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TW200731447A - Bonding means and bonding apparatus for supporting plate, and bonding method for supporting plate - Google Patents

Bonding means and bonding apparatus for supporting plate, and bonding method for supporting plate

Info

Publication number
TW200731447A
TW200731447A TW095145191A TW95145191A TW200731447A TW 200731447 A TW200731447 A TW 200731447A TW 095145191 A TW095145191 A TW 095145191A TW 95145191 A TW95145191 A TW 95145191A TW 200731447 A TW200731447 A TW 200731447A
Authority
TW
Taiwan
Prior art keywords
supporting plate
bonding
semiconductor wafer
plate
alignment members
Prior art date
Application number
TW095145191A
Other languages
English (en)
Other versions
TWI323923B (zh
Inventor
Akihiko Nakamura
Atsushi Miyanari
Yoshihiro Inao
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Publication of TW200731447A publication Critical patent/TW200731447A/zh
Application granted granted Critical
Publication of TWI323923B publication Critical patent/TWI323923B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B38/00Ancillary operations in connection with laminating processes
    • B32B38/18Handling of layers or the laminate
    • B32B38/1825Handling of layers or the laminate characterised by the control or constructional features of devices for tensioning, stretching or registration
    • B32B38/1833Positioning, e.g. registration or centering
    • B32B38/1841Positioning, e.g. registration or centering during laying up
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • H01L21/52Mounting semiconductor bodies in containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B38/00Ancillary operations in connection with laminating processes
    • B32B38/18Handling of layers or the laminate
    • B32B2038/1891Using a robot for handling the layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2309/00Parameters for the laminating or treatment process; Apparatus details
    • B32B2309/60In a particular environment
    • B32B2309/68Vacuum
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/14Semiconductor wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/0046Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by constructional aspects of the apparatus
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/17Surface bonding means and/or assemblymeans with work feeding or handling means

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
TW095145191A 2005-12-06 2006-12-05 Bonding means and bonding apparatus for supporting plate, and bonding method for supporting plate TW200731447A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005352594A JP4781802B2 (ja) 2005-12-06 2005-12-06 サポートプレートの貼り合わせ手段及び貼り合わせ装置、並びにサポートプレートの貼り合わせ方法

Publications (2)

Publication Number Publication Date
TW200731447A true TW200731447A (en) 2007-08-16
TWI323923B TWI323923B (zh) 2010-04-21

Family

ID=38117556

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095145191A TW200731447A (en) 2005-12-06 2006-12-05 Bonding means and bonding apparatus for supporting plate, and bonding method for supporting plate

Country Status (4)

Country Link
US (2) US8136564B2 (zh)
JP (1) JP4781802B2 (zh)
KR (1) KR100838460B1 (zh)
TW (1) TW200731447A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI573662B (zh) * 2011-03-25 2017-03-11 不二越機械工業股份有限公司 工作件之貼附方法以及貼附裝置

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KR20100034450A (ko) * 2008-09-24 2010-04-01 삼성전자주식회사 기판접합장치
JP5149207B2 (ja) * 2009-01-13 2013-02-20 株式会社荏原製作所 基板搭載装置
WO2010121068A2 (en) * 2009-04-16 2010-10-21 Suss Microtec, Inc. Improved apparatus for temporary wafer bonding and debonding
JP5572575B2 (ja) * 2010-05-12 2014-08-13 東京エレクトロン株式会社 基板位置決め装置、基板処理装置、基板位置決め方法及びプログラムを記録した記憶媒体
JP5449239B2 (ja) * 2010-05-12 2014-03-19 東京エレクトロン株式会社 基板処理装置、基板処理方法及びプログラムを記録した記憶媒体
SG179299A1 (en) * 2010-09-13 2012-04-27 Trimech Technology Pte Ltd A display panel substrate assembly, an apparatus and a method for forming a display panel substrate assembly
DE102011113292A1 (de) * 2011-09-05 2013-03-07 Schmid Vacuum Technology Gmbh Vakuumdurchführung und Vakuumbeschichtungsvorrichtung mit Vakuumdurchführungen
JP5427856B2 (ja) * 2011-09-07 2014-02-26 東京エレクトロン株式会社 接合方法、プログラム、コンピュータ記憶媒体及び接合システム
JP5913914B2 (ja) * 2011-11-08 2016-04-27 東京応化工業株式会社 基板処理装置及び基板処理方法
JP6055597B2 (ja) * 2012-02-09 2016-12-27 東京応化工業株式会社 貼付方法及び貼付装置
JP5639617B2 (ja) * 2012-05-11 2014-12-10 東京応化工業株式会社 貼付装置および貼付方法
JP6001934B2 (ja) * 2012-06-25 2016-10-05 東京応化工業株式会社 重ね合わせ装置および重ね合わせ方法
JP6088835B2 (ja) 2012-09-28 2017-03-01 東京応化工業株式会社 貼合装置および貼り合わせ方法
WO2014157082A1 (ja) 2013-03-29 2014-10-02 東京応化工業株式会社 貼付方法
CN103273719B (zh) * 2013-06-07 2015-09-09 无锡隆盛科技股份有限公司 氧传感器芯片叠压装置
JP5585689B2 (ja) * 2013-06-13 2014-09-10 株式会社ニコン 基板ホルダおよび貼り合せ装置
JP6374680B2 (ja) * 2013-12-13 2018-08-15 東京応化工業株式会社 貼付方法
JP6942121B2 (ja) * 2015-10-15 2021-09-29 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 基板キャリアシステム
CN106739424B (zh) * 2015-11-20 2020-02-14 财团法人工业技术研究院 取下贴合装置及应用此装置的取下方法与贴合方法
JP6612670B2 (ja) * 2016-03-31 2019-11-27 東京応化工業株式会社 基板処理装置、及び、基板処理方法
US10730276B2 (en) * 2017-01-17 2020-08-04 Maven Optronics Co., Ltd. System and method for vacuum film lamination
CN108110096B (zh) * 2018-02-10 2024-09-06 江苏应材微机电科技有限公司 一种led生产设备用新型扩晶机
CN108711556B (zh) * 2018-05-25 2020-06-19 北京北方华创微电子装备有限公司 去气腔室以及去气方法
CN109473380A (zh) * 2018-10-26 2019-03-15 志圣科技(广州)有限公司 晶圆加工机台及其加工方法
CN111029292B (zh) * 2019-12-25 2022-08-02 山东天岳先进科技股份有限公司 一种晶锭的粘结分离装置及方法
KR102377036B1 (ko) * 2020-02-24 2022-03-22 피에스케이홀딩스 (주) 정렬 장치, 그리고 이를 포함하는 기판 처리 장치
JP6990800B1 (ja) * 2020-03-24 2022-01-14 株式会社日立ハイテク 真空処理装置
KR20220030454A (ko) 2020-09-01 2022-03-11 삼성전자주식회사 기판 정렬 장치 및 이를 구비하는 기판 본딩 설비
JP7578905B2 (ja) 2020-12-01 2024-11-07 ウシオ電機株式会社 Led素子及びその製造方法
CN113263820A (zh) * 2021-05-19 2021-08-17 曹健 一种复合结构铁粉芯胚体堆叠均匀压制装置
JP7580129B2 (ja) 2022-04-12 2024-11-11 Aiメカテック株式会社 基板重ね合わせ装置及び基板重ね合わせ方法

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JP3742000B2 (ja) * 2000-11-30 2006-02-01 富士通株式会社 プレス装置
JP2002192394A (ja) 2000-12-28 2002-07-10 Mitsubishi Gas Chem Co Inc 無機基板のプレス加工法およびプレス装置
US6808566B2 (en) * 2001-09-19 2004-10-26 Tokyo Electron Limited Reduced-pressure drying unit and coating film forming method
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JP2004165403A (ja) * 2002-11-13 2004-06-10 Ricoh Co Ltd アライメント接着方法およびアライメント接着装置
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI573662B (zh) * 2011-03-25 2017-03-11 不二越機械工業股份有限公司 工作件之貼附方法以及貼附裝置

Also Published As

Publication number Publication date
US8931535B2 (en) 2015-01-13
JP4781802B2 (ja) 2011-09-28
KR20070059994A (ko) 2007-06-12
KR100838460B1 (ko) 2008-06-16
US20120132359A1 (en) 2012-05-31
TWI323923B (zh) 2010-04-21
US20070125495A1 (en) 2007-06-07
JP2007158122A (ja) 2007-06-21
US8136564B2 (en) 2012-03-20

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