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TW200813394A - Method with the three dimensional outline measuring and the system of reconstruction which has a sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching - Google Patents

Method with the three dimensional outline measuring and the system of reconstruction which has a sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching Download PDF

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TW200813394A
TW200813394A TW95133580A TW95133580A TW200813394A TW 200813394 A TW200813394 A TW 200813394A TW 95133580 A TW95133580 A TW 95133580A TW 95133580 A TW95133580 A TW 95133580A TW 200813394 A TW200813394 A TW 200813394A
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color
raster
sub
image
stripe
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TW95133580A
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TWI287615B (en
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Chern-Sheng Lin
Jyh-Fa Lee
Mau-Shiun Yeh
Chia-Hau Lin
Shih-Liang Ku
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Chung Shan Inst Of Science
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Abstract

The invention is a kind of method with the three dimensional outline measuring and the system of reconstruction which has the sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching. The method includes pre-step; projected step; video acquired step; video fine tuning step; video processing step; and reconstructive step. The system includes a projected apparatus which emits the beam from the optical grating to DUT; an image from the optical grating on DUT and has the same contrast on the plural grating lines; a CPU can reconstruct 3-D profile of DUT using optical grating imaging with fine tuning main and sub-frames. So achieved the optical grating has the same contrast to be easy to distinguish, the monitor has main- and sub-frames can be switched, and adjusting the optical grating with modified module.

Description

200813394 ^ 九、發明說明: 【發明所屬之技術領域】. 本發明係有關一種使用彩色光柵次像素定位與. 單螢幕之子母晝面切換的三維輪廓量測方法與重建 系統,其兼顧光柵具有相同的對比度較易分辨、顯示 器具有可切換之子母畫面以及具有調整模組可以調 整光栅等功效。 【先前技術】 |_ •隨著產業技術之提升與產品少量多樣化的趨 勢,要領先對手、擴大市場的關鍵便在於縮短產品製 程時間,這也成了產品研發時非常重要的課題之一, 而相關之逆向工程技術也就越來越受到重視。舉凡產 品檢驗、工業製造、產品外形設計、物體外形掃描以 及多媒體動畫製作等,皆需要有一個可以快速且精確 的量測技術作為依靠。而實現逆向工程最重要的便是 量測能力。 傳統自動化檢測技術可分為兩類,一為接觸式量 測,另一為非接觸式量測。非接觸式量測以光為量測 工具最被廣泛應用。一般是投影灰階光柵至一待測工 件上進行測量;但常因背景光擾亂待測工件實體而使 待測工件不明顯,以致出現條紋誤判。若是待測工件 表面太光滑亦料致其+—部位強烈反光而使得其 他條紋漫滅不清或斷線。若待測工件有突然陡升陡降 之曲線易造成陰影而遭誤判為條紋,而產生條紋相交 6 200813394 • 之情形。 此外,傳統自動化檢測技術仍有以下缺點: [1] 單色光栅不易分辨。參閱第七谓,傳統採用 投射單色條紋掃描待測工件,若待測工件表面清楚, 結合高速、高解析度攝影裝置擷取光栅影像之相位移 式掃描疊紋方法,可完整重建待測工件之三維模型, 但如第十一及第十二圖所示,當光栅投射在不平坦之 待測工件表面時,光栅條紋會產生扭曲變形,若有一 ,· 部份被物體的陰影所覆蓋時,便很難判斷出那一條條 紋應該對應到那一條條紋,如此會影響到影像的重 建。 [2] 顯示器無可切換之子母晝面。傳統光學量測 法,其投影裝ί之光栅與攝影裝置擷取之光柵影像, 是由兩個顯示器顯示,無法合併在單一畫面上顯示, 器材數量多,控制複雜且檢視不易。另外,反覆觀看 影像與調整攝影裝置之焦距必需分開動作,無法在觀 看影像的同時,從顯示器直接調整攝影裝置,相當不 便。 [3] 光柵無法調整。·習用光柵多半為固定設計, 其密度與對比度無法調整,若量測微元件易失去準確 性。 因此,有必要研發新技術,以解決上述缺弊。 【發明内容】 本發明之主要目的,在於提供一種使用彩色光柵 200813394 像素疋位與單螢幕之子母畫面切換的三曰 =與蝴統,其設計嫌具有相 =明之次要目的,在於提供一種使用彩色光挪 素疋位與早螢幕之子母畫面切換的三維輪廓量 去與重建系統,其顯示器具有可切換之子母查 面。 可旦 本發明之又一目的,在於提供一種使用彩色光柵 次像素定位與單螢幕之子母晝面切換的三=旦 測方法與重建系統,其具有調整模組可以調整^里。 π本發明係提供-種使用彩色光栅次像素定位鱼 早螢幕之子母畫面㈣的三維輪廓量測方法與重建 系統,其量測方法部分包括: 、 一 ·預備步驟; 一·投影步驟;200813394 ^ IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a three-dimensional contour measurement method and reconstruction system using color raster sub-pixel positioning and single-screen switching of a single screen, which has the same grating The contrast is easier to distinguish, the display has a switchable picture and the adjustment module can adjust the grating. [Prior technology] |_ • With the improvement of industrial technology and the diversification of products, the key to leading the market and expanding the market is to shorten the manufacturing process time, which has become one of the most important topics in product development. The related reverse engineering technology is getting more and more attention. Product inspection, industrial manufacturing, product design, object shape scanning, and multimedia animation production all require a fast and accurate measurement technique. The most important thing to achieve reverse engineering is the measurement capability. Traditional automated inspection techniques can be divided into two categories, one for contact measurement and the other for non-contact measurement. Non-contact measurement with light as the measurement tool is most widely used. Generally, the gray scale grating is projected onto a workpiece to be measured for measurement; however, the workpiece to be tested is often inconspicuous due to the background light disturbing the workpiece to be tested, so that the stripe misjudgment occurs. If the surface of the workpiece to be tested is too smooth, the +-part will be strongly reflective and the other stripes will be unclear or broken. If the workpiece to be tested has a sudden steep rise and fall, the curve is easily caused by shadows and is mistakenly judged as stripes, resulting in the intersection of stripes 6 200813394 •. In addition, the traditional automated detection technology still has the following disadvantages: [1] Monochrome gratings are not easy to distinguish. Referring to the seventh, the conventional method uses a projected monochrome stripe to scan the workpiece to be tested. If the surface of the workpiece to be tested is clear, combined with the high-speed, high-resolution photographic device to capture the phase-shifting scanning overlay method of the grating image, the workpiece to be tested can be completely reconstructed. The three-dimensional model, but as shown in the eleventh and twelfth figures, when the grating is projected on the surface of the workpiece to be tested that is not flat, the grating stripe will be distorted, if one, part is covered by the shadow of the object It is difficult to judge which stripe should correspond to that stripe, which will affect the reconstruction of the image. [2] The display has no switchable face. The traditional optical measurement method, the raster image of the projection device and the raster image captured by the photographing device are displayed by two displays, and cannot be combined and displayed on a single screen. The number of devices is large, the control is complicated, and the viewing is not easy. In addition, the repeated viewing of the image and the adjustment of the focal length of the photographic device must be performed separately, and it is not convenient to directly adjust the photographic device from the display while viewing the image. [3] The raster cannot be adjusted. • Conventional gratings are mostly fixed designs, and their density and contrast cannot be adjusted. If the measurement micro-components are easy to lose accuracy. Therefore, it is necessary to develop new technologies to solve the above shortcomings. SUMMARY OF THE INVENTION The main object of the present invention is to provide a three-dimensional display system that uses a color raster 200813394 pixel clamp and a single-screen screen switching, and the design is suspected to have the second purpose of providing a use. The three-dimensional contour amount of the color-growth element and the screen of the early screen are switched to the reconstruction system, and the display has a switchable mother-in-law face-up. Another object of the present invention is to provide a three-deciding method and a reconstruction system using color raster sub-pixel positioning and single-screen switching of a single screen, which has an adjustment module that can be adjusted. π The present invention provides a three-dimensional contour measuring method and a reconstruction system using a color raster sub-pixel positioning fish screen (4), and the measuring method portion thereof comprises: a preliminary step; a projection step;

三·擷取影像步驟; 四·影像微調步驟; 五·影像處理步驟;以及 六·重建步驟。 其重建系統部分係包括: 一投影裝置,係用以朝一待測工件發出一光栅光 線,該光柵光線具有複數柵線,其對比度均相同,該 光柵光線在該待測工件上形成一光柵影像,其包括複 數色彩不同之條紋; Ν 200813394 一攝影裝置’係用以從該待測工件上擷取該光柵 影像; 一中央處理單元,其至少包括:3. Capture image steps; 4. Image fine-tuning steps; 5. Image processing steps; and 6. Reconstruction steps. The portion of the reconstruction system includes: a projection device for emitting a grating light toward a workpiece to be tested, the grating light having a plurality of grid lines having the same contrast, the grating light forming a raster image on the workpiece to be tested, It includes a plurality of stripes of different colors; Ν 200813394 a photographic device is used to extract the raster image from the workpiece to be tested; a central processing unit, which at least includes:

i· 一中央處理器,係對該光栅影像進行影像分析,、 消除雜訊以及條紋細線化作業,並利用拋物線曲線分 佈分析,求得更精確之最低/最高灰階分佈的落點, 得到每一條紋細線化後之光柵影像中每一像素點,再 利用鈿線化條紋做拋物線曲線分佈擬合,求出條紋最 大之彎曲的程度,配合相位移技術以及相位重建得到 該待測工件之三維輪廓; 一-示器,係與該中央處理器電性連接,該顯示 器至少具有兩種切換模式: Π]同時顯示一第一顯示部及一第二顯示部:可 顯示該投影裝置欲投影之光栅/該攝影裝置擷取之光 栅影像;該第一顯示部至少可用於直接調整該攝影裝 置之焦距、光圈及景深; [2]以第一顯示部全螢幕顯示該光柵影像/三維 輪廓。 本發明之上述目的與優點,不難從下述所選用實 施例之詳細說明與附圖中,獲得深入瞭解。 只 後· 茲以下列實施例並配合圖式詳細說明本發明於 【實施方式】 •參閱第m本發明係—種·『使用彩色光 200813394 栅次像素疋位與單螢幕之子母畫面切換的三雄輪廓 夏測方法與重建糸統』’其量測方法部分包括下列步 驟: 一 ·預備步驟11 :準備一投影裝置20、一攝影 裝置30及一中央處理單元40;i. A central processing unit that performs image analysis on the raster image, eliminates noise and stripe thinning, and uses parabolic curve distribution analysis to obtain a more accurate minimum/highest grayscale distribution drop point. Each pixel of the stripe image after thinning is stripped, and then the parabola curve distribution is used to fit the curve of the parabola curve, and the maximum bending degree of the stripe is obtained. The phase shifting technique and phase reconstruction are used to obtain the three-dimensional shape of the workpiece to be tested. The display device is electrically connected to the central processing unit, and the display has at least two switching modes: Π] simultaneously displaying a first display portion and a second display portion: displaying the projection device to be projected The grating/the raster image captured by the photographing device; the first display portion is at least capable of directly adjusting the focal length, the aperture and the depth of field of the photographing device; [2] displaying the raster image/three-dimensional contour on the full screen of the first display portion. The above objects and advantages of the present invention will be readily understood from the following detailed description of the embodiments of the invention. The following is a detailed description of the present invention in the following embodiments with reference to the drawings. [Embodiment] Referring to the mth embodiment of the present invention, "the use of color light 200813394 gate sub-pixel position and single screen screen switching between the three males The contour summer measuring method and the reconstruction system 』the measuring method part thereof comprises the following steps: 1. preliminary step 11: preparing a projection device 20, a photographing device 30 and a central processing unit 40;

二·投影步驟12 :啟動該投影裝置2〇,該投影 裝置20朝一待測工件90照射一光栅光線21,其具有 複數對比度相同之拇線,該光桃光線21在該待测工 件90上形成一光栅影像91,該光栅影像91由複數對 比度相同的條紋901(參閱第三及第四圖)組成; 二·榻取影像步驟13 :啟動該攝影.裝置30,從 該待測工件90上擷取該光柵影像91 ; 四·影像微調步驟14 :該中央處理單元4〇設一 顯示器,41,談顯示器41可同時顯示一第一顯示部 41U即子晝面)及一第二顯示部412(即母晝面),第二 …頁不f 412(即母晝面)顯示該投影裝置欲投影之光 、、員示部411(即子晝面)顯示所擷取之光柵影 像史k該第一顯不部411(即子晝面)顯示所擷取之光 二像至夕可用於調整該攝影裝置之焦距、光圈及 景深····莖 . 一 / 寺,直到第一顯示部411上呈現清晰之 “ ”像91日才’可將該第—顯示部411從該顯示器 莖關閉,切換成第二顯示部412在顯示,器41全螢 幕顯示光柵影像91。 〜像處理步驟15 :該中央處理單元4〇從該 200813394 攝影裝置30接收該光柵影像91 ;並對該光柵影像91 進行影像分析、消除不必要之背景雜訊,再對光柵影 像91.進行條紋細線化作業; 六·重建步驟16 :利用條紋細線化後之光柵影像 91中每一像素點,配合相位移技術以及相位重建得到 該待測工件90之三維輪廓。 如此為本發明之使用彩色光桃次像素定位與單2. Projection step 12: starting the projection device 2, the projection device 20 illuminates a grating light 21 toward a workpiece 90 to be tested, which has a plurality of thumb lines having the same contrast, and the light ray 21 is formed on the workpiece 90 to be tested. a raster image 91, the raster image 91 is composed of a plurality of stripes 901 having the same contrast (see the third and fourth figures); 2. The image capture step 13: the camera is activated. The device 30 is mounted on the workpiece 90 to be tested. Taking the raster image 91; 4. Image fine-tuning step 14: The central processing unit 4 is provided with a display 41, and the display 41 can simultaneously display a first display portion 41U or a second display portion 412 ( That is, the mother's face), the second page is not f 412 (ie, the mother's face) displays the light to be projected by the projection device, and the member 411 (ie, the face) displays the history of the captured raster image. A display 411 (ie, a sub-surface) displays the captured light image to the night, which can be used to adjust the focal length, aperture, and depth of field of the photographing device. The temple is displayed on the first display portion 411. The clear "" is like the 91st, the first display portion 411 can be taken from the Stem shown is closed, the display is switched to the second display unit 412, the display screen 41 is a full raster image 91 firefly. ~ Image processing step 15: The central processing unit 4 receives the raster image 91 from the 200813394 camera device 30; performs image analysis on the raster image 91, eliminates unnecessary background noise, and then stripes the raster image 91. Thinning operation; 6. Reconstruction step 16: The three-dimensional contour of the workpiece 90 to be tested is obtained by using the phase shift technique and phase reconstruction for each pixel in the raster image 91 after the thinning of the stripe. Thus, the use of color light peach sub-pixel positioning and single for the present invention

螢幕之子母晝面切換的三維輪廉量測方法與重建系 統。 · 本發明之實際操作方法,係以該中央處理單元40 之中央處理器42預先製作欲進行投影之光柵(即光柵 光線21),該光柵中每一;[冊線(如第五圖之每一條紋) 之對比度均相同,光柵密度最好是5條/1mm,光栅 以彩色(彩色參考圖如附件一之第C圖所示)為最佳, 其色彩組合至少可為 R,G,B,1/2R,1/2G,1/2B,1/3R,1/3G, 1/3B,1/4R,1/4G,1/4B,(1/2R+1/2G),(1/2R+1/2B),(1/2G + 1/2B),(1/3R+1/3G),(1/3R+1/3B),(1/3G+1/3B)· · · · 等變化,R、G、B為色彩三原色,而彩色光栅條紋的 產生方式可為: I = [LPMxl.6 3 LPMx3] if /minx3<255 ? then R = Random[〇 , x3] 5 Re[〇 , 255] else R = Random[〇 y 255] 5 7?g[〇 , 255] G = 3x1 -R-Random[〇 , 255] , Ge[〇 , 255] B = 3xl-R-G ? Bg[〇 5 255] 11 200813394 其中I為每條光柵的整體加總亮度值,LPM(line pair/mm)為光柵數目,11、0、6為色彩三原色。將1 值限制在[LPMx 1.6,LPMx3]間,可避免G、B值過飽 合,影響到光栅亮度的不均。R值由亂數產生,若光 柵之整體總亮度值(I值)太低,則限制R值的範圍在 [〇,L χ3]間,如此可避免R、G、B三值達到過飽合, 確保R、G、Β均可落在[0,255]間。G值也是由亂數 產生,範圍限制在[0,· 255]間。The three-dimensional round-robin measurement method and reconstruction system for switching the screen of the child's face. The actual operation method of the present invention is that the central processing unit 42 of the central processing unit 40 pre-produces the grating to be projected (ie, the grating light 21), each of the gratings; [the album line (as shown in the fifth figure) The contrast ratio of a stripe is the same, the grating density is preferably 5 strips/1 mm, and the grating is best in color (the color reference image is shown in Figure C of Annex I), and the color combination can be at least R, G, B. , 1/2R, 1/2G, 1/2B, 1/3R, 1/3G, 1/3B, 1/4R, 1/4G, 1/4B, (1/2R+1/2G), (1/ 2R+1/2B), (1/2G + 1/2B), (1/3R+1/3G), (1/3R+1/3B), (1/3G+1/3B)· · · · For the same variation, R, G, and B are the three primary colors, and the color grating stripes can be generated as follows: I = [LPMxl.6 3 LPMx3] if /minx3<255 ? Then R = Random[〇, x3] 5 Re[〇 , 255] else R = Random[〇y 255] 5 7?g[〇, 255] G = 3x1 -R-Random[〇, 255] , Ge[〇, 255] B = 3xl-RG ? Bg[〇5 255] 11 200813394 where I is the total summed brightness value of each grating, LPM (line pair/mm) is the number of gratings, and 11, 0, and 6 are the three primary colors of color. Limiting the value of 1 to [LPMx 1.6, LPMx3] prevents the G and B values from being saturated, which affects the uneven brightness of the grating. The R value is generated by random numbers. If the overall total luminance value (I value) of the grating is too low, the range of the R value is limited to [〇, L χ 3], so that the three values of R, G, and B can be prevented from being saturated. , to ensure that R, G, and Β can fall between [0, 255]. The G value is also generated by random numbers, and the range is limited to [0, · 255].

Ι· 彩色光栅條紋的產生方式亦可遵循投影出的彩 色光柵每條條紋的最高顏色亮度相同之法則,必須使 每條光柵的最高顏色亮度都相等,而最高顏色亮度如 的定義為:Ι· The color grating stripe can also be generated in the same way as the highest color brightness of each stripe of the projected color raster. The highest color brightness of each stripe must be equal, and the highest color brightness is defined as:

Bn = Α/αχ(/?, G9 B) 9 Bn s |〇?255] 其中及、G、B為色彩三原色。欲使每條光柵的 最高顏色.亮度均相等,則必須使每條光柵的心值相 等。而彩色光栅條紋的產生方式係隨機選擇一及值, 並限制及值的最大值為如: R = Random^),255\ if R > Bn,R = Bn 隨機選擇一 G值,並限制G值的最大值為如: G = Random[〇,255] if G> Bn , G = Bn 取i?、G的最大值,若此值為如,則万的值可以 12 200813394 疋(k機送擇的值,若及、(^的最、大值不是如,則令万 值^為βη if(Max(R, G) = Bn) 5 B = Random[0, Bn] • else B = Bn 參閱第二圖,將中央處理器42預先製好的光柵 輸出至該投影震置20(例如為數位光源處理器,其英 文為 Digital Light Processing,簡稱 DLP),透過該 投影裝·置20投射至該待測工件9〇上而形成光柵影 像91。由該攝影裝置3〇擷取該光柵影像9〇1並傳回 該中央處理單元4〇,並顯示於該中央處理單元4〇 之顯示器41上。 以該顯不器41之第一顯示部411顯示所擷取之 光柵影像91,並可用於調整該攝影裝置3〇,至該光 柵影像91清晰的呈現於該第一顯示部411上,再將 第一顯示部411從該顯示器41上關閉,切換成第二 顯示部412在顯示器41全螢幕顯示該光柵影像91。 以該中央處理器42將光柵影像91上之不同序號 的條紋901予以不同之RGB色彩組合,正確地讀取° 彩色之光栅影像·91的條紋9〇1位置,並重建出正確 之待測工件90的三維輪廓。 麥閱第六圖,舉例來講,當光柵光線在待測工件. 上形成光柵影像,假設有一參考平面,則待測工件表 面相對於參考平面的高度可表示為: 13 200813394 ⑴ h(x,y)二」〇 •恤 + tan / tan θη) 其中Ρ〇為光柵光線投射至參考平面之間距,0 〇 為投射角度’ θ η為攝影裝置擷取之D點與參考平面 之夾角’ 0 cd為D點相對於c點之相位值,假設0 η = 9Ό° ’則表面高度可表示為·· K^y)= P0 -tan^( 2πBn = Α/αχ(/?, G9 B) 9 Bn s |〇?255] where, G, B are the three primary colors. To make each raster's highest color and brightness equal, you must equalize the heart value of each raster. The color grating stripe is randomly selected by a value, and the maximum value of the limit and value is as follows: R = Random^), 255\ if R > Bn, R = Bn randomly select a G value, and limit G The maximum value of the value is as follows: G = Random[〇,255] if G> Bn , G = Bn Take the maximum value of i?, G, if this value is, then the value of 10,000 can be 12 200813394 疋 (k machine The value chosen, if and (the maximum and maximum value of ^ is not the same, then the value ^ is βη if(Max(R, G) = Bn) 5 B = Random[0, Bn] • else B = Bn In the second figure, the pre-made grating of the central processing unit 42 is output to the projection oscillator 20 (for example, a digital light source processor, which is Digital Light Processing (DLP) in English), and is projected to the projection device 20 through the projection device 20 A raster image 91 is formed on the workpiece 9 to be tested. The raster image 9〇 is captured by the photographing device 3 and transmitted back to the central processing unit 4〇, and displayed on the display 41 of the central processing unit 4〇. The captured image 91 is displayed by the first display portion 411 of the display 41, and can be used to adjust the imaging device 3 to the raster image 91. Presented on the first display portion 411, the first display portion 411 is closed from the display 41, and switched to the second display portion 412 to display the raster image 91 on the full screen of the display 41. The central processor 42 is used to rasterize The stripe 901 of different numbers on the image 91 is combined with different RGB colors to correctly read the stripe 9〇1 position of the color raster image 91 and reconstruct the correct three-dimensional contour of the workpiece 90 to be tested. In the six figures, for example, when the grating light forms a raster image on the workpiece to be tested, assuming a reference plane, the height of the surface of the workpiece to be tested relative to the reference plane can be expressed as: 13 200813394 (1) h(x, y) 〇•shirt + tan / tan θη) where Ρ〇 is the distance between the grating rays projected to the reference plane, 0 〇 is the projection angle ' θ η is the angle between the D point captured by the camera and the reference plane' 0 cd is D point Relative to the phase value of point c, assuming 0 η = 9Ό° 'the surface height can be expressed as ··· K^y)= P0 -tan^( 2π

(2) 由於Ρ〇與θ 〇皆為疋值,且參考平面可假設於任 何位置,因此待測工件表面輪廓可由投射至待測工件 上變形的條紋之相位分佈值來決定。 · 正弦強度分佈之數位光柵,其光強度與相位移之 間的關係可表示成: I(x,y) = / (x^y) + Γ(χ9γ)0Ο3[φ(χ9γ) + S] (3 ) 由於上式中有 r(x,y)(average intensity)、Ι,,(χ, yKintensity modulation)以及 5(phase m〇duiati〇n)三 個未知數,所以至少需要三組不同的方程式才可解 出,可以攝影裝置擷取四張光栅影像,以9〇度作為 相移角度,可得到相位值與光強度之間關係如下: 咖,/2)/(/ι—/3)) ⑷ 利用上式便可以得到每一個像素點的相位值;再 配合相位移技術以及相位重建得到該待測工件之三 維輪廓。 — 另外,本發明可應用線段投影法量測該待測工件 200813394 9〇之表面高度;其係利用光栅條紋在待測工件9〇表 面上產生之位移量的多寡,·來計算待測工件9〇之高 度(如第八圖所示),主要方式如下; 已知待測工件90細線化後之預定條紋的兩個端 點,#私7小則其斜率奶為: Χ2 ~-χι · Ι· 欲計算線段上每一點之物體高度j,則須由線段 上之任意點户6〇汐對直線做垂直線,線段即為 所求之物體高度,而直線户ρ的斜率為·· # m2 = —?- 利用直線d万及直線/^的聯立方程式,可求出兩 直線方程式的交點Ρ;)為: \y-m2x-\-c2 ' ml -m2 < C9 — Ci y3=mr—~L- + q l m「m2 計算户、0兩點間的距離即可求得物體高度J為· ^ = Ρ〇 = λ[(χ3-x)2 +(y3 -yf 於數位影像處理分析上,如能將待測工件之像素 灰階、顏色,以及鄰近各像素之資訊一併納入考量了 則可將檢測精度提升至次像素的範圍。 15 200813394 因此於該重建步驟16中,可再利用拋物線曲線分 佈分析的方法將檢測精度提升至次像素的範圍。刀 如第九圖所示為原始數位影像中預定一條紋之樺 切面的灰階分佈示意圖,圖中左邊所顯示的是原 始數位影像的條紋,圖中右邊所顯示的是原始數位影 像的一條紋之橫切面;如第十圖所示為拋物線曲 線分佈分析示意圖,假設拋物線方程式且(2) Since both Ρ〇 and θ 〇 are 疋, and the reference plane can be assumed to be at any position, the surface profile of the workpiece to be tested can be determined by the phase distribution value of the stripe projected onto the workpiece to be tested. · The relationship between the light intensity and the phase shift of a digital grating with a sinusoidal intensity distribution can be expressed as: I(x,y) = / (x^y) + Γ(χ9γ)0Ο3[φ(χ9γ) + S] ( 3) Since there are three unknowns of r(x, y) (average intensity), Ι, (χ, yKintensity modulation) and 5 (phase m〇duiati〇n) in the above formula, at least three different equations are required. It can be solved that four raster images can be captured by the photographic device, and the phase shift angle is 9 degrees, and the relationship between the phase value and the light intensity can be obtained as follows: coffee, /2)/(/ι—/3)) (4) The phase value of each pixel point can be obtained by using the above formula; and the three-dimensional contour of the workpiece to be tested is obtained by the phase shift technique and the phase reconstruction. In addition, the present invention can measure the surface height of the workpiece to be tested 200813394 by using a line projection method; and calculate the workpiece to be tested by using the amount of displacement of the grating stripe on the surface of the workpiece 9 to be tested. The height of the crucible (as shown in the eighth figure), the main way is as follows; It is known that the two ends of the predetermined stripe after the thinning of the workpiece to be tested 90, #私7小, the slope of the milk is: Χ2 ~-χι · Ι · To calculate the height j of each point on the line segment, you must make a vertical line from any point on the line segment. The line segment is the height of the object you are looking for, and the slope of the line ρ is ·· # m2 = —?- Using the simultaneous equations of the straight line d and the line /^, the intersection of the two linear equations can be found;): \y-m2x-\-c2 ' ml -m2 < C9 — Ci y3=mr —~L- + qlm “m2 Calculate the distance between the household and 0 points to obtain the height J of the object ^ ^ Ρ〇= λ[(χ3-x)2 +(y3 -yf on digital image processing analysis If the pixel gray level, color, and information of adjacent pixels of the workpiece to be tested are taken into consideration, the detection accuracy can be improved to the secondary image. 15 200813394 Therefore, in the reconstruction step 16, the detection accuracy can be improved to the sub-pixel range by using the parabolic curve distribution analysis method. The knife is as shown in the ninth figure, which is a predetermined stripe of birch in the original digital image. Schematic diagram of the gray scale distribution of the cut surface, the left side of the figure shows the stripe of the original digital image, the right side of the figure shows the cross section of the stripe of the original digital image; as shown in the tenth figure, the schematic diagram of the parabolic curve distribution analysis, Assume a parabolic equation and

為原始數位影像中某線段灰階分佈的最低或 最高之處;又此拋物線方程式有三個未知數,需要三 組方程式來求解,因此取以,々」及其前^兩^ 「沿,办;、6¾汾)做拋物線曲線分佈分析,以求得更精 確的最低或最高灰階分佈的落點。其相關數學式如4 所示: 嫁設原始數位影像中某線段灰階分佈的函數為拋 物線方程式: g = a(x- c)2 + b 取& 及其前後兩點化^办)做拋物線 曲線分佈分析: a{xQ-cf +b = g0 < a{xx-c)2 •hb = gl a(X2 ~C)2+^ = g2 求得此拋物線方程式的三個未知數3C為·· xi(g〇-g2hxHs^^) 2k (^2 - )+ ^ - g2 )+ X2 (gl - g〇 )] 16 200813394 一- So - gj (x0-cfThe lowest or highest gray-scale distribution of a line segment in the original digital image; this parabolic equation has three unknowns, which requires three sets of equations to solve, so take 々, and its front ^ two ^ "edge, do; 63⁄4汾) Do a parabolic curve distribution analysis to obtain a more accurate minimum or maximum gray-scale distribution. The relevant mathematical formula is shown as 4: The function of marrying the gray-scale distribution of a line segment in the original digital image is parabolic equation. : g = a(x- c)2 + b Take & and its two points before and after; do the parabolic curve distribution analysis: a{xQ-cf +b = g0 < a{xx-c)2 •hb = gl a(X2 ~C)2+^ = g2 Find the three unknowns of this parabolic equation 3C is ·· xi(g〇-g2hxHs^^) 2k (^2 - )+ ^ - g2 )+ X2 (gl - g〇)] 16 200813394 一 - So - gj (x0-cf

其中拋物線的頂點位於W處,即在處為 利用次像素的方法所逼近的影像中某線段灰階分佈的 敢低或隶南位置。The vertices of the parabola are located at W, that is, at the position of the gray level distribution of a line segment in the image approached by the method using the sub-pixel.

因本發明之投影裝置2〇朝待測工件90照射的光 柵光線21(如第五圖)係為彩色(如附件一第c圖所 示)’故待測工件90形成之光栅影像91(如第三圖)亦 為彩色(如附件一第A圖所示),其每一條紋9〇1之對 比度均相同,即使光柵影像91在待測工件9〇表面上 有部分被其陰影覆蓋(如第四圖,其對應之彩色圖為 附件-之第B圖),仍可清楚分辨每—條紋的相接處, 確實重建待測物9〇之三維輪廓。 本發明之三維量測方法至少可廣泛應用於 m光學類:測量產品形狀、曲率。 [2]光通吼類:測量光纖端面。 [3] 半導體類:測量晶圓表面輅廓。 [4] 電子類:測量.錫膏厚度。 以及表面 [5] 機械類.測量機械實體之外觀形狀 粗糙度。 參閱第二圖’有關本發明之重建系統部分,其包 17 200813394 才又影裝置20,係用以朝一待測工件9〇發出一 光拇光線21 ;該光柵光線21具有複數柵線,其對比 .度均相同,該光栅光線21在該待測工件⑽上形成一 光柵影像91,其包括複數對比度均相同之條紋9〇1 ; 一攝影裝置30,係用以從該待測工件9〇上擷取 該光柵影像91 ; 中央處理單元40,係至少包括一顯示器41及 一中央處理器42 ;其中: I· 該顯示器41,係可同時顯示一第一顯示部411 及一第二顯示部412;以該第一顯示部411(即子晝面) 顯示所擷取之光柵影像,可用於調整該攝影裝置3q 之焦距、光圈及景深·· ··等,至該攝影裝置30 •擷取之光柵影像91(也可以說是條紋9〇1)相當清晰的 顯示於該第一顯示部411(即子晝面)時;將該第一顯 示部411關閉,該第二顯示部412在該顯示器上 i_ 以全螢幕顯示該光柵影像91(也可以說是條紋901); 該中央處理器42,係可對該光栅影像91進行影 · 像分析、消除不必要之背景雜訊,再對該光栅影像91 進行條紋細線化作業,利用條紋細線化後之光栅影像 91中每一像素點,配合相位移技術以及相位重建得到 該待測工件90之三維輪廓’並顯示於該顯示器4工。 如此為本發明之使用彩色光栅次像素定位與單 螢幕之子母畫面切換的三錐輪廓重建系統。 參閱第二圖,實務上,該投影裝置2〇係為數位 18 200813394 光源處理器(Digital Light Processing,簡稱 DLP),其 具有高亮度、色調重現性正確、反應時間快、無雜訊 等優點,且其發出之光柵光線21係由該中央處理器 42預先處理成彩色(如第五圖所示,其彩色圖如附件 - · 一之第C圖),相對該待測工件90上形成之光柵影像 91亦為彩色;該投影裝置20之鏡頭上又可包括一聚 焦透鏡22,其配合不同尺寸大小的待測工件90,控 制該投影裝置20輸出不同尺寸大小之光柵光線21。The grating light 21 (such as the fifth figure) irradiated by the projection device 2 of the present invention toward the workpiece 90 to be tested is colored (as shown in the attached figure c), so the raster image 91 formed by the workpiece 90 to be tested (such as The third figure) is also colored (as shown in Figure A of Annex A), and the contrast of each stripe 9〇1 is the same, even if the raster image 91 is partially covered by the shadow on the surface of the workpiece 9 to be tested (eg In the fourth figure, the corresponding color map is the attachment-B map. It is still possible to clearly distinguish the intersection of each stripe and indeed reconstruct the three-dimensional contour of the object to be tested. The three-dimensional measurement method of the present invention can be widely applied to at least m optics: measuring product shape and curvature. [2] Optical communication : class: measuring the fiber end face. [3] Semiconductors: Measuring the surface profile of wafers. [4] Electronics: Measurement. Solder paste thickness. And surface [5] Mechanical class. Measuring the appearance of the mechanical body Roughness. Referring to the second figure 'reconstruction system portion of the present invention, the package 17 200813394 is only a shadow device 20 for emitting a light beam 21 toward a workpiece 9 to be tested; the grating light 21 has a plurality of grid lines, the contrast The grating light 21 forms a raster image 91 on the workpiece (10) to be tested, and includes a stripe 9〇1 having the same plurality of contrasts; a photographing device 30 for picking up from the workpiece 9 to be tested. The central processing unit 40 includes at least one display 41 and a central processing unit 42. The display unit 41 displays a first display portion 411 and a second display portion 412 simultaneously. Displaying the captured raster image by the first display portion 411 (ie, the sub-plane), and adjusting the focal length, aperture, depth of field, and the like of the imaging device 3q to the imaging device 30. When the raster image 91 (also referred to as the stripe 9〇1) is displayed relatively clearly on the first display portion 411 (ie, the sub-surface); the first display portion 411 is turned off, and the second display portion 412 is on the display. Display the raster image 91 on i_ in full screen (also It is said that the stripe 901); the central processing unit 42 can perform image and image analysis on the raster image 91, eliminate unnecessary background noise, and perform stripe thinning operation on the raster image 91, and thinning the stripe Each pixel in the subsequent raster image 91 is matched with the phase shift technique and phase reconstruction to obtain a three-dimensional contour of the workpiece 90 to be tested and displayed on the display. Thus, the present invention is a three-cone contour reconstruction system using color raster sub-pixel positioning and single screen switching of a single screen. Referring to the second figure, in practice, the projection device 2 is a digital 18 processing device (Digital Light Processing, DLP for short), which has the advantages of high brightness, correct color tone reproducibility, fast response time, no noise, and the like. And the grating light 21 emitted by the central processing unit 42 is pre-processed into color (as shown in the fifth figure, the color map is as shown in the attached figure - the first C picture), and is formed on the workpiece 90 to be tested. The raster image 91 is also colored. The lens of the projection device 20 can further include a focusing lens 22 for matching the workpieces 90 of different sizes to control the projection device 20 to output the grating light 21 of different sizes.

該攝影裝置30係為感光耦合(Charge Coupled Device ,簡稱CCD)攝影機,最好是彩色攝影機。 本發明之使用彩色光柵次像素定位與單螢幕之 子母晝面切換的三維輪廓重建系統又包括: 一彩色光柵序號建立模組421,係用以將不同序 號之光栅影像91的條紋901予以不同的RGB色彩組 合。 一彩色光柵序號讀取模組422,係用以正確讀取 各彩色條紋901之位置,並重建出待測工件90正確 的三維輪廓,該彩色光柵序號建立模組421與該彩色 光柵序號讀取模組422皆可直接設於該中央處理器 42上。 一調整模組50,係用以產生並調整欲投影光柵 (也可以說是光柵光線21)之柵線的密度及明暗對比 度,該調整模組50可直接設於該中央處理器42上, 或是直接由該中央處理器42取代。 19 200813394 . 本發明之優點及功效歸納如下: [1] 光柵具有相同對比度較易分辨。本發明投影 之光柵光線具有相同對比度(例如為彩色),當投射在 待測工件上時,即使待測工件表面有凹凸不平,使光 柵影像產生彎曲,甚至是受到待測工件陰影影響時, 仍可藉由彩色攝影裝置將彩色光柵的每一柵線位置 正確地讀取出來,並重建出精密之三維影像。 [2] 顯示器具有可切換之子母畫面。本發明之顯 __ 示器具有可切換之子母晝面,其至少具備兩種功能: (a) 可顯示投影裝置欲投影之光柵,亦可顯示攝 影裝置擷取之光柵影像。 (b) 可由第一顯示部(即子晝面)直接輕易的調整 攝影裝置之焦距、光圈及景深·,· ··等,使該攝影 裝置可以擷取清晰的光柵影像,在調整完攝影裝置 後,可以將其關閉,以全螢幕的第二顯示部(即母晝 面)清楚呈現三維輪廓之重建過程。 [3] 具有調整模組可以調整光柵光線。本發明設 有一調整模組,其用以產生並調整欲投影光栅(也可. 以說是光栅光線)之栅線的密度及明暗對比度,以適 用於各種不同的待測工件。 以上僅是藉由較佳實施例詳細說明本發明,對於 該實施例所做的任何簡單修改與變化,佘不脫離本發 明之精神與範圍。 由以上詳細說明,可使熟知本項技藝者明瞭本發 20 200813394 - 明的確可達成前述目的,實已符合專利法之規定,爰 提出發ό月專利申請。 【附件一】 第Α圖係第三圖之彩色示意圖 第B圖係第四圖之彩色示意圖 第C圖係第五圖之彩色示意圖 【圖式簡單說明】 __ 第一圖係本發明之三維輪廓量測方法之流程示意圖 第二圖係本發明之三維輪廓重建系統之基本架構示意圖 第三圖係本發明之光柵光線投射在待測工件上之示意圖一 弟四圖係本發明之光拇光線投射在待測工件上之不意圖二 . 第五圖係本發明之光柵之示意圖 第六圖係本發明之光栅影像之條紋示意圖 第七圖係本發明之實際流程參考示意圖 ρφ 第八圖係本發明之線段投影法之示意圖 第九圖係本發明之原始影像中之預定條紋之橫切面AT 的灰階分佈示意圖 第十圖係本發明之拋物線曲線分佈分析之示意圖 第十一圖係習用之光柵光線投射在待測工件上之示意圖一 第十二圖係習用之光柵光線投射在待測工件上之示意圖二 21 200813394 422彩色光栅序號讀取模組 - 【圖式元件符號說明】 11預備步驟 13擷取影像步驟 15影像處理步驟 20投影裝置 22聚焦透鏡 40中央處理單元 411第一顯示部 I· 42中央處理器 90待測工件 91光栅影像 12投影步驟 14影像微調步騍 16重建步驟 21光柵光線 30攝影裝置 41顯示器 412弟二顯示部 421彩色光柵序號建立模組 50調整模組 901條紋 22The photographing device 30 is a Charge Coupled Device (CCD) camera, preferably a color camera. The three-dimensional contour reconstruction system using the color raster sub-pixel positioning and the single-screen switching of the single screen of the present invention further includes: a color raster number establishing module 421 for different stripes 901 of the raster image 91 of different serial numbers. RGB color combination. A color raster number reading module 422 is configured to correctly read the position of each color stripe 901 and reconstruct a correct three-dimensional contour of the workpiece 90 to be tested, and the color raster number establishing module 421 and the color raster number are read. Module 422 can be directly disposed on the central processing unit 42. An adjustment module 50 is configured to generate and adjust the density and brightness contrast of the raster lines of the grating to be projected (also referred to as the grating light 21). The adjustment module 50 can be directly disposed on the central processing unit 42, or It is replaced directly by the central processor 42. 19 200813394 . The advantages and effects of the present invention are summarized as follows: [1] The grating has the same contrast and is easy to distinguish. The grating light of the projection of the invention has the same contrast (for example, color), and when projected on the workpiece to be tested, even if the surface of the workpiece to be tested has irregularities, the raster image is curved, even when affected by the shadow of the workpiece to be tested, Each gate line position of the color grating can be correctly read by a color photographing device, and a precise three-dimensional image can be reconstructed. [2] The display has a switchable picture. The display device of the present invention has a switchable mother and daughter face, which has at least two functions: (a) can display a raster to be projected by the projection device, and can also display a raster image captured by the camera. (b) The focal length, aperture and depth of field of the photographic device can be directly and easily adjusted by the first display unit (ie, the sub-surface), so that the photographic device can capture a clear raster image and adjust the photographic device. After that, it can be turned off, and the reconstruction process of the three-dimensional contour is clearly presented in the second display portion of the full screen (ie, the mother face). [3] With adjustment module to adjust the grating light. The present invention is provided with an adjustment module for generating and adjusting the density and brightness contrast of the raster lines of the grating (which may be said to be grating light) to be applied to various workpieces to be tested. The present invention has been described in detail with reference to the preferred embodiments of the present invention. From the above detailed description, it will be apparent to those skilled in the art that the present invention can be achieved in accordance with the provisions of the Patent Law, and the patent application is filed. [Attachment 1] Figure 3 is a color diagram of the third diagram. Figure B is a color diagram of the fourth diagram. Figure C is a color diagram of the fifth diagram. [Simple diagram of the diagram] __ The first diagram is the three-dimensional contour of the present invention. The schematic diagram of the flow chart of the measurement method is the schematic diagram of the basic structure of the three-dimensional contour reconstruction system of the present invention. The third diagram is the schematic diagram of the grating light of the present invention projected onto the workpiece to be tested. FIG. 5 is a schematic view of a grating of the present invention. FIG. 6 is a schematic diagram of a stripe image of the present invention. FIG. 7 is a schematic diagram of the actual flow of the present invention. FIG. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 9 is a schematic diagram showing a gray scale distribution of a cross section AT of a predetermined stripe in an original image of the present invention. FIG. 11 is a schematic diagram showing a parabolic curve distribution analysis of the present invention. Schematic diagram of the projection on the workpiece to be tested. Figure 12 is a schematic diagram of the conventional grating light projected onto the workpiece to be tested. 21 200813394 422 color grating No. reading module - [schematic component symbol description] 11 preliminary step 13 capture image step 15 image processing step 20 projection device 22 focusing lens 40 central processing unit 411 first display portion I 42 central processor 90 to be tested workpiece 91 Raster Image 12 Projection Step 14 Image Fine Tuning Step 16 Reconstruction Step 21 Grating Light 30 Photographic Device 41 Display 412 Dimensional Display Unit 421 Color Grating Number Establishment Module 50 Adjustment Module 901 Stripe 22

Claims (1)

200813394 十、申請專利範圍: 1·一種使用彩色光柵次像素定位與單螢幕之子母查 換的二維輪廓量測方法,其包括下列步驟: 一·預備步驟:準備一投影裝置、一攝影裝置及一中 央處理單元;200813394 X. Patent application scope: 1. A two-dimensional contour measurement method using color raster sub-pixel positioning and single screen detection, including the following steps: 1. preliminary steps: preparing a projection device, a photographing device and a central processing unit; —··投影步驟·啟動該投影裝置,該投影裝置朝一待 測工件照射一光栅光線,其具有複數對比度均相 同之柵線,該光栅光線在該待測工件上形成一光 柵影像,該光栅影像由複數對比度相同,而色彩 成分不同的條紋組成; 三·擷取影像步驟··啟動該攝影裝置,從該待測工件 上擷取該光栅影像;、 四 五 •影像微調步驟:該中央處理單元設一顯示器,該 顯示器可同時顯示-第—顯示部及—第二顯°示^ ,從該第一顯示部至少可用於直接調整該攝影裝 置之焦距、光圈及景深,至該第一顯示部上呈現 清晰之光柵影像,將該第一顯示部從該顯示器上 關閉,以該第二顯示部在該顯示器上全螢幕顯示 該光栅影像; 影像處理步驟:以該中央處理單元對該光栅影像 進打影像分析、消除雜訊,以及條紋細線化作業 六·重建步驟:該中央處理單元利用拋物線曲線分佈 析求付精確之敢低/最南灰階分佈之落點,以 23 200813394 得到每一條紋細線化後之光柵影像中每一像素點 ,再利用細線化條紋做拋物線曲線分佈擬合,求 出條紋最大之彎曲的程度,再配合相位移技術以 及相位重建得到該待測工件之三維輪廓。 2 ·如申請專利範圍第1項所述之使用彩色光柵次像素定 位與單螢幕之子母晝面切換的三維輪廓量測方法,其 中:—····································································································· It consists of a plurality of stripes with the same contrast and different color components; 3. Capture the image step··Start the camera device, and capture the raster image from the workpiece to be tested; 4·5•Image fine adjustment step: the central processing unit Providing a display capable of simultaneously displaying a -first display portion and a second display portion, wherein the first display portion is at least operable to directly adjust a focal length, an aperture, and a depth of field of the photographing device to the first display portion Presenting a clear raster image, the first display portion is closed from the display, and the second display portion displays the raster image on the display in full screen; image processing step: the raster image is input by the central processing unit Perform image analysis, eliminate noise, and stripline thinning operations. 6. Reconstruction steps: The central processing unit utilizes parabola The curve distribution is analyzed and the exact point of the dare low/most southern gray scale distribution is obtained. At 23 200813394, each pixel point in the thinned image of each stripe is obtained, and then the thin lined stripe is used for the parabolic curve distribution fitting. The degree of bending of the stripe is determined, and the three-dimensional contour of the workpiece to be tested is obtained by phase shifting technique and phase reconstruction. 2 · A three-dimensional contour measurement method using color raster sub-pixel positioning and single-screen switching of a single screen as described in claim 1 of the patent scope, wherein: 於該重建步驟中,將該光柵影像上之不同序號的條 紋予以不同之RGB色彩組合,正確讀取每一條紋之 位置,即可重建出待測工件之三維輪廓。 3 ·如申請專利範圍第1項所述之使用彩色光柵次像素定 位與單螢幕之子母晝面切換的三維輪廓量測方法,其 中,該中央處理單元至少設有: 一中央處理器,係與該顯示器電性連接;該中央處 理器用以預先製作一光柵,以供該投影裝置投影出該 光柵光線。 4 ·如申請專利範圍第3項所述之使用彩色光柵次像素定 位與單螢幕之子母晝面切換的三維輪廓量測方法,其 中: 該光柵光線係為彩色,其色彩組合至少包括:r,G, B,1/2R,1/2G,1/2B,1/3R,1/3G,1/3B,1/4R,1/4G, 1/4B,(1/2R+1/2G),(1/2R+1/2B),(1/2G+1/2B), ! (1/3R+1/3G), (1/3R+1/3B),(1/3G+1/3B)等,R、G、B 為色彩三原色,假設I為每條光栅的整體加總亮度值 24 200813394 • ’彩色光拇條敌的產生方式係為: / = [LPMxL6,ZiWx3] if 7^x3 <255 ? then R = Random[〇 9 x3] ? i? e [〇 ? 255] else R = Random[〇 , 255] ? 7? g [〇 5 255] G = 3x1-R-Random[〇 ? 255] ? G g [〇 ? 255] 5 = 3χ/ — π — G , ,255]。 5 ·如申請專利範圍第3項所述之使用彩色光柵次像素定 位與單螢幕之子母晝面切換的三維輪廓量測方法,其 __ 中,該光柵光線係為彩色,該彩色光栅條紋之產生方 式係為: 定義最高顏色亮度如為: Βη ξ Max{R, G, B) , Bn g [〇?255] 隨機選擇一允值,並限制无值的最大值為万/7 R - Randorr^)^155\ if R > Bn,R = Bn _· 隨機選擇一 f值,並限制C值的最大值為及7 G = Random^),255\ if G> Bn , G-Bn 取f的最大值,若此值為及7,貝万的值可以是 隨機選择的值;若允、f的最大值不是洳,則令万值為 Bn ·· 25 200813394 if{Max(R,G)=zBn、,B = Rand〇miQ,Bn、 else B = Bn 6 種使用l色光栅次像素定位與單螢幕之子母晝面切 換的三維輪廓重建系統,係包括: •技衫裝置,係用以朝一待測工件發出一光柵光線 ^光栅光線具有複數栅線,其對比度均相同,該光In the reconstruction step, different strips of different numbers on the raster image are combined with different RGB colors, and the position of each stripe is correctly read to reconstruct the three-dimensional contour of the workpiece to be tested. 3. The three-dimensional contour measuring method using the color raster sub-pixel positioning and the single-screen switching of the single screen as described in claim 1, wherein the central processing unit has at least: a central processing unit The display is electrically connected; the central processor is configured to pre-form a grating for the projection device to project the grating light. 4. The three-dimensional contour measuring method using color raster sub-pixel positioning and single-screen switching of a single screen as described in claim 3, wherein: the grating light is color, and the color combination includes at least: r, G, B, 1/2R, 1/2G, 1/2B, 1/3R, 1/3G, 1/3B, 1/4R, 1/4G, 1/4B, (1/2R+1/2G), (1/2R+1/2B), (1/2G+1/2B), ! (1/3R+1/3G), (1/3R+1/3B), (1/3G+1/3B) Etc., R, G, B are the three primary colors of color, assuming I is the total summed brightness value of each raster 24 200813394 • 'Color light thumbing enemy is produced by: / = [LPMxL6,ZiWx3] if 7^x3 &lt ;255 ? then R = Random[〇9 x3] ? i? e [〇? 255] else R = Random[〇, 255] ? 7? g [〇5 255] G = 3x1-R-Random[〇? 255 ] G g [〇? 255] 5 = 3χ/ — π — G , , 255]. 5. The three-dimensional contour measuring method using color raster sub-pixel positioning and single-screen switching of a single screen as described in claim 3, wherein the grating light is colored, and the color grating stripe is The production method is as follows: Define the highest color brightness as: Βη ξ Max{R, G, B) , Bn g [〇?255] Randomly select a allowable value and limit the maximum value of no value to 10,000/7 R - Randorr ^)^155\ if R > Bn,R = Bn _· Randomly select an f-value and limit the maximum value of C to 7 G = Random^), 255\ if G> Bn , G-Bn f The maximum value, if the value is 7, the value of Bewan can be a randomly selected value; if the maximum value of f and f is not 洳, then the value is Bn ·· 25 200813394 if{Max(R,G )=zBn,, B = Rand〇miQ, Bn, else B = Bn 6 three-dimensional contour reconstruction systems using 1-color raster sub-pixel positioning and single-screen sub-plane switching, including: • Technology device, system A grating light is emitted toward a workpiece to be tested. The grating light has a plurality of grid lines, and the contrast is the same. 柵光線在該待測工件上形成一光栅影像,其包括複數 色彩不同之條紋; 攝,IV裝置,係用以從該待測工件上擷取該光柵影 像; 一中央處理單元,其至少包括: 一中央處理器’係對該光栅影像進行影像分析、消 /除雜訊以及條紋細線化作業,制賴物㈣線分佈 析求得更精確之敢低/最高灰階分佈的落點,得 i· 到每-條紋細線化後之光栅影像中每一像素點,再利 用細線化條紋做拋物線曲線分佈擬合,求出條紋最大 之弓曲的程度,配合相位移技術以及相位重建得到該 待測工件之三維輪廓; j . 一顯示器’係與該中央處理器電性連接,該顯示器 至少具有兩種切換模式: [1]同時顯示一第一顯示部及一第二顯示部··可顯 示該彳又衫裝置欲投影之光柵/該攝影裝置擷取 之光栅影像;該第一顯示部至少可用於直接調 26 200813394 整該攝影裝置之焦距、光圈及景深; [2]以第二顯示部全螢幕顯示該光柵影像/三維輪 廓。 7 ·如申請專利範圍第6項所述之使用彩色光柵次像素定 位與單螢幕之子母畫面切換的三維輪廓重建系統,其 中: ’、 該投影裝置係為數位光源處理器; HI 該攝影裝置係為彩色感光耦合攝影機。 8 ·如中請專利範圍第6項所述之使用彩色光栅次像素定 位與單螢幕之子母晝面切換的三維輪廊重建系統,立 又包括: 〃 …、一 71丁个, 栅衫像的條紋予以不同的RGB色彩組合; »· 9 一彩色光柵序號讀取模組:係用以正^讀取各彩色 條紋,位置,並重建出待測工件正確之三維輪廊:. 二,整模組’係用以產生並調整欲投影光栅之拇線 轉被又及明暗對比度,以供該投影裝置投影出光 綠0 2請專利範㈣6項所述之使㈣色光栅次像素定 中轉早f幕之子母晝面切換的三維輪廓重建系統,其 人不‘ 包括衣焦透鏡,其配 同尺寸大小之光柵光線。控細又影褒置輸出不 27The grating light forms a raster image on the workpiece to be tested, and includes a plurality of stripes of different colors; a camera, an IV device for capturing the raster image from the workpiece to be tested; and a central processing unit comprising: A central processing unit performs image analysis, erasing/de-noising noise, and stripe thinning on the raster image, and the line distribution of the object (four) is more accurately determined to be lower and the highest gray scale distribution is obtained. · To each pixel point in the raster image after each stripe thinning, and then use the thin lined stripe to do the parabolic curve distribution fitting, find the degree of the maximum bow of the stripe, and match the phase shift technique and phase reconstruction to obtain the test a three-dimensional contour of the workpiece; j. A display is electrically connected to the central processing unit, and the display has at least two switching modes: [1] simultaneously displaying a first display portion and a second display portion. a raster image to be projected by the device and a raster image captured by the camera device; the first display portion can be used for at least a direct adjustment of the focal length and light of the camera device And depth; [2] In the second display unit to display the full screen raster image / three-dimensional contour. 7. A three-dimensional contour reconstruction system using color raster sub-pixel positioning and single screen picture switching as described in claim 6 wherein: ', the projection device is a digital light source processor; HI the camera device A color-sensing coupling camera. 8 · The three-dimensional corridor reconstruction system using the color raster sub-pixel positioning and the single-screen switching of the single screen as described in the sixth paragraph of the patent scope includes: 〃 ..., a 71-inch, a shirt-like image Stripes are given different RGB color combinations; »· 9 A color raster number reading module: used to read each color stripe, position, and reconstruct the correct three-dimensional wheel gallery of the workpiece to be tested: The group 'is used to generate and adjust the thumb line of the raster to be projected and the contrast of the light and dark, for the projection device to project the light green 0 2, the patent specification (4), 6 items, so that the (four) color grating sub-pixels are fixed in the middle and early f The three-dimensional contour reconstruction system of the child's face switching is not included in the lens, which is matched with the grating light of the same size. Control fine and shadow output is not 27
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TWI479134B (en) * 2013-04-26 2015-04-01 Chroma Ate Inc Two - dimensional timing type colorimeter detection method and the colorimeter
TWI490457B (en) * 2010-10-20 2015-07-01 Hon Hai Prec Ind Co Ltd System and method for detecting light intensity

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TWI414748B (en) * 2009-01-23 2013-11-11 Univ Nat Taipei Technology Method for simultaneuos hue phase-shifting and system for 3-d surface profilometry using the same

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI490457B (en) * 2010-10-20 2015-07-01 Hon Hai Prec Ind Co Ltd System and method for detecting light intensity
TWI479134B (en) * 2013-04-26 2015-04-01 Chroma Ate Inc Two - dimensional timing type colorimeter detection method and the colorimeter

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