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TW200728728A - A test card for integrated circuit (1) - Google Patents

A test card for integrated circuit (1)

Info

Publication number
TW200728728A
TW200728728A TW095103555A TW95103555A TW200728728A TW 200728728 A TW200728728 A TW 200728728A TW 095103555 A TW095103555 A TW 095103555A TW 95103555 A TW95103555 A TW 95103555A TW 200728728 A TW200728728 A TW 200728728A
Authority
TW
Taiwan
Prior art keywords
integrated circuit
propping member
locking unit
test card
circuit board
Prior art date
Application number
TW095103555A
Other languages
Chinese (zh)
Other versions
TWI284739B (en
Inventor
hong-guang Fan
Shen-Yi Lin
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Priority to TW95103555A priority Critical patent/TWI284739B/en
Application granted granted Critical
Publication of TW200728728A publication Critical patent/TW200728728A/en
Publication of TWI284739B publication Critical patent/TWI284739B/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

A test card for integrated circuit (1) includes: a circuit board having signal contact points; a set of probe having a telecommunication transfer board and several probes that electrically connect to the signal contact points on the telecommunication transfer board; several plane maintaining components respectively having a propping member and a locking unit; each propping member respectively pass through the designated position of the circuit board and contacts the telecommunication transfer board with one of its ends; the locking unit is clamped at the other end of the propping member. Thus the levelness between the probe set and the circuit board may be maintained when the locking unit clamps the propping member.
TW95103555A 2006-01-27 2006-01-27 Test card of integrated circuit TWI284739B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95103555A TWI284739B (en) 2006-01-27 2006-01-27 Test card of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95103555A TWI284739B (en) 2006-01-27 2006-01-27 Test card of integrated circuit

Publications (2)

Publication Number Publication Date
TW200728728A true TW200728728A (en) 2007-08-01
TWI284739B TWI284739B (en) 2007-08-01

Family

ID=39445955

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95103555A TWI284739B (en) 2006-01-27 2006-01-27 Test card of integrated circuit

Country Status (1)

Country Link
TW (1) TWI284739B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579567B (en) * 2015-12-31 2017-04-21 鴻勁科技股份有限公司 Test stand and its application test equipment
TWI797004B (en) * 2022-04-29 2023-03-21 中華精測科技股份有限公司 Cantilever probe card and carrying seat thereof

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI409463B (en) * 2009-10-23 2013-09-21 King Yuan Electronics Co Ltd Probe card and structure reinforced test scoket therein
CN105004888B (en) * 2014-11-10 2017-11-24 成都振芯科技股份有限公司 A kind of adjustable integrated circuit measurement jig
CN116840526B (en) * 2023-09-01 2023-10-31 江苏协和电子股份有限公司 Needle head, PCB detection equipment using needle head and use method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI579567B (en) * 2015-12-31 2017-04-21 鴻勁科技股份有限公司 Test stand and its application test equipment
TWI797004B (en) * 2022-04-29 2023-03-21 中華精測科技股份有限公司 Cantilever probe card and carrying seat thereof

Also Published As

Publication number Publication date
TWI284739B (en) 2007-08-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees