TW200638519A - Capacitor material for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate - Google Patents
Capacitor material for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrateInfo
- Publication number
- TW200638519A TW200638519A TW094147056A TW94147056A TW200638519A TW 200638519 A TW200638519 A TW 200638519A TW 094147056 A TW094147056 A TW 094147056A TW 94147056 A TW94147056 A TW 94147056A TW 200638519 A TW200638519 A TW 200638519A
- Authority
- TW
- Taiwan
- Prior art keywords
- circuitized
- circuitized substrate
- substrate
- making
- handling system
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
- H05K1/162—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor incorporating printed capacitors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49822—Multilayer substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16235—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a via metallisation of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00011—Not relevant to the scope of the group, the symbol of which is combined with the symbol of this group
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01012—Magnesium [Mg]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0102—Calcium [Ca]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01087—Francium [Fr]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0183—Dielectric layers
- H05K2201/0187—Dielectric layers with regions of different dielectrics in the same layer, e.g. in a printed capacitor for locally changing the dielectric properties
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0206—Materials
- H05K2201/0209—Inorganic, non-metallic particles
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/02—Fillers; Particles; Fibers; Reinforcement materials
- H05K2201/0203—Fillers and particles
- H05K2201/0242—Shape of an individual particle
- H05K2201/0257—Nanoparticles
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/09509—Blind vias, i.e. vias having one side closed
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/09718—Clearance holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0023—Etching of the substrate by chemical or physical means by exposure and development of a photosensitive insulating layer
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Inorganic Insulating Materials (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
A material for used as part of an internal capacitor within a circuitized substrate includes a polymer (e.g., a cycloaliphatic epoxy or phenoxy based) resin and a quantity of nano-powders of ferroelectric ceramic material (e.g., barium titanate) having a particle size substantially in the range of from about 0.01 microns to about 0.90 microns and a surface area for selected ones of said particles within the range of from about 2.0 to about 20 square meters per gram. A circuitized substrate adapted fro using such a material and capacitor therein and a method of making such a substrate are also provided. An electrical assembly (substrate and at least one electrical component) and an information handling system (e.g., personal computer) are also provided.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/031,085 US7541265B2 (en) | 2005-01-10 | 2005-01-10 | Capacitor material for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200638519A true TW200638519A (en) | 2006-11-01 |
Family
ID=36652454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094147056A TW200638519A (en) | 2005-01-10 | 2005-12-28 | Capacitor material for use in circuitized substrates, circuitized substrate utilizing same, method of making said circuitized substrate, and information handling system utilizing said circuitized substrate |
Country Status (4)
Country | Link |
---|---|
US (1) | US7541265B2 (en) |
JP (1) | JP2006210911A (en) |
CN (1) | CN1822358B (en) |
TW (1) | TW200638519A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102737834A (en) * | 2011-04-11 | 2012-10-17 | 佳邦科技股份有限公司 | Conductive structure with embedded electrodes, solid capacitor and manufacturing method thereof |
TWI447763B (en) * | 2011-03-16 | 2014-08-01 | Inpaq Technology Co Ltd | Conductive structure having an embedded electrode, solid capacitor having an embedded electrode and method of making the same |
TWI622109B (en) * | 2016-07-07 | 2018-04-21 | 欣興電子股份有限公司 | Package substrate and method of fabricating the same |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
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US8607445B1 (en) | 2005-01-10 | 2013-12-17 | Endicott Interconnect Technologies, Inc. | Substrate having internal capacitor and method of making same |
US8501575B2 (en) | 2005-01-10 | 2013-08-06 | Endicott Interconnect Technologies, Inc. | Method of forming multilayer capacitors in a printed circuit substrate |
US7449381B2 (en) * | 2005-07-05 | 2008-11-11 | Endicott Interconect Technologies, Inc. | Method of making a capacitive substrate for use as part of a larger circuitized substrate, method of making said circuitized substrate and method of making an information handling system including said circuitized substrate |
JP5050315B2 (en) * | 2005-03-04 | 2012-10-17 | 日立化成工業株式会社 | Gate insulating film and thin film transistor using the same |
US20060289976A1 (en) * | 2005-06-23 | 2006-12-28 | Intel Corporation | Pre-patterned thin film capacitor and method for embedding same in a package substrate |
US8929086B2 (en) * | 2005-09-26 | 2015-01-06 | International Business Machines Corporation | Gel package structural enhancement of compression system board connections |
US7930820B2 (en) * | 2005-09-26 | 2011-04-26 | International Business Machines Corporation | Method for structural enhancement of compression system board connections |
KR100691370B1 (en) * | 2005-10-12 | 2007-03-12 | 삼성전기주식회사 | Manufacturing Method of Thin Film Capacitor and Printed Circuit Board with Thin Film Capacitor |
JP4934325B2 (en) * | 2006-02-17 | 2012-05-16 | 株式会社フジクラ | Printed wiring board connection structure and printed wiring board connection method |
JP4503583B2 (en) * | 2006-12-15 | 2010-07-14 | 日本メクトロン株式会社 | Adhesive sheet for capacitor and method for manufacturing printed wiring board with built-in capacitor using the same |
CN101682989B (en) * | 2007-03-10 | 2016-10-26 | 新美亚通讯设备有限公司 | For the method manufacturing capacitive stack and electronic interconnection platform |
TWI338357B (en) * | 2008-07-17 | 2011-03-01 | Unimicron Technology Corp | Chip package carrier and manufacturing method thereof |
US7791897B2 (en) * | 2008-09-09 | 2010-09-07 | Endicott Interconnect Technologies, Inc. | Multi-layer embedded capacitance and resistance substrate core |
WO2011089936A1 (en) * | 2010-01-22 | 2011-07-28 | 日本電気株式会社 | Substrate with built-in functional element, and wiring substrate |
US8446707B1 (en) | 2011-10-10 | 2013-05-21 | Endicott Interconnect Technologies, Inc. | Circuitized substrate with low loss capacitive material and method of making same |
US9035194B2 (en) * | 2012-10-30 | 2015-05-19 | Intel Corporation | Circuit board with integrated passive devices |
US20140167900A1 (en) | 2012-12-14 | 2014-06-19 | Gregorio R. Murtagian | Surface-mount inductor structures for forming one or more inductors with substrate traces |
US9123735B2 (en) | 2013-07-31 | 2015-09-01 | Infineon Technologies Austria Ag | Semiconductor device with combined passive device on chip back side |
US9177831B2 (en) * | 2013-09-30 | 2015-11-03 | Intel Corporation | Die assembly on thin dielectric sheet |
KR20190058695A (en) * | 2014-02-21 | 2019-05-29 | 미쓰이금속광업주식회사 | Copper-clad laminate for forming integrated capacitor layer, multilayer printed wiring board, and production method for multilayer printed wiring board |
US9832865B2 (en) * | 2016-04-26 | 2017-11-28 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Methods and devices for providing increased routing flexibility in multi-layer printed circuit boards |
JP6380726B1 (en) * | 2016-12-21 | 2018-08-29 | 大日本印刷株式会社 | Penetration electrode substrate, semiconductor device, and method of manufacturing penetration electrode substrate |
US10317558B2 (en) * | 2017-03-14 | 2019-06-11 | Saudi Arabian Oil Company | EMU impulse antenna |
US10416335B2 (en) | 2017-03-14 | 2019-09-17 | Saudi Arabian Oil Company | EMU impulse antenna with controlled directionality and improved impedance matching |
US10330815B2 (en) | 2017-03-14 | 2019-06-25 | Saudi Arabian Oil Company | EMU impulse antenna for low frequency radio waves using giant dielectric and ferrite materials |
US10365393B2 (en) | 2017-11-07 | 2019-07-30 | Saudi Arabian Oil Company | Giant dielectric nanoparticles as high contrast agents for electromagnetic (EM) fluids imaging in an oil reservoir |
US11640934B2 (en) * | 2018-03-30 | 2023-05-02 | Intel Corporation | Lithographically defined vertical interconnect access (VIA) in dielectric pockets in a package substrate |
CN110843370B (en) * | 2018-07-30 | 2021-08-17 | 卡西欧计算机株式会社 | Computer-readable recording medium and method for forming conductive circuit pattern |
JP7455516B2 (en) * | 2019-03-29 | 2024-03-26 | Tdk株式会社 | Substrate with built-in element and its manufacturing method |
WO2021084981A1 (en) * | 2019-10-29 | 2021-05-06 | パナソニックIpマネジメント株式会社 | Paste composition, dielectric composition, capacitor, and method for manufacturing dielectric composition |
US11715688B2 (en) * | 2020-05-26 | 2023-08-01 | Qualcomm Incorporated | Variable dielectric constant materials in same layer of a package |
CN114702785B (en) * | 2022-03-22 | 2023-12-19 | 深圳市纽菲斯新材料科技有限公司 | Low-dielectric resin composition, copper foil, and preparation method and application thereof |
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US5162977A (en) * | 1991-08-27 | 1992-11-10 | Storage Technology Corporation | Printed circuit board having an integrated decoupling capacitive element |
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JP2701802B2 (en) | 1995-07-17 | 1998-01-21 | 日本電気株式会社 | Printed circuit board for bare chip mounting |
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US6426250B1 (en) * | 2001-05-24 | 2002-07-30 | Taiwan Semiconductor Manufacturing Company | High density stacked MIM capacitor structure |
US6577492B2 (en) | 2001-07-10 | 2003-06-10 | 3M Innovative Properties Company | Capacitor having epoxy dielectric layer cured with aminophenylfluorenes |
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TWI226101B (en) * | 2003-06-19 | 2005-01-01 | Advanced Semiconductor Eng | Build-up manufacturing process of IC substrate with embedded parallel capacitor |
-
2005
- 2005-01-10 US US11/031,085 patent/US7541265B2/en not_active Expired - Fee Related
- 2005-12-28 CN CN2005100974245A patent/CN1822358B/en not_active Expired - Fee Related
- 2005-12-28 TW TW094147056A patent/TW200638519A/en unknown
-
2006
- 2006-01-06 JP JP2006001082A patent/JP2006210911A/en not_active Withdrawn
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI447763B (en) * | 2011-03-16 | 2014-08-01 | Inpaq Technology Co Ltd | Conductive structure having an embedded electrode, solid capacitor having an embedded electrode and method of making the same |
CN102737834A (en) * | 2011-04-11 | 2012-10-17 | 佳邦科技股份有限公司 | Conductive structure with embedded electrodes, solid capacitor and manufacturing method thereof |
CN102737834B (en) * | 2011-04-11 | 2015-06-24 | 佳邦科技股份有限公司 | Conductive structure with embedded electrodes, solid capacitor and manufacturing method thereof |
TWI622109B (en) * | 2016-07-07 | 2018-04-21 | 欣興電子股份有限公司 | Package substrate and method of fabricating the same |
Also Published As
Publication number | Publication date |
---|---|
US20060151863A1 (en) | 2006-07-13 |
US7541265B2 (en) | 2009-06-02 |
CN1822358B (en) | 2012-07-04 |
JP2006210911A (en) | 2006-08-10 |
CN1822358A (en) | 2006-08-23 |
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