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Application filed by Benq CorpfiledCriticalBenq Corp
Publication of TW200643704ApublicationCriticalpatent/TW200643704A/en
Monitoring And Testing Of Transmission In General
(AREA)
Tests Of Electronic Circuits
(AREA)
Abstract
A method for testing an IDE device via a cable connected to a station provided with a pass mode and a fail mode. The cable comprises a first connector and a second connector. The device has a signal terminal to receive the connectors and a jumper terminal with a master pin, a slave pin and a cable select pin to receive a jumper cap thereon. When the first connector is placed on the signal terminal, the station shows pass mode if the jumper cap is placed on one of the master pin and the cable select pin, and the station shows fail mode if the jumper cap is placed on the slave pin. When the second connector is placed on the signal terminal, the station shows pass mode if the jumper cap is placed on one of the slave pin and the cable select pin, and the station shows fail mode if the jumper cap is placed on the master pin.
TW094130399A2005-06-012005-09-05Testing apparatus and method thereof
TW200643704A
(en)