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TW200801491A - System for testing a flat panel display device and method thereof - Google Patents

System for testing a flat panel display device and method thereof

Info

Publication number
TW200801491A
TW200801491A TW096105771A TW96105771A TW200801491A TW 200801491 A TW200801491 A TW 200801491A TW 096105771 A TW096105771 A TW 096105771A TW 96105771 A TW96105771 A TW 96105771A TW 200801491 A TW200801491 A TW 200801491A
Authority
TW
Taiwan
Prior art keywords
testing
defect
measuring
measuring apparatus
display panel
Prior art date
Application number
TW096105771A
Other languages
English (en)
Other versions
TWI418778B (zh
Inventor
Byung-Uk Kim
Ki-Beom Lee
Yong-Woo Kim
Mi-Sun Park
Jin-Sup Hong
Wy-Yong Kim
Original Assignee
Dongjin Semichem Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020060014568A external-priority patent/KR100783309B1/ko
Application filed by Dongjin Semichem Co Ltd filed Critical Dongjin Semichem Co Ltd
Priority claimed from KR1020070015691A external-priority patent/KR101391448B1/ko
Publication of TW200801491A publication Critical patent/TW200801491A/zh
Application granted granted Critical
Publication of TWI418778B publication Critical patent/TWI418778B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW096105771A 2006-02-15 2007-02-15 用以測試平面顯示裝置之系統及其方法 TWI418778B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020060014568A KR100783309B1 (ko) 2006-02-15 2006-02-15 평판 표시 장치의 검사 시스템
KR1020070015691A KR101391448B1 (ko) 2007-02-15 2007-02-15 평판 표시 장치의 검사시스템 및 검사방법

Publications (2)

Publication Number Publication Date
TW200801491A true TW200801491A (en) 2008-01-01
TWI418778B TWI418778B (zh) 2013-12-11

Family

ID=38371758

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096105771A TWI418778B (zh) 2006-02-15 2007-02-15 用以測試平面顯示裝置之系統及其方法

Country Status (4)

Country Link
US (1) US7859274B2 (zh)
JP (1) JP5260320B2 (zh)
TW (1) TWI418778B (zh)
WO (1) WO2007094627A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI391649B (zh) * 2008-09-16 2013-04-01 Au Optronics Corp 面板缺陷之點燈測試機台及面板缺陷之點燈測試方法
TWI391665B (zh) * 2008-08-04 2013-04-01 Top Eng Co Ltd 陣列測試器

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CN102216888A (zh) * 2008-11-21 2011-10-12 夏普株式会社 二维传感器阵列、显示装置、电子设备
KR101279656B1 (ko) * 2008-12-22 2013-06-27 엘지디스플레이 주식회사 프로브 검사장치
WO2011019974A2 (en) * 2009-08-14 2011-02-17 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method and system for aligning color filter array
JP4726983B2 (ja) * 2009-10-30 2011-07-20 住友化学株式会社 欠陥検査システム、並びに、それに用いる、欠陥検査用撮影装置、欠陥検査用画像処理装置、欠陥検査用画像処理プログラム、記録媒体、および欠陥検査用画像処理方法
KR101575803B1 (ko) * 2010-01-15 2015-12-09 삼성전자 주식회사 저조도 환경에서의 고감도 영상 생성 방법 및 그 장치
KR100998484B1 (ko) * 2010-07-07 2010-12-06 레이져라이팅(주) 레이저 빔의 광경로 거리가 일정한 도광판 레이저 가공장치
US8995747B2 (en) 2010-07-29 2015-03-31 Sharp Laboratories Of America, Inc. Methods, systems and apparatus for defect detection and classification
US8331650B2 (en) 2010-07-29 2012-12-11 Sharp Laboratories Of America, Inc. Methods, systems and apparatus for defect detection
AU2013203316B2 (en) * 2012-09-25 2015-09-24 Angel Group Co., Ltd. Card shoe apparatus and table game system
CN102929007B (zh) * 2012-10-19 2015-06-03 深圳市华星光电技术有限公司 测量设备及其控制方法
US8867817B1 (en) * 2012-10-29 2014-10-21 Amazon Technologies, Inc. Display analysis using scanned images
TWI499788B (zh) * 2013-04-29 2015-09-11 E Ink Holdings Inc 畫素陣列基板檢測方法及畫素陣列基板檢測裝置
KR101697071B1 (ko) * 2014-04-18 2017-01-17 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
CN105093574B (zh) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 显示面板检测台
KR101777290B1 (ko) * 2016-01-12 2017-09-14 에스엔유 프리시젼 주식회사 광학측정장치의 데이터 평가장치 및 데이터 평가방법
US10401145B2 (en) * 2016-06-13 2019-09-03 Carl Zeiss Industrielle Messtechnik Gmbh Method for calibrating an optical arrangement
KR102669154B1 (ko) 2016-11-30 2024-05-28 삼성디스플레이 주식회사 패터닝 장치 및 이의 구동 방법
KR102667359B1 (ko) * 2018-12-04 2024-05-21 삼성디스플레이 주식회사 검사 장치 및 이의 구동 방법
CN117055249B (zh) * 2023-08-30 2024-02-13 安徽创显电子科技有限公司 一种液晶显示屏组装加工线抽样质检分析系统

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US5586058A (en) * 1990-12-04 1996-12-17 Orbot Instruments Ltd. Apparatus and method for inspection of a patterned object by comparison thereof to a reference
JPH06273342A (ja) * 1993-03-18 1994-09-30 Glory Ltd 液晶表示装置の欠陥検出装置
JP3297950B2 (ja) * 1993-07-13 2002-07-02 シャープ株式会社 平面型表示パネル検査装置
JPH0926398A (ja) * 1995-07-11 1997-01-28 Advantest Corp 画像表示器の面積欠陥検査方法とその装置
JPH11132750A (ja) * 1997-10-30 1999-05-21 Matsushita Electric Ind Co Ltd 点欠陥検出装置及び方法
JP2000171504A (ja) * 1998-12-04 2000-06-23 Nec Corp 半導体評価装置
US6362820B1 (en) * 1999-06-24 2002-03-26 Microsoft Corporation Quadric metric for simplifying meshes with appearance attributes
JP2001124661A (ja) * 1999-10-25 2001-05-11 Horiba Ltd 平面表示装置の品位検査方法およびその品位検査装置
JP2001174772A (ja) * 1999-12-14 2001-06-29 Sony Corp 液晶表示パネルの不良解析方法
JP3468755B2 (ja) * 2001-03-05 2003-11-17 石川島播磨重工業株式会社 液晶駆動基板の検査装置
JP2003149081A (ja) * 2001-11-08 2003-05-21 Matsushita Electric Ind Co Ltd 表示装置の検査方法及びそれを用いた検査装置
US20040086166A1 (en) * 2002-11-01 2004-05-06 Photon Dynamics, Inc. Method and apparatus for flat patterned media inspection
US7308157B2 (en) * 2003-02-03 2007-12-11 Photon Dynamics, Inc. Method and apparatus for optical inspection of a display
JP2004347363A (ja) * 2003-05-20 2004-12-09 Utechzone Co Ltd 輝度分布の紛乱程度で電子式ディスプレイの表示品質を検査する方法
JP2005181040A (ja) * 2003-12-18 2005-07-07 Seiko Epson Corp 表示パネルの欠陥検出方法及びその検出装置並びに表示パネルの製造方法
US7468611B2 (en) * 2006-10-20 2008-12-23 Photon Dynamics, Inc. Continuous linear scanning of large flat panel media

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI391665B (zh) * 2008-08-04 2013-04-01 Top Eng Co Ltd 陣列測試器
TWI391649B (zh) * 2008-09-16 2013-04-01 Au Optronics Corp 面板缺陷之點燈測試機台及面板缺陷之點燈測試方法

Also Published As

Publication number Publication date
WO2007094627A1 (en) 2007-08-23
TWI418778B (zh) 2013-12-11
US20090224777A1 (en) 2009-09-10
JP2009527018A (ja) 2009-07-23
JP5260320B2 (ja) 2013-08-14
US7859274B2 (en) 2010-12-28

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees