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TW200538875A - Coating composition of positive photosensitive polyimide - Google Patents

Coating composition of positive photosensitive polyimide Download PDF

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TW200538875A
TW200538875A TW93114164A TW93114164A TW200538875A TW 200538875 A TW200538875 A TW 200538875A TW 93114164 A TW93114164 A TW 93114164A TW 93114164 A TW93114164 A TW 93114164A TW 200538875 A TW200538875 A TW 200538875A
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TW93114164A
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TWI294559B (en
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Jyh-Long Cheng
Jinn-Shing King
Charng-Shing Lu
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Ind Tech Res Inst
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Abstract

A coating composition of positive photosensitive polyimide is disclosed, which includes an organic solvent and the following components dissolved in the organic solvent: (a) a polyimide having a phenolic hydroxyl group or carboxyl group at the end of a principal chain of the polymer; (b) a compound having a phenolic hydroxyl group; and (c) a quinonediazide sulfonate as a photosensitive agent. The amount of the components (b) and (c) are 1-50 parts by weight per 100 parts by weight the component (a) in the coating composition. A film of the coating composition can be developed with an alkaline aqueous solution, which has a high photosensitivity, excellent resolution, low post-cure temperature, high film residual rate in thickness, and a pattern having a tapered-angle at the cross section. The coating solution can be used for forming an insulating layer in displays or in other suitable applications.

Description

200538875 玖、發明說明: 【發明所屬之技術領域】 本發明係關於一種正型光敏感性聚醯亞胺塗佈組合 物,其可用於形成一顯示器之絕緣層。 【先前技術】 聚醯亞胺(polyimide,PI)由於具有優異的熱安定性及 良好的機械,電氣及化學性質,被廣泛地應用於半導體及 顯示器產業,例如1C晶片保護膜,晶片級封裝(Chip scaie package,CSP)及顯示器上的絕緣層(insuiator)等。由於使用 光敏感性聚醯亞胺(PSPI)可簡化製程、降低成本而且可提 高產品良率,所以使用PSPI已是一種趨勢。 正型光敏感性聚醯亞胺的相關文獻非常多,但大多為 聚醢亞胺之前驅物如聚醢胺酸酯(p〇lyarnic acid ester),如 US 6329110、US 6291619、US 6232032 及 US 5858584 等 專利中所揭示。聚醯胺酸酯在顯影後的圖案為標準矩形, 但顯示器中絕緣層的需求為截面呈漸窄(tapere(J_angle μ the cross section)的圖形,且聚醯胺酸酯最後還需以35〇〇c 高溫進行亞醯胺化(imidized ),與低於250。(:的製程需求 相衝突。因此以聚醯胺酸酯所製成的PSPI並不適用。另外200538875 (1) Description of the invention: [Technical field to which the invention belongs] The present invention relates to a positive photosensitive polyimide coating composition, which can be used to form an insulating layer of a display. [Prior technology] Polyimide (PI) is widely used in the semiconductor and display industries due to its excellent thermal stability and good mechanical, electrical, and chemical properties, such as 1C wafer protection films, wafer-level packaging ( Chip scaie package (CSP) and the insulation layer (insuiator) on the display. The use of light-sensitive polyimide (PSPI) has become a trend because it can simplify the process, reduce costs, and increase product yield. Positive light-sensitive polyimide has a lot of related literatures, but most of them are precursors of polyimide such as polyarnic acid esters, such as US 6329110, US 6291619, US 6232032 and US 5858584 and other patents. The pattern of the polyurethane after development is a standard rectangle, but the insulation layer in the display needs a tapere (J_angle μ the cross section) cross-section, and the final polyurethane needs to be 35 °. 〇c Imidized at a high temperature, which conflicts with process requirements below 250. (: PSPI made with polyamidate is not suitable. In addition,

有已亞醯胺化(imidized)的 PSPI 如 US 6627377、US 5441845、US 5573 886等專利所揭示,其硬烤溫度雖然可 以較低,但其普遍都是可溶型的PI,故其耐溶劑性都普遍 較差,且需用高濃度的鹼性顯影液方能顯影,故其實用性 200538875 較低。There are imidized PSPI such as US 6627377, US 5441845, US 5573 886 and other patents. Although the hard baking temperature can be lower, it is generally soluble PI, so it is solvent resistant. The performance is generally poor, and high-concentration alkaline developing solution is required to develop, so its practicality 200538875 is low.

Masao Tomikawa 等人於 Journai 〇f ph〇t〇p〇lymerMasao Tomikawa et al. In Journai 〇f ph〇t〇p〇lymer

Science and Technology,2002,1 5,205〜208、US 6593043 及US 6524764揭示在主鏈導入末端基為酚基的聚醯胺酸酯 及加入具有紛基(phenolic hydroxyl group)之化合物當作交 聯劑(crosslinking agent),可使圖案有截面呈漸窄 (tapered_angle at the cross section)的效果,但其聚醯胺酸 酯的主結構在亞醯胺化(imidized )時仍是需要高溫才能確 保其亞醯胺化完全。在US 6524764實施例6-13中有指出 在聚醯胺酸酯轉化為聚醯亞胺時會造成收縮(shrinkage ), 故聚醯胺酸酯所組成的PSPI其膜厚保持率也較低(66%), 其合成步驟亦較複雜。 【發明内容】 本發明的一主要目的在於提出一種新型的正型光敏感 性聚醯亞胺塗佈組合物,合成步驟簡單,可用鹼性水溶液 在短時間内顯影完成,具有高感度,良好的解析度,低的 硬烤溫度,高膜厚保持率,且在硬化後其圖案具有截面呈 漸乍(tapered-angle at the cross section)的形狀。本發明的 塗佈組合物在室溫下具有良好的儲存性。 本發明的正型光敏感性聚醯亞胺塗佈組合物包含一有 機溶劑及溶於該有機溶劑中的聚醯亞胺,其主鏈末端具 有紛基(Phen〇Hc hydroxyl group)或羧基(carb〇xyl g UP) (b)具有紛基(phen〇Hc hydroxyl group)之化合物, 200538875 及(c)作為感光劑的g昆疊氮石黃酸鹽(quinonediazide sulfonate),其中相對於每一百重量份的成分(a),成分(b) 的用量為1-50重量份,較佳的5-25重量份,及成分(c)的 用量為1-50重量份,較佳的5-25重量份。 較佳的5-25,該聚醯亞胺具有下列式(1)或(2)的構造·· Γ 〇 0Science and Technology, 2002, 15,205 ~ 208, US 6593043 and US 6524764 disclose the introduction of polyamino esters with phenolic groups in the main chain and the addition of compounds with phenolic hydroxyl groups as crosslinks Crosslinking agent can make the pattern tapered_angle at the cross section, but its main structure of polyamic acid ester still needs high temperature to ensure its imidization. The imidization is complete. In US 6524764 Example 6-13, it is pointed out that the shrinkage (shrinkage) will be caused when the polyamidate is converted into polyamidoimide, so the PSPI composed of polyamidate has a lower film thickness retention rate ( 66%), and its synthetic steps are more complicated. [Summary of the Invention] A main object of the present invention is to propose a new type of positive light-sensitive polyfluorene imide coating composition. The synthesis step is simple, and it can be developed in a short time using an alkaline aqueous solution. It has high sensitivity and good Resolution, low hard baking temperature, high film thickness retention, and its pattern has a tapered-angle at the cross section after hardening. The coating composition of the present invention has good storage properties at room temperature. The positive photosensitivity polyfluorene imide coating composition of the present invention comprises an organic solvent and polyfluorene imide dissolved in the organic solvent, and the main chain terminal has a phenoxy group or a carboxyl group ( carb〇xyl g UP) (b) a compound having a phenoHc hydroxyl group, 200538875 and (c) quinonediazide sulfonate as a photosensitizer, in which The amount of component (a), the amount of component (b) is 1-50 parts by weight, preferably 5-25 parts by weight, and the amount of component (c) is 1-50 parts by weight, preferably 5-25 Parts by weight. Preferably, 5-25, the polyfluoreneimide has the structure of the following formula (1) or (2) ... Γ 〇 0

式(1)及(2)中11為10_600的整數,Ari為四價有機基團, Αι*2為一至四價有機基團,An為二價芳基,ri為一 〇H基 或COOH基。In the formulae (1) and (2), 11 is an integer of 10 to 600, Ari is a tetravalent organic group, A ** 2 is a monovalent to tetravalent organic group, An is a divalent aromatic group, and ri is a 10H group or a COOH group. .

較佳的’ Ar3為A better ’Ar3 is

較佳的’ Aq為 7 200538875A better ‘Aq is 7 200538875

較佳的,其中Ar2為Preferably, Ar2 is

0¾ I -H6C3-^i-〇-i CH3 LCH30¾ I -H6C3- ^ i-〇-i CH3 LCH3

或擎~Xr<P> 其中m為1-20的整數,及Xi為 8 200538875 -ο—,一s—,一c(cf3)2—,c(ch3)2 — -CH,-, -S〇2-, ^hco-?Or engine ~ Xr < P > where m is an integer from 1-20, and Xi is 8 200538875 -ο—, one s—, one c (cf3) 2—, c (ch3) 2 — -CH,-, -S 〇2-, ^ hco-?

其中m為1-20的整數,Z為H或甲基。 較佳的,該成分(b)之具有酚基(phenolic hydroxyl group)化合物具有下列構造:Where m is an integer from 1 to 20 and Z is H or methyl. Preferably, the phenolic hydroxyl group compound of the component (b) has the following structure:

其中R3至R9為H、-OH基、CVCm烷基或C4_C2〇環脂基, 及z為0-5的整數。更佳的,該成分(1^)為: 9 200538875Wherein R3 to R9 are H, -OH group, CVCm alkyl group or C4-C20 cycloaliphatic group, and z is an integer of 0-5. More preferably, the component (1 ^) is: 9 200538875

BisP-B OH , H丨BisP-B OH, H 丨

Bis-FBis-F

or

較佳的,該成分(C)之感光劑具有下列結構:Preferably, the photosensitizer of the component (C) has the following structure:

CH3CH3

CFsCFs

CF3CF3

ODOD

10 200538875 其中D為氫, ο ο10 200538875 where D is hydrogen, ο ο

n2 且D不全為氫。n2 and D are not all hydrogen.

S〇2S〇2

車父佳的’該成分(a),(b)及(c)的重量和佔該組合物全部 重量的5-50%。Che Fujia's weight of the ingredients (a), (b) and (c) is 5-50% of the total weight of the composition.

較佳的’該有機溶劑為N-曱基·2-σ比略燒酮、γ-丁内酯、 或乳酸乙酯(ethyl lactate)。 【實施方式】 聚醯亞胺的合成步驟為將適量的二胺單體與二酸酐單 體溶於一合適的有機溶劑例如N-曱基-2-吡咯烷酮 (N-methyl_2_pyrrolidone;NMP)中,並於 0〜4°C 下劇烈攪拌Preferably, the organic solvent is N-fluorenyl · 2-sigmadol, γ-butyrolactone, or ethyl lactate. [Embodiment] The synthesis step of polyimide is to dissolve an appropriate amount of diamine monomer and dianhydride monomer in a suitable organic solvent such as N-methyl-2-pyrrolidone (NMP), and Stir vigorously at 0 ~ 4 ° C

4小時’再加入封端劑(endcapped agent)例如一具有紛基或 羧基的初級胺後攪拌4小時,加入二甲苯(Xylene)並加熱至 1 80°C使其迴流,約3小時後將其冷卻,得到主鏈末端具有 一盼基或魏基的聚酿亞胺(PI)溶液。本發明的光敏感性聚酿 亞胺(PSPI)溶液的配製為取適量的PI溶液,加入酚基 (phenolic hydroxyl group)交聯劑及感光劑,其中可加入 NMP、γ-丁内酯(γ-butyrolactone,GBL)、或乳酸乙酯(ethyl lactate)等溶劑將PSPI溶液稀釋至所需濃度,以備使用。 使用本發明的PSPI溶液的微影製程如下··(i)將PSPI 11 200538875 溶液利用旋轉塗布或其他方式塗布於適當的基材上;預 烤;(iii)曝光;(iv)顯影;及(v)硬烤,所得到的圖案為聚醯 亞胺。於上述步驟⑴中,將此正型PSPI溶液塗佈於一適當 基材上,而上述基材例如為一矽基材、玻璃或IT0玻璃。 而上述塗佈的方法如旋轉塗佈法(spin c〇ating)、滾輪塗佈 法(roller coating)、網版塗佈法(screen c〇ating)、淋幕塗佈 法(curtain coating)、浸鍍法(dip c〇ating)及喷灑塗佈法 (spray coating),但並不侷限於上述塗佈方法。於本發明較 佳實施例中,經塗佈所形成之薄膜先於7〇〜12〇<t下預烤 (prebake)數分鐘以蒸除其中之溶劑。接著將上述經塗佈之 基材於一光罩下經由光化射線曝光,上述之光化射線例如 為X光射線、電子束射線、紫外光射線、可見光射線或其 他可作為光化射線之光源等。 曝光後上述經塗佈之基材隨後藉由一鹼性水性顯影劑 *、、、貝〜,來洗去該薄膜的被曝光部份而得到一光阻圖形。上 述之鹼性水性顯影劑包含一鹼性水溶液,例如為無機鹼(氫 氧化鉀、氫氧化鈉)、一級胺(乙胺)、二級胺(二乙胺)、三 級胺(三乙胺)、或四級銨鹽(四甲基氫氧化銨 (teti*amethylamm〇niumhydr〇xide))的水溶液,其中以含有 四甲基氫氧化銨之水溶液為較佳。顯影可藉由浸泡、喷灑 或覆液或使用其他已知顯影方法而完成。上述經顯影後之 光阻圖形隨後經由去離子水清洗後,及在18〇〜4〇〇。〇下執 行硬烤程序(post-cure)將剩餘的溶劑趕乾,即得到具有截面 呈漸窄的聚醯亞胺圖形。 12 200538875 膜厚保持率(Film residual rate)的計算如下式: 膜厚保持率(%) = [(硬烤後的膜厚)/(預烤後的膜厚)] 本發明可藉下列實施例被進一步瞭解,該等實施例僅 用於說明,而非用於限制本發明範圍。 藥品4 hours' and then add an endcapped agent, such as a primary amine with a carbonyl or carboxyl group, and stir for 4 hours. Add Xylene and heat to 180 ° C to reflux. After about 3 hours, add After cooling, a polyimide (PI) solution having a pentyl group or a Wei group at the end of the main chain is obtained. The light sensitive polyimide (PSPI) solution of the present invention is prepared by taking an appropriate amount of a PI solution, adding a phenolic hydroxyl group crosslinking agent and a photosensitizer, and NMP, γ-butyrolactone (γ -Butyrolactone (GBL), or ethyl lactate and other solvents will dilute the PSPI solution to the required concentration for use. The lithography process using the PSPI solution of the present invention is as follows: (i) PSPI 11 200538875 solution is applied on a suitable substrate by spin coating or other methods; pre-baking; (iii) exposure; (iv) development; and ( v) Hard roast, the resulting pattern is polyimide. In the above step (i), the positive PSPI solution is coated on an appropriate substrate, and the substrate is, for example, a silicon substrate, glass, or ITO glass. The above coating methods include spin coating, roller coating, screen coating, curtain coating, and dipping. The plating method (dip coating) and the spray coating method are not limited to the above-mentioned coating methods. In a preferred embodiment of the present invention, the thin film formed by coating is prebake for several minutes at 70 to 120 ° t to evaporate the solvent therein. Then, the coated substrate is exposed to actinic rays under a photomask. The actinic rays are, for example, X-ray rays, electron beam rays, ultraviolet rays, visible rays, or other light sources that can be used as actinic rays. Wait. After the exposure, the coated substrate is washed with an alkaline aqueous developer *, ..., and then to expose the exposed portion of the film to obtain a photoresist pattern. The above-mentioned alkaline aqueous developer contains an alkaline aqueous solution, such as an inorganic base (potassium hydroxide, sodium hydroxide), a primary amine (ethylamine), a secondary amine (diethylamine), and a tertiary amine (triethylamine). ), Or an aqueous solution of a quaternary ammonium salt (teti * amethylammoniumhydroxide), of which an aqueous solution containing tetramethylammonium hydroxide is preferred. Development can be accomplished by soaking, spraying, or coating or using other known development methods. The developed photoresist pattern is then washed with deionized water, and is between 180 and 400. A post-cure was performed at 0 ° to drive the remaining solvent to dry, and a polyimide pattern with a tapered cross section was obtained. 12 200538875 The film thickness retention rate is calculated as follows: Film thickness retention rate (%) = [(film thickness after hard baking) / (film thickness after pre-baking)] The present invention can be borrowed from the following examples It is further understood that these examples are for illustration only and are not intended to limit the scope of the invention. drug

二(無水-偏苯三酸)乙二g旨(ethylene glycol bis(anhydro-trimellitate) (TMEG)),Ethylene glycol bis (anhydro-trimellitate) (TMEG),

雙(3,4-二叛苯基)醚二if (bis(3,4-dicarboxyphenyl)ether dianhydride (ODPA)), 13 200538875Bis (3,4-dicarboxyphenyl) ether dianhydride (ODPA), 13 200538875

3,3-二經聯苯胺(3,3-dihydroxybenzidine (HAB)), 六狀-2, 2-二(3-胺基-4-經苯基) (Hexofluoro-252-bis(3-amino-4-hydroxyphenyl) (BisAPAF)) » 3,5-二胺基苯曱酸(3,5-diaminobenzoic acid (3,5-DABA)), 4,4 ’ -氧二苯胺(4,4’-Oxydianiline (ODA)),3,3-dihydroxybenzidine (HAB), Hexofluoro-252-bis (3-amino- 4-hydroxyphenyl) (BisAPAF)) »3,5-diaminobenzoic acid (3,5-DABA)), 4,4'-oxydiphenylamine (4,4'-Oxydianiline (ODA)),

2,2-二(4-(4-胺基苯氧基)苯基)丙烷 (2,2-bis(4-(4-aminophenoxyl)phenyl)propane (BAPP)),2,2-bis (4- (4-aminophenoxy) phenyl) propane (2,2-bis (4- (4-aminophenoxyl) phenyl) propane (BAPP)),

2,2-二(4-(3_ 胺基苯氧基)苯基)颯(2,2-bis(4-(3_aminophenoxyl)phenyl)sulfone 14 200538875 (m-BAPS))2,2-bis (4- (3-aminophenoxy) phenyl) fluorene (2,2-bis (4- (3-_aminophenoxyl) phenyl) sulfone 14 200538875 (m-BAPS))

2,3,4-二經基-苯甲酬-1,2-二重氣秦酿r5-石黃酸鹽 (2,3,4-trihydroxy-benzophenone-1,2-diazonaphthoquinone-5-sulfonate (PIC-3), 由 KOYO chemicals Inc·購得) 實施例1 使用配備有一機械攪拌器與氮氣進口之1000毫升之三 頸圓底燒瓶,加入18.3公克(50毫莫耳)之Bis-APAF、12.3公 克(30毫莫耳)之BAPP、2_02公克(10毫莫耳)之ODA、20.5 公克(50毫莫耳)之丁“丑0及15.5公克(50毫莫耳)之00?八,並 加入400克之NMP溶劑。將上述溶液於0°C攪拌4小時後,再 加入2.1 8克(20毫莫耳)之封端劑3-胺基苯醇 (3-aminophenol),並於室溫下再擾拌4小時,再加入80克之 二曱苯後升溫至1 80°C攪拌3小時。冷卻後可得到黏稠PI溶 液PI-1。經由紅外線(IR)光譜分析,本實施例所合成的PI 在1781 cm·1及1377 cm·1有醯亞胺C = Ο及C-N的特性吸收, 15 200538875 如圖1所示。取PI-1溶液50克,加入1.875克PIC-3、1.875克 DML_PC後混和均勻,可得一感光聚醯亞胺塗佈組合物 PSPI-1 〇然後利用旋轉塗佈法塗佈PSPI-1塗佈組合物於ITO 玻璃上,經由加熱板(Hot-Plate)於110°C下,2分鐘之軟 烤程序(prebake)後,便可得到一膜厚約為1.1 μιη之薄膜。 然後將上述經塗佈之ΙΤ0玻璃利用一未經過濾之汞弧光燈 (其所測得之波長介於250〜400nm),投予約1 00 mJ/cm2之能 量,而加以曝光。以2.38% (重量百分比)之氫氧化四甲基銨 (tetramethylammonium hydroxide ; TMAH)水溶液顯影劑加 以顯影,顯影時間為35秒。隨後在熱風循環烘箱230°C下, 經30分鐘的硬烤程序(post-cure),便可得到一财熱性之PI 圖形。如圖2a及2b所示,上述圖形具有一 10 μιη之線寬與間 距,膜厚約為2.0 μιη。而此圖形於硬烤後與其原先軟烤後 之厚度相較,具有9 1 %之膜厚保持率(Film residual rate), 由掃描電子顯微(scanning electron microscope,SEM)鏡照片可觀察 到該聚醯亞胺圖案為具有呈漸窄的截面(tapered-angle at the cross section) ° 實施例2 使用配備有一機械攪拌器與氮氣進口之1000毫升之 三頸圓底燒瓶,加入7.6公克(50毫莫耳)之3,5_DABA、 12.975公克(30毫莫耳)之m-BAPS、1.54公克(7·5毫莫耳) 之0DA、32·8公克(80毫莫耳)之TMEG及6.2公克(20毫 莫耳)之0DPA,並加入400克之ΝΜΡ溶劑。將上述溶液於 16 200538875 〇°C攪拌4小時後 再加入2·73克(25毫莫耳)之封端劑3_ Τ丰 胺基苯醇,並於室溫下再攪拌4小時,加入8〇克之一「 後升溫至180°C攪拌3小時。冷卻後可得到黏稠ρι溶液 PI-2。取ΡΙ·2溶液50克,加入i 875克pic_3、丨〇克2,3,4-Diacetyl-benzyl-1,2-digassin r5-Luteinate (2,3,4-trihydroxy-benzophenone-1, 2-diazonaphthoquinone-5-sulfonate ( PIC-3), available from KOYO chemicals Inc.) Example 1 A 1000 ml three-necked round bottom flask equipped with a mechanical stirrer and nitrogen inlet was charged with 18.3 g (50 mmol) of Bis-APAF, 12.3 GAPP (30 millimoles) of BAPP, 2_02 grams (10 millimoles) of ODA, 20.5 grams (50 millimoles) of Ding "Ugly 0 and 15.5 grams (50 millimoles) of 0-8, and add 400 g of NMP solvent. After stirring the solution at 0 ° C for 4 hours, add 2.18 g (20 mmol) of 3-aminophenol as the capping agent, and Stir for 4 hours, then add 80 grams of dibenzobenzene, then raise the temperature to 1 80 ° C and stir for 3 hours. After cooling, a viscous PI solution PI-1 can be obtained. Through infrared (IR) spectrum analysis, the PI synthesized in this example is at 1781 cm · 1 and 1377 cm · 1 have the characteristic absorption of fluorene imine C = 〇 and CN, 15 200538875 as shown in Figure 1. Take 50 grams of PI-1 solution, add 1.875 grams of PIC-3, 1.875 grams of DML_PC and mix Even A photosensitive polyimide coating composition PSPI-1 can be obtained, and then the PSPI-1 coating composition is coated on the ITO glass by a spin coating method through a hot plate (Hot-Plate) at 110 ° C. After 2 minutes of prebake, a thin film with a thickness of about 1.1 μm can be obtained. Then, the coated ITO glass is subjected to an unfiltered mercury arc lamp (the measured wavelength thereof). (Between 250 ~ 400nm), energy of about 100 mJ / cm2 is administered, and exposure is performed. A 2.38% (wt%) aqueous solution of tetramethylammonium hydroxide (TMAH) developer is used for development, and the development time is 35 seconds. Then in a hot-air circulation oven at 230 ° C, after 30 minutes of post-cure, you can get a PI graph of financial performance. As shown in Figures 2a and 2b, the above graph has a 10 μm The line width and spacing, the film thickness is about 2.0 μιη. Compared with the thickness of the original soft baked after this hard baking, this figure has a film residual rate of 91% (scanning electron microscopy) (Scanning electron microscope, SEM) The polyimide pattern has a tapered-angle at the cross section. Example 2 A 1000-ml three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet was used. 7.6 grams (50 3,5_DABA, m-BAPS of 12.975 grams (30 millimoles), 0DA of 1.54 grams (7.5 millimoles), TMEG of 32.8 grams (80 millimoles), and 6.2 grams (20 mmol) of 0 DPA, and 400 g of NMP solvent was added. The above solution was stirred at 16 200538875 0 ° C for 4 hours, and then 2.73 g (25 millimoles) of the capping agent 3_T fenaminobenzyl alcohol was added, and stirred at room temperature for another 4 hours, and added to 8 After the temperature was raised to 180 ° C and stirred for 3 hours, a viscous ρ solution PI-2 was obtained after cooling. Take 50 grams of PI · 2 solution, add i 875 grams pic_3, 丨 〇 grams

後混和均勻,可得一感光聚醯亞胺塗佈組合物pspi_2。然 後利用旋轉塗佈法塗佈PSPI_2塗佈組合物於ιτ〇玻璃上, 且經由加熱板於iurc下,2分鐘之軟烤程序後,便可得到 一膜厚約為1.1 μπι之薄膜。然後將上述經塗佈之ιτ〇玻璃 利用一未經過濾之汞弧光燈(其所測得之波長介於 250〜40〇nm)投予約120 mJ/cm2之能量加以曝光。以2 (重量百分比)之TMAH水溶液顯影劑加以顯影,顯影時間 為35秒。隨後在熱風循環烘箱23〇t:下’經”分鐘的硬 烤程序,便可得到一耐熱性之PI圖形。上述ρι圖形具有 Βμιη之線寬與間距,膜厚為〇.95um。而此ρι圖形於;硬 烤後與其原先軟烤後之厚度相較,具有86%之膜厚保持After mixing, a photosensitive polyimide coating composition pspi_2 can be obtained. Then, a spin coating method was used to coat the PSPI_2 coating composition on ιτο glass, and a soft baking procedure was performed on the heating plate under iurc for 2 minutes to obtain a thin film having a thickness of about 1.1 μm. The coated ITO glass was then exposed to an energy of about 120 mJ / cm2 using an unfiltered mercury arc lamp (whose measured wavelength was between 250 and 400 nm). It was developed with 2 (wt.%) TMAH aqueous developer, and the development time was 35 seconds. Then in a hot-air circulation oven at 23 ° t: under a hard-bake process for 'minutes', a heat-resistant PI pattern can be obtained. The above-mentioned pattern has a line width and pitch of Βμιη, and the film thickness is 0.95um. And this ρι Figure in; Compared with the original soft roasted thickness after hard roasting, it has a film thickness retention of 86%

率,由SEM圖亦可觀察到該聚醯亞胺圖案為具有呈漸窄的 截面。 實施例3 使用配備有一機械攪拌器與氮氣進口之1〇〇〇毫升之 三頸圓底燒瓶,加入10.8公克(50毫莫耳)之ΗΑΒ、12 975 公克(30毫莫耳)之m-BAPS、2.02公克(10毫莫耳)之〇DA 及〇.〇公克(100毫莫耳)之TMEG,並加入4〇〇克之NMp 溶劑。將上述溶液於〇°C攪拌4小時後,再加入218克(2〇 17 200538875 毫莫耳)之封端劑3 -胺基苯醇,並於室溫下再擾拌4小時, 加入80克之二甲苯後,升溫至18(TC攪拌3小時。冷卻後 可得到黏稠PI溶液PI-3 。取PI-3溶液50克,加入1.It is also observed from the SEM image that the polyfluorene imine pattern has a tapered cross section. Example 3 A 1000 ml three-necked round bottom flask equipped with a mechanical stirrer and a nitrogen inlet was charged with 10.8 g (50 mmol) of 莫 ΑΒ, 12 975 g (30 mmol) of m-BAPS. , 2.02 grams (10 millimoles) of ODA and 0.00 grams (100 millimoles) of TMEG, and 400 grams of NMp solvent was added. After the above solution was stirred at 0 ° C for 4 hours, 218 g (2017 200538875 mmol) of 3-aminobenzyl end capping agent was added, and stirred at room temperature for another 4 hours, and 80 g of After xylene, warm up to 18 ° C and stir for 3 hours. After cooling, a thick PI solution PI-3 can be obtained. Take 50 grams of PI-3 solution and add 1.

克PIC-3、2.25克BIPC-PC後混和均勻,可得一感光聚醯 亞胺塗佈組合物PSPI-3。利用旋轉塗佈法塗佈pspi-3塗佈 組合物於ITO玻璃上,且經由加熱板於u〇t:下,2分鐘之 軟烤程序後,便可得到一膜厚約為之薄膜。然後將 上述經塗佈之ITO玻璃利用一未經過濾之汞弧光燈(其所 測得之波長介於250〜400 nm)投予約12〇 mJ/cm2之能量加 以曝光。以2.38% (重量百分比)之TMAH水溶液顯影劑加 以顯影,顯影時間為40秒。隨後在熱風循環烘箱23(rc下, 經30分鐘的硬烤程序,便可得到一耐熱性之ρι圖形。上 述PI圖形具有15陣之線寬與間距,膜厚為1〇5 _。而 此ΡΙ圖形於硬烤後與其原先預烤後之厚度相較,具有一為 原先厚度87.5%之膜厚保持率(Film她),由咖G of PIC-3 and 2.25 g of BIPC-PC were mixed uniformly to obtain a photosensitive polyimide coating composition PSPI-3. A spin coating method was used to coat the pspi-3 coating composition on the ITO glass, and a soft baking process of 2 minutes was performed on a hot plate under uOt: to obtain a thin film having a thickness of about 100 Å. The coated ITO glass was then exposed to an energy of about 120 mJ / cm2 using an unfiltered mercury arc lamp (whose measured wavelength was between 250 and 400 nm). The developer was developed with a 2.38% (wt.%) Aqueous solution of TMAH, and the development time was 40 seconds. Then in a hot-air circulation oven 23 (rc), a heat-resistant ρι pattern can be obtained after a 30-minute hard roasting process. The above PI pattern has a line width and spacing of 15 arrays, and the film thickness is 105 °. Compared with the original pre-bake thickness, the Pl pattern has a film thickness retention rate (Film) of 87.5% of the original thickness.

® Φ ^ ^ ® t ^ (tapered-angle at the cross section) 〇 比較例1 使用配備有-機械授拌器與氮氣進口之i〇〇〇毫升之 二頸圓底燒瓶,加入36 6公岁 A見(1〇〇耄莫耳)之Bis_APAF、 31·〇公克(100毫莫耳)之qdpa )DPA ’並加入400克之NMP溶 劑。將上述溶液於〇亡播牲 、 攪拌4小時後加入80克之二甲苯德 升溫至180°C攪拌3小時。冷$德 了 4部後可得到黏稠PI溶液 ΡΙ-Cl。取PK1溶液 狀 克,加入1·8克PIC-3混和均勻, 18 200538875 可知一感光聚醯亞胺塗佈組合物pSPI_ci。利用旋轉塗佈 法塗佈PSPI-C1塗佈組合物於IT〇玻璃上,且經由加熱板 於110 C下’ 2分鐘之軟烤程序後,便可得到一膜厚約為L i μιη之薄膜。然後將上述經塗佈之IT〇玻璃利用一未經過濾 之水5瓜光燈(其所測得之波長介於250〜40〇nm)投予約120 mJ/cm2之能量加以曝光。以2·38% (重量百分比)之tmah 水溶液顯影劑加以顯影,顯影時間超過3分鐘仍無法得到 圖案。在此比較例中,該P][的合成未使用封端劑。 比較例2 取實施例1製備的PI-1溶液5〇克,加入ι ·875克pIC_3 後混和均勻’可得一感光聚醯亞胺塗佈組合物pSpi_C2。 重覆實施例1的微影製程,其中軟烤後的膜厚為10μιη, 以TMAH水溶液顯影的顯影時間為6〇秒,得具有2〇 μιη 之線寬與間距,膜厚為0_8 μπι (膜厚保持率8〇%)。由SEM 圖觀察其PI圖案的截面為矩形,並無漸窄的形狀。在此比 車父例中’ a亥感光聚酿亞胺塗佈組合物pjgpi_C2未使用成分 (b)具有酚基(phenolic hydroxyl group)之化合物。 比較例3 HAB-0DPA-丁醇(butanol)·聚醯胺酸酯(p〇lyamic acid ester) 之合成 使用配備有一機械攪拌器與氮氣進口之25〇毫升之三 頸圓底燒瓶,加入15.50公克(50亳莫耳)之〇DpA、7·4〇公 19 200538875 克(100毫莫耳)之正丁醇—anol)及IIS公克之NMp溶 劑。加熱上述混合物至8(rc並於此溫度下攪拌4小時,進 行酯化反應,將上述溶液冷卻至4〇c以下,再加入ΐ6·63公 克(2〇0毫莫耳)之°比咬(Pyridine)及19.50公克(100毫莫耳) 之笨基膦酸一氯化物{^henylphosphonic dichl〇rjde),再於 室溫下擾拌2小時後,進行⑽η基的活化反應。將上述 溶液冷卻至0〜4。(:後,再加入10·8公克(5〇毫莫耳)之ηαβ, 並於0〜4 C下攪拌1小時後,再於室溫下攪拌8小時(進行 聚醯胺酸酯的聚合反應)。利用1〇〇〇毫升之甲醇將所形成 _ 之溶液沉澱,並過濾之以收集其中之聚合物,並將所收集 之聚合物利用去離子水清洗三次。最後將所得到的聚醯胺 酸酯置放於80°C之真空環境下24小時使之乾燥。取5公 克的聚醯胺酸酯、1·25公克的piC-3及187s公克的NMp 溶劑配成感光聚醯胺酸酯塗佈組合物pspi_C3。重覆實施 例1微影製程,其中軟烤後的膜厚為10 μιη,以tmah水 >谷液顯影的顯影時間為60秒,得到具有20 之線寬與間 籲 距的圖形,膜厚為0·9 um。而此圖形於35〇〇c硬烤後與其 原先軟烤之厚度相較,具有70%之膜厚保持率(Film residual rate),其圖案為矩形。 比較例3為一般感光聚醯胺酸酯塗佈組合物,在此只 是強調其需經由350°C硬烤及其膜厚保持率較低。 【圖式簡單說明】 圖1為本發明實施例1所合成的聚醯亞胺的紅外線光 20 200538875 譜’其中被分析的聚醯亞胺有於180°c反應3小時及於190 C反應3小時的兩種。 圖2a及2b分別為使用本發明實施例丨所製備的正型 光敏感性聚醯亞胺塗佈組合物的圖形的上視及剖視掃描電 子顯微鏡(SEM)照片。® Φ ^ ^ ® t ^ (tapered-angle at the cross section) 〇 Comparative Example 1 A 2,000 ml two-necked round bottom flask equipped with a mechanical stirrer and nitrogen inlet was charged with 36 6 years old A See Bis_APAF (100 mol), qdpa (31.0 g (100 mmol)) DPA 'and add 400 g of NMP solvent. The solution was stirred at 0 ° C for 4 hours, then 80 g of xylene was added, and the temperature was raised to 180 ° C and stirred for 3 hours. After 4 cold steps, a thick PI solution PI-Cl was obtained. Take gram of PK1 solution, add 1.8 grams of PIC-3 and mix well. 18 200538875 shows a photosensitive polyimide coating composition pSPI_ci. The spin-coating method was used to coat the PSPI-C1 coating composition on IT0 glass, and after a soft-bake process at 110 ° C for 2 minutes on a hot plate, a thin film with a thickness of about 0.5 μm was obtained. . The coated IT0 glass was then exposed to energy of about 120 mJ / cm2 using an unfiltered water 5 lamp (the measured wavelength was between 250 and 400 nm). It was developed with a 2.38% (wt%) tmah aqueous developer, and the pattern could not be obtained even after the development time exceeded 3 minutes. In this comparative example, the capping agent was not used in the synthesis of P] [. Comparative Example 2 Take 50 grams of the PI-1 solution prepared in Example 1, add 875 grams of pIC_3, and mix uniformly to obtain a photosensitive polyimide coating composition pSpi_C2. The lithography process of Example 1 was repeated, in which the film thickness after soft baking was 10 μm, and the development time when developed with TMAH aqueous solution was 60 seconds, to obtain a line width and pitch of 20 μm, and the film thickness was 0-8 μm (film (Thickness retention 80%). The SEM image observed that the PI pattern had a rectangular cross section and did not have a tapered shape. In this comparative example, the caramelized polyimide coating composition pjgpi_C2 is not used. (B) A compound having a phenolic hydroxyl group. Comparative Example 3 Synthesis of HAB-0DPA-butanol and polyamic acid ester A three-necked round-bottomed flask of 25 milliliters equipped with a mechanical stirrer and nitrogen inlet was charged with 15.50 grams (50 mol) ODpA, 7.40 gram 19 200538875 g (100 millimolar) of n-butanol (anol) and IIS gram of NMp solvent. The mixture was heated to 8 ° C and stirred at this temperature for 4 hours to carry out the esterification reaction. The solution was cooled to below 40 ° C, and then 6.63 grams (200 millimoles) of ° specific bite ( Pyridine) and 19.50 grams (100 millimoles) of benzylphosphonic acid monochloride {^ henylphosphonic dichlorjde). After stirring at room temperature for 2 hours, the activation reaction of the ⑽η group was performed. The above solution was cooled to 0 ~ 4. (: Then, 10.8 g (50 mmol) of ηαβ was added and stirred at 0 to 4 C for 1 hour, and then stirred at room temperature for 8 hours. (Polymerization polymerization reaction was performed) ). The solution formed was precipitated with 1000 ml of methanol, and filtered to collect the polymer therein, and the collected polymer was washed three times with deionized water. Finally, the obtained polyamide was obtained. The ester was placed in a vacuum environment at 80 ° C for 24 hours to dry. Take 5 grams of polyamidate, 1.25 grams of piC-3 and 187s grams of NMp solvent to prepare a photosensitive polyamidate. Coating composition pspi_C3. The lithography process of Example 1 was repeated, in which the film thickness after soft baking was 10 μm, and the development time with tmah water & valley liquid development was 60 seconds to obtain a line width of 20 and a gap between The thickness of the pattern is 0 · 9 um. Compared with the original soft-baking thickness, the pattern has a film residual rate of 70%, and the pattern is rectangular. Comparative Example 3 is a general photosensitive polyurethane coating composition, but it is only emphasized that it needs to be hard-baked at 350 ° C and Its film thickness retention rate is relatively low. [Schematic description] Figure 1 is the infrared light 20 200538875 spectrum of the polyimide synthesized in Example 1 of the present invention, in which the analyzed polyimide reacts at 180 ° c. Two types of reaction at 3 hours and 3 hours at 190 C. Figures 2a and 2b are top and cross-sectional scans of a pattern of a positive photosensitized polyfluorene imide coating composition prepared using Example 丨 of the present invention, respectively. Electron microscope (SEM) photograph.

21twenty one

Claims (1)

200538875 拾、申請專利範圍·· 1· 種正型光敏感性聚醯亞胺塗佈組合物,包含一有 機/合劑及溶於該有機溶劑中的(a)聚醯亞胺,其主鏈末端具 有一紛基或缓基,(b)具有酚基之化合物,及(C)作為感光劑 的酿疊氮石黃酸鹽,其中相對於每一百重量份的成分⑷,成 刀(b)的用里為1-5〇重量份,及成分⑷的用量為1_5〇重量 2·如申請專利範圍第1項的組合物, 具有下列式(1)或(2)的構造: 其中該聚醯亞胺200538875 Scope of patent application ·· 1 · Positive type photosensitive polyimide coating composition, comprising an organic compound and (a) polyimide dissolved in the organic solvent, the main chain terminal (B) a compound having a phenol group or a slow group, (b) a compound having a phenol group, and (C) a brewed azide xanthate salt as a photosensitizer, wherein for each hundred parts by weight of the component ⑷, a knife (b) is formed The content is from 1 to 50 parts by weight, and the amount of component 为 is from 1 to 50% by weight. 2. The composition according to item 1 of the patent application scope has the structure of the following formula (1) or (2): Imine Rl—Ar3-Ν 厂〇Λ 'VU 一Ar2~Ν- 、cy II Rl—Ar3-Ν'Rl-Ar3-N factory 〇Λ 'VU-Ar2 ~ N-, cy II Rl-Ar3-N' η Άγ2—η Άγ2— ^3—R! (1)^ 3—R! (1) 式(1)及(2)中11為10·600的整數,Αγι為四價有機2 Ar2為二至四價有機基團,Ar3為二價芳基,Rl i 馬一 OH 或COOH基。 3.如申請專利範圍第2項的組合物’丨中〜為 22 200538875In the formulae (1) and (2), 11 is an integer of 10.600, A [gamma] is a tetravalent organic group, 2 Ar2 is a divalent to tetravalent organic group, Ar3 is a divalent aromatic group, and Ri is a mono- or COOH group. 3. The composition according to item 2 of the scope of application for patents 丨 丨 ~ is 22 200538875 4·如申請專利範圍第2或3項的組合物,其中八1^為4. If the composition of the scope of patent application item 2 or 3, wherein 8 ^ 5.如申請專利範圍第2或3項的組合物,其中Ar2為5. The composition according to item 2 or 3 of the patent application scope, wherein Ar2 is 23 20053887523 200538875 chl! c «3 i-C3H^ 0¾ < -h6c3-卜-ch3 L〇%chl! c «3 i-C3H ^ 0¾ < -h6c3-b-ch3 L〇% ◎礙或 其中m為1-20的整數,及Xi為 —0—,—S一,一 C(CF3)2 — · —C(CH3)2 — -S〇2-◎ or where m is an integer of 1-20, and Xi is —0—, —S —, — C (CF3) 2 — · —C (CH3) 2 — -S〇2- Λ- -或—(CH2)mli—0—qi—(CH2)n z z 其中m為1-20的整數,Z為H或曱基 6.如申請專利範圍第2項的組合物,其中相對於每一 百重量份的成分(a),成分(b)的用量為5-25重量份。 24 200538875 7.如申請專利範圍第1項之組合物,其中成分(b)之 具有酚基化合物具有下列構造:Λ- -or— (CH2) mli—0—qi— (CH2) nzz where m is an integer from 1 to 20 and Z is H or fluorenyl 6. As for the composition in the second item of the patent application, where One hundred parts by weight of the component (a), and the amount of the component (b) is 5-25 parts by weight. 24 200538875 7. The composition according to item 1 of the scope of patent application, wherein the component (b) having a phenolic compound has the following structure: R8 R9 其中R3至119為Η、-OH基、CVC20烷基或C4-C20環脂基, 及z為0-5的整數。 8.如申請專利範圍第7項之組合物,其中成分(b)之 具有酚基化合物為:R8 R9 wherein R3 to 119 are fluorene, -OH group, CVC20 alkyl group or C4-C20 cycloaliphatic group, and z is an integer of 0-5. 8. The composition according to item 7 of the scope of patent application, wherein the component (b) having a phenolic compound is: 25 20053887525 200538875 OH , H丨 BisP-BOH, H 丨 BisP-B OHOH Bis-FBis-F or 9.如申請專利範圍第1項之組合物,其中成分(0之感 光劑具有下列結構: 26 200538875 ch39. The composition according to item 1 of the scope of patent application, wherein the photosensitizer of the component (0 has the following structure: 26 200538875 ch3 cf3cf3 DD 其中D為氫,Where D is hydrogen, 10. 如申請專利範圍第1項的組合物,其中成分(a), (b)及(c)的重量和佔該組合物全部重量的5-50%。 11. 如申請專利範圍第1項的組合物,其中的有機溶 劑為N-甲基-2-吡咯烷酮、丁内酯、或乳酸乙酯。 2710. The composition according to item 1 of the patent application range, wherein the weight of ingredients (a), (b) and (c) and 5-50% of the total weight of the composition. 11. The composition according to item 1 of the patent application scope, wherein the organic solvent is N-methyl-2-pyrrolidone, butyrolactone, or ethyl lactate. 27
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9477148B1 (en) 2015-05-26 2016-10-25 Industrial Technology Research Institute Polymer, method for preparing the same, and a photosensitive resin composition thereof
TWI571481B (en) * 2015-05-26 2017-02-21 財團法人工業技術研究院 Polymer, method for preparing the same, and a photosensitive resin composition thereof
TWI662063B (en) * 2018-02-02 2019-06-11 新應材股份有限公司 Photosensitive Polyimide Composition and Photoresist Film MADE Thereof

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI718853B (en) 2020-01-21 2021-02-11 新應材股份有限公司 Method of removing photoresist, laminate, polyimide resin and stripper

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9477148B1 (en) 2015-05-26 2016-10-25 Industrial Technology Research Institute Polymer, method for preparing the same, and a photosensitive resin composition thereof
TWI571481B (en) * 2015-05-26 2017-02-21 財團法人工業技術研究院 Polymer, method for preparing the same, and a photosensitive resin composition thereof
TWI662063B (en) * 2018-02-02 2019-06-11 新應材股份有限公司 Photosensitive Polyimide Composition and Photoresist Film MADE Thereof

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