waterproof film is a parylene | to prevent moisture from entering the sensor to conform to the underwater operating environment. When designing the reticle, the limitation of the wafer space and the power of the sensor should be taken into consideration. Therefore, when designing the sensor on the wafer, except for the single sense, the device is placed in a single test wafer, as shown in the figure. As shown in the second, it is additionally designed to simultaneously configure two or four sensors on a single test wafer. In addition to increasing the number of sensors and reducing unit cost, test wafers with four sensors design four sensing films of different lengths, giving them different resonant frequencies to enhance the performance of the sensing wafer. [Embodiment] In order to facilitate the examination committee to further understand, understand and understand the structure, use and characteristics of the present invention, the inventors cite several preferred embodiments, with detailed drawings The description is as follows: The main manufacturing method and structure of the present invention are described in detail in FIG. 3 and FIG. The following is illustrated as follows: Figure 3 is a process flow diagram of the micro-sensor of the present invention, wherein the sensing
8 CKU-P060054-TW 200813406 器係以六吋單晶矽晶片為基底。圖三(幻考量沉積薄膜之 品質,本發明使用低壓化學氣相沉積(LPCVD)沉積一層厚 度為0·3μπι氮化矽作為絕緣層。圖三⑻使用lpcVD在 氮化矽薄膜上沉積一層厚〇·3μπ1多晶矽薄膜,作為壓阻8 CKU-P060054-TW 200813406 The device is based on a six-inch single crystal germanium wafer. Figure 3 (The quality of the phantom deposited film, the present invention uses low pressure chemical vapor deposition (LPCVD) to deposit a thickness of 0. 3μπι nitride as an insulating layer. Figure 3 (8) using lpcVD deposited a thick layer on the tantalum nitride film ·3μπ1 polycrystalline germanium film as piezoresistive
之材料。由於多晶矽阻值較高,需離子佈植硼離子降低電 阻率,其佈植濃度為lxl〇2GNA[cm-3]。此濃度之設定使多 曰曰矽之電阻溫度係數降為零,以降低壓阻對溫度的靈敏 度,最後經由退火過程使離子均勻分佈。圖三(c)為確保 壓阻外型之精確,因此採用深反應離子蝕刻機(DRIE)钱刻 該多晶矽薄膜產生壓阻外型。包含兩個位於薄膜結構兩侧 之感測端壓阻一 11及壓阻三13,其阻值隨著該薄膜結構 形變而改變;以及兩個未設置在薄膜結構上阻值固定的壓 阻=12及壓阻四14,其位置距離該薄膜結構較遠,以避 免背後蝕刻孔洞過大使壓阻懸浮,造成壓阻隨聲波振動而 阻值改變。圖三(d)巾係制金(Au)/鉻⑼料導線材料 以電子束蒸鍍機進行蒸鍍,其中鉻係作為黏著層,用於增 加金的黏著性’鉻蒸鍍的厚度為l5〇A,金蒸鍍的厚度^ _人·,並以濕式磁㈣方式浸泡金糊液與鉻茲刻液, 使導線金屬.導線一 21、金屬導線二22、金屬導線三B 及金屬導線四24與外接導線連接點—扣、外接導二線連 =二212、外接導線連接點三213及外接導線連接點四 214成型’連接四個壓阻組成惠斯敦電橋電路。該電 ίΓΓΓ點,分成輯,—對為外接導線連接點一 、外接導線連接點三犯作為外加電壓之輸入端與接Material. Due to the high resistance value of polycrystalline germanium, ion implantation of boron ions is required to reduce the resistivity, and the implantation concentration is lxl〇2GNA [cm-3]. This concentration is set so that the temperature coefficient of resistance of the multi-turn is reduced to zero to reduce the sensitivity of the piezoresistance to temperature, and finally the ions are evenly distributed through the annealing process. Figure 3 (c) is to ensure the accuracy of the piezoresistive shape, so the deep reactive ion etching machine (DRIE) is used to engrave the polysilicon film to produce a piezoresistive profile. The sensing terminal pressure resistance 11 and the piezoresistive resistor 13 are disposed on both sides of the film structure, and the resistance changes according to the deformation of the film structure; and the two piezoresistors which are not disposed on the film structure and have a fixed resistance = 12 and piezoresistive four 14, the position is far from the structure of the film to avoid excessive etching of the back hole to cause the piezoresistive suspension, causing the piezoresistive resistance to change with the vibration of the acoustic wave. Figure 3 (d) The system of gold (Au) / chromium (9) wire material is evaporated by electron beam evaporation machine, in which chromium is used as an adhesive layer to increase the adhesion of gold. The thickness of chromium evaporation is l5. 〇A, the thickness of gold evaporation is _人·, and the gold paste and chrome engraving solution are soaked in wet magnetic (four) way, so that the wire metal, wire 21, metal wire 22, metal wire 3 B and metal wire Four 24 and external wire connection points - buckle, external guide wire connection = two 212, external wire connection point three 213 and external wire connection point four 214 forming 'connect four pressure resistance to form the Wheatstone bridge circuit. The electric ΓΓΓ point is divided into a series, and the pair is connected to the external wire, and the external wire connection point is used as the input terminal of the applied voltage.
CKU-P060054-TW 200813406 地端,一對外接導線連接點二212、外接導線連接點四2i4 為感測器電壓訊號之輸出端。圖三(e)首先將第一道光罩 重複對位保護壓阻,再以反應式離子蝕刻機(RIE)來蝕刻 多餘的氮化矽,僅存壓阻與導線底下之區域作為絕緣層 5,避免該制賴3料咖纽㈣應力過大而^ 裂。接下來以鋁做為蝕刻罩幕,使用電感耦合式電漿離子 蝕刻系統(icp)將單晶石夕晶片蝕刻出該感測薄臈3外型上 半,溝槽4卜該感測薄膜3外型下半部溝槽42,使該感 測薄膜3 JL面外型成型。圖三(〇以銘做為射彳罩幕,使 用電^合式電歸子則彡統進行背後_製作出該 =測薄膜3。在侧之前’將晶片研磨至25_,以避免 月後钮刻過深’造成雜草現象與侧底面的曲度過大。另 外由於是-般六对單晶石夕晶片,並無钱刻阻擔層,且讓 感測薄膜3所需钕刻之深度極深,幾乎達晶片底部,因 在烟深度與速社賴精雜制來獲得適當厚度之 薄膜結構。圖三(g)最後於該晶片外層沉積-防水層7以 符合水下操作環境,其中該防水層7係為聚對二甲苯基 (Parylene)薄膜。 本無明之感測11最關鍵的製程為#後侧製程,特 =詳細說明。在背後_的製程上除了鋪赌構懸浮所 、的侧孔6外’ gj應背後細彳之後薄膜料,為避免切 副時的水柱輯_傷無法制切賴。因此,在背錢 Ξ的光罩上多了日後方便鑽石刀手工分離感測晶片的切 °逼8°其細部的製程如圖四所示:圖四⑻為正面薄膜結CKU-P060054-TW 200813406 Ground terminal, an external wire connection point 212, external wire connection point 4 2i4 is the output of the sensor voltage signal. Figure 3 (e) first repeats the para-protective piezoresistance of the first mask, and then etches excess tantalum nitride by a reactive ion etching machine (RIE), leaving only the area under the piezoresistive and the underlying conductor as the insulating layer 5 In order to avoid the excessive stress and cracking of the three materials. Next, aluminum is used as an etching mask, and a single crystal etched wafer is etched out of the upper half of the sensing thin raft 3 by an inductively coupled plasma ion etching system (icp), and the trench 4 is used for the sensing film 3 The outer lower half groove 42 shapes the sensing film 3 JL. Figure 3 (〇 铭 铭 做 彳 , , , , , , , , , 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭 铭Too deep 'causes the weed phenomenon and the curvature of the side bottom surface is too large. In addition, because it is a six-pair single crystal stone wafer, there is no money to resist the layer, and the depth of the sensing film 3 required to be engraved is extremely deep. , almost up to the bottom of the wafer, due to the depth of smoke and the rapid development of the film to obtain a film structure of appropriate thickness. Figure 3 (g) finally deposited on the outer layer of the wafer - waterproof layer 7 to meet the underwater operating environment, where the waterproof The layer 7 is a parylene film. The most critical process of the sensible sensing 11 is the #back side process, special = detailed description. On the back _ process, in addition to the side of the gambling structure Outside the hole 6 'gj should be behind the fine film material, in order to avoid the water column when cutting the pair _ injury can not be made to cut. Therefore, in the back of the money mask, more convenient diamond knife manually separate the sensor wafer The process of cutting the part by 8° is shown in Figure 4: Figure 4 (8) is the front film knot.
CKU-P060054-TW 10 200813406CKU-P060054-TW 10 200813406
構外型蝕刻;圖四(b)背後蝕刻到晶片一半的厚度,·圖四 (C)為避免電感耦合式電漿離子蝕刻系統腔體“針:: 取出晶片時因切割道太深使得晶片破裂,在往下繼續麵 薄膜結構前,先塗佈光阻將蝴道保護。圖四⑷繼、4 下姓刻出該薄膜結構,此時儀刻深度的控制相當重要,在 即將餘穿薄膜正面外型溝槽4時須將單次的關時間縮 小為-分鐘,-次次慢慢兹刻,最後製作出感測薄膜結構 3。根據以上之製造過程,完成了如圖五、圖六及圖 示之實例圖。其中’圖五及圖六分別為前述製程之背後餘 刻光罩圖及背後侧實_。圖谓為試作之感測 微實例圖。 ^ 於裝程完成後 在感測II之外接導線連接點—211、外接導線連接勢二 m、外接導線連接點三213及外接導線連接點四214 線^結到該封裝盒之接點,如圖人所示。最後將該封U 接a在測試基座上進㈣試。圖九 中測試之結果,喇叭唑由掃借鞀+ _饮〗片在二軋 由知頻耘式控制,發出頻率為 加+壓之間箱_1G ghz _波,該感測器外 談:從接收端所得的結果可知,隨頻率增加, 二賴^度越佳’此測試結果與感測器越接近自然頻 越佳的趨勢相符。在該感測器水下測試中, 式控制^ 可以發出較高解崎波,因此以掃頻程 槽^一 1太办到1QOkIiz間隔為1kHz之聲波 :由 曰 ★明之感測器接收。測試結果輸出訊號如圖External shape etching; Figure 4 (b) etched to the thickness of the wafer half, Figure 4 (C) to avoid inductively coupled plasma ion etching system cavity "Needle:: When the wafer is removed, the wafer is broken due to the etched path being too deep Before proceeding to the film structure, the photoresist is coated to protect the film. Figure 4 (4) follows the pattern of the film, and the control of the depth of the instrument is very important. When the outer groove 4 is required, the single off time must be reduced to -minute, and the next time, the sensing film structure 3 is finally produced. According to the above manufacturing process, the figure 5 and FIG. 6 are completed. The example diagram of the figure is shown in Fig. 5 and Fig. 6 respectively for the reticle pattern and the back side of the process behind the above process. The picture is the sensory micro-example diagram of the test. ^ After the completion of the process II external wire connection point -211, external wire connection potential two m, external wire connection point three 213 and external wire connection point four 214 wire ^ junction to the junction of the package, as shown in the figure. Finally, the seal U is connected to the test pedestal (4). The results of the test in Figure 9 are The azole is controlled by the 鼗 _ _ 〗 〖 in the second rolling by the knowledge frequency 耘 type control, the frequency is between the plus + pressure box _1G ghz _ wave, the sensor talks: the results from the receiving end can be known With the increase of frequency, the better the second degree is. This test result is consistent with the trend that the sensor is closer to the natural frequency. In the underwater test of the sensor, the control can generate a higher resolution wave. Therefore, the sweep frequency slot ^1 is too much to 1QOkIiz interval 1kHz sound wave: received by the sensor of 曰★明. The test result output signal is as shown in the figure
CKU-P060054-TW 11 200813406 十’其縱座標為感測ϋ輸出訊號之振福, 當頻率小於50耻日夺,該感測器之振動並不^頻^ 時’該感測器有明顯的共振彻^^^ U此推峤其共振頻率約為6〇kHz。 二上所4,本發明之微感測器,可用於水文探測、 t貝源開發、水下無人載具之水下通訊與水下聲纹量測 丰利用水聲的各截職用;料,該錢器在空氣中則CKU-P060054-TW 11 200813406 Ten's ordinate is the vibration of the sensing ϋ output signal. When the frequency is less than 50 shame, the vibration of the sensor is not ^^^ when the sensor has obvious Resonance is ^^^ U This pushes its resonant frequency to be about 6 〇 kHz. Second, the micro-sensor of the present invention can be used for hydrological detection, t-bone source development, underwater communication of underwater unmanned vehicles and underwater sound recordings. The money is in the air
可運用於加工機械之微聲響感蜊。 、 、hJ本發明已以如述較佳實施例揭示,然其並非用 t限ί本發明,任何熟習此技藝者,在不脫離本發明之精 1和犯圍内’當可作各種之更動與修改。如上述的解釋, 3可χ作各型式的修正與變化,而不會破壞此發明的精 〜口此本發明之保護範圍當視後附之申請專利範圍所界 疋者為車。It can be used in the micro-sounding sensation of processing machinery. The invention has been disclosed in the preferred embodiments as described above, but it is not intended to limit the invention, and anyone skilled in the art can make various changes without departing from the essence of the invention. With modifications. As explained above, 3 can be used to modify and change various types without deteriorating the scope of the invention. The scope of protection of the present invention is defined by the scope of the appended claims.
CKU-P060054-TW 12 200813406 【圖式簡單說明】 圖一:係本發明之感測器例圖 圖二:係本發明之感測晶片配置示意圖 圖三:係本發明之感測器製程示意圖 圖四··係本發明之背後蝕刻細部製程示意圖 圖五:係本發明之背後蝕刻光罩圖 圖六:係本發明之背後蝕刻實例圖 圖七··係本發明之感測器實例圖 • 圖八:係本發明之感測器配置於封裝盒之實例圖 圖九:係本發明之感測器空氣中測試各頻率之功率 頻譜值 圖十:係本發明之感測器水下測試各頻率輸出訊號 之峰值CKU-P060054-TW 12 200813406 BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a sensor of the present invention. FIG. 2 is a schematic diagram of a configuration of a sensing wafer of the present invention. FIG. 3 is a schematic diagram of a process of the sensor of the present invention. FIG. 5 is a schematic diagram of the etching process of the back surface of the present invention. FIG. 5 is an illustration of the etching mask behind the present invention. FIG. 6 is an example of etching behind the present invention. FIG. 7 is an example of a sensor of the present invention. 8: An example of the sensor of the present invention is disposed in a package. FIG. 9 is a power spectrum value of each frequency tested in the sensor air of the present invention. FIG. 10 is a sensor underwater test of the frequency of the present invention. Peak of output signal
13 CKU-P060054-TW 200813406 【主要元件符號說明】 I- 壓阻 II- 壓阻一 12- 壓阻二 13- 壓阻三 14- 壓阻四 2-金屬導線 21-金屬導線一 211-外接導線連接點一 • 22-金屬導線二 212-外接導線連接點二 23·金屬導線三 213-外接導線連接點三 24-金屬導線四 214·外接導線連接點四 3- 感測薄膜 4- 感測薄膜外型溝槽 41 -感測薄膜外型上半部溝槽 42-感測薄膜外型下半部溝槽 5- 絕緣層 ® 6-背後蝕刻孔 7- 防水層 8- 切割道。13 CKU-P060054-TW 200813406 [Description of main components] I- Piezoresistive II- Piezoresistive 12- Piezoresistive 2-13- Piezoresistive Tri- 14- Piezoresistive 4-2 Metal Wire 21-Metal Wire-211-External Wire Connection point one• 22-metal wire two 212-external wire connection point two 23·metal wire three 213-external wire connection point three 24-metal wire four 214·external wire connection point four 3- sensing film 4-sensing film Outer groove 41 - sensing film profile upper half groove 42 - sensing film profile lower half groove 5 - insulation layer 6 - back etching hole 7 - waterproof layer 8 - cutting track.
14 CKU-P060054-TW14 CKU-P060054-TW
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