TW200736628A - IC testing machine capable of simultaneously testing a plurality of integrated circuits - Google Patents
IC testing machine capable of simultaneously testing a plurality of integrated circuitsInfo
- Publication number
- TW200736628A TW200736628A TW095109724A TW95109724A TW200736628A TW 200736628 A TW200736628 A TW 200736628A TW 095109724 A TW095109724 A TW 095109724A TW 95109724 A TW95109724 A TW 95109724A TW 200736628 A TW200736628 A TW 200736628A
- Authority
- TW
- Taiwan
- Prior art keywords
- testing
- integrated circuits
- carrying fixtures
- transporting mechanism
- respective carrying
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
An IC testing machine capable of simultaneously testing a plurality of integrated circuits comprises: a feeding tray, a plurality of collection trays, a first transporting mechanism, a second transporting mechanism, a testing ports, a plurality of carrying fixtures as well as a rail conveying mechanism, wherein the first transporting mechanism can pass the untested integrated circuit of feeding tray onto the respective carrying fixtures such that said respective carrying fixtures can simultaneously hold a plurality of untested integrated circuits, and by using the rail conveying mechanism, the respective carrying fixtures can be directly transported into the testing ports so as to have a simultaneous testing process of multiple integrated circuits, thereafter, the respective carrying fixtures will be moved out of the testing ports, by using the second transporting mechanism, the tested integrated circuits of respective carrying fixtures will be classified and placed onto the respective collection trays, thereby enabling to decrease the testing time of IC pick-and-place replacement so as to further enhance the IC testing efficiency.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95109724A TWI299406B (en) | 2006-03-21 | 2006-03-21 | Ic testing machine capable of simultaneously testing a plurality of integrated circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95109724A TWI299406B (en) | 2006-03-21 | 2006-03-21 | Ic testing machine capable of simultaneously testing a plurality of integrated circuits |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200736628A true TW200736628A (en) | 2007-10-01 |
| TWI299406B TWI299406B (en) | 2008-08-01 |
Family
ID=45069674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95109724A TWI299406B (en) | 2006-03-21 | 2006-03-21 | Ic testing machine capable of simultaneously testing a plurality of integrated circuits |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI299406B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110010536A (en) * | 2019-03-04 | 2019-07-12 | 智优科技股份有限公司 | Wafer Pick & Place Equipment |
| CN111744804A (en) * | 2020-07-08 | 2020-10-09 | 天津金海通自动化设备制造有限公司 | A transfer mechanism and electronic component testing and sorting machine |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI394172B (en) * | 2008-12-19 | 2013-04-21 | Hon Tech Inc | Automatic test sorting machine |
-
2006
- 2006-03-21 TW TW95109724A patent/TWI299406B/en active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110010536A (en) * | 2019-03-04 | 2019-07-12 | 智优科技股份有限公司 | Wafer Pick & Place Equipment |
| CN110010536B (en) * | 2019-03-04 | 2023-05-23 | 智优科技股份有限公司 | Wafer taking and placing equipment |
| CN111744804A (en) * | 2020-07-08 | 2020-10-09 | 天津金海通自动化设备制造有限公司 | A transfer mechanism and electronic component testing and sorting machine |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI299406B (en) | 2008-08-01 |
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