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TW200722759A - Inspection fixture for printed wiring board - Google Patents

Inspection fixture for printed wiring board

Info

Publication number
TW200722759A
TW200722759A TW095119556A TW95119556A TW200722759A TW 200722759 A TW200722759 A TW 200722759A TW 095119556 A TW095119556 A TW 095119556A TW 95119556 A TW95119556 A TW 95119556A TW 200722759 A TW200722759 A TW 200722759A
Authority
TW
Taiwan
Prior art keywords
board
pin
printed wiring
wiring board
inspection fixture
Prior art date
Application number
TW095119556A
Other languages
Chinese (zh)
Other versions
TWI323785B (en
Inventor
Shinhichi Nakamura
Katsuaki Ishikawa
Hirokazu Tanaka
Original Assignee
Ohnishi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ohnishi Electronics Co Ltd filed Critical Ohnishi Electronics Co Ltd
Publication of TW200722759A publication Critical patent/TW200722759A/en
Application granted granted Critical
Publication of TWI323785B publication Critical patent/TWI323785B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

Provided is an inspection fixture for printed wiring board capable of holding probe pins as desired, changing probe pins easily, and coping with requirement of high-density arrangement for printed wiring board. The inspection fixture for printed wiring board includes a pin board 104 having an accommodating hole 118 and installation holes 122, 124, a protection board 106 having a guiding hole 128, a probe pin 130 inserted into the installation holes 122, 124 of the pin board 104 with a front end thereof passing through the guiding hole 128 of the protection board 106 and protruding to the outside, and a spring member accommodated within the accommodating hole 118 of the pin board 104. The pin board 104 includes a rubber board 134, while a resilient holding portion 138 of the rubber board 134 resiliently holding a peripheral surface of the probe pin 138.
TW095119556A 2005-12-12 2006-06-02 Inspection fixture for printed wiring board TWI323785B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005357718A JP4448086B2 (en) 2005-12-12 2005-12-12 Inspection jig for printed wiring boards

Publications (2)

Publication Number Publication Date
TW200722759A true TW200722759A (en) 2007-06-16
TWI323785B TWI323785B (en) 2010-04-21

Family

ID=38165570

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119556A TWI323785B (en) 2005-12-12 2006-06-02 Inspection fixture for printed wiring board

Country Status (4)

Country Link
JP (1) JP4448086B2 (en)
KR (1) KR100869720B1 (en)
CN (1) CN1982896B (en)
TW (1) TWI323785B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI383163B (en) * 2007-07-31 2013-01-21

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009016746A1 (en) * 2007-08-01 2009-02-05 Elia Co., Ltd. Contactor and interface assembly
JP4901811B2 (en) * 2008-05-27 2012-03-21 ミツイ精密株式会社 Electrical connector, camera lens and camera
JP5226429B2 (en) * 2008-08-25 2013-07-03 大西電子株式会社 Inspection jig for printed wiring boards
KR101522723B1 (en) * 2013-10-28 2015-06-01 김철군 A pin apparatus for test socket of device
CN105842490A (en) * 2016-05-25 2016-08-10 国家电网公司 Anti-damaged apparatus for relay protection terminal strip
SG11201908960XA (en) * 2017-03-30 2019-11-28 Nhk Spring Co Ltd Probe holder and probe unit
KR101911496B1 (en) * 2018-04-13 2018-12-28 황동원 Socket device for testing a semiconductor device
KR102413287B1 (en) * 2020-10-21 2022-06-27 주식회사 오킨스전자 Test socket
CN112305394B (en) * 2020-11-06 2021-04-27 法特迪精密科技（苏州）有限公司 Probe socket piece and probe assembly

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2532331B2 (en) * 1992-11-09 1996-09-11 日本発条株式会社 Conductive contact
JPH07294552A (en) * 1994-04-26 1995-11-10 Onishi Denshi Kk Continuity inspection jig for printed-wiring board
EP1113274B1 (en) * 1998-07-10 2005-01-12 Nhk Spring Co.Ltd. Conductive contact
JP4655392B2 (en) 2001-03-16 2011-03-23 イビデン株式会社 Continuity inspection jig and manufacturing method thereof
CN2502280Y (en) * 2001-08-13 2002-07-24 吴志成 Fixtures for Increased Test Density
JP4251855B2 (en) * 2002-11-19 2009-04-08 株式会社ヨコオ Manufacturing method of inspection jigs for high frequency and high speed devices
CN2677944Y (en) * 2003-12-03 2005-02-09 陈嘉隆 Fixtures for testing circuit boards

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI383163B (en) * 2007-07-31 2013-01-21

Also Published As

Publication number Publication date
TWI323785B (en) 2010-04-21
JP4448086B2 (en) 2010-04-07
CN1982896A (en) 2007-06-20
KR100869720B1 (en) 2008-11-21
JP2007163217A (en) 2007-06-28
CN1982896B (en) 2012-01-11
KR20070062396A (en) 2007-06-15

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees