TW200741172A - A measuring apparatus for the thin film thickness using interference technology of laser - Google Patents
A measuring apparatus for the thin film thickness using interference technology of laserInfo
- Publication number
- TW200741172A TW200741172A TW095114333A TW95114333A TW200741172A TW 200741172 A TW200741172 A TW 200741172A TW 095114333 A TW095114333 A TW 095114333A TW 95114333 A TW95114333 A TW 95114333A TW 200741172 A TW200741172 A TW 200741172A
- Authority
- TW
- Taiwan
- Prior art keywords
- thin film
- measuring apparatus
- film thickness
- laser
- interference technology
- Prior art date
Links
- 239000010409 thin film Substances 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 abstract 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
The present invention discloses a measuring apparatus for the thin film thickness, comprising a laser source, a first lens, a second lens, a device-under-test (DUT) unit and a CCD camera. The measuring apparatus according to the present invention has several advantages, such as ease fabrication, ease operation, low cost and simultaneously thickness observation of the overall of thin film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95114333A TWI290614B (en) | 2006-04-21 | 2006-04-21 | A measuring apparatus for the thin film thickness using interference technology of laser |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95114333A TWI290614B (en) | 2006-04-21 | 2006-04-21 | A measuring apparatus for the thin film thickness using interference technology of laser |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200741172A true TW200741172A (en) | 2007-11-01 |
TWI290614B TWI290614B (en) | 2007-12-01 |
Family
ID=39327537
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95114333A TWI290614B (en) | 2006-04-21 | 2006-04-21 | A measuring apparatus for the thin film thickness using interference technology of laser |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI290614B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI464054B (en) * | 2010-12-06 | 2014-12-11 | Koa Glass Co Ltd | Decorative glass container and method for producing decorative glass container |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5660026B2 (en) | 2011-12-28 | 2015-01-28 | 信越半導体株式会社 | Film thickness distribution measurement method |
WO2013186879A1 (en) * | 2012-06-13 | 2013-12-19 | 株式会社シンクロン | Device for measuring film thickness and device for forming film |
TWI486550B (en) * | 2014-01-20 | 2015-06-01 | Nat Univ Tsing Hua | An Optical Interferometry Based On-Line Real-Time Thickness Measurement Apparatus and Method Thereof |
TWI509215B (en) * | 2015-07-02 | 2015-11-21 | Ta Jen Kuo | A high accuracy apparatus and method of photoelectric glass substrate in real-time identification |
JP7202106B2 (en) * | 2018-08-31 | 2023-01-11 | 株式会社Screenホールディングス | Substrate processing method and substrate processing apparatus |
-
2006
- 2006-04-21 TW TW95114333A patent/TWI290614B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI464054B (en) * | 2010-12-06 | 2014-12-11 | Koa Glass Co Ltd | Decorative glass container and method for producing decorative glass container |
Also Published As
Publication number | Publication date |
---|---|
TWI290614B (en) | 2007-12-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |